A method and system for evaluating the service life of insulating materials

Abstract

The present invention relates to the technical field of insulating material detection, and discloses a method and system for evaluating the service life of insulating materials. The present invention performs a DC durability test on a target insulating material according to preset test conditions, thereby reducing test time and improving test efficiency. At the same time, based on test data obtained from the test, an effective service life evaluation is performed in combination with thermophysical data and working environment data, thereby accurately obtaining the service life of the target insulating material under normal working conditions. The present invention solves the technical problem that traditional DC durability test methods have the disadvantages of long test time and low test efficiency, which makes it difficult to effectively evaluate the service life of insulating materials.

Description

Technical Field

[0001] The present invention relates to the technical field of insulating material detection, and in particular to a method and system for evaluating the service life of insulating materials. Background Art

[0002] The durability of insulating materials under DC voltage is a key property of these materials. Assessing their DC durability and understanding their expected service life are crucial for ensuring the stable operation of power equipment. Traditional DC durability testing methods, which apply a steady DC voltage across the insulation material until it breaks down, tripping a fuse and severing the circuit, are time-consuming and cumbersome. Furthermore, some samples may not fail even after prolonged exposure, making the test difficult to conduct and, consequently, hindering effective evaluation of the insulation material's service life. Summary of the Invention

[0003] The present invention provides a method and system for evaluating the service life of insulating materials, which solves the technical problem that traditional DC durability test methods have shortcomings such as long test time and low test efficiency, which makes it difficult to effectively evaluate the service life of insulating materials.

[0004] A first aspect of the present invention provides a method for evaluating the service life of an insulating material, comprising:

[0005] In response to a request for life assessment of a target insulation material, obtaining thermophysical data and working environment data of the target insulation material;

[0006] Performing a DC durability test on the target insulation material according to preset test conditions to obtain test data of the target insulation material at different test temperatures;

[0007] Determining a damage threshold of the target insulating material using the thermophysical data and the test data;

[0008] The service life of the target insulating material is determined using the thermophysical data, the damage threshold and the working environment data.

[0009] Optionally, the preset test condition is to gradually increase the applied test voltage according to a preset time interval.

[0010] Optionally, the test data includes breakdown time, voltage step, and time step, the thermophysical data includes activation energy data and a Boltzmann constant, and determining the damage threshold of the target insulating material using the thermophysical data and the test data includes:

[0011] Substituting the breakdown time, the voltage step, and the time step at the different test temperatures into a preset critical value function to obtain a critical value expression at each test temperature;

[0012] Combining the critical value expressions to obtain a critical value simultaneous formula;

[0013] The critical value simultaneous equations are solved using the test temperatures, the activation energy data, and the Boltzmann constant to determine the damage critical value of the target insulating material.

[0014] Optionally, the working environment data includes working voltage and working temperature, and determining the service life of the target insulating material by using the thermophysical data, the damage threshold, and the working environment data includes:

[0015] Determining a thermal activation coefficient using the activation energy data, the Boltzmann constant, and the operating temperature;

[0016] The service life of the target insulating material is determined using the thermal activation coefficient, the damage threshold, and the operating voltage.

[0017] Optionally, the determining of the thermal activation coefficient using the activation energy data, the Boltzmann constant and the operating temperature includes:

[0018] Performing a ratio operation on the activation energy data and the Boltzmann constant to obtain a first ratio;

[0019] Performing a ratio operation on the first ratio and the operating temperature to obtain a second ratio;

[0020] The thermal activation coefficient is obtained by calculating the second ratio power of the natural constant.

[0021] Optionally, the determining the service life of the target insulating material by using the thermal activation coefficient, the damage threshold, and the operating voltage includes:

[0022] Performing a multiplication operation on the thermal activation coefficient and the damage threshold to obtain a target multiplication value;

[0023] The target multiplication value is used to perform a ratio operation with the operating voltage to obtain the service life of the target insulating material.

[0024] A second aspect of the present invention provides a service life assessment system for insulating materials, comprising:

[0025] a response module, configured to respond to a request for life assessment of a target insulation material and obtain thermophysical data and working environment data of the target insulation material;

[0026] a test module, configured to perform a DC durability test on the target insulating material according to preset test conditions, and obtain test data of the target insulating material at different test temperatures;

[0027] a critical value module, configured to determine a damage critical value of the target insulating material using the thermophysical data and the test data;

[0028] A life assessment module is used to determine the service life of the target insulation material by using the thermophysical data, the damage threshold and the working environment data.

[0029] A third aspect of the present invention provides an electronic device comprising a memory and a processor, wherein the memory stores a computer program, and when the computer program is executed by the processor, the processor executes the steps of the service life assessment method of the insulating material as described in any one of the above items.

[0030] A fourth aspect of the present invention provides a computer-readable storage medium having a computer program stored thereon, wherein the computer program, when executed, implements the service life evaluation method of the insulating material as described in any one of the above items.

[0031] A fifth aspect of the present invention provides a computer program product, which includes a computer program stored on a non-transitory computer-readable storage medium, and the computer program includes program instructions, wherein when the program instructions are executed by a computer, the computer executes the service life assessment method of the insulating material as described in any one of the above items.

[0032] It can be seen from the above technical solutions that the present invention has the following advantages:

[0033] In the present invention, in response to a request for life assessment of a target insulating material, thermophysical data and working environment data of the target insulating material are obtained, a DC durability test is performed on the target insulating material according to preset test conditions, test data of the target insulating material at different test temperatures are obtained, the damage threshold of the target insulating material is determined using the thermophysical data and the test data, and the service life of the target insulating material is determined using the thermophysical data, the damage threshold and the working environment data. The present invention performs a DC durability test on the target insulating material according to the preset test conditions, which can reduce the test time and thus improve the test efficiency. At the same time, based on the test data obtained from the test, an effective evaluation of the service life is performed in combination with the thermophysical data and the working environment data, thereby accurately obtaining the service life of the target insulating material under normal working conditions. The present invention solves the technical problem that the traditional DC durability test method has the disadvantages of long test time and low test efficiency, which makes it difficult to effectively evaluate the service life of the insulating material. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0035] Figure 1 A flowchart of a method for evaluating the service life of an insulating material provided in Example 1 of the present invention;

[0036] Figure 2 A flowchart of a method for evaluating the service life of an insulating material provided in the second embodiment of the present invention;

[0037] Figure 3 A schematic diagram of a stepped voltage waveform provided in the second embodiment of the present invention;

[0038] Figure 4 A schematic diagram showing the distribution of breakdown voltage of a sample as a function of time step length provided in Example 2 of the present invention;

[0039] Figure 5 This is a structural block diagram of a service life evaluation system for insulating materials provided in Example 3 of the present invention;

[0040] Figure 6 This is a structural block diagram of a computer device provided in Example 4 of the present invention. DETAILED DESCRIPTION

[0041] The embodiments of the present invention provide a method and system for evaluating the service life of an insulating material, which are used to solve the technical problem that traditional DC durability test methods have shortcomings such as long test time and low test efficiency, which make it difficult to effectively evaluate the service life of insulating materials.

[0042] In order to make the purpose, features, and advantages of the present invention more obvious and easy to understand, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the embodiments described below are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0043] See also Figure 1 , Figure 1 This is a flowchart of the steps of a method for evaluating the service life of an insulating material provided in Example 1 of the present invention.

[0044] The present invention provides a method for evaluating the service life of an insulating material, comprising:

[0045] Step 101: In response to a request for life assessment of a target insulation material, obtain thermophysical data and working environment data of the target insulation material.

[0046] A life assessment request refers to an instruction requesting an assessment of the service life of a target insulation material.

[0047] Thermophysical data refers to physical quantity data related to the thermal properties of the target insulating material, including but not limited to activation energy data and Boltzmann constant.

[0048] Working environment data refers to various parameters and condition information related to the surrounding environment when the target insulation material is in a specific operating state, including but not limited to working voltage and working temperature.

[0049] In an embodiment of the present invention, in response to a received request instruction for evaluating the service life of a target insulating material, thermophysical data and working environment data of the target insulating material are acquired.

[0050] Step 102: Perform a DC durability test on the target insulating material according to preset test conditions to obtain test data of the target insulating material at different test temperatures.

[0051] Preset test conditions refer to a combination of a series of test parameters and environmental factors that are pre-set before conducting a DC durability test on the target insulation material. Testing according to the preset test conditions can reduce the test time, thereby improving the test efficiency, and enabling the insulation material to complete the test efficiently and conveniently in a shorter time, thereby achieving the advantages of short time consumption and high efficiency.

[0052] Test data refers to the test-related information obtained by measuring, recording and analyzing the target insulation material during the DC durability test, which is used to reflect the various performances of the target insulation material under the action of the DC electric field.

[0053] In an embodiment of the present invention, a DC durability test is performed on a target insulating material according to preset test conditions, and test data of the target insulating material at different test temperatures is obtained.

[0054] Step 103: Determine the damage threshold of the target insulating material using the thermophysical data and the test data.

[0055] In an embodiment of the present invention, thermophysical data and test data are used to perform formula conversion, and the converted formula is solved to obtain the damage threshold of the target insulating material.

[0056] Step 104: Determine the service life of the target insulation material using the thermophysical data, the damage threshold, and the working environment data.

[0057] In an embodiment of the present invention, calculations are performed using thermophysical data, damage thresholds, and working environment data to obtain the damage threshold of the target insulating material.

[0058] In the present invention, in response to a request for life assessment of a target insulating material, thermophysical data and working environment data of the target insulating material are obtained, a DC durability test is performed on the target insulating material according to preset test conditions, test data of the target insulating material at different test temperatures are obtained, the damage threshold of the target insulating material is determined using the thermophysical data and the test data, and the service life of the target insulating material is determined using the thermophysical data, the damage threshold and the working environment data. The present invention performs a DC durability test on the target insulating material according to the preset test conditions, which can reduce the test time and thus improve the test efficiency. At the same time, based on the test data obtained from the test, an effective evaluation of the service life is performed in combination with the thermophysical data and the working environment data, thereby accurately obtaining the service life of the target insulating material under normal working conditions. The present invention solves the technical problem that the traditional DC durability test method has the disadvantages of long test time and low test efficiency, which makes it difficult to effectively evaluate the service life of the insulating material.

[0059] See also Figure 2 , Figure 2 This is a flowchart of the steps of a method for evaluating the service life of an insulating material provided in Example 2 of the present invention.

[0060] The present invention provides a method for evaluating the service life of an insulating material, comprising:

[0061] Step 201: In response to a request for life assessment of a target insulation material, obtain thermophysical data and working environment data of the target insulation material.

[0062] In the embodiment of the present invention, the specific implementation process of step 201 is similar to that of step 101 and will not be repeated here.

[0063] It should be noted that the present invention calculates the cumulative damage of the insulating material based on the damage balance method and establishes a cumulative damage physical model.

[0064] Similar to the mechanism of metal fatigue, the damage equilibrium theory states that any insulation will undergo continuous, irreparable, incremental and destructive changes even under operating or working stresses. The reasons behind these irreversible changes are not yet fully understood. Even after the stress is removed, the accumulated damage becomes embedded in the material's memory. Moreover, this damage is only incremental and will continue to contribute to degradation when the stress cycle is restarted. The basic governing principle for insulation degradation under stress is assumed to follow an inverse power law. If is the power law coefficient, then the abstract quantity damage It's time and stress The joint function of , so the following rules apply:

[0065] (1)

[0066] Where, represents the abstract quantity damage, represents a constant, represents stress, represents the power law coefficient, Indicates time.

[0067] For a given material, if all other test conditions remain constant, the constant K can be used as a unit without loss of generality.

[0068] Considering the different time steps , ,… The corresponding electrical stress , ,… Under the action of the damage gradually accumulates, the cumulative damage within a certain period of time It can be expressed as:

[0069] (2)

[0070] Where, Indicates the The cumulative damage at each test temperature is represents a constant, represents the voltage step or time step at which the final breakdown occurs, represents the applied stress, Indicates time time steps.

[0071] When a Reaching a critical value through any accumulation path When , it is considered that the insulation breakdown occurs at this time. Therefore, the insulation breakdown criterion at this time is:

[0072] (3)

[0073] If the cumulative damage threshold is considered In line with the Arrhenius model, the critical value is considered It changes exponentially with temperature and satisfies:

[0074] It should be noted that the Arrhenius model is an important model used to describe the relationship between chemical reaction rate and temperature.

[0075] (4)

[0076]

[0077] Where, represents the activation energy of the degradation process, represents the Boltzmann constant, represents absolute temperature, Indicates the critical value of cumulative damage at the test temperature.

[0078] It is worth mentioning that the critical value of cumulative damage at breakdown at different test temperatures is The present invention is explained by taking two test temperatures as an example. If D1 and D2 are D at T1 and T2 test temperatures respectively, cRT value, then it satisfies:

[0079] (5)

[0080] The above formula is the theoretical basis for the subsequent accelerated aging test (DC durability test).

[0081] Step 202: Perform a DC durability test on the target insulating material according to preset test conditions to obtain test data of the target insulating material at different test temperatures.

[0082] Furthermore, the preset test condition is specifically to gradually increase the applied test voltage according to a preset time interval.

[0083] In the embodiment of the present invention, the basic method of the test is the same as that of the conventional DC durability test, that is, a DC voltage is applied to both ends of the insulating material. However, in this embodiment, the DC durability test is performed on the target insulating material by gradually increasing the test voltage at a preset time interval. The applied voltage waveform is as follows: Figure 3The step voltage waveform shown is composed of a series of discrete voltage steps, that is, the voltage value does not change continuously, but suddenly jumps to a new value at different time points and maintains at each voltage value for a period of time, forming a step-like shape. By using a step voltage waveform in the durability test, the voltage stress on the insulating material under these actual working conditions can be better simulated. At a certain higher voltage step, the insulation resistance of the insulating material decreases significantly faster, indicating that the voltage level has a greater impact on the durability of the insulating material, accelerating the aging process of the insulating material, reducing the test time, thereby improving the test efficiency, and more accurately evaluating the durability of the insulating material in a complex voltage environment.

[0084] Its voltage satisfies:

[0085] (6)

[0086] Where, Indicates the test voltage to be applied. represents the voltage step size, represents the breakdown time, Indicates the time step.

[0087] Not greater than The maximum integer of , if the time step is small enough, it can be approximately considered that:

[0088] (7)

[0089] In the embodiment of the present invention, the target insulating material is completely placed in a constant temperature box so that its temperature remains stable during the test. Under the action of the test voltage, the insulating material gradually breaks down, and different test temperatures T1, T2, ..., T m Insulation material breakdown time t1, t2, ..., t m , voltage step and time step .

[0090] Step 203: Determine the damage threshold of the target insulating material using the thermophysical data and the test data.

[0091] Furthermore, the test data includes breakdown time, voltage step and time step, and the thermophysical data includes activation energy data and Boltzmann constant. Step 203 may include the following sub-steps:

[0092] S11. Substitute the breakdown time, voltage step, and time step at different test temperatures into the preset critical value function to obtain the critical value expression at each test temperature.

[0093] It should be noted that the preset critical value function is specifically:

[0094]

[0095] In the embodiment of the present invention, the breakdown time, voltage step and time step at different test temperatures are substituted into a preset critical value function to obtain a critical value expression at each test temperature.

[0096] The critical value expression is as follows:

[0097] (8)

[0098] That is, by substituting formulas (2), (6) and (7) into formula (5), the critical value expressions at each test temperature can be obtained.

[0099] For ease of understanding, take two test temperatures T1 and T2 as an example, then:

[0100]

[0101]

[0102] S12. Combine the critical value expressions to obtain the critical value simultaneous formula.

[0103] In the embodiment of the present invention, the cumulative damage critical value at breakdown at different test temperatures must be the same, therefore, combining the critical value expressions, we can obtain the critical value simultaneous formula.

[0104] Taking two test temperatures T1 and T2 as an example, the critical value simultaneous equation is as follows:

[0105]

[0106] It should be noted that if multiple test temperatures are involved, the same applies and will not be repeated here.

[0107] In the embodiment of the present invention, the breakdown time, voltage step and time step at different test temperatures are substituted into the preset critical value function respectively, and the functions are combined to solve the life index n.

[0108] S13. Solve the critical value simultaneous equation using the test temperatures, activation energy data, and the Boltzmann constant to determine the damage critical value of the target insulating material.

[0109] In the embodiment of the present invention, the life exponent n is solved in step S12, and then the critical value simultaneous equation is solved using the test temperatures, activation energy data and Boltzmann constant. At this time, taking two test temperatures T1 and T2 as an example, the damage critical value of the target insulating material is Specifically:

[0110] (9)

[0111] In the embodiment of the present invention, the experimentally measured temperatures T1 and T2 and their corresponding breakdown times t1 and t2 are combined with the experimental temperature, activation energy data, Boltzmann constant, voltage step and time step, and brought into solving formulas (8) and (9) to obtain the approximate solution of the life index n and the critical value at this time. .

[0112] Furthermore, the operating environment data includes operating voltage and operating temperature.

[0113] It should be noted that when predicting the life of the target insulating material here, it is necessary to make the prediction under the steady-state working voltage at the working temperature T0. Since the working environment of most products made of working insulating materials, such as insulated cables, is mostly at normal temperature, the working temperature is preferably normal temperature.

[0114] At room temperature and constant DC operating voltage, the voltage satisfies:

[0115] (10)

[0116] It should be noted that here, formula (2) and formula (10) are substituted into formula (4). When the unit meets the specification, the default constant k representing the unit is 1, and E is a constant for DC constant voltage. The accumulated time is the service life t0. At this time, It can be expressed as follows using formula (2):

[0117]

[0118] Therefore, by substituting formulas (2) and (10) into formula (4), we can see that the cumulative damage critical value is satisfy:

[0119] (11)

[0120] At this time, the service life t0 of the insulation material can be expressed as:

[0121] (12)

[0122] Step 204: Determine the thermal activation coefficient using the activation energy data, the Boltzmann constant, and the operating temperature.

[0123] Furthermore, step 204 may include the following sub-steps:

[0124] S21. Perform a ratio operation on the activation energy data and the Boltzmann constant to obtain a first ratio.

[0125] In a specific implementation, to facilitate the implementation of the method, the above process can be converted into a formula encapsulation form, wherein the first ratio can be calculated as follows:

[0126]

[0127] Where, represents the first ratio, represents activation energy data, represents the Boltzmann constant.

[0128] S22. Perform a ratio operation on the first ratio and the operating temperature to obtain a second ratio.

[0129] S23. Calculate the second power of the ratio of the natural constant to obtain the thermal activation coefficient.

[0130] In the specific implementation, in order to facilitate the implementation of the method, the above process can be converted into a formula encapsulation form, where the thermal activation coefficient is .

[0131] Step 205: Determine the service life of the target insulation material using the thermal activation coefficient, the damage threshold, and the operating voltage.

[0132] Furthermore, step 205 may include the following sub-steps:

[0133] S31. Perform multiplication operation on the thermal activation coefficient and the damage critical value to obtain a target multiplication value.

[0134] S32. Perform a ratio operation using the target multiplication value and the operating voltage to obtain the service life of the target insulation material.

[0135] In a specific implementation, to facilitate the implementation of the method, the above process can be converted into a formula encapsulation form, where the service life can be calculated as follows:

[0136]

[0137] Where, Indicates service life, represents the thermal activation coefficient, represents the damage threshold of the target insulating material, which is calculated by formula (9) in step S13 above. Indicates the operating voltage.

[0138] In the embodiment of the present invention, the above formula (12) is used to solve the thermal activation coefficient, damage threshold and operating voltage to obtain the service life of the target insulation material.

[0139] It is worth mentioning that the service life assessment scheme of the insulating material in the present invention is also applicable to other high-voltage DC devices using insulating materials (such as filter capacitors, insulators, cable connectors, high-voltage DC gas-insulated switchgear, etc.), and is applicable to the vast majority of materials that require insulation durability testing. The service life assessment method of the present invention can provide an important basis for the effective design of DC insulating materials represented by cables.

[0140] The present invention provides an application example of a polyvinyl chloride (PVC) cable as a test material;

[0141] The rated voltage of the cable is 1100V. Tests were conducted under DC conditions at 50°C and 70°C. Four sets of tests were conducted at each temperature, each containing five samples. The voltage step size was 0.5 kV, and the time step size (tstep) was set to 1min, 2min, 5min, and 60min, respectively. The distribution of the breakdown voltage of the PVC samples with the time step size is shown in Figure 2. Figure 4 shown.

[0142] For PVC samples tested at higher temperatures, lower breakdown voltages confirm the effect of thermal stress on accelerated insulation degradation. Across the entire PVC data set, the minimum breakdown time was 8 minutes and the maximum was 13 hours.

[0143] Calculate the life index n and cumulative damage critical value D of this group of samples c The results are shown in Table 1.

[0144]

[0145] At room temperature (27°C) and a rated voltage stress of 1.1 kV, the cable used in this example has an estimated lifespan of 101.6 years. At higher operating temperatures (e.g., 37°C), the cable's lifespan drops dramatically to 10.9 years under the same operating stress. Therefore, the DC durability of a cable is related to its rated operating voltage and operating temperature.

[0146] In summary, the present invention can test the DC durability under low-temperature and low-voltage operating conditions through a short-term high-temperature and high-voltage test. The above application examples prove that a cable that requires a service life of 100 years using conventional methods can be tested in a few hours using this method. The test can be completed efficiently and conveniently in a short time.

[0147] In the present invention, in response to a request for life assessment of a target insulating material, thermophysical data and working environment data of the target insulating material are obtained, a DC durability test is performed on the target insulating material according to preset test conditions, test data of the target insulating material at different test temperatures are obtained, the damage threshold of the target insulating material is determined using the thermophysical data and the test data, and the service life of the target insulating material is determined using the thermophysical data, the damage threshold and the working environment data. The present invention performs a DC durability test on the target insulating material according to the preset test conditions, which can reduce the test time and thus improve the test efficiency. At the same time, based on the test data obtained from the test, an effective evaluation of the service life is performed in combination with the thermophysical data and the working environment data, thereby accurately obtaining the service life of the target insulating material under normal working conditions. The present invention solves the technical problem that the traditional DC durability test method has the disadvantages of long test time and low test efficiency, which makes it difficult to effectively evaluate the service life of the insulating material.

[0148] See also Figure 5 , Figure 5 This is a structural block diagram of a service life assessment system for insulating materials provided in Example 3 of the present invention.

[0149] The present invention provides a service life evaluation system for insulating materials, comprising:

[0150] A response module 301 is configured to respond to a request for life assessment of a target insulation material and obtain thermophysical data and working environment data of the target insulation material;

[0151] The test module 302 is used to perform a DC durability test on the target insulation material according to preset test conditions, and obtain test data of the target insulation material at different test temperatures.

[0152] A critical value module 303 is used to determine a damage critical value of a target insulation material using thermophysical data and test data;

[0153] The life assessment module 304 is configured to determine the service life of the target insulation material using thermophysical data, damage thresholds, and working environment data.

[0154] Furthermore, the preset test condition is specifically to gradually increase the applied test voltage according to a preset time interval.

[0155] Furthermore, the test data includes breakdown time, voltage step and time step, the thermophysical data includes activation energy data and Boltzmann constant, and the critical value module 303 includes:

[0156] A conversion submodule is used to substitute the breakdown time, voltage step and time step at different test temperatures into a preset critical value function to obtain a critical value expression at each test temperature;

[0157] The simultaneous submodule is used to combine the critical value expressions to obtain the critical value simultaneous formula;

[0158] The solution submodule is used to solve the critical value simultaneous equation using the test temperatures, activation energy data and Boltzmann constant to determine the damage critical value of the target insulating material.

[0159] Furthermore, the operating environment data includes operating voltage and operating temperature, and the life assessment module 304 includes:

[0160] Thermal Activation Coefficient submodule, which is used to determine the thermal activation coefficient using activation energy data, Boltzmann constant and operating temperature;

[0161] The life determination submodule is used to determine the service life of the target insulation material by using the thermal activation coefficient, the damage threshold and the operating voltage.

[0162] Furthermore, the thermal activation coefficient submodule includes:

[0163] A first ratio unit is used to perform a ratio operation using the activation energy data and the Boltzmann constant to obtain a first ratio;

[0164] A second ratio unit is used to perform a ratio operation on the first ratio and the operating temperature to obtain a second ratio;

[0165] The operation unit is used to calculate the second ratio power of the natural constant to obtain the thermal activation coefficient.

[0166] Furthermore, the lifespan determination submodule includes:

[0167] A target multiplication unit is used to perform a multiplication operation using the thermal activation coefficient and the damage threshold to obtain a target multiplication value;

[0168] The life output unit is used to perform a ratio operation using the target multiplier value and the operating voltage to obtain the service life of the target insulation material.

[0169] In the present invention, in response to a request for life assessment of a target insulating material, thermophysical data and working environment data of the target insulating material are obtained, a DC durability test is performed on the target insulating material according to preset test conditions, test data of the target insulating material at different test temperatures are obtained, the damage threshold of the target insulating material is determined using the thermophysical data and the test data, and the service life of the target insulating material is determined using the thermophysical data, the damage threshold and the working environment data. The present invention performs a DC durability test on the target insulating material according to the preset test conditions, which can reduce the test time and thus improve the test efficiency. At the same time, based on the test data obtained from the test, an effective evaluation of the service life is performed in combination with the thermophysical data and the working environment data, thereby accurately obtaining the service life of the target insulating material under normal working conditions. The present invention solves the technical problem that the traditional DC durability test method has the disadvantages of long test time and low test efficiency, which makes it difficult to effectively evaluate the service life of the insulating material.

[0170] See also Figure 6 , Figure 6 This is a structural block diagram of a computer device provided in Example 4 of the present invention.

[0171] An electronic device according to an embodiment of the present invention includes: a memory 401 and a processor 402, wherein the memory 402 stores a computer program; when the computer program is executed by the processor 402, the processor 402 executes the service life evaluation method of the insulating material as described in any of the above embodiments.

[0172] Memory 401 may be an electronic memory such as flash memory, EEPROM (Electrically Erasable Programmable Read-Only Memory), EPROM, hard disk, or ROM. Memory 401 has storage space 403 for program code 413 for executing any of the method steps described above. For example, storage space 403 for program code may include individual program codes 413 for implementing various steps in the method described above. These program codes may be read from or written to one or more computer program products. These computer program products include program code carriers such as hard disks, compact disks (CDs), memory cards, or floppy disks. The program codes may be compressed, for example, in a suitable format. When executed by a processing device, these codes cause the processing device to execute the various steps in the method described above. These program codes may be read from or written to one or more computer program products. These computer program products include program code carriers such as hard disks, compact disks (CDs), memory cards, or floppy disks. The program codes may be compressed, for example, in a suitable format. When these codes are executed by a computing and processing device, they cause the computing and processing device to execute the steps of the above-described method for evaluating the service life of an insulation material.

[0173] The fifth embodiment of the present invention further provides a computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the service life evaluation method of the insulating material as described in any of the above embodiments is implemented.

[0174] Embodiment 6 of the present invention also provides a computer program product, which includes a computer program stored on a non-transitory computer-readable storage medium, and the computer program includes program instructions, wherein when the program instructions are executed by a computer, the computer executes the service life evaluation method of the insulating material as described in any of the above embodiments.

[0175] Those skilled in the art will clearly understand that, for the convenience and brevity of description, the specific working processes of the systems, devices and units described above can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0176] In the several embodiments provided in this application, it should be understood that the disclosed systems, devices and methods can be implemented in other ways. For example, the device embodiments described above are merely schematic. For example, the division of units is only a logical function division. In actual implementation, there may be other division methods, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interface, device or unit, which can be electrical, mechanical or other forms.

[0177] Units described as separate components may or may not be physically separate, and components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.

[0178] In addition, the functional units in the various embodiments of the present invention may be integrated into a single processing unit, each unit may exist physically separately, or two or more units may be integrated into a single unit. The aforementioned integrated units may be implemented in the form of hardware or software functional units.

[0179] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the portion that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for causing a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the various embodiments of the method of the present invention. The aforementioned storage medium includes various media that can store program code, such as USB flash drives, mobile hard drives, read-only memories (ROMs), random access memories (RAMs), magnetic disks, or optical disks.

[0180] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present invention.

Claims

1. A method for evaluating the service life of an insulating material, characterized in that: include: In response to a request for life assessment of a target insulation material, obtaining thermophysical data and working environment data of the target insulation material; Performing a DC durability test on the target insulation material according to preset test conditions to obtain test data of the target insulation material at different test temperatures; Determining a damage threshold of the target insulating material using the thermophysical data and the test data; The test data includes breakdown time, voltage step and time step, the thermophysical data includes activation energy data and Boltzmann constant, and determining the damage threshold of the target insulating material using the thermophysical data and the test data includes: Substituting the breakdown time, the voltage step, and the time step at the different test temperatures into a preset critical value function to obtain a critical value expression at each test temperature; Combining the critical value expressions to obtain a critical value simultaneous formula; Solving the critical value simultaneous equations using the test temperatures, the activation energy data, and the Boltzmann constant to determine the damage critical value of the target insulating material; Determining the service life of the target insulation material using the thermophysical data, the damage threshold, and the working environment data; The working environment data includes working voltage and working temperature, and determining the service life of the target insulating material by using the thermophysical data, the damage threshold, and the working environment data includes: Determining a thermal activation coefficient using the activation energy data, the Boltzmann constant, and the operating temperature; Determining the service life of the target insulating material using the thermal activation coefficient, the damage threshold, and the operating voltage; Determining the thermal activation coefficient using the activation energy data, the Boltzmann constant, and the operating temperature includes: Performing a ratio operation on the activation energy data and the Boltzmann constant to obtain a first ratio; Performing a ratio operation on the first ratio and the operating temperature to obtain a second ratio; Calculating the second ratio power of the natural constant to obtain the thermal activation coefficient; The determining the service life of the target insulating material by using the thermal activation coefficient, the damage threshold, and the operating voltage includes: Performing a multiplication operation on the thermal activation coefficient and the damage threshold to obtain a target multiplication value; The target multiplication value is used to perform a ratio operation with the operating voltage to obtain the service life of the target insulating material.

2. The method for evaluating the service life of an insulating material according to claim 1, wherein: The preset test condition is specifically to gradually increase the applied test voltage according to a preset time interval.

3. A service life evaluation system for insulating materials, characterized in that: include: a response module, configured to respond to a request for life assessment of a target insulation material and obtain thermophysical data and working environment data of the target insulation material; a test module, configured to perform a DC durability test on the target insulating material according to preset test conditions, and obtain test data of the target insulating material at different test temperatures; a critical value module, configured to determine a damage critical value of the target insulating material using the thermophysical data and the test data; The test data includes breakdown time, voltage step and time step, the thermophysical data includes activation energy data and Boltzmann constant, and the critical value module includes: a conversion submodule, configured to substitute the breakdown time, the voltage step, and the time step at the different test temperatures into a preset critical value function to obtain a critical value expression at each test temperature; A simultaneous submodule, for combining the critical value expressions to obtain a critical value simultaneous formula; A solution submodule, configured to solve the critical value simultaneous equations using the test temperatures, the activation energy data, and the Boltzmann constant to determine the damage critical value of the target insulating material; a lifespan assessment module, configured to determine the service life of the target insulation material using the thermophysical data, the damage threshold, and the working environment data; The working environment data includes working voltage and working temperature, and the life assessment module includes: a thermal activation coefficient submodule, configured to determine a thermal activation coefficient using the activation energy data, the Boltzmann constant, and the operating temperature; a lifespan determination submodule, configured to determine the service life of the target insulating material using the thermal activation coefficient, the damage threshold, and the operating voltage; The thermal activation coefficient submodule includes: A first ratio unit is configured to perform a ratio operation on the activation energy data and the Boltzmann constant to obtain a first ratio; a second ratio unit, configured to perform a ratio operation on the first ratio and the operating temperature to obtain a second ratio; a calculation unit, configured to calculate the second ratio power of the natural constant to obtain a thermal activation coefficient; The lifespan determination submodule includes: a target multiplication unit, configured to perform a multiplication operation on the thermal activation coefficient and the damage threshold to obtain a target multiplication value; The service life output unit is used to perform a ratio operation using the target multiplication value and the operating voltage to obtain the service life of the target insulating material.

4. An electronic device, characterized in that: The method comprises a memory and a processor, wherein a computer program is stored in the memory, and when the computer program is executed by the processor, the processor executes the steps of the method for evaluating the service life of an insulating material according to any one of claims 1 to 2.

5. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed, the service life evaluation method of the insulating material according to any one of claims 1 to 2 is implemented.

6. A computer program product, characterized in that The computer program product includes a computer program stored on a non-transitory computer-readable storage medium, wherein the computer program includes program instructions, wherein when the program instructions are executed by a computer, the computer is caused to execute the service life evaluation method of the insulation material according to any one of claims 1 to 2.

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