Microscope binocular parallelism error measuring device and method

Abstract

The invention discloses a binocular parallelism error measuring device and method for a microscope. The binocular parallelism error measuring device of the microscope comprises a base and a first measuring assembly and a second measuring assembly which are located on the base, the first measuring assembly comprises a first detector, a first lens cone and a first objective lens which are connected in sequence, and the second measuring assembly comprises a second detector, a second lens cone and a second objective lens which are connected in sequence. The first objective lens and the second objective lens are used for respectively aligning with an ocular lens of a binocular microscope to be detected, and the first detector and the second detector are used for respectively displaying respective centers and received cross images of the binocular microscope on a display device.

Description

Technical Field

[0001] The present application relates to the field of instrument measurement technology, and in particular to a device and method for measuring binocular parallelism difference of a microscope. Background Art

[0002] Usually, the left and right outgoing beams of the left and right tubes of a binocular microscope should be parallel. When measured at any position within the pupil distance range of 55mm-75mm, the parallelism error should meet the following requirements: the divergence in the horizontal direction should not exceed 60'; the convergence in the horizontal direction should not exceed 30'; and the crossover in the vertical direction should not exceed 30'. The instrument for measuring the parallelism difference of the left and right outgoing beams of the left and right tubes of a binocular microscope is a microscope binocular parallelism difference measuring instrument.

[0003] Figure 1 A conventional microscope binocular parallelism difference measuring instrument is shown. During measurement, the crosshairs are placed on the stage of the microscope to be measured, and the focusing handwheel of the microscope objective is adjusted to focus the crosshairs clearly, and the image of the crosshairs is centered. Then, the left optical system of the microscope binocular parallelism difference measuring instrument is used to aim at the crosshairs in the eyepiece of the microscope to be measured, and then the right optical axis deflection knob of the microscope binocular parallelism difference measuring instrument is adjusted to achieve the aiming of the optical axis on the other side. The parallelism of the left and right outgoing light beams of the left and right lens barrels of the binocular microscope can be measured by the angle formed by the deflection of the binocular measuring instrument and the rotating shaft. In particular, when there is a high and low azimuth parallelism difference in the light beam, it is necessary to rotate the entirety of the microscope binocular parallelism difference measuring instrument and the tilting handwheel of the graticule to measure the parallelism of the outgoing light beam of the microscope.

[0004] The traditional method uses the adjustment of the mechanical axis of the optical axis, and requires the absolute coincidence of the optical axis to achieve the measurement of the optical axis parallelism error. There are the following technical problems: 1) During the measurement process, the crosshair image must be aligned with the graticule image on one side, and the reading is taken on the other side. The human eye is aligned during measurement, the alignment accuracy is low, it is easily disturbed by external factors, and the measurement repeatability is poor. 2) The measurement is achieved through a mechanical micrometer, and then converted into an angle through the distance relative to the fixed rotating shaft, which has low accuracy. 3) The mechanical adjustment and its measurement operation are relatively cumbersome and complicated, and errors are easily introduced in principle. 4) When there is an optical axis parallelism error in the upper and lower positions, the measurement is more complicated. Summary of the invention

[0005] The present application proposes a microscope binocular parallelism difference measuring device and method, which has simple installation and adjustment, good measurement repeatability, simple measurement process and high measurement accuracy, so as to solve the above technical problems.

[0006] According to a first aspect of the present application, a microscope binocular parallel difference measuring device is provided, comprising: a base and a first measuring component and a second measuring component located thereon, wherein the first measuring component comprises a first detector, a first lens barrel and a first objective lens connected in sequence, the second measuring component comprises a second detector, a second lens barrel and a second objective lens connected in sequence, the first objective lens and the second objective lens are used to respectively align an eyepiece of a binocular microscope to be measured, and the first detector and the second detector are used to respectively display their respective centers and the received crosshair images of the binocular microscope on a display device.

[0007] In an optional embodiment, the microscope binocular parallel difference measuring device further includes: a sliding component, and at least one of the first measuring component and the second measuring component is slidably connected to the base through the sliding component.

[0008] In an optional embodiment, the first detector and the second detector are CCD image sensors; the microscope binocular parallel difference measuring device also includes: a first sleeve and a second sleeve, which are used to assist the first objective lens and the second objective lens to align with one eyepiece of the binocular microscope respectively.

[0009] According to a second aspect of the present application, a method for measuring binocular parallelism of a microscope is provided, which is implemented using a device for measuring binocular parallelism of a microscope according to the first aspect, and the method comprises: connecting a first detector and a second detector to a display device to display images transmitted by the first detector and the second detector; aligning a first objective lens and a second objective lens with two eyepieces of a binocular microscope; adjusting a sliding assembly on the display device so that the centers of crosshair images received by the first detector and the second detector are respectively located near the center of the first detector and the center of the second detector; processing the image on the display device to obtain the position of the center of the crosshair image received by the first detector relative to the center of the first detector and the position of the center of the crosshair image received by the second detector relative to the center of the second detector; and calculating the directional deviation of binocular output light of the microscope using the focal length of the objective lens.

[0010] In an optional embodiment, the microscope binocular parallel difference measurement method also includes: using a microscope binocular parallel difference measurement device to receive parallel light emitted by a collimator with a graticule; adjusting the position of the first detector and / or the second detector so that the center of the cross-line image received by both is located near the center of their field of view; fixing the first detector and the second detector, and setting respective center lines at the positions of the cross-line images received by the first detector and the second detector.

[0011] According to a third aspect of the present application, a microscope binocular parallel difference measuring device is provided, comprising: a base and a first measuring component and a second measuring component located thereon, wherein the first measuring component comprises a first detector, a first lens barrel and a first objective lens connected in sequence, the second measuring component comprises an eyepiece, a second lens barrel and a second objective lens connected in sequence, the eyepiece is provided with a graticule, the first objective lens and the second objective lens are used to respectively align with one eyepiece of a binocular microscope to be measured, and the first detector is used to display its center and a received crosshair image of the binocular microscope on a display device.

[0012] In an optional embodiment, the microscope binocular parallel difference measuring device further includes: a sliding component, and at least one of the first measuring component and the second measuring component is slidably connected to the base through the sliding component.

[0013] In an optional embodiment, the first detector is a CCD image sensor; the microscope binocular parallel difference measuring device also includes: a first sleeve and a second sleeve, which are used to assist the first objective lens and the second objective lens to align with one eyepiece of the binocular microscope respectively.

[0014] According to a fourth aspect of the present application, a method for measuring binocular parallelism of a microscope is provided, which is implemented using a binocular parallelism measuring device for a microscope according to the third aspect, and the method comprises: connecting a first detector to a display device to display an image transmitted by the first detector; aligning a first objective lens and a second objective lens with two eyepieces of a binocular microscope; fine-tuning the binocular parallelism measuring device for the microscope so that the center of a crosshair image of the binocular microscope observed on the eyepiece of the second measuring component is aligned with the center of a graticule, and the center of a crosshair image received by the first detector on the display device is located near the center of the first detector; processing the image on the display device to obtain a position of the center of the crosshair image received by the first detector relative to the center of the first detector; and calculating the direction deviation of binocular output light of the microscope using the focal length of the objective lens.

[0015] In an optional embodiment, the microscope binocular parallel difference measurement method also includes: using a microscope binocular parallel difference measurement device to receive parallel light emitted by a collimator with a graticule; aligning the center of the graticule of the eyepiece of the second measuring component with the center of the observed cross-line image; adjusting the position of the first detector so that the center of the cross-line image received by it is located near the center of its field of view; fixing the first detector and setting its center line at the position of the cross-line image received by the first detector.

[0016] The beneficial effects of the present application are as follows: the binocular parallel difference measuring device and method of the microscope provided by the present application utilizes a binocular camera to simulate the human eye for measurement, which can effectively avoid the measurement error introduced by human eye fatigue during multiple measurements, and has good measurement repeatability; the detector is used to receive the crosshair image, and image processing is performed on the computer to obtain the number of pixel points from the center of the crosshair image to the center of the detector, and then the offset angle is converted according to the focal length of the objective lens. The installation and adjustment process of the device using a collimator only needs to ensure that the grating plate image received by the two detectors is in the center of the display screen, and then the detector center is set according to the grating plate image, and the installation and adjustment requirements are low, the process is simple and convenient, and the reliability is high. At the same time, the measurement accuracy is directly related to the pixel size of the detector, and the measurement accuracy is greatly improved compared with the traditional measurement method. Using a binocular camera to image the crosshair image emitted by the binocular of the microscope, the offset value of the center of the two crosshair images relative to the center of each detector can be obtained, and the deviation of the two emitted light beams can be directly calculated, which eliminates the need to overlap the center of the crosshair image on one side with the center image of the grating plate in the traditional measurement method, and the measurement process is simple and the measurement result is reliable. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The advantages of the above and / or additional aspects of the present application will become apparent and easily understood in the description of the embodiments in conjunction with the following drawings, in which:

[0018] Figure 1 A conventional microscope binocular parallelism measuring instrument is shown.

[0019] Figure 2 It is a schematic structural diagram of a microscope binocular parallel difference measuring device according to an embodiment of the present application.

[0020] Figure 3 The relative positions of the two CCD centers and the crosshair image are schematically shown.

[0021] Figure 4 It is a structural schematic diagram of a microscope binocular parallel difference measuring device according to another embodiment of the present application.

[0022] Reference numerals:

[0023] 100-base, 1-first measuring assembly, 11-first detector, 12-first lens barrel, 13-first objective lens, 14-first sleeve, 2-second measuring assembly, 21-second detector, 22-second lens barrel, 23-second objective lens, 24-second sleeve, 3-slider, 4-top cover, 5-adjusting screw. DETAILED DESCRIPTION

[0024] In order to more clearly understand the above-mentioned purposes, features and advantages of the present application, the present application is further described in detail below in conjunction with the accompanying drawings and specific implementation methods. It should be noted that the embodiments of the present application and the features in the embodiments can be combined with each other without conflict.

[0025] In the following description, many specific details are elaborated to facilitate a full understanding of the present application. However, the present application may also be implemented in other ways different from those described herein. Therefore, the scope of protection of the present application is not limited to the specific embodiments disclosed below.

[0026] Example 1

[0027] like Figure 2 As shown, this embodiment provides a microscope binocular parallel difference measuring device, which includes: a base 100 and a first measuring component 1 and a second measuring component 2 located thereon. The first measuring component 1 includes a first detector 11, a first lens barrel 12 and a first objective lens 13 connected in sequence, and the second measuring component 2 includes a second detector 21, a second lens barrel 22 and a second objective lens 23 connected in sequence. The first objective lens 13 and the second objective lens 23 are used to align one eyepiece of the binocular microscope to be measured respectively. The first detector 11 and the second detector 21 are used to display their respective centers and the received crosshair images of the binocular microscope on a display device (not shown).

[0028] The first detector 11 and the second detector 12 may be, for example, CCD image sensors. Figure 3 The relative positions of the two CCD centers and the crosshair image are schematically shown.

[0029] At least one of the first measuring component 1 and the second measuring component 2 can be slidably connected to the base 100 through a sliding component. For example, the first measuring component 1 is fixedly connected to the base 100, and the second measuring component 2 is slidably connected to the base 100. A dovetail groove is provided on the base 100, and the sliding component includes a slider 3 located in the dovetail groove and fixedly connected to at least one of the first lens barrel 12 and the second lens barrel 22, a top cover 4 fixed to the base 100, and an adjusting screw 5 penetrating the top cover 4 and resting on the slider 3, the slider 3 can slide in the dovetail groove, and the adjusting screw 5 is used to lock the slider.

[0030] The microscope binocular parallelism difference measuring device may further include a first sleeve 14 and a second sleeve 24 for assisting the first objective lens 13 and the second objective lens 23 to align with one eyepiece of the binocular microscope respectively.

[0031] The method for measuring the binocular parallelism difference of a microscope using the above device comprises the following steps.

[0032] The first detector 11 and the second detector 21 are connected to a display device to display images transmitted by the first detector 11 and the second detector 12 .

[0033] The first objective lens 13 and the second objective lens 23 are aligned with the two eyepieces of the binocular microscope.

[0034] The sliding assembly is adjusted so that the centers of the cross-line images received by the first detector 11 and the second detector 12 are located near the center of the first detector and the center of the second detector respectively on the display device.

[0035] The image on the display device is processed to obtain the position of the center of the crosshair image received by the first detector 11 relative to the center of the first detector and the position of the center of the crosshair image received by the second detector 12 relative to the center of the second detector.

[0036] The direction deviation of the binocular light output from the microscope is calculated using the focal length of the objective lens.

[0037] For example, Figure 3 As shown, the number of pixels of the two cross-line image centers relative to the CCD center is (N1, N2) and (N3, N4), the CCD pixel size is a, and the focal length of the objective lens used in the microscope binocular parallel difference measurement device is b. According to the requirements of GB / T2985-2008, the microscope binocular parallel difference measurement device needs to measure the horizontal divergence or convergence of the outgoing light beams of the left and right optical systems of the binocular microscope and the vertical crossover.

[0038] According to the above known parameters combined Figure 3 Calculate horizontal divergence or convergence:

[0039]

[0040] Vertical crossover:

[0041] The CCD center crosshairs divide the CCD imaging area into four blocks. For the crosshair image centers imaged at different positions, the angle calculation formula is adjusted, that is, the distance between the two crosshair image centers and the number of CCD center pixels are determined to be added or subtracted to obtain the angle deviation.

[0042] The microscope binocular parallelism difference measurement method may further include the step of calibrating the light beam parallelism of the microscope binocular parallelism difference measurement device through a collimator. Specifically:

[0043] The microscope binocular parallel difference measuring device is used to receive the parallel light emitted by the parallel light tube with a graticule.

[0044] The positions of the first detector and / or the second detector are adjusted so that the centers of the cross-line images received by both detectors are located near the centers of their fields of view.

[0045] The first detector and the second detector are fixed, and the respective center lines are set at the positions of the cross-line images received by the first detector and the second detector. The center line is the parallelism zero angle position.

[0046] After calibration, the microscope binocular parallelism difference measuring device of Example 1 of the present application can set the parallelism zero angle position of the light beam through computer software, directly reducing the zero error. However, the traditional microscope binocular parallelism difference measuring instrument must use a mechanical device to position and lock to achieve the zero position of the parallelism difference.

[0047] Compared with the traditional binocular microscope parallel difference measurement device, the microscope binocular parallel difference measurement device of the present application only needs to be adjusted until the parallel light tube graticule image received by the dual detectors is roughly located at the center of each display, and then the graticule image center is set to the CCD center to complete the adjustment of the device. This process can be repeated in the subsequent calibration of the device. The adjustment requirements are low, the process is simple and convenient, and the reliability is high.

[0048] Compared with the traditional left and right optical system outgoing light beam direction deviation measurement device, the present application uses dual detectors to receive cross-line images. One detector is fixed, and the other detector can be freely moved to adapt to binocular microscope measurements of any pupil distance. During measurement, there is no need to adjust one side of the cross-line image to the center. The measurement results can be directly processed by computer to directly obtain the direction deviation angle value. It has a simple structure, easy operation and high measurement accuracy.

[0049] Example 2

[0050] like Figure 4 As shown, this embodiment provides a microscope binocular parallel difference measuring device, which includes: a base 100 and a first measuring component 1 and a second measuring component 2 located thereon. The first measuring component 1 includes a first detector 11, a first lens barrel 12 and a first objective lens 13 connected in sequence, and the second measuring component 2 includes an eyepiece, a second lens barrel 22 and a second objective lens 23 connected in sequence, and the eyepiece is provided with a graticule. The first objective lens 13 and the second objective lens 23 are used to align with one eyepiece of the binocular microscope to be measured, respectively, and the first detector 11 is used to display its center and the received crosshair image of the binocular microscope on a display device (not shown).

[0051] The first detector 11 and the second detector 12 may be, for example, CCD image sensors.

[0052] At least one of the first measuring component 1 and the second measuring component 2 may be slidably connected to the base 100 via a sliding component. This is similar to the embodiment 1 and will not be described in detail herein.

[0053] The microscope binocular parallelism difference measuring device may further include a first sleeve 14 and a second sleeve 24 for assisting the first objective lens 13 and the second objective lens 23 to align with one eyepiece of the binocular microscope respectively.

[0054] The method for measuring the binocular parallelism difference of a microscope using the above device comprises the following steps.

[0055] The first detector 11 is connected to a display device to display the image transmitted by the first detector.

[0056] The first objective lens 13 and the second objective lens 23 are aligned with the two eyepieces of the binocular microscope.

[0057] The binocular parallel difference measuring device of the microscope is fine-tuned so that the center of the crosshair image of the binocular microscope observed on the eyepiece of the second measuring component 2 is aligned with the center of the graticule, and the center of the crosshair image received by the first detector 11 on the display device is located near the center of the first detector.

[0058] The image on the display device is processed to obtain the position of the center of the cross-line image received by the first detector 11 relative to the center of the first detector.

[0059] The direction deviation of the binocular light output from the microscope is calculated using the focal length of the objective lens.

[0060] The specific calculation principle is similar to that of Example 1 and will not be repeated here.

[0061] The microscope binocular parallelism difference measurement method may further include the step of calibrating the light beam parallelism of the microscope binocular parallelism difference measurement device through a collimator. Specifically:

[0062] The microscope binocular parallel difference measuring device is used to receive the parallel light emitted by the parallel light tube with a graticule.

[0063] Align the center of the reticle of the eyepiece of the second measuring assembly with the center of the observed cross-hair image.

[0064] The position of the first detector is adjusted so that the center of the cross-line image received by it is located near the center of its field of view.

[0065] The first detector is fixed, and the center line is set at the position of the cross-line image received by the first detector.

[0066] The steps in this application can be adjusted in order, combined, and deleted according to actual needs.

[0067] The units in the device of the present application can be combined, divided and deleted according to actual needs.

[0068] Although the present application is disclosed in detail with reference to the accompanying drawings, it should be understood that these descriptions are merely exemplary and are not intended to limit the application of the present application. The scope of protection of the present application is defined by the appended claims and may include various modifications, alterations and equivalents made to the invention without departing from the scope and spirit of the present application.

Claims

1. A microscope binocular parallel difference measuring device, comprising: a base and a first measuring component and a second measuring component located thereon, The first measuring assembly includes a first detector, a first lens barrel and a first objective lens connected in sequence, and the second measuring assembly includes a second detector, a second lens barrel and a second objective lens connected in sequence. The first objective lens and the second objective lens are used to align with an eyepiece of the binocular microscope to be tested respectively. The first detector and the second detector are used to respectively display their respective centers and the received crosshair images of the binocular microscope on a display device.

2. The microscope binocular parallelism difference measuring device according to claim 1, further comprising: A sliding assembly, wherein at least one of the first measuring assembly and the second measuring assembly is slidably connected to the base through the sliding assembly.

3. The microscope binocular parallelism difference measuring device according to claim 2, wherein: The first detector and the second detector are CCD image sensors; the microscope binocular parallel difference measuring device also includes: a first sleeve and a second sleeve, which are used to assist the first objective lens and the second objective lens to align with one eyepiece of the binocular microscope respectively.

4. A method for measuring the binocular parallelism difference of a microscope, which is implemented by using the binocular parallelism difference measuring device of the microscope according to claim 2 or 3, the method comprising: connecting the first detector and the second detector to a display device to display images transmitted by the first detector and the second detector; Align the first objective lens and the second objective lens with two eyepieces of a binocular microscope; By adjusting the sliding assembly, the centers of the cross-line images received by the first detector and the second detector are respectively located near the center of the first detector and the center of the second detector on the display device; Processing the image on the display device to obtain the position of the center of the crosshair image received by the first detector relative to the center of the first detector and the position of the center of the crosshair image received by the second detector relative to the center of the second detector; The direction deviation of the binocular light output from the microscope is calculated using the focal length of the objective lens.

5. The method for measuring the binocular parallelism difference of a microscope according to claim 4 further comprises: The parallel light emitted by the collimator with a graticule is received by using a binocular parallel difference measuring device of a microscope; Adjusting the positions of the first detector and / or the second detector so that the centers of the cross-line images received by both detectors are located near the centers of their fields of view; The first detector and the second detector are fixed, and respective center lines are set at positions of cross-line images received by the first detector and the second detector.

6. A microscope binocular parallelism difference measuring device, comprising: a base and a first measuring component and a second measuring component located thereon, The first measuring assembly includes a first detector, a first lens barrel and a first objective lens connected in sequence, and the second measuring assembly includes an eyepiece, a second lens barrel and a second objective lens connected in sequence, wherein the eyepiece is provided with a graticule. The first objective lens and the second objective lens are used to align with an eyepiece of the binocular microscope to be tested respectively. The first detector is used to display the center thereof and the received crosshair image of the binocular microscope on a display device.

7. The microscope binocular parallelism difference measuring device according to claim 6, further comprising: A sliding assembly, wherein at least one of the first measuring assembly and the second measuring assembly is slidably connected to the base through the sliding assembly.

8. The microscope binocular parallelism difference measuring device according to claim 7, wherein: The first detector is a CCD image sensor; The microscope binocular parallel difference measuring device also includes: a first sleeve and a second sleeve, which are used to assist the first objective lens and the second objective lens to align with one eyepiece of the binocular microscope respectively.

9. A method for measuring the binocular parallelism difference of a microscope, which is implemented by using the binocular parallelism difference measuring device of the microscope according to claim 7 or 8, the method comprising: connecting the first detector to a display device to display the image transmitted by the first detector; Align the first objective lens and the second objective lens with two eyepieces of a binocular microscope; Fine-tune the microscope binocular parallel difference measuring device so that the center of the crosshair image of the binocular microscope observed on the eyepiece of the second measuring assembly is aligned with the center of the graticule, and the center of the crosshair image received by the first detector is located near the center of the first detector on the display device; Processing the image on the display device to obtain the position of the center of the cross-line image received by the first detector relative to the center of the first detector; The direction deviation of the binocular light output from the microscope is calculated using the focal length of the objective lens.

10. The method for measuring binocular parallelism difference of a microscope according to claim 9, further comprising: The parallel light emitted by the collimator with a graticule is received by using a binocular parallel difference measuring device of a microscope; Align the center of the reticle of the eyepiece of the second measuring assembly with the center of the observed cross-hair image; Adjusting the position of the first detector so that the center of the cross-line image received by it is located near the center of its field of view; The first detector is fixed, and the center line is set at the position of the cross-line image received by the first detector.

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