Integrated circuit test method and device, computer equipment and storage medium

Abstract

The invention relates to the technical field of electronic technology testing. The invention relates to an integrated circuit test method and device, computer equipment and a storage medium, and the method comprises the steps: obtaining integrated circuit test information, matching a test configuration file according to the integrated circuit test information, obtaining a preset test signal according to the test configuration file, and inputting the preset test signal to a to-be-tested integrated circuit. And collecting the output signal to obtain an integrated circuit analysis result, comparing the integrated circuit analysis result with a preset analysis result, and generating a test report. The method has the effect of realizing the accuracy and the efficiency of integrated circuit testing.

Description

Technical Field

[0001] The present invention relates to the technical field of electronic technology testing, and in particular to an integrated circuit testing method, device, computer equipment and storage medium. Background Art

[0002] With the rapid development of electronic technology, integrated circuits have been widely used in various electronic devices. To ensure the performance and stability of integrated circuits, accurate testing is essential. At present, although there are a variety of integrated circuit testing technologies, these technologies still have shortcomings in test signal generation, signal acquisition and analysis, such as low test accuracy and low test efficiency.

[0003] Existing integrated circuit testing methods usually rely on fixed test signals and parameter settings, and cannot be flexibly adjusted according to the characteristics and requirements of different integrated circuits. This leads to limitations and inaccuracies in test results.

[0004] Therefore, how to provide a test method that can flexibly generate test signals according to the characteristics of different integrated circuits, efficiently collect and analyze output signals, and accurately evaluate the performance of integrated circuits has become an urgent problem to be solved in the current field of electronic technology. Summary of the invention

[0005] In order to achieve accuracy and efficiency in integrated circuit testing, the present application provides an integrated circuit testing method, apparatus, computer equipment, and storage medium.

[0006] The above-mentioned invention objective of the present application is achieved through the following technical solutions: An integrated circuit testing method, the integrated circuit testing method comprising: Acquire integrated circuit test information, and match a test configuration file according to the integrated circuit test information; According to the test configuration file, a preset test signal is obtained; The preset test signal is input to the integrated circuit to be tested, the output signal is collected, and the integrated circuit analysis result is obtained; the integrated circuit analysis result is compared with the preset analysis result to generate a test report.

[0007] By adopting the above technical solution, by automatically acquiring the test information of the integrated circuit and matching the corresponding test configuration file, it is ensured that each test follows standardized steps and parameter settings. This can reduce errors caused by human operation and improve the consistency and repeatability of test results. The test configuration file provides customized test signals according to different models, test modes and test conditions. This ensures that the test signal is highly matched with the actual working environment and conditions of the integrated circuit to be tested, improving the accuracy and relevance of the test. Real-time acquisition and analysis of output signals can quickly discover and locate problems. Through the real-time feedback mechanism, dynamic adjustments can be made during the test process to improve the effectiveness and response speed of the test. By comparing the actual test results with the preset standards, the performance and quality of the integrated circuit can be comprehensively evaluated. The generated test report provides detailed analysis data and diagnostic information to support subsequent decision-making and improvement measures.

[0008] In a preferred example, the present application may be further configured as follows: the step of obtaining the integrated circuit test information and matching the test configuration file according to the integrated circuit test information includes: Based on the information of the integrated circuit to be tested, obtaining test parameters, wherein the test parameters include the model, test mode and test conditions of the integrated circuit to be tested; A preset test configuration file database is queried according to the test parameters, and a matching test configuration file is selected.

[0009] By adopting the above technical solution, the appropriate test configuration file is selected according to the specific integrated circuit model, test mode and test conditions to ensure the accurate matching of test parameters. The test deviation caused by incorrect parameter setting is reduced and the accuracy of the test is improved. The preset test configuration file database is strictly verified and standardized to ensure that each configuration file can accurately reflect the requirements under different test conditions. This can reduce errors and inconsistencies in the configuration file and further improve the reliability of the test.

[0010] In a preferred example, the present application may be further configured as follows: the integrated circuit testing method further includes: The test state and signal changes of the integrated circuit are monitored in real time to obtain monitoring results, and the test parameters are adjusted according to the monitoring results.

[0011] By adopting the above technical solutions, any deviations can be quickly discovered and corrected through real-time monitoring to ensure the accuracy of test signals and results. Real-time adjustment of test parameters reduces the need for manual intervention, shortens the test cycle, and improves test efficiency. Real-time feedback of monitoring results enables the system to dynamically adjust test parameters to cope with any uncertainties or changes during the test process, ensuring the stability and continuity of the test process.

[0012] In a preferred example, the present application may be further configured as follows: the step of querying a preset test configuration file database according to the test parameters and selecting the matching test configuration file further includes: In the preset test configuration file database, performing a multi-dimensional index search based on the test parameters to obtain a test search result; The test search results are sorted by a machine learning algorithm, and a test configuration file having the highest matching degree with the test parameters is selected.

[0013] By adopting the above technical solution, multi-dimensional index search combined with machine learning algorithm can more accurately match test parameters and ensure that the selected test profile is most suitable for the integrated circuit to be tested.

[0014] In a preferred example, the present application may be further configured as follows: obtaining a preset test signal according to the test configuration file includes: According to the signal parameters in the test configuration file, the signal parameters include signal type, frequency, amplitude and waveform characteristics; based on the signal parameters, the preset test signal is obtained through a signal generation algorithm.

[0015] By adopting the above technical solutions, the signal type, frequency, amplitude and waveform characteristics are precisely defined to ensure that the generated test signal strictly complies with the preset test standards, reduce errors and deviations, and improve the accuracy of the test. The automated test signal generation process reduces the time for manual setting and adjustment of signal parameters, improves the efficiency of test preparation and execution, and shortens the test cycle.

[0016] In a preferred example, the present application can be further configured as follows: the step of inputting the preset test signal to the integrated circuit to be tested, collecting the output signal, and obtaining the integrated circuit analysis result includes: Inputting the preset test signal into the integrated circuit to be tested, and collecting the output signal of the integrated circuit to be tested in real time; Perform error detection on the output signal, compare the difference between the output signal and the expected signal, and obtain an error value; analyze the response time of the output signal, and evaluate the reaction speed of the integrated circuit to be tested when the input signal changes; evaluate the stability of the output signal, and check whether the output signal fluctuates within the expected range; Measuring the voltage and current values ​​of the output signal to ensure that they are within a safe and expected operating range; The error value, the response time of the output signal, the stability of the output signal, and the voltage and current values ​​of the output signal are processed comprehensively to obtain the integrated circuit analysis result.

[0017] By adopting the above technical solutions, the performance deviation of the integrated circuit can be accurately identified by comparing the difference between the output signal and the expected signal, ensuring the accuracy of the test results. Evaluating the reaction speed of the integrated circuit when the input signal changes helps to identify the problem of slow response and ensure the performance of the integrated circuit in practical applications. Check the fluctuation of the output signal to ensure that the signal is stable within the expected range to prevent the integrated circuit from becoming unstable during operation. Ensure that the voltage and current values ​​of the output signal are within the safe and expected working range to prevent overload or other electrical problems and ensure the reliability and safety of the integrated circuit. Through real-time acquisition and comprehensive processing of multiple performance indicators (error value, response time, stability, voltage and current), comprehensive analysis results of the integrated circuit can be quickly obtained, improving test efficiency.

[0018] In a preferred example, the present application may be further configured as follows: comparing the integrated circuit analysis result with a preset analysis result to generate a test report includes: Comparing the integrated circuit analysis result with the preset analysis result to obtain an error detection result; Based on the error detection result, evaluate whether the performance of the integrated circuit to be tested meets expectations and obtain an evaluation result; based on the evaluation result, generate the test report, and the test report includes the integrated circuit performance index, the integrated circuit error rate and the integrated circuit fault location.

[0019] By adopting the above technical solution, by comparing the actual analysis results of the integrated circuit with the preset standard results, the performance deviation can be accurately identified to ensure the accuracy of the test results. According to the error detection results, the performance of the integrated circuit is evaluated to see whether it meets expectations, ensuring that the test results can truly reflect the actual performance of the integrated circuit. The test report includes the performance indicators, error rate and fault location of the integrated circuit, providing a comprehensive performance evaluation and ensuring the detailed and comprehensive test results. Through accurate fault location analysis, problems can be quickly located, troubleshooting time can be reduced, and maintenance efficiency can be improved.

[0020] The second object of the invention is achieved by the following technical solutions: An integrated circuit testing device, the integrated circuit testing device comprising: An information acquisition module, used to acquire integrated circuit test information and match a test configuration file according to the integrated circuit test information; a signal generation module, used to obtain a preset test signal according to the test configuration file; A signal detection module, used to input the preset test signal into the integrated circuit to be tested, collect the output signal, and obtain the integrated circuit analysis result; The signal comparison module is used to compare the integrated circuit analysis result with the preset analysis result and generate a test report.

[0021] By adopting the above technical solution, by automatically acquiring the test information of the integrated circuit and matching the corresponding test configuration file, it is ensured that each test follows standardized steps and parameter settings. This can reduce errors caused by human operation and improve the consistency and repeatability of test results. The test configuration file provides customized test signals according to different models, test modes and test conditions. This ensures that the test signal is highly matched with the actual working environment and conditions of the integrated circuit to be tested, improving the accuracy and relevance of the test. Real-time acquisition and analysis of output signals can quickly discover and locate problems. Through the real-time feedback mechanism, dynamic adjustments can be made during the test process to improve the effectiveness and response speed of the test. By comparing the actual test results with the preset standards, the performance and quality of the integrated circuit can be comprehensively evaluated. The generated test report provides detailed analysis data and diagnostic information to support subsequent decision-making and improvement measures.

[0022] The third objective of the present application is achieved through the following technical solutions: A computer device comprises a memory, a processor and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the above-mentioned integrated circuit testing method when executing the computer program.

[0023] The fourth objective of the present application is achieved through the following technical solutions: A computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the integrated circuit testing method are implemented.

[0024] In summary, the present application includes at least one of the following beneficial technical effects: 1. By automatically acquiring the test information of the integrated circuit and matching the corresponding test configuration files, ensure that each test follows standardized steps and parameter settings. This can reduce errors caused by human operation and improve the consistency and repeatability of test results. The test configuration files provide customized test signals according to different models, test modes and test conditions. This ensures that the test signals are highly matched with the actual working environment and conditions of the integrated circuit to be tested, improving the accuracy and relevance of the test. Real-time acquisition and analysis of output signals can quickly discover and locate problems. Through the real-time feedback mechanism, dynamic adjustments can be made during the test process to improve the effectiveness and response speed of the test. By comparing the actual test results with the preset standards, the performance and quality of the integrated circuit can be comprehensively evaluated. The generated test report provides detailed analysis data and diagnostic information to support subsequent decision-making and improvement measures; 2. By comparing the difference between the output signal and the expected signal, the performance deviation of the integrated circuit can be accurately identified to ensure the accuracy of the test results. Evaluating the response speed of the integrated circuit when the input signal changes can help identify the problem of slow response and ensure the performance of the integrated circuit in actual applications. Check the fluctuation of the output signal to ensure that the signal is stable within the expected range to prevent the integrated circuit from becoming unstable during operation. Ensure that the voltage and current values ​​of the output signal are within the safe and expected operating range to prevent overload or other electrical problems and ensure the reliability and safety of the integrated circuit. Through real-time acquisition and comprehensive processing of multiple performance indicators (error value, response time, stability, voltage and current), comprehensive analysis results of the integrated circuit can be quickly obtained, which improves test efficiency; 3. By comparing the actual analysis results of the integrated circuit with the preset standard results, the performance deviation can be accurately identified to ensure the accuracy of the test results. According to the error detection results, the performance of the integrated circuit is evaluated to see if it meets expectations, ensuring that the test results can truly reflect the actual performance of the integrated circuit. The test report includes the performance indicators, error rate and fault location of the integrated circuit, providing a comprehensive performance evaluation to ensure the detailed and comprehensive test results. Through accurate fault location analysis, problems can be quickly located, troubleshooting time can be reduced, and maintenance efficiency can be improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 is a flow chart of an integrated circuit testing method in one embodiment of the present application; Figure 2 This is a flowchart of the implementation of step S10 of the integrated circuit testing method in one embodiment of the present application; Figure 3 This is a flowchart of the implementation of the integrated circuit testing method after step S11 in one embodiment of the present application; Figure 4 is a flowchart for implementing step S12 of the integrated circuit testing method in one embodiment of the present application; Figure 5 is a flowchart for implementing step S20 of the integrated circuit testing method in one embodiment of the present application; Figure 6 is a flowchart for implementing step S30 of the integrated circuit testing method in one embodiment of the present application; Figure 7 is a flowchart for implementing step S40 of the integrated circuit testing method in one embodiment of the present application; Figure 8 is a principle block diagram of an integrated circuit testing method in an embodiment of the present application; Fig. 9 It is a schematic diagram of a device in an embodiment of the present application. DETAILED DESCRIPTION

[0026] The present application is further described in detail below in conjunction with the accompanying drawings.

[0027] In one embodiment, if Figure 1 As shown, the present application discloses an integrated circuit testing method, which specifically includes the following steps: S10: Acquire the integrated circuit to be tested information, and load the test configuration file according to the integrated circuit to be tested information.

[0028] In this embodiment, the integrated circuit test information refers to data related to the integrated circuit to be tested, including but not limited to the model, design documents, expected performance parameters, environmental conditions and test requirements of the integrated circuit. The test configuration file refers to a file used to guide the integrated circuit test process, including the signal parameters, test mode, test conditions and preset standards required for the test.

[0029] Specifically, the test information of the integrated circuit is obtained from the user input or the system database. Including but not limited to: integrated circuit model, test mode (such as functional test, performance test, environmental test, etc.), test conditions (such as temperature, humidity, working voltage, etc.), establish a test profile database, including preset test profiles under different models and test modes. Use a multidimensional index search algorithm to find a test profile that matches the test information in the database. Load the matching test profile into the test system.

[0030] S20: Obtain a preset test signal according to the loaded test configuration file.

[0031] In this embodiment, the preset test signal refers to a standardized test signal generated according to parameters (such as signal type, frequency, amplitude and waveform characteristics) defined in a test configuration file, and is used to test the performance of an integrated circuit.

[0032] Specifically, the test configuration file is parsed, and the parameters required for signal generation are extracted from the loaded test configuration file. The parameters include: Signal type: clock signal, data signal, control signal, etc. Frequency: the operating frequency of the signal, such as 1MHz, 10MHz, etc. Amplitude, the voltage amplitude of the signal, such as 3.3V, 5V, etc. Waveform characteristics, the shape of the signal, such as sine wave, square wave, triangle wave, etc. Phase: the phase information of the signal, suitable for multi-signal synchronous testing. According to the signal type and characteristics in the test configuration file, select the signal generator. For example, use an arbitrary waveform generator (AWG) or a function generator (FG). Configure the signal generator: Set the frequency and input the frequency parameters of the signal. Set the amplitude and input the amplitude parameters of the signal. Select the waveform and select to generate a sine wave, square wave or other waveform according to the waveform characteristics. Set the phase and configure the phase parameters of the signal. Generate the preset test signal: Sine wave generation, use the sine wave function to generate a sine signal with the corresponding frequency and amplitude. Square wave generation, use the square wave function to generate a square wave signal with the corresponding frequency and amplitude. Triangle wave generation: Use the triangle wave function to generate a triangle wave signal with the corresponding frequency and amplitude. Output analog signal: Use the digital-to-analog converter (DAC) to convert the generated digital signal into an analog signal for output.

[0033] S30: Inputting a preset test signal to the integrated circuit to be tested, collecting the output signal, and obtaining the integrated circuit analysis result.

[0034] In this embodiment, the integrated circuit analysis result refers to comprehensive data obtained through error detection and performance evaluation, including error value, response time, stability, voltage and current, etc.

[0035] Specifically, a preset test signal is generated according to the test configuration file, and the output of the signal generator is connected to the input of the integrated circuit to be tested. The electrical parameters of the test environment are configured to meet the working conditions of the integrated circuit to be tested. A preset test signal is generated and input using a signal generator to ensure that the signal characteristics meet the description in the test configuration file. An oscilloscope or other signal acquisition device is used to monitor and record the output signal of the integrated circuit. At the same time, the sampling rate, time base and trigger conditions of the oscilloscope are set, and the waveform, amplitude and frequency of the output signal are continuously recorded. The collected output signal is sent to the data processing and analysis system. The error value is calculated by comparing the output signal with the standard reference signal. The response time, stability, voltage and current characteristics of the output signal are analyzed. The error detection and performance evaluation results are processed comprehensively to obtain the final integrated circuit analysis results.

[0036] S40: Compare the integrated circuit analysis result with the preset analysis result and generate a test report.

[0037] In this embodiment, the preset analysis result refers to the pre-set standard analysis data for comparison. The test report refers to the report generated after the integrated circuit analysis result is compared with the preset analysis result, including the performance index, error rate and fault location of the integrated circuit.

[0038] Specifically, the preset analysis results are extracted from the test configuration file, and the preset analysis results include the characteristic parameters of the standard reference signal, the allowable error range and performance indicators. The actual analysis results of the integrated circuit are compared in detail with the preset analysis results, and the actual error value of the output signal is compared with the preset error range to check whether the deviation is within the allowable range. The response time, stability, voltage and current characteristics of the actual output signal are compared with the preset standard to evaluate whether the actual performance of the integrated circuit meets expectations. A detailed test report is generated based on the comparison results, and the test report includes a test overview, test parameters, error detection results, performance evaluation results, and conclusions and recommendations.

[0039] In one embodiment, if Figure 2 As shown, in step S10, the integrated circuit test information is obtained, and the test configuration file is matched according to the integrated circuit test information, including: S11: Based on the information of the integrated circuit to be tested, test parameters are obtained, where the test parameters include the model of the integrated circuit to be tested, the test mode and the test conditions.

[0040] In this embodiment, the model of the integrated circuit to be tested refers to the type or number of the integrated circuit. The test mode refers to the specific strategy or method used in the test process. For example, functional testing (verifying basic functions), performance testing (measuring performance indicators), fault testing (detecting faults and defects), etc. Test conditions refer to the specific environment and operating parameters during the test, such as test temperature, power supply voltage, signal frequency, etc.

[0041] Specifically, the model is read from the identification of the IC to be tested, and the test mode is selected according to the test target. For example, the function test, performance test or fault test is determined by the system default setting or user selection. The test conditions are determined according to the working environment and specifications of the IC to be tested. For example, the recommended operating conditions in the data sheet or the specific conditions specified by the user are read.

[0042] S12: Query a preset test configuration file database according to the test parameters, and select a matching test configuration file.

[0043] In this embodiment, the preset test configuration file database refers to a database storing various test configuration files, each of which contains detailed test steps and parameters corresponding to a specific model, test mode and test condition.

[0044] Specifically, connect to a preset test profile database. Structure the test parameters (including the model, test mode and test conditions of the integrated circuit to be tested) into query conditions. Perform a query in the test profile database to find a test profile that matches the test parameters. The query conditions should include the model, test mode and test conditions to ensure that the best matching test profile is found.

[0045] In one embodiment, if Figure 3 As shown, after step S11, the integrated circuit testing method further includes: S111: monitor the test status and signal changes of the integrated circuit in real time, obtain monitoring results, and adjust test parameters according to the monitoring results.

[0046] In this embodiment, the monitoring result refers to a comprehensive report of signal analysis data, detected anomalies and fault information.

[0047] Specifically, connect the oscilloscope probe and the logic analyzer probe to the test point of the integrated circuit to be tested. Set the data acquisition frequency, such as 1MHz, to ensure high-precision signal acquisition. The oscilloscope and logic analyzer collect input and output signals in real time and transmit the data to the monitoring software. The monitoring software stores and processes the signal data collected in real time. Use signal processing algorithms to analyze the waveform, frequency, amplitude and other parameters of the signal. Compare the real-time signal with the reference signal to detect signal deviations and anomalies. Detect anomalies in the signal through threshold detection. When anomalies are detected, mark the fault location and type. Generate a monitoring report with the analysis results, which contains information such as signal waveform, anomaly detection results, and fault location. Parse the monitoring report to extract abnormal signals and fault information. Determine the test parameters that need to be adjusted, such as frequency, amplitude, etc. Adjust the test parameters based on the monitoring results and update the test configuration file.

[0048] In one embodiment, if Figure 4 As shown, in step S12, that is, querying a preset test configuration file database according to the test parameters and selecting a matching test configuration file, it also includes: S121: In a preset test configuration file database, a multi-dimensional index search is performed based on the test parameters to obtain test search results.

[0049] In this embodiment, multidimensional index search refers to the use of multiple parameters (dimensions) to search simultaneously, which can more efficiently locate eligible data items. Each dimension corresponds to an index, and the index is used to quickly retrieve data that matches the conditions. The test search results refer to the test configuration files that match the input test parameters obtained through the multidimensional index search, and the test configuration files contain test steps and parameters for specific models, test modes, and test conditions.

[0050] Specifically, the database contains multiple test configuration files, each of which contains the following information: model, test mode, test conditions, test steps and parameters, and a multidimensional index is established. An index is established for each dimension for fast retrieval. For example: Model index: index by model. Test mode index: index by test mode. Test condition index: index by test condition. The input test parameters include model, test mode and test condition. For example: model = A, test mode = 1, test condition = 2. A composite query condition is generated based on the input parameters, for example: model = AAND, test mode = 1AND, test condition = 2. Using the multidimensional index mechanism of the database, matching records are retrieved in the model index, test mode index and test condition index respectively. The matching records are merged to obtain a configuration file that meets all conditions.

[0051] S122: Sort the test search results by a machine learning algorithm, and select a test configuration file with the highest matching degree with the test parameters.

[0052] In this embodiment, the machine learning algorithm refers to a random forest algorithm.

[0053] Specifically, collect historical data, which includes the results of past tests and corresponding configuration files. Extract features from each test configuration file, such as model, test mode, test conditions, test results, etc. Score or classify the configuration files based on the historical test results. Use 80% of the historical data to train the random forest algorithm model. Use 20% of the historical data to verify the accuracy of the model. The random forest algorithm model inputs features: model, test mode, test conditions, historical matching degree, etc. The random forest algorithm model outputs features: matching degree score. Obtain a trained random forest algorithm model. Input the current test parameters into the trained random forest algorithm model. The trained random forest algorithm model calculates the matching degree score of each configuration file based on the input test parameters. Sort the test configuration files according to the calculated matching degree scores. Select the test configuration file with the highest matching degree from the sorting results.

[0054] In one embodiment, if Figure 5 As shown, in step S20, a preset test signal is obtained according to the test configuration file, including: S21: According to the signal parameters in the test configuration file, the signal parameters include signal type, frequency, amplitude, and waveform characteristics.

[0055] Specifically, the signal parameters are read from the test configuration file, including signal type, frequency, amplitude, and waveform characteristics. The signal type indicates the basic form of the signal, such as sine wave, square wave, triangle wave, pulse signal, etc. The frequency indicates the frequency of the signal, such as 1kHz, 10MHz, etc. The amplitude indicates the amplitude of the signal, such as 1V, 5V, etc. The waveform characteristics include the phase, duty cycle, rise / fall time, etc. of the signal.

[0056] S22: Based on the signal parameters, a preset test signal is obtained through a signal generation algorithm.

[0057] In this embodiment, the signal generation algorithm refers to a mathematical and computational method used to generate a test signal based on given signal parameters (such as signal type, frequency, amplitude, and waveform characteristics). A sine wave generation algorithm is used to generate a sine wave signal. A square wave generation algorithm is used to generate a square wave signal. A triangle wave generation algorithm is used to generate a triangle wave signal. A pulse generation algorithm is used to generate a pulse signal.

[0058] Specifically, signal parameters are read from the configuration file, including signal type, frequency, amplitude, and waveform characteristics. The corresponding signal generation algorithm is selected according to the signal type read. The preset test signal is generated using the selected algorithm and the read parameters. The sine wave generation formula is: V(t) = A·sin(2πft+φ), where A is the amplitude, f is the frequency, and φ is the phase. The square wave generation formula is: V(t) = A·sgn(sin(2πft)), where V(t) is the square wave voltage at time t, A is the amplitude of the square wave, and f is the frequency of the square wave. sgn(x) is a sign function, defined as: The formula for generating a triangle wave is: Where: V(t) is the triangular wave voltage at time t. A is the amplitude of the triangular wave. T is the period of the triangular wave. f is the frequency of the triangle wave. mod represents the modulo operation. The formula for generating the pulse signal is: Where V(t) is the pulse signal voltage at time t. A is the amplitude of the pulse signal. t0 is the start time of the pulse signal. τ is the width (duration) of the pulse signal. rect(x) is the rectangular function, defined as:

[0059] In one embodiment, if Figure 6 As shown, in step S30, a preset test signal is input to the integrated circuit to be tested, and an output signal is collected to obtain an integrated circuit analysis result, including: S31: inputting a preset test signal into the integrated circuit to be tested, and collecting the output signal of the integrated circuit to be tested in real time.

[0060] Specifically, a signal generator is connected to the input terminal of the integrated circuit to be tested. An oscilloscope, logic analyzer or other measuring device is connected to the output terminal of the integrated circuit. A preset test signal is generated according to the test configuration file. The preset test signal includes the input signal type, frequency, amplitude and waveform characteristics. The generated test signal is input to the integrated circuit to be tested. The oscilloscope or logic analyzer is started to collect the output signal of the integrated circuit in real time. The collected output signal data is transmitted to the test system through the interface of the measuring device. S32: Perform error detection on the output signal, compare the difference between the output signal and the expected signal, and obtain an error value.

[0061] In this embodiment, the expected signal refers to a theoretically ideal signal generated according to the test configuration file and preset signal parameters.

[0062] Specifically, the output signal data of the integrated circuit to be tested is collected and recorded in real time. According to the preset signal parameters (such as signal type, frequency, amplitude, waveform characteristics), the expected signal is generated. Ensure that the expected signal is synchronized with the actual output signal on the time axis. Align the output signal and the expected signal on the time axis. Align through the rising edge, falling edge or specific feature points of the signal. Calculate the error value between the output signal and the expected signal. Common error calculation methods include absolute error, relative error and mean square error.

[0063] Absolute error: Absolute error = S out (t)-S expected (t).

[0064] Relative error:

[0065] Mean Square Error: According to the calculated error value, the difference between the output signal and the expected signal is analyzed to obtain the error value.

[0066] S33: Analyze the response time of the output signal to evaluate the reaction speed of the integrated circuit to be tested when the input signal changes.

[0067] Specifically, set the trigger mode of the oscilloscope to detect the rising or falling edge of the input signal. Connect the input signal to the input channel of the oscilloscope. When the input signal changes (such as from a low level to a high level), the oscilloscope captures and records the moment of this change. Connect the output signal of the integrated circuit to be tested to another channel of the oscilloscope. The oscilloscope monitors the changes of the input signal and the output signal at the same time, and records the moment when the output signal changes accordingly. Read the moment when the input signal changes (T in ) and the time when the output signal changes (Tout).

[0068] Calculate the response time: Response time = T OUT -T in .

[0069] S34: Evaluate the stability of the output signal and check whether the output signal fluctuates within the expected range.

[0070] Specifically, connect the output signal to the input channel of the oscilloscope. Set the time base and voltage range of the oscilloscope to ensure that the complete output signal waveform can be captured. Continuously monitor the output signal and record the changes in the signal. Determine the expected voltage range of the output signal based on the design requirements or standards. For example, the output signal should be within the range of 3.3V±5%. Determine the allowable fluctuation range. For example, the fluctuation of the output signal should not exceed ±0.1V. Use the measurement function of the oscilloscope or data analysis software to analyze the fluctuation of the output signal. Compare the actual voltage value of the output signal with the expected range to check whether it exceeds the expected range.

[0071] S35: Measure the voltage and current values ​​of the output signal to ensure that they are within the safe and expected operating range.

[0072] Specifically, connect the probe of the oscilloscope to the output terminal of the integrated circuit. Use a current probe to measure the current value of the output signal. Connect the current probe to the input channel of the oscilloscope and pass it through the output current path of the integrated circuit. Set the voltage range of the oscilloscope (e.g., 0V to 5V) and the time base (e.g., 1ms / div) to ensure that the complete output signal waveform can be captured. Select an appropriate probe attenuation ratio (e.g., 10x or 1x) and adjust it according to the measured voltage range. Select an appropriate current range (e.g., 0A to 10A). Start the oscilloscope and monitor the voltage waveform of the output signal in real time. Record the changes in the voltage waveform, paying special attention to the peak voltage and the lowest voltage. Use the current probe to monitor the current value of the output signal in real time. Record the changes in the current waveform, paying special attention to the peak current and the lowest current. Compare the measured voltage value with the expected voltage range. For example, if the expected voltage range is 3.3V±5% (i.e., 3.135V to 3.465V), ensure that the measured voltage value is within this range. Compare the measured current value with the expected current range. For example, if the expected current range is 0A to 100mA, make sure the measured current value is within this range.

[0073] S36: Comprehensively process the error value, the response time of the output signal, the stability of the output signal, and the voltage and current values ​​of the output signal to obtain an integrated circuit analysis result.

[0074] Specifically, compare the preset test signal with the actual output signal and calculate the error value. The error value can be expressed as an absolute error or a relative error. Record the time required for the signal to stabilize from input change to output stability. The response time can be observed and recorded by an oscilloscope. Evaluate the fluctuation range of the output signal. Stability can be expressed by calculating the standard deviation or variance. Measure and record the voltage and current values ​​of the output signal to ensure that they are within the expected range. Standardize different data to make them have the same dimension and comparability. Minimum-maximum normalization formula: Where X is the original data value. X′ is the standardized data value. Xmin is the minimum value in the original data set. Xmax is the maximum value in the original data set. Different weights are assigned according to the test requirements and the importance of each data. For example: error value weight: 30%, response time weight: 25%, stability weight: 20%, voltage and current value weight: 25%. Comprehensive performance index = 0.3×standardized error value + 0.25×standardized response time + 0.2×standardized stability + 0.25×standardized voltage and current value. Comprehensive performance index = 0.3×standardized error value + 0.25×standardized response time + 0.2×standardized stability + 0.25×standardized voltage and current value. The standardized data are weighted and summed according to the weight to obtain the integrated circuit analysis result. The integrated circuit analysis result is used to evaluate the performance of the integrated circuit as a whole.

[0075] In one embodiment, if Figure 7 As shown, in step S40, the integrated circuit analysis result is compared with the preset analysis result to generate a test report, including: S41: Compare the integrated circuit analysis result with the preset analysis result to obtain an error detection result.

[0076] Specifically, the output signal collected from the integrated circuit to be tested includes parameters such as voltage, current, response time, stability, etc. The expected output signal set according to the standard or design specification before the test includes parameters such as voltage, current, response time, stability, etc. Each parameter is compared separately, such as voltage, current, response time, etc. To calculate the error between the actual value and the expected value, the following formula can be used: Error = Actual Value - Expected Value to generate the error detection result: S42: Based on the error detection result, evaluating whether the performance of the integrated circuit to be tested meets expectations, and obtaining an evaluation result.

[0077] Specifically, the error values, actual values, and expected values ​​of all detection parameters are collected. The expected performance standards are defined, including the allowable error range of each parameter and the overall performance standards. The error value of each parameter is compared with its corresponding expected value. The set performance standards are used to determine whether each parameter is within the allowable error range. The error detection results of all parameters are comprehensively evaluated. The overall performance score is calculated using the weighted average method. According to the overall performance score, it is judged whether the overall performance of the integrated circuit meets expectations. For example, parameter 1: actual value = 3.3V, expected value = 3.3V. Parameter 2: actual value = 20mA, expected value = 19.5mA. Parameter 3: actual value = 5ns, expected value = 5ns. Set performance standards: voltage allowable error range: ±0.1V, current allowable error range: ±1mA, response time allowable error range: ±0.5ns. Voltage error value = 3.3V-3.3V = 0V. Current error value = 20mA-19.5mA = 0.5mA. Response time error value = 5ns-5ns = 0ns. Voltage: 0V≤±0.1V, in line with expectations, current: 0.5mA≤±1mA, in line with expectations, response time: 0ns≤±0.5ns, in line with expectations. Assign weights: voltage 40%, current 30%, response time 30%. Calculate the comprehensive score: 100%*0.4+100%*0.3+100%*0.3=100%. The comprehensive performance score is 100%, and the conclusion is that the performance of the integrated circuit meets expectations.

[0078] S43: Generate a test report based on the evaluation results, the test report including integrated circuit performance indicators, integrated circuit error rate and integrated circuit fault location.

[0079] Specifically, collect all evaluation results, including the performance indicators of each key parameter, error rate, and any fault locations detected. Organize the collected evaluation data according to the requirements of the test report to ensure the integrity and accuracy of the data. List all performance indicators based on the actual measured values ​​of each key parameter in the evaluation results. For example, voltage, current, response time, etc. Calculate the error rate using the formula: Based on any parameters detected in the evaluation results that do not meet expectations, possible fault locations are marked. The fault location is located through circuit design diagrams, signal paths, etc. For example, voltage: actual value = 3.3V, expected value = 3.3V. Current: actual value = 20mA, expected value = 19.5mA. Response time: actual value = 5ns, expected value = 5ns. Calculate and list the error rates: voltage error rate 0%, current error rate 2.56%, response time error rate 0%. Based on the high current error rate, check whether there are problems with the components and connections in the current path, and mark the fault location.

[0080] It should be understood that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0081] In one embodiment, an integrated circuit testing device is provided, and the integrated circuit testing device corresponds one-to-one to the integrated circuit testing method in the above embodiment. Figure 8 As shown, the integrated circuit testing device includes an information acquisition module, a signal acquisition module, a signal detection module and a signal comparison module. The detailed description of each functional module is as follows: An information acquisition module, used to acquire integrated circuit test information and match a test configuration file according to the integrated circuit test information; A signal generation module, used to obtain a preset test signal according to a test configuration file; The signal detection module is used to input a preset test signal into the integrated circuit to be tested, collect the output signal, and obtain the integrated circuit analysis result; The signal comparison module is used to compare the integrated circuit analysis results with the preset analysis results and generate a test report.

[0082] Optionally, the information acquisition module includes: A test parameter submodule, used to obtain test parameters based on the integrated circuit to be tested information, the test parameters including the model, test mode and test conditions of the integrated circuit to be tested; The configuration file matching submodule is used to query the preset test configuration file database according to the test parameters and select the matching test configuration file.

[0083] Optionally, the test parameter submodule also includes: The real-time adjustment submodule is used to monitor the test status and signal changes of the integrated circuit in real time, obtain the monitoring results, and adjust the test parameters according to the monitoring results.

[0084] Optionally, the configuration file matching submodules include: A search unit, used to perform a multi-dimensional index search based on the test parameters in a preset test configuration file database to obtain a test search result; The result matching unit is used to sort the test search results through a machine learning algorithm and select the test configuration file with the highest matching degree with the test parameters.

[0085] Optionally, the signal generation module includes: A signal parameter submodule is used to test the signal parameters in the configuration file, where the signal parameters include signal type, frequency, amplitude and waveform characteristics; The digital signal generation submodule is used to obtain a preset test signal through a signal generation algorithm based on signal parameters.

[0086] Optionally, the signal detection module includes: A signal input submodule, used to input a preset test signal into the integrated circuit to be tested, and collect the output signal of the integrated circuit to be tested in real time; The error calculation submodule is used to perform error detection on the output signal, compare the difference between the output signal and the expected signal, and obtain the error value; The response time submodule is used to analyze the response time of the output signal and evaluate the reaction speed of the IC to be tested when the input signal changes; The signal fluctuation submodule is used to evaluate the stability of the output signal and check whether the output signal fluctuates within the expected range; The signal measurement submodule is used to measure the voltage and current values ​​of the output signal to ensure that they are within the safe and expected working range; the result processing submodule is used to comprehensively process the error value, the response time of the output signal, the stability of the output signal, the voltage and current values ​​of the output signal to obtain the integrated circuit analysis results.

[0087] Optionally, the signal comparison module includes: The error detection result submodule is used to compare the integrated circuit analysis result with the preset analysis result to obtain the error detection result; An evaluation result submodule is used to evaluate whether the performance of the integrated circuit to be tested meets expectations based on the error detection result, and obtain an evaluation result; The detection report submodule is used to generate a test report based on the evaluation results. The test report includes integrated circuit performance indicators, integrated circuit error rate and integrated circuit fault location.

[0088] The specific definition of the integrated circuit test device can be found in the definition of the integrated circuit test method above, which will not be repeated here. Each module in the above integrated circuit test device can be implemented in whole or in part by software, hardware and a combination thereof. The above modules can be embedded in or independent of the processor in the computer device in the form of hardware, or can be stored in the memory of the computer device in the form of software, so that the processor can call and execute the operations corresponding to the above modules.

[0089] In one embodiment, a computer device is provided. The computer device may be a server, and its internal structure diagram may be as follows: Fig. 9As shown. The computer device includes a processor, a memory, a network interface and a database connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used for a preset test configuration file database. The network interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, an integrated circuit testing method is implemented.

[0090] In one embodiment, a computer device is provided, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the following steps when executing the computer program: Obtaining integrated circuit test information, and matching a test configuration file according to the integrated circuit test information; According to the test configuration file, a preset test signal is obtained; Input a preset test signal to the integrated circuit to be tested, collect the output signal, and obtain the integrated circuit analysis result; Compare the IC analysis results with the preset analysis results and generate a test report.

[0091] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by a processor, the following steps are implemented: Obtaining integrated circuit test information, and matching a test configuration file according to the integrated circuit test information; According to the test configuration file, a preset test signal is obtained; Input a preset test signal to the integrated circuit to be tested, collect the output signal, and obtain the integrated circuit analysis result; Compare the IC analysis results with the preset analysis results and generate a test report.

[0092] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided in the present application can include non-volatile and / or volatile memory. Non-volatile memory can include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory can include random access memory (RAM) or external cache memory. As an illustration and not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).

[0093] Those skilled in the art can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example. In actual applications, the above-mentioned functions can be distributed and completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above.

[0094] The embodiments described above are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, a person skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. An integrated circuit testing method, characterized in that: The integrated circuit testing method comprises: Acquire integrated circuit test information, and match a test configuration file according to the integrated circuit test information; According to the test configuration file, a preset test signal is obtained; Inputting the preset test signal into the integrated circuit to be tested, collecting the output signal, and obtaining the integrated circuit analysis result; The integrated circuit analysis result is compared with the preset analysis result to generate a test report.

2. The integrated circuit testing method according to claim 1, characterized in that: The obtaining of integrated circuit test information and matching of a test configuration file according to the integrated circuit test information includes: Based on the information of the integrated circuit to be tested, obtaining test parameters, wherein the test parameters include the model, test mode and test conditions of the integrated circuit to be tested; A preset test configuration file database is queried according to the test parameters, and a matching test configuration file is selected.

3. The integrated circuit testing method according to claim 2, characterized in that: The integrated circuit testing method further includes: The test state and signal changes of the integrated circuit are monitored in real time to obtain monitoring results, and the test parameters are adjusted according to the monitoring results.

4. The integrated circuit testing method according to claim 2, characterized in that: The step of querying a preset test configuration file database according to the test parameters and selecting a matching test configuration file further includes: In the preset test configuration file database, performing a multi-dimensional index search based on the test parameters to obtain a test search result; The test search results are sorted by a machine learning algorithm, and a test configuration file having the highest matching degree with the test parameters is selected.

5. The integrated circuit testing method according to claim 1, characterized in that: The step of obtaining a preset test signal according to the test configuration file includes: According to the signal parameters in the test configuration file, the signal parameters include signal type, frequency, amplitude and waveform characteristics; Based on the signal parameters, the preset test signal is obtained through a signal generation algorithm.

6. The integrated circuit testing method according to claim 1, characterized in that: The step of inputting the preset test signal to the integrated circuit to be tested, collecting the output signal, and obtaining the integrated circuit analysis result includes: Inputting the preset test signal into the integrated circuit to be tested, and collecting the output signal of the integrated circuit to be tested in real time; Performing error detection on the output signal, comparing the difference between the output signal and the expected signal, and obtaining an error value; Analyzing the response time of the output signal to evaluate the reaction speed of the integrated circuit to be tested when the input signal changes; evaluating the stability of the output signal and checking whether the output signal fluctuates within an expected range; Measuring the voltage and current values ​​of the output signal to ensure that they are within a safe and expected operating range; The error value, the response time of the output signal, the stability of the output signal, and the voltage and current values ​​of the output signal are processed comprehensively to obtain the integrated circuit analysis result.

7. The integrated circuit testing method according to claim 1, characterized in that: The step of comparing the integrated circuit analysis result with a preset analysis result to generate a test report includes: Comparing the integrated circuit analysis result with the preset analysis result to obtain an error detection result; According to the error detection result, evaluating whether the performance of the integrated circuit to be tested meets expectations, and obtaining an evaluation result; The test report is generated according to the evaluation result, and the test report includes the integrated circuit performance index, the integrated circuit error rate and the integrated circuit fault location.

8. An integrated circuit testing device, characterized in that: The integrated circuit testing device comprises: An information acquisition module, used to acquire integrated circuit test information and match a test configuration file according to the integrated circuit test information; A signal generating module, used for obtaining a preset test signal according to the test configuration file; A signal detection module, used to input the preset test signal into the integrated circuit to be tested, collect the output signal, and obtain the integrated circuit analysis result; The signal comparison module is used to compare the integrated circuit analysis result with the preset analysis result and generate a test report.

9. A computer device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of the integrated circuit testing method according to any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the steps of the integrated circuit testing method according to any one of claims 1 to 7 are implemented.

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