Atmospheric vertical refraction correction method and device based on local meteorological field model

Abstract

This application relates to the field of precision engineering intelligent monitoring technology, and particularly relates to an atmospheric vertical refraction correction method and device based on a local meteorological field model. The method includes: obtaining time-matched meteorological data based on the initial meteorological data of the measurement points within the target survey station and the measurement data affected by atmospheric vertical refraction; constructing a local meteorological field model based on the meteorological data and DEM data including the target survey station and the measurement points; determining the position where the refractive index profile structure is located in combination with the model data within the profile where the ranging optical path curve is located; combining Snell's law and the refractive index profile structure to correct the measurement data for atmospheric vertical refraction, obtaining the horizontal distance and height difference with reduced influence of atmospheric vertical refraction, and further obtaining the three-dimensional coordinates of the measurement points with higher accuracy. Thus, it solves the problems in the related technology that in a complex atmospheric environment, the monitoring accuracy of the horizontal and vertical displacements of the measurement points is relatively low, it cannot be used in the actual monitoring environment, and it is difficult to obtain high-precision monitoring and warning results, etc.

Description

Technical Field

[0001] The present application relates to the technical field of intelligent monitoring in precision engineering, and particularly to an atmospheric vertical refraction correction method and device based on a local meteorological field model. Background Art

[0002] Atmospheric vertical refraction is mainly affected by meteorological factors such as temperature, air pressure, and humidity. Among them, the effects of air pressure and temperature are the most significant. These meteorological factors are themselves affected by changes in seasons, weather, and altitude. Therefore, during the intelligent monitoring of precision engineering, it is necessary to reduce the influence of meteorological factors on trigonometric leveling.

[0003] In related technologies, the commonly used methods in intelligent monitoring of precision engineering are divided into two types: First, using the principle of electromagnetic wave ranging and the Barrell-Sears formula, and directly correcting the original inclined distance observation values through the meteorological data collected at the measuring station; Second, by introducing the atmospheric vertical refraction coefficient k to determine or weaken the influence of atmospheric vertical refraction, and the method of calculating the refraction coefficient k can use redundant observations and calculate the refraction coefficient k using different adjustment models with additional atmospheric refraction; It can also derive a precise calculation formula based on atmospheric thermodynamics and atmospheric physics, and calculate the refraction coefficient k using measured meteorological elements.

[0004] However, in related technologies, the first method mainly considers the meteorological factors of a single measuring station, and the monitoring accuracy of vertical displacement is relatively low; while in the actual complex environment, there are large deviations in the calculation results of the second method. Therefore, how to obtain more accurate atmospheric vertical refraction correction remains a key problem that urgently needs to be solved. Summary of the Invention

[0005] The present application provides an atmospheric vertical refraction correction method and device based on a local meteorological field model to solve the problems in related technologies, such as low monitoring accuracy of the horizontal and vertical displacements of the measuring points in a complex atmospheric environment, large deviations, inability to be used under the requirements of high-precision actual monitoring environments, and difficulty in obtaining high-precision monitoring and warning results.

[0006] The first aspect embodiment of the present application provides an atmospheric vertical refraction correction method based on a local meteorological field model, including the following steps: obtaining the initial meteorological data of the measuring point in the target measuring station and the measurement data affected by atmospheric vertical refraction, and based on the initial meteorological data and the measurement data, determining the meteorological data whose measurement time of the initial meteorological data and the measurement time of the measurement data meet a preset matching time; constructing a local meteorological field model including the target measuring station and the measuring point based on the meteorological data and the DEM (Digital Elevation Model) data including the target measuring station and the measuring point; combining the measurement data and the local meteorological field model data in the section where the ranging optical path curve is located to determine the position where the refractive index profile structure is located, where the refractive index profile structure is composed of at least one layer of refractive index layer, and the layer thicknesses of different refractive index profile structures are different; combining Snell's law and the refractive index profile structure to perform atmospheric vertical refraction correction on the measurement data to obtain the horizontal distance and height difference with reduced influence of atmospheric vertical refraction, and based on the horizontal distance and the height difference, obtaining the three-dimensional coordinates of the measuring point with higher accuracy.

[0007] Optionally, in an embodiment of the present application, it further includes: determining the resolution of the local meteorological field model according to the DEM data; determining the resolution of the refractive index profile structure based on the resolution.

[0008] Optionally, in an embodiment of the present application, the combining Snell's law and the refractive index profile structure to perform atmospheric vertical refraction correction on the measurement data to obtain the horizontal distance and height difference with reduced influence of atmospheric vertical refraction includes: combining the refractive index profile structure and the layer thickness to calculate the light propagation time of each refractive index layer; accumulating the light propagation time of the refractive index layer until the accumulated light propagation time is greater than the propagation time of the inclined distance measurement value in the measurement data, and correcting the last layer of the refractive index profile structure based on the accumulated light propagation time to obtain the corrected last layer; based on the corrected last layer, accumulating all the layers in the refractive index profile structure to calculate the horizontal distance and height difference of the measurement data.

[0009] Optionally, in an embodiment of the present application, the calculation formulas for the horizontal distance and the height difference may but are not limited to be respectively:

[0010]

[0011] where n 0 is the reference refractive index of the total station, S ce is the inclined distance measurement value, n i is the fixed refractive index constant obtained from the refractive index profile structure, ΔS iis the optical path length within the i-th layer, H i is the height, S sum , D sum and H sum are the corrected inclined distance, horizontal distance, and height difference respectively.

[0012] Optionally, in an embodiment of the present application, the calculation formula for the three-dimensional coordinates of the measurement point may be, but is not limited to:

[0013]

[0014] where, (X ce , Y ce , H ce ) are the coordinates of the measuring station, α is the measured horizontal angle, i is the height of the instrument, and v is the height of the prism.

[0015] An embodiment of the second aspect of the present application provides an atmospheric vertical refraction correction device based on a local meteorological field model, including: a matching module, configured to obtain the initial meteorological data of the measurement point within the target measuring station and the measurement data affected by the atmospheric vertical refraction, and based on the initial meteorological data and the measurement data, determine the meteorological data whose measurement time of the initial meteorological data and the measurement time of the measurement data satisfy a preset matching time; a construction module, configured to construct a local meteorological field model including the target measuring station and the measurement point based on the meteorological data and the DEM data including the target measuring station and the measurement point; a generation module, configured to determine the position where the refractive index profile structure is located by combining the measurement data and the local meteorological field model data within the profile of the ranging optical path curve, where the refractive index profile structure is composed of at least one layer of refractive index layer, and the layer thicknesses of different refractive index profile structures are different; an elimination module, configured to perform atmospheric vertical refraction correction on the measurement data by combining Snell's law and the refractive index profile structure, obtain the horizontal distance and height difference with reduced influence of the atmospheric vertical refraction, and obtain the three-dimensional coordinates of the measurement point with higher accuracy based on the horizontal distance and the height difference.

[0016] Optionally, in an embodiment of the present application, it further includes: a first determination module, configured to determine the resolution of the local meteorological field model according to the DEM data; a second determination module, configured to determine the resolution of the refractive index profile structure based on the resolution.

[0017] Optionally, in an embodiment of the present application, the elimination module includes: a first calculation unit, configured to calculate the light propagation time of each refractive index layer by combining the refractive index profile structure and the layer thickness; a determination unit, configured to accumulate the light propagation time of the refractive index layers until the accumulated light propagation time is greater than the propagation time of the inclined distance measurement value in the measurement data, and correct the last layer of the refractive index profile structure based on the accumulated light propagation time to obtain a corrected last layer; a second calculation unit, configured to accumulate all layers in the refractive index profile structure based on the corrected last layer, and calculate the horizontal distance and height difference of the measurement data.

[0018] Optionally, in an embodiment of the present application, the calculation formulas for the horizontal distance and the height difference may but are not limited to be respectively:

[0019]

[0020] where n 0 is the reference refractive index of the total station, S ce is the inclined distance measurement value, n i is the fixed refractive index constant obtained from the refractive index profile structure, ΔS i is the optical path length in the i-th layer, H i is the height, S sum , D sum and H sum are the corrected inclined distance, horizontal distance and height difference respectively.

[0021] Optionally, in an embodiment of the present application, the calculation formula for the three-dimensional coordinates of the measurement point may but is not limited to be:

[0022]

[0023] where (X ce , Y ce , H ce ) are the coordinates of the measurement station, α is the measured horizontal angle, i is the height of the instrument, and v is the height of the prism.

[0024] An embodiment of the third aspect of the present application provides an electronic device, including: a memory, a processor, and a computer program stored on the memory and executable on the processor, where the processor executes the program to implement the method for atmospheric vertical refraction correction based on the local meteorological field model as described in the above embodiment.

[0025] An embodiment of the fourth aspect of the present application provides a computer-readable storage medium, where the computer-readable storage medium stores a computer program, and when the program is executed by a processor, it implements the method for atmospheric vertical refraction correction based on the local meteorological field model as described above.

[0026] The fifth aspect of the present application provides a computer program product, including a computer program, which when executed implements the above-mentioned method for atmospheric vertical refraction correction based on a local meteorological field model.

[0027] Embodiments of the present application can combine initial meteorological data and measurement data affected by atmospheric vertical refraction to obtain meteorological data, and construct a local meteorological field model based on the meteorological data. On this basis, a refractive index profile structure is further constructed. The refractive index profile structure is tracked layer by layer in combination with the obtained measurement data, and then three-dimensional coordinates that eliminate the influence of atmospheric vertical refraction are obtained, thereby weakening the influence of atmospheric vertical refraction on the ranging value, correcting the horizontal distance measurement value in the horizontal plane and the height difference measurement value in the vertical plane, improving the monitoring accuracy of the horizontal displacement and vertical displacement of the monitoring point, and providing more accurate data support for precise intelligent engineering monitoring. Thus, the problems in the related art are solved, that is, in a complex atmospheric environment, the monitoring accuracy of the horizontal and vertical displacements of the measuring points is relatively low, there are large deviations, it cannot be used under the requirements of high-precision actual monitoring environments, and it is difficult to obtain high-precision monitoring and early warning results.

[0028] Additional aspects and advantages of the present application will be given in part in the following description, become apparent in part from the following description, or be understood through the practice of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] The above-mentioned and / or additional aspects and advantages of the present application will become apparent and easy to understand from the following description of the embodiments in conjunction with the drawings, where:

[0030] Figure 1 is a flowchart of a method for atmospheric vertical refraction correction based on a local meteorological field model according to an embodiment of the present application;

[0031] Figure 2 is a schematic block diagram of the principle of ray tracing with a constant refractive index within a layer according to an embodiment of the present application;

[0032] Figure 3 is a schematic block diagram of the temporal variation of the X coordinate of point L5-7 before and after correction according to an embodiment of the present application;

[0033] Figure 4 is a schematic block diagram of the temporal variation of the Y coordinate of point L5-7 before and after correction according to an embodiment of the present application;

[0034] Figure 5 is a schematic block diagram of the temporal variation of the H coordinate of point L5-7 before and after correction according to an embodiment of the present application;

[0035] Figure 6A flowchart of the working principle of an atmospheric vertical refraction correction method based on a local meteorological field model provided according to an embodiment of the present application;

[0036] Figure 7 A schematic block diagram of an atmospheric vertical refraction correction device based on a local meteorological field model provided according to an embodiment of the present application;

[0037] Figure 8 A schematic structural diagram of an electronic device provided according to an embodiment of the present application. Detailed implementation manners

[0038] The embodiments of the present application will be described in detail below. The examples of the embodiments are shown in the accompanying drawings, where the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the accompanying drawings are exemplary and are intended to explain the present application, and should not be construed as a limitation to the present application.

[0039] The atmospheric vertical refraction correction method and device based on a local meteorological field model according to an embodiment of the present application will be described below with reference to the accompanying drawings. In view of the problems mentioned in the above background art that in a complex atmospheric environment, the monitoring accuracy of the horizontal and vertical displacements of the measuring points is relatively low, there are large deviations, it cannot be used under the requirements of a high-precision actual monitoring environment, and it is difficult to obtain high-precision monitoring and early warning results, the present application provides an atmospheric vertical refraction correction method based on a local meteorological field model. In this method, meteorological data can be obtained by combining initial meteorological data and measurement data affected by atmospheric vertical refraction, and a local meteorological field model can be constructed based on the meteorological data. On this basis, a refractive index profile structure is further constructed. The refractive index profile structure is traced layer by layer in combination with the obtained measurement data, and then the three-dimensional coordinates that eliminate the influence of atmospheric vertical refraction are obtained, thereby weakening the influence of atmospheric vertical refraction on the ranging value, correcting the horizontal distance measurement value in the horizontal plane and the height difference measurement value in the vertical plane, and improving the monitoring accuracy of the horizontal displacement and the vertical displacement of the monitoring point, providing more accurate data support for precise intelligent engineering monitoring. Thus, the problems in the related art that in a complex atmospheric environment, the monitoring accuracy of the horizontal and vertical displacements of the measuring points is relatively low, there are large deviations, it cannot be used under the requirements of a high-precision actual monitoring environment, and it is difficult to obtain high-precision monitoring and early warning results are solved.

[0040] Specifically, Figure 1 A flowchart of an atmospheric vertical refraction correction method based on a local meteorological field model provided according to an embodiment of the present application.

[0041] As Figure 1 shown, the atmospheric vertical refraction correction method based on a local meteorological field model includes the following steps:

[0042] In step S101, obtain the initial meteorological data of the measuring points in the target measuring station and the measurement data affected by atmospheric vertical refraction, and based on the initial meteorological data and the measurement data, determine the meteorological data whose measurement time of the initial meteorological data and the measurement time of the measurement data meet the preset matching time.

[0043] It can be understood that the initial meteorological data in the embodiments of the present application can be obtained from meteorological stations such as discrete meteorological stations or automatic meteorological stations, but are not limited thereto. The measurement data can be obtained from a measuring robot in the target measuring station, but are not limited thereto. Specifically, those skilled in the art can set it according to the actual situation, and the present application does not make specific limitations.

[0044] In some embodiments, the embodiments of the present application can match the initial meteorological data obtained from the discrete meteorological station and the measurement data affected by atmospheric vertical refraction collected by the measuring robot in the target measuring station according to the measurement time, ensure that the measurement time of the initial meteorological data and the measurement time of the measurement data meet a certain matching time, and then obtain the meteorological data that meets a certain matching time, so that the obtained meteorological data and the measurement data have consistency and relevance.

[0045] Among them, the certain matching time can be set by those skilled in the art according to the actual situation, and the present application does not make specific limitations.

[0046] Exemplarily, the embodiments of the present application match the initial meteorological data obtained from the discrete meteorological station and the measurement data affected by atmospheric vertical refraction collected by the measuring robot in the target measuring station to ensure the consistency of the measurement time. For example, if the data of a discrete meteorological station is missing, then delete that meteorological station and only use the remaining stations.

[0047] In step S102, based on the meteorological data and the DEM data including the target measuring station and the measuring points, construct a local meteorological field model including the target measuring station and the measuring points.

[0048] Those skilled in the art can understand that the embodiments of the present application can fuse the meteorological data obtained by matching the initial meteorological data with the measurement time with the DEM data including the target measuring station and the measuring points, and in the area covered by the DEM data, use the local thin plate smoothing spline model for interpolation simulation to obtain the interpolation result of the meteorological factors at the three-dimensional grid point positions as the local meteorological field model.

[0049] Exemplarily, the theoretical statistical model expression of the local meteorological field model in the embodiments of the present application can be but is not limited to:

[0050] z i =f(x i )+b T y i +e i (i = 1, 2, 3...),

[0051] where z i is the meteorological factor at point i in space, f is a smoothing function with respect to the spline independent variable x i used to describe the functional relationship between the meteorological factor and the horizontal and vertical coordinates, y i is a P-dimensional independent covariate, b is its coefficient used to describe the influence of the elevation difference factor on the interpolation surface, and ei is a random error that is usually ignored.

[0052] Furthermore, in the embodiments of the present application, the function f and the coefficient b can be determined by least squares estimation, and the expression of the least squares estimation can be but is not limited to:

[0053]

[0054] where J m (f) is the roughness measure function (spline order) of the function f(x i ), that is, the m-th partial derivative of the function f, and ρ is a positive smooth function determined by the minimization of GCV (Generalized Cross Validation).

[0055] It can be understood that the embodiments of the present application can use the "one point move" method to sequentially remove a meteorological collection target site, perform surface fitting on the remaining sites under a certain smoothing parameter to obtain the estimated value of this site, then calculate the variance between the observed value and the estimated value, and further obtain the interpolation result of the meteorological factor at the three-dimensional grid point position as the local meteorological field model.

[0056] In step S103, combining the measurement data and the local meteorological field model data within the profile where the ranging optical path curve is located, determine the position where the refractive index profile structure is located, where the refractive index profile structure is composed of at least one refractive index layer, and the layer thicknesses of different refractive index profile structures are different.

[0057] It can be understood that the embodiments of the present application can combine the measurement data and the vertical plane where the ranging optical path curve is located to determine at least one profile of the meteorological data. This profile can but is not limited to include the small-range meteorological field of the ranging optical path curve profile to improve the computer speed, and perform a more refined simulation of the meteorological field based on the DEM data of the target station, and extract the meteorological factors of the interpolation points on the path of the ranging optical path curve.

[0058] In other words, the embodiments of the present application can extract the meteorological field simulation results of the grid points within the profile and calculate the refractive index values of these grid points. In the embodiments of the present application, the refractive index can be calculated by the Rüeger refractive index formula, and the expression of the Rüeger refractive index formula can be but is not limited to:

[0059]

[0060] Among them, T is the air temperature in the actual environment, P is the atmospheric pressure in the actual environment, e is the water vapor pressure, and N sg is the atmospheric group refractivity in the standard atmospheric environment.

[0061] Furthermore, in the embodiments of the present application, the expression of the atmospheric group refractivity in the standard atmospheric environment can be but is not limited to:

[0062]

[0063] Among them, λ is the modulation wave wavelength of the total station, 650 μm.

[0064] And the water vapor pressure e in the embodiments of the present application can be calculated from the relative humidity f and the ambient temperature T, and its expression can be but is not limited to:

[0065]

[0066] Among them, e 0 is the natural logarithm base, E is the saturated water vapor pressure, which can be calculated by the BUCK model, or a higher-precision calculation model can be selected according to the actual engineering needs. The present application does not make specific limitations.

[0067] In the actual execution process, the embodiments of the present application can combine the measurement data, use the vertical plane where the ranging optical path curve is located as a section, obtain at least one section of the measurement data, extract the meteorological field simulation results of the grid points in the section, calculate the refractive index values of these grid points, and form a refractive index vertical section from the refractive indices at the grid points.

[0068] It should be noted that the embodiments of the present application can approximate the refractive index vertical section structure as being composed of multiple refractive index layers with simple structures, and use the refractive index constants within each independent layer to replace the continuous variation of the entire refractive index vertical section.

[0069] In addition, the embodiments of the present application can cut the ranging optical path curve into different layers by a fixed layer thickness ΔH, and select the refractive index of the center point within the layer as the constant refractive index of the layer, and combine them into a vertical refractive index profile, that is, the layer thicknesses of different refractive index profile structures are different. Moreover, the smaller the selected value of the layer thickness ΔH in the embodiments of the present application, the more layers of ray tracing, and the closer the fitted ray propagation path is to the curve. However, limited by the accuracy of the vertical refractive index profile, the more layers are accumulated, the greater the cumulative refractive index fitting error, thus causing the atmospheric vertical refraction correction to deviate from the true ray path propagation situation. Therefore, the layer thickness ΔH needs to be specifically determined after comprehensive consideration of the actual height difference of the measuring line and the refractive index fitting accuracy. As a possible implementation method, the embodiments of the present application can flexibly determine the fixed value of the layer thickness ΔH for each measuring point in combination with the accuracy of the refractive index profile structure and the height difference hc between the measuring point and the target measuring station, which can be but is not limited to expressed as:

[0070] Specifically, it can be set by those skilled in the art according to the actual situation, and the present application does not make specific limitations.

[0071] Optionally, in an embodiment of the present application, it further includes: determining the resolution of the local meteorological field model according to the DEM data; determining the resolution of the refractive index profile structure based on the resolution.

[0072] In the actual execution process, the resolution of the local meteorological field model in the embodiments of the present application can be determined according to the DEM data. It should be noted that the higher the resolution, the smoother the fitting of each spatial point, the finer the grid point meteorological values obtained, and the more accurate the vertical refractive index profile formed, but the calculation amount will increase, and the requirements for computer hardware will also be higher. For example, in the embodiments of the present application, the plane range of the monitoring area of the target site is about 650m×400m, the maximum height difference of the measuring points is 140m, and 7 automatic weather stations are distributed inside and outside the monitoring area. Combining the DEM data in the measuring area, the interpolation grid point resolution of the local meteorological field is further determined. Therefore, the embodiments of the present application can reasonably determine the resolution of the local meteorological field model after comprehensive consideration of the actual requirements. Specifically, it can be set by those skilled in the art according to the actual situation, and the present application does not make specific limitations.

[0073] In step S104, combining Snell's law and the refractive index profile structure, perform atmospheric vertical refraction correction on the measurement data to obtain the horizontal distance and height difference that weaken the influence of atmospheric vertical refraction, and obtain the three-dimensional coordinates of the measuring points with higher accuracy based on the horizontal distance and height difference. The calculation formula of the three-dimensional coordinates of the measuring points can be but is not limited to:

[0074]

[0075] Among them, (X ce ,Y ce ,Hce ) is the coordinate of the measuring station, α is the measured horizontal angle, i is the instrument height, and v is the prism height.

[0076] Furthermore, the embodiment of the present application can track the light propagation path of each measuring point using the layer thickness and correct the last layer. Refer to Figure 2 , at height H i In the i-th layer corresponding to, the fixed refractive index constant n is obtained from the refractive index profile result i , according to the principle of ray tracing, refer to Figure 2 , the tracking result of the light propagation path in each layer can be but is not limited to expressed as:

[0077]

[0078] ΔD i =(H i+1 -H i )×tanθ i

[0079] where, ΔS i is the optical path length in the i-th layer, and ΔD i is the horizontal distance length in the i-th layer.

[0080] It should be noted that through the above steps, the embodiment of the present application can calculate the horizontal distance and height difference that eliminate the influence of atmospheric vertical refraction, and then calculate the three-dimensional coordinates of the measuring points for eliminating the influence of atmospheric vertical refraction.

[0081] Among them, in the embodiment of the present application, the calculation formula for the three-dimensional coordinates of the measuring points in precise engineering survey is:

[0082]

[0083] where, R is the radius of the earth's curvature.

[0084] It should be noted that in the precise engineering survey of the embodiment of the present application, the earth curvature correction is not necessary. Therefore, the embodiment of the present application can decide whether to implement this correction according to the actual situation of the project. Specifically, it can be set by those skilled in the art according to the actual situation. The present application does not make specific limitations. The calculation formula for the corrected three-dimensional coordinates can be but is not limited to:

[0085]

[0086] where, (X ce , Y ce , H ce ) is the coordinate of the measuring station, α is the measured horizontal angle, i is the instrument height, v is the prism height. Furthermore, in the embodiment of the present application, the correction results of some points refer to Figure 3 , 4, 5.

[0087] Optionally, in an embodiment of the present application, in combination with Snell's law and the refractive index profile structure, atmospheric vertical refraction correction is performed on the measurement data to obtain the horizontal distance and height difference with reduced influence of atmospheric vertical refraction, including: calculating the light propagation time of each refractive index layer in combination with the refractive index profile structure and the layer thickness; accumulating the light propagation time of the refractive index layers until the accumulated light propagation time is greater than the propagation time of the inclined distance measurement value in the measurement data, and correcting the last layer of the refractive index profile structure based on the accumulated light propagation time to obtain the corrected last layer; based on the corrected last layer, accumulating all the layers in the refractive index profile structure to calculate the horizontal distance and height difference of the measurement data. Among them, the calculation formulas for the horizontal distance and height difference can be but are not limited to:

[0088]

[0089] where n 0 is the reference refractive index of the total station, S ce is the inclined distance measurement value, n i is the fixed refractive index constant obtained from the refractive index profile result, ΔS i is the optical path length within the i-th layer, H i is the height, S sum , D sum and H sum are the corrected inclined distance, horizontal distance and height difference respectively.

[0090] As a possible implementation manner, the embodiment of the present application can calculate the light propagation time of each refractive index layer in combination with the refractive index profile structure and the layer thickness. When the accumulated light propagation time is greater than the propagation time of the inclined distance measurement value in the measurement data, the last layer of the refractive index profile structure is corrected, and based on the corrected last layer, all the layers in the refractive index profile structure are accumulated to calculate the horizontal distance and height difference of the measurement data.

[0091] Exemplarily, the embodiment of the present application can determine the layer thickness ΔH in combination with the refractive index profile structure and Snell's law, and then perform layer-by-layer tracking on the light propagation path. Using n i ×ΔS i as the propagation time of the equivalent light for a one-way trip. When the accumulated propagation time of N + 1 layers is greater than n 0 ×S ce , stop tracking and calculate the last layer, and then obtain the corrected inclined distance S sum , horizontal distance D sum and height difference H sum .

[0092] That is to say, in the embodiment of the present application, since the propagation speed of light in air is t = n*S / C 0, where C 0 is the speed of light in vacuum, which is a constant. Therefore, in the embodiments of the present application, n i ×ΔS i can be used to represent the one-way propagation time of the equivalent light ray. When the cumulative propagation time of N + 1 layers is greater than n 0 ×S ce , the tracking is stopped and the last layer is calculated. Then, the horizontal distance D sum and the height difference H sum after the tracking ends can be calculated. The calculation formulas can be but are not limited to the following respectively:

[0093]

[0094] where n 0 is the reference refractive index of the total station, S ce is the measured inclined distance, n i is the fixed refractive index constant obtained from the refractive index profile structure, ΔS i is the optical path length within the i-th layer, H i is the height, S sum , D sum and H sum are the corrected inclined distance, horizontal distance and height difference respectively.

[0095] Next, a specific embodiment is used to introduce in detail the working principle of the atmospheric vertical refraction correction method based on the local meteorological field model proposed in the embodiments of the present application.

[0096] Figure 6 is a flowchart of the working principle of the atmospheric vertical refraction correction method based on the local meteorological field model according to an embodiment of the present application.

[0097] Step S601: Match the initial meteorological data.

[0098] It can be understood that in the embodiments of the present application, the initial meteorological data obtained from the discrete meteorological stations and the measurement data collected by the total station in the target measurement station can be matched according to the measurement time, so as to ensure that the measurement time of the initial meteorological data and the measurement time of the measurement data meet a certain matching time, and then obtain the meteorological data that meets a certain matching time.

[0099] Step S602: Obtain the DEM data of the measurement area.

[0100] It can be understood that in the embodiments of the present application, the DEM data of the measurement area can be obtained based on the measurement points in the target measurement station.

[0101] Step S603: Establish the local meteorological field model.

[0102] Among them, in the embodiments of the present application, the processed initial meteorological data can be fused with the DEM data including the target measuring station and measuring points. Within the area covered by the DEM data, the local thin plate smoothing spline model is used for interpolation simulation to obtain the interpolation results of meteorological factors at the three-dimensional grid point positions, which are used as the local meteorological field model.

[0103] Step S604: Refractive index profile structure.

[0104] Among them, in the embodiments of the present application, the profile of meteorological data can be determined according to the vertical plane where the ranging optical path curve is located, the meteorological field simulation results of the grid points in the profile are extracted, the refractive index values of these grid points are calculated, and the refractive index vertical profile is formed by the refractive indices at the grid points.

[0105] Step S605: Measurement data.

[0106] Among them, in the embodiments of the present application, the zenith distance, inclined distance, and horizontal angle measured can be obtained from the measurement data affected by atmospheric vertical refraction collected by the total station, and then the three-dimensional coordinates of the measuring point affected by atmospheric vertical refraction can be obtained.

[0107] Step S606: Ray tracing improvement.

[0108] Among them, in the embodiments of the present application, in combination with the refractive index profile structure and Snell's law, after determining the layer thickness ΔH, the propagation path of the light is traced layer by layer, and the equivalent one-way propagation time of the light is used as n i ×ΔS i When the cumulative propagation time of N + 1 layers is greater than n 0 ×S ce then stop tracking and calculate the last layer, and then obtain the corrected inclined distance S sum , horizontal distance D sum and height difference H sum .

[0109] Step S607: Improved result of height difference.

[0110] It can be understood that in the embodiments of the present application, the three-dimensional coordinates of the measuring point with higher accuracy can be obtained by using the horizontal distance and height difference that weaken the influence of atmospheric vertical refraction.

[0111] According to the atmospheric vertical refraction correction method based on the local meteorological field model proposed in the embodiments of the present application, meteorological data can be obtained by combining initial meteorological data and measurement data affected by atmospheric vertical refraction, and a local meteorological field model can be constructed based on the meteorological data. On this basis, a refractive index profile structure is further constructed. The refractive index profile structure is tracked layer by layer in combination with the obtained measurement data, and then three-dimensional coordinates with the influence of atmospheric vertical refraction eliminated are obtained, thereby weakening the influence of atmospheric vertical refraction on the ranging value, correcting the horizontal distance measurement value in the horizontal plane and the height difference measurement value in the vertical plane, improving the horizontal displacement monitoring accuracy and vertical displacement monitoring accuracy of the monitoring point, and providing more accurate data support for precision intelligent engineering monitoring. Thus, the problems in the related art are solved, that is, in a complex atmospheric environment, the monitoring accuracy of the horizontal and vertical displacements of the measuring points is relatively low, there are large deviations, it cannot be used under the requirements of high-precision actual monitoring environments, and it is difficult to obtain high-precision monitoring and warning results.

[0112] Next, a description is given of an atmospheric vertical refraction correction device based on a local meteorological field model proposed in the embodiments of the present application with reference to the accompanying drawings.

[0113] Figure 7 It is a block diagram of an atmospheric vertical refraction correction device based on a local meteorological field model provided according to the embodiments of the present application.

[0114] As Figure 7 shown, the atmospheric vertical refraction correction device 10 based on the local meteorological field model includes: a matching module 100, a construction module 200, a generation module 300, and an elimination module 400.

[0115] Among them, the matching module 100 is used to obtain the initial meteorological data of the measuring point in the target measuring station and the measurement data affected by atmospheric vertical refraction, and based on the initial meteorological data and the measurement data, determine the meteorological data whose measurement time of the initial meteorological data and the measurement time of the measurement data meet the preset matching time.

[0116] The construction module 200 is used to construct a local meteorological field model including the target measuring station and the measuring point based on the meteorological data and the DEM data including the target measuring station and the measuring point.

[0117] The generation module 300 is used to determine the position where the refractive index profile structure is located by combining the measurement data and the local meteorological field model data in the profile where the ranging optical path curve is located, where the refractive index profile structure is composed of at least one layer of refractive index layer, and the layer thicknesses of different refractive index profile structures are different.

[0118] The elimination module 400 is used to perform atmospheric vertical refraction correction on the measurement data by combining Snell's law and the refractive index profile structure, obtain the horizontal distance and height difference with the influence of atmospheric vertical refraction weakened, and obtain the three-dimensional coordinates of the measuring point with higher accuracy based on the horizontal distance and the height difference.

[0119] Optionally, in an embodiment of the present application, it further includes: a first determination module and a second determination module.

[0120] Wherein, the first determination module is configured to determine the resolution of the local meteorological field model according to the DEM data.

[0121] The second determination module is configured to determine the resolution of the refractive index profile structure based on the resolution.

[0122] Optionally, in an embodiment of the present application, the elimination module 400 includes: a first calculation unit, a determination unit, and a second calculation unit.

[0123] Wherein, the first calculation unit is configured to calculate the light propagation time of each refractive index layer by combining the refractive index profile structure and the layer thickness.

[0124] The determination unit is configured to accumulate the light propagation time of the refractive index layer until the accumulated light propagation time is greater than the propagation time of the slant range measurement value in the measurement data, and correct the last layer of the refractive index profile structure based on the accumulated light propagation time to obtain the corrected last layer.

[0125] The second calculation unit is configured to accumulate all the layers in the refractive index profile structure based on the corrected last layer and calculate the horizontal distance and height difference of the measurement data.

[0126] Optionally, in an embodiment of the present application, the calculation formulas for the horizontal distance and height difference can be but are not limited to:

[0127]

[0128] Wherein, n 0 is the reference refractive index of the total station, S ce is the slant range measurement value, n i is the fixed refractive index constant obtained from the refractive index profile structure, ΔS i is the optical path length in the i-th layer, H i is the height, S sum , D sum and H sum are the corrected slant range, horizontal distance, and height difference, respectively.

[0129] Optionally, in an embodiment of the present application, the calculation formula for the three-dimensional coordinates of the measurement point can be but is not limited to:

[0130]

[0131] Wherein, (X ce , Y ce , H ce) is the coordinate of the measurement station, α is the measured horizontal angle, i is the instrument height, and v is the prism height.

[0132] It should be noted that the foregoing explanation of the embodiment of the atmospheric vertical refraction correction method based on the local meteorological field model is also applicable to the atmospheric vertical refraction correction device based on the local meteorological field model of this embodiment, and will not be elaborated here.

[0133] The atmospheric vertical refraction correction device based on the local meteorological field model proposed according to the embodiments of the present application can combine the initial meteorological data and the measurement data affected by the atmospheric vertical refraction to obtain meteorological data, and construct a local meteorological field model based on the meteorological data. On this basis, a refractive index profile structure is further constructed. The refractive index profile structure is tracked layer by layer in combination with the obtained measurement data, and then the three-dimensional coordinates without the influence of atmospheric vertical refraction are obtained, thereby weakening the influence of atmospheric vertical refraction on the ranging value, correcting the horizontal distance measurement value in the horizontal plane and the height difference measurement value in the vertical plane, and improving the horizontal displacement monitoring accuracy and vertical displacement monitoring accuracy of the monitoring point, providing more accurate data support for precision intelligent engineering monitoring. Thus, the problems in the related art are solved, that is, in a complex atmospheric environment, the monitoring accuracy of the horizontal and vertical displacements of the measuring points is low, there are large deviations, it cannot be used under the requirements of high-precision actual monitoring environments, and it is difficult to obtain high-precision monitoring and warning results.

[0134] Figure 8 It is a schematic structural diagram of an electronic device provided according to an embodiment of the present application. The electronic device may include:

[0135] A memory 801, a processor 802, and a computer program stored on the memory 801 and executable on the processor 802.

[0136] When the processor 802 executes the program, it implements the atmospheric vertical refraction correction method provided in the above embodiment.

[0137] Furthermore, the electronic device further includes:

[0138] A communication interface 803 for communication between the memory 801 and the processor 802.

[0139] The memory 801 is used to store a computer program executable on the processor 802.

[0140] The memory 801 may include a high-speed RAM memory, and may also include a non-volatile memory, such as at least one disk memory.

[0141] If the memory 801, the processor 802, and the communication interface 803 are implemented independently, the communication interface 803, the memory 801, and the processor 802 can be interconnected through a bus and communicate with each other. The bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, an Extended Industry Standard Architecture (EISA) bus, etc. The bus can be divided into an address bus, a data bus, a control bus, etc. For ease of representation, Figure 8 only a thick line is used to represent it in Figure 8 , but it does not mean that there is only one bus or one type of bus.

[0142] Optionally, in a specific implementation, if the memory 801, the processor 802, and the communication interface 803 are integrated on a single chip, the memory 801, the processor 802, and the communication interface 803 can communicate with each other through an internal interface.

[0143] The processor 802 may be a Central Processing Unit (CPU), or an Application Specific Integrated Circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of the present application.

[0144] The embodiments of the present application also provide a computer-readable storage medium, on which a computer program is stored, and when the program is executed by a processor, the above method for atmospheric vertical refraction correction based on a local meteorological field model is implemented.

[0145] The embodiments of the present application also provide a computer program product, including a computer program, and when the program is executed, the above method for atmospheric vertical refraction correction based on a local meteorological field model is implemented.

[0146] In the description of this specification, the descriptions with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples", etc. mean that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of this application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described may be combined in any one or N embodiments or examples in a suitable manner. In addition, without contradiction, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of different embodiments or examples.

[0147] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include at least one of these features. In the description of this application, the meaning of "N" is at least two, such as two, three, etc., unless otherwise specifically defined.

[0148] Any process or method description shown in the flowchart or described in other ways herein may be understood to represent a module, segment, or portion of code including one or N executable instructions for implementing a customized logic function or process, and the scope of the preferred embodiments of this application includes additional implementations, where the functions may be executed in a substantially simultaneous manner or in a reverse order according to the involved functions, rather than in the order shown or discussed, which should be understood by those skilled in the art to which the embodiments of this application belong.

[0149] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as a definitional sequence list of executable instructions for implementing logical functions, which can be specifically implemented in any computer-readable medium for use by an instruction execution system, apparatus, or device (such as a computer-based system, a system including a processor, or other systems that can fetch and execute instructions from the instruction execution system, apparatus, or device), or in conjunction with these instruction execution systems, apparatus, or devices. For the purposes of this specification, a "computer-readable medium" can be any device that can contain, store, communicate, propagate, or transport a program for use by or in conjunction with an instruction execution system, apparatus, or device. More specific examples (non-exhaustive list) of computer-readable media include the following: an electrical connection portion (electronic device) having one or N wirings, a portable computer disk cartridge (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disc read-only memory (CDROM). Additionally, the computer-readable medium can even be paper or other suitable media on which the program can be printed, since the program can be obtained electronically by optically scanning the paper or other media, followed by editing, interpretation, or otherwise processing as appropriate, and then storing it in a computer memory.

[0150] It should be understood that various parts of the present application can be implemented by hardware, software, firmware, or a combination thereof. In the above-described embodiments, the N steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system. If implemented in hardware, as in another embodiment, any one or a combination of the following techniques known in the art can be used: discrete logic circuits having logic gate circuits for implementing logical functions on data signals, application-specific integrated circuits having suitable combinational logic gate circuits, programmable gate arrays (PGAs), field-programmable gate arrays (FPGAs), etc.

[0151] Those of ordinary skill in the art of this technology can understand that all or part of the steps carried by the methods of the above-described embodiments can be completed by instructing relevant hardware through a program, and the program can be stored in a computer-readable storage medium. When the program is executed, it includes one or a combination of the steps of the method embodiments.

[0152] In addition, each functional unit in various embodiments of the present application may be integrated into a processing module, may exist physically separately for each unit, or two or more units may be integrated into one module. The above-mentioned integrated module may be implemented in the form of hardware or in the form of a software functional module. When the integrated module is implemented in the form of a software functional module and sold or used as an independent product, it may also be stored in a computer-readable storage medium.

[0153] The above-mentioned storage medium may be a read-only memory, a magnetic disk, an optical disc, etc. Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and should not be construed as limiting the present application. Those of ordinary skill in the art can make changes, modifications, substitutions, and variations to the above embodiments within the scope of the present application.

Claims

1. A method for correcting atmospheric vertical refraction based on a local meteorological field model, characterized in that: The following steps are involved: Acquire initial meteorological data of a measuring point in a target measuring station and measurement data affected by atmospheric vertical refraction, and determine, based on the initial meteorological data and the measurement data, the measurement time of the initial meteorological data and the meteorological data that meets a preset matching time among the measurement times of the measurement data; Based on the meteorological data satisfying the preset matching time and the digital elevation model DEM data including the target station and the measuring point, a local meteorological field model including the target station and the measuring point is constructed; Determine the location of the refractive index profile structure by combining the measurement data and the local meteorological field model data in the section where the ranging light path curve is located, wherein the refractive index profile structure is composed of at least one refractive index layer, and the layer thicknesses of different refractive index profile structures are different; Combining Snell's law and the refractive index profile structure, the measurement data is corrected for atmospheric vertical refraction to obtain a horizontal distance and a height difference that reduce the influence of atmospheric vertical refraction, and based on the horizontal distance and the height difference, the three-dimensional coordinates of the measurement point with higher accuracy are obtained.

2. The method according to claim 1, characterized in that Also includes: Determining the resolution of the local meteorological field model according to the DEM data; A resolution of the refractive index profile structure is determined based on the resolution.

3. The method according to claim 1, characterized in that Combining Snell's law and the refractive index profile structure, the measurement data is corrected for atmospheric vertical refraction to obtain a horizontal distance and height difference that reduce the influence of atmospheric vertical refraction, including: Calculating the light propagation time for each refractive index layer in combination with the refractive index profile structure and the layer thickness; Accumulating the light propagation time of the refractive index layer until the accumulated light propagation time is greater than the propagation time of the slant distance measurement value in the measurement data, and correcting the last layer of the refractive index profile structure based on the accumulated light propagation time to obtain a corrected last layer; Based on the corrected last layer, all layers in the refractive index profile structure are accumulated to calculate the horizontal distance and height difference of the measurement data.

4. The method according to claim 1, characterized in that: The calculation formulas for the horizontal distance and the height difference are respectively: Where n0 is the reference refractive index of the measuring robot, S ce is the slope distance measurement value, n i is the fixed refractive index constant obtained from the refractive index profile structure, ΔS i is the optical path length in the i-th layer, H i is the elevation value of the i-th layer, S sum , D sum and H sum are the corrected slope distance, horizontal distance and height difference, ΔD i is the horizontal distance length within the i-th layer.

5. The method according to claim 4, characterized in that The calculation formula of the three-dimensional coordinates of the measuring point is: Among them, (X ce ,Y ce ,H ce ) is the coordinate of the measuring station, α is the measuring horizontal angle, j is the instrument height, and v is the prism height.

6. An atmospheric vertical refraction correction device based on a local meteorological field model, characterized in that: include: A matching module, used to obtain initial meteorological data of a measuring point in a target measuring station and measurement data affected by atmospheric vertical refraction, and determine, based on the initial meteorological data and the measurement data, the measurement time of the initial meteorological data and the measurement time of the measurement data that satisfies a preset matching time; A construction module, configured to construct a local meteorological field model including the target station and the measuring point based on the meteorological data satisfying the preset matching time and the DEM data including the target station and the measuring point; A generating module, used for combining the measurement data and the local meteorological field model data in the section where the ranging light path curve is located, to determine the location of the refractive index profile structure, wherein the refractive index profile structure is composed of at least one refractive index layer, and the layer thicknesses of different refractive index profile structures are different; The elimination module is used to combine Snell's law and the refractive index profile structure to perform atmospheric vertical refraction correction on the measurement data, obtain the horizontal distance and height difference that reduce the influence of atmospheric vertical refraction, and obtain the three-dimensional coordinates of the measurement point with higher accuracy based on the horizontal distance and the height difference.

7. The device according to claim 6, characterized in that Also includes: A first determination module is used to determine the resolution of the local meteorological field model according to the DEM data; A second determination module is used to determine the resolution of the refractive index profile structure based on the resolution.

8. The device according to claim 6, characterized in that The elimination module comprises: a first calculation unit for calculating the light propagation time of each refractive index layer in combination with the refractive index profile structure and the layer thickness; a determination unit, configured to accumulate the light propagation time of the refractive index layer until the accumulated light propagation time is greater than the propagation time of the slant distance measurement value in the measurement data, and to correct the last layer of the refractive index profile structure based on the accumulated light propagation time to obtain a corrected last layer; The second calculation unit is used to accumulate all layers in the refractive index profile structure based on the corrected last layer, and calculate the horizontal distance and height difference of the measurement data.

9. The device according to claim 6, characterized in that The calculation formulas for the horizontal distance and the height difference are respectively: Where n0 is the reference refractive index of the measuring robot, S ce is the slope distance measurement value, n i is the fixed refractive index constant obtained from the refractive index profile structure, ΔS i is the optical path length in the i-th layer, H i is the elevation value of the i-th layer, S sum , D sum and H sum are the corrected slope distance, horizontal distance and height difference, ΔD i is the horizontal distance length within the i-th layer.

10. The device according to claim 9, characterized in that The calculation formula of the three-dimensional coordinates of the measuring point is: Among them, (X ce ,Y ce ,H ce ) is the coordinate of the measuring station, α is the measuring horizontal angle, j is the instrument height, and v is the prism height.

11. An electronic device, characterized in that: include: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the atmospheric vertical refraction correction method based on a local meteorological field model as described in any one of claims 1 to 5.

12. A computer-readable storage medium having a computer program stored thereon, characterized in that: The program is executed by a processor to implement the atmospheric vertical refraction correction method based on a local meteorological field model as described in any one of claims 1 to 5.

13. A computer program product, characterized in that It comprises a computer program, which, when executed, is used to implement the atmospheric vertical refraction correction method based on the local meteorological field model as described in any one of claims 1 to 5.

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