A server multiplexing component test plan generation method and system

Abstract

The application discloses a kind of server component test scheme generation method, device and system, electronic equipment and computer storage medium, wherein the method comprises: according to the project component list of server to be tested project, determine whether there is matching reuse component in the component basis data of server project with the component in the to be tested project;If yes, then according to the reuse component list generated by the project component list and the component basis data, select the to be tested component of the current project stage in the to be tested project;According to the reuse component test planning generated by the to be tested component, search the component reuse information of the to be tested component in the server project;According to the component reuse information, generate the reuse component test scheme of the server to be tested project, to speed up the design progress of test.

Description

Technical Field

[0001] This application relates to the field of computer application technology, specifically to a method, system, computer storage medium, and electronic device for generating server component reuse test schemes. Background Technology

[0002] Currently, the demand for server testing is becoming increasingly diversified. General-purpose server products have more and more configurations, support more and more components, and each component has more and more models. In order to save development costs, there will be shared components and boards in different server projects. It is necessary to test the compatibility reuse of components and the reuse of board functions. The purpose of reuse is to verify modules with the same or similar functions through reusable testing, speed up the test design process, and reduce the burden on testers. Summary of the Invention

[0003] This application provides a method for generating test plans for server reusable components, addressing the problems of numerous components, large workload, and difficulty in test management in existing technologies. This application also provides a system for generating test plans for server reusable components, a computer storage medium, and an electronic device.

[0004] This application provides a method for generating a server component reuse test scheme, including:

[0005] Based on the project component list of the server project to be tested, determine whether there are any reusable components in the basic component data of the server project that match the components in the project to be tested; if so, select the component to be tested in the current project stage of the project to be tested based on the reusable component list generated from the project component list and the basic component data; search for component reuse information of the component to be tested in the server project based on the reusable component test plan generated from the component to be tested; generate a reusable component test plan for the server project to be tested based on the component reuse information.

[0006] Optionally, it further includes: generating a set of internal components and / or a set of external components based on the reuse analysis of internal and / or external components of the server project; determining the basic data of the components based on the set of internal and / or external components and the component use case baseline; wherein the internal and / or external components include one or more components selected from motherboard, hard drive, RAID card and backplane.

[0007] Optionally, generating a set of internal components based on the reuse analysis of internal components of the server project includes at least one of the following: when the internal component is the motherboard, based on the test results of the reuse relationship between motherboards within the project, reusable motherboards are selected as a first set to generate a first motherboard set within the project; when the internal component is the motherboard, based on the test results of the reuse relationship between the CPU and the motherboard within the project, motherboards with reusable CPUs are selected as a second set to generate a second motherboard set within the project; when the internal component is the motherboard, based on the test results of the reuse relationship between the memory and the motherboard within the project, motherboards with reusable memory are selected as a third set to generate a third motherboard set within the project; when the internal component is the motherboard, based on the test results of the reuse relationship between the power supply and the motherboard within the project, motherboards with reusable power supplies are selected as a fourth set to generate a fourth motherboard set within the project.

[0008] Optionally, generating a set of internal components based on the reuse analysis of internal components of the server project includes at least one of the following: when the internal component is a backplane, based on the test results of the reuse relationship between backplanes within the project, reusable backplanes are used as a first set to generate a first backplane set within the project; when the internal component is the backplane, based on the test results of the reuse relationship between disk array cards and the backplane within the project, backplanes of reusable disk array cards are used as a second set to generate a second backplane set within the project; when the internal component is the backplane, based on the test results of the reuse relationship between hard drives and the backplane within the project, backplanes of reusable hard drives are used as a third set to generate a third backplane set within the project.

[0009] Optionally, generating a set of internal components based on the reuse analysis of internal components of the server project includes: when the internal component of the project is a hard disk, generating a first set of internal hard disks by taking the reusable hard disks as the first set based on the test results of the reuse relationship between hard disks in the project.

[0010] Optionally, generating a set of internal components based on the reuse analysis of internal components of the server project includes: when the internal component of the project is a disk array card, generating a first set of internal disk array cards by taking the reusable disk array cards as the first set based on the test results of the reuse relationship between disk array cards in the project.

[0011] Optionally, generating an inter-project component set based on the inter-project component reuse analysis of the server project includes at least one of the following: when the inter-project component is the motherboard, based on the test results of the reuse relationship between the motherboards, reusable motherboards are selected as a first set to generate an inter-project first motherboard set; when the inter-project component is the motherboard, based on the test results of the reuse relationship between the CPU and the motherboard, motherboards with reusable CPUs are selected as a second set to generate an inter-project second motherboard set; when the inter-project component is the motherboard, based on the test results of the reuse relationship between the memory and the motherboard, motherboards with reusable memory are selected as a third set to generate an inter-project third motherboard set; when the inter-project component is the motherboard, based on the test results of the reuse relationship between the power supply and the motherboard, motherboards with reusable power supplies are selected as a fourth set to generate an inter-project fourth motherboard set.

[0012] Optionally, generating an inter-project component set based on the inter-project component reuse analysis of the server project includes at least one of the following: when the inter-project component is a backplane, based on the reuse relationship test results between the inter-project backplanes, reusable backplanes are used as a first set to generate an inter-project first backplane set; when the inter-project component is the backplane, based on the reuse relationship test results between the inter-project disk array card and the backplane, backplanes of reusable disk array cards are used as a second set to generate an inter-project second backplane set; when the inter-project component is the backplane, based on the reuse relationship test results between the inter-project hard disk and the backplane, backplanes of reusable hard disks are used as a third set to generate an inter-project third backplane set.

[0013] Optionally, generating an inter-project component set based on the inter-project component reuse analysis of the server project includes at least one of the following: when the inter-project component is a hard disk, based on the test results of the reuse relationship between the hard disks in the inter-project, the reusable hard disks are taken as the first set to generate an inter-project first hard disk set.

[0014] Optionally, generating an inter-project component set based on the reuse analysis of inter-project components of the server project includes at least one of the following: when the inter-project component is a disk array card, based on the test results of the reuse relationship between the disk array cards in the inter-project, the reusable disk array cards are taken as a first set to generate an inter-project first disk array card set.

[0015] Optionally, determining whether there are reusable components matching the components in the component base data of the server project based on the project component list of the server project under test includes: obtaining project identification information of the server project under test; wherein the project identification information is used to identify the attribute information of the server project under test and / or the attribute information of the components in the server project under test; determining whether the project component list of the server project under test exists based on the project identification information; if so, matching the reusable components in the project component list with the component set in the component base data.

[0016] Optionally, the step of selecting the component to be tested in the current project stage of the project to be tested from the reusable component list generated based on the project component list and the component basic data includes: generating the reusable component list based on the component types in the project component list and the component basic data; and selecting the component to be tested in the current project stage of the project to be tested based on the reusable component list.

[0017] Optionally, generating the reusable component list based on the component types and component basic data in the project component list includes at least one of the following: when the component type in the project component list is a motherboard, exporting the motherboard basic data corresponding to the motherboard retrieved from the component basic data to a reusable motherboard list; when the component type in the project component list is a backplane, exporting the backplane basic data corresponding to the backplane retrieved from the component basic data to a reusable backplane list; when the component type in the project component list is a CPU, exporting the CPU basic data corresponding to the CPU retrieved from the component basic data to a reusable CPU-motherboard ...-motherboard, exporting the CPU basic data corresponding to the CPU retrieved from the component basic data to a reusable CPU-motherboard list; when the component type in the project component list is a CPU-motherboard, exporting the CPU basic data corresponding to the CPU retrieved from the component basic data to a reusable CPU-motherboard list; when the component type in the project component list is a CPU-motherboard, exporting the CPU basic data corresponding to the CPU retrieved from the component basic data to a reusable CPU-motherboard list; when the component type in When the type is memory, the memory basic data corresponding to the memory, retrieved from the component basic data, is exported to the reused memory-motherboard list; when the component type in the project component list is power supply, the power supply basic data corresponding to the power supply, retrieved from the component basic data, is exported to the reused power supply-motherboard list; when the component type in the project component list is RAID card, the RAID card basic data corresponding to the RAID card, retrieved from the component basic data, is exported to the reused RAID card-backplane list; when the component type in the project component list is hard drive, the hard drive basic data corresponding to the hard drive, retrieved from the component basic data, is exported to the reused hard drive-backplane list.

[0018] Optionally, the step of searching for component reuse information of the component under test in the server project based on the reused component test plan generated by the component under test includes: generating the reused component test plan according to the component under test and the set test plan generation method; and searching for component reuse information of the component under test in the server project based on the reused component test plan.

[0019] Optionally, generating the reusable component test plan according to the component under test and the set test plan generation method includes: determining whether the component under test belongs to the project component set in the component basic data; if yes, generating the reusable component test plan according to the information in the project component set; if no, generating the reusable component test plan according to the component information corresponding to the component under test in the component basic data.

[0020] Optionally, if so, the reusable component test plan is generated based on the information in the project component set, including: when the component under test is an independent component, establishing an independent component matrix based on the set name and project component code in the project component set; generating the reusable component test plan for the component under test based on the triggering of hyperlinks to the set name and project component code in the independent component matrix; when the component under test is a combined component, establishing a combined component matrix with the model number of the first component in the combined component as the row and the set name corresponding to the combined component and the code of the second component in the combined component as the column; and generating the reusable component test plan based on the combined component matrix.

[0021] Optionally, if not, then based on the component information corresponding to the component under test in the component basic data, the reusable component test plan is generated, including: when the component under test is an independent component and / or a combined component, establishing an independent component matrix and / or a combined component matrix based on the encoding in the component basic data; and generating the reusable component test plan based on the independent component matrix and / or the combined component matrix.

[0022] Optionally, the step of searching for component reuse information of the component under test in the server project based on the reuse component test plan generated by the component under test includes: reviewing the reuse component test plan; and when the review result is passed, searching for component reuse information of the component under test in the server project.

[0023] Optionally, when the review result is passed, the component reuse information of the component under test in the server project is searched according to the set search method, including: when the reused component test plan corresponds to a motherboard, determining the inter-project motherboard set identifier information corresponding to the motherboard code; searching for the motherboard test configuration information corresponding to the motherboard code based on the motherboard set corresponding to the motherboard set identifier information; filtering motherboard test case configuration information and motherboard test cases in the motherboard test case baseline of the component basic data based on the motherboard test configuration information; determining the component reuse information of the motherboard based on the motherboard test case configuration information and motherboard test cases; when the reused component test plan corresponds to a hard disk-backplane, determining the component reuse information corresponding to the backplane code. The project-to-project hard disk-backplane set identifier information and the hard disk code corresponding to the hard disk set identifier information are used as follows: Based on the backplane code in the hard disk-backplane set corresponding to the hard disk-backplane set identifier information, the hard disk code is matched, and then matched with all disk codes in the hard disk set corresponding to the hard disk set identifier information; based on the matching results, the test configuration information of the hard disk-backplane combination corresponding to the matching results is searched; based on the test configuration information of the hard disk-backplane combination, the hard disk-backplane test case configuration information and hard disk-backplane test cases are filtered from the hard disk test case baseline of the component basic data; based on the hard disk-backplane test case configuration information and hard disk-backplane test cases, the component reuse information of the hard disk-backplane is determined.

[0024] Optionally, generating a reusable component test plan for the server under test based on the component reuse information includes: reviewing the component reuse information; and generating the reusable component test plan for the server under test based on the component reuse information when the review result is passed.

[0025] Optionally, it also includes: generating a project reusable component library according to the reusable component test plan; querying the test results of the project under test according to the reusable component test plan based on the project reusable component library; and outputting the test results.

[0026] Optionally, querying the test results of the project under test according to the reusable component test plan based on the project reusable component library includes: searching for component test configuration information corresponding to the component under test in the project reusable component library based on the component code of the component under test; filtering the test case baseline test configuration information and test cases of the component test case baseline of the component under test in the component test case baseline in the component basic data based on the component test configuration information; and determining the test result based on the test case baseline test configuration information and the test cases.

[0027] Optionally, it may also include: determining the number of reused test cases based on one or more combinations of the number of components under test in the project under test, the total number of components in the project under test, the number of test case baselines for the components under test in the project under test, the number of test case references for the components under test in the project under test, and the number of sets corresponding to the components under test.

[0028] This application also discloses a server reusable component test plan generation system, comprising: a project component reuse module and a computational strategy model scheme automation module executing the server reusable component test plan generation method described above; wherein, the project component reuse module includes: a component reuse data maintenance module and a component use case baseline module; the component reuse data maintenance module is used to generate a list of components within the project and / or components between projects based on the reuse analysis of components within the server project and / or components between projects; the component use case baseline module is used to generate a component use case baseline; the computational strategy model scheme automation module includes: a component library management module and a project management module, wherein the component library management module is a reusable component library, and the project management module is used to display the component reuse status of the component under test in the server project.

[0029] This application also discloses an electronic device, including: the memory for storing a computer program, wherein when the program is read and executed by the processor, it executes the above-described server component test scheme generation method.

[0030] This application also discloses a computer-readable storage medium, characterized in that it stores a computer program, which is executed by a processor using the above-described server component test scheme generation method.

[0031] Compared with the prior art, this application has the following advantages:

[0032] This application provides a method for generating a test plan for reusable server components, comprising: determining, based on the component list of the server project to be tested, whether there are reusable components in the component basic data of the server project that match the components in the project to be tested; if so, selecting the component to be tested in the current project stage of the project to be tested based on the reusable component list generated from the component list and the component basic data; searching for component reuse information of the component to be tested in the server project based on the reusable component test plan generated from the component to be tested; and generating a reusable component test plan for the server project to be tested based on the component reuse information. This facilitates the testing of reusable server components by reducing the need for material replacement and real-time updates to offline planning tables, enabling fast and efficient testing of reusable components while reducing the workload of testing personnel. Attached Figure Description

[0033] Figure 1 This is a flowchart of the first embodiment of a server reusable component test scheme generation method provided in this application.

[0034] Figure 2 This is a flowchart of another embodiment of a server reusable component testing scheme method provided in this application.

[0035] Figure 3 This is a flowchart illustrating an embodiment of the server reuse component test scheme generation method provided in this application, specifically regarding the search for component reuse information.

[0036] Figure 4 This is a schematic diagram of an embodiment of a server reusable component testing scheme generation device provided in this application.

[0037] Figure 5 This is a schematic diagram of the structure of an embodiment of an electronic device provided in this application.

[0038] Figure 6 This is a schematic diagram of an embodiment of a server reusable component testing scheme generation system provided in this application.

[0039] Figure 7 This is a schematic diagram illustrating an embodiment of a server reuse component test scheme generation method provided in this application. Detailed Implementation

[0040] Numerous specific details are set forth in the following description to provide a full understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar extensions without departing from the spirit of the invention. Therefore, this invention is not limited to the specific embodiments disclosed below.

[0041] The terms "first," "second," "third," etc., used in the specification, claims, and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that embodiments of the invention described herein can be implemented, for example, in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0042] As described in the background section, current testing methods for server component reuse require replacing parts to address material issues and updating offline planning tables. For example, when reusing a motherboard within a project, if a problem occurs, the test plan needs to be changed, and / or the motherboard needs to be replaced. This results in high maintenance and labor costs during the server component reuse process.

[0043] Based on this, this application provides a method for reusing server components, which can improve the efficiency of server component reuse testing, thereby reducing maintenance costs and the manual costs of offline operations. A detailed description is provided below with reference to specific application scenarios:

[0044] Please refer to Figure 1 As shown, Figure 1 This is a flowchart illustrating an embodiment of a server component reuse method provided in this application. The embodiment includes:

[0045] Step S101: Based on the list of components of the server project to be tested, determine whether there are any reusable components in the basic data of the server project that match the components in the project to be tested;

[0046] In this embodiment, the list of components of the server to be tested can be understood as all the components involved in the server that need to be tested.

[0047] The basic component data of the server project can be understood as the component data that already exists in the server project.

[0048] Based on the above explanation of the relevant terms in step S101, it can be understood that step S101 is to find out whether there are any reusable components in the existing component basic data of the server project that match the components in the project to be tested.

[0049] Step S102: If yes, then select the component to be tested in the current project stage of the project to be tested based on the project component list and the reusable component list generated from the component basic data;

[0050] Step S102 can be understood as follows: if there are matching reusable parts, generate a reusable part list based on the project part list and part basic data, list all the matching reusable parts, and select the parts in the project to be tested that need to be tested in the current project phase from the reusable part list.

[0051] Step S103: Based on the reusable component test plan generated by the component under test, search for component reuse information of the component under test in the server project;

[0052] The reusable component test plan can be understood as the planning steps performed when testing reusable components. Based on the reusable component test plan, the reuse information of the component under test in the server project is searched.

[0053] Step S104: Generate a test plan for the reused components of the server project under test based on the component reuse information.

[0054] The reused component test plan can be a newly generated test plan or it can reuse the test results of reused components in the component reuse information.

[0055] The specific implementation process of the above steps is described below.

[0056] The basic component data in step S101 can be determined in the following ways:

[0057] Steps S101-11: Based on the reuse analysis of intra-project components and / or inter-project components of the server project, generate intra-project component sets and / or inter-project component sets;

[0058] Steps S101-12: Determine the basic data of the components based on the set of components within the project and / or the set of components between projects, as well as the component use case baseline.

[0059] The components within and / or between projects include one or more components such as a motherboard, hard drive, RAID card, and backplane.

[0060] The specific implementation process of steps S101-11 may include:

[0061] Method 1: Based on the reuse analysis of the internal components of the server project, generate a set of internal components, including at least one of the following:

[0062] When the internal component of the project is the motherboard, based on the test results of the reuse relationship between motherboards within the project, reusable motherboards are selected as the first set to generate the first motherboard set within the project; when the internal component of the project is the motherboard, based on the test results of the reuse relationship between the CPU and the motherboard within the project, motherboards with reusable CPUs are selected as the second set to generate the second motherboard set within the project; when the internal component of the project is the motherboard, based on the test results of the reuse relationship between the memory and the motherboard within the project, motherboards with reusable memory are selected as the third set to generate the third motherboard set within the project; when the internal component of the project is the motherboard, based on the test results of the reuse relationship between the power supply and the motherboard within the project, motherboards with reusable power supplies are selected as the fourth set to generate the fourth motherboard set within the project.

[0063] Method 1 can be understood as follows: when the internal component of the project is a motherboard, the reuse relationship test between motherboards in the project is performed, which is to test the basic functions of the motherboard. If the test result of the basic functions is reusable, the reusable motherboards are used as the first set to generate the first set in the project. When the internal component of the project is a motherboard, the reuse relationship test between the CPU and the motherboard in the project is performed. If the test result is reusable, the motherboards with reusable CPUs are used as the second set to generate the second set of motherboards in the project, and so on.

[0064] Preferred implementation examples are shown in Table 1. Item A in the first row, whose internal component is motherboard 1, is the first item. In the first item, there is no reuse; its motherboard (basic functions), CPU-motherboard, memory-motherboard, and power supply-motherboard form a new set. Item A in the second row, whose internal component is motherboard 2, is the second item. If the basic function test result for the motherboard is reusable, it is classified into the first set; if the test result for the CPU-motherboard relationship is reusable, it is classified into the second set; if the test result for the memory-motherboard relationship is not reusable, it is classified into set C; if the basic function test result for the power supply-motherboard relationship is reusable, it is classified into the fourth set. Item B in the third row, whose internal component is motherboard 3, is classified into set A if the basic function test result for the motherboard is not reusable; if the test result for the CPU-motherboard relationship is not reusable, it is classified into set B; if the test result for the memory-motherboard relationship is not reusable, it is classified into set D; if the basic function test result for the power supply-motherboard relationship is reusable, it is classified into the fourth set.

[0065] In this context, the first set, the second set, the third set, the fourth set, the A set, the B set, the C set, and the D set are merely set designations and have no substantive meaning.

[0066]

[0067] Table 1

[0068] Method 2: Based on the reuse analysis of the internal components of the server project, a set of internal components is generated, including at least one of the following:

[0069] When the internal component of the project is a backplane, based on the test results of the reuse relationship between backplanes within the project, reusable backplanes are used as a first set to generate a first backplane set within the project; when the internal component of the project is the backplane, based on the test results of the reuse relationship between the CPU and the backplane within the project, reusable CPU backplanes are used as a second set to generate a second backplane set within the project; when the internal component of the project is the backplane, based on the test results of the reuse relationship between the memory and the backplane within the project, reusable memory backplanes are used as a third set to generate a third backplane set within the project; when the internal component of the project is the backplane... When the component is the backplane, based on the test results of the reuse relationship between the power supply and the backplane within the project, backplanes with reusable power supplies are designated as the fourth set, generating the fourth motherboard set within the project; when the component between projects is the backplane, based on the test results of the reuse relationship between the disk array card and the backplane between projects, backplanes with reusable disk array cards are designated as the fifth set, generating the fifth motherboard set between projects; when the component between projects is the backplane, based on the test results of the reuse relationship between the hard drive and the backplane between projects, backplanes with reusable hard drives are designated as the sixth set, generating the sixth motherboard set between projects.

[0070] Method 2 can be understood as follows: when the internal component of the project is a backplane, the reuse relationship test between the backplanes in the project is performed, which is to test the basic functions of the backplane. If the test result of the basic functions is reusable, it is classified into the first set. When the internal component of the project is a backplane, the reuse relationship test between the disk array card and the motherboard in the project is performed. If the test result is reusable, the motherboard of the reusable disk array card is regarded as the second set, and the second motherboard set in the project is generated, and so on.

[0071] The preferred embodiment is shown in Table 2. When the internal component of the project is a backplane, the test on the reuse relationship between the disk array card and the motherboard in the project, and the internal component of project A in the first row being backplane 1, which is the first project, there is no reuse in the first project, and its backplane, disk array card-backplane, and hard drive-backplane form a new set; the internal component of project A in the second row being backplane 2, which is the second project, when the test result of the backplane is reusable, it is classified into the first set; when the test result of the disk array card and backplane is reusable, it is classified into the second set; when the test result of the hard drive and backplane is reusable, ... It is classified into the third set; the internal component of item B in the third row is backplane 3. When the test result of the backplane is that it is not reusable, it is classified into set YY; when the test result of the disk array card and the backplane is that it is not reusable, it is classified into set A; when the test result of the hard drive and the backplane is that it is not reusable, it is classified into set C; the internal component of item B in the fourth row is backplane 4. When the test result of the backplane is that it is not reusable, it is classified into set YY; when the test result of the disk array card and the backplane is that it is not reusable, it is classified into set B; when the test result of the hard drive and the backplane is that it is not reusable, it is classified into set D.

[0072] In this context, the first set, the second set, the third set, the fourth set, the YY set, the A set, the B set, the C set, and the D set are merely set designations and have no substantive meaning.

[0073]

[0074] Table 2

[0075] Method 3: Based on the reuse analysis of the internal components of the server project, a set of internal components is generated, including at least one of the following:

[0076] When the internal component of the project is a hard drive, the reusable hard drives are selected as the first set based on the test results of the reuse relationship between the hard drives in the project, and the first set of hard drives in the project is generated.

[0077] Method 3 can be understood as follows: when the internal component of the project is a hard drive, the reuse relationship test between the hard drives in the project is to test the basic functions of the hard drives. If the test result of the basic functions is that they are reusable, they are classified into the first set.

[0078] The preferred embodiment is shown in Table 3. Item A in the first row has a component called hard disk 1, which is the first item. In the first item, there is no reuse, and the hard disks form a new set. Item A in the second row has a component called hard disk 2, which is the second item. When the test result of the hard disk is that it is reusable, it is classified into the first set (XX manufacturer - XX capacity - XX protocol). Item B in the third row has a component called hard disk 3. When the test result of the hard disk is that it is not reusable, it is classified into set B (YY manufacturer - YY capacity - YY protocol). Item B in the fourth row has a component called hard disk 4. When the test result of the hard disk is that it is not reusable, it is classified into set B (YY manufacturer - YY capacity - YY protocol).

[0079]

[0080] Table 3

[0081] Method 4: The generation of a set of internal components based on the reuse analysis of the server project's internal components includes at least one of the following methods:

[0082] When the inter-project component is a disk array card, based on the test results of the reuse relationship between the inter-project disk array cards, reusable disk array cards are selected as the first set to generate the first inter-project disk array card set; when the inter-project component is a disk array card, based on the test results of the reuse relationship between the inter-project CPU and the disk array card, disk array cards with reusable CPUs are selected as the second set to generate the second inter-project disk array card set; when the inter-project component is a disk array card, based on the test results of the reuse relationship between the inter-project memory and the disk array card, disk array cards with reusable memory are selected as the third set to generate the third inter-project disk array card set; when the inter-project component is a disk array card, based on the test results of the reuse relationship between the inter-project power supply and the disk array card, disk array cards with reusable power supply are selected as the fourth set to generate the fourth inter-project disk array card set.

[0083] For example, in Table 4, the internal component of item A in the first row is disk array card 1, which is the first item. There is no reuse in the first item, and its disk array cards form a new set. The internal component of item A in the second row is disk array card 2, which is the second item. When the test result of the disk array card is that it is reusable, it is classified into the first set (XX manufacturer - XX chip). The internal component of item B in the third row is disk array card 3. When the test result of the disk array card is that it is not reusable, it is classified into set B (YY manufacturer - YY chip). The internal component of item B in the fourth row is disk array card 4. When the test result of the disk array card is that it is not reusable, it is classified into set B (YY manufacturer - YY chip).

[0084]

[0085] Table 4

[0086] Method 5: Based on the inter-project component reuse analysis of the server project, generate an inter-project component set, including at least one of the following:

[0087] When the inter-project component is the motherboard, based on the test results of the reuse relationship between the motherboards, reusable motherboards are selected as the first set to generate the first inter-project motherboard set; when the inter-project component is the motherboard, based on the test results of the reuse relationship between the CPU and the motherboard, motherboards with reusable CPUs are selected as the second set to generate the second inter-project motherboard set; when the inter-project component is the motherboard, based on the test results of the reuse relationship between the memory and the motherboard, motherboards with reusable memory are selected as the third set to generate the third inter-project motherboard set; when the inter-project component is the motherboard, based on the test results of the reuse relationship between the power supply and the motherboard, motherboards with reusable power supplies are selected as the fourth set to generate the fourth inter-project motherboard set.

[0088] Method Six: Based on the reuse analysis of inter-project components in the server project, an inter-project component set is generated, including at least one of the following:

[0089] When the inter-project component is a backplane, based on the test results of the reuse relationship between the inter-project backplanes, reusable backplanes are used as a first set to generate a first inter-project backplane set; when the inter-project component is the backplane, based on the test results of the reuse relationship between the inter-project CPU and the backplane, backplanes with reusable CPUs are used as a second set to generate a second inter-project backplane set; when the inter-project component is the backplane, based on the test results of the reuse relationship between the inter-project memory and the backplane, backplanes with reusable memory are used as a third set to generate a third inter-project backplane set; when the inter-project... When the component is the backplane, based on the test results of the reuse relationship between the inter-project power supply and the backplane, backplanes with reusable power supplies are designated as the fourth set, generating the fourth inter-project motherboard set; when the inter-project component is the backplane, based on the test results of the reuse relationship between the inter-project disk array card and the backplane, backplanes with reusable disk array cards are designated as the fifth set, generating the fifth inter-project motherboard set; when the inter-project component is the backplane, based on the test results of the reuse relationship between the inter-project hard drive and the backplane, backplanes with reusable hard drives are designated as the sixth set, generating the sixth inter-project motherboard set.

[0090] Method 7: Based on the reuse analysis of inter-project components of the server project, an inter-project component set is generated, including at least one of the following:

[0091] When the inter-project component is a hard drive, based on the test results of the inter-project hard drive reuse relationship, reusable hard drives are selected as the first set to generate the first inter-project hard drive set; when the inter-project component is the hard drive, based on the test results of the inter-project CPU and hard drive reuse relationship, hard drives with reusable CPUs are selected as the second set to generate the second inter-project hard drive set; when the inter-project component is the hard drive, based on the test results of the inter-project memory and hard drive reuse relationship, hard drives with reusable memory are selected as the third set to generate the third inter-project hard drive set; when the inter-project component is the hard drive, based on the test results of the inter-project power supply and hard drive reuse relationship, hard drives with reusable power supply are selected as the fourth set to generate the fourth inter-project hard drive set.

[0092] Method 8: The generation of an inter-project component set based on the inter-project component reuse analysis of the server project includes at least one of the following methods:

[0093] When the inter-project component is a disk array card, based on the test results of the reuse relationship between the inter-project disk array cards, reusable disk array cards are selected as the first set to generate the first inter-project disk array card set; when the inter-project component is a disk array card, based on the test results of the reuse relationship between the inter-project CPU and the disk array card, disk array cards with reusable CPUs are selected as the second set to generate the second inter-project disk array card set; when the inter-project component is a disk array card, based on the test results of the reuse relationship between the inter-project memory and the disk array card, disk array cards with reusable memory are selected as the third set to generate the third inter-project disk array card set; when the inter-project component is a disk array card, based on the test results of the reuse relationship between the inter-project power supply and the disk array card, disk array cards with reusable power supply are selected as the fourth set to generate the fourth inter-project disk array card set.

[0094] The specific implementation process of methods five to eight is the same as that of methods one to four, depending on the project.

[0095] In step S101-12, the component test case baseline is all test cases of a component, as shown in Table 5. It includes the test case name of the component, the corresponding test case number, whether it is automated, customer line affiliation, and platform affiliation. This step is existing technology and will not be described in detail here.

[0096]

[0097] Table 5

[0098] The specific implementation process of step S101 may include:

[0099] Step S101-1: Obtain the project identification information of the server project under test; wherein, the project identification information is used to identify the attribute information of the server project under test and / or the attribute information of the components in the server project under test; based on the project identification information, determine whether there is a project component list of the server project under test; if so, match the reusable components in the project component list with the component set in the component basic data.

[0100] Step S101-1 can be understood as obtaining the project identifier of the project to be tested on the server, that is, determining which project it is, which includes the attribute information of the project to be tested and / or the attribute information of the components in the project to be tested.

[0101] This allows us to determine whether a project component list exists. If it does, we match the reusable components in the project component list with the component set in the aforementioned component basic data. In other words, we match the reusable components in the project under test with the component set.

[0102] The specific implementation process of step S102 may include:

[0103] Step S102-1: Generate the list of reusable components based on the component types and basic component data in the project component list;

[0104] The specific implementation process of step S102-1 may include at least one of the following:

[0105] When the component type in the project component list is motherboard, the motherboard basic data corresponding to the motherboard retrieved from the component basic data is exported to the reused motherboard list. For example, when the component type is MB (Mainboard), the motherboard basic data corresponding to the retrieved motherboard is exported to the reused motherboard list.

[0106] When the component type in the project component list is a backplane, the backplane basic data corresponding to the backplane, retrieved from the component basic data, is exported to the reused backplane list. For example, when the component type is HDDBP (harddisk drive backup plane, backplane), the backplane basic data corresponding to the backplane is exported to the reused motherboard list.

[0107] When the component type in the project component list is CPU, the CPU basic data corresponding to the CPU retrieved from the component basic data is exported to the reused CPU-motherboard list. For example, when the component type is CPU, the CPU basic data corresponding to the retrieved CPU type is exported to the reused motherboard list.

[0108] When the component type in the project component list is memory, the memory basic data corresponding to the memory, retrieved from the component basic data, is exported to the reused memory-motherboard list. For example, when the component type is CPU, the CPU basic data corresponding to the CPU type is exported to the reused CPU-motherboard list.

[0109] When the component type in the project component list is power supply, the power supply basic data corresponding to the power supply retrieved from the component basic data is exported to the reused power supply-motherboard list. For example, when the component type is MEM (Memory) and / or PMEM (Persistent Memory), the basic data corresponding to the MEM and / or PMEM types retrieved is exported to the reused memory-motherboard list.

[0110] When the component type in the project component list is a disk array card, the disk array card basic data corresponding to the disk array card, retrieved from the component basic data, is exported to the reused disk array card - backplane list. For example, when the component type is a power supply, the technical data corresponding to the power supply type is exported to the reused power supply - motherboard list.

[0111] When the component type in the project component list is a hard drive, the hard drive basic data corresponding to the hard drive, retrieved from the component basic data, is exported to the reused hard drive-backplane list. For example, the component type could be SATA HDD (SATA Hard Disk Drive), SAS HDD (SAS Hard Disk Drive), SAS SSD (SAS Solid State Disk), SATA SSD (SATA Solid State Disk), SATA M.2 (Solid State Disk with M.2 interface supporting SATA bus), NVME M.2 (Non-Volatile Memory Express M.2, Solid State Disk with M.2 interface supporting non-volatile memory host controller), or PCIE M.2 (Peripheral Component Interconnect-Express M.2, Solid State Disk with M.2 interface supporting high-speed serial computer expansion bus).

[0112] The above implementation process can be understood as querying the basic data of the component corresponding to different component types, and then exporting it to the reuse list of that component type.

[0113] Step S102-2: Select the component to be tested in the current stage of the project under test according to the list of reusable components.

[0114] The specific implementation process of step S103 may include:

[0115] Step S103-1: Based on the component under test, generate the test plan for the reused component according to the set test plan generation method;

[0116] The specific implementation process of step S103-1 may include:

[0117] Step S103-1-1: Determine whether the component to be tested belongs to the component set within the project in the component basic data;

[0118] Step S103-1-2: If yes, then generate the reusable component test plan based on the information in the project component set;

[0119] The specific implementation process of step S103-1-2 may include:

[0120] When the component under test is an independent component, an independent component matrix is ​​established based on the set name and component code in the project's component set; a reusable component test plan for the component under test is generated based on the triggering of hyperlinks to the set name and component code in the independent component matrix; when the component under test is a combined component, a combined component matrix is ​​established with the model number of the first component in the combined component as the row and the set name and the code of the second component in the combined component as the column; the reusable component test plan is generated based on the combined component matrix.

[0121] The above implementation process can be understood as follows: as shown in Table 6, the motherboard matrix is ​​obtained when the component under test is an independent component. The CPU-motherboard set A is the name of the CPU-motherboard set in the project. An independent matrix is ​​established, and a hyperlink is established for the component code in the project, such as YZMB-02757-102. Through the hyperlink, the reuse test plan of the CPU-motherboard under test can be learned.

[0122]

[0123] Table 6

[0124] Table 7 shows the matrix obtained when the component under test is a combined component. The model of the CPU of the first component in the combined component is used as the row, and the set name corresponding to the CPU-motherboard of the combined component and the code of the second component are used as the column, such as the CPU-motherboard set A and the inter-item set PN (YZMB-02757-105). A combined component matrix is ​​established, and a test plan for reused components is generated based on the combined component matrix.

[0125]

[0126] Table 7

[0127] Step S103-1-3: If not, generate the test plan for the reused component based on the component information corresponding to the component under test in the component basic data.

[0128] The specific implementation process of step S103-1-3 may include:

[0129] When the component under test is an independent component and / or a combined component, an independent component matrix and / or a combined component matrix are established based on the encoding in the component's basic data; and the test plan for the reused component is generated based on the independent component matrix and / or the combined component matrix.

[0130] The above implementation process can be understood as follows: when the component under test does not belong to the component set within the project in the component basic data, a reusable component test plan is generated based on the component information corresponding to the component under test in the basic data. Independent components and combined components are represented in matrix form according to the encoding summarized from the component basic data, and then the reusable component test plan is generated.

[0131] Step S103-2: According to the reused component test plan, search for the component reuse information of the component under test in the server project.

[0132] The specific implementation process of step S103-2 may include:

[0133] Step S103-2-1: Review the test plan for the reused components; this can be understood as reviewing the generated test plan for the reused components through human experience.

[0134] Step S103-2-2: When the verification result is passed, search for the component reuse information of the component under test in the server project.

[0135] Step S103-2-2 can be understood as follows: when the review result is passed, the component reuse information of the component under test in the server project is searched according to the set search method.

[0136] The specific implementation process of searching for the reuse information of the component under test in the server project in step S103-2-2 includes:

[0137] When the reusable component test plan corresponds to a motherboard, determine the inter-project motherboard set identifier information corresponding to the motherboard code; search for the motherboard test configuration information corresponding to the motherboard code based on the motherboard set identifier information; filter the motherboard test configuration information and motherboard test cases in the motherboard test case baseline of the component basic data based on the motherboard test configuration information; determine the component reuse information of the motherboard based on the motherboard test configuration information and motherboard test cases.

[0138] When the reusable component test plan corresponds to a backplane, the following steps are taken: First, determine the backplane set identifier information within the first project corresponding to the backplane code; based on the backplane code in the first backplane set corresponding to the backplane set identifier information within the first project, search for a second backplane set including the backplane code in the second project of the component basic data; based on the inter-project backplane code determined by the second backplane set, search for backplane test configuration information corresponding to the inter-project backplane code; based on the backplane test configuration information, filter backplane test case configuration information and backplane test cases in the backplane test case baseline of the component basic data; based on the backplane test case configuration information and backplane test cases, determine the component reuse information of the backplane.

[0139] When the reusable component test plan corresponds to a CPU-motherboard, the inter-project CPU-motherboard set identifier information corresponding to the motherboard code is determined; based on the CPU-motherboard set corresponding to the CPU-motherboard set identifier information, the motherboard code in the CPU-motherboard set is matched with all CPU codes in the CPU-motherboard set; based on the matching result, the test configuration information of the CPU-motherboard combination corresponding to the matching result is searched; based on the test configuration information of the CPU-motherboard combination, CPU-motherboard test case test configuration information and CPU-motherboard test cases are filtered in the CPU test case baseline of the component basic data; based on the CPU-motherboard test case test configuration information and CPU-motherboard test cases, the component reuse information of the CPU-motherboard is determined;

[0140] When the reusable component test plan corresponds to memory-motherboard, the inter-project memory-motherboard set identifier information corresponding to the motherboard code is determined; based on the memory-motherboard set corresponding to the memory-motherboard set identifier information, the motherboard code in the memory-motherboard set is matched with all memory codes in the memory-motherboard set; based on the matching result, the test configuration information of the memory-motherboard combination corresponding to the matching result is searched; based on the test configuration information of the memory-motherboard combination, memory-motherboard test case test configuration information and memory-motherboard test cases are filtered in the memory test case baseline of the component basic data; based on the memory-motherboard test case test configuration information and memory-motherboard test cases, the component reuse information of the memory-motherboard is determined;

[0141] When the reusable component test plan corresponds to a power supply-motherboard, the inter-project power supply-motherboard set identifier information corresponding to the motherboard code is determined; based on the power supply-motherboard set corresponding to the power supply-motherboard set identifier information, the motherboard code in the power supply-motherboard set is matched with all power supply codes in the power supply-motherboard set; based on the matching result, the test configuration information of the power supply-motherboard combination corresponding to the matching result is searched; based on the test configuration information of the power supply-motherboard combination, the power supply-motherboard test case configuration information and power supply-motherboard test cases are filtered in the power supply test case baseline of the component basic data; based on the power supply-motherboard test case configuration information and power supply-motherboard test cases, the component reuse information of the power supply-motherboard is determined;

[0142] When the test plan for the reused component corresponds to a disk array card-backplane, the following steps are taken: First, determine the inter-project disk array card-backplane set identifier information and the inter-project disk array card set identifier information corresponding to the backplane code. Second, match the backplane code in the disk array card-backplane set corresponding to the disk array card set identifier information with all disk array card codes in the disk array card set corresponding to the disk array card set identifier information. Third, search for test configuration information for the disk array card-backplane combination corresponding to the matching result. Fourth, filter disk array card-backplane test case configuration information and disk array card-backplane test cases in the disk array card test case baseline of the component basic data based on the test configuration information of the disk array card-backplane combination. Fifth, determine the component reuse information of the disk array card-backplane based on the test configuration information and the disk array card-backplane test cases.

[0143] When the reusable component test plan corresponds to a hard disk-backplane configuration, the following steps are taken: First, determine the inter-project hard disk-backplane set identifier information corresponding to the backplane code and the inter-project hard disk set identifier information corresponding to the hard disk code. Second, match the backplane code in the hard disk-backplane set corresponding to the hard disk set identifier information with the hard disk code, and match the backplane code with all disk codes in the hard disk set corresponding to the hard disk set identifier information. Third, search for test configuration information for the hard disk-backplane combination corresponding to the matching result. Fourth, filter the hard disk-backplane test case configuration information and hard disk-backplane test cases in the hard disk test case baseline of the component basic data based on the test configuration information of the hard disk-backplane combination. Fifth, determine the component reuse information of the hard disk-backplane based on the hard disk-backplane test case configuration information and the hard disk-backplane test cases.

[0144] The specific implementation steps of step S103-2-2 above vary depending on the component and the corresponding search method.

[0145] The specific implementation process of step S104 may include:

[0146] The component reuse information is reviewed; when the review result is passed, a test plan for the reused components of the server to be tested is generated based on the component reuse information.

[0147] Figure 2 This is a flowchart of a second embodiment of a server component reuse method provided in this application.

[0148] It also includes: step S201 generating a project reuse component library according to the reuse component test plan; step S202 querying the test results of the project under test according to the reuse component test plan based on the project reuse component library; and step S203 outputting the test results.

[0149] The specific implementation process of step S202 may include:

[0150] Based on the component code of the component under test, search for the component test configuration information corresponding to the component under test in the project reuse component library; based on the component test configuration information, filter the test case baseline test configuration information and test cases of the component test case baseline of the component under test in the component basic data; determine the test result based on the test case baseline test configuration information and the test cases.

[0151] The test results can be verified by human experience, and the content can be edited, with the modification date and the reason for generating the test results recorded.

[0152] Step S202 further includes determining the number of reused test cases based on one or more combinations of the number of components under test in the project under test, the total number of components in the project under test, the number of test case baselines for the components under test in the project under test, the number of test case references for the components under test in the project under test, and the number of sets corresponding to the components under test.

[0153] The number of reused use cases is obtained in the following way:

[0154] When the component under test is a motherboard, the number of reused test cases is determined based on the number of motherboards in the project under test, the number of test case baselines for the motherboards in the project under test, and the number of motherboard test case references in the project under test.

[0155] When the component under test is a motherboard, the specific formula for calculating the number of reuse test cases is as follows:

[0156] The number of motherboards in the project under test × the number of baseline test cases for motherboards in the project under test - the number of reference test cases for motherboards in the project under test.

[0157] When the component under test is a backplane, the number of reused test cases is determined based on the number of backplanes in the project under test, the number of test case baselines for the backplanes in the project under test, and the number of reference test cases for the backplanes in the project under test.

[0158] When the component under test is a backplane, the specific formula for calculating the number of reuse cases is as follows:

[0159] The number of backplanes in the project under test × the number of test case baselines for the backplanes in the project under test - the number of reference test cases for the backplanes in the project under test.

[0160] When the component under test is a CPU, the number of reused test cases is determined based on the number of CPUs in the test project, the number of test case baselines for the CPUs in the test project, the total number of CPUs in the test project, the number of sets corresponding to the motherboard, and the number of CPU test case references in the test project.

[0161] When the component under test is a CPU, the specific formula for calculating the number of reuse test cases is as follows:

[0162] The number of CPUs in the project under test × the number of test case baselines for the CPUs in the project under test × the total number of CPUs in the project under test - the number of sets corresponding to the motherboard - the number of reference test cases for the CPUs in the project under test.

[0163] When the component under test is memory, the number of reused test cases is determined based on the quantity of memory in the project under test, the number of test case baselines for memory in the project under test, the total quantity of memory in the project under test, the number of sets corresponding to the motherboard, and the reference number of memory test cases in the project under test.

[0164] When the component under test is memory, the specific formula for calculating the number of reuse test cases is as follows:

[0165] The number of memory units in the project under test × the number of baseline test cases for memory units in the project under test × the total number of memory units in the project under test - the number of sets corresponding to the motherboard - the number of reference test cases for memory units in the project under test.

[0166] When the component under test is a power supply, the number of reused test cases is determined based on the number of power supplies in the project under test, the number of test case baselines for the power supply in the project under test, the total number of power supplies in the project under test, the number of sets corresponding to the motherboard, and the number of reference test cases for the power supply in the project under test.

[0167] When the component under test is a power supply, the specific formula for calculating the number of reuse cases is as follows:

[0168] The number of power supplies in the project under test × the number of test case baselines for the power supply in the project under test × the total number of power supplies in the project under test - the number of sets corresponding to the motherboard - the number of reference test cases for the power supply in the project under test.

[0169] When the component under test is a disk array card, the number of reused test cases is determined based on the number of disk array cards in the project under test, the number of test case baselines for the disk array cards in the project under test, the total number of disk array cards in the project under test, the number of sets corresponding to the backplane, and the number of reference test cases for the disk array cards in the project under test.

[0170] When the component under test is a disk array card, the specific formula for calculating the number of reuse cases is as follows:

[0171] The number of disk array cards in the project under test × the number of baseline test cases for the disk array cards in the project under test × the total number of disk array cards in the project under test - the number of sets corresponding to the backplane - the number of reference test cases for the disk array cards in the project under test.

[0172] When the component under test is a hard drive, the number of reused test cases is determined based on the number of hard drives in the project under test, the number of test case baselines for the hard drives in the project under test, the total number of hard drives in the project under test, the number of sets corresponding to the backplane, and the number of reference test cases for the hard drives in the project under test.

[0173] When the component under test is a hard drive, the specific formula for calculating the number of reuse cases is as follows:

[0174] The number of hard drives in the project under test × the number of test case baselines for the hard drives in the project under test × the total number of hard drives in the project under test - the number of sets corresponding to the backplane - the number of reference test cases for the hard drives in the project under test.

[0175] Based on the different search methods used for different components in step S103-2-2, this application also provides a flowchart of an embodiment for searching server component reuse information, as follows: Figure 3 As shown.

[0176] Step S301 When the test plan for the reused component corresponds to CPU-motherboard, determine the CPU-motherboard set identification information between the projects corresponding to the motherboard code;

[0177] Step S302: Based on the CPU-motherboard set corresponding to the CPU-motherboard set identifier information, match the motherboard code in the CPU-motherboard set with all CPU codes in the CPU-motherboard set; based on the matching result, search for the test configuration information of the CPU-motherboard combination corresponding to the matching result;

[0178] Step S303: Automatically search the component parameter attribute table for the combined test configuration information;

[0179] Step S304: If not found, then based on the test configuration information of the CPU-motherboard combination, filter the CPU-motherboard test configuration information and CPU-motherboard test cases in the CPU test case baseline of the component basic data;

[0180] Step S305: If found, automatically filter the CPU-motherboard test case test configuration information and CPU-motherboard test cases in the single component test cases according to the test configuration information of the CPU-motherboard combination;

[0181] Step S306: Determine the component reuse information of the CPU-motherboard based on the CPU-motherboard test configuration information and the CPU-motherboard test cases;

[0182] Steps S301-S305 can be understood as follows: when the test configuration information and / or combined configuration information of the corresponding component are found, the component is searched for in the automated component parameter attribute table. If found, CPU-motherboard test configuration information and CPU-motherboard test cases are automatically filtered in the single component test cases. If not found, CPU-motherboard test configuration information and CPU-motherboard test cases are automatically filtered in the single component test cases, thereby determining the component reuse information of the component.

[0183] The above embodiments are also applicable when the component types corresponding to the reuse component test plan are memory and / or power supply and / or motherboard and / or backplane and / or disk array card and / or hard disk, and the component reuse information is determined according to the different component types through their respective search methods.

[0184] Based on the above, this application also provides an apparatus, such as... Figure 4 As shown, it includes:

[0185] The determining unit 401 is used to determine, based on the list of components of the server project to be tested, whether there are any reusable components in the basic data of the components of the server project that match the components in the project to be tested.

[0186] The selection unit 402 selects the component to be tested in the current stage of the project to be tested based on the project component list and the reusable component list generated by the component basic data;

[0187] The search unit 403 searches for component reuse information of the component under test in the server project based on the reuse component test plan generated by the component under test.

[0188] The generation unit 404 is used to generate a test plan for the reused components of the server project under test based on the component reuse information. For details of the embodiment of the providing device, please refer to steps S101 to S104 and S201 to S204 above.

[0189] Based on the above, this application also provides an electronic device, such as... Figure 5 As shown, it includes:

[0190] Processor 501; memory 502, the memory being used to store a program for processing the above method, the program executing the above method when read and executed by the processor.

[0191] It should be noted that the detailed description of the electronic device provided in the embodiments of this application can be found in the relevant description of the above-described method embodiments provided in this application, and will not be repeated here.

[0192] Corresponding to the method embodiments provided in this application, this application also provides a computer-readable storage medium. Since this embodiment is substantially similar to the method embodiments provided in this application, it is described simply; relevant details can be found in the descriptions of the method embodiments provided in this application. The embodiments described below are merely illustrative.

[0193] The storage medium stores a computer program, which is executed by a processor to perform the methods described above.

[0194] Based on the above, this application also provides a server reusable component test scheme generation system, such as... Figure 6 As shown, it includes:

[0195] The system includes: a project component reuse module and a computational strategy model scheme automation module.

[0196] The project component reuse module 601 includes: a component reuse data maintenance module and a component use case baseline module; the component reuse data maintenance module is used to generate a list of components within the project and / or components between projects based on the reuse analysis of components within the server project and / or components between projects; the component use case baseline module is used to generate a component use case baseline;

[0197] The automated module 602 for the computational strategy model scheme includes a component library management module and a project management module. The component library management module is a reusable component library, and the project management module is used to display the component reuse status of the component under test in the server project.

[0198] For details of the embodiment of the providing device, please refer to steps S101 to S104 and steps S201 to S204 above.

[0199] Based on the above, this application is implemented for example... Figure 7 As shown in the figure, a reuse test scheme is provided. For specific methods, please refer to steps S101 to S104 and steps S201 to S204 above.

[0200] It should be noted that the detailed description of the computer-readable storage medium provided in the embodiments of this application can be found in the relevant description of the above-described method embodiments provided in this application, and will not be repeated here.

[0201] In a typical configuration, a computing device includes one or more processors (CPUs), input / output interfaces, network interfaces, and memory.

[0202] Memory may include non-persistent storage in computer-readable media, such as random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash RAM. Memory is an example of computer-readable media.

[0203] 1. Computer-readable media includes both permanent and non-permanent, removable and non-removable media that can store information by any method or technology. Information can be computer-readable instructions, data structures, program modules, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, magnetic magnetic disk storage or other magnetic storage devices, or any other non-transferable medium that can be used to store information accessible by a computing device. As defined herein, computer-readable media does not include non-transitory computer-readable media, such as modulated data signals and carrier waves.

[0204] 2. Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product embodied on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0205] Although this application discloses preferred embodiments as described above, it is not intended to limit this application. Any person skilled in the art can make possible changes and modifications without departing from the spirit and scope of this application. Therefore, the scope of protection of this application should be determined by the scope defined in the claims of this application.

[0206] It should be noted that the embodiments of this application may involve the use of user data. In practical applications, user-specific personal data may be used in the scheme described herein within the scope permitted by applicable laws and regulations, provided that it complies with the applicable laws and regulations of the country (e.g., with the user's explicit consent, with the user being properly notified, etc.).

Claims

1. A method for generating a test scheme for server reusable components, characterized in that, include: Based on the list of components of the server project to be tested, determine whether there are any reusable components in the basic data of the server project components that match the components in the project to be tested; If so, then select the component to be tested in the current stage of the project to be tested based on the project component list and the reusable component list generated from the component basic data; Based on the reusable component test plan generated by the component under test, search for component reuse information of the component under test in the server project; Based on the component reuse information, a test plan for the reused components of the server project to be tested is generated; The method further includes: Based on the reuse analysis of the internal components and / or inter-project components of the server project, generate a set of internal components and / or a set of inter-project components; The component basic data is determined based on the component set within the project and / or the component set between projects, as well as the component use case baseline; The internal and / or inter-project components include one or more components selected from motherboard, hard drive, disk array card and backplane; The step of searching for component reuse information of the component under test in the server project based on the reuse component test plan generated by the component under test includes: Based on the component under test, a test plan for the reusable component is generated according to the set test plan generation method; According to the reusable component test plan, search for component reuse information of the component under test in the server project; The step of generating a test plan for the reused component according to the component under test and the set test plan generation method includes: Determine whether the component under test belongs to the component set within the project in the component basic data; If so, then the test plan for the reusable component is generated based on the information in the set of components within the project. If not, then the test plan for the reused component is generated based on the component information corresponding to the component under test in the component basic data; If so, then based on the information in the set of components within the project, a test plan for the reused component is generated, including: When the component to be tested is an independent component, an independent component matrix is ​​established based on the set name and component code in the project's component set; Based on the triggering of the hyperlinks to the set names and component codes within the project in the independent component matrix, the reusable component test plan for the component under test is generated; When the component under test is a combination component, the model number of the first component in the combination component is used as the row, and the set name corresponding to the combination component and the code of the second component in the combination component are used as the column to establish a combination component matrix; The test plan for the reusable components is generated based on the combined component matrix.

2. The method according to claim 1, characterized in that, The step of generating a set of internal components based on the reuse analysis of the internal components of the server project includes at least one of the following: When the internal component of the project is the motherboard, the reusable motherboards are selected as the first set based on the test results of the reuse relationship between the motherboards in the project, and the first set of motherboards in the project is generated. When the internal component of the project is the motherboard, based on the test results of the reuse relationship between the CPU and the motherboard in the project, the motherboards with reusable CPUs are used as the second set to generate the second motherboard set in the project. When the internal component of the project is the motherboard, based on the test results of the reuse relationship between the internal memory and the motherboard, the motherboards with reusable memory are used as the third set to generate the third motherboard set in the project. When the internal component of the project is the motherboard, based on the test results of the reuse relationship between the power supply and the motherboard in the project, the motherboards with reusable power supplies are taken as the fourth set, and the fourth motherboard set in the project is generated.

3. The method according to claim 1, characterized in that, The step of generating a set of internal components based on the reuse analysis of the internal components of the server project includes at least one of the following: When the internal component of the project is a back panel, the reusable back panels are selected as the first set based on the test results of the reuse relationship between the back panels in the project, and the first set of back panels in the project is generated. When the component within the project is the backplane, based on the test results of the reuse relationship between the CPU and the backplane within the project, the backplanes of the reusable card CPU are used as the second set to generate the second backplane set within the project. When the internal component of the project is the backplane, based on the test results of the reuse relationship between the internal memory of the project and the backplane, the backplanes with reusable memory are used as the third set to generate the third backplane set in the project. When the internal component of the project is the backplane, based on the test results of the reuse relationship between the power supply and the backplane in the project, the backplanes with reusable power supply are used as the fourth set to generate the fourth motherboard set in the project. When the inter-project component is the backplane, based on the test results of the reuse relationship between the inter-project disk array card and the backplane, the backplane of the reusable disk array card is taken as the fifth set, and the fifth motherboard set of the inter-project is generated. When the inter-project component is the backplane, based on the test results of the reuse relationship between the inter-project hard drive and the backplane, the backplane with reusable hard drives is taken as the sixth set, and the sixth motherboard set between projects is generated.

4. The method according to claim 1, characterized in that, The step of generating a set of internal components based on the reuse analysis of the internal components of the server project includes at least one of the following: When the internal component of the project is a hard drive, the reusable hard drives are selected as the first set based on the test results of the reuse relationship between the hard drives in the project, and the first set of hard drives in the project is generated. When the internal component of the project is the hard disk, based on the test results of the reuse relationship between the CPU and the hard disk in the project, the hard disks with reusable CPUs are used as the second set to generate the second set of hard disks in the project. When the internal component of the project is the hard disk, based on the test results of the reuse relationship between the internal memory and the hard disk, the hard disks with reusable memory are used as the third set to generate the third set of hard disks in the project; When the internal component of the project is the hard disk, based on the test results of the reuse relationship between the power supply and the hard disk in the project, the hard disks with reusable power supply are taken as the fourth set, and the fourth set of hard disks in the project is generated.

5. The method according to claim 1, characterized in that, The step of generating a set of internal components of the server project based on the reuse analysis of the internal components of the project includes at least one of the following: when the internal component of the project is a disk array card, the reusable disk array cards are taken as the first set based on the test results of the reuse relationship between the disk array cards in the project, and a first set of disk array cards in the project is generated. When the internal component of the project is the disk array card, based on the test results of the reuse relationship between the CPU and the disk array card in the project, the disk array cards that can reuse the CPU are taken as the second set, and the second disk array card set in the project is generated. When the internal component of the project is the disk array card, based on the test results of the reuse relationship between the internal memory and the disk array card, the disk array cards with reusable memory are used as the third set to generate the third disk array card set in the project. When the internal component of the project is the disk array card, based on the test results of the multiplexing relationship between the power supply and the disk array card in the project, the disk array cards with reusable power supply are taken as the fourth set, and the fourth disk array card set in the project is generated.

6. The method according to claim 1, characterized in that, The step of generating an inter-project component set based on the reuse analysis of inter-project components of the server project includes at least one of the following: when the inter-project component is the motherboard, based on the test results of the reuse relationship between the motherboards, the reusable motherboards are taken as the first set, and an inter-project first motherboard set is generated. When the inter-project component is the motherboard, based on the test results of the reuse relationship between the inter-project CPU and the motherboard, the motherboards with reusable CPUs are used as the second set to generate the second inter-project motherboard set. When the inter-project component is the motherboard, based on the test results of the reuse relationship between the inter-project memory and the motherboard, the motherboards with reusable memory are used as the third set to generate the third motherboard set between projects; When the inter-project component is the motherboard, based on the test results of the reuse relationship between the inter-project power supply and the motherboard, the motherboards with reusable power supplies are used as the fourth set to generate the fourth motherboard set between projects.

7. The method according to claim 1, characterized in that, The step of generating an inter-project component set based on the inter-project component reuse analysis of the server project includes at least one of the following: When the inter-project component is a back panel, the reusable back panels are used as the first set based on the test results of the reuse relationship between the inter-project back panels, and the first set of inter-project back panels is generated. When the inter-project component is the backplane, based on the test results of the reuse relationship between the inter-project CPU and the backplane, the backplanes with reusable CPUs are used as the second set to generate the second backplane set between projects. When the inter-project component is the backplane, based on the test results of the reuse relationship between the inter-project memory and the backplane, the backplanes with reusable memory are used as the third set to generate the third backplane set between projects. When the inter-project component is the backplane, based on the test results of the reuse relationship between the inter-project power supply and the backplane, the backplane with reusable power supply is taken as the fourth set, and the fourth inter-project motherboard set is generated. When the inter-project component is the backplane, based on the test results of the reuse relationship between the inter-project disk array card and the backplane, the backplane of the reusable disk array card is taken as the fifth set, and the fifth motherboard set of the inter-project is generated. When the inter-project component is the backplane, based on the test results of the reuse relationship between the inter-project hard drive and the backplane, the backplane with reusable hard drives is taken as the sixth set, and the sixth motherboard set between projects is generated.

8. The method according to claim 1, characterized in that, The step of generating an inter-project component set based on the inter-project component reuse analysis of the server project includes at least one of the following: When the inter-project component is a hard drive, the reusable hard drives are used as the first set based on the test results of the reusability relationship between the hard drives in the inter-project, and the first set of hard drives between the projects is generated. When the inter-project component is the hard disk, based on the test results of the reuse relationship between the CPU and the hard disk between the projects, the hard disks with reusable CPUs are used as the second set to generate the second set of hard disks between projects. When the inter-project component is the hard disk, based on the test results of the reuse relationship between the inter-project memory and the hard disk, the hard disks with reusable memory are used as the third set to generate the third hard disk set between projects; When the inter-project component is the hard disk, based on the test results of the reuse relationship between the inter-project power supply and the hard disk, the hard disks with reusable power supply are used as the fourth set to generate the fourth inter-project hard disk set.

9. The method according to claim 1, characterized in that, The step of generating an inter-project component set based on the inter-project component reuse analysis of the server project includes at least one of the following: When the inter-project component is a disk array card, the reusable disk array cards are used as the first set based on the test results of the reuse relationship between the inter-project disk array cards, and the first inter-project disk array card set is generated. When the inter-project component is the disk array card, based on the test results of the reuse relationship between the inter-project CPU and the disk array card, the disk array cards with reusable CPUs are used as the second set to generate the second inter-project disk array card set. When the inter-project component is the disk array card, based on the test results of the reuse relationship between the inter-project memory and the disk array card, the disk array cards with reusable memory are used as the third set to generate the third disk array card set between projects; When the inter-project component is the disk array card, based on the test results of the reuse relationship between the inter-project power supply and the disk array card, the disk array cards with reusable power supply are taken as the fourth set, and the fourth inter-project disk array card set is generated.

10. The method according to claim 1, characterized in that, The step of determining whether there are reusable components in the basic component data of the server project that match the components in the project under test, based on the project component list of the server project to be tested, includes: Obtain the project identification information of the server project under test; wherein, the project identification information is used to identify the attribute information of the server project under test and / or the attribute information of the components in the server project under test; Based on the project identification information, determine whether the project component list of the server to be tested exists; If so, the reusable components in the project component list are matched with the component set in the component basic data.

11. The method according to claim 1, characterized in that, The reusable component list generated based on the project component list and the component basic data selects the components to be tested in the current project phase of the project to be tested, including: The list of reusable components is generated based on the component types and basic component data in the project component list; Based on the list of reusable components, select the component to be tested for the current stage of the project under test.

12. The method according to claim 11, characterized in that, The step of generating the reusable component list based on the component types and basic component data in the project component list includes at least one of the following: When the component type in the project component list is motherboard, the motherboard basic data corresponding to the motherboard queried from the component basic data is exported to the reused motherboard list; When the component type in the project component list is a backplate, the backplate basic data corresponding to the backplate queried from the component basic data is exported to the reused backplate list. When the component type in the project component list is CPU, the CPU basic data corresponding to the CPU queried from the component basic data is exported to the reused CPU-motherboard list; When the component type in the project component list is memory, the memory basic data corresponding to the memory is retrieved from the component basic data and exported to the reused memory-motherboard list; When the component type in the project component list is power supply, the power supply basic data corresponding to the power supply queried in the component basic data will be exported to the reused power supply-motherboard list; When the component type in the project component list is a disk array card, the disk array card basic data corresponding to the disk array card queried in the component basic data is exported to the reusable disk array card-backplane list; When the component type in the project component list is a hard disk, the hard disk basic data corresponding to the hard disk is retrieved from the component basic data and exported to the reused hard disk-backplane list.

13. The method according to claim 1, characterized in that, If not, then based on the component information corresponding to the component under test in the component basic data, a test plan for the reused component is generated, including: When the component under test is an independent component and / or a combined component, an independent component matrix and / or a combined component matrix are established based on the encoding in the component's basic data; The test plan for the reused components is generated based on the independent component matrix and / or the combined component matrix.

14. The method according to claim 1, characterized in that, The step of searching for component reuse information of the component under test in the server project based on the reuse component test plan generated by the component under test includes: The test plan for the reusable components was reviewed; When the review result is passed, search for the component reuse information of the component under test in the server project.

15. The method according to claim 14, characterized in that, When the review result is passed, the component reuse information of the component under test in the server project is searched according to the set search method, including: When the test plan for the reused component corresponds to a motherboard, determine the inter-project motherboard set identification information corresponding to the motherboard code; Based on the motherboard set corresponding to the motherboard set identifier information, search for the motherboard test configuration information corresponding to the motherboard code; Based on the motherboard test configuration information, filter the motherboard test configuration information and motherboard test cases from the motherboard test case baseline of the component basic data; Based on the motherboard test case configuration information and motherboard test cases, determine the component reuse information of the motherboard; When the test plan for the reused component corresponds to a backplane, determine the backplane set identification information within the first project corresponding to the backplane code; Based on the backplate code in the first backplate set corresponding to the backplate set identifier information in the first item, a second backplate set including the backplate code is searched in the second item of the component basic data. Based on the inter-project backplane code determined by the second backplane set, search for the backplane test configuration information corresponding to the inter-project backplane code; Based on the backplane test configuration information, filter the backplane test configuration information and backplane test cases from the backplane test case baseline of the component basic data; Based on the backplane test case configuration information and the backplane test cases, determine the component reuse information of the backplane; When the test plan for the reused component corresponds to CPU-motherboard, determine the CPU-motherboard set identification information between the projects corresponding to the motherboard code; Based on the CPU-motherboard set corresponding to the CPU-motherboard set identifier information, the motherboard code in the CPU-motherboard set is matched with all CPU codes in the CPU-motherboard set; Based on the matching results, search for the test configuration information of the CPU-motherboard combination corresponding to the matching results; Based on the test configuration information of the CPU-motherboard combination, filter the CPU-motherboard test configuration information and CPU-motherboard test cases in the CPU test case baseline of the component basic data; Based on the CPU-motherboard test case configuration information and the CPU-motherboard test cases, determine the component reuse information of the CPU-motherboard; When the test plan for the reused component corresponds to memory-motherboard, determine the memory-motherboard set identification information between the projects corresponding to the motherboard code; Based on the memory-motherboard set corresponding to the memory-motherboard set identifier information, the motherboard code in the memory-motherboard set is matched with all memory codes in the memory-motherboard set; Based on the matching results, search for the test configuration information of the memory-motherboard combination corresponding to the matching results; Based on the test configuration information of the memory-motherboard combination, filter the memory-motherboard test configuration information and memory-motherboard test cases in the memory test case baseline of the component basic data; Based on the memory-motherboard test case configuration information and memory-motherboard test cases, determine the component reuse information of the memory-motherboard; When the test plan for the reused component corresponds to the power supply-motherboard, determine the inter-project power supply-motherboard set identification information corresponding to the motherboard code; Based on the power supply-motherboard set corresponding to the power supply-motherboard set identifier information, the motherboard code in the power supply-motherboard set is matched with all power supply codes in the power supply-motherboard set; Based on the matching results, search for the test configuration information of the power supply-motherboard combination corresponding to the matching results; Based on the test configuration information of the power supply-motherboard combination, filter the power supply-motherboard test configuration information and power supply-motherboard test cases from the power supply test case baseline of the component basic data; Based on the power supply-motherboard test case configuration information and the power supply-motherboard test cases, determine the component reuse information of the power supply-motherboard; When the test plan for the reused component corresponds to a disk array card-backplane, determine the inter-project disk array card-backplane set identification information corresponding to the backplane code and the inter-project disk array card set identification information corresponding to the disk array card code. The backplane code in the disk array card-backplane set corresponding to the disk array card-backplane set identification information is matched with all disk array card codes in the disk array card set corresponding to the disk array card set identification information. Based on the matching results, search for the test configuration information of the disk array card-backplane combination corresponding to the matching results; Based on the test configuration information of the disk array card-backplane combination, filter the disk array card-backplane test configuration information and disk array card-backplane test cases from the disk array card test case baseline of the component basic data; Based on the disk array card-backplane test configuration information and disk array card-backplane test cases, determine the component reuse information of the disk array card-backplane; When the test plan for the reused component corresponds to the hard disk-backplane, determine the hard disk-backplane set identification information between projects corresponding to the backplane code and the hard disk set identification information between projects corresponding to the hard disk code; The backplane code in the hard disk-backplane set corresponding to the hard disk-backplane set identification information is matched with the hard disk code, and matched with all silver disk codes in the hard disk set corresponding to the hard disk set identification information; Based on the matching results, search for the test configuration information of the hard drive-backplane combination corresponding to the matching results; Based on the test configuration information of the hard drive-backplane combination, filter the hard drive-backplane test configuration information and hard drive-backplane test cases from the hard drive test case baseline of the component basic data; Based on the hard drive-backplane test configuration information and the hard drive-backplane test cases, determine the component reuse information of the hard drive-backplane.

16. The method according to claim 1 or 15, characterized in that, The step of generating a test plan for the reused components of the server project under test based on the component reuse information includes: The component reuse information is reviewed; When the review result is passed, a test plan for the reused components of the server to be tested is generated based on the component reuse information.

17. The method according to claim 1, characterized in that, Also includes: Based on the reusable component testing plan, a project reusable component library is generated; Query the test results of the project under test according to the test plan based on the reusable component library; Output the test results.

18. The method according to claim 17, characterized in that, The step of querying the test results of the project under test according to the test plan based on the reused component library includes: Based on the component code of the component under test, search for the component test configuration information corresponding to the component under test in the project reuse component library; Based on the component test configuration information, filter the test case baseline test configuration information and test cases of the component test case baseline of the component to be tested from the component test case baseline in the component basic data; The test results are determined based on the baseline test configuration information and the test cases.

19. The method according to claim 18, characterized in that, Also includes: The number of reused test cases is determined based on one or more combinations of the number of components under test in the project under test, the total number of components in the project under test, the number of test case baselines for the components under test in the project under test, the number of test case references for the components under test in the project under test, and the number of sets corresponding to the components under test.

20. The method according to claim 19, characterized in that, The determination of the number of reused test cases based on one or more combinations of the following: the number of components under test in the project under test, the total number of components in the project under test, the number of test case baselines for the components under test in the project under test, the number of test case references for the components under test in the project under test, and the number of sets corresponding to the components under test, includes: When the component under test is a motherboard, the number of reused test cases is determined based on the number of motherboards in the project under test, the number of test case baselines for the motherboards in the project under test, and the number of motherboard test case references in the project under test. When the component under test is a backplane, the number of reused test cases is determined based on the number of backplanes in the project under test, the number of test case baselines for the backplanes in the project under test, and the number of reference test cases for the backplanes in the project under test. When the component under test is a CPU, the number of reused test cases is determined based on the number of CPUs in the test project, the number of test case baselines for the CPUs in the test project, the total number of CPUs in the test project, the number of sets corresponding to the motherboard, and the number of CPU test case references in the test project. When the component under test is memory, the number of reused test cases is determined based on the quantity of memory in the project under test, the number of test case baselines for memory in the project under test, the total quantity of memory in the project under test, the number of sets corresponding to the motherboard, and the reference number of memory test cases in the project under test. When the component under test is a power supply, the number of reused test cases is determined based on the number of power supplies in the project under test, the number of test case baselines for the power supply in the project under test, the total number of power supplies in the project under test, the number of sets corresponding to the motherboard, and the number of reference test cases for the power supply in the project under test. When the component under test is a disk array card, the number of reused test cases is determined based on the number of disk array cards in the project under test, the number of test case baselines for the disk array cards in the project under test, the total number of disk array cards in the project under test, the number of sets corresponding to the backplane, and the number of reference test cases for the disk array cards in the project under test. When the component under test is a hard drive, the number of reused test cases is determined based on the number of hard drives in the project under test, the number of test case baselines for the hard drives in the project under test, the total number of hard drives in the project under test, the number of sets corresponding to the backplane, and the number of reference test cases for the hard drives in the project under test.

21. A server reusable component test scheme generation device, characterized in that, include: The determining unit is used to determine, based on the list of components of the server project to be tested, whether there are any reusable components in the basic data of the components of the server project that match the components in the project to be tested; The selection unit selects the component to be tested in the current stage of the project under test based on the project component list and the reusable component list generated from the component basic data. The search unit searches for component reuse information of the component under test in the server project based on the reuse component test plan generated by the component under test. The generation unit is used to generate a test plan for the reused components of the server test item based on the component reuse information. The device further includes: Based on the reuse analysis of the internal components and / or inter-project components of the server project, generate a set of internal components and / or a set of inter-project components; The component basic data is determined based on the component set within the project and / or the component set between projects, as well as the component use case baseline; The internal and / or inter-project components include one or more components selected from motherboard, hard drive, disk array card and backplane; The step of searching for component reuse information of the component under test in the server project based on the reuse component test plan generated by the component under test includes: Based on the component under test, a test plan for the reusable component is generated according to the set test plan generation method; According to the reusable component test plan, search for component reuse information of the component under test in the server project; The step of generating a test plan for the reused component according to the component under test and the set test plan generation method includes: Determine whether the component under test belongs to the component set within the project in the component basic data; If so, then the test plan for the reusable component is generated based on the information in the set of components within the project. If not, then the test plan for the reused component is generated based on the component information corresponding to the component under test in the component basic data; If so, then based on the information in the set of components within the project, a test plan for the reused component is generated, including: When the component to be tested is an independent component, an independent component matrix is ​​established based on the set name and component code in the project's component set; Based on the triggering of the hyperlinks to the set names and component codes within the project in the independent component matrix, the reusable component test plan for the component under test is generated; When the component under test is a combination component, the model number of the first component in the combination component is used as the row, and the set name corresponding to the combination component and the code of the second component in the combination component are used as the column to establish a combination component matrix; The test plan for the reusable components is generated based on the combined component matrix.

22. A server reusable component test scheme generation system, characterized in that, include: Project component reuse module and computational strategy model solution automation module; The project component reuse module and the computational strategy model scheme automation module execute the server reuse component test scheme generation method according to any one of claims 1 to 20.

23. An electronic device, characterized in that, include: A memory for storing computer programs, which, when read and executed by a processor, execute the server multiplexing component test scheme generation method according to any one of claims 1-20.

24. A computer-readable storage medium, characterized in that, The system contains a computer program that, when executed by a processor, implements the server multiplexed component test scheme generation method as described in any one of claims 1-20.

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