Test device for LCC and CLCC valves

Abstract

The present invention provides a test device suitable for LCC converter valves and CLCC converter valves, and suitable for testing thyristor valves and IGBT submodules. The device includes a shared main power module and a main control unit, and automatically adjusts the test parameters through an adaptive test module to achieve accurate testing of different devices. The thyristor valve test module and the IGBT submodule test module share a power supply and control system to ensure synchronous management and data feedback. The device supports local and remote test modes, can automatically load test programs and transmit data in real time, and improve test efficiency and operational flexibility. The control algorithm ensures accurate regulation of voltage and current to meet different test requirements.

Description

Technical Field

[0001] The present invention relates to the technical field of power electronic equipment testing, and in particular to a testing device (CTE) suitable for LCC (grid commutation converter) converter valves and CLCC (controllable commutation converter) converter valves. Background Art

[0002] Since its birth, high-voltage direct current (HVDC) transmission technology has been widely used in the field of power transmission. With the rapid growth of global energy demand and the continuous development of new energy, HVDC technology has gradually become one of the main technical means in the fields of cross-regional power grid interconnection, offshore wind power transmission and renewable energy grid connection due to its significant advantages in long-distance and high-power transmission. In the high-voltage direct current transmission system, the converter valve is the core equipment, and its performance reliability and stability directly determine the safety and operation efficiency of the entire transmission system.

[0003] In practical applications, LCC (grid-commutated converter) valves and CLCC (controllable commutated converter) valves are common types of commutation equipment in HVDC systems. LCC valves use thyristors as the main switching elements and control current commutation through the natural commutation characteristics of thyristors. CLCC valves combine controllable commutation technology with LCC, and usually introduce new devices such as IGBTs (insulated gate bipolar transistors) to improve commutation efficiency and system reliability. As the structures of these two types of valves become more complex, the requirements for their testing are becoming more diverse and complex, and the importance of testing technology in practical applications is becoming more prominent.

[0004] The converter valve is responsible for the conversion between DC and AC during operation. It is composed of a large number of power semiconductor devices, including thyristors, diodes, capacitors, resistors and other components. These components need to withstand extremely high voltages and currents in actual operation, so the equipment is required to have extremely high stability, durability and reliability. In order to ensure the long-term stable operation of these components, the testing process of the converter valve is crucial, especially during the commissioning and maintenance of new equipment. For LCC converter valves, the switching performance, trigger response and voltage withstand capability of thyristors are key links in the test; for CLCC converter valves, the introduction of IGBTs brings more complex switching control, so higher requirements are also placed on their performance testing.

[0005] Existing testing technologies are mostly focused on the overall functional testing of the converter valve and the individual performance testing of the internal key components. Taking thyristors as an example, as the core components of LCC converter valves, thyristors rely on external trigger signals to turn on and off, and the trigger current and voltage need to be precisely controlled during the test. The responsiveness of thyristors under extreme voltage conditions is an important criterion for measuring their performance. The test equipment must provide precise voltage and current control as well as fast data acquisition capabilities. In addition, due to the extremely high voltage and complex transient current waveforms in the thyristor working environment, the test system needs to have strong anti-interference capabilities to ensure the accuracy and stability of data acquisition.

[0006] As a key component in CLCC converter valves, IGBT has the advantages of high switching speed and low switching loss, but it also places higher requirements on testing. Testing of IGBT requires not only accurate measurement of its switching behavior, but also evaluation of its stability under high voltage and high power environments. Especially in complex switching states, parameters such as IGBT switching response, overcurrent protection, and overvoltage protection are crucial. Existing test equipment often faces problems such as insufficient equipment flexibility and untimely response when performing precision testing on IGBTs, which limits the comprehensiveness and accuracy of the test.

[0007] Traditional converter valve test equipment usually has the characteristics of single function and low efficiency. They can often only test specific types of converter valve components and cannot cover the performance tests of multiple devices such as thyristors and IGBTs at the same time. Due to the large differences in the electrical parameter requirements of thyristors and IGBTs during operation, traditional test equipment needs to frequently replace test modules or adjust test settings in actual applications, which increases the complexity of operation and prolongs the test cycle. In addition, since these devices lack adaptive functions, operators often need to manually adjust test parameters such as voltage, current and frequency according to different devices, resulting in a cumbersome and error-prone testing process. With the improvement of the integration of converter valves, this inefficient testing method obviously cannot meet the testing needs of future power electronic equipment.

[0008] Furthermore, traditional test equipment is not only relatively simple in function, but also has poor flexibility. The working conditions of thyristors and IGBTs are different, requiring different trigger voltages, currents, and test modes, and existing equipment is usually difficult to support these diverse needs at the same time. In high-voltage direct current transmission systems, the lack of automated test equipment is also a major challenge currently faced. With the expansion of system scale and the increase in equipment complexity, testing methods that rely on manual adjustment and manual control are inefficient and have a large error margin. Therefore, the automation and intelligent development of test equipment has become an inevitable trend, especially intelligent equipment that can automatically adjust the test process according to the components under test, which is an urgently needed solution for the industry. Summary of the invention

[0009] In order to solve the above problems in the prior art, the present invention proposes a test device (CTE) suitable for LCC converter valves and CLCC converter valves, comprising:

[0010] The main power supply module is used to convert AC power into DC power and provide power outputs of different voltage levels;

[0011] Multiple types of power output units, the output power includes DC power supply, pulse power supply and current source;

[0012] The main control unit is used to receive test parameters, control the test process and communicate with external devices;

[0013] A sampling unit, used to collect voltage and current data during the test;

[0014] An output control unit, used to control the output of various power supplies according to the instructions of the main control unit;

[0015] A thyristor valve test module and an IGBT submodule test module, used to test the thyristor valve and the IGBT submodule respectively, and the thyristor valve test module and the IGBT submodule test module share the main power supply module and the main control unit;

[0016] The main control unit further includes an adaptive test module, which dynamically adjusts voltage, current and related parameters according to the requirements of different devices under test, automatically adapts the corresponding test modules and power output units, and further automatically matches the corresponding test parameters and test processes according to the characteristics of the components under test.

[0017] The adaptive test module comprises:

[0018] The device identification unit is used to identify the type and characteristics of the device under test, automatically detect the voltage level, operating frequency and current requirement of the device, and determine the type of the device under test based on the input electrical signal;

[0019] The parameter adjustment unit automatically adjusts the corresponding test parameters according to the result of the identification by the device identification unit, wherein:

[0020] For a thyristor valve, the parameter adjustment unit dynamically adjusts the trigger voltage, trigger time and damping circuit characteristics;

[0021] For the IGBT submodule, the parameter adjustment unit adjusts the turn-on and turn-off timings and the current waveform;

[0022] The feedback control unit is used to collect voltage and current data in real time and compare the collected data with preset reference parameters. If the data deviates from the preset value, the test parameters are dynamically adjusted by adjusting the output voltage and current;

[0023] The test parameters are adjusted in real time by predicting the future response of the system through the adaptive algorithm unit, wherein the algorithm adopted by the adaptive algorithm unit is:

[0024]

[0025] in:

[0026] J is the cost function of the control objective, which is used to minimize the error and control actions during the test;

[0027] is the output value of the system;

[0028] is the target reference value;

[0029] is the change in the control variable;

[0030] is the weight coefficient of the control action;

[0031] is the length of the prediction time domain, representing the output of the algorithm predicting multiple moments in the future;

[0032] It is the length of the control time domain, which determines the number of times the control variable is allowed to be adjusted in each control cycle;

[0033] k is the current time point or future time step, which is used to track the output of the system and the performance of the control variables at each time point;

[0034] The automatic matching unit is used to automatically select and adapt the corresponding test modules and power output units according to the requirements of different devices under test.

[0035] The thyristor valve test module comprises:

[0036] A valve base electronic equipment (VBE) test unit, which is used to perform electrical function tests on valve base electronic equipment. The valve base electronic equipment test unit simulates the trigger signal of actual working conditions by providing a control signal to detect the trigger current, trigger voltage and response time of the valve base electronic equipment;

[0037] A thyristor trigger monitoring unit (TTM) test unit is used to monitor the triggering condition of the thyristor. The thyristor trigger monitoring unit test unit verifies the trigger signal receiving capability, monitoring accuracy and feedback response time of the thyristor trigger monitoring unit by sending a simulated trigger signal and collecting a feedback signal.

[0038] A damping circuit test unit, used to test the electrical performance of the damping circuit, the damping circuit test unit includes a damping resistance test, a damping capacitance test and a damping circuit overall function test;

[0039] In the local test mode unit, the operator manually adjusts the test parameters and performs the test through the control panel, and the test results are displayed on the control panel in real time;

[0040] Remote test mode unit, the thyristor valve test module is connected to the remote operation terminal through the network, automatically loads the preset test parameters, and tests the valve base electronic equipment, thyristor trigger monitoring unit and damping circuit in sequence. The test data is transmitted to the remote terminal in real time through the network for the operator to monitor and adjust.

[0041] The IGBT submodule test module comprises:

[0042] An electrical path test unit, used to verify the integrity and correctness of the electrical paths within the IGBT submodules by providing stable current and voltage;

[0043] Energy acquisition system function verification unit, used to test the energy acquisition and balancing capabilities of the energy acquisition system under different load conditions;

[0044] High-potential board monitoring unit, used to detect the potential monitoring, overvoltage protection function and signal acquisition accuracy of high-potential boards;

[0045] IGBT turn-on and turn-off response test unit, used to accurately measure the turn-on time, turn-off time and switching loss of IGBT through high-frequency current signals;

[0046] Overvoltage protection performance test unit, used to test the startup and recovery capabilities of the IGBT's overvoltage protection mechanism by gradually increasing the input voltage;

[0047] The stability test unit in the system power-off state is used to simulate the current cut-off under power-off conditions and the performance evaluation after power restoration.

[0048] The main control unit realizes unified management of power output, test process, data acquisition and feedback through a shared control algorithm, so that the two test modules can work synchronously under different test conditions; the control algorithm is:

[0049]

[0050] in:

[0051] It is the real-time output voltage of the main power module;

[0052] The target voltage required for the current test item;

[0053] is the voltage deviation, defined as the difference between the reference voltage and the actual output voltage;

[0054] is the proportionality factor, which is used to adjust the intensity of the voltage response;

[0055] is the integral coefficient, used to eliminate the continuous steady-state deviation;

[0056] is the differential coefficient, which is used to control the response speed and regulation accuracy of the voltage;

[0057] : At time point Voltage deviation at ;

[0058] : Represents a small time interval, used for integration operations.

[0059] The converter valve test device of the present invention realizes the efficient integration of the thyristor valve test module and the IGBT submodule test module by adopting a shared main power module and main control unit, thereby greatly improving the working efficiency of the test system. Through the adaptive test module, the voltage, current and related test parameters can be automatically adjusted according to the needs of different devices under test, ensuring accurate testing of different devices, reducing human intervention, and improving the automation and accuracy of the test. At the same time, the control algorithm realizes real-time adjustment of the power output to ensure that the system remains stable and accurate under complex test conditions. In addition, the combination of remote test mode and local test mode further enhances the flexibility of operation and meets the testing needs in multiple scenarios. BRIEF DESCRIPTION OF THE DRAWINGS

[0060] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of the present application, but do not constitute an improper limitation of the present invention. In the drawings:

[0061] Figure 1 The schematic diagram of the test equipment (CTE) suitable for LCC converter valves and CLCC converter valves is shown. DETAILED DESCRIPTION

[0062] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments, wherein the illustrative embodiments and descriptions are only used to explain the present invention but are not intended to limit the present invention.

[0063] Embodiment 1:

[0064] Overall structure of the test device (CTE):

[0065] like Figure 1 As shown, this embodiment provides a test device (CTE) for LCC converter valves and CLCC converter valves. The device is used to perform functional tests on converter valves in high-voltage direct current transmission systems, and is particularly suitable for testing the performance of thyristors and IGBT submodules. The test device integrates a high degree of automation and flexibility, can dynamically adjust test parameters, adapt to different test requirements, greatly improve test efficiency and reduce equipment switching and manual adjustments.

[0066] The test device consists of the following main components:

[0067] 1. Main power module: The main power module is used to receive 220V AC power and convert it into DC power through AC / DC, and can provide power output of different voltage levels. The main power module provides power support for various power output units in the test device through the converted power supply. The module can flexibly output power according to the voltage and current requirements of different test items, such as the high-voltage power output required in thyristor valve testing and the stable current supply in IGBT module testing. The main power module is designed to be highly flexible and can meet the power requirements of multiple test scenarios at the same time.

[0068] 2. Multiple types of power output units: including 100V DC power supply, high-voltage DC power supply, high-voltage pulse power supply and current source, which are used for different test items. The 100V DC power supply is used for initial testing of low voltage, while the high-voltage DC power supply is used for equipment response testing under high voltage conditions, especially the high-voltage withstand test required for thyristor valve testing. The high-voltage pulse power supply is mainly used for dynamic testing, suitable for thyristor opening and closing tests, and simulates the actual working conditions of the equipment through the pulse power supply. The current source provides a stable current supply for various types of equipment for current response testing to ensure the accuracy and consistency of the test results.

[0069] 3. Main control unit: including CPU, photoelectric conversion module, high-speed AD module, low-speed AD module, IO buffer and RS485 communication interface. The CPU is used to receive test parameters from the operator and control the entire test process. The photoelectric conversion module converts electrical signals into optical signals to improve the anti-interference ability of data transmission. High-speed AD and low-speed AD modules are used to collect high-speed dynamic signals and steady-state signals respectively to meet different test requirements. The main control unit communicates with external devices through the RS485 communication interface to realize remote control and monitoring functions.

[0070] 4. Sampling unit: The sampling unit is responsible for collecting voltage, current and other data in real time during the test process, and transmits these data to the main control unit for processing. The sampling unit is designed with high precision as the goal, and can flexibly adjust the sampling rate in high-speed and low-speed test modes to ensure data accuracy in various test environments, especially in high-frequency switching or transient voltage tests to provide accurate measurement results.

[0071] 5. Output control unit: The output control unit precisely controls the power module according to the instructions of the main control unit to ensure that different test items are carried out under the required voltage and current conditions. For example, when performing high-voltage testing of thyristors, the output control unit will control the high-voltage power supply to output precise voltage and control the current source to maintain a stable current supply. In the IGBT module test, the output control unit will precisely adjust the pulse voltage and current to meet the requirements of high switching frequency.

[0072] 6. Thyristor valve test module: This module is used to test the performance of thyristor valves. The main contents of the test include the electrical connection and functional verification of the valve base electronics (VBE), thyristor trigger monitoring unit (TTM) and damping circuit. The thyristor valve test module can be operated in local test mode and remote test mode. In local test mode, the operator can manually control the equipment and adjust the test parameters to verify the correctness of the equipment connection and the functional integrity of the damping unit. In remote test mode, the equipment automatically executes the preset test program and transmits the test data to the remote operation terminal through the network for remote monitoring and operation. The design of this module not only simplifies the test process, but also improves the flexibility and efficiency of the test.

[0073] 7. IGBT submodule test module: This module is used for performance testing of IGBT submodules. The main test items include electrical path testing, energy extraction system function verification, and monitoring functions of high-voltage boards. IGBT modules are usually used in CLCC converter valves, and their switching performance directly affects the overall efficiency and stability of the system. Therefore, this test module can test the IGBT's on-off response, overvoltage protection performance, and stability in the system power-off state through precise current and voltage control. The test data is fed back to the main control unit in real time through the sampling unit. The main control unit adjusts the test parameters according to the working status of the IGBT module to ensure the accuracy of the data during the test.

[0074] 8. Adaptive test module: The adaptive test module is the core control module of the main control unit. This module can dynamically adjust the test parameters according to different devices under test and automatically adapt the corresponding test modules and power output units. The test system will detect the working status and characteristics of the device under test in real time through the adaptive test module, and automatically adjust the voltage, current and other parameters. For example, for thyristor valves, the adaptive test module will adjust the trigger voltage, trigger time and damping circuit characteristics according to the actual test needs to ensure the accuracy of the test results. For IGBT sub-modules, the adaptive test module ensures its normal switching behavior under different working conditions by adjusting the timing and current waveform of opening and closing. The introduction of the adaptive module simplifies the operation process, reduces the complexity of manual adjustment, and improves the automation level of the test.

[0075] 9. Shared design: The thyristor valve test module and the IGBT submodule test module achieve functional integration by sharing the same main power module and main control unit. In actual applications, although the two test modules have different test objects, their power supply requirements and control requirements have certain commonalities. Therefore, the main power module is used to provide power support for the two test modules, and the synchronization and coordination of the test process are ensured through unified management of the main control unit. This not only simplifies the structural design of the test device, but also reduces the switching time of the equipment and improves the work efficiency and integration of the system.

[0076] The test device provided in this embodiment can realize efficient performance testing of thyristors and IGBT modules in LCC converter valves and CLCC converter valves. The test device integrates multiple test functions, can automatically adjust test parameters according to different test requirements, and simplifies the system structure and improves test efficiency by sharing the main power module and the main control unit, and has broad application prospects.

[0077] Embodiment 2:

[0078] Adaptive testing module:

[0079] The adaptive test module is a core module for dynamically adjusting test parameters. It can automatically adapt the corresponding test module and power output unit according to the requirements of different devices under test. By adaptively adjusting the test voltage, current and related test parameters, the module ensures accurate testing of devices with different characteristics, reduces human intervention, and improves the automation and efficiency of the test process.

[0080] The adaptive test module mainly consists of the following parts:

[0081] 1. Device identification unit: The first step of the adaptive test module is to identify the type and characteristics of the device under test. The module automatically detects the basic information of the device, such as the voltage level, operating frequency and current requirement of the device, by connecting to the interface of the device under test. The identification unit determines whether the thyristor valve or IGBT submodule is currently connected based on the input electrical signal. This judgment relies on the built-in identification algorithm, which can automatically classify by comparing the initial voltage and current characteristic signals of the device with the characteristic curves in the preset standard database.

[0082] 2. Parameter adjustment unit: After the device identification is completed, the parameter adjustment unit in the adaptive test module will automatically adjust the corresponding test parameters according to the identification results and preset device characteristics.

[0083] For thyristor valves, the adaptive module will dynamically adjust the following parameters:

[0084] Trigger voltage: According to the model of thyristor and working environment, adjust the voltage amplitude to ensure that the trigger voltage can stably turn on the thyristor.

[0085] Trigger time: The trigger time directly affects the conduction performance of the thyristor. The adaptive module will adjust the sending time of the trigger signal according to the response speed of the thyristor to ensure that it is triggered at the appropriate time point.

[0086] Damping circuit characteristics: The damping circuit is used to absorb the overvoltage generated during the commutation process to ensure the stability of the system. The adaptive module adjusts the parameters of the damping circuit (such as resistance and capacitance values) according to the working environment of the thyristor to prevent the thyristor from being damaged during the commutation process.

[0087] For IGBT submodules, the adaptive module will adjust the following parameters according to the working conditions of the equipment:

[0088] Turn-on and turn-off timing: The switching behavior of the IGBT is affected by the driving signal. The adaptive module optimizes the switching characteristics of the IGBT by adjusting the rise and fall time of the driving current to ensure that it can be turned on and off quickly under high current. At the same time, the module monitors the switching loss in real time to ensure that the IGBT works within a safe range.

[0089] Current waveform adjustment: Under high power conditions, the current waveform of the IGBT will be affected by load changes. The adaptive module can ensure the stability and efficiency of the IGBT under different loads by adjusting the amplitude and frequency of the current waveform.

[0090] 3. Feedback control unit: One of the core technologies of the adaptive test module is its closed-loop feedback control system. During the test, the feedback control unit collects voltage and current data in real time and compares it with the preset reference parameters. If the collected signal deviates from the preset value, the feedback unit will immediately adjust the output voltage and current to ensure the accuracy of the test results. For example, if the current response fluctuates after the thyristor is triggered, the feedback unit will correct the fluctuation by adjusting the trigger voltage and current. For the IGBT sub-module, when it is detected that the switching current waveform does not meet expectations, the feedback unit will automatically adjust the drive current to ensure that the IGBT sub-module remains stable during the switching process.

[0091] 4. Adaptive algorithm: The core algorithm of the adaptive test module is based on the model predictive control (MPC) algorithm, combined with the equipment characteristic database to achieve real-time adjustment of the system. The algorithm predicts the future system response and makes real-time adjustments to ensure the dynamic adaptability of parameters such as voltage and current.

[0092] The formula is described as follows:

[0093]

[0094] in:

[0095] J is the cost function of the control objective, which is used to minimize the error and control actions during the test;

[0096] is the output value of the system (such as the voltage or current measured during the actual test);

[0097] is the target reference value (such as a preset voltage or current reference);

[0098] is the change in the controlled variable (such as the voltage or current adjustment of the power supply);

[0099] is the weight coefficient of the control action, balancing the system accuracy and control response speed;

[0100] is the length of the prediction time domain, representing the output of the algorithm predicting multiple moments in the future;

[0101] It is the length of the control time domain, which determines the number of times the control variable is allowed to be adjusted in each control cycle;

[0102] k is the current time point or future time step, which is used to track the output of the system and the performance of the control variables at each time point.

[0103] The MPC algorithm predicts the system behavior in multiple steps in the future and dynamically adjusts the output voltage and current to ensure that the system maintains high accuracy under complex test conditions. The adaptive module uses MPC control to optimally predict and adjust the thyristor trigger voltage and current waveform, as well as the IGBT switching timing and current adjustment, making the system more responsive.

[0104] 5. Automatic matching of test modules and power output units: After the adaptive test module determines the test parameters through the above steps, it will automatically adapt the corresponding test modules and power output units. For example, when it is detected that the device under test is a thyristor, the module will select a high-voltage pulse power supply and adjust the pulse width and frequency of its output to meet the on and off requirements of the thyristor. For the IGBT sub-module, the adaptive module will select a high-voltage DC power supply and ensure that the driving current of the IGBT module meets its working conditions by adjusting the output of the current source.

[0105] 6. Automated operation and optimized design: The adaptive test module has a high degree of automation. In actual test operations, the operator only needs to input the device type, and the system will automatically set the parameters according to the device characteristics without manual adjustment. This design greatly simplifies the operation process and reduces the errors caused by human operation. At the same time, the module has a parameter optimization algorithm that can gradually optimize the test results through multiple iterative tests to ensure that high-precision test results can be maintained under complex conditions.

[0106] In summary, the adaptive test module realizes dynamic test parameter adjustment of different devices through technical means such as device identification, parameter adjustment, feedback control, adaptive algorithm and automated operation, ensuring the stability and performance of thyristor and IGBT modules under different working conditions.

[0107] Embodiment 3:

[0108] Thyristor valve test module:

[0109] The thyristor valve test module is a module specifically used to test the performance of thyristor valves and related electrical components in LCC converter valves. The module is designed to verify the working status of the thyristor valve, the valve base electronics (VBE), the thyristor trigger monitoring unit (TTM) and the functional integrity of the damping circuit to ensure that the equipment can work properly in the high-voltage transmission system. The thyristor valve test module can support local test mode and remote test mode, making the test process more flexible and meeting the operational requirements in different scenarios.

[0110] 1. Valve Base Electronic Equipment (VBE) Test:

[0111] VBE is the core control unit of the thyristor valve, responsible for triggering the thyristor to turn on and off. During the test, the thyristor valve test module first performs an electrical function test on VBE. The test module will provide a stable control signal, simulate the trigger signal under actual working conditions, and detect the response time of VBE and the reliability of the turn-on signal.

[0112] During the test, the test module will collect the trigger current and voltage and compare them with the preset reference values ​​to ensure that VBE sends accurate control signals within the specified trigger time. If the trigger signal deviates from the preset value, the system will record the abnormality and prompt the operator to adjust the relevant parameters. The test mainly includes the following aspects:

[0113] Trigger current test: By collecting the trigger current output by VBE, it is determined whether the conduction conditions of the thyristor are met.

[0114] Trigger voltage test: Accurately measure the trigger voltage output by VBE to ensure that VBE can provide sufficient trigger voltage under different working environments.

[0115] Response time test: Detect the response time of VBE from receiving the control signal to sending the trigger signal to ensure that it meets the real-time requirements of the system.

[0116] 2. Thyristor trigger monitoring unit (TTM) test:

[0117] The thyristor trigger monitoring unit (TTM) is mainly used to monitor the triggering of thyristors in real time to ensure the correct transmission and execution of the trigger signal. In the thyristor valve test module, the TTM test mainly focuses on the reception and feedback of the trigger signal. The test module will send an analog trigger signal to the TTM and verify the monitoring accuracy of the TTM based on the feedback trigger voltage and current.

[0118] The testing process includes the following steps:

[0119] Trigger signal reception test: The test module sends a standard trigger signal to the TTM and collects the feedback data of the trigger signal in real time, including voltage, current and its waveform, to ensure that the TTM can accurately receive the trigger signal and transmit it to the thyristor.

[0120] Trigger monitoring accuracy test: TTM not only receives the trigger signal, but also monitors whether the thyristor is turned on as expected. The test module will detect the response ability of TTM by adjusting the trigger conditions (such as reducing the trigger voltage or current) to determine whether the trigger monitoring function of TTM meets the expected requirements.

[0121] Real-time detection: In order to ensure the high real-time performance of the system, TTM needs to feedback the trigger signal in a very short time. The test module will detect the feedback response time of TTM to ensure that it remains stable in the high-speed dynamic changes of the high-voltage system.

[0122] 3. Damping circuit test:

[0123] The damping circuit is responsible for absorbing overvoltage and suppressing oscillation during the commutation process, so the verification of its electrical connection and function is crucial. The thyristor valve test module tests the damping circuit by simulating the actual electrical environment during the commutation process, mainly testing the damping resistance, capacitance and their corresponding electrical characteristics.

[0124] Damping resistance test: The test module performs electrical performance tests on the resistor elements in the damping circuit, measures the stability and accuracy of the resistance value, and compares it with the design parameters. If the resistance value deviates from the preset range, the module will trigger an alarm, indicating that the resistor needs to be replaced or adjusted.

[0125] Damping capacitor test: Test the capacitor elements in the damping circuit, collect the working characteristics of the capacitor under different voltage conditions, and verify its withstand voltage and charge and discharge characteristics.

[0126] Damping circuit overall function test: The test module simulates the overvoltage generated during the commutation process and observes the damping circuit's absorption effect on the overvoltage. By analyzing the voltage waveform, it is determined whether the damping circuit can effectively suppress the overvoltage and the test results are recorded.

[0127] 4. Local test mode:

[0128] In local test mode, the operator can manually adjust the test parameters through the control panel of the device, and flexibly test VBE, TTM and damping circuit. Test parameters such as trigger voltage, trigger current, response time, etc. can be manually set according to test requirements. The test results will be displayed in real time on the control panel, and the operator can adjust the connection or related parameters of the device according to the test data. Local test mode is particularly suitable for equipment commissioning and maintenance sites, which is convenient for quickly checking the connection status and functional completeness of the device.

[0129] Operation steps in local test mode:

[0130] The operator turns on the power and selects the test item.

[0131] Manually input or adjust test parameters, such as trigger voltage, trigger current, etc.

[0132] Start the test program, the system executes the test according to the input parameters and collects the test data in real time.

[0133] Based on the test results, the operator manually adjusts the equipment or confirms its functional integrity.

[0134] 5. Remote test mode:

[0135] In remote test mode, the thyristor valve test module can transmit the execution of the test program and data to the remote operation terminal through the network connection. The operator does not need to debug on site, the system automatically tests according to the preset parameters and procedures, and the test data is transmitted to the operation terminal in real time through the network, which is convenient for remote monitoring and adjustment.

[0136] The main advantage of remote test mode is the convenience of operation and the improvement of efficiency. The test process in this mode is fully automated. The test module tests VBE, TTM and damping circuit in sequence according to the preset conditions to ensure the accuracy of each part's function. The operator can monitor the test progress through the remote terminal and view the test report after the test is completed.

[0137] Operation steps in remote test mode:

[0138] The remote terminal is connected to the test device via the network and selects a preset test program.

[0139] The system automatically loads the test parameters and tests the VBE, TTM and damping circuit in sequence.

[0140] The test data is transmitted to the remote terminal in real time via the network, and the operator can view the data in real time or export a report after the test is completed.

[0141] 6. Processing and recording of test data:

[0142] Whether in local test mode or remote test mode, the thyristor valve test module can automatically record the voltage, current data and device response during the test. The test data can be displayed on the terminal device in the form of a curve, which is convenient for operators to observe the dynamic response of the device under different working conditions. After the test, the system will automatically generate a test report and archive all test data for subsequent analysis.

[0143] The data processing algorithm includes real-time filtering and Fourier transform analysis of voltage and current waveforms to extract characteristic parameters such as frequency and amplitude. These processing results will be compared with preset standards to ensure that the working performance of the equipment meets the design requirements.

[0144] Through the above detailed description, the adaptive thyristor valve test module can effectively perform comprehensive tests on key components in the commutation system to ensure the safety and stability of the system, and has broad application prospects.

[0145] Embodiment 4:

[0146] IGBT submodule test module:

[0147] The IGBT submodule test module is used for the performance test of the IGBT submodule in the CLCC converter valve. Its core task is to evaluate the IGBT's on / off response, overvoltage protection performance, and stability in the system power-off state. Since the IGBT submodule plays a key role in the CLCC converter valve, its switching performance directly affects the overall efficiency and stability of the system. Therefore, the design of this module focuses on precise current and voltage control, and relies on real-time feedback data for parameter adjustment and performance evaluation.

[0148] 1. Electrical path test:

[0149] The electrical path test of the IGBT submodule is designed to verify the integrity of the electrical path within the module and the correctness of the connection. The test module detects the actual working status of electrical components such as resistors and capacitors within the IGBT module by providing stable test current and voltage. During the test, parameters such as connectivity and impedance of the electrical path will be collected in real time to ensure that the electrical path of the IGBT submodule works properly and avoid open circuits, short circuits or other abnormal conditions.

[0150] The main steps of the test include:

[0151] Resistance test: By providing a constant current, the resistance value of each major electrical component in the module is measured to ensure that the resistance meets the design specifications.

[0152] On-circuit test: Detects the electrical connectivity of the IGBT in the on state to ensure that the current can flow smoothly through the various electrical components in the module.

[0153] Capacitor and inductor testing: By accurately measuring the electrical characteristics of capacitors and inductors, their energy storage and release characteristics are verified to ensure that the current and voltage waveforms during the switching process meet expectations.

[0154] 2. Functional verification of energy acquisition system:

[0155] The energy harvesting system is an important component in the IGBT submodule that is responsible for obtaining energy from the high potential end and maintaining the operation of the module. The stability of the energy harvesting system directly affects the performance of the IGBT module under various working conditions. This test module tests the stability and power supply capacity of the energy harvesting system under various load change conditions by simulating different workloads and electrical conditions.

[0156] During the functional verification process, the voltage and current waveforms of the energy extraction system will be accurately measured and compared with the preset working curve. The specific test steps include:

[0157] Energy acquisition test: Provide high voltage load conditions to test the energy acquisition efficiency of the energy acquisition system under different load conditions. By measuring the voltage and current fluctuations of the system, the adaptability and power supply stability of the energy acquisition system are evaluated.

[0158] Energy balance test: Detect the energy balance ability of the energy acquisition system under different loads to ensure that the system can maintain a stable energy supply under continuous working conditions and avoid energy shortages or power supply fluctuations caused by load changes.

[0159] Load change response test: By introducing rapidly changing load conditions, the response speed and recovery ability of the energy acquisition system are observed to ensure that it can maintain stable power supply under rapid switching conditions without short-term power outages or excessive voltage fluctuations.

[0160] 3. High potential board monitoring function test:

[0161] The high-voltage board is an important part of the IGBT module. Its main function is to ensure that the module can correctly sense the electrical state under high-voltage working environment and monitor the system operation status in real time. The module test includes potential monitoring, overvoltage protection and accuracy test of signal acquisition within the module.

[0162] Potential monitoring test: The test module provides high voltage working conditions to detect the high potential board's ability to perceive the actual voltage. By collecting voltage monitoring data and comparing it with the actual working voltage, it ensures that the board can accurately perceive system voltage changes and promptly feedback potential information to the control system.

[0163] Overvoltage protection test: By gradually increasing the system voltage to the design limit, the overvoltage protection function of the high-voltage board is tested to see if it can be activated in time. Specifically, when the voltage exceeds the safety range, the test module detects whether the high-voltage board can respond quickly and trigger the system protection mechanism through feedback signals to ensure system safety.

[0164] Signal acquisition and transmission test: High-voltage boards need to accurately acquire and transmit voltage, current and other signals under high-voltage environments. This test module simulates the signal acquisition process under different high-voltage conditions to detect the accuracy, latency and anti-interference ability of signal transmission, ensuring that the board can operate stably in complex electromagnetic environments.

[0165] 4. IGBT turn-on and turn-off response test:

[0166] The on-off performance of IGBT is a key factor affecting the working efficiency of the entire CLCC converter valve. In order to ensure the rapid response capability of IGBT in actual work, the test module accurately measures the switching behavior of IGBT through high-frequency current signals.

[0167] Turn-on time test: Provide a control signal to trigger the on-state of the IGBT and test the time required for the IGBT to fully turn on after receiving the control signal. The test module collects the current waveform of the IGBT and calculates its turn-on delay time to ensure that the turn-on performance of the IGBT meets the design requirements.

[0168] Turn-off time test: Similar to the turn-on test, the test module triggers the shutdown of the IGBT by providing a control signal, records the time for the current to drop during the shutdown process, and compares it with the preset reference value to ensure that the IGBT can quickly cut off the current when it is turned off to prevent overcurrent or short circuit.

[0169] Switching loss test: During the process of turning on and off, the IGBT will generate certain switching losses. The test module measures the energy loss during the switching process to evaluate the switching loss level of the IGBT, ensuring that the module can maintain low loss and avoid overheating under high-frequency working conditions.

[0170] 5. Overvoltage protection performance test:

[0171] The IGBT module may face sudden voltage rise during operation, and overvoltage protection performance is crucial to system safety. The test module gradually increases the input voltage until the design voltage upper limit of the IGBT module to test whether the IGBT overvoltage protection mechanism can respond in a very short time.

[0172] The specific steps are as follows:

[0173] Increase the voltage step by step: By testing the power control unit of the module, the operating voltage of the IGBT is gradually increased until the designed overvoltage protection critical point is reached.

[0174] Monitoring overvoltage protection start-up time: After the voltage reaches the critical point, the test module monitors the overvoltage protection trigger time of the IGBT and records the time interval from overvoltage to complete cut-off of the module.

[0175] Overvoltage recovery test: When the overvoltage is released, the test module reduces the voltage to detect whether the IGBT can automatically recover to normal working state. This process verifies the recovery ability of the IGBT module after overvoltage to ensure the module's anti-fault ability.

[0176] 6. Stability test of the system under power-off state:

[0177] The power-off stability test is used to evaluate the response of the IGBT to sudden power failure or large voltage fluctuations. The test module simulates the power-off condition to detect whether the IGBT module can quickly cut off the current to prevent overcurrent or arcing.

[0178] The test steps are as follows:

[0179] Power-off simulation: The test module simulates the sudden power-off that the IGBT module may encounter in actual working conditions by quickly cutting off the power supply.

[0180] Power-off response time: The test module collects the current waveform of the IGBT after power-off and calculates the time it takes for the current to drop after power-off to ensure that the IGBT can quickly cut off the current in a very short time to avoid the spread of faults.

[0181] Power-off recovery test: After power is restored, the test module detects the recovery of the IGBT to ensure that it can work normally after power is restored without failure or performance degradation.

[0182] Through the above tests, the IGBT submodule test module can comprehensively evaluate the performance of the IGBT module and ensure its stability and reliability under various working conditions. The collaboration between the test module, the main control unit and the sampling unit ensures the real-time and accuracy of the test data and provides comprehensive performance evaluation and fault detection of the system.

[0183] Embodiment 5:

[0184] Shared Design:

[0185] In the design of the thyristor valve test module and the IGBT submodule test module of the present invention, a shared main power module and main control unit are used to achieve efficient integration of different test modules. Although these two modules are used to test different types of electrical components (thyristors and IGBTs), they have some common power supply and control requirements in practical applications. Therefore, this embodiment simplifies the structure of the test device through a shared design, improves the efficiency of the test process, and ensures the system's integration and work coordination.

[0186] 1. Shared main power module:

[0187] The main power supply module is the core component that provides unified power support for the thyristor valve test module and the IGBT submodule test module. Through this module, the two test systems can flexibly call different voltage and current outputs according to test needs without the need for independent power supply systems.

[0188] Voltage output range adjustment: The main power module can output multiple voltage levels, including 100V DC power supply, high-voltage DC power supply and high-voltage pulse power supply, to meet the needs of different test items. Thyristor testing usually requires high-voltage pulse power supply to simulate the high-voltage working conditions in the actual working environment, while IGBT testing focuses more on stable high-voltage DC power supply. Therefore, through a flexibly adjusted power module, the system can switch between different voltage levels according to real-time test requirements.

[0189] Current supply adjustment: The main power module can also provide appropriate current output according to the current demand during the test. For thyristor valve testing, the current demand fluctuates with the change of trigger signal and conduction time; while in IGBT submodule testing, the current demand is more stable, but the response speed for transient current is required to be higher. Through the shared current supply system, the two test modules can call the current output function in the main power module according to different test scenarios to meet different electrical conditions.

[0190] 2. Sharing and coordination of master control units:

[0191] The main control unit is the control core of the entire test device, responsible for managing and coordinating the thyristor valve test module and the IGBT submodule test module. The main control unit controls the power output, test process, data acquisition and feedback by monitoring the test status in real time. Since the control requirements of thyristors and IGBT submodules have certain commonalities, the use of a unified main control unit helps to simplify the control structure and ensure coordination between different test modules.

[0192] Synchronous management of test processes: The main control unit can achieve synchronous management of thyristor and IGBT tests through a shared control algorithm. Although the test contents of these two modules are different, their test steps have certain commonality, such as voltage / current startup and shutdown, data collection and feedback, etc. The main control unit can manage these common steps in a unified manner, and for the special needs of different modules (such as thyristor trigger signal adjustment or IGBT switch timing test), the main control unit will automatically switch to the corresponding mode according to the preset test program.

[0193] Shared data collection and feedback: The main control unit cooperates with the sampling unit to uniformly collect the voltage and current data generated during the test, analyze the data and provide feedback. Since the working status of the thyristor and IGBT modules is reflected by the changes in voltage and current, the main control unit can use the same data processing algorithm to analyze the electrical characteristics in real time and feedback abnormal conditions to the operator. This shared design effectively reduces the complexity of the system and improves the efficiency of data processing.

[0194] 3. Power switching and control algorithm:

[0195] In order to ensure that the shared main power module and main control unit can effectively support different test modules, the system has designed an automated power switching and control algorithm. This algorithm can automatically adjust the voltage and current output according to the power requirements of the current test module in different test scenarios, and ensure smooth switching between different test items.

[0196] The basic formula of the control algorithm can be expressed as:

[0197]

[0198] in:

[0199] It is the real-time voltage output by the main power module;

[0200] is the reference voltage, that is, the target voltage required by the current test item;

[0201] is the voltage deviation, defined as the difference between the reference voltage and the actual output voltage;

[0202] is the proportionality factor, which is used to adjust the intensity of the voltage response;

[0203] is the integral coefficient, used to eliminate the continuous steady-state deviation;

[0204] is the differential coefficient, which is used to control the response speed and regulation accuracy of the voltage;

[0205] : At time point Voltage deviation at ;

[0206] : Represents a small time interval, used for integration operations.

[0207] Through this control algorithm, the system can adjust the power output in real time during different test tasks to ensure that the thyristor and IGBT submodules obtain the most appropriate voltage and current input under their respective test conditions. At the same time, the main control unit will fine-tune the parameters of the control algorithm based on real-time monitoring data to ensure the stability and accuracy of the output during the test.

[0208] 4. Improved work efficiency and integration:

[0209] The shared design not only simplifies the hardware structure of the test device, but also greatly reduces the system switching time. Traditional test systems often require independent power supply and control systems for different test modules, which increases the size, cost and operation complexity of the equipment. In this implementation, through the shared main power module and main control unit, the thyristor valve test module and the IGBT submodule test module can achieve flexible function switching in the same system.

[0210] Reduce switching time: Since the two test modules share the same main power module and main control unit, the test system can quickly switch between different test tasks, and the operator does not need to wait for the equipment to restart or reconfigure the power supply. Through the automated power control algorithm, the system can switch to the voltage and current output suitable for the current test module within a few milliseconds, thereby greatly shortening the test preparation time and improving the test efficiency.

[0211] Enhanced integration: Through shared design, the integration of the test device is significantly improved. Operators can operate different test modules through a unified control interface, simplifying the configuration and use of the system. At the same time, the various functional modules in the system are closely coordinated through the main control unit to ensure seamless connection of power supply, control, data processing and other links during the test process, avoiding the problem of functional separation caused by the independence of modules.

[0212] In summary, by sharing the main power module and the main control unit, the thyristor valve test module and the IGBT submodule test module of the present invention can achieve functional integration and efficient collaborative work. The shared design not only improves the working efficiency of the system, but also simplifies the structure of the test device and reduces the complexity of the operation, so that the test device has wide applicability and high integration in practical applications.

[0213] The above description is only a preferred embodiment of the present invention, so all equivalent changes or modifications made according to the structure, characteristics and principles described in the scope of the patent application of the present invention are included in the scope of the patent application of the present invention.

Claims

1. A test device suitable for LCC converter valves and CLCC converter valves, characterized in that: The testing device comprises: The main power supply module is used to convert AC power into DC power and provide power outputs of different voltage levels; Multiple types of power output units, including DC power supply, pulse power supply and current source; The main control unit is used to receive test parameters, control the test process and communicate with external devices; A sampling unit, used to collect voltage and current data during the test; An output control unit, used to control the output of various power supplies according to the control signal of the main control unit; A thyristor valve test module and an IGBT submodule test module, used to test the thyristor valve and the IGBT submodule respectively, and the thyristor valve test module and the IGBT submodule test module share the main power supply module and the main control unit; The main control unit also includes an adaptive test module, which dynamically adjusts voltage, current and related parameters according to the requirements of different devices under test, automatically adapts the corresponding test module and power output unit, and automatically matches the corresponding test parameters and test procedures according to the characteristics of the components under test; The adaptive test module comprises: The device identification unit is used to identify the type and characteristics of the device under test, automatically detect the voltage level, operating frequency and current requirement of the device, and determine the type of the device under test based on the input electrical signal; The parameter adjustment unit automatically adjusts the corresponding test parameters according to the result of the identification by the device identification unit, wherein: For a thyristor valve, the parameter adjustment unit dynamically adjusts the trigger voltage, trigger time and damping circuit characteristics; For the IGBT submodule, the parameter adjustment unit adjusts the turn-on and turn-off timings and the current waveform; The feedback control unit is used to collect voltage and current data in real time and compare the collected data with preset reference parameters. When the data deviates from the preset value, the test parameters are dynamically adjusted by adjusting the output voltage and current; The test parameters are adjusted in real time by predicting the future response of the system through the adaptive algorithm unit, wherein the algorithm adopted by the adaptive algorithm unit is: in: J is the cost function of the control objective, which is used to minimize the error and control actions during the test; y ( k ) is the output value of the system; r ( k ) is the target reference value; △ u ( k ) is the change of the control variable; is the weight coefficient of the control action; N p is the length of the prediction time domain, representing the output of the algorithm predicting multiple moments in the future; Nc It is the length of the control time domain, which determines the number of times the control variable is allowed to be adjusted in each control cycle; k is the current time point or future time step, used to track the performance of the system output and control variables at each time point; Automatic matching unit, used to automatically select and adapt the corresponding test modules and power output units according to the requirements of different devices under test; The main control unit realizes unified management of power output, test process, data acquisition and feedback through a shared control algorithm, so that the two test modules can work synchronously under different test conditions; the control algorithm is: in: V out ( t ) is the real-time output voltage of the main power module; V ref ( t ) is the target voltage required by the current test item; e ( t ) is the voltage deviation, defined as the difference between the reference voltage and the actual output voltage; K p is the proportionality factor, which is used to adjust the intensity of the voltage response; Ki is the integral coefficient, used to eliminate the continuous steady-state deviation; K d is the differential coefficient, which is used to control the response speed and regulation accuracy of the voltage; e( ): at a point in time Voltage deviation at ; : Represents a small time interval, used for integration operations.

2. A test device suitable for LCC converter valves and CLCC converter valves according to claim 1, characterized in that: The thyristor valve test module comprises: A valve base electronic equipment test unit, used to perform an electrical function test on the valve base electronic equipment, wherein the valve base electronic equipment test unit simulates a trigger signal of an actual working condition by providing a control signal, and detects a trigger current, a trigger voltage and a response time of the valve base electronic equipment; A thyristor trigger monitoring unit test unit is used to monitor the triggering condition of the thyristor. The thyristor trigger monitoring unit test unit verifies the trigger signal receiving capability, monitoring accuracy and feedback response time of the thyristor trigger monitoring unit by sending an analog trigger signal and collecting a feedback signal. A damping circuit test unit, used to test the electrical performance of the damping circuit, the damping circuit test unit includes a damping resistance test, a damping capacitance test and a damping circuit overall function test; In the local test mode unit, the operator manually adjusts the test parameters and performs the test through the control panel, and the test results are displayed on the control panel in real time; Remote test mode unit, the thyristor valve test module is connected to the remote operation terminal through the network, automatically loads the preset test parameters, and tests the valve base electronic equipment, thyristor trigger monitoring unit and damping circuit in sequence. The test data is transmitted to the remote terminal in real time through the network for the operator to monitor and adjust.

3. A test device suitable for LCC converter valves and CLCC converter valves according to claim 1, characterized in that: The IGBT submodule test module comprises: An electrical path test unit, used to verify the integrity and correctness of the electrical paths within the IGBT submodules by providing stable current and voltage; Energy acquisition system function verification unit, used to test the energy acquisition and balancing capabilities of the energy acquisition system under different load conditions; High-potential board monitoring unit, used to detect the potential monitoring, overvoltage protection function and signal acquisition accuracy of high-potential boards; IGBT turn-on and turn-off response test unit, used to accurately measure the turn-on time, turn-off time and switching loss of IGBT through high-frequency current signals; Overvoltage protection performance test unit, used to test the startup and recovery capabilities of the IGBT's overvoltage protection mechanism by gradually increasing the input voltage; The stability test unit in the system power-off state is used to simulate the current cut-off under power-off conditions and evaluate the performance after power restoration.

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