Polishing degree detection method, system and polishing machine based on laser positioning

Abstract

The present invention discloses a polishing degree detection method, system and polishing machine based on laser positioning, including determining a detection integration group of a target part according to the polishing requirements of the target part, and using the detection integration group of the target part to construct a set detection environment of the target part; based on the detection integration group of the target part, using the set detection environment of the target part, framing the detection area of ​​the target part to obtain the scanned image information of the target part. The present invention sets different detection scanning conditions according to the polishing detection requirements of the polished part, scans the overall polishing conditions of the polished part in different ranges, and then judges the polishing qualification degree of the polished part according to the polishing detection requirements of the polished part. That is, there is no need to manually perform the detection work of the polished part, which ensures the efficiency of polishing detection on the one hand, and the accuracy of polishing detection on the other hand. That is, it effectively solves the disadvantage of low efficiency of manual polishing detection in the prior art.

Description

Technical Field

[0001] The present invention relates to the technical field of polishing detection, and in particular to a polishing degree detection method, system and polishing machine based on laser positioning. Background Art

[0002] Polishing is generally to use mechanical kinetic energy to grind the surface of an object to make the surface smoother and flatter, remove surface particles, oxide scale and defects, and thus improve the overall appearance quality of the material. Polishing can be used to eliminate small scratches and minor damages produced during the processing of metal materials. Polishing can also remove surface oxides and rust, improve its anti-corrosion performance, and extend the service life of the material. In addition, it can also improve the mechanical properties of the material, such as reducing the friction coefficient and increasing strength and hardness.

[0003] After the metal parts are polished, they are usually inspected manually using instruments (such as electron microscopes, three-coordinate measuring instruments, etc.). However, the overall efficiency of using instruments for inspection is low and cannot meet the actual polishing inspection requirements. Summary of the invention

[0004] The purpose of the present invention is to solve the shortcoming of low efficiency of manual polishing detection in the prior art, and to propose a polishing degree detection method, system and polishing machine based on laser positioning.

[0005] In order to achieve the above object, the present invention adopts the following technical solutions:

[0006] In a first aspect, the present invention provides a method for detecting a polishing degree based on laser positioning, comprising:

[0007] According to the polishing requirements of the target part, determine the detection integration group of the target part, and use the detection integration group of the target part to build a set detection environment of the target part;

[0008] According to the detection integration group of the target part, using the set detection environment of the target part, the detection area of ​​the target part is framed to obtain the scanned image information of the target part;

[0009] Acquire feature search information of the target part according to the scanned image information of the target part, and determine at least two search detection ranges in the target part in a graded manner according to the feature search information;

[0010] Searching the scanned image information of the target part according to at least two search detection ranges in the target part to determine at least two feature detection information in the target part;

[0011] According to the polishing requirements of the target parts, set the polishing alarm information of the target parts;

[0012] According to the polishing alarm information of the target part, at least two feature detection information in the target part are matched to determine the polishing qualified information of the target part.

[0013] In some feasible embodiments, the method of hierarchically determining at least two search detection ranges in a target part includes:

[0014] According to the polishing requirements of the target part, a first scan image of the target part is determined by using a set detection environment of the target part;

[0015] Performing image partitioning on the first scanned image of the target part, obtaining at least two partitioned images in the first scanned image, and performing feature recognition on each partitioned image in the first scanned image, respectively obtaining search information of each partitioned image in the first scanned image;

[0016] Acquire a second scan image of the target part according to the search information of each subarea image in the first scan image and using the set detection environment of the target part;

[0017] Performing image coordinate division on the second scanned image of the target part to obtain coordinate system distribution information in the second scanned image of the target part;

[0018] The second scanning image search information of the target part is determined according to the coordinate system distribution information in the second scanning image of the target part.

[0019] In some feasible embodiments, the first scanning image search range of the target part is larger than the second scanning image search range of the target part.

[0020] In some feasible embodiments, the method for determining at least two feature detection information in a target part includes:

[0021] According to the search information of each sub-area image in the first scanned image, the first feature recognition is performed on the first scanned image of the target part to determine the first feature information in each sub-area image in the first scanned image;

[0022] Judging each subarea image in the first scanned image according to the first feature information in each subarea image in the first scanned image, and determining the information to be inspected of each subarea image in the first scanned image;

[0023] Determine the subarea image to be inspected in the first scanned image according to the information to be inspected of each subarea image in the first scanned image, scan the subarea image to be inspected in the first scanned image in a narrowed range by using the set inspection environment of the target part, and determine the second scanned image of the subarea image to be inspected in the first scanned image;

[0024] A second feature recognition is performed on the second scanned image of the subarea image to be inspected in the first scanned image to determine second feature information in the second scanned image of the subarea image to be inspected.

[0025] In some feasible embodiments, the method for determining the information to be inspected of each subarea image in the first scanned image includes:

[0026] Performing image processing on the first scanned image of the target part to obtain grayscale value feature information in the first scanned image of the target part, and respectively determining grayscale value feature information of each subarea image in the first scanned image;

[0027] According to the polishing requirements of the target part, the grayscale determination interval of the first scanned image is set;

[0028] According to the grayscale determination interval of the first scanned image, the grayscale value characteristic information of each subarea image is matched and determined to determine the information to be inspected of each subarea image.

[0029] In some feasible embodiments, the method for determining the second feature information in the second scanned image of the subarea image to be inspected includes:

[0030] Determine at least a second scanned image of a subarea image according to the information to be inspected of each subarea image;

[0031] Performing plane coordinate division on the second scanned image of the partitioned image to obtain a plane coordinate system of the second scanned image;

[0032] Performing image analysis on the second scanned image of the partitioned image, and determining the contour area to be inspected of the second scanned image in combination with the plane coordinate system of the second scanned image;

[0033] The second characteristic information of the second scanned image is determined according to the contour area to be detected of the second scanned image and according to the gray value information of the contour area to be detected of the second scanned image.

[0034] In some feasible embodiments, the method for determining the contour area to be detected of the second scanned image includes:

[0035] performing image analysis on the second scanned image to determine an abnormal area in the second scanned image;

[0036] A judgment base point is set on the second scanned image, and contour coordinates of the abnormal area in the second scanned image are extracted according to the plane coordinate system of the second scanned image to determine coordinate information of the abnormal area in the second scanned image;

[0037] According to the abnormal region coordinate information in the second scanned image, image feature information of the abnormal region in the second scanned image is determined.

[0038] In a second aspect, the present invention provides a polishing degree detection system based on laser positioning, which adopts any one of the polishing degree detection methods based on laser positioning described in the first aspect.

[0039] In some feasible embodiments, the detection system further includes:

[0040] An image scanning module, which is used to acquire images in different scanning ranges according to the polishing requirements of the target part;

[0041] An image processing module, the image processing module is used to perform feature recognition on a scanned image of a target part;

[0042] A feature extraction module is used to extract features for image recognition.

[0043] The present invention provides a polishing machine in a third aspect, which adopts a polishing degree detection method based on laser positioning as described in any one of the first aspects.

[0044] The beneficial effects of the present invention are:

[0045] In the embodiment of the present invention, different detection scanning conditions are set according to the polishing detection requirements of the polished workpiece, and the overall polishing conditions of the polished workpiece are scanned in different ranges, and then the polishing qualification degree of the polished workpiece is judged according to the polishing detection requirements of the polished workpiece. That is, there is no need to manually perform the detection work of the polished workpiece, which ensures the efficiency of the polishing detection on the one hand, and the accuracy of the polishing detection on the other hand. That is, it effectively solves the disadvantage of low efficiency of manual polishing detection in the prior art. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] Figure 1 It is a schematic diagram of the overall process of a polishing degree detection method based on laser positioning provided in an embodiment of the present invention;

[0047] Figure 2 A schematic diagram of a part of the process of a polishing degree detection method based on laser positioning provided in an embodiment of the present invention

[0048] Figure 3 A schematic diagram of a first scanning image partition according to an implementation of a polishing degree detection method based on laser positioning provided in an embodiment of the present invention;

[0049] Figure 4 A schematic diagram of a second scanning image of an implementation of a polishing degree detection method based on laser positioning provided in an embodiment of the present invention;

[0050] Figure 5It is a schematic diagram of an enlarged second scanning image of an implementation of a polishing degree detection method based on laser positioning provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0051] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0052] It should be noted that all directional indications in the embodiments of the present invention (such as up, down, left, right, front, back, etc.) are only used to explain the relative position relationship, movement status, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.

[0053] In the present invention, unless otherwise clearly specified and limited, the terms "connection", "fixation", etc. should be understood in a broad sense. For example, "fixation" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0054] In addition, if there are descriptions involving "first", "second", etc. in the embodiments of the present invention, the descriptions of "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In addition, the meaning of "and / or" appearing in the full text includes three parallel schemes. Taking "A and / or B" as an example, it includes scheme A, or scheme B, or a scheme that satisfies both A and B. In addition, the technical solutions between the various embodiments can be combined with each other, but it must be based on the ability of ordinary technicians in the field to implement. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such a combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0055] Reference Figures 1 to 5In order to solve the disadvantage of low efficiency of manual polishing detection in the prior art, the present invention provides a polishing degree detection method based on laser positioning in the first aspect. The detection method sets different detection scanning conditions according to the polishing detection requirements of the polished workpiece, scans the overall polishing condition of the polished workpiece in different ranges, and then judges the polishing qualification degree of the polished workpiece according to the polishing detection requirements of the polished workpiece. That is, there is no need to manually detect the polished workpiece, which ensures the efficiency of polishing detection on the one hand and the accuracy of polishing detection on the other hand. That is, it effectively solves the disadvantage of low efficiency of manual polishing detection in the prior art.

[0056] Specifically, the polishing degree detection method includes:

[0057] The polishing processing requirements of the polished part can be obtained in advance to determine the detection integration group of the target part, and the detection integration group of the target part can be used to construct the set detection environment of the target part, that is, according to the polishing detection requirements of the polished part, set the scanning environment of different search ranges to ensure that the search requirements of different polishing detection requirements are met; in some embodiments, in order to meet the detection requirements of the polished part, the image of the polished part can be imaged by using electron microscopes with different search ranges. In order to achieve the detection area of ​​the target part according to the detection integration group of the target part, the set detection environment of the target part is used to frame the target part, and the scanning image information of the target part is obtained; that is, according to the detection requirements of the polished part, the detection surface or detection area of ​​the polished part is scanned and imaged by electron microscopes with different search ranges. Then, according to the scanning image information of the target part, the characteristic search information of the target part (including but not limited to: gray value of image imaging, cleanliness, etc.) can be obtained, and then different search ranges can be graded according to the characteristic search information to determine the image search situation in the polishing detection area of ​​the target part, so as to facilitate the polishing detection image imaging of the target parts with different judgment conditions. Then, according to at least two search detection ranges in the target part, feature search is performed on the scanned image information of different scanning ranges of the target part respectively, so as to determine the feature detection information in the target part (including but not limited to: grayscale value, cleanliness, etc. in the image imaging of different scanning ranges), and then judge whether the polishing process of the target part is qualified according to the feature detection information in the target part. In this embodiment, in order to obtain the information for judging whether the polishing process of the target part is qualified more clearly and intuitively, the polishing alarm information of the target part can also be set according to the polishing requirements of the target part, that is, according to the polishing qualified requirements of the target part, the grayscale value qualified interval, the cleanliness qualified interval, and the qualified interval of the combination of the two can be set. When the image imaging of different scanning ranges of the target part does not meet the above-mentioned grayscale value qualified interval, the cleanliness qualified interval, and the qualified interval of the combination of the two, the polishing process of the target part can be judged to be unqualified, that is, according to the polishing alarm information of the target part, at least two feature detection information in the target part are matched to determine the polishing qualified information of the target part. That is, there is no need for manual inspection of the polished workpiece, which ensures the polishing inspection efficiency on the one hand and the polishing inspection accuracy on the other hand, and effectively solves the disadvantage of low efficiency of manual polishing inspection in the prior art.

[0058] In this embodiment, in order to facilitate understanding of how to set different search detection ranges, the following description is given. Specifically, the method of hierarchically determining at least two search detection ranges in a target part includes:

[0059] According to the polishing requirements of the target part, the first scanned image of the target part is determined by using the set detection environment of the target part; the target part can be imaged by a large-scale electron microscope search image according to the polishing requirements of the target part to produce the first scanned image of the target part; and then, in order to facilitate the detection and analysis of the first scanned image, the first scanned image of the target part can be divided into image partitions (it can be divided into equal parts, that is, the first scanned image can be divided into two or more equal parts, in Figure 3 In the method, the first scanning image of the target part is divided into four equal parts), at least two sub-area images are obtained in the first scanning image, and feature recognition is performed on each sub-area image in the first scanning image (feature recognition can be performed according to the gray value feature and smoothness in each sub-area image), and search information of each sub-area image in the first scanning image is obtained respectively; that is, the corresponding gray value qualified interval and smoothness qualified interval can be set according to the polishing detection requirements to determine the search area of ​​the first scanning image, so as to achieve the subsequent determination of the small-range search area of ​​the target part. That is, according to the search information of each sub-area image in the first scanning image, the second scanning image of the target part for small-range electron microscope search imaging is obtained by using the set detection environment of the target part; in order to facilitate the determination of the abnormal position or point feedback in the second scanning image, the image coordinate division of the second scanning image of the target part is required to obtain the coordinate system distribution information in the second scanning image of the target part; then, according to the coordinate system distribution information in the second scanning image of the target part, the second scanning image search information of the target part is determined, that is, according to the coordinate system distribution information in the second scanning image, the abnormal position or point feedback in the second scanning image can be directly determined, thereby ensuring the polishing detection efficiency of the target part. That is, in this embodiment, the first scanning image search range of the target part is larger than the second scanning image search range of the target part.

[0060] In this embodiment, in order to facilitate understanding of how to obtain different feature detection information of a target part, the following description is given here. Specifically, the method for determining at least two feature detection information of a target part includes:

[0061] According to the search information of each partition image in the first scanned image, the first feature recognition is performed on the first scanned image of the target part to determine the first feature information in each partition image in the first scanned image; according to the first feature information in each partition image in the first scanned image, each partition image in the first scanned image is judged to determine the information to be inspected of each partition image in the first scanned image; that is, according to the gray value qualified interval set according to the polishing detection requirements, the smoothness qualified interval and other information, it is determined whether the feature information in each partition image in the first scanned image of the target part meets the qualified interval set according to the polishing detection requirements. If the current partition image is preliminarily qualified, then the small range search feature acquisition of the current partition image is further performed according to the polishing detection requirements to achieve a further defect whether the target part meets the set polishing processing detection requirements. That is, according to the information to be inspected of each subarea image in the first scanned image, the subarea image to be inspected in the first scanned image is determined, and the subarea image to be inspected in the first scanned image is scanned in a narrow range by using the set detection environment of the target part, and the second scanned image of the subarea image to be inspected in the first scanned image is determined; then the second feature (including but not limited to: gray value information and smoothness information in the image display) of the second scanned image of the subarea image to be inspected in the first scanned image is identified, and then the second feature information in the second scanned image of the subarea image to be inspected is determined. Then, the gray value qualified interval and smoothness qualified interval of the corresponding second scanned image can be further set according to the polishing detection requirements, and then the second scanned image of the target part is judged according to the gray value qualified interval and smoothness qualified interval of the corresponding second scanned image, so as to further determine whether the polishing of the target part is qualified. That is, the polishing alarm information of the target part includes: the gray value qualified interval and / or smoothness qualified interval in the first scanned image, and the gray value qualified interval and / or smoothness qualified interval in the second scanned image.

[0062] In summary, the method for determining the information to be inspected of each partition image in the first scanned image includes: performing image processing (including image noise reduction, grayscale processing, etc.) on the first scanned image of the target part to obtain grayscale value feature information in the first scanned image of the target part, and respectively determining the grayscale value feature information of each partition image in the first scanned image; then, according to the polishing requirements of the target part, setting the grayscale judgment interval of the first scanned image; and then, according to the grayscale judgment interval of the first scanned image, matching and judging the grayscale value feature information of each partition image respectively, to determine the information to be inspected of each partition image.

[0063] In this embodiment, in order to facilitate understanding of how to obtain the second feature of the second scanned image in the subarea image to be inspected, the following description is given. Specifically, the method for determining the second feature information in the second scanned image of the subarea image to be inspected includes:

[0064] According to the information to be inspected of each partition image, at least a second scanned image of the partition image is determined; that is, according to the qualified information of each partition image, the location of the partition image that needs to be determined in a more detailed range, and a small range of electron microscope search imaging is performed to obtain the second scanned image of the current partition image, and then the second scanned image of the partition image is divided into plane coordinates to obtain the plane coordinate system of the second scanned image; at the same time, the second scanned image of the partition image is analyzed (including but not limited to: grayscale value, cleanliness, etc. in the image imaging of the second scanned image), and the contour area to be inspected of the second scanned image is determined in combination with the plane coordinate system of the second scanned image; that is, it is necessary to set the corresponding grayscale value qualified interval and / or smoothness qualified interval according to the polishing processing requirements of the target part, and then analyze the grayscale value and / or smoothness performance abnormal area in the actual second scanned image of the target part in combination with the grayscale value qualified interval and / or smoothness qualified interval in the second scanned image to determine the contour area to be inspected of the second scanned image. Then, according to the contour area to be inspected of the second scanned image and the grayscale value information of the contour area to be inspected of the second scanned image, the second characteristic information of the second scanned image is determined. That is, a more refined image feature extraction can be performed based on the second scanned image of the target part to determine the abnormal area actually displayed in the second scanned image of the target part, and at the same time, the feature extraction of the abnormal area can be performed to determine whether it falls into the gray value qualified interval and / or the smoothness qualified interval in the second scanned image set according to the polishing processing requirements of the target part, thereby determining whether the target part meets further polishing detection requirements. In addition, the depth of the abnormal area in the second scanned image can be determined based on the gray value performance of the abnormal area in the second scanned image of the target part, providing a reference for subsequent rework polishing.

[0065] In this embodiment, in order to facilitate understanding of how to obtain the contour area to be detected of the second scanned image, the following description is given here. Specifically, the method for determining the contour area to be detected of the second scanned image includes:

[0066] Perform image analysis on the second scanned image to determine the abnormal area in the second scanned image; that is, determine the qualified area that needs to be judged currently based on the position of the second scanned image of the target part that is different from the qualified interval of grayscale value and / or qualified interval of smoothness in the second scanned image; then set a judgment base point on the second scanned image, and based on the plane coordinate system of the second scanned image, use the relative position of the judgment base point and the abnormal area to extract the contour coordinates of the abnormal area in the second scanned image to determine the coordinate information of the abnormal area in the second scanned image; then determine the image feature information of the abnormal area in the second scanned image (including: the longest diameter and width in the abnormal area, etc.) based on the coordinate information of the abnormal area in the second scanned image, and then judge the image feature information of the abnormal area in the second scanned image based on the qualified interval of grayscale value and / or qualified interval of smoothness in the second scanned image to determine whether the performance of the target part within the detection range of the second scanned image is qualified, and then make an overall judgment on whether the target part meets the qualified standards for polishing processing. Reference Figure 4 and Figure 5 In this embodiment, the above method can be used to determine that there is an abnormal area light cluster of 201.9nm in the target part in the second scanning image. At this time, the corresponding qualified detection interval is set according to the qualified polishing detection of the target part, and then the qualified detection interval is used to judge whether the abnormal area light cluster of 201.9nm meets the qualified requirements, and then the overall judgment is made whether the target part is qualified for polishing processing.

[0067] In the second aspect, the present invention provides a polishing degree detection system based on laser positioning, which adopts a polishing degree detection method based on laser positioning described in any one of the first aspects. The detection system also includes: an image scanning module, which is used to acquire images of different scanning ranges according to the polishing requirements of the target part; an image processing module, which is used to perform feature recognition on the scanned image of the target part; and a feature extraction module, which is used to extract features of image recognition. That is, in this embodiment, the image scanning module is used to perform image imaging of the target part in different search ranges, and then the image processing module is used to perform feature information recognition on the image imaging of the target part in different search ranges, and the feature extraction module is used to extract the identified features, so as to facilitate the subsequent judgment of whether the target part is in a qualified range. In some embodiments, the image scanning module is an electron microscope scanning imaging.

[0068] In some embodiments, the detection system can communicate using any currently known or future developed network protocol such as HTTP (HyperText TransferProtoco l), and can be interconnected with digital data communication (e.g., communication network) of any form or medium. Examples of communication networks include local area networks ("LAN"), wide area networks ("WAN"), internets (e.g., the Internet), and peer-to-peer networks (e.g., ad hoc peer-to-peer networks), as well as any currently known or future developed networks.

[0069] The functions described above herein may be performed at least in part by one or more hardware logic components. For example, without limitation, exemplary types of hardware logic components that may be used include: field programmable gate arrays (FPGAs), application specific integrated circuits (ASICs), application specific standard products (ASSPs), systems on chips (SOCs), complex programmable logic devices (CPLDs), and the like.

[0070] The present invention provides a polishing machine in a third aspect, which adopts a polishing degree detection method based on laser positioning as described in any one of the first aspects. The polishing machine adopts the above-mentioned polishing degree detection method, and can judge the polishing qualification degree of the polished part without manual detection of the polished part, which ensures the polishing detection efficiency on the one hand and the polishing detection accuracy on the other hand. It can effectively meet the assembly line processing detection requirements of the polishing machine.

[0071] A fourth aspect of the present invention provides a computer readable medium having a computer program stored thereon, wherein the program is executed by a processor to implement a method for detecting a polishing degree based on laser positioning as described in any one of the first aspects. The computer readable medium in this embodiment can be written in one or more programming languages ​​or a combination thereof to write a computer program code for performing the operations of some embodiments of the present disclosure, wherein the programming language includes an object-oriented programming language, such as Java, Smalltalk, C++, and also includes a conventional procedural programming language, such as "C" language or a similar programming language. The program code can be executed entirely on a user's computer, partially on a user's computer, as an independent software package, partially on a user's computer, partially on a remote computer, or entirely on a remote computer or server. In the case of a remote computer, the remote computer can be connected to the user's computer through any type of network, including a local area network (LAN) or a wide area network (WAN), or can be connected to an external computer (e.g., using an Internet service provider to connect through the Internet).

[0072] The flow chart and block diagram in the accompanying drawings illustrate the possible architecture, function and operation of the system, method and computer program product according to various embodiments of the present disclosure. In this regard, each square box in the flow chart or block diagram can represent a module, a program segment or a part of a code, and the module, the program segment or a part of the code contains one or more executable instructions for realizing the specified logical function. It should also be noted that in some implementations as replacements, the functions marked in the square box can also occur in a sequence different from that marked in the accompanying drawings. For example, two square boxes represented in succession can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each square box in the block diagram and / or flow chart, and the combination of the square boxes in the block diagram and / or flow chart can be implemented with a dedicated hardware-based system that performs a specified function or operation, or can be implemented with a combination of dedicated hardware and computer instructions.

[0073] In particular, according to some embodiments of the present disclosure, the process described above with reference to the flowchart can be implemented as a computer software program. For example, some embodiments of the present disclosure include a computer program product, which includes a computer program carried on a computer readable medium, and the computer program includes a program code for executing the method shown in the flowchart.

[0074] The fifth aspect of the present invention provides an electronic device, comprising: one or more processors; a storage device having one or more programs stored thereon; when the one or more programs are executed by the one or more processors, the one or more processors implement a method for detecting a polishing degree based on laser positioning as described in the first aspect. The computer-readable medium may be included in the electronic device; or it may exist separately, that is, it is not assembled in the electronic device. The computer-readable medium carries one or more programs, and when the one or more programs are executed by the electronic device, the electronic device can implement a method for detecting a polishing degree based on laser positioning as described in the first aspect.

[0075] A sixth aspect of the present invention provides a computer program product, comprising a computer program, which, when executed by a processor, implements a polishing degree detection method based on laser positioning as described in the first aspect.

[0076] The above descriptions are only some preferred embodiments of the present disclosure and an explanation of the technical principles used. Those skilled in the art should understand that the scope of the invention involved in the embodiments of the present disclosure is not limited to the technical solutions formed by a specific combination of the above-mentioned technical features, but should also cover other technical solutions formed by any combination of the above-mentioned technical features or their equivalent features without departing from the above-mentioned inventive concept. For example, the above-mentioned features are replaced with the technical features with similar functions disclosed in the embodiments of the present disclosure (but not limited to) and the technical solutions formed.

Claims

1. A method for detecting polishing degree based on laser positioning, characterized in that: include: According to the polishing requirements of the target part, determine the detection integration group of the target part, and use the detection integration group of the target part to build a set detection environment of the target part; According to the detection integration group of the target part, using the set detection environment of the target part, the detection area of ​​the target part is framed to obtain the scanned image information of the target part; Acquire feature search information of the target part according to the scanned image information of the target part, and determine at least two search detection ranges in the target part in a graded manner according to the feature search information; Searching the scanned image information of the target part according to at least two search detection ranges in the target part to determine at least two feature detection information in the target part; According to the polishing requirements of the target parts, set the polishing alarm information of the target parts; According to the polishing alarm information of the target part, at least two feature detection information in the target part are matched to determine the polishing qualified information of the target part.

2. The method for detecting polishing degree based on laser positioning according to claim 1, characterized in that: The method of hierarchically determining at least two search detection ranges in a target part comprises: According to the polishing requirements of the target part, a first scan image of the target part is determined by using a set detection environment of the target part; Performing image partitioning on the first scanned image of the target part, obtaining at least two partitioned images in the first scanned image, and performing feature recognition on each partitioned image in the first scanned image, respectively obtaining search information of each partitioned image in the first scanned image; Acquire a second scan image of the target part according to the search information of each subarea image in the first scan image and using the set detection environment of the target part; Performing image coordinate division on the second scanned image of the target part to obtain coordinate system distribution information in the second scanned image of the target part; The second scanning image search information of the target part is determined according to the coordinate system distribution information in the second scanning image of the target part.

3. The method for detecting polishing degree based on laser positioning according to claim 2, characterized in that: The first scanning image search range of the target part is larger than the second scanning image search range of the target part.

4. The method for detecting polishing degree based on laser positioning according to claim 3, characterized in that: The method for determining at least two feature detection information in a target part comprises: According to the search information of each sub-area image in the first scanned image, the first feature recognition is performed on the first scanned image of the target part to determine the first feature information in each sub-area image in the first scanned image; Judging each subarea image in the first scanned image according to the first feature information in each subarea image in the first scanned image, and determining the information to be inspected of each subarea image in the first scanned image; Determine the subarea image to be inspected in the first scanned image according to the information to be inspected of each subarea image in the first scanned image, and scan the subarea image to be inspected in the first scanned image in a narrowed range by using the set inspection environment of the target part to determine a second scanned image of the subarea image to be inspected in the first scanned image; A second feature recognition is performed on the second scanned image of the subarea image to be inspected in the first scanned image to determine second feature information in the second scanned image of the subarea image to be inspected.

5. The method for detecting polishing degree based on laser positioning according to claim 4, characterized in that: The method for determining the information to be inspected of each subarea image in the first scanned image comprises: Performing image processing on the first scanned image of the target part to obtain grayscale value feature information in the first scanned image of the target part, and respectively determining grayscale value feature information of each subarea image in the first scanned image; According to the polishing requirements of the target part, the grayscale determination interval of the first scanned image is set; According to the grayscale determination interval of the first scanned image, the grayscale value characteristic information of each subarea image is matched and determined to determine the information to be inspected of each subarea image.

6. The method for detecting polishing degree based on laser positioning according to claim 5, characterized in that: The method for determining the second feature information in the second scanned image of the subarea image to be inspected comprises: Determine at least a second scanned image of a subarea image according to the information to be inspected of each subarea image; Performing plane coordinate division on the second scanned image of the partitioned image to obtain a plane coordinate system of the second scanned image; Performing image analysis on the second scanned image of the partitioned image, and determining the contour area to be inspected of the second scanned image in combination with the plane coordinate system of the second scanned image; The second characteristic information of the second scanned image is determined according to the contour area to be detected of the second scanned image and according to the gray value information of the contour area to be detected of the second scanned image.

7. The method for detecting polishing degree based on laser positioning according to claim 6, characterized in that: The method for determining the contour area to be detected of the second scanned image comprises: performing image analysis on the second scanned image to determine an abnormal area in the second scanned image; A judgment base point is set on the second scanned image, and contour coordinates of the abnormal area in the second scanned image are extracted according to the plane coordinate system of the second scanned image to determine coordinate information of the abnormal area in the second scanned image; According to the abnormal region coordinate information in the second scanned image, image feature information of the abnormal region in the second scanned image is determined.

8. A polishing degree detection system based on laser positioning, characterized in that: A polishing degree detection method based on laser positioning as described in any one of claims 1 to 7 is adopted.

9. The polishing degree detection system based on laser positioning according to claim 8, characterized in that: The detection system also includes: An image scanning module, which is used to acquire images in different scanning ranges according to the polishing requirements of the target part; An image processing module, the image processing module is used to perform feature recognition on a scanned image of a target part; A feature extraction module is used to extract features for image recognition.

10. A polishing machine, characterized in that: A polishing degree detection method based on laser positioning as described in any one of claims 1 to 7 is adopted.

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