A complex dielectric constant measurement method and system based on reflection polarizability

Abstract

The present invention belongs to the field of millimeter wave radiation detection technology, and discloses a complex dielectric constant measurement method and system based on reflection polarization, comprising: keeping the physical temperature of the material to be tested unchanged within the test time [0, t], so that the current incident angle θ i The ambient radiation incident on the surface of the material to be tested is in a changing state, and the current incident angle θ is measured. i Calculate the estimated value of the emission voltage of the material to be tested based on the horizontal polarization output and the vertical polarization output to estimate the current incident angle θ i Reflection polarization RDoP: Change the current incident angle θ i , and repeat the above steps to obtain the incident angles θ1, θ2, ..., θ M The reflection polarization RDoP under each incident angle θ1, θ2, ..., θ M The complex dielectric constant of the material to be measured at the current physical temperature is estimated by using the reflection polarization RDoP under the condition of φ(R)=1. The present invention can reduce the error and complexity of complex dielectric constant measurement.

Description

Technical Field

[0001] The present invention belongs to the technical field of millimeter wave radiation detection, and more specifically, relates to a complex dielectric constant measurement method and system based on reflection polarization. Background Art

[0002] In nature, all substances with a physical temperature above absolute zero radiate energy in the form of electromagnetic waves. Their frequency range spans nearly the entire wavelength range, and different substances exhibit distinct radiation spectra. Millimeter-wave radiation detection technology offers advantages such as all-day and near-all-weather operation, concealment, and excellent penetration. It has important applications in remote sensing, target detection, and human security inspections.

[0003] The complex permittivity is a key parameter that describes the electromagnetic properties of materials. Targets made of different materials exhibit different millimeter-wave radiation characteristics due to their varying complex permittivity. Accurate complex permittivity enables better target classification and identification, promoting the application of millimeter-wave radiometric measurement in various fields.

[0004] Traditional complex dielectric constant measurement methods such as the transmission line method and the resonator method have disadvantages such as large loss, difficult processing, and low measurement accuracy when applied to the millimeter wave band. Millimeter wave radiation measurement technology can be used to measure the complex dielectric constant. Millimeter wave radiation refers to the spontaneous radiation of an object in the millimeter wave band. The energy characteristics and polarization characteristics of the radiation signal are closely related to the complex dielectric constant of the material. The use of millimeter wave radiation measurement technology to measure the complex dielectric constant has the advantages of non-contact, easy sample preparation, and high test frequency. However, the existing methods for obtaining the complex dielectric constant based on millimeter wave radiation measurement technology still have problems of high computational complexity and large errors. For example, there is a method for measuring the complex dielectric constant based on millimeter wave radiation in the prior art. This method measures the complex dielectric constant based on the radiation brightness temperature and cross-correlation method, which requires calibration, that is, the output of the radiometer needs to be converted into brightness temperature data through a calibration process, which increases the computational complexity; moreover, errors may also be generated during the calibration process; at the same time, the cross-correlation calculation method further increases the computational complexity. Summary of the Invention

[0005] In response to the above-mentioned defects or improvement needs of the prior art, the present invention provides a complex dielectric constant measurement method and system based on reflection polarizability, which aims to reduce the error and complexity of complex dielectric constant measurement.

[0006] To achieve the above object, according to a first aspect of the present invention, a method for measuring complex permittivity based on reflection polarizability is provided, comprising:

[0007] S1. During the test time [0, t], maintain the physical temperature T of the material to be tested. objunchanged, so that the current incident angle θ i The ambient radiation incident on the surface of the material to be tested is in a changing state, and the current incident angle θ is measured. i The horizontal polarization output V of the material under test h and vertically polarized output V v ; Where i is 1, 2, ..., or M, and M represents the total number of incident angles measured;

[0008] S2. Calculate the emission voltage V of the material to be tested E Estimated value of and such that the estimated value The absolute value of the autocorrelation is the minimum, which is the estimated target. The current incident angle θ is estimated. i The reflection polarization RDoP under p e represents the emission polarization;

[0009] S3. Change the current incident angle θ i , and repeat S1-S2 to obtain the incident angles θ1, θ2, ..., θ M Reflection polarization RDoP under

[0010] S4, based on the incident angles θ1, θ2, ..., θ M The reflection polarization RDoP estimates the material under test at the current physical temperature T obj The complex dielectric constant under .

[0011] Furthermore, the current incident angle θ is estimated by the following formula: i Reflection polarization RDoP under:

[0012]

[0013] in, express The autocorrelation of C N is the noise correction term of the millimeter wave radiometer used to measure the current incident angle θ i The horizontal polarization output V of the material under test h and vertically polarized output V v ; C is a constant.

[0014] Furthermore, the millimeter wave radiometer noise correction term C N The calculation method is:

[0015]

[0016] in, For the horizontal polarization output V h The standard deviation of For the vertical polarization output Vv The standard deviation of .

[0017] Furthermore, in S4, the physical temperature of the material to be tested at the current physical temperature T is estimated by the following formula: obj Complex dielectric constant under

[0018]

[0019]

[0020] Where N is the preset estimate; R m (θ i ) represents the incident angle θ i Reflection polarization RDoP under Represents the parameter to be estimated At the incident angle θ i Theoretical value of RDoP under ; parameters to be estimated represents the jth complex dielectric constant within the approximate complex dielectric constant range of the material to be tested; wherein the approximate complex dielectric constant range of the material to be tested is a known quantity, and the complex dielectric constant range is divided into N complex dielectric constants according to a preset estimate, and the jth complex dielectric constant is

[0021] Furthermore, the M incident angles include angles between (α-α0, α+α0); wherein α is the Brewster angle, and α0 is a preset angle threshold.

[0022] Furthermore, the total number of incident angles M≥3.

[0023] According to a second aspect of the present invention, there is provided a complex dielectric constant measurement system based on reflection polarizability, comprising:

[0024] Radiation source, used to maintain the physical temperature T of the material under test during the test time [0, t] obj Under the same conditions, the changing ambient radiation is created so that the current incident angle θ i The ambient radiation incident on the surface of the material to be measured is in a changing state; wherein i is 1, 2, ..., or M; wherein M represents the total number of incident angles measured;

[0025] Millimeter wave radiometer, used to measure the current incident angle θ i The horizontal polarization output V of the material under test within the test time [0, t] is h and vertically polarized output V v ;

[0026] Reflection polarization calculation module, used to calculate the emission voltage V of the material to be tested E Estimated value of and such that the estimated value The absolute value of the autocorrelation is the minimum, which is the estimated target. The current incident angle θ is estimated. i The reflection polarization RDoP under each incident angle θ1, θ2, ..., θ M The reflection polarization RDoP under p e represents the emission polarization;

[0027] Complex dielectric constant measurement module for each incident angle θ1, θ2, ..., θ M The reflection polarization RDoP estimates the material under test at the current physical temperature T obj The complex dielectric constant under .

[0028] According to a third aspect of the present invention, there is provided an electronic device comprising a computer-readable storage medium and a processor;

[0029] The computer-readable storage medium is used to store executable instructions;

[0030] The processor is configured to read the executable instructions stored in the computer-readable storage medium to execute the complex dielectric constant measurement method according to any one of the first aspects.

[0031] According to a fourth aspect of the present invention, a computer-readable storage medium is provided, on which a computer program is stored. When the program is executed by a processor, the method for measuring the complex dielectric constant as described in any one of the first aspects is implemented.

[0032] According to a fifth aspect of the present invention, a computer program product is provided. When the computer program product is run on a computer, the computer is enabled to execute the complex dielectric constant measurement method according to any one of the first aspects.

[0033] In general, the above technical solutions conceived by the present invention can achieve the following beneficial effects:

[0034] (1) The complex dielectric constant measurement method based on reflection polarization of the present invention directly calculates the emission voltage V of the material to be tested by directly using the horizontal polarization output voltage and vertical polarization output voltage of the material to be tested at different incident angles. E , then through the emission voltage V E The absolute value of the autocorrelation is minimized to estimate the reflection polarization RDoP at each incident angle, avoiding the calibration process using radiometer brightness temperature data and the existing complex process of calculating the cross-correlation between emission brightness temperature and reflection brightness temperature. This greatly reduces the computational complexity of estimating the complex dielectric constant of the material to be measured based on the reflection polarization RDoP, and also avoids the measurement error caused by calibration.

[0035] (2) Furthermore, the present invention is based on the emission voltage VE A calculation formula for the optimal estimation of the reflection polarization degree RDoP is designed based on the autocorrelation of . By solving this formula, the reflection polarization degree RDoP at various incident angles can be obtained.

[0036] (3) As a preference, based on the obtained reflection polarization RDoP at each incident angle, the present invention provides a specific complex dielectric constant estimation method, which constructs a measurement polarization matrix R according to the reflection polarization at each incident angle. m , divide the known complex dielectric constant range of the material to be tested into multiple complex dielectric constants, and construct the theoretical polarizability matrix R according to the RDoP theoretical values ​​of each complex dielectric constant divided within the range at each incident angle n , with the minimum difference between the two as the optimization goal, and then the estimated complex dielectric constant is obtained.

[0037] (4) Furthermore, the present invention constructs the radiometer noise correction term C directly based on the polarization output voltage of the millimeter wave radiometer. N , there is no need to convert it into brightness temperature data for calculation, which greatly reduces the calculation complexity and measurement error.

[0038] (5) Preferably, the selected incident angle includes an angle near the Brewster angle, which can avoid the RDoP values ​​of certain materials being the same at different incident angles.

[0039] (6) Preferably, the total number of incident angles M ≥ 3, which can increase the accuracy of the calculation. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] Figure 1 Schematic diagram of a complex dielectric constant measurement method based on reflection polarizability in an embodiment of the present invention.

[0041] Figure 2 Schematic diagram of a measurement system in an embodiment of the present invention.

[0042] Figure 3 It is the horizontal polarization output of the radiometer during the measurement period in the embodiment of the present invention.

[0043] Figure 4 It is the vertical polarization output of the radiometer during the measurement period in the embodiment of the present invention. DETAILED DESCRIPTION

[0044] In order to make the objectives, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only intended to illustrate the present invention and are not intended to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.

[0045] Example 1

[0046] like Figure 1 As shown, the complex dielectric constant measurement method based on reflection polarizability provided in an embodiment of the present invention includes:

[0047] S1. Maintain the physical temperature T of the material to be tested within a test time [0, t]. obj Unchanged, control based on the current incident angle θ i Ambient radiation T incident on the surface of the material to be tested inc Fluctuations; During the test time [0, t], the current incident angle θ is measured using a millimeter-wave radiometer. i The horizontal polarization output V of the material under test h and vertically polarized output V v ; Where i is 1, 2, ..., or M, and M represents the total number of incident angles measured;

[0048] S2, based on the horizontal polarization output V of the material to be tested h and vertically polarized output V v , calculate the emission voltage V of the material to be tested E Estimated value of And make the emission voltage V E Estimated value The absolute value of the autocorrelation is the minimum, which is the estimated target. The current incident angle θ is estimated. i Reflection polarization RDoP under

[0049] S3, change the current incident angle, and repeat S1-S2 to obtain the incident angles θ1, θ2, ..., θ M Reflection polarization RDoP under

[0050] S4, based on the incident angles θ1, θ2, ..., θ M The reflection polarization RDoP estimates the material under test at the current physical temperature T obj The complex dielectric constant under .

[0051] In the embodiment of the present invention, the incident angles θ1, θ2, ..., θ M The reflection polarization RDoP under r (θ1), p r (θ1),…,p r (θ M );

[0052] In the embodiment of the present invention, the emission brightness temperature of the material sample is T E The expression is:

[0053]

[0054] In order to avoid errors in the calibration process, the present invention directly uses the radiometer output V h and V v To represent the emission part of the sample, define the emission voltage V E Estimated value of for:

[0055]

[0056] Where, V E The estimated value of p e Take any value between [0,1] to represent the emission polarization. Based on the emission voltage V E Estimated value of The autocorrelation of can be used to directly calculate the corresponding RDoP.

[0057] The present invention provides a specific RDoP estimation method:

[0058]

[0059] in, Representative Calculation The autocorrelation of C N represents the radiometer noise correction term, and C represents a constant.

[0060] In the embodiment of the present invention, in order to avoid the calibration process required by using radiometer brightness temperature data, a new radiometer noise correction term C is constructed. N , the calculation formula is:

[0061]

[0062] in, is the noise of the millimeter wave radiometer horizontal polarization channel, is the noise of the vertical polarization channel of the millimeter wave radiometer, that is, V h and V v The standard deviation of .

[0063] In the embodiment of the present invention, the radiometer noise correction term C is constructed directly based on the polarization output voltage of the millimeter wave radiometer. N , there is no need to convert it into brightness temperature data for calculation, which greatly reduces the calculation complexity.

[0064] Preferably, the selected incident angles include an angle near the Brewster angle, which can avoid the same RDoP value of certain materials at different incident angles; the total number of incident angles M≥3, which increases the accuracy of the calculation.

[0065] Specifically, in S4, the complex dielectric constant is estimated by the following formula:

[0066]

[0067]

[0068] Where N is a preset estimate, which is set according to the approximate range of the complex dielectric constant of the current material to be tested. The approximate range of the complex dielectric constant of the current material to be tested is a known quantity. The larger the preset estimate, the higher the accuracy of the calculation, but the corresponding calculation complexity will increase. m It is p r (θ1), p r (θ1),…,p r (θ M ) is constructed, the matrix size is N×M, where R m (θ i ) represents R m The elements in the i-th column of i The reflection polarization RDoP under p r (θ i ); Specifically, in the embodiment of the present invention, R m for:

[0069]

[0070] R n The parameters to be estimated are (j=1,2,…,N) at the incident angles θ1, θ2,…, θ M The matrix constructed by the RDoP theoretical value obtained under the above conditions has a size of N×M, where Represents the parameter to be estimated At the incident angle θ i Theoretical value of RDoP under ; parameters to be estimated It represents the jth complex dielectric constant within the approximate complex dielectric constant range of the material to be tested. The approximate complex dielectric constant range of the material to be tested is a known quantity. The known complex dielectric constant range is divided into N complex dielectric constants according to the preset estimated quantity. The jth complex dielectric constant is In the embodiment of the present invention, R n for:

[0071]

[0072] In other embodiments, other parameter estimation methods may also be used to solve the complex dielectric constant.

[0073] The complex dielectric constant measurement method based on reflection polarization of the present invention directly uses the horizontal polarization output voltage and vertical polarization output voltage of the material to be tested at different incident angles measured by the radiometer to calculate the emission voltage V of the material to be tested. E , then through the emission voltage V E The absolute value of the autocorrelation of the minimum is used to estimate the reflection polarization RDoP at each incident angle, avoiding the calibration process of the radiometer brightness temperature data and the existing complex process of calculating the cross-correlation between the emission brightness temperature and the reflection brightness temperature. This greatly reduces the computational complexity of estimating the complex dielectric constant of the material to be measured based on the reflection polarization RDoP, and also avoids the measurement error caused by calibration.

[0074] Example 2

[0075] like Figure 2 As shown, the present invention also provides a complex dielectric constant measurement system based on reflection polarizability, including: a millimeter wave radiometer, a radiation source, a reflection polarizability calculation module and a complex dielectric constant measurement module;

[0076] The radiation source is used to measure the physical temperature T of the material to be tested during the test time [0, t] obj Under the same conditions, the changing ambient radiation is created so that the current incident angle θ i The ambient radiation incident on the surface of the material to be tested is in a changing state;

[0077] The millimeter wave radiometer is used to measure the current incident angle θ i The horizontal polarization output V of the material under test within the test time [0, t] is h and vertically polarized output V v ;

[0078] The reflection polarization calculation module is used to output V based on the horizontal polarization of the material to be tested. h and vertically polarized output V v , calculate the emission voltage V of the material to be tested E Estimated value of and make the estimated value The absolute value of the autocorrelation is the minimum, which is the estimated target. The current incident angle θ is estimated. i The reflection polarization RDoP under each incident angle θ1, θ2, ..., θ M The reflection polarization RDoP under for:

[0079]

[0080] Where p e represents the emission polarization;

[0081] The complex dielectric constant measurement module is used to measure the dielectric constant based on the incident angles θ1, θ2, ..., θM The reflection polarization RDoP estimates the material under test at the current physical temperature T obj The complex dielectric constant under .

[0082] The specific implementation method of each module can be found in the specific description of the corresponding steps in the above embodiment 1, which will not be repeated here.

[0083] It also includes a water tank for holding the liquid material to be tested. In the embodiment of the present invention, the material to be tested is liquid. In other embodiments, other materials to be tested can also be selected.

[0084] It also includes a turntable for adjusting the angle between the center of the radiometer antenna and the horizontal line (90°-θ i ), so that the incident angle of the current measurement is θ i , i takes 1, 2, …, M; wherein the radiometer antenna is aligned with the center of the surface of the material to be measured.

[0085] In the embodiment of the present invention, the radiation source is an absorbing material, and the position of the absorbing material is changed to produce fluctuating environmental radiation. In other embodiments, other radiation sources may also be used, such as noise sources or natural conditions.

[0086] Below is Figure 2 The schematic diagram of the measurement system shown further illustrates the complex dielectric constant measurement process of the present invention.

[0087] (1) Figure 2 As shown, the radiometer observes the calm water surface at an incident angle of 40°. During the measurement process, in order to create a constantly changing ambient radiation T inc , change the position of the absorbing material, the order of change of the absorbing material position is ①②①②①. The total measurement time is 16s, and the radiometer is used to measure the target horizontal polarization output V during this period. h (t) and vertical polarization output V v (t), the measurement results are as follows Figure 3 、 Figure 4 shown.

[0088] (2) In order to remove the radiometer noise, use V h and V v The standard deviation of the time series is 0.0018 and 0.0016, and the For p e The valuation of RDoP is obtained by traversing RDOP∈[-1,0] and calculating the valuation of RDoP as -0.2823.

[0089] (3) Repeat steps (1) to (2) at incident angles of 50°, 60°, and 70°, and finally obtain the RDoP measurement values ​​at incident angles of 40°, 50°, 60°, and 70°, which are -0.2823, -0.4155, -0.5989, and -0.8113, respectively.

[0090] (4) The complex dielectric constant of the target is estimated based on the RDoP measured at these four incident angles. In the embodiment of the present invention, the real part and imaginary part of the complex dielectric constant of the material to be tested are estimated in the ranges of [1, 15] and [0, 15], respectively, and the estimation step size is 0.01. Based on the above method, the final result is 6.3 + 10.99i.

[0091] Example 3

[0092] An embodiment of the present invention provides an electronic device, including a computer-readable storage medium and a processor;

[0093] The computer-readable storage medium is used to store executable instructions;

[0094] The processor is configured to read the executable instructions stored in the computer-readable storage medium to execute the complex dielectric constant measurement method in the above-mentioned embodiment 1. For related technical solutions, please refer to the corresponding description in embodiment 1 and will not be repeated here.

[0095] Example 4

[0096] An embodiment of the present invention provides a computer-readable storage medium having a computer program stored thereon. When the program is executed by a processor, the complex dielectric constant measurement method described in Example 1 above is implemented. For related technical solutions, see the corresponding description in Example 1 and will not be repeated here.

[0097] Example 5

[0098] An embodiment of the present invention provides a computer program product that, when executed on a computer, causes the computer to execute the complex permittivity measurement method described in Example 1. For related technical solutions, see the corresponding description in Example 1 and will not be repeated here.

[0099] The present invention does not require calibration, does not need to measure the target physical temperature and ambient brightness temperature, and can directly use the radiometer output to obtain the complex dielectric constant of the material, and uses the emission voltage V EThe autocorrelation calculation of the reflected degree of polarization (RDoP) has low computational complexity and is unaffected by radiometer noise, atmospheric radiation and attenuation, and the approximate error of the Rayleigh-Jones law. This solves the current problems of complex permittivity measurement in the millimeter-wave radiation field, which have multiple error sources, require high-precision calibration equipment, and are susceptible to non-ideal factors. The above technical solution conceived by this invention can be used to measure the complex permittivity of various high-loss materials in the millimeter-wave frequency band. Based on the complex permittivity measurement value, material classification and hidden object identification can be further performed.

[0100] It will be easily understood by those skilled in the art that the above description is merely a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A complex dielectric constant measurement method based on reflection polarizability, characterized in that: include: S1. During the test time [0, t], maintain the physical temperature T of the material to be tested. obj unchanged, so that the current incident angle θ i The ambient radiation incident on the surface of the material to be tested is in a changing state, and the current incident angle θ is measured. i The horizontal polarization output V of the material under test h and vertically polarized output V v ; Where i is 1, 2, ..., or M, and M represents the total number of incident angles measured; S2. Calculate the emission voltage V of the material to be tested E Estimated value of , and so that the estimated value The absolute value of the autocorrelation is the minimum, which is the estimated target. The current incident angle θ is estimated. i The reflection polarization RDoP under , p e represents the emission polarization; S3. Change the current incident angle θ i , and repeat S1-S2 to obtain the incident angles θ1, θ2, ..., θ M Reflection polarization RDoP under S4, based on the incident angles θ1, θ2, ..., θ M The reflection polarization RDoP estimates the material under test at the current physical temperature T obj Complex dielectric constant under ; In S4, the current physical temperature T of the material to be tested is estimated by the following formula: obj Complex dielectric constant under : Where, is a preset estimate; represents the incident angle θ i Reflection polarization RDoP under Represents the parameter to be estimated At the incident angle θ i Theoretical value of RDoP under ; parameters to be estimated represents the jth complex dielectric constant within the approximate complex dielectric constant range of the material to be tested; wherein the approximate complex dielectric constant range of the material to be tested is a known quantity, and the complex dielectric constant range is divided into The jth complex dielectric constant is .

2. The method for measuring complex dielectric constant according to claim 1, wherein: The current incident angle θ is estimated by the following formula i Reflection polarization RDoP under: in, express The autocorrelation of is the noise correction term of the millimeter wave radiometer used to measure the current incident angle θ i The horizontal polarization output V of the material under test h and vertically polarized output V v ; is a constant.

3. The method for measuring complex dielectric constant according to claim 2, wherein: The millimeter-wave radiometer noise correction term The calculation method is: in, For the horizontal polarization output V h The standard deviation of For the vertical polarization output V v The standard deviation of .

4. The method for measuring complex dielectric constant according to claim 1, wherein: The M incident angles are included in The angle between For Brewster Point, is the preset angle threshold.

5. The method for measuring complex dielectric constant according to claim 1, wherein: The total number of incident angles M≥3.

6. A complex dielectric constant measurement system based on reflection polarizability, characterized in that: include: Radiation source, used to maintain the physical temperature T of the material under test during the test time [0, t] obj Under the same conditions, the changing ambient radiation is created so that the current incident angle θ i The ambient radiation incident on the surface of the material to be measured is in a changing state; wherein i is 1, 2, ..., or M; wherein M represents the total number of incident angles measured; Millimeter wave radiometer, used to measure the current incident angle θ i The horizontal polarization output V of the material under test within the test time [0, t] is h and vertically polarized output V v ; Reflection polarization calculation module, used to calculate the emission voltage V of the material to be tested E Estimated value of , and so that the estimated value The absolute value of the autocorrelation is the minimum, which is the estimated target. The current incident angle θ is estimated. i The reflection polarization RDoP under each incident angle θ1, θ2, ..., θ M Reflection polarization RDoP under , p e represents the emission polarization; Complex dielectric constant measurement module for each incident angle θ1, θ2, ..., θ M The reflection polarization RDoP estimates the material under test at the current physical temperature T obj Complex dielectric constant under ; Among them, the current physical temperature T of the material to be tested is estimated by the following formula: obj Complex dielectric constant under : Where, is a preset estimate; represents the incident angle θ i Reflection polarization RDoP under Represents the parameter to be estimated At the incident angle θ i Theoretical value of RDoP under ; parameters to be estimated represents the jth complex dielectric constant within the approximate complex dielectric constant range of the material to be tested; wherein the approximate complex dielectric constant range of the material to be tested is a known quantity, and the complex dielectric constant range is divided into The jth complex dielectric constant is .

7. An electronic device, characterized in that: comprising a computer-readable storage medium and a processor; The computer-readable storage medium is used to store executable instructions; The processor is configured to read the executable instructions stored in the computer-readable storage medium to execute the complex dielectric constant measurement method according to any one of claims 1 to 5.

8. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the program is executed by a processor, the complex dielectric constant measurement method according to any one of claims 1 to 5 is implemented.

9. A computer program product, characterized in that When the computer program product is run on a computer, the computer is enabled to execute the complex dielectric constant measurement method according to any one of claims 1 to 5.

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