Optoelectronic equipment calibration method
The static and dynamic calibration of optoelectronic equipment is solved through the drone and calibration reference point method, and the problem of expensive instruments and professionals in the existing technology is solved, and an efficient and economical calibration process is achieved, which improves the calibration process and improves the calibration process. The accuracy and installation efficiency of the equipment are achieved.
Patent Information
- Application Number
- CN202411111976.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-14
- Publication Date
- 2024-12-13
AI Technical Summary
The existing standard calibration methods for optoelectronic equipment require expensive measuring instruments and professionals, and it is difficult to accurately measure altitude in a narrow space, resulting in large installation errors and affecting the accuracy of the equipment.
UAVs are used for static and dynamic calibration. By measuring the relative height and orientation of optoelectronic equipment, combined with the drone calibration method and the calibration reference point method, fine-tuning and optimization are used for self-propelled detection and tracking algorithms to reduce high-precision measurements. Dependence of instruments and professionals.
The calibration process of optoelectronic equipment is simplified, the operation complexity and cost are reduced, the calibration efficiency is improved, and the horizontal zero error of the equipment can be accurately eliminated in various terrains, increasing the probability of target guidance entering the field of view.
Smart Images
Figure CN119124212A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of target detection, and in particular to a method for calibrating a photoelectric device. Background Art
[0002] Photoelectric equipment is a high-precision and high-level monitoring and tracking device. In daily applications, its installation accuracy is extremely high, and it is often necessary to be accurate to within 0.1 degrees. Therefore, it is usually necessary to perform static calibration and dynamic calibration on the photoelectric equipment to ensure its accuracy. In the prior art, static calibration is to make the orientation and level of the photoelectric equipment as close to zero as possible under the accuracy of the existing measuring instruments. It is a process of "finding" the orientation zero and horizontal zero of the photoelectric equipment. Dynamic calibration is done to guide the target into the field of view of the photoelectric device. It is a correction value related to the target characteristics. The correction value made by dynamic calibration can increase the probability of guiding the target into the field of view of the photoelectric device.
[0003] However, in actual applications, measuring the altitude of the equipment not only requires very expensive measuring instruments, but also requires the training of professional surveyors, which is time-consuming and laborious. Therefore, when measuring the height of the equipment, the altitude of the equipment is not measured, but the relative height of the equipment is measured. For example, the relative height relative to the installation ground, etc., greatly simplifies the difficulty of measuring the height. If the installation facilities of the optoelectronic equipment are directly fixed on the ground, then the height of the optoelectronic equipment relative to the ground is obtained by the height of the installation facilities and the height of the optoelectronic equipment itself. If the installation facilities of the optoelectronic equipment are installed on a building platform, it is only necessary to measure the relative height of the optoelectronic equipment and the building platform, that is, the height of the installation facilities and the height of the optoelectronic equipment itself; if the building platform space is small, only the relative height of the optoelectronic equipment and the ground can be measured, that is, the building height, the height of the installation facilities and the optoelectronic equipment. Summary of the invention
[0004] In view of the above technical problems in the related art, the present invention proposes a photoelectric device calibration method, which can overcome the above shortcomings of the prior art.
[0005] To achieve the above technical objectives, the technical solution of the present invention is implemented as follows: A method for calibrating a photoelectric device comprises the following steps: S1 Install equipment: Install the optoelectronic equipment to the installation location; S2 static calibration: first measure the installation height of the optoelectronic equipment, then perform static horizontal calibration on the optoelectronic equipment, and finally perform static azimuth calibration on the optoelectronic equipment; the static horizontal calibration is used to "shield" the horizontal error existing in the installation and leveling of the optoelectronic equipment, that is, the error within 0.1 degrees during installation, and the error between the horizontal zero of the equipment and the "true" horizontal zero when calibrating the optoelectronic equipment. S3 Dynamic Calibration: Select a dynamic calibration target and use it to dynamically calibrate the optoelectronic device. The correction value is obtained by guiding the dynamic calibration target into the field of view of the optoelectronic device. The correction value can increase the probability of guiding the dynamic calibration target into the field of view of the optoelectronic device. S4 system verification: Through the detection and tracking algorithm of the optoelectronic device, the effect of the target object in the field of view of the optoelectronic device is comprehensively observed, and the correction value and configuration parameters of the detection and tracking algorithm are fine-tuned and optimized according to the observed abnormal phenomena.
[0006] Preferably, in S1, when installing the optoelectronic device, the matters needing attention include: a). The installation facilities must be solid and stable, and cannot resonate with the rotation of the optoelectronic equipment; b). The installation location should be open and without large obstructions around; c). When designing the installation facilities, a firmware for flexible level adjustment should be considered to achieve the purpose of flexible level adjustment of the equipment after installation; d). High-precision level equipment is required to adjust the level of optoelectronic equipment; e). The installation precision of optoelectronic equipment should be within 0.1 degree.
[0007] Preferably, the S2 specifically includes the following steps: S2.1: Measure the installation height of the optoelectronic equipment. The installation height is the relative height of the optoelectronic equipment. S2.2: Use the UAV as a calibration tool to perform static horizontal calibration of optoelectronic equipment; S2.3: Use the calibration reference point method or the UAV calibration method to perform static orientation calibration of the optoelectronic equipment.
[0008] Preferably, in S2.1, the relative height h can be calculated as follows: a). If the installation facilities of the photovoltaic equipment are directly fixed on the installation ground, then calculate the sum of the height of the installation facilities and the height of the photovoltaic equipment itself, that is, the relative height of the photovoltaic equipment relative to the installation ground; b). If the installation facilities of the photovoltaic equipment are installed on a building platform, and the building platform serves as the installation ground, it is only necessary to measure the relative height between the photovoltaic equipment and the building platform. Then the sum of the height of the installation facilities and the height of the photovoltaic equipment itself is the relative height of the photovoltaic equipment; c). If the platform space of the building is small, we can only measure the relative height between the photoelectric equipment and the ground, and calculate the sum of the building height, the height of the installation facilities and the height of the photoelectric equipment itself, that is, the relative height of the photoelectric equipment.
[0009] During implementation, if the building height is known, the relative height h of the optoelectronic device and the ground can be easily obtained; if the building height is unknown, it can only be measured by measuring tools; according to the nature of our work project, using drones to measure relative height is a good choice, as shown in Figure 1 Schematic diagram of drone height measurement shown.
[0010] Preferably, the S2.1 uses a drone to measure the relative height of the optoelectronic device, and the specific steps are: a). Adjust the photoelectric equipment to 0 degrees horizontally, with the maximum field of view; b) The take-off point of the drone should be as close to the building as possible on the basis of safety. You can also take off the drone at a relatively far distance from the building, and then approach the building and optoelectronic equipment when the drone reaches a safe height; c). The drone hovering point should be as close as possible to the middle of the optoelectronic device’s field of view; d) To determine whether the drone is in the middle of the optoelectronic device, you can increase the focal length (the field of view becomes smaller) when the drone is hovering. If the drone is still in the field of view at the maximum focal length, it means that the drone is already in the middle of the optoelectronic device's field of view; at this time, the drone's hovering height is the height of the optoelectronic device relative to the ground; e). The height of the drone is accurate to the meter level; if you want to further increase the measurement accuracy, when the drone is already in the middle of the optoelectronic device's field of view, fine-tune the drone's height up and down until it hovers after a height change, and then the optoelectronic device follows and adjusts the drone to the middle of the field of view again; then calculate a more accurate height based on the distance value measured by the drone to the optoelectronic device and the pitch value after the optoelectronic fine-tuning. For details, please refer to Figure 2 Schematic diagram of fine-tuning the drone's altitude measurement shown.
[0011] Preferably, in S2.2, the method of using a drone to perform static level calibration on the optoelectronic device specifically includes the following steps: S2.2.1: Take off the UAV from the Home point near the optoelectronic device and hover it at the suspension point, where the Home point is the take-off point of the UAV, and measure or calculate relevant data; where the lateral distance of the Home point relative to the optoelectronic device is d, and the relative height of the suspension point relative to the Home point is H meters and the lateral distance is D meters; S2.2.2: Measure the relative height h of the optoelectronic device relative to the Home point (the Home point can be located on the ground or on a building platform, etc.), the distance d between the optoelectronic device and the Home point, and then calculate the theoretical value β of the angle between the hanging point and the optoelectronic device and the horizontal plane using the following formula; d=tan(90-α)*h (Formula 1); β=ctan((Hh) / (D+d)) (Formula 2); In the formula, α is the angle between the line connecting the photoelectric device and the Home point and the horizontal plane, and β is obtained through theoretical calculation; S2.2.3: Obtain the angle measurement value γ between the suspension point and the line connecting the photoelectric device and the horizontal plane through the state feedback of the photoelectric device; S2.2.4: Calculate the difference between γ and β respectively, which is the static level calibration value of the photoelectric device; if the difference is less than 0, it means that the zero level of the photoelectric device is too low; if the difference is greater than 0, it means that the zero level of the photoelectric device is too high.
[0012] Preferably, in S2.2, the Home point may be located on the ground or a building platform, etc.
[0013] Preferably, in S2.2, H is preferably 200, and D is preferably 200 / 500 / 800 / 1000 / 2000. The values of H and D depend on actual needs and may also be specifically numbered, such as H1, H2, H3, etc. or D1, D2, D3, etc.
[0014] Now, the static level calibration method in S2.2 is specifically described by an example. Figure 3 As shown: (Step 1): Take off the drone from the Home point near the optoelectronic device and hover at point A and point B respectively - two suspended points as examples. Similarly, H takes two values H1 and H2, and D takes two values D1 and D2, and then calculate the relevant data; Among them, the lateral distance of the Home point relative to the optoelectronic device is d, the relative height H1 of point A relative to the Home point is 200 meters, and the lateral distance D1 is 200 meters, and the relative height H2 of point B relative to the Home point is 200 meters, and the lateral distance D2 is 500 meters; (Step 2): Measure the relative height h between the optoelectronic device and the drone, and the lateral distance d between the optoelectronic device and the drone's Home point. The relative height h is the height of the optoelectronic device relative to the drone's take-off point - the Home point (the ground or a building platform). Then calculate the theoretical angles β1 and β2 between the lines connecting point A and point B and the optoelectronic device relative to the horizontal plane using the following formulas; d = tan(90-α)*h; β1=ctan((H1-h) / (D1+d)) =ctan((200-h) / (200+d)); β2=ctan((H2-h) / (D2+d)) =ctan((200-h) / (500+d)); In the formula, α is the angle between the line connecting the photoelectric device and the Home point and the horizontal plane, β1 and β2 are examples of β and are obtained through theoretical calculation; H1=200, D1=200, H2=200, D2=500; (Step 3): Obtain the angle measurement values γ1 and γ2 between point A and the line connecting point B and the photoelectric device relative to the horizontal plane through the state feedback of the photoelectric device; (Step 4): Calculate the difference between γ1 and β1, and the difference between γ2 and β2, that is, the static level calibration value of the photoelectric device; if the difference is less than 0, it means that the zero level of the photoelectric device is too low; if the difference is greater than 0, it means that the zero level of the photoelectric device is too high.
[0015] Preferably, in S2.2, when using a drone to perform static level calibration on the optoelectronic equipment, matters needing attention include: a). When obtaining the lateral distance d between the optoelectronic device and the drone's Home point, the drone can easily enter the optoelectronic device's field of view due to its proximity to the optoelectronic device. However, in order to improve the accuracy of the d value, the optoelectronic device must be pulled to the maximum focal length - minimum field of view, and then the up, down, left, and right of the optoelectronic device must be fine-tuned to try to keep the drone in the middle of the field of view. Only in this way can the measured distance be closer to the actual distance; b). When the UAV flies to a certain distance and hovers, the optoelectronic device should be pulled to the maximum focal length - minimum field of view, and then the up, down, left and right of the optoelectronic device should be fine-tuned to make the UAV in the middle of the field of view; the pitch angle of the optoelectronic device obtained by such operation is closer to the real pitch angle.
[0016] Preferably, in S2.3, the calibration reference point method may be specifically: a1) First, find a calibration reference point near the optoelectronic device. The calibration reference point should preferably be an object with obvious image features (such as a large color difference from the image background); b1) Secondly, use the instrument to measure the longitude and latitude coordinates of the optoelectronic device and the calibration reference point, and then calculate the azimuth angle α of the calibration reference point relative to the optoelectronic device from the longitude and latitude coordinates of the two points; then manually adjust the optoelectronic device to the reference point, increase the focal length to the maximum - the minimum field of view, and ensure that the reference point object is in the middle of the image, read the state value of the optoelectronic device to obtain the azimuth value β; c1) Finally, the difference between α and β is the azimuth calibration value; the error of the calibration reference point method mainly depends on the error of the photoelectric device measured by the instrument and the calibration reference point, such as Figure 4 Schematic diagram of static azimuth calibration is shown.
[0017] Preferably, in the calibration reference point method in S2.3, the calibration reference point is preferably between 1 km and 2 km away from the optoelectronic equipment.
[0018] Preferably, in S2.3, the drone calibration method may be specifically: a2) Calibrate with the drone. In the static level calibration section, when the drone moves away from the device and reaches the hovering point, the pilot takes a photo. b2) After the drone lands, the photos taken by the drone are exported to the computer, and the longitude and latitude information can be found through the photo attributes. The azimuth angle α of the drone relative to the optoelectronic device can also be calculated through this longitude and latitude information and the longitude and latitude information of the optoelectronic device; c2) The calibration value that needs to be adjusted in the azimuth β of the feedback state of the photoelectric device can be calculated, that is, the difference between β and α. The UAV calibration method makes full use of the high accuracy of UAV measurement of longitude and latitude, so the error source of this method mainly lies in the measurement of longitude and latitude of the photoelectric device.
[0019] Preferably, in S3, a flying object is selected as the dynamic calibration target. During implementation, the purpose of static calibration is to make the orientation and level of the optoelectronic device as close to zero as possible under the accuracy of existing measuring instruments, which is a process of "finding" the orientation zero and level zero of the optoelectronic device. Dynamic calibration is a correction value related to the target characteristics made in order to guide the dynamic calibration target into the field of view of the optoelectronic device. This correction value can increase the probability of guiding the target into the field of view of the optoelectronic device.
[0020] like Figure 5 As shown in the figure, dynamic calibration does not have measuring instruments, and the most valuable calibration object is the flying object itself, such as civil aviation. The calibrator must have a deep understanding of optoelectronic equipment and sensors, and must be good at observation and active thinking.
[0021] Preferably, in S4, the abnormal phenomenon includes whether the target object is pulled left and right, pulled up and down, draws a circle in the field of view, etc.
[0022] Beneficial effects of the present disclosure: Compared with the prior art, the optoelectronic equipment calibration method provided by the present disclosure is simple to operate and easy to execute, and can eliminate the error values existing in the installation of optoelectronic equipment to the greatest extent, greatly reducing the professional requirements for operators, and can adapt to various complex and changeable terrains. The present disclosure does not require expensive auxiliary equipment, greatly reducing the cost of operations such as standardized calibration of optoelectronic equipment, has good economic value, and greatly improves the calibration efficiency for optoelectronic equipment. The present disclosure can easily eliminate the error between the horizontal zero and the "true" horizontal zero of the equipment when the optoelectronic equipment is equipped, greatly reducing the error value range within 0.1 degrees during installation, and through the coordination of static calibration and dynamic calibration, a high-precision correction value can be obtained to increase the probability of guiding the target into the field of view of the optoelectronic equipment. BRIEF DESCRIPTION OF THE DRAWINGS
[0023] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.
[0024] Figure 1 Schematic diagram of drone altitude measurement in S2.1 described in the present disclosure.
[0025] Figure 2 This is a schematic diagram of fine-tuning the drone's altitude measurement when measuring the drone's altitude in S2.1 described in the present disclosure.
[0026] Figure 3 This is a schematic diagram showing an example of the operation of the static horizontal calibration in S2.2 described in the present disclosure.
[0027] Figure 4 This is a schematic diagram of the static orientation calibration of the calibration reference point method in S2.3 described in the present disclosure.
[0028] Figure 5 It is a schematic diagram of guiding the pitch correction value when a flying object (civil aviation) is selected as a dynamic calibration target in S3 described in the present disclosure. DETAILED DESCRIPTION
[0029] The following will be combined with the accompanying drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field belong to the scope of protection of the present invention.
[0030] like Figure 1-5 As shown, in order to facilitate understanding of the above technical solution of the present invention, the above technical solution of the present invention is described in detail below through specific usage.
[0031] The optoelectronic device calibration method of the present invention comprises the following steps: S1 Install equipment: Install the optoelectronic equipment to the installation location; S2 static calibration: first measure the installation height of the optoelectronic equipment, then perform static horizontal calibration on the optoelectronic equipment, and finally perform static azimuth calibration on the optoelectronic equipment; the static horizontal calibration is used to "shield" the horizontal error existing in the installation and leveling of the optoelectronic equipment (i.e. the error within 0.1 degree during installation), and to calibrate the error between the horizontal zero of the equipment and the "true" horizontal zero when the optoelectronic equipment is installed; S3 Dynamic Calibration: Select a dynamic calibration target and use it to dynamically calibrate the optoelectronic device. The correction value is obtained by guiding the dynamic calibration target into the field of view of the optoelectronic device. The correction value can increase the probability of guiding the dynamic calibration target into the field of view of the optoelectronic device. S4 system verification: Through the detection and tracking algorithm of the optoelectronic device, the effect of the target object in the field of view of the optoelectronic device is comprehensively observed, and the correction value and configuration parameters of the detection and tracking algorithm are fine-tuned and optimized according to the observed abnormal phenomena.
[0032] In one embodiment, in S1, when installing the optoelectronic device, the matters needing attention include: a). The installation facilities must be solid and stable, and cannot resonate with the rotation of the optoelectronic equipment; b). The installation location should be open and without large obstructions around; c). When designing the installation facilities, a firmware for flexible level adjustment should be considered to achieve the purpose of flexible level adjustment of the equipment after installation; d). High-precision level equipment is required to adjust the level of optoelectronic equipment; e). The installation precision of optoelectronic equipment should be within 0.1 degree.
[0033] In one embodiment, S2 specifically includes the following steps: S2.1: Measure the installation height of the optoelectronic equipment. The installation height is the relative height of the optoelectronic equipment. S2.2: Use the UAV as a calibration tool to perform static horizontal calibration of optoelectronic equipment; S2.3: Use the calibration reference point method or the UAV calibration method to perform static orientation calibration of the optoelectronic equipment.
[0034] In one embodiment, in S2.1, the relative height h can be calculated as follows: a). If the installation facilities of the photovoltaic equipment are directly fixed on the installation ground, then calculate the sum of the height of the installation facilities and the height of the photovoltaic equipment itself, that is, the relative height of the photovoltaic equipment relative to the installation ground; b). If the installation facilities of the photovoltaic equipment are installed on a building platform, and the building platform serves as the installation ground, it is only necessary to measure the relative height between the photovoltaic equipment and the building platform. Then the sum of the height of the installation facilities and the height of the photovoltaic equipment itself is the relative height of the photovoltaic equipment; c). If the platform space of the building is small, we can only measure the relative height between the photoelectric equipment and the ground, and calculate the sum of the building height, the height of the installation facilities and the height of the photoelectric equipment itself, that is, the relative height of the photoelectric equipment.
[0035] During implementation, if the building height is known, the relative height h of the optoelectronic device and the ground can be easily obtained; if the building height is unknown, it can only be measured by measuring tools; according to the nature of our work project, using drones to measure relative height is a good choice, as shown in Figure 1 Schematic diagram of drone height measurement shown.
[0036] In one embodiment, the S2.1 uses a drone to measure the relative height of the optoelectronic device, and the specific steps are: a). Adjust the photoelectric equipment to 0 degrees horizontally, with the maximum field of view; b) The take-off point of the drone should be as close to the building as possible on the basis of safety. You can also take off the drone at a relatively far distance from the building, and then approach the building and optoelectronic equipment when the drone reaches a safe height; c). The drone hovering point should be as close as possible to the middle of the optoelectronic device’s field of view; d) To determine whether the drone is in the middle of the optoelectronic device, you can increase the focal length (the field of view becomes smaller) when the drone is hovering. If the drone is still in the field of view at the maximum focal length, it means that the drone is already in the middle of the optoelectronic device's field of view; at this time, the drone's hovering height is the height of the optoelectronic device relative to the ground; e). The height of the drone is accurate to the meter level; if you want to further increase the measurement accuracy, when the drone is already in the middle of the optoelectronic device's field of view, fine-tune the drone's height up and down until it hovers after a height change, and then the optoelectronic device follows and adjusts the drone to the middle of the field of view again; then calculate a more accurate height based on the distance value measured by the drone to the optoelectronic device and the pitch value after the optoelectronic fine-tuning. For details, please refer to Figure 2 Schematic diagram of fine-tuning the drone's altitude measurement shown.
[0037] In one embodiment, in S2.2, the method of using a drone to perform static level calibration on the optoelectronic device specifically includes the following steps: S2.2.1: Take off the UAV from the Home point near the optoelectronic device and hover it at the suspension point, where the Home point is the take-off point of the UAV, and measure or calculate relevant data; where the lateral distance of the Home point relative to the optoelectronic device is d, and the relative height of the suspension point relative to the Home point is H meters and the lateral distance is D meters; S2.2.2: Measure the relative height h of the optoelectronic device relative to the Home point (the Home point can be located on the ground or on a building platform, etc.), the distance d between the optoelectronic device and the Home point, and then calculate the theoretical value β of the angle between the hanging point and the optoelectronic device and the horizontal plane using the following formula; d=tan(90-α)*h (Formula 1); β=ctan((Hh) / (D+d)) (Formula 2); In the formula, α is the angle between the line connecting the photoelectric device and the Home point and the horizontal plane, and β is obtained through theoretical calculation; S2.2.3: Obtain the angle measurement value γ between the suspension point and the line connecting the photoelectric device and the horizontal plane through the state feedback of the photoelectric device; S2.2.4: Calculate the difference between γ and β respectively, which is the static level calibration value of the photoelectric device; if the difference is less than 0, it means that the zero level of the photoelectric device is too low; if the difference is greater than 0, it means that the zero level of the photoelectric device is too high.
[0038] In one embodiment, in S2.2, the Home point may be located on the ground or a building platform, etc.
[0039] In one embodiment, in S2.2, H is preferably 200, and D is preferably 200 / 500 / 800 / 1000 / 2000. The values of H and D depend on actual needs and may also be specifically numbered, such as H1, H2, H3, etc. or D1, D2, D3, etc.
[0040] Now, the static level calibration method in S2.2 is specifically described by an example. Figure 3 As shown: (Step 1): Take the drone off from the Home point near the optoelectronic device and hover at point A and point B, taking two hovering points as examples. Similarly, H takes two values H1 and H2, and D takes two values D1 and D2, and then calculate the relevant data; among which, the lateral distance of the Home point relative to the optoelectronic device is d, the relative height H1 of point A relative to the Home point is 200 meters, and the lateral distance D1 is 200 meters, and the relative height H2 of point B relative to the Home point is 200 meters, and the lateral distance D2 is 500 meters; (Step 2): Measure the relative height h between the optoelectronic device and the drone, and the lateral distance d between the optoelectronic device and the drone's Home point. The relative height h is the height of the optoelectronic device relative to the drone's take-off point - the Home point (the ground or a building platform). Then calculate the theoretical angles β1 and β2 between the lines connecting point A and point B and the optoelectronic device relative to the horizontal plane using the following formulas; d = tan(90-α)*h; β1=ctan((H1-h) / (D1+d)) =ctan((200-h) / (200+d)); β2=ctan((H2-h) / (D2+d)) =ctan((200-h) / (500+d)); In the formula, α is the angle between the line connecting the photoelectric device and the Home point and the horizontal plane, β1 and β2 are examples of β and are obtained through theoretical calculation; H1=200, D1=200, H2=200, D2=500; (Step 3): Obtain the angle measurement values γ1 and γ2 between point A and the line connecting point B and the photoelectric device relative to the horizontal plane through the state feedback of the photoelectric device; (Step 4): Calculate the difference between γ1 and β1, and the difference between γ2 and β2, that is, the static level calibration value of the photoelectric device; if the difference is less than 0, it means that the zero level of the photoelectric device is too low; if the difference is greater than 0, it means that the zero level of the photoelectric device is too high.
[0041] In one embodiment, in S2.2, when using a drone to perform static level calibration on an optoelectronic device, matters needing attention include: a). When obtaining the lateral distance d between the optoelectronic device and the drone's Home point, the drone can easily enter the optoelectronic device's field of view due to its proximity to the optoelectronic device. However, in order to improve the accuracy of the d value, the optoelectronic device must be pulled to the maximum focal length - minimum field of view, and then the up, down, left, and right of the optoelectronic device must be fine-tuned to try to keep the drone in the middle of the field of view. Only in this way can the measured distance be closer to the actual distance; b). When the UAV flies to a certain distance and hovers, the optoelectronic device should be pulled to the maximum focal length - minimum field of view, and then the up, down, left and right of the optoelectronic device should be fine-tuned to make the UAV in the middle of the field of view; the pitch angle of the optoelectronic device obtained by such operation is closer to the real pitch angle.
[0042] In one embodiment, in S2.3, the calibration reference point method may be specifically: a1) First, find a calibration reference point near the optoelectronic device. The calibration reference point should preferably be an object with obvious image features (such as a large color difference from the image background); b1) Secondly, use the instrument to measure the longitude and latitude coordinates of the optoelectronic device and the calibration reference point, and then calculate the azimuth angle α of the calibration reference point relative to the optoelectronic device from the longitude and latitude coordinates of the two points; then manually adjust the optoelectronic device to the reference point, increase the focal length to the maximum - the minimum field of view, and ensure that the reference point object is in the middle of the image, read the state value of the optoelectronic device to obtain the azimuth value β; c1) Finally, the difference between α and β is the azimuth calibration value; the error of the calibration reference point method mainly depends on the error of the photoelectric device measured by the instrument and the calibration reference point, such as Figure 4 Schematic diagram of static azimuth calibration is shown.
[0043] In one embodiment, in the calibration reference point method in S2.3, the calibration reference point is preferably between 1 km and 2 km away from the optoelectronic device.
[0044] In one embodiment, in S2.3, the drone calibration method may be specifically: a2) Calibrate with the drone. In the static level calibration section, when the drone moves away from the device and reaches the hovering point, the pilot takes a photo. b2) After the drone lands, the photos taken by the drone are exported to the computer, and the longitude and latitude information can be found through the photo attributes. The azimuth angle α of the drone relative to the optoelectronic device can also be calculated through this longitude and latitude information and the longitude and latitude information of the optoelectronic device; c2) The calibration value that needs to be adjusted in the azimuth β of the feedback state of the photoelectric device can be calculated, that is, the difference between β and α. The UAV calibration method makes full use of the high accuracy of UAV measurement of longitude and latitude, so the error source of this method mainly lies in the measurement of longitude and latitude of the photoelectric device.
[0045] In one embodiment, in S3, a flying object is selected as the dynamic calibration target. During implementation, the purpose of static calibration is to make the orientation and level of the optoelectronic device as close to zero as possible under the accuracy of existing measuring instruments. It is a process of "finding" the orientation zero and level zero of the optoelectronic device. The dynamic calibration is a correction value related to the target characteristics made in order to guide the dynamic calibration target into the field of view of the optoelectronic device. This correction value can increase the probability of guiding the target into the field of view of the optoelectronic device.
[0046] like Figure 5 As shown in the figure, dynamic calibration does not have measuring instruments, and the most valuable calibration object is the flying object itself, such as civil aviation. The calibrator must have a deep understanding of optoelectronic equipment and sensors, and must be good at observation and active thinking.
[0047] In one embodiment, in S4, the abnormal phenomenon includes whether the target object is pulled left and right, pulled up and down, draws a circle in the field of view, etc.
[0048] In summary, with the aid of the above technical solutions of the present invention, the optoelectronic equipment calibration method provided by the present disclosure is simple to operate and easy to execute, and can eliminate the error values existing in the installation of optoelectronic equipment to the greatest extent, greatly reducing the professional requirements for operators, and can adapt to various complex and changeable terrains. The present disclosure does not require expensive auxiliary equipment, greatly reduces the cost of operations such as standardized calibration of optoelectronic equipment, has good economic value, and greatly improves the calibration efficiency for optoelectronic equipment. The present disclosure can easily eliminate the error between the horizontal zero and the "true" horizontal zero of the equipment when the optoelectronic equipment is equipped, greatly reducing the error value range within 0.1 degrees during installation, and through the coordination of static calibration and dynamic calibration, a high-precision correction value can be obtained to increase the probability of guiding the target into the field of view of the optoelectronic equipment.
[0049] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims
1. A method for calibrating optoelectronic equipment. It is characterized in that The following steps are involved: S1 Install equipment: Install the optoelectronic equipment to the installation location; S2 static calibration: first measure the installation height of the optoelectronic equipment, then perform static horizontal calibration on the optoelectronic equipment, and finally perform static azimuth calibration on the optoelectronic equipment; the static horizontal calibration is used to "shield" the horizontal error existing in the installation and leveling of the optoelectronic equipment, that is, the error within 0.1 degrees during installation, and the error between the horizontal zero of the equipment and the "true" horizontal zero when calibrating the optoelectronic equipment. S3 Dynamic Calibration: Select a dynamic calibration target and use it to dynamically calibrate the optoelectronic device. The correction value is obtained by guiding the dynamic calibration target into the field of view of the optoelectronic device. The probability of guiding the dynamic calibration target into the field of view of the optoelectronic device is increased by the correction value. S4 system verification: Through the detection and tracking algorithm of the optoelectronic device, the effect of the target object in the field of view of the optoelectronic device is comprehensively observed, and the correction value and configuration parameters of the detection and tracking algorithm are fine-tuned and optimized according to the observed abnormal phenomena.
2. The optoelectronic device calibration method according to claim 1, It is characterized in that In S1, when installing optoelectronic equipment, the matters needing attention include: a) The installation facilities must be solid and stable, and cannot resonate with the rotation of the optoelectronic equipment; b) The installation location must be open and without large obstructions around; c) When designing the installation facilities, a firmware for flexible level adjustment should be considered to achieve the purpose of flexible level adjustment of the equipment after installation; d) High-precision level equipment is required to adjust the level of optoelectronic equipment; e) The installation level of optoelectronic equipment must be accurate to within 0.1 degree.
3. The optoelectronic device calibration method according to claim 1, It is characterized in that The S2 specifically includes the following steps: S2.1: Measure the installation height of the optoelectronic equipment. The installation height is the relative height of the optoelectronic equipment. S2.2: Use the UAV as a calibration tool to perform static horizontal calibration of optoelectronic equipment; S2.3: Use the calibration reference point method or the UAV calibration method to perform static orientation calibration of the optoelectronic equipment.
4. The optoelectronic device calibration method according to claim 1, It is characterized in that In S2.1, the relative height h is calculated as follows: a) If the installation facilities of the photovoltaic equipment are directly fixed on the installation ground, then calculate the sum of the height of the installation facilities and the height of the photovoltaic equipment itself, that is, the relative height of the photovoltaic equipment relative to the installation ground; b) If the installation facilities of the photovoltaic equipment are installed on a building platform, and the building platform serves as the installation ground, it is only necessary to measure the relative height between the photovoltaic equipment and the building platform. Then the sum of the height of the installation facilities and the height of the photovoltaic equipment itself is the relative height of the photovoltaic equipment. c) If the platform space of the building is small, we can only measure the relative height of the photovoltaic equipment and the ground, and calculate the sum of the building height, the height of the installation facilities and the height of the photovoltaic equipment itself, that is, the relative height of the photovoltaic equipment.
5. The optoelectronic device calibration method according to claim 1, It is characterized in that S2.1 uses a drone to measure the relative height of the optoelectronic device, and the specific steps are as follows: a) The optoelectronic equipment is adjusted to 0 degrees horizontally, with the maximum field of view; b) The take-off point of the drone should be as close to the building as possible on the basis of safety. The drone should be launched at a relatively far distance from the building, and then approach the building and optoelectronic equipment when the drone reaches a safe height; c) The drone’s hovering point should be as close as possible to the center of the optoelectronic device’s field of view; d) Determine whether the drone is in the middle of the optoelectronic device. When the drone is hovering, increase the focal length - the field of view becomes smaller. If the drone is still in the field of view at the maximum focal length, it means that the drone is already in the middle of the optoelectronic device's field of view. At this time, the drone's hovering height is the height of the optoelectronic device relative to the ground. e) The altitude of the UAV is accurate to the meter level; if you want to further increase the measurement accuracy, when the UAV is already in the middle of the field of view of the optoelectronic device, fine-tune the altitude of the UAV up and down until there is a change in altitude and it hovers, and then the optoelectronic device follows and adjusts the UAV to the middle of the field of view again; then calculate a more accurate altitude based on the distance value measured by the UAV to the optoelectronic device and the pitch value after the optoelectronic fine-tuning.
6. The optoelectronic device calibration method according to claim 1, It is characterized in that In S2.2, the method of using a drone to perform static level calibration on the optoelectronic equipment specifically includes the following steps: S2.2.1: Take off the UAV from the Home point near the optoelectronic device and hover it at the suspension point, where the Home point is the take-off point of the UAV, and measure or calculate relevant data; where the lateral distance of the Home point relative to the optoelectronic device is d, and the relative height of the suspension point relative to the Home point is H meters and the lateral distance is D meters; S2.2.2: Measure the relative height h of the optoelectronic device relative to the Home point, and the distance d between the optoelectronic device and the Home point, and then calculate the theoretical value β of the angle between the hanging point and the optoelectronic device and the horizontal plane using the following formula; d=tan(90-α)*h (Formula 1); β=ctan((Hh) / (D+d)) (Formula 2); In the formula, α is the angle between the line connecting the photoelectric device and the Home point and the horizontal plane, and β is obtained through theoretical calculation; S2.2.3: Obtain the angle measurement value γ between the suspension point and the line connecting the photoelectric device and the horizontal plane through the state feedback of the photoelectric device; S2.2.4: Calculate the difference between γ and β respectively, which is the static level calibration value of the photoelectric device. If the difference is less than 0, it means that the zero level of the photoelectric device is too low; if the difference is greater than 0, it means that the zero level of the photoelectric device is too high.
7. The optoelectronic device calibration method according to claim 6, It is characterized in that In S2.2, when using drones to perform static level calibration of optoelectronic equipment, the following matters need to be noted: a) When obtaining the lateral distance d between the optoelectronic device and the drone's Home point, the drone can easily enter the optoelectronic device's field of view due to its proximity to the optoelectronic device. However, in order to improve the accuracy of the d value, the optoelectronic device must be pulled to the maximum focal length - minimum field of view, and then the up, down, left, and right of the optoelectronic device must be fine-tuned to try to keep the drone in the middle of the field of view. Only in this way can the measured distance be closer to the actual distance; b) When the UAV flies to a certain distance and hovers, the optoelectronic device should be pulled to the maximum focal length - minimum field of view, and then the up, down, left and right of the optoelectronic device should be fine-tuned to try to put the UAV in the middle of the field of view; the pitch angle of the optoelectronic device obtained by such operation is closer to the real pitch angle.
8. The optoelectronic device calibration method according to claim 1, It is characterized in that In S2.3, The calibration reference point method is specifically as follows: a1) First, find a calibration reference point near the optoelectronic device. The calibration reference point should be an object with obvious image features. b1) Secondly, use the instrument to measure the longitude and latitude coordinates of the optoelectronic device and the calibration reference point, and then calculate the azimuth angle α of the calibration reference point relative to the optoelectronic device from the longitude and latitude coordinates of the two points; then manually adjust the optoelectronic device to the reference point, increase the focal length to the maximum - the minimum field of view, and ensure that the reference point object is in the middle of the image, read the state value of the optoelectronic device to obtain the azimuth value β; c1) Finally, the difference between α and β is the azimuth calibration value; The UAV calibration method is specifically as follows: a2) Calibrate with the drone. In the static level calibration section, when the drone moves away from the device and reaches the hovering point, the pilot takes a photo. b2) After the drone lands, the photos taken by the drone are exported to the computer, and the longitude and latitude information can be found through the photo attributes. The azimuth angle α of the drone relative to the optoelectronic device can also be calculated through this longitude and latitude information and the longitude and latitude information of the optoelectronic device; c2) The calibration value that needs to be adjusted in the azimuth, i.e., the difference between β and α, can be calculated from the azimuth β fed back from the photoelectric device.
9. The optoelectronic device calibration method according to claim 1, It is characterized in that In S3, a flying object is selected as the dynamic calibration target.
10. The optoelectronic device calibration method according to claim 1, It is characterized in that In S4, the abnormal phenomenon includes whether the target object is pulled left and right, pulled up and down, or draws a circle in the field of view.