A spring metal micro-particle mixed dielectric chip test interface

Abstract

The present application discloses a spring metal microparticle mixed medium chip test interface, which belongs to the field of chip testing technology. It mainly includes a detection interface, one end of which is provided with a mounting plate for testing the chip, and the mounting plate includes a plate body arranged on one side of the detection interface; at least two groups of detection channels, which are opened on the plate body; a silicone cylinder, which is placed in the detection channel; a spiral channel, which is opened in the silicone cylinder, and a second silicone is injected into the spiral channel, which is a mixture of metal microparticles and high-strength silicone. A spring metal microparticle mixed medium chip test interface of the present application can open a spiral channel in the chip test interface by providing a spiral channel and a silicone cylinder, and then mix the metal microparticles with higher density silicone and fill them into the channel, and supplement the elastic force of the test interface by force, thereby enhancing the strength and toughness of the test interface.

Description

Technical Field

[0001] The present application relates to the field of chip testing technology, and in particular to a spring metal micro-particle mixed medium chip testing interface. Background Art

[0002] Metal microparticles are a type of medium composed of tiny metal particles, while spring metal microparticles are mixed with silica gel and combined with springs in the channel. The metal microparticles improve the performance and life of the spring, making it widely used in microelectronics, sensor technology and biomedicine. The spring metal microparticle mixed medium chip test interface is an interface for connecting metal microparticle medium chips and test equipment. It is used to realize signal transmission and data exchange between the chip and external test equipment, which can improve the reliability and efficiency of the test.

[0003] For example, the patent with authorization announcement number CN118091377B discloses a metal micro-particle dielectric chip test interface, which mainly includes a shell, an interface component, a flexible body, metal particles and a first metal contact end. When performing chip testing, the flexible body is squeezed by the first metal contact end, and the metal particles inside the flexible body contact each other, reducing the risk of broken contact and retaining the conductivity of the metal.

[0004] Although the above-mentioned chip test interface realizes the test of the chip, since the test interface is mainly made of flexible silicone, the chip test is often carried out multiple times, and the chip needs to be debugged when testing different chips. The chip needs to be connected and disconnected from the test equipment multiple times to detect its compatibility. After multiple installation and disassembly, the flexible test silicone interface will produce a certain degree of fatigue, and the elasticity of the test interface will gradually become less than before. If the fatigued flexible test interface is connected to the test equipment at this time, the test interface may not generate the original force to squeeze the flexible body, resulting in the metal particles in the flexible body no longer contacting each other, and the chip detection cannot continue. Therefore, it is necessary to provide a spring metal microparticle mixed medium chip test interface to solve the above problems.

[0005] It should be noted that the above information disclosed in this background technology section is only for understanding the background technology of the present application concept, and therefore, it may contain information that does not constitute the prior art. Summary of the invention

[0006] Based on the above problems existing in the prior art, the problem to be solved by the present application is: to provide a spring metal microparticle mixed medium chip test interface, which solves the problem that the chip test interface may become fatigued after a large number of tests and cannot continue to perform detection.

[0007] The technical solution adopted by the present application to solve its technical problems is: a spring metal microparticle mixed medium chip test interface, including a detection interface, one end of the detection interface is provided with a mounting plate for testing the chip, the mounting plate includes a plate body arranged on one side of the detection interface; at least two groups of detection channels, the detection channels are opened on the plate body; a silicone tube, the silicone tube is placed in the detection channel; a spiral channel, the spiral channel is opened in the silicone tube, a second silicone is injected into the spiral channel, the second silicone is a mixture of metal microparticles and high-strength silicone, the strength of the second silicone is greater than the strength of the silicone used to make the silicone tube, and the spiral channel is a curved spiral; wherein: before the detection is started, the metal microparticles in the second silicone are in a separated state, when the silicone tube is squeezed, the second silicone supplements the elastic force of the silicone tube by being subjected to force, and because the spiral channel is a curved spiral, the metal microparticles located in the second silicone are transmitted by undergoing radial and axial deformation, and the metal microparticles are more tightly connected.

[0008] Furthermore, a suction cup is provided on the plate body, and the suction cup absorbs the plate body, and an upper connecting plate is fixedly installed on the suction cup, a second bracket is fixedly installed on one side of the upper connecting plate, a sliding bar is fixedly installed on one side of the second bracket, a support frame is slidably installed on one side of the sliding bar, a cylinder is fixedly installed on the support frame, the output end of the cylinder is fixedly connected to the sliding bar, and a base is fixedly installed on the bottom of the support frame; a support pad is fixedly installed above the silicone tube, and the diameter of the support pad is larger than the diameter of the silicone tube, the detection channel includes a first chamber, a second chamber, a third chamber and a fourth chamber connected to the third chamber, the inner diameter of the first chamber is adapted to the outer diameter of the support pad, the inner diameter of the second chamber is larger than the inner diameter of the first chamber, the inner diameter of the third chamber is smaller than the inner diameter of the first chamber, and the inner diameter of the fourth chamber is smaller than the inner diameter of the third chamber and forms a blocking step, and the blocking step and the support pad are both provided with contacts for conducting electricity.

[0009] Furthermore, a protective cover is installed on the surface of the silicone tube, and the protective cover includes a first sleeve fixedly installed on the surface of the silicone tube, the inner diameter of the first sleeve is the same as the outer diameter of the support pad, a locking block is fixedly installed on the side of the first sleeve close to the detection channel, an arc groove is provided in the first chamber for use with the locking block, a threaded groove is provided on the inner wall of the third chamber, an external thread is provided on the surface of the support pad, the external thread is adapted to the threaded groove, and a threaded inlet is provided on the third chamber near the second chamber, and the threaded inlet is communicated with the threaded groove; a first sleeve is fixedly provided on the surface of the silicone tube, a locking block is fixedly installed on the surface of the first sleeve, and an arc groove for use with the locking block is provided in the first chamber.

[0010] Furthermore, an entrance end is provided at one end of the arc-shaped groove, one end of the entrance end extends outside the detection channel, a terminal end is provided at the end of the arc-shaped groove, a transition channel is provided above the terminal end, the transition channel is communicated with the terminal end, an opening is provided below the terminal end, and the opening and the inner wall of the first chamber form a placement step.

[0011] Furthermore, a second sleeve is arranged below the first sleeve, the inner wall of the second sleeve is in contact with the outer wall of the silicone sleeve, the outer diameter of the second sleeve is the same as the outer diameter of the first sleeve, a first auxiliary sleeve is arranged on the side of the first sleeve close to the second sleeve, and a second auxiliary sleeve is arranged on the position of the second sleeve close to the first sleeve.

[0012] Furthermore, the first auxiliary tube and the first sleeve are of an integral design, the diameter of the first auxiliary tube is smaller than the diameter of the first sleeve and the inner diameters thereof are consistent, a first step is formed at the position where the first auxiliary tube connects with the first sleeve, a protruding end is provided at the bottom of the first auxiliary tube, a second step is formed between the protruding end and the first auxiliary tube, at least two sets of positioning pins are fixedly installed at the bottom of the first auxiliary tube, and a positioning hole used to cooperate with the positioning pins is provided in the second sleeve.

[0013] Furthermore, the second auxiliary tube and the second sleeve are integrally arranged, the inner diameter of the second auxiliary tube is larger than the inner diameter of the second sleeve and forms a third step, and the second auxiliary tube is provided with a lap joint near the first sleeve, the inner wall of the lap joint is in contact with the outer wall of the first auxiliary tube, and a fourth step is formed between the lap joint and the second auxiliary tube.

[0014] Furthermore, a first bracket is slidably installed on one side of the support frame, and a spring is fixedly installed on the bottom of the first bracket, the spring is relatively strong, side panels are fixedly installed on both sides of the first bracket, auxiliary panels are fixedly installed on the side panels, at least two groups of auxiliary units are provided on the auxiliary panels, the number and positions of the auxiliary units correspond to the number and positions of the detection interfaces, and a limit pad is fixedly installed on the auxiliary unit, and the inner diameter of the limit pad is adapted to the diameter of the silicone tube.

[0015] Furthermore, a vertical rod is fixedly mounted on the limiting pad, a supporting member is fixedly mounted on the vertical rod, a supporting end is fixedly mounted on one side of the supporting member, and a limiting groove for cooperating with the supporting end is formed on the second sleeve.

[0016] Furthermore, the limiting groove includes a first channel opened on the surface of the second sleeve, the first channel is a vertical channel, a second channel is arranged at the end of the first channel, the second channel is spiral, and a first stationary point is arranged at the position where the first channel and the second channel communicate.

[0017] The beneficial effect of the present application is: a spring metal microparticle mixed medium chip test interface provided by the present application, by providing a spiral channel and a silicone tube, a spiral channel can be opened in the chip test interface, and then the metal microparticles are mixed with higher density silicone and filled into the channel, and the elastic force of the test interface is supplemented by force, thereby enhancing the strength and toughness of the test interface and extending the life of the test interface.

[0018] In addition to the above-described purposes, features and advantages, the present application also has other purposes, features and advantages. The present application will be further described in detail with reference to the drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] The drawings constituting part of the present application are used to provide a further understanding of the present application. The exemplary embodiments and descriptions of the present application are used to explain the present application and do not constitute an improper limitation on the present application. In the drawings:

[0020] Figure 1 This is an overall schematic diagram of a spring metal micro-particle mixed dielectric chip test interface in this application;

[0021] Figure 2 for Figure 1 Schematic diagram of the overall structure of the test component;

[0022] Figure 3 for Figure 2 Remove the auxiliary board flip diagram from the test assembly;

[0023] Figure 4 for Figure 3 A zoomed-in split diagram of the structure of the middle A area;

[0024] Figure 5 for Figure 3 The structure of the middle A area is enlarged and flipped after section;

[0025] Figure 6 for Figure 5 The overall structure breakdown diagram;

[0026] Figure 7 for Figure 6 Side view of the overall structure;

[0027] Figure 8 for Figure 6 A magnified view of the structure of the middle B region;

[0028] Fig. 9 for Figure 7 A magnified view of the structure of the middle C region;

[0029] Figure 10-12 It is the motion trajectory diagram of the installation plate structure test process;

[0030] Fig.13 for Fig.10 A magnified view of the structure in region D.

[0031] Among them, the reference numerals in the figure are:

[0032] 1. Base; 2. Support base; 3. Conveying assembly; 4. Testing assembly; 41. Support frame; 42. First bracket; 43. Second bracket; 44. Side plate; 45. Upper connecting plate; 46. Suction cup;

[0033] 5. Auxiliary plate; 51. Auxiliary unit; 52. Limit pad; 53. Vertical rod; 54. Abutment member; 55. Abutment end;

[0034] 6. Mounting plate; 61. Plate body; 62. Detection channel; 621. First chamber; 622. Second chamber; 623. Third chamber; 7. Detection interface; 71. Silicone tube; 72. Spiral channel; 73. Second silicone;

[0035] 8. Protective sleeve; 81. First sleeve; 811. First auxiliary sleeve; 812. Second step; 813. Positioning pin; 82. Second sleeve; 821. Second auxiliary sleeve; 822. Fourth step; 83. Support pad; 84. Locking block;

[0036] 9. Limiting groove; 91. First channel; 92. Second channel; 93. First stationary point; 10. Arc groove; 101. Entrance end; 102. Terminal end; 103. Placement step; 104. Transition channel; 11. Threaded groove; 12. Sliding bar. DETAILED DESCRIPTION

[0037] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0038] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present application.

[0039] Embodiment 1: This embodiment mainly introduces how to supplement the elastic force of the metal micro-particle medium chip test interface, thereby achieving the effect of extending the life of the test interface. Specifically:

[0040] like Figure 3-Figure 6 As shown, the present application provides a spring metal micro-particle mixed medium chip test interface, including a detection interface 7, the detection interface 7 is the existing chip test interface body, a mounting plate 6 is arranged at one end of the detection interface 7, the mounting plate 6 is the existing plate for testing the chip, the mounting plate 6 includes a plate body 61 arranged on one side of the detection interface 7, a plurality of detection channels 62 are opened on the plate body 61, the detection interface 7 is installed in the detection channel 62, and usually the number of the detection interfaces 7 corresponds to the number and position of the detection channels 62;

[0041] The detection interface 7 includes a silicone tube 71 placed in the detection channel 62. The silicone tube 71 is the shell of the detection interface 7, which is mainly made of silicone material. During testing, the silicone tube 71 contacts the test chip. Usually, metal particles with a certain density are injected into the silicone tube 71. Before the detection starts, there is a certain gap between the metal particles. At the beginning of the detection, the silicone tube 71 first contacts the connection end of the chip, the silicone tube 71 is squeezed, and its internal space is reduced. The metal particles contact each other, and the metal particles in contact with each other can conduct electricity, so that the chip can be tested.

[0042] In order to facilitate the connection between the detection interface 7 and the detection channel 62, a support pad 83 is fixedly installed on the side of the silicone tube 71 close to the detection channel 62. The diameter of the support pad 83 is larger than the diameter of the silicone tube 71. The support pad 83 is fixedly installed with the detection channel 62, so that the silicone tube 71 and the detection channel 62 can be connected through the support pad 83.

[0043] Furthermore, in order to facilitate chip testing, this embodiment also introduces a device for chip testing, such as Figure 1-Figure 3 As shown, the device includes a base 1, which provides support for chip testing and ensures stable chip testing. A support base 2 is fixedly installed on the base 1, and a conveying component 3 for conveying chips is installed on the support base 2. The conveying component 3 is an existing assembly line. The staff only needs to place the chip on the conveying component 3 to convey the chip from one end where it is initially placed to the other end of the conveying component 3, which facilitates the conveying of the chip.

[0044] A test device for testing the chip is installed on the base 1. Figure 1-Figure 3 The test equipment includes a support frame 41 fixedly mounted on the base 1, a first bracket 42 is slidably mounted on one side of the support frame 41, a spring is fixedly mounted at the bottom of the first bracket 42, and the strength of the spring is relatively large. When the first bracket 42 is subjected to an external force, it will move downward, and after the external force ends, it will automatically reset due to the resilience of the spring. The first bracket 42 is located above the conveying component 3, and side panels 44 are fixedly mounted on both sides of the first bracket 42, and a test step (not shown in the figure) is provided on the side corresponding to the side panel 44, and the test step is mainly used to place auxiliary detection equipment;

[0045] A slide bar 12 is also slidably mounted on the support frame 41. When subjected to external force, the slide bar 12 is suitable for sliding in the vertical direction on the support frame 41. A cylinder is also fixedly mounted on the support frame 41. The output end of the cylinder is fixedly connected to the slide bar 12, so that when the cylinder is started, the slide bar 12 is suitable for sliding downward. A second bracket 43 is fixedly mounted on one side of the slide bar 12. An upper connecting plate 45 is fixedly mounted on one side of the second bracket 43. A suction cup 46 is fixedly connected to the bottom of the upper connecting plate 45, and the mounting plate 6 is adsorbed on the bottom of the suction cup 46. The suction cup 46 is mainly used to fix the mounting plate 6 and keep it stable, and after the cylinder is started, it is suitable for driving the suction cup 46 and the mounting plate 6 to move downward synchronously;

[0046] When testing the chip, the worker only needs to place the test chip on the conveying assembly 3, and the conveying assembly 3 conveys the chip to the bottom of the mounting plate 6, and then starts the cylinder, the cylinder drives the slide bar 12 to move downward, the slide bar 12 drives the test assembly 4 to move downward, the mounting plate 6 moves downward synchronously, and the detection interface 7 contacts the chip on the conveying assembly 3, thereby testing the chip;

[0047] However, in order to improve the life of the detection interface 7, as Figure 6As shown, a spiral channel 72 is provided in the silicone tube 71, and the interior of the spiral channel 72 is hollow. It should be noted that a second silicone 73 is injected into the spiral channel 72, and the second silicone 73 is a mixture of metal microparticles and higher strength silicone. In the initial state, the metal microparticles in the second silicone 73 are separated from each other. In the present application, the strength of the second silicone 73 injected into the spiral channel 72 is greater than the strength of the silicone used to make the silicone tube 71. In comparison, the second silicone 73 injected into the spiral channel 72 has stronger elasticity than the silicone tube 71. When the spiral channel 72 is squeezed, the spiral channel 72 inside it will also be squeezed. At the same time, the second silicone 73 in the spiral channel 72 will also be squeezed, and the metal microparticles in the second silicone 73 will be close to and contact each other after being squeezed, so as to achieve a conductive effect.

[0048] The second silicone 73 supplements the elastic force of the silicone tube 71 by being subjected to force, and irregular capillaries connected to each other are formed inside. Moreover, due to the spiral shape of the spiral channel 72, the metal microparticles in the second silicone 73 transmit the load by undergoing radial and axial deformation, so that the metal microparticles are in closer contact, further reducing the risk of contact breakage. In addition, due to the better elasticity of the second silicone 73, the life of the test interface is increased.

[0049] Furthermore, in order to ensure the conductivity between the detection interface 7 and the board body 61, a contact is provided in the detection channel 62, and the support pad 83 is also made of a metal material and has a certain conductivity, so that when the silicone tube 71 is squeezed, it will squeeze the internal spiral channel 72, and the second silicone 73 will contact each other. At this time, the silicone tube 71 has conductivity, and then the silicone tube 71 can transmit the signal to the support pad 83, and the support pad 83 transmits the signal to the board body 61. In this way, the mounting plate 6 has conductivity, the chip can be tested, and the detection interface 7 can be easily removed from the board body 61 by controlling the power loss or power supply of the electromagnet sheet;

[0050] To summarize, the above-mentioned detection interface 7 is equipped with a spiral channel 72, and the second silicone 73 is injected into the spiral channel 72, so that when the silicone tube 71 is subjected to force, the second silicone 73 supplements the elastic force of the silicone tube 71, and because the spiral channel 72 is a curved spiral setting, the metal microparticles of the second silicone 73 are subjected to radial and axial deformation transmission when in contact, so that the connectivity between the metal microparticles is better, thereby improving the stability of the detection interface 7.

[0051] Embodiment 2: The above embodiment realizes the contact test of the chip by providing a spiral channel 72 and a second silicone 73 mixed in the spiral channel 72, and improves the toughness and stability of the detection interface 7. However, since the detection interface 7 is fixedly connected to the mounting plate 6 by the support pad 83, when one group of detection interfaces 7 on the mounting plate 6 is damaged and needs to be repaired or replaced, it is not convenient to disassemble the detection interface 7 fixedly connected in the detection channel 62. Secondly, since there are a large number of detection interfaces 7, if a large number of damaged ones are present, disassembling the detection interface 7 will undoubtedly consume a lot of time and cost.

[0052] In order to solve this problem, the present embodiment improves the support pad 83 and the detection channel 62, and installs a protective cover 8 on the outside of the silicone tube 71, thereby protecting the detection interface 7 and enabling quick disassembly. Specifically:

[0053] like Figure 6-Figure 9 As shown, the detection channel 62 is composed of a first chamber 621, a second chamber 622, a third chamber 623 and a fourth chamber connected to the third chamber 623 which are gradually approaching the position of the suction cup 46, wherein the inner diameter of the first chamber 621 is adapted to the outer diameter of the support pad 83, the inner diameter of the second chamber 622 is larger than the inner diameter of the first chamber 621, the inner diameter of the third chamber 623 is slightly smaller than the inner diameter of the first chamber 621, and the inner diameter of the fourth chamber is smaller than the inner diameter of the third chamber 623 and forms a blocking step. It should be noted that when the detection interface 7 is installed, the support pad 83 is abutted against the blocking step. In order to ensure the conductivity of the mounting plate 6, contacts for conductivity are provided on the blocking step and the support pad 83. When the support pad 83 is abutted against the blocking step, the contacts on the blocking step and the contacts on the support pad 83 are in contact with each other, and the mounting plate 6 is conductive at this time.

[0054] A protective sleeve 8 for protecting the silicone tube 71 is installed on the surface of the silicone tube 71. The protective sleeve 8 is mainly used to protect the silicone tube 71 from being worn during testing or when not testing. Figure 6-Figure 9, the protective sleeve 8 includes a first sleeve 81 fixedly mounted on the surface of the silicone tube 71, the inner diameter of the first sleeve 81 is equal to the outer diameter of the support pad 83 and is fixedly connected thereto, a locking block 84 is fixedly mounted on the first sleeve 81 on one side close to the detection channel 62, the locking block 84 protrudes from the surface of the first sleeve 81, and at the same time, an arc groove 10 for cooperating with the locking block 84 is provided in the first chamber 621, the total arc length of the arc groove 10 is less than half of the circumference of the first chamber 621, one end of the arc groove 10 is provided with an entrance end 101 along the length direction of the detection channel 62, one side of the entrance end 101 is communicated with the arc groove 10, and the other end of the entrance end 101 extends to the outside of the detection channel 62, the locking block 84 is suitable for entering the arc groove 10 through the entrance end 101, and similarly, when installing the detection interface 7, the locking block 84 needs to be aligned with the entrance end 101 so that the support pad 83 can enter the detection channel 62;

[0055] An end end 102 is provided at the end of the arc groove 10. When the locking block 84 enters the detection channel 62 through the entrance end 101, if the silicone tube 71 is to be fixed in the detection channel 62, the first sleeve 81 needs to be rotated to drive the locking block 84 to slide in the arc groove 10 until the locking block 84 slides to the end end 102. The upper and lower sides of the end end 102 are also provided with placement steps 103 and a transition channel 104, respectively. The transition channel 104 is provided with a first opening at the end end 102. The opening is connected to the second chamber 622, so that the locking block 84 can enter the second chamber 622. When the locking block 84 enters the second chamber 622, the locking block 84 is no longer restricted. At this time, the support pad 83 and the first sleeve 81 can move up and down and rotate freely, but there is a risk that the locking block 84 will slide back into the transition channel 104 and return to the terminal end 102. If this happens, just push the first sleeve 81 upward to drive the locking block 84 to move upward, so that the locking block 84 returns to the second chamber 622 again.

[0056] The placement step 103 is also provided with a second opening below the terminal end 102, but the second opening passes through the detection channel 62, and the second opening and the inner wall of the first chamber 621 form a placement step 103. The space size at the placement step 103 is adapted to the volume size of the locking block 84. When the locking block 84 is in this position, the locking block 84 is restricted by the inner wall of the detection channel 62. At this time, the first sleeve 81 cannot rotate left and right or move downward, and can only be driven by pushing the first sleeve 81 upward to drive the locking block 84 to move up to the terminal end 102 position before the next operation can be performed;

[0057] It can be understood that when the detection interface 7 needs to be installed, the staff only needs to align the locking block 84 with the entrance end 101, and then push up the first sleeve 81. Due to the fixed connection, the first sleeve 81 moves up to drive the silicone tube 71, the support pad 83 and the locking block 84 to move up synchronously, and the locking block 84 enters the arc groove 10 through the entrance end 101. Due to the limitation of the arc groove 10, the first sleeve 81 cannot continue to move up at this time, and can only rotate the first sleeve 81, so that the locking block 84 rotates in the arc groove 10 and finally reaches the terminal end 102. At this time, the staff can release the first sleeve 81. Under the action of gravity, the locking block 84 moves from the terminal end 102 to the placement step 103. Due to the limitation of the first chamber 621, when the locking block 84 is at the placement step 103, the first sleeve 81 cannot move. At this time, the preliminary installation of the detection interface 7 is completed. For the convenience of explanation, the detection interface 7 in this state is defined as the pre-detection state;

[0058] If the detection interface 7 in the pre-detection state is to be disassembled, the staff only needs to push up the first sleeve 81, and the locking block 84 moves up to the terminal end 102, and then reverse the first sleeve 81, and the locking block 84 returns to the entrance end 101 under the push of the arc groove 10. Under the action of gravity, the last step of disassembling the detection interface 7 can be completed. It should be noted that in the process of pushing up the first sleeve 81, the force must be controlled to prevent the locking block 84 from moving up to the transition channel 104 and failing to disassemble. Therefore, when pushing up, the staff can reverse and push up the first sleeve 81. Once the locking block 84 returns to the terminal end 102, the locking block 84 will directly enter the arc groove 10 to slide;

[0059] The above process only completes the preliminary installation of the detection interface 7, and the installation board 6 needs to be powered on later. Figure 6-Figure 9 As shown, an external thread is provided on the surface of the support pad 83, and a thread groove 11 adapted to the external thread is provided in the third chamber 623, and a thread inlet is also provided on the third chamber 623 in the direction close to the second chamber 622, and the thread inlet is communicated with the thread groove 11, and the external thread on the support pad 83 can enter the thread groove 11 through the thread inlet, and rotate upward by thread locking, and the support pad 83 is locked at the position of the third chamber 623, and the contact on the support pad 83 contacts the contact on the blocking step to ensure the conductivity between the support pad 83 and the detection channel 62;

[0060] After the initial installation of the detection interface 7, the staff can continue to push up the first sleeve 81. Since the locking block 84 is located in the second chamber 622 and is not restricted at this time, the first sleeve 81 can move up and down freely. When the top of the support pad 83 reaches the connection between the third chamber 623 and the second chamber 622, since the inner diameter of the third chamber 623 is smaller than the inner diameter of the first chamber 621, the support pad 83 can no longer move up, and the external thread on the surface of the support pad 83 reaches the thread inlet position. Then the staff can rotate the first sleeve 81. The rotation of the first sleeve 81 drives the support pad 83 to rotate synchronously. After rotation, the external thread on the surface of the support pad 83 will enter the thread groove 11 through the thread inlet. With continuous rotation, the support pad 83 will enter the third chamber 623 until the external thread is locked with the thread groove 11. Finally, the top of the support pad 83 reaches the position of the blocking step, and the contacts on the two contact each other. At this time, the mounting plate 6 is in a conductive state, and the detection interface 7 is also locked with the detection channel 62, and the chip test can be started.

[0061] The above process realizes the installation of the detection interface 7 by pushing up and rotating twice. However, if the installed detection interface 7 needs to be tested, the first sleeve 81 needs to be rotated twice. In order to solve this problem, the present embodiment further improves the structure of the protective cover 8 and adds auxiliary disassembly and assembly equipment, so that the detection interface 7 is in a fully installed state during detection, and is in a waiting state when not detected. Specifically:

[0062] like Figure 5-Figure 7 As shown, the protective sleeve 8 also includes a second sleeve 82 arranged below the first sleeve 81, the inner wall of the second sleeve 82 is fitted with the outer wall of the silicone tube 71, the outer diameter of the second sleeve 82 is equal to the outer diameter of the first sleeve 81, and a first auxiliary sleeve 811 is arranged on the side of the first sleeve 81 close to the second sleeve 82. It should be noted that the first auxiliary sleeve 811 and the first sleeve 81 are of an integrated design, the diameter of the first auxiliary sleeve 811 is smaller than the diameter of the first sleeve 81 and the inner diameters thereof are consistent, so that a first step is formed at the position where the first sleeve 81 and the first auxiliary sleeve 811 are connected, and a protruding end is arranged at the bottom of the first auxiliary sleeve 811, and a second step 812 is formed between the protruding end and the first auxiliary sleeve 811;

[0063] In this embodiment, a second auxiliary cylinder 821 is provided at one end of the second sleeve 82 corresponding to the first sleeve 81. The second auxiliary cylinder 821 and the second sleeve 82 are of an integral design. At the same time, the inner diameter of the second auxiliary cylinder 821 is larger than the inner diameter of the second sleeve 82, so that a third step is formed at the position where the second auxiliary cylinder 821 and the second sleeve 82 are connected, and a lap joint is provided at a position of the second auxiliary cylinder 821 close to the first sleeve 81. The inner wall of the lap joint is in contact with the outer wall of the first auxiliary cylinder 811, and a fourth step 822 is formed between the lap joint and the second auxiliary cylinder 821. When there is no external force, the fourth step 822 is overlapped on the second step 812. For details, please refer to Figure 5 , at this time, the distance between the first sleeve 81 and the second sleeve 82 is the longest; when subjected to external force, the second sleeve 82 is suitable for approaching the position of the first sleeve 81;

[0064] Furthermore, in order to ensure that the second sleeve 82 can drive the first sleeve 81 to rotate synchronously when rotating, and the second sleeve 82 can move up and down freely, as shown in FIG. Figure 6 As shown, multiple groups of positioning pins 813 are fixedly installed at the bottom of the first auxiliary cylinder 811, and multiple groups of positioning holes for matching the positioning pins 813 are opened in the second sleeve 82. In the initial state, the positioning pins 813 are inserted into the positioning holes. When the second sleeve 82 is close to the first sleeve 81, the positioning pins 813 are completely inserted into the positioning holes. Therefore, under the restriction of the positioning pins 813, the rotation of the second sleeve 82 will always drive the first sleeve 81 to rotate;

[0065] like Figure 2 , Fig.10 , Fig.13 As shown, an auxiliary plate 5 is fixedly installed between the side plates 44, and the auxiliary plate 5 is used to assist in the disassembly and assembly of the detection interface 7. A plurality of auxiliary units 51 corresponding to the positions and numbers of the detection channels 62 are arranged on the auxiliary plate 5, and a limit pad 52 is fixedly installed on the auxiliary unit 51. It should be noted that the inner diameter of the limit pad 52 is adapted to the diameter of the silicone tube 71 but is smaller than the outer diameter of the protective cover 8, so that the silicone tube 71 is suitable for moving to the bottom of the auxiliary plate 5 through the limit pad 52, but the protective cover 8 will stop on the limit pad 52;

[0066] A vertical rod 53 is fixedly installed above the limiting pad 52, and a supporting member 54 is fixedly installed on the vertical rod 53. A protruding supporting end 55 is provided at one end of the supporting member 54. The diameter of the supporting end 55 is smaller than the diameter of the supporting member 54. It should be noted that the supporting end 55 is made of a flexible material.

[0067] like Fig.10 , Fig.13As shown, a limiting groove 9 for cooperating with the abutting end 55 is provided on the surface of the second sleeve 82, and the limiting groove 9 includes a first channel 91 provided on the surface of the second sleeve 82. The first channel 91 is a vertical channel. An inlet is provided at one end of the first channel 91 so that the abutting end 55 can enter the first channel 91. A second channel 92 is provided at the end of the first channel 91. The second channel 92 is spiral, and a first stationary point 93 is provided at the position where the first channel 91 and the second channel 92 communicate with each other so as to stop the abutting end 55.

[0068] In summary, when testing chips, refer to Figure 10-12 If the detection interface 7 has not been installed on the mounting plate 6, the staff needs to pick up the detection interface 7. Figure 5 As shown, at this time, the first sleeve 81 is farthest from the second sleeve 82, the fourth step 822 overlaps the second step 812, and the locking block 84 is at the inlet end 101, and the silicone tube 71 is located in the second sleeve 82. At this time, the silicone tube 71 is completely protected by the protective sleeve 8 to prevent it from being worn during detection;

[0069] Then the staff rotates the first sleeve 81, and the rotation of the first sleeve 81 drives the second sleeve 82 to rotate synchronously, and the locking block 84 rotates from the entrance end 101 to the terminal end 102. Then the first sleeve 81 is released, and due to the effect of gravity, the locking block 84 falls from the terminal end 102 to the placement step 103. At this time, it means that the preliminary installation of the detection interface 7 is completed, and the detection interface 7 is in the state of waiting for detection, and then the chip can be tested;

[0070] When the test begins, the staff starts the cylinder, which drives the slide bar 12 to move downward, and drives the mounting plate 6 to move downward simultaneously. The mounting plate 6 moves downward, which drives the detection interface 7 that has been preliminarily installed to move downward, and the detection interface 7 contacts the auxiliary plate 5, and the abutting end 55 also enters the first channel 91 through the inlet. It should be noted that since the locking block 84 of the detection interface 7 that has been preliminarily installed will stay in the same position, and the rotation of the first sleeve 81 will drive the second sleeve 82 to rotate, and then the first channel 91 on the second sleeve 82 will be at the same angle, and the position of the abutting end 55 will not change, so that the abutting end 55 can always enter the first channel 91;

[0071] When the abutting end 55 enters the first channel 91, since the abutting end 55 is made of a flexible material, but the protective sleeve 8 is made of a hard material, the protective sleeve 8 will generate a certain squeezing force on the abutting end 55, and the friction therebetween will increase. Compared with the adaptation relationship between the locating pin 813 and the locating hole, the friction between the abutting end 55 and the first channel 91 is greater. Therefore, when the abutting end 55 is located at the initial position of the first channel 91, under the action of the friction force, the second sleeve 82 cannot continue to move downward, and as the cylinder continues to move, the second sleeve 82 will move closer to the position of the first sleeve 81, so that the silicone tube 71 slowly protrudes from the second sleeve 82. For details, refer to Fig.10 ;

[0072] As the cylinder continues to operate, the second auxiliary cylinder 821 fits with the first sleeve 81, and the locking block 84 also moves up from the position of the placement step 103 through the transition channel 104 into the second chamber 622. When the support pad 83 moves to the position where the second chamber 622 and the third chamber 623 are connected, since the inner diameter of the third chamber 623 is larger than the inner diameter of the first chamber 621, the support pad 83 cannot move up further at this time, but the external thread set on its surface reaches the position of the thread inlet. At this time, under the action of the cylinder, the supporting end 55 will move up relatively until it reaches the position of the first stationary point 93. For details, please refer to Fig.11 , and in this state, one end of the silicone tube 71 protrudes out of the protective sleeve 8;

[0073] However, the effect of the cylinder is not over yet. Since the second channel 92 is a spiral channel, the abutting end 55 will slide in the second channel 92 as the cylinder acts. Due to the limitation of the abutting end 55, the second sleeve 82 will rotate relatively, thereby driving the first sleeve 81 to rotate. The rotation of the first sleeve 81 drives the support pad 83 to rotate, so that the external thread on the support pad 83 enters into the thread groove 11 through the thread, and the support pad 83 is screwed into the third chamber 623. When the abutting end 55 reaches the end of the second channel 92, the top of the support pad 83 also reaches the blocking step. At this time, the contact on the support pad 83 is in contact with the contact on the blocking step, and the installation of the detection interface 7 is completed.

[0074] like Fig.12 As shown, when the detection interface 7 is installed, the silicone tube 71 protrudes from the auxiliary plate 5. At this time, the second sleeve 82 is placed on the limit pad 52, and the output end of the cylinder continues to push down. At this time, the detection interface 7 drives the auxiliary plate 5 to move down synchronously until one end of the silicone tube 71 contacts the chip, and the chip begins to be detected;

[0075] It should be noted that, due to the relatively large strength of the spring at the bottom of the first bracket 42, when the cylinder acts downward on the detection interface 7, the first bracket 42 does not move downward, but when the detection interface 7 is completely installed, the detection interface 7 has no space to move upward, and at this time, the cylinder acts downward again, and the auxiliary plate 5 will move downward synchronously, the spring is compressed, and then the chip detection is performed;

[0076] After the test is completed, the cylinder will drive the suction cup 46 to move up, thereby driving the mounting plate 6 and the auxiliary plate 5 to move up synchronously. The auxiliary plate 5 is reset under the action of the spring. When the auxiliary plate 5 moves to the initial position, the cylinder will drive the mounting plate 6 to continue to move up, and the abutting end 55 also slides in the second channel 92 under the action of the cylinder. At the same time, the support pad 83 will also rotate synchronously, and the support pad 83 will disengage from the third chamber 623. Finally, the abutting end 55 will pass the first stationary point 93 and then disengage from the first channel 91. After rotating a fixed distance, the locking block 84 returns from the transition channel 104 to the position of the placement step 103. Finally, the detection interface 7 returns to the state to be detected. If the staff needs to disassemble the detection interface 7 at this time, they only need to rotate it once, and in the absence of external force, the detection interface 7 will not disengage from the detection channel 62. The silicone tube 71 is also located in the protective cover 8, and the protective cover 8 can better protect the silicone tube 71.

[0077] The above description is only the preferred embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A spring metal micro-particle mixed dielectric chip test interface, characterized in that: include: A detection interface (7), one end of which is provided with a mounting plate (6) for testing a chip, the mounting plate (6) comprising a plate body (61) arranged on one side of the detection interface (7); at least two groups of detection channels (62), the detection channels (62) being arranged on the plate body (61); a silicone tube (71), the silicone tube (71) being placed in the detection channel (62); and a spiral channel (72), the spiral channel (72) being arranged in the silicone tube (71), the spiral channel (72) being injected with a second silicone (73), the second silicone (73) being metal microparticles and high-strength The second silicone (73) is stronger than the silicone used to make the silicone tube (71), and the spiral channel (72) is in a curved spiral shape; wherein: before the detection is started, the metal microparticles in the second silicone (73) are in a separated state, and when the silicone tube (71) is squeezed, the second silicone (73) supplements the elastic force of the silicone tube (71) by the force, and because the spiral channel (72) is in a curved spiral shape, the metal microparticles in the second silicone (73) are transmitted by undergoing radial and axial deformation, and the metal microparticles are more tightly connected.

2. A spring metal microparticle mixed dielectric chip test interface according to claim 1, characterized in that: The plate body (61) is provided with a suction cup (46), the suction cup (46) adsorbs the plate body (61), an upper connecting plate (45) is fixedly mounted on the suction cup (46), a second bracket (43) is fixedly mounted on one side of the upper connecting plate (45), a sliding bar (12) is fixedly mounted on one side of the second bracket (43), a support frame (41) is slidably mounted on one side of the sliding bar (12), a cylinder is fixedly mounted on the support frame (41), an output end of the cylinder is fixedly connected to the sliding bar (12), and a base (1) is fixedly mounted on the bottom of the support frame (41); a support pad (83) is fixedly mounted above the silicone tube (71), and the support pad (83) is fixedly mounted on the bottom of the silicone tube (71). The diameter of the detection channel (62) is larger than the diameter of the silicone tube (71), the detection channel (62) includes a first chamber (621), a second chamber (622), a third chamber (623) and a fourth chamber connected to the third chamber (623), the inner diameter of the first chamber (621) is adapted to the outer diameter of the support pad (83), the inner diameter of the second chamber (622) is larger than the inner diameter of the first chamber (621), the inner diameter of the third chamber (623) is smaller than the inner diameter of the first chamber (621), the inner diameter of the fourth chamber is smaller than the inner diameter of the third chamber (623) and forms a blocking step, and contacts for conducting electricity are provided on the blocking step and the support pad (83).

3. The spring metal microparticle mixed dielectric chip test interface according to claim 2, characterized in that: A protective sleeve (8) is installed on the surface of the silicone tube (71), and the protective sleeve (8) comprises a first sleeve (81) fixedly installed on the surface of the silicone tube (71), the inner diameter of the first sleeve (81) being the same as the outer diameter of the support pad (83), a locking block (84) being fixedly installed on one side of the first sleeve (81) close to the detection channel (62), an arc groove (10) for use with the locking block (84) being provided in the first chamber (621), and a threaded groove (10) being provided on the inner wall of the third chamber (623) 11), the surface of the support pad (83) is provided with an external thread, the external thread is adapted to the thread groove (11), the third chamber (623) is provided with a threaded inlet in a direction close to the second chamber (622), the threaded inlet is communicated with the thread groove (11); the surface of the silicone tube (71) is fixedly sleeved with a first sleeve (81), the surface of the first sleeve (81) is fixedly mounted with a locking block (84), and the first chamber (621) is provided with an arc groove (10) for use with the locking block (84).

4. The spring metal micro-particle mixed dielectric chip test interface according to claim 3, characterized in that: An inlet end (101) is provided at one end of the arc-shaped groove (10), one end of the inlet end (101) extends to the outside of the detection channel (62), a terminal end (102) is provided at the end of the arc-shaped groove (10), a transition channel (104) is provided above the terminal end (102), the transition channel (104) is communicated with the terminal end (102), an opening is provided below the terminal end (102), and the opening and the inner wall of the first chamber (621) form a placement step (103).

5. The spring metal micro-particle mixed dielectric chip test interface according to claim 4, characterized in that: A second sleeve (82) is arranged below the first sleeve (81); the inner wall of the second sleeve (82) is in contact with the outer wall of the silicone sleeve (71); the outer diameter of the second sleeve (82) is the same as the outer diameter of the first sleeve (81); a first auxiliary sleeve (811) is arranged on a side of the first sleeve (81) close to the second sleeve (82); and a second auxiliary sleeve (821) is arranged on a position of the second sleeve (82) close to the first sleeve (81).

6. The spring metal micro-particle mixed dielectric chip test interface according to claim 5, characterized in that: The first auxiliary tube (811) and the first sleeve (81) are of an integral design; the diameter of the first auxiliary tube (811) is smaller than the diameter of the first sleeve (81) and the inner diameters thereof are consistent; a first step is formed at the position where the first auxiliary tube (811) and the first sleeve (81) meet; a protruding end is provided at the bottom of the first auxiliary tube (811); a second step (812) is formed between the protruding end and the first auxiliary tube (811); at least two groups of positioning pins (813) are fixedly installed at the bottom of the first auxiliary tube (811); and a positioning hole for use with the positioning pins (813) is provided in the second sleeve (82).

7. The spring metal micro-particle mixed dielectric chip test interface according to claim 6, characterized in that: The second auxiliary tube (821) and the second sleeve (82) are integrally arranged, the inner diameter of the second auxiliary tube (821) is larger than the inner diameter of the second sleeve (82) and forms a third step, the second auxiliary tube (821) is provided with an overlapping portion near the first sleeve (81), the inner wall of the overlapping portion is in contact with the outer wall of the first auxiliary tube (811), and a fourth step (822) is formed between the overlapping portion and the second auxiliary tube (821).

8. The spring metal micro-particle mixed dielectric chip test interface according to claim 7, characterized in that: A first bracket (42) is slidably mounted on one side of the support frame (41), a spring is fixedly mounted on the bottom of the first bracket (42), the spring having a relatively strong force, side panels (44) are fixedly mounted on both sides of the first bracket (42), an auxiliary panel (5) is fixedly mounted on the side panel (44), at least two groups of auxiliary units (51) are provided on the auxiliary panel (5), the number and positions of the auxiliary units (51) correspond to the number and positions of the detection interfaces (7), a limiting pad (52) is fixedly mounted on the auxiliary unit (51), the inner diameter of the limiting pad (52) is adapted to the diameter of the silicone tube (71).

9. The spring metal micro-particle mixed dielectric chip test interface according to claim 8, characterized in that: A vertical rod (53) is fixedly mounted on the limiting pad (52), a supporting piece (54) is fixedly mounted on the vertical rod (53), a supporting end (55) is fixedly mounted on one side of the supporting piece (54), and a limiting groove (9) used in conjunction with the supporting end (55) is formed on the second sleeve (82).

10. The spring metal micro-particle mixed dielectric chip test interface according to claim 9, characterized in that: The limiting groove (9) comprises a first channel (91) opened on the surface of the second sleeve (82), the first channel (91) being a vertical channel, a second channel (92) being arranged at the end of the first channel (91), the second channel (92) being spiral-shaped, and a first stationary point (93) being arranged at a position where the first channel (91) and the second channel (92) communicate with each other.

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