An automatic detection system and method for wiring faults of switchgear

Abstract

The present invention provides an automatic detection system and method for wiring faults of switch cabinets, which relates to the technical field of switch cabinet fault detection. It includes a test module, a test source, and a collection device. By changing the current output and voltage output of the test source, wiring fault detection and positioning are carried out according to the received signals of the collection module. If a wiring fault is detected, the corresponding fault information is reported and detected. After the fault is investigated and eliminated, the detection is carried out again until all wiring faults have been investigated and eliminated, realizing the automatic detection and positioning of wiring faults of switch cabinets, improving the detection efficiency and reducing the missed detection caused by human factors at the same time.

Description

Technical Field

[0001] The present invention relates to the technical field of switch cabinet fault detection, and more specifically, to an automatic detection system and method for wiring faults of switch cabinets. Background Art

[0002] With the development of the power industry, switch cabinets of smart grids play an important role in related industries. However, the wiring joints of switch cabinets are dense and the failure rate is relatively high. If manual methods are used to check for faults one by one, not only is the detection efficiency extremely low, consuming a large amount of manpower and material resources, but it is also easy to miss detections due to personal reasons, leading to more serious potential safety hazards. Therefore, the research on automatic detection of wiring faults has become particularly crucial.

[0003] The prior art proposes a distribution automation detection system, including a distribution terminal simulation device, a fault simulation device, and an automatic detection subsystem. The distribution terminal simulation device, the fault simulation device, and the automatic detection subsystem are respectively used to connect to the distribution automation system to be tested. The distribution automation system includes a distribution master station and a plurality of distribution terminals connected to the distribution master station. The automatic detection subsystem is respectively connected to the distribution terminal simulation device, the fault simulation device, and the distribution automation system. By simulating the communication behavior data and fault status data of multiple distribution terminals, and based on the communication behavior data and fault status data, at least one of function detection, performance detection, and fault diagnosis isolation and recovery detection is performed on the distribution automation system, and detection data is output. However, in this solution, the specific functions of the acquisition device are detected, rather than the pre-factory state after the cabinet assembly wiring is completed. Currently, the overall wiring fault detection and location of switch cabinets are still topics that urgently need to be studied. Summary of the Invention

[0004] To solve the problems of low efficiency and inaccurate location in manual detection of overall wiring faults of current switch cabinets, the present invention proposes an automatic detection system and method for wiring faults of switch cabinets. By changing the current and voltage outputs of the test source, the voltage and current accuracies are automatically detected, and whether there are abnormalities in the voltage acquisition line and current acquisition line of the switch cabinet is judged and located, improving the detection efficiency and reducing missed detections caused by human factors.

[0005] To achieve the above technical effects, the technical solution of the present invention is as follows:

[0006] An automatic detection system for wiring faults of a switch cabinet includes: a test module, a test source, and an acquisition device; the test module is respectively connected to the test source and the acquisition device through serial communication, the signal output end of the test source is connected to the test point of the switch cabinet; the signal input end of the acquisition device is connected to the test points of each switch cabinet.

[0007] In this technical solution, the automatic detection system for the wiring faults of the switchgear is provided with a test source connected to the test points of the switchgear and a collection device for receiving output voltage and current signals. The test module can change the voltage and current outputs of the test source and correspondingly detect the abnormal conditions of the lines of the switchgear for real-time positioning.

[0008] Automatically detect the accuracy of voltage and current, judge whether there are abnormalities in the voltage acquisition line and the current acquisition line, judge the possible problem points of the line, and reduce the missed detection caused by human factors

[0009] Preferably, the collection device includes a distribution automation terminal device and a low-voltage circuit measurement and control terminal device.

[0010] Preferably, the test module controls the test source to output standard current and voltage signals through the serial port of the test source. The voltage signals include single-phase voltage, two-phase voltage and three-phase voltage, and the current signals include single-phase current and three-phase current; the test module receives the voltage and current obtained by the collection device through the communication port.

[0011] Preferably, the test module controls the test source to output standard current and voltage signals through the serial port of the test source. The voltage signals include single-phase voltage, two-phase voltage and three-phase voltage, and the current signals include single-phase current and three-phase current.

[0012] Preferably, the test module receives the voltage, current and power values obtained by the collection device through the communication port and controls the output of the test source through the serial port of the test source.

[0013] Preferably, the test module includes: an interaction unit, a function output unit, a power calculation unit, a data analysis unit and a fault judgment unit;

[0014] The interaction unit provides an operation interface for the user. The operation interface includes a protocol setting option, a test item option and a knowledge and experience library viewing option;

[0015] The function output unit controls the output of the test source based on the items selected in the operation interface;

[0016] The data analysis unit receives and analyzes the voltage and current obtained by the collection device;

[0017] The power calculation unit performs power calculation based on the test items and the data analysis results;

[0018] The fault judgment unit gives corresponding fault detection results and fault causes based on the existing knowledge and experience library and stores them in the knowledge and experience library.

[0019] The present invention also provides an automatic detection method for wiring faults in a switch cabinet. The test module detects and locates wiring faults according to the received signals of the acquisition module by changing the current output and voltage output of the test source. If a wiring fault is detected, the detection is stopped and the corresponding fault information is reported. After the fault is investigated, the detection is restarted until all wiring faults have been investigated; the test items for wiring fault detection and location include: single-phase voltage test, two-phase voltage test, single-phase current test, and three-phase voltage and current test.

[0020] Preferably, the single-phase voltage test includes the following process:

[0021] S11. The test module controls the test source to sequentially output single-phase voltages of A, B, and C.

[0022] S12. The test module reads whether there is a short circuit in the test source. If so, it reports to check for a short circuit in the corresponding phase. Otherwise, it proceeds to step S13.

[0023] S13. Read the voltage value obtained by the acquisition device and determine whether the voltage value meets the preset error range. If so, proceed to step S16. Otherwise, proceed to step S14.

[0024] S14. Determine whether the input voltage is lower than the set value of 0. If so, report to check for an open circuit in the corresponding phase. Otherwise, proceed to step S15.

[0025] S15. Determine whether the input voltage is within the preset range of poor contact values. If so, report to check whether the line is loose. Otherwise, report to check the voltage accuracy of the acquisition device.

[0026] S16. Determine whether the single-phase voltage output is completed in a cycle. If so, proceed to the next test item. Otherwise, return to step S11.

[0027] Preferably, the two-phase voltage test includes the following process:

[0028] S21. The test module controls the test source to sequentially output two-phase voltages of AB, AC, and BC.

[0029] S22. The test module reads whether there is a short circuit in the test source. If so, report to check for a short circuit in the corresponding two-phase voltage. Otherwise, proceed to step S23.

[0030] S23. Determine whether the two-phase voltage output is completed in a cycle. If so, proceed to the next test item. Otherwise, return to step S21.

[0031] Preferably, the single-phase current test includes the following process:

[0032] S31. The test module controls the test source to sequentially output single-phase currents of A, B, and C.

[0033] S32. The test module reads whether the test source is open circuited. If so, it reports and checks whether the corresponding phase current is open circuited. Otherwise, it proceeds to step S33.

[0034] S33. Read the current value obtained by the acquisition device, and determine whether the current value meets the preset error range. If so, proceed to step S35, otherwise, proceed to step S34;

[0035] S34. Determine whether the input current is lower than the set shunt value. If so, report to check the corresponding phase current shunt. Otherwise, report to check the current accuracy of the acquisition device.

[0036] S35. Determine whether the single-phase voltage output cycle is complete. If so, proceed to the next test item; otherwise, return to step S31.

[0037] Preferably, the three-phase voltage and current test includes the following process:

[0038] S41. The test module controls the test source to output ABC three-phase current in sequence;

[0039] S42. Read the voltage value, current value and power value obtained by the acquisition device and determine whether they meet the preset error range respectively. If so, record the data and output a qualified report to end the wiring fault detection and positioning; otherwise, report to check the power accuracy of the acquisition device.

[0040] Compared with the prior art, the technical solution of the present invention has the following beneficial effects:

[0041] 1. The present invention sets up an automatic detection system for switch cabinet wiring faults, is provided with a test source connected to the switch cabinet test point and a collection device for receiving output voltage and current signals, changes the voltage and current output of the test source through the test module, and utilizes the signal reception of the collection device to realize fault location at the corresponding wiring point.

[0042] 2. The present invention changes the current output and voltage output of the test source, and performs wiring fault detection and positioning according to the received signal of the acquisition module. If a wiring fault is detected, the corresponding fault information is reported and detected. After the fault is troubleshooted, the detection is performed again until all wiring faults have been troubleshooted, thereby realizing automatic detection and positioning of wiring faults in the switch cabinet, improving the detection efficiency and reducing missed detections caused by human factors. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] Figure 1 A schematic diagram showing the structure of a switch cabinet wiring fault automatic detection system proposed in Embodiment 1 of the present invention;

[0044] Figure 2 A schematic diagram showing the structure of the test module proposed in Embodiment 1 of the present invention;

[0045] Figure 3 Schematic diagram showing the process of the automatic detection method for wiring faults in switchgear proposed in Embodiment 2 of the present invention;

[0046] Figure 4 Schematic diagram showing the process of single-phase voltage test proposed in Embodiment 3 of the present invention;

[0047] Figure 5 Schematic diagram showing the process of two-phase voltage test proposed in Embodiment 3 of the present invention;

[0048] Figure 6 Schematic diagram showing the process of single-phase current test proposed in Embodiment 3 of the present invention;

[0049] Figure 7 Schematic diagram showing the process of three-phase voltage and current test proposed in Embodiment 3 of the present invention. Detailed implementation manners

[0050] The accompanying drawings are only for illustrative purposes and should not be construed as limitations on this patent;

[0051] For better illustration of this embodiment, some parts of the accompanying drawings are omitted, enlarged or reduced, and do not represent the actual size;

[0052] For those skilled in the art, it is understandable that some well-known content descriptions in the accompanying drawings may be omitted.

[0053] The technical solutions of the present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0054] The description of the positional relationship in the accompanying drawings is only for illustrative purposes and should not be construed as limitations on this patent;

[0055] Embodiment 1

[0056] This embodiment proposes an automatic detection system for wiring faults in switchgear, including: a test module, a test source, and a collection device; the test module is respectively connected to the test source and the collection device through serial communication, the signal output end of the test source is connected to the test point of the switchgear; the signal input end of the collection device is connected to the test points of each switchgear.

[0057] As Figure 1 shown, in the voltage circuit and current circuit of the switchgear, the UD terminal receives the voltage signal sent by the test source, and the voltage signal is transmitted to the UD terminal of the sectional cabinet through the sectional bayonet at the top of the switchgear cabinet respectively, and the collection device receives the voltage signal through the UD terminal; the collection device receives the current signal sent by the test source through the ID terminal.

[0058] In this embodiment, the acquisition device includes a distribution automation terminal device and a low-voltage circuit measurement and control terminal device. The test module controls the test source to output standard current and voltage signals. The voltage signals include single-phase voltage, two-phase voltage, and three-phase voltage; the current signals include single-phase current and three-phase current. Specifically, the test module supports the serial port interface power protocol DLT634.5101, the network port interface power protocol DLT634.5104, and the RS485 interface MODUBUS protocol. The test module receives the voltage, current, and power values obtained by the acquisition device through the communication port and controls the output of the test source through the serial port of the test source. In this embodiment, the detection system has a one-key detection function and can determine whether the current, voltage, active power, and reactive power of the acquisition device meet the accuracy requirements.

[0059] As Figure 2 shown, the test module includes: an interaction unit, a function output unit, a power calculation unit, a data parsing unit, and a fault judgment unit;

[0060] The interaction unit provides an operation interface for the user. The operation interface includes a protocol setting option, a test item option, and a knowledge and experience library viewing item. Specifically, the acquisition device and protocols include DLT634.5101, DLT634.5104, and the MODUBUS protocol. The test items include accuracy and output control phases. The knowledge and experience library contains the experience of problems encountered in automatic testing and the summary of experiences manually input, which can be searched by personnel to view problems;

[0061] The function output unit controls the output of the test source based on the items selected in the operation interface;

[0062] The data parsing unit receives and parses the voltage and current obtained by the acquisition device;

[0063] The power calculation unit performs power calculation based on the test items and the data parsing results;

[0064] The fault judgment unit gives the corresponding fault detection results and fault causes based on the existing knowledge and experience library and stores them in the knowledge and experience library. For example, when the output three-phase voltage is 57.74V, the three-phase current is 5A, and the angular difference is 45°, the theoretically obtained active power should be 612W, the reactive power should be 612Var, and the apparent power should be 866VA; the actually collected active power is 0W, the reactive power is 0Var, and the apparent power is 0VA. Then the fault judgment unit determines the fault as two-phase reverse connection based on the knowledge and experience library and records the detection result in the knowledge and experience library for viewing.

[0065] Embodiment 2

[0066] This embodiment proposes an automatic detection method for wiring faults in switchgear. Firstly, the accuracy of the acquisition device detection, the protocol of the acquisition device, and the output signal parameter values are selected. The test module detects and locates wiring faults according to the received signals of the acquisition module by changing the current output and voltage output of the test source. During the test, if a wiring fault is detected, such as voltage short circuit, open circuit, unreliable contact, open circuit in the current loop, shunt, etc., the detection is stopped and the corresponding fault information is reported. After the fault is investigated, the detection is restarted until all wiring faults have been investigated, and then a qualified report is printed to end the automatic detection and location of wiring faults.

[0067] Among them, the test module, the test source, and the acquisition device; the test module is respectively connected to the test source and the acquisition device through serial communication. The signal output end of the test source is connected to the test point of the switchgear; the signal input end of the acquisition device is connected to the test points of each switchgear.

[0068] Specifically, in this embodiment, as Figure 3 shown, the test items for wiring fault detection and location include: single-phase voltage test, two-phase voltage test, single-phase current test, and three-phase voltage and current test; the single-phase voltage test, two-phase voltage test, single-phase current test, and three-phase voltage and current test are carried out in sequence. During the process of each test item, if a corresponding fault is detected, after the fault is investigated, it is necessary to return to the single-phase voltage test and start from the beginning until all test items are completed.

[0069] Embodiment 3

[0070] In this embodiment, based on Embodiment 2, in the automatic detection method for wiring faults in switchgear, single-phase voltage test, two-phase voltage test, single-phase current test, and three-phase voltage and current test are respectively carried out on the switchgear to be detected. The specific process is as follows:

[0071] As Figure 4 shown, first, a single-phase voltage test is carried out. The steps of the single-phase voltage test are as follows:

[0072] S11. The test module controls the test source to output single-phase voltages of A, B, and C in sequence.

[0073] S12. The test module reads whether there is a short circuit in the test source. If so, report and check the short circuit of the corresponding phase. Otherwise, go to step S13.

[0074] S13. Read the voltage value obtained by the acquisition device and judge whether the voltage value meets the preset error range. If so, go to step S16. Otherwise, go to step S14.

[0075] S14. Judge whether the input voltage is lower than the set value of 0. If so, report and check the open circuit of the corresponding phase. Otherwise, go to step S15.

[0076] S15. Determine whether the input voltage is within the preset poor contact value range. If so, report to check whether the line is loose. Otherwise, report to check the voltage accuracy of the acquisition device.

[0077] S16. Determine whether the single-phase voltage output is completed. If so, enter the two-phase current test. Otherwise, return to step S11.

[0078] As Figure 5 shown, S21. The test module controls the test source to output the voltages of two phases AB, AC, and BC in sequence.

[0079] S22. The test module reads whether there is a short circuit in the test source. If so, report to check the short circuit of the corresponding two-phase voltage. Otherwise, enter step S23.

[0080] S23. Determine whether the two-phase voltage output is completed. If so, enter the two-phase voltage test. Otherwise, return to step S21.

[0081] As Figure 6 shown, the two-phase voltage test includes the following steps:

[0082] S31. The test module controls the test source to output the single-phase currents of A, B, and C in sequence.

[0083] S32. The test module reads whether there is an open circuit in the test source. If so, report to check the open circuit of the corresponding phase current. Otherwise, enter step S33.

[0084] S33. Read the current value obtained by the acquisition device and determine whether the current value meets the preset error range. If so, enter step S35. Otherwise, enter step S34.

[0085] S34. Determine whether the input current is lower than the set shunt value. If so, report to check the shunt of the corresponding phase current. Otherwise, report to check the current accuracy of the acquisition device.

[0086] S35. Determine whether the single-phase voltage output is completed. If so, enter the three-phase voltage and current test. Otherwise, return to step S31.

[0087] As Figure 7 shown, the three-phase voltage and current test includes the following steps:

[0088] S41. The test module controls the test source to output the three-phase currents of ABC in sequence.

[0089] S42. Read the voltage value, current value, and power value obtained by the acquisition device and determine whether they meet the preset error ranges respectively. If so, record each item of data and output a qualified report to end the wiring fault detection and location. Otherwise, report to check the power accuracy of the acquisition device.

[0090] Herein, through different test items, it is possible to respectively detect wiring faults of switchgear such as short circuits of each of A, B, and C in the voltage circuit to N, short circuits between any two of AB, BC, and AC, open circuits of A, B, and C in the current circuit, and shunting to the ground.

[0091] Obviously, the above embodiments of the present invention are only examples for clearly illustrating the present invention, rather than limitations on the implementation manners of the present invention. For those of ordinary skill in the art, other different forms of changes or modifications can be made based on the above description. It is not necessary and impossible to enumerate all implementation manners here. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention shall be included within the protection scope of the claims of the present invention.

Claims

1. An automatic detection system for wiring faults in switchgear, characterized in that, include: Test modules, test sources and acquisition devices; The test module is connected to the test source and the acquisition device through serial communication, the signal output end of the test source is connected to the test point of the switch cabinet; the signal input end of the acquisition device is connected to the test point of each switch cabinet; the system has a one-key detection function, which can determine whether the current, voltage, active power and reactive power of the acquisition device meet the accuracy requirements; The system described herein applies the following switch cabinet wiring fault automatic detection method: The test module detects and locates wiring faults according to the received signals of the acquisition module by changing the current output and voltage output of the test source. If wiring faults including voltage short circuit, wire break, unreliable contact, current loop open circuit and shunt are detected, the test will be stopped and the corresponding fault information will be reported. After the fault is cleared, the test will be repeated until all wiring faults have been cleared. The test items for wiring fault detection and location include: single-phase voltage test, two-phase voltage test, single-phase current test and three-phase voltage and current test; The single-phase voltage test, two-phase voltage test, single-phase current test and three-phase voltage and current test are performed in sequence. During the process of each test item, if a corresponding fault is detected, after troubleshooting, it is necessary to return to the single-phase voltage test and start from the beginning until all test items are tested; The single-phase voltage test includes the following processes: S11. The test module controls the test source to output A, B, and C single-phase voltages in sequence; S12. The test module reads whether the test source is short-circuited. If so, it reports and checks whether the corresponding phase is short-circuited. Otherwise, it proceeds to step S13. S13. Read the voltage value obtained by the acquisition device, and determine whether the voltage value meets the preset error range. If so, proceed to step S16, otherwise, proceed to step S14; S14. Determine whether the input voltage is lower than the set value of 0. If so, check the corresponding phase for open circuit. Otherwise, proceed to step S15. S15. Determine whether the input voltage is within the preset poor contact value range. If so, report to check whether the circuit is loose. Otherwise, report to check the voltage accuracy of the acquisition device. S16. Determine whether the single-phase voltage output cycle is complete, if so, proceed to the next test item, otherwise, return to step S11; The two-phase voltage test includes the following processes: S21. The test module controls the test source to output AB, AC, and BC two-phase voltages in sequence; S22. The test module reads whether the test source is short-circuited. If so, it reports and checks whether the corresponding two-phase voltage is short-circuited. Otherwise, it proceeds to step S23. S23. Determine whether the two-phase voltage output cycle is complete, if so, proceed to the next test item, otherwise, return to step S21; The single-phase current test includes the following processes: S31. The test module controls the test source to output A, B, and C single-phase currents in sequence; S32. The test module reads whether the test source is open circuited. If so, it reports and checks whether the corresponding phase current is open circuited. Otherwise, it proceeds to step S33. S33. Read the current value obtained by the acquisition device, and determine whether the current value meets the preset error range. If so, proceed to step S35, otherwise, proceed to step S34; S34. Determine whether the input current is lower than the set shunt value. If so, report to check the shunt of the corresponding phase current; otherwise, report to check the current accuracy of the acquisition device. S35. Determine whether the single-phase voltage output has completed a cycle. If so, proceed to the next test item; otherwise, return to step S31. The three-phase voltage and current test includes the following process: S41. The test module controls the test source to output the ABC three-phase currents in sequence. S42. Read the voltage value, current value, and power value obtained by the acquisition device and determine whether they respectively meet the preset error range. If so, record each data and output a qualified report to end the wiring fault detection and location; otherwise, report to check the power accuracy of the acquisition device.

2. The automatic detection system for wiring faults of switchgear according to claim 1, wherein The acquisition device includes a distribution automation terminal device and a low-voltage loop measurement and control terminal device.

3. The automatic detection system for wiring faults of switchgear according to claim 1, characterized in that The test module controls the test source to output standard current and voltage signals through the serial port of the test source. The voltage signals include single-phase voltage, two-phase voltage, and three-phase voltage, and the current signals include single-phase current and three-phase current.

4. The automatic detection system for wiring faults of switchgear according to claim 3, wherein, The test module receives the voltage, current, and power values obtained by the acquisition device through the communication port and controls the output of the test source through the serial port of the test source.

5. The automatic detection system for wiring faults of switchgear according to claim 4, characterized in that The test module includes: an interaction unit, a function output unit, a power calculation unit, a data analysis unit, and a fault judgment unit; The interaction unit provides an operation interface for the user. The operation interface includes a protocol setting option, a test item option, and a knowledge and experience library viewing option; The function output unit controls the output of the test source based on the item selected in the operation interface; The data analysis unit receives and analyzes the voltage and current obtained by the acquisition device; The power calculation unit performs power calculation based on the test item and the data analysis result; The fault judgment unit gives the corresponding fault detection result and fault cause based on the existing knowledge and experience library and stores them in the knowledge and experience library.

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