Testing system of signal amplifying and shaping circuit

By designing a signal amplification and shaping circuit test system, using PC, signal components, power supply components and relay modules, the reference voltage and negative pulse signal test of the signal amplification and shaping circuit are realized, solving the gap in the test system in the existing technology and improving the The accuracy and efficiency of the tests are carried out.

CN119310437APending Publication Date: 2025-01-14SUZHOU R&D CENT OF NO 214 RES INST OF CHINA NORTH IND GRP
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Patent Information

Application Number
CN202411510924.6
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-10-28
Publication Date
2025-01-14

AI Technical Summary

Technical Problem

The existing technology lacks a test system for signal amplification and shaping circuits, and cannot effectively conduct reference voltage testing and negative pulse signal testing, which affects the accuracy and stability of signal amplification and shaping circuits.

Method used

A test system for signal amplification and shaping circuit is designed, including PC, signal component, power supply component, relay module and output signal detection unit. Different signals and voltages are provided through signal component and power supply component, and the relay module is switched on and off. Implement tests of reference voltage and negative pulse signals.

Benefits of technology

The reference voltage and negative pulse signal testing of the signal amplification and shaping circuit are realized, which improves the accuracy and efficiency of the test, is suitable for batch testing, reduces the possibility of misoperation by testers, and reduces production costs.

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Abstract

The invention discloses a test system for a signal amplifying and shaping circuit. The test system comprises a PC, a signal assembly, a power supply assembly, a relay module and an output signal detection unit, the PC is used for outputting control data of the signal assembly, control data of the power supply assembly and channel switching data of the relay module, and receiving a test result of the output signal detection unit; the signal assembly is used for providing different signals for the tested circuit according to the control data of the signal assembly; the power supply assembly is used for providing power supplies with different voltages for the tested circuit according to control data of the power supply assembly; the relay module is used for controlling the eight relays to perform on-off switching according to the relay module channel switching data; and the output signal detection unit is used for carrying out reference voltage test and negative pulse signal test on the tested circuit. According to the invention, reference voltage testing and negative pulse signal testing can be carried out on the signal amplification shaping circuit.
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Description

Technical Field

[0001] The invention relates to a test system for a signal amplifying and shaping circuit, belonging to the technical field of circuit testing. Background Art

[0002] Four-quadrant laser detectors are a type of laser detectors that are widely used in industry, transportation, communications, military, etc. The principle is that when the reflected light spot falls on the detector surface divided by the Cartesian coordinate system, based on the photoelectric effect, the four quadrants will output electrical signals of different intensities to achieve the detection of the target.

[0003] Since the electrical signal generated by the photosensitive material on the detector is very small, it needs to go through a signal amplification and shaping circuit to identify and process the signal in each quadrant. In order to ensure the accuracy and stability of the signal amplification and shaping circuit, the signal amplification and shaping circuit needs to be tested for reference voltage and negative pulse. Currently, there is no system for testing the signal amplification and shaping circuit. Summary of the invention

[0004] The purpose of the present invention is to overcome the deficiencies in the prior art and provide a test system for a signal amplifying and shaping circuit, which can perform a reference voltage test and a negative pulse signal test on the signal amplifying and shaping circuit. To achieve the above purpose, the present invention is implemented by adopting the following technical solutions: In a first aspect, the present invention provides a test system for a signal amplification and shaping circuit, comprising: a PC, a signal component, a power supply component, a relay module, and an output signal detection unit; The PC is used to output control data of the signal component, control data of the power component, and channel switching data of the relay module, and receive the test result of the output signal detection unit; The input end of the signal component is connected to the PC, and the output end is connected to the relay of the relay module and then connected to the circuit under test, so as to provide different signals to the circuit under test according to the control data of the signal component; The input end of the power supply component is connected to the PC, and the output end is connected to the circuit under test, connected to the sub-relay of the relay module, and then connected to the circuit under test, and is used to provide power supplies of different voltages to the circuit under test according to the control data of the power supply component; The relay module includes eight relays, which are used to control the eight relays to switch on and off according to the channel switching data of the relay module; The output signal detection unit has an input end connected to the circuit under test, and an output end connected to a PC, and is used to perform a reference voltage test and a negative pulse signal test on the circuit under test.

[0005] In combination with the first aspect, optionally, the signal component includes a signal source, a signal conversion unit and a preamplification unit, The signal source input end is connected to the PC, and the output end is connected to the signal conversion unit and the preamplification unit, and is used to generate different pulse signals according to the control data of the signal component and then input them into the signal conversion unit and the preamplification unit respectively; The signal conversion unit is used to convert the pulse signal output by the signal source into a four-way sharp pulse signal, and the output end is connected to the relay of the relay module and then connected to the A channel, B channel, C channel and D channel of the circuit under test respectively; The preamplifier unit is used to pre-process the pulse signal output by the signal source into an amplified signal, and the output end is connected to the relay of the relay module and then connected to the Um channel of the circuit under test.

[0006] In combination with the first aspect, optionally, the signal conversion unit includes a potentiometer R1, an operational amplifier N1, and output resistors R8-R11; the operational amplifier N1 includes a port 102, a port 103, a port 104, a port 106, and a port 107; One end of the potentiometer R1 is connected to the signal source, and the other end is connected to the port 103 of the operational amplifier N1. The potentiometer R1 is used to adjust the circuit impedance of the signal conversion unit; The port 102 of the operational amplifier N1 is grounded, and the port 104 and the port 107 are connected to a power supply of -12V voltage and a power supply of +12V voltage respectively; One end of the output resistors R8~R11 is connected to the port 106 of the operational amplifier N1, and the other end is respectively connected to the first relay, the second relay, the third relay and the fourth relay of the relay module and then connected to the A channel, the B channel, the C channel and the D channel of the circuit under test, for outputting four-way sharp pulse signals.

[0007] In combination with the first aspect, optionally, the preamplifier unit includes an input capacitor C7, a potentiometer R12, a potentiometer R13, an operational amplifier N2 and an output capacitor C11; the operational amplifier N2 includes a port 202, a port 203, a port 206 and a port 207; One end of the input capacitor C7 is connected to the signal source, and the other end is connected to one end of the potentiometer R12, and the other end of the potentiometer R12 is connected to the port 202 of the operational amplifier N2; one end of the potentiometer R13 is connected to the port 202 of the operational amplifier N2, and the other end is connected to the port 206 of the operational amplifier N2; the potentiometer R12 and the potentiometer R13 are used to adjust the circuit impedance of the preamplifier unit; The port 203 of the operational amplifier N2 is grounded, and the port 207 is connected to a power supply with a voltage of +5V; One end of the output capacitor C11 is connected to the port 206 of the operational amplifier N2, and the other end is connected to the fifth relay of the relay module and then connected to the Um channel of the circuit under test, so as to output an amplified pulse signal.

[0008] In combination with the first aspect, optionally, it further includes an input signal debugging unit; The output end of the input signal debugging unit is connected to the PC, the input end is connected to the A channel and Um channel of the circuit under test, and the output end is connected to the PC, which is used to perform signal debugging before the sharp pulse signal and the amplified signal are input into the circuit under test.

[0009] In combination with the first aspect, optionally, the power supply assembly includes a DC power supply and a power conversion unit; The DC power input end is connected to the PC, and the output end is connected to the input end of the power conversion unit and the power channel of the circuit under test, and is used to provide a +12V voltage power supply and a -12V voltage power supply to the power conversion unit and the circuit under test according to the control data of the power supply component; The power conversion unit is used to convert a +12V power supply into a +5V power supply, and to convert a -12V power supply into a -6V power supply. After the output end is connected to the relay of the relay module, the +5V power supply is connected to the / YZG channel, COUT channel and / JG channel of the circuit under test and the +5V input channel of the circuit under test, and the output end is connected to the -6V input channel of the circuit under test.

[0010] In combination with the first aspect, optionally, the power conversion unit includes a voltage regulator N3 and a voltage regulator N4, The voltage regulator N3 is used to convert a +12V voltage power supply into a +5V voltage power supply, the input end is connected to the +12V voltage power supply of the DC power supply, the output end is connected to the sixth relay of the relay module and then connected to the / YZG channel of the circuit under test, the seventh relay of the relay module and then connected to the COUT channel of the circuit under test, the eighth relay of the relay module and then connected to the / JG channel of the circuit under test, and directly connected to the +5V input channel of the circuit under test; the input end and the output end of the voltage regulator N3 are both connected to a filter capacitor; The voltage regulator N4 is used to convert a -12V voltage power supply into a -6V voltage power supply, the input end is connected to the -12V voltage power supply of the DC power supply, and the output end is connected to the -6V input channel of the circuit under test; the input and output ends of the voltage regulator N4 are both connected to filter capacitors.

[0011] In combination with the first aspect, optionally, the eight relays are respectively a first relay, a second relay, a third relay, a fourth relay, a fifth relay, a sixth relay, a seventh relay and an eighth relay; One end of the first relay is connected to the signal conversion unit of the signal component, and the other end is connected to the A channel of the circuit under test of the circuit under test; One end of the second relay is connected to the signal conversion unit of the signal component, and the other end is connected to the B channel of the circuit under test of the circuit under test; One end of the third relay is connected to the signal conversion unit of the signal component, and the other end is connected to the C channel of the circuit under test of the circuit under test; One end of the fourth relay is connected to the signal conversion unit of the signal component, and the other end is connected to the D channel of the circuit under test of the circuit under test; One end of the fifth relay is connected to the preamplifier unit of the signal component, and the other end is connected to the Um channel of the circuit under test of the circuit under test; One end of the sixth relay is connected to the power conversion unit of the power supply assembly, and the other end is connected to the / YZG channel of the circuit under test of the circuit under test; One end of the seventh relay is connected to the power conversion unit of the signal component, and the other end is connected to the COUT channel of the circuit under test of the circuit under test; One end of the eighth relay is connected to the power conversion unit of the signal component, and the other end is connected to the / JG channel of the circuit under test.

[0012] In combination with the first aspect, optionally, performing a reference voltage test on the circuit under test includes: Step a: the power supply assembly outputs a DC power supply, disconnects the first relay, the second relay, the third relay, the fourth relay, the fifth relay and the seventh relay, closes the sixth relay and the eighth relay, and the output signal detection unit tests the first-level reference voltage; Step b: the power supply component keeps outputting direct current power, disconnects the first relay, the second relay, the third relay, the fourth relay and the fifth relay, closes the sixth relay, the seventh relay and the eighth relay, and the output signal detection unit tests the second-level reference voltage; Step c: the power supply component keeps outputting DC power, disconnects the first relay, the second relay, the third relay, the fourth relay, the fifth relay and the sixth relay, closes the seventh relay and the eighth relay, and the output signal detection unit tests the third level reference voltage.

[0013] In combination with the first aspect, optionally, performing a negative pulse signal test on the circuit under test includes: Step a: the power supply assembly outputs a DC power supply, disconnects the first relay, the second relay, the third relay, the fourth relay, the fifth relay and the seventh relay, and closes the sixth relay and the eighth relay, so that the output signal detection unit keeps monitoring the first-level reference voltage during the test; Step b: the signal component outputs a -25mV pulse signal, closes the first relay, and the output signal detection unit tests the negative pulse signal of the A channel of the circuit under test, and disconnects the first relay after the test is completed; closes the second relay, and the output signal detection unit tests the negative pulse signal of the B channel of the circuit under test, and disconnects the second relay after the test is completed; closes the third relay, and the output signal detection unit tests the negative pulse signal of the C channel of the circuit under test, and disconnects the third relay after the test is completed; closes the fourth relay, and the output signal detection unit tests the negative pulse signal of the C channel of the circuit under test, and disconnects the fourth relay after the test is completed; Step c: The signal component outputs a pulse signal of -270mV, closing the fifth relay, and the output signal detection unit detects the U of the circuit under test. m The negative pulse signal of the channel is tested, and the fifth relay is disconnected after the test is completed.

[0014] Compared with the prior art, the test system for a signal amplification and shaping circuit provided by the embodiment of the present invention has the following beneficial effects: The signal component of the present invention is used to provide different signals for the circuit under test according to the control data of the signal component, and eight relays are controlled by the relay module to switch on and off. The present invention can perform negative pulse signal testing on the circuit under test, filling the gap in the prior art; The power supply assembly of the present invention is used to provide power supplies of different voltages to the circuit under test according to the control data of the power supply assembly, and the eight relays are controlled by the relay module to switch on and off. The present invention can perform a reference voltage test on the circuit under test, thus filling the gap in the prior art. The present invention provides an input signal debugging unit for debugging the signal before the sharp pulse signal and the amplified signal are input into the circuit under test, so as to ensure the correctness and integrity of the input signal; The present invention can be used in batch testing of signal amplification and shaping circuit products, can quickly complete the test of circuit indicators, can directly complete the determination of circuit eligibility, reduces the possibility of erroneous operation by testers, speeds up the production cycle, and reduces production costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 It is a structural schematic diagram of a test system for a signal amplification and shaping circuit provided in Embodiment 1 of the present invention; Figure 2 It is a circuit diagram of a signal conversion unit in a test system of a signal amplification and shaping circuit provided in Embodiment 1 of the present invention; Figure 3 It is a circuit diagram of a preamplifier unit in a test system of a signal amplification and shaping circuit provided in Embodiment 1 of the present invention; Figure 4It is a circuit diagram of a power conversion unit in a test system of a signal amplification and shaping circuit provided in Example 1 of the present invention. DETAILED DESCRIPTION

[0016] The present invention will be further described below in conjunction with the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the present invention, and cannot be used to limit the protection scope of the present invention. Example 1

[0017] like Figure 1 As shown, the present invention provides a test system for a signal amplification and shaping circuit, comprising: a PC, a signal component, a power supply component, a relay module, an output signal detection unit and an input signal debugging unit.

[0018] In this embodiment, PC is the abbreviation of Personal Computer, which is used to output control data of the signal component, control data of the power component, relay module channel switching data, and receive the test result of the output signal detection unit.

[0019] The test result of the signal detection unit includes a reference voltage test result and a negative pulse signal test result.

[0020] Furthermore, the PC processes and calculates the received test results through the configured algorithms and programs, and can obtain other parameter information of the measured signal amplifying and shaping circuit. The PC is connected to the display component, and can display the measurement results, display the processed and calculated other parameter information of the measured signal amplifying and shaping circuit.

[0021] The input end of the signal component is connected to the PC, and the output end is connected to the relay of the relay module and then connected to the circuit under test. It is used to provide different signals to the circuit under test according to the control data of the signal component.

[0022] like Figure 1 As shown, the signal component includes a signal source, a signal conversion unit and a preamplification unit.

[0023] The signal source input end is connected to the PC, and the output end is connected to the signal conversion unit and the preamplifier unit, and is used to generate different pulse signals according to the control data of the signal component and then input them into the signal conversion unit and the preamplifier unit respectively.

[0024] The signal conversion unit is used to convert the pulse signal output by the signal source into a four-way sharp pulse signal. The output end is connected to the relay of the relay module and then connected to the A channel, B channel, C channel and D channel of the circuit under test respectively.

[0025] like Figure 2As shown, the signal conversion unit includes a potentiometer R1, an operational amplifier N1, output resistors R8-R11, resistors R2-R7, and capacitors C1-C6. The operational amplifier N1 includes a port 102, a port 103, a port 104, a port 106, and a port 107.

[0026] One end of the potentiometer R1 is connected to the signal source, and the other end is connected to the port 103 of the operational amplifier N1. The potentiometer R1 is used to adjust the circuit impedance of the signal conversion unit.

[0027] The terminal 102 of the operational amplifier N1 is grounded, and the terminal 104 and the terminal 107 are connected to a power supply of -12V voltage and a power supply of +12V voltage, respectively.

[0028] One end of the output resistors R8~R11 is connected to the port 106 of the operational amplifier N1, and the other end is respectively connected to the first relay, the second relay, the third relay and the fourth relay of the relay module and then connected to the A channel, the B channel, the C channel and the D channel of the circuit under test, for outputting four sharp pulse signals.

[0029] One end of capacitor C2 is connected to potentiometer R1, and the other end is connected to port 103 of operational amplifier N1. One end of resistor R2 and capacitor C1 is connected between potentiometer R1 and capacitor C2, and the other end is grounded. One end of resistor R4 is connected between capacitor C2 and port 103 of operational amplifier N1, and the other end is grounded. One end of resistor R3 is connected to port 102 of operational amplifier N1, and the other end is grounded. One end of resistor R7 is connected to port 102 of operational amplifier N1, and the other end is connected to port 106 of operational amplifier N1. One end of resistor R5 is connected to port 104 of operational amplifier N1, and the other end is connected to a power supply with a voltage of -12V. Capacitor C3 and capacitor C5 are connected in parallel, and one end of capacitor C3 and capacitor C5 is connected to port 104 of operational amplifier N1, and the other end is grounded. One end of resistor R6 is connected to port 107 of operational amplifier N1, and the other end is connected to a power supply with a voltage of +12V. The capacitor C4 and the capacitor C6 are connected in parallel, one end of the capacitor C4 and the capacitor C6 are connected to the port 107 of the operational amplifier N1, and the other end is grounded.

[0030] The preamplifier unit is used to pre-process the pulse signal output by the signal source into an amplified signal, and the output end is connected to the relay of the relay module and then connected to the Um channel of the circuit under test.

[0031] like Figure 3 As shown, the preamplifier unit includes an input capacitor C7, a potentiometer R12, a potentiometer R13, an operational amplifier N2, an output capacitor C11, resistors R14-R15, capacitors C8-C10, capacitor C12, and capacitor C13. The operational amplifier N2 includes a port 202, a port 203, a port 206, and a port 207.

[0032] One end of the input capacitor C7 is connected to the signal source, and the other end is connected to one end of the potentiometer R12, and the other end of the potentiometer R12 is connected to the port 202 of the operational amplifier N2. One end of the potentiometer R13 is connected to the port 202 of the operational amplifier N2, and the other end is connected to the port 206 of the operational amplifier N2. The potentiometer R12 and the potentiometer R13 are used to adjust the circuit impedance of the preamplifier unit.

[0033] The terminal 203 of the operational amplifier N2 is grounded, and the terminal 207 is connected to a power supply of +5V voltage.

[0034] One end of the output capacitor C11 is connected to the port 206 of the operational amplifier N2, and the other end is connected to the fifth relay of the relay module and then connected to the Um channel of the circuit under test, for outputting an amplified pulse signal.

[0035] Capacitor C8 is connected in parallel with potentiometer R13, one end of which is connected to port 202 of operational amplifier N2, and the other end of which is connected to port 206 of operational amplifier N2. One end of resistor R15 is connected to port 207 of operational amplifier N2, and the other end of resistor R15 is connected to a +5V power supply. Capacitor C12 and capacitor C13 are connected in parallel, one end of capacitor C12 and capacitor C13 is connected to port 207 of operational amplifier N2, and the other end of capacitor C12 and capacitor C13 is grounded.

[0036] The operational amplifier N2 further includes a port 204. One end of the resistor R14 is connected to the port 204 of the operational amplifier N2, and the other end is connected to a power supply with a voltage of -6 V. The capacitor C9 and the capacitor C10 are connected in parallel, and one end of the capacitor C9 and the capacitor C10 are connected to the port 204 of the operational amplifier N2, and the other end is grounded.

[0037] like Figure 1 As shown, the input end of the power supply component is connected to the PC, and the output end is connected to the circuit under test, connected to the sub-relay of the relay module, and then connected to the circuit under test, so as to provide power of different voltages to the circuit under test according to the control data of the power supply component.

[0038] The power supply assembly includes a DC power supply and a power conversion unit.

[0039] The DC power input terminal is connected to the PC, and the output terminal is connected to the input terminal of the power conversion unit and the power channel of the circuit under test, and is used to provide +12V voltage power and -12V voltage power to the power conversion unit and the circuit under test according to the control data of the power supply component.

[0040] The power conversion unit is used to convert a +12V power supply into a +5V power supply and a -12V power supply into a -6V power supply. After the output end is connected to the relay of the relay module, the +5V power supply is connected to the / YZG channel, COUT channel and / JG channel of the circuit under test and the +5V input channel of the circuit under test, and the output end is connected to the -6V input channel of the circuit under test.

[0041] like Figure 4 As shown, the power conversion unit includes a voltage regulator N3 and a voltage regulator N4, as well as capacitors C14-C22, a potentiometer R16, and a resistor R17.

[0042] The voltage regulator N3 is used to convert a +12V voltage power supply into a +5V voltage power supply. The input end (port 301) is connected to the +12V voltage power supply of the DC power supply, and the output end (port 303) is connected to the sixth relay of the relay module and then connected to the / YZG channel of the circuit under test, connected to the seventh relay of the relay module and then connected to the COUT channel of the circuit under test, connected to the eighth relay of the relay module and then connected to the / JG channel of the circuit under test, and directly connected to the +5V input channel of the circuit under test.

[0043] The input end of the voltage regulator N3 is connected with a filter capacitor, including a capacitor C14 and a capacitor C15, and the other ends of the capacitor C14 and the capacitor C15 are grounded.

[0044] The output end of the voltage regulator N3 is connected with a filter capacitor, including a capacitor C16 and a capacitor C17, and the other end of the capacitor C16 and the capacitor C17 are grounded.

[0045] The ground terminal (port 302) of the regulator N3 is connected to ground.

[0046] A filter capacitor is connected to both the output end and the output end; The voltage regulator N4 is used to convert a -12V voltage power supply into a -6V voltage power supply. The input end (port 402) is connected to the -12V voltage power supply of the DC power supply, and the output end (port 403) is connected to the -6V input channel of the circuit under test.

[0047] The input end of the voltage regulator N4 is connected with filter capacitors, including capacitor C18 and capacitor C19, and the other ends of the capacitor C18 and the capacitor C19 are grounded.

[0048] The output end of the voltage regulator N4 is connected with a filter capacitor, including capacitor C21 and capacitor C22, and the other ends of the capacitor C21 and capacitor C22 are grounded. Among them, the capacitor C21 is an electrolytic capacitor.

[0049] The ground terminal (port 401) of the voltage regulator N4 is grounded through a capacitor C20. The capacitor C20 is an electrolytic capacitor.

[0050] One end of the potentiometer R16 is connected to the port 401 of the voltage regulator N4, and the other end is grounded. One end of the resistor R17 is connected to the port 401 of the voltage regulator N4, and the other end is connected to the port 403 of the voltage regulator N4.

[0051] Considering the circuit impedance matching problem, the sharp pulse signal and the amplified signal need to be debugged before being input into the circuit under test to ensure that the signal input into the circuit under test is complete and correct. This embodiment is provided with an input signal debugging unit. The output end of the input signal debugging unit is connected to the PC, the input end is connected to the A channel and the Um channel of the circuit under test, and the output end is connected to the PC, which is used to debug the signal before the sharp pulse signal and the amplified signal are input into the circuit under test, so as to ensure the correctness and integrity of the input signal.

[0052] In this embodiment, the input signal debugging unit includes an oscilloscope and a multimeter.

[0053] The input end of the output signal detection unit is connected to the circuit under test, and the output end is connected to the PC, and is used to perform a reference voltage test and a negative pulse signal test on the circuit under test.

[0054] In this embodiment, the output signal detection unit includes an oscilloscope and a multimeter.

[0055] The relay module includes eight relays, which are used to control the on-off switching of the eight relays according to the channel switching data of the relay module.

[0056] Specifically, the eight relays are respectively a first relay, a second relay, a third relay, a fourth relay, a fifth relay, a sixth relay, a seventh relay and an eighth relay.

[0057] One end of the first relay is connected to the signal conversion unit of the signal component, and the other end is connected to the A channel of the measured circuit of the measured circuit.

[0058] One end of the second relay is connected to the signal conversion unit of the signal component, and the other end is connected to the B channel of the measured circuit of the measured circuit.

[0059] One end of the third relay is connected to the signal conversion unit of the signal component, and the other end is connected to the C channel of the measured circuit of the measured circuit.

[0060] One end of the fourth relay is connected to the signal conversion unit of the signal component, and the other end is connected to the D channel of the circuit under test of the circuit under test.

[0061] One end of the fifth relay is connected to the preamplifier unit of the signal component, and the other end is connected to the Um channel of the circuit under test.

[0062] One end of the sixth relay is connected to the power conversion unit of the power supply component, and the other end is connected to the / YZG channel of the circuit under test of the circuit under test.

[0063] One end of the seventh relay is connected to the power conversion unit of the signal component, and the other end is connected to the COUT channel of the circuit under test of the circuit under test; One end of the eighth relay is connected to the power conversion unit of the signal component, and the other end is connected to the / JG channel of the circuit under test of the circuit under test.

[0064] It should be noted that the default state of the eight relays is disconnected.

[0065] The embodiment of the present invention provides a method for using a test system of a signal amplification and shaping circuit, comprising performing a reference voltage test on the circuit under test and performing a negative pulse signal test on the circuit under test.

[0066] The reference voltage test of the circuit under test includes: the PC sends an output instruction to the DC power supply of the power supply component and the signal source of the signal component through the control line, and the DC power supply outputs a +12V voltage power supply and a -12V voltage power supply. Figure 2 As shown, the power conversion unit of the power supply assembly converts the +12V voltage power supply into the +5V voltage power supply, and converts the -12V voltage power supply into the -6V voltage power supply. The first relay of the control relay module is disconnected, the second relay is disconnected, the third relay is disconnected, the fourth relay is disconnected, the fifth relay is disconnected, the sixth relay is closed, the seventh relay is disconnected, and the eighth relay is closed.

[0067] The specific steps include: Step a: The power supply component outputs a DC power supply, disconnects the first relay, the second relay, the third relay, the fourth relay, the fifth relay and the seventh relay, closes the sixth relay and the eighth relay, and the output signal detection unit tests the first-level reference voltage.

[0068] Step b: the power supply component keeps outputting DC power, disconnects the first relay, the second relay, the third relay, the fourth relay and the fifth relay, closes the sixth relay, the seventh relay and the eighth relay, and the output signal detection unit tests the second level reference voltage.

[0069] Step c: the power supply component keeps outputting DC power, disconnects the first relay, the second relay, the third relay, the fourth relay, the fifth relay and the sixth relay, closes the seventh relay and the eighth relay, and the output signal detection unit tests the third level reference voltage.

[0070] This embodiment can perform a reference voltage test on a circuit under test, thus filling a gap in the prior art.

[0071] The negative pulse signal test is performed on the circuit under test, including: the signal source of the PC controls the signal component to output a -25mV pulse signal, which is converted into a -25mV sharp pulse signal by the signal conversion unit of the signal component. Figure 3As shown. The first relay is controlled to close, the input signal debugging unit detects and debugs the signal of channel A, and the PC processes it. After completion, the first relay is disconnected. The signal source of the PC controls the signal component to output a -270mV pulse signal, and the preamplifier unit of the signal component outputs a -270mV amplified signal. Figure 4 In the default state of the relay module, the control relay 5 is closed, the input signal debugging unit detects and debugs the signal of the Um channel, and the PC processes it, and then disconnects the fifth relay.

[0072] The specific steps include: Step a: The power supply component outputs a DC power supply, disconnects the first relay, the second relay, the third relay, the fourth relay, the fifth relay and the seventh relay, and closes the sixth relay and the eighth relay, so that the output signal detection unit keeps monitoring the first-level reference voltage during the test.

[0073] Step b: the signal component outputs a -25mV pulse signal, closes the first relay, and the output signal detection unit tests the negative pulse signal of the A channel of the circuit under test, and disconnects the first relay after the test is completed; closes the second relay, and the output signal detection unit tests the negative pulse signal of the B channel of the circuit under test, and disconnects the second relay after the test is completed; closes the third relay, and the output signal detection unit tests the negative pulse signal of the C channel of the circuit under test, and disconnects the third relay after the test is completed; closes the fourth relay, and the output signal detection unit tests the negative pulse signal of the C channel of the circuit under test, and disconnects the fourth relay after the test is completed.

[0074] Step c: The signal component outputs a pulse signal of -270mV, closing the fifth relay, and the output signal detection unit detects the U of the circuit under test. m The negative pulse signal of the channel is tested, and the fifth relay is disconnected after the test is completed.

[0075] This embodiment can perform a negative pulse signal test on the circuit under test, thus filling the gap in the prior art.

[0076] The above is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the technical principles of the present invention. These improvements and modifications should also be regarded as the scope of protection of the present invention.

Claims

1. A test system for a signal amplification and shaping circuit, characterized in that: include: PC, signal components, power components, relay modules and output signal detection units; The PC is used to output control data of the signal component, control data of the power component, and channel switching data of the relay module, and receive the test result of the output signal detection unit; The input end of the signal component is connected to the PC, and the output end is connected to the relay of the relay module and then connected to the circuit under test, so as to provide different signals to the circuit under test according to the control data of the signal component; The input end of the power supply component is connected to the PC, and the output end is connected to the circuit under test, connected to the sub-relay of the relay module, and then connected to the circuit under test, and is used to provide power supplies of different voltages to the circuit under test according to the control data of the power supply component; The relay module includes eight relays, which are used to control the eight relays to switch on and off according to the channel switching data of the relay module; The output signal detection unit has an input end connected to the circuit under test, and an output end connected to a PC, and is used to perform a reference voltage test and a negative pulse signal test on the circuit under test.

2. The signal amplification and shaping circuit test system according to claim 1, characterized in that: The signal component includes a signal source, a signal conversion unit and a preamplification unit. The signal source input end is connected to the PC, and the output end is connected to the signal conversion unit and the preamplification unit, and is used to generate different pulse signals according to the control data of the signal component and then input them into the signal conversion unit and the preamplification unit respectively; The signal conversion unit is used to convert the pulse signal output by the signal source into a four-way sharp pulse signal, and the output end is connected to the relay of the relay module and then connected to the A channel, B channel, C channel and D channel of the circuit under test respectively; The preamplifier unit is used to pre-process the pulse signal output by the signal source into an amplified signal, and the output end is connected to the relay of the relay module and then connected to the Um channel of the circuit under test.

3. The signal amplification and shaping circuit test system according to claim 2, characterized in that: The signal conversion unit includes a potentiometer R1, an operational amplifier N1, and output resistors R8-R11; the operational amplifier N1 includes a port 102, a port 103, a port 104, a port 106, and a port 107; One end of the potentiometer R1 is connected to the signal source, and the other end is connected to the port 103 of the operational amplifier N1. The potentiometer R1 is used to adjust the circuit impedance of the signal conversion unit; The port 102 of the operational amplifier N1 is grounded, and the port 104 and the port 107 are connected to a power supply of -12V voltage and a power supply of +12V voltage respectively; One end of the output resistors R8~R11 is connected to the port 106 of the operational amplifier N1, and the other end is respectively connected to the first relay, the second relay, the third relay and the fourth relay of the relay module and then connected to the A channel, the B channel, the C channel and the D channel of the circuit under test, for outputting four-way sharp pulse signals.

4. The signal amplification and shaping circuit test system according to claim 2, characterized in that: The preamplifier unit includes an input capacitor C7, a potentiometer R12, a potentiometer R13, an operational amplifier N2 and an output capacitor C11; the operational amplifier N2 includes a port 202, a port 203, a port 206 and a port 207; One end of the input capacitor C7 is connected to the signal source, and the other end is connected to one end of the potentiometer R12, and the other end of the potentiometer R12 is connected to the port 202 of the operational amplifier N2; one end of the potentiometer R13 is connected to the port 202 of the operational amplifier N2, and the other end is connected to the port 206 of the operational amplifier N2; the potentiometer R12 and the potentiometer R13 are used to adjust the circuit impedance of the preamplifier unit; The port 203 of the operational amplifier N2 is grounded, and the port 207 is connected to a power supply with a voltage of +5V; One end of the output capacitor C11 is connected to the port 206 of the operational amplifier N2, and the other end is connected to the fifth relay of the relay module and then connected to the Um channel of the circuit under test, so as to output an amplified pulse signal.

5. The signal amplification and shaping circuit test system according to claim 2, characterized in that: Also includes an input signal debugging unit; The output end of the input signal debugging unit is connected to the PC, the input end is connected to the A channel and Um channel of the circuit under test, and the output end is connected to the PC, which is used to perform signal debugging before the sharp pulse signal and the amplified signal are input into the circuit under test.

6. The signal amplification and shaping circuit test system according to claim 1, characterized in that: The power supply assembly includes a DC power supply and a power conversion unit; The DC power input end is connected to the PC, and the output end is connected to the input end of the power conversion unit and the power channel of the circuit under test, and is used to provide a +12V voltage power supply and a -12V voltage power supply to the power conversion unit and the circuit under test according to the control data of the power supply component; The power conversion unit is used to convert a +12V power supply into a +5V power supply, and to convert a -12V power supply into a -6V power supply. After the output end is connected to the relay of the relay module, the +5V power supply is connected to the / YZG channel, COUT channel and / JG channel of the circuit under test and the +5V input channel of the circuit under test, and the output end is connected to the -6V input channel of the circuit under test.

7. The signal amplification and shaping circuit test system according to claim 6, characterized in that: The power conversion unit includes a voltage regulator N3 and a voltage regulator N4. The voltage regulator N3 is used to convert a +12V voltage power supply into a +5V voltage power supply, the input end is connected to the +12V voltage power supply of the DC power supply, the output end is connected to the sixth relay of the relay module and then connected to the / YZG channel of the circuit under test, the seventh relay of the relay module and then connected to the COUT channel of the circuit under test, the eighth relay of the relay module and then connected to the / JG channel of the circuit under test, and directly connected to the +5V input channel of the circuit under test; the input end and the output end of the voltage regulator N3 are both connected to a filter capacitor; The voltage regulator N4 is used to convert a -12V voltage power supply into a -6V voltage power supply, the input end is connected to the -12V voltage power supply of the DC power supply, and the output end is connected to the -6V input channel of the circuit under test; the input and output ends of the voltage regulator N4 are both connected to filter capacitors.

8. The signal amplification and shaping circuit test system according to claim 1, characterized in that: The eight relays are respectively a first relay, a second relay, a third relay, a fourth relay, a fifth relay, a sixth relay, a seventh relay and an eighth relay; One end of the first relay is connected to the signal conversion unit of the signal component, and the other end is connected to the A channel of the circuit under test of the circuit under test; One end of the second relay is connected to the signal conversion unit of the signal component, and the other end is connected to the B channel of the circuit under test of the circuit under test; One end of the third relay is connected to the signal conversion unit of the signal component, and the other end is connected to the C channel of the circuit under test of the circuit under test; One end of the fourth relay is connected to the signal conversion unit of the signal component, and the other end is connected to the D channel of the circuit under test of the circuit under test; One end of the fifth relay is connected to the preamplifier unit of the signal component, and the other end is connected to the Um channel of the circuit under test of the circuit under test; One end of the sixth relay is connected to the power conversion unit of the power supply assembly, and the other end is connected to the / YZG channel of the circuit under test of the circuit under test; One end of the seventh relay is connected to the power conversion unit of the signal component, and the other end is connected to the COUT channel of the circuit under test of the circuit under test; One end of the eighth relay is connected to the power conversion unit of the signal component, and the other end is connected to the / JG channel of the circuit under test.

9. The signal amplification and shaping circuit test system according to claim 8, characterized in that: The performing of a reference voltage test on the circuit under test comprises: Step a: the power supply assembly outputs a DC power supply, disconnects the first relay, the second relay, the third relay, the fourth relay, the fifth relay and the seventh relay, closes the sixth relay and the eighth relay, and the output signal detection unit tests the first-level reference voltage; Step b: the power supply component keeps outputting direct current power, disconnects the first relay, the second relay, the third relay, the fourth relay and the fifth relay, closes the sixth relay, the seventh relay and the eighth relay, and the output signal detection unit tests the second-level reference voltage; Step c: the power supply component keeps outputting DC power, disconnects the first relay, the second relay, the third relay, the fourth relay, the fifth relay and the sixth relay, closes the seventh relay and the eighth relay, and the output signal detection unit tests the third level reference voltage.

10. The test system for the signal amplification and shaping circuit according to claim 8, characterized in that: Perform negative pulse signal test on the circuit under test, including: Step a: the power supply assembly outputs a DC power supply, disconnects the first relay, the second relay, the third relay, the fourth relay, the fifth relay and the seventh relay, and closes the sixth relay and the eighth relay, so that the output signal detection unit keeps monitoring the first-level reference voltage during the test; Step b: the signal component outputs a -25mV pulse signal, closes the first relay, and the output signal detection unit tests the negative pulse signal of the A channel of the circuit under test, and disconnects the first relay after the test is completed; closes the second relay, and the output signal detection unit tests the negative pulse signal of the B channel of the circuit under test, and disconnects the second relay after the test is completed; closes the third relay, and the output signal detection unit tests the negative pulse signal of the C channel of the circuit under test, and disconnects the third relay after the test is completed; closes the fourth relay, and the output signal detection unit tests the negative pulse signal of the C channel of the circuit under test, and disconnects the fourth relay after the test is completed; Step c: The signal component outputs a pulse signal of -270mV, closing the fifth relay, and the output signal detection unit detects the U of the circuit under test. m The negative pulse signal of the channel is tested, and the fifth relay is disconnected after the test is completed.