Integrated Circuit Testing Method, Device, Computer Equipment, and Storage Medium

Abstract

The present invention relates to the technical field of electronic technology testing. This application relates to an integrated circuit testing method, device, computer device, and storage medium, including obtaining integrated circuit test information, matching a test configuration file according to the integrated circuit test information, obtaining a preset test signal according to the test configuration file, inputting the preset test signal into the integrated circuit to be tested, collecting the output signal to obtain an integrated circuit analysis result, comparing the integrated circuit analysis result with a preset analysis result, and generating a test report. This application has the effect of achieving the accuracy and efficiency of integrated circuit testing.

Description

Technical Field

[0001] The present invention relates to the technical field of electronic technology testing, and in particular, to an integrated circuit testing method, device, computer device, and storage medium. Background Art

[0002] With the rapid development of electronic technology, integrated circuits have been widely used in various electronic devices. To ensure the performance and stability of integrated circuits, accurate testing of them is crucial. Currently, although there are various integrated circuit testing technologies, these technologies still have deficiencies in aspects such as test signal generation, signal acquisition and analysis, such as low test accuracy and low test efficiency.

[0003] Existing integrated circuit testing methods usually rely on fixed test signals and parameter settings, and cannot be flexibly adjusted according to the characteristics and requirements of different integrated circuits. This leads to limitations and inaccuracies in test results.

[0004] Therefore, how to provide a testing method that can flexibly generate test signals according to the characteristics of different integrated circuits, efficiently collect and analyze output signals, and accurately evaluate the performance of integrated circuits has become an urgent problem to be solved in the current field of electronic technology. Summary of the Invention

[0005] To achieve the accuracy and efficiency of integrated circuit testing, the present application provides an integrated circuit testing method, device, computer device, and storage medium.

[0006] The first above-mentioned object of the present application is achieved by the following technical solutions:

[0007] An integrated circuit testing method, the integrated circuit testing method includes:

[0008] Obtain integrated circuit test information, and match a test configuration file according to the integrated circuit test information;

[0009] According to the test configuration file, obtain a preset test signal;

[0010] Input the preset test signal into the integrated circuit to be tested, collect the output signal, and obtain an integrated circuit analysis result; compare the integrated circuit analysis result with a preset analysis result to generate a test report.

[0011] By adopting the above technical solution, by automatically obtaining the test information of the integrated circuit and matching the corresponding test configuration file, it is ensured that each test follows standardized steps and parameter settings. This can reduce the errors caused by human operations and improve the consistency and repeatability of test results. The test configuration file provides customized test signals according to different models, test modes, and test conditions. This can ensure that the test signals highly match the actual working environment and conditions of the integrated circuit to be tested, improving the accuracy and relevance of the test. Real-time collection and analysis of the output signals can quickly detect and locate problems. Through the real-time feedback mechanism, dynamic adjustment can be carried out during the test process, improving the effectiveness and response speed of the test. By comparing the actual test results with the preset standards, the performance and quality of the integrated circuit can be comprehensively evaluated. The generated test report provides detailed analysis data and diagnostic information to support subsequent decision-making and improvement measures.

[0012] In a preferred example, the present application can be further configured as: the obtaining of the integrated circuit test information and the matching of the test configuration file according to the integrated circuit test information include:

[0013] Based on the information of the integrated circuit to be tested, test parameters are obtained, and the test parameters include the model, test mode, and test conditions of the integrated circuit to be tested;

[0014] Query the preset test configuration file database according to the test parameters and select the matching test configuration file.

[0015] By adopting the above technical solution, a suitable test configuration file is selected according to the specific integrated circuit model, test mode, and test conditions to ensure the accurate matching of test parameters. The test deviation caused by incorrect parameter settings is reduced, and the accuracy of the test is improved. The preset test configuration file database has been strictly verified and standardized to ensure that each configuration file in it can accurately reflect the requirements under different test conditions. This can reduce the errors and inconsistencies in the configuration file and further improve the reliability of the test.

[0016] In a preferred example, the present application can be further configured as: the integrated circuit test method further includes:

[0017] Real-time monitor the test status and signal changes of the integrated circuit to obtain a monitoring result, and adjust the test parameters according to the monitoring result.

[0018] By adopting the above technical solution, through real-time monitoring, any deviation can be quickly detected and corrected, ensuring the accuracy of test signals and results. Real-time adjustment of test parameters reduces the need for manual intervention, shortens the test cycle, and improves test efficiency. The real-time feedback of monitoring results enables the system to dynamically adjust test parameters to cope with any uncertainties or changes during the test process, ensuring the stability and continuity of the test process.

[0019] In a preferred example, the present application can be further configured as follows: Querying the preset test configuration file database according to the test parameters and selecting the matching test configuration file further includes:

[0020] Performing a multi-dimensional index search in the preset test configuration file database based on the test parameters to obtain a test search result;

[0021] Sorting the test search results through a machine learning algorithm and selecting the test configuration file with the highest matching degree to the test parameters.

[0022] By adopting the above technical solution, the multi-dimensional index search combined with the machine learning algorithm can more accurately match the test parameters, ensuring that the selected test configuration file is most suitable for the integrated circuit to be tested currently.

[0023] In a preferred example, the present application can be further configured as follows: Obtaining the preset test signal according to the test configuration file includes:

[0024] According to the signal parameters in the test configuration file, the signal parameters include signal type, frequency, amplitude, and waveform characteristics; Based on the signal parameters, the preset test signal is obtained through a signal generation algorithm.

[0025] By adopting the above technical solution, by precisely defining the signal type, frequency, amplitude, and waveform characteristics, it is ensured that the generated test signal strictly conforms to the preset test standard, reduces errors and deviations, and improves the accuracy of the test. The process of automatically generating test signals reduces the time for manually setting and adjusting signal parameters, improves the efficiency of test preparation and execution, and shortens the test cycle.

[0026] In a preferred example, the present application can be further configured as follows: Inputting the preset test signal into the integrated circuit to be tested, collecting the output signal, and obtaining the integrated circuit analysis result includes:

[0027] Inputting the preset test signal into the integrated circuit to be tested and collecting the output signal of the integrated circuit to be tested in real time;

[0028] Perform error detection on the output signal, compare the difference between the output signal and the expected signal to obtain an error value; analyze the response time of the output signal to evaluate the reaction speed of the integrated circuit under test when the input signal changes; evaluate the stability of the output signal to check whether the output signal fluctuates within the expected range;

[0029] Measure the voltage and current values of the output signal to ensure that they are within the safe and expected operating range;

[0030] Comprehensively process the error value, the response time of the output signal, the stability of the output signal, and the voltage and current values of the output signal to obtain the analysis result of the integrated circuit.

[0031] By adopting the above technical solution, by comparing the difference between the output signal and the expected signal, the performance deviation of the integrated circuit can be accurately identified to ensure the accuracy of the test result. Evaluating the reaction speed of the integrated circuit when the input signal changes helps to identify problems with slow response and ensure the performance of the integrated circuit in actual applications. Checking the fluctuation of the output signal ensures that the signal is stable within the expected range and prevents unstable phenomena during the operation of the integrated circuit. Ensuring that the voltage and current values of the output signal are within the safe and expected operating range prevents overload or other electrical problems and guarantees the reliability and safety of the integrated circuit. By collecting and comprehensively processing multiple performance indicators (error value, response time, stability, voltage, and current) in real time, a comprehensive analysis result of the integrated circuit can be obtained quickly, improving the test efficiency.

[0032] In a preferred example of the present application, it can be further configured as: comparing the analysis result of the integrated circuit with a preset analysis result to generate a test report, including:

[0033] Compare the analysis result of the integrated circuit with the preset analysis result to obtain an error detection result;

[0034] According to the error detection result, evaluate whether the performance of the integrated circuit under test meets the expectations to obtain an evaluation result; according to the evaluation result, generate the test report, and the test report includes the integrated circuit performance indicators, the integrated circuit error rate, and the integrated circuit fault location.

[0035] By adopting the above technical solutions, by comparing the actual analysis results of the integrated circuit with the preset standard results, the performance deviation can be accurately identified, ensuring the accuracy of the detection results. According to the error detection results, evaluate whether the performance of the integrated circuit meets the expectations, and ensure that the test results can truly reflect the actual performance of the integrated circuit. The test report includes the performance indicators, error rate, and fault location of the integrated circuit, providing a comprehensive performance evaluation to ensure the detail and comprehensiveness of the test results. Through accurate fault location analysis, the problem can be quickly located, reducing the troubleshooting time and improving the maintenance efficiency.

[0036] The second invention object of the present application is achieved by the following technical solutions:

[0037] An integrated circuit test device, the integrated circuit test device includes:

[0038] An information acquisition module, configured to acquire integrated circuit test information and match a test configuration file according to the integrated circuit test information; a signal generation module, configured to obtain a preset test signal according to the test configuration file;

[0039] A signal detection module, configured to input the preset test signal into the integrated circuit to be tested, collect the output signal, and obtain the integrated circuit analysis result;

[0040] A signal comparison module, configured to compare the integrated circuit analysis result with a preset analysis result and generate a test report.

[0041] By adopting the above technical solutions, by automatically acquiring the test information of the integrated circuit and matching the corresponding test configuration file, it is ensured that each test follows standardized steps and parameter settings. This can reduce the errors caused by human operations and improve the consistency and repeatability of the test results. The test configuration file provides customized test signals according to different models, test modes, and test conditions. This can ensure that the test signals are highly matched with the actual working environment and conditions of the integrated circuit to be tested, improving the accuracy and relevance of the test. Real-time collecting and analyzing the output signal can quickly discover and locate problems. Through the real-time feedback mechanism, dynamic adjustment can be performed during the test process, improving the effectiveness and response speed of the test. By comparing the actual test results with the preset standards, the performance and quality of the integrated circuit can be comprehensively evaluated. The generated test report provides detailed analysis data and diagnostic information to support subsequent decision-making and improvement measures.

[0042] The third object of the present application is achieved by the following technical solutions:

[0043] A computer device includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the steps of the above-mentioned integrated circuit testing method are implemented.

[0044] The above-mentioned fourth object of the present application is achieved by the following technical solutions:

[0045] A computer-readable storage medium stores a computer program. When the computer program is executed by a processor, the steps of the above-mentioned integrated circuit testing method are implemented.

[0046] In summary, the present application includes at least one of the following beneficial technical effects:

[0047] 1. By automatically obtaining the test information of the integrated circuit and matching the corresponding test configuration file, it is ensured that each test follows standardized steps and parameter settings. This can reduce the errors caused by human operations and improve the consistency and repeatability of test results. The test configuration file provides customized test signals according to different models, test modes, and test conditions. This can ensure that the test signals highly match the actual working environment and conditions of the integrated circuit to be tested, improving the accuracy and relevance of the test. Real-time collection and analysis of the output signals can quickly detect and locate problems. Through the real-time feedback mechanism, dynamic adjustment can be carried out during the test process, improving the effectiveness and response speed of the test. By comparing the actual test results with the preset standards, the performance and quality of the integrated circuit can be comprehensively evaluated. The generated test report provides detailed analysis data and diagnostic information, supporting subsequent decision-making and improvement measures;

[0048] 2. By comparing the differences between the output signal and the expected signal, the performance deviation of the integrated circuit can be accurately identified, ensuring the accuracy of the test results. Evaluating the reaction speed of the integrated circuit when the input signal changes helps to identify problems with slow response and ensure the performance of the integrated circuit in actual applications. Checking the fluctuation of the output signal ensures that the signal is stable within the expected range and prevents unstable phenomena from occurring during the operation of the integrated circuit. Ensuring that the voltage and current values of the output signal are within the safe and expected working range prevents overload or other electrical problems and guarantees the reliability and safety of the integrated circuit. By real-time collecting and comprehensively processing multiple performance indicators (error value, response time, stability, voltage, and current), a comprehensive analysis result of the integrated circuit can be quickly obtained, improving the test efficiency;

[0049] 3. By comparing the actual analysis results of the integrated circuit with the preset standard results, the performance deviation can be accurately identified, ensuring the accuracy of the detection results. According to the error detection results, evaluate whether the performance of the integrated circuit meets the expectations, ensuring that the test results can truly reflect the actual performance of the integrated circuit. The test report includes the performance indicators, error rate, and fault location of the integrated circuit, providing a comprehensive performance evaluation to ensure the detail and comprehensiveness of the test results. Through precise fault location analysis, the problem can be quickly located, reducing the troubleshooting time and improving the repair efficiency. Brief Description of the Drawings

[0050] Figure 1 is a flowchart of the integrated circuit testing method in an embodiment of the present application;

[0051] Figure 2 is an implementation flowchart in step S10 of the integrated circuit testing method in an embodiment of the present application;

[0052] Figure 3 is an implementation flowchart after step S11 of the integrated circuit testing method in an embodiment of the present application;

[0053] Figure 4 is an implementation flowchart in step S12 of the integrated circuit testing method in an embodiment of the present application;

[0054] Figure 5 is an implementation flowchart in step S20 of the integrated circuit testing method in an embodiment of the present application;

[0055] Figure 6 is an implementation flowchart in step S30 of the integrated circuit testing method in an embodiment of the present application;

[0056] Figure 7 is an implementation flowchart in step S40 of the integrated circuit testing method in an embodiment of the present application;

[0057] Figure 8 is a principle block diagram of the integrated circuit testing method in an embodiment of the present application;

[0058] Figure 9 is a schematic diagram of the device in an embodiment of the present application. Detailed Description of the Embodiment

[0059] The following further describes the present application in detail with reference to the accompanying drawings.

[0060] In one embodiment, as Figure 1 shown, the present application discloses an integrated circuit testing method, which specifically includes the following steps:

[0061] S10: Obtain the information of the integrated circuit to be tested, and load the test configuration file according to the information of the integrated circuit to be tested.

[0062] In this embodiment, the information of the integrated circuit to be tested refers to the data related to the integrated circuit to be tested, including but not limited to the model of the integrated circuit, design documents, expected performance parameters, environmental conditions, and test requirements. The test configuration file refers to the file used to guide the integrated circuit test process, including the signal parameters, test modes, test conditions, and preset standards required for the test.

[0063] Specifically, obtain the test information of the integrated circuit from user input or the system database. This includes but is not limited to: the integrated circuit model, test modes (such as functional test, performance test, environmental test, etc.), test conditions (such as temperature, humidity, operating voltage, etc.). Establish a test configuration file database, which contains preset test configuration files for different models and test modes. Use a multi-dimensional index search algorithm to find the test configuration file that matches the test information in the database. Load the matching test configuration file into the test system.

[0064] S20: Obtain the preset test signal according to the loaded test configuration file.

[0065] In this embodiment, the preset test signal refers to the standardized test signal generated according to the parameters defined in the test configuration file (such as signal type, frequency, amplitude, and waveform characteristics), and is used to test the performance of the integrated circuit.

[0066] Specifically, parse the test configuration file and extract the parameters required for signal generation from the loaded test configuration file. The parameters include: Signal type: clock signal, data signal, control signal, etc. Frequency: the operating frequency of the signal, such as 1 MHz, 10 MHz, etc. Amplitude, the voltage amplitude of the signal, such as 3.3 V, 5 V, etc. Waveform characteristics, the shape of the signal, such as sine wave, square wave, triangular wave, etc. Phase: the phase information of the signal, applicable to multi-signal synchronization testing. According to the signal type and characteristics in the test configuration file, select a signal generator. For example, use an arbitrary waveform generator (AWG) or a function generator (FG). Configure the signal generator: set the frequency, input the frequency parameter of the signal. Set the amplitude, input the amplitude parameter of the signal. Select the waveform, according to the waveform characteristics, select to generate a sine wave, square wave or other waveforms. Set the phase, configure the phase parameter of the signal. Generate the preset test signal: Sine wave generation, use the sine wave function to generate a sine signal corresponding to the frequency and amplitude. Square wave generation, use the square wave function to generate a square wave signal corresponding to the frequency and amplitude. Triangular wave generation, use the triangular wave function to generate a triangular wave signal corresponding to the frequency and amplitude. Output the analog signal, convert the generated digital signal into an analog signal through a digital-to-analog converter (DAC) and output it.

[0067] S30: Input the preset test signal into the integrated circuit to be tested, collect the output signal, and obtain the integrated circuit analysis result.

[0068] In this embodiment, the integrated circuit analysis result refers to the comprehensive data obtained through error detection and performance evaluation, including error values, response time, stability, voltage, current, etc.

[0069] Specifically, a preset test signal is generated according to the test configuration file, and the output end of the signal generator is connected to the input end of the integrated circuit to be tested. The electrical parameters of the test environment are configured to meet the working conditions of the integrated circuit to be tested. The signal generator is used to generate and input the preset test signal to ensure that the signal characteristics conform to the description in the test configuration file. An oscilloscope or other signal acquisition device is used to monitor and record the output signal of the integrated circuit. At the same time, the sampling rate, time base, and trigger conditions of the oscilloscope are set, and parameters such as the waveform, amplitude, and frequency of the output signal are continuously recorded. The collected output signal is sent to the data processing and analysis system. By comparing the output signal with the standard reference signal, the error value is calculated. The response time, stability, voltage, and current characteristics of the output signal are analyzed. The error detection and performance evaluation results are comprehensively processed to obtain the final integrated circuit analysis result.

[0070] S40: Compare the integrated circuit analysis result with the preset analysis result to generate a test report.

[0071] In this embodiment, the preset analysis result refers to the preset standard analysis data for comparison. The test report refers to the report generated after comparing the integrated circuit analysis result with the preset analysis result, including information such as the performance indicators, error rate, and fault location of the integrated circuit.

[0072] Specifically, the preset analysis result is extracted from the test configuration file. The preset analysis result includes the characteristic parameters of the standard reference signal, the allowable error range, and performance indicators. The actual analysis result of the integrated circuit is compared in detail with the preset analysis result. The actual error value of the output signal is compared with the preset error range to check whether the deviation is within the allowable range. The response time, stability, voltage, and current characteristics of the actual output signal are compared with the preset standards to evaluate whether the actual performance of the integrated circuit meets the expectations. A detailed test report is generated according to the comparison results. The test report includes a test overview, test parameters, error detection results, performance evaluation results, and conclusions and suggestions.

[0073] In one embodiment, as Figure 2 shown, in step S10, that is, obtaining the integrated circuit test information, matching the test configuration file according to the integrated circuit test information, including:

[0074] S11: Based on the integrated circuit information to be tested, obtain test parameters. The test parameters include the model, test mode, and test conditions of the integrated circuit to be tested.

[0075] In this embodiment, the model of the integrated circuit to be tested refers to the type or number of the integrated circuit. The test mode refers to the specific strategy or method adopted during the test. For example, functional testing (verifying basic functions), performance testing (measuring performance indicators), fault testing (detecting faults and defects), etc. The test conditions refer to the specific environment and operating parameters during the test, such as test temperature, power supply voltage, signal frequency, etc.

[0076] Specifically, read the model from the identification of the integrated circuit to be tested, and select the test mode according to the test objectives. For example, determine whether it is functional testing, performance testing or fault testing through system default settings or user selection. Determine the test conditions according to the working environment and specifications of the integrated circuit to be tested. For example, read the recommended operating conditions in the data sheet or specific conditions specified by the user.

[0077] S12: Query the preset test configuration file database according to the test parameters, and select the matching test configuration file.

[0078] In this embodiment, the preset test configuration file database refers to the database that stores various test configuration files. Each test configuration file contains the detailed test steps and parameters corresponding to a specific model, test mode and test conditions.

[0079] Specifically, connect to the preset test configuration file database. Structure the test parameters (including the model, test mode and test conditions of the integrated circuit to be tested) into query conditions. Execute the query in the test configuration file database to find the test configuration file that matches the test parameters. The query conditions should include the model, test mode and test conditions to ensure finding the most matching test configuration file.

[0080] In one embodiment, as Figure 3 shown, after step S11, that is, the integrated circuit test method, further includes:

[0081] S111: Real-time monitor the test status and signal changes of the integrated circuit, obtain the monitoring results, and adjust the test parameters according to the monitoring results.

[0082] In this embodiment, the monitoring results refer to the comprehensive report of signal analysis data, detected abnormalities and fault information.

[0083] Specifically, connect the oscilloscope probe and the logic analyzer probe to the test points of the integrated circuit under test. Set the data acquisition frequency, such as 1 MHz, to ensure high-precision signal acquisition. The oscilloscope and the logic analyzer collect the input and output signals in real time and transmit the data to the monitoring software. The monitoring software stores and processes the signal data collected in real time. Use signal processing algorithms to analyze parameters such as the waveform, frequency, and amplitude of the signal. Compare the real-time signal with the reference signal to detect signal deviations and anomalies. Detect anomalies in the signal through threshold detection. When an anomaly is detected, mark the fault location and type. Generate a monitoring report based on the analysis results, including information such as the signal waveform, anomaly detection results, and fault location. Parse the monitoring report to extract the abnormal signals and fault information. Determine the test parameters that need to be adjusted, such as frequency, amplitude, etc. According to the monitoring results, adjust the test parameters and update the test configuration file.

[0084] In one embodiment, as Figure 4 shown, in step S12, that is, query the preset test configuration file database according to the test parameters and select the matching test configuration file, further includes:

[0085] S121: In the preset test configuration file database, perform a multi-dimensional index search based on the test parameters to obtain a test search result.

[0086] In this embodiment, the multi-dimensional index search refers to using multiple parameters (dimensions) to perform a search simultaneously, which can more efficiently locate the data items that meet the conditions. Each dimension corresponds to an index, and the index is used to quickly retrieve the data that matches the conditions. The test search result refers to the test configuration file that is obtained through the multi-dimensional index search and matches the input test parameters. The test configuration file contains the test steps and parameters for a specific model, test mode, and test conditions.

[0087] Specifically, the database contains multiple test configuration files, and each file contains the following information: model, test mode, test conditions, test steps, and parameters, and a multi-dimensional index is established. An index is established for each dimension for quick retrieval. For example: model index: establish an index according to the model. Test mode index: establish an index according to the test mode. Test condition index: establish an index according to the test conditions. The input test parameters include the model, test mode, and test conditions. For example: model = A, test mode = 1, test conditions = 2. Generate a composite query condition according to the input parameters, such as: model = A AND, test mode = 1 AND, test conditions = 2. Use the multi-dimensional index mechanism of the database to retrieve the matching records in the model index, test mode index, and test condition index respectively. Merge the matching records to obtain the configuration file that meets all the conditions.

[0088] S122: Sort the test search results through a machine learning algorithm, and select the test configuration file with the highest matching degree to the test parameters.

[0089] In this embodiment, the machine learning algorithm refers to the random forest algorithm.

[0090] Specifically, collect historical data, which includes the results of past tests and the corresponding configuration files. Extract features from each test configuration file, such as model number, test mode, test conditions, test results, etc. Score or classify the configuration files according to the historical test results. Use 80% of the historical data to train the random forest algorithm model. Use 20% of the historical data to verify the accuracy of the model. The input features of the random forest algorithm model: model number, test mode, test conditions, historical matching degree, etc. The output feature of the random forest algorithm model: matching degree score. Obtain the trained random forest algorithm model. Input the current test parameters into the trained random forest algorithm model. The trained random forest algorithm model calculates the matching degree score of each configuration file according to the input test parameters. Sort the test configuration files according to the calculated matching degree scores. Select the test configuration file with the highest matching degree from the sorting results.

[0091] In one embodiment, as Figure 5 shown, in step S20, that is, according to the test configuration file, obtain the preset test signal, including:

[0092] S21: According to the signal parameters in the test configuration file, the signal parameters include signal type, frequency, amplitude, and waveform characteristics.

[0093] Specifically, read the signal parameters from the test configuration file, including signal type, frequency, amplitude, and waveform characteristics. Among them, the signal type represents the basic form of the signal, such as sine wave, square wave, triangular wave, pulse signal, etc. The frequency represents the frequency of the signal, such as 1 kHz, 10 MHz, etc. The amplitude represents the amplitude of the signal, such as 1 V, 5 V, etc. The waveform characteristics include the phase, duty cycle, rise / fall time, etc. of the signal.

[0094] S22: Based on the signal parameters, obtain the preset test signal through a signal generation algorithm.

[0095] In this embodiment, the signal generation algorithm refers to the mathematical and calculation methods used to generate test signals according to the given signal parameters (such as signal type, frequency, amplitude, and waveform characteristics). The sine wave generation algorithm is used to generate sine wave signals. The square wave generation algorithm is used to generate square wave signals. The triangular wave generation algorithm is used to generate triangular wave signals. The pulse generation algorithm is used to generate pulse signals.

[0096] Specifically, signal parameters are read from a configuration file, including signal type, frequency, amplitude, and waveform characteristics. A corresponding signal generation algorithm is selected according to the read signal type. A preset test signal is generated using the selected algorithm and the read parameters. The sine wave generation formula is: V(t)=A·sin(2πft + φ), where A is the amplitude, f is the frequency, and φ is the phase. The square wave generation formula: V(t)=A·sgn(sin(2πft)), where V(t) is the square wave voltage at time t, A is the amplitude of the square wave, and f is the frequency of the square wave. sgn(x) is the sign function, defined as: The generation formula for a triangular wave: where: V(t) is the triangular wave voltage at time t. A is the amplitude of the triangular wave. T is the period of the triangular wave, f is the frequency of the triangular wave. mod represents the modulo operation. The generation formula for a pulse signal: where V(t) is the pulse signal voltage at time t. A is the amplitude of the pulse signal. t0 is the starting time of the pulse signal. τ is the width (duration) of the pulse signal. rect(x) is the rectangular function, defined as:

[0097]

[0098] In one embodiment, as Figure 6 shown, in step S30, the preset test signal is input into the integrated circuit to be tested, and the output signal is collected to obtain the integrated circuit analysis result, including:

[0099] S31: Input the preset test signal into the integrated circuit to be tested, and collect the output signal of the integrated circuit to be tested in real time.

[0100] Specifically, connect the signal generator to the input end of the integrated circuit to be tested. Connect an oscilloscope, a logic analyzer, or other measurement devices to the output end of the integrated circuit. Generate a preset test signal according to the test configuration file. The preset test signal includes the input signal type, frequency, amplitude, and waveform characteristics. Input the generated test signal into the integrated circuit to be tested. Start the oscilloscope or the logic analyzer to collect the output signal of the integrated circuit in real time. Transmit the collected output signal data to the test system through the interface of the measurement device

[0101] S32: Perform error detection on the output signal, compare the difference between the output signal and the expected signal, and obtain the error value.

[0102] In this embodiment, the expected signal refers to the theoretically ideal signal generated according to the test configuration file and the preset signal parameters.

[0103] Specifically, the output signal data of the integrated circuit to be tested is collected and recorded in real time. According to the preset signal parameters (such as signal type, frequency, amplitude, waveform characteristics), an expected signal is generated. Ensure that the expected signal is synchronized with the actual output signal on the time axis. Align the output signal and the expected signal on the time axis. Alignment is performed through the rising edge, falling edge or specific feature points of the signal. Calculate the error value between the output signal and the expected signal. Commonly used error calculation methods include absolute error, relative error and mean square error.

[0104] Absolute error: Absolute error = S out (t) - S expected (t).

[0105] Relative error:

[0106] Mean square error: According to the calculated error value, analyze the difference between the output signal and the expected signal to obtain the error value.

[0107] S33: Analyze the response time of the output signal to evaluate the reaction speed of the integrated circuit to be tested when the input signal changes.

[0108] Specifically, set the trigger mode of the oscilloscope to detect the rising edge or falling edge of the input signal. Connect the input signal to the input channel of the oscilloscope. When the input signal changes (such as from low level to high level), the oscilloscope will capture and record the moment of this change. Connect the output signal of the integrated circuit to be tested to another channel of the oscilloscope. The oscilloscope monitors the changes of the input signal and the output signal simultaneously and records the moment of the corresponding change of the output signal. Through the time scale of the oscilloscope, read the moment of the input signal change (T in ) and the moment of the output signal change (Tout).

[0109] Calculate the response time: Response time = T OUT - T in .

[0110] S34: Evaluate the stability of the output signal and check whether the output signal fluctuates within the expected range.

[0111] Specifically, connect the output signal to the input channel of the oscilloscope. Set the time base and voltage range of the oscilloscope to ensure that the complete waveform of the output signal can be captured. Continuously monitor the output signal and record the changes in the signal. Determine the expected voltage range of the output signal according to the design requirements or standards. For example, the output signal should be within the range of 3.3V ± 5%. Determine the allowable fluctuation amplitude. For example, the fluctuation of the output signal should not exceed ±0.1V. Use the measurement function of the oscilloscope or data analysis software to analyze the fluctuation of the output signal. Compare the actual voltage value of the output signal with the expected range to check if there is any situation beyond the expected range.

[0112] S35: Measure the voltage and current values of the output signal to ensure that they are within the safe and expected operating range.

[0113] Specifically, connect the probe of the oscilloscope to the output terminal of the integrated circuit. Use a current probe to measure the current value of the output signal. Connect the current probe to the input channel of the oscilloscope and through the output current path of the integrated circuit. Set the voltage range of the oscilloscope (e.g., 0V to 5V) and the time base (e.g., 1ms / div) to ensure that the complete waveform of the output signal can be captured. Select an appropriate probe attenuation ratio (e.g., 10x or 1x) and adjust it according to the measured voltage range. Select an appropriate current measurement range (e.g., 0A to 10A). Start the oscilloscope and monitor the voltage waveform of the output signal in real time. Record the changes in the voltage waveform, especially paying attention to the peak voltage and the minimum voltage. Use the current probe to monitor the current value of the output signal in real time. Record the changes in the current waveform, especially paying attention to the peak current and the minimum current. Compare the measured voltage value with the expected voltage range. For example, if the expected voltage range is 3.3V ± 5% (i.e., 3.135V to 3.465V), ensure that the measured voltage value is within this range. Compare the measured current value with the expected current range. For example, if the expected current range is 0A to 100mA, ensure that the measured current value is within this range.

[0114] S36: Comprehensively process the error value, the response time of the output signal, the stability of the output signal, the voltage and current values of the output signal to obtain the analysis result of the integrated circuit.

[0115] Specifically, compare the preset test signal with the actual output signal and calculate the error value. The error value can be expressed as absolute error or relative error. Record the time required for the signal to change from input to output stability. The response time can be observed and recorded through the oscilloscope. Evaluate the fluctuation range of the output signal. The stability can be expressed by calculating the standard deviation or variance. Measure and record the voltage and current values of the output signal to ensure that they are within the expected range. Standardize different data to make them have the same dimension and comparability. Minimum - maximum normalization formula: Among them, X is the original data value. X' is the data value after standardization. Xmin is the minimum value in the original data set. Xmax is the maximum value in the original data set. Different weights are assigned according to the test requirements and the importance of each data item. For example: error value weight: 30%, response time weight: 25%, stability weight: 20%, voltage and current value weight: 25%. Comprehensive performance index = 0.3 × standardized error value + 0.25 × standardized response time + 0.2 × standardized stability + 0.25 × standardized voltage and current value. The comprehensive performance index = 0.3 × standardized error value + 0.25 × standardized response time + 0.2 × standardized stability + 0.25 × standardized voltage and current value. The standardized data items are weighted and summed according to the weights to obtain the integrated circuit analysis result. The integrated circuit analysis result is used to comprehensively evaluate the performance of the integrated circuit.

[0116] In one embodiment, as Figure 7 shown, in step S40, the integrated circuit analysis result is compared with the preset analysis result to generate a test report, including:

[0117] S41: Compare the integrated circuit analysis result with the preset analysis result to obtain an error detection result.

[0118] Specifically, the output signals collected from the integrated circuit under test include parameters such as voltage, current, response time, and stability. The expected output signals set according to the standards or design specifications before the test include parameters such as voltage, current, response time, and stability. Each parameter is compared separately, such as voltage, current, response time, etc. Calculate the error between the actual value and the expected value, and the following formula can be used: error = actual value - expected value, and generate an error detection result:

[0119] S42: According to the error detection result, evaluate whether the performance of the integrated circuit under test meets the expectations to obtain an evaluation result.

[0120] Specifically, collect the error values, actual values, and expected values of all detection parameters. Define the expected performance criteria, including the allowable error range for each parameter and the overall performance criteria. Compare the error value of each parameter with its corresponding expected value. Use the set performance criteria to determine whether each parameter is within the allowable error range. Comprehensively evaluate the error detection results of all parameters. Calculate the overall performance score using the weighted average method. Determine whether the overall performance of the integrated circuit meets the expectations based on the overall performance score. For example, Parameter 1: Actual value = 3.3V, Expected value = 3.3V. Parameter 2: Actual value = 20mA, Expected value = 19.5mA. Parameter 3: Actual value = 5ns, Expected value = 5ns. Set the performance criteria: Allowable error range for voltage: ±0.1V, Allowable error range for current: ±1mA, Allowable error range for response time: ±0.5ns. Voltage error value = 3.3V - 3.3V = 0V. Current error value = 20mA - 19.5mA = 0.5mA. Response time error value = 5ns - 5ns = 0ns. Voltage: 0V ≤ ±0.1V, meets expectations, Current: 0.5mA ≤ ±1mA, meets expectations, Response time: 0ns ≤ ±0.5ns, meets expectations. Assign weights: Voltage 40%, Current 30%, Response time 30%. Calculate the comprehensive score: 100% * 0.4 + 100% * 0.3 + 100% * 0.3 = 100%. The comprehensive performance score is 100%, and the conclusion is that the performance of the integrated circuit meets the expectations.

[0121] S43: Generate a test report based on the evaluation results. The test report includes the performance indicators of the integrated circuit, the error rate of the integrated circuit, and the fault location of the integrated circuit.

[0122] Specifically, collect all evaluation results, including the performance indicators, error rates, and any detected fault locations of each key parameter. Organize the collected evaluation data according to the requirements of the test report to ensure the integrity and accuracy of the data. List all the performance indicators based on the actual measured values of each key parameter in the evaluation results. For example, voltage, current, response time, etc. Calculate the error rate, and the formula is: Based on any parameters that do not meet the expectations detected in the evaluation results, mark the possible fault locations. The fault locations are located through circuit design diagrams, signal paths, etc. For example, Voltage: Actual value = 3.3V, Expected value = 3.3V. Current: Actual value = 20mA, Expected value = 19.5mA. Response time: Actual value = 5ns, Expected value = 5ns. Calculate and list the error rates: Voltage error rate is 0%, Current error rate is 2.56%, Response time error rate is 0%. Based on the relatively high current error rate, check whether there are problems with the components and connections in the current path and mark the fault locations.

[0123] It should be understood that the magnitudes of the sequence numbers of the steps in the above embodiments do not imply the order of execution. The order of execution of each process should be determined according to its function and internal logic, and should not constitute any limitation to the implementation process of the embodiments of the present application.

[0124] In one embodiment, an integrated circuit testing device is provided, which corresponds one-to-one with the integrated circuit testing method in the above embodiment. As Figure 8 shown, the integrated circuit testing device includes an information acquisition module, a signal acquisition module, a signal detection module, and a signal comparison module. The detailed description of each functional module is as follows:

[0125] The information acquisition module is used to acquire integrated circuit test information and match a test configuration file according to the integrated circuit test information;

[0126] The signal generation module is used to obtain a preset test signal according to the test configuration file;

[0127] The signal detection module is used to input the preset test signal into the integrated circuit to be tested, collect the output signal, and obtain the integrated circuit analysis result;

[0128] The signal comparison module is used to compare the integrated circuit analysis result with the preset analysis result and generate a test report.

[0129] Optionally, the information acquisition module includes:

[0130] The test parameter sub-module is used to obtain test parameters based on the information of the integrated circuit to be tested. The test parameters include the model, test mode, and test conditions of the integrated circuit to be tested;

[0131] The configuration file matching sub-module is used to query the preset test configuration file database according to the test parameters and select a matching test configuration file.

[0132] Optionally, the test parameter sub-module is further followed by:

[0133] The real-time adjustment sub-module is used to monitor the test status and signal changes of the integrated circuit in real time, obtain the monitoring result, and adjust the test parameters according to the monitoring result.

[0134] Optionally, the configuration file matching sub-module includes:

[0135] The search unit is used to perform a multi-dimensional index search in the preset test configuration file database based on the test parameters to obtain a test search result;

[0136] The result matching unit is used to sort the test search results through a machine learning algorithm and select the test configuration file with the highest matching degree with the test parameters.

[0137] Optionally, the signal generation module includes:

[0138] A signal parameter sub-module for generating signal parameters according to a test configuration file, where the signal parameters include signal type, frequency, amplitude, and waveform characteristics;

[0139] A digital signal generation sub-module for obtaining a preset test signal based on the signal parameters through a signal generation algorithm.

[0140] Optionally, the signal detection module includes:

[0141] A signal input sub-module for inputting a preset test signal into the integrated circuit to be tested and collecting the output signal of the integrated circuit to be tested in real time;

[0142] An error calculation sub-module for detecting errors in the output signal, comparing the difference between the output signal and the expected signal, and obtaining an error value;

[0143] A response time sub-module for analyzing the response time of the output signal and evaluating the reaction speed of the integrated circuit to be tested when the input signal changes;

[0144] A signal fluctuation sub-module for evaluating the stability of the output signal and checking whether the output signal fluctuates within the expected range;

[0145] A signal measurement sub-module for measuring the voltage and current values of the output signal to ensure that they are within a safe and expected operating range; A result processing sub-module for comprehensively processing the error value, the response time of the output signal, the stability of the output signal, and the voltage and current values of the output signal to obtain an integrated circuit analysis result.

[0146] Optionally, the signal comparison module includes:

[0147] An error detection result sub-module for comparing the integrated circuit analysis result with a preset analysis result to obtain an error detection result;

[0148] An evaluation result sub-module for evaluating whether the performance of the integrated circuit to be tested meets the expectations based on the error detection result to obtain an evaluation result;

[0149] A test report sub-module for generating a test report based on the evaluation result, where the test report includes integrated circuit performance indicators, integrated circuit error rate, and integrated circuit fault location.

[0150] Specific limitations on the integrated circuit testing device can be referred to the limitations on the integrated circuit testing method in the above text, which will not be elaborated here. Each module in the above integrated circuit testing device can be implemented in whole or in part by software, hardware, and their combination. Each of the above modules can be embedded in or independent of the processor in the computer device in the form of hardware, or stored in the memory of the computer device in the form of software, so as to facilitate the processor to call and execute the operations corresponding to each of the above modules.

[0151] In one embodiment, a computer device is provided. The computer device can be a server, and its internal structure diagram can be as Figure 9 shown. The computer device includes a processor, a memory, a network interface, and a database connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program, and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used for a preset test configuration file database. The network interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, it implements an integrated circuit testing method.

[0152] In one embodiment, a computer device is provided, including a memory, a processor, and a computer program stored on the memory and executable on the processor. When the processor executes the computer program, the following steps are implemented:

[0153] Obtain integrated circuit test information and match a test configuration file according to the integrated circuit test information;

[0154] Obtain a preset test signal according to the test configuration file;

[0155] Input the preset test signal into the integrated circuit to be tested, collect the output signal, and obtain an integrated circuit analysis result;

[0156] Compare the integrated circuit analysis result with a preset analysis result to generate a test report.

[0157] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by the processor, the following steps are implemented:

[0158] Obtain integrated circuit test information and match a test configuration file according to the integrated circuit test information;

[0159] Obtain a preset test signal according to the test configuration file;

[0160] Input a preset test signal into the integrated circuit to be tested, collect the output signal, and obtain the integrated circuit analysis result;

[0161] Compare the integrated circuit analysis result with the preset analysis result to generate a test report.

[0162] Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by instructing relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above methods. Among them, any reference to a memory, storage, database, or other medium used in the various embodiments provided in the present application can include non-volatile and / or volatile memories. Non-volatile memories can include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memories can include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDR SDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), etc.

[0163] Those skilled in the art can clearly understand that for the convenience and simplicity of description, only the above division of each functional unit and module is used as an example. In actual applications, the above functions can be allocated to different functional units and modules according to needs, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above.

[0164] The above embodiments are only used to illustrate the technical solutions of the present application, not to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements for some of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the various embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. An integrated circuit testing method, characterized in that, The integrated circuit testing method includes: Obtaining integrated circuit test information and matching a test configuration file according to the integrated circuit test information; The obtaining of the integrated circuit test information and matching of the test configuration file according to the integrated circuit test information includes: Based on the integrated circuit information to be tested, obtaining test parameters, where the test parameters include the model, test mode, and test conditions of the integrated circuit to be tested; Querying a preset test configuration file database according to the test parameters and selecting the matching test configuration file; The querying of the preset test configuration file database according to the test parameters and selection of the matching test configuration file further includes: In the preset test configuration file database, performing a multi-dimensional index search based on the test parameters to obtain a test search result; Sorting the test search result through a machine learning algorithm and selecting the test configuration file with the highest matching degree with the test parameters; Obtaining a preset test signal according to the test configuration file; Inputting the preset test signal into the integrated circuit to be tested, collecting the output signal, and obtaining an integrated circuit analysis result; Comparing the integrated circuit analysis result with a preset analysis result to generate a test report.

2. The integrated circuit testing method according to claim 1, characterized in that The integrated circuit testing method further includes: Real-time monitoring of the test status and signal changes of the integrated circuit to obtain a monitoring result, and adjusting the test parameters according to the monitoring result.

3. The integrated circuit testing method according to claim 1, wherein The obtaining of the preset test signal according to the test configuration file includes: According to the signal parameters in the test configuration file, where the signal parameters include signal type, frequency, amplitude, and waveform characteristics; Based on the signal parameters, obtaining the preset test signal through a signal generation algorithm.

4. The integrated circuit testing method according to claim 1, characterized in that, The inputting of the preset test signal into the integrated circuit to be tested, collecting the output signal, and obtaining an integrated circuit analysis result includes: Inputting the preset test signal into the integrated circuit to be tested and real-time collecting the output signal of the integrated circuit to be tested; Performing error detection on the output signal, comparing the difference between the output signal and the expected signal to obtain an error value; Analyzing the response time of the output signal and evaluating the reaction speed of the integrated circuit to be tested when the input signal changes; Evaluating the stability of the output signal and checking whether the output signal fluctuates within the expected range; Measuring the voltage and current values of the output signal to ensure that they are within a safe and expected operating range; Comprehensively processing the error value, the response time of the output signal, the stability of the output signal, and the voltage and current values of the output signal to obtain the integrated circuit analysis result.

5. The integrated circuit testing method according to claim 1, wherein The comparing of the integrated circuit analysis result with a preset analysis result to generate a test report includes: Comparing the integrated circuit analysis result with the preset analysis result to obtain an error detection result; According to the error detection result, evaluating whether the performance of the integrated circuit to be tested meets the expectation to obtain an evaluation result; Based on the evaluation results, generate the test report, where the test report includes the performance indicators of the integrated circuit, the error rate of the integrated circuit, and the fault location of the integrated circuit.

6. An integrated circuit testing device, characterized in that, The integrated circuit test device includes: An information acquisition module, configured to acquire integrated circuit test information and match a test configuration file according to the integrated circuit test information; The information acquisition module includes: A test parameter sub-module, configured to obtain test parameters based on the information to be tested of the integrated circuit, where the test parameters include the model, test mode, and test conditions of the integrated circuit to be tested; A configuration file matching sub-module, configured to query a preset test configuration file database according to the test parameters and select a matching test configuration file; The configuration file matching sub-module further includes: A search unit, configured to perform a multi-dimensional index search in the preset test configuration file database based on the test parameters to obtain a test search result; A result matching unit, configured to sort the test search results through a machine learning algorithm and select the test configuration file with the highest matching degree with the test parameters; A signal generation module, configured to obtain a preset test signal according to the test configuration file; A signal detection module, configured to input the preset test signal into the integrated circuit to be tested, collect the output signal, and obtain an integrated circuit analysis result; A signal comparison module, configured to compare the integrated circuit analysis result with a preset analysis result to generate a test report.

7. A computer device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, the steps of the integrated circuit test method according to any one of claims 1 to 5 are implemented.

8. A computer-readable storage medium storing a computer program, characterized in that, When the computer program is executed by the processor, the steps of the integrated circuit test method according to any one of claims 1 to 5 are implemented.

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