Direct-current resistor temperature drift characteristic measurement system based on data visualization

Abstract

The invention provides a direct-current resistor temperature drift characteristic measurement system based on data visualization, which comprises a measurement circuit, a detection system, a regulation and control system and a visualization system, and is characterized in that the measurement circuit is used for measuring the temperature drift characteristic of a resistor to be detected; the detection system is used for detecting parameters in the measurement circuit and the regulation and control system, the regulation and control system is used for regulating and controlling independent variables of the measurement circuit, and the visualization system is used for analyzing and visualizing the parameters of the systems. According to the invention, the error caused by the detection end is introduced in the analysis stage of the temperature drift characteristic curve, and the error introduced by the temperature difference between the temperature value of the first temperature control box and the detection temperature value of the to-be-detected resistor is analyzed, so that the accuracy of the temperature drift characteristic analysis result of the to-be-detected resistor is improved; and meanwhile, a data visualization technology is introduced, so that an analysis result can be converted into various charts in different forms.

Description

Technical Field

[0001] The invention relates to the field of circuit element testing, and in particular to a DC resistance temperature drift characteristic measurement system based on data visualization. Background Art

[0002] In the amplifier circuit, any parameter change, such as power supply voltage fluctuation, component aging, and semiconductor component parameter changes with temperature, will cause output voltage drift. In the direct-coupled amplifier circuit, the drift voltage of the previous stage will be sent to the next stage together with the useful signal, and amplified step by step, so that sometimes it is difficult to distinguish what is the useful signal and what is the drift voltage at the output. The change in semiconductor device parameters caused by temperature change is the main reason for the zero drift phenomenon, so zero drift is also called temperature drift, or temperature drift for short.

[0003] For example, the prior art CN113625816A discloses a low temperature drift current generating circuit, comprising a negative temperature coefficient voltage unit, an operational amplifier with a positive temperature coefficient compensation voltage, a current mirror and a resistor, wherein a first output end of the current mirror is connected to an output end of the negative temperature coefficient voltage unit and to a first input end of the operational amplifier with a positive temperature coefficient compensation voltage, a second output end of the current mirror is connected to one end of the resistor and to a second input end of the operational amplifier with a positive temperature coefficient compensation voltage, an output end of the operational amplifier with a positive temperature coefficient compensation voltage is connected to an input end of the current mirror, a second end of the resistor serves as an output end of the current generating circuit, a current flowing through the resistor is a low temperature drift current, and is output from the output end of the current generating circuit.

[0004] Another typical prior art disclosed in CN213661576U is a temperature drift suppression circuit, which includes: a power amplifier circuit, a comparator A1, an enabling module, and a sampling correction module. The sampling correction module includes a sampling module and a correction module.

[0005] Next, let's look at a method for correcting temperature drift of a thermometer thermocouple disclosed in the prior art such as KR101704222B1, which includes: obtaining an analog voltage of a resistance thermistor in response to a constant current source, converting the obtained analog voltage into data, and calculating the temperature difference between each temperature in an RT table depending on the temperature of the thermistor and a set normal temperature, and calculating a correction value by multiplying the calculated temperature difference by a set correction coefficient.

[0006] Although there are many methods for measuring the temperature drift characteristics of resistors in the art, it is often difficult to accurately obtain the temperature drift curve of the resistor, and there is little use of data visualization, and the data expression is not intuitive enough. In order to solve the common problems in the art, the present invention is made. Summary of the invention

[0007] The purpose of the present invention is to propose a DC resistance temperature drift characteristic measurement system based on data visualization in view of the current shortcomings.

[0008] In order to overcome the shortcomings of the prior art, the present invention adopts the following technical solutions:

[0009] A DC resistor temperature drift characteristic measurement system based on data visualization, comprising a measurement circuit, a detection system, a control system and a visualization system, wherein the measurement circuit is used to measure the temperature drift characteristic of a resistor to be detected, the detection system is used to detect various parameters in the measurement circuit and the control system, the control system is used to control the independent variable of the measurement circuit, and the visualization system is used to analyze and visualize the parameters of various systems;

[0010] The visualization system includes a recording module, a data processing module, a chart generating module, a data storage module, a display module and an interactive module; the recording module is in signal communication with the detection system and the measurement circuit, the recording module is used to record the detection data of the detection system and the measurement circuit, the recording module includes a timer, and the timer is used to record time; the data processing module is used to analyze the temperature drift characteristics of the resistor to be detected according to the detection data, and generate a temperature drift characteristic curve of the resistor to be detected; the interactive module is used to receive user instructions; the chart generating module is used to generate corresponding charts according to the user instructions and the processing results of the data processing module; the data storage module is used to store the data in the recording module, the data processing module and the chart generating module; the display module is used to display the generated chart.

[0011] Furthermore, the measuring circuit includes a power supply, a first voltmeter, a second voltmeter, an ammeter, a resistor to be detected, a thermistor and multiple wires; the power supply is used to output direct current of different sizes; the wires are used to connect various circuit elements; the power supply, the resistor to be detected, the ammeter and the thermistor are connected in series in sequence through the wires; the first voltmeter and the resistor to be detected are connected in parallel through the wires to detect the voltage across the resistor to be detected; the second voltmeter and the thermistor are connected in parallel through the wires to detect the voltage across the thermistor; the ammeter is used to detect the current of the circuit, and the thermistor is used to regulate the overall resistance of the circuit.

[0012] Furthermore, the control system includes a first temperature-controlled box and a second temperature-controlled box, the first temperature-controlled box including a first temperature-controlled component, a first input hole and a first output hole; the first input hole and the first output hole are used to allow the wire to pass through the first temperature-controlled box, the first temperature-controlled box surrounds the resistor to be detected and is in a sealed state, and the first temperature-controlled component is used to set the internal temperature of the first temperature-controlled box; the second temperature-controlled box includes a second temperature-controlled component, a second input hole and a second output hole; the second input hole and the second output hole are used to allow the wire to pass through the second temperature-controlled box, the second temperature-controlled box surrounds the thermistor and is in a sealed state, and the second temperature-controlled component is used to set the internal temperature of the second temperature-controlled box.

[0013] Furthermore, the detection system includes a first detection component, a second detection component, a third detection component, and a fourth detection component; the detection end of the first detection component is attached to the resistor to be detected, and is used to detect the temperature of the resistor to be detected; the second detection component is installed on the inner wall of the first temperature control box, and is used to detect the temperature inside the first temperature control box; the detection end of the third detection component is attached to the thermistor, and is used to detect the temperature of the thermistor; the fourth detection component is installed on the inner wall of the second temperature control box, and is used to detect the temperature inside the second temperature control box.

[0014] Furthermore, the measuring circuit for measuring the temperature drift characteristic of the DC resistance comprises the following steps:

[0015] STEP 1, adjust the resistance value of the thermistor;

[0016] STEP2, turn on the power supply, the first voltmeter, the second voltmeter and the ammeter;

[0017] STEP 3, continuously lower the temperature of the first temperature control box until the value of the first voltmeter drops to the minimum value and remains stable;

[0018] STEP4, continue to increase the temperature of the first temperature control box until the value of the ammeter drops to the minimum value and remains stable;

[0019] STEP5, the recording module records the readings of the ammeter, the first voltmeter, the first detection element and the second detection element during the process from STEP3 to STEP4. After the recording is completed, the power supply is turned off and the measurement is completed.

[0020] Furthermore, the visualization system analyzes and visualizes the parameters of each system and includes the following steps:

[0021] S1, the recording module records the readings of the ammeter, the first voltmeter, the first detection element and the second detection element and the recording time;

[0022] S2, the data processing module analyzes the temperature drift characteristics of the resistor to be detected according to the reading;

[0023] S3, the interaction module receives the user instruction;

[0024] S4, the chart generation module selects a suitable chart model according to the user instruction, and displays the curve and processing result generated by the data processing module during the processing;

[0025] S5, the data storage module stores data;

[0026] S6, the display module displays the generated chart.

[0027] Furthermore, the data processing module analyzes the temperature drift characteristics of the resistor to be detected, including the following steps:

[0028] S21, according to the readings of the ammeter, the first voltmeter, the first detection element, the second detection element, and the timer, respectively draw a current variation curve over time, a voltage variation curve over time, a temperature variation curve over time of the resistance to be detected, and a temperature variation curve over time of the first temperature control box;

[0029] S22, combining the current variation with time curve and the voltage variation with time curve by R=U / I to obtain the resistance value variation with time curve of the resistance to be detected, wherein R is the resistance value of the resistance to be detected, U is the reading of the first voltmeter, and I is the reading of the ammeter;

[0030] S23, obtaining a curve of the resistance value of the resistor to be detected varying with the detection temperature according to the curve of the resistance value of the resistor to be detected varying with the time and the curve of the detection temperature of the resistor to be detected varying with the time; obtaining a curve of the temperature of the resistor to be detected varying with the temperature of the first temperature control box according to the curve of the detection temperature of the resistor to be detected varying with the time and the curve of the temperature of the first temperature control box varying with the time;

[0031] S24, from the starting point to the end point of the curve of the resistance value of the resistor to be detected changing with the detection temperature, extract the detection temperature value of the resistor to be detected and its corresponding resistance value every one degree Celsius to obtain multiple detection temperature values ​​[T1, T2...Ti...TN] and multiple resistance values ​​[R1, R2...Ri...RN] of the resistor to be detected, where i∈[1,N], Ri corresponds to Ti, and N is the number of extractions;

[0032] Obtain the temperature value [t1, t2…ti…tN] of the first temperature control box corresponding to [T1, T2…Ti…TN] from the curve of the temperature change of the resistor to be detected as the temperature of the first temperature control box;

[0033] S25, substitute T1, R1 and t1 into T, R and t in the following formula respectively to obtain B1, substitute T2, R2 and t2 into T, R and t in the following formula respectively to obtain B2, and so on until TN, RN and tN are substituted into T, R and t in the following formula respectively to obtain BN;

[0034]

[0035] Wherein, R is the resistance of the resistor to be detected, R0 is the resistance of the resistor to be detected at room temperature, T0 is the preset normal temperature value, B is the temperature coefficient, T is the detection temperature value of the resistor to be detected, t is the temperature value of the first temperature control box, S 总 is the surface area of ​​the detection end of the first detection member, S 贴 is the contact area between the detection end of the first detection element and the resistor to be detected;

[0036] S26, arranging B1, B2...Bi...BN from small to large to obtain a sequence of temperature coefficients B;

[0037] S27, eliminating the five smallest values ​​and the five largest values ​​in the sequence of the temperature coefficient B, and averaging the remaining values ​​in the sequence to obtain an average temperature coefficient b.

[0038] The beneficial effects achieved by the present invention are as follows: by introducing the error caused by the detection end in the analysis stage of the temperature drift characteristic curve, the error introduced by the temperature difference between the temperature value of the first temperature control box and the detection temperature value of the resistor to be detected is analyzed, thereby improving the accuracy of the temperature drift characteristic analysis result of the resistor to be detected; at the same time, by introducing data visualization technology, the analysis results can be converted into charts in a variety of different forms. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] The present invention can be further understood from the following description in conjunction with the accompanying drawings. The components in the figures are not necessarily drawn to scale, but the emphasis is placed on illustrating the principles of the embodiments. In different views, the same reference numerals designate the same parts.

[0040] Figure 1 It is a structural schematic diagram of the present invention.

[0041] Figure 2 The present invention is a flow chart of the measurement circuit for measuring the temperature drift characteristics of a DC resistor.

[0042] Figure 3 This is a flow chart of the visualization system of the present invention analyzing and visualizing the parameters of each system.

[0043] Figure 4 The present invention is a flow chart of a data processing module analyzing the temperature drift characteristic of a resistor to be detected and generating a temperature drift characteristic curve of the resistor to be detected. DETAILED DESCRIPTION

[0044] The following is an explanation of the embodiments of the present invention through specific embodiments. Those skilled in the art can understand the advantages and effects of the present invention from the contents disclosed in this specification. The present invention can be implemented or applied through other different specific embodiments, and the details in this specification can also be modified and changed in various ways based on different viewpoints and applications without departing from the spirit of the present invention. In addition, the drawings of the present invention are only simple schematic illustrations and are not depicted according to actual sizes. It is stated in advance. The following embodiments will further explain the relevant technical contents of the present invention in detail, but the disclosed contents are not intended to limit the scope of protection of the present invention.

[0045] Embodiment 1:

[0046] according to Figure 1 , Figure 2 , Figure 3 and Figure 4 This embodiment provides a DC resistance temperature drift characteristic measurement system based on data visualization, including a measurement circuit, a detection system, a control system and a visualization system, wherein the measurement circuit is used to measure the temperature drift characteristic of the resistor to be detected, the detection system is used to detect various parameters in the measurement circuit and the control system, the control system is used to control the independent variable of the measurement circuit, and the visualization system is used to analyze and visualize the parameters of each system;

[0047] The visualization system includes a recording module, a data processing module, a chart generating module, a data storage module, a display module and an interactive module; the recording module is in signal communication with the detection system and the measurement circuit, the recording module is used to record the detection data of the detection system and the measurement circuit, the recording module includes a timer, and the timer is used to record time; the data processing module is used to analyze the temperature drift characteristics of the resistor to be detected according to the detection data, and generate a temperature drift characteristic curve of the resistor to be detected; the interactive module is used to receive user instructions; the chart generating module is used to generate corresponding charts according to the user instructions and the processing results of the data processing module; the data storage module is used to store the data in the recording module, the data processing module and the chart generating module; the display module is used to display the generated chart.

[0048] Furthermore, the measuring circuit includes a power supply, a first voltmeter, a second voltmeter, an ammeter, a resistor to be detected, a thermistor and multiple wires; the power supply is used to output direct current of different sizes; the wires are used to connect various circuit elements; the power supply, the resistor to be detected, the ammeter and the thermistor are connected in series in sequence through the wires; the first voltmeter and the resistor to be detected are connected in parallel through the wires to detect the voltage across the resistor to be detected; the second voltmeter and the thermistor are connected in parallel through the wires to detect the voltage across the thermistor; the ammeter is used to detect the current of the circuit, and the thermistor is used to regulate the overall resistance of the circuit.

[0049] Specifically, the temperature characteristic curve of the thermistor is known.

[0050] Furthermore, the control system includes a first temperature-controlled box and a second temperature-controlled box, the first temperature-controlled box including a first temperature-controlled component, a first input hole and a first output hole; the first input hole and the first output hole are used to allow the wire to pass through the first temperature-controlled box, the first temperature-controlled box surrounds the resistor to be detected and is in a sealed state, and the first temperature-controlled component is used to set the internal temperature of the first temperature-controlled box; the second temperature-controlled box includes a second temperature-controlled component, a second input hole and a second output hole; the second input hole and the second output hole are used to allow the wire to pass through the second temperature-controlled box, the second temperature-controlled box surrounds the thermistor and is in a sealed state, and the second temperature-controlled component is used to set the internal temperature of the second temperature-controlled box.

[0051] Furthermore, the detection system includes a first detection component, a second detection component, a third detection component, and a fourth detection component; the detection end of the first detection component is attached to the resistor to be detected, and is used to detect the temperature of the resistor to be detected; the second detection component is installed on the inner wall of the first temperature control box, and is used to detect the temperature inside the first temperature control box; the detection end of the third detection component is attached to the thermistor, and is used to detect the temperature of the thermistor; the fourth detection component is installed on the inner wall of the second temperature control box, and is used to detect the temperature inside the second temperature control box.

[0052] Furthermore, the measuring circuit for measuring the temperature drift characteristic of the DC resistance comprises the following steps:

[0053] STEP 1, adjust the resistance value of the thermistor;

[0054] Specifically, when the temperature is too low, the resistance value of the resistor to be detected will be approximately equal to 0. By adjusting the resistance value of the thermistor, a short circuit in the measurement circuit can be avoided. Different temperature drift characteristic curves of the resistor to be detected can also be obtained for different thermistor resistance values.

[0055] STEP2, turn on the power supply, the first voltmeter, the second voltmeter and the ammeter;

[0056] STEP 3, continuously lower the temperature of the first temperature control box until the value of the first voltmeter drops to the minimum value and remains stable;

[0057] STEP4, continue to increase the temperature of the first temperature control box until the value of the ammeter drops to the minimum value and remains stable;

[0058] STEP5, the recording module records the readings of the ammeter, the first voltmeter, the first detection element and the second detection element during the process from STEP3 to STEP4. After the recording is completed, the power supply is turned off and the measurement is completed.

[0059] Specifically, by changing the output of the power supply and the resistance value of the thermistor, the temperature drift characteristic of the DC resistor can be measured multiple times, and by comparing the results of the multiple measurements, the measurement accuracy can be improved.

[0060] Specifically, adjusting the resistance value of the thermistor includes the following steps:

[0061] STEP 11, setting the temperature of the second temperature control box according to the temperature characteristic curve of the thermistor and the required resistance value;

[0062] STEP 12, observe the reading of the third detection member. If the reading of the third detection member is the same as the set temperature of the second temperature control box and remains stable, the resistance value setting is completed.

[0063] Furthermore, the visualization system analyzes and visualizes the parameters of each system and includes the following steps:

[0064] S1, the recording module records the readings of the ammeter, the first voltmeter, the first detection element and the second detection element and the recording time;

[0065] S2, the data processing module analyzes the temperature drift characteristics of the resistor to be detected according to the reading;

[0066] S3, the interaction module receives the user instruction;

[0067] S4, the chart generation module selects a suitable chart model according to the user instruction, and displays the curve and processing result generated by the data processing module during the processing;

[0068] S5, the data storage module stores data;

[0069] S6, the display module displays the generated chart.

[0070] Furthermore, the data processing module analyzes the temperature drift characteristics of the resistor to be detected, including the following steps:

[0071] S21, according to the readings of the ammeter, the first voltmeter, the first detection element, the second detection element, and the timer, respectively draw a current variation curve over time, a voltage variation curve over time, a temperature variation curve over time of the resistance to be detected, and a temperature variation curve over time of the first temperature control box;

[0072] S22, combining the current variation with time curve and the voltage variation with time curve by R=U / I to obtain the resistance value variation with time curve of the resistance to be detected, wherein R is the resistance value of the resistance to be detected, U is the reading of the first voltmeter, and I is the reading of the ammeter;

[0073] S23, obtaining a curve of the resistance value of the resistor to be detected varying with the detection temperature according to the curve of the resistance value of the resistor to be detected varying with the time and the curve of the detection temperature of the resistor to be detected varying with the time; obtaining a curve of the temperature of the resistor to be detected varying with the temperature of the first temperature control box according to the curve of the detection temperature of the resistor to be detected varying with the time and the curve of the temperature of the first temperature control box varying with the time;

[0074] S24, from the starting point to the end point of the curve of the resistance value of the resistor to be detected changing with the detection temperature, extract the detection temperature value of the resistor to be detected and its corresponding resistance value every one degree Celsius to obtain multiple detection temperature values ​​[T1, T2...Ti...TN] and multiple resistance values ​​[R1, R2...Ri...RN] of the resistor to be detected, where i∈[1,N], Ri corresponds to Ti, and N is the number of extractions;

[0075] Obtain the temperature value [t1, t2…ti…tN] of the first temperature control box corresponding to [T1, T2…Ti…TN] from the curve of the temperature change of the resistor to be detected as the temperature of the first temperature control box;

[0076] Specifically, the serial numbers of the temperature values ​​and the resistance values ​​correspond to the number of times the same resistor is repeatedly tested.

[0077] S25, substitute T1, R1 and t1 into T, R and t in the following formula respectively to obtain B1, substitute T2, R2 and t2 into T, R and t in the following formula respectively to obtain B2, and so on until TN, RN and tN are substituted into T, R and t in the following formula respectively to obtain BN;

[0078]

[0079] Wherein, R is the resistance of the resistor to be detected, R0 is the resistance of the resistor to be detected at room temperature, T0 is the preset normal temperature value, B is the temperature coefficient, T is the detection temperature value of the resistor to be detected, t is the temperature value of the first temperature control box, S 总 is the surface area of ​​the detection end of the first detection member, S 贴is the contact area between the detection end of the first detection element and the resistor to be detected;

[0080] Generally speaking, the preset normal temperature value is the normal temperature value of the environment, for example, it can be set to 26 degrees Celsius.

[0081] Specifically, a pressure detection unit is provided inside the detection end of the first detection member, and there are multiple pressure detection units. The pressure detection unit can detect the pressure on various parts of the surface of the detection end of the first detection member; the pressure detection unit can detect the pressure at the contact part between the detection end of the first detection member and the resistor to be detected. By analyzing the proportion of the pressure detection units that detect the pressure in all the pressure detection units, it can be known that S 空 In S 总 The proportion of S 空 The value of, that is: Where L 检 is the number of pressure detection units that detect pressure, L 总 is the total number of pressure detection units.

[0082] S26, arranging B1, B2...Bi...BN from small to large to obtain a sequence of temperature coefficients B;

[0083] S27, eliminating the five smallest values ​​and the five largest values ​​in the sequence of the temperature coefficient B, and averaging the remaining values ​​in the sequence to obtain an average temperature coefficient b.

[0084] Specifically, the average temperature coefficient b can be used to characterize the temperature drift characteristics of the resistor. The larger the average temperature coefficient b is, the more drastic the change in the resistance value with temperature change is.

[0085] It is worth noting that for a resistor, its temperature coefficient is generally constant, but in the actual measurement process, the temperature coefficient will often change when the temperature is too high or too low, and errors caused by the measurement will occur. This solution uses the average temperature coefficient to reduce the impact of errors and extreme values, thereby improving the accuracy of the temperature characteristic curve of the resistor to be detected.

[0086] The beneficial effects of this solution are as follows: by introducing the error caused by the detection end in the analysis stage of the temperature drift characteristic curve, the error introduced by the temperature difference between the temperature value of the first temperature control box and the detection temperature value of the resistor to be detected is analyzed, thereby improving the accuracy of the temperature drift characteristic analysis result of the resistor to be detected; at the same time, by introducing data visualization technology, the analysis results can be converted into charts in a variety of different forms.

[0087] Embodiment 2:

[0088] This embodiment should be understood to include all the features of any of the above embodiments, and further improve on the above embodiments, and the parameter adjustment method of the first temperature control box includes the following contents:

[0089] The first temperature control box is provided with an algorithm unit, and the algorithm unit adjusts the parameters of the first temperature control box according to the temperature value detected by the second detection element using the following formula:

[0090] Parameter adjustment amount = Kp(t)*(current error + Ki(t)*accumulated error + Kd(t)*error change rate);

[0091] Wherein, Kp(t), Ki(t) and Kd(t) are adaptive parameters of proportion, integration and differentiation at time t, respectively; the current error is the error between the set temperature at time t and the temperature value detected by the second detection member; the cumulative error is the cumulative value of multiple errors generated from the start of temperature adjustment of the first temperature control box to time t; the error change rate is the change rate of multiple errors generated from the start of temperature adjustment of the first temperature control box to time t;

[0092] Specifically, the parameter adjustment amount may be the power of the heating element or the heat dissipation element in the first temperature-controlled box.

[0093] Specifically, the adjustment formula of the adaptive parameters is as follows:

[0094] Kp(t)=Kp0+ΔKp(t); Ki(t)=Ki0+ΔKi(t); Kd(t)=Kd0+ΔKd(t);

[0095] Among them, Kp0, Ki0 and Kd0 are initial parameters pre-set by technicians in this field based on experience, and ΔKp(t), ΔKi(t) and ΔKd(t) are parameter corrections calculated based on the error index at time t;

[0096] The error index is obtained according to the following formula:

[0097]

[0098] Wherein, e(t) is the error index, y_ref(t) is the set temperature at time t, y(t) is the temperature value detected by the second detection member at time t; e(t0) is the error index at the last parameter adjustment; ΔK(t0) is the parameter adjustment amount at the last parameter adjustment; Δt is the time interval between two adjustments, which is determined by technicians in this field according to needs when designing the algorithm unit;

[0099] According to the error signal, the parameter correction can be calculated:

[0100] ΔKp(t)=γp*e(t); ΔKi(t)=γi*∫e(t)dt; ΔKd(t)=γd*de(t) / dt;

[0101] Among them, γp, γi and γd are initial gain parameters of adaptive parameter adjustment obtained by technicians in this field based on experience, and are used to control the speed and amplitude of parameter correction.

[0102] The beneficial effects of this embodiment are as follows: by continuously adjusting the parameters of the first temperature control box, when the difference between the set temperature and the actual temperature is large, the difference between the set temperature and the actual temperature can be quickly shortened; when the difference between the set temperature and the actual temperature is small, the parameters are finely adjusted to improve the performance and stability of the first temperature control box.

[0103] The contents disclosed above are only preferred feasible embodiments of the present invention, and do not limit the protection scope of the present invention. Therefore, all equivalent technical changes made using the contents of the present invention specification and drawings are included in the protection scope of the present invention. In addition, the elements therein can be updated as technology develops.

Claims

1. A DC resistance temperature drift characteristic measurement system based on data visualization, characterized in that: It includes a measuring circuit, a detection system, a control system and a visualization system, wherein the measuring circuit is used to measure the temperature drift characteristics of the resistor to be detected, the detection system is used to detect various parameters in the measuring circuit and the control system, the control system is used to control the independent variable of the measuring circuit, and the visualization system is used to analyze and visualize the parameters of various systems; The visualization system includes a recording module, a data processing module, a chart generation module, a data storage module, a display module and an interaction module; the recording module is in signal communication with the detection system and the measurement circuit, the recording module is used to record the detection data of the detection system and the measurement circuit, the recording module includes a timer, and the timer is used to record time; the data processing module is used to analyze the temperature drift characteristics of the resistor to be detected according to the detection data, and generate a temperature drift characteristic curve of the resistor to be detected; the interaction module is used to receive user instructions; The chart generation module is used to generate corresponding charts according to user instructions and processing results of the data processing module; The data storage module is used to store the data in the recording module, the data processing module and the chart generating module; the display module is used to display the generated chart.

2. The DC resistance temperature drift characteristic measurement system based on data visualization according to claim 1, characterized in that: The measuring circuit includes a power supply, a first voltmeter, a second voltmeter, an ammeter, a resistor to be detected, a thermistor and multiple wires; the power supply is used to output direct current of different sizes; the wires are used to connect various circuit elements; the power supply, the resistor to be detected, the ammeter and the thermistor are connected in series in sequence through the wires; the first voltmeter and the resistor to be detected are connected in parallel through the wires to detect the voltage across the resistor to be detected; the second voltmeter and the thermistor are connected in parallel through the wires to detect the voltage across the thermistor; the ammeter is used to detect the current of the circuit, and the thermistor is used to adjust the overall resistance of the circuit.

3. The DC resistance temperature drift characteristic measurement system based on data visualization according to claim 2, characterized in that: The control system includes a first temperature control box and a second temperature control box, the first temperature control box includes a first temperature control component, a first input hole and a first output hole; the first input hole and the first output hole are used to allow the wire to pass through the first temperature control box, the first temperature control box surrounds the resistor to be detected and is in a sealed state, and the first temperature control component is used to set the internal temperature of the first temperature control box; the second temperature control box includes a second temperature control component, a second input hole and a second output hole; the second input hole and the second output hole are used to allow the wire to pass through the second temperature control box, the second temperature control box surrounds the thermistor and is in a sealed state, and the second temperature control component is used to set the internal temperature of the second temperature control box.

4. The DC resistance temperature drift characteristic measurement system based on data visualization according to claim 3 is characterized in that: The detection system includes a first detection component, a second detection component, a third detection component, and a fourth detection component; the detection end of the first detection component is attached to the resistor to be detected, and is used to detect the temperature of the resistor to be detected; the second detection component is installed on the inner wall of the first temperature control box, and is used to detect the temperature inside the first temperature control box; the detection end of the third detection component is attached to the thermistor, and is used to detect the temperature of the thermistor; the fourth detection component is installed on the inner wall of the second temperature control box, and is used to detect the temperature inside the second temperature control box.

5. The DC resistance temperature drift characteristic measurement system based on data visualization according to claim 4, characterized in that: The measuring circuit for measuring the temperature drift characteristic of the DC resistance comprises the following steps: STEP 1, adjust the resistance value of the thermistor; STEP2, turn on the power supply, the first voltmeter, the second voltmeter and the ammeter; STEP 3, continuously lower the temperature of the first temperature control box until the value of the first voltmeter drops to the minimum value and remains stable; STEP4, continue to increase the temperature of the first temperature control box until the value of the ammeter drops to the minimum value and remains stable; STEP5, the recording module records the readings of the ammeter, the first voltmeter, the first detection element and the second detection element during the process from STEP3 to STEP4. After the recording is completed, the power supply is turned off and the measurement is completed.

6. The DC resistance temperature drift characteristic measurement system based on data visualization according to claim 5, characterized in that: The visualization system analyzes the parameters of each system and performs visualization processing, including the following steps: S1, the recording module records the readings of the ammeter, the first voltmeter, the first detection element and the second detection element and the recording time; S2, the data processing module analyzes the temperature drift characteristics of the resistor to be detected according to the reading; S3, the interaction module receives the user instruction; S4, the chart generation module selects a suitable chart model according to the user instruction, and displays the curve and processing result generated by the data processing module during the processing; S5, the data storage module stores data; S6, the display module displays the generated chart.

7. A DC resistance temperature drift characteristic measurement system based on data visualization according to claim 6, characterized in that: The data processing module analyzes the temperature drift characteristics of the resistor to be detected, including the following steps: S21, according to the readings of the ammeter, the first voltmeter, the first detection element, the second detection element, and the timer, respectively draw a current variation curve over time, a voltage variation curve over time, a temperature variation curve over time of the resistance to be detected, and a temperature variation curve over time of the first temperature control box; S22, combining the current variation with time curve and the voltage variation with time curve by R=U / I to obtain the resistance value variation with time curve of the resistance to be detected, wherein R is the resistance value of the resistance to be detected, U is the reading of the first voltmeter, and I is the reading of the ammeter; S23, obtaining a curve of the resistance value of the resistor to be detected varying with the detection temperature according to the curve of the resistance value of the resistor to be detected varying with the time and the curve of the detection temperature of the resistor to be detected varying with the time; obtaining a curve of the temperature of the resistor to be detected varying with the temperature of the first temperature control box according to the curve of the detection temperature of the resistor to be detected varying with the time and the curve of the temperature of the first temperature control box varying with the time; S24, from the starting point to the end point of the curve of the resistance value of the resistor to be detected changing with the detection temperature, extract the detection temperature value of the resistor to be detected and its corresponding resistance value every one degree Celsius to obtain multiple detection temperature values ​​[T1, T2...Ti...TN] and multiple resistance values ​​[R1, R2...Ri...RN] of the resistor to be detected, where i∈[1,N], Ri corresponds to Ti, and N is the number of extractions; Obtain the temperature value [t1, t2…ti…tN] of the first temperature control box corresponding to [T1, T2…Ti…TN] from the curve of the temperature change of the resistor to be detected as the temperature of the first temperature control box; S25, substitute T1, R1 and t1 into T, R and t in the following formula respectively to obtain B1, substitute T2, R2 and t2 into T, R and t in the following formula respectively to obtain B2, and so on until TN, RN and tN are substituted into T, R and t in the following formula respectively to obtain BN; Wherein, R is the resistance of the resistor to be detected, R0 is the resistance of the resistor to be detected at room temperature, T0 is the preset normal temperature value, B is the temperature coefficient, T is the detection temperature value of the resistor to be detected, t is the temperature value of the first temperature control box, S 总 is the surface area of ​​the detection end of the first detection member, S 贴 is the contact area between the detection end of the first detection element and the resistor to be detected; S26, arranging B1, B2...Bi...BN from small to large to obtain a sequence of temperature coefficients B; S27, eliminating the five smallest values ​​and the five largest values ​​in the sequence of the temperature coefficient B, and averaging the remaining values ​​in the sequence to obtain an average temperature coefficient b.

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