A high and low temperature programmable test system and its equipment

Abstract

The present invention discloses a high and low temperature programmable test system and its equipment, including: an equipment unit, which is composed of a table body and a placement rack, and further includes: a test unit, which is arranged on the side of the equipment unit, and the test unit includes a low temperature chamber and a high temperature chamber, and a baffle is movably arranged between the low temperature chamber and the high temperature chamber. The low temperature chamber and the high temperature chamber arranged inside the cabinet exist independently and are separated by a closed baffle, so that the low temperature chamber and the high temperature chamber exist independently. Thus, when the clamping unit drives the test piece to move inside the low temperature chamber or the high temperature chamber, the other chamber starts heating or refrigerating in advance, so that after the test piece is tested in the low temperature chamber or the high temperature chamber, the baffle can be quickly opened, the test piece can be quickly transferred to the inside of the other chamber, and the height control member is closed again to separate the low temperature chamber and the high temperature chamber, thereby reducing the total test time by preheating or refrigerating in advance.

Description

Technical Field

[0001] The present invention relates to the technical field of high and low temperature testing, and particularly to a high and low temperature programmable testing system and its equipment. Background Art

[0002] A high and low temperature test chamber is an experimental device used to simulate tests on materials, products or equipment under different temperature environments to evaluate their performance and reliability. Common tests include environmental adaptability tests, accelerated life tests, reliability tests, and failure analysis tests, etc.

[0003] Chinese Patent CN202310454511.X discloses a high and low temperature test chamber for solid state drives, which relates to the technical field of test chambers. This invention has advantages such as high performance parameters and high space utilization rate; effectively improves the test efficiency of SSD hard drives and greatly saves energy. The solution is as follows: A motor is installed in the front of the left side of the box body, which is connected to an impeller. A volute is provided outside the impeller. The right side of the volute is the air outlet, and a volute air outlet guide baffle is provided; A heater and an evaporator are installed in the rear of the left side of the box body. A first air guide inclined plate is provided above the volute air outlet guide baffle. The right side of the evaporator is the air return port, and a second air guide inclined plate is provided below the air return port; The cavity in the rear of the right side of the box body is the solid state drive test area, and the front of the right side is the first air duct. An inner door is provided between the solid state drive test area and the first air duct. The air outlet is communicated with the first air duct, the first air duct is communicated with the second air duct, the second air duct is communicated with the third air duct, and the third air duct is communicated with the air return port. This invention is used for high and low temperature testing of solid state drives.

[0004] The following problems exist in the above patent and the prior art:

[0005] In high and low temperature situations, it is necessary to repeatedly open and close the door of the high and low temperature oven. Water vapor short circuits are likely to form on the test piece to be tested and the test circuit, causing product damage. Moreover, the test temperature is likely to be distorted when repeatedly opening and closing the door of the high and low temperature oven, and it is impossible to effectively detect and eliminate defective products in high and low temperature environments. Summary of the Invention

[0006] The purpose of this part is to outline some aspects of the embodiments of the present invention and briefly introduce some preferred embodiments. Some simplifications or omissions may be made in this part, as well as in the abstract and title of the present application, to avoid obscuring the purpose of this part, the abstract and the title. However, such simplifications or omissions shall not be used to limit the scope of the present invention.

[0007] To solve the above technical problems, the present invention provides the following technical solutions:

[0008] A high and low temperature programmable testing system, characterized in that the system includes: an equipment unit, the equipment unit is composed of a table body and a placement rack, and is characterized in that it further includes:

[0009] The test unit is arranged on the side of the device unit. The test unit includes a low-temperature chamber and a high-temperature chamber, and a baffle is movably arranged between the low-temperature chamber and the high-temperature chamber.

[0010] As a preferred solution of the high and low temperature programmable test system of the present invention, wherein: the low-temperature chamber is arranged at the bottom of the high-temperature chamber, a heating element is fixedly installed on the side wall of the high-temperature chamber, an outer door is rotatably installed on the side of the low-temperature chamber and the high-temperature chamber, a power chamber is arranged at the top of the cabinet body, a height control element is fixedly connected inside the power chamber, and the output shaft of the height control element passes through the power chamber and is movably connected with the installation chamber;

[0011] A rotary power source is fixedly installed inside the installation chamber, exhaust components are arranged at the positions corresponding to the surfaces of the cabinet body of the low-temperature chamber and the high-temperature chamber, and a refrigerating component is arranged on the side of the low-temperature chamber.

[0012] As a preferred solution of the high and low temperature programmable test system of the present invention, wherein: the baffle includes two baffle control sources, and the two baffle control sources are symmetrically and fixedly installed on the surface of the cabinet body;

[0013] The output shaft of the baffle control source is fixedly connected with a baffle plate through a connecting block, the baffle plate movably passes through the cabinet body and is arranged between the low-temperature chamber and the high-temperature chamber, and the baffle plates are symmetrically arranged inside the cabinet body.

[0014] As a preferred solution of the high and low temperature programmable test system of the present invention, wherein: an elastic chamber is opened in the middle of the inner side of the baffle plate, the left baffle plate is movably connected with a middle insertion plate through the elastic chamber, the right baffle plate is movably connected with a docking plate through the elastic chamber, and springs are arranged between the outer sides of the middle insertion plate and the docking plate and the docking plate;

[0015] A receiving chamber for movably receiving the middle insertion plate is arranged inside the docking plate, semi-circular bayonets are symmetrically opened on the opposite surfaces of the middle insertion plate and the docking plate, and the circle formed by the closure of the semi-circular bayonets is matched with the outer diameter of the output shaft of the height control element.

[0016] As a preferred solution of the high and low temperature programmable test system of the present invention, wherein: the output shaft of the rotary power source is fixedly connected with a hollow tube, an unfolding control source is fixedly connected to the side of the hollow tube, the output shaft of the unfolding control source is movably connected with a sleeve block, and the sleeve block is slidably sleeved on the surface of the hollow tube;

[0017] A plurality of notches are annularly arranged on the surface of the sleeve block, and a transverse shaft is arranged horizontally inside the notches

[0018] Another object of the present invention is to provide a high and low temperature programmable test device for the deficiencies of the prior art, which includes the following steps:

[0019] A clamping unit, the clamping unit is movably arranged inside the cabinet body, the clamping unit includes a disc body, several unfolding cavities are arranged inside the disc body, a bottom plate is movably arranged inside the unfolding cavity, a workpiece to be tested is clamped on the surface of the bottom plate, air guiding plates are movably arranged on the left and right sides inside the bottom plate, an adsorption cavity is arranged between the air guiding plates, and an adsorption plate is installed inside the adsorption cavity.

[0020] As a preferred scheme of the high and low temperature programmable testing equipment of the present invention, wherein: the horizontal axis is movably connected to the horizontal rotating shaft inside the connecting seat through a control rod, a plugging plate is fixedly connected to the bottom of the connecting seat, and several through slots are arranged on the surface of the disc body along the circumferential direction of its surface;

[0021] The part of the through slot arranged inside the disc body is fixedly connected with an open cavity, the plugging plate is movably arranged inside the open cavity, a sliding block is slidably arranged inside the through slot, and the plugging plate is fixedly connected to the bottom plate through the sliding block.

[0022] As a preferred scheme of the high and low temperature programmable testing equipment of the present invention, wherein: several partition plates are evenly arranged at the bottom of the disc body, a hollow tube is fixedly connected to the middle of the partition plate, a top fan plate is fixedly connected to the bottom between adjacent partition plates, and a fan-shaped unfolding cavity is jointly formed by the disc body, the hollow tube, the partition plate and the top fan plate;

[0023] The internal shape of the unfolding cavity matches the shape of the bottom plate.

[0024] As a preferred scheme of the high and low temperature programmable testing equipment of the present invention, wherein: an outer arc plate and an inner inserting block are fixedly arranged on the bottom surface of the bottom plate opposite to the through slot, and the outer arc plate is arranged on the outer side of the bottom plate;

[0025] An outer card slot is arranged on the inner side of the outer arc plate, the inner inserting block is arranged on the inner side of the bottom plate, an adsorption cavity is opened in the middle of the inner inserting block, a moisture absorption paper with through holes evenly opened on the surface is arranged inside the adsorption plate, an inner card slot is opened at the position of the inner inserting block corresponding to the outer card slot, and the workpiece to be tested is clamped between the outer card slot and the inner card slot.

[0026] As a preferred scheme of the high and low temperature programmable testing equipment of the present invention, wherein: air vents are opened on both the left and right sides of the adsorption cavity, a storage cavity is opened on the surface of the inner inserting block corresponding to the air vents, a pull sealing plate is movably installed inside the storage cavity, and movable slots for the pull sealing plate to move are opened at the upper and lower parts of the air vents;

[0027] The outer surface of the sealing plate is fixedly connected with a convex block. A transfer port is formed on one side of the air guide plate close to the air outlet. The transfer port is movably connected with the convex block through a vertically arranged rotating shaft inside it. A control shaft is fixedly connected to the middle of the air guide plate. The control shaft passes through the bottom plate and is slidably arranged inside the sliding groove. The sliding groove is formed on the surface of the disk body. A side rack is fixedly arranged on the surface of the disk body. The control shaft is meshed with the side rack through a triggering member on its surface.

[0028] Advantages of the present invention:

[0029] First, insert several test pieces to be tested into the independent outer card slot and inner card slot. At this time, the output shaft of the deployment control source extends. The output shaft of the deployment control source pushes the sleeve block to slide along the hollow tube, so that the sleeve block drives the control rod at its bottom to move outwards. Thus, the control rod drives the plugging plate and the slider to move outwards along the through slot, so that the slider drives the bottom plate to extend. Furthermore, when the test piece clamped on the surface of the bottom plate extends out of the deployment cavity, it should be noted that the maximum distance for the test piece to extend out of the deployment cavity is such that the adsorption cavity is always inside the deployment cavity, and the top of the adsorption cavity is blocked by the top fan plate.

[0030] Second, start the rotation power source. The rotation power source drives the disk body to rotate through the hollow tube. The rotating disk body will drive the test piece to fully contact the air inside the test space, so that the test piece is evenly heated or cooled, reducing the temperature difference caused by different positions and preventing local temperature differences. Of course, to further improve the uniformity of heating or cooling of the test piece, the rotation power source can be set to rotate forward by a set number of turns and then reverse by a set number of turns. Thus, during the forward and reverse rotation of the rotation power source, different surfaces of the test piece can contact the air on the forward side of the rotation of the disk body, reducing the temperature difference between different surfaces, thereby reducing the fluctuation of the electrical performance parameters of the test piece caused by the temperature difference change. The rotation power source drives several different test pieces to move, which can simulate the dynamic environmental changes that the product may encounter during actual use, making the test data more comprehensive and reducing the test deviation.

[0031] III. The low-temperature chamber and the high-temperature chamber provided inside the cabinet exist independently and are separated by a closed partition baffle, so that the low-temperature chamber and the high-temperature chamber exist independently. The clamping unit can be controlled by the push-pull of the height control member to be positioned in the low-temperature chamber or the high-temperature chamber. Thus, when the clamping unit drives the test piece to move inside the low-temperature chamber or the high-temperature chamber, the other chamber starts heating or refrigeration in advance, so that after the test piece is tested in the low-temperature chamber or the high-temperature chamber, the partition baffle can be quickly opened, the test piece can be quickly transferred to the inside of the other chamber, and the height control member is closed again to separate the low-temperature chamber and the high-temperature chamber. Therefore, the total test time is reduced by preheating or refrigeration in advance. The disk body can be provided with outer clamping grooves and inner clamping grooves to test multiple test pieces at the same time, thereby improving the test speed of multiple test pieces.

[0032] IV. When the height control member drives the test piece to move between the low-temperature chamber and the high-temperature chamber, it will be affected by the temperature difference, resulting in water droplets condensing on the surface of the test piece. Therefore, before the test piece switches between the low-temperature chamber and the high-temperature chamber, the expansion control source will pull the sleeve block and the control rod to lift, so that the control rod pulls the plugging plate to insert into the opening cavity, sealing the bottom of the disk body. When the plugging plate inserts into the opening cavity, it will pull the bottom plate to move into the expansion cavity through the slider, making the outer arc plate, the partition plate and the top fan plate contact and seal. With the heat insulation and heat preservation materials of the partition plate, the top fan plate, the outer arc plate, the bottom plate and the inner plug block, the condensed water generated on the surface of the test piece during the conversion between the low-temperature chamber and the high-temperature chamber is reduced.

[0033] V. When the clamping unit drives the test piece received in the expansion cavity to transfer chambers, the rotation power source is started to drive the disk body to rotate. First, the entire surface of the clamping unit can be fully contacted with the air in the chamber to be transferred, reducing the external temperature difference of the clamping unit. At the same time, the condensed water attached to the surface of the clamping unit will be thrown off during the rotation of the clamping unit, thus ensuring the safety of the test piece.

[0034] VI. When the disk body rotates for a preset time under the control of the rotation power source, the expansion control source pushes the sleeve block to move a preset distance and will stay for a set time after the expansion control source pushes the sleeve block to move a preset distance. When the expansion control source pushes the sleeve block to move a preset distance, the bottom plate will gradually extend out of the surface of the expansion cavity along the through groove, so that a small amount of external air can enter the side of the test piece through the gap between the outer arc plate and the expansion cavity, reducing the overall exposure of the test piece. Thus, under the action of the temperature difference, condensed water quickly condenses on the surface of the test piece, affecting the safety of the test piece. By slowly pushing the bottom plate out of the expansion cavity by the expansion control source, with the increase of the exposed gap between the outer arc plate and the expansion cavity, the surface temperature of the test piece can be adjusted step by step, so that the surface temperature of the test piece drops or rises more stably, thus avoiding the generation of a large amount of condensed water and reducing the accumulation of thermal stress.

[0035] VII. As the base plate moves outward in the unfolding cavity, it drives the trigger member to engage with the side rack, causing the trigger member to rotate. The rotating trigger member drives the air guide plate to rotate through the control shaft, and then the air guide plate gradually opens outward. Thus, as the base plate moves outward, the air guide plate will always, in cooperation with the rotation of the disc body, obliquely guide the air entering the interior of the base plate, so that the air passes through the air guide plate and enters the interior of the adsorption cavity through the air outlet to contact the adsorption plate. Therefore, the temperature difference water vapor driven by the air will be adsorbed by the adsorption plate. Through the guidance of the air guide plate on the other side of the adsorption cavity and combined with the driving force generated by the rotation of the disc body, the air passing through the adsorption plate and reaching the air guide plate on the other side is discharged through the space between the outer arc plate and the unfolding cavity, thus completing the air circulation. This improves the temperature adjustment effect on the test piece caused by the stepped unfolding, and with the outward movement of the base plate and the guidance of the unfolding air guide plate, the air reaching the inner top of the base plate can be quickly circulated, thereby reducing the large amount of water vapor aggregation caused by the air gathering on the test piece or the thermal stress aggregation caused by the rapid temperature rise.

[0036] VIII. As the base plate unfolds, the surface of the test piece gradually approaches the temperature outside the disc body. At this time, the outer side of the unfolding air guide plate continues to unfold and contacts the partition plate. As the air guide plate continuously unfolds, it pulls the sealing plate to move inside the air outlet through the convex block, and then the air outlet gradually shrinks as the base plate unfolds. When the test piece is on the side of the rotating disc body, the shrinking air outlet increases the air flow rate passing through the air outlet, thereby reducing the influence of the increasing space driven by the gradual unfolding of the base plate on the air circulation of the air outlet. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] To more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for the description of the embodiments. Among them:

[0038] Figure 1 is a schematic diagram of the overall structure of the present invention;

[0039] Figure 2 is a schematic diagram of the comparison of the side view of the test unit of the present invention;

[0040] Figure 3 is a schematic diagram of the internal structure connection of the power cavity of the present invention;

[0041] Figure 4 is a schematic diagram of the structural connection of the grading member of the present invention;

[0042] Figure 5 is a schematic diagram of the internal structure connection of the grading member of the present invention;

[0043] Figure 6 is Figure 5 an enlarged schematic diagram of part A in

[0044] Figure 7 Schematic diagram of the internal structure connection of the test unit of the present invention;

[0045] Figure 8 For Figure 7 Enlarged structural schematic diagram of part B in

[0046] Figure 9 Schematic diagram of the structural connection of the clamping unit of the present invention;

[0047] Figure 10 Schematic diagram of the internal structure connection of the clamping unit of the present invention;

[0048] Figure 11 For Figure 10 Enlarged structural schematic diagram of part C in

[0049] Figure 12 Schematic diagram of the separation of the plugging board and the plugging board of the present invention;

[0050] Figure 13 For Figure 13 Enlarged structural schematic diagram of part D in

[0051] Figure 14 Schematic diagram of the structural connection of the bottom of the disc body of the present invention;

[0052] Figure 15 Schematic diagram of the internal structure connection of the unfolding cavity of the present invention;

[0053] Figure 16 For Figure 15 Enlarged structural schematic diagram of part E in

[0054] Figure 17 Schematic diagram of the connection between the disc body and the bottom plate of the present invention;

[0055] Figure 18 Schematic diagram of the structural connection of the bottom plate of the present invention;

[0056] Figure 19 For Figure 18 Enlarged structural schematic diagram of part F in

[0057] Figure 20 Schematic diagram of the structural connection of the unfolded bottom plate of the present invention;

[0058] Figure 21 Schematic diagram of the process of the present invention.

[0059] In the figure:

[0060] 1. Equipment unit; 101. Table body; 102. Placing rack;

[0061] 2. Test unit; 201. Cabinet; 2011. Low temperature chamber; 2012. High temperature chamber; 20121. Heating element; 2013. Outward opening door; 2014. Power chamber; 20141. Height control element; 2015. Refrigeration element; 2016. Exhaust element; 202. Partition element; 2021. Partition control source; 20211. Connecting block; 2022. Partition plate; 2023. Elastic chamber; 2024. Middle plug-in board; 2025. Docking plate; 20251. Accommodating chamber; 2026. Semicircular bayonet; 203. Installation chamber; 2031. Rotating power source; 2032. Hollow tube; 2033. Expanding control source; 2034. Block; 2035. Notch; 20351. Horizontal axis; 20352. Control rod;

[0062] 3. Clamping unit; 301. Plate; 3011. Side rack; 3012. Through slot; 3013. Partition plate; 3014. Top fan plate; 30141. Soft sleeve; 3015. Sliding slot; 302. Inserting plate; 3021. Opening cavity; 3022. Sliding block; 3023. Connecting seat; 303. Bottom plate; 3031. Outer arc plate; 30311. Outer clamping slot; 3032 , inner plug-in block; 30321, adsorption cavity; 30322, adsorption plate; 30323, inner card slot; 30324, storage cavity; 30325, air outlet; 30326, movable slot; 304, expansion cavity; 305, part to be tested; 306, air induction plate; 3061, control shaft; 30611, trigger part; 3062, transfer port; 3063, bump; 30631, sealing plate. DETAILED DESCRIPTION

[0063] Embodiment 1: Figure 1-9 As shown, a high and low temperature program-controlled test system, the system comprises: an equipment unit 1, the equipment unit 1 is composed of a platform 101 and a placement rack 102, the computer and the voltage detection instrument are respectively installed on the surface of the platform 101 and the placement rack 102, the top of the platform 101 is fixedly connected with the placement rack 102, and it is characterized in that it also includes:

[0064] The test unit 2 is arranged on the side of the equipment unit 1, and the test unit 2 includes a low-temperature chamber 2011 and a high-temperature chamber 2012, and a dividing member 202 is movably arranged between the low-temperature chamber 2011 and the high-temperature chamber 2012.

[0065] Preferably, the low-temperature chamber 2011 is arranged at the bottom of the high-temperature chamber 2012. A heating element 20121 is fixedly installed on the side wall of the high-temperature chamber 2012. The heating element 20121 is preferably a resistance electric heating tube, which is controlled by a computer in the instruction control module and powered by an external energy source. An external opening door 2013 is rotatably installed on the side parts of the low-temperature chamber 2011 and the high-temperature chamber 2012. A power chamber 2014 is arranged at the top of the cabinet body 201. A height control element 20141 is fixedly connected inside the power chamber 2014. The height control element 20141 is preferably an oil cylinder or an electric telescopic rod, which is controlled by a computer in the instruction control module and powered by an external energy source. The output shaft of the height control element 20141 passes through the power chamber 2014 and is movably connected with the installation chamber 203;

[0066] A rotation power source 2031 is fixedly installed inside the installation chamber 203. The rotation power source 2031 is preferably a servo motor, which is controlled by a computer in the instruction control module and powered by an external energy source. The test electrical appliance is controlled by controlling the high and low levels output from the computer port in the instruction control module. Exhaust parts 2016 are arranged at the corresponding positions of the low-temperature chamber 2011 and the high-temperature chamber 2012 on the surface of the cabinet body 201. The exhaust parts 2016 are preferably air extraction pumps. The exhaust parts 2016 are respectively connected to the low-temperature chamber 2011 and the high-temperature chamber 2012 through pipelines. A solenoid valve is installed in the middle of the pipeline. When the exhaust parts 2016 do not work, the pipeline, the low-temperature chamber 2011 and the high-temperature chamber 2012 are sealed by the solenoid valve. The solenoid valve is controlled by a computer in the instruction control module. A refrigeration element 2015 is arranged on the side part of the low-temperature chamber 2011. The refrigeration element 2015 is preferably composed of a compressor, a condenser, an evaporator and an expansion valve. Of course, in order to improve the effects of the refrigeration element 2015 and the heating element 20121, circulation fans and temperature sensors can be installed inside the low-temperature chamber 2011 and the high-temperature chamber 2012 and be controlled by a computer in the instruction control module.

[0067] Preferably, the gear shifting element 202 includes two gear shifting control sources 2021, and the two gear shifting control sources 2021 are symmetrically and fixedly installed on the surface of the cabinet body 201; The gear shifting control source 2021 is preferably a cylinder or an electric telescopic rod, which is controlled by a computer in the instruction control module in cooperation with a drive controller and powered by an external energy source. The output shaft of the gear shifting control source (2021) is fixedly connected with a gear shifting plate (2022) through a connecting block (20211). A sealing strip is horizontally wrapped on the outer side of the gear shifting plate 2022. The gear shifting plate 2022 movably passes through the cabinet body 201 and is arranged between the low-temperature chamber 2011 and the high-temperature chamber 2012. The gear shifting plates 2022 are symmetrically arranged inside the cabinet body 201.

[0068] Preferably, an elastic cavity 2023 is formed in the middle of the inner side of the partition baffle 2022. The left partition baffle 2022 is movably connected to the middle insertion plate 2024 through the elastic cavity 2023, and the right partition baffle 2022 is movably connected to the docking plate 2025 through the elastic cavity 2023. Springs are arranged between the outer sides of the middle insertion plate 2024 and the docking plate 2025 and the docking plate 2025.

[0069] An accommodation cavity 20251 for movably accommodating the middle insertion plate 2024 is arranged inside the docking plate 2025. Semi-circular bayonets 2026 are symmetrically formed on the opposite surfaces of the middle insertion plate 2024 and the docking plate 2025. The circle formed by the closure of the semi-circular bayonets 2026 matches the outer diameter of the output shaft of the height control member 20141, and the inner circular opening of the semi-circular bayonet 2026 is coated with a rubber sealing layer. Thus, when the output shaft of the height control member 20141 drives the clamping unit 3 to move into the low-temperature cavity 2011, the partition baffle 2022 closes, and the semi-circular bayonet 2026 is clamped onto the surface of the output shaft of the height control member 20141, realizing the separation of the low-temperature cavity 2011 and the high-temperature cavity 2012 when the clamping unit 3 is transferred to the low-temperature cavity 2011.

[0070] Preferably, the output shaft of the rotary power source 2031 is fixedly connected to the hollow tube 2032. An expansion control source 2033 is fixedly connected to the side of the hollow tube 2032. The output shaft of the expansion control source 2033 is movably connected to a sleeve block 2034. The sleeve block 2034 is slidably sleeved on the surface of the hollow tube 2032. The expansion control source 2033 is preferably an electric telescopic rod, which is controlled by a computer in the command control module and powered by an external energy source.

[0071] A plurality of notches 2035 are annularly arranged on the surface of the sleeve block 2034, and a transverse shaft 20351 is arranged inside the notch 2035.

[0072] As Figure 1-20 shown, a high and low temperature programmable test device includes: a clamping unit 3, the clamping unit 3 is movably arranged inside the cabinet body 201. The clamping unit 3 includes a disc body 301. A plurality of expansion cavities 304 are arranged inside the disc body 301. A bottom plate 303 is movably arranged inside the expansion cavity 304. A test piece 305 is clamped on the surface of the bottom plate 303. Air guide plates 306 are movably arranged on the left and right sides inside the bottom plate 303. An adsorption cavity 30321 is arranged between the air guide plates 306, and an adsorption plate 30322 is installed inside the adsorption cavity 30321.

[0073] Preferably, the horizontal axis 20351 is movably connected through a control rod 20352 and a horizontal rotating shaft inside the connecting seat 3023. A plugging plate 302 is fixedly connected to the bottom of the connecting seat 3023. A plurality of through grooves 3012 are arranged on the surface of the disc body 301 along the circumferential direction of its surface;

[0074] The part of the through groove 3012 arranged inside the disc body 301 is fixedly connected with an open cavity 3021. The plugging plate 302 is movably arranged inside the open cavity 3021. A rubber sealing layer is covered on the connecting part of the plugging plate 302 and the open cavity 3021. A slider 3022 is slidably arranged inside the through groove 3012. The plugging plate 302 is fixedly connected to the bottom plate 303 through the slider 3022.

[0075] Preferably, a plurality of partition plates 3013 are evenly arranged at the bottom of the disc body 301. A hollow tube 2032 is fixedly connected to the middle of the partition plate 3013. A top fan plate 3014 is fixedly connected to the bottom between adjacent partition plates 3013. The disc body 301, the hollow tube 2032, the partition plate 3013 and the top fan plate 3014 together enclose a fan-shaped unfolding cavity 304. A soft sleeve 30141 is opened at the bottom of the top fan plate 3014. The soft sleeve 30141 is made of rubber material. A tie strap is annularly arranged on the surface of the soft sleeve 30141. The soft sleeve 30141 is used for draining water vapor;

[0076] The internal shape of the unfolding cavity 304 matches the shape of the bottom plate 303.

[0077] Preferably, an outer arc plate 3031 and an inner insertion block 3032 are fixedly arranged on the bottom surface of the bottom plate 303 opposite to the through groove 3012. The outer arc plate 3031 is arranged on the outside of the bottom plate 303. The outer arc plate 3031, the bottom plate 303 and the inner insertion block 3032 are movably sealed with the partition plate 3013 and the top fan plate 3014 through the rubber layers attached to their surfaces;

[0078] An outer card slot 30311 is provided on the inner side of the outer arc plate 3031. The inner insertion block 3032 is arranged on the inner side of the bottom plate 303. An adsorption cavity 30321 is formed in the middle of the inner insertion block 3032. A moisture-absorbing paper with uniformly distributed through holes on its surface is arranged inside the adsorption plate 30322. An inner card slot 30323 is formed at a position of the inner insertion block 3032 corresponding to the outer card slot 30311. A test piece 305 is clamped between the outer card slot 30311 and the inner card slot 30323. To reduce the influence of the rotation of the disc body 301 on the connecting wires of the test piece 305, a Bluetooth module can be arranged on the surface of the bottom plate 303, so that the voltage signal data of the test piece 305 can communicate between the Bluetooth module connected to the external control instruction module through the Bluetooth module, and the data detected on the test piece 305 can be viewed by a computer. The Bluetooth module can select the E104-BT53C3 series Bluetooth module.

[0079] Preferably, air inlets 30325 are formed on both the left and right sides of the adsorption cavity 30321. A storage cavity 30324 is formed on the surface of the inner insertion block 3032 corresponding to the air inlets 30325. A pull sealing plate 30631 is movably installed inside the storage cavity 30324. Moving grooves 30326 for accommodating the movement of the pull sealing plate 30631 are formed in the upper and lower parts of the air inlets 30325.

[0080] A convex block 3063 is fixedly connected to the outer surface of the pull sealing plate 30631. A transfer port 3062 is formed on one side of the air guiding plate 306 close to the air inlets 30325. The transfer port 3062 is movably connected to the convex block 3063 through a vertically arranged rotating shaft inside it. A control shaft 3061 is fixedly connected to the middle of the air guiding plate 306. The control shaft 3061 passes through the bottom plate 303 and is slidably arranged inside the sliding groove 3015. The sliding groove 3015 is formed on the surface of the disc body 301. A side rack 3011 is fixedly arranged on the surface of the disc body 301. The control shaft 3061 is engaged with the side rack 3011 through a triggering member 30611 on its surface. The triggering member 30611 is preferably a gear.

[0081] The partition plate 2022, the middle insertion plate 2024, the docking plate 2025, the disc body 301, the partition plate 3013, the top fan plate 3014, the outer arc plate 3031 and the bottom plate 303 are all preferably made of aerogel plates or are covered with multiple layers of heat insulation layers on their surfaces.

[0082] Operation process:

[0083] By inserting a number of test pieces 305 to be tested into the independent outer card slot 30311 and the inner card slot 30323, at this time, the output shaft of the deployment control source 2033 extends, causing the output shaft of the deployment control source 2033 to push the sleeve block 2034 to slide along the hollow tube 2032, so that the sleeve block 2034 drives the control rod 20352 at its bottom to move outward, thereby causing the control rod 20352 to drive the plugging plate 302 and the slider 3022 to move outward along the through slot 3012, so that the slider 3022 drives the bottom plate 303 to extend. Furthermore, when the test piece 305 clamped on the surface of the bottom plate 303 extends out of the deployment cavity 304, it should be noted that the maximum distance that the test piece 305 extends out of the deployment cavity 304, the adsorption cavity 30321 is always inside the deployment cavity 304, so that the top of the adsorption cavity 30321 is blocked by the top fan plate 3014;

[0084] Then start the rotation power source 2031, so that the rotation power source 2031 drives the disk body 301 to rotate through the hollow tube 2032, and the rotating disk body 301 will drive the test piece 305 to fully contact the air inside the test space, so that the test piece 305 is evenly heated or cooled, reducing the temperature difference caused by different positions and preventing local temperature differences. Of course, to further improve the uniformity of heating or cooling of the test piece 305, the rotation power source 2031 can be reversed by a set number of turns after rotating forward by a set number of turns. Furthermore, during the forward and reverse rotation of the rotation power source 2031, different surfaces of the test piece 305 can be in contact with the air on the forward side of the rotation of the disk body 301, reducing the temperature difference between different surfaces, thereby reducing the fluctuations in the electrical performance parameters of the test piece 305 caused by temperature difference changes. The rotation power source 2031 drives a number of different test pieces 305 to move, which can simulate the dynamic environment changes that the product may encounter during actual use, making the test data more comprehensive and reducing test deviations;

[0085] The low-temperature chamber 2011 and the high-temperature chamber 2012 provided inside the cabinet body 201 exist independently and are separated by a closed partition baffle 2022. Thus, the low-temperature chamber 2011 and the high-temperature chamber 2012 exist independently. The clamping unit 3 can be controlled to be positioned in the low-temperature chamber 2011 or the high-temperature chamber 2012 under the push-pull control of the height control member 20141. When the clamping unit 3 drives the test piece 305 to move inside the low-temperature chamber 2011 or the high-temperature chamber 2012, the other chamber can be pre-started for heating or cooling. After the test piece 305 is tested in the low-temperature chamber 2011 or the high-temperature chamber 2012, the partition baffle 2022 can be quickly opened, so that the test piece 305 can be quickly transferred to the inside of the other chamber, and then the height control member 20141 is closed again to separate the low-temperature chamber 2011 and the high-temperature chamber 2012. Thus, the total test time is reduced by preheating or pre-cooling. The disc body 301 can be provided with an outer card slot 30311 and an inner card slot 30323 to test multiple test pieces 305 simultaneously, thereby improving the test speed of multiple test pieces 305.

[0086] When the height control member 20141 drives the test piece 305 to move between the low-temperature chamber 2011 and the high-temperature chamber 2012, it will be affected by the temperature difference, resulting in water droplets condensing on the surface of the test piece 305. Therefore, before the test piece 305 switches between the low-temperature chamber 2011 and the high-temperature chamber 2012, the expansion control source 2033 will pull the sleeve block 2034 and the control rod 20352 upward, so that the control rod 20352 pulls the plugging plate 302 to insert into the opening cavity 3021, sealing the bottom of the disc body 301. When the plugging plate 302 inserts into the opening cavity 3021, it will pull the bottom plate 303 to move into the expansion cavity 304 through the slider 3022, making the outer arc plate 3031, the partition plate 3013 and the top fan plate 3014 contact and seal. With the heat-insulating and heat-preserving materials of the partition plate 3013, the top fan plate 3014, the outer arc plate 3031, the bottom plate 303 and the inner plug 3032, the condensed water generated on the surface of the test piece 305 during the conversion between the low-temperature chamber 2011 and the high-temperature chamber 2012 can be reduced.

[0087] When the clamping unit 3 drives the test piece 305 received in the expansion cavity 304 to transfer chambers, the rotation power source 2031 will be started to drive the disc body 301 to rotate. First, the entire surface of the clamping unit 3 can be fully contacted with the air in the chamber to be transferred, reducing the external temperature difference of the clamping unit 3. At the same time, the condensed water attached to the surface of the clamping unit 3 will be thrown off during the rotation of the clamping unit 3, thus ensuring the safety of the test piece 305.

[0088] When the disk body 301 rotates for a preset time under the control of the rotation power source 2031, the deployment control source 2033 pushes the sleeve block 2034 to move a preset distance and will stay for a set time after the deployment control source 2033 pushes the sleeve block 2034 to move a preset distance. When the deployment control source 2033 pushes the sleeve block 2034 to move a preset distance, the bottom plate 303 will gradually extend out of the surface of the deployment cavity 304 along the through groove 3012, so that a small amount of external air can enter the side of the test piece 305 through the gap between the outer arc plate 3031 and the deployment cavity 304, thereby reducing the overall exposure of the test piece 305. Under the action of the temperature difference, condensed water will quickly condense on the surface of the test piece 305, which will affect the safety of the test piece 305. By slowly pushing the bottom plate 303 out of the deployment cavity 304 by the deployment control source 2033, with the increase of the exposure gap between the outer arc plate 3031 and the deployment cavity 304, the surface temperature of the test piece 305 can be adjusted step by step, so that the surface temperature of the test piece 305 drops or rises more stably, thereby avoiding the generation of a large amount of condensed water and reducing the accumulation of thermal stress;

[0089] As the bottom plate 303 moves outward in the deployment cavity 304, it will drive the trigger member 30611 to engage with the side rack 3011, so that the trigger member 30611 rotates. The rotating trigger member 30611 drives the air guide plate 306 to rotate through the control shaft 3061, and then the air guide plate 306 gradually opens outward. As the bottom plate 303 moves outward, the air guide plate 306 will always obliquely guide the air entering the inside of the bottom plate 303 in cooperation with the rotation of the disk body 301. The air passes through the air inlet 30325 under the guidance of the air guide plate 306 and enters the inside of the adsorption cavity 30321 to contact the adsorption plate 30322. The temperature difference water vapor carried by the air will be adsorbed by the adsorption plate 30322. Through the guidance of the air guide plate 306 on the other side of the adsorption cavity 30321 and combined with the driving force generated by the rotation of the disk body 301, the air passing through the adsorption plate 30322 and reaching the air guide plate 306 on the other side is discharged through the space between the outer arc plate 3031 and the deployment cavity 304, thus completing the air circulation, thereby improving the temperature adjustment effect of the temperature change caused by the stepped deployment on the test piece 305. With the outward movement of the bottom plate 303 and the guidance of the deployed air guide plate 306, the air reaching the inner top of the bottom plate 303 can be quickly circulated, thereby reducing the accumulation of a large amount of water vapor brought by the air gathering on the test piece 305 or the accumulation of thermal stress caused by rapid temperature rise;

[0090] As the bottom plate 303 unfolds, the surface temperature of the device under test 305 gradually approaches the temperature outside the disc body 301. At this time, the outer side of the air guiding plate 306 continues to unfold and contacts the partition plate 3013. As the air guiding plate 306 continues to unfold, it will pull the sealing plate 30631 to move inside the air outlet 30325 through the bump 3063. As a result, the air outlet 30325 gradually shrinks as the bottom plate 303 unfolds. During the rotation of the disc body 301, the reduced air outlet 30325 increases the air flow rate passing through the air outlet 30325, thereby reducing the influence of the increased space driven by the gradual unfolding of the bottom plate 303 on the air circulation of the air outlet 30325.

[0091] Embodiment 2: Refer to Figure 21 As shown in the figure, the difference between this embodiment and the above embodiments is:

[0092] A programmed operation process, which includes: a control instruction module, a relay module, and an independent test module;

[0093] The control instruction module is used to send control instructions, enabling the relay module to process and transmit the control signal, making the independent test module conduct signals with an external electrical performance detection instrument, and sending SCPI instructions after conduction, enabling the detection instrument to switch to the parameters corresponding to the SCPI instructions to test the product under test;

[0094] The relay module is used for the transmission of control instruction signals and the protection circuit; the independent test module uses independent inputs to test multiple different products.

[0095] The control instruction signal is sent by the computer in the control instruction module. In the initial stage, the control signal is sent by the computer in the control module, passed through the intermediate relay in the relay module, and then transmitted to the subsequent power relay. As a result, the intermediate relay and the subsequent power relay are closed after receiving the signal, enabling the test communication signal in the independent test module to establish a communication connection with the external test device. This communication connection is preferably through Bluetooth. After the test line communication connection is completed, the control instruction module sends SCPI instructions. It should be noted that the SCPI instructions are the SCPI instruction sets provided by each instrument manufacturer. The test device instrument is controlled by the SCPI instructions to monitor various parameters of the product under test. The control instruction module can detect multiple products, and each product test is through an independent communication channel, making multiple test channel routes independent of each other and not interfering with each other. The relay module cooperates with the opening and closing of different independent modules to cooperate with external instruments to detect the voltage signal changes of the input and output of the products corresponding to different independent test modules.

Claims

1. A high and low temperature programmable test device is applied to a high and low temperature programmable test system, and the system includes: A test unit (2), the test unit (2) includes a low temperature chamber (2011) and a high temperature chamber (2012), and a grading member (202) is movably arranged between the low temperature chamber (2011) and the high temperature chamber (2012); The low temperature chamber (2011) is arranged at the bottom of the high temperature chamber (2012), and the output shaft of the height control member (20141) is movably connected to the installation cavity (203); A rotary power source (2031) is fixedly installed inside the installation cavity (203), the output shaft of the rotary power source (2031) is fixedly connected to the hollow tube (2032), a deployment control source (2033) is fixedly connected to the side of the hollow tube (2032), the output shaft of the deployment control source (2033) is movably connected to a sleeve block (2034), and the sleeve block (2034) is movably connected to the connection seat (3023) through a control rod (20352); It is characterized in that it further includes: a clamping unit (3), the clamping unit (3) includes a disk body (301), a plurality of partition plates (3013) are evenly arranged at the bottom of the disk body (301), a hollow tube (2032) is fixedly connected to the middle of the partition plate (3013), and a top fan plate (3014) is fixedly connected to the bottom between adjacent partition plates (3013), and a fan-shaped deployment cavity (304) is jointly formed by the disk body (301), the hollow tube (2032), the partition plate (3013) and the top fan plate (3014); A bottom plate (303) is movably arranged inside the deployment cavity (304), the internal shape of the deployment cavity (304) matches the shape of the bottom plate (303), a workpiece to be tested (305) is clamped on the surface of the bottom plate (303), air guide plates (306) are movably arranged on the left and right sides inside the bottom plate (303), and an inner insertion block (3032) is fixedly arranged on the bottom surface of the bottom plate (303) opposite to the through groove (3012), and an adsorption cavity (30321) is opened in the middle of the inner insertion block (3032) and is located between the air guide plates (306); Air outlets (30325) are opened on both the left and right sides of the adsorption cavity (30321), a storage cavity (30324) is opened on the surface of the inner insertion block (3032) corresponding to the air outlet (30325), a pull sealing plate (30631) is movably installed inside the storage cavity (30324), and movable grooves (30326) for the pull sealing plate (30631) to move are opened in the upper and lower parts of the air outlet (30325); The outer surface of the pulling and sealing plate (30631) is fixedly connected with a bump (3063). A transfer port (3062) is formed on one side of the air guiding plate (306) close to the air outlet (30325). The transfer port (3062) is movably connected with the bump (3063) through a vertically arranged rotating shaft inside it. A control shaft (3061) is fixedly connected to the middle of the air guiding plate (306). The control shaft (3061) passes through the bottom plate (303) and is slidably arranged inside the sliding groove (3015). The sliding groove (3015) is formed on the surface of the disk body (301). A side rack (3011) is fixedly arranged on the surface of the disk body (301). The control shaft (3061) is meshed with the side rack (3011) through a triggering member (30611) on its surface; The bottom of the connecting seat (3023) is fixedly connected with an inserting and sealing plate (302). A plurality of through grooves (3012) are arranged on the surface of the disk body (301) along the circumferential direction of its surface; The part of the through groove (3012) arranged inside the disk body (301) is fixedly connected with an open cavity (3021). The inserting and sealing plate (302) is movably arranged inside the open cavity (3021). A slider (3022) is slidably arranged inside the through groove (3012). The inserting and sealing plate (302) is fixedly connected with the bottom plate (303) through the slider (3022).

2. The high and low temperature programmable testing device according to claim 1, wherein: The grading member (202) comprises two grading control sources (2021), and the two grading control sources (2021) are symmetrically and fixedly installed on the surface of the cabinet body (201); The output shaft of the grading control source (2021) is fixedly connected with a grading baffle (2022) through a connecting block (20211). The grading baffle (2022) movably passes through the cabinet body (201) and is arranged between the low temperature cavity (2011) and the high temperature cavity (2012). The grading baffle (2022) is symmetrically arranged inside the cabinet body (201).

3. The high and low temperature programmable testing device according to claim 2, wherein: An elastic cavity (2023) is formed in the middle of the inner side of the grading baffle (2022). The left grading baffle (2022) is movably connected with a middle inserting plate (2024) through the elastic cavity (2023). The right grading baffle (2022) is movably connected with a docking plate (2025) through the elastic cavity (2023). Springs are arranged between the outer sides of the middle inserting plate (2024) and the docking plate (2025) and the docking plate (2025); A receiving cavity (20251) for movably receiving the middle inserting plate (2024) is arranged inside the docking plate (2025). Semi-circular bayonets (2026) are symmetrically formed on the opposite faces of the middle inserting plate (2024) and the docking plate (2025). The circle formed by the closing of the semi-circular bayonets (2026) is matched with the outer diameter of the output shaft of the height control member (20141).

4. The high and low temperature programmable testing device according to claim 3, wherein: The bottom surface of the bottom plate (303) opposite to the through groove (3012) is fixedly provided with an outer arc plate (3031), and the outer arc plate (3031) is arranged on the outer side of the bottom plate (303); An outer card slot (30311) is arranged on the inner side of the outer arc plate (3031). An adsorption plate (30322) is installed inside the adsorption cavity (30321). A moisture absorption paper with through holes evenly formed on the surface is arranged inside the adsorption plate (30322). An inner card slot (30323) is formed at a position corresponding to the outer card slot (30311) on the inner insertion block (3032). A test piece (305) is clamped between the outer card slot (30311) and the inner card slot (30323).

5. The high and low temperature programmable test equipment according to claim 4, characterized in that: A device unit (1), the device unit (1) is composed of a table body (101) and a placement rack (102). The test unit (2) is arranged on the side of the device unit (1). The low temperature cavity (2011) and the high temperature cavity (2012) are arranged inside the cabinet body (201); A heating element (20121) is fixedly installed on the side wall of the high temperature cavity (2012). An outer opening door (2013) is rotatably installed on the sides of the low temperature cavity (2011) and the high temperature cavity (2012). A power cavity (2014) is arranged at the top of the cabinet body (201). A height control element (20141) is fixedly connected inside the power cavity (2014). The output shaft of the height control element (20141) passes through the power cavity (2014) and is movably connected to the installation cavity (203); Exhaust elements (2016) are arranged at positions corresponding to the surfaces of the cabinet body (201) for the low temperature cavity (2011) and the high temperature cavity (2012). A refrigeration element (2015) is arranged on the side of the low temperature cavity (2011); The sleeve block (2034) is slidably sleeved on the surface of the hollow tube (2032); a plurality of notches (2035) are annularly arranged on the surface of the sleeve block (2034), and a horizontal shaft (20351) is horizontally arranged inside the notch (2035); The horizontal shaft (20351) is movably connected through a control rod (20352) and a horizontal rotating shaft inside the connecting seat (3023). The clamping unit (3) is movably arranged inside the cabinet body (201).

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