An artificial intelligence-based flexible printed circuit board LED test and analysis system

Abstract

The present invention belongs to the technical field of circuit board testing and analysis, and specifically discloses a flexible printed circuit board LED testing and analysis system based on artificial intelligence, the system comprising: a test layout module, a test scene layout module, a single brightness test module, a brightness performance test analysis module, an external force mixed test module, an external force mixed test analysis module, an environmental mixed test module, an environmental mixed test analysis module, a performance analysis report generation module and a database; the present invention collects data in the test process by using a camera, thereby reducing the amount of data processing while ensuring the validity of the test results, and at the same time, by setting an external force mixed test scene and an environmental mixed test scene, solves the current deficiency of only performing test analysis through a single test scene, realizes a comprehensive analysis of external force bearing and environmental bearing, and can objectively evaluate the comprehensive performance of the flexible printed circuit board.

Description

Technical Field

[0001] The invention belongs to the technical field of circuit board testing and analysis, and relates to a flexible printed circuit board LED testing and analysis system based on artificial intelligence. Background Art

[0002] Flexible printed circuit boards are printed circuits made of flexible insulating substrates. They are lightweight, bendable, and take up little space. They are widely used in communication equipment, military equipment, aerospace equipment, and other fields. In order to ensure the reliability and stability of flexible printed circuit boards, it is necessary to test and analyze flexible printed circuit boards.

[0003] Currently, flexible printed circuit board LED test analysis mostly adopts a single dimension for test analysis, and there are still the following deficiencies: 1. The current test requires the deployment of multiple test equipment, the amount of data processed is relatively large, and the test cost cannot be saved.

[0004] 2. Currently, test analysis is only performed through a single test scenario, resulting in limited test coverage and an inability to fully evaluate the performance of LEDs in different test scenarios, which in turn leads to insufficient reliability assessment of flexible printed circuit boards.

[0005] 3. The current test is a unidirectional scenario test, that is, when conducting flexibility testing, only the flexibility index is considered, and the brightness of the LED is not comprehensively considered. It is impossible to objectively evaluate the overall performance of the flexible printed circuit board, which increases the quality risk of the flexible printed circuit board. Summary of the invention

[0006] In view of this, in order to solve the problems raised in the above background technology, a flexible printed circuit board LED testing and analysis system based on artificial intelligence is proposed.

[0007] The purpose of the present invention can be achieved through the following technical solutions: The present invention provides a flexible printed circuit board LED test and analysis system based on artificial intelligence, the system comprising: a test layout module, used to record the flexible printed circuit board as a target circuit board, fix the target circuit board on a test fixture and align it with the test equipment.

[0008] The test scene layout module is used to set the test scene of the target circuit board, including a single brightness test scene, an external force mixed test scene, and an environmental mixed test scene.

[0009] The single brightness test module is used to perform brightness performance test in a single brightness test scene and record brightness performance test data in a single brightness test scene.

[0010] The brightness performance test analysis module is used to analyze the brightness consistency in a single test scene based on the brightness performance test data in a single brightness test scene, and make a brightness consistency judgment. If the judgment result does not match, the test is terminated. Otherwise, the external force mixing test module and the environmental mixing test module are started in sequence.

[0011] The external force mixed test module is used to perform external force bearing capacity test in the external force mixed test scenario and record the external force bearing capacity test data in the external force mixed test scenario.

[0012] The external force mixed test analysis module is used to analyze the external force bearing adaptation index according to the external force bearing capacity test data under the external force mixed test scenario.

[0013] The environmental mixing test module is used to perform environmental adaptability tests under environmental mixing test scenarios and record environmental adaptability test data under environmental mixing test scenarios.

[0014] The environmental mixed test analysis module is used to analyze the environmental adaptability index based on the environmental adaptability test data under the environmental mixed test scenario.

[0015] The performance analysis report generation module is used to generate an analysis report based on the brightness matching degree, external force bearing adaptation index and environmental adaptation index.

[0016] Furthermore, the system also includes a database, which is used to store a reference brightness response time and a reference brightness value of the LED in the target circuit board, store the corresponding allowable horizontal tension, vertical tension, and bending force of the target circuit board, store the reference horizontal stretching length of the target circuit board under the corresponding allowable horizontal tension, the reference vertical stretching length under the corresponding allowable vertical tension, and the reference bending angle under the corresponding allowable bending force, store the length and width of the target circuit board, store the reference recovery time of the unit deformation of the target circuit board, and store the allowable load value range of the target circuit board corresponding to each test environment type.

[0017] Furthermore, the analysis of the brightness matching degree in a single test scene includes: extracting a reference brightness response time and a reference brightness value of an LED in a target circuit board from a database, which are recorded as T′ and N′ respectively.

[0018] The brightness response time and brightness value of the LED in each test are extracted from the brightness performance test data, and the average values ​​are calculated to obtain the average brightness response time and average brightness value, which are recorded as and

[0019] The brightness response time of the LED in each test is compared with the reference brightness response time. If the brightness response time of the LED in a certain test is less than or equal to the reference brightness response time, the test is recorded as a brightness response time matching test. The number of brightness response time matching tests is counted and recorded as D 1 , and the number of tests is recorded as D′.

[0020] The brightness value of the LED in each test is compared with the reference brightness value. If the brightness value of the LED in a certain test is greater than or equal to the reference brightness value, the test is recorded as a brightness match test. The number of brightness match tests is counted and recorded as D 2 .

[0021] Calculate the brightness matching degree δ in a single test scene. k 1 and k 2 They are respectively the set reference brightness response duration match test ratio and brightness value match test ratio.

[0022] Further, the brightness matching judgment includes: if the brightness matching degree is less than the set reference permitted brightness matching degree, then taking the non-matching as the brightness performance test result, otherwise taking the matching as the brightness performance test result.

[0023] Furthermore, the external force bearing capacity test in the external force mixed test scenario includes: extracting the horizontal tension, vertical tension and bending force that the target circuit board is allowed to bear from a database.

[0024] The target circuit board is subjected to a horizontal tensile test according to the horizontal tensile force allowed to be carried, and the horizontal tensile length and horizontal tensile recovery time during the horizontal tensile test are recorded by a camera.

[0025] After completing the horizontal stretch test of the target circuit board, repeat the brightness test under a single brightness test scene, and record the brightness performance test data after the horizontal stretch test through a camera. The horizontal stretch length during the horizontal stretch test, the horizontal stretch recovery time and the brightness performance test data after the horizontal stretch test are used as horizontal stretch bearing test data.

[0026] According to the vertical tensile force and bending force that the target circuit board can bear, vertical tensile test and bending test are carried out on the target circuit board in sequence, and the vertical tensile bearing capacity test data and bending bearing capacity test data are recorded.

[0027] The horizontal tensile bearing capacity test data, the vertical tensile bearing capacity test data and the bending bearing capacity test data are used as the external force bearing capacity test data in the external force mixed test scenario.

[0028] Furthermore, the analysis of the external force bearing adaptation index includes: extracting the horizontal stretching length and the horizontal stretching recovery time during the horizontal stretching test from the external force bearing test data, which are recorded as L and T respectively. α .

[0029] Extract the length of the target circuit board from the database, record it as L′, and calculate the horizontal tensile deformation φ of the target circuit board.

[0030] Extract the reference restoration time of the unit deformation of the target circuit board from the database, denoted as T α ″, calculate the horizontal stretch reference recovery time T of the target circuit board α ′,T α ′=φ*T α ″, and then the degree of fit of the horizontal tensile test of the target circuit board is calculated, denoted as ε 1 .

[0031] According to ε 1 The vertical tensile test fit and bending test fit of the target circuit board are obtained by the same statistical method, which are recorded as ε 2 and ε 3 , and then calculate the external force bearing adaptation index η, q 1 ,q 2 and q 3 are the reference weights for the horizontal tensile test, vertical tensile test and bending test, respectively, and q 3 >q 2 =q 1 ,q 1 +q 2 +q 3 =1, Indicates the floor symbol.

[0032] Furthermore, the statistical calculation of the horizontal stretch test conformity of the target circuit board includes: obtaining the brightness conformity under the horizontal stretch test by statistically calculating the brightness conformity under a single test scenario, which is recorded as δ″.

[0033] The reference horizontal tensile length of the target circuit board under the allowable horizontal tensile force is extracted from the database and recorded as L″.

[0034] Statistics of the horizontal tensile test conformity of the target circuit board ε 1 , δ′ is the reference brightness match under the set horizontal tensile test.

[0035] Furthermore, the environmental adaptability test in the environmental mixed test scenario includes: setting each test environment type.

[0036] The permitted load value interval corresponding to each test environment type of the target circuit board is extracted from the database, and the upper limit value and the lower limit value of the permitted load value interval corresponding to each test environment type are respectively extracted as the test values ​​of each test environment type.

[0037] According to the test values ​​of each test environment type, the brightness performance test of the target circuit board is carried out, and the brightness performance test data corresponding to the test upper limit value and the test lower limit value under each test environment type are recorded and used as environmental adaptability test data under the environmental mixed test scenario.

[0038] Furthermore, the analysis of the environmental adaptability index includes: extracting brightness performance test data corresponding to the test upper limit value under each test environment type from the environmental adaptability test data, and then extracting the brightness response time and brightness value during each test.

[0039] With the test order as the horizontal axis and the brightness response time as the vertical axis, we construct the response time curve under a single test brightness scene and the brightness response time curve of the corresponding test upper limit value under each test environment type, and then calculate the brightness response time similarity σ of the test upper limit value under each test type. j , j is the environment type number, j=1,2,......,n.

[0040] According to σ j The statistical method is similar to the statistical method to obtain the brightness similarity of the upper limit value of each test type, denoted as ω j .

[0041] According to the statistical method of δ, the brightness matching degree of each test type corresponding to the test upper limit value is obtained by statistics, which is recorded as δ j ″′, based on which the environmental adaptability index λ corresponding to the upper limit of each test environment type is calculated j .

[0042] According to λ j The statistical method is similar to the statistical method to obtain the environmental adaptation index λ of the lower limit of each test type. j ′, and then calculate the environmental adaptation index ζ,

[0043] Furthermore, the statistical environmental adaptability index of each test environment type corresponding to the test upper limit value includes: using the brightness response time curve corresponding to the test upper limit value under each test environment type as the response time curve of each test environment type, and using the response time curve under a single test brightness scene as the target curve.

[0044] The response time curve of each test environment type is overlapped and compared with the target curve to obtain the overlap curve length ψ of each test environment type. j, and the length of the response time curve of each test environment type is recorded as ψ′ j , ψ j and ψ′ j The ratio of is taken as the brightness response time similarity σ of the upper limit value of each test environment type j .

[0045] Statistical analysis of the environmental adaptability index λ corresponding to the upper limit of each test environment type j , σ′ j ,ω j ′ and (δ τ ) j The brightness response time, brightness value and brightness consistency of the j-th test environment type corresponding to the test upper limit value are set respectively.

[0046] Compared with the prior art, the present invention has the following beneficial effects: (1) The present invention uses a camera to collect data during the test process, thereby reducing the amount of data processing while ensuring the validity of the test results, while saving the cost of the test. On another level, non-contact data collection avoids damage to the flexible printed circuit board during the test process.

[0047] (2) The present invention solves the problem of currently only performing test analysis through a single test scenario by setting up external force mixed test scenarios and environmental mixed test scenarios, and more comprehensively evaluates the performance of LEDs under different test scenarios, thereby improving the reliability evaluation of flexible printed circuit boards and providing data support for the subsequent optimization design of flexible printed circuit boards.

[0048] (3) When conducting the external force bearing capacity test and analysis, the present invention comprehensively considers the brightness of the LED by combining the changes in stretching and bending and the brightness performance, thereby realizing a comprehensive test and analysis of the external force bearing capacity, and then can objectively evaluate the overall performance of the flexible printed circuit board, thereby reducing the quality risk of the flexible printed circuit board.

[0049] (4) When performing environmental adaptability test analysis, the present invention effectively reduces the test scope by setting each environmental test type and the upper and lower limits of each environmental test type, thereby reducing the tediousness of the test and reducing some unnecessary tests, thereby shortening the time of environmental testing and avoiding the waste of resources. On another level, it also improves the work efficiency of environmental testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0050] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings required for describing the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying creative work.

[0051] Figure 1 It is a schematic diagram of the connection of each module of the system of the present invention. DETAILED DESCRIPTION

[0052] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0053] See also Figure 1 As shown, the present invention provides a flexible printed circuit board LED test and analysis system based on artificial intelligence, the system comprising: a test layout module, a test scene layout module, a single brightness test module, a brightness performance test and analysis module, an external force mixed test module, an external force mixed test and analysis module, an environmental mixed test module, an environmental mixed test and analysis module, a performance analysis report generation module and a database.

[0054] In the above, the test scene layout module is respectively connected to the test layout module and the single brightness test module, the brightness performance test analysis module is respectively connected to the single brightness test module, the external force mixed test module, the performance analysis report generation module and the database, the external force mixed test analysis module is respectively connected to the external force mixed test module, the environmental mixed test module, the performance analysis report generation module and the database, and the environmental mixed test analysis module is also respectively connected to the environmental mixed test module, the performance analysis report generation module and the database.

[0055] The test layout module is used to record the flexible printed circuit board as a target circuit board, fix the target circuit board on the test fixture and align it with the test equipment.

[0056] The test scene layout module is used to set the test scene of the target circuit board, including a single brightness test scene, an external force mixed test scene and an environmental mixed test scene.

[0057] The embodiments of the present invention solve the shortcomings of the current test analysis only through a single test scenario by setting up external force mixed test scenarios and environmental mixed test scenarios, more comprehensively evaluate the performance of LEDs in different test scenarios, improve the reliability evaluation of flexible printed circuit boards, and provide data support for the subsequent optimization design of flexible printed circuit boards.

[0058] The single brightness test module is used to perform a brightness performance test in a single brightness test scene and record brightness performance test data in the single brightness test scene.

[0059] The brightness performance test analysis module is used to analyze the brightness consistency in a single test scene based on the brightness performance test data in a single brightness test scene, and make a brightness consistency judgment. If the judgment result does not match, the test is terminated. Otherwise, the external force mixing test module and the environmental mixing test module are started in sequence.

[0060] Exemplarily, the system also includes a database, which is used to store a reference brightness response time and a reference brightness value of the LED in the target circuit board, store the corresponding allowable horizontal tension, vertical tension, and bending force of the target circuit board, store the reference horizontal stretching length of the target circuit board under the allowable horizontal tension, the reference vertical stretching length under the allowable vertical tension, and the reference bending angle under the allowable bending force, store the length and width of the target circuit board, store the reference recovery time of the unit deformation of the target circuit board, and store the allowable load value range of the target circuit board corresponding to each test environment type.

[0061] Exemplarily, the analysis of brightness matching in a single test scenario includes: extracting a reference brightness response duration and a reference brightness value of an LED in a target circuit board from a database, which are recorded as T′ and N′, respectively.

[0062] The brightness response time and brightness value of the LED in each test are extracted from the brightness performance test data, and the average values ​​are calculated to obtain the average brightness response time and average brightness value, which are recorded as and

[0063] The brightness response time of the LED in each test is compared with the reference brightness response time. If the brightness response time of the LED in a certain test is less than or equal to the reference brightness response time, the test is recorded as a brightness response time matching test. The number of brightness response time matching tests is counted and recorded as D 1 , and the number of tests is recorded as D′.

[0064] The brightness value of the LED in each test is compared with the reference brightness value. If the brightness value of the LED in a certain test is greater than or equal to the reference brightness value, the test is recorded as a brightness match test. The number of brightness match tests is counted and recorded as D 2 .

[0065] Calculate the brightness matching degree δ in a single test scene. k 1 and k 2 They are respectively the set reference brightness response duration match test ratio and brightness value match test ratio.

[0066] It should be added that k 1 and k 2 It is extracted from the flexible printed circuit board test technical specification table.

[0067] Exemplarily, the brightness matching judgment includes: if the brightness matching degree is less than the set reference permitted brightness matching degree, then taking the non-matching as the brightness performance test result, otherwise taking the matching as the brightness performance test result.

[0068] The external force mixed test module is used to perform an external force bearing capacity test in an external force mixed test scenario and record the external force bearing capacity test data in the external force mixed test scenario.

[0069] Exemplarily, the external force bearing capacity test in the external force mixed test scenario includes: extracting the horizontal tension, vertical tension and bending force that the target circuit board is allowed to bear from a database.

[0070] The target circuit board is subjected to a horizontal tensile test according to the horizontal tensile force allowed to be carried, and the horizontal tensile length and horizontal tensile recovery time during the horizontal tensile test are recorded by a camera.

[0071] After completing the horizontal stretch test of the target circuit board, repeat the brightness test under a single brightness test scene, and record the brightness performance test data after the horizontal stretch test through a camera. The horizontal stretch length during the horizontal stretch test, the horizontal stretch recovery time and the brightness performance test data after the horizontal stretch test are used as horizontal stretch bearing test data.

[0072] The target circuit board is subjected to vertical tensile test and bending test in sequence according to the vertical tensile force and bending force that the target circuit board can bear, and the vertical tensile load-bearing test data and the bending load-bearing test data are recorded by a camera.

[0073] The horizontal tensile bearing capacity test data, vertical tensile bearing capacity test data and bending bearing capacity test data are used as external force bearing capacity evaluation test data under the external force mixed test scenario.

[0074] The external force mixed test analysis module is used to analyze the external force bearing adaptability index according to the external force bearing capacity test data in the external force mixed test scenario.

[0075] The embodiment of the present invention uses a camera to collect data during the test process, thereby reducing the amount of data processing while ensuring the validity of the test results, while saving the cost of the test. On another level, non-contact data collection avoids damage to the flexible printed circuit board during the test process.

[0076] Exemplarily, the analysis of the external force bearing adaptation index includes: extracting the horizontal stretching length and the horizontal stretching recovery time during the horizontal stretching test from the external force bearing test data, which are recorded as L and T respectively. α .

[0077] Extract the length of the target circuit board from the database, record it as L′, and calculate the horizontal tensile deformation φ of the target circuit board.

[0078] Extract the reference restoration time of the unit deformation of the target circuit board from the database, denoted as T α ″, calculate the horizontal stretch reference recovery time T of the target circuit board α ′,T α ′=φ*T α ″, and then the degree of fit of the horizontal tensile test of the target circuit board is calculated, denoted as ε 1 .

[0079] Furthermore, the statistical calculation of the horizontal stretch test conformity of the target circuit board includes: obtaining the brightness conformity under the horizontal stretch test by statistically calculating the brightness conformity under a single test scenario, which is recorded as δ″.

[0080] The reference horizontal tensile length of the target circuit board under the allowable horizontal tensile force is extracted from the database and recorded as L″.

[0081] Statistics of the horizontal tensile test conformity of the target circuit board ε 1 , δ′ is the reference brightness match under the set horizontal tensile test.

[0082] It should be added that δ′ is extracted from the flexible printed circuit board test technical specification table.

[0083] According to ε 1 The vertical tensile test fit and bending test fit of the target circuit board are obtained by the same statistical method, which are recorded as ε 2 and ε 3 , and then calculate the external force bearing adaptation index η, q 1 ,q 2and q 3 are the reference weights for the horizontal tensile test, vertical tensile test and bending test, respectively, and q 3 >q 2 =q 1 ,q 1 +q 2 +q 3 =1, Indicates the floor symbol.

[0084] It should be added that the reference weight of the fit of the bending test is greater than the reference weight of the fit of the horizontal tensile test and the vertical tensile test, i.e., q 3 >q 2 =q 1 This is because flexible printed circuit boards often need to undergo multiple bends to adapt to specific application scenarios. If the bending performance is poor, it is easy to cause the flexible printed circuit board to break or degrade in performance. Therefore, for flexible printed circuit boards, the bending test impact weight is usually given a higher proportion. For the convenience of analysis, the specific reference weight value of the fit degree can be q 1 =q 2 =0.3,q 3 =0.4.

[0085] It should be added that the specific analysis method of the target circuit board bending test conformity is: the bending angle and bending recovery time during the bending test are extracted from the external force bearing test data, and are recorded as θ and T respectively. β .

[0086] The reference restoration time of the unit deformation of the target circuit board is extracted from the database, and the horizontal tensile deformation of the target circuit board is matched and compared with the reference restoration time of the unit deformation of the target circuit board to obtain the reference restoration time, which is recorded as T β ′.

[0087] According to the statistical method of brightness matching under a single test scene, the brightness matching of the bending test is obtained by statistics, which is recorded as δ β .

[0088] The reference bending angle of the target circuit board under the allowable bearing bending force is extracted from the database and recorded as θ′.

[0089] Statistical target circuit board bending test conformity ε 3 , δ′ β To set the reference brightness match under the bending test.

[0090] It should also be added that δ′ β It is extracted from the flexible printed circuit board test technical specification table.

[0091] When performing the external force bearing capacity test and analysis, the embodiment of the present invention comprehensively considers the brightness of the LED by combining the changes in stretching and bending and the brightness performance, thereby achieving a comprehensive test and analysis of the external force bearing capacity, and then can objectively evaluate the overall performance of the flexible printed circuit board, thereby reducing the quality risk of the flexible printed circuit board.

[0092] The environmental mixing test module is used to perform environmental adaptability test in an environmental mixing test scenario and record environmental adaptability test data in the environmental mixing test scenario.

[0093] Exemplarily, the environmental adaptability test in the environment mixed test scenario includes: setting each test environment type.

[0094] The permitted load value interval corresponding to each test environment type of the target circuit board is extracted from the database, and the upper limit value and the lower limit value of the permitted load value interval corresponding to each test environment type are respectively extracted as the test values ​​of each test environment type.

[0095] Exemplarily, according to the test values ​​of each test environment type, the brightness performance test of the target circuit board is performed, and the brightness performance test data corresponding to the test upper limit value and the test lower limit value under each test environment type are recorded and used as environmental adaptability test data under the environmental mixed test scenario.

[0096] It should be added that the test environment types include but are not limited to temperature, humidity and light intensity.

[0097] The environmental mixed test analysis module is used to analyze the environmental adaptability index according to the environmental adaptability test data in the environmental mixed test scenario.

[0098] Exemplarily, the analysis of the environmental adaptability index includes: extracting brightness performance test data corresponding to the test upper limit value under each test environment type from the environmental adaptability test data, and then extracting the brightness response time and brightness value during each test.

[0099] It should be added that the upper and lower limits of each environment type are selected for analysis through edge analysis or limit testing when analyzing the environmental adaptability index, and the limit case analysis method is set to evaluate the limit performance and analyze the performance of the flexible printed circuit board under the most severe environmental conditions, so as to determine the performance limit of the flexible printed circuit board. It is also convenient to predict potential failures.

[0100] With the test order as the horizontal axis and the brightness response time as the vertical axis, we construct the response time curve under a single test brightness scene and the brightness response time curve of the corresponding test upper limit value under each test environment type, and then calculate the brightness response time similarity σ of the test upper limit value under each test type. j, j is the environment type number, j=1,2,......,n.

[0101] According to σ j The statistical method is similar to the statistical method to obtain the brightness similarity of the upper limit value of each test type, denoted as ω j .

[0102] According to the statistical method of δ, the brightness matching degree of each test type corresponding to the test upper limit value is obtained by statistics, which is recorded as δ j ″′, based on which the environmental adaptability index λ corresponding to the upper limit of each test environment type is calculated j .

[0103] Furthermore, the statistical environmental adaptability index of each test environment type corresponding to the test upper limit value includes: using the brightness response time curve corresponding to the test upper limit value under each test environment type as the response time curve of each test environment type, and using the response time curve under a single test brightness scene as the target curve.

[0104] The response time curve of each test environment type is overlapped and compared with the target curve to obtain the overlap curve length ψ of each test environment type. j , and the length of the response time curve of each test environment type is recorded as ψ′ j , ψ j and ψ′ j The ratio of is taken as the brightness response time similarity σ of the upper limit value of each test environment type j .

[0105] Statistical analysis of the environmental adaptability index λ corresponding to the upper limit of each test environment type j , σ′ j ,ω j ′ and (δ τ ) j The brightness response time, brightness value and brightness consistency of the j-th test environment type corresponding to the test upper limit value are set respectively.

[0106] It should be added that σ′ j ,ω j ′ and (δ τ ) j All are extracted from the flexible printed circuit board test technical specification table.

[0107] According to λ j The statistical method is similar to the statistical method to obtain the environmental adaptation index λ of the lower limit of each test type. j ′, and then calculate the environmental adaptation index ζ,

[0108] When performing environmental adaptability test analysis, the embodiment of the present invention effectively reduces the test scope by setting each environmental test type and the upper and lower limits of each environmental test type, thereby reducing the tediousness of the test and reducing some unnecessary tests, thereby shortening the time of environmental testing and avoiding waste of resources, and improving the work efficiency of environmental testing on another level.

[0109] The performance analysis report generation module is used to generate an analysis report based on the brightness matching degree, external force bearing adaptation index and environmental adaptation index.

[0110] The above contents are merely examples and explanations of the concept of the present invention. Those skilled in the art may make various modifications or additions to the specific embodiments described or replace them in a similar manner. As long as they do not deviate from the concept of the invention or exceed the scope defined by the present invention, they shall all fall within the protection scope of the present invention.

Claims

1. A flexible printed circuit board LED test and analysis system based on artificial intelligence, characterized by: The system includes: A test layout module, used for recording the flexible printed circuit board as a target circuit board, fixing the target circuit board on a test fixture and aligning it with a test device; A test scene layout module is used to set the test scene of the target circuit board, including a single brightness test scene, an external force mixed test scene, and an environmental mixed test scene; A single brightness test module is used to perform brightness performance test in a single brightness test scene and record brightness performance test data in a single brightness test scene; The brightness performance test analysis module is used to analyze the brightness consistency in a single test scene according to the brightness performance test data in a single brightness test scene, and make a brightness consistency judgment. If the judgment result does not match, the test is terminated, otherwise the external force mixing test module and the environmental mixing test module are started in sequence; An external force mixed test module is used to perform an external force bearing capacity test in an external force mixed test scenario and record the external force bearing capacity test data in the external force mixed test scenario; An external force mixed test analysis module is used to analyze the external force bearing adaptability index based on the external force bearing capacity test data under the external force mixed test scenario; An environmental mixed test module is used to perform environmental adaptability tests under environmental mixed test scenarios and record environmental adaptability test data under environmental mixed test scenarios; An environmental mixed test analysis module is used to analyze the environmental adaptability index based on the environmental adaptability test data under the environmental mixed test scenario; A performance analysis report generation module is used to generate an analysis report based on brightness matching, external force bearing adaptation index and environmental adaptation index; The external force bearing capacity test in the external force mixed test scenario includes: Extracting the horizontal tension, vertical tension and bending force that the target circuit board can bear from the database; Perform a horizontal tensile test on the target circuit board according to the horizontal tensile force allowed to be carried, and record the horizontal tensile length and horizontal tensile recovery time during the horizontal tensile test by a camera; After completing the horizontal stretch test of the target circuit board, repeat the brightness test under a single brightness test scene, and record the brightness performance test data after the horizontal stretch test through a camera, and use the horizontal stretch length during the horizontal stretch test, the horizontal stretch recovery time, and the brightness performance test data after the horizontal stretch test as the horizontal stretch bearing test data; Performing a vertical tensile test and a bending test on the target circuit board in sequence according to the vertical tensile force and bending force that the target circuit board can bear, and recording the vertical tensile bearing capacity test data and the bending bearing capacity test data by a camera; The horizontal tensile bearing capacity test data, the vertical tensile bearing capacity test data and the bending bearing capacity test data are used as the external force bearing capacity evaluation test data in the external force mixed test scenario; The analysis of the external force bearing adaptation index includes: The horizontal stretching length and horizontal stretching recovery time during the horizontal stretching test are extracted from the external force bearing test data and recorded as L and T respectively. α ; Extract the length of the target circuit board from the database, record it as L′, and calculate the horizontal tensile deformation φ of the target circuit board. Extract the reference restoration time of the unit deformation of the target circuit board from the database, denoted as T α ″, calculate the horizontal stretch reference recovery time T of the target circuit board α ′,T α ′=φ*T α ″, and then the degree of agreement of the horizontal tensile test of the target circuit board is calculated, which is recorded as ε1; According to the statistical method of ε1, the vertical tensile test fit and the bending test fit of the target circuit board are statistically obtained, which are recorded as ε2 and ε3 respectively, and then the external force bearing adaptation index η is calculated. q1, q2 and q3 are the reference weights for setting the consistency of horizontal tensile test, vertical tensile test and bending test, q3>q2=q1, q1+q2+q3=1, Indicates the floor symbol; The statistical target circuit board horizontal tensile test conformity includes: According to the statistical method of brightness matching under a single test scene, the brightness matching under the horizontal stretching test is obtained by statistics, which is recorded as δ″; Extract the reference horizontal tensile length of the target circuit board under the allowable horizontal tensile force from the database, denoted as L″; Statistical target circuit board horizontal tensile test conformity ε1, δ′ is the reference brightness match under the set horizontal tensile test.

2. The artificial intelligence-based flexible printed circuit board LED test and analysis system according to claim 1, characterized in that: The system also includes a database, which is used to store a reference brightness response time and a reference brightness value of the LED in the target circuit board, store the corresponding allowable horizontal tension, vertical tension, and bending force of the target circuit board, store the reference horizontal stretching length of the target circuit board under the allowable horizontal tension, the reference vertical stretching length under the allowable vertical tension, and the reference bending angle under the allowable bending force, store the length and width of the target circuit board, store the reference recovery time of the unit deformation of the target circuit board, and store the allowable load value range of the target circuit board corresponding to each test environment type.

3. The artificial intelligence-based flexible printed circuit board LED test and analysis system according to claim 2, characterized in that: The analysis of brightness matching in a single test scene includes: Extract the reference brightness response time and reference brightness value of the LED in the target circuit board from the database, and record them as T′ and N′ respectively; The brightness response time and brightness value of the LED in each test are extracted from the brightness performance test data, and the average values ​​are calculated to obtain the average brightness response time and average brightness value, which are recorded as and The brightness response time of the LED in each test is compared with the reference brightness response time. If the brightness response time of the LED in a certain test is less than or equal to the reference brightness response time, the test is recorded as a brightness response time matching test, and the number of brightness response time matching tests is counted and recorded as D1, and the number of tests is recorded as D′; The brightness value of the LED in each test is compared with the reference brightness value. If the brightness value of the LED in a certain test is greater than or equal to the reference brightness value, the test is recorded as a brightness value matching test, and the number of brightness value matching tests is counted and recorded as D2; Calculate the brightness matching degree δ in a single test scene. k1 and k2 are the reference brightness response duration matching test ratio and brightness value matching test ratio respectively.

4. The artificial intelligence-based flexible printed circuit board LED test and analysis system according to claim 3, characterized in that: The brightness matching judgment comprises: If the brightness match is less than the set reference allowable brightness match, it will not be matched as the brightness performance test result, otherwise it will be matched as the brightness performance test result.

5. The artificial intelligence-based flexible printed circuit board LED test and analysis system according to claim 2, characterized in that: The environmental adaptability test in the environmental mixed test scenario includes: Set each test environment type; Extract the permitted load value interval corresponding to each test environment type of the target circuit board from the database, and respectively extract the upper limit value and the lower limit value of the permitted load value interval corresponding to each test environment type as the test value of each test environment type; According to the test values ​​of each test environment type, the brightness performance test of the target circuit board is carried out, and the brightness performance test data corresponding to the test upper limit value and the test lower limit value under each test environment type are recorded and used as environmental adaptability test data under the environmental mixed test scenario.

6. The artificial intelligence-based flexible printed circuit board LED test and analysis system according to claim 5, characterized in that: The analysis of the environmental adaptation index includes: Extract the brightness performance test data corresponding to the upper limit value of each test environment type from the environmental adaptability test data, and then extract the brightness response time and brightness value of each test; With the test order as the horizontal axis and the brightness response time as the vertical axis, we construct the response time curve under a single test brightness scene and the brightness response time curve of the corresponding test upper limit value under each test environment type, and then calculate the brightness response time similarity σ of the test upper limit value under each test type. j , j is the environment type number, j = 1, 2, ..., n; According to σ j The statistical method is similar to the statistical method to obtain the brightness similarity of the upper limit value of each test type, denoted as ω j ; According to the statistical method of δ, the brightness matching degree of each test type corresponding to the test upper limit value is obtained by statistics, which is recorded as δ″′ j , based on which the environmental adaptability index λ corresponding to the upper limit of each test environment type is calculated j ; According to λ j The statistical method is similar to the statistical method to obtain the environmental adaptation index λ′ of the lower limit of each test type. j , and then calculate the environmental adaptation index ζ, 7. The artificial intelligence-based flexible printed circuit board LED test and analysis system according to claim 6, characterized in that: The statistical environmental adaptability index of each test environment type corresponding to the test upper limit value includes: The brightness response time curve corresponding to the upper limit value of the test under each test environment type is used as the response time curve of each test environment type, and the response time curve under a single test brightness scene is used as the target curve; The response time curve of each test environment type is overlapped and compared with the target curve to obtain the overlap curve length ψ of each test environment type. j , and the length of the response time curve of each test environment type is recorded as ψ′ j , and ψ j and ψ′ j The ratio of is taken as the brightness response time similarity σ of the upper limit value of each test environment type j ; Statistical analysis of the environmental adaptability index λ corresponding to the upper limit of each test environment type j , σ′ j ,ω′ j and (δ τ ) j The brightness response time, brightness value and brightness consistency of the j-th test environment type corresponding to the test upper limit value are set respectively.

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