A testing device and method for LED driver chip

Abstract

The present invention discloses a testing device and method for an LED driver chip. In the device, after ATE sends a change command signal to a control unit, it receives test data sent by the LED driver chip to be tested. After the test is completed, it is determined whether the function of the LED driver chip to be tested meets a preset standard; the control unit sequentially provides different input signals to the LED driver chip to be tested based on the received change command signal; after receiving the input signal, the LED driver chip to be tested outputs test data, and the input signal is a test vector corresponding to the number of bits of the current that the LED driver chip to be tested can drive. Since the present invention sends a change command signal to the control unit through ATE, the control unit sequentially provides input signals to the LED driver chip to be tested based on the change command signal, and the input signal is a test vector corresponding to the number of bits of the current that the LED driver chip to be tested can determine, and the control unit can provide all test vectors, so that the test result of the LED driver chip is more accurate.

Description

Technical Field

[0001] The present invention relates to the field of integrated circuit testing, and in particular to a testing device and method for an LED driver chip. Background Art

[0002] With the widespread application of LEDs, the requirements for LED parameters such as brightness, color temperature, and color saturation are becoming increasingly refined, which requires the LED drive circuit to be able to achieve more precise control.

[0003] Since LED driver chips used in LED driver circuits are already common, testing the accuracy of LED driver chips is crucial to determining whether product performance is qualified or not. Related technologies use ATE (Automatic Test Equipment) to test the LED driver chips to be tested. However, since there are many test vectors for LED driver chips, especially multi-bit current LED driver chips, testing a multi-bit current LED driver chip requires tens of thousands of tests. It is difficult for ATE to test all test vectors and can only test some test vectors, resulting in inaccurate test results. Summary of the invention

[0004] The present invention provides a testing device and method for an LED driver chip, which are used to solve the problem in the prior art that when testing an LED driver chip, it is difficult for ATE to implement the test of all test vectors, resulting in inaccurate test results.

[0005] In a first aspect, an embodiment of the present invention provides a testing device for an LED driver chip, including ATE and a control unit;

[0006] The ATE is used to receive test data sent by the LED driver chip to be tested after sending a change instruction signal to the control unit, and after the test is completed, determine whether the function of the LED driver chip meets the preset standard based on the received test data;

[0007] The control unit is used to sequentially provide different input signals to the LED driver chip to be tested based on the received change instruction signal;

[0008] Wherein, the LED driver chip to be tested outputs test data based on the received input signal each time after receiving the input signal; the input signal is a test vector corresponding to the number of bits of the current that the LED driver chip to be tested can drive.

[0009] In a possible implementation, it further includes a processing unit;

[0010] After receiving the test data sent by the LED driver chip to be tested, the ATE is further used to: send the test data to the processing unit, and receive target test data sent by the processing unit, and after the test is completed, determine whether the function of the LED driver chip meets the preset standard based on the received target test data;

[0011] The processing unit is used to receive the test data sent by the ATE and filter the test data to obtain the target test data, wherein the target test data includes part or all of the following: the current value in the test data, the voltage value in the test data, the delay time in the test data, and the logic signal in the test data.

[0012] In a possible implementation manner, the control unit is specifically configured to:

[0013] Based on the received change command signal, sequentially provide the LED driver chip to be tested with input signals arranged in sequence;

[0014] Among them, the input signals arranged in sequence include the current values ​​included in the input signals increasing in sequence, or the voltage values ​​included in the input signals increasing in sequence, or the current values ​​included in the input signals decreasing in sequence, or the voltage values ​​included in the input signals decreasing in sequence.

[0015] In a possible implementation manner, the change instruction signal includes a pulse signal.

[0016] In a possible implementation manner, the control unit is specifically configured to:

[0017] receiving the change command signal, and providing a different input signal to the LED driver chip to be tested when recognizing that the pulse signal in the change command signal is a rising edge; or

[0018] The change command signal is received, and when it is identified that the pulse signal in the change command signal is a falling edge, a different input signal is provided to the LED driver chip to be tested.

[0019] In a possible implementation, a test board is also included;

[0020] The test board is used to carry the LED driver chip to be tested and provide a working circuit for the LED driver chip to be tested.

[0021] In a second aspect, an embodiment of the present invention further provides a method for testing an LED driver chip, the method comprising:

[0022] Sending a change instruction signal to the control unit through automatic test equipment ATE;

[0023] After receiving the change command signal, the control unit sequentially provides different input signals to the LED driver chip to be tested;

[0024] Receiving test data sent by the LED driver chip to be tested through the ATE, and after the test is completed, judging whether the function of the LED driver chip meets the preset standard based on the received test data;

[0025] Wherein, the LED driver chip to be tested outputs test data based on the received input signal each time after receiving the input signal; the input signal is a test vector corresponding to the number of bits of the current that the LED driver chip to be tested can drive.

[0026] In a possible implementation, the method includes:

[0027] After receiving the test data sent by the LED driver chip to be tested, sending the test data to the processing unit through the ATE;

[0028] Receiving the test data sent by the ATE through the processing unit, and screening the test data to obtain target test data, wherein the target test data includes part or all of the following: a current value in the test data, a voltage value in the test data, a delay time in the test data, and a logic signal in the test data;

[0029] The target test data sent by the processing unit is received by the ATE, and after the test is completed, it is determined whether the function of the LED driver chip meets the preset standard based on the received target test data.

[0030] In a possible implementation, the method includes:

[0031] Based on the received change instruction signal, the control unit sequentially provides the LED driver chip to be tested with input signals arranged in sequence;

[0032] Among them, the input signals arranged in sequence include the current values ​​included in the input signals increasing in sequence, or the voltage values ​​included in the input signals increasing in sequence, or the current values ​​included in the input signals decreasing in sequence, or the voltage values ​​included in the input signals decreasing in sequence.

[0033] In a possible implementation manner, the change instruction signal includes a pulse signal.

[0034] In a possible implementation, the method includes:

[0035] receiving the change command signal, and when recognizing that the pulse signal in the change command signal is a rising edge, providing different input signals to the LED driver chip to be tested through the control unit; or

[0036] The change command signal is received, and when it is identified that the pulse signal in the change command signal is a falling edge, different input signals are provided to the LED driver chip to be tested through the control unit.

[0037] In a possible implementation, the method further includes:

[0038] The LED driver chip to be tested is carried by a test board, and a working circuit is provided for the LED driver chip to be tested by the test board.

[0039] The beneficial effects of the present invention are as follows:

[0040] The present invention provides a testing device and method for an LED driver chip, comprising an ATE and a control unit: after sending a change command signal to the control unit, the ATE receives test data sent by the LED driver chip to be tested, and after the test is completed, based on the received test data, determines whether the function of the LED driver chip meets the preset standard; the control unit sequentially provides different input signals to the LED driver chip to be tested based on the received change command signal; wherein the LED driver chip to be tested outputs test data after each input signal is received; the input signal is a test vector corresponding to the number of bits of the current that the LED driver chip to be tested can drive. Since the change command signal is sent to the control unit by the ATE in the present application, the control unit sequentially provides the input signal to the LED driver chip to be tested based on the change command signal, and the input signal is a test vector corresponding to the number of bits of the current that the LED driver chip to be tested can determine, and the control unit can provide all the test vectors, thereby making the test result of the LED driver chip more accurate. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0042] Figure 1 A schematic diagram of a testing device for an LED driver chip of the prior art provided in an embodiment of the present application;

[0043] Figure 2 A schematic diagram of a testing device for an LED driver chip provided in an embodiment of the present application;

[0044] FIG3( a) is a schematic diagram of a pulse signal provided in an embodiment of the present application;

[0045] FIG3( b) is a schematic diagram of another pulse signal provided in an embodiment of the present application;

[0046] Figure 4 A schematic diagram of another LED driver chip testing device provided in an embodiment of the present application;

[0047] Figure 5 A schematic diagram of extracting a current value provided in an embodiment of the present application;

[0048] Figure 6 A schematic diagram of another LED driver chip testing device provided in an embodiment of the present application;

[0049] Figure 7 A flow chart of a method for testing an LED driver chip provided in an embodiment of the present application;

[0050] Figure 8 A complete flowchart of a method for testing an LED driver chip provided in an embodiment of the present application. DETAILED DESCRIPTION

[0051] In order to make the purpose, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0052] The widespread application of LEDs is inseparable from the support of LED driver circuits. As the demand for LED brightness, color temperature, color saturation and other parameters becomes increasingly refined, this requires LED driver circuits to be able to achieve more precise control.

[0053] Since LED driver chips used in LED driver circuits, such as 8-bit current driver chips, 11-bit current driver chips, and 16-bit current driver chips, are already common, testing the accuracy of LED driver chips is crucial to determining whether product performance is qualified or not. Figure 1 As shown, ATE (Automatic Test Equipment) is used to test the current accuracy of the LED driver chip. After the ATE sends an input signal corresponding to the test vector to the LED driver chip, the test data sent by the LED driver chip is received, and based on the test data, it is determined whether the function of the LED driver chip meets the preset standard.

[0054] However, for a multi-bit current LED driver chip, there are many test vectors. Testing a multi-bit current LED driver chip requires tens of thousands of tests. ATE cannot test all test vectors and can only test some test vectors, resulting in inaccurate test results.

[0055] Based on the above problems, an embodiment of the present application provides a testing device for an LED driver chip, such as Figure 2 As shown, it includes ATE203 and control unit 201:

[0056] ATE 203, for receiving test data sent by the LED driver chip 202 to be tested after sending a change instruction signal to the control unit 201, and after the test is completed, judging whether the function of the LED driver chip 202 to be tested meets a preset standard based on the received test data;

[0057] The control unit 201 is used to sequentially provide different input signals to the LED driver chip 202 to be tested based on the received change command signal;

[0058] The LED driver chip 202 to be tested outputs test data based on the received input signal each time after receiving the input signal; the input signal is a test vector corresponding to the number of bits of the current that the LED driver chip 202 to be tested can drive.

[0059] An embodiment of the present invention provides a test device for an LED driver chip, the device comprising an ATE and a control unit: the ATE sends a change command signal to the control unit, the control unit sequentially provides different input signals for the LED driver chip to be tested based on the received change command signal, the LED driver chip to be tested outputs test data after each input signal is received, the ATE receives the test data sent by the LED driver chip to be tested, and after the test is completed, based on the received test data, determines whether the function of the LED driver chip meets the preset standard; wherein the input signal is a test vector corresponding to the number of bits of the current that the LED driver chip to be tested can drive. Since the change command signal is sent to the control unit by the ATE in the present application, the control unit sequentially provides different input signals for the LED driver chip to be tested based on the change command signal, the input signal is a test vector corresponding to the number of bits of the current that the LED driver chip to be tested can determine, and the control unit can provide input signals corresponding to all the test vectors, thereby making the test result of the LED driver chip more accurate.

[0060] It should be noted that the control unit 201 may be an MCU, an FPGA (Field Programmable Gate Array), or a CPLD (Complex Programmable Logic Device).

[0061] In addition, the control unit 201 can be used to test the current accuracy of the LED driver chip under test, and can also be used to test the delay time accuracy of the LED driver chip under test, the logic signal accuracy of the LED driver chip under test, the voltage accuracy of the LED driver chip under test, etc.

[0062] In a specific embodiment, the control unit 201 is specifically configured to provide sequentially arranged input signals to the LED driver chip 202 to be tested based on the received change instruction signal.

[0063] In an embodiment of the present application, the input signals arranged in sequence include the current values ​​included in the input signals increasing in sequence, or the voltage values ​​included in the input signals increasing in sequence, or the current values ​​included in the input signals decreasing in sequence, or the voltage values ​​included in the input signals decreasing in sequence.

[0064] The control unit sequentially inputs the sequenced input signals to the LED driver chip 202 to be tested. Since the input signals received by the LED driver chip 202 to be tested are sequenced input signals, the test data output by the LED driver chip 202 to be tested is also sequenced, thereby making it more convenient for the ATE 203 to determine whether the function of the LED driver chip 202 to be tested meets the preset standard based on the received test data.

[0065] In a specific implementation, the change command signal includes a pulse signal, and the ATE sends the pulse signal to the control unit. In one embodiment, the control unit receives the change command signal, and when it identifies that the pulse signal in the change command signal is a rising edge, it provides an input signal to the LED driver chip to be tested. As shown in FIG. 3( a ), when the control unit identifies that a rising edge of the pulse signal arrives, it outputs an input signal to the LED driver chip to be tested, until the last input signal is input to the LED driver chip to be tested.

[0066] In another embodiment, the control unit receives a change command signal, identifies that a pulse signal in the change command signal is a falling edge, and provides an input signal to the LED driver chip to be tested. As shown in FIG3(b), when the control unit identifies that a falling edge of the pulse signal has arrived, it outputs an input signal to the LED driver chip to be tested until the last input signal is input to the LED driver chip to be tested.

[0067] For example, an LED driver chip under test with an 11-bit current needs to be tested with 2048 test vectors. The control unit 201 receives a change command signal, identifies the rising edge or falling edge of the pulse signal in the change command signal, and sends an input signal corresponding to a test vector to the LED driver chip under test with the 11-bit current, until all the input signals corresponding to the 2048 test vectors are sent.

[0068] In implementation, an initial input signal can be pre-stored in the control unit, and the initial input signal can include a current value and a voltage value. When the control unit 201 receives a change command signal, upon identifying a rising edge or a falling edge of a pulse signal in the change command signal, the initial input signal is sent as an input signal to the LED driver chip 202. Upon identifying a second rising edge or a second falling edge of the pulse signal, the control unit generates a next input signal based on the initial input signal. For example, the current value in the initial input signal is added to a preset current value to obtain a target current value. The target current value and the voltage value in the initial input signal are combined to form a next input signal. The control unit inputs the next input signal to the LED driver chip 202 to be tested, and so on, until the last input signal is input to the LED driver chip to be tested.

[0069] For example, an 11-bit current LED driver chip to be tested needs to be tested with 2048 test vectors. The preset current a1 and the current value A1 in the initial input signal are stored in the control unit 201 in advance. When the control unit 201 receives the change command signal, upon identifying the rising edge or falling edge of the pulse signal in the change command signal, the control unit sends the initial input signal as an input signal to the 11-bit current LED driver chip to be tested, wherein the initial input signal includes the current value A1. Upon identifying the second rising edge of the pulse signal, the control unit 201 compares A1 with the preset current a1. The sum A1+a1 of A1+a1 and the preset current a1 is used as the current value in the input signal, and the input signal including the current value A1+a1 is sent as the second input signal to the 11-bit LED driver chip to be tested; when the third rising edge of the pulse signal is identified, the control unit 201 uses the sum A1+a1+a1 of A1+a1 and the preset current a1 as the current value in the input signal, and sends the input signal including the current value A1+a1+a1 as the third input signal to the 11-bit current LED driver chip to be tested… until the 2048th input signal is input to the 11-bit LED driver chip to be tested.

[0070] It should be noted that when the preset current is a positive number, the current value of the input signal increases sequentially; when the preset current is a negative number, the current value of the input signal decreases sequentially.

[0071] In another embodiment, the control unit generates a next input signal based on the initial input signal, for example, the voltage value in the initial input signal is added to the preset voltage value to obtain a target voltage value, and the target voltage value and the current value in the initial input signal are combined to form the next input signal, and the control unit inputs the next input signal to the LED driver chip 202 to be tested, and so on, until the last input signal is input to the LED driver chip to be tested.

[0072] For example, an 11-bit current LED driver chip to be tested needs to be tested with 2048 test vectors. The preset voltage value b1 and the voltage value B1 in the initial input signal are stored in the control unit 201 in advance. When the control unit 201 receives the change command signal, it identifies the first rising edge of the pulse signal in the change command signal, and sends the initial input signal as an input signal to the 11-bit current LED driver chip to be tested, wherein the initial input signal includes the voltage value B1. When the second rising edge of the pulse signal is identified, the control unit 201 adds the sum of B1 and the preset voltage value b1. The control unit 201 uses the value B1+b1+b1 as the voltage value in the input signal, and sends the input signal including the voltage value B1+b1 as the second input signal to the 11-bit LED driver chip to be tested; when the third rising edge of the pulse signal is identified, the control unit 201 uses the sum B1+b1+b1 of B1+b1 and the preset voltage value b1 as the voltage value in the input signal, and sends the input signal including the voltage value B1+b1+b1 as the third input signal to the 11-bit current LED driver chip to be tested… until the 2048th input signal is input to the 11-bit LED driver chip to be tested.

[0073] It should be noted that when the preset voltage value is a positive number, the voltage value of the input signal increases sequentially; when the preset voltage value is a negative number, the voltage value of the input signal decreases sequentially.

[0074] In addition, when the control unit receives the change command signal and identifies that the pulse signal in the change command signal is a rising edge or a falling edge, and provides an input signal to the LED driver chip to be tested, the control unit enters an interrupt until the LED driver chip to be tested completes the test, the control unit stops the interrupt, and identifies that the next pulse signal in the change command signal is a rising edge or a falling edge, and provides an input signal to the LED driver chip to be tested.

[0075] The control unit enters an interruption to avoid interference with the test of the LED driver chip to be tested, thereby improving the test accuracy of the LED driver chip to be tested.

[0076] In one embodiment, if Figure 4 As shown, the testing device provided in the embodiment of the present application further includes a processing unit 401;

[0077] After receiving the test data sent by the LED driver chip 202 to be tested, the ATE sends the test data to the processing unit 201;

[0078] After receiving the test data sent by the ATE, the processing unit 201 screens the test data to obtain target test data, wherein the target test data includes part or all of the following: current value in the test data, voltage value in the test data, delay time in the test data, and logic signal in the test data;

[0079] The ATE receives the target test data sent by the processing unit 201 , and after the test is completed, determines whether the function of the LED driver chip to be tested meets a preset standard based on the received target test data.

[0080] In an embodiment of the present application, the processing unit 401 selects a large amount of test data received to obtain target test data, wherein the target test data includes part or all of the following: current value in the test data, voltage value in the test data, delay time in the test data, and logic signal in the test data. In a specific implementation, the test data may include test time, test equipment model, test data value, etc., and the test data value includes current value, voltage value, delay time, and logic signal.

[0081] Specifically, after receiving a large amount of test data, the processing unit 401 extracts the test data based on a preset data format, and then arranges the extracted data to obtain target test data.

[0082] In a specific implementation, the preset data format includes a preset data identifier (such as a data number, a data type code), a preset data symbol (such as a space, a letter, etc.), a preset data length, etc.

[0083] like Figure 5 FIG. 1 is a schematic diagram of a current value extraction method provided in an embodiment of the present application. Figure 5 The data extracted from the test data all include the letter "e", that is, when extracting data from a large amount of test data, the data string with the letter "e" is extracted.

[0084] When testing the current accuracy of the LED driver chip to be tested, the processing unit 401 selects the current value from the test data as the target test data.

[0085] In addition, when testing the voltage accuracy of the LED driver chip to be tested, the processing unit 401 selects the voltage value from the test data as the target test data.

[0086] When testing the delay time accuracy of the LED driver chip to be tested, the processing unit 401 selects the delay time from the test data as the target test data;

[0087] When testing the logic signal accuracy of the LED driver chip to be tested, the processing unit 401 selects the logic signal from the test data as the target test data, wherein the logic signal can be a binary value corresponding to the input signal.

[0088] After the test is completed, the ATE determines whether the function of the LED driver chip to be tested meets the preset standard based on the received target test data. Specifically, if the target test data includes a current value, the ATE compares the received current value with the current threshold range corresponding to the preset gear. If the received current value is within the current threshold range, it is determined that the function of the LED driver chip to be tested meets the preset standard. Otherwise, it is determined that the function of the LED driver chip to be tested does not meet the preset standard.

[0089] For example, the target test data includes 500 current values. When ATE receives the 1st to 4th current values, it performs a test through the current threshold range I1 corresponding to the first preset gear, that is, the received 1st current value, the 2nd current value, the 3rd current value, and the 4th current value are compared with the current threshold range I1 in turn, where I1 can be 0 to 200 μA; when ATE receives the 5th to 34th current values, it performs a test through the current threshold range I2 corresponding to the second preset gear, that is, the received current values ​​are compared with the current threshold range I2 in turn. , where I2 can be 201μA~2mA; when ATE receives the 35th current value to the 234th current value, it is tested through the current threshold range I3 corresponding to the third preset gear, that is, the received current value is compared with the current threshold range I3 in sequence, where I3 can be 3mA~25mA; when ATE receives the 235th current value to the 500th current value, it is tested through the current threshold range I4 corresponding to the fourth preset gear, that is, the received current value is compared with the current threshold range I4 in sequence, where I4 can be 26mA~~50mA. When the current values ​​received by ATE are all within the current threshold range corresponding to the preset gear, it is determined that the function of the LED driver chip to be tested meets the preset standard, otherwise, it is determined that the function of the LED driver chip to be tested does not meet the preset standard.

[0090] If the target test data includes a voltage value, the ATE compares the received voltage value with the voltage threshold range corresponding to the preset gear position. If the received voltage value is within the voltage threshold range, it is determined that the function of the LED driver chip to be tested meets the preset standard. Otherwise, it is determined that the function of the LED driver chip to be tested does not meet the preset standard.

[0091] For example, the target test data includes 400 voltage values. When ATE receives the 1st to 50th voltage values, it tests through the voltage threshold range V1 corresponding to the first preset gear, that is, the received voltage values ​​are compared with the voltage threshold range V1 in sequence, where V1 can be 0 to 500 μv; when ATE receives the 51st to 150th voltage values, it tests through the voltage threshold range V2 corresponding to the second preset gear, that is, the received voltage values ​​are compared with the voltage threshold range V2 in sequence, where V2 can be 501 μv to 2 mv; when ATE receives the 151st to 400th voltage values, it tests through the voltage threshold range V3 corresponding to the third preset gear, that is, the received voltage values ​​are compared with the voltage threshold range V3 in sequence, where I3 can be 3 mv to 50 mv. When ATE receives all the received voltage values ​​within the voltage threshold range corresponding to the preset gear, it is determined that the function of the LED driver chip to be tested meets the preset standard; otherwise, it is determined that the function of the LED driver chip to be tested does not meet the preset standard.

[0092] If the target test data includes a delay time, the ATE compares the received delay time with a delay time threshold range corresponding to a preset gear position, and if the received delay time is within the delay time threshold range, it is determined that the function of the LED driver chip to be tested meets the preset standard, otherwise, it is determined that the function of the LED driver chip to be tested does not meet the preset standard;

[0093] For example, the target test data includes 400 delay times. When ATE receives the 1st to 100th delay times, it performs a test through the delay time T1 corresponding to the first preset gear, that is, the received delay time is compared with the delay time threshold range T1 in sequence, where T1 can be 0 to 10ms; when ATE receives the 101st to 200th delay times, it performs a test through the delay time threshold range T2 corresponding to the second preset gear, that is, the received delay time is compared with the delay time threshold range T2 in sequence, where T2 can be 11ms. ~30ms; when ATE receives the 201st delay time to the 300th delay time, it is tested through the delay time threshold range T3 corresponding to the third preset gear, that is, the received delay time is compared with the delay time threshold range T3 in sequence, where T3 can be 31ms~50ms; when ATE receives the 301st delay time to the 500th delay time, it is tested through the delay time threshold range T4 corresponding to the fourth preset gear, that is, the received delay time is compared with the delay time threshold range T4 in sequence, where T4 can be 51ms~70ms. When the delay time received by ATE is within the delay time threshold range, it is determined that the function of the LED driver chip to be tested meets the preset standard, otherwise, it is determined that the function of the LED driver chip to be tested does not meet the preset standard.

[0094] If the target test data includes a logic signal, the ATE compares the frequency of the received logic signal with the frequency threshold range corresponding to the preset gear. If the frequency of the received logic signal is within the frequency threshold range, it is determined that the function of the LED driver chip to be tested meets the preset standard. Otherwise, it is determined that the function of the LED driver chip to be tested does not meet the preset standard.

[0095] For example, the target test data includes 200 logic signals. When ATE receives the 1st to 50th logic signals, it performs a test through the frequency threshold range F1 corresponding to the first preset gear, that is, the frequency of the received logic signal is compared with the frequency threshold range F1 in sequence, where F1 can be 0 to 10 Hz; when ATE receives the 51st to 100th logic signals, it performs a test through the frequency threshold range F2 corresponding to the second preset gear, that is, the frequency of the received logic signal is compared with the frequency threshold range F2 in sequence, where F2 can be 11 Hz~20Hz; when ATE receives the 101st logic signal to the 150th logic signal, it is tested through the frequency threshold range F3 corresponding to the third preset gear, that is, the frequency of the received logic signal is compared with the frequency threshold range F3 in sequence, where F3 can be 21Hz~30Hz; when ATE receives the 151st logic signal to the 200th logic signal, it is tested through the frequency threshold range F4 corresponding to the fourth preset gear, that is, the frequency of the received logic signal is compared with the frequency threshold range F4 in sequence, where F4 can be 31Hz~40Hz. When the frequency of the logic signal received by ATE is within the frequency threshold range, it is determined that the function of the LED driver chip to be tested meets the preset standard, otherwise, it is determined that the function of the LED driver chip to be tested does not meet the preset standard.

[0096] In addition, after the ATE determines whether the function of the LED driver chip to be tested meets the preset standard based on the received target test data, the ATE is powered off and reset to improve the judgment accuracy of the ATE.

[0097] It should be noted that the above is only an example, and other methods of testing whether the function of the LED driver chip to be tested meets the preset standard are also applicable to the embodiments of the present application.

[0098] In one embodiment, if Figure 6 As shown, a test board 601 is also included;

[0099] The test board 601 is used to carry the LED driver chip 202 to be tested and provide a working circuit for the LED driver chip to be tested.

[0100] In a specific implementation, the working circuit includes a working environment peripheral circuit, specifically including capacitors, resistors, relays, crystal oscillators and other devices, which are used to simulate the working environment of the LED driver chip and improve the test accuracy.

[0101] It should be noted that ATE can also be used to provide power supply voltage for the LED driver chip 202 to be tested and the test board 601 .

[0102] Based on the same technical concept, the embodiment of the present application also provides a testing method for an LED driver chip. The principle of solving the problem by the testing method for the LED driver chip is similar to the principle of the testing device for the above-mentioned LED driver chip. Therefore, the implementation of the testing method for the LED driver chip can refer to the implementation of the testing device for the LED driver chip, and the repeated parts will not be repeated.

[0103] like Figure 7 FIG. 1 is a flow chart of a method for testing an LED driver chip provided in an embodiment of the present application, the method comprising:

[0104] S601, sending a change instruction signal to the control unit through the automatic test equipment ATE;

[0105] S602, after receiving the change command signal, the control unit sequentially provides different input signals to the LED driver chip to be tested;

[0106] S603, receiving test data sent by the LED driver chip to be tested through ATE, and after the test is completed, judging whether the function of the LED driver chip meets the preset standard based on the received test data;

[0107] Wherein, after receiving an input signal each time, the LED driver chip to be tested outputs test data based on the received input signal; the input signal is a test vector corresponding to the number of bits of the current that can be driven by the LED driver chip to be tested.

[0108] The test method for the LED driver chip provided in the embodiment of the present invention sends a change command signal to the control unit through ATE, and the control unit sequentially provides different input signals to the LED driver chip to be tested based on the change command signal. The input signal is a test vector corresponding to the number of bits of the current that can be determined by the LED driver chip to be tested. The control unit can provide input signals corresponding to all the test vectors, thereby making the test result of the LED driver chip more accurate.

[0109] In some implementations, the method includes:

[0110] After receiving the test data sent by the LED driver chip to be tested, sending the test data to the processing unit through the ATE;

[0111] Receiving the test data sent by the ATE through the processing unit, and screening the test data to obtain target test data, wherein the target test data includes part or all of the following: a current value in the test data, a voltage value in the test data, a delay time in the test data, and a logic signal in the test data;

[0112] The target test data sent by the processing unit is received by the ATE, and after the test is completed, it is determined whether the function of the LED driver chip meets the preset standard based on the received target test data.

[0113] In some implementations, the method includes:

[0114] Based on the received change instruction signal, the control unit sequentially provides the LED driver chip to be tested with input signals arranged in sequence;

[0115] Among them, the input signals arranged in sequence include the current values ​​included in the input signals increasing in sequence, or the voltage values ​​included in the input signals increasing in sequence, or the current values ​​included in the input signals decreasing in sequence, or the voltage values ​​included in the input signals decreasing in sequence.

[0116] In some implementations, the change instruction signal includes a pulse signal.

[0117] In some implementations, the method includes:

[0118] receiving the change command signal, and when recognizing that the pulse signal in the change command signal is a rising edge, providing different input signals to the LED driver chip to be tested through the control unit; or

[0119] The change command signal is received, and when it is identified that the pulse signal in the change command signal is a falling edge, different input signals are provided to the LED driver chip to be tested through the control unit.

[0120] In some implementations, the method further comprises:

[0121] The LED driver chip to be tested is carried by a test board, and a working circuit is provided for the LED driver chip to be tested by the test board.

[0122] like Figure 8 FIG. 1 is a complete flow chart of a method for testing an LED driver chip provided in an embodiment of the present application, which specifically includes the following steps:

[0123] S701, sending a change instruction signal to the control unit through ATE;

[0124] S702, providing different input signals to the LED driver chip to be tested in sequence based on the received change command signal by the control unit;

[0125] S703, outputting test data to ATE based on each input signal received by the LED driver chip under test;

[0126] S704, receiving the test data sent by the LED driver chip to be tested through ATE, and sending the test data to the processing unit;

[0127] S705, receiving the test data sent by the ATE through the processing unit, and screening the test data to obtain target test data;

[0128] S706 , receiving the target test data sent by the processing unit through ATE, and after the test is completed, judging whether the function of the LED driver chip meets the preset standard based on the received target test data.

[0129] The embodiment of the present invention provides a testing device and method for an LED driver chip, the testing device comprising an ATE and a control unit: the ATE is used to receive test data sent by the LED driver chip to be tested after sending a change command signal to the control unit, and after the test is completed, based on the received test data, determine whether the function of the LED driver chip meets the preset standard; the control unit is used to sequentially provide different input signals to the LED driver chip to be tested based on the received change command signal; wherein the LED driver chip to be tested outputs test data after each input signal is received; the input signal is a test vector corresponding to the number of bits of the current that the LED driver chip to be tested can drive. Since the change command signal is sent to the control unit by the ATE in the present application, the control unit sequentially provides different input signals to the LED driver chip to be tested based on the change command signal, and the input signal is a test vector corresponding to the number of bits of the current that the LED driver chip to be tested can determine, and the control unit can provide input signals corresponding to all the test vectors, so that the test result of the LED driver chip is more accurate.

[0130] The present application is described above with reference to the block diagrams and / or flow charts showing the methods, devices (systems) and / or computer program products according to the embodiments of the present application. It should be understood that a block of the block diagram and / or flow chart diagram and a combination of blocks of the block diagram and / or flow chart diagram can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer and / or other programmable data processing device to produce a machine, so that the instructions executed by the computer processor and / or other programmable data processing device create a method for implementing the functions / actions specified in the block diagram and / or flow chart block.

[0131] Accordingly, the present application may also be implemented with hardware and / or software (including firmware, resident software, microcode, etc.). Furthermore, the present application may take the form of a computer program product on a computer-usable or computer-readable storage medium, which has a computer-usable or computer-readable program code implemented in the medium, for use by an instruction execution system or in conjunction with an instruction execution system. In the context of the present application, a computer-usable or computer-readable medium may be any medium that may contain, store, communicate, transmit, or convey a program for use by an instruction execution system, device, or apparatus, or in conjunction with an instruction execution system, device, or apparatus.

[0132] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.

Claims

1. A testing device for an LED driver chip, characterized in that: Including automatic test equipment ATE and control unit: The ATE is used to receive test data sent by the LED driver chip to be tested after sending a change instruction signal to the control unit, and after the test is completed, determine whether the function of the LED driver chip to be tested meets a preset standard based on the received test data; The control unit is used to provide different input signals arranged in sequence to the LED driver chip to be tested based on the received change instruction signal; Wherein, the LED driver chip to be tested outputs test data based on the received input signal each time after receiving the input signal; the different input signals arranged in sequence are all test vectors corresponding to the number of bits of the current that the LED driver chip to be tested can drive.

2. The testing device according to claim 1, characterized in that: Also includes a processing unit; After receiving the test data sent by the LED driver chip to be tested, the ATE is further used to: send the test data to the processing unit, and receive target test data sent by the processing unit, and after the test is completed, determine whether the function of the LED driver chip meets the preset standard based on the received target test data; The processing unit is used to receive the test data sent by the ATE and filter the test data to obtain the target test data, wherein the target test data includes part or all of the following: the current value in the test data, the voltage value in the test data, the delay time in the test data, and the logic signal in the test data.

3. The testing device according to claim 1, characterized in that: The sequentially arranged input signals include the current values ​​included in the input signals increasing in sequence, or the voltage values ​​included in the input signals increasing in sequence, or the current values ​​included in the input signals decreasing in sequence, or the voltage values ​​included in the input signals decreasing in sequence.

4. The testing device according to claim 1, characterized in that: The change instruction signal includes a pulse signal.

5. The testing device according to claim 4, characterized in that: The control unit is specifically used for: receiving the change command signal, and providing a different input signal to the LED driver chip to be tested when recognizing that the pulse signal in the change command signal is a rising edge; or The change command signal is received, and when it is identified that the pulse signal in the change command signal is a falling edge, a different input signal is provided to the LED driver chip to be tested.

6. The testing device according to any one of claims 1 to 5, characterized in that: Also included is a test board; The test board is used to carry the LED driver chip to be tested and provide a working circuit for the LED driver chip to be tested.

7. A method for testing an LED driver chip, characterized in that: The method comprises: Sending a change command signal to the control unit via automatic test equipment ATE; After receiving the change command signal, the control unit provides different input signals arranged in sequence to the LED driver chip to be tested; Receiving test data sent by the LED driver chip to be tested through the ATE, and after the test is completed, judging whether the function of the LED driver chip to be tested meets a preset standard based on the received test data; Wherein, the LED driver chip to be tested outputs test data based on the received input signal each time after receiving the input signal; the different input signals arranged in sequence are all test vectors corresponding to the number of bits of the current that the LED driver chip to be tested can drive.

8. The method according to claim 7, characterized in that The method further comprises: After receiving the test data sent by the LED driver chip to be tested, sending the test data to the processing unit through the ATE; Receiving the test data sent by the ATE through the processing unit, and screening the test data to obtain target test data, wherein the target test data includes part or all of the following: a current value in the test data, a voltage value in the test data, a delay time in the test data, and a logic signal in the test data; The target test data sent by the processing unit is received by the ATE, and after the test is completed, it is determined whether the function of the LED driver chip meets the preset standard based on the received target test data.

9. The method according to claim 7, characterized in that The sequentially arranged input signals include input signals in which current values ​​are sequentially increased, or input signals in which voltage values ​​are sequentially increased, or input signals in which current values ​​are sequentially decreased, or input signals in which voltage values ​​are sequentially decreased.

10. The method according to claim 7, characterized in that The change instruction signal includes a pulse signal.

11. The method according to claim 10, characterized in that The method comprises: receiving the change command signal, and when recognizing that the pulse signal in the change command signal is a rising edge, providing different input signals to the LED driver chip to be tested through the control unit; or The change command signal is received, and when it is identified that the pulse signal in the change command signal is a falling edge, different input signals are provided to the LED driver chip to be tested through the control unit.

12. The method according to any one of claims 7 to 11, characterized in that: The method further comprises: The LED driver chip to be tested is carried by a test board, and a working circuit is provided for the LED driver chip to be tested by the test board.

Images