A test method and device based on comb signal

Abstract

The present application relates to the field of electromagnetic technology, and specifically to a test method and device based on comb signals. This solution includes: obtaining at least one frequency point based on the comb signal and the amplitude corresponding to each of the at least one frequency point; performing time domain conversion on the at least one frequency point and the amplitude corresponding to each of the at least one frequency point to obtain time domain data corresponding to the at least one frequency point; performing signal processing on the time domain data corresponding to the at least one frequency point according to the acquired acquisition parameters to obtain target spectrum data; controlling the spectrum analyzer to acquire the target spectrum data to obtain a target spectrum graph; and determining whether the test system meets the test standard based on the target spectrum graph. This method improves the flexibility and accuracy of electromagnetic compatibility testing, simplifies the test process, and expands the frequency coverage range. At the same time, it reduces hardware dependence and promotes test standardization and automation.

Description

Technical Field

[0001] The present application relates to the field of electromagnetic technology, and in particular to a testing method and device based on comb signals. Background Art

[0002] In the field of electromagnetic compatibility (EMC) testing, ensuring that the test environment and layout meet standard requirements is crucial. This process typically includes regular verification of the test system to verify that it meets the predetermined test standards. To verify conducted and radiated interference systems, a comb signal source has traditionally been used as the emission source. A comb signal source is a device that generates a signal with multiple equally spaced frequency components. Its signal spectrum exhibits a comb-like shape on the frequency axis, hence the name "comb signal."

[0003] While this traditional method can effectively generate and measure signals with multiple frequency components, its limitations are also significant. Traditional comb signal sources are typically limited to generating fixed frequency points and corresponding amplitudes based on their hardware characteristics. While these fixed frequency and amplitude settings meet basic testing requirements, they lack flexibility and cannot verify specific, user-defined frequency points. Consequently, custom frequency point requirements cannot be met during testing, limiting the applicability and flexibility of the test system. This limitation makes traditional methods inadequate when detailed verification of specific frequency points is required, resulting in information loss during testing and analysis. Summary of the Invention

[0004] An object of an embodiment of the present invention is to provide a test method and apparatus based on comb signals, so as to solve the technical problem that a user-defined frequency point cannot be tested during electromagnetic compatibility laboratory testing.

[0005] In a first aspect, an embodiment of the present invention provides a comb signal-based testing method, which is applied to a test system including a spectrum analyzer. The method includes:

[0006] Acquire at least one frequency point based on the comb signal and an amplitude corresponding to each frequency point in the at least one frequency point;

[0007] Performing time domain conversion on the at least one frequency point and the amplitude corresponding to each frequency point in the at least one frequency point to obtain time domain data corresponding to the at least one frequency point;

[0008] performing signal processing on the time domain data corresponding to the at least one frequency point according to the acquired acquisition parameters to obtain target spectrum data;

[0009] Controlling the spectrum analyzer to collect the target spectrum data to obtain a target spectrum graph;

[0010] Determine whether the test system meets the test standard according to the target frequency spectrum.

[0011] In combination with the first aspect, in a possible implementation method, performing time domain conversion on the at least one frequency point and the amplitude corresponding to each of the at least one frequency point to obtain time domain data corresponding to the at least one frequency point includes: generating a spectrum data matrix based on the at least one frequency point and the amplitude corresponding to each of the at least one frequency point; performing an inverse Fourier transform calculation on the spectrum data matrix to obtain the time domain data corresponding to the at least one frequency point.

[0012] In combination with the first aspect, in a possible implementation method, the acquisition parameters include a sampling rate and a sampling time; the signal processing is performed on the time domain data corresponding to the at least one frequency point according to the acquired acquisition parameters to obtain target spectrum data, including: determining the number of sampling points according to the sampling rate and the sampling time; performing data preprocessing on the time domain data corresponding to the at least one frequency point to obtain a plurality of preprocessed time domain data; dividing the plurality of preprocessed time domain data into a plurality of target segments according to the sampling time, the data length of each target segment being equal to the number of sampling points; performing Fourier transform calculation on the plurality of target segments to obtain spectrum data corresponding to each of the plurality of target segments; and determining that the spectrum data corresponding to all of the target segments is the target spectrum data.

[0013] In combination with the first aspect, in a possible implementation method, controlling the spectrum analyzer to collect the target spectrum data to obtain a target spectrum graph includes: setting the sampling rate corresponding to the spectrum analyzer and the sampling rate corresponding to the acquisition parameter to the same value; controlling the spectrum analyzer to collect the target spectrum data according to the sampling rate corresponding to the acquisition parameter to obtain a target spectrum graph.

[0014] In combination with the first aspect, in a possible implementation, before determining whether the test system meets the test standard based on the target spectrum diagram, the method also includes: obtaining a first spectrum diagram based on the acquired acquisition parameters and the time domain data corresponding to the at least one frequency point.

[0015] In combination with the first aspect, in a possible implementation method, determining whether the test system meets the test standard based on the target spectrum diagram includes: comparing the target spectrum diagram with the first spectrum diagram to determine whether an offset point appears; determining whether the offset point is within a preset offset range; if it is within the preset offset range, determining that the current test system meets the test standard; or, if it is not within the preset offset range, determining that the current test system does not meet the test standard.

[0016] In combination with the first aspect, in a possible implementation, after determining that the current test system does not meet the test standard if it is not within the preset offset range, the method also includes: obtaining the position and amplitude of the offset point, and the degree of deviation of the offset point; analyzing the offset point to obtain adjustment parameters, and the adjustment parameters are used to adjust the test system; and retesting according to the adjustment parameters.

[0017] In a second aspect, an embodiment of the present invention provides a comb signal-based test device, which is applied to a test system, wherein the test system includes a spectrum analyzer, and the device includes:

[0018] an acquiring unit, configured to acquire at least one frequency point based on the comb signal and an amplitude corresponding to each frequency point in the at least one frequency point;

[0019] a conversion unit, configured to perform time domain conversion on the at least one frequency point and the amplitude corresponding to each of the at least one frequency point to obtain time domain data corresponding to the at least one frequency point;

[0020] a determining unit, configured to perform signal processing on the time domain data corresponding to the at least one frequency point according to the acquired acquisition parameters to obtain target spectrum data;

[0021] The determining unit is further configured to control the spectrum analyzer to collect the target spectrum data and obtain a target spectrum graph;

[0022] The determining unit is further configured to determine whether the test system meets a test standard according to the target frequency spectrum.

[0023] In a third aspect, an embodiment of the present invention provides a computer device, including:

[0024] at least one processor; and,

[0025] a memory communicatively connected to the at least one processor; wherein,

[0026] The memory stores instructions that can be executed by the at least one processor. The instructions are executed by the at least one processor to enable the at least one processor to perform the method according to the first aspect.

[0027] In a fourth aspect, a computer-readable storage medium is provided, wherein the computer-readable storage medium stores a computer program, wherein the computer program includes program instructions, and when the program instructions are executed by a processor, the processor is caused to perform the method according to the first aspect.

[0028] In the scheme implemented by the above-mentioned test method, device, equipment and storage medium based on comb signals, this method obtains and defines multiple frequency points and their corresponding amplitudes, so that users can customize the frequency components of the test signal according to specific needs, thereby improving the flexibility of the test, so that the test can be accurately verified for specific frequency points without being restricted by the fixed frequency points of traditional comb signal sources; further, the frequency points and their amplitudes are converted into the time domain, and then these data are collected by controlling the spectrum analyzer to obtain a more accurate target spectrum diagram, which helps to identify and quantify performance deviations in the test system; and by analyzing the target spectrum diagram, it is determined whether the test system meets the predetermined test standards. Automated standard compliance detection improves the efficiency of the test process, reduces the need for manual intervention, and can more easily identify problem points in the test system, such as offset, interference, etc., and then determine whether the system has deviations or does not meet the standards; thus, this method provides a more efficient, accurate and flexible testing method, which helps to improve the reliability and efficiency of the entire testing process. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments of the present invention. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0030] Figure 1 is a schematic diagram of a testing system in one embodiment of the present invention;

[0031] Figure 2 1 is a flow chart of a comb signal-based testing method according to an embodiment of the present invention;

[0032] Figure 3 1 is a schematic structural diagram of a comb signal-based testing device according to an embodiment of the present invention;

[0033] Figure 4 It is a structural diagram of a computer device in one embodiment of the present invention. DETAILED DESCRIPTION

[0034] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0035] It should be noted that, unless there is a conflict, the various features of the embodiments of the present invention may be combined with each other and are all within the scope of protection of the present invention. In addition, although the functional modules are divided in the device schematics and the logical order is shown in the flow charts, in some cases, the steps shown or described may be performed in a different order than the module division in the device or the order in the flow charts. Furthermore, the terms "first," "second," "third," etc. used in the present invention do not limit the data or execution order, but only distinguish between identical or similar items with substantially the same functions and effects.

[0036] The technical solution of this application can be applied to various testing scenarios.

[0037] In the test method based on comb signal, it is applied to the test system, see Figure 1 , Figure 1 This is a schematic diagram of a test system provided in an embodiment of the present application. The test system 10 includes an acquisition card 20, a host computer 30, a test device (such as a conducted and radiated interference system) 40, and a spectrum analyzer 50.

[0038] The test system 10 is a configuration designed for electromagnetic compatibility (EMC) testing, and is intended to detect and analyze the performance and response of a test device (such as a conducted or radiated disturbance system) 40 in an electromagnetic environment.

[0039] The acquisition card 20 is a data acquisition device connected to a host computer and used to receive and store time-domain signal data. It can set the sampling rate according to the host computer's instructions and convert analog signals into digital signals, or convert digital signals into analog signals for output. Specifically, the acquisition card 20 receives the test signal and corresponding test signal parameters from the host computer, digitizes the time-domain signal data, and then outputs the signal through the signal output port and transmits it to the spectrum analyzer for further analysis.

[0040] The host computer 30 is typically a computer with specialized software installed, which is used to generate and convert test signals. The host computer can be programmed to generate the frequency and amplitude parameters of the test signal, convert these parameters into time domain data through an inverse Fourier transform, and then send the time domain data of the test signal to the acquisition card through the network port.

[0041] Specifically, the host computer generates the signal to be transmitted based on the user-defined frequency points, ensuring that the signal source outputs the correct frequency components. The host computer also sets the amplitude of the test signal to ensure that the signal source outputs the appropriate signal strength. Optionally, the host computer monitors the test process in real time and records all relevant data, including the actual output parameters of the signal source and the spectrum data collected by the spectrum analyzer.

[0042] The test equipment (e.g., conducted or radiated interference system) 40 refers to the device used to actually test conducted or radiated interference. It may include an antenna, a test bench, a receiving sensor, etc. This equipment is used to capture the signals generated by the acquisition card and simulate the electromagnetic environment under actual operating conditions. Specifically, after receiving the signal from the acquisition card, the system's response is evaluated, and the test signal results (e.g., output signal, interference level, etc.) are provided to the spectrum analyzer for analysis.

[0043] The spectrum analyzer 50 is used to measure and analyze the signal's spectral characteristics, including amplitude and frequency distribution. Specifically, it receives spectrum data corresponding to digitized time-domain signal data transmitted from the acquisition card at a specific sampling rate, generates a target spectrogram based on the acquired spectrum data, and transmits the spectrogram data to a host computer for further analysis and judgment.

[0044] It can be seen from the above components that the host computer 30 generates the parameters of the comb signal source (such as frequency, amplitude, etc.) through instruction configuration, and sends these parameters to the acquisition card 20; the acquisition card 20 converts the analog signal into a digital signal, stores the time domain data in the memory, and cyclically outputs the host computer's instructions according to the sampling rate set by the host computer to generate a specific signal, and transmits it to the test equipment 40; after receiving the signal, the test equipment 40 processes it (for example, simulates conduction or radiation effects) and passes the processed signal to the acquisition card 20; after receiving the signal output by the acquisition card 20, the spectrum analyzer 50 converts it into a spectrum diagram, and the tester can use the spectrum diagram to verify whether the system meets the test standards.

[0045] Therefore, the test system 10 can effectively evaluate and ensure the electromagnetic compatibility of the test equipment and meet the test requirements of various application scenarios.

[0046] In view of this, the present application proposes a test method based on comb signals to solve the above problems, which is described in detail below.

[0047] See also Figure 2 , Figure 2 A flow chart of a comb signal-based testing method provided in an embodiment of the present invention includes the following steps:

[0048] S10: Acquire at least one frequency point based on a comb signal and an amplitude corresponding to each frequency point in the at least one frequency point.

[0049] The acquisition process can be used to set the test frequency points based on the test requirements. These frequency points can be fixed or customized based on the test requirements. These frequency points may cover the entire frequency range or be concentrated in a specific frequency band. For example, for electromagnetic compatibility (EMC) testing, it may be necessary to focus on certain key frequency points to evaluate the system's performance at these frequency points.

[0050] The amplitude refers to the strength or level of the signal at that frequency point, and is usually set based on the requirements of the test standard or the characteristics of the device under test.

[0051] In practice, the host computer inputs or selects the frequencies to be tested. For example, the tester might select frequencies such as 100kHz, 500kHz, and 1MHz. An amplitude is set for each selected frequency, such as -30dBm or -20dBm, depending on the test requirements. The host computer sends this frequency and amplitude information to the acquisition card, which generates a corresponding signal based on these parameters. The acquisition card outputs a composite signal containing all selected frequencies and their corresponding amplitudes. This signal is used as the test signal for electromagnetic compatibility testing of the device under test.

[0052] It can be seen that in this embodiment, by obtaining and defining multiple frequency points and their corresponding amplitudes, the user can customize the frequency components of the test signal according to specific needs, thereby improving the flexibility of the test and enabling the test to be accurately verified at specific frequency points without being restricted by the fixed frequency points of the traditional comb signal source.

[0053] S20: Perform time domain conversion on the at least one frequency point and the amplitude corresponding to each of the at least one frequency point to obtain time domain data corresponding to the at least one frequency point.

[0054] The frequency domain describes the distribution of a signal at different frequencies. A spectrogram shows the amplitude and phase at each frequency point. The time domain describes how a signal changes over time. Time domain data is the actual representation of a signal on a time axis, providing a visual representation of the signal's waveform and changes.

[0055] Among them, the frequency point is the specific frequency component in the comb signal, and each frequency point has a corresponding amplitude in the spectrum; the amplitude is the amplitude at each frequency point, which represents the signal strength at that frequency. The amplitude is used to describe the intensity distribution of the signal in the frequency domain.

[0056] Time-domain data is typically an array of real numbers, representing the amplitude of a signal at a series of discrete time points. The length of the time-domain data determines the temporal resolution—the time interval that can be resolved. Longer time-domain data yields higher temporal resolution, but also increases computational complexity and storage requirements. Converting frequency-domain information to the time-domain can help analyze signal performance under actual test conditions.

[0057] Among them, the purpose of time domain conversion is to convert discrete frequency points and amplitude information in the frequency domain into continuous signals in the time domain, so as to observe the changes of the signal over time.

[0058] It can be seen that in this embodiment, a time domain signal for electromagnetic compatibility testing can be generated from the perspective of the frequency domain, which is crucial for subsequent signal acquisition and analysis.

[0059] In one embodiment, performing time domain conversion on the at least one frequency point and the amplitude corresponding to each of the at least one frequency point to obtain time domain data corresponding to the at least one frequency point includes: generating a spectrum data matrix based on the at least one frequency point and the amplitude corresponding to each of the at least one frequency point; and performing inverse Fourier transform calculation on the spectrum data matrix to obtain time domain data corresponding to the at least one frequency point.

[0060] The spectrum data matrix is ​​a matrix-like data structure that stores each frequency point and its corresponding amplitude and phase. The spectrum data matrix can contain data for multiple frequency points, with each row typically representing the amplitude and phase of a frequency point.

[0061] Specifically, the frequency points and corresponding amplitude data set by the host computer are organized into a matrix. For example, each row of the matrix may represent the amplitude and (optional) phase information of a frequency point.

[0062] Specifically, the inverse Fourier transform is a mathematical transformation used to convert frequency domain data (i.e., frequency points and their amplitudes) into time domain data (i.e., signal changes over time). The time domain signal waveform can be obtained by combining the frequency components of the frequency domain signal.

[0063] For example, specify the frequency points to be converted (e.g., 100kHz, 200kHz, etc.) and the corresponding amplitudes (e.g., 1V, 0.5V, etc.). Create a spectral data matrix, typically the same size as the number of sampling points. If the sampling rate is Fs and the maximum duration of the signal to be analyzed is T, then the number of sampling points is Fs*T. In the matrix, rows represent sampling points and columns represent frequency components. In the spectral data matrix, fill the columns corresponding to the selected frequency points with the corresponding amplitudes. Leave the columns corresponding to the unselected frequency points at zero. If phase is considered, the amplitudes must be combined with the phase information to form a complex number for filling. Due to the symmetry of the Fourier transform, if only the positive frequency component is of interest, the spectral data may need to be symmetrically expanded before the IFFT to ensure that the time domain signal is real. Calculations are performed on the filled spectral data matrix using the inverse Fourier transform. The result is a time domain data array that represents the waveform of the original comb signal on the time axis. This array contains information about the amplitude of the signal as it changes over time.

[0064] It can be seen that in this embodiment, by constructing a spectrum data matrix and performing inverse Fourier transform calculations on it, corresponding time domain data can be obtained from frequency domain data, providing necessary information for signal testing and system analysis.

[0065] S30. Perform signal processing on the time domain data corresponding to the at least one frequency point according to the acquired acquisition parameters to obtain target spectrum data.

[0066] Acquisition parameters refer to various settings used to control signal acquisition, including but not limited to sampling rate, sampling time, bandwidth, etc. Acquisition parameters may be manually set by the user based on test requirements or automatically generated by the test software based on preset test standards, and are not limited here.

[0067] Specifically, the sampling rate refers to the number of times per second that data is sampled from a continuous signal, typically measured in Hertz (Hz). The sampling rate directly affects the frequency and time resolution of the signal. Depending on the signal's maximum frequency, the sampling rate should be at least twice that of the highest frequency to satisfy the Nyquist theorem and avoid aliasing.

[0068] For example, choose an appropriate sampling rate based on the bandwidth and frequency range of the signal. For example, for a signal with a bandwidth of 20kHz, the sampling rate should be at least 40kHz. If higher frequency resolution is required, a higher sampling rate can be selected.

[0069] Before starting acquisition, the sampling rate of the acquisition card needs to be set according to the test requirements. This can be done through the control software of the acquisition card, and ensure that the internal sampling rate of the spectrum analyzer is synchronized with the sampling rate of the acquisition card to ensure data consistency and accuracy.

[0070] Furthermore, when the acquisition card configuration is completed, the spectrum analyzer is controlled to start acquiring the frequency domain data sent by the acquisition card, and the acquisition card will cyclically output the signal at the set sampling rate.

[0071] Optionally, the frequency domain data collected by the spectrum analyzer can be analyzed and processed by a host computer.

[0072] Among them, the target spectrum diagram is an image generated after the spectrum analyzer collects frequency domain data, showing the intensity or power distribution of the signal at different frequencies. The target spectrum diagram reflects the frequency component and amplitude of the signal.

[0073] It can be seen that in this embodiment, by performing signal processing on the time domain data and then obtaining the target spectrum data, the reliability and efficiency of the entire testing process can be significantly improved.

[0074] In one embodiment, the acquisition parameters include a sampling rate and a sampling time; the signal processing is performed on the time domain data corresponding to the at least one frequency point according to the acquired acquisition parameters to obtain target spectrum data, including: determining the number of sampling points according to the sampling rate and the sampling time; performing data preprocessing on the time domain data corresponding to the at least one frequency point to obtain a plurality of preprocessed time domain data; dividing the plurality of preprocessed time domain data into a plurality of target segments according to the sampling time, the data length of each target segment being equal to the number of sampling points; performing Fourier transform calculation on the plurality of target segments to obtain spectrum data corresponding to each of the plurality of target segments; and determining that the spectrum data corresponding to all of the target segments is the target spectrum data.

[0075] The number of sampling points is the total number of samples collected during the entire sampling time; the number of sampling points is equal to the sampling rate multiplied by the sampling time.

[0076] Data preprocessing aims to improve the quality of collected data for more accurate spectral analysis. Preprocessing steps typically include denoising, signal detrending, and windowing. Specifically, denoising involves applying filters or denoising algorithms (such as mean filtering or median filtering) to reduce random noise in the signal and improve clarity. Detrending eliminates long-term trends or DC offsets in time-domain data to avoid misleading spectrograms. Windowing uses window functions (such as Hamming and Hanning windows) to reduce spectral leakage caused by signal truncation and improve the frequency resolution of the spectrogram.

[0077] As a result, the preprocessed time domain data is cleaner and more consistent, and more suitable for subsequent data conversion and analysis.

[0078] Specifically, the preprocessed time domain data is divided into multiple target segments according to the sampling time. The data length of each target segment should be equal to the number of sampling points. This is achieved by dividing the entire time domain data into continuous blocks, each containing N samples, where N corresponds to the number of sampling points.

[0079] The calculation in this step refers to converting the time domain data into frequency domain data through Fourier transform in order to analyze the frequency components of the signal. The spectrum data includes the frequency components and their corresponding amplitudes (sometimes also phase information).

[0080] In the implementation of the calculation, a fast Fourier transform (FFT) is performed on the preprocessed time domain data to convert the data from the time domain to the frequency domain, and the amplitude and frequency information are extracted from the frequency domain data to form spectrum data, and it is ensured that the frequency axis in the spectrum data correctly corresponds to the actual frequency point.

[0081] Specifically, the spectrum data of each target segment includes the frequency components and corresponding amplitudes of the signal of that segment; by combining the spectrum data of all target segments, the target spectrum data within the entire acquisition time is obtained.

[0082] It can be seen that in this embodiment, preprocessing is performed to improve data quality, and conversion from the time domain to the frequency domain is performed to reveal the frequency characteristics of the signal.

[0083] S40: Control the spectrum analyzer to collect the target spectrum data to obtain a target spectrum graph.

[0084] In a specific implementation, the target spectrum data is cyclically transmitted by the acquisition card, which can be sent to the spectrum analyzer via a data interface (such as USB, Ethernet, PCIe, etc.). Cyclic transmission is a repeated measurement process, the purpose of which is to continuously collect data so that multiple measurements can be performed to obtain more accurate results.

[0085] Among them, the spectrum data is visualized and the target spectrum diagram is generated to facilitate the analysis and interpretation of the frequency domain characteristics of the signal.

[0086] In a specific implementation, the drawing process can include setting the coordinate axes, labels, and legends of the drawing. The horizontal axis usually represents frequency, and the vertical axis represents amplitude or power. Spectrum data is plotted into a graph using a drawing tool or software (such as Matlab, Python's Matplotlib, Excel, etc.). The frequency axis: The horizontal axis represents the frequency range; the amplitude axis: The vertical axis represents the amplitude or power of the signal at different frequency points.

[0087] Specifically, controlling the spectrum analyzer to collect the target spectrum data and obtain a target spectrum graph includes: setting the sampling rate corresponding to the spectrum analyzer and the sampling rate corresponding to the acquisition parameter to the same value; controlling the spectrum analyzer to collect the target spectrum data according to the sampling rate corresponding to the acquisition parameter to obtain a target spectrum graph.

[0088] The spectrum analyzer needs to be configured according to acquisition parameters to ensure it correctly receives and processes the target spectrum data. After receiving the target spectrum data, the spectrum analyzer acquires it according to the configured parameters. This may include setting appropriate trigger conditions to ensure consistent data acquisition.

[0089] It can be seen that in this embodiment, by ensuring that the spectrum analyzer correctly acquires frequency domain data according to the sampling rate of the acquisition card and generates an accurate spectrum diagram, effective electromagnetic compatibility testing and analysis can be performed.

[0090] S50: Determine whether the test system meets the test standard according to the target frequency spectrum.

[0091] A test standard is a predefined set of parameters or performance indicators used to evaluate and verify whether a system, component, or device meets the expected performance level. These standards can include industry standards, international standards, internal company standards, and so on. Specifically, in this embodiment, the test standard may include specific spectrum requirements, such as the allowable amplitude range, frequency distribution, and interference level.

[0092] Among them, the test standards may include parameters such as signal strength at a specific frequency point, signal-to-noise ratio (SNR), harmonic distortion level, spurious emission level, and frequency stability.

[0093] The target spectrum provides a frequency-domain view of the test system's output signal. By analyzing this spectrum, performance indicators such as the system's frequency response, signal purity, and interference level can be measured and evaluated. Performance indicators extracted from the spectrum are compared with the requirements of the test standard to determine whether the test system meets the standard. For example, if the test standard requires a signal-to-noise ratio of at least a certain value, analysis can clearly demonstrate whether the test system meets this requirement.

[0094] It can be seen that in this embodiment, by systematically evaluating whether the test system meets the standard requirements of the electromagnetic compatibility test, it is ensured that the product or device can operate normally in the electromagnetic environment without causing harmful interference.

[0095] By acquiring and defining multiple frequency points and their corresponding amplitudes, this method allows users to customize the frequency components of the test signal according to specific needs, thereby improving the flexibility of the test and enabling the test to be accurately verified for specific frequency points without being restricted by the fixed frequency points of traditional comb signal sources. Further, the frequency points and their amplitudes are converted into the time domain, and then these data are collected by controlling the spectrum analyzer to obtain a more accurate target spectrum diagram, which helps to identify and quantify performance deviations in the test system. Moreover, by analyzing the target spectrum diagram, it is determined whether the test system meets the predetermined test standards. Automated standard compliance detection improves the efficiency of the test process, reduces the need for manual intervention, and can more easily identify problem points in the test system, such as offset, interference, etc., and then determine whether the system has deviations or does not meet the standards. Therefore, this method provides a more efficient, accurate and flexible testing method, which helps to improve the reliability and efficiency of the entire test process.

[0096] In one embodiment, before determining whether the test system meets the test standard based on the target spectrum, the method further includes: obtaining a first spectrum based on the acquired acquisition parameters and the time domain data corresponding to the at least one frequency point.

[0097] The first spectrogram is a theoretical spectrogram, i.e., a theoretical spectrogram generated under ideal conditions based on the acquired acquisition parameters and the time-domain data corresponding to the at least one frequency point. Specifically, the ideal condition is a condition free of actual noise or interference. This ideal condition disregards noise, interference, and non-ideal factors in actual measurement. This spectrogram is called a theoretical spectrogram, assuming that the acquisition equipment and test environment are perfect and introduce no errors.

[0098] Therefore, the theoretical spectrum diagram is generated under the assumption that all equipment and environmental conditions are optimal, so it represents the spectral characteristics of the signal under ideal conditions. Since the uncertainties in actual measurements are not taken into account, the theoretical spectrum diagram is usually very accurate and can be used as a reference standard. The theoretical spectrum diagram is used to compare with the spectrum diagram obtained from actual measurements to evaluate performance deviations in actual measurements.

[0099] It can be seen that in this embodiment, a theoretical spectrum diagram is obtained, which serves as a reference for subsequent actual measured spectrum diagrams for comparison and evaluation of the performance of the actual test system.

[0100] In one embodiment, determining whether the test system meets the test standard based on the target spectrum graph includes: comparing the target spectrum graph with the first spectrum graph to determine whether an offset point appears; determining whether the offset point is within a preset offset range; if it is within the preset offset range, determining that the current test system meets the test standard; or, if it is not within the preset offset range, determining that the current test system does not meet the test standard.

[0101] The target spectrogram is the actual measured spectrogram, generated based on the time-domain data and acquisition parameters obtained during actual testing. It reflects the frequency-domain characteristics of the test system under actual operating conditions. The target spectrogram can be compared with the theoretically expected spectrogram to confirm whether the actual system performance meets expectations.

[0102] The first spectrogram is generated based on a theoretical model or under ideal conditions. Based on pre-set theoretical data and ideal acquisition parameters, it displays the expected frequency domain characteristics of the signal under ideal conditions. The first spectrogram serves as a baseline for comparison with the actual measured target spectrogram.

[0103] In a specific implementation, two spectrograms are placed on top of each other on the same frequency axis for comparison to visually compare the differences between them. The comparison can be performed by visual inspection or by using software tools to automatically identify the differences between corresponding frequency points in the two spectrograms, which is not limited here.

[0104] The offset point refers to a frequency point in the target spectrum graph whose amplitude or phase is different from the corresponding point in the first spectrum graph.

[0105] The preset offset range is the maximum allowable amplitude or phase deviation range defined in the test standard or specification. The preset offset range is usually based on the performance requirements of the test system and the specifications of the device under test.

[0106] Specifically, if the deviations of all offset points are within the preset offset range, then the performance of the test system can be considered acceptable and it meets the test standard; if the deviation of any offset point exceeds the preset offset range, then the performance of the test system is considered unqualified and it does not meet the test standard.

[0107] It can be seen that in this embodiment, whether the test system meets the test requirements is evaluated by comparing the actual measurement results with the theoretical expectations, thereby ensuring the accuracy and reliability of the test system.

[0108] In one embodiment, after determining that the current test system does not meet the test standard if it is not within the preset offset range, the method further includes: obtaining the position and amplitude of the offset point, and the degree of deviation of the offset point; analyzing the offset point to obtain adjustment parameters, and the adjustment parameters are used to adjust the test system; and retesting according to the adjustment parameters.

[0109] The offset point refers to the specific frequency point on the frequency axis of the spectrum where the amplitude deviates. It is usually expressed as a frequency value (Hz). The amplitude of the offset point refers to the difference between the actual measured signal amplitude and the theoretical expected amplitude at that frequency point.

[0110] Specifically, the position of the offset point can be found by comparing the target spectrum diagram (actual measurement) and the first spectrum diagram (theoretical prediction) to find the frequency point in the actual measured spectrum that is different from the theoretical value; the amplitude of the offset point can be extracted from the spectrum diagram by extracting the actual measured amplitude and the theoretical expected amplitude, and calculating the difference between them.

[0111] Deviation refers to the difference between the actual measured value and the expected value. It can be a difference in amplitude or phase, and is typically expressed in decibels (dB) or degrees (°). The degree of deviation can be quantified by calculating the absolute difference in amplitude or the relative difference (for example, percentage deviation).

[0112] The purpose of analyzing offset points is to understand the causes of these deviations and determine how to adjust the test system to eliminate or reduce them. This analysis may include examining the calibration status of the test equipment, changes in the test environment, interference in the signal path, and instrument settings. This typically involves specialized knowledge and technical experience.

[0113] The analysis process may include but is not limited to the following: if there is a single-point offset, it means that the deviation of a certain frequency point may be due to a specific hardware or setting problem; if there is a multi-point offset, it means that the deviation of multiple frequency points may indicate an overall setting problem of the system or environmental interference.

[0114] Furthermore, the causes of the offset may include but are not limited to the following: hardware problems, such as nonlinearity or drift of the signal source or test equipment; setup errors, such as incorrect sampling rate settings or inaccurate system calibration; environmental influences, such as external electromagnetic interference or changes in the test environment.

[0115] Adjustment parameters may include gain adjustment, filter setting, frequency correction, power management, etc. The purpose of adjusting parameters is to correct offsets and improve the performance of the test system to make it closer to theoretical expectations.

[0116] Specifically, the test system is modified accordingly based on the obtained adjustment parameters, which may involve hardware reconfiguration, software parameter updates, or test environment optimization.

[0117] In practice, retesting is performed to verify whether the adjusted parameters are effective and whether the test system now meets the test criteria. Following the same test procedure and conditions, data is collected again, a new spectrum is generated, and the previous comparison and analysis steps are repeated. If the adjusted test results show that the offset point is within the preset offset range, the test system can be considered to have met the test criteria. If the problem persists, further adjustment and analysis may be required.

[0118] It can be seen that the iterative method in this embodiment ensures that the test system can accurately measure signals in actual operation and meet the predetermined test standards.

[0119] It should be noted that, in each of the above-mentioned embodiments, there is not necessarily a certain order between the above-mentioned steps. A person skilled in the art can understand, based on the description of the embodiments of this application, that in different embodiments, the above-mentioned steps may have different execution orders, that is, they may be executed in parallel, or may be executed interchangeably, etc.

[0120] As another aspect of the present invention, an embodiment of the present invention provides a comb signal-based test device. The comb signal-based test device can be a software module comprising a plurality of instructions stored in a memory. A processor can access the memory and call the instructions for execution to implement the comb signal-based test method described in each of the above embodiments.

[0121] See also Figure 3 , Figure 3 Schematic diagram of a test device based on comb signals provided in an embodiment of the present application. Figure 3 As shown, the comb signal-based test device 300 includes:

[0122] An acquiring unit 301 is configured to acquire at least one frequency point based on a comb signal and an amplitude corresponding to each frequency point in the at least one frequency point;

[0123] A conversion unit 302 is configured to perform time domain conversion on the at least one frequency point and the amplitude corresponding to each of the at least one frequency point to obtain time domain data corresponding to the at least one frequency point;

[0124] The determining unit 303 is configured to perform signal processing on the time domain data corresponding to the at least one frequency point according to the acquired acquisition parameters to obtain target spectrum data;

[0125] The determining unit 303 is further configured to control the spectrum analyzer to collect the target spectrum data and obtain a target spectrum graph;

[0126] The determining unit 303 is further configured to determine whether the test system meets a test standard according to the target frequency spectrum.

[0127] By acquiring and defining multiple frequency points and their corresponding amplitudes, this method allows users to customize the frequency components of the test signal according to specific needs, thereby improving the flexibility of the test and enabling the test to be accurately verified for specific frequency points without being restricted by the fixed frequency points of traditional comb signal sources. Further, the frequency points and their amplitudes are converted into the time domain, and then these data are collected by controlling the spectrum analyzer to obtain a more accurate target spectrum diagram, which helps to identify and quantify performance deviations in the test system. Moreover, by analyzing the target spectrum diagram, it is determined whether the test system meets the predetermined test standards. Automated standard compliance detection improves the efficiency of the test process, reduces the need for manual intervention, and can more easily identify problem points in the test system, such as offset, interference, etc., and then determine whether the system has deviations or does not meet the standards. Therefore, this method provides a more efficient, accurate and flexible testing method, which helps to improve the reliability and efficiency of the entire test process.

[0128] In one embodiment, in performing time domain conversion on the at least one frequency point and the amplitude corresponding to each of the at least one frequency point to obtain time domain data corresponding to the at least one frequency point, the conversion unit 302 is further used to generate a spectrum data matrix based on the at least one frequency point and the amplitude corresponding to each of the at least one frequency point; and perform inverse Fourier transform calculation on the spectrum data matrix to obtain time domain data corresponding to the at least one frequency point.

[0129] In one embodiment, in the step of performing signal processing on the time domain data corresponding to the at least one frequency point according to the acquired acquisition parameters to obtain target spectrum data, the determination unit 303 is further used to determine the number of sampling points according to the sampling rate and the sampling time; perform data preprocessing on the time domain data corresponding to the at least one frequency point to obtain a plurality of preprocessed time domain data; divide the plurality of preprocessed time domain data into a plurality of target segments according to the sampling time, the data length of each target segment being equal to the number of sampling points; perform Fourier transform calculation on the plurality of target segments to obtain spectrum data corresponding to each of the plurality of target segments; and determine that the spectrum data corresponding to all of the target segments is the target spectrum data.

[0130] In one embodiment, in controlling the spectrum analyzer to collect the target spectrum data and obtain a target spectrum graph, the determining unit 303 is further used to set the sampling rate corresponding to the spectrum analyzer and the sampling rate corresponding to the acquisition parameter to the same value; and control the spectrum analyzer to collect the target spectrum data according to the sampling rate corresponding to the acquisition parameter to obtain a target spectrum graph.

[0131] In one embodiment, before determining whether the test system meets the test standard based on the target spectrum, the determining unit 303 is further configured to obtain a first spectrum based on the acquired acquisition parameters and the time domain data corresponding to the at least one frequency point.

[0132] In one embodiment, in determining whether the test system meets the test standard based on the target spectrum diagram, the determination unit 303 is further used to compare the target spectrum diagram with the first spectrum diagram to determine whether an offset point appears; determine whether the offset point is within a preset offset range; if it is within the preset offset range, determine that the current test system meets the test standard; or, if it is not within the preset offset range, determine that the current test system does not meet the test standard.

[0133] In one embodiment, after determining that the current test system does not meet the test standard if it is not within the preset offset range, the determination unit 303 is further used to obtain the position and amplitude of the offset point, and the degree of deviation of the offset point; analyze the offset point to obtain adjustment parameters, and the adjustment parameters are used to adjust the test system; and re-test according to the adjustment parameters.

[0134] It should be noted that the comb signal-based test device described above can execute the comb signal-based test method provided in the embodiments of this application, and has the corresponding functional modules and beneficial effects of executing the method. For technical details not fully described in the embodiments of the comb signal-based test device, please refer to the comb signal-based test method provided in the embodiments of this application.

[0135] See also Figure 4 , Figure 4 4 is a schematic diagram of the structure of a computer device provided in an embodiment of the present application. The computer device includes one or more processors 41 and a memory 42. The memory 42 is connected to the one or more processors 41, for example, via a bus.

[0136] The processor 41 is configured to support the computer device in executing the corresponding functions of the method in the above method embodiment. The processor 41 can be a central processing unit (CPU), a network processor (NP), a hardware chip, or any combination thereof. The above hardware chip can be an application specific integrated circuit (ASIC), a programmable logic device (PLD), or a combination thereof. The above PLD can be a complex programmable logic device (CPLD), a field-programmable gate array (FPGA), a generic array logic (GAL), or any combination thereof.

[0137] Memory 42 is used to store program code, etc. Memory 42 may include volatile memory (VM), such as random access memory (RAM); non-volatile memory (NVM), such as read-only memory (ROM), flash memory, hard disk drive (HDD), or solid-state drive (SSD); or a combination of the aforementioned types of memory.

[0138] The memory 42 can be used to store non-volatile software programs, non-volatile computer executable programs, and modules, such as the program instructions / modules corresponding to the comb signal-based test method in the embodiments of the present application. The processor 41 executes the non-volatile software programs, instructions, and modules stored in the memory 42 to execute the various functional applications and data processing of the comb signal-based test method and the comb signal-based test device, thereby realizing the functions of the various modules or units of the comb signal-based test method and the comb signal-based test device provided in the above-mentioned method embodiments.

[0139] Memory 42 may include a program storage area and a data storage area. The program storage area may store an operating system and application programs required for at least one function. The data storage area may store data generated by the use of the comb signal-based test device, etc. In some embodiments, memory 42 may optionally include a memory 42 remote from processor 41. Such remote memory 42 may be connected to the comb signal-based test device via a network. Examples of such networks include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0140] The one or more modules are stored in the memory 42. When executed by the one or more processors 41, the comb signal-based test method in any of the above-mentioned method embodiments is executed, for example, the method steps described in the above-mentioned method embodiments are executed to realize the functions of the modules described in the above-mentioned device embodiments.

[0141] An embodiment of the present application further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, wherein the computer program includes program instructions, and when the program instructions are executed by a computer, the computer executes the method as described in the above embodiment.

[0142] Those skilled in the art will appreciate that all or part of the processes in the above-described method embodiments can be implemented by instructing related hardware through a computer program. The program can be stored in a computer-readable storage medium, and when executed, the program can include the processes in the above-described method embodiments. The storage medium can be a magnetic disk, an optical disk, a read-only memory (ROM), or a random access memory (RAM).

[0143] The above disclosure is only a preferred embodiment of the present application, and certainly cannot be used to limit the scope of rights of the present application. Therefore, equivalent changes made according to the claims of the present application are still within the scope covered by the present application.

Claims

1. A test method based on comb signals, characterized in that: Applied to a test system, the test system including a spectrum analyzer, the method comprising: Acquire at least one frequency point based on the comb signal and an amplitude corresponding to each frequency point in the at least one frequency point; Performing time domain conversion on the at least one frequency point and the amplitude corresponding to each frequency point in the at least one frequency point to obtain time domain data corresponding to the at least one frequency point; performing signal processing on the time domain data corresponding to the at least one frequency point according to the acquired acquisition parameters to obtain target spectrum data; Controlling the spectrum analyzer to collect the target spectrum data to obtain a target spectrum graph; Determine whether the test system meets the test standard according to the target frequency spectrum.

2. The method according to claim 1, characterized in that The performing time domain conversion on the at least one frequency point and the amplitude corresponding to each of the at least one frequency point to obtain time domain data corresponding to the at least one frequency point includes: generating a frequency spectrum data matrix according to the at least one frequency point and the amplitude corresponding to each frequency point in the at least one frequency point; Perform inverse Fourier transform calculation on the spectrum data matrix to obtain time domain data corresponding to the at least one frequency point.

3. The method according to claim 1, characterized in that The acquisition parameters include a sampling rate and a sampling time; and the signal processing is performed on the time domain data corresponding to the at least one frequency point according to the acquired acquisition parameters to obtain target spectrum data, including: Determining the number of sampling points according to the sampling rate and the sampling time; Performing data preprocessing on the time domain data corresponding to the at least one frequency point to obtain a plurality of preprocessed time domain data; Dividing the preprocessed multiple time domain data into multiple target segments according to the sampling time, wherein the data length of each target segment is equal to the number of sampling points; Performing Fourier transform calculation on the multiple target segments to obtain spectrum data corresponding to each target segment in the multiple target segments; The spectrum data corresponding to all the target segments is determined as the target spectrum data.

4. The method according to claim 1, wherein The controlling the spectrum analyzer to collect the target spectrum data to obtain a target spectrum graph includes: Setting the sampling rate corresponding to the spectrum analyzer and the sampling rate corresponding to the acquisition parameter to the same value; The spectrum analyzer is controlled to collect the target spectrum data according to the sampling rate corresponding to the acquisition parameter to obtain a target spectrum graph.

5. The method according to claim 1, wherein Before determining whether the test system meets the test standard according to the target spectrum diagram, the method further includes: A first frequency spectrum is obtained according to the acquired acquisition parameters and the time domain data corresponding to the at least one frequency point.

6. The method according to claim 5, characterized in that Determining whether the test system meets the test standard according to the target frequency spectrum includes: Comparing the target spectrum with the first spectrum to determine whether an offset point occurs; Determining whether the offset point is within a preset offset range; If it is within the preset offset range, it is determined that the current test system meets the test standard; or, If it is not within the preset offset range, it is determined that the current test system does not meet the test standard.

7. The method according to claim 6, characterized in that After determining that the current test system does not meet the test standard if the value is not within the preset offset range, the method further includes: Obtaining the position and amplitude of the offset point, and the degree of deviation of the offset point; Analyzing the offset point to obtain an adjustment parameter, wherein the adjustment parameter is used to adjust the test system; Re-test according to the adjustment parameters.

8. A comb signal-based test device, applied to a test system including a spectrum analyzer, comprising: an acquiring unit, configured to acquire at least one frequency point based on the comb signal and an amplitude corresponding to each frequency point in the at least one frequency point; a conversion unit, configured to perform time domain conversion on the at least one frequency point and the amplitude corresponding to each of the at least one frequency point to obtain time domain data corresponding to the at least one frequency point; a determining unit, configured to perform signal processing on the time domain data corresponding to the at least one frequency point according to the acquired acquisition parameters to obtain target spectrum data; The determining unit is further configured to control the spectrum analyzer to collect the target spectrum data and obtain a target spectrum graph; The determining unit is further configured to determine whether the test system meets a test standard according to the target frequency spectrum.

9. A computer device comprising a memory and a processor, wherein the memory is connected to the processor, and the processor is configured to execute one or more computer programs stored in the memory, wherein when the processor executes the one or more computer programs, the computer device implements the method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a computer program, wherein the computer program includes program instructions, and when the program instructions are executed by a processor, the processor is caused to perform the method according to any one of claims 1 to 7.

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