Dynamic characteristic testing method and system of power semiconductor device and related assembly

By setting the load inductor and bridge arm in the test circuit, and using the pulse sequence control device to conduct or disconnect, the cumbersome testing in the existing technology is solved, and accurate dynamic characteristic testing is achieved under any pulse width, which improves the testing efficiency.

CN119178975APending Publication Date: 2024-12-24CRRC ZHUZHOU ELECTRIC LOCOMOTIVE RESEARCH INSTITUTE CO LTD
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Patent Information

Application Number
CN202310745195.1
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2023-06-21
Publication Date
2024-12-24

AI Technical Summary

Technical Problem

When testing the dynamic characteristics of power semiconductor devices, the prior art requires replacement of loads of different inductors. The test process is cumbersome and inefficient, making it difficult to accurately obtain dynamic characteristic parameters at any pulse width.

Method used

A test method is adopted to set the load inductor and two bridge arms in the test circuit, determine the target duration of the free-current state of the load inductor based on the current test pulse width, and output the corresponding pulse sequence to the device to be tested and the device to be tested. Control it to turn on or off, obtain current and voltage to determine dynamic characteristic parameters, and achieve accurate testing at any pulse width without changing the load inductor.

Benefits of technology

This reduces the complexity of the test process, improves the efficiency of dynamic characteristics testing of power semiconductor devices, and achieves accurate test results under any pulse width.

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Abstract

The invention discloses a dynamic characteristic test method and system of a power semiconductor device and a related component, and relates to the field of power electronics, the dynamic characteristic test method is applied to a test circuit, and comprises the following steps: determining a target duration of a follow current state of a load inductor based on a current test pulse width; outputting a first pulse sequence corresponding to the target duration to the to-be-tested device, and outputting a second pulse sequence corresponding to the target duration to the test accompanying device, so as to control the to-be-tested device and the test accompanying device to be connected or disconnected; acquiring current and / or voltage passing through the to-be-tested device under the driving of the first pulse sequence and the second pulse sequence; and determining dynamic characteristic parameters of the to-be-tested device based on the current and / or the voltage. The load inductor does not need to be replaced after the pulse width conversion is tested, the complexity of the testing process is reduced, the dynamic characteristic testing efficiency of the power semiconductor device is improved, and accurate testing of the dynamic characteristics of the power semiconductor device under any pulse width is achieved.
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