Equipment parameter calibration method, device, equipment and storage medium

Abstract

The present application discloses a device parameter calibration method, apparatus, equipment and storage medium, which relates to the field of data processing technology, including: after detecting that the device to be calibrated is placed on a target turntable in an arbitrary posture and remains stationary for a preset time, determining the current observation equation according to the current acceleration measurement value and the initial relative posture; after detecting that the rotated target turntable remains stationary for a preset time, calculating the target rotation matrix in combination with the target observation equation set; solving the error parameter according to the target rotation matrix, and calibrating the parameters of the device to be calibrated according to the error parameter; through the above method, the device to be calibrated is placed on the target turntable in an arbitrary posture, that is, there is no strict requirement for the posture of the device to be calibrated, after determining the current observation equation, controlling the target turntable to rotate multiple times, and using the error parameter to calibrate the parameters, so as to effectively improve the parameter calibration efficiency and reduce the parameter calibration cost on the basis of ensuring the accuracy of the equipment, and meet the needs of application scenarios.

Description

Technical Field

[0001] The present application relates to the field of data processing technology, and in particular to a method, apparatus, device and storage medium for calibrating device parameters. Background Art

[0002] Inertial measurement devices are often used to measure data such as acceleration and angular velocity of an object. If the parameters of the inertial measurement device are calibrated incorrectly, the measured data will be inaccurate. Therefore, it is particularly important to calibrate the parameters of the inertial measurement device. At present, the common method for calibrating the parameters of the device is to use a temperature chamber during the calibration process to meet environmental requirements. At the same time, it must be strictly placed in a fixed posture on a high-cost high-precision turntable before calibration. However, in conventional application scenarios, the accuracy requirements for inertial measurement devices are not high. If the above method is still used for parameter calibration, it will lead to low parameter calibration efficiency and high cost.

[0003] The above contents are only used to assist in understanding the technical solution of the present application and do not constitute an admission that the above contents are prior art. Summary of the invention

[0004] The main purpose of this application is to provide a device parameter calibration method, apparatus, equipment and storage medium, aiming to solve the technical problems of low efficiency and high cost of parameter calibration in the prior art.

[0005] To achieve the above purpose, the present application proposes a device parameter calibration method, the method comprising:

[0006] After detecting that the device to be calibrated is placed on the target turntable in an arbitrary posture and remains stationary for a preset time, the current observation equation is determined according to the current acceleration measurement value and the initial relative posture between the device to be calibrated and the target turntable;

[0007] Controlling the target turntable to rotate, and after detecting that the rotated target turntable has been stationary for a preset time, determining a set of target observation equations;

[0008] Calculate a target rotation matrix based on the current observation equation and the target observation equation set;

[0009] The error parameters are solved according to the target rotation matrix, and the parameters of the device to be calibrated are calibrated according to the error parameters.

[0010] In one embodiment, after detecting that the device to be calibrated is placed on the target turntable in an arbitrary posture and remains stationary for a preset time, the step of determining the current observation equation according to the current acceleration measurement value and the initial relative posture between the device to be calibrated and the target turntable includes:

[0011] When it is detected that the device to be calibrated is placed on the target turntable in any posture, the static time of the target turntable is counted;

[0012] When the static time of the target turntable reaches a preset time, obtaining the current acceleration measurement value and the initial relative posture between the device to be calibrated and the target turntable;

[0013] Determine the current error parameter;

[0014] A current observation equation is generated according to the current acceleration measurement value, the initial relative posture between the device to be calibrated and the target turntable, and the current error parameter.

[0015] In one embodiment, the step of controlling the target turntable to rotate and determining the target observation equation set after detecting that the rotated target turntable remains stationary for a preset time period comprises:

[0016] Controlling the target turntable to rotate along the first axis by a preset angle, and counting a first static time length of the target turntable after the first rotation;

[0017] When the first static time reaches a preset time, generating a first observation equation according to the first acceleration measurement value, the first relative posture between the device to be calibrated and the target turntable, and the current error parameter;

[0018] Control the rotated target turntable to rotate a target angle along the second axis, and count a second static time length of the target turntable after the second rotation;

[0019] When the second static time reaches a preset time, continue to control the rotated target turntable to rotate along the first axis by a preset angle, and count a third static time of the target turntable after the third rotation;

[0020] When the third static time reaches a preset time, generating a second observation equation according to the second acceleration measurement value, the second relative posture between the device to be calibrated and the target turntable, and the current error parameter;

[0021] A target observation equation set is obtained according to the first observation equation and the second observation equation.

[0022] In one embodiment, the target observation equation set includes a first observation equation and a second observation equation; the step of calculating the target rotation matrix according to the current observation equation and the target observation equation set includes:

[0023] Performing subtraction calculation on the current observation equation and the first observation equation to obtain a first observation equation;

[0024] Performing subtraction calculation on the current observation equation and the second observation equation to obtain a second observation equation;

[0025] Determine respectively vectors and diagonal matrices having equal modulus values ​​in the first observation equation and the second observation equation;

[0026] Performing equivalent processing on the first observation equation according to the vector and the diagonal matrix to obtain a first equivalent observation formula;

[0027] Performing equivalent processing on the second observation equation according to the vector and the diagonal matrix to obtain a second equivalent observation formula;

[0028] Get the characteristic information of the rotation matrix;

[0029] A target rotation matrix is ​​calculated according to the characteristic information, the first equivalent observation formula, and the second equivalent observation formula.

[0030] In one embodiment, the step of calculating the target rotation matrix according to the characteristic information, the first equivalent observation formula and the second equivalent observation formula includes:

[0031] Determine a characteristic expression according to the characteristic information, and determine an equivalent replacement object according to the characteristic expression;

[0032] Calculate the first equivalent observation formula and the second equivalent observation formula according to the equivalent substitution object to obtain a current expression;

[0033] A target rotation matrix is ​​calculated according to the current expression based on a preset assumption strategy.

[0034] In one embodiment, the step of calculating the target rotation matrix according to the current expression based on a preset assumption strategy includes:

[0035] Assume the values ​​of multiple parameters based on preset assumption strategies;

[0036] Generate a first parameter expression according to the current expression and the values ​​of a plurality of parameters;

[0037] Convert the first parameter expression according to the multiple parameters to obtain a second parameter expression;

[0038] The second parameter expression is changed according to the first observation equation and the second observation equation to obtain a rotation matrix to solve the equation group;

[0039] The target rotation matrix is ​​calculated by solving the set of equations according to the rotation matrix.

[0040] In one embodiment, the step of solving the error parameter according to the target rotation matrix and calibrating the parameters of the device to be calibrated according to the error parameter includes:

[0041] Get the coordinate system of the device to be calibrated;

[0042] Converting the angular velocity measurement value from the coordinate system of the device to be calibrated to the coordinate system of the target turntable to obtain a target equation;

[0043] Obtaining a first integral result equation according to the target equation and the first observation equation;

[0044] Obtaining a second integral result equation according to the target equation and the second observation equation;

[0045] When the second static time reaches a preset time, a third observation equation is generated according to a third acceleration measurement value, a third relative posture between the device to be calibrated and the target turntable, and a current error parameter, and a third integral result equation is obtained according to the target equation and the third observation equation;

[0046] According to the first integral result equation, the second integral result equation and the third integral result equation, an integral result equation group is formed;

[0047] The error parameters are solved according to the integral result equation group, and the parameters of the device to be calibrated are calibrated according to the error parameters.

[0048] In addition, to achieve the above purpose, the present application also proposes a device parameter calibration device, the device parameter calibration device comprising:

[0049] A detection module is used to determine a current observation equation according to a current acceleration measurement value and an initial relative posture between the device to be calibrated and the target turntable after detecting that the device to be calibrated is placed on the target turntable in an arbitrary posture and remains stationary for a preset time;

[0050] A determination module, used for controlling the target turntable to rotate, and determining a set of target observation equations after detecting that the rotated target turntable has been stationary for a preset time period;

[0051] A calculation module, used for calculating a target rotation matrix according to the current observation equation and the target observation equation set;

[0052] The calibration module is used to solve the error parameters according to the target rotation matrix, and perform parameter calibration on the device to be calibrated according to the error parameters.

[0053] In addition, to achieve the above-mentioned purpose, the present application also proposes a device parameter calibration device, which includes: a memory, a processor, and a computer program stored in the memory and executable on the processor, and the computer program is configured to implement the steps of the device parameter calibration method described above.

[0054] In addition, to achieve the above-mentioned purpose, the present application also proposes a storage medium, which is a computer-readable storage medium, and a computer program is stored on the storage medium. When the computer program is executed by the processor, the steps of the device parameter calibration method described above are implemented.

[0055] One or more technical solutions proposed in the present application have at least the following technical effects: after detecting that the device to be calibrated is placed on the target turntable in an arbitrary posture and remains stationary for a preset time, the current observation equation is determined according to the current acceleration measurement value and the initial relative posture between the device to be calibrated and the target turntable; the target turntable is controlled to rotate, and after detecting that the rotated target turntable remains stationary for a preset time, a set of target observation equations is determined; the target rotation matrix is ​​calculated according to the current observation equation and the set of target observation equations; the error parameters are solved according to the target rotation matrix, and the device to be calibrated is calibrated according to the error parameters; in the above manner, the device to be calibrated is placed at any position of the target turntable in an arbitrary posture, that is, there is no strict requirement for the posture of the device to be calibrated. After determining the current observation equation, the target turntable is controlled to rotate multiple times at multiple angles, and then the error parameters are used to calibrate the device to be calibrated, so as to effectively improve the parameter calibration efficiency and reduce the parameter calibration cost on the basis of ensuring the accuracy of the equipment, and meet the needs of application scenarios. BRIEF DESCRIPTION OF THE DRAWINGS

[0056] The accompanying drawings herein are incorporated in and constitute a part of the specification, illustrate embodiments consistent with the present application, and together with the description, are used to explain the principles of the present application.

[0057] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0058] Figure 1 A schematic diagram of a process flow provided for Embodiment 1 of the device parameter calibration method of the present application;

[0059] Figure 2 A flow chart of the second embodiment of the device parameter calibration method of the present application;

[0060] Figure 3 This is a schematic diagram of the module structure of the device parameter calibration device according to the embodiment of the present application;

[0061] Figure 4 Schematic diagram of the device structure of the hardware operating environment involved in the device parameter calibration method in the embodiment of the present application.

[0062] The purpose, features and advantages of this application will be further described in conjunction with the embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0063] It should be noted that the execution subject of this embodiment can be a computing service device with data processing, network communication and program running functions, such as a tablet computer, a personal computer, a mobile phone, etc., or an electronic device capable of realizing the above functions, a parameter calibration device, etc. The following takes the parameter calibration device as an example to illustrate this embodiment and the following embodiments.

[0064] Based on this, the present application embodiment provides a device parameter calibration method, referring to Figure 1 , Figure 1 This is a flow chart of the first embodiment of the device parameter calibration method of the present application.

[0065] In this embodiment, the device parameter calibration method includes steps S10 to S40:

[0066] Step S10, after detecting that the device to be calibrated is placed on the target turntable in an arbitrary posture and remains stationary for a preset time, determine the current observation equation according to the current acceleration measurement value and the initial relative posture between the device to be calibrated and the target turntable.

[0067] It should be noted that the device to be calibrated can be an inertial measurement unit (IMU), and the target turntable refers to a turntable with two axes. Compared with the high-precision turntable used in the prior art, it does not need to be strictly placed in a fixed posture, thereby greatly simplifying the calibration action. In addition, the application scenario of this embodiment is a scenario where orthogonality errors are ignored, and the magnitude of the ignored orthogonality errors is small.

[0068] It should be understood that the current acceleration measurement value refers to the acceleration measurement value after the preset static time, which can be 10 seconds. The initial relative posture refers to the relative posture between the device to be calibrated and the target turntable after the preset static time. The current observation equation determined is specifically expressed as:

[0069] .

[0070] in, Indicates the current acceleration measurement value, represents the diagonal matrix at the initial relative posture, Represents the acceleration due to gravity.

[0071] Further, step S10 includes: when it is detected that the device to be calibrated is placed on the target turntable in an arbitrary posture, counting the static time of the target turntable; when the static time of the target turntable reaches a preset time, obtaining the current acceleration measurement value and the initial relative posture between the device to be calibrated and the target turntable; determining the current error parameter; and generating the current observation equation according to the current acceleration measurement value, the initial relative posture between the device to be calibrated and the target turntable, and the current error parameter.

[0072] It can be understood that when it is detected that the device to be calibrated is placed on the target turntable in any posture, it indicates that the device to be calibrated is fixed together with the target turntable. At this time, the timing starts from the moment when the device to be calibrated is placed, that is, the static time of the target turntable is counted. The current error parameter can be a parameter for generating the current observation equation. The current error parameter includes , At this time, the current observation equation is generated by combining the initial relative posture between the device to be calibrated and the target turntable and the current error parameters.

[0073] Step S20, controlling the target turntable to rotate, and determining a target observation equation set after detecting that the rotated target turntable remains stationary for a preset time period.

[0074] It can be understood that after determining the current observation equation, it is necessary to control the target turntable to rotate multiple times at different angles along multiple axes, and the axes used for rotation include a first axis and a second axis, wherein the first axis may be a horizontal axis and the second axis may be a non-horizontal axis. The target observation equation refers to a set of multiple observation equations generated after rotation, for example, the first observation equation, the second observation equation, etc.

[0075] Further, step S20 includes: controlling the target turntable to rotate by a preset angle along the first axis, and counting a first static time of the target turntable after the first rotation; when the first static time reaches the preset time, generating a first observation equation according to the first acceleration measurement value, the first relative posture between the device to be calibrated and the target turntable, and the current error parameter; controlling the rotated target turntable to rotate by a target angle along the second axis, and counting a second static time of the target turntable after the second rotation; when the second static time reaches the preset time, continuing to control the rotated target turntable to rotate by a preset angle along the first axis, and counting a third static time of the target turntable after the third rotation; when the third static time reaches the preset time, generating a second observation equation according to the second acceleration measurement value, the second relative posture between the device to be calibrated and the target turntable, and the current error parameter; and obtaining a target observation equation set according to the first observation equation and the second observation equation.

[0076] It should be understood that the preset angle can be 810°, that is, the target turntable is controlled to rotate 810° along the first axis. The first static time refers to the static time after the target turntable is controlled to rotate for the first time. At this time, it is necessary to obtain the same type of parameters, that is, the first acceleration measurement value, the first relative posture between the device to be calibrated and the target turntable, and then generate the first observation equation in combination with the current error parameter, which can be specifically expressed as:

[0077] .

[0078] in, Indicates the current acceleration measurement value, represents the diagonal matrix at the initial relative posture, Represents the acceleration due to gravity.

[0079] In addition, the target turntable will be controlled to rotate for the second time. At this time, the axis of rotation is the second axis and the rotation angle is the target angle. The target angle can be 990°. The second static time refers to the static time after the target turntable is controlled to rotate along the second axis to the target angle for the second time. After counting the second static time, it is further determined whether the second static time reaches the preset time. The preset time can be 10 seconds. At this time, an observation equation can also be generated. In addition, the target turntable will be controlled to continue rotating for the third time, and then the same type of parameters, i.e., the second acceleration measurement value, the second relative posture between the device to be calibrated and the target turntable are obtained again, and then the second observation equation is generated in combination with the current error parameter. Then, the first observation equation and the second observation equation constitute the target observation equation set. After the target turntable is controlled for the second time, it is determined whether the second static time reaches the preset time. If so, the third observation equation is generated according to the third acceleration measurement value, the third relative posture between the device to be calibrated and the target turntable, and the current error parameter, i.e., the target observation equation set includes not only the first observation equation and the second observation equation, but also the third observation equation.

[0080] Step S30, calculating the target rotation matrix according to the current observation equation and the target observation equation set.

[0081] It can be understood that the target rotation matrix refers to a matrix used to transform measurement values ​​to other coordinate systems, and the target rotation matrix can be calculated using the first observation equation and the second observation equation in the current observation equation and the target observation equation set.

[0082] Step S40, solving error parameters according to the target rotation matrix, and performing parameter calibration on the device to be calibrated according to the error parameters.

[0083] It should be understood that the error parameter refers to the parameter that has a greater impact on the error of the device to be calibrated. Since the application scenario of this embodiment is a scenario where orthogonality error is ignored, the error parameter includes zero bias and proportional factor. At this time, the error parameter is used to calibrate the parameters of the device to be calibrated to reduce the error of the device to be calibrated.

[0084] Further, step S40 includes: obtaining the coordinate system of the device to be calibrated; converting the angular velocity measurement value from the coordinate system of the device to be calibrated to the coordinate system of the target turntable to obtain a target equation; obtaining a first integral result equation according to the target equation and the first observation equation; obtaining a second integral result equation according to the target equation and the second observation equation; when the second static time reaches a preset time, generating a third observation equation according to the third acceleration measurement value, the third relative posture between the device to be calibrated and the target turntable, and the current error parameter, and obtaining a third integral result equation according to the target equation and the third observation equation; forming an integral result equation group according to the first integral result equation, the second integral result equation and the third integral result equation; solving the error parameter according to the integral result equation group, and calibrating the device to be calibrated according to the error parameter.

[0085] It should be noted that after obtaining the target rotation matrix, the target rotation matrix is ​​used to transform the angular velocity measurement value from the coordinate system of the device to be calibrated to the coordinate system of the target turntable. At this time, the target equation can be used to represent the angular velocity measurement value in the coordinate system of the target turntable. The target equation can be expressed as:

[0086] .

[0087] in, represents the angular velocity measurement value in the coordinate system of the target turntable, and Represents the error parameter.

[0088] It can be understood that the first integral result refers to the integral result after the target turntable is controlled to rotate along the first axis by a preset angle. After the target equation is obtained, the first integral result equation is obtained by combining the first observation equation, which is specifically:

[0089] .

[0090] Similarly, the second integral result refers to the integral result after the target turntable after being controlled to rotate further along the first axis by a preset angle. After the target equation is obtained, the second integral result equation is obtained by combining the second observation equation, which is specifically:

[0091] .

[0092] Similarly, the third integral result refers to the integral result after the target turntable is controlled to continue to rotate along the second axis by the target angle. After the target equation is obtained, the third integral result equation is obtained by combining the third observation equation, which is specifically:

[0093] .

[0094] It should be noted that Represents the angular velocity measurement value in the coordinate system of the target turntable. After obtaining the first integral result equation, the second integral result equation and the third integral result equation, the above multiple integral result equations are used to form an integral result equation group, which is specifically:

[0095] .

[0096] It should be noted that the target rotation matrix C in the integral result equation group is a known parameter, because the target rotation matrix C can be calculated through steps S301 to S307 in the second embodiment, and the step of forming the integral result equation group is S40, that is, the above steps are the steps after calculating the target rotation matrix C. After forming the integral result equation group, the integral result equation group is solved to calculate and At this time, the error parameter has been determined, and then the error parameter is used to calibrate the parameters of the device to be calibrated. Obviously, this embodiment does not require a temperature box for calibration, and the parameter calibration can be completed using a dual-axis turntable, which simplifies the calibration action, thereby significantly shortening the calibration time and reducing the calibration cost, while also meeting the needs of application scenarios.

[0097] This embodiment determines the current observation equation according to the current acceleration measurement value and the initial relative posture between the device to be calibrated and the target turntable after detecting that the device to be calibrated is placed on the target turntable in an arbitrary posture and remains stationary for a preset time; controls the target turntable to rotate, and determines the target observation equation set after detecting that the rotated target turntable remains stationary for a preset time; calculates the target rotation matrix according to the current observation equation and the target observation equation set; solves the error parameter according to the target rotation matrix, and performs parameter calibration on the device to be calibrated according to the error parameter; through the above method, the device to be calibrated is placed at any position of the target turntable in an arbitrary posture, that is, there is no strict requirement for the posture of the device to be calibrated, after determining the current observation equation, controls the target turntable to perform multiple rotations at multiple angles, and then uses the error parameter to perform parameter calibration on the device to be calibrated, so as to effectively improve the parameter calibration efficiency and reduce the parameter calibration cost on the basis of ensuring the accuracy of the equipment, and meet the requirements of application scenarios.

[0098] Based on the first embodiment of the present application, in the second embodiment of the present application, the same or similar contents as those in the above-mentioned embodiment 1 can be referred to the above introduction, and will not be repeated in the following. Figure 2 , the target observation equation set includes a first observation equation and a second observation equation, and step S30 includes steps S301 to S307:

[0099] Step S301, performing subtraction calculation on the current observation equation and the first observation equation to obtain the first observation equation.

[0100] It should be noted that, in obtaining the target observation equation set, the first observation equation is extracted from the target observation equation set, and then the current observation equation and the first observation equation are subtracted. At this time, the first observation equation can be expressed as:

[0101] .

[0102] Step S302, performing subtraction calculation on the current observation equation and the second observation equation to obtain a second observation equation.

[0103] It can be understood that, similarly, the second observation equation is extracted from the target observation equation set, and the second observation equation at this time can be expressed as:

[0104] .

[0105] It should be noted that the observation equation Represents the unit matrix. After obtaining the second observation equation, the current observation equation and the second observation equation are subtracted. At this time, the second observation equation can be expressed as:

[0106] .

[0107] Step S303, respectively determining vectors and diagonal matrices with equal modulus values ​​in the first observation equation and the second observation equation.

[0108] It should be understood that in the first observation equation, the vectors with equal modulus values ​​are and , the diagonal matrix is and , similarly, in the second observation equation, the vectors with equal modulus values ​​are and , the diagonal matrix is and .

[0109] Step S304: perform equivalent processing on the first observation equation according to the vector and the diagonal matrix to obtain a first equivalent observation formula.

[0110] It can be understood that after determining the vectors with equal modulus values ​​in the first observation equation, the first observation equation can be further expressed as:

[0111] .

[0112] The equivalent is as follows:

[0113] .

[0114] Then the diagonal matrix in the second observation equation is further expressed as:

[0115]

[0116]

[0117] .

[0118] It should be noted that, based on the above formula, the first observation equation can be further processed to obtain a first equivalent observation formula, which is:

[0119] .

[0120] Step S305: perform equivalent processing on the second observation equation according to the vector and the diagonal matrix to obtain a second equivalent observation formula.

[0121] It can be understood that the diagonal matrix in the second observation equation can be further expressed as:

[0122]

[0123] .

[0124] It should be noted that, based on the above formula, the second observation formula can be further processed to obtain a second equivalent observation formula, which is:

[0125] .

[0126] Step S306, obtaining characteristic information of the rotation matrix.

[0127] It should be understood that characteristic information refers to information that is unique to the rotation matrix compared to other matrices, such as orthogonal characteristic information and construction characteristic information.

[0128] Step S307, calculating a target rotation matrix according to the characteristic information, the first equivalent observation formula, and the second equivalent observation formula.

[0129] It can be understood that the target rotation matrix refers to the matrix used to convert the measurement value to other coordinate systems. After obtaining the characteristic information of the rotation matrix, the target rotation matrix is ​​comprehensively calculated in combination with the first equivalent observation formula and the second equivalent observation formula.

[0130] Further, step S307 includes: determining a characteristic expression based on the characteristic information, and determining an equivalent substitution object based on the characteristic expression; calculating the first equivalent observation formula and the second equivalent observation formula according to the equivalent substitution object to obtain a current expression; and calculating a target rotation matrix according to the current expression based on a preset assumption strategy.

[0131] It should be understood that the characteristic expression refers to an expression determined according to the characteristic information of the rotation matrix, and the characteristic expression can be expressed as:

[0132] .

[0133] Further expressed as:

[0134] .

[0135] The equivalent substitution object at this time can be the parameter on the left side of the above equation, which can be expressed as:

[0136] .

[0137] It should be noted that after obtaining the equivalent substitution object, the current expression is calculated using the equivalent substitution object, specifically:

[0138] .

[0139] Furthermore, the step of calculating the target rotation matrix according to the current expression based on a preset assumption strategy includes: assuming the values ​​of multiple parameters based on the preset assumption strategy; generating a first parameter expression according to the current expression and the values ​​of multiple parameters; converting the first parameter expression according to the multiple parameters to obtain a second parameter expression; changing the second parameter expression according to the first observation equation and the second observation equation to obtain a rotation matrix solution equation group; and calculating the target rotation matrix according to the rotation matrix solution equation group.

[0140] It is understood that the preset assumption strategy refers to a strategy for assuming the value of a parameter, for example, assuming Approximately equal to 1, after assuming the values ​​of multiple parameters, the first parameter expression is generated in combination with the current expression, specifically:

[0141]

[0142] It should be noted that after obtaining the first parameter expression, the first parameter expression is converted into the second parameter expression using multiple parameters, that is, introducing , specifically:

[0143] .

[0144] In addition, multiple equivalent substitution objects are determined according to the first observation equation and the second observation equation, specifically:

[0145] .

[0146] After determining the above multiple equivalent substitution objects, the multiple equivalent substitution objects are used to replace the parameters in the first observation equation and the second observation equation respectively. The replaced equations are the rotation matrix solution equations, specifically:

[0147] .

[0148] At this time, the above rotation matrix solution equation group can be solved to obtain the target rotation matrix.

[0149] In this embodiment, the first observation equation is obtained by subtracting the current observation equation from the first observation equation; the second observation equation is obtained by subtracting the current observation equation from the second observation equation; the vectors and diagonal matrices with equal modulus values ​​in the first observation equation and the second observation equation are determined respectively; the first observation equation is equivalently processed according to the vector and the diagonal matrix to obtain a first equivalent observation formula; the second observation equation is equivalently processed according to the vector and the diagonal matrix to obtain a second equivalent observation formula; the characteristic information of the rotation matrix is ​​obtained; the target rotation matrix is ​​calculated according to the characteristic information, the first equivalent observation formula and the second equivalent observation formula; in the above manner, the current observation equation is subtracted from the first observation equation and the second observation equation in turn, and then the vectors and diagonal matrices with equal modulus values ​​in the observation equations are determined respectively, and after equivalently processing multiple equivalent observation formulas, the target rotation matrix is ​​comprehensively calculated in combination with the characteristic information of the rotation matrix, thereby effectively improving the accuracy of calculating the target rotation matrix.

[0150] This application also provides a device parameter calibration device, please refer to Figure 3 , the equipment parameter calibration device comprises:

[0151] The detection module 10 is used to determine the current observation equation according to the current acceleration measurement value and the initial relative posture between the device to be calibrated and the target turntable after detecting that the device to be calibrated is placed on the target turntable in an arbitrary posture and remains stationary for a preset time.

[0152] The determination module 20 is used to control the target turntable to rotate, and determine a target observation equation set after detecting that the rotated target turntable remains stationary for a preset time period.

[0153] The calculation module 30 is used to calculate the target rotation matrix according to the current observation equation and the target observation equation set.

[0154] The calibration module 40 is used to solve the error parameters according to the target rotation matrix, and perform parameter calibration on the device to be calibrated according to the error parameters.

[0155] This embodiment determines the current observation equation according to the current acceleration measurement value and the initial relative posture between the device to be calibrated and the target turntable after detecting that the device to be calibrated is placed on the target turntable in an arbitrary posture and remains stationary for a preset time; controls the target turntable to rotate, and determines the target observation equation set after detecting that the rotated target turntable remains stationary for a preset time; calculates the target rotation matrix according to the current observation equation and the target observation equation set; solves the error parameter according to the target rotation matrix, and performs parameter calibration on the device to be calibrated according to the error parameter; through the above method, the device to be calibrated is placed at any position of the target turntable in an arbitrary posture, that is, there is no strict requirement for the posture of the device to be calibrated, after determining the current observation equation, controls the target turntable to perform multiple rotations at multiple angles, and then uses the error parameter to perform parameter calibration on the device to be calibrated, so as to effectively improve the parameter calibration efficiency and reduce the parameter calibration cost on the basis of ensuring the accuracy of the equipment, and meet the requirements of application scenarios.

[0156] The device parameter calibration device provided by the present application adopts the device parameter calibration method in the above embodiment, which can solve the technical problems of low efficiency and high cost of parameter calibration in the prior art. Compared with the prior art, the beneficial effects of the device parameter calibration device provided by the present application are the same as the beneficial effects of the device parameter calibration method provided by the above embodiment, and other technical features in the device parameter calibration device are the same as the features disclosed in the above embodiment method, which will not be repeated here.

[0157] In one embodiment, the detection module 10 is further used to count the static time of the target turntable when it is detected that the device to be calibrated is placed on the target turntable in an arbitrary posture; when the static time of the target turntable reaches a preset time, obtain the current acceleration measurement value and the initial relative posture between the device to be calibrated and the target turntable; determine the current error parameter; and generate the current observation equation according to the current acceleration measurement value, the initial relative posture between the device to be calibrated and the target turntable, and the current error parameter.

[0158] In one embodiment, the determination module 20 is also used to control the target turntable to rotate by a preset angle along the first axis, and count the first static time of the target turntable after the first rotation; when the first static time reaches the preset time, generate a first observation equation according to the first acceleration measurement value, the first relative posture between the device to be calibrated and the target turntable, and the current error parameter; control the rotated target turntable to rotate by a target angle along the second axis, and count the second static time of the target turntable after the second rotation; when the second static time reaches the preset time, continue to control the rotated target turntable to rotate by a preset angle along the first axis, and count the third static time of the target turntable after the third rotation; when the third static time reaches the preset time, generate a second observation equation according to the second acceleration measurement value, the second relative posture between the device to be calibrated and the target turntable, and the current error parameter; obtain a target observation equation set according to the first observation equation and the second observation equation.

[0159] In one embodiment, the target observation equation set includes a first observation equation and a second observation equation; the calculation module 30 is also used to perform subtraction calculation on the current observation equation and the first observation equation to obtain a first observation equation; perform subtraction calculation on the current observation equation and the second observation equation to obtain a second observation equation; respectively determine vectors and diagonal matrices with equal modulus values ​​in the first observation equation and the second observation equation; perform equivalent processing on the first observation equation according to the vector and the diagonal matrix to obtain a first equivalent observation formula; perform equivalent processing on the second observation equation according to the vector and the diagonal matrix to obtain a second equivalent observation formula; obtain characteristic information of the rotation matrix; calculate the target rotation matrix according to the characteristic information, the first equivalent observation formula and the second equivalent observation formula.

[0160] In one embodiment, the calculation module 30 is also used to determine a characteristic expression based on the characteristic information, and determine an equivalent substitution object based on the characteristic expression; calculate the first equivalent observation formula and the second equivalent observation formula according to the equivalent substitution object to obtain a current expression; and calculate the target rotation matrix according to the current expression based on a preset assumption strategy.

[0161] In one embodiment, the calculation module 30 is also used to assume the values ​​of multiple parameters based on a preset assumption strategy; generate a first parameter expression according to the current expression and the values ​​of multiple parameters; convert the first parameter expression according to the multiple parameters to obtain a second parameter expression; change the second parameter expression according to the first observation equation and the second observation equation to obtain a rotation matrix solution equation group; calculate the target rotation matrix according to the rotation matrix solution equation group.

[0162] In one embodiment, the calibration module 40 is further used to obtain the coordinate system of the device to be calibrated; convert the angular velocity measurement value from the coordinate system of the device to be calibrated to the coordinate system of the target turntable to obtain a target equation; obtain a first integral result equation according to the target equation and the first observation equation; obtain a second integral result equation according to the target equation and the second observation equation; when the second static time reaches a preset time, generate a third observation equation according to the third acceleration measurement value, the third relative posture between the device to be calibrated and the target turntable, and the current error parameter, and obtain a third integral result equation according to the target equation and the third observation equation; form an integral result equation group according to the first integral result equation, the second integral result equation and the third integral result equation; solve the error parameter according to the integral result equation group, and perform parameter calibration on the device to be calibrated according to the error parameter.

[0163] The present application provides a device parameter calibration device, which includes: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the device parameter calibration method in the above-mentioned embodiment one.

[0164] Reference below Figure 4 , which shows a schematic diagram of the structure of a device parameter calibration device suitable for implementing the embodiment of the present application. The device parameter calibration device in the embodiment of the present application may include but is not limited to mobile terminals such as mobile phones, laptop computers, digital broadcast receivers, PDAs (Personal Digital Assistants), PADs (Portable Application Descriptions), PMPs (Portable Media Players), vehicle-mounted terminals (such as vehicle-mounted navigation terminals), etc., and fixed terminals such as digital TVs, desktop computers, etc. Figure 4 The device parameter calibration device shown is merely an example and should not bring any limitation to the functions and scope of use of the embodiments of the present application.

[0165] like Figure 4As shown, the device parameter calibration device may include a processing device 1001 (such as a central processing unit, a graphics processor, etc.), which can perform various appropriate actions and processes according to a program stored in a read-only memory (ROM: Read Only Memory) 1002 or a program loaded from a storage device 1003 to a random access memory (RAM: Random Access Memory) 1004. In RAM1004, various programs and data required for the operation of the device parameter calibration device are also stored. The processing device 1001, ROM1002 and RAM1004 are connected to each other through a bus 1005. An input / output (I / O) interface 1006 is also connected to the bus. Generally, the following systems can be connected to the I / O interface 1006: an input device 1007 including, for example, a touch screen, a touch pad, a keyboard, a mouse, an image sensor, a microphone, an accelerometer, a gyroscope, etc.; an output device 1008 including, for example, a liquid crystal display (LCD: Liquid Crystal Display), a speaker, a vibrator, etc.; a storage device 1003 including, for example, a magnetic tape, a hard disk, etc.; and a communication device 1009. The communication device 1009 can allow the device parameter calibration device to communicate with other devices wirelessly or by wire to exchange data. Although the figure shows a device parameter calibration device with various systems, it should be understood that it is not required to implement or have all the systems shown. More or fewer systems can be implemented or provided instead.

[0166] In particular, according to the embodiments disclosed in the present application, the process described above with reference to the flowchart can be implemented as a computer software program. The computer program includes a program code for executing the method shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed from the network through a communication device, or installed from the storage device 1003, or installed from the ROM 1002. When the computer program is executed by the processing device 1001, the above-mentioned functions defined in the method of the embodiment disclosed in the present application are executed.

[0167] The device parameter calibration device provided by the present application adopts the device parameter calibration method in the above embodiment, which can solve the technical problems of low efficiency and high cost of parameter calibration in the prior art. Compared with the prior art, the beneficial effects of the device parameter calibration device provided by the present application are the same as the beneficial effects of the device parameter calibration method provided by the above embodiment, and the other technical features in the device parameter calibration device are the same as the features disclosed in the method of the previous embodiment, which will not be repeated here.

[0168] It should be understood that the various parts disclosed in this application can be implemented by hardware, software, firmware or a combination thereof. In the description of the above embodiments, specific features, structures, materials or characteristics can be combined in any one or more embodiments or examples in a suitable manner.

[0169] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art who is familiar with the present technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

[0170] The present application provides a computer-readable storage medium having computer-readable program instructions (ie, computer programs) stored thereon, wherein the computer-readable program instructions are used to execute the device parameter calibration method in the above-mentioned embodiment.

[0171] The computer-readable storage medium provided in the present application may be, for example, a USB flash drive, but is not limited to electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, systems or devices, or any combination of the above. More specific examples of computer-readable storage media may include, but are not limited to: an electrical connection with one or more wires, a portable computer disk, a hard disk, a random access memory (RAM: Random Access Memory), a read-only memory (ROM: Read Only Memory), an erasable programmable read-only memory (EPROM: Erasable Programmable Read Only Memory or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM: CD-ReadOnly Memory), an optical storage device, a magnetic storage device, or any suitable combination of the above. In this embodiment, the computer-readable storage medium may be any tangible medium containing or storing a program, which may be used by or in combination with an instruction execution system, system or device. The program code contained on the computer-readable storage medium may be transmitted using any appropriate medium, including but not limited to: wires, optical cables, RF (Radio Frequency: Radio Frequency), etc., or any suitable combination of the above.

[0172] The computer-readable storage medium may be included in the device parameter calibration device; or may exist independently without being assembled into the device parameter calibration device.

[0173] Computer program code for performing the operations of the present application may be written in one or more programming languages ​​or a combination thereof, including object-oriented programming languages ​​such as Java, Smalltalk, C++, and conventional procedural programming languages ​​such as "C" or similar programming languages. The program code may be executed entirely on the user's computer, partially on the user's computer, as a separate software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a local area network (LAN) or a wide area network (WAN), or may be connected to an external computer (e.g., via the Internet using an Internet service provider).

[0174] The flow chart and block diagram in the accompanying drawings illustrate the possible architecture, function and operation of the system and method according to various embodiments of the present application. In this regard, each box in the flow chart or block diagram can represent a module, a program segment or a part of a code, and the module, the program segment or a part of the code contains one or more executable instructions for realizing the specified logical function. It should also be noted that in some implementations as replacements, the functions marked in the box can also occur in a sequence different from that marked in the accompanying drawings. For example, two boxes represented in succession can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram and / or flow chart, and the combination of the boxes in the block diagram and / or flow chart can be implemented with a dedicated hardware-based system that performs a specified function or operation, or can be implemented with a combination of dedicated hardware and computer instructions.

[0175] The modules involved in the embodiments described in this application may be implemented by software or hardware, wherein the name of the module does not constitute a limitation on the unit itself in some cases.

[0176] The readable storage medium provided in the present application is a computer-readable storage medium, which stores computer-readable program instructions (i.e., computer programs) for executing the above-mentioned device parameter calibration method, and can solve the technical problems of low efficiency and high cost of parameter calibration in the prior art. Compared with the prior art, the beneficial effects of the computer-readable storage medium provided in the present application are the same as the beneficial effects of the device parameter calibration method provided in the above-mentioned embodiment, and will not be described in detail here.

[0177] The above descriptions are only some embodiments of the present application, and are not intended to limit the patent scope of the present application. All equivalent structural changes made using the contents of the present application specification and drawings under the technical concept of the present application, or direct / indirect applications in other related technical fields are included in the patent protection scope of the present application.

Claims

1. A method for calibrating equipment parameters, characterized in that: The method comprises: After detecting that the device to be calibrated is placed on the target turntable in an arbitrary posture and remains stationary for a preset time, the current observation equation is determined according to the current acceleration measurement value and the initial relative posture between the device to be calibrated and the target turntable; Controlling the target turntable to rotate, and after detecting that the rotated target turntable has been stationary for a preset time, determining a set of target observation equations; Calculate a target rotation matrix based on the current observation equation and the target observation equation set; Solving error parameters according to the target rotation matrix, and performing parameter calibration on the device to be calibrated according to the error parameters; The target observation equation set includes a first observation equation and a second observation equation; the step of calculating a target rotation matrix according to the current observation equation and the target observation equation set includes: Performing subtraction calculation on the current observation equation and the first observation equation to obtain a first observation equation; Performing subtraction calculation on the current observation equation and the second observation equation to obtain a second observation equation; Determine respectively vectors and diagonal matrices having equal modulus values ​​in the first observation equation and the second observation equation; Performing equivalent processing on the first observation equation according to the vector and the diagonal matrix to obtain a first equivalent observation formula; Performing equivalent processing on the second observation equation according to the vector and the diagonal matrix to obtain a second equivalent observation formula; Get the characteristic information of the rotation matrix; A target rotation matrix is ​​calculated according to the characteristic information, the first equivalent observation formula, and the second equivalent observation formula.

2. The method according to claim 1, characterized in that The step of determining the current observation equation according to the current acceleration measurement value and the initial relative posture between the device to be calibrated and the target turntable after detecting that the device to be calibrated is placed on the target turntable in an arbitrary posture and remains stationary for a preset time comprises: When it is detected that the device to be calibrated is placed on the target turntable in any posture, the static time of the target turntable is counted; When the static time of the target turntable reaches a preset time, obtaining the current acceleration measurement value and the initial relative posture between the device to be calibrated and the target turntable; Determine the current error parameter; A current observation equation is generated according to the current acceleration measurement value, the initial relative posture between the device to be calibrated and the target turntable, and the current error parameter.

3. The method according to claim 1, characterized in that The step of controlling the target turntable to rotate and determining a set of target observation equations after detecting that the rotated target turntable remains stationary for a preset time period comprises: Controlling the target turntable to rotate along the first axis by a preset angle, and counting a first static time length of the target turntable after the first rotation; When the first static time reaches a preset time, generating a first observation equation according to the first acceleration measurement value, the first relative posture between the device to be calibrated and the target turntable, and the current error parameter; Control the rotated target turntable to rotate a target angle along the second axis, and count a second static time length of the target turntable after the second rotation; When the second static time reaches a preset time, continue to control the rotated target turntable to rotate along the first axis by a preset angle, and count a third static time of the target turntable after the third rotation; When the third static time reaches a preset time, generating a second observation equation according to the second acceleration measurement value, the second relative posture between the device to be calibrated and the target turntable, and the current error parameter; A target observation equation set is obtained according to the first observation equation and the second observation equation.

4. The method according to claim 1, characterized in that The step of calculating the target rotation matrix according to the characteristic information, the first equivalent observation formula and the second equivalent observation formula comprises: Determine a characteristic expression according to the characteristic information, and determine an equivalent replacement object according to the characteristic expression; Calculate the first equivalent observation formula and the second equivalent observation formula according to the equivalent substitution object to obtain a current expression; A target rotation matrix is ​​calculated according to the current expression based on a preset assumption strategy.

5. The method according to claim 4, characterized in that The step of calculating the target rotation matrix according to the current expression based on a preset assumption strategy includes: Assume the values ​​of multiple parameters based on preset assumption strategies; Generate a first parameter expression according to the current expression and the values ​​of a plurality of parameters; Convert the first parameter expression according to the multiple parameters to obtain a second parameter expression; The second parameter expression is changed according to the first observation equation and the second observation equation to obtain a rotation matrix to solve the equation group; The target rotation matrix is ​​calculated by solving the set of equations according to the rotation matrix.

6. The method according to claim 3, characterized in that The step of solving the error parameter according to the target rotation matrix and calibrating the parameters of the device to be calibrated according to the error parameter comprises: Get the coordinate system of the device to be calibrated; Converting the angular velocity measurement value from the coordinate system of the device to be calibrated to the coordinate system of the target turntable to obtain a target equation; Obtaining a first integral result equation according to the target equation and the first observation equation; Obtaining a second integral result equation according to the target equation and the second observation equation; When the second static time reaches a preset time, a third observation equation is generated according to a third acceleration measurement value, a third relative posture between the device to be calibrated and the target turntable, and a current error parameter, and a third integral result equation is obtained according to the target equation and the third observation equation; According to the first integral result equation, the second integral result equation and the third integral result equation, an integral result equation group is formed; The error parameters are solved according to the integral result equation group, and the parameters of the device to be calibrated are calibrated according to the error parameters.

7. A device for calibrating equipment parameters, characterized in that: The device comprises: A detection module is used to determine a current observation equation according to a current acceleration measurement value and an initial relative posture between the device to be calibrated and the target turntable after detecting that the device to be calibrated is placed on the target turntable in an arbitrary posture and remains stationary for a preset time; A determination module, used for controlling the target turntable to rotate, and determining a set of target observation equations after detecting that the rotated target turntable has been stationary for a preset time period; A calculation module, used for calculating a target rotation matrix according to the current observation equation and the target observation equation set; A calibration module, used to solve error parameters according to the target rotation matrix, and perform parameter calibration on the device to be calibrated according to the error parameters; The target observation equation set includes a first observation equation and a second observation equation; the calculation module is also used to perform subtraction calculation on the current observation equation and the first observation equation to obtain a first observation equation; perform subtraction calculation on the current observation equation and the second observation equation to obtain a second observation equation; respectively determine the vectors and diagonal matrices with equal modulus values ​​in the first observation equation and the second observation equation; perform equivalent processing on the first observation equation according to the vector and the diagonal matrix to obtain a first equivalent observation formula; perform equivalent processing on the second observation equation according to the vector and the diagonal matrix to obtain a second equivalent observation formula; obtain characteristic information of the rotation matrix; calculate the target rotation matrix according to the characteristic information, the first equivalent observation formula and the second equivalent observation formula.

8. A device parameter calibration device, characterized in that: The device comprises: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the computer program is configured to implement the steps of the device parameter calibration method according to any one of claims 1 to 6.

9. A storage medium, characterized in that: The storage medium is a computer-readable storage medium, and a computer program is stored on the storage medium. When the computer program is executed by a processor, the steps of the device parameter calibration method according to any one of claims 1 to 6 are implemented.

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