A high-temperature gas temperature measurement device

Abstract

The present invention discloses a high-temperature gas temperature measurement device, which relates to the technical field of gas temperature detection. Through the design of a rotating vane and a baffle plate, the air in the rotating chamber can generate an obvious centrifugal force under the condition of high-speed rotation, so that the air with a lower temperature quickly flows to the inner wall edge of the rotating chamber under the action of the centrifugal force, while the air with a higher temperature converges to the axial center position of the rotating chamber. This design can complete the air flow and the aggregation of hot air in a relatively short time, greatly improving the accuracy and efficiency of air temperature measurement; since the light emitted by the semiconductor laser will undergo a red shift in wavelength after being heated, the laser is guided to the optical wavelength detector by the light guiding optical fiber for detection, and the air temperature can be accurately measured. In occasions with high-precision measurement requirements, reliable and accurate temperature data can be provided, effectively avoiding the measurement errors of traditional temperature sensors in high-temperature or complex environments.

Description

Technical Field

[0001] The present invention relates to the technical field of gas temperature detection, and specifically to a high-temperature gas temperature measurement device. Background Art

[0002] Most of the existing air temperature measurement devices use traditional temperature sensors such as thermocouples or thermistors. These sensors are easily interfered with in high-temperature or complex environments, and the measurement accuracy is not high. In addition, traditional temperature sensors need to be placed in the environment during the measurement process, and are easily affected by environmental factors, resulting in unstable measurement data. Especially when measuring high-temperature gases, the high-temperature gas will increase the internal resistance of the device, resulting in the measurement accuracy being affected and unable to meet the measurement requirements in high-temperature environments. Summary of the Invention

[0003] To overcome the defects of the above-mentioned prior art, the present invention provides the following technical solution: A high-temperature gas temperature measurement device, including an installation housing. A rotating chamber is rotatably installed in the installation housing through a rotating chamber bracket. A plurality of circular and equally spaced rotating vanes are fixed on the circumferential surface of the inner wall of the rotating chamber. A plurality of flow holes are also opened on the rotating chamber. A baffle for blocking the flow holes is rotatably arranged on the rotating chamber. Vent holes with the same number and shape as the flow holes are opened on the baffle. A shielding ring plate is fixed at one end of the rotating chamber away from the baffle in a detachable manner. A heat-receiving shell is arranged at the axis inside the rotating chamber. A semiconductor laser is fixedly arranged inside the heat-receiving shell. A collimating lens is also fixed inside the heat-receiving shell for collimating the light emitted by the semiconductor laser.

[0004] Preferably, the heat-receiving shell is fixed on a support tube. An avoidance through hole is opened at the intersection of the rotating chamber and the support tube. A sealing piece is slidably and hermetically arranged at the avoidance through hole. The sealing piece is fixed on the support tube. A support ring frame is fixed at the coaxial position of the avoidance through hole. Symmetrically arranged moving rack brackets are fixed on the support ring frame.

[0005] Preferably, a toothed ring is rotatably sleeved and installed on the support ring frame. Two moving racks symmetric about the origin of the support ring frame are slidably installed on the two moving rack brackets respectively. A counterweight block is fixed at one end of the moving rack. Two extension arms symmetric about the origin of the support ring frame are respectively fixed on the two moving rack brackets. A tension spring is fixed between the extension arm and the other end of the moving rack. The two moving racks are meshed and driven with the toothed ring, and the toothed ring is fixedly matched with the baffle.

[0006] Preferably, an installation base is also fixedly installed on the installation housing. A threaded boss is arranged on the installation base. An installation tube can be fixedly sleeved on the threaded boss by threading.

[0007] Preferably, a driving motor is fixedly installed on the rotating chamber bracket, and the output shaft of the driving motor is in transmission connection with the circumferential surface of the rotating chamber through a transmission belt.

[0008] Preferably, a light guiding optical fiber is fixedly installed on the rotating chamber bracket. One end of the light guiding optical fiber is connected to the heat receiving shell, and the other end of the light guiding optical fiber is connected to an optical wavelength tester, for guiding the light emitted by the semiconductor laser into the optical wavelength tester.

[0009] Preferably, a light guiding channel can also be fixed on the installation housing. Black matte coatings are provided on the inner and outer surfaces of the light guiding channel. A second reflecting mirror and a first reflecting mirror are fixedly installed in the light guiding channel. The first reflecting mirror and the second reflecting mirror are perpendicularly arranged. The first reflecting mirror is used to perpendicularly reflect the light emitted by the semiconductor laser onto the second reflecting mirror, and the second reflecting mirror is used to perpendicularly reflect the light reflected by the first reflecting mirror out of the light guiding channel again.

[0010] Preferably, a light shielding shell is arranged on the path of the light reflected by the second reflecting mirror. A light shielding plate is fixed on the inner wall of the light shielding shell. Two light sensors are provided on the light shielding plate. A double slit hole is also fixedly arranged inside the light shielding shell, for observing and recording the light fringes passing through the light sensors.

[0011] Compared with the prior art, the present invention has the following beneficial effects: (1) Through the design of the rotating vane and the shielding plate, the air in the rotating chamber can generate an obvious centrifugal force under the condition of high-speed rotation, so that the air with a lower temperature quickly flows to the inner wall edge of the rotating chamber under the action of the centrifugal force, while the air with a higher temperature converges to the axis position of the rotating chamber. This design can complete the air flow and the aggregation of hot air in a relatively short time, greatly improving the accuracy and efficiency of air temperature measurement; (2) Since the light emitted by the semiconductor laser will undergo a red shift in wavelength after being heated, using the light guiding optical fiber to guide the laser to the optical wavelength detector for detection can accurately measure the air temperature. Especially in the occasion of high-precision measurement requirements, this device can provide reliable and accurate temperature data, effectively avoiding the measurement errors of traditional temperature sensors in high-temperature or complex environments; (3) The design of the present invention takes into account the requirements of different measurement environments and provides a variety of installation and use methods, such as installing a collimating lens in the rotating chamber to directly output light, or guiding the light to a distant light shielding shell through the light guiding channel and the reflecting mirror system for measurement. This flexible installation method can adapt to various complex on-site environments and improve the applicability and operability of the equipment. Description of the Drawings

[0012] Figure 1 It is a schematic diagram of the overall structure of the present invention.

[0013] Figure 2Schematic diagram of the light-shielding shell structure of the present invention.

[0014] Figure 3 Schematic diagram of the light-guiding channel structure of the present invention.

[0015] Figure 4 Schematic diagram of the mounting base structure of the present invention.

[0016] Figure 5 Schematic diagram of the rotating chamber bracket structure of the present invention.

[0017] Figure 6 Schematic diagram of the shielding ring plate structure of the present invention.

[0018] Figure 7 Schematic diagram of the rotating chamber structure of the present invention.

[0019] Figure 8 Schematic diagram of the structure at the support ring frame of the present invention.

[0020] Figure 9 For the present invention Figure 8 Schematic diagram of the structure at position A in

[0021] Figure 10 Schematic diagram of the structure at the tension spring of the present invention.

[0022] In the figure: 101 - rotating chamber; 102 - rotating paddle; 103 - baffle; 104 - ventilation hole; 105 - circulation hole; 106 - avoidance through hole; 107 - sealing sheet; 108 - support tube; 109 - heat-receiving shell; 110 - semiconductor laser; 111 - collimating lens; 112 - support ring frame; 113 - toothed ring; 114 - counterweight; 115 - moving rack; 116 - moving rack bracket; 117 - extension arm; 118 - tension spring; 119 - shielding ring plate; 120 - light guide fiber; 121 - rotating chamber bracket; 122 - transmission belt; 123 - drive motor; 124 - installation housing; 125 - mounting base; 126 - installation tube; 127 - light-guiding channel; 128 - second reflector; 129 - first reflector; 130 - light-shielding shell; 131 - light-shielding plate; 132 - double-slit hole; 133 - light sensor. Detailed implementation manners

[0023] The following combines with the attached Figures 1-10 drawings and further illustrates the technical solution of the present invention through specific implementation manners.

[0024] The present invention provides a high-temperature gas temperature measurement device, which includes an installation housing 124. Inside the installation housing 124, a rotating chamber 101 is rotatably installed through a rotating chamber bracket 121. On the circumferential surface of the inner wall of the rotating chamber 101, a plurality of rotating vanes 102 arranged in a circular equidistant array are fixed. A plurality of flow holes 105 are also formed on the rotating chamber 101. A shutter plate 103 for blocking the flow holes 105 is rotatably arranged on the rotating chamber 101. Vent holes 104 having the same number and shape as the flow holes 105 are formed on the shutter plate 103. At one end of the rotating chamber 101 away from the shutter plate 103, a shielding ring plate 119 is fixed in a detachable manner. At the axis center inside the rotating chamber 101, a heat-receiving shell 109 is arranged. A semiconductor laser 110 is fixedly arranged inside the heat-receiving shell 109. A collimating lens 111 is also fixed inside the heat-receiving shell 109 for collimating the light emitted by the semiconductor laser 110. The heat-receiving shell 109 is fixed on a support tube 108. An avoidance through hole 106 is formed at the intersection position of the rotating chamber 101 and the support tube 108. A sealing piece 107 is slidably and sealingly arranged at the avoidance through hole 106. The sealing piece 107 is fixed on the support tube 108. And at the coaxial position of the avoidance through hole 106, a support ring frame 112 is fixed. Symmetrically arranged moving rack brackets 116 are fixed on the support ring frame 112. A gear ring 113 is rotatably sleeved and installed on the support ring frame 112. Two moving racks 115 symmetric about the origin of the support ring frame 112 are slidably installed on the two moving rack brackets 116 respectively. One end of each moving rack 115 is fixed with a counterweight 114. Two extension arms 117 symmetric about the origin of the support ring frame 112 are also respectively fixed on the two moving rack brackets 116. A tension spring 118 is fixed between the extension arm 117 and the other end of the moving rack 115. The two moving racks 115 are in meshing transmission with the gear ring 113, and the gear ring 113 is fixedly matched with the shutter plate 103. An installation base 125 is also fixedly installed on the installation housing 124. A threaded boss is arranged on the installation base 125, and an installation tube 126 can be threadedly sleeved and fixed on the threaded boss. A driving motor 123 is fixedly installed on the rotating chamber bracket 121. The output shaft of the driving motor 123 is in transmission connection with the circumferential surface of the rotating chamber 101 through a transmission belt 122. An optical fiber 120 is fixedly installed on the rotating chamber bracket 121. One end of the optical fiber 120 is connected to the heat-receiving shell 109, and the other end of the optical fiber 120 is connected to an optical wavelength tester for guiding the light emitted by the semiconductor laser 110 into the optical wavelength tester.The light guiding channel 127 can also be fixed on the installation housing 124. A black matte coating is provided on the inner and outer surfaces of the light guiding channel 127. A second reflecting mirror 128 and a first reflecting mirror 129 are fixedly installed in the light guiding channel 127. The first reflecting mirror 129 is perpendicularly arranged with respect to the second reflecting mirror 128. The first reflecting mirror 129 is used to reflect the light emitted by the semiconductor laser 110 vertically onto the second reflecting mirror 128, and the second reflecting mirror 128 is used to reflect the light reflected by the first reflecting mirror 129 vertically out of the light guiding channel 127. A light shielding housing 130 is arranged on the path of the light reflected by the second reflecting mirror 128. A light shielding plate 131 is fixed on the inner wall of the light shielding housing 130. Two light sensors 133 are provided on the light shielding plate 131. A double slit hole 132 is also fixedly arranged inside the light shielding housing 130 for observing and recording the light stripes passing through the light sensors 133.

[0025] The working principle of a high-temperature gas temperature measurement device disclosed by the present invention is as follows: The whole is installed in the environment where the temperature needs to be measured, and then the driving motor 123 is started. The output shaft of the driving motor 123 drives the rotating chamber 101 to rotate through the transmission belt 122 (the rotating chamber 101 rotates on the rotating chamber bracket 121). The rotating vane 102 inside the rotating chamber 101 rotates following the rotating chamber 101. At this time, the rotating vane 102 will stir the air inside the rotating chamber 101 to rotate. The rotating air will flow towards the inner wall edge of the rotating chamber 101 under the action of centrifugal force, so that the air passes through the shielding ring plate 119 and then enters the central position inside the rotating chamber 101, and then flows radially along the rotating chamber 101 to the inner wall of the rotating chamber 101, and flows to the outside of the rotating chamber 101 through the circulation hole 105 and the air permeable hole 104 under the action of pressure (when the circulation hole 105 and the air permeable hole 104 are aligned, that is, when the rotating speed of the rotating chamber 101 is relatively low).In this process, the external air will flow into the rotating chamber 101 along the air flow, and then the speed of the output shaft of the driving motor 123 will be increased, which will also increase the speed of the rotating chamber 101. At this time, the rotating paddle 102 inside the rotating chamber 101 will accelerate the rotation speed of the air, thereby increasing the centrifugal force on the air inside the rotating chamber 101. At the same time, the counterweight 114 will also rotate with the rotating chamber 101. This is because the counterweight 114 is fixed on the moving rack 115, and the moving rack 115 is installed on the moving rack bracket 116. The moving rack bracket 116 is fixed on the rotating chamber 101 through the supporting ring frame 112. At this time, the counterweight 114 will rotate with the rotating chamber 101 (the counterweight 114 always rotates with the rotating chamber 101. At the beginning, due to the slow rotation speed of the rotating chamber 101, the centrifugal force on the counterweight 114 cannot pull the tension spring 118). At this time, the high-speed rotating counterweight 114 will pull the tension spring 118 through the moving rack 115 under the action of centrifugal force, and then the moving rack 115 will slide on the moving rack bracket 116. The sliding of the moving rack 115 will drive the gear ring 113 to rotate. The rotation of the gear ring 113 will drive the shielding plate 103 to rotate. At this time, the air vent 104 will be aligned with the flow hole 105. The air in the rotating chamber 101 is staggered, thereby blocking the flow hole 105, so that the air in the rotating chamber 101 cannot flow, and the hot air will accumulate in the rotating chamber 101. Due to the high-speed rotation of the air, the air is gathered to the edge of the inner wall of the rotating chamber 101 under the action of centrifugal force, especially the air with relatively low temperature, because of its high density, while the air with higher temperature will gather to the axial position of the rotating chamber 101 (not only due to the action of centrifugal force, but also due to the density difference between cold air and hot air, the hot air will diffuse towards the axial position with lower density). At this time, all the hot air in the air sucked into the rotating chamber 101 will gather in the rotating chamber 101 axial position (suitable for detecting an environment with relatively low air temperature, not a high temperature environment. If the air in a high temperature environment can directly rotate the rotating chamber 101, the hot air can be sucked in to heat the heated shell 109. If the ambient air temperature is not high, the sucked hot air needs to be gathered to the axial position of the rotating chamber 101 to improve the heating efficiency of the heated shell 109. Moreover, since the rotation speed of the rotating chamber 101 is known, the ratio of the hot air in the middle to the hot air outside the rotating chamber 101 is determined. Therefore, the temperature of the ambient air outside the rotating chamber 101 can be measured by measuring the temperature at the axial position of the rotating chamber 101).

[0026] After the heated housing 109 is heated, it will transfer the temperature to the semiconductor laser 110. After the semiconductor laser 110 is heated, as the temperature rises, the bandgap width of the semiconductor material will decrease, resulting in a decrease in the energy of the emitted photons, thereby making the laser wavelength longer (redshift). Therefore, by detecting the wavelength of the light emitted by the semiconductor laser 110, the temperature of the air can be measured. Therefore, the light emitted by the semiconductor laser 110 is led out through the light guiding optical fiber 120 and detected in the optical wavelength detector to obtain the temperature. If the light guiding optical fiber 120 cannot reach the place where the temperature needs to be detected, the semiconductor laser 110 can be turned around and the collimating lens 111 can be aligned with the support tube 108 for installation. The light passes through the support tube 108 and then exits, or a light guiding channel 127 is installed on the installation housing 124, and the light is emitted through the refraction of the first reflector 129 and the second reflector 128 (at this time, the collimating lens 111 is installed in a direction away from the support tube 108). At this time, the light shielding housing 130 set in the distance is aligned with the light emitted from the support tube 108 or the light guiding channel 127, so that the light passes through the light sensor 133 (in order to reduce the influence of other light sources and increase the intensity of the light emitted by the semiconductor laser 110). At this time, interference fringes are formed after the light passes through the light sensor 133, and the interference fringes will be projected onto the double slit hole 132. By the light received by the pixel points at the corresponding positions on the double slit hole 132, the distance between adjacent bright fringes or dark fringes can be known. Since the double slit spacing of the light sensor 133 is known and the distance from the light shielding plate 131 to the double slit hole 132 is also known, the wavelength of the light can be obtained at this time, and then the temperature of the air can be obtained.

Claims

1. A high temperature gas temperature measuring device, characterized in that: The invention comprises a mounting shell (124), wherein a rotating chamber (101) is rotatably mounted in the mounting shell (124) via a rotating chamber bracket (121), a plurality of rotating paddles (102) arranged in a circular equidistant array are fixed on the circumferential surface of the inner wall of the rotating chamber (101), a plurality of flow holes (105) are also provided on the rotating chamber (101), a shielding plate (103) for shielding the flow holes (105) is also rotatably provided on the rotating chamber (101), and a shielding plate (103) is provided on the shielding plate (103) which is parallel to the flow holes. (105) air vents (104) of the same number and shape, a baffle ring plate (119) is fixed to one end of the rotating chamber (101) away from the baffle plate (103) in a manner that is easy to disassemble, a heated shell (109) is provided at the axis of the rotating chamber (101), a semiconductor laser (110) is fixedly provided inside the heated shell (109), and a collimating lens (111) is also fixed inside the heated shell (109) for collimating light emitted by the semiconductor laser (110).

2. A high temperature gas temperature measuring device according to claim 1, characterized in that: The heated shell (109) is fixed on the support tube (108); an avoidance through hole (106) is provided at the intersection of the rotating chamber (101) and the support tube (108); a sealing sheet (107) is provided as a sliding seal at the avoidance through hole (106); the sealing sheet (107) is fixed on the support tube (108); a support ring frame (112) is fixed at a coaxial position of the avoidance through hole (106); and a symmetrically arranged movable rack bracket (116) is fixed on the support ring frame (112).

3. A high temperature gas temperature measuring device according to claim 2, characterized in that: A gear ring (113) is rotatably mounted on the support ring frame (112), and two movable racks (115) are slidably mounted on the two movable rack brackets (116) respectively, which are symmetrical about the origin of the support ring frame (112), and a counterweight (114) is fixed to one end of the movable rack (115). Two extension arms (117) are also fixedly mounted on the two movable rack brackets (116) respectively, which are symmetrical about the origin of the support ring frame (112), and a tension spring (118) is fixed between the extension arm (117) and the other end of the movable rack (115), and the two movable racks (115) are meshed with the gear ring (113) for transmission, wherein the gear ring (113) is fixedly matched with the shielding plate (103).

4. A high temperature gas temperature measuring device according to claim 3, characterized in that: A mounting base (125) is also fixedly mounted on the mounting housing (124), and a threaded boss is provided on the mounting base (125). A mounting tube (126) is threadedly fixedly sleeved on the threaded boss.

5. A high temperature gas temperature measuring device according to claim 4, characterized in that: A driving motor (123) is fixedly mounted on the rotating chamber bracket (121), and an output shaft of the driving motor (123) is drivingly connected to the circumferential surface of the rotating chamber (101) via a driving belt (122).

6. A high temperature gas temperature measuring device according to claim 5, characterized in that: A light-guiding optical fiber (120) is fixedly mounted on the rotating chamber bracket (121); one end of the light-guiding optical fiber (120) is connected to the heated shell (109); the other end of the light-guiding optical fiber (120) is connected to an optical wavelength tester, and is used to guide light emitted by the semiconductor laser (110) to the optical wavelength tester.

7. A high temperature gas temperature measuring device according to claim 6, characterized in that: A light guiding channel (127) can also be fixed on the mounting housing (124), and a black matte coating is provided on the inner and outer surfaces of the light guiding channel (127). A second reflector (128) and a first reflector (129) are fixedly installed in the light guiding channel (127), wherein the first reflector (129) and the second reflector (128) are vertically arranged, and the first reflector (129) is used to vertically reflect the light emitted by the semiconductor laser (110) onto the second reflector (128), and the second reflector (128) is used to vertically reflect the light reflected by the first reflector (129) out of the light guiding channel (127).

8. A high temperature gas temperature measuring device according to claim 7, characterized in that: A light shielding shell (130) is arranged on the path of light reflected by the second reflector (128), a light shielding plate (131) is fixed on the inner wall of the light shielding shell (130), two light sensors (133) are provided on the light shielding plate (131), and double slit holes (132) are also fixedly arranged inside the light shielding shell (130) for observing and recording light stripes passing through the light sensors (133).

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