A chip batch automated testing system based on data analysis

Abstract

The present invention relates to the technical field of chip batch detection, and specifically to a chip batch automatic testing system based on data analysis, comprising an operating table, the top of the operating table is movably connected with an annular turntable through a bearing, the side walls of the operating table are fixedly connected with multiple groups of racks 1 and multiple groups of racks 2 through bolts, the top of the rack 1 is symmetrically fixedly connected with a slide rail 1, a slide plate 1 is arranged between the two slide rails 1, both ends of the slide plate 1 are slidably connected in the correspondingly arranged slide rail 1, the bottom of the slide plate 1 is symmetrically fixedly connected with an electric push rod 1, the bottom end of the electric push rod 1 is fixedly connected with a cross plate, a separating and combining component is arranged on the top of the cross plate, the separating and combining component comprises a push plate, the push plate is arranged on the top of the cross plate, and the side walls of the cross plate are fixedly connected with a support plate. Compared with the prior art, the present invention expands the chip spacing in advance to eliminate the problem that the contact between the test equipment and the adjacent chip pins affects the detection structure.

Description

Technical Field

[0001] The present invention relates to the technical field of chip batch detection, and in particular to a chip batch automatic testing system based on data analysis. Background Art

[0002] Integrated circuits are a way of miniaturizing circuits. Using a certain process, the transistors, resistors, capacitors, inductors and other components and wiring required in a circuit are interconnected and made on a small piece or several small pieces of semiconductor chips or dielectric substrates. They are then packaged in a tube shell to become a miniature structure with the required circuit function. All the components in it have formed a whole in structure, making a major step forward in the direction of miniaturization, low power consumption, intelligence and high reliability of electronic components.

[0003] After the chip is produced, it needs to undergo a rigorous testing procedure to ensure its quality and performance. Due to the large scale of modern chip production, a single one-by-one testing method can no longer meet the needs of large-scale production. Therefore, in order to improve production efficiency and ensure product quality, automated testing equipment is often used to perform batch testing of chips. In the actual testing process, due to the dense arrangement and small spacing between chips, the chips are prone to slight displacement during the test, which may cause contact between the test equipment and adjacent chip pins, causing problems such as false triggering or short circuits, thereby affecting the accuracy of the test results.

[0004] In view of the above technical defects, a solution is now proposed. Summary of the invention

[0005] The purpose of the present invention is to provide a chip batch automated testing system based on data analysis, which is used to solve the problem that automated testing equipment is used for batch testing in chip production, but slight displacement between chips may cause the testing equipment to contact with adjacent chip pins, affecting the accuracy of the test results.

[0006] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: a chip batch automatic testing system based on data analysis, comprising an operating table, the top of the operating table is movably connected to a ring-shaped turntable through a bearing, the side walls of the operating table are fixedly connected to multiple groups of racks 1 and multiple groups of racks 2 through bolts, the top of the rack 1 is symmetrically fixedly connected to a slide rail 1, a slide plate 1 is arranged between the two slide rails 1, both ends of the slide plate 1 are slidably connected to the corresponding slide rail 1, the bottom of the slide plate 1 is symmetrically fixedly connected to an electric push rod 1, the bottom end of the electric push rod 1 is fixedly connected to a cross plate, and the top of the cross plate is provided with a separating and combining material assembly.

[0007] Further, the material separation and combination assembly includes a push plate, the push plate is arranged on the top of the horizontal plate, the side wall of the horizontal plate is fixedly connected to a support plate, the top of the support plate is fixedly connected to a second electric push rod, the output end of the second electric push rod is fixedly connected to the side wall of the push plate, the other side wall of the push plate is fixedly connected to multiple groups of limit rods, the side wall of the limit rod is fixedly connected to a first limit inclined block, and the side wall of the limit rod is fixedly connected to a second limit inclined block through a connecting frame;

[0008] A plurality of slide grooves are provided on the top of the transverse plate, the top of the transverse plate is fixedly connected to a limiting frame, a guide rod is slidably connected inside the limiting frame, the cross-section of the guide rod is rectangular, one end of the guide rod is fixedly connected to a limiting inclined block three, and the limiting inclined block three cooperates with the limiting inclined block one and the limiting inclined block two.

[0009] Furthermore, an inclined slot is provided on the top of the limiting inclined block three, a connecting rod is fixedly connected to the top of the limiting inclined block one, a slider is slidably connected in the inclined slot, and one end of the connecting rod is fixedly connected to the slider.

[0010] Furthermore, a sliding seat is provided at the bottom of the transverse plate, and a pneumatic suction cup is provided at the bottom of the sliding seat.

[0011] Furthermore, a slide rail 2 is fixedly connected to the top of the frame 2, a slide plate 2 is arranged between the two slide rails 2, both ends of the slide plate 2 are slidably connected in the corresponding slide rails 2, and a positioning component is arranged at the bottom of the slide plate 2.

[0012] Furthermore, the alignment assembly includes two electric push rods three and a lower moving plate, the electric push rods three are symmetrically fixedly connected to the bottom of the slide plate two, and the lower moving plate is fixedly connected to the bottom of the electric push rod three.

[0013] Furthermore, the calibration assembly also includes multiple groups of rotating frames one and multiple groups of rotating frames two, multiple groups of mounting grooves are opened on the top of the lower moving plate, the rotating frame one and the rotating frame two are respectively rotatably connected in the mounting grooves opened on the top of the lower moving plate, driving grooves are opened on the outer sides of the rotating frame one and the rotating frame two, the bottom of the slide plate two is fixedly connected to multiple groups of driving frames matching the rotating frame one and the rotating frame two, the bottom end of the driving frame is fixedly connected to a driving block, and the driving block is slidably connected in the driving groove, the side wall of the frame one is fixedly installed with a control panel, and the top of the operating table is fixedly installed with a detection mechanism.

[0014] The present invention also proposes a chip batch automated testing method based on data analysis, comprising the following steps:

[0015] Step 1: Slide plate 1 slides to the top close to the chip position, and the pneumatic suction cup contacts the upper surface of the chip under the action of electric push rod 1 and synchronously adsorbs and fixes the chip, and then the batch of chips is transferred to the top of the circular turntable, and then the electric push rod 2 is started. The electric push rod 2 drives the limiting inclined block 1 to move synchronously through the push plate and the limiting rod, and the connecting frame rod slides in the inclined slide groove through the slider. During the movement, the limiting inclined block 1 drives the guide rod to slide in the limiting frame through the limiting inclined block 3, and then the distance between adjacent chips is further expanded through the sliding seat and the pneumatic suction cup, and then the pneumatic suction cup descends and places the chip with the adjusted distance on the top of the circular turntable;

[0016] Step 2: The circular turntable drives the chip with the expanded spacing to be transported. When the chip is transported to the bottom of the slide plate 2, the electric push rod 3 drives the lower plate to descend synchronously, thereby driving the rotating frame 1 and the rotating frame 2 to deflect synchronously. The rotating frame 1 and the rotating frame 2 are in contact with the chip around and further adjust the position of the chip synchronously.

[0017] Step 3: The testing organization collects and tests data on the current batch of chips, and performs data analysis and comparison based on the test result threshold to determine whether the chip is abnormal. When the chip is detected to be normal, the limiting bevel block 2 in the next separation and combination component will contact the limiting bevel block 3, thereby reducing the spacing between the tested chips to facilitate their centralized transportation. The chips are then taken out from the top of the ring turntable to facilitate efficient testing of the next batch of chips.

[0018] Compared with the prior art, the present invention has the following beneficial effects:

[0019] When the present invention is in use, a limiting bevel block 1, a limiting bevel block 2 and a limiting bevel block 3 with different angles of the bevel edges are arranged on the top of the horizontal plate, and the limiting bevel block 3 contacts the limiting bevel block 1 and the limiting bevel block 2 respectively, and then cooperates with the pneumatic suction cup to conveniently adsorb the chip, so that the chips that originally had a very small adjacent spacing are unfolded, that is, the spacing between adjacent chips is expanded, thereby eliminating the problem that the contact between the test equipment and the adjacent chip pins affects the detection structure, and then cooperates with the calibration component, and multiple groups of mounting grooves are opened on the top of the lower moving plate, and the rotating frame 1 and the rotating frame 2 are respectively in contact with the outside of the chip, and the driving block on the side wall of the driving frame cooperates with the driving groove, so that the rotating frame 1 and the rotating frame 2 rotate synchronously and drive the chip to perform position calibration, and multi-channel parallel chip absorption and synchronous position calibration are adopted to improve the test coverage and efficiency, thereby accelerating the test speed and improving production efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to facilitate understanding by those skilled in the art, the present invention is further described below in conjunction with the accompanying drawings;

[0021] Figure 1 It is a three-dimensional diagram of the structure of the material separation and combination component of the present invention;

[0022] Figure 2 It is a top view of the overall structure of the present invention;

[0023] Figure 3 for Figure 1 Schematic diagram of the enlarged structure of region A;

[0024] Figure 4 It is a structural schematic diagram of the rotating frame 1 and the rotating frame 2 of the present invention;

[0025] Figure 5 It is a schematic diagram of the structure of the downward moving plate in the present invention;

[0026] Figure 6 It is a schematic diagram of the structure of the calibration component in the present invention.

[0027] Figure numerals: 1, operating table; 2, circular turntable; 301, frame 1; 302, frame 2; 4, slide rail 1; 5, slide plate 1; 6, electric push rod 1; 7, cross plate; 8, material separation and combination assembly; 801, push plate; 802, support plate; 803, limit rod; 804, limit inclined block 1; 805, limit inclined block 2; 806, limit frame; 807, guide rod; 808, limit inclined block 3; 9, electric Push rod two; 10. Inclined slide groove; 11. Connecting frame rod; 12. Sliding seat; 13. Pneumatic suction cup; 14. Slide rail two; 15. Slide plate two; 16. Control panel; 17. Detection mechanism; 18. Calibration assembly; 181. Electric push rod three; 182. Lowering plate; 183. Rotating frame one; 184. Rotating frame two; 185. Drive groove; 186. Drive frame; 187. Drive block; 19. Mounting groove. DETAILED DESCRIPTION

[0028] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0029] Embodiment 1: Figure 1-Figure 6As shown, a chip batch automatic testing system based on data analysis includes an operating table 1, the top of the operating table 1 is movably connected to a ring-shaped turntable 2 through a bearing, the side wall of the operating table 1 is fixedly connected to multiple sets of racks 1 301 and multiple sets of racks 2 302 through bolts, the top of the rack 1 301 is symmetrically fixedly connected to a slide rail 1 4, a slide plate 1 5 is arranged between the two slide rails 1 4, both ends of the slide plate 1 5 are slidably connected to the correspondingly arranged slide rails 1 4, the bottom of the slide plate 1 5 is symmetrically fixedly connected to an electric push rod 1 6, and the bottom end of the electric push rod 1 6 is fixedly connected to a cross plate 7;

[0030] A control panel 16 is fixedly installed on the side wall of the rack 301, and a detection mechanism 17 is fixedly installed on the top of the operating table 1. It should be noted here that the detection mechanism 17 is an existing mechanism, and its function is to test the chip performance. A separation and combination component 8 is arranged on the top of the horizontal plate 7.

[0031] The material separation and combination assembly 8 includes a push plate 801, which is arranged on the top of the horizontal plate 7, and a support plate 802 is fixedly connected to the side wall of the horizontal plate 7, and an electric push rod 2 9 is fixedly connected to the top of the support plate 802, and the output end of the electric push rod 2 9 is fixedly connected to the side wall of the push plate 801, and the other side wall of the push plate 801 is fixedly connected to multiple groups of limit rods 803, and the side wall of the limit rod 803 is fixedly connected to the limit inclined block 1 804, and the side wall of the limit rod 803 is fixedly connected to the limit inclined block 2 805 through a connecting frame;

[0032] A plurality of slide grooves are provided on the top of the transverse plate 7, and a limiting frame 806 is fixedly connected to the top of the transverse plate 7, and a guide rod 807 is slidably connected inside the limiting frame 806. The cross section of the guide rod 807 is rectangular, and one end of the guide rod 807 is fixedly connected to a limiting inclined block three 808, and the limiting inclined block three 808 cooperates with the limiting inclined block one 804 and the limiting inclined block two 805. An inclined slide groove 10 is provided on the top of the limiting inclined block three 808, and a connecting frame rod 11 is fixedly connected to the top of the limiting inclined block one 804, and a slider is slidably connected inside the inclined slide groove 10, and one end of the connecting frame rod 11 is fixedly connected to the slider, and a sliding seat 12 is provided at the bottom of the transverse plate 7, and the sliding seat 12 is fixedly connected to the bottom of the guide rod 807, and a pneumatic suction cup 13 is provided at the bottom of the sliding seat 12.

[0033] When setting specific Figure 2 As shown, a motor is fixedly installed on one side of the slide rail 1 4 and the slide rail 2 14, and the inner walls of the slide rail 1 4 and the slide rail 2 14 are movably connected with a threaded rod through a bearing, and the motor is used to drive the threaded rod to rotate, and the other end of the threaded rod is fixedly connected with a sprocket, and the two correspondingly arranged sprockets are connected by a chain, and then when the motor drives the corresponding threaded rod to rotate, the corresponding slide plate 1 5 and the slide plate 2 15 slide;

[0034] First, a batch of chips are placed on the top of the carrier, which is set on one side of the circular turntable 2. The slide plate 5 realizes directional sliding under the action of the corresponding threaded rod until it slides to the top close to the chip position, and then the electric push rod 6 is started, and the electric push rod 6 drives the cross plate 7 to descend until the pneumatic suction cup 13 contacts the upper surface of the chip and synchronously adsorbs and fixes the chip. The electric push rod 6 drives the chip to rise synchronously through the pneumatic suction cup 13 and transfers it to the top of the circular turntable 2 in a centralized manner;

[0035] Then, the electric push rod 2 9 is started again, and the electric push rod 2 9 drives the push plate 801 to move synchronously. The push plate 801 drives the limiting bevel block 1 804 to move synchronously through the limiting rod 803. During the movement, the limiting bevel block 1 804 drives the guide rod 807 to slide in the limiting frame 806 through the limiting bevel block 3 808. At the same time, the connecting frame rod 11 slides in the inclined slide groove 10 through the slider. The limiting bevel block 1 804 and the limiting bevel block 3 808 are in contact with each other through the connecting frame rod 11, so that the adjacent oblique edges of the limiting bevel block 1 804 and the limiting bevel block 3 808 are always in contact.

[0036] It should be noted here that if Figure 1 As shown, the angles of the bevels contacted by the three limit bevel blocks 1 804, the three limit bevel blocks 2 805 and the three limit bevel blocks 3 808 on one side of the top of the horizontal plate 7 are all different, and the electric push rod 2 9 is used as the center of symmetry. The three limit bevel blocks 1 804, the three limit bevel blocks 2 805 and the three limit bevel blocks 3 808 with different bevel angles are symmetrically arranged. Then, when the limit bevel block 3 808 slides, the guide rod 807 drives the sliding seat 12 and the pneumatic suction cup 13 to move synchronously, so that the chips with a small adjacent spacing are unfolded, that is, the spacing between adjacent chips is expanded, and then the pneumatic suction cup 13 descends and places the chips with adjusted spacing on the top of the annular turntable 2, so that the detection mechanism 17 can test them more conveniently.

[0037] Embodiment 2: The top of the frame 2 302 is fixedly connected with a slide rail 2 14, a slide plate 2 15 is arranged between the two slide rails 2 14, both ends of the slide plate 2 15 are slidably connected in the corresponding slide rails 2 14, and a calibration component 18 is arranged at the bottom of the slide plate 2 15, the calibration component 18 includes two electric push rods 3 181 and a lower moving plate 182, the electric push rods 3 181 are symmetrically fixedly connected to the bottom of the slide plate 2 15, and the lower moving plate 182 is fixedly connected to the bottom of the electric push rods 3 181;

[0038] The calibration assembly 18 also includes multiple groups of rotating frames 183 and multiple groups of rotating frames 184. Multiple groups of mounting grooves 19 are opened on the top of the lower plate 182. The rotating frames 183 and 184 are respectively rotatably connected in the mounting grooves 19 opened on the top of the lower plate 182. Driving grooves 185 are opened on the outer sides of the rotating frames 183 and 184. The bottom of the slide plate 2 15 is fixedly connected with multiple groups of driving frames 186 that cooperate with the rotating frames 183 and 184. The bottom of the driving frame 186 is fixedly connected with a driving block 187, and the driving block 187 is slidably connected in the driving groove 185.

[0039] Since the chip is a precision product, if the position is not placed accurately during the detection process, it is very easy to affect the detection accuracy and detection efficiency of the detection mechanism 17, so the position of the chip needs to be calibrated, and the calibration steps are as follows:

[0040] The annular turntable 2 drives the chips with expanded spacing to be transmitted. When the chips are transmitted to the bottom of the slide plate 2 15, the electric push rod 3 181 is started, and the electric push rod 3 181 drives the lower plate 182 to descend synchronously. During the descent of the lower plate 182, the driving block 187 on the side wall of the driving frame 186 cooperates with the driving groove 185, thereby driving the corresponding rotating frame 1 183 and the rotating frame 2 184 to deflect synchronously.

[0041] like Figure 5 As shown, rotating frame 183 and rotating frame 2 184 are arranged in the installation groove 19, and rotating frame 183 and rotating frame 2 184 are in contact with the chip on all sides and further synchronously adjust the position of the chip, so that it is convenient for the detection mechanism 17 to perform more efficient and accurate detection, and then the annular turntable 2 transmits the chip after position calibration to the detection mechanism 17, and the detection mechanism 17 collects and tests data of the current batch of chips, and performs data analysis and comparison according to the test result threshold, so as to determine whether the chip is abnormal. When there is no abnormality in the chip detection, the limiting bevel block 2 805 in the next separating and combining component 8 contacts the limiting bevel block 3 808, thereby reducing the spacing between the chips after detection, which is convenient for centralized transportation, and then the chip is taken out from the top of the annular turntable 2, so as to facilitate efficient detection of the next batch of chips.

[0042] The above contents are merely examples and explanations of the structure of the present invention. The technicians in this technical field may make various modifications or additions to the specific embodiments described or replace them in a similar manner. As long as they do not deviate from the structure of the invention or exceed the scope defined by the claims, they should all fall within the protection scope of the present invention.

[0043] In the description of this specification, the description with reference to the terms "one embodiment", "example", "specific example", etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner.

[0044] The preferred embodiments of the present invention disclosed above are only used to help explain the present invention. The preferred embodiments do not describe all the details in detail, nor do they limit the invention to only specific implementation methods. Obviously, many modifications and changes can be made according to the content of this specification. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the present invention, so that those skilled in the art can understand and use the present invention well. The present invention is limited only by the claims and their full scope and equivalents.

Claims

1. A chip batch automated testing system based on data analysis, comprising an operating table (1), the top of the operating table (1) being movably connected to a ring-shaped turntable (2) via a bearing, characterized in that: The side wall of the operating table (1) is fixedly connected with a plurality of racks (301) by bolts, the top of the rack (301) is symmetrically fixedly connected with a slide rail (4), a slide plate (5) is arranged between the two slide rails (4), both ends of the slide plate (5) are slidably connected in the corresponding slide rails (4), the bottom of the slide plate (5) is symmetrically fixedly connected with an electric push rod (6), the bottom end of the electric push rod (6) is fixedly connected with a horizontal plate (7), and the top of the horizontal plate (7) is provided with a material separation and combination component (8); The material separation and combination assembly (8) comprises a push plate (801), wherein the push plate (801) is arranged on the top of the transverse plate (7), the side wall of the transverse plate (7) is fixedly connected to a support plate (802), the top of the support plate (802) is fixedly connected to an electric push rod 2 (9), the output end of the electric push rod 2 (9) is fixedly connected to the side wall of the push plate (801), the other side wall of the push plate (801) is fixedly connected to a plurality of groups of limit rods (803), the side wall of the limit rod (803) is fixedly connected to a limit inclined block 1 (804), and the side wall of the limit rod (803) is fixedly connected to a limit inclined block 2 (805) via a connecting frame; The top of the transverse plate (7) is provided with a plurality of inclined grooves (10); the top of the transverse plate (7) is fixedly connected to a limiting frame (806); a guide rod (807) is slidably connected inside the limiting frame (806); the cross section of the guide rod (807) is rectangular; one end of the guide rod (807) is fixedly connected to a limiting inclined block three (808); the limiting inclined block three (808) cooperates with the limiting inclined block one (804) and the limiting inclined block two (805); The top of the limiting inclined block 3 (808) is provided with an inclined slot (10), the top of the limiting inclined block 1 (804) is fixedly connected with a connecting rod (11), a sliding block is slidably connected in the inclined slot (10), and one end of the connecting rod (11) is fixedly connected to the sliding block; A sliding seat (12) is provided at the bottom of the transverse plate (7), and a pneumatic suction cup (13) is provided at the bottom of the sliding seat (12).

2. A chip batch automated testing system based on data analysis according to claim 1, characterized in that: The side wall of the operating table (1) is also fixedly connected to a plurality of sets of racks 2 (302) by bolts, the top of the racks 2 (302) is fixedly connected to a slide rail 2 (14), a slide plate 2 (15) is arranged between two slide rails 2 (14), the two ends of the slide plate 2 (15) are slidably connected in the corresponding slide rails 2 (14), and a calibration component (18) is arranged at the bottom of the slide plate 2 (15); The alignment assembly (18) comprises two electric push rods (181) and a lower moving plate (182), wherein the electric push rods (181) are symmetrically fixedly connected to the bottom of the slide plate (15), and the lower moving plate (182) is fixedly connected to the bottom of the electric push rod (181); The calibration assembly (18) further comprises a plurality of groups of rotating frames (183) and a plurality of groups of rotating frames (184). The top of the lower moving plate (182) is provided with a plurality of groups of mounting grooves (19). The rotating frames (183) and the rotating frames (184) are respectively rotatably connected in the mounting grooves (19) provided in the top of the lower moving plate (182). The outer sides of the rotating frames (183) and the rotating frames (184) are provided with driving grooves (185). The bottom of the slide plate (15) is fixedly connected with a plurality of groups of driving frames (186) matched with the rotating frames (183) and the rotating frames (184). The bottom end of the driving frames (186) is fixedly connected with a driving block (187). The driving block (187) is slidably connected in the driving groove (185). A control panel (16) is fixedly installed on the side wall of the frame (301). A detection mechanism (17) is fixedly installed on the top of the operating table (1).

3. A chip batch automated testing method based on data analysis, using a chip batch automated testing system based on data analysis as claimed in claim 2, characterized in that: The following steps are involved: Step 1: Slide plate 1 (5) slides to the top of the chip position, and the pneumatic suction cup (13) contacts the upper surface of the chip under the action of electric push rod 1 (6) and synchronously adsorbs and fixes the chip, and then the batch of chips is transferred to the top of the annular turntable (2), and then the electric push rod 2 (9) is started. The electric push rod 2 (9) drives the limiting inclined block 1 (804) to move synchronously through the push plate (801) and the limiting rod (803), and the connecting frame rod (11) slides in the inclined slide groove (10) through the slider. During the movement, the limiting inclined block 1 (804) drives the guide rod (807) to slide in the limiting frame (806) through the limiting inclined block 3 (808), and then the distance between adjacent chips is further expanded through the sliding seat (12) and the pneumatic suction cup (13). Then the pneumatic suction cup (13) descends and places the chip with the adjusted distance on the top of the annular turntable (2); Step 2: The circular turntable (2) drives the chip with the expanded spacing to be transported. When the chip is transported to the bottom of the slide plate (15), the electric push rod (181) drives the lower plate (182) to descend synchronously, thereby driving the rotating frame (183) and the rotating frame (184) to deflect synchronously. The rotating frame (183) and the rotating frame (184) are in contact with the chip on all sides and further adjust the position of the chip synchronously. Step three: The detection mechanism (17) collects and tests data on the current batch of chips, and performs data analysis and comparison according to the test result threshold to determine whether the chip is abnormal. When the chip is detected to be normal, the limiting bevel block 2 (805) in the next separation and combination component (8) contacts the limiting bevel block 3 (808), thereby reducing the spacing between the chips that have been tested, making it easier to transport them in a centralized manner. The chips are then taken out from the top of the annular turntable (2) to facilitate efficient testing of the next batch of chips.

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