Methods, systems, equipment, media, and products for measuring conductor voltage on double-circuit towers.

Abstract

This invention discloses a method, system, device, medium, and product for measuring the conductor voltage of a double-circuit tower, relating to the field of non-contact electrical parameter measurement technology. The measurement method includes: determining the distance between the measuring phase conductors of each phase in the double-circuit line under test and sensors located at predetermined distances on the measuring phase conductors, and determining the angle between each connecting line and the x-axis of the spatial coordinate system; determining the induced voltage generated by each measuring phase conductor by inversely decomposing the induced voltage measured at each sensor; and determining the voltage of each measuring phase conductor relative to ground based on the measured distances, angles, induced voltages, and the voltage of the measuring phase conductors relative to ground in a single-circuit line. This invention is developed based on the method of voltage inversion for single-circuit lines, eliminating the need to develop a new method for measuring the voltage of double-circuit lines, accurately measuring the voltage of double-circuit line systems while reducing costs.

Description

Technical Field

[0001] This invention relates to the field of non-contact measurement technology of electrical parameters, and in particular to a method, system, device, medium and product for measuring the conductor voltage of a double-circuit tower. Background Technology

[0002] Over the past few decades, non-contact measurement technology has made significant progress. Compared to traditional contact measurement, non-contact measurement technology offers many advantages, including faster measurement speeds, lower installation costs, and greater flexibility. It does not require direct contact with the object being measured, thus allowing measurements to be taken without affecting system operation. Furthermore, non-contact measurement technology can achieve high-frequency measurements, providing more information about the system's status.

[0003] Determining voltage by measuring the electric field and combining it with corresponding algorithms has become a popular research topic. However, non-contact measurement technology also faces some challenges. Due to the complexity of three-phase power systems, most voltage measurement research methods focus on voltage inversion solutions for single-circuit lines. For double-circuit lines or more complex systems, new methods must be developed to accurately measure their voltage, but these new methods are costly and difficult to implement. Summary of the Invention

[0004] The purpose of this invention is to provide a method, system, device, medium, and product for measuring the conductor voltage of double-circuit towers, in order to solve the problem that in the prior art, only newly developed methods can be used to accurately measure the voltage of double-circuit lines, resulting in high construction costs.

[0005] To achieve the above objectives, the present invention provides the following solution:

[0006] A method for measuring conductor voltage on a double-circuit tower, comprising:

[0007] The dual-circuit circuit to be tested is divided into a first circuit to be tested and a second circuit to be tested; both the first circuit to be tested and the second circuit to be tested are single circuits.

[0008] Obtain the spatial coordinates of the measuring phase conductor in the double-circuit circuit under test and the spatial coordinates of the sensor set at a preset distance from the measuring phase conductor; the measuring phase conductor is the A-phase conductor, the B-phase conductor, the C-phase conductor of the first circuit under test, the A'-phase conductor, the B'-phase conductor, or the C'-phase conductor of the second circuit under test;

[0009] The distance between the measuring phase conductor and the sensor is determined based on the spatial coordinates of the measuring phase conductor and the spatial coordinates of the sensor.

[0010] Based on the spatial coordinates of the measuring phase conductor for each phase, the spatial coordinates of the corresponding sensor for each measuring phase conductor, and the distance between each measuring phase conductor and each sensor, the first virtual connection and the spatial coordinate system are determined. x The included angle along the axial direction; the first virtual connection is the virtual connection between the sensor corresponding to each phase's measuring phase conductor and each phase's measuring phase conductor; the spatial coordinate system is based on the line connecting the B-phase conductor and the B'-phase conductor. x The axis is the central axis of the double-return tower. y A spatial coordinate system is established using the axes;

[0011] By using the principle of electric field superposition, the induced voltage measured at each of the sensors is decomposed in reverse to determine the induced voltage generated by each phase measuring conductor.

[0012] Based on the distance between each phase measurement conductor and each sensor, and the first virtual connection and the spatial coordinate system... x The included angle in the axial direction, the induced voltage generated by each phase measuring conductor, and the voltage of the measuring phase conductor relative to ground in a single circuit are used to determine the voltage of each phase measuring conductor relative to ground in the double circuit to be tested.

[0013] Optionally, the voltage of the measuring phase conductor to ground in the single-circuit line is:

[0014] ;

[0015] Where U is the voltage of the measuring phase conductor to ground in a single-circuit line. For U in the first i The induced voltage generated at each sensor in a single-circuit line i =1,2,3 For measuring the phase conductor and the first phase conductor in a single-circuit line i The distance between the sensors For the first virtual connection and spatial coordinate system x The angle along the axial direction, To measure the radius of the phase conductor in a single-circuit line. The distance between the sensor and the zero-potential surface. To measure the internal dielectric constant of a phase conductor in a single-circuit circuit. is the dielectric constant of air.

[0016] Optionally, the distance between the measuring phase conductor and the sensor is:

[0017] ;

[0018] ;

[0019] in, To measure the phase conductor and the first i The distance between the sensors in the dual-circuit circuit under test i =1, 2, 3, 4, 5, 6, ( x , y ) represents the spatial coordinates of the measured phase conductor. x si , y si ) is the first i The coordinates of each sensor.

[0020] Optionally, using the formula , , , , ,as well as Determine the first virtual connection and the spatial coordinate system. x Angle along the axial direction;

[0021] in, For the first virtual connection and spatial coordinate system x The included angle along the axial direction in the double-circuit line under test. i =1, 2, 3, 4, 5, 6 To measure the phase conductor and the first i The distance between the sensors, ( x , y ) represents the spatial coordinates of the measured phase conductor. x si , y si ) is the first i The coordinates of each sensor.

[0022] Optionally, the induced voltage generated by the measuring phase conductor in each phase is:

[0023] ;

[0024] ;

[0025] in, For phase A conductor in the first... i The induced voltage measured at each sensor in the double-circuit circuit under test i =1, 2, 3 For phase B conductor in the first... iThe induced voltage measured at each sensor For the C-phase conductor in the first... i The induced voltage measured at each sensor For phase A' conductor in the first... i The induced voltage measured at each sensor For phase B conductor in the first... i The induced voltage measured at each sensor For the C' phase conductor in the first i The induced voltage measured at each sensor , , , , , All are fixed constants. j =1, 2, 3 Let A' be the phase of the conductor.

[0026] Optionally, based on the distance between each phase measurement conductor and each sensor, and the first virtual connection and the spatial coordinate system... x The included angle along the axis, the induced voltage generated by each phase conductor of the measuring phase, and the single-circuit voltage are used to determine the voltage of each phase conductor of the double-circuit line under test relative to ground, specifically including:

[0027] Using formula Determine the voltage of each phase measuring conductor relative to ground in the double-circuit circuit under test;

[0028] in, This represents the voltage of phase A conductor relative to ground. This represents the voltage of phase B conductor relative to ground. This represents the voltage of phase C conductor relative to ground. Let V be the voltage of phase A' conductor relative to ground. Let be the voltage of phase B conductor relative to ground. Let be the voltage of phase C' conductor relative to ground. For phase A conductor and the first i The distance between the sensors in the dual-circuit circuit under test i =1, 2, 3 For phase B conductor and the first i The distance between the sensors For the C-phase conductor and the first i The distance between the sensors For phase A' conductor and the first i The distance between the sensors For phase B conductor and the first i The distance between the sensors For phase C' conductor and the firsti The distance between the sensors Indicates that the A-phase conductor and the first i The connections between the sensors and x The angle along the axial direction, Indicates that the B-phase conductor is connected to the first phase conductor. i The connections between the sensors and x The angle along the axial direction, Indicates the C-phase conductor and the first i The connections between the sensors and x The angle along the axial direction, For phase A' conductor and the first i The connections between the sensors and x The angle along the axial direction, For phase B conductor and the first i The connections between the sensors and x The angle along the axial direction, For phase C' conductor and the first i The connections between the sensors and x The angle along the axial direction, To measure the radius of the phase conductor, The distance between the sensor and the zero potential surface, To measure the internal dielectric constant of the phase conductor, is the dielectric constant of air.

[0029] A measurement system for conductor voltage of a double-circuit tower includes: a spatial position coordinate acquisition module, a distance determination module, an angle determination module, an induced voltage determination module, and a voltage determination module;

[0030] The spatial position coordinate acquisition module is used to acquire the spatial position coordinates of the measuring phase conductor in the double-circuit line under test and the spatial position coordinates of the sensor set at a preset distance from the measuring phase conductor; the measuring phase conductor is the A phase conductor of the first circuit, the B phase conductor of the first circuit, the C phase conductor of the first circuit, the A' phase conductor of the second circuit, the B' phase conductor of the second circuit, or the C' phase conductor of the second circuit.

[0031] The distance determination module is used to determine the distance between the measuring phase conductor and the sensor based on the spatial position coordinates of the measuring phase conductor and the spatial position coordinates of the sensor.

[0032] The angle determination module is used to determine the first virtual connection line and the spatial coordinate system based on the spatial position coordinates of each phase measuring phase conductor, the spatial position coordinates of the corresponding sensor of each phase measuring phase conductor, and the distance between each phase measuring phase conductor and each sensor. xThe included angle along the axial direction; the first virtual connection is the virtual connection between the sensor corresponding to each phase's measuring phase conductor and each phase's measuring phase conductor; the spatial coordinate system is based on the line connecting the B-phase conductor and the B'-phase conductor. x The axis is the central axis of the double-return tower. y A spatial coordinate system is established using the axes;

[0033] The induced voltage determination module is used to reverse decompose the induced voltage measured at each of the sensors by using the principle of electric field superposition, and determine the induced voltage generated by each phase of the measuring phase conductor.

[0034] The voltage determination module is used to determine the voltage based on the distance between each phase measuring conductor and each sensor, the distance between the first virtual connection and the spatial coordinate system. x The included angle in the axial direction, the induced voltage generated by each phase measuring conductor, and the voltage of the measuring phase conductor relative to ground in a single circuit are used to determine the voltage of each phase measuring conductor relative to ground in the double circuit to be tested.

[0035] An electronic device includes a memory and a processor, the memory storing a computer program and the processor running the computer program to cause the electronic device to perform the method for measuring the conductor voltage of a double-return tower as described above.

[0036] A computer-readable storage medium is characterized in that it stores a computer program, which, when executed by a processor, implements the method for measuring the conductor voltage of a double-return tower as described above.

[0037] A computer program product includes a computer program, characterized in that, when executed by a processor, the computer program implements the steps of the method for measuring the conductor voltage of a double-return tower.

[0038] According to specific embodiments provided by the present invention, the present invention discloses the following technical effects:

[0039] The present invention provides a method, system, device, medium, and product for measuring conductor voltage on double-circuit towers. This involves determining the distance between the measuring phase conductors of each phase in the double-circuit line under test and sensors positioned at preset distances on the measuring phase conductors. Each measuring phase conductor is connected to its respective sensor, and the relationship between each connection and the spatial coordinate system is determined. x The included angle along the axis; using the principle of electric field superposition, the induced voltage measured at each sensor is decomposed in reverse to determine the induced voltage generated by each phase measuring conductor; based on the distance between each phase measuring conductor and each sensor, the connection between each line and the spatial coordinate system... xThe included angle along the axis, the induced voltage generated by each phase conductor, and the voltage of the phase conductor relative to ground in a single-circuit line are used to determine the voltage of each phase conductor relative to ground in the double-circuit line under test. This invention is developed based on the method of voltage inversion solution for single-circuit lines, eliminating the need to develop a new method for measuring the voltage of double-circuit lines. It not only accurately measures the voltage of each phase conductor relative to ground in a double-circuit line system but also reduces costs. Attached Figure Description

[0040] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0041] Figure 1 A flowchart illustrating the method for measuring conductor voltage in a double-return tower provided by this invention;

[0042] Figure 2 This is a vector decomposition diagram of the induced voltage vectors of each sensor in a single-circuit line. Figure 2 (a) in the figure is the vector decomposition diagram of the first sensor induced voltage in a single-circuit line; Figure 2 (b) in the figure is the vector decomposition diagram of the second sensor induced voltage in a single-circuit line; Figure 2 (c) in the figure is the vector decomposition diagram of the induced voltage of the third sensor in a single-circuit line;

[0043] Figure 3 This is a front view of the double-return tower structure and sensor in this invention;

[0044] Figure 4 This is a side view of the double-return tower structure and sensor in this invention;

[0045] Figure 5 This is a diagram showing the distance and deflection angle between the dual-circuit line and the sensor in this invention.

[0046] Symbol explanation:

[0047] Phase A conductor—1, Phase B conductor—2, Phase C conductor—3, Phase A' conductor—4, Phase B' conductor—5, Phase C' conductor—6, Sensor group for the first circuit under test—7, Sensor group for the second circuit under test—8, Double-circuit tower—9. Detailed Implementation

[0048] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0049] The purpose of this invention is to provide a method, system, device, medium, and product for measuring the voltage of conductors in double-circuit towers. By developing a method based on the voltage inversion solution of single-circuit lines, there is no need to develop a new method for measuring the voltage of double-circuit lines. This not only accurately measures the voltage of each phase conductor to ground in a double-circuit line system, but also reduces costs.

[0050] To make the above-mentioned objects, features and advantages of the present invention more apparent and understandable, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0051] Example 1

[0052] like Figure 1 As shown, the method for measuring the conductor voltage of a double-circuit tower provided by the present invention includes:

[0053] Step 101: Divide the double-circuit line to be tested into the first circuit to be tested and the second circuit to be tested; both the first circuit to be tested and the second circuit to be tested are single circuits.

[0054] Step 102: Obtain the spatial coordinates of the measuring phase conductors in the double-circuit circuit under test and the spatial coordinates of the sensors set at a preset distance from the measuring phase conductors; the measuring phase conductors are A-phase conductor 1, B-phase conductor 2, C-phase conductor 3 of the first circuit under test, A'-phase conductor 4, B'-phase conductor 5 or C'-phase conductor 6 of the second circuit under test.

[0055] Step 103: Determine the distance between the measuring phase conductor and the sensor based on the spatial coordinates of the measuring phase conductor and the sensor.

[0056] Step 104: Based on the spatial coordinates of each phase measuring conductor, the spatial coordinates of the corresponding sensor for each phase measuring conductor, and the distance between each phase measuring conductor and each sensor, determine the first virtual connection and the spatial coordinate system. x The included angle along the axial direction; the first virtual connection is the virtual connection between the sensor corresponding to each phase measurement phase conductor and each phase measurement phase conductor; the spatial coordinate system is based on the line connecting phase B conductor 2 and phase B' conductor 5. x The axis is the central axis of the double-return tower. yA spatial coordinate system is established using axes.

[0057] Step 105: Using the principle of electric field superposition, the induced voltage measured at each sensor is decomposed in reverse to determine the induced voltage generated by each phase measuring conductor.

[0058] Step 106: Based on the distance between each phase measuring conductor and each sensor, the first virtual connection and the spatial coordinate system... x The included angle in the axial direction, the induced voltage generated by each phase measuring conductor, and the voltage of the measuring phase conductor to ground in a single circuit are used to determine the voltage of each phase measuring conductor to ground in the double circuit to be tested.

[0059] Furthermore, the voltage of the measuring phase conductor to ground in a single-circuit line is... .

[0060] Where U is the voltage of the measuring phase conductor to ground in a single-circuit line. For U in the first i The induced voltage generated at each sensor in a single-circuit line i =1,2,3 For measuring the phase conductor and the first phase conductor in a single-circuit line i The distance between the sensors For the first virtual connection and spatial coordinate system x The angle along the axial direction, To measure the radius of the phase conductor in a single-circuit line. The distance between the sensor and the zero potential surface. To measure the internal dielectric constant of a phase conductor in a single-circuit circuit. The dielectric constant of air is given. All sensors are equidistant from the zero-potential surface.

[0061] Furthermore, the distance between the measuring phase conductor and the sensor is:

[0062] ;

[0063] .

[0064] in, To measure the phase conductor and the first i The distance between the sensors in the dual-circuit circuit under test i =1, 2, 3, 4, 5, 6, ( x , y ) represents the spatial coordinates of the measured phase conductor. x si , y si ) is the first iThe coordinates of each sensor.

[0065] Furthermore, using the formula , , , , ,as well as Determine the first virtual connection and the spatial coordinate system. x The angle along the axial direction.

[0066] in, For the first virtual connection and spatial coordinate system x The included angle along the axial direction in the double-circuit line under test. i =1, 2, 3, 4, 5, 6 To measure the phase conductor and the first i The distance between the sensors, ( x , y ) represents the spatial coordinates of the measured phase conductor. x si , y si ) is the first i The coordinates of each sensor.

[0067] Furthermore, the induced voltage generated by each phase measuring conductor is as follows:

[0068] and

[0069]

[0070] in, For phase A conductor 1 in the first... i The induced voltage measured at each sensor in the double-circuit circuit under test i =1, 2, 3 For phase B conductor 2 in the first... i The induced voltage measured at each sensor For phase C conductor 3 in the first i The induced voltage measured at each sensor For phase A conductor 4 in the first... i The induced voltage measured at each sensor For phase B conductor 5 in the first i The induced voltage measured at each sensor For phase C' conductor 6 in the first i The induced voltage measured at each sensor , , , , , All are fixed constants.j =1, 2, 3 This refers to the phase of conductor 4 in phase A'.

[0071] Furthermore, based on the distance between each phase measurement conductor and each sensor, and the first virtual connection and the spatial coordinate system... x The voltage of each phase measuring conductor relative to ground in the double-circuit line under test is determined by considering the included angle along the axial direction, the induced voltage generated by each phase measuring conductor, and the single-circuit line voltage. Specifically, this includes using the formula...

[0072] Determine the voltage of each phase conductor relative to ground in the double-circuit circuit under test.

[0073] in, Let be the voltage of phase A conductor 1 to ground. This represents the voltage of phase B conductor 2 to ground. This represents the voltage of phase C conductor 3 to ground. Let be the voltage of phase A conductor 4 to ground. This represents the voltage between phase B conductor 5 and ground. Let be the voltage of phase C conductor 6 to ground. For phase A conductor 1 and the first i The distance between the sensors in the dual-circuit circuit under test i =1, 2, 3 For phase B conductor 2 and the first i The distance between the sensors For phase C conductor 3 and the first i The distance between the sensors For phase A' conductor 4 and the first i The distance between the sensors For phase B conductor 5 and the first i The distance between the sensors For phase C' conductor 6 and the first i The distance between the sensors Indicates that phase A conductor 1 and the first i The connections between the sensors and x The angle along the axial direction, This indicates that phase B conductor 2 and the first i The connections between the sensors and x The angle along the axial direction, This indicates that the C-phase conductor 3 and the first i The connections between the sensors and x The angle along the axial direction, For phase A' conductor 4 and the first i The connections between the sensors and x The angle along the axial direction, For phase B conductor 5 and the first i The connections between the sensors and x The angle along the axial direction, For phase C' conductor 6 and the first i The connections between the sensors and x The angle along the axial direction, To measure the radius of the phase conductor, The distance between the sensor and the zero potential surface, To measure the internal dielectric constant of the phase conductor, The dielectric constant of air is given. All sensors are equidistant from the zero-potential surface.

[0074] Specifically, by using the principle of electric field superposition, the induced voltage measured at each sensor is decomposed in reverse to determine the induced voltage generated by each phase measuring conductor. The specific decomposition process is as follows:

[0075] like Figure 2 As shown, the decomposition can be proven by mathematical theorems. Mathematical proof:

[0076] Known and The ratio is assumed to have no unique solution. Then it exists And there are = Then there is ,Right now Similarly, we can obtain That is, k1 ( )= Therefore, k1 = 1. Thus, there exists only one unique solution. Further determination .

[0077] Let be the induced voltage of each of the six phase conductors in the double-circuit line under test. In actual operation, due to the phase of the voltage in each circuit (i.e., the phase of the induced voltage), it is only necessary to know the ratio of the magnitudes of the induced voltages to uniquely determine . The combination of [various parameters]. The induced voltage is measured by the sensor at the corresponding position of phase B conductor 2 in the sensor of the first circuit under test. For example, the ratio of the induced voltages generated by the six-phase conductors can be determined.

[0078]

[0079]

[0080] .

[0081] In the formula These are all fixed constants. Similarly, for other sensors, the induced voltage generated by the six-phase conductors at their positions can be obtained using the same method. Thus, the induced voltage measured by each sensor can be decomposed to obtain the actual induced voltage of the phase conductors on the three sensors.

[0082] The decomposition result is represented in matrix form, as follows:

[0083] .

[0084] Example 2

[0085] like Figures 3-5 As shown, the measurement system for conductor voltage of a double-circuit tower provided by the present invention includes: a spatial position coordinate acquisition module, a distance determination module, an angle determination module, an induced voltage determination module, and a voltage determination module.

[0086] The spatial position coordinate acquisition module is used to acquire the spatial position coordinates of the measuring phase conductors in the double-circuit line under test and the spatial position coordinates of the sensors set at a preset distance from the measuring phase conductors. The measuring phase conductors are A-phase conductor 1, B-phase conductor 2, and C-phase conductor 3 of the first circuit under test, and A'-phase conductor 4, B'-phase conductor 5, or C'-phase conductor 6 of the second circuit under test. Specifically, the double-circuit line under test is divided into the first circuit under test and the second circuit under test. Both the first circuit under test and the second circuit under test are single circuits. The sensor group 7 of the first circuit under test consists of sensors corresponding to each phase conductor of the first circuit under test, and the sensor group 8 of the second circuit under test consists of sensors corresponding to each phase conductor of the second circuit under test.

[0087] The distance determination module is used to determine the distance between the measuring phase conductor and the sensor based on the spatial coordinates of the measuring phase conductor and the sensor.

[0088] The angle determination module is used to determine the first virtual connection and the spatial coordinate system based on the spatial position coordinates of each phase measuring conductor, the spatial position coordinates of the corresponding sensor for each phase measuring conductor, and the distance between each phase measuring conductor and each sensor. x The included angle along the axial direction; the first virtual connection is the virtual connection between the sensor corresponding to each phase measurement phase conductor and each phase measurement phase conductor; the spatial coordinate system is based on the line connecting phase B conductor 2 and phase B' conductor 5. x The axis is the central axis of the double-return tower 9. y A spatial coordinate system is established using axes.

[0089] The induced voltage determination module is used to reverse decompose the induced voltage measured at each sensor by using the principle of electric field superposition, and to determine the induced voltage generated by each phase measuring conductor.

[0090] The voltage determination module is used to determine the voltage based on the distance between each phase measuring conductor and each sensor, the distance between the first virtual connection and the spatial coordinate system. x The included angle in the axial direction, the induced voltage generated by each phase measuring conductor, and the voltage of the measuring phase conductor relative to ground in a single circuit are used to determine the voltage of each phase measuring conductor relative to ground in the double circuit to be tested.

[0091] Furthermore, it also includes a position coordinate determination module.

[0092] The position coordinate determination module is used to determine the position coordinates of each phase measuring conductor in the double-circuit line under test based on the voltage of each phase measuring conductor to ground.

[0093] Example 3

[0094] An electronic device includes a memory and a processor, the memory storing a computer program and the processor running the computer program to enable the electronic device to perform a method for measuring the voltage of a double-circuit tower conductor.

[0095] Example 4

[0096] A computer-readable storage medium storing a computer program that, when executed by a processor, implements a method for measuring conductor voltage, such as that of a double-circuit tower.

[0097] Example 5

[0098] A computer program product includes a computer program that, when executed by a processor, implements the steps of the method for measuring the conductor voltage of a double-return tower.

[0099] The various embodiments in this specification are described in a progressive manner, with each embodiment focusing on the differences from other embodiments. The same or similar parts between the various embodiments can be referred to each other.

[0100] This document uses specific examples to illustrate the principles and implementation methods of the present invention. The descriptions of the above embodiments are only for the purpose of helping to understand the methods, systems, and core ideas of the present invention. Furthermore, those skilled in the art will recognize that, based on the ideas of the present invention, there will be changes in the specific implementation methods and application scope. Therefore, the content of this specification should not be construed as a limitation of the present invention.

Claims

1. A method for measuring the conductor voltage of a double-circuit tower, characterized in that, include: The double-circuit circuit to be tested is divided into the first circuit to be tested and the second circuit to be tested. Both the first circuit to be tested and the second circuit to be tested are single-circuit circuits. Obtain the spatial coordinates of the measuring phase conductor in the double-circuit circuit under test and the spatial coordinates of the sensor set at a preset distance from the measuring phase conductor; the measuring phase conductor is the A-phase conductor, the B-phase conductor, the C-phase conductor of the first circuit under test, the A'-phase conductor, the B'-phase conductor, or the C'-phase conductor of the second circuit under test; The distance between the measuring phase conductor and the sensor is determined based on the spatial coordinates of the measuring phase conductor and the spatial coordinates of the sensor. Based on the spatial coordinates of the measuring phase conductor for each phase, the spatial coordinates of the corresponding sensor for each measuring phase conductor, and the distance between each measuring phase conductor and each sensor, the first virtual connection and the spatial coordinate system are determined. x The included angle along the axial direction, specifically including, using the formula , , , , ,as well as Determine the first virtual connection and the spatial coordinate system. x The angle along the axial direction; where, For the first virtual connection and spatial coordinate system x The included angle along the axial direction in the double-circuit line under test. i =1, 2, 3 To measure the phase conductor and the first i The distance between the sensors, ( x , y ) represents the spatial coordinates of the measured phase conductor. x si , y si ) is the first i The coordinates of each sensor; the first virtual connection is the virtual connection between the sensor corresponding to each phase measurement phase conductor and each phase measurement phase conductor; the spatial coordinate system is based on the connection between phase B conductor and phase B' conductor. x The axis is the central axis of the double-return tower. y A spatial coordinate system is established using the axes; By using the principle of electric field superposition, the induced voltage measured at each of the sensors is decomposed in reverse to determine the induced voltage generated by each phase measuring conductor. Based on the distance between each phase measurement conductor and each sensor, and the first virtual connection and the spatial coordinate system... x The included angle along the axis, the induced voltage generated by each phase measuring conductor, and the voltage of the measuring phase conductor relative to ground in a single-circuit line are used to determine the voltage of each phase measuring conductor relative to ground in the double-circuit line under test. Specifically, this includes: Using formula Determine the voltage of each phase measuring conductor relative to ground in the double-circuit circuit under test; in, This represents the voltage of phase A conductor relative to ground. This represents the voltage of phase B conductor relative to ground. This represents the voltage of phase C conductor relative to ground. Let V be the voltage of phase A' conductor relative to ground. Let B' be the voltage of the conductor relative to ground. Let be the voltage of phase C' conductor relative to ground. For phase A conductor and the first i The distance between the sensors in the dual-circuit circuit under test i =1, 2, 3 For phase B conductor and the first i The distance between the sensors For the C-phase conductor and the first i The distance between the sensors For phase A' conductor and the first i The distance between the sensors For phase B conductor and the first i The distance between the sensors For phase C' conductor and the first i The distance between the sensors Indicates that the A-phase conductor and the first i The connections between the sensors and x The angle along the axial direction, Indicates that the B-phase conductor is connected to the first phase conductor. i The connections between the sensors and x The angle along the axial direction, Indicates the C-phase conductor and the first i The connections between the sensors and x The angle along the axial direction, For phase A' conductor and the first i The connections between the sensors and x The angle along the axial direction, For phase B conductor and the first i The connections between the sensors and x The angle along the axial direction, For phase C' conductor and the first i The connections between the sensors and x The angle along the axial direction, To measure the radius of the phase conductor, The distance between the sensor and the zero potential surface, To measure the internal dielectric constant of the phase conductor, The dielectric constant of air; The voltage of the measuring phase conductor relative to ground in the single-circuit line is: ； Where U is the voltage of the measuring phase conductor to ground in a single-circuit line. For U in the first i The induced voltage generated at each sensor in a single-circuit line i =1,2,3 For measuring the phase conductor and the first phase conductor in a single-circuit line i The distance between the sensors For the first virtual connection and spatial coordinate system x The angle along the axial direction, To measure the radius of the phase conductor in a single-circuit line. The distance between the sensor and the zero-potential surface. To measure the internal dielectric constant of a phase conductor in a single-circuit circuit. is the dielectric constant of air.

2. The method for measuring conductor voltage of a double-circuit tower according to claim 1, characterized in that, The distance between the measuring phase conductor and the sensor is: ； ； in, To measure the phase conductor and the first i The distance between the sensors in the dual-circuit circuit under test i =1, 2, 3, 4, 5, 6, ( x , y ) represents the spatial coordinates of the measured phase conductor. x si , y si ) is the first i The coordinates of each sensor.

3. The method for measuring the conductor voltage of a double-circuit tower according to claim 1, characterized in that, The induced voltage generated by the measuring phase conductor in each phase is: ； ； in, For phase A conductor in the first... i The induced voltage measured at each sensor in the double-circuit circuit under test i =1, 2, 3 For phase B conductor in the first... i The induced voltage measured at each sensor For the C-phase conductor in the first... i The induced voltage measured at each sensor For phase A' conductor in the first... i The induced voltage measured at each sensor For phase B conductor in the first... i The induced voltage measured at each sensor For the C' phase conductor in the first i The induced voltage measured at each sensor , , , , , All are fixed constants. j =1, 2, 3 Let A' be the phase of the conductor.

4. A measurement system for conductor voltage on a double-circuit tower, characterized in that, The method for measuring the conductor voltage of a double-circuit tower as described in any one of claims 1-3, wherein the measuring system for the conductor voltage of a double-circuit tower comprises: a spatial position coordinate acquisition module, a distance determination module, an angle determination module, an induced voltage determination module, and a voltage determination module; The spatial position coordinate acquisition module is used to acquire the spatial position coordinates of the measuring phase conductor in the double-circuit line under test and the spatial position coordinates of the sensor set at a preset distance from the measuring phase conductor; the measuring phase conductor is the A phase conductor of the first circuit, the B phase conductor of the first circuit, the C phase conductor of the first circuit, the A' phase conductor of the second circuit, the B' phase conductor of the second circuit, or the C' phase conductor of the second circuit. The distance determination module is used to determine the distance between the measuring phase conductor and the sensor based on the spatial position coordinates of the measuring phase conductor and the spatial position coordinates of the sensor. The angle determination module is used to determine the first virtual connection line and the spatial coordinate system based on the spatial position coordinates of each phase measuring phase conductor, the spatial position coordinates of the corresponding sensor of each phase measuring phase conductor, and the distance between each phase measuring phase conductor and each sensor. x The included angle along the axial direction; the first virtual connection is the virtual connection between the sensor corresponding to each phase's measuring phase conductor and each phase's measuring phase conductor; the spatial coordinate system is based on the line connecting the B-phase conductor and the B'-phase conductor. x The axis is the central axis of the double-return tower. y A spatial coordinate system is established using the axes; The induced voltage determination module is used to reverse decompose the induced voltage measured at each of the sensors by using the principle of electric field superposition, and determine the induced voltage generated by each phase of the measuring phase conductor. The voltage determination module is used to determine the voltage based on the distance between each phase measuring conductor and each sensor, the distance between the first virtual connection and the spatial coordinate system. x The included angle in the axial direction, the induced voltage generated by each phase measuring conductor, and the voltage of the measuring phase conductor relative to ground in a single circuit are used to determine the voltage of each phase measuring conductor relative to ground in the double circuit to be tested.

5. An electronic device, characterized in that, It includes a memory and a processor, the memory being used to store a computer program, and the processor running the computer program to cause the electronic device to perform the method for measuring the conductor voltage of a double-return tower as described in any one of claims 1-3.

6. A computer-readable storage medium, characterized in that, It stores a computer program that, when executed by a processor, implements the method for measuring the conductor voltage of a double-return tower as described in any one of claims 1-3.

7. A computer program product, comprising a computer program, characterized in that, When executed by a processor, the computer program implements the steps of the method for measuring the conductor voltage of a double-return tower as described in any one of claims 1-3.

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