Filter index determination method, apparatus, device, and storage medium

Abstract

The application provides a filter index determination method, device and equipment and a storage medium. The method comprises determining second data of the filter at a second temperature based on first data of the filter at a first temperature and preset data of the filter at the second temperature; and determining an index value of the filter at the second temperature based on the second data of the filter at the second temperature. The method is simple and efficient in evaluating the filter index under high and low temperature environments, low in cost and beneficial to production. The preset data of the filter is inversely deduced based on the first data of the filter at the first temperature and an index requirement corresponding to the index value, and a temperature range of the filter under the index requirement is determined according to the corresponding relationship between the preset data and the temperature.

Description

Technical Field

[0001] This invention relates to the field of optical fiber communication technology, and specifically to a method, apparatus, device, and storage medium for determining filter specifications. Background Technology

[0002] In optical communication systems, especially in wavelength division multiplexing (WDM) optical networks, filters are core components. Filters can typically be placed in front of a photodetector to form a tuned receiver, or they can be placed inside a laser cavity to form a wavelength-tunable light source. Filters have a wide range of applications.

[0003] In practical applications, changes in ambient temperature can cause wavelength shifts and insertion loss variations in filters, further impacting their performance and hindering the normal operation of communication networks. Therefore, we must pay attention not only to the filter's ambient temperature performance but also to its high and low temperature performance. Ambient temperature conditions for filters can be easily achieved through a constant temperature and humidity environment of 25°C, making ambient temperature testing simple and efficient. However, high and low temperature environments must be achieved using ovens with set temperatures. The heating and cooling cycles of these ovens are long and costly, hindering the selection of optimal performance parameters for production testing. The reason for this is the current lack of a suitable method for guiding this process.

[0004] There is currently no effective solution to the above problems. Summary of the Invention

[0005] In view of this, the main objective of the present invention is to provide a method, apparatus, device and storage medium for determining filter parameters.

[0006] To achieve the above objectives, the technical solution of the present invention is implemented as follows:

[0007] This invention provides a method for determining filter specifications, including:

[0008] Based on the first data of the filter at the first temperature and the preset data of the filter at the second temperature, the second data of the filter at the second temperature is determined;

[0009] Based on the second data of the filter at the second temperature, the index value of the filter at the second temperature is determined.

[0010] In the above scheme, determining the second data of the filter at the second temperature based on the first data of the filter at the first temperature and the preset data of the filter at the second temperature includes:

[0011] A first operation is performed on the first data of the filter at the first temperature and the preset data of the filter at the second temperature to obtain the second data of the filter at the second temperature.

[0012] In the above scheme, determining the index value of the filter at the second temperature based on the second data of the filter at the second temperature includes:

[0013] The filter's second data at the second temperature is processed by a second operation to obtain the filter's index value at the second temperature.

[0014] In the above scheme, the first data includes at least first insertion loss data; the preset data includes at least first preset insertion loss; the second data includes at least second insertion loss data; determining the second data of the filter at the second temperature based on the first data of the filter at the first temperature and the preset data of the filter at the second temperature includes:

[0015] Based on the first insertion loss data of the filter at the first temperature and the first preset insertion loss of the filter at the second temperature, the second insertion loss data of the filter at the second temperature is determined.

[0016] In the above scheme, the first data includes at least first wavelength data; the preset data includes at least a first preset wavelength; the second data includes at least second wavelength data; determining the second data of the filter at the second temperature based on the first data of the filter at the first temperature and the preset data of the filter at the second temperature includes:

[0017] Based on the first wavelength data of the filter at the first temperature and the first preset wavelength of the filter at the second temperature, the second wavelength data of the filter at the second temperature is determined.

[0018] In the above scheme, the first data includes at least the accuracy data of the filter at a first temperature; the preset data includes at least a first preset wavelength; the index value includes at least an accuracy index value; the method further includes:

[0019] Based on the first preset wavelength and the accuracy data of the filter at the first temperature, the accuracy index value of the filter at the second temperature is determined.

[0020] In the above scheme, the first data includes at least the insertion loss data of the filter within the effective bandwidth at the first temperature; the preset data includes at least a first preset insertion loss; the index value includes at least the insertion loss index value within the effective bandwidth; the method further includes:

[0021] Based on the first preset insertion loss and the insertion loss data of the filter within the effective bandwidth at the first temperature, the insertion loss index value of the filter within the effective bandwidth at the second temperature is determined.

[0022] In the above scheme, the second wavelength data includes a first wavelength value and a second wavelength value; the index value includes at least a bandwidth index value; determining the index value of the filter at the second temperature based on the second data of the filter at the second temperature includes:

[0023] Based on the first wavelength value and the second wavelength value of the filter at the second temperature, the bandwidth index value of the filter at the second temperature is determined.

[0024] In the above scheme, the index value includes at least a crosstalk index value; the method further includes:

[0025] Based on the insertion loss index value within the effective bandwidth of the filter at the second temperature, the crosstalk index value of the filter at the second temperature is determined.

[0026] This invention provides a filter index determination device, the device comprising: an interaction module, a control module, a storage module, and a calculation module; the control module is connected to the interaction module, the storage module, and the calculation module respectively.

[0027] The interaction module is used to input calculation instructions and send the calculation instructions to the control module;

[0028] The control module is used to receive the operation instruction, retrieve the operation task corresponding to the operation instruction from the storage module, and allocate the operation task to the module.

[0029] The computing module is used to receive the computing task, calculate the index value of the filter based on the computing task, and store the index value as the computing result in the storage module.

[0030] The storage module is used to store the computation task corresponding to the computation instruction, and to store the computation result.

[0031] In the above scheme, the device includes:

[0032] The control module is also used to send the calculation results stored in the storage module to the interaction module;

[0033] The interaction module is also used to receive and display the calculation results sent by the control module.

[0034] In the above scheme, the computing module includes: a laser emitting unit, a polarization control unit, a beam splitting unit, a filter under test, a power monitoring unit, and a computing unit;

[0035] The laser emitting unit is used to emit laser light with a specific wavelength;

[0036] The polarization control unit is used to control the laser traversal polarization state;

[0037] The beam splitting unit is used to split the laser beam into multiple paths;

[0038] The filter under test is used to transmit the laser;

[0039] The power monitoring unit is used to monitor the optical power of the laser;

[0040] The computing unit is used to perform calculations based on the first data and preset data corresponding to the optical power to obtain the second data, and to perform calculations on the index value of the filter based on the second data.

[0041] This invention provides a filter index determination device, comprising:

[0042] The first determining module is used to determine the second data of the filter at the second temperature based on the first data of the filter at the first temperature and the preset data of the filter at the second temperature;

[0043] The second determining module is used to determine the index value of the filter at the second temperature based on the second data of the filter at the second temperature.

[0044] This invention provides a filter index determination device, including a memory and a processor. The memory stores a computer program that can run on the processor, and the processor executes the program to implement the steps in the method described above.

[0045] This invention provides a computer-readable storage medium storing a computer program thereon, which, when executed by a processor, implements the steps of the method described above.

[0046] This invention provides a method, apparatus, device, and storage medium for determining filter performance. The method includes determining second data for the filter at a second temperature based on first data of the filter at a first temperature and preset data of the filter at a second temperature; and determining the filter's performance index value at the second temperature based on the second data of the filter at the second temperature. This method is simple and efficient for evaluating filter performance under high and low temperature environments, and is low-cost and conducive to production. Attached Figure Description

[0047] Figure 1 This is a schematic diagram illustrating the implementation process of the filter index determination method according to an embodiment of the present invention;

[0048] Figure 2 This is a schematic diagram of the wavelength-transmittance curve of the filter under normal temperature conditions in the filter index determination method of this invention embodiment;

[0049] Figure 3 This is a schematic diagram showing the wavelength-transmittance comparison curves at room temperature and high temperature for the filter index determination method in an embodiment of the present invention.

[0050] Figure 4 This is a partially enlarged view of the wavelength-transmittance comparison curves at room temperature and high temperature for the filter index determination method of this invention embodiment;

[0051] Figure 5 This is a schematic diagram illustrating the definition of center wavelength and accuracy data in the filter performance determination method according to an embodiment of the present invention.

[0052] Figure 6 This is a schematic diagram illustrating the insertion loss definition in the filter performance determination method according to an embodiment of the present invention.

[0053] Figure 7 This is a schematic diagram illustrating the bandwidth definition of the filter index determination method according to an embodiment of the present invention;

[0054] Figure 8 This is a schematic diagram illustrating the crosstalk definition in the filter index determination method of this invention.

[0055] Figure 9 This is a schematic diagram of the composition structure of the filter index determination device according to an embodiment of the present invention;

[0056] Figure 10 This is a schematic diagram of the composition structure of the filter index determination device according to an embodiment of the present invention;

[0057] Figure 11 This is a schematic diagram of a hardware entity structure of a filter index determination device according to an embodiment of the present invention. Detailed Implementation

[0058] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the specific technical solutions of the invention will be further described in detail below with reference to the accompanying drawings of the embodiments of the present invention. The following embodiments are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0059] In related technologies, the performance indicators of filters are greatly affected by temperature. In practical applications, it is necessary to pay attention not only to the filter's room temperature performance but also to its high and low temperature performance. The room temperature performance of filters can be easily measured in a constant-temperature production environment, but the high and low temperature environments of filters must be achieved by setting corresponding temperatures in an oven. The heating and cooling cycles of the oven are long, the cost is high, and it is not conducive to production. Currently, there is a lack of a method to guide this process.

[0060] This invention provides a method for determining filter parameters. This method is applied to a filter parameter determination device. The function implemented by this method can be achieved by the processor in the filter parameter determination device calling program code. Of course, the program code can be stored in a computer storage medium. It can be seen that the computing device includes at least a processor and a storage medium.

[0061] Figure 1 This is a schematic diagram illustrating the implementation process of the filter index determination method according to an embodiment of the present invention, as shown below. Figure 1 As shown, the method includes:

[0062] Step 101: Based on the first data of the filter at the first temperature and the preset data of the filter at the second temperature, determine the second data of the filter at the second temperature;

[0063] Step 102: Based on the second data of the filter at the second temperature, determine the index value of the filter at the second temperature.

[0064] In step 101: the process for determining the filter specifications can be determined based on actual circumstances and is not limited here. As an example, the method for determining the filter specifications could be a method for evaluating the high and low temperature performance of a filter.

[0065] The first temperature can be determined based on actual conditions and is not limited here. As an example, the first temperature can be any of the operating temperatures of the filter. Specifically, the first temperature can be the normal operating temperature of the filter, such as 25°C.

[0066] The first data can be determined according to the actual situation and is not limited here. As an example, the first data can be the first wavelength-transmittance data of the filter at a first temperature. In related technologies, insertion loss and transmittance have an inverse relationship, and the first wavelength-transmittance data characterizes the correspondence between the wavelength data and the insertion loss data of the filter at the first temperature.

[0067] The preset data can be determined based on actual conditions and is not limited here. As an example, the preset data may be data related to the filter at a second temperature.

[0068] The second data can be determined based on actual conditions and is not limited here. As an example, the second data can be the second wavelength-transmittance data of the filter at a second temperature. In related technologies, insertion loss and transmittance have an inverse relationship, and the second wavelength-transmittance data characterizes the correspondence between the wavelength data and insertion loss data of the filter at the second temperature. Furthermore, the second wavelength-transmittance data is determined based on the first wavelength-transmittance data and the data related to the filter at the second temperature.

[0069] In step 102: The second temperature can be determined according to actual conditions and is not limited here. As an example, the second temperature can be any temperature other than the first temperature among the operating temperatures of the filter. Specifically, the second temperature can be the maximum operating temperature of the filter, 65°C.

[0070] The step of determining the index value of the filter at the second temperature based on the second data of the filter at the second temperature can be achieved by determining the index value of the filter at the second temperature based on the second data of the filter at the second temperature and the preset definition of the index.

[0071] The specified index values ​​can be determined based on actual conditions and are not limited here. As an example, the index values ​​can be accuracy index values, insertion loss index values, bandwidth index values, crosstalk index values, passband flatness index values, and polarization-dependent loss index values, etc. The following embodiments use commonly used indexes, specifically including accuracy index values, insertion loss index values, bandwidth index values, and crosstalk index values, to illustrate the details.

[0072] This invention provides a method for determining filter performance indicators. Based on first data of the filter at a first temperature and preset data of the filter at a second temperature, second data of the filter at the second temperature are determined. Based on the second data of the filter at the second temperature, the performance indicator value of the filter at the second temperature is determined. This method is simple and efficient for evaluating filter performance indicators under high and low temperature environments, and is low in cost and conducive to production.

[0073] In an optional embodiment of the present invention, determining the second data of the filter at the second temperature based on the first data of the filter at a first temperature and the preset data of the filter at a second temperature includes:

[0074] A first operation is performed on the first data of the filter at the first temperature and the preset data of the filter at the second temperature to obtain the second data of the filter at the second temperature.

[0075] In this embodiment, the first computational process can be determined according to actual conditions and is not limited here. As an example, the first data of the filter at the first temperature and the preset data of the filter at the second temperature can be summed to determine the second data of the filter at the second temperature.

[0076] In an optional embodiment of the present invention, determining the index value of the filter at the second temperature based on the second data of the filter at the second temperature includes:

[0077] The filter's second data at the second temperature is processed by a second operation to obtain the filter's index value at the second temperature.

[0078] In this embodiment, the second computational processing can be determined according to the actual situation and is not limited here. As an example, the second computational processing can be any one of precision computation processing, insertion loss computation processing, bandwidth computation processing, or crosstalk computation processing.

[0079] The precision calculation process can be a precision calculation formula, which can be obtained by subtracting the second data of the filter at the second temperature from the standard data, thus obtaining the precision index value of the filter at the second temperature. The standard data can be data determined according to the International Telecommunication Union (ITU) standard, and the second data of the filter at the second temperature can be the center wavelength of the filter at the second temperature, where the center wavelength represents the wavelength value corresponding to the center of the spectral range covered by the peak insertion loss decrease (ndB).

[0080] The insertion loss calculation process can be performed by processing the second data of the filter at the second temperature to obtain the insertion loss index value of the filter at the second temperature. The second data can be the second wavelength-transmittance data.

[0081] The bandwidth calculation process can involve processing the second data of the filter at the second temperature, the preset frequency of the filter, and the speed of light to obtain the bandwidth index value of the filter at the second temperature. The second data of the filter at the second temperature can be the short-wavelength and long-wavelength values ​​corresponding to the spectral range covered by the peak insertion loss decrease (ndB).

[0082] The crosstalk calculation can be performed using a crosstalk calculation formula. This formula involves subtracting the second data of the filter at the second temperature from the insertion loss index value of the filter channel to obtain the crosstalk index value of the filter at the second temperature. The second data of the filter at the second temperature can be the minimum insertion loss index value of the filter channel within the corresponding effective bandwidth range.

[0083] In an optional embodiment of the present invention, the first data includes at least first insertion loss data; the preset data includes at least first preset insertion loss; the second data includes at least second insertion loss data; determining the second data of the filter at the second temperature based on the first data of the filter at the first temperature and the preset data of the filter at the second temperature includes:

[0084] Based on the first insertion loss data of the filter at the first temperature and the first preset insertion loss of the filter at the second temperature, the second insertion loss data of the filter at the second temperature is determined.

[0085] In this embodiment, the first insertion loss data can be determined according to actual conditions, and is not limited here. As an example, the first insertion loss data can be any insertion loss data among all insertion loss data of the filter at the first temperature.

[0086] The first preset insertion loss can be determined based on actual conditions and is not limited here. As an example, the first preset insertion loss can be data related to the filter at a second temperature. Specifically, the first preset insertion loss can be the temperature-dependent loss of the filter at its maximum operating temperature of 65°C.

[0087] The second insertion loss data can be determined based on actual conditions and is not limited here. As an example, the second insertion loss data can be any insertion loss data from all insertion loss data of the filter at the second temperature.

[0088] The step of determining the second insertion loss data of the filter at the second temperature based on the first insertion loss data of the filter at the first temperature and the first preset insertion loss of the filter at the second temperature can be achieved by summing the first insertion loss data and the first preset insertion loss to determine the second insertion loss data of the filter at the second temperature.

[0089] For ease of understanding, suppose we have a 48-channel filter (wavelength division multiplexer) with a channel spacing of 100GHz, and starting frequencies of 196100GHz and 191400GHz. According to the International Telecommunication Union (ITU) standard, one of the ITU wavelengths is selected as λ. ITU =1529.553nm(f ITU=196000GHz) channel. Figure 2 This is a schematic diagram of the wavelength-transmittance curve of the filter under normal temperature conditions in the filter index determination method of this invention embodiment, wherein... Figure 2 The ordinate represents the transmittance. Figure 2 The horizontal axis represents the wavelength. In related technologies, insertion loss and transmittance have an inverse relationship. The first wavelength-transmittance data of the channel at room temperature (25°C) is as follows: Figure 2 As shown, the temperature-dependent loss TDL of the filter at 65℃ is 0.2dB, and the insertion loss under high and low temperature conditions is calculated as shown in formula (1):

[0090] IL T =IL 25 +TDL (1)

[0091] In equation (1), IL T For the second insertion loss data under temperature T, IL 25 The first insertion loss data is at room temperature (25°C), and TDL is the temperature-dependent loss of the filter at 65°C relative to that at room temperature (25°C).

[0092] In an optional embodiment of the present invention, the first data includes at least first wavelength data; the preset data includes at least a first preset wavelength; the second data includes at least second wavelength data; determining the second data of the filter at the second temperature based on the first data of the filter at the first temperature and the preset data of the filter at the second temperature includes:

[0093] Based on the first wavelength data of the filter at the first temperature and the first preset wavelength of the filter at the second temperature, the second wavelength data of the filter at the second temperature is determined.

[0094] In this embodiment, the first wavelength data can be determined according to actual conditions, and is not limited here. As an example, the first wavelength data can be any wavelength data from all wavelength data of the filter at the first temperature.

[0095] The first preset wavelength can be determined based on actual conditions and is not limited here. As an example, the first preset wavelength can be data related to the filter at a second temperature. Specifically, the first preset wavelength can be the temperature-dependent wavelength of the filter at its maximum operating temperature of 65°C.

[0096] The second wavelength data can be determined based on actual conditions and is not limited here. As an example, the second wavelength data can be any wavelength data from all wavelength data of the filter at the second temperature.

[0097] The step of determining the second wavelength data of the filter at the second temperature based on the first wavelength data of the filter at the first temperature and the first preset wavelength of the filter at the second temperature can be achieved by summing the first wavelength data and the first preset wavelength to determine the second wavelength data of the filter at the second temperature.

[0098] For ease of understanding, the temperature-dependent wavelength TDW of the filter at 65℃ is 20pm, and the wavelength calculation formula for high and low temperature conditions is shown in (2):

[0099] WL T =WL 25 +TDW (2)

[0100] In equation (2), WL T The second wavelength data is for temperature T, WL 25 The first wavelength data is at room temperature (25°C), and TDW is the temperature-dependent wavelength of the filter at 65°C relative to that at room temperature (25°C). Figure 3 This is a schematic diagram showing the wavelength-transmittance comparison curves at room temperature and high temperature for the filter index determination method of this invention, wherein... Figure 3 The ordinate represents the transmittance. Figure 3 The horizontal axis represents the wavelength (Wavelength), and the second wavelength-transmittance data of the filter at 65°C is as follows: Figure 3 As shown. The... Figure 3 The range of the reduced ordinate is [-30, 0]. Figure 4 , Figure 4 This is a partially enlarged view of the wavelength-transmittance comparison curves at room temperature and high temperature for the filter index determination method of this invention, wherein... Figure 4 The ordinate represents the transmittance. Figure 4 The horizontal axis represents the wavelength, such as... Figure 4 As shown, the filter's wavelength shifts to longer wavelengths by 20 pm at 65°C, and the insertion loss of the filter increases by 0.2 dB at 65°C.

[0101] In an optional embodiment of the present invention, the first data includes at least the accuracy data of the filter at a first temperature; the preset data includes at least a first preset wavelength; the index value includes at least an accuracy index value; and the method further includes:

[0102] Based on the first preset wavelength and the accuracy data of the filter at the first temperature, the accuracy index value of the filter at the second temperature is determined.

[0103] In this embodiment, the accuracy data of the filter at the first temperature can be determined by: determining the standard center wavelength according to a preset criterion; processing the standard center wavelength and the center wavelength of the filter at the first temperature based on the preset method to determine the accuracy data of the filter at the first temperature; wherein, the center wavelength represents the wavelength value corresponding to the center of the spectral range covered by the peak insertion loss decrease ndB.

[0104] The process for determining the center wavelength can be determined according to the actual situation and is not limited here. As an example, the center wavelength of the filter under test at the first temperature is determined based on the first cutoff wavelength and the second cutoff wavelength of the filter at the first temperature; wherein, the first cutoff wavelength and the second cutoff wavelength are the wavelength values ​​corresponding to the peak insertion loss decrease ndB, and the first cutoff wavelength is smaller than the second cutoff wavelength.

[0105] The step of determining the standard center wavelength according to a preset criterion can be to select one of the ITU wavelengths as the standard center wavelength according to the ITU standard. The step of processing the standard center wavelength and the center wavelength of the filter at a first temperature based on the preset method to determine the accuracy data of the filter at the first temperature can be achieved by subtracting the center wavelength from the standard center wavelength to determine the accuracy data of the filter at the first temperature.

[0106] Based on the first preset wavelength and the accuracy data of the filter at the first temperature, the accuracy index value of the filter at the second temperature can be determined by summing the first preset wavelength and the accuracy data of the filter at the first temperature to determine the accuracy index value of the filter at the second temperature.

[0107] For ease of understanding, Figure 5 This is a schematic diagram illustrating the definition of center wavelength and accuracy data in the filter performance determination method according to an embodiment of the present invention, as shown below. Figure 5 As shown, assuming the center wavelength λ c Let the wavelength value at the center of the spectral range covered by the 3dB drop in peak insertion loss be the value of the wavelength. Then, the accuracy data of the filter at room temperature (25℃) is calculated as shown in formula (3):

[0108] Δλ T =λ c -λ ITU (3)

[0109] In equation (3), ΔλT This represents the accuracy data of the filter at the first temperature. The accuracy data at a normal temperature of 25℃ is calculated using formula (3) above as Δλ. T =-27pm. The accuracy index of the filter at 65℃ is calculated as shown in formula (4):

[0110] Δλ 65 =Δλ 25 +TDW = -7pm (4)

[0111] In equation (4), Δλ 65 Δλ represents the accuracy index of the filter at 65°C. 25 This refers to the accuracy data of the filter at a normal temperature of 25°C.

[0112] In some embodiments, the first data includes at least the center wavelength of the filter at a first temperature; the preset data includes at least a first preset wavelength; the second data includes at least the center wavelength of the filter at a second temperature; the index value includes at least a precision index value; the method further includes: determining the center wavelength of the filter at a second temperature based on the center wavelength of the filter at the first temperature and the first preset wavelength of the filter at the second temperature; wherein the center wavelength characterizes the wavelength value corresponding to the center of the spectral range covered by the peak insertion loss decrease ndB; and determining the precision index value of the filter at a second temperature based on the standard center wavelength and the center wavelength of the filter at the second temperature.

[0113] Specifically, the method further includes: summing the center wavelength of the filter at a first temperature and a first preset wavelength of the filter at a second temperature to obtain the center wavelength of the filter at the second temperature; wherein the center wavelength represents the wavelength value corresponding to the center of the spectral range covered by the peak insertion loss decrease ndB; and subtracting the center wavelength of the filter at the second temperature from the standard center wavelength to obtain the accuracy index value of the filter at the second temperature. In an optional embodiment of the present invention, the first data includes at least the insertion loss data of the filter within the effective bandwidth at the first temperature; the preset data includes at least the first preset insertion loss; the index value includes at least the insertion loss index value within the effective bandwidth; the method further includes:

[0114] Based on the first preset insertion loss and the insertion loss data of the filter within the effective bandwidth at the first temperature, the insertion loss index value of the filter within the effective bandwidth at the second temperature is determined.

[0115] In this embodiment, the insertion loss data of the filter within its effective bandwidth at the first temperature can be determined according to actual conditions. The insertion loss data within its effective bandwidth at the first temperature can be the maximum insertion loss within the effective bandwidth of the filter channel, the peak insertion loss, or the center wavelength insertion loss; no limitation is made here. The calculation approach for the insertion loss index is the same. It is particularly important to note that the peak insertion loss at high and low temperatures is only related to temperature-dependent losses and not to temperature-dependent wavelengths. As an example, the insertion loss data can be the maximum insertion loss within the effective bandwidth of the filter channel.

[0116] The first preset insertion loss can be determined based on actual conditions and is not limited here. As an example, the first preset insertion loss can be data related to the filter at a second temperature. Specifically, the first preset insertion loss can be the temperature-dependent loss of the filter at its maximum operating temperature of 65°C.

[0117] The step of determining the insertion loss index value of the filter in the effective bandwidth at the second temperature based on the first preset insertion loss and the insertion loss data of the filter in the first temperature can be achieved by summing the insertion loss index value of the filter in the effective bandwidth at the second temperature when the temperature-dependent wavelength of the filter at its maximum operating temperature of 65°C has little impact on the insertion loss index value of the filter in the effective bandwidth at the second temperature.

[0118] In some embodiments, the first data may be the first wavelength-transmittance data; the preset data includes at least a first preset insertion loss and a first preset wavelength; the second data may be the second wavelength-transmittance data; the index value includes at least an insertion loss index value within the effective bandwidth; the method further includes: determining the second wavelength-transmittance data of the filter at the second temperature based on the first wavelength-transmittance data of the filter at a first temperature and the first preset insertion loss and the first preset wavelength of the filter at a second temperature; and determining the insertion loss index value of the filter at the second temperature based on the second wavelength-transmittance data of the filter at the second temperature. For ease of understanding, Figure 6 This is a schematic diagram illustrating the insertion loss definition in the filter performance determination method of this invention. It is assumed that the insertion loss data represents the maximum insertion loss within the effective bandwidth of the channel. The insertion loss data within the effective bandwidth of the + / -12.5GHz channel at a normal temperature of 25°C is determined to be 5dB. Considering temperature-dependent loss and temperature-dependent wavelength, based on the second wavelength-transmittance data of the filter at 65°C, the insertion loss performance value of the filter at 65°C is calculated to be 5.2dB.

[0119] In an optional embodiment of the present invention, the second wavelength data includes a first wavelength value and a second wavelength value; the index value includes at least a bandwidth index value; determining the index value of the filter at the second temperature based on the second data of the filter at the second temperature includes:

[0120] Based on the first wavelength value and the second wavelength value of the filter at the second temperature, the bandwidth index value of the filter at the second temperature is determined.

[0121] In this embodiment, the first wavelength value and the second wavelength value can be the short wavelength value and the long wavelength value corresponding to the spectral range covered by the peak insertion loss reduction ndB.

[0122] The bandwidth metric value may include a first bandwidth metric value and a second bandwidth metric value. The first bandwidth metric value can be determined according to actual conditions and is not limited here. As an example, the first bandwidth metric value may be the full bandwidth. The second bandwidth metric value can be determined according to actual conditions and is not limited here. As an example, the second bandwidth metric value may be the net bandwidth.

[0123] The method of determining the bandwidth index value of the filter at the second temperature based on the first wavelength value and the second wavelength value of the filter can be as follows: determining a first bandwidth value based on the first wavelength value; determining a second bandwidth value based on the second wavelength value; summing the first bandwidth value and the second bandwidth value to obtain the first bandwidth index value; and summing the smaller bandwidth value between the first bandwidth value and the second bandwidth value twice to obtain the second bandwidth index value.

[0124] For ease of understanding, Figure 7 This is a schematic diagram illustrating the bandwidth definition of the filter index determination method according to an embodiment of the present invention, as shown below. Figure 7 As shown, assuming the ndB bandwidth is defined as the spectral width covered by the peak insertion loss reduction ndB, the full bandwidth = BW1 + BW2, and the net bandwidth = 2 × min(BW1, BW2). Therefore, the full bandwidth is not affected by temperature-dependent loss and temperature-dependent wavelength, while the net bandwidth is independent of temperature-dependent loss and only depends on the temperature-dependent wavelength. Furthermore, when the center wavelength λ... c =λ ITUAt this time, the 3dB net bandwidth is equivalent to the 3dB full bandwidth (generally speaking, the smaller the wavelength precision, the larger the net bandwidth, but since the center wavelength is the 3dB center wavelength, the net bandwidth of 0.5dB, 1.5dB, 10dB or 20dB is different). Based on the first wavelength-transmittance data at 25℃, the first wavelength value and the second wavelength value corresponding to the peak insertion loss of the filter decreasing by 3dB at 25℃ are calculated to be 1529.025nm and 1530.027nm, respectively. At this time, the calculation of the first bandwidth value BW1 and the second bandwidth value BW2 of the filter at 25℃ are as shown in formulas (5) and (6), respectively:

[0125] BW1 25 =c / 1529.025-196000=67.73GHz (5)

[0126] BW2 25 =196000-c / 1530.027=60.67GHz (6)

[0127] In equations (5) and (6), c represents the speed of light constant, and c = 299792458 m / s. Based on this, the filter's net bandwidth and full bandwidth at 25℃ are 121.34 GHz and 128.4 GHz, respectively. Considering the temperature-dependent wavelength TDW = 20 pm, the wavelength values ​​corresponding to a 3 dB decrease in peak insertion loss at 65℃ are calculated as shown in equations (7) and (8), respectively:

[0128] 1529.025+0.02=1529.045nm (7)

[0129] 1530.027+0.02=1530.047nm (8)

[0130] The filter has a first bandwidth value BW1 at 65°C. 65 With the second bandwidth value BW2 65 The calculations are shown in formulas (9) and (10) respectively:

[0131] BW1 65 =c / 1529.045-196000=65.16GHz (9)

[0132] BW2 65 =196000-c / 1530.047=63.24GHz (10)

[0133] According to the above formulas (9) and (10), the net bandwidth of the filter at 65℃ is calculated to be 126.48GHz, and the full bandwidth remains unchanged at 128.4GHz.

[0134] In an optional embodiment of the present invention, the index value includes at least a crosstalk index value; the method further includes:

[0135] Based on the insertion loss index value within the effective bandwidth of the filter at the second temperature, the crosstalk index value of the filter at the second temperature is determined.

[0136] In this embodiment, the crosstalk index value can be determined according to the actual situation and is not limited here. As an example, the crosstalk index value can be the adjacent crosstalk index value, the non-adjacent crosstalk index value, or the total crosstalk index value.

[0137] As an example, the adjacent crosstalk index (AX) can be defined as the difference between the insertion loss index of the filter channel and the minimum insertion loss index of the filter's adjacent channels within the corresponding effective bandwidth. The adjacent crosstalk index is typically the minimum of the left adjacent crosstalk and the right adjacent crosstalk. Specifically, the adjacent crosstalk index is defined as the difference between the maximum insertion loss within the effective bandwidth of the filter channel and the minimum insertion loss within the corresponding effective bandwidth of the filter's adjacent channels.

[0138] The non-adjacent crosstalk index (NX) can be defined as the difference between the insertion loss index of the filter channel and the minimum insertion loss index of the non-adjacent channels of the filter within the corresponding effective bandwidth. The non-adjacent crosstalk index is typically the minimum of all non-adjacent crosstalk values. Specifically, the non-adjacent crosstalk index is defined as the difference between the maximum insertion loss within the effective bandwidth of the filter channel and the minimum insertion loss within the corresponding effective bandwidth of the non-adjacent channels of the filter.

[0139] The total crosstalk (TX) can be defined as the sum of all adjacent crosstalk and non-adjacent crosstalk.

[0140] For ease of understanding, Figure 8 This is a schematic diagram illustrating the crosstalk definition in the filter index determination method of this invention, as shown in the example. Figure 8 As shown, based on the first wavelength-transmittance data of the filter at 25℃, the maximum insertion loss within the effective bandwidth of the filter channel is 5dB, and the minimum insertion loss of adjacent channels within their corresponding effective bandwidth is 12.58dB. Therefore, the adjacent crosstalk index of the filter at room temperature (25℃) is calculated to be 7.58dB. Similarly, based on the second wavelength-transmittance data of the filter at 65℃, the maximum insertion loss within the effective bandwidth of the filter channel is 5.2dB, and the minimum insertion loss of adjacent channels within their corresponding effective bandwidth is 13.6dB. Therefore, the adjacent crosstalk index of the filter at 65℃ is calculated to be 8.4dB.

[0141] like Figure 8As shown, non-adjacent crosstalk is typically taken as the minimum value among all non-adjacent crosstalk values. Based on the first wavelength-transmittance data of the filter at room temperature (25°C), the maximum insertion loss within the effective bandwidth of the filter channel is 5dB, and the minimum insertion loss of non-adjacent channels within the corresponding effective bandwidth is 43.33dB. Therefore, the non-adjacent crosstalk index of the filter at room temperature (25°C) is calculated to be 38.33dB. Similarly, based on the second wavelength-transmittance data of the filter at 65°C, the maximum insertion loss within the effective bandwidth of the filter channel is 5.2dB, and the minimum insertion loss of non-adjacent channels within the corresponding effective bandwidth is 43.53dB. Therefore, the non-adjacent crosstalk index of the filter at 65°C is calculated to be 38.53dB.

[0142] like Figure 8 As shown, assuming that total crosstalk is defined as the sum of all adjacent crosstalk and non-adjacent crosstalk, the calculation of total crosstalk for channel j is as shown in formula (11):

[0143]

[0144] In equation (11), 1 ≤ j ≤ N, 1 ≤ i ≤ N, N represents the total number of channels, and i, j, and N are all positive integers. AX j,i This represents the adjacent crosstalk of channel j to channel i, where AX j,j-1 Indicates left adjacent crosstalk, AX j,j+1 Indicates right adjacent crosstalk, NX j,i This represents the non-adjacent crosstalk between channel j and channel i, i.e., i≠j, j±1. Based on the first wavelength-transmittance data of the filter at room temperature (25℃), the total crosstalk index at 25℃ is calculated to be 5.66dB. Based on the second wavelength-transmittance data of the filter at 65℃, the total crosstalk index at 65℃ is calculated to be 5.76dB.

[0145] It should be noted that AX, NX and TX are not affected by temperature-dependent losses, but are affected by temperature-dependent wavelengths, although there is no strict rule.

[0146] In some embodiments, based on the method for evaluating the high and low temperature performance of a filter, the range of values ​​for TDW can be calculated when TDL is a given value; or the range of values ​​for TDL when TDW is a given value, thereby enabling precise selection of performance indicators. Furthermore, based on the first data of the filter at a first temperature and the corresponding performance requirements of the performance indicators, preset data for the filter, namely the TDL and TDW of the filter, can be derived. Then, according to the correspondence between the preset data and temperature, the temperature range of the filter under certain performance requirements can be determined.

[0147] This invention calculates second wavelength-transmittance data under high and low temperature conditions based on first wavelength-transmittance data at room temperature, combined with temperature-dependent loss and temperature-dependent wavelength under high and low temperature conditions. Based on the second wavelength-transmittance data and the defined indicators, corresponding wavelength accuracy, insertion loss, bandwidth, and crosstalk values ​​are calculated. Furthermore, this method can also calculate the temperature-dependent loss and temperature-dependent wavelength range under certain indicator requirements, allowing for more precise device selection. The evaluation method provided by this invention is simple, efficient, low-cost, and conducive to production.

[0148] Based on the above method, this embodiment of the invention also provides a filter index determination device, wherein the filter index determination device can be a device for evaluating the high and low temperature index of a filter. Figure 9 This is a schematic diagram of the composition structure of the filter index determination device according to an embodiment of the present invention, as shown below. Figure 9 As shown, the device 900 includes: an interaction module 901, a control module 902, a storage module 903, and a calculation module 904; the control module 902 is connected to the interaction module 901, the storage module 903, and the calculation module 904 respectively.

[0149] The interaction module 901 is used to input calculation instructions and send the calculation instructions to the control module;

[0150] The control module 902 is used to receive the operation instruction, retrieve the operation task corresponding to the operation instruction from the storage module, and allocate the operation task to the operation module.

[0151] The computing module 904 is used to receive the computing task, calculate the index value of the filter based on the computing task, and store the index value as the computing result in the storage module.

[0152] The storage module 903 is used to store the operation task corresponding to the operation instruction and to store the operation result.

[0153] In this embodiment, the interaction module 901 can be a web client, the control module 902 can be a server, the storage module 903 can be a database, and the calculation module 904 can be an indicator value calculation system. Indicator value calculation instructions are input through the web client and sent to the server. After receiving the indicator value calculation instructions, the server retrieves the recorded indicator value calculation tasks from the database and assigns the tasks to the indicator value calculation system. The indicator value calculation system records the results of the indicator value calculations in the database. Specifically, the web client is used to input the indicator value calculation instructions; the server is used to retrieve the corresponding indicator value calculation tasks from the database based on the instructions and assign them to the indicator value calculation system; the database records the indicator value calculation tasks and results corresponding to the instructions; and the indicator value calculation system receives the tasks and performs the calculations.

[0154] In an optional embodiment of the present invention, the device 900 further includes:

[0155] The control module 902 is also used to send the calculation results stored in the storage module 903 to the interaction module 901;

[0156] The interaction module 901 is also used to receive and display the calculation results sent by the control module 902.

[0157] In this embodiment, the calculation results of the indicator values ​​stored in the database are uploaded to the web interface via a server for display. The server is also used to send the calculation results of the indicator values ​​stored in the database to the web interface; the web interface is also used to receive and display the calculation results of the indicator values ​​sent by the server.

[0158] In an optional embodiment of the present invention, the computing module 904 includes: a laser emitting unit 9041, a polarization control unit 9042, a beam splitting unit 9043, a filter under test 9044, a power monitoring unit 9045, and a computing unit 9046.

[0159] The laser emitting unit 9041 is used to emit laser light with a specific wavelength;

[0160] The polarization control unit 9042 is used to control the laser traversal polarization state;

[0161] The beam splitting unit 9043 is used to split the laser beam into multiple paths;

[0162] The filter under test 9044 is used to pass the laser;

[0163] The power monitoring unit 9045 is used to monitor the optical power of the laser;

[0164] The calculation unit 9046 is used to calculate the second data based on the first data and preset data corresponding to the optical power, and to calculate the index value of the filter based on the second data.

[0165] In this embodiment, the laser emitting unit 9041 can be a tunable laser, the polarization control unit 9042 can be a polarization controller, the beam splitting unit 9043 can be a beam splitter, the power monitoring unit 9045 can be a multi-channel power meter, and the calculation unit 9046 can be an index value calculation device. The main function of the tunable laser is to emit light within a certain wavelength range; the main function of the polarization controller is to allow the incoming light to traverse all polarization states; the main function of the beam splitter is to split the light into multiple paths, enabling simultaneous testing of many devices, i.e., the devices share a single light source and polarization controller; the main function of the index value calculation device is to perform index value calculations; and the main function of the multi-channel power meter is to monitor the power value.

[0166] The tunable laser emits light, and the wavelength of the emitted light is scanned within a certain wavelength range. After passing through all polarization states by a polarization controller, the emitted light is split by a beam splitter. At this time, the beam splitter is first connected to the multi-channel power meter to obtain the stored light value; then the beam splitter is connected to the filter under test, and the light split by the beam splitter enters the filter under test respectively. After the light is output from the filter under test, it reaches the multi-channel power meter to obtain the power value. Combined with the synchronization function, the wavelength value is obtained, and the stored light value is subtracted to finally obtain the first data at the first temperature. The index value calculation device obtains the second data based on the first data and the preset data of the filter at the second temperature. The index value of the filter is calculated based on the second data. The first data can be the first wavelength-transmittance data, and the second data can be the second wavelength-transmittance data.

[0167] This invention embodiment completes the index value calculation of the filter through an index value calculation device. The index value calculation device provided by this invention embodiment sets the index value calculation system and database in the cloud, realizing flexible access and sharing of the device and data, which is convenient, efficient and conducive to production.

[0168] This invention also provides a filter index determination device. Figure 10 This is a schematic diagram of the composition structure of the filter index determination device according to an embodiment of the present invention, as shown below. Figure 10 As shown, the device 1000 includes:

[0169] The first determining module 1001 is used to determine the second data of the filter at the second temperature based on the first data of the filter at the first temperature and the preset data of the filter at the second temperature;

[0170] The second determining module 1002 is used to determine the index value of the filter at the second temperature based on the second data of the filter at the second temperature.

[0171] In other embodiments, the first determining module 1001 is further configured to perform a first calculation on the first data of the filter at a first temperature and the preset data of the filter at a second temperature to obtain the second data of the filter at the second temperature.

[0172] In other embodiments, the second determining module 1002 is further configured to perform a second calculation on the second data of the filter at the second temperature to obtain the index value of the filter at the second temperature.

[0173] In other embodiments, the first data includes at least first insertion loss data; the preset data includes at least first preset insertion loss; the second data includes at least second insertion loss data; the first determining module 1001 is further configured to determine the second insertion loss data of the filter at the second temperature based on the first insertion loss data of the filter at the first temperature and the first preset insertion loss of the filter at the second temperature.

[0174] In other embodiments, the first data includes at least first wavelength data; the preset data includes at least a first preset wavelength; the second data includes at least second wavelength data; the first determining module 1001 is further configured to determine the second wavelength data of the filter at a second temperature based on the first wavelength data of the filter at a first temperature and the first preset wavelength of the filter at a second temperature.

[0175] In other embodiments, the first data includes at least the accuracy data of the filter at a first temperature; the preset data includes at least a first preset wavelength; the index value includes at least an accuracy index value; the device 1000 further includes a third determining module, used to determine the accuracy index value of the filter at a second temperature based on the first preset wavelength and the accuracy data of the filter at the first temperature.

[0176] In other embodiments, the first data includes at least the insertion loss data of the filter within the effective bandwidth at a first temperature; the preset data includes at least a first preset insertion loss; the index value includes at least an insertion loss index value within the effective bandwidth; the device 1000 further includes a fourth determining module, used to determine the insertion loss index value of the filter within the effective bandwidth at a second temperature based on the first preset insertion loss and the insertion loss data of the filter within the effective bandwidth at a first temperature.

[0177] In other embodiments, the second wavelength data includes a first wavelength value and a second wavelength value; the index value includes at least a bandwidth index value; the second determining module 1002 is further configured to determine the bandwidth index value of the filter at a second temperature based on the first wavelength value and the second wavelength value of the filter at a second temperature.

[0178] In other embodiments, the index value includes at least a crosstalk index value; the device 1000 further includes a fifth determining module for determining the crosstalk index value of the filter at the second temperature based on the insertion loss index value within the effective bandwidth of the filter at the second temperature.

[0179] It should be noted that, in the embodiments of the present invention, if the above-described filter index determination method is implemented as a software functional module and sold or used as an independent product, it can also be stored in a computer-readable storage medium. Based on this understanding, the technical embodiments of the present invention, or the parts that contribute to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a filter index determination device (which may be a personal computer, server, or network device, etc.) to execute all or part of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), magnetic disks, or optical disks. Thus, the embodiments of the present invention are not limited to any specific hardware and software combination.

[0180] Correspondingly, embodiments of the present invention provide a filter index determination device, including a memory and a processor. The memory stores a computer program that can run on the processor. When the processor executes the program, it implements the steps in the filter index determination method provided in the above embodiments.

[0181] Correspondingly, embodiments of the present invention provide a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps in the filter index determination method provided in the above embodiments.

[0182] It should be noted that the descriptions of the storage medium and device embodiments above are similar to those of the method embodiments above, and have similar beneficial effects. For technical details not disclosed in the storage medium and device embodiments of the present invention, please refer to the descriptions of the method embodiments of the present invention for understanding.

[0183] It should be noted that, Figure 11 This is a schematic diagram of a hardware entity structure of a filter index determination device according to an embodiment of the present invention, such as... Figure 11 As shown, the hardware entity of the filter index determination device 1100 includes a processor 1101 and a memory 1103. Optionally, the filter index determination device 1100 may also include a communication interface 1102.

[0184] It is understood that memory 1103 can be volatile memory or non-volatile memory, or both. Non-volatile memory can be read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), ferromagnetic random access memory (FRAM), flash memory, magnetic surface memory, optical disc, or compact disc read-only memory (CD-ROM); magnetic surface memory can be disk storage or magnetic tape storage. Volatile memory can be random access memory (RAM), which is used as an external cache. By way of example, but not limitation, many forms of RAM are available, such as Static Random Access Memory (SRAM), Synchronous Static Random Access Memory (SSRAM), Dynamic Random Access Memory (DRAM), Synchronous Dynamic Random Access Memory (SDRAM), Double Data Rate Synchronous Dynamic Random Access Memory (DDRSDRAM), Enhanced Synchronous Dynamic Random Access Memory (ESDRAM), SyncLink Dynamic Random Access Memory (SLDRAM), and Direct Rambus Random Access Memory (DRRAM).The memory 1103 described in this embodiment of the invention is intended to include, but is not limited to, these and any other suitable types of memory.

[0185] The methods disclosed in the above embodiments of the present invention can be applied to processor 1101, or implemented by processor 1101. Processor 1101 may be an integrated circuit chip with signal processing capabilities. In the implementation process, each step of the above method can be completed by the integrated logic circuit of the hardware in processor 1101 or by instructions in the form of software. The processor 1101 may be a general-purpose processor, a digital signal processor (DSP), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. Processor 1101 can implement or execute the methods, steps, and logic block diagrams disclosed in the embodiments of the present invention. The general-purpose processor may be a microprocessor or any conventional processor, etc. The steps of the methods disclosed in the embodiments of the present invention can be directly manifested as being executed by a hardware decoding processor, or being executed by a combination of hardware and software modules in the decoding processor. The software modules may be located in a storage medium, which is located in memory 1103. Processor 1101 reads the information in memory 1103 and completes the steps of the aforementioned method in conjunction with its hardware.

[0186] In an exemplary embodiment, the filter metric determination device may be implemented by one or more application-specific integrated circuits (ASICs), DSPs, programmable logic devices (PLDs), complex programmable logic devices (CPLDs), field-programmable gate arrays (FPGAs), general-purpose processors, controllers, microcontrollers (MCUs), microprocessors, or other electronic components to perform the aforementioned method.

[0187] In the several embodiments provided by this invention, it should be understood that the disclosed methods and apparatus can be implemented in other ways. The apparatus embodiments described above are merely illustrative. For example, the division of units is only a logical functional division, and in actual implementation, there may be other division methods, such as: multiple units or components may be combined, or integrated into another observation, or some features may be ignored or not executed. In addition, the communication connections between the various components shown or discussed may be through some interfaces, indirect coupling or communication connections between devices or units, and may be electrical, mechanical, or other forms.

[0188] The units described above as separate components may or may not be physically separate. The components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of the units may be selected to achieve the purpose of this embodiment according to actual needs.

[0189] Those skilled in the art will understand that all or part of the steps of the above method embodiments can be implemented by hardware related to program instructions. The aforementioned program can be stored in a computer-readable storage medium. When the program is executed, it performs the steps of the above method embodiments. The aforementioned storage medium includes various media that can store program code, such as mobile storage devices, read-only memory (ROM), magnetic disks, or optical disks.

[0190] Alternatively, if the integrated units described above in the embodiments of the present invention are implemented as software functional units and sold or used as independent products, they can also be stored in a computer-readable storage medium. Based on this understanding, the technical embodiments of the present invention, or the parts that contribute to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a filter index determining device (which may be a personal computer, server, or network device, etc.) to execute all or part of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as mobile storage devices, ROM, magnetic disks, or optical disks.

[0191] The filter index determination method, apparatus, and computer storage medium described in this invention are only examples of the embodiments of this invention, but are not limited thereto. Any method, apparatus, and computer storage medium related to the filter index determination are within the protection scope of this invention.

[0192] It should be understood that the phrase "one embodiment" or "an embodiment" throughout the specification means that a specific feature, structure, or characteristic related to the embodiment is included in at least one embodiment of the invention. Therefore, "in one embodiment" or "in an embodiment" appearing throughout the specification does not necessarily refer to the same embodiment. Furthermore, these specific features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. It should be understood that in the various embodiments of the invention, the sequence numbers of the above-described processes do not imply a sequential order of execution; the execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the invention. The sequence numbers of the above-described embodiments of the invention are merely descriptive and do not represent the superiority or inferiority of the embodiments.

[0193] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0194] The above description is merely an embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in the present invention should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A filter finger print determination method, characterized by, The method comprises: determining second data of the filter at a second temperature based on first data of the filter at a first temperature and preset data of the filter at the second temperature, wherein the first data comprises at least first wavelength-transmittance data, the preset data comprises one or more of first preset insertion loss and first preset wavelength, and the second data comprises at least second wavelength-transmittance data; determining an index value of the filter at the second temperature based on the second data of the filter at the second temperature, wherein the index value comprises one or more of an accuracy index value, an insertion loss index value, a bandwidth index value, a crosstalk index value, a passband flatness index value and a polarization dependent loss index value.

2. The method of claim 1, wherein, The determining of the second data of the filter at the second temperature based on the first data of the filter at the first temperature and the preset data of the filter at the second temperature comprises: performing first operation processing on the first data of the filter at the first temperature and the preset data of the filter at the second temperature to obtain the second data of the filter at the second temperature.

3. The method of claim 1, wherein, The determining of the index value of the filter at the second temperature based on the second data of the filter at the second temperature comprises: performing second operation processing on the second data of the filter at the second temperature to obtain the index value of the filter at the second temperature.

4. The method of claim 1, wherein, The first data comprises at least first insertion loss data, the second data comprises at least second insertion loss data, and the determining of the second data of the filter at the second temperature based on the first data of the filter at the first temperature and the preset data of the filter at the second temperature comprises: determining second insertion loss data of the filter at the second temperature based on first insertion loss data of the filter at the first temperature and first preset insertion loss of the filter at the second temperature.

5. The method of claim 1, wherein, The first data comprises at least first wavelength data, the second data comprises at least second wavelength data, and the determining of the second data of the filter at the second temperature based on the first data of the filter at the first temperature and the preset data of the filter at the second temperature comprises: determining second wavelength data of the filter at the second temperature based on first wavelength data of the filter at the first temperature and first preset wavelength of the filter at the second temperature.

6. The method of claim 1, wherein, The first data comprises at least accuracy data of the filter at the first temperature, and the method further comprises: determining an accuracy index value of the filter at the second temperature based on the first preset wavelength and the accuracy data of the filter at the first temperature.

7. The method of claim 1, wherein, The first data comprises at least insertion loss data of the filter within an effective bandwidth at the first temperature, and the method further comprises: determining an insertion loss index value of the filter within the effective bandwidth at the second temperature based on the first preset insertion loss and the insertion loss data of the filter within the effective bandwidth at the first temperature.

8. The method of claim 5, wherein, The second wavelength data comprises first wavelength values and second wavelength values, and the determining of the index value of the filter at the second temperature based on the second data of the filter at the second temperature comprises: Determine a bandwidth index value of the filter at the second temperature based on the first wavelength value and the second wavelength value at the second temperature of the filter.

9. The method of claim 7, wherein, The method further comprises: Determine a crosstalk index value of the filter at the second temperature based on the insertion loss index value within the effective bandwidth at the second temperature of the filter.

10. A filter finger print determination apparatus characterized by, The device comprises an interaction module, a control module, a storage module and an operation module; the control module is connected with the interaction module, the storage module and the operation module respectively; The interaction module is configured to input an operation instruction and send the operation instruction to the control module; The control module is configured to receive the operation instruction, call an operation task corresponding to the operation instruction in the storage module, and distribute the operation task to the operation module; The operation module is configured to receive the operation task, calculate an index value of the filter based on the operation task, and store the index value as an operation result in the storage module; wherein the calculation of the index value of the filter based on the operation task comprises: determining second data at the second temperature of the filter based on first data at the first temperature of the filter and preset data at the second temperature of the filter; wherein the first data at least comprises first wavelength-transmittance data, the preset data comprises one or more of first preset insertion loss and first preset wavelength, and the second data at least comprises second wavelength-transmittance data; determining the index value of the filter at the second temperature based on the second data at the second temperature of the filter; wherein the index value comprises one or more of accuracy index value, insertion loss index value, bandwidth index value, crosstalk index value, passband flatness index value and polarization-dependent loss index value; The storage module is configured to store the operation task corresponding to the operation instruction and store the operation result.

11. The apparatus of claim 10, wherein, Comprise: The control module is further configured to send the operation result stored in the storage module to the interaction module; The interaction module is further configured to receive and display the operation result sent by the control module.

12. The apparatus of claim 10, wherein, The operation module comprises a laser emission unit, a polarization control unit, a light splitting unit, a filter to be measured, a power monitoring unit and an operation unit; The laser emission unit is configured to emit laser with wavelength; The polarization control unit is configured to control the laser to traverse polarization state; The light splitting unit is configured to split the laser; The filter to be measured is configured to pass through the laser; The power monitoring unit is configured to monitor the optical power of the laser; The operation unit is configured to perform operation on the first data corresponding to the optical power and the preset data to obtain second data, and perform operation on the index value of the filter based on the second data.

13. A filter finger print determination apparatus, characterized by, Comprise: The first determining module is configured to determine second data of the filter at a second temperature based on first data of the filter at a first temperature and preset data of the filter at the second temperature, wherein the first data at least includes first wavelength-transmittance data, the preset data includes one or more of first preset insertion loss and first preset wavelength, and the second data at least includes second wavelength-transmittance data. The second determining module is configured to determine an index value of the filter at the second temperature based on the second data of the filter at the second temperature, wherein the index value includes one or more of an accuracy index value, an insertion loss index value, a bandwidth index value, a crosstalk index value, a passband flatness index value, and a polarization dependent loss index value.

14. A filter index determination device comprising a memory and a processor, said memory storing a computer program operable on the processor, characterized in that, The processor implements the steps in the method of any one of claims 1 to 9 when executing the program.

15. A computer readable storage medium having stored thereon a computer program, characterized in that, The computer program implements the steps in the method of any one of claims 1 to 9 when executed by the processor.

Images