Method and device for testing and verifying influence of TRIM function on read-write performance of solid state disk

Abstract

The invention relates to a method and device for testing and verifying the influence of a TRIM function on the read-write performance of a solid state disk, computer equipment and a storage medium. The method comprises the steps that a BG Trim default value is obtained through a DFT command; filling and idling for a certain time, and obtaining baseline performance of sequential writing and sequential reading; initiating a Trim command and executing sequential write operation at the same time, and counting the sequential write performance as the write performance of the BG Trim idle 0S; after safe erasure, filling the disk and leaving the disk idle for a certain time, initiating a Trim command and executing sequential reading operation at the same time, and counting the sequential reading performance as the reading performance of BG Trim idle 0S; and counting test results and outputting a graphical test report. According to the method, the Trim of the solid state disk can be controlled to be started by writing the shell script, and meanwhile, the influence of the TRIM function on the IO reading and writing performance can be indirectly reflected in combination with the sequential reading and writing performance.

Description

Technical Field

[0001] The present invention relates to the technical field of solid state drive testing, and in particular to a method, device, computer equipment and storage medium for testing and verifying the influence of a TRIM function on the read and write performance of a solid state drive. Background Art

[0002] During the data reading process of SSD (Solid State Drive), a series of actions will affect the performance of SSD, such as TRIM in the firmware, garbage collection mechanism, firmware upgrade and downgrade, etc. The write operation of SSD needs to erase the data block before writing new data, so the TRIM function is very important for SSD based on NAND flash memory. Among them, the TRIM function of SSD is mainly used to improve the performance of SSD, extend the service life and optimize storage space. The TRIM instruction allows the operating system to tell the SSD which data blocks are no longer in use and can be safely erased by the SSD controller. This action usually occurs when the user deletes files or empties the Recycle Bin. Therefore, testing and verifying whether the TRIM mechanism of the current SSD is reasonable directly determines the user experience of SSD products on the client side.

[0003] At present, the general practice in the industry is to use the FIO tool to issue TRIM commands to check and track TRIM performance. However, whether the read and write IOs during background TRIM have a negative impact on IO performance, whether the degree of impact is in line with expectations, and whether the read and write IOs after the background TRIM ends have an impact on IO performance. These TRIM performance impact tests that interact with read and write IO are not covered. Summary of the invention

[0004] Based on this, it is necessary to provide a test and verification method, device, computer equipment and storage medium for the impact of the TRIM function on the read and write performance of solid-state drives in response to the above technical problems.

[0005] A method for testing and verifying the influence of a TRIM function on the read and write performance of a solid state drive, the method comprising:

[0006] Get the default value of BG Trim through DFT command;

[0007] Fill the disk and leave it idle for a certain period of time to obtain the baseline performance of sequential write and sequential read;

[0008] Initiate the Trim command and execute the sequential write operation at the same time, and count the sequential write performance as the write performance of BG Trim idle 0S;

[0009] After secure erasure, fill the disk and leave it idle for a certain period of time, initiate a Trim command and perform sequential read operations at the same time, and count the sequential read performance as the BG Trim idle 0S read performance;

[0010] Count the test results and output graphical test reports.

[0011] In one embodiment, the method further comprises:

[0012] After secure erasure, fill the disk and leave it idle for a certain period of time. After initiating the Trim command, leave it idle for a certain period of time before performing sequential write operations. The performance of sequential writes is counted as the write performance of the BG Trim idle time.

[0013] After secure erasure, fill the disk and leave it idle for a certain period of time. After initiating the Trim command, leave it idle for a certain period of time and then perform a sequential read operation. The performance of sequential reads is counted as the read performance of the BG Trim idle time.

[0014] In one embodiment, the step of initiating a Trim command and executing a sequential write operation at the same time, and calculating the performance of the sequential write as the write performance of the BG Trim idle OS includes:

[0015] Use FIO to issue the TRIM command, trim 10g, bs=10g. At the same time, use FIO for sequential write, size=10g, BS is 1024K, Q8T1 offset=0, and collect sequential write performance data.

[0016] In one embodiment, the step of initiating a Trim command and executing a sequential read operation at the same time, and counting the performance of the sequential read as the read performance of the BG Trim idle OS includes:

[0017] Use FIO to issue the TRIM command, trim 10g, bs=10g. Use FIO to do sequential reads at the same time, size=10g, BS is 1024K, Q8T1 offset=0, and collect sequential read performance data.

[0018] A test and verification device for the influence of a TRIM function on the read and write performance of a solid state drive, the device comprising:

[0019] A first acquisition module, wherein the first acquisition module is used to obtain a BG Trim default value through a DFT command;

[0020] A second acquisition module, the second acquisition module is used to fill the disk and leave it idle for a certain period of time to obtain a baseline performance of sequential writing and sequential reading;

[0021] The first test module is used to initiate a Trim command and execute a sequential write operation at the same time, and to count the sequential write performance as the BG Trim idle 0S write performance; after secure erasure, fill the disk and leave it idle for a certain period of time, initiate a Trim command and execute a sequential read operation at the same time, and to count the sequential read performance as the BG Trim idle 0S read performance;

[0022] The result output module is used to count the test results and output a graphical test report.

[0023] In one embodiment, the device further comprises a second testing module, wherein the second testing module is configured to:

[0024] After secure erasure, fill the disk and leave it idle for a certain period of time. After initiating the Trim command, leave it idle for a certain period of time before performing sequential write operations. The performance of sequential writes is counted as the write performance of the BG Trim idle time.

[0025] After secure erasure, fill the disk and leave it idle for a certain period of time. After initiating the Trim command, leave it idle for a certain period of time and then perform a sequential read operation. The performance of sequential reads is counted as the read performance of the BG Trim idle time.

[0026] In one embodiment, the first test module is further used for:

[0027] Use FIO to issue the TRIM command, trim 10g, bs=10g. At the same time, use FIO for sequential write, size=10g, BS is 1024K, Q8T1 offset=0, and collect sequential write performance data.

[0028] In one embodiment, the first test module is further used for:

[0029] Use FIO to issue the TRIM command, trim 10g, bs=10g. Use FIO to do sequential reads at the same time, size=10g, BS is 1024K, Q8T1 offset=0, and collect sequential read performance data.

[0030] A computer device comprises a memory, a processor and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of any one of the above methods when executing the computer program.

[0031] A computer-readable storage medium stores a computer program, wherein the computer program implements the steps of any one of the above methods when executed by a processor.

[0032] The test verification method, device, computer equipment and storage medium of the impact of the TRIM function on the read and write performance of the solid-state hard disk are as follows: the BG Trim default value is obtained through the DFT command; the disk is filled and idle for a certain period of time, and the baseline performance of sequential write and sequential read is obtained; the Trim command is initiated and the sequential write operation is performed at the same time, and the performance of sequential write is counted as the write performance of BG Trim idle 0S; after secure erasure, the disk is filled and idle for a certain period of time, the Trim command is initiated and the sequential read operation is performed at the same time, and the performance of sequential read is counted as the read performance of BG Trim idle 0S; the test results are counted and a graphical test report is output. The present invention can control the Trim startup of the solid-state hard disk by writing a shell script, and at the same time, combined with the sequential read and write performance, it can indirectly reflect the performance impact of the TRIM function on the read and write IO. In addition, after the test is completed, the collected data can be automatically imported into the specified performance template for graphical display, thereby realizing efficient visual testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] Figure 1 A flowchart of a method for testing and verifying the effect of a TRIM function on the read and write performance of a solid state drive in one embodiment;

[0034] Figure 2 A performance evaluation effect diagram showing the intersection of BG Trim and read / write IO in one embodiment;

[0035] Figure 3 A flowchart of a method for testing and verifying the effect of a TRIM function on the read and write performance of a solid state drive in another embodiment;

[0036] Figure 4 A structural block diagram of a device for testing and verifying the effect of a TRIM function on the read and write performance of a solid state drive in one embodiment;

[0037] Figure 5 A structural block diagram of a device for testing and verifying the influence of a TRIM function on the read and write performance of a solid state drive in another embodiment;

[0038] Figure 6 FIG. 4 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0039] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0040] In one embodiment, Figure 1 As shown, a test and verification method for the influence of the TRIM function on the read and write performance of a solid state drive is provided, and the method includes:

[0041] Step 102, obtaining the BG Trim default value through the DFT command;

[0042] Step 104, fill the disk and leave it idle for a certain period of time to obtain the baseline performance of sequential writing and sequential reading;

[0043] Step 106, initiate a Trim command and execute a sequential write operation at the same time, and count the performance of the sequential write as the write performance of the BG Trim idle OS;

[0044] Step 108, after secure erasure, fill the disk and leave it idle for a certain period of time, initiate a Trim command and perform a sequential read operation at the same time, and count the sequential read performance as the read performance of BG Trim idle OS;

[0045] Step 110: Count the test results and output a graphical test report.

[0046] In this embodiment, a test verification method for the effect of the TRIM function on the read and write performance of the solid-state drive is provided. The method uses the open source tools FIO, NVME, setpci, DFT firmware and serial port tools to write a shell script in the Linux system to control the Trim startup of the solid-state drive, and combines the sequential read and write speed and 4K random read and write performance to indirectly reflect the effect of the TRIM function. When read and write IOs are expected to come in, the performance will decline after the previous BG Trim is executed; the BG Trim command ends and has a positive effect on the read hit (becomes nomapping performance); the write hit has a reverse effect. After the test is completed, the collected data is automatically imported into the specified performance template for graphical display.

[0047] Specifically, first turn off APST (autonomous power state transfer) / ASPM (active state power management), SetPS0 (an IO read and write power state that supports maximum power consumption), and perform secure erasure on the hard disk under test. Use the DFT command to obtain the default threshold of BG Trim (the default value corresponds to 5G) and save it.

[0048] Next, fill the disk and leave it idle for a certain period of time, specifically 60 seconds. Then use FIO to fill the disk with 10G, BS is 1024K, Q8T1, offset = 0, collect performance data as a baseline, and obtain the baseline performance of sequential write. Use FIO for sequential reads, size = 10g, BS is 1024K, Q8T1 offset = 0, collect performance data as a baseline, and obtain the baseline performance of sequential reads.

[0049] Then, use FIO to issue TRIM command and use FIO to do sequential write at the same time to collect sequential write performance data. The stage name is "BG-TRIM-idle0s" and the action is "sequential write". After secure erase, use FIO to fill the disk with 10G. After filling the disk, leave it idle for a certain period of time, specifically 60s, BS is 1024K, Q8T1, offset=0.

[0050] Then, use FIO to issue the TRIM command and use FIO to do sequential reads to collect sequential read performance data. The stage name is "BG-TRIM-idle0s" and the action is "sequential read".

[0051] In one embodiment, the method further includes: after secure erasure, filling the disk and leaving it idle for a certain period of time, initiating a Trim command and leaving it idle for a certain period of time before executing a sequential write operation, and counting the performance of sequential writes as the write performance of the BG Trim idle time corresponding to that time; after secure erasure, filling the disk and leaving it idle for a certain period of time, initiating a Trim command and leaving it idle for a certain period of time before executing a sequential read operation, and counting the performance of sequential reads as the read performance of the BG Trim idle time corresponding to that time.

[0052] Specifically, use FIO to issue the TRIM command, and then use FIO to do sequential write after 60 seconds of idle time to collect sequential write performance data. The stage name is "BG-TRIM-idle60s" and the action is "sequential write". After secure erasure, use FIO to fill the disk with 10G, and then idle for a certain period of time after filling the disk, specifically 60s, BS is 1024K, Q8T1, offset = 0. Use FIO to issue the TRIM command, and then use FIO to do sequential read after 60 seconds of idle time to collect sequential read performance data. The stage name is "BG-TRIM-idle60s" and the action is "sequential read".

[0053] Finally, the test results are counted and a graphical test report is output. After the test is completed, the collected data is automatically imported into the specified performance template for graphical display. Specifically, Figure 2 The performance evaluation diagram shown shows the effect when BG Trim and read and write IO intersect.

[0054] In the above embodiment, the BG Trim default value is obtained through the DFT command; the disk is filled and idle for a certain period of time to obtain the baseline performance of sequential write and sequential read; the Trim command is initiated and the sequential write operation is performed at the same time, and the performance of sequential write is counted as the write performance of BG Trim idle 0S; after secure erasure, the disk is filled and idle for a certain period of time, the Trim command is initiated and the sequential read operation is performed at the same time, and the performance of sequential read is counted as the read performance of BG Trim idle 0S; the test results are counted and a graphical test report is output. The present invention can control the Trim startup of the solid-state hard disk by writing a shell script, and at the same time, combined with the sequential read and write performance, it can indirectly reflect the performance impact of the TRIM function on the read and write IO. In addition, after the test is completed, the collected data can be automatically imported into the specified performance template for graphical display, thereby realizing efficient visual testing.

[0055] In one embodiment, the steps of initiating a Trim command and executing a sequential write operation at the same time, and counting the performance of the sequential write as the write performance of the BG Trim idle OS include:

[0056] Use FIO to issue the TRIM command, trim 10g, bs=10g. At the same time, use FIO for sequential write, size=10g, BS is 1024K, Q8T1 offset=0, and collect sequential write performance data.

[0057] In one embodiment, the step of initiating a Trim command and executing a sequential read operation at the same time, and counting the performance of the sequential read as the read performance of the BG Trim idle OS includes:

[0058] Use FIO to issue the TRIM command, trim 10g, bs=10g. Use FIO to do sequential reads at the same time, size=10g, BS is 1024K, Q8T1 offset=0, and collect sequential read performance data.

[0059] In this embodiment, if Figure 3 As shown, a test verification method for the influence of the TRIM function on the read and write performance of the solid-state drive is provided. The hardware requirements of the test method are as follows: the computer to be tested is ASUS Z790. For the computer to be tested, the method described in this patent is applicable to desktops, notebooks and other computers that support the M.2PCIe interface, and there is no mandatory requirement for the specific model. The solid-state drive to be tested is a consumer-grade solid-state drive that supports the BG Trim function. The location of the solid-state drive to be tested is a slave disk.

[0060] Software requirements: The operating system is Linux Ubuntu; the tools are FIO, NVME, setpci, and DFT firmware; the test script is a self-written shell script.

[0061] The specific implementation steps are as follows:

[0062] Step 1. Turn off APST / ASPM, Set PS0, and securely erase the hard disk under test.

[0063] Step 2: Use the DFT command to obtain the default threshold of BG Trim (the default value corresponds to 5G) and save it.

[0064] Step 3: Fill the disk and idle for 60 seconds: Use FIO to fill the disk with 10G, BS is 1024K, Q8T1, offset=0 to collect performance data as the baseline, the stage name is "BG-TRIM-Baseline", and the action is "Sequential Write".

[0065] Step 4: Use FIO to do sequential read, size = 10g, BS is 1024K, Q8T1 offset = 0, collect performance data as a baseline, stage name "BG-TRIM-Baseline", action "Sequential Read".

[0066] Step 5. Use FIO to issue the TRIM command, trim 10g, bs=10g. At the same time, use FIO for sequential write, size=10g, BS is 1024K, Q8T1 offset=0, collect sequential write performance data, stage name "BG-TRIM-idle0s", action "sequential write".

[0067] Step 6: After secure erasure, use FIO to fill the disk with 10G, and then idle for 60s. BS is 1024K, Q8T1, offset=0.

[0068] Step 7. Use FIO to issue the TRIM command, trim 10g, bs=10g. Use FIO to do sequential reads at the same time, size=10g, BS is 1024K, Q8T1 offset=0, collect sequential read performance data, stage name "BG-TRIM-idle0s", action "sequential read".

[0069] Step 8: Repeat steps 1-7, but in steps 5 and 7, wait 60 seconds after the trim command is issued before executing the corresponding sequential write and read actions. The corresponding stage name becomes "BG-TRIM-idle60s".

[0070] In this embodiment, the performance impact evaluation of the Trim function of the solid state drive under test on the read and write IO is obtained through a Shell script.

[0071] It should be understood that although Figure 1-Figure 3The steps in the flowchart are shown in sequence as indicated by the arrows, but these steps are not necessarily executed in the order indicated by the arrows. Unless otherwise specified in this document, there is no strict order restriction for the execution of these steps, and these steps can be executed in other orders. Moreover, Figure 1-Figure 3 At least part of the steps may include multiple sub-steps or multiple stages. These sub-steps or stages are not necessarily executed at the same time, but can be executed at different times. The execution order of these sub-steps or stages is not necessarily sequential, but can be executed in turn or alternately with other steps or at least part of the sub-steps or stages of other steps.

[0072] In one embodiment, Figure 4 As shown, a test and verification device 400 for the influence of a TRIM function on the read and write performance of a solid state drive is provided, and the device comprises:

[0073] A first acquisition module 401, the first acquisition module is used to obtain a BG Trim default value through a DFT command;

[0074] A second acquisition module 402, the second acquisition module is used to fill the disk and leave it idle for a certain period of time to obtain the baseline performance of sequential writing and sequential reading;

[0075] The first test module 403 is used to initiate a Trim command and execute a sequential write operation at the same time, and to count the sequential write performance as the write performance of BG Trim idle 0S; after secure erasure, fill the disk and leave it idle for a certain period of time, initiate a Trim command and execute a sequential read operation at the same time, and to count the sequential read performance as the read performance of BG Trim idle 0S;

[0076] The result output module 404 is used to count the test results and output a graphical test report.

[0077] In one embodiment, Figure 5 As shown, a test verification device 400 for the influence of a TRIM function on the read and write performance of a solid state drive is provided, and the device also includes a second test module 405, and the second test module is used to:

[0078] After secure erasure, fill the disk and leave it idle for a certain period of time. After initiating the Trim command, leave it idle for a certain period of time before performing sequential write operations. The performance of sequential writes is counted as the write performance of the BG Trim idle time.

[0079] After secure erasure, fill the disk and leave it idle for a certain period of time. After initiating the Trim command, leave it idle for a certain period of time and then perform a sequential read operation. The performance of sequential reads is counted as the read performance of the BG Trim idle time.

[0080] In one embodiment, the first test module 403 is further used to:

[0081] Use FIO to issue the TRIM command, trim 10g, bs=10g. At the same time, use FIO for sequential write, size=10g, BS is 1024K, Q8T1 offset=0, and collect sequential write performance data.

[0082] In one embodiment, the first test module 403 is further used to:

[0083] Use FIO to issue the TRIM command, trim 10g, bs=10g. Use FIO to do sequential reads at the same time, size=10g, BS is 1024K, Q8T1 offset=0, and collect sequential read performance data.

[0084] For the specific limitations of the test and verification device for the impact of the TRIM function on the read and write performance of the solid-state hard disk, please refer to the limitations of the test and verification method for the impact of the TRIM function on the read and write performance of the solid-state hard disk mentioned above, which will not be repeated here.

[0085] In one embodiment, a computer device is provided, whose internal structure diagram can be as follows: Figure 6 As shown. The computer device includes a processor, a memory and a network interface connected through a device bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating device, a computer program and a database. The internal memory provides an environment for the operation of the operating device and the computer program in the non-volatile storage medium. The network interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a test verification method for the influence of a TRIM function on the read and write performance of a solid-state hard disk is implemented.

[0086] Those skilled in the art will understand that Figure 6 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0087] In one embodiment, a computer device is provided, including a memory, a processor, and a computer program stored in the memory and executable on the processor, and the processor implements the steps in the above method embodiments when executing the computer program.

[0088] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps in the above method embodiments are implemented.

[0089] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided in the present application can include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. As an illustration and not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).

[0090] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0091] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the attached claims.

Claims

1. A method for testing and verifying the effect of a TRIM function on the read and write performance of a solid state drive, the method comprising: Get the default value of BG Trim through DFT command; Fill the disk and leave it idle for a certain period of time to obtain the baseline performance of sequential write and sequential read; Initiate the Trim command and execute the sequential write operation at the same time, and count the sequential write performance as the write performance of BG Trim idle 0S; After secure erasure, fill the disk and leave it idle for a certain period of time, initiate a Trim command and perform sequential read operations at the same time, and count the sequential read performance as the BG Trim idle 0S read performance; Count the test results and output graphical test reports.

2. The test and verification method for the influence of TRIM function on the read and write performance of solid state drives according to claim 1, characterized in that: The method further comprises: After secure erasure, fill the disk and leave it idle for a certain period of time. After initiating the Trim command, leave it idle for a certain period of time before performing sequential write operations. The performance of sequential writes is counted as the write performance of the BG Trim idle time. After secure erasure, fill the disk and leave it idle for a certain period of time. After initiating the Trim command, leave it idle for a certain period of time and then perform a sequential read operation. The performance of sequential reads is counted as the read performance of the BG Trim idle time.

3. The test and verification method for the influence of TRIM function on the read and write performance of solid state drives according to claim 1, characterized in that: The steps of initiating a Trim command and executing a sequential write operation at the same time, and calculating the performance of the sequential write as the write performance of the BG Trim idle OS include: Use FIO to issue the TRIM command, trim 10g, bs=10g. At the same time, use FIO for sequential write, size=10g, BS is 1024K, Q8T1 offset=0, and collect sequential write performance data.

4. The test and verification method for the influence of TRIM function on the read and write performance of solid state drives according to claim 3, characterized in that: The steps of initiating a Trim command and executing a sequential read operation at the same time, and counting the performance of the sequential read as the read performance of the BG Trim idle OS include: Use FIO to issue the TRIM command, trim 10g, bs=10g. Use FIO to do sequential reads at the same time, size=10g, BS is 1024K, Q8T1 offset=0, and collect sequential read performance data.

5. A test and verification device for the effect of TRIM function on the read and write performance of a solid state drive, characterized in that: The device comprises: A first acquisition module, wherein the first acquisition module is used to obtain a BG Trim default value through a DFT command; A second acquisition module, the second acquisition module is used to fill the disk and leave it idle for a certain period of time to obtain a baseline performance of sequential writing and sequential reading; The first test module is used to initiate a Trim command and execute a sequential write operation at the same time, and to count the sequential write performance as the BG Trim idle 0S write performance; after secure erasure, fill the disk and leave it idle for a certain period of time, initiate a Trim command and execute a sequential read operation at the same time, and to count the sequential read performance as the BG Trim idle 0S read performance; The result output module is used to count the test results and output a graphical test report.

6. The test and verification device for the influence of TRIM function on the read and write performance of solid state hard disk according to claim 5, characterized in that: The device further comprises a second testing module, wherein the second testing module is configured to: After secure erasure, fill the disk and leave it idle for a certain period of time. After initiating the Trim command, leave it idle for a certain period of time before performing sequential write operations. The performance of sequential writes is counted as the write performance of the BG Trim idle time. After secure erasure, fill the disk and leave it idle for a certain period of time. After initiating the Trim command, leave it idle for a certain period of time and then perform a sequential read operation. The performance of sequential reads is counted as the read performance of the BG Trim idle time.

7. The test and verification device for the influence of TRIM function on the read and write performance of solid state hard disk according to claim 5, characterized in that: The first test module is also used for: Use FIO to issue the TRIM command, trim 10g, bs=10g. At the same time, use FIO for sequential write, size=10g, BS is 1024K, Q8T1 offset=0, and collect sequential write performance data.

8. The test and verification device for the influence of TRIM function on the read and write performance of solid state hard disk according to claim 7, characterized in that: The first test module is also used for: Use FIO to issue the TRIM command, trim 10g, bs=10g. Use FIO to do sequential reads at the same time, size=10g, BS is 1024K, Q8T1 offset=0, and collect sequential read performance data.

9. A computer device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 4 are implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 4 are implemented.

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