Voltage Regulator Test Equipment

Abstract

The present application relates to a voltage regulator testing device. The voltage regulator testing device includes: a detection component; a test sub-board, which is detachably connected to the voltage regulator to be tested, so that the multiple pins of the voltage regulator to be tested are respectively connected to the multiple contacts of the test sub-board; a test motherboard, the test motherboard includes a pin configuration component, the test motherboard is detachably connected to the test sub-board, so that the first end of the pin configuration component is respectively connected to the multiple contacts of the test sub-board, and the second end of the pin configuration component is connected to the detection component, the pin configuration component is used to transmit the detection signal of the detection component to the voltage regulator to be tested through the multiple contacts of the test sub-board, and transmit the test signal fed back and output by the voltage regulator to be tested to the detection component. The voltage regulator testing device of the present application can reduce the testing cost and improve the testing progress.

Description

Technical Field

[0001] The present application relates to the technical field of chip testing, and in particular to a voltage regulator testing device. Background Art

[0002] A voltage regulator is a component used to maintain voltage stability. In applications, voltage regulators have many different package types such as SOT-223, TO-3, TO-39, TO-263, etc., and the pin arrangement positions of voltage regulator chips of the same package type may also be different.

[0003] When testing the voltage regulator, a dedicated test device must be designed according to the different pin arrangement positions of each voltage regulator, which is not only costly but also delays the screening and testing progress. Summary of the invention

[0004] Based on this, it is necessary to provide a voltage regulator testing device to address the above technical problems, which can reduce testing costs and improve testing progress.

[0005] A voltage regulator testing device, the device comprising:

[0006] Detection components;

[0007] A test sub-board is detachably connected to the voltage regulator to be tested, so that a plurality of pins of the voltage regulator to be tested are respectively connected to a plurality of contacts of the test sub-board;

[0008] A test motherboard, the test motherboard includes a pin configuration component, the test motherboard is detachably connected to the test daughter board, so that the first end of the pin configuration component is respectively connected to multiple contacts of the test daughter board, and the second end of the pin configuration component is connected to the detection component, the pin configuration component is used to transmit the detection signal of the detection component to the voltage regulator to be tested through the multiple contacts of the test daughter board, and transmit the test signal fed back and output by the voltage regulator to be tested to the detection component.

[0009] In one embodiment, the detection component includes:

[0010] a power supply unit connected to the second end of the pin configuration component and used for providing a detection signal to the voltage regulator to be tested through the pin configuration component and the test sub-board;

[0011] The detection unit is connected to the second end of the pin configuration component, and is used to receive the test signal of the voltage regulator to be tested through the pin configuration component and the test sub-board, and generate a test result based on the test signal.

[0012] In one embodiment, the plurality of contacts of the test daughter board include a first contact, a second contact and a third contact; and the pin configuration component includes:

[0013] a first configuration unit, wherein a first end of the first configuration unit is connected to a first contact of the test sub-board, a second end of the first configuration unit is respectively connected to the power supply unit, the detection unit and a common ground, when the first configuration unit is in a first working state, the first configuration unit is used to transmit a detection signal of the detection component to the first contact of the test sub-board, when the first configuration unit is in a second working state, the first configuration unit is used to transmit a test signal output by the voltage regulator to be tested to the detection component, and when the first configuration unit is in a third state, the first contact of the test sub-board is connected to the common ground;

[0014] a second configuration unit, wherein a first end of the second configuration unit is connected to a second contact of the test sub-board, a second end of the second configuration unit is respectively connected to the power supply unit, the detection unit and the common ground, when the second configuration unit is in a first working state, the second configuration unit is used to transmit a detection signal of the detection component to the second contact of the test sub-board, when the second configuration unit is in a second working state, the second configuration unit is used to transmit a test signal output by the voltage regulator to be tested to the detection component, and when the second configuration unit is in a third state, the second contact of the test sub-board is connected to the common ground;

[0015] a third configuration unit, wherein a first end of the third configuration unit is connected to a third contact of the test sub-board, a second end of the third configuration unit is respectively connected to the power supply unit, the detection unit and the common ground, and when the third configuration unit is in a first working state, the third configuration unit is used to transmit a detection signal of the detection component to the third contact of the test sub-board, and when the third configuration unit is in a second working state, the third configuration unit is used to transmit a test signal output by the voltage regulator to be tested to the detection component, and when the third configuration unit is in a third state, the third contact of the test sub-board is connected to the common ground;

[0016] The first configuration unit, the second configuration unit and the third configuration unit are in different working states at the same time.

[0017] In one embodiment, the first configuration unit includes:

[0018] a first relay, wherein a first end of the first relay is connected to a first contact of the test sub-board, and a second end of the first relay is connected to the power supply unit;

[0019] a second relay, wherein a first end of the second relay is connected to the first contact of the test sub-board, and a second end of the second relay is connected to the detection unit;

[0020] A third relay, wherein a first end of the third relay is connected to the first contact of the test sub-board, and a second end of the third relay element is connected to the common ground.

[0021] In one embodiment, the second configuration unit includes:

[0022] a fourth relay, wherein a first end of the fourth relay is connected to the second contact of the test sub-board, and a second end of the fourth relay is connected to the power supply unit;

[0023] a fifth relay, wherein a first end of the fifth relay is connected to the second contact of the test sub-board, and a second end of the fifth relay is connected to the detection unit;

[0024] A sixth relay, wherein a first end of the sixth relay is connected to the second contact of the test sub-board, and a second end of the sixth relay is connected to the common ground.

[0025] In one embodiment, the third configuration unit includes:

[0026] a seventh relay, wherein a first end of the seventh relay is connected to the third contact of the test sub-board, and a second end of the seventh relay is connected to the power supply unit;

[0027] an eighth relay, a first end of the eighth relay being connected to the third contact of the test sub-board, and a second end of the eighth relay being connected to the detection unit;

[0028] A ninth relay, wherein a first end of the ninth relay is connected to the third contact of the test sub-board, and a second end of the ninth relay is connected to the common ground.

[0029] In one embodiment, the test motherboard further includes:

[0030] The capacitor configuration component is respectively connected to the first contact, the second contact and the third contact of the test sub-board, and is used for filtering the detection signal or the test signal.

[0031] In one embodiment, the capacitor configuration component includes:

[0032] A first capacitor configuration unit includes a plurality of first filter circuits. When the first capacitor configuration unit is in a first target state, a target first filter circuit is conductively connected to a first contact of the test sub-board, and the target first filter circuit is one of the plurality of first filter circuits.

[0033] A second capacitor configuration unit includes a plurality of second filter circuits. When the second capacitor configuration unit is in a second target state, the target second filter circuit is conductively connected to the second contact of the test sub-board, and the target second filter circuit is one of the plurality of second filter circuits.

[0034] The third capacitor configuration unit includes multiple third filter circuits. When the third capacitor configuration unit is in a third target state, the target third filter circuit is conductively connected to the third contact of the test sub-board, and the target third filter circuit is one of the multiple third filter circuits.

[0035] In one embodiment, the first filter circuit includes a first filter capacitor; the second filter circuit includes a second filter capacitor; and the third filter circuit includes a third filter capacitor.

[0036] In one embodiment, the number of the first filter circuit, the number of the second filter circuit and the number of the third filter circuit are four respectively.

[0037] The voltage regulator test device comprises a detection component, a test sub-board and a test motherboard. The test sub-board is detachably connected to the voltage regulator to be tested. When testing the voltage regulator to be tested, firstly, multiple pins of the voltage regulator to be tested are respectively connected to multiple contacts of the test sub-board to fix the voltage regulator to be tested on the test sub-board, and then the test sub-board is connected to the test motherboard, so that multiple pins of the voltage regulator to be tested are connected to the first end of the pin configuration component on the test motherboard through multiple corresponding contacts of the test sub-board. Since the second end of the pin configuration component is connected to the detection component, the voltage regulator to be tested can receive the detection signal from the detection component through the corresponding contacts of the test sub-board and the pin configuration component, and the generated test signal is fed back and output to the detection component through the pin configuration component and the corresponding contacts of the test sub-board. For voltage regulators to be tested with different packaging models, it is only necessary to use the voltage regulator testing device of the present application, replace the test sub-board of the voltage regulator to be tested with the different packaging models, and connect the test sub-board to the universal test motherboard, so that voltage regulators of different packaging models and voltage regulators of the same packaging model but with different pin arrangement positions can be tested, which can not only reduce the testing cost of the voltage regulator, but also improve the efficiency of the voltage regulator. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the conventional technology, the drawings required for use in the embodiments or the conventional technology descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0039] Figure 1 A schematic diagram of the structure of a voltage regulator testing device in one embodiment;

[0040] Figure 2 It is a structural schematic diagram of a voltage regulator testing device in another embodiment;

[0041] Figure 3 A schematic diagram of the structure of a voltage regulator testing device in yet another embodiment;

[0042] Figure 4 It is a structural schematic diagram of a voltage regulator testing device in yet another embodiment;

[0043] Figure 5 It is a structural schematic diagram of a voltage regulator testing device in yet another embodiment;

[0044] Figure 6 FIG. 4 is a schematic diagram of the structure of a voltage regulator testing device in yet another embodiment.

[0045] Explanation of the accompanying drawings: 1-detection component, 11-power supply unit, 12-detection unit, 2-test sub-board, 3-test motherboard, 31-pin configuration component, 311-first configuration unit, 312-second configuration unit, 313-third configuration unit, 32-capacitor configuration component, 321-first capacitor configuration unit, 3211-first filtering circuit, 322-second capacitor configuration unit, 3221-second filtering circuit, 323-third capacitor configuration unit, 3231-third filtering circuit, 4-voltage regulator to be tested. DETAILED DESCRIPTION

[0046] In order to facilitate understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. Embodiments of the present application are provided in the drawings. However, the present application can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present application more thorough and comprehensive.

[0047] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used herein in the specification of this application are only for the purpose of describing specific embodiments and are not intended to limit this application.

[0048] It can be understood that the terms "first", "second", etc. used in the present application can be used in this article to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish the first element from another element.

[0049] It should be noted that when an element is considered to be "connected" to another element, it can be directly connected to the other element, or connected to the other element through an intermediate element. In addition, the "connection" in the following embodiments should be understood as "electrical connection", "communication connection", etc. if there is transmission of electrical signals or data between the connected objects.

[0050] When used herein, the singular forms "a", "an", and "said / the" may also include plural forms, unless the context clearly indicates otherwise. It should also be understood that the terms "include / comprise" or "have" etc. specify the presence of stated features, wholes, steps, operations, components, parts or combinations thereof, but do not exclude the possibility of the presence or addition of one or more other features, wholes, steps, operations, components, parts or combinations thereof.

[0051] In one embodiment, Figure 1 As shown, the present application provides a voltage regulator testing device, which includes a detection component 1, a testing daughter board 2 and a testing mother board 3.

[0052] The test sub-board 2 is detachably connected to the voltage regulator 4 to be tested, so that the multiple pins of the voltage regulator 4 to be tested are respectively connected to the multiple contacts of the test sub-board 2. The test motherboard 3 includes a pin configuration component 31, and the test motherboard 3 is detachably connected to the test sub-board 2, so that the first end of the pin configuration component 31 is respectively connected to the multiple contacts of the test sub-board 2, and the second end of the pin configuration component 31 is connected to the detection component 1. The pin configuration component 31 is used to transmit the detection signal of the detection component 1 to the voltage regulator 4 to be tested through the multiple contacts of the test sub-board 2, and transmit the test signal fed back and output by the voltage regulator 4 to be tested to the detection component 1.

[0053] It can be understood that when the voltage regulator needs to be tested, the voltage regulator 4 to be tested is first fixed on the test sub-board 2, and the multiple pins of the voltage regulator 4 to be tested can be connected to the multiple contacts of the test sub-board 2. Specifically, the first pin A1 of the voltage regulator 4 to be tested is connected to the first contact F1 of the test sub-board 2, the second pin A2 of the voltage regulator 4 to be tested is connected to the second contact F2 of the test sub-board 2, and the third pin A3 of the voltage regulator 4 to be tested is connected to the third contact F3 of the test sub-board 2. After that, the test sub-board 2 can be spliced ​​with the test motherboard 3, so that the pins of the voltage regulator 4 to be tested can be connected to the pin configuration component 31 on the test motherboard 3 through the contacts of the test sub-board 2, and then connected to the detection component 1 through the pin configuration component 31. When the connection between the voltage regulator 4 to be tested and the test sub-board 2, and the connection between the test sub-board 2 and the test motherboard 3 is completed, the pin configuration component 31 can be controlled to be in a corresponding working state according to the type of each pin of the voltage regulator 4 to be tested, so that the detection signal of the detection component 1 can be transmitted to the voltage regulator 4 to be tested through the pin configuration component 31 and multiple contacts of the test sub-board 2, and the detection component 1 can receive the test signal feedback output by the voltage regulator 4 to be tested through the pin configuration component 31 and multiple contacts of the test sub-board 2.

[0054] In the application, since there are differences in the size and number of pins of voltage regulators of different package models, it is only necessary to design a test sub-board according to the package model of the voltage regulator to be tested, so as to lead the IN pin, GND pin and OUT pin of the voltage regulator to be tested to the first contact F1, the second contact F2 and the third contact F3 of the test sub-board, and then the voltage regulator can be tested through the detection component and the pin configuration component and the capacitor configuration component on the test motherboard. It should be noted that no matter what package model of voltage regulator the test sub-board is suitable for, the test sub-board and the test motherboard in the present application can be connected to realize the corresponding connection between the pin configuration component and the multiple contacts of the test sub-board 2.

[0055] The voltage regulator test device includes a detection component, a test sub-board and a test motherboard. The test sub-board is detachably connected to the voltage regulator to be tested. When testing the voltage regulator to be tested, firstly, multiple pins of the voltage regulator to be tested are respectively connected to multiple contacts of the test sub-board to fix the voltage regulator to be tested on the test sub-board, and then the test sub-board is connected to the test motherboard, so that multiple pins of the voltage regulator to be tested are connected to the first end of the pin configuration component on the test motherboard through multiple corresponding contacts of the test sub-board. Since the second end of the pin configuration component is connected to the detection component, the voltage regulator to be tested can receive the detection signal from the detection component through the corresponding contacts of the test sub-board and the pin configuration component, and the generated test signal is fed back and output to the detection component through the pin configuration component and the corresponding contacts of the test sub-board. Through the voltage regulator test device of the present application, voltage regulators of different packaging models and the same packaging model but with different pin arrangement positions can be tested, which can not only reduce the testing cost of the voltage regulator, but also improve the efficiency of the voltage regulator.

[0056] In one embodiment, Figure 2 As shown, the detection component 1 includes: a power supply unit 11 and a detection unit 12. The power supply unit 11 is connected to the second end of the pin configuration component 31, and is used to provide a detection signal to the voltage regulator 4 to be tested through the pin configuration component 31 and the test sub-board 2. The detection unit 12 is connected to the second end of the pin configuration component 31, and is used to receive the test signal of the voltage regulator 4 to be tested through the pin configuration component 31 and the test sub-board 2, and generate a test result based on the test signal.

[0057] In the application, the voltage regulator receives the power supply signal through the IN pin, is grounded through the GND pin, and outputs the feedback signal through the OUT pin. Since the pin types and pin arrangement sequences of voltage regulators of different package types are different, and even the pin arrangement sequences of voltage regulators of the same package type are different, after determining the pin types of the voltage regulator 4 to be tested, the working state of the control pin configuration component 31 can be controlled so that the detection signal output by the power supply unit 11, i.e., the power supply signal, can be sent to the IN pin of the voltage regulator 4 to be tested through the pin configuration component 31 and the corresponding contacts of the test sub-board 2, and the detection unit 12 can receive the feedback signal output by the OUT pin of the voltage regulator 4 to be tested, i.e., the test signal, through the pin configuration component 31 and the corresponding contacts of the test sub-board 2 by the working state of the control pin configuration component 31.

[0058] Exemplarily, after determining that the second pin A2 of the voltage regulator 4 to be tested is the IN pin and the first pin A1 is the OUT pin, by controlling the working state of the pin configuration component 31, the detection signal output by the power supply unit 11 can be sent to the second pin A2 of the voltage regulator 4 to be tested through the pin configuration component 31 and the second contact F2 of the test sub-board 2, so that the voltage regulator 4 to be tested can receive the power supply of the power supply unit 11 to work, and then output the test signal through the OUT pin. The test signal output by the first pin A1, i.e., the OUT pin, is then sent to the detection unit 12 through the first contact F1 of the test sub-board 2 and the pin configuration component 31, and the detection unit 12 can generate a test result based on the test signal.

[0059] In one embodiment, Figure 3 As shown, the pin configuration component 31 includes: a first configuration unit 311 , a second configuration unit 312 and a third configuration unit 313 .

[0060] The first end of the first configuration unit 311 is connected to the first contact F1 of the test sub-board 2, and the second end of the first configuration unit 311 is respectively connected to the power supply unit 11, the detection unit 12 and the common ground. When the first configuration unit 311 is in the first working state, the first configuration unit 311 is used to transmit the detection signal of the detection component 1 to the first contact F1 of the test sub-board 2. When the first configuration unit 311 is in the second working state, the first configuration unit 311 is used to transmit the test signal output by the voltage regulator 4 to be tested to the detection component 1. When the first configuration unit 311 is in the third state, the first contact F1 of the test sub-board 2 is connected to the common ground.

[0061] It can be understood that the pin configuration component 31 can include three configuration units: a first configuration unit 311, a second configuration unit 312 and a third configuration unit 313. These three configuration units: the first configuration unit 311, the second configuration unit 312 and the third configuration unit 313 are respectively connected to the first contact F1, the second contact F2 and the third contact on the test sub-board 2, and then respectively connected to the first pin A1, the second pin A2 and the third pin A3 of the voltage regulator 4 to be tested through the first contact F1, the second contact F2 and the third contact F3.

[0062] In application, when the voltage regulator test device is connected, since the first contact F1 of the test sub-board 2 is connected to the first pin A1 of the voltage regulator 4 to be tested, when the first pin A1 of the voltage regulator 4 to be tested is an IN pin, the first configuration unit 311 is controlled to be in the first working state, so that the detection signal of the power supply unit 11 is transmitted to the first contact F1 of the test sub-board 2 through the first configuration unit 311, and then transmitted to the IN pin of the voltage regulator 4 to be tested; if the first pin A1 of the voltage regulator 4 to be tested is an OUT pin, the first configuration unit 311 is controlled to be in the second working state, so that the test signal output by the OUT pin of the voltage regulator 4 to be tested is transmitted to the detection unit 12 through the first contact F1 and the first configuration unit 311; if the first pin A1 of the voltage regulator 4 to be tested is a GND pin, the first configuration unit 311 is controlled to be in the third working state, so that the GND pin of the voltage regulator 4 to be tested can be grounded through the first contact F1 and the first configuration unit 311.

[0063] The first end of the second configuration unit 312 is connected to the second contact F2 of the test sub-board 2, and the second end of the second configuration unit 312 is respectively connected to the power supply unit 11, the detection unit 12 and the common ground. When the second configuration unit 312 is in the first working state, the second configuration unit 312 is used to transmit the detection signal of the detection component 1 to the second contact F2 of the test sub-board 2. When the second configuration unit 312 is in the second working state, the second configuration unit 312 is used to transmit the test signal output by the voltage regulator 4 to be tested to the detection component 1. When the second configuration unit 312 is in the third state, the second contact F2 of the test sub-board 2 is connected to the common ground.

[0064] Exemplarily, if the second pin A2 of the voltage regulator 4 to be tested is an IN pin, the second configuration unit 312 is controlled to be in the first working state, so that the detection signal of the power supply unit 11 is transmitted to the second contact F2 of the test sub-board 2 through the second configuration unit 312, and then transmitted to the IN pin of the voltage regulator 4 to be tested; if the second pin A2 of the voltage regulator 4 to be tested is an OUT pin, the second configuration unit 312 is controlled to be in the second working state, so that the test signal output by the OUT pin of the voltage regulator 4 to be tested is transmitted to the detection unit 12 through the second contact F2 and the second configuration unit 312; if the second pin A2 of the voltage regulator 4 to be tested is a GND pin, the second configuration unit 312 is controlled to be in the third working state, so that the GND pin of the voltage regulator 4 to be tested can be grounded through the second contact F2 and the second configuration unit 312.

[0065] The first end of the third configuration unit 313 is connected to the third contact F3 of the test sub-board 2, and the second end of the third configuration unit 313 is respectively connected to the power supply unit 11, the detection unit 12 and the common ground. When the third configuration unit 313 is in the first working state, the third configuration unit 313 is used to transmit the detection signal of the detection component 1 to the third contact F3 of the test sub-board 2. When the third configuration unit 313 is in the second working state, the third configuration unit 313 is used to transmit the test signal output by the voltage regulator 4 to be tested to the detection component 1. When the third configuration unit 313 is in the third state, the third contact F3 of the test sub-board 2 is connected to the common ground.

[0066] Similarly, if the third pin A3 of the voltage regulator 4 to be tested is an IN pin, the third configuration unit 313 is controlled to be in the first working state, so that the detection signal of the power supply unit 11 is transmitted to the third contact F3 of the test sub-board 2 through the third configuration unit 313, and then transmitted to the IN pin of the voltage regulator 4 to be tested; if the third pin A3 of the voltage regulator 4 to be tested is an OUT pin, the third configuration unit 313 is controlled to be in the second working state, so that the test signal output by the OUT pin of the voltage regulator 4 to be tested is transmitted to the detection unit 12 through the third contact F3 and the third configuration unit 313; if the third pin A3 of the voltage regulator 4 to be tested is a GND pin, the third configuration unit 313 is controlled to be in the third working state, so that the GND pin of the voltage regulator 4 to be tested can be grounded through the third contact F3 and the third configuration unit 313.

[0067] Among them, since there is only one IN pin, GND pin and OUT pin on a voltage regulator, when testing a voltage regulator to be tested, the working states of the configuration units corresponding to the IN pin, GND pin and OUT pin must be different. For example, if the first pin A1 of the voltage regulator to be tested 4 is an IN pin, the second pin A2 is a GND pin, and the third pin A3 is an OUT pin, then the first configuration unit 311 is controlled to be in the first working state, the second configuration unit 312 is in the third working state, and the third configuration unit 313 is in the second working state, so that the IN pin can receive the power supply of the power supply unit 11, the GND pin can be grounded, and the OUT pin can output the test signal to the detection unit 12. It can be seen that the first configuration unit 311, the second configuration unit 312 and the third configuration unit 313 will not be in the same working state at the same time.

[0068] In one embodiment, Figure 4As shown, the first configuration unit 311 includes: a first relay K1, a second relay K2 and a third relay K3. The first end of the first relay K1 is connected to the first contact F1 of the test sub-board 2, and the second end of the first relay K1 is connected to the power supply unit 11. The first end of the second relay K2 is connected to the first contact F1 of the test sub-board 2, and the second end of the second relay K2 is connected to the detection unit 12. The first end of the third relay K3 is connected to the first contact F1 of the test sub-board 2, and the second end of the third relay K3 is connected to the common ground.

[0069] It can be understood that the first configuration unit 311 may include three relays: a first relay K1, a second relay K2 and a third relay K3, the first ends of the first relay K1, the second relay K2 and the third relay K3 are respectively connected to the first contact F1 of the test sub-board 2, and the second ends are respectively connected to the power supply unit 11, the detection unit 12 and the common ground, so as to turn on the corresponding relay according to the type of the first pin A1 of the voltage regulator 4 to be tested, so that the first configuration unit 311 is in a corresponding working state. Exemplarily, if the first pin A1 of the voltage regulator 4 to be tested is an IN pin, the first relay K1 is controlled to be turned on, and the second relay K2 and the third relay K3 are turned off, so that the first configuration unit 311 is in the first working state, so that the detection signal of the power supply unit 11 is transmitted to the first contact F1 of the test sub-board 2 through the first configuration unit 311, and then transmitted to the IN pin of the voltage regulator 4 to be tested; if the first pin A1 of the voltage regulator 4 to be tested is an OUT pin, the second relay K2 is controlled to be turned on, and the first relay K1 and the third relay K3 are turned off, so that the first configuration unit 311 is in the second working state, so that the test signal output by the OUT pin of the voltage regulator 4 to be tested is transmitted to the detection unit 12 through the first contact F1 and the first configuration unit 311; if the first pin A1 of the voltage regulator 4 to be tested is a GND pin, the third relay K3 is controlled to be turned on, and the first relay K1 and the second relay K2 are turned off, so that the first configuration unit 311 is in the third working state, so that the GND pin of the voltage regulator 4 to be tested can be grounded through the first contact F1 and the first configuration unit 311.

[0070] In one embodiment, please refer to Figure 4 The second configuration unit 312 includes: a fourth relay K4, a fifth relay K5, and a sixth relay K6. A first end of the fourth relay K4 is connected to the second contact F2 of the test sub-board 2, and a second end of the fourth relay K4 is connected to the power supply unit 11. A first end of the fifth relay K5 is connected to the second contact F2 of the test sub-board 2, and a second end of the fifth relay K5 is connected to the detection unit 12. A first end of the sixth relay K6 is connected to the second contact F2 of the test sub-board 2, and a second end of the sixth relay K6 is connected to the common ground.

[0071] Similarly, the corresponding relay may be turned on according to the type of the second pin A2 of the voltage regulator 4 to be tested, so that the second configuration unit 312 is in a corresponding working state. If the second pin A2 of the voltage regulator 4 to be tested is an IN pin, the fourth relay K4 is controlled to be turned on, and the fifth relay K5 and the sixth relay K6 are turned off, so that the second configuration unit 312 is in the first working state, so that the detection signal of the power supply unit 11 is transmitted to the second contact F2 of the test sub-board 2 through the second configuration unit 312, and then transmitted to the IN pin of the voltage regulator 4 to be tested; if the second pin A2 of the voltage regulator 4 to be tested is an OUT pin, the fifth relay K5 is controlled to be turned on, and the fifth relay K5 and the sixth relay K6 are turned off, so that the second configuration unit 312 is in the second working state, so that the test signal output by the OUT pin of the voltage regulator 4 to be tested is transmitted to the detection unit 12 through the second contact F2 and the second configuration unit 312; if the second pin A2 of the voltage regulator 4 to be tested is a GND pin, the sixth relay K6 is controlled to be turned on, and the fifth relay K5 and the fourth relay K4 are turned off, so that the second configuration unit 312 is in the third working state, so that the GND pin of the voltage regulator 4 to be tested can be grounded through the second contact F2 and the second configuration unit 312.

[0072] In one embodiment, please refer to Figure 4 The third configuration unit 313 includes: a seventh relay K7, an eighth relay K8, and a ninth relay K9. A first end of the seventh relay K7 is connected to the third contact F3 of the test sub-board 2, and a second end of the seventh relay K7 is connected to the power supply unit 11. A first end of the eighth relay K8 is connected to the third contact F3 of the test sub-board 2, and a second end of the eighth relay K8 is connected to the detection unit 12. A first end of the ninth relay K9 is connected to the third contact F3 of the test sub-board 2, and a second end of the ninth relay K9 is connected to the common ground.

[0073] In application, the corresponding relay may be turned on according to the type of the third pin A3 of the voltage regulator 4 to be tested, so that the third configuration unit 313 is in a corresponding working state. If the third pin A3 of the voltage regulator 4 to be tested is an IN pin, the seventh relay K7 is controlled to be turned on, and the eighth relay K8 and the ninth relay K9 are turned off, so that the third configuration unit 313 is in the first working state, so that the detection signal of the power supply unit 11 is transmitted to the third contact F3 of the test sub-board 2 through the third configuration unit 313, and then transmitted to the IN pin of the voltage regulator 4 to be tested; if the third pin A3 of the voltage regulator 4 to be tested is an OUT pin, the eighth relay K8 is controlled to be turned on, and the seventh relay K7 and the ninth relay K9 are turned off, so that the third configuration unit 313 is in the second working state, so that the test signal output by the OUT pin of the voltage regulator 4 to be tested is transmitted to the detection unit 12 through the third contact F3 and the third configuration unit 313; if the third pin of the voltage regulator 4 to be tested is a GND pin, the ninth relay K9 is controlled to be turned on, and the eighth relay K8 and the seventh relay K7 are turned off, so that the third configuration unit 313 is in the third working state, so that the GND pin of the voltage regulator 4 to be tested can be grounded through the third contact F3 and the third configuration unit 313.

[0074] In the application, the test motherboard 3 may also include a control chip, and the third ends of the first relay K1, the second relay K2, the third relay K3, the fourth relay K4, the fifth relay K5, the sixth relay K6, the seventh relay K7, the eighth relay K8 and the ninth relay K9 are respectively connected to the power supply of the relay, and the fourth ends are respectively connected to the corresponding pins of the control chip, so as to control the corresponding relays to be turned on and off according to the command of the control chip.

[0075] In one embodiment, Figure 5 As shown, the test motherboard 3 further includes: a capacitor configuration component 32, which is respectively connected to the first contact F1, the second contact F2 and the third contact F3 of the test daughter board 2, and is used for filtering the detection signal or the test signal.

[0076] It can be understood that in the actual test process of the voltage regulator, it is also necessary to connect decoupling capacitors or filter capacitors in parallel at the power input terminal and the voltage output terminal, that is, the IN pin and the OUT pin of the voltage regulator to filter the input and output voltages of the voltage regulator 4 to be tested and to avoid the influence of external interference on the voltage regulator. By arranging a capacitor configuration component 32 on the test motherboard 3, the capacitor configuration component 32 is respectively connected to the first contact F1, the second contact F2 and the third contact F3 of the test daughter board 2, so that corresponding filtering can be provided for the IN pin and the OUT pin of the voltage regulator 4 to be tested.

[0077] In one embodiment, Figure 6As shown, the capacitor configuration component 32 includes a first capacitor configuration unit 321, a second capacitor configuration unit 322 and a third capacitor configuration unit 323. The first capacitor configuration unit 321 includes a plurality of first filter circuits 3211. When the first capacitor configuration unit 321 is in the first target state, the target first filter circuit is conductively connected to the first contact F1 of the test sub-board 2, and the target first filter circuit is one of the plurality of first filter circuits. The second capacitor configuration unit 322 includes a plurality of second filter circuits 3221. When the second capacitor configuration unit 322 is in the second target state, the target second filter circuit is conductively connected to the second contact F2 of the test sub-board 2, and the target second filter circuit is one of the plurality of second filter circuits. The third capacitor configuration unit 323 includes a plurality of third filter circuits 3231. When the third capacitor configuration unit 323 is in the third target state, the target third filter circuit is conductively connected to the third contact F3 of the test sub-board 2, and the target third filter circuit is one of the plurality of third filter circuits. The first filter circuit 3211 includes a first filter capacitor, the second filter circuit 3221 includes a second filter capacitor, the third filter circuit 3231 includes a third filter capacitor, and the number of the first filter circuit, the second filter circuit and the third filter circuit can be four respectively.

[0078] Similar to the pin configuration component 31, the first capacitor configuration unit 321, the second capacitor configuration unit 322 and the third capacitor configuration unit 323 are respectively connected to the first contact F1, the second contact F2 and the third contact F3 of the test sub-board 2 to provide corresponding filtering processing for the IN pin and the OUT pin of the voltage regulator 4 to be tested. Exemplarily, the first capacitor configuration unit 321 may include four first filtering circuits 3211, each of which may include a first switch and a first filtering capacitor, that is, the first capacitor configuration unit 321 includes a first switch S1, a first filtering capacitor C1, a first switch S2, a first filtering capacitor C2, a first switch S3, a first filtering capacitor C3, a first switch S4 and a first filtering capacitor C4, the first end of each first switch is respectively connected to the first contact F1 of the test sub-board 2, the second end of each first switch is respectively connected to the first end of the corresponding first filtering capacitor, such as the second end of the first switch S2 is connected to the first end of the first filtering capacitor C2, and the second end of each first filtering capacitor is grounded.

[0079] Similarly, the second capacitor configuration unit 322 includes four second filter circuits 3221, each of which may include a second switch and a second filter capacitor, that is, the second capacitor configuration unit 322 includes a second switch S5, a second filter capacitor C5, a second switch S6, a second filter capacitor C6, a second switch S7, a second filter capacitor C7, a second switch S8 and a second filter capacitor C8, the first end of each second switch is respectively connected to the second contact F2 of the test sub-board 2, the second end of each second switch is respectively connected to the first end of the corresponding second filter capacitor, such as the second end of the second switch S8 is connected to the first end of the second filter capacitor C8, and the second end of each second filter capacitor is grounded. The third capacitor configuration unit 323 includes four third filter circuits 3231, each of which may include a third switch and a third filter capacitor, that is, the third capacitor configuration unit 323 includes a third switch S9, a third filter capacitor C9, a third switch S10, a third filter capacitor C10, a third switch S11, a third filter capacitor C11, a third switch S12 and a third filter capacitor C12, the first end of each third switch is respectively connected to the third contact F3 of the test sub-board 2, the second end of each third switch is respectively connected to the first end of the corresponding third filter capacitor, such as the second end of the third switch S9 is connected to the first end of the third filter capacitor C9, and the second end of each third filter capacitor is grounded.

[0080] In the application, the corresponding first switch, second switch or third switch can be turned on according to the pin capacitance size requirement of the voltage regulator 4 to be tested, so that the target first filter circuit can be selected for the IN pin and OUT pin of the voltage regulator 4 to be tested to provide a suitable filter capacitor.

[0081] In an example, the capacitance of the first filter capacitor C1, the second filter capacitor C5 and the third filter capacitor C9 are all 10μF, the capacitance of the first filter capacitor C2, the first filter capacitor C3, the second filter capacitor C6, the second filter capacitor C7, the third filter capacitor C10 and the third filter capacitor C11 are all 1μF, and the capacitance of the first filter capacitor C4, the second filter capacitor C8 and the third filter capacitor C12 are all 0.1μF. The first pin A1 of the voltage regulator 4 to be tested is an IN pin, and the third pin A3 is an OUT pin. The IN pin of the voltage regulator 4 to be tested requires a capacitor of 10 μF, and the OUT pin requires a capacitor of 0.1 μF. The first filter circuit including the first switch S1 and the first filter capacitor C1 is determined to be the target first filter circuit, and the third filter circuit including the third switch S12 and the third filter capacitor C12 is determined to be the target third filter circuit. The target first filter circuit is controlled to be conductively connected to the first contact F1 of the test sub-board 2, and the target third filter circuit is controlled to be conductively connected to the third contact F3 of the test sub-board 2, that is, the first switch S1 and the third switch 12 are controlled to be conductively connected, and the remaining first switches, second switches and third switches are disconnected, so that the first capacitor configuration unit 321 is in the first target state and the third capacitor configuration unit 323 is in the third target state, so that a capacitor of 10 μF can be provided for the IN pin of the voltage regulator 4 to be tested, and a capacitor of 0.1 μF can be provided for the OUT pin.

[0082] Among them, the third ends of each first switch, each second switch and each third switch are also respectively connected to the power supply of the relay, and the fourth ends are also respectively connected to the corresponding pins of the control chip, for controlling the corresponding switches to be on and off according to the commands of the control chip.

[0083] In application, it is only necessary to design a test sub-board according to the package model of the voltage regulator to be tested, so as to lead the IN pin, GND pin and OUT pin of the voltage regulator to be tested to the first contact F1, the second contact F2 and the third contact F3. It should be noted that no matter what package model of voltage regulator the test sub-board 2 is suitable for, the test sub-board 2 and the test motherboard 3 in this application can be connected to realize the corresponding connection of the pin configuration component 31, the capacitor configuration component 32 and the multiple contacts of the test sub-board 2, and the voltage regulator can be tested through the detection component and the pin configuration component and the capacitor configuration component on the test motherboard. Through the voltage regulator test device of this application, it is no longer necessary to set a test device for each voltage regulator one by one, which not only reduces the test cost of the voltage regulator, but also improves the efficiency of the voltage regulator.

[0084] In the description of this specification, the description with reference to the terms "some embodiments", "other embodiments", "ideal embodiments", etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic descriptions of the above terms do not necessarily refer to the same embodiment or example.

[0085] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0086] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the attached claims.

Claims

1. A voltage regulator testing device, characterized in that: The device comprises: Detection components; A test sub-board, detachably connected to the voltage regulator to be tested, the test sub-board being used to fix the voltage regulator to be tested so that a plurality of pins of the voltage regulator to be tested are respectively connected to a plurality of contacts of the test sub-board correspondingly; A test motherboard, the test motherboard comprising a control chip, a pin configuration component and a capacitor configuration component, the test motherboard being detachably connected to the test daughter board so that the first end of the pin configuration component is respectively connected to a plurality of contacts of the test daughter board, the second end of the pin configuration component is connected to the detection component, the pin configuration component is used to transmit the detection signal of the detection component to the voltage regulator to be tested through the plurality of contacts of the test daughter board, and transmit the test signal fed back and output by the voltage regulator to be tested to the detection component, the capacitor configuration component is respectively connected to the first contact, the second contact and the third contact of the test daughter board, and is used to filter the detection signal or the test signal; Wherein, the capacitor configuration component includes a first capacitor configuration unit, a second capacitor configuration unit and a third capacitor configuration unit; the first capacitor configuration unit includes a plurality of first filter circuits, when the first capacitor configuration unit is in a first target state, the target first filter circuit is conductively connected to the first contact of the test sub-board, and the target first filter circuit is one of the plurality of first filter circuits; the second capacitor configuration unit includes a plurality of second filter circuits, when the second capacitor configuration unit is in a second target state, the target second filter circuit is conductively connected to the second contact of the test sub-board, and the target second filter circuit is one of the plurality of second filter circuits; the third capacitor configuration unit includes a plurality of third filter circuits, when the third capacitor configuration unit is in a third target state, the target third filter circuit is conductively connected to the third contact of the test sub-board, and the target third filter circuit is one of the plurality of third filter circuits; The detection component comprises: a power supply unit connected to the second end of the pin configuration component and used for providing a detection signal to the voltage regulator to be tested through the pin configuration component and the test sub-board; a detection unit connected to the second end of the pin configuration component, configured to receive a test signal of the voltage regulator to be tested through the pin configuration component and the test sub-board, and generate a test result based on the test signal; The pin configuration component comprises: a first configuration unit, wherein a first end of the first configuration unit is connected to a first contact of the test sub-board, a second end of the first configuration unit is respectively connected to the power supply unit, the detection unit and a common ground, when the first configuration unit is in a first working state, the first configuration unit is used to transmit a detection signal of the detection component to the first contact of the test sub-board, when the first configuration unit is in a second working state, the first configuration unit is used to transmit a test signal output by the voltage regulator to be tested to the detection component, and when the first configuration unit is in a third state, the first contact of the test sub-board is connected to the common ground; a second configuration unit, wherein a first end of the second configuration unit is connected to a second contact of the test sub-board, a second end of the second configuration unit is respectively connected to the power supply unit, the detection unit and the common ground, when the second configuration unit is in a first working state, the second configuration unit is used to transmit a detection signal of the detection component to the second contact of the test sub-board, when the second configuration unit is in a second working state, the second configuration unit is used to transmit a test signal output by the voltage regulator to be tested to the detection component, and when the second configuration unit is in a third state, the second contact of the test sub-board is connected to the common ground; a third configuration unit, wherein a first end of the third configuration unit is connected to a third contact of the test sub-board, a second end of the third configuration unit is respectively connected to the power supply unit, the detection unit and the common ground, and when the third configuration unit is in a first working state, the third configuration unit is used to transmit a detection signal of the detection component to the third contact of the test sub-board, and when the third configuration unit is in a second working state, the third configuration unit is used to transmit a test signal output by the voltage regulator to be tested to the detection component, and when the third configuration unit is in a third state, the third contact of the test sub-board is connected to the common ground; The first configuration unit, the second configuration unit and the third configuration unit are in different working states at the same time; The first configuration unit includes: a first relay, wherein a first end of the first relay is connected to a first contact of the test sub-board, and a second end of the first relay is connected to the power supply unit; a second relay, wherein a first end of the second relay is connected to the first contact of the test sub-board, and a second end of the second relay is connected to the detection unit; A third relay, wherein a first end of the third relay is connected to the first contact of the test sub-board, and a second end of the third relay element is connected to the common ground; The second configuration unit includes: a fourth relay, wherein a first end of the fourth relay is connected to the second contact of the test sub-board, and a second end of the fourth relay is connected to the power supply unit; a fifth relay, wherein a first end of the fifth relay is connected to the second contact of the test sub-board, and a second end of the fifth relay is connected to the detection unit; a sixth relay, wherein a first end of the sixth relay is connected to the second contact of the test sub-board, and a second end of the sixth relay is connected to the common ground; The third configuration unit includes: a seventh relay, wherein a first end of the seventh relay is connected to the third contact of the test sub-board, and a second end of the seventh relay is connected to the power supply unit; an eighth relay, a first end of the eighth relay being connected to the third contact of the test sub-board, and a second end of the eighth relay being connected to the detection unit; A ninth relay, wherein the first end of the ninth relay is connected to the third contact of the test sub-board, and the second end of the ninth relay is connected to the common ground; the voltage regulator testing device is used to test voltage regulators of different packaging models and the same packaging model but with different pin arrangement positions.

2. The voltage regulator testing device according to claim 1, characterized in that: The first filter circuit includes a first filter capacitor; the second filter circuit includes a second filter capacitor; and the third filter circuit includes a third filter capacitor.

3. The voltage regulator testing device according to claim 1, characterized in that: The number of the first filter circuit, the number of the second filter circuit, and the number of the third filter circuit are four respectively.

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