Multi-channel withstand voltage test sorting system and sorting method based on sensitivity test technology

By setting up indexing disks and multiple test channels in the inductance test sorting system, the problem of inefficient testing of existing systems is solved, and efficient inductance testing and unqualified product processing is achieved.

CN118874888BActive Publication Date: 2025-04-22RONGCHEER IND TECH (SUZHOU) CO LTD
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Patent Information

Application Number
CN202411385040.2
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2024-09-30
Publication Date
2025-04-22
Estimated Expiration
2044-09-30

AI Technical Summary

Technical Problem

The existing inductance test sorting system can only form a single test channel, resulting in inefficient testing.

Method used

By setting up an indexing disk and setting up conveyor grooves at equal intervals along the circumferential direction, multiple test channels are formed. The loading device loads the inductor to the indexing plate, the test device corresponds one by one to the test station, the probe mechanism is tested, the waste discharge mechanism treats the unqualified products, and the discharge device receives the qualified products.

Benefits of technology

The formation of multiple test channels has been achieved, the inductance testing efficiency has been improved, the cutting structure has been simplified, and the waste discharge efficiency of unqualified products has been improved.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present invention discloses a multi-channel withstand voltage test sorting system and sorting method based on inductance test technology, which belongs to the field of inductance automatic test, including: a circulation device, including a dividing plate, which is circumferentially arranged with a circle of conveying troughs for accommodating inductance at equal intervals, and the conveying troughs are suitable for being driven by the dividing plate to successively turn to the loading station, the testing station and the unloading station; a loading device, suitable for loading the inductance to the conveying trough at the loading station; a testing device, including a probe mechanism and a waste discharge mechanism located downstream of the probe mechanism, the probe mechanism is suitable for testing the inductance at the testing station, and the waste discharge mechanism is suitable for receiving the inductance that fails the test; a unloading device, suitable for receiving the inductance that passes the test at the unloading station; there are multiple test stations, and they are arranged at equal intervals between the loading station and the unloading station, and the test device corresponds to the test station one by one. The present invention adopts the above structure, which can form a multi-channel test channel and improve the efficiency of inductance testing.
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Description

Technical Field

[0001] The present invention relates to the technical field of automatic inductance testing, and in particular to a multi-channel withstand voltage test sorting system and a sorting method based on inductance testing technology. Background Art

[0002] Before leaving the factory, chip inductors usually need to be tested for performance using inductor testing equipment to remove inductors that fail the test. For example, Chinese utility model patent CN216988719U discloses a fully automated high-speed interlayer withstand voltage test sorting mechanism for power inductors, including a vibration plate direct vibration feeding mechanism, a dividing plate module, a positioning module, a pre-test detection module, a test module, an NG exclusion detection device, and a receiving barrel module. The vibration plate direct vibration feeding mechanism can transport the inductor to the input position of the dividing plate module. The dividing plate module is provided with a number of suction nozzles at equal distances along its circumference. The suction nozzles are suitable for adsorbing the inductor at the input position and driving the inductor to flow to the positioning module, the pre-test detection module, the test module, the NG exclusion detection device, and the receiving barrel module in turn to perform corresponding operations. With the above structure, the sorting mechanism can only form a single test channel, resulting in very low inductance testing efficiency.

[0003] Therefore, it is necessary to improve the prior art to overcome the above defects in the prior art. Summary of the invention

[0004] The object of the present invention is to provide a multi-channel withstand voltage test sorting system and a sorting method based on inductance test technology, which can form multiple test channels and improve the efficiency of inductance testing.

[0005] The object of the present invention is to achieve the following technical solution: a multi-channel withstand voltage test sorting system based on the inductive test technology, comprising:

[0006] The circulation device comprises a dividing plate, on which a circle of conveying grooves for accommodating inductors are arranged at equal intervals along the circumference, and the conveying grooves are suitable for being driven by the dividing plate to successively rotate to a loading station, a testing station and a unloading station;

[0007] A feeding device, adapted to feed the inductor to the conveying trough at the feeding station;

[0008] A testing device, comprising a probe mechanism and a waste discharge mechanism located downstream of the probe mechanism, wherein the probe mechanism is suitable for testing the inductor at the testing station, and the waste discharge mechanism is suitable for receiving the inductor that fails the test;

[0009] A material unloading device, adapted to receive the qualified inductor tested at the unloading station;

[0010] There are multiple test stations, which are evenly spaced between the loading station and the unloading station, and the test devices correspond to the test stations one by one.

[0011] Furthermore, the preset rotation angle of the dividing plate is the angle between two adjacent conveying grooves. Whenever the dividing plate rotates by the preset angle, the loading device loads the inductor to the corresponding conveying groove, and when the dividing plate rotates continuously for a preset number of times, the loading device stops loading.

[0012] Furthermore, the preset number of times the dividing plate rotates for feeding is N times, the number of the testing stations is M, N / M=a, a≥2, and is a positive integer.

[0013] Furthermore, there are a-1 conveying grooves between two adjacent test stations, there are a-1 conveying grooves between the unloading station and the adjacent test station, and there are a conveying grooves between the loading station and the adjacent test station.

[0014] Furthermore, the conveying trough is formed by being recessed inward from the outer circumference of the dividing plate, and the circulation device comprises:

[0015] tabletop;

[0016] A cover plate is located above the table plate, and the indexing plate is rotatably disposed between the table plate and the cover plate;

[0017] A guide ring piece is fixed on the table and is arranged around the outer periphery of the indexing plate. The inner periphery of the guide ring piece is suitable for blocking the notch of the conveying groove. The guide ring piece is provided with a loading notch to avoid the notch of the conveying groove. The loading notch at least covers the loading station.

[0018] A driving mechanism, adapted to drive the indexing plate to rotate;

[0019] The conveying trough is a through structure in the axial direction of the dividing plate, and the table plate and the cover plate are sealed on both sides of the conveying trough in the axial direction of the dividing plate.

[0020] Furthermore, the feeding device comprises:

[0021] Vibrating plate, used to regularize and convey inductance;

[0022] A conveying guide rail, the input end of which is connected to the output port of the vibration plate, and the output end of which is connected to the loading station;

[0023] A storage bin storing inductance and adapted to convey the inductance to the vibration plate;

[0024] Wherein, the inductor is suitable for moving along the conveying guide rail under the vibration of the vibration plate, and is input into the conveying trough through the feeding notch and the notch of the conveying trough.

[0025] Furthermore, the table plate is provided with a second mounting hole along the axial direction of the indexing plate, and the probe mechanism comprises:

[0026] A test seat, mounted in the second mounting hole from the bottom portion of the table, the test seat comprising a first supporting surface flush with the top surface of the table and a probe hole extending downward from the first supporting surface;

[0027] A test probe is inserted into the probe hole;

[0028] A probe driving member, adapted to drive the test probe to extend out of the first supporting surface along the probe hole;

[0029] When the inductor flows to the testing station, the inductor is supported on the first supporting surface.

[0030] Furthermore, the table plate is provided with a third mounting hole along the axial direction of the indexing plate, and the waste discharge mechanism comprises:

[0031] A waste discharge seat, comprising a second supporting surface, a material discharge groove and an air blowing hole, wherein the second supporting surface is flush with the top surface of the table, and the material discharge groove and the air blowing hole are recessed inward from the second supporting surface;

[0032] A waste pipe, one end of which is connected to the discharge trough;

[0033] An air blowing pipe, connected to the air blowing hole;

[0034] A defective product box connected to the other end of the waste pipe;

[0035] When the inductor flows to the waste discharge station, the inductor is supported on the second support surface, and the air blowing pipe is suitable for blowing air into the air blowing hole to blow the inductor on the second support surface toward the discharge trough.

[0036] Furthermore, the table plate is provided with a material discharge hole along the axial direction of the indexing plate, and the material discharge device comprises:

[0037] Qualified product box;

[0038] A material discharge pipe, one end of which is connected to the lower end of the material discharge hole, and the other end of which is connected to the qualified product material box;

[0039] The material discharge hole corresponds to the inductor at the material discharge station, and when the inductor flows to the material discharge station, the inductor falls into the material discharge hole.

[0040] In addition, the present invention also provides a sorting method, comprising the following steps:

[0041] S100, the indexing plate rotates continuously for a preset number of times and stops. During this process, each time the indexing plate rotates once, the feeding device feeds the inductor into the corresponding conveying slot of the indexing plate;

[0042] S200, after the inductors are loaded, the indexing plate continues to rotate in the same direction, so that the multiple inductors flow to different test stations, and the inductor at the most upstream corresponds to the test station adjacent to the unloading station;

[0043] S300, multiple probe mechanisms test the inductors at different test stations. After the test is completed, the indexing plate rotates by a preset angle, and the multiple probe mechanisms continue to test the inductors. During this process, when the tested inductors are unqualified, the waste discharge mechanism receives the unqualified inductors.

[0044] S400, as the indexing plate continuously rotates, the qualified inductors flow to a feeding device, and the feeding device receives the qualified inductors;

[0045] S500, when all the inductors on the dividing plate are removed, re-execute steps S100 to S400.

[0046] Compared with the prior art, the present invention has the following beneficial effects: the present invention sets a dividing plate, and a circle of conveying grooves for accommodating inductors are evenly spaced along the circumferential direction of the dividing plate. As the dividing plate rotates, the loading device can load the dividing plate on a large scale, and the test stations are evenly spaced between the loading station and the unloading station. The testing devices correspond to the testing stations one by one. When the dividing plate receives a preset number of inductors, the loading device can stop loading, and then as the dividing plate rotates, multiple testing devices can respectively test part of the inductors located downstream thereof, that is, multiple testing channels are formed, which effectively improves the testing efficiency; each testing device includes a probe mechanism for testing the inductors and a waste discharge mechanism located downstream of the probe mechanism, and the waste discharge mechanism can receive the inductors that fail the test of the corresponding probe mechanism, effectively improving the waste discharge efficiency of unqualified products, while qualified products are centrally received by the unloading device, which simplifies the unloading structure and facilitates subsequent circulation. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] Figure 1 It is a partial schematic diagram of the sorting system of the present invention.

[0048] Figure 2 It is a schematic diagram of the distribution of each workstation in the sorting system of the present invention.

[0049] Figure 3 It is a schematic diagram of the exploded structure of the circulation device and the testing device in the present invention.

[0050] Figure 4 It is a schematic diagram of the installation of the circulation device, the testing device and the feeding device in the present invention.

[0051] Figure 5 It is a schematic diagram of the exploded structure of the indexing plate, the cover plate and the guide ring piece in the present invention.

[0052] Figure 6 It is a schematic diagram of the docking of the discharging mechanism and the circulation device in the present invention.

[0053] Figure 7 It is a schematic diagram of the exploded structure of the discharging device in the present invention.

[0054] Figure 8 It is a structural schematic diagram of the probe mechanism in the present invention.

[0055] Fig. 9 It is a partial structural schematic diagram of the waste discharge mechanism in the present invention.

[0056] Fig.10 It is a schematic structural diagram of a defective material box in the present invention.

[0057] Fig.11 It is a schematic diagram of the installation of the waste discharge mechanism and the circulation device in the present invention.

[0058] Fig.12 yes Fig.11 A partial enlarged view at point A.

[0059] Fig.13 It is a schematic structural diagram of a qualified material box in the present invention.

[0060] Fig.14 It is a structural schematic diagram of the sorting system of the present invention.

[0061] Fig.15 It is a schematic diagram of the installation of the material box bin, the unqualified material box and the qualified material box in the present invention.

[0062] Description of reference numerals:

[0063] 100, circulation device; 110, indexing plate; 111, conveying trough; 112, loading station; 113, testing station; 114, unloading station; 115, waste discharge station; 116, groove; 120, table; 121, first mounting hole; 122, second mounting hole; 123, third mounting hole; 124, unloading hole; 130, cover plate; 131, avoidance gap; 132, observation hole; 133, transparent sheet; 14 0, guide ring; 141, feeding notch; 142, negative pressure groove; 143, waste discharge hole; 150, driving mechanism; 160, first connector; 200, feeding device; 210, vibration plate; 220, conveying guide rail; 230, storage bin; 240, discharging mechanism; 241, discharging seat; 2411, docking groove; 242, pressure arm assembly; 2421, pressure arm; 2422, pressure arm driving member; 243, separation assembly ; 2431, ejector pin; 2432, ejector pin driving member; 2433, push rod; 300, test device; 310, probe mechanism; 311, test seat; 3111, first support surface; 3112, probe hole; 312, test probe; 313, probe driving member; 314, transmission arm; 315, mounting bolt; 316, spring; 317, limit block; 320, waste discharge mechanism; 321, waste discharge seat; 3211, The second supporting surface; 3212, the material discharge trough; 3213, the air blowing hole; 3214, the guiding slope; 3215, the guide trough; 3216, the guide surface; 322, the waste pipe; 323, the air blowing pipe; 324, the unqualified material box; 330, the testing host; 400, the material unloading device; 410, the qualified material box; 420, the second connecting head; 500, the material box bin; 510, the taking and releasing port; 520, the docking pipe; 600, the frame. DETAILED DESCRIPTION

[0064] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are described in detail below in conjunction with the accompanying drawings. It is understandable that the specific embodiments described herein are only used to explain the present application, rather than to limit the present application. It should also be noted that, for ease of description, only some structures related to the present application are shown in the accompanying drawings, rather than all structures. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.

[0065] The terms "including" and "having" and any variations thereof in this application are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device comprising a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products or devices.

[0066] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0067] See also Figure 1 and Figure 2 As shown, a multi-channel withstand voltage test sorting system based on the inductance test technology corresponding to a preferred embodiment of the present invention comprises: a flow device 100, comprising a dividing plate 110, which is provided with a circle of conveying grooves 111 for accommodating inductors at equal intervals along the circumferential direction, and the conveying grooves 111 are suitable for sequentially passing through a loading station 112, a testing station 113 and a unloading station 114 under the rotation of the dividing plate 110; a loading device 200, suitable for loading the inductors to the conveying grooves 111 at the loading station 112; a testing device 30 0, including a probe mechanism 310 and a waste discharge mechanism 320 located downstream of the probe mechanism 310, the probe mechanism 310 is suitable for testing the inductor at the test station 113, and the waste discharge mechanism 320 is suitable for receiving the inductor that fails the test; the unloading device 400 is suitable for receiving the inductor that passes the test at the unloading station 114; wherein there are multiple test stations 113, and they are arranged at equal intervals between the loading station 112 and the unloading station 114, and the test devices 300 correspond to the test stations 113 one by one.

[0068] The present invention provides a dividing plate 110, and the dividing plate 110 is provided with a circle of conveying grooves 111 for accommodating inductors at equal intervals along the circumferential direction. As the dividing plate 110 rotates, the loading device 200 can load the dividing plate 110 on a large scale, and the test stations 113 are arranged at equal intervals between the loading station 112 and the unloading station 114. The test device 300 corresponds to the test station 113 one by one. When the dividing plate 110 receives a preset number of inductors, the loading device 200 can stop loading, and then as the dividing plate 110 rotates, the loading device 200 can load the inductors to the dividing plate 110. By rotating, multiple test devices 300 can test part of the inductance located downstream thereof respectively, namely, multiple test channels are formed, which effectively improves the test efficiency; each test device 300 includes a probe mechanism 310 for testing the inductance and a waste discharge mechanism 320 located downstream of the probe mechanism 310, and the waste discharge mechanism 320 can receive the inductance that fails the test of the corresponding probe mechanism 310, which effectively improves the waste discharge efficiency of the unqualified products, while the qualified products are centrally received by the unloading device 400, which simplifies the unloading structure and facilitates the subsequent circulation.

[0069] Furthermore, the preset rotation angle of the indexing plate 110 is the angle between two adjacent conveying grooves 111. Whenever the indexing plate 110 rotates by the preset angle, the loading device 200 loads the inductor to the corresponding conveying groove 111, and when the indexing plate 110 rotates continuously for the preset number of times, the loading device 200 stops loading. In this embodiment, the preset number of times the indexing plate 110 rotates for loading is N times, the number of test stations 113 is M, N / M=a, a≥2, and is a positive integer. After the indexing plate 110 is loaded, multiple inductors flow to different test stations 113, and the most upstream inductor corresponds to the test station 113 adjacent to the unloading station 114. At this time, there are a-1 conveying grooves 111 between each adjacent test station 113, there are a-1 conveying grooves 111 between the unloading station 114 and the adjacent test station 113, and there are a-2 conveying grooves 111 between the loading station 112 and the adjacent test station 113.

[0070] In this embodiment, the number of conveying slots 111 between the loading station 112 and the adjacent test station 113 is not less than a-2, preferably a. At this time, after the indexing plate 110 is loaded, the indexing plate 110 needs to continue to rotate twice so that the inductor at the most upstream corresponds to the test station 113 adjacent to the unloading station 114, so that the loading device 200 has sufficient installation space and avoids the mutual limitation of the loading device 200 and the probe mechanism 310. A total of 2N conveying slots 111 are arranged on the indexing plate 110 to reduce the preset rotation angle of the indexing plate 110 while improving the inductance transmission efficiency.

[0071] In this embodiment, the preset number of times is specifically 25 times, and the number of the test stations 113 is 5. That is, after the indexing plate 110 continuously receives 25 inductors, the loading device 200 stops loading, and when the indexing plate 110 drives the inductors to flow through the test stations 113, each test device 300 can test 5 adjacent inductors respectively, thereby improving the test efficiency.

[0072] Further, refer to Figures 3 to 5As shown, the circulation device 100 includes a table 120, a cover plate 130, a guide ring piece 140 and a driving mechanism 150. The top surface of the table 120 is parallel to the horizontal direction, the cover plate 130 is located above the table 120, the indexing plate 110 is rotatably placed between the table 120 and the cover plate 130, and the rotation axis of the indexing plate 110 is parallel to the vertical direction. The guide ring piece 140 is fixed on the table 120 and is arranged around the outer periphery of the indexing plate 110. The conveying groove 111 is recessed inward from the outer periphery of the indexing plate 110, and the recessed direction of the conveying groove 111 is parallel to the radial direction of the indexing plate 110. The inner periphery of the guide ring piece 140 is suitable for blocking the notch of the conveying groove 111. In this embodiment, the inner periphery of the guide ring piece 140 is specifically matched with the outer periphery of the indexing plate 110. The guide ring 140 is provided with a loading notch 141 for avoiding the notch of the conveying groove 111 . The loading notch 141 at least covers the loading station 112 to avoid hindering the loading device 200 from loading the inductor into the conveying groove 111 .

[0073] Preferably, the conveying trough 111 is a through structure in the axial direction of the indexing plate 110, and the table 120 and the cover plate 130 cover the conveying trough 111 on both sides of the axial direction of the indexing plate 110. The inductor placed in the conveying trough 111 is supported on the table 120 and is limited by the cover plate 130 in the vertical upward direction, which improves the reliability of the inductor conveying process and facilitates the processing and forming of the conveying trough 111. Preferably, the cover plate 130 is an annular plate with the same contour as the guide ring sheet 140, which is fixed on the guide ring sheet 140 and blocked at the top periphery of the indexing plate 110. Preferably, the cover plate 130 is provided with an avoidance gap 131 corresponding to the feeding gap 141, and the cover plate 130 is suitable for blocking the conveying trough 111 outside the area of ​​the avoidance gap 131. When the inductor is stuck during the feeding process, the operator can find and deal with it in time.

[0074] The cover plate 130 is provided with an observation hole 132 along the axial direction of the indexing plate 110. The observation hole 132 corresponds to the conveying slot 111. A transparent sheet 133 is embedded in the observation hole 132. The transparent sheet 133 can be made of transparent plastic, glass or other materials. The bottom surface of the transparent sheet 133 is flush with the bottom surface of the cover plate 130 blocking the conveying slot 111. When the inductance flows to the observation hole 132, the transparent sheet 133 can reliably block and position the inductance. In this embodiment, there are multiple observation holes 132, and they correspond to multiple test stations 113 one by one, so as to observe the inductance at the test station 113.

[0075] Preferably, a negative pressure channel is formed between the cover plate 130 and the guide ring plate 140. There are multiple negative pressure channels, which are respectively connected to different test stations 113, so as to provide negative pressure to the conveying groove 111 at the test station 113 through the negative pressure channel. The inductor is fastened to the conveying groove 111 under the action of the negative pressure. When the probe mechanism 310 contacts and tests the inductor, the inductor movement deviation can be avoided, thereby improving the test reliability. The negative pressure can also absorb dust on the surface of the inductor and / or the conveying groove 111, thereby ensuring the cleanliness of the inductor that flows out subsequently.

[0076] Specifically, the guide ring 140 is recessed inward from its top surface to form a negative pressure groove 142, and the negative pressure groove 142 extends along the radial direction of the dividing plate 110 to the inner periphery of the guide ring 140. The cover plate 130 is sealed on the notch of the negative pressure groove 142 to cooperate with the negative pressure groove 142 to form a negative pressure channel. The cover plate 130 is provided with a first connector 160 that is connected to the negative pressure channel. The first connector 160 can be connected to the negative pressure device through a pipeline to provide negative pressure to the negative pressure channel.

[0077] The driving mechanism 150 is suitable for driving the dividing plate 110 to rotate. The driving mechanism 150 is arranged below the table 120 and is connected to the dividing plate 110. The driving mechanism 150 can specifically drive the dividing plate 110 to rotate by means of a motor cooperating with a transmission shaft, which will not be described in detail in the present invention.

[0078] Further, refer to Figure 1 As shown, the feeding device 200 includes a vibration plate 210, a conveying guide rail 220 and a storage bin 230. The vibration plate 210 is used to organize and convey the inductor. The input end of the conveying guide rail 220 is connected to the output port of the vibration plate 210, and the output end is connected to the feeding station 112. The conveying guide rail 220 is recessed inward from its top surface to form a guide groove (not shown), and the guide groove extends to both ends of the conveying guide rail 220. The inductor can move along the guide groove. The storage bin 230 stores the inductor and is suitable for timely conveying the inductor to the vibration plate 210 when the vibration plate 210 is short of material. When the feeding device 200 is working, the inductor is suitable for moving along the conveying guide rail 220 under the vibration of the vibration plate 210, and is input into the conveying groove 111 at the feeding station 112 through the feeding notch 141.

[0079] Since the inductors on the conveying rail 220 usually move against each other, when the most upstream inductor is loaded into the conveying trough 111, the inductors adjacent thereto are likely to affect the inductors and / or the dividing plate 110 in the conveying trough 111. Preferably, the loading device 200 also includes a discharge mechanism 240 connected between the output end of the conveying rail 220 and the dividing plate 110, the discharge mechanism 240 is suitable for receiving at least two inductors output by the conveying rail 220, and when the most upstream inductor is input into the loading station 112, the discharge mechanism 240 is suitable for fixing the inductors adjacent thereto, so as to improve the reliability of the inductor loading process.

[0080] Specifically, refer to Figure 3 , Figure 6 and Figure 7 As shown, the discharge mechanism 240 includes a discharge seat 241, a pressure arm assembly 242 and a separation assembly 243. The table 120 is provided with a first mounting hole 121 along the axial direction of the indexing plate 110. The discharge seat 241 is fixed to the table 120 and at least partially accommodated in the first mounting hole 121. The discharge seat 241 is recessed inward from its top surface to form a docking groove 2411. One end of the docking groove 2411 is connected to the output end of the guide groove, and the other end is connected to the loading station 112. The bottom of the docking groove 2411, the bottom of the guide groove and the top surface of the table 120 are flush, so that the inductor can be smoothly moved into the loading station 112 through the guide groove and the docking groove 2411 in turn.

[0081] The pressure arm assembly 242 is arranged above the discharge seat 241 to cover the notch of the docking groove 2411. The separation assembly 243 is arranged below the discharge seat 241, and includes an ejector pin 2431 and an ejector pin driving member 2432 which is transmission-connected to the ejector pin 2431. The ejector pin 2431 is located at the output end of the docking groove 2411. The discharge seat 241 is penetrated downward from the bottom of the docking groove 2411 to form an ejector pin hole (not shown in the figure). The ejector pin driving member 2432 can drive the ejector pin 2431 to extend out from the ejector pin hole to push the single inductor at the output end of the docking groove 2411 against the pressure arm assembly 242. The ejector drive 2432 can be a linear cylinder, an electric cylinder, etc., and is preferably an electromagnet in the present embodiment, which has a retractable push rod 2433, and the ejector 2431 is fixed to the push rod 2433. By turning the electromagnet on and off, the push rod 2433 can be retracted up and down, thereby driving the ejector 2431 to retract up and down, effectively increasing the frequency of the ejector 2431 rising and falling.

[0082] Preferably, the pressure arm assembly 242 includes a pressure arm 2421 and a pressure arm driving member 2422 that is transmission-connected to the pressure arm 2421. The pressure arm driving member 2422 can drive the pressure arm 2421 to move to the docking groove 2411 to cover the notch of the docking groove 2411, or move away from the docking groove 2411, so that when different types of inductors are tested later, it is convenient to disassemble, assemble and replace the discharge seat 241. The pressure arm driving member 2422 can be a motor or a cylinder, and the present invention is not limited here.

[0083] Further, refer to Figure 3 and Figure 8 As shown, the probe mechanism 310 includes a test seat 311, a test probe 312 and a probe driving member 313. The table 120 is provided with a second mounting hole 122 along the axial direction of the dividing plate 110. The test seat 311 is installed in the second mounting hole 122 from the bottom part of the table 120. The test seat 311 includes a first supporting surface 3111 flush with the top surface of the table 120 and a probe hole 3112 formed downwardly from the first supporting surface 3111. The test probe 312 is penetrated in the probe hole 3112. When the inductance flows to the test station 113, the inductance is supported on the first supporting surface 3111. The probe driving member 313 is suitable for driving the test probe 312 to extend out of the first supporting surface 3111 along the probe hole 3112 to contact and test the inductance.

[0084] Specifically, the test seat 311 is a long strip structure, the probe hole 3112 is located at one end of the test seat 311, and the probe mechanism 310 includes a transmission arm 314 located below the test seat 311, one end of the transmission arm 314 is rotatably connected to the other end of the test seat 311, and the test probe 312 is arranged at the other end of the transmission arm 314. The probe driving member 313 is specifically an electromagnet, which is supported between the test seat 311 and the transmission arm 314. When the probe driving member 313 is powered on, it can drive the transmission arm 314 to rotate upward so that the test probe 312 extends upward from the first support surface 3111. When the probe driving member 313 is powered off, the transmission arm 314 rotates downward under the action of gravity so that the test probe 312 does not extend relative to the first support surface 3111.

[0085] Preferably, a buffer structure is provided between the test seat 311 and the transmission arm 314, and the buffer structure includes a mounting bolt 315 and a spring 316. The mounting bolt 315 is movably provided in the transmission arm 314 from the bottom of the transmission arm 314, and its end is threadedly connected with the bottom of the test seat 311. The spring 316 is sleeved outside the mounting bolt 315, and its two ends are limited between the test seat 311 and the transmission arm 314. When the transmission arm 314 rotates upward, it can drive the spring 316 to gradually compress, so as to play the role of buffering the test probe 312, reduce the probability of inductance damage during the test process, and when the transmission arm 314 rotates downward to the limit position, the cap of the mounting bolt 315 can support the transmission arm 314. In addition, a limit block 317 is provided at the bottom of the test seat 311, and when the transmission arm 314 rotates upward to the limit position, the transmission arm 314 will abut against the limit block 317.

[0086] By adopting the probe mechanism 310 of the above structure, the structure is simple, the inductance can be tested quickly and smoothly, and the reliability is high.

[0087] Further, refer to Figure 2 As shown, a waste discharge station 115 is provided downstream of each test station 113 to correspond to the waste discharge mechanism 320. The conveying trough 111 can flow to the waste discharge station 115 under the rotation of the indexing plate 110. The waste discharge mechanism 320 is suitable for discharging the inductance in the conveying trough 111 at the waste discharge station 115. The conveying trough 111 at the waste discharge station 115 can be arranged adjacent to the conveying trough 111 at the corresponding test station 113, or arranged with at least one conveying trough 111 spaced apart. In this embodiment, the conveying trough 111 at the waste discharge station 115 and the conveying trough 111 at the corresponding test station 113 are spaced apart by one conveying trough 111, ensuring that the probe mechanism 310 and the waste discharge mechanism 320 have sufficient installation space, and the waste discharge mechanism 320 can timely discharge the inductance that fails the test.

[0088] Reference Figure 3 , Figures 9 to 12As shown, the waste discharge mechanism 320 includes a waste discharge seat 321, a waste pipe 322, an air blowing pipe 323 and a defective material box 324. The table 120 is provided with a third mounting hole 123 along the axial direction of the indexing plate 110, and the waste discharge seat 321 is installed in the third mounting hole 123 from the bottom part of the table 120. The waste discharge seat 321 includes a second supporting surface 3211, a discharge groove 3212 and an air blowing hole 3213. The second supporting surface 3211 is flush with the top surface of the table 120. The discharge groove 3212 and the air blowing hole 3213 are both formed by inward depression from the second supporting surface 3211. The discharge groove 3212 and the air blowing hole 3213 are arranged at intervals along the radial direction of the indexing plate 110. When the inductor flows to the waste discharge station 115, the inductor is supported on the second supporting surface 3211 and is located between the air blowing hole 3213 and the discharge groove 3212. The waste pipe 322 is arranged in the vertical direction, one end of the waste pipe 322 is connected to the discharge groove 3212, and the other end is connected to the defective product box 324. The air blowing pipe 323 is connected to the air blowing hole 3213. When the inductor at the waste discharge station 115 is defective, the air blowing pipe 323 is suitable for blowing air into the air blowing hole 3213, and blowing the inductor on the second support surface 3211 into the discharge groove 3212. The inductor on the discharge groove 3212 falls into the waste pipe 322 along the discharge groove 3212, and is finally collected in the defective product box 324.

[0089] Specifically, a waste discharge hole 143 is opened along the axial direction of the dividing plate 110 at the position of the guide ring 140 corresponding to the waste discharge station 115. The waste discharge hole 143 is provided with a notch in its radial direction which is connected to the notch of the conveying groove 111. The discharge groove 3212 has a guide slope 3214 inclined to the second supporting surface 3211. The high side of the discharge groove 3212 is connected to the notch of the conveying groove 111 at the waste discharge station 115. The waste pipe 322 is correspondingly arranged below the waste discharge hole 143 and is connected to the low side of the discharge groove 3212. The inductance can flow into the discharge groove 3212 from the notch of the conveying groove 111 along the radial direction of the dividing plate 110, and can reliably flow into the waste pipe 322 under the guidance of the guide slope 3214.

[0090] Preferably, the air hole 3213 is formed through along the axial direction of the dividing plate 110, and the air pipe 323 is installed at the lower end of the air hole 3213 along the axial direction of the dividing plate 110, so as to improve the installation convenience of the air pipe 323. However, with the above structure, the air blowing direction of the air hole 3213 is parallel to the axial direction of the dividing plate 110, which is not conducive to the inductance flowing into the conveying groove 111 along the radial direction of the dividing plate 110. Preferably, the waste discharge seat 321 is recessed inward from the second support surface 3211 to form a guide groove 3215, and the guide groove 3215 covers the outside of the air hole 3213. The guide groove 3215 includes a guide surface 3216 close to the discharge groove 3212, and the guide surface 3216 is an inclined surface, which is inclined toward the discharge groove 3212 in the direction from the bottom side connected to the bottom of the guide groove 3215 to the top side. The bottom surface of the indexing plate 110 is sealed at the notch of the guide groove 3215. The bottom surface of the indexing plate 110 is inwardly recessed to form a groove 116. The groove 116 extends along the radial direction of the indexing plate 110 to the bottom of the conveying groove 111 to form a guide outlet for the airflow in the guide groove 3215 to flow out. There are multiple grooves 116, which correspond to the conveying grooves 111. The airflow blown out of the air blowing hole 3213 can flow to the second supporting surface 3211 along the radial direction of the indexing plate 110 under the guidance of the guide surface 3216, so as to reliably blow the inductor to the discharge groove 3212.

[0091] Further, refer to Fig.14 As shown, the test device 300 also includes a test host 330, which is signal-connected to the probe mechanism 310. There are multiple test hosts 330, which correspond to the probe mechanisms 310 one by one. By controlling the test host 330, various test parameters can be adjusted to meet different test requirements. The sorting system includes a rack 600, and the above devices are all installed on the rack 600.

[0092] Further, refer to Figure 3 , Figure 4 and Fig.13 As shown, the table 120 is provided with a feed hole 124 along the axial direction of the dividing plate 110, and the feed device 400 includes a qualified product box 410 and a feed tube (not shown in the figure), one end of the feed tube is connected to the lower end of the feed hole 124, and the other end is connected to the qualified product box 410, and the feed hole 124 corresponds to the inductor at the feed station 114. When the inductor flows to the feed station 114, the inductor will fall into the feed hole 124 and be collected in the qualified product box 410 along the feed tube. Preferably, the unloading device 400 also includes a second connecting head 420, which is fixed on the cover plate 130. Avoidance holes are opened at the positions of the cover plate 130 and the guide ring plate 140 corresponding to the unloading hole 124. The second connecting head 420 is connected to the unloading hole 124 through the avoidance hole. The second connecting head 420 can be externally connected to the air path structure to blow air into the unloading hole 124, so that the inductor can fall into the unloading hole 124 more easily.

[0093] In addition, refer to Fig.14 and Fig.15 As shown, the sorting system also includes a material box bin 500 arranged on the frame 600, and the unqualified material box 324 and the qualified material box 410 are both placed in the material box bin 500. The material box bin 500 has a side opening 510 for taking and placing the unqualified material box 324 and the qualified material box 410. The top of the material box bin 500 is provided with a plurality of butt joints 520, and the butt joints 520 correspond to the above-mentioned material boxes one by one. The tops of the unqualified material box 324 and the qualified material box 410 are both open sides, and the open sides cover the corresponding butt joints 520. The waste pipe 322 and the feed pipe are connected to different butt joints 520, so that the inductor falls into the material box through the butt joints 520. By adopting the above structure, the convenience of taking and placing the unqualified material box 324 and the qualified material box 410 is greatly improved. In addition, the sorting system is also provided with a number of sensors for detecting inductance, which are arranged at the loading station 112, the testing station 113 and the waste discharge station 115 to ensure that the preset program of the sorting system is installed and runs reliably.

[0094] In addition, the present invention also provides a sorting method, comprising the following steps:

[0095] S100 , the indexing plate 110 rotates continuously for a preset number of times and stops. During this process, each time the indexing plate 110 rotates once, the loading device 200 loads the inductor into the conveying slot 111 corresponding to the indexing plate 110 .

[0096] S200, after the inductor loading is completed, the indexing plate 110 continues to rotate in the same direction so that the multiple inductors flow to different test stations 113, and the inductor at the most upstream corresponds to the test station 113 adjacent to the unloading station 114. When the inductors on the indexing plate 110 are aligned, the probe mechanism 310 can test the inductor at the corresponding test station 113 and multiple inductors downstream thereof.

[0097] S300, multiple probe mechanisms 310 test the inductors at different test stations 113. After the test is completed, the dividing plate 110 rotates a preset angle, and the multiple probe mechanisms 310 continue to test the inductors. During this process, when the tested inductors are unqualified, the waste discharge mechanism 320 receives the unqualified inductors.

[0098] In this step, when the probe mechanism 310 tests that the inductor is unqualified, the probe mechanism 310 continuously tests multiple times, and when the multiple test results are unqualified, the inductor is determined to be a defective product.

[0099] S400, as the indexing plate 110 continuously rotates, all the inductors that fail the test are discharged from the indexing plate 110, and the inductors that pass the test gradually flow to the unloading device 400, and when flowing through the unloading device 400, the unloading device 400 receives the qualified inductors;

[0100] S500: After all the inductors on the indexing plate 110 have been unloaded, the steps S100 to S400 are executed again to continue loading and testing operations.

[0101] The present invention adopts the sorting system of the above structure, which is convenient for replacing corresponding components to adapt to different types of inductors and has good versatility; and by using the dividing plate 110 in conjunction with multiple testing devices 300, the number of inductors tested per minute can reach more than one thousand, and the testing efficiency is high.

[0102] The above description is only an implementation method of the present application, and does not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the description and drawings of this application, or directly or indirectly used in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A multi-channel withstand voltage test sorting system based on the inductive test technology, characterized in that: include: The circulation device (100) comprises a dividing plate (110), a table (120), a cover plate (130), a guide ring (140) and a driving mechanism (150), wherein the dividing plate (110) is provided with a circle of conveying grooves (111) for accommodating inductors at equal intervals along the circumferential direction, wherein the conveying grooves (111) are formed by being recessed inward from the outer circumference of the dividing plate (110), and the conveying grooves (111) are suitable for being driven by the dividing plate (110) to successively rotate to a loading station (112), a testing station (113), and a feeding station (114). 13) and a material unloading station (114), the cover plate (130) is located above the table plate (120), the indexing plate (110) is rotatably placed between the table plate (120) and the cover plate (130), the guide ring piece (140) is fixed on the table plate (120) and is arranged around the outer periphery of the indexing plate (110), the inner periphery of the guide ring piece (140) is suitable for blocking the notch of the conveying groove (111), and the guide ring piece (140) is provided with a groove to avoid the conveying groove (111) The slot (111) has a feeding notch (141) at the notch, the feeding notch (141) at least covers the feeding station (112), the driving mechanism (150) is suitable for driving the indexing plate (110) to rotate, the conveying slot (111) is a through structure in the axial direction of the indexing plate (110), the table (120) and the cover plate (130) cover the conveying slot (111) on both sides in the axial direction of the indexing plate (110), and the guide ring (140) extends inward from its top surface. A negative pressure groove (142) is formed in the depression, and the negative pressure groove (142) extends along the radial direction of the indexing plate (110) to the inner peripheral edge of the guide ring plate (140). The cover plate (130) covers the notch of the negative pressure groove (142) to cooperate with the negative pressure groove (142) to form a negative pressure channel. There are multiple negative pressure channels, which are respectively connected to different test stations (113). The cover plate (130) is provided with a first connector (160) connected to the negative pressure channel; A loading device (200) adapted to load the inductor into the conveying trough (111) located at the loading station (112); A testing device (300) comprising a probe mechanism (310) and a waste discharge mechanism (320) located downstream of the probe mechanism (310), wherein the probe mechanism (310) is suitable for testing an inductor located at the testing station (113), and the waste discharge mechanism (320) is suitable for receiving an inductor that fails the test; A material unloading device (400) adapted to receive an inductor that has passed the test at the material unloading station (114); There are a plurality of test stations (113), which are arranged at equal intervals between the loading station (112) and the unloading station (114); the test devices (300) correspond to the test stations (113) one by one; the preset rotation angle of the indexing plate (110) is the angle between two adjacent conveying grooves (111); whenever the indexing plate (110) rotates by a preset angle, the loading device (200) loads the inductor to the corresponding conveying groove (111); and when the indexing plate (110) rotates continuously for a preset number of times, the loading device (200) stops loading; and when loading is completed, the indexing plate (110) continues to rotate in the same direction, so as to A plurality of inductors are transferred to different test stations (113), and the most upstream inductor corresponds to the test station (113) adjacent to the unloading station (114); the preset number of loading rotations of the indexing plate (110) is N times; the number of the test stations (113) is M, N / M=a, a≥2, and is a positive integer; there are a-1 conveying grooves (111) between two adjacent test stations (113); there are a-1 conveying grooves (111) between the unloading station (114) and the test station (113) adjacent thereto; and there are a conveying grooves (111) between the loading station (112) and the test station (113) adjacent thereto.

2. The multi-channel withstand voltage test sorting system based on the sensitivity test technology as claimed in claim 1, characterized in that: The feeding device (200) comprises: A vibration plate (210) for regulating and conveying inductance; A conveying guide rail (220), the input end of which is connected to the output port of the vibration plate (210), and the output end of which is connected to the loading station (112); A storage bin (230) storing inductance and adapted to transport the inductance to the vibration plate (210); The inductor is suitable for moving along the conveying guide rail (220) under the vibration of the vibration plate (210), and is input into the conveying trough (111) through the loading notch (141) and the notch of the conveying trough (111).

3. The multi-channel withstand voltage test sorting system based on the sensitivity test technology as claimed in claim 1, characterized in that: The table plate (120) is provided with a second mounting hole (122) extending through the table plate (120) along the axial direction of the indexing plate (110), and the probe mechanism (310) comprises: A test seat (311) is installed in the second installation hole (122) from the bottom portion of the table (120), the test seat (311) comprising a first support surface (3111) flush with the top surface of the table (120) and a probe hole (3112) extending downward from the first support surface (3111); A test probe (312) is inserted into the probe hole (3112); A probe driving member (313) adapted to drive the test probe (312) to extend out of the first supporting surface (3111) along the probe hole (3112); When the inductor flows to the test station (113), the inductor is supported on the first supporting surface (3111).

4. The multi-channel withstand voltage test sorting system based on the sensitivity test technology as claimed in claim 1, characterized in that: The table plate (120) is provided with a third mounting hole (123) extending through the table plate (120) along the axial direction of the indexing plate (110), and the waste discharge mechanism (320) comprises: The waste discharge seat (321) comprises a second supporting surface (3211), a material discharge groove (3212) and an air blowing hole (3213), wherein the second supporting surface (3211) is flush with the top surface of the table (120), and the material discharge groove (3212) and the air blowing hole (3213) are formed by being recessed inward from the second supporting surface (3211); A waste pipe (322), one end of which is connected to the discharge trough (3212); An air blowing pipe (323) connected to the air blowing hole (3213); A defective material box (324) connected to the other end of the waste material pipe (322); When the inductor flows to the waste discharge station (115), the inductor is supported on the second support surface (3211), and the air blowing pipe (323) is suitable for blowing air into the air blowing hole (3213) and blowing the inductor on the second support surface (3211) toward the discharge trough (3212).

5. The multi-channel withstand voltage test sorting system based on the sensitivity test technology as claimed in claim 1, characterized in that: The table plate (120) is provided with a material discharge hole (124) extending through the table plate (120) along the axial direction of the indexing plate (110), and the material discharge device (400) comprises: Qualified product box (410); A material discharge pipe, one end of which is connected to the lower end of the material discharge hole (124), and the other end of which is connected to the qualified product material box (410); The material discharge hole (124) corresponds to the inductor at the material discharge station (114), and when the inductor flows to the material discharge station (114), the inductor falls into the material discharge hole (124).

6. A sorting method using the sorting system according to any one of claims 1 to 5, characterized in that: The steps include: S100, the indexing plate (110) rotates continuously for a preset number of times and stops, and during this process, each time the indexing plate (110) rotates once, the loading device (200) loads the inductor into the conveying groove (111) corresponding to the indexing plate (110); S200, after the inductors are loaded, the indexing plate (110) continues to rotate in the same direction so that the plurality of inductors are transferred to different test stations (113), and the inductor at the most upstream corresponds to the test station (113) adjacent to the unloading station (114); S300, a plurality of probe mechanisms (310) test the inductors at different test stations (113); after the test is completed, the indexing plate (110) rotates by a preset angle, and the plurality of probe mechanisms (310) continue to test the inductors; during this process, when the tested inductors are unqualified, the waste discharge mechanism (320) receives the unqualified inductors; S400, as the indexing plate (110) continuously rotates, the qualified inductors flow to the unloading device (400), and the unloading device (400) receives the qualified inductors; S500: After all the inductors on the indexing plate (110) have been removed, re-execute steps S100 to S400.

Citation Information

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