Spectrometer and electronic device

Abstract

The embodiment of the application provides a spectrometer and electronic equipment, which are used for environmental monitoring, biological medicine, food safety and the like. The device comprises a window, an active light source, a window sheet, a light splitting module, a detection module and a data processing module. The window sheet is coated with a mirror-symmetrical reflective film capable of reflecting specific wave bands on both sides, that is, the reflective spectrum information of the active light source and the reflective spectrum information of a to-be-measured object can be simultaneously acquired through one measurement without additionally increasing accessories and the volume of the instrument, so that the reference reflectance spectrum information of the to-be-measured object is obtained. The technical scheme of the application can simplify the spectrum reference measurement process and the spectrum calibration process, and quickly acquire the reference reflectance spectrum information of the to-be-measured object.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of spectrum measurement, and more particularly, to a spectrometer and an electronic device. BACKGROUND

[0002] Spectrum can reflect the molecular structure information of a substance, and plays an important role in the fields of biology, chemistry, pharmaceutical materials, food industry, geological exploration and the like. With the improvement of living standards, more and more people pay more attention to the quality of life, such as food safety, health monitoring and the like, so that the demand for spectrum detection in daily life is rapidly increasing.

[0003] Spectral instruments can qualitatively and quantitatively analyze the structure and composition of a substance without damage by using optical principles, and are one of the most widely used analysis tools in scientific research and industry. Although the size of a commercial portable or handheld miniature spectral instrument has been gradually compressed to centimeter level or even millimeter level, in the actual long-term use process, the reference test and spectral calibration test of the instrument are complex and professional, and it is difficult to well solve the problem of spectral consistency.

[0004] Therefore, how to quickly obtain the spectral information of a to-be-detected object is a problem to be solved. SUMMARY

[0005] Embodiments of the present application provide a spectrometer and an electronic device, which can simplify the spectrum detection process and effectively realize the quick acquisition of the spectral information of a to-be-detected object.

[0006] In a first aspect, a spectrometer is provided, comprising: a window, an active light source, a window sheet, a light splitting module, a detection module and a data processing module, the window sheet is installed in the window, and the window sheet and the light splitting module are coaxial, mirror-symmetrical reflective films are coated on both sides of the window sheet, and the wave band range of the reflective films is a first wave band range; wherein:

[0007] The active light source is configured to emit a first light beam to the window sheet;

[0008] The window sheet is configured to reflect a second light beam to the light splitting module, and the wave band range of the second light beam is the first wave band range;

[0009] The window sheet is further configured to transmit a third light beam to a to-be-detected object, and the third light beam is incident to the light splitting module through the diffuse reflection of the surface of the to-be-detected object, and the wave band range of the third light beam is a wave band range other than the first wave band range in the wave band range of the first light beam;

[0010] The light splitting module is configured to perform light splitting processing on a mixed light beam of the second light beam and the third light beam;

[0011] The detection module is configured to detect the light beam after the light splitting processing to obtain a first mixed spectrum;

[0012] a data processing module configured to separate the first mixed spectrum to obtain a full spectrum range reflectance spectrum of the active light source and a full spectrum range reflectance spectrum of the object to be measured without reference;

[0013] The data processing module is further configured to determine a reference reflectance spectrum of the object to be measured in the full spectrum range according to the full spectrum range reflectance spectrum of the active light source and the full spectrum range reflectance spectrum of the object to be measured without reference.

[0014] In the technical solution of the present application, a self-reference spectrometer is provided. The reference reflectance spectrum information of the object to be measured is obtained by coating a mirror-symmetrical reflective film that can reflect specific wave bands (for example, three specific center wavelengths and bandwidths in the first wave band range) on both sides of the window sheet. That is, without additional accessories and without increasing the volume of the instrument, the reflectance spectrum of the active light source and the reflectance spectrum of the object to be measured can be obtained simultaneously through one measurement, so that the reference reflectance spectrum of the object to be measured is obtained according to the ratio of the two. The implementation can simplify the self-reference measurement process of the spectrum and effectively and quickly obtain the spectral information of the object to be measured.

[0015] With reference to the first aspect, in some implementations of the first aspect, the data processing module is configured to separate the first mixed spectrum to obtain the full spectrum range reflectance spectrum of the active light source and the full spectrum range reflectance spectrum of the object to be measured without reference, specifically as follows:

[0016] obtaining the reflectance spectrum of the active light source in the first wave band range according to the first mixed spectrum and the pre-stored reflectance spectrum of the active light source;

[0017] subtracting the reflectance spectrum of the active light source in the first wave band range from the first mixed spectrum to obtain the reflectance spectrum of the object to be measured without reference;

[0018] performing interpolation calculation on the reflectance spectrum of the object to be measured without reference to obtain the full spectrum range reflectance spectrum of the object to be measured without reference;

[0019] fitting the full spectrum range reflectance spectrum of the active light source according to the pre-stored extrapolation function of the reflectance spectrum of the active light source and the reflectance spectrum of the active light source in the first wave band range.

[0020] With reference to the first aspect, in some implementations of the first aspect, the data processing module is further configured to:

[0021] calibrating the first mixed spectrum according to the pre-stored reflectance spectrum of the active light source.

[0022] The pre-stored reflection spectrum of the active light source can be understood as the reflection spectrum information measured by the spectrometer when the active light source is turned on during factory calibration, including the central wavelength position, bandwidth and intensity of the active light source in the first wavelength range, and is used to calibrate the spectral drift of the spectrometer or the active light source in the subsequent actual use process.

[0023] The pre-stored reflection spectrum of the active light source can be understood as the reflection spectrum information measured by the spectrometer when the active light source is turned on during factory calibration, including the central wavelength position, bandwidth and intensity of the active light source in the first wavelength range, and is used to calibrate the spectral drift of the spectrometer or the active light source in the subsequent actual use process.

[0024] In this implementation, a self-calibration spectrometer is provided. By calibrating the first mixed spectrum by fitting the actual reflection spectrum of the active light source, the accuracy of the spectral measurement can be ensured, because the intensity of each wavelength of the active light source may change during long-term use, causing errors in the measurement data. Through the self-calibration of the spectrometer, the actual full-spectrum reflection spectrum of the active light source is finally obtained. This implementation can simplify the spectral calibration process while ensuring the high quality and stability of the collected reflection spectrum.

[0025] In combination with the first aspect, in some implementations of the first aspect, the number of active light sources is one or more, and the plurality of active light sources are uniformly distributed on the inner edge region of the window sheet.

[0026] In this implementation, the positions of the active light sources should be as uniformly distributed as possible on both ends (for example, the edge region inside the instrument) or around the window sheet, that is, in the field of view of the spectral instrument, to ensure the integrity of spectral acquisition. At the same time, it should be avoided to block the diffuse reflection light of the surface of the object to be measured as much as possible to reduce the energy loss of the object to be measured. In other words, the active light source is not placed on the light path between the object to be measured and the light splitting module as much as possible.

[0027] In combination with the first aspect, in some implementations of the first aspect, the first light beam completely covers the entire window.

[0028] In this implementation, by limiting the first light beam emitted by the active light source to completely cover the window, it can ensure the integrity of the collected spectral information while improving the complete incidence of the second light beam and the third light beam reflected by the window sheet into the light splitting module, as much as possible to ensure that the beam energy is not lost, thereby improving the spectral accuracy of the collected spectrum.

[0029] In some implementations of the first aspect, the bandwidth of the reflective film is less than or equal to a spectral resolution of the spectrometer.

[0030] It should be understood that the design of the bandwidth of the reflective film needs to balance the spectral recovery accuracy of the object to be measured and the coating process complexity of the window sheet. The narrower the bandwidth of the reflective film, the easier it is to accurately recover the reflectance spectrum of the object to be measured, but the higher the requirement for coating; on the contrary, the wider the bandwidth of the reflective film, the more difficult it is to accurately recover the reflectance spectrum of the object to be measured, but the lower the requirement for coating.

[0031] In this implementation, the bandwidth of the reflective film is set to be less than or equal to the spectral resolution of the spectrometer, that is, the numerical value of the bandwidth of the reflective film is greater than the numerical value of the spectral resolution of the spectrometer, which can ensure that the obtained active light source has a more accurate reflectance spectrum in the first waveband range.

[0032] In some implementations of the first aspect, the number of wavebands of the reflective film is greater than or equal to one.

[0033] For example, the number of wavebands of the reflective film is three.

[0034] It should be understood that the design of the number of wavebands of the reflective film needs to consider the spectral recovery accuracy of the object to be measured and the active light source. The more the number of wavebands of the reflective film, the more difficult it is to accurately recover the reflectance spectrum of the object to be measured, but the easier it is to accurately recover the spectrum of the active light source; on the contrary, the fewer the number of wavebands of the reflective film, the easier it is to accurately recover the reflectance spectrum of the object to be measured, but the more difficult it is to accurately recover the spectrum of the active light source.

[0035] In this implementation, the number of wavebands of the reflective film is set to three, which can obtain a spectral sampling interval less than three times, avoiding the influence of missing spectral information of the object to be measured due to the deduction of part of the spectral range. Since the near-infrared spectrum has fewer characteristic peaks, that is, the spectrum of the active light source is relatively continuous, a spectral sampling interval less than three times can prevent missing the absorption peak and other characteristics of the object to be measured, thereby improving the spectral detection accuracy.

[0036] In a second aspect, an electronic device is provided, which includes the spectrometer in the first aspect or any of the implementations thereof.

[0037] In a third aspect, an electronic device is provided, which includes a processor and the spectrometer in the first aspect or any of the implementations thereof. The spectrometer includes a window, an active light source, a window sheet, a light splitting module, and a detection module. The window sheet is installed in the window and is coaxial with the light splitting module. Mirror-symmetric reflective films are coated on both sides of the window sheet. The waveband range of the reflective film is a first waveband range. In the electronic device:

[0038] an active light source configured to emit a first light beam to the window sheet;

[0039] a window sheet configured to reflect a second light beam to a light splitting module, the second light beam having a wavelength range different from the first wavelength range;

[0040] the window sheet is further configured to transmit a third light beam to the object to be measured, the third light beam being incident on the light splitting module through diffuse reflection of the surface of the object to be measured, the third light beam having a wavelength range different from the first wavelength range;

[0041] a light splitting module configured to split the mixed light beam of the second light beam and the third light beam;

[0042] a detection module configured to detect the light beam after the splitting to obtain a first mixed spectrum;

[0043] a data processing module configured to separate the first mixed spectrum to obtain a full spectrum reflectance spectrum of the active light source and a full spectrum reflectance spectrum of the object to be measured without reference;

[0044] a processor configured to receive the full spectrum reflectance spectrum of the active light source and the full spectrum reflectance spectrum of the object to be measured without reference from the spectrometer;

[0045] the processor is further configured to determine a full spectrum reference reflectance spectrum of the object to be measured according to the full spectrum reflectance spectrum of the active light source and the full spectrum reflectance spectrum of the object to be measured without reference.

[0046] In the technical solution of the present application, a self-reference spectrometer is provided. The reference reflectance spectrum information of the object to be measured is obtained by coating a mirror-symmetrical reflective film that can reflect specific wavelength ranges (for example, three specific center wavelengths and bandwidths within the first wavelength range) on both sides of the window sheet. That is, without additional accessories and without increasing the volume of the instrument, the reflectance spectrum of the active light source and the reflectance spectrum of the object to be measured can be obtained simultaneously through one measurement, and thus the reference reflectance spectrum of the object to be measured can be obtained according to the ratio of the two. This implementation can simplify the process of self-reference spectral measurement and quickly and accurately obtain the spectral information of the object to be measured.

[0047] In combination with the third aspect, in some implementations of the third aspect, the processor is configured to separate the first mixed spectrum to obtain the full spectrum reflectance spectrum of the active light source and the full spectrum reflectance spectrum of the object to be measured without reference, specifically:

[0048] obtain the reflectance spectrum of the active light source in the first wavelength range according to the first mixed spectrum and the pre-stored reflectance spectrum of the active light source;

[0049] The first mixed spectrum is subtracted from the reflection spectrum of the active light source in the first waveband range to obtain a reflection spectrum of the object to be measured without reference;

[0050] The reflection spectrum of the object to be measured without reference is interpolated to obtain a reflection spectrum of the object to be measured without reference in the full waveband range;

[0051] The reflection spectrum of the active light source in the full waveband range is fitted according to the pre-stored extrapolation function of the reflection spectrum of the active light source and the reflection spectrum of the active light source in the first waveband range.

[0052] In combination with the third aspect, in some implementations of the third aspect, the data processing module is further configured to:

[0053] The first mixed spectrum is calibrated according to the pre-stored reflection spectrum of the active light source.

[0054] In this implementation, a self-calibrated spectrometer is provided. The first mixed spectrum is calibrated by fitting the actual reflection spectrum of the active light source, which can ensure the accuracy of the measurement, because the intensity of each wavelength of the active light source may change during long-term use, causing errors in the measured data. Through the self-calibration of the spectrometer, the actual full-spectrum reflection spectrum of the active light source is finally obtained. This implementation can simplify the spectral calibration process while ensuring the high quality and stability of the collected reflection spectrum.

[0055] In combination with the third aspect, in some implementations of the third aspect, the number of active light sources is one or more, and the plurality of active light sources are uniformly distributed on the inner edge region of the window sheet.

[0056] In this implementation, the positions of the active light sources should be as uniformly distributed as possible on both ends (for example, the edge region inside the instrument) or around the window sheet, that is, in the field of view of the spectral instrument, to ensure the integrity of the spectral acquisition. At the same time, the active light sources should be as far away as possible from the light path between the object to be measured and the light splitting module to reduce the energy loss of the object to be measured. In other words, the active light sources should not be placed on the light path between the object to be measured and the light splitting module.

[0057] In combination with the third aspect, in some implementations of the third aspect, the first light beam completely covers the entire window.

[0058] In this implementation, by limiting the first light beam emitted by the active light source to completely cover the window, the second light beam and the third light beam reflected by the window sheet can be completely incident into the light splitting module, which can ensure that the beam energy is not lost as much as possible, thereby improving the spectral accuracy of the collected spectrum.

[0059] In some implementations of the third aspect, the bandwidth of the reflective film is less than or equal to a spectral resolution of the spectrometer.

[0060] It should be understood that the design of the bandwidth of the reflective film needs to balance the spectral recovery accuracy of the object to be measured and the coating process complexity of the window sheet. The narrower the bandwidth of the reflective film, the easier it is to accurately recover the reflectance spectrum of the object to be measured, but the higher the requirement for coating; on the contrary, the wider the bandwidth of the reflective film, the more difficult it is to accurately recover the reflectance spectrum of the object to be measured, but the lower the requirement for coating.

[0061] In this implementation, the bandwidth of the reflective film is set to be less than or equal to the spectral resolution of the spectrometer, that is, the value of the bandwidth of the reflective film is greater than the value of the spectral resolution of the spectrometer, which can ensure that the obtained active light source has a more accurate reflectance spectrum in the first waveband range.

[0062] In some implementations of the third aspect, the number of wavebands of the reflective film is greater than or equal to 1.

[0063] For example, the number of wavebands of the reflective film is 3.

[0064] It should be understood that the design of the number of wavebands of the reflective film needs to consider the spectral recovery accuracy of the object to be measured and the active light source. The more the number of wavebands of the reflective film, the more difficult it is to accurately recover the reflectance spectrum of the object to be measured, but the easier it is to accurately recover the spectrum of the active light source; on the contrary, the fewer the number of wavebands of the reflective film, the easier it is to accurately recover the reflectance spectrum of the object to be measured, but the more difficult it is to accurately recover the spectrum of the active light source.

[0065] In this implementation, the number of wavebands of the reflective film is set to 3, which can obtain less than 3 times the spectral sampling interval, avoiding the influence of missing spectral information of the object to be measured due to the deduction of part of the spectral range. Since the near-infrared spectrum has fewer characteristic peaks and the spectrum is relatively continuous, limiting the spectral sampling interval to less than 3 times can prevent missing the absorption peaks and other characteristics of the object to be measured, thereby improving the spectral detection accuracy. BRIEF DESCRIPTION OF DRAWINGS

[0066] Figure 1 FIG. 1 is a structural schematic diagram of a spectrometer 100 provided by an embodiment of the present application.

[0067] Figure 2 FIG. 2 is a planar structural schematic diagram of a window and a window sheet provided by an embodiment of the present application.

[0068] Figure 3 FIG. 3 is a planar structural schematic diagram of a window sheet and a reflective film provided by an embodiment of the present application.

[0069] Figure 4is a flowchart of a spectrum self-reference detection method 400 provided by an embodiment of the present application.

[0070] Figure 5 is a flowchart of a spectrum self-reference and self-calibration detection method 500 provided by an embodiment of the present application.

[0071] Figures 6 to 11 is a schematic diagram of a spectrum self-reference and self-calibration detection result provided by an embodiment of the present application.

[0072] Figure 12 is a structural schematic diagram of an electronic device 1200 provided by an embodiment of the present application. DETAILED DESCRIPTION

[0073] The technical solutions in the present application will be described below with reference to the drawings.

[0074] Spectrum instruments are important components of modern optical instruments. Using optical principles, the structure and composition of matter can be qualitatively and quantitatively analyzed without damage, with the advantages of high analysis accuracy, large measurement range, and fast measurement speed, and are widely used in scientific research, information, biological medicine, food and drug detection, agriculture, environment, and security fields. In particular, small and light portable, low-power, and low-cost miniature spectrum instruments are constantly developing, and are widely used in daily life fields such as fruit sugar detection, food freshness detection, non-invasive blood glucose detection, indoor natural gas leakage detection, and household harmful volatile matter detection.

[0075] For the above applications, the material composition and content are mainly studied by obtaining the spectral information of the object to be measured. Due to the aging of the light source after long-term use, or the drift of the instrument after long-term use, etc., it may cause errors in the detection results of the object to be measured, therefore, the self-reference spectrum of the object to be measured is considered to study the material composition and content. That is, by obtaining the reflectance spectral information of the object to be measured, the background noise in the spectrum detection process can be effectively removed, thereby reducing the adverse effects of external conditions on the spectrum signal.

[0076] In order to obtain the reflectivity spectral information of the object to be measured, a reference measurement can be used, that is, the ratio measurement between the reference light signal energy incident on the object to be measured and the light signal energy reflected back through the object to be measured. In an example, in order to obtain the reference light signal energy incident on the object to be measured, the radiation of the light source is usually calibrated. However, the energy of the light source decreases over time, so the light source needs to be calibrated regularly, which increases the complexity of use. In another example, a diffuse reflectance plate is usually placed at the same position as the object to be measured, and the energy received by the diffuse reflectance plate is taken as reference information, so as to obtain the reflectivity spectral information of the object to be measured. However, this way needs to measure the diffuse reflectance plate every time, which is cumbersome, and an additional diffuse reflectance component needs to be carried, which is inconvenient to use.

[0077] In addition, in order to obtain more accurate reflectivity spectral information, a special monochromator needs to be used in the laboratory to calibrate the spectrum of the spectral instrument. However, due to the aging of the device in actual use, the spectrum band will drift, so the spectral instrument needs to be sent to the laboratory for regular calibration of the instrument to ensure the accuracy of the spectrum band. This calibration method is complex, professional and tedious.

[0078] Therefore, how to simplify the reference measurement process and the spectral calibration process, and quickly and accurately obtain the reflectivity spectral information of the object to be measured is a technical problem to be solved.

[0079] Therefore, the present application provides a spectral instrument and an electronic device, that is, a self-reference and self-calibration spectral instrument. By coating a mirror surface symmetrical reflection film that can reflect a specific waveband on both sides of the window sheet, the spectral information of the active light source and the spectral information of the object to be measured can be obtained at the same time through one measurement without additional accessories and without increasing the volume of the instrument, so as to obtain the real-time reference reflectivity spectral information of the object to be measured. Further, the calibration of the instrument spectrum can be realized, and the spectral drift of the instrument can be corrected, so as to simplify the operation process and ensure the spectral measurement accuracy and stability.

[0080] In order to facilitate understanding of the technical solutions of the present application, some concepts and technologies related to the present application are simply explained.

[0081] 1. Reflectivity

[0082] It refers to the percentage of the reflected radiation energy of an object to the total radiation energy. The reflectivity of different objects is different, which mainly depends on the nature of the object (surface condition), and the wavelength and incident angle of the incident electromagnetic wave. The size range of reflectivity is always less than or equal to 1, and the reflectivity can be used to judge the nature of the object.

[0083] 2. Complex light

[0084] Complex light refers to light composed of several monochromatic lights, also known as "composite light", containing light of multiple frequencies, such as sunlight, arc light, incandescent light, etc. General light source is complex light composed of monochromatic light of different wavelengths, and the light emitted by sunlight, artificial daylight, incandescent lamp, etc. in nature is complex light. Judgment method Complex light is not only the white light of the sun, but the white light must be complex light.

[0085] 3、Common optical axis

[0086] Optical axis refers to the center line of the light beam (light column) or the symmetry axis of the optical system. The light beam rotates around the optical axis without any change in optical properties. All surfaces with optical power are symmetric about the optical axis, and the centers of curvature of all surfaces are located on the optical axis.

[0087] 4、Spectral resolution

[0088] Spectral resolution refers to the minimum wavelength interval that can be detected, indicating the spectral detection capability. Spectral resolution, also known as band width, refers to the recording width of the detector in the wavelength direction. Spectral resolution is strictly defined as the wavelength width at which the instrument reaches 50% of the maximum spectral response. For continuous spectrum, spectral resolution can be simply defined as the wave number Δv (cm-1) or wavelength interval between two adjacent absorption characteristics. For example, the spectral resolution of multispectral imaging technology is about 10.

[0089] 5、Infrared light

[0090] Infrared light generally refers to infrared (Infrared, IR), which is a kind of electromagnetic wave with frequency between microwave and visible light, frequency of 0.3THz ~ 400THz, corresponding to the total radiation of wavelength of 760nm ~ 1000um in vacuum. It is invisible light with lower frequency than red light.

[0091] 6、Matrix

[0092] In metal materials, it refers to the main phase or main aggregate, that is, the main component of complex phase alloy. In thermal spraying process, the object used to deposit thermal spraying layer is called matrix. In repair, it refers to the machine part that needs to be repaired. In architecture, the main structure or enclosure structure of the building. In X-ray fluorescence analysis in analytical science, the matrix is the entire sample except the analyzed elements.

[0093] 7、Interpolation algorithm

[0094] Interpolation is an important method of discrete function approximation, and it can be used to estimate the approximate value of a function at other points by using the value of the function at a finite number of points. Common interpolation algorithms include, but are not limited to, nearest neighbor difference value method, bilinear interpolation method and bicubic interpolation method.

[0095] In order to facilitate the understanding of the technical solutions of the present application, the following points are explained.

[0096] In the present application, "at least one" means one or more, and "multiple" means two or more. In the textual description of the present application, the character " / ", generally indicates that the associated objects before and after are in an "or" relationship.

[0097] In the present application, "first", "second", and various numerical numbers (for example, #1, #2) are only for the convenience of description and do not limit the scope of the embodiments of the present application. The size of the serial number of each process below does not mean the order of execution, and the execution order of each process should be determined by its function and inherent logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0098] In the present application, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion, for example, a process, method, system, product or device that includes a series of steps or units does not have to be limited to those clearly listed steps or units, but can include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0099] In the present application, "exemplary" or "for example" and the like are used to mean example, illustration or description, and the embodiments or design schemes described as "exemplary" or "for example" should not be interpreted as more preferred or more advantageous than other embodiments or design schemes. The use of "exemplary" or "for example" and the like is intended to present the relevant concept in a specific manner, for ease of understanding.

[0100] In the present application, the first feature "on" or "under" the second feature can be direct contact between the first and second features, or indirect contact between the first and second features through an intermediate medium. Moreover, the first feature "above", "over" and "on" the second feature can be directly above or obliquely above the first feature, or only means that the horizontal height of the first feature is higher than that of the second feature. The first feature "below", "under" and "under" the second feature can be directly below or obliquely below the first feature, or only means that the horizontal height of the first feature is less than that of the second feature.

[0101] It should be noted that the terms "center", "upper", "lower", "front", "rear", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description, and do not indicate or specify that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application.

[0102] In this application, unless otherwise expressly specified and limited, the terms "installed," "fixed," "set," etc., shall be interpreted broadly. When an element is referred to as being "fixed to" or "set on" another element, it may be directly on the other element or there may be an intervening element. When an element is considered to be "connected" to another element, it may be directly connected to the other element or there may be an intervening element present.

[0103] The technical solution provided in this application will be described in detail below with reference to the accompanying drawings.

[0104] Figure 1 This is a schematic diagram of the structure of a spectrometer 100 provided in an embodiment of this application. Figure 1 As shown, the spectrometer 100 includes: an instrument window 01, a window pane 02, an active light source 03, a spectroscopic module 04, a detection module 05, and a data processing module 06. Figure 2 As shown, window 02 is installed in instrument window 01, and window 02 is coaxial with beam splitter module 04 so that the light beams (e.g., the second beam and the third beam) can be collimated and incident into beam splitter module 04. It should be understood that window 02 is a transparent optical plate that serves to protect electronic components, sensors, or semiconductor components in the optical path. It does not change the optical magnification and only affects the optical path length.

[0105] To simplify the spectral detection process, the technical solution of this application involves coating both sides of the window 02 with a reflective film of a specific wavelength band. For example... Figure 3As shown, the reflective film is coated on the base sheet of the window sheet 02 to improve the reflectivity of the first light beam emitted by the active light source 03, so as to reflect the second light beam through the window sheet 02 to obtain the spectral information of the specific waveband of the active light source. The reflective films coated on the two sides of the window sheet 02 are mirror-symmetric. It should be understood that mirror symmetry means that the image in the plane mirror is consistent with the up-down direction of the real thing, but the left-right direction is opposite. Alternatively, in addition to the specific waveband described above, an anti-reflection film of other wavebands can also be coated on the two sides of the window sheet 02 to improve the transmittance of the first light beam emitted by the active light source 03, so as to obtain the reflectance spectral information of the measured object by means of diffuse reflection on the surface of the measured object and transmission of the third light beam through the window sheet 02. That is, the spectral information of the specific waveband of the active light source 03 and the reflectance spectral information of the measured object can be obtained at the same time by one measurement, and then the reference reflectance spectral information of the measured object can be obtained.

[0106] It should be noted that the reflective films coated on the two sides (or the two sides of the window sheet 02) of the window sheet 02 are mirror-symmetric, which can ensure the accuracy of the spectral detection result, for example, to ensure that the third light beam can return to the entrance of the light splitting module 04. For example, the two sides of the window sheet 02 are coated with three reflective films of specific wavebands (i.e., the first waveband range includes three wavebands) which are mirror-symmetric. For example, one side of the window sheet 02 is coated with three layers of reflective films with waveband ranges of 600-1000 nm, 1200-1600 nm and 2000-2400 nm from the side close to the window sheet 02. Correspondingly, the other side of the window sheet 02 is also coated with three layers of reflective films with waveband ranges of 600-1000 nm, 1200-1600 nm and 2000-2400 nm from the side close to the window sheet 02.

[0107] It should be understood that the active light source 03 is a complex light source, and its spectrum can cover the working spectrum of the spectral instrument. In order to improve the energy of the specific waveband spectrum reflected by the window sheet 02 into the light splitting module 04, the light spot of the active light source 03 should cover the entire window sheet 02. For example, the active light source 03 is arranged on the inner side of the spectral instrument 100, as shown in the figure. Figure 1 As shown, the active light source 03 is distributed at one end of the window sheet 02.

[0108] Alternatively, the number of active light sources 03 can also be multiple. For example, the number of active light sources 03 is two, which are arranged at the two ends of the window sheet 02 and in the edge area of the instrument. In this application, as long as the first light beam emitted by the active light source 03 can cover the entire window sheet 02 and does not block the complete incidence of the light beam (e.g., the second light beam and the third light beam) into the light splitting module 04.

[0109] It should be noted that the active light source 03 should not be arranged on the light path formed between the window sheet 02 and the light splitting module 04. That is, the active light source 03 is not coaxial with the light splitting module 04. This way can avoid the shielding of the second light beam and the third light beam as much as possible, reduce the loss of light beam energy, and improve the accuracy of spectral acquisition.

[0110] The light splitting module 04 can perform light splitting processing on the mixed light beam of the light beam reflected by the window sheet 02 (i.e., the second light beam) and the light beam transmitted through the window sheet 02 (i.e., the third light beam), and then the light beams of different spectral segments after light splitting are incident to the detection module 05. The detection module 05 can be a charge coupled device (CCD) or other types of light detectors. The detector can be composed of detector pixels, which are used to detect the light intensity of the light beams of different spectral segments at each wavelength pixel.

[0111] The data processing module 06 is connected with the light splitting module 04 and the detection module 05, and is used to read the spectral information on the light splitting module 04 and the detection module 05 to obtain mixed spectral information. Meanwhile, the data processing module 06 can also separate the light source spectral information reflected by the window sheet 02 and the spectral information reflected by the object to be measured. Further, the data processing module 06 can also calibrate the spectral drift data of the spectral instrument or the active light source, and the real-time collected reflection spectral information of the specific waveband of the active light source 03 and the real-time reflection spectral information of the object to be measured, and finally obtain the real and accurate self-reference reflectance spectral curve of the object to be measured through calculation.

[0112] It should be noted that, Figure 1 The spectral instrument 100 shown is only an example for facilitating understanding of the scheme, and the relative distance between the components shown in the figure, the shape and size of the components are not necessarily the same as or scaled according to the actual object.

[0113] The working principle of the spectral instrument 100 will be specifically explained below. Figure 1

[0114] ​For example, during the use of the instrument, the active light source 03 emits a first light beam to the window sheet 02. Since the window sheet 02 is coated with a mirror-symmetrical specific waveband reflecting film on both sides, the light beam of the corresponding specific waveband in the first light beam will be directly reflected (i.e. a second light beam) on the surface of the window sheet 02 and then incident on the light splitting module 04 and the detection module 05 of the instrument for light splitting and detection processing in sequence, thereby avoiding the influence of the light beam containing the specific waveband from the outside on the measurement. The light beams of the remaining wavebands in the first light beam will be transmitted through the window sheet 02 to irradiate the object to be measured, and then be diffusely reflected (i.e. a third light beam) on the surface of the object to be measured and then transmitted through the window sheet 02 to be incident on the light splitting module 04 and the detection module 05 of the instrument for light splitting and detection processing in sequence. The data processing module 05 separates the mixed spectral information after the light splitting and detection processing to obtain the real-time reflection spectrum of the active light source 03 and the real-time reflection spectrum of the object to be measured, and then performs ratio processing on the two to obtain the real-time reference reflectance spectrum of the object to be measured.

[0115] Optionally, the mixed light beam of the second light beam and the third light beam is incident on the light splitting module 04 of the instrument, and the light splitting module 04 can split the incident polychromatic light (i.e. the mixed light beam) into light beams of different spectral bands and then be incident on the detection module 05 for spectral detection. It should be understood that the detection module 05 can respond to all spectral signals in the spectral range covered by the spectrometer. Therefore, the spectral curve finally obtained by the instrument is a mixed spectrum, which includes the spectrum of the light beam diffusely reflected on the surface of the object to be measured after being transmitted through the window sheet 02 and the reflection spectrum of the active light source 03 of the specific waveband directly reflected on the surface of the window sheet 02.

[0116] Further, the data processing module 05 can determine whether the spectrum of the instrument is shifted according to the reflection spectrum (central wavelength position and bandwidth) of the active light source calibrated before the instrument is shipped, so as to realize the calibration and fitting of the real-time reflection spectrum of the active light source 03, and obtain the actual reflection spectrum of the object to be measured without reference by spectral interception; then, the actual reflection spectrum of the object to be measured without reference after separation is subjected to interpolation reduction to obtain the actual full-spectral curve of the object to be measured without reference; and then, the actual full-spectral reflection spectrum of the active light source 03 is deduced according to the deduction function F1 of the reflection spectrum of the active light source calibrated before the instrument is shipped and in combination with the actual reflection spectrum of the active light source 03 after fitting. Finally, the actual full-spectral reference reflectance spectrum of the object to be measured is determined according to the actual full-spectral reflection spectrum of the active light source 03 and the actual full-spectral reflection spectrum of the object to be measured without reference.

[0117] The implementation mode can not only realize real-time spectral calibration, but also use the reduced spectrum of the object to be measured and the reduced spectrum of the active light source 03 for real-time reference to obtain the actual reference reflectivity spectrum curve of the object to be measured. That is, the data processing module 05 can separate and calibrate the real-time spectrum of the object to be measured without reference in the first mixed spectrum and the reflection spectrum of the active light source 03 in a specific wave band, and calculate to obtain the real and accurate reference reflectivity spectrum information of the object to be measured.

[0118] In the technical scheme of the present application, the spectrometer 100 is a self-reference and self-calibration spectral instrument. By designing a window sheet 02 capable of reflecting specific wavelengths, that is, the window sheet is coated with a mirror-symmetric reflection film capable of reflecting specific wave bands on both sides, the reflection spectrum information of the active light source 03 and the reflection spectrum information of the object to be measured can be obtained simultaneously in one measurement, so as to obtain the reference reflectivity spectrum information of the object to be measured. Further, the spectrometer 100 can also realize calibration of the collected first mixed spectrum, the real-time reflection spectrum of the active light source, and the real-time reflection spectrum of the object to be measured without reference by pre-storing the reflection spectrum information of the active light source 03 at the factory. The scheme is simple and reliable, and can obtain the actual full-spectrum reference reflectivity spectrum curve of the object to be measured without increasing the additional volume.

[0119] In order to better realize the recovery of the reflection spectrum of the object to be measured and the spectrum of the light source, the bandwidth of the specific wave band reflection film coated on the window sheet 02 and the number of wave bands of the reflection film are considered for example.

[0120] (1) Bandwidth of the reflection film

[0121] It should be understood that the bandwidth of the specific wave band reflection film coated on both sides of the window sheet 02 mainly affects the recovery accuracy of the reflection spectrum of the object to be measured. Among them, the smaller the bandwidth of the reflection film, the easier the reflection spectrum of the object to be measured is to be accurately recovered, and the higher the difficulty of coating is; on the contrary, the larger the bandwidth of the reflection film, the more difficult it is to accurately recover the reflection spectrum of the object to be measured, and the lower the difficulty of coating is. Therefore, the design of the bandwidth of the specific wave band reflection film needs to balance the accuracy of the recovery of the reflection spectrum of the object to be measured and the processing difficulty of coating. Based on the continuous and non-mutated spectral characteristics of near-infrared spectrum, it is a good balance point to set the bandwidth of the reflection film to be not more than the spectral resolution of the instrument itself.

[0122] That is, the value of the bandwidth of the reflective film is greater than the value of the spectral resolution of the instrument, which can ensure that the obtained reflectance spectrum of the active light source 03 is more accurate. In combination with the calibration of the reflectance spectrum of the active light source 03 before the instrument leaves the factory, the center wavelength position, peak value, bandwidth and the like of the spectrum of the active light source 03 in a specific waveband (i.e. in the first waveband range) can be accurately fitted, and in combination with the derivation function F1 of the reflectance spectrum of the active light source calibrated before leaving the factory, the actual full-spectrum reflectance spectrum of the active light source 03 can be restored.

[0123] (2) Number of wavebands of the reflective film

[0124] It should be understood that the number of wavebands of the reflective film of the specific waveband coated by the window sheet 02 mainly affects the recovery accuracy of the reflectance spectrum of the object to be measured and the reflectance spectrum of the active light source 03. Among them, the more the number of wavebands of the reflective film, the more difficult it is to accurately recover the reflectance spectrum of the object to be measured, and the more easily the reflectance spectrum of the active light source 03 is accurately recovered; on the contrary, the less the number of wavebands of the reflective film, the more easily the reflectance spectrum of the object to be measured is accurately recovered, and the more difficult it is to accurately recover the reflectance spectrum of the active light source 03. Therefore, the design of the number of wavebands of the reflective film of the specific waveband needs to balance the recovery accuracy of the reflectance spectrum of the object to be measured and the reflectance spectrum of the active light source 03. Based on the spectral characteristics of near-infrared spectrum, such as continuity, no mutation, and fewer characteristic peaks of the spectrum, and referring to the current three-waveband classic temperature measurement method, it is a good balance point to set the number of wavebands of the reflective film of the specific waveband to three.

[0125] That is, the bandwidth of the reflective film is less than 3 times the spectral sampling interval, which can ensure that the number of continuous interpolation points of the reflectance spectrum of the object to be measured is controlled within 3 points, reduce the influence of missing spectral information of the object to be measured due to deduction, prevent missing the absorption peak and other characteristics of the reflectance spectrum of the object to be measured, and avoid too many or too few interpolation points affecting the recovery accuracy and complexity of the reflectance spectrum of the object to be measured during spectral restoration.

[0126] It should be noted that the three-waveband classic temperature measurement method refers to establishing a universal model for the emissivity function in the short waveband. This universal emissivity model only needs to select three wavelengths to construct a closed temperature measurement equation, which solves the problem of mutual coupling between temperature and emissivity in radiation temperature measurement, thereby realizing accurate measurement of the actual temperature.

[0127] It should be noted that the above-mentioned bandwidth and number of wavebands of the reflective film are only examples given for the convenience of understanding the scheme, and can effectively realize the accurate recovery of the reflectance spectrum of the object to be measured and the reflectance spectrum of the active light source 03 of the specific waveband, and should not constitute any limitation on the technical scheme of the present application.

[0128] To ensure the coating effect of window 02, a vacuum evaporation coating process can be used. For example, a mirror-symmetrical antireflective film can be deposited on both sides of window 02, allowing window 02 to enhance the spectral range covered by the spectrometer 100. Then, a mirror-symmetrical reflective film can be deposited on both sides of window 02. The thin film preparation process includes: placing the substrate material of window 02 in a vacuum coating machine, heating the film material to evaporate or sublimate it, and then adhering it to the surface of the substrate material. The gaseous film particles reaching the surface of the substrate material will condense to form nuclei, growing into a solid-phase thin film, thus completing one coating step.

[0129] It should be understood that the wavelength range of the reflective film coated on both sides of window 02 should be included within the spectral range of the active light source 03. In other words, in the actual design of the reflective film, the spectral range of the active light source 03 determines the wavelength range of the reflective film coated on both sides of window 02. Furthermore, the specific wavelength range of the reflective film determines the selection of coating process parameters. For example, the material of the reflective film (different materials have different dielectric constants, reflectivities, etc.), the thickness of the reflective film, or the number of reflective film layers, etc.

[0130] For example, the active light source 03 can be near-infrared or infrared light with a spectral range of 400–2500 nm, and the spectral ranges of the three selected reflective films can be 600–1000 nm, 1200–1600 nm, and 2000–2400 nm. The material of the reflective film can be silver (Ag), chromium (Cr), titanium (Ti), or copper (Cu), and the thickness can be greater than 10 nm, with more than 10 layers, etc. The above parameters are merely examples provided for ease of understanding of the solution, and the technical solution of this application does not specifically limit them.

[0131] Based on the above Figure 1 The spectrometer 100 shown below and its working principle are explained in conjunction with the following. Figure 2 The spectral self-reference and self-calibration detection methods shown, and Figure 3 The spectral self-reference and self-calibration detection results shown herein provide a detailed explanation of the technical solution of this application.

[0132] First, the instrument needs to be calibrated and tested before it leaves the factory, including:

[0133] (1) Instrument spectral calibration:

[0134] For example, the instrument is calibrated by an external standard calibration device (such as a monochromator, a collimator, etc.) with the built-in active light source 03 of the instrument turned off, i.e. the spectral range, the spectral resolution and the spectral wavelength corresponding to the detector readout pixel of the instrument are determined, and the spectral calibration result is pre-stored in the spectral instrument (for example, the data processing module 06). For example, the spectral range of the instrument is 400-2500 nm, the spectral resolution of the instrument is 10 nm, and the spectral wavelength corresponding to the detector readout pixel is 300 nm.

[0135] (2) Derivation function F1 of the reflectance spectrum of the built-in active light source 03 of the instrument:

[0136] First, a standard diffuse reflectance plate is placed in front of the instrument window 01 (for example, the position of the object to be measured), the built-in active light source 03 of the instrument is turned on, and the light beam is emitted onto the window sheet 02. The second light beam of a specific wavelength band is reflected by the window sheet 02, and the light beam of the remaining wavelength band is transmitted through the window sheet 02 and incident on the object to be measured, and the third light beam of the diffuse reflection is incident on the instrument spectrometer module 04, the detection module 05, and the mixed spectrum Z is obtained by the data processing module 06. λ Therefore, the mixed spectrum Z λ is the superposition spectrum of the spectrum reflected by the window sheet 02 after the standard diffuse reflectance plate is irradiated by the active light source 03, and the spectrum of a specific wavelength band reflected by the reflective film on the inner surface of the window sheet 02 directly irradiated by the active light source 03.

[0137] Then, the standard diffuse reflectance plate in front of the instrument window 01 is replaced by a standard black plate, the built-in active light source 03 of the instrument is kept on, and the spectrum is collected according to the above implementation mode. At this time, the obtained spectrum curve is only the spectrum Y λ of a specific wavelength band reflected by the reflective film on the inner surface of the window sheet 02 directly irradiated by the active light source 03.

[0138] Finally, according to the above two spectrum detections, the spectrum X λ of the standard diffuse reflectance plate irradiated by the active light source 03 and then reflected by the window sheet 02 is obtained by calculating X λ = Z λ -Y λ ; further, the actual reflectance spectrum X' λ of the standard diffuse reflectance plate can be restored by using an interpolation algorithm.

[0139] It should be noted that based on the above step (2), the center wavelength position and bandwidth of the spectrum of the light of the specific waveband reflected by the built-in active light source 03 directly through the reflection film on the inner surface of the window sheet 02, and the intensity and other spectral information can also be calibrated at the factory, and stored in the spectral instrument (for example, the data processing module 06) for judging the spectral drift of the instrument during actual use after leaving the factory. For example, the number of wavebands of the reflection film is set to three, and the waveband ranges are 600-1000nm, 1200nm-1600nm and 2000nm-2400nm respectively, and the corresponding center wavelengths are 800nm, 1400nm and 2200nm respectively.

[0140] Further, according to the calibrated center wavelength positions and bandwidths of the three specific wavebands, the reflection spectrum of the active light source 03 is fitted. Based on the fitted reflection spectrum of the active light source 03 and the center wavelength positions and bandwidths of the three specific wavebands, the fitting model can be deduced, which is the derivation function F1, and then the derivation function relationship between Y λ and Y λ is established, which satisfies: Y λ =F1(Y λ ).

[0141] Thereafter, during the long-term use of the instrument, the actual full-spectrum reflection spectrum Y λ of the active light source 03 can be determined according to the real-time acquired reflection spectrum Y λ of the active light source 03 of the specific waveband, combined with the calibrated derivation function F1 at the factory.

[0142] Figure 4 is a flowchart of a spectral self-reference detection method 400 provided by an embodiment of the present application. As shown in Figure 4 , for the actual use process of the instrument after leaving the factory, the following multiple steps are included.

[0143] S410, acquiring a first mixed spectrum.

[0144] For example, turn on the instrument's built-in active light source 03 and aim it at the object to be measured to collect spectra. Because the window 02 is coated with mirror-symmetrical reflective films for three specific wavelength bands, such as 600–1000 nm, 1200 nm–1600 nm, and 2000 nm–2400 nm, the corresponding light beams from the active light source 03 (e.g., with a spectral range of 400–2500 nm) are directly reflected by the inner surface of the window 02, and the reflected beams are the second beam. Meanwhile, light beams from other wavelength bands in the active light source 03 (e.g., 400–600 nm, 1000 nm–1200 nm, 1600–2000 nm, and 2400–2500 nm) illuminate the object under test through the window 02, and after diffuse reflection from the object, are emitted again through the window 02, and the reflected beams are the third beam. The instrument then performs spectral dispersion and detection processing on the mixed beam of the second and third beams to obtain the first mixed spectrum Z. λ This includes the real-time reflectance spectrum X of the unreferenced test object. λ And the real-time reflection spectrum Y of a specific band of the active light source 03 λ That is, Z. λ =X λ +Y λ .

[0145] like Figure 6 As shown, the curve represents the relationship between the intensity information (vertical axis) and wavelength (horizontal axis) of the first mixed spectrum. The solid line represents the Z-axis of the first mixed spectrum. λ The spectral curve shows that the continuous, wide-range dashed line represents the real-time reflectance spectrum X of the unreferenced analyte. λ The spectral curves, with the dashed lines representing the three shorter wavelength ranges, indicate the real-time reflectance spectra of the active light source 03 in three specific wavelength bands. λ Among them, the real-time reflectance spectrum X of the unreferenced test object. λ The spectral curves, and the real-time reflectance spectra of the active light source 03 in three specific bands. λ The specific separation process is described in steps S420 and S430 below, which will not be explained here.

[0146] S420, according to the first mixing spectrum Z λ And the pre-stored reflection spectrum of active light source 03, to obtain the reflection spectrum Y of active light source 03 in the first waveband range. λ .

[0147] It should be understood that the pre-stored reflection spectrum of the active light source 03 refers to the reflection spectrum information obtained by the spectrometer when the active light source 03 is turned on during factory calibration. This includes the center wavelength position, bandwidth, intensity, and other spectral information of the active light source 03 within the first band range. This information is used to calibrate the spectral drift of the spectrometer or the active light source 03 during subsequent actual use. The method for obtaining the reflection spectrum of the pre-stored active light source 03 in a specific band can be found in step (2) above before factory calibration, and will not be repeated here for the sake of brevity.

[0148] For example, the intensity of the active light source 03, calibrated at the factory, in a specific wavelength band, and the first mixed spectrum Z... λ By aligning the intensity of the active light source 03 in a specific wavelength band, the reflection spectrum Y of the active light source 03 can be obtained. λ .like Figure 7 As shown, the reflection spectrum Y of the active light source 03 in three specific wavelength bands is represented. λ The graph shows the relationship between intensity information (vertical axis) and wavelength (horizontal axis). Specifically, the vertical axis corresponding to the three protrusions in the graph represents the intensity information of the active light source 03 in three specific wavelength bands.

[0149] S430, the first mixed spectrum Z λ And the reflection spectrum Y of the active light source 03 in the first band range λ The difference is performed to obtain the reflectance spectrum X of the unreferenced test object. λ .

[0150] For example, based on the actual reflectance spectrum Y of the active light source 03 λ The center wavelength position and bandwidth in the first mixed spectrum Z λ In this process, portions of the spectrum in three specific wavebands are extracted, and the resulting spectral curves represent the reflectance spectrum X of the unreferenced test object. λ In other words, the first mixed spectrum Z λ The reflection spectrum Y of active light source 03 λ The intensity information is subtracted, and the ordinate of the resulting spectral curve is the reflectance spectrum X of the unreferenced test object. λ Intensity information. For example... Figure 8 As shown, X represents the reflectance spectrum of the unreferenced test object after truncation. λ The curve relationship between intensity information (vertical axis) and wavelength (horizontal axis).

[0151] Based on the above steps S420 and S430, the first mixed spectrum Z is completed. λ The separation process yielded the reflection spectrum Y of the active light source 03. λ And the actual reflectance spectrum X of the unreferenced test object.λ .

[0152] S440, Reflectance spectrum X of the unreferenced test object λ Interpolation calculations were performed to obtain the full-spectrum reflectance spectrum X' of the unreferenced test object. λ .

[0153] For example, the reflectance spectrum curve X of the truncated, non-referenced test object. λ By performing interpolation calculations, the full-spectrum reflectance spectrum X' of the unreferenced test object can be reconstructed. λ The specific implementation of interpolation can be found in existing spectral interpolation techniques, which will not be elaborated upon here. For example... Figure 9 As shown, X' represents the full-spectrum reflectance spectrum of the unreferenced test object. λ The curve relationship between intensity information (vertical axis) and wavelength (horizontal axis).

[0154] S450, based on the pre-stored derivation function F1 of the reflection spectrum of the active light source 03, and the reflection spectrum Y of the active light source 03 in the first band range... λ The full-spectrum reflectance spectrum Y' of the active light source 03 was obtained. λ .

[0155] It should be understood that the pre-stored extrapolation function F1 of the active light source's reflection spectrum refers to the reflection spectrum of the active light source 03 obtained during factory calibration by fitting three specific center wavelengths within the first band range, such as 800nm, 1400nm, and 2200nm. F1 is used in subsequent practical applications to determine the full-spectrum reflection spectrum of the active light source 03 by combining the real-time acquired reflection spectra of the active light source in these three specific bands. The method for obtaining the pre-stored extrapolation function F1 of the active light source's reflection spectrum can be found in step (2) before factory calibration, and will not be repeated here for brevity. The specific implementation method of the fitting process can be found in existing spectral fitting techniques, and will not be repeated here. Figure 10 As shown, Y' represents the full-spectrum reflectance spectrum of the active light source. λ The curve relationship between intensity information (vertical axis) and wavelength (horizontal axis).

[0156] Based on the above steps S440 and S450, the reflection spectrum Y of the active light source 03 is thus obtained. λ and the reflectance spectrum X of the unreferenced test object. λ The reduction process involves analyzing the reflection spectrum Y of the active light source 03. λ The fitting process is performed, and the reflectance spectrum of the unreferenced test object is X-rayed. λ Perform interpolation.

[0157] S460, determining the reference reflectance spectrum information R' of the full spectrum of the object to be measured according to the full spectrum reflectance spectrum X' of the object to be measured without reference λ and the full spectrum reflectance spectrum Y' of the active light source 03. λ

[0158] Exemplarily, the full spectrum reflectance spectrum X' of the object to be measured obtained in the step S440 λ is divided by the full spectrum reflectance spectrum Y' of the active light source 03 obtained in the step S450 λ , that is, R' = X' / Y'. λ λ As shown in FIG. 6, a curve relationship between the reference reflectance spectrum information R' (ordinate) of the full spectrum of the object to be measured and the wavelength (abscissa) is shown. Figure 11

[0159] Therefore, according to the above implementation mode, the spectral instrument completes the collection and calibration of the spectral reflectance curve of the full spectrum of the object to be measured, and the reflectance spectrum information of the object to be measured can be obtained by one measurement, the operation process is simplified, and then the structure or composition of the object is determined.

[0160] Considering that the collected spectrum may be offset due to long-time use of the instrument, resulting in error problems of the spectral detection result. Therefore, the instrument can be self-calibrated during use to ensure the accuracy of the collected spectrum.

[0161] Figure 5 is a flowchart of a spectral self-reference and self-calibration detection method 500 provided by the embodiment of the present application. As shown in FIG. 7, for the actual use process of the instrument after leaving the factory, the following steps are included. Figure 5

[0162] S510, obtaining a first mixed spectrum Z λ .

[0163] The specific implementation mode can refer to the step S410 of the method 400 described above, and will not be described here for brevity.

[0164] S520, calibrating the first mixed spectrum Z λ according to the pre-stored reflectance spectrum of the active light source 03, to obtain a calibrated first mixed spectrum Z' λ .

[0165] Exemplarily, according to the center wavelength and bandwidth of the active light source 03 at specific wavelength bands, for example, 800 nm, 1400 nm and 2200 nm, which are calibrated when the instrument leaves the factory, the real-time reflectance spectrum Y λ ​​​​Calibration is performed to determine if the instrument's spectrum has shifted; if so, calibration is performed. Further, extreme values ​​are searched near the center wavelength of each specific band, and the actual reflection spectrum of the active light source 03 in each specific band is fitted, thus obtaining the actual center wavelength position and bandwidth of the active light source 03.

[0166] It should be noted that if the instrument is used for an extended period after leaving the factory, the center wavelength position of the pre-stored active light source 03 may differ from the center wavelength position of the actually fitted active light source 03. This indicates a shift in the reflection spectrum of the active light source 03, requiring calibration of the reflection spectrum to align and adjust the center wavelength position of the actually fitted center wavelength with the pre-stored center wavelength position and bandwidth. For example, the center wavelength of the actually fitted center wavelength may be shifted to the right. If the instrument is used for a short period after leaving the factory, the center wavelength position of the pre-stored active light source 03 may be the same as the center wavelength position of the actually fitted active light source 03, indicating that the reflection spectrum of the active light source 03 has not shifted.

[0167] For example, if the instrument is used for a long period of time after leaving the factory, the center wavelength position of the pre-stored active light source 03 may differ from the center wavelength position of the actually fitted active light source 03. This indicates that the reflection spectrum of the active light source 03 has shifted, and it is necessary to further calibrate the first mixed spectrum Z based on the actual reflection spectrum of the fitted active light source 03. λ For example, the first mixed spectrum Z collected λ Shifting the entire spectrum to the right yields the calibrated first mixed spectrum Z'. λ If the instrument is used shortly after leaving the factory, the center wavelength position of the pre-stored active light source 03 may be the same as the center wavelength position of the actually fitted active light source 03. This indicates that the reflection spectrum of the active light source 03 has not shifted, and Z' λ =Z λ .

[0168] It should be noted that the calibration of the first mixed spectrum is an optional step, and subsequent steps such as spectral separation and spectral reconstruction based on the calibrated mixed spectrum are also optional. It should be understood that calibrating the instrument and the acquired spectra ensures a more accurate reflectance spectrum curve of the analyte, thereby ensuring accurate qualitative and quantitative analysis of the substance's structure and composition. Optionally, calibration can be performed each time the instrument is used for spectral measurement, or it can be periodic, such as calibrating every certain period of time, or after every 10 spectral measurements, etc. This application does not specifically limit this.

[0169] S530, based on the calibrated first mixture spectrum Z' λand the pre-stored reflection spectrum of the active light source 03, to obtain the actual reflection spectrum of the active light source 03 in the first waveband range.

[0170] For example, the intensity of the active light source 03 in the specific waveband calibrated when the instrument is shipped, and the first mixed spectrum Z' λ calibrated, are aligned, so as to obtain the actual reflection spectrum of the active light source 03.

[0171] S540, the first mixed spectrum Z' λ calibrated is subtracted from the actual reflection spectrum of the active light source 03 in the first waveband range, to obtain the actual reflection spectrum of the non-reference object to be measured.

[0172] For example, based on the central wavelength position and bandwidth of the actual reflection spectrum of the active light source 03, the partial spectrum of the three specific wavebands in the first mixed spectrum Z' λ calibrated is intercepted, and the spectrum curve after the interception is the actual reflection spectrum X λ of the non-reference object to be measured. That is, the first mixed spectrum Z' λ calibrated is subtracted from the intensity information of the actual reflection spectrum of the active light source 03, and the ordinate of the obtained spectrum curve is the intensity information of the actual reflection spectrum of the non-reference object to be measured.

[0173] Based on the above steps S530 and S540, the separation processing of the first mixed spectrum Z' λ calibrated is completed, and the actual reflection spectrum of the active light source 03 and the actual reflection spectrum of the non-reference object to be measured are obtained.

[0174] S550, the actual reflection spectrum of the non-reference object to be measured is subjected to interpolation calculation, to obtain the actual full-spectrum reflection spectrum of the non-reference object to be measured.

[0175] For example, the reflection spectrum curve of the non-reference object to be measured after the interception is subjected to interpolation calculation, and the actual full-spectrum reflection spectrum of the non-reference object to be measured can be restored. The specific implementation mode of the interpolation processing can refer to the existing spectrum interpolation technology, and will not be described in detail here.

[0176] S560, according to the derivation function F1 of the pre-stored reflection spectrum of the active light source 03 and the actual reflection spectrum of the active light source 03 in the first waveband range, the actual full-spectrum reflection spectrum of the active light source 03 is obtained.

[0177] It should be understood that the extrapolation function F1 of the pre-stored reflection spectrum of the active light source refers to fitting the actual reflection spectrum of the active light source 03 through three specific center wavelengths in the first waveband range, such as 800 nm, 1400 nm and 2200 nm, at the time of factory calibration. F1 is used to determine the full-spectrum reflection spectrum of the active light source 03 in combination with the real-time collected reflection spectrum of the active light source at the three specific wavebands during subsequent actual use. The acquisition method of the extrapolation function F1 of the pre-stored reflection spectrum of the active light source can be referred to the above step (2) before factory, which will not be described here for brevity. The specific implementation of the fitting process can refer to the existing spectrum fitting technology, which will not be described here. Based on the above steps S550 and S560, the actual reflection spectrum of the active light source 03 and the actual reflection spectrum of the non-reference object to be measured are restored, that is, the actual reflection spectrum of the active light source 03 is fitted, and the actual reflection spectrum of the non-reference object to be measured is interpolated.

[0178] S570, according to the actual full-spectrum reflection spectrum of the non-reference object to be measured and the actual full-spectrum reflection spectrum of the active light source 03, determining the actual full-spectrum reference reflectance spectrum information of the object to be measured.

[0179] Exemplarily, the actual full-spectrum reflection spectrum of the object to be measured obtained in the above step S550 is calculated by ratio with the actual full-spectrum reflection spectrum of the active light source 03 obtained in the above step S560, that is, the actual full-spectrum reference reflectance spectrum of the object to be measured is obtained.

[0180] Therefore, according to the above implementation mode, the spectral instrument completes the collection and calibration of the actual full-spectrum spectral reflectance curve of the object to be measured, simplifies the self-reference process of the spectral reflectance of the object to be measured, and ensures the accuracy of spectral collection.

[0181] In summary, the technical scheme of the present application adopts a window sheet 02 that can reflect specific wavelengths, and through one measurement, the specific waveband reflection spectrum information of the active light source 03 and the reflection spectrum information of the measured object can be obtained at the same time, so as to obtain the reflectance spectrum information of the object to be measured. At the same time, the spectral self-calibration can be realized, and the spectral drift of the instrument can be corrected. The device disclosed in the present application does not need to increase additional accessories, nor does it need to increase the volume of the instrument, which simplifies the spectral reference measurement process, realizes the rapid and accurate acquisition of the reference reflectance spectrum information of the object to be measured, and uses and operates the scheme simply, without additional accessories, which is convenient for spectral instrument integration and rapid real-time spectral analysis and other scene applications.

[0182] It should be understood that commercial portable or handheld spectral analysis devices have gradually compressed the spectral instrument to centimeter level, and will continue to compress the volume to millimeter level, even micron level. The aboveFigure 1 It is a trend to integrate the spectrometer 100 into a chip or an electronic device such as a smart phone, a notebook computer, and the like.

[0183] Figure 12 is a schematic structural diagram of an electronic device 1200 provided by an embodiment of the present application. The electronic device 1200 can be a terminal consumer product or a 3C electronic product (computer, communication, consumer electronic product), such as a mobile phone, a portable computer, a tablet computer, an electronic reader, a notebook computer, a digital camera, a wearable device, a headset, a watch, a digital camera, or a stylus, and the like. The electronic device 1200 can also be a vehicle, or a control device, a car machine, a vehicle-mounted device, and the like applied to a vehicle. Figure 12 The embodiment shown takes the electronic device 1200 as a mobile phone as an example for illustration.

[0184] The electronic device 1200 can include a housing 1210, a display screen 1220, and a circuit board assembly 1230. The display screen 1220 and the circuit board assembly 1230 are mounted to the housing 1210. Specifically, the housing 1210 can include a frame and a back cover. The frame can be located between the display screen 1220 and the back cover. The frame can surround the outer periphery of the display screen 1220 and the outer periphery of the back cover, and the display screen 1220 is spaced apart from the back cover. The cavity formed between the display screen 1220, the frame, and the back cover can be used to accommodate the circuit board assembly 1230, and the housing 1210 can be used to fix the circuit board assembly 1230. The circuit board assembly 1230 can include a circuit board, and a spectrometer 1240 disposed on the circuit board.

[0185] The circuit board can be a printed circuit board, a flexible circuit board, an integrated circuit (or referred to as a chip), and the like. According to the number of electronic elements carried on the circuit board, the circuit board can be a single-sided board or a double-sided board. The single-sided board can refer to a circuit board carrying electronic elements on one side. The double-sided board can refer to a circuit board carrying electronic elements on both sides. According to the type of electronic elements carried on the circuit board, the circuit board can be a main board, a module board, a frame board, a radio frequency board, or an application processor (AP) board, and the like. The main board can be a main circuit board in the electronic device. The RF board can be used to carry a radio frequency chip, a radio frequency power amplifier, a wireless fidelity (WIFI) chip, and the like. The AP board can be used to carry a system on chip (SOC) element, a double data rate memory, and the like.

[0186] Optionally, the electronic device further comprises a processor which can analyze and calibrate the spectrum of the object to be measured, i.e. to quickly and accurately obtain the reflectivity spectrum information of the object to be measured, and the specific implementation manner is similar to the function of the data processing module in the spectral instrument, which will not be described in detail here.

[0187] Specifically, taking the detection of the sugar content of fruits as an example, the detection window of the spectrometer 1240 of the electronic device 1200 is aligned with the fruit to collect the spectral curve of the fruit, and the sugar content of the fruit can be quickly calculated through the model algorithm built in the spectrometer 1240, so as to achieve the purpose of rapid detection of the sugar content. In addition, the alcohol content of baijiu, the protein content of milk and milk powder, and even whether the vegetables are organically planted can be detected.

[0188] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working process of the system, device and unit described above can refer to the corresponding process in the foregoing method embodiments, which will not be described here.

[0189] In the several embodiments provided in the present application, it should be understood that the disclosed system, device and method can be implemented by other means. For example, the device embodiments described above are only schematic, and the division of the units is only a logical function division, and there can be another division manner in actual implementation, for example, a plurality of units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the coupling or direct coupling or communication connection between the units shown or discussed can be indirect coupling or communication connection through some interface, device or unit, and can be electrical or other forms.

[0190] Those skilled in the art can realize that the units and algorithm steps of each example described in combination with the embodiments disclosed herein can be realized by electronic hardware or a combination of computer software and electronic hardware. Whether the functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the present application.

[0191] The above is only a specific implementation manner of the present application, but the protection scope of the present application is not limited thereto, and any person skilled in the art can easily think of changes or replacements within the technical range disclosed in the present application, which should be covered in the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A spectrometer, characterized in that, include: The system comprises a window, an active light source, a window pane, a beam splitter module, a detection module, and a data processing module. The window pane is installed within the window and shares the same optical axis as the beam splitter module. Both sides of the window pane are coated with a mirror-symmetrical reflective film, and the reflective film's wavelength range is a first wavelength range. The active light source is used to emit a first light beam to the window plate; The window is used to reflect the second beam to the beam splitter, and the wavelength range of the second beam is the same as that of the first wavelength range. The window is also used to transmit a third beam to the object under test. The third beam is incident on the beam splitter module through diffuse reflection from the surface of the object under test. The wavelength range of the third beam is other wavelength ranges besides the first wavelength range in the wavelength range of the first beam. The beam splitting module is used to perform beam splitting processing on the mixed beam of the second beam and the third beam; The detection module is used to detect the beam after spectral processing to obtain the first mixed spectrum; The data processing module is used to separate the first mixed spectrum to obtain the full-spectrum reflectance spectrum of the active light source and the full-spectrum reflectance spectrum of the unreferenced object under test. The data processing module is further configured to determine the reference reflectance spectrum of the full spectrum of the test object based on the full spectrum reflectance spectrum of the active light source and the full spectrum reflectance spectrum of the unreferenced test object.

2. The spectrometer according to claim 1, characterized in that, The data processing module is used to separate the first mixed spectrum to obtain the full-spectrum reflectance spectrum of the active light source and the full-spectrum reflectance spectrum of the unreferenced object under test, specifically: Based on the first mixed spectrum and the pre-stored reflection spectrum of the active light source, the reflection spectrum of the active light source in the first band range is obtained; The first mixed spectrum is subtracted from the reflection spectrum of the active light source in the first band range to obtain the reflection spectrum of the unreferenced object under test. Interpolation calculations are performed on the reflectance spectrum of the unreferenced test object to obtain the full-spectrum reflectance spectrum of the unreferenced test object; Based on the pre-stored extrapolation function of the reflection spectrum of the active light source and the reflection spectrum of the active light source in the first band range, the full-spectrum reflection spectrum of the active light source is fitted to obtain the full-spectrum reflection spectrum of the active light source.

3. The spectrometer according to claim 1 or 2, characterized in that, The data processing module is also used for: The first mixed spectrum is calibrated based on the pre-stored reflection spectrum of the active light source.

4. The spectrometer according to any one of claims 1 to 3, characterized in that, The number of active light sources is multiple, and the multiple active light sources are evenly distributed in the inner edge area of ​​the window.

5. The spectrometer according to any one of claims 1 to 4, characterized in that, The first beam completely covers the window.

6. The spectrometer according to any one of claims 1 to 5, characterized in that, The bandwidth of the reflective film is less than or equal to the spectral resolution of the spectrometer.

7. The spectrometer according to any one of claims 1 to 6, characterized in that, The reflective film has one or more wavelength bands.

8. An electronic device, characterized in that, include: The spectrometer as described in any one of claims 1 to 7.

9. An electronic device, characterized in that, include: A spectrometer and a processor, the spectrometer comprising: a window, an active light source, a window plate, a beam splitter module, and a detection module, wherein the window plate is mounted in the window and shares the same optical axis as the beam splitter module, and both sides of the window plate are coated with mirror-symmetrical reflective films, the reflective films having a wavelength range of a first wavelength range; wherein: The active light source is used to emit a first light beam to the window plate; The window is used to reflect the second beam to the beam splitter, and the wavelength range of the second beam is the same as that of the first wavelength range. The window is also used to transmit a third beam to the object under test. The third beam is incident on the beam splitter module through diffuse reflection from the surface of the object under test. The wavelength range of the third beam is other wavelength ranges besides the first wavelength range in the wavelength range of the first beam. The beam splitting module is used to perform beam splitting processing on the mixed beam of the second beam and the third beam; The detection module is used to detect the beam after spectral processing to obtain the first mixed spectrum; The processor is configured to separate the first mixed spectrum to obtain the full-spectrum reflectance spectrum of the active light source and the full-spectrum reflectance spectrum of the unreferenced object under test; The processor is further configured to determine the reference reflectance spectrum of the full spectrum of the test object based on the full spectrum reflectance spectrum of the active light source and the full spectrum reflectance spectrum of the unreferenced test object.

10. The electronic device according to claim 9, characterized in that, The processor is used to separate the first mixed spectrum to obtain the full-spectrum reflectance spectrum of the active light source and the full-spectrum reflectance spectrum of the unreferenced object under test, specifically: Based on the first mixed spectrum and the pre-stored reflection spectrum of the active light source, the reflection spectrum of the active light source in the first band range is obtained; The first mixed spectrum is subtracted from the reflection spectrum of the active light source in the first band range to obtain the reflection spectrum of the unreferenced object under test. Interpolation calculations are performed on the reflectance spectrum of the unreferenced test object to obtain the full-spectrum reflectance spectrum of the unreferenced test object; Based on the pre-stored extrapolation function of the reflection spectrum of the active light source and the reflection spectrum of the active light source in the first band range, the full-spectrum reflection spectrum of the active light source is fitted to obtain the full-spectrum reflection spectrum of the active light source.

11. The electronic device according to claim 9 or 10, characterized in that, The processor is also used for: The first mixed spectrum is calibrated based on the pre-stored reflection spectrum of the active light source.

12. The electronic device according to any one of claims 9 to 11, characterized in that, The number of active light sources is multiple, and the multiple active light sources are evenly distributed in the inner edge area of ​​the window.

13. The electronic device according to any one of claims 9 to 12, characterized in that, The first beam completely covers the window.

14. The electronic device according to any one of claims 9 to 13, characterized in that, The bandwidth of the reflective film is less than or equal to the spectral resolution of the spectrometer.

15. The electronic device according to any one of claims 9 to 14, characterized in that, The reflective film has one or more wavelength bands.

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