Detection system and method for TPU materials

Abstract

The present invention discloses a detection system and method for TPU materials. The present invention sets three different detection environmental conditions, namely low temperature, room temperature and high temperature, through an environmental simulation unit, so as to comprehensively study the influence of environmental factors on the performance of TPU materials, detect and analyze a variety of performance indicators of TPU materials under different environments, so as to obtain the performance index of TPU under different environmental conditions. Combining these indicators can more comprehensively and accurately describe the performance characteristics of TPU materials, avoid the limitation of single indicator evaluation, and solve the problem that most of the existing technologies only independently detect a certain quality parameter of TPU materials, and when detecting the quality of TPU materials, do not consider the performance of TPU materials under different environmental conditions, and the detection is single.

Description

Technical Field

[0001] The present invention relates to the technical field of TPU material detection, and in particular to a detection system and method for TPU material. Background Art

[0002] TPU materials are widely used in many fields due to their excellent physical properties, such as high elasticity, wear resistance, oil resistance, chemical resistance, etc., including but not limited to automotive parts, electronic equipment housings, medical equipment, sports equipment, etc. However, the quality of TPU materials varies, and their performance is affected by many factors, such as raw material formula, production process, processing conditions, etc. In order to ensure the reliability and safety of TPU materials in applications, they need to be fully and accurately tested.

[0003] However, the detection system for TPU materials in the prior art still has the following shortcomings:

[0004] Most of them only conduct independent tests on a certain quality parameter of TPU materials, such as tensile strength, hardness or wear resistance, etc., without comprehensive consideration of the correlation between various quality parameters;

[0005] At the same time, when testing the quality of TPU materials, the performance of TPU materials under different environmental conditions was not considered, and the testing was single-minded;

[0006] To this end, a detection system and method for TPU materials are introduced. Summary of the invention

[0007] In view of this, the present invention provides a detection system and method for TPU materials to solve the problems raised by the above background technology.

[0008] The purpose of the present invention can be achieved by the following technical solution: a detection system for TPU material, comprising:

[0009] Sample preparation module: used to randomly select x samples from the current batch of TPU materials as test samples, where x ≥ 4; cut the x sampled test samples into three groups of sub-samples of set sizes; and transport the cut x test samples to the test area after pre-processing;

[0010] Detection and evaluation module: including environment simulation unit, data processing unit and performance output unit;

[0011] The environmental simulation unit is used to place x test samples in sample trays with corresponding numbers, respectively, and set different test environment conditions; the test environment conditions include low temperature environment, room temperature environment and high temperature environment; and record the performance data of each test sample under different test environment conditions and send them to the data processing unit; the performance data includes test data under low temperature environment, test data under room temperature environment and test data under high temperature environment;

[0012] The data processing unit is used to comprehensively evaluate the performance data of each test sample under different test environment conditions, so as to obtain the performance index of each test sample under different test environment conditions. and sent to the performance output unit; wherein g represents the number corresponding to different test environment conditions, g=1, 2 or 3, representing low temperature environment, room temperature environment and high temperature environment respectively, and k represents the number of each test sample, k=1, 2, ..., x;

[0013] The performance output unit is used to evaluate the performance index of each test sample under different test environment conditions. Analyze and obtain the comprehensive evaluation index of each test sample And sent to the report generation module;

[0014] Report generation module: receives the comprehensive evaluation index of each test sample , and execute the corresponding steps to generate an evaluation report for the current batch of TPU materials.

[0015] In some embodiments, the detection data in the low temperature environment is comprehensively evaluated, specifically:

[0016] S1: Adjust the temperature of the detection area to a preset low temperature range, and take a group of sub-samples of each detection sample and transport them to the detection area;

[0017] S1-101: After waiting for the set time zone, the corresponding sub-samples of each test sample are stretched at the preset stretching speed, and the magnitude of the pulling force of each group is measured in real time by the force sensor during the stretching process; The tensile strength of each test sample corresponding to the sample is calculated, and the average value of each group of tensile strengths of each test sample corresponding to the sample is calculated to obtain the low-temperature tensile average value of each test sample corresponding to the sample in a low-temperature environment. ;

[0018] S1-102: Perform tearing test on the corresponding sub-samples of each test sample at a preset constant speed, and measure the force change in real time through the force sensor during the test; The tear strength of each test sample corresponding to the sub-sample is calculated, and the average tear strength of each group of sub-samples corresponding to each test sample is calculated to obtain the low-temperature tear average of each test sample corresponding to the sub-sample in a low-temperature environment. ;

[0019] S1-103: Measure the area of ​​each test sample before it is sent to the test area and after it reaches the set time zone. The area before it is sent to the low-temperature test position and after it reaches the set time zone is represented by a1 and a2 respectively. The size change rate of each test sample under low-temperature environment is obtained by calculating (a1-a2) / a1×100%. .

[0020] In some embodiments, the detection data under room temperature environment is comprehensively evaluated, specifically:

[0021] S2: adjusting the temperature of the detection area to a preset room temperature range, and taking a group of sub-samples of each detection sample and transporting them to the detection area;

[0022] S2-201: Similarly to steps S1-101 to S1-102, obtain the room temperature tensile mean value of each test sample corresponding to the sub-sample under room temperature environment and room temperature tearing mean ;

[0023] S2-202: Obtain the room temperature tensile mean value of each test sample corresponding to the sub-sample under room temperature environment and room temperature tearing mean After that, measure the density value of each test sample corresponding to the sub-sample .

[0024] In some embodiments, the detection data under high temperature environment is comprehensively evaluated, specifically:

[0025] S3: taking a group of sub-samples from each test sample and transporting them to the test area, and then adjusting the temperature of the test area to a preset high temperature range according to a preset heating rate;

[0026] S3-301: Record the length, width and thickness of each sub-sample of the test sample before it is sent into the test area, and calculate the initial volume of each sub-sample of the test sample before it is sent into the test area;

[0027] During the period of time when the detection area is adjusted to the preset high temperature range according to the preset heating rate, the measurement volume of each detection sample corresponding to each detection sample at each time point is recorded by the measuring tool; the measured volume of each detection sample corresponding to each detection sample at each time point and the initial volume are substituted into the formula , calculate the volume change rate of each sub-sample corresponding to each test sample at each time point;

[0028] The volume change rate of each sub-sample corresponding to each test sample at each time point is averaged to obtain the volume change mean of each sub-sample corresponding to each test sample;

[0029] During the time period when the detection area is adjusted to the preset high temperature range according to the preset heating rate, the mass change of the sub-sample corresponding to each detection sample in the time period is recorded. If the difference between the mass recorded and the initial mass of the sub-sample corresponding to each detection sample at a certain time point reaches a preset threshold, the temperature value of the detection area at that time point is used as the decomposition temperature value of the sub-sample corresponding to each detection sample;

[0030] Taking the time point corresponding to the decomposition temperature value of the sub-sample corresponding to each test sample as the starting point, the decomposition rate of the sub-sample corresponding to each test sample in the preset time zone after the starting point is calculated; extracting the mass loss rate of the sub-sample corresponding to each test sample at each time point in the preset time zone, that is, calculating it by recording the mass at each time point / initial mass, and then calculating the ratio of the change in mass loss rate to the time interval between adjacent time points, and taking the average value of each group of ratios to obtain the decomposition rate of the sub-sample corresponding to each test sample;

[0031] The mean volume change, decomposition temperature and decomposition rate of each sample are marked as , as well as , and substitute into the formula Calculate and obtain the thermal performance index of each test sample corresponding to the sub-sample ;in , as well as are the preset maximum allowable volume change mean, minimum allowable decomposition temperature and maximum allowable decomposition rate; z1, z2 and z3 are the volume change mean , decomposition temperature and the decomposition rate The weight factor of influence.

[0032] In some embodiments, the performance index of each test sample under different test environment conditions is obtained. , specifically:

[0033] S4: According to the formula , calculate the performance data of each test sample under different test environment conditions, so as to obtain the performance index of each test sample under different test environment conditions ;

[0034] in , as well as They represent the qualified low-temperature tensile mean, qualified low-temperature tearing mean and the maximum allowable dimensional change rate under low-temperature environmental conditions; w1, w2 and w3 are the low-temperature tensile mean , low temperature tearing mean And the dimensional change rate The impact weight factor of

[0035] , as well as They represent the qualified mean tensile strength, the qualified mean tear strength and the qualified density under room temperature conditions; w4, w5 and w6 are the room temperature tensile strength and the qualified density respectively. , Room temperature tearing mean And the density value The impact weight factor of

[0036] , as well as They represent the highest allowable thermal performance index, the passing high temperature tensile mean value and the passing high temperature tear mean value under high temperature environment conditions; w7, w8 and w9 are the thermal performance index , high temperature tensile mean And high temperature tearing mean The weight factor of influence.

[0037] In some embodiments, a comprehensive evaluation index of each test sample is obtained. , specifically:

[0038] Preset the performance index of each test sample under different test environment conditions Each group of index value ranges are set to correspond to a performance score for each index value range; the performance index of each test sample under different test environment conditions is calculated. Matching with the preset range of index values ​​of each group, so as to obtain the performance score of each test sample under different test environment conditions;

[0039] Preset the weight coefficients corresponding to different test environment conditions, multiply the performance scores of each test sample under different test environment conditions by the corresponding preset weight coefficients, and then add them up to obtain the comprehensive evaluation index of each test sample. .

[0040] In some embodiments, corresponding steps are performed to generate an evaluation report of the current batch of TPU materials, specifically:

[0041] The comprehensive evaluation index of each test sample is calculated using the standard deviation formula Calculate and obtain the index deviation value. If the index deviation value is greater than the corresponding preset reference threshold, the repeated analysis signaling is triggered. After the repeated analysis signaling is triggered, the triggered repeated analysis signaling is sent to the sample preparation module, and x test samples are randomly selected again, and the comprehensive evaluation index is analyzed. ;

[0042] If the index deviation value is less than the corresponding preset reference threshold, the comprehensive evaluation index of each test sample is After calculating the average, a comprehensive average is obtained, and the range of average values ​​of each group of the comprehensive average is preset, and each group of average value range is set to correspond to a performance level; after matching the obtained comprehensive average with the range of average values ​​of each group, the matched performance level is used as the performance level of the current batch of TPU materials;

[0043] Extract the performance level of the current batch of TPU materials and the comprehensive evaluation index of each test sample As well as production information, the extracted content is filled into the preset report template to generate an evaluation report for the current batch of TPU materials.

[0044] A detection system and method for TPU materials, comprising:

[0045] Pre-preparation: Randomly select x samples from the current batch of TPU materials as test samples, where x ≥ 4, and cut the x samples into three groups of sub-samples of set sizes using a material cutting device; and after pre-processing, the cut x test samples are transported to the test area by an automated robot;

[0046] Test evaluation: Place x test samples in sample trays with corresponding numbers, set different test environment conditions, and conduct a comprehensive evaluation of the performance data of each test sample under different test environment conditions, so as to obtain the performance index of each test sample under different test environment conditions. ;

[0047] Output results: Performance index of each test sample under different test environment conditions Analyze and obtain the comprehensive evaluation index of each test sample ; According to the comprehensive evaluation index of each test sample , generate the performance level of the current batch of TPU materials, extract the performance level of the current batch of TPU materials, and the comprehensive evaluation index of each test sample and production information, and fills the extracted content into the preset report template to generate an evaluation report for the current batch of TPU materials.

[0048] Compared with the prior art, the present invention has the following beneficial effects:

[0049] The present invention sets three different detection environmental conditions of low temperature, room temperature and high temperature through an environmental simulation unit, and can comprehensively study the influence of environmental factors on the performance of TPU materials, detect and analyze multiple performance indicators of TPU materials under different environments, so as to obtain the performance index of TPU under different environmental conditions. Combining these indicators can more comprehensively and accurately describe the performance characteristics of TPU materials, avoid the limitation of single indicator evaluation, and solve the problem that most of the existing technologies only independently detect a certain quality parameter of TPU materials, and when detecting the quality of TPU materials, do not consider the performance of TPU materials under different environmental conditions, and the detection is single.

[0050] The present invention presets each group of index value ranges of the performance index of each test sample under different test environment conditions, sets different index value ranges to correspond to a performance score respectively; matches the performance index of each test sample under different environments with the preset groups of index value ranges to obtain a performance score, and then calculates a comprehensive evaluation index in combination with the weight coefficients corresponding to the different test environment conditions, thereby improving the comprehensiveness and accuracy of TPU material testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0051] Further details, features and advantages of the present application are disclosed in the following description of exemplary embodiments in conjunction with the accompanying drawings, in which:

[0052] Figure 1 It is a principle block diagram of the present invention;

[0053] Figure 2 It is a flow chart of the present invention. DETAILED DESCRIPTION

[0054] Several embodiments of the present application will be described in more detail below with reference to the accompanying drawings so that those skilled in the art can implement the present application. The present application can be embodied in many different forms and purposes and should not be limited to the embodiments described herein. These embodiments are provided to make the present application comprehensive and complete, and to fully convey the scope of the present application to those skilled in the art. The embodiments do not limit the present application.

[0055] Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by those of ordinary skill in the art to which this application belongs. It will be further understood that terms such as those defined in commonly used dictionaries should be interpreted as having a meaning consistent with their meaning in the relevant art and / or the context of this specification, and will not be interpreted in an idealized or overly formal sense unless explicitly defined as such herein.

[0056] Example 1

[0057] See also Figure 1 As shown, a detection system for TPU materials includes a sample preparation module, a detection and evaluation module, and a report generation module;

[0058] The sample preparation module is used to randomly select x samples from the current batch of TPU materials as test samples, where x≥4, and the specific value of x is set by the technician according to the number of TPU materials in the current batch; the x sampled test samples are cut into three groups of sub-samples of set sizes by the material cutting device; and the cut x test samples are transported to the test area by the automated robot after pretreatment; the pretreatment includes removing dust, oil stains and impurities on the surface of the test samples;

[0059] The detection and evaluation module includes an environment simulation unit, a data processing unit, and a performance output unit;

[0060] The environmental simulation unit is used to place x test samples in the sample trays with corresponding numbers, and set different test environment conditions; the test environment conditions include low temperature environment, room temperature environment and high temperature environment; and record the performance data of each test sample under different test environment conditions and send them to the data processing unit; the performance data includes the low temperature tensile mean under low temperature environment , low temperature tearing mean And the dimensional change rate ; Room temperature tensile mean under room temperature environment , Room temperature tearing mean And the density value And the thermal performance index in high temperature environment , high temperature tensile mean And high temperature tearing mean ;

[0061] By adjusting the temperature parameters of the testing environment, the influence of environmental factors on the performance of TPU materials is studied.

[0062] The data processing unit is used to comprehensively evaluate the performance data of each test sample under different test environment conditions, so as to obtain the performance index of each test sample under different test environment conditions. and sent to the performance output unit; wherein g represents the number corresponding to different test environment conditions, g=1, 2 or 3, representing low temperature environment, room temperature environment and high temperature environment respectively, and k represents the number of each test sample, k=1, 2, ..., x;

[0063] Specifically:

[0064] S1: Adjust the temperature of the detection area to a preset low temperature range, and take a group of sub-samples of each detection sample and transport them to the detection area;

[0065] It should be noted that before placing the test sample and sensor in a low-temperature environment, first turn on the preheating function of the sensor to allow it to work stably at room temperature for a period of time. Then put the sample tray with the sensor into an environmental simulation box that has been stabilized at a low temperature (such as -40°C). Wait for the sensor and sample to be fully stable in the low-temperature environment.

[0066] S1-101: After waiting for the set time zone, such as 2-3 hours, ensure that the test sample is fully stable in the low temperature environment; install the sub-samples at low temperature on the tensile test device, stretch the sub-samples corresponding to each test sample at a preset stretching speed, and measure the magnitude of the tension of each group in real time through the force sensor during the stretching process; record the tension at a frequency of 500 times per second; The tensile strength of each test sample corresponding to the sample is calculated, and the average value of each group of tensile strengths of each test sample corresponding to the sample is calculated to obtain the low-temperature tensile average value of each test sample corresponding to the sample in a low-temperature environment. ;

[0067] S1-102: Install the sub-samples at low temperature on the tear tester, and perform tear tests on the sub-samples corresponding to each test sample at a preset constant speed. During the test, the force change is measured in real time by the force sensor; the force value is recorded at a frequency of 1000 times per second; The tear strength of each test sample corresponding to the sub-sample is calculated, and the average tear strength of each group of sub-samples corresponding to each test sample is calculated to obtain the low-temperature tear average of each test sample corresponding to the sub-sample in a low-temperature environment. ;

[0068] S1-103: Measure the area of ​​each test sample before it is sent to the test area and after it reaches the set time zone. The area before it is sent to the low-temperature test position and after it reaches the set time zone is represented by a1 and a2 respectively. The size change rate of each test sample under low-temperature environment is obtained by calculating (a1-a2) / a1×100%. ;

[0069] S2: adjusting the temperature of the detection area to a preset room temperature range, and taking a group of sub-samples of each detection sample and transporting them to the detection area;

[0070] S2-201: Similarly to steps S1-101 to S1-102, obtain the room temperature tensile mean value of each test sample corresponding to the sub-sample under room temperature environment and room temperature tearing mean ;

[0071] S2-202: Obtain the room temperature tensile mean value of each test sample corresponding to the sub-sample under room temperature environment and room temperature tearing mean Then, use a densitometer to measure the density value of each sub-sample corresponding to the test sample. ;

[0072] S3: taking a group of sub-samples from each test sample and transporting them to the test area, and then adjusting the temperature of the test area to a preset high temperature range according to a preset heating rate;

[0073] S3-301: Record the length, width and thickness of each sub-sample of the test sample before it is sent into the test area, and calculate the initial volume of each sub-sample of the test sample before it is sent into the test area;

[0074] During the period of time when the test area is adjusted to the preset high temperature range according to the preset heating rate, the measured volume of each sub-sample corresponding to each test sample at each time point is recorded by a measuring tool; the measuring tool includes a laser rangefinder and a micrometer; the measured volume of each sub-sample corresponding to each test sample at each time point and the initial volume are substituted into the formula , calculate the volume change rate of each sub-sample corresponding to each test sample at each time point;

[0075] The volume change rate of each sub-sample corresponding to each test sample at each time point is averaged to obtain the volume change mean of each sub-sample corresponding to each test sample;

[0076] During the time period when the detection area is adjusted to the preset high temperature range according to the preset heating rate, the mass change of the sub-sample corresponding to each detection sample in the time period is recorded. If the difference between the mass recorded and the initial mass of the sub-sample corresponding to each detection sample at a certain time point reaches a preset threshold, the temperature value of the detection area at that time point is used as the decomposition temperature value of the sub-sample corresponding to each detection sample;

[0077] Taking the time point corresponding to the decomposition temperature value of the sub-sample corresponding to each test sample as the starting point, the decomposition rate of the sub-sample corresponding to each test sample in the preset time zone after the starting point is calculated; extracting the mass loss rate of the sub-sample corresponding to each test sample at each time point in the preset time zone, that is, calculating it by recording the mass at each time point / initial mass, and then calculating the ratio of the change in mass loss rate to the time interval between adjacent time points, and taking the average value of each group of ratios to obtain the decomposition rate of the sub-sample corresponding to each test sample;

[0078] The mean volume change, decomposition temperature and decomposition rate of each sample are marked as , as well as , and substitute into the formula Calculate and obtain the thermal performance index of each test sample corresponding to the sub-sample ;in , as well as They are the preset maximum allowable volume change mean, minimum allowable decomposition temperature and maximum allowable decomposition rate respectively; they are set by technicians according to the quality requirements of the current batch of TPU; z1, z2 and z3 are the volume change mean , decomposition temperature and the decomposition rate The impact weight factor of

[0079] S3-302: After reaching the preset high temperature range, similarly to steps S1-101 to S1-102, obtain the high temperature tensile mean value of each test sample corresponding to the sub-sample in the high temperature environment and high temperature tearing mean ;

[0080] S4: According to the formula , calculate the performance data of each test sample under different test environment conditions, so as to obtain the performance index of each test sample under different test environment conditions ;

[0081] in , as well as They represent the qualified low-temperature tensile mean, qualified low-temperature tearing mean and the maximum allowable dimensional change rate under low-temperature environmental conditions; w1, w2 and w3 are the low-temperature tensile mean , low temperature tearing mean And the dimensional change rate The impact weight factor of

[0082] , as well as They represent the qualified mean tensile strength, the qualified mean tear strength and the qualified density under room temperature conditions; w4, w5 and w6 are the room temperature tensile strength and the qualified density respectively. , Room temperature tearing mean And the density value The impact weight factor of

[0083] , as well as They represent the highest allowable thermal performance index, the passing high temperature tensile mean value and the passing high temperature tear mean value under high temperature environment conditions; w7, w8 and w9 are the thermal performance index , high temperature tensile mean And high temperature tearing mean The impact weight factor of

[0084] It should be noted that by setting three different test environmental conditions of low temperature, room temperature and high temperature in the environmental simulation unit, the influence of environmental factors on the performance of TPU materials can be comprehensively studied. This helps to understand the performance of TPU materials under different temperature conditions and provide a basis for its use in various practical application scenarios (such as cold regions, normal temperature environments, high temperature industrial environments, etc.);

[0085] Testing of multiple performance indicators: Testing of multiple performance indicators of TPU materials in different environments, including tensile strength, tear strength, dimensional change rate (low temperature environment), density (room temperature environment), volume change rate, decomposition temperature, decomposition rate (high temperature environment), etc. Combining these indicators can more comprehensively and accurately describe the performance characteristics of TPU materials, avoiding the limitations of single indicator evaluation.

[0086] The performance output unit is used to evaluate the performance index of each test sample under different test environment conditions. Analyze and obtain the comprehensive evaluation index of each test sample And sent to the report generation module;

[0087] Specifically:

[0088] Preset the performance index of each test sample under different test environment conditions The index value ranges of each group are set to correspond to a performance score respectively; the performance score range is set to 1-10 and is a positive integer;

[0089] The performance index of each test sample under different test environment conditions Matching with the preset range of index values ​​of each group, so as to obtain the performance score of each test sample under different test environment conditions;

[0090] Preset the weight coefficients corresponding to different test environment conditions, multiply the performance scores of each test sample under different test environment conditions by the corresponding preset weight coefficients, and then add them up to obtain the comprehensive evaluation index of each test sample. ;

[0091] The report generation module is used to receive the comprehensive evaluation index of each test sample , and execute the corresponding steps to generate an evaluation report for the current batch of TPU materials;

[0092] Specifically:

[0093] The comprehensive evaluation index of each test sample is calculated using the standard deviation formula Calculate and obtain the index deviation value. If the index deviation value is greater than the corresponding preset reference threshold, the repeated analysis signaling is triggered. After the repeated analysis signaling is triggered, the triggered repeated analysis signaling is sent to the sample preparation module, and x test samples are randomly selected again, and the comprehensive evaluation index is analyzed. ;

[0094] If the index deviation value is less than the corresponding preset reference threshold, the comprehensive evaluation index of each test sample is After calculating the average, a comprehensive average is obtained, and the range of average values ​​of each group of the comprehensive average is preset, and each group of average value range is set to correspond to a performance level; after matching the obtained comprehensive average with the range of average values ​​of each group, the matched performance level is used as the performance level of the current batch of TPU materials;

[0095] Extract the performance level of the current batch of TPU materials and the comprehensive evaluation index of each test sample And production information, and fill the extracted content into the preset report template to generate an evaluation report for the current batch of TPU materials; production information includes production time and production quantity, etc.;

[0096] Example 2

[0097] See also Figure 2 As shown, based on the detection system for TPU materials provided in Example 1 of the present application, Example 2 of the present application proposes a detection method for TPU materials. Example 2 is only a preferred method of Example 1, and the implementation of Example 2 will not affect the independent implementation of Example 1.

[0098] Specifically, the detection method for TPU material provided in Example 2 of the present application is different in that it includes:

[0099] Pre-preparation: Randomly select x samples from the current batch of TPU materials as test samples, where x ≥ 4, and cut the x samples into three groups of sub-samples of set sizes using a material cutting device; and after pre-processing, the cut x test samples are transported to the test area by an automated robot;

[0100] Test evaluation: Place x test samples in sample trays with corresponding numbers, set different test environment conditions, and conduct a comprehensive evaluation of the performance data of each test sample under different test environment conditions, so as to obtain the performance index of each test sample under different test environment conditions. ;

[0101] It should be noted that by setting up multiple data acquisition cards, connected to different testing equipment, analog signals are converted into digital signals and transmitted to the computer; the computer is installed with special data processing software, which can display, store, analyze and generate reports for the collected data in real time. The data processing software has powerful algorithm functions, which can perform correlation analysis, error correction and quality assessment on the data of different testing items, and provide users with intuitive and accurate test results;

[0102] Output results: Performance index of each test sample under different test environment conditions Analyze and obtain the comprehensive evaluation index of each test sample ; According to the comprehensive evaluation index of each test sample , generate the performance level of the current batch of TPU materials, extract the performance level of the current batch of TPU materials, and the comprehensive evaluation index of each test sample and production information, and fill the extracted content into the preset report template to generate an evaluation report for the current batch of TPU materials;

[0103] The preferred embodiments of the present invention disclosed above are only used to help explain the present invention. The preferred embodiments do not describe all the details in detail, nor do they limit the invention to only specific implementation methods. Obviously, many modifications and changes can be made according to the content of this specification. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the present invention, so that those skilled in the art can understand and use the present invention well. The present invention is limited only by the claims and their full scope and equivalents.

Claims

1. A detection system for TPU materials, characterized in that: include: Sample preparation module: used to randomly select x samples from the current batch of TPU materials as test samples, where x≥4; cut the x sampled test samples into three groups of sub-samples of set sizes; After pre-processing, the cut x test samples are transported to the test area; Detection and evaluation module: including environment simulation unit, data processing unit and performance output unit; The environmental simulation unit is used to place x test samples in sample trays with corresponding numbers, and set different test environment conditions; the test environment conditions include low temperature environment, room temperature environment and high temperature environment; and record the performance data of each test sample under different test environment conditions and send them to the data processing unit; The performance data includes test data under low temperature environment, test data under room temperature environment and test data under high temperature environment; The data processing unit is used to comprehensively evaluate the performance data of each test sample under different test environment conditions, so as to obtain the performance index of each test sample under different test environment conditions. and sent to the performance output unit; Where g represents the number corresponding to different test environment conditions, g=1, 2 or 3, representing low temperature environment, room temperature environment and high temperature environment respectively, k represents the number of each test sample, k=1, 2, ..., x; Comprehensive evaluation of the test data in low temperature environment, specifically: S1: Adjust the temperature of the detection area to a preset low temperature range, and take a group of sub-samples of each detection sample and transport them to the detection area; S1-101: After waiting for the set time zone, the corresponding sub-samples of each test sample are stretched at the preset stretching speed, and the magnitude of the pulling force of each group is measured in real time by the force sensor during the stretching process; The tensile strength of each test sample corresponding to the sample is calculated, and the average value of each group of tensile strengths of each test sample corresponding to the sample is calculated to obtain the low-temperature tensile average value of each test sample corresponding to the sample in a low-temperature environment. ; S1-102: Perform tearing test on the corresponding sub-samples of each test sample at a preset constant speed, and measure the force change in real time through the force sensor during the test; The tear strength of each test sample corresponding to the sub-sample is calculated, and the average tear strength of each group of sub-samples corresponding to each test sample is calculated to obtain the low-temperature tear average of each test sample corresponding to the sub-sample in a low-temperature environment. ; S1-103: Measure the area of ​​each test sample before it is sent to the test area and after it reaches the set time zone. The area before it is sent to the low-temperature test position and after it reaches the set time zone is represented by a1 and a2 respectively. The size change rate of each test sample under low-temperature environment is obtained by calculating (a1-a2) / a1×100%. ; Comprehensive evaluation of the test data under room temperature environment, specifically: S2: adjusting the temperature of the detection area to a preset room temperature range, and taking a group of sub-samples of each detection sample and transporting them to the detection area; S2-201: Similarly to steps S1-101 to S1-102, obtain the room temperature tensile mean value of each test sample corresponding to the sub-sample under room temperature environment and room temperature tearing mean ; S2-202: Obtain the room temperature tensile mean value of each test sample corresponding to the sub-sample under room temperature environment and room temperature tearing mean After that, measure the density value of each test sample corresponding to the sub-sample ; Comprehensive evaluation of the test data in high temperature environment, specifically: S3: taking a group of sub-samples from each test sample and transporting them to the test area, and then adjusting the temperature of the test area to a preset high temperature range according to a preset heating rate; S3-301: Record the length, width and thickness of each sub-sample of the test sample before it is sent into the test area, and calculate the initial volume of each sub-sample of the test sample before it is sent into the test area; During the period of time when the detection area is adjusted to the preset high temperature range according to the preset heating rate, the measurement volume of each detection sample corresponding to each detection sample at each time point is recorded by the measuring tool; the measurement volume of each detection sample corresponding to each detection sample at each time point and the initial volume are substituted into the formula , calculate the volume change rate of each sub-sample corresponding to each test sample at each time point; The volume change rate of each sub-sample corresponding to each test sample at each time point is averaged to obtain the volume change mean of each sub-sample corresponding to each test sample; During the time period when the detection area is adjusted to the preset high temperature range according to the preset heating rate, the mass change of the sub-sample corresponding to each detection sample in the time period is recorded. If the difference between the mass recorded and the initial mass of the sub-sample corresponding to each detection sample at a certain time point reaches a preset threshold, the temperature value of the detection area at that time point is used as the decomposition temperature value of the sub-sample corresponding to each detection sample; Taking the time point corresponding to the decomposition temperature value of the sub-sample corresponding to each test sample as the starting point, the decomposition rate of the sub-sample corresponding to each test sample in the preset time zone after the starting point is calculated; extracting the mass loss rate of the sub-sample corresponding to each test sample at each time point in the preset time zone, that is, calculating it by recording the mass at each time point / initial mass, and then calculating the ratio of the change in mass loss rate to the time interval between adjacent time points, and taking the average value of each group of ratios to obtain the decomposition rate of the sub-sample corresponding to each test sample; The mean volume change, decomposition temperature and decomposition rate of each sample are marked as , as well as , and substitute into the formula Calculate and obtain the thermal performance index of each test sample corresponding to the sub-sample ;in , as well as They are respectively the preset maximum allowable volume change mean, the minimum allowable decomposition temperature and the maximum allowable decomposition rate; z1, z2 and z3 are the mean volume changes respectively. , decomposition temperature and the decomposition rate The impact weight factor of Get the performance index of each test sample under different test environment conditions , specifically: S4: According to the formula , calculate the performance data of each test sample under different test environment conditions, so as to obtain the performance index of each test sample under different test environment conditions ; in , as well as They represent the qualified low-temperature tensile mean, qualified low-temperature tearing mean and the maximum allowable dimensional change rate under low-temperature environmental conditions; w1, w2 and w3 are the low-temperature tensile mean , low temperature tearing mean And the dimensional change rate The impact weight factor of , as well as They represent the qualified mean tensile strength, the qualified mean tear strength and the qualified density under room temperature conditions; w4, w5 and w6 are the room temperature tensile strength and the qualified density respectively. , Room temperature tearing mean And the density value The impact weight factor of , as well as They represent the highest allowable thermal performance index, the passing high temperature tensile mean value and the passing high temperature tear mean value under high temperature environment conditions; w7, w8 and w9 are the thermal performance index , high temperature tensile mean And high temperature tearing mean The impact weight factor of The performance output unit is used to evaluate the performance index of each test sample under different test environment conditions. Analyze and obtain the comprehensive evaluation index of each test sample And sent to the report generation module; Report generation module: receives the comprehensive evaluation index of each test sample , and execute the corresponding steps to generate an evaluation report for the current batch of TPU materials.

2. The detection system for TPU materials according to claim 1, characterized in that: Get the comprehensive evaluation index of each test sample , specifically: Preset the performance index of each test sample under different test environment conditions Each group of index value ranges are set to correspond to a performance score for each index value range; the performance index of each test sample under different test environment conditions is calculated. Matching with the preset range of index values ​​of each group, so as to obtain the performance score of each test sample under different test environment conditions; Preset the weight coefficients corresponding to different test environment conditions, multiply the performance scores of each test sample under different test environment conditions by the corresponding preset weight coefficients, and then add them up to obtain the comprehensive evaluation index of each test sample. .

3. The detection system for TPU material according to claim 2, characterized in that: Perform the corresponding steps to generate an evaluation report for the current batch of TPU materials, specifically: The comprehensive evaluation index of each test sample is calculated using the standard deviation formula Calculate and obtain the index deviation value. If the index deviation value is greater than the corresponding preset reference threshold, the repeated analysis signaling is triggered. After the repeated analysis signaling is triggered, the triggered repeated analysis signaling is sent to the sample preparation module, and x test samples are randomly selected again, and the comprehensive evaluation index is analyzed. ; If the index deviation value is less than the corresponding preset reference threshold, the comprehensive evaluation index of each test sample is After calculating the average, a comprehensive average is obtained, and the range of average values ​​of each group of the comprehensive average is preset, and each group of average value range is set to correspond to a performance level; after matching the obtained comprehensive average with the range of average values ​​of each group, the matched performance level is used as the performance level of the current batch of TPU materials; Extract the performance level of the current batch of TPU materials and the comprehensive evaluation index of each test sample As well as production information, the extracted content is filled into the preset report template to generate an evaluation report for the current batch of TPU materials.

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