Electronic equipment testing fixture and testing method

Abstract

The present invention discloses an electronic equipment test fixture and a test method, including a rack, wherein a visual inspection mechanism, a solder joint inspection mechanism and a functional test mechanism are sequentially installed on the top of the rack; a protective cover is installed on the outer side of the visual inspection mechanism, the solder joint inspection mechanism and the functional test mechanism; the visual inspection mechanism includes a visual bracket and a visual inspection camera, the visual inspection camera is installed on the protective cover, the visual bracket is an L-shaped structure, two movable clamping frames are slidably installed in the middle of the visual bracket, the visual bracket is located on the outer side of the two movable clamping frames and is detachably installed with an inclined bracket, the inclined bracket is slidably installed with a sliding seat, the inclined bracket is installed with a driving cylinder for driving the sliding seat to move back and forth, and the sliding seat is connected to the inclined bracket. The present invention can realize the detection of the appearance of the circuit board, the detection of the solder joints and the detection of the function, and the test of the circuit board is more comprehensive.

Description

Technical Field

[0001] The present invention relates to the technical field of test fixtures, and in particular to an electronic equipment test fixture and a test method. Background Art

[0002] With the development of society, electronic equipment is being used more and more widely. Circuit boards are one of the main components of electronic equipment. Circuit boards make circuits miniaturized and intuitive, and play an important role in the mass production of fixed circuits and the optimization of electrical appliance layout. After the circuit boards are produced, they need to be tested before they can be shipped. The traditional testing method is to manually place the circuit board to be tested on the test bench, and then manually crimp and select a series of operations such as operation buttons and lights to complete the functional test of the circuit board.

[0003] The existing publication number CN109164375A discloses an electronic equipment circuit board testing device, comprising a testing platform, a loading support platform, a unloading support platform and a conveying device, wherein the conveying device is installed on the ground, and the loading support platform and the unloading support platform are respectively located on the left and right sides of the testing platform, and both are located directly below the conveying device, and the testing platform, the loading support platform and the unloading support platform are all provided with a positioning fixture for fixing the circuit board, a receiving groove is provided on the testing platform, and a translation driving device for driving the positioning fixture to translate is provided in the receiving groove, a buffer device and a limiting device for limiting the two ends of the positioning fixture are provided on the translation driving device, and a lifting device is provided on the top of the testing platform, and a plurality of detection needle plates are installed on the lifting device; automatic conveying and automatic detection of circuit boards are realized, and the number and types of detected circuit boards are increased, thereby improving the detection efficiency.

[0004] However, the detection equipment in the prior art cannot achieve reasonable adaptation between the detection head and the circuit board, and cannot realize the detection of the outside of the circuit board and the detection of the solder joints, resulting in subsequent functional tests. For this reason, we propose an electronic equipment test fixture and test method. Summary of the invention

[0005] The purpose of the present invention is to provide an electronic equipment testing fixture and a testing method to solve the problems in the prior art.

[0006] To achieve the above-mentioned object, the present invention provides the following technical solutions: an electronic equipment test fixture, comprising a rack, on the top of which a visual inspection mechanism, a solder joint inspection mechanism and a functional testing mechanism are sequentially installed; a protective cover is installed on the outer sides of the visual inspection mechanism, the solder joint inspection mechanism and the functional testing mechanism;

[0007] The visual inspection mechanism includes a visual bracket and a visual inspection camera, the visual inspection camera is installed on the protective cover, the visual bracket is an L-shaped structure, two movable clamping frames are slidably installed in the middle of the visual bracket, the visual bracket is located on the outside of the two movable clamping frames and is detachably installed with an inclined bracket, the inclined bracket is slidably installed with a sliding seat, the inclined bracket is installed with a driving cylinder that drives the sliding seat to move back and forth, and the sliding seat is connected to the inclined bracket;

[0008] The solder joint detection mechanism includes a substrate and a rangefinder, a driving component bracket is installed at the bottom of the substrate, the driving component bracket is installed with a driving component, the driving component drives a rotating platform, the rotating platform is installed with two fixture components, the rotating platform is used to drive the two fixture components to rotate 180°, and the rotating platform is provided with through holes that cooperate with the two fixture components;

[0009] The functional testing mechanism comprises a testing head assembly, a lower limit assembly and an upper limit assembly.

[0010] Preferably, the base plate is installed with a lifting cylinder, a measuring head is driven on the top of the lifting cylinder, and the rotating platform is provided with a through hole for the measuring head to pass through.

[0011] Preferably, a guide column is installed on the top of the rotating platform, the base plate is provided with an arc hole cooperating with the guide main, the base plate is provided with a first buffer limit assembly at both ends of the arc hole, and a first positioning cylinder is installed on the top of the base plate. The first positioning cylinder drives a positioning head cooperating with the rotating platform.

[0012] Preferably, the jig assembly includes a linear module and a mounting seat, the linear module drives a jig plate, and there are two mounting seats in total, both of which are equipped with a second positioning cylinder and a second buffer limit assembly, and the second positioning cylinder drives a positioning head that cooperates with the jig plate.

[0013] Preferably, a protective plate is installed on the outer side of the rotating platform, and the protective plate is an arc-shaped protective plate.

[0014] Preferably, the test head assembly comprises a test bracket, the test bracket is rotatably mounted with a movable plate via a pin shaft, a sliding cylinder is mounted on the top of the movable plate, the sliding cylinder drives a test head mounting seat to reciprocate, and a plurality of test heads are mounted on the test head mounting seat.

[0015] Preferably, the test bracket is provided with an adjustment rod for adjusting the angle of the movable plate below the movable plate, and the test head mounting seat is provided with an oil pressure buffer which cooperates with a baffle on the movable plate.

[0016] Preferably, the lower limit assembly includes a lifting cylinder and a lower limit seat, both of which are fixed on the frame, a lifting plate is arranged below the lower limit seat, the lifting plate is driven by the lifting cylinder, a plurality of detection probes are installed on the top of the lifting plate, and when the lifting plate rises, the detection probes can pass through the lower limit seat; a limiting groove is provided on the lower limit seat, a support column and a positioning pin are installed in the limiting groove of the lower limit seat, and at least two guide sleeves are installed on the lower limit seat; a boss is provided on the lower limit seat at the detection probe, and the boss is provided with a hole for the detection probe to pass through.

[0017] Preferably, the upper limit positioning assembly includes a cylinder seat, a downward pressure cylinder is installed on one side of the cylinder seat, the downward pressure cylinder drives the upper limit positioning seat to rise and fall, and a guide protrusion that cooperates with a guide sleeve is installed at the bottom of the upper limit positioning seat.

[0018] An electronic equipment testing method uses the electronic equipment testing fixture described above; comprising the following steps:

[0019] S1. The visual inspection camera can be used to inspect the appearance of the circuit board to ensure whether the circuit board is missing or damaged. The visual bracket is an L-shaped structure, which allows the subsequent circuit boards to be tilted, thereby facilitating the visual inspection camera to fully inspect the circuit board;

[0020] S2. The driving assembly drives the rotating platform to realize the switching of two fixture assemblies and two circuit boards, thereby realizing the detection of two circuit boards, with higher detection efficiency. When one circuit board is being detected, the circuit board on the other fixture assembly can be taken and placed; the top of the lifting cylinder drives a measuring head, which can detect the bottom of the circuit board by driving the measuring head through the lifting cylinder, and the distance at the soldering point can be detected by the distance meter;

[0021] S3. The angle of the movable plate can be adjusted by adjusting the rod, thereby adjusting the angle of the test head, so that it can better adapt to the circuit board, and the test head is driven by the sliding cylinder to detect the circuit board; after the lower limit seat and the upper limit seat limit the circuit board, the detection probe of the lifting plate is driven to rise by the lifting cylinder, and the circuit board can be detected.

[0022] Compared with the prior art, the present invention has the following beneficial effects:

[0023] 1. Through the visual inspection mechanism, solder joint inspection mechanism and functional testing mechanism, the circuit board appearance inspection, solder joint inspection and function inspection can be realized to ensure a more comprehensive test of the circuit board. When unqualified products are detected in the current process, there is no need for subsequent inspection operations, saving testing time.

[0024] 2. The visual inspection camera can be used to inspect the appearance of the circuit board to ensure whether the circuit board is missing or damaged. The visual bracket is an L-shaped structure, which allows the subsequent circuit boards to be tilted, thereby facilitating the visual inspection camera to comprehensively inspect the circuit board.

[0025] 3. The driving component drives a rotating platform, and the rotating platform is equipped with two fixture components; the two fixture components can place two circuit boards at the same time, and the two fixture components and the two circuit boards can be switched by driving the rotating platform by the driving component, so as to realize the detection of the two circuit boards, and the detection efficiency is higher. When one circuit board is detected, the circuit board on the other fixture component can be taken and placed; the rotating platform is provided with a through hole for the measuring head to pass through, and the bottom of the circuit board can be detected by driving the measuring head by the lifting cylinder. The measuring head is driven by the top of the lifting cylinder, and the bottom of the circuit board can be detected by driving the measuring head by the lifting cylinder; a mechanism can be used to detect the upper and lower solder joints of the circuit board without repeatedly flipping the circuit board.

[0026] 4. A guide column is installed on the top of the rotating platform, and the base plate is provided with an arc-shaped hole that cooperates with the guide main body. The guide column cooperates with the arc-shaped hole to realize the smooth rotation of the rotating platform, thereby further ensuring the smoothness of the rotation of the fixture assembly and the accuracy of the position after rotation, and improving the accuracy of subsequent detection. The guide column can be buffered and limited by the first buffer limit assembly, thereby buffering and limiting the rotating platform. The first positioning cylinder drive has a positioning head that cooperates with the rotating platform. The positioning head can position the rotating platform after rotation to prevent the rotating platform from moving, thereby further ensuring the stability of the position of the rotating platform.

[0027] 5. The linear module can drive the jig plate to move back and forth, so as to detect the welding points in different positions and ensure the comprehensiveness of the detection; the second buffer limit assembly on both sides can buffer and limit the position of the jig plate, and the second positioning cylinder drives the positioning head that cooperates with the jig plate. The positioning head positions the jig plate after moving to ensure the stability of the jig plate after moving, and further improve the accuracy of the detection.

[0028] 6. The test bracket is located below the movable plate and is equipped with an adjusting rod for adjusting the angle of the movable plate. The angle of the movable plate can be adjusted by the adjusting rod, thereby adjusting the angle of the test head, so that it can better adapt to the circuit board, and the test head is driven by the sliding cylinder to detect the circuit board; a guide protrusion cooperating with the guide sleeve is installed at the bottom of the upper limit seat, and the accuracy of movement between the lower limit seat and the upper limit seat is ensured by the guide protrusion and the sleeve to avoid damage to the circuit board; after the lower limit seat and the upper limit seat limit the circuit board, the detection probe of the lifting plate is driven to rise by the lifting cylinder, and the circuit board can be detected. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation of the present invention. In the accompanying drawings:

[0030] Figure 1 It is a schematic diagram of the structure of the present invention;

[0031] Figure 2 It is a front view of the present invention;

[0032] Figure 3 It is a structural schematic diagram of the visual detection mechanism of the present invention;

[0033] Figure 4 It is a structural schematic diagram of the functional testing mechanism of the present invention;

[0034] Figure 5 is a schematic structural diagram of a test head assembly of the present invention;

[0035] Figure 6 It is a structural schematic diagram of the lower limit assembly of the present invention;

[0036] Figure 7 It is a structural schematic diagram of the upper limit assembly of the present invention;

[0037] Figure 8 It is a structural schematic diagram of the welding point detection mechanism of the present invention;

[0038] Fig. 9 It is a schematic diagram of the structure inside the welding spot detection mechanism of the present invention;

[0039] Fig.10 It is a structural schematic diagram of the fixture assembly of the present invention.

[0040] In the figure: 1, frame; 2, protective cover; 3, visual inspection mechanism; 4, solder joint inspection mechanism; 5, functional testing mechanism; 31, visual bracket; 32, visual inspection camera; 33, movable clamping frame; 34, sliding seat; 35, driving cylinder; 36, tilting bracket; 41, base plate; 42, driving component bracket; 43, driving component; 44, rotating platform; 441, through hole; 45, fixture component; 46, rangefinder; 47, first positioning cylinder; 48, first buffer limit component; 49, lifting cylinder; 491, measuring head; 451, linear module; 452, fixture plate ;453, mounting seat;454, second positioning cylinder;51, test head assembly;52, lower limit assembly;53, upper limit assembly;511, test bracket;512, adjusting rod;513, movable plate;514, sliding cylinder;515, test head mounting seat;516, test head;521, lifting cylinder;522, lifting plate;523, lower limit seat;524, limit groove;525, support column;526, positioning pin;527, boss;528, detection probe;531, cylinder seat;532, downward pressure cylinder;533, lower limit seat;534, guide protrusion. DETAILED DESCRIPTION

[0041] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention. Therefore, the following detailed description of the embodiments of the present invention provided in the drawings is not intended to limit the scope of the invention claimed for protection, but merely represents selected embodiments of the present invention.

[0042] See also Figure 1-2 In an embodiment of the present invention, an electronic equipment test fixture and a test method include a rack 1, wherein a visual inspection mechanism 3, a solder joint inspection mechanism 4 and a functional test mechanism 5 are sequentially installed on the top of the rack 1. The visual inspection mechanism 3, the solder joint inspection mechanism 4 and the functional test mechanism 5 can realize the inspection of the appearance of the circuit board, the inspection of the solder joints and the inspection of the functions, thereby ensuring that the test of the circuit board is more comprehensive. After the current sequence process detects a defective product, there is no need to perform subsequent inspection operations, thereby saving test time. A protective cover 2 is installed on the outer side of the visual inspection mechanism 3, the solder joint inspection mechanism 4 and the functional test mechanism 5 of the rack 1, and the protective cover 2 is used to protect the internal components.

[0043] like Figure 1 and 3; The visual inspection mechanism 3 includes a visual bracket 31 and a visual inspection camera 32. The visual inspection camera 32 is installed on the protective cover 2. The appearance of the circuit board can be inspected by the visual inspection camera 32 to ensure whether the appearance of the circuit board is missing or damaged. The visual bracket 31 is an L-shaped structure. The L-shaped structure can make the subsequent circuit boards be tilted, so as to facilitate the comprehensive inspection of the circuit boards by the visual inspection camera; Two movable clamping frames 33 are slidably installed in the middle of the visual bracket 31. The visual bracket 31 is located on the outer sides of the two movable clamping frames 33 and can be detachably installed with an inclined bracket 36. The inclined bracket 36 is slidably installed with a sliding seat 34. The inclined bracket 36 is installed with a driving cylinder 35 for driving the sliding seat 34 to move back and forth. The sliding seat 34 is connected to the inclined bracket 36, and the movable clamping frame 33 can be driven by the driving cylinder 35 to clamp the circuit board;

[0044] like Figure 1 , 8 , 9; The solder joint detection mechanism 4 includes a substrate 41 and a rangefinder 46, and the distance at the solder joint can be detected by the rangefinder 46. A driving component bracket 42 is installed at the bottom of the substrate 41, and a driving component 43 is installed on the driving component bracket 42. The driving component 43 drives a rotating platform 44, and the rotating platform 44 is installed with two fixture components 45. The rotating platform 44 is used to drive the two fixture components 45 to rotate 180°. The rotating platform 44 is provided with a through hole 441 that cooperates with the two fixture components 45; the two fixture components 45 can place two circuit boards at the same time, and the two fixture components 45 and the two circuit boards can be switched by driving the rotating platform 44 by the driving component 43, so as to realize the detection of the two circuit boards, and the detection efficiency is higher. When one circuit board is detected, the circuit board on the other fixture component 45 can be taken and placed;

[0045] like Figure 1 , 8, 9; The base plate 41 is installed with a lifting cylinder 49, and a measuring head is driven on the top of the lifting cylinder 49. The rotating platform 44 is provided with a through hole 441 for the measuring head 491 to pass through. The measuring head can be driven by the lifting cylinder 49 to detect the bottom of the circuit board; A guide column is installed on the top of the rotating platform 44, and the base plate 41 is provided with an arc hole that cooperates with the guide main. The guide column cooperates with the arc hole to realize the smooth rotation of the rotating platform 44, thereby further ensuring the smoothness of the rotation of the fixture component 45 and the accuracy of the position after rotation, thereby improving the accuracy of subsequent detection. The base plate 41 is installed with a first buffer limit component 48 at both ends of the arc hole. The guide column can be buffered and limited by the first buffer limit component 48, thereby buffering and limiting the rotating platform 44. A first positioning cylinder 47 is installed on the top of the base plate 41. The first positioning cylinder 47 drives a positioning head that cooperates with the rotating platform 44. The positioning head can position the rotating platform 44 after rotation to prevent the rotating platform 44 from moving, thereby further ensuring the stability of the position of the rotating platform 44;

[0046] like Figure 8 , 9 and 10; the jig assembly 45 includes a linear module 451 and a mounting seat 453, the linear module 451 drives a jig plate 452, and the linear module 451 can drive the jig plate 452 to move back and forth, so as to detect the welding points at different positions and ensure the comprehensiveness of the detection; there are two mounting seats 453, both of which are installed with a second positioning cylinder 454 and a second buffer limit assembly, and the position of the jig plate 452 can be buffered and limited by the second buffer limit assemblies on both sides, and the second positioning cylinder 454 drives a positioning head that cooperates with the jig plate 452, and the positioning head positions the jig plate 452 after moving, so as to ensure the stability of the jig plate 452 after moving, and further improve the accuracy of the detection; a protective plate is detachably installed on the outer side of the rotating platform 44, and the protective plate is an arc-shaped protective plate, and the inner components can be protected by the protective plate.

[0047] like Figure 1 , 4and 5; the functional testing mechanism 5 includes a test head assembly 51, a lower limit assembly 52 and an upper limit assembly 53; the test head assembly 51 includes a test bracket 511, the test bracket 511 is rotatably mounted with a movable plate 513 through a pin shaft, a sliding cylinder 514 is mounted on the top of the movable plate 513, the sliding cylinder 514 drives a test head mounting seat 515 to reciprocate, and a plurality of test heads 516 are mounted on the test head mounting seat 515; the test bracket 511 is located below the movable plate 513 and is mounted with an adjusting rod 512 for adjusting the angle of the movable plate 513, the angle of the movable plate 513 can be adjusted by the adjusting rod 512, thereby adjusting the angle of the test head 516, so that it can better adapt to the circuit board, and the test head 516 is driven by the sliding cylinder 514 to detect the circuit board, and the test head mounting seat 515 is mounted with an oil pressure buffer that cooperates with the baffle on the movable plate 513.

[0048] like Figure 4 , 6 and 7; the lower limit assembly 52 includes a lifting cylinder 521 and a lower limit seat 523, both of which are fixed on the frame 1, a lifting plate 522 is arranged below the lower limit seat 523, the lifting plate 522 is driven by the lifting cylinder 521, a plurality of detection probes 528 are installed on the top of the lifting plate 522, when the lifting plate 522 rises, the detection probes 528 can pass through the lower limit seat 523; the lower limit seat 523 is provided with a limiting groove 524, the lower limit seat 523 is located in the limiting groove 524 and is provided with a support column 525 and a positioning pin 526, the support column 525 is used to make the circuit board, and the positioning pin 526 is used to limit the position of the circuit board; the lower limit seat 523 is also provided with at least two guide sleeves. The upper limit assembly 53 includes a cylinder seat 531, a downward pressure cylinder 532 is installed on one side of the cylinder seat 531, and the downward pressure cylinder 532 drives the upper limit seat 533 to rise and fall. A guide protrusion 534 cooperating with a guide sleeve is installed at the bottom of the upper limit seat 533. The accuracy of movement between the lower limit seat 523 and the upper limit seat 533 is ensured by the guide protrusion 534 and the sleeve to avoid damage to the circuit board; after the lower limit seat 523 and the upper limit seat 533 limit the circuit board, the detection probe of the lifting plate 522 is driven to rise by the lifting cylinder 521, so that the circuit board can be detected; the lower limit seat 523 is provided with a boss 527 at the detection probe 528, and the boss 527 is provided with a hole for the detection probe 528 to pass through.

[0049] An electronic equipment testing method uses the electronic equipment testing fixture described above; comprising the following steps:

[0050] S1. The appearance of the circuit board can be inspected by the visual inspection camera 32 to ensure whether the appearance of the circuit board is missing or damaged. The L-shaped structure can make the subsequent circuit boards inclined, so as to facilitate the comprehensive inspection of the circuit board by the visual inspection camera;

[0051] S2. The driving assembly 43 drives the rotating platform 44 to realize the switching of the two fixture assemblies 45 and the two circuit boards, so as to realize the detection of the two circuit boards, and the detection efficiency is higher. When one circuit board is detected, the circuit board on the other fixture assembly 45 can be taken and placed; the top of the lifting cylinder 49 drives a measuring head, and the bottom of the circuit board can be detected by driving the measuring head through the lifting cylinder 49; a mechanism can be used to detect the upper and lower solder joints of the circuit board without repeatedly turning over the circuit board;

[0052] S3. The angle of the movable plate 513 can be adjusted by adjusting the rod 512, thereby adjusting the angle of the test head 516, so that it can better adapt to the circuit board, and the test head 516 is driven by the sliding cylinder 514 to detect the circuit board; after the lower limit seat 523 and the upper limit seat 533 limit the circuit board, the detection probe of the lifting plate 522 is driven to rise by the lifting cylinder 521, and the circuit board can be detected.

[0053] The working principle of the present invention is as follows: the appearance of the circuit board can be inspected by the visual inspection camera 32 to ensure whether the appearance of the circuit board is missing or damaged. The L-shaped structure can make the subsequent circuit boards be set at an angle, so as to facilitate the comprehensive inspection of the circuit board by the visual inspection camera; the switching of the two fixture assemblies and the two circuit boards can be realized by driving the rotating platform through the driving component, so as to realize the inspection of the two circuit boards, and the inspection efficiency is higher. When inspecting one circuit board, the circuit board on the other fixture assembly can be taken and placed; the top of the lifting cylinder is driven with a measuring head, and the bottom of the circuit board can be inspected by driving the measuring head through the lifting cylinder, and the distance at the welding point can be detected by the rangefinder; the angle of the movable plate 513 can be adjusted by the adjusting rod 512, so as to adjust the angle of the test head 516, so as to better adapt to the circuit board, and the test head 516 is driven by the sliding cylinder 514 to inspect the circuit board; after the lower limit seat 523 and the upper limit seat 533 limit the circuit board, the detection probe of the lifting plate 522 is driven to rise by the lifting cylinder 521, so as to inspect the circuit board.

[0054] Finally, it should be noted that the above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art can still modify the technical solutions described in the aforementioned embodiments or replace some of the technical features therein by equivalents. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. An electronic equipment test fixture, comprising a rack (1), characterized in that: A visual inspection mechanism (3), a solder joint inspection mechanism (4) and a functional testing mechanism (5) are sequentially mounted on the top of the frame (1); a protective cover (2) is mounted on the outer sides of the visual inspection mechanism (3), the solder joint inspection mechanism (4) and the functional testing mechanism (5) of the frame (1); The visual inspection mechanism (3) comprises a visual support (31) and a visual inspection camera (32), wherein the visual inspection camera (32) is mounted on the protective cover (2), the visual support (31) is an L-shaped structure, two movable clamping frames (33) are slidably mounted in the middle of the visual support (31), and a tilting support (36) is detachably mounted on the outer sides of the two movable clamping frames (33) of the visual support (31), a sliding seat (34) is slidably mounted on the tilting support (36), a driving cylinder (35) for driving the sliding seat (34) to reciprocate is mounted on the tilting support (36), and the sliding seat (34) is connected to the tilting support (36); The solder joint detection mechanism (4) comprises a base plate (41) and a rangefinder (46); a driving component bracket (42) is mounted on the bottom of the base plate (41); a driving component (43) is mounted on the driving component bracket (42); the driving component (43) drives a rotating platform (44); two fixture components (45) are mounted on the rotating platform (44); the rotating platform (44) is used to drive the two fixture components (45) to rotate 180 degrees; the rotating platform (44) is provided with a through hole (441) that cooperates with the two fixture components (45); a lifting cylinder (49) is mounted on the base plate (41); a measuring head (491) is driven on the top of the lifting cylinder (49); and the rotating platform (44) is provided with a through hole (441) for the measuring head (491) to penetrate; The functional testing mechanism (5) comprises a test head assembly (51), a lower limit assembly (52) and an upper limit assembly (53); The test head assembly (51) comprises a test bracket (511), the test bracket (511) being rotatably mounted with a movable plate (513) via a pin shaft, a sliding cylinder (514) being mounted on the top of the movable plate (513), the sliding cylinder (514) driving a test head mounting seat (515) to reciprocate, and a plurality of test heads (516) being mounted on the test head mounting seat (515).

2. An electronic equipment test fixture according to claim 1, characterized in that: A guide column is installed on the top of the rotating platform (44); an arc-shaped hole cooperating with the guide column is opened on the base plate (41); first buffer limiter components (48) are installed at both ends of the arc-shaped hole of the base plate (41); and a first positioning cylinder (47) is installed on the top of the base plate (41); the first positioning cylinder (47) drives a positioning head cooperating with the rotating platform (44).

3. An electronic equipment test fixture according to claim 2, characterized in that: The jig assembly (45) comprises a linear module (451) and a mounting seat (453); the linear module (451) drives a jig plate (452); two mounting seats (453) are provided; both mounting seats (453) are installed with a second positioning cylinder (454) and a second buffer limit assembly; the second positioning cylinder (454) drives a positioning head that cooperates with the jig plate (452).

4. The electronic device test fixture according to claim 3, characterized in that: A protective plate is installed on the outer side of the rotating platform (44), and the protective plate is an arc-shaped protective plate.

5. The electronic equipment test fixture according to claim 4, characterized in that: The test bracket (511) is located below the movable plate (513) and is installed with an adjustment rod (512) for adjusting the angle of the movable plate (513), and the test head mounting seat (515) is installed with an oil pressure buffer that cooperates with a baffle on the movable plate (513).

6. The electronic equipment test fixture according to claim 5, characterized in that: The lower limit assembly (52) comprises a lifting cylinder (521) and a lower limit seat (523), the lifting cylinder (521) and the lower limit seat (523) are both fixed on the frame (1), a lifting plate (522) is arranged below the lower limit seat (523), the lifting plate (522) is driven by the lifting cylinder (521), a plurality of detection probes (528) are installed on the top of the lifting plate (522), and when the lifting plate (522) rises, the detection probes (528) ) can pass through the lower limit seat (523); the lower limit seat (523) is provided with a limit groove (524), the lower limit seat (523) is located in the limit groove (524) and is equipped with a support column (525) and a positioning pin (526), ​​and the lower limit seat (523) is also equipped with at least two guide sleeves; the lower limit seat (523) is provided with a boss (527) at the detection probe (528), and the boss (527) is provided with a hole for the detection probe (528) to pass through.

7. The electronic equipment test fixture according to claim 6, characterized in that: The upper limit positioning assembly (53) comprises a cylinder seat (531), a downward pressure cylinder (532) is installed on one side of the cylinder seat (531), the downward pressure cylinder (532) drives the upper limit positioning seat (533) to rise and fall, and a guide protrusion (534) cooperating with a guide sleeve is installed at the bottom of the upper limit positioning seat (533).

8. An electronic equipment testing method, characterized in that: The electronic device test fixture according to claim 7 is used, comprising the following steps: S1. Inspect the appearance of the circuit board using a visual inspection camera (32) to ensure whether the appearance of the circuit board is missing or damaged; S2, the driving component (43) drives a rotating platform (44), and the rotating platform (44) is equipped with two fixture components (45); the two fixture components (45) can place two circuit boards at the same time, and the driving component (43) drives the rotating platform (44) to achieve the switching of the two fixture components (45) and the two circuit boards, thereby realizing the detection of the two circuit boards; the top of the lifting cylinder (49) drives a measuring head, and the bottom of the circuit board can be detected by driving the measuring head through the lifting cylinder (49); S3. The angle of the movable plate (513) is adjusted by means of the adjusting rod (512), thereby adjusting the angle of the test head (516), so that the test head (516) can be better matched with the circuit board, and the test head (516) is driven by the sliding cylinder (514) to detect the circuit board; after the lower limit seat (523) and the upper limit seat (533) limit the circuit board, the detection probe of the lifting plate (522) is driven to rise by means of the lifting cylinder (521), so that the circuit board can be detected.

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