VCSEL module polarization test method, equipment, device and computer equipment

Abstract

The present application relates to a VCSEL module polarization test method, equipment, device and computer equipment, which obtain the power-on information of each test point on the driver board; since each test point can correspond to the welding of a VCSEL module to be tested, the position of the VCSEL module to be tested on the driver board that needs to be polarized can be determined according to the power-on information of each test point. The polarization test path is planned according to the power-on information, and the polarization test process is performed on the VCSEL module to be tested on the polarization test path according to the polarization test path. The test path with a short distance can be flexibly configured to perform polarization test on the VCSEL module to be tested, thereby improving the test efficiency. The driver board supplies power to the VCSEL module to be tested under the control of the test control signal, and the polarization drive module drives a polarizer to rotate at a preset angle interval under the enablement of the polarization drive signal corresponding to the test control signal, so that the laser power of the laser radiated by the VCSEL module to be tested and corresponding to the polarization state of the polarizer rotation angle can be obtained.

Description

Technical Field

[0001] The present application relates to the technical field of polarization testing of VCSEL modules, and in particular to a method, equipment, device and computer equipment for polarization testing of VCSEL modules. Background Art

[0002] VCSEL (Vertical-Cavity Surface-Emitting Laser) has the advantages of low threshold current, single longitudinal mode, low power consumption and high reliability. It is widely used in optical communications, 3D Sensor and LiDAR (Light Detection and Ranging). It is also an ideal light source for quantum precision measuring instruments such as atomic clocks, atomic magnetometers and atomic gyroscopes. Polarization extinction ratio is the core performance parameter of polarized light source. It is of great significance to measure polarization extinction ratio efficiently and quickly. Especially in VCSEL reliability testing, a highly repeatable and accurate test system is crucial.

[0003] Traditional manual polarization testing of VCSEL modules is not suitable for industrial and large-scale testing. Manual testing has low test efficiency and cannot accurately record the specific angles of different polarization directions. Especially in VCSEL module reliability testing, a fast, efficient and accurate test system is crucial. Summary of the invention

[0004] Based on this, it is necessary to provide a VCSEL module polarization testing method, equipment, device and computer equipment to address the above technical problems.

[0005] In a first aspect, the present application provides a VCSEL module polarization testing method, the method comprising:

[0006] Obtaining power-on information of each test point on the driver board; wherein each of the test points may correspond to a VCSEL module to be tested;

[0007] Planning a polarization test path according to the power-on information;

[0008] Performing a polarization test process on the VCSEL module to be tested on the polarization test path according to the polarization test path; the polarization test process includes: outputting a test control signal to the driving board so that the driving board supplies power to the VCSEL module to be tested;

[0009] Based on the test control signal, a polarization driving signal is output to enable a polarization driving module to drive a polarizer to rotate at a preset angle interval; wherein when the polarizer rotates, a central axis perpendicular to the extension direction of the polarizer is used as the rotation axis;

[0010] The power test module is controlled to obtain the laser power of the laser in the polarization state selected by the polarizer at different rotation angles.

[0011] In one embodiment, it also includes:

[0012] A test chart is generated based on the laser powers at different rotation angles corresponding to the test control signal.

[0013] In one embodiment, it also includes:

[0014] The test control signal and / or the polarization drive signal are adjusted according to the test chart.

[0015] In one embodiment, the test control signal is used to control at least one of the peak current, drive pulse width and modulation frequency output by the driver board to the VCSEL module to be tested; adjusting the test control signal according to the test chart includes:

[0016] At least one of a peak current, a driving pulse width and a modulation frequency output to the VCSEL module to be tested is adjusted according to the test chart.

[0017] In one embodiment, adjusting the polarization drive signal according to the test chart includes:

[0018] The level state of the polarization driving signal is adjusted according to the test chart to adjust the rotation angle interval or the rotation direction of the polarizer.

[0019] In one embodiment, the polarization test process further includes:

[0020] Outputting a corresponding movement control signal to a movement module according to the polarization test path;

[0021] The moving module controls the polarizer to move to the light-emitting side of each VCSEL module to be tested on the polarization test path according to the polarization test path based on the movement control signal;

[0022] Wherein, the light incident surface of the polarizer is parallel to the light emitting surface of the VCSEL module to be tested.

[0023] In a second aspect, the present application also provides a VCSEL module polarization test device, including:

[0024] A driving board, comprising a plurality of test sites, wherein the test sites are used to access the VCSEL module to be tested; the driving board is used to supply power to the corresponding VCSEL module to be tested through the test sites;

[0025] A main control module is connected to the driving board and is used to obtain power-on information of each test point on the driving board; wherein each of the test points can correspond to a VCSEL module to be tested for welding; a polarization test path is planned according to the power-on information; a polarization test process is performed on the VCSEL module to be tested on the polarization test path according to the polarization test path; the polarization test process includes: outputting a test control signal so that the driving board supplies power to the corresponding VCSEL module to be tested according to the test control signal; and outputting a polarization drive signal based on the test control signal;

[0026] A polarization drive module and a polarizer connected to each other, wherein the polarization drive module is connected to the main control module, and the polarization drive module is used to drive the polarizer to rotate at a preset angle interval when enabled by the polarization drive signal; wherein when the polarizer rotates, the central axis perpendicular to the extension direction of the polarizer is used as the rotation axis;

[0027] The power test module is arranged on the light-emitting side of the polarizer and is used to obtain the laser power of the laser in the polarization state selected by the polarizer at different rotation angles.

[0028] In one embodiment, the main control module is further configured to output a corresponding movement control signal according to the polarization test path; and further comprises:

[0029] A moving module, used for controlling the polarizer to move to the light-emitting side of each VCSEL module to be tested on the polarization test path according to the polarization test path based on the movement control signal;

[0030] Wherein, the light incident surface of the polarizer is parallel to the light emitting surface of the VCSEL module to be tested.

[0031] In a third aspect, the present application further provides a VCSEL module polarization test device, the VCSEL module polarization test device comprising:

[0032] The first receiving module is used to obtain the power-on information of each test point on the driver board; wherein each of the test points can correspond to a VCSEL module to be tested;

[0033] A planning module, used for planning a polarization test path according to the power-on information;

[0034] An execution module is used to execute a polarization test process on the VCSEL module to be tested on the polarization test path according to the polarization test path; the polarization test process includes: outputting a test control signal to the driving board so that the driving board supplies power to the VCSEL module to be tested; outputting a polarization drive signal based on the test control signal so that a polarization drive module can drive a polarizer to rotate according to a preset angle interval; wherein, when the polarizer rotates, the central axis perpendicular to the extension direction of the polarizer is used as the rotation axis;

[0035] The second receiving module is used to obtain the laser power of the laser of the polarization state selected by the polarizer of a power testing module at different rotation angles.

[0036] In a fourth aspect, the present application further provides a computer device, comprising a memory and a processor, wherein the memory stores a computer program, and the processor implements the steps of the above method when executing the computer program.

[0037] The above-mentioned VCSEL module polarization test method, equipment, device and computer equipment obtain the power-on information of each test point on the driver board; since each test point can correspond to the welding of a VCSEL module to be tested, the position of the VCSEL module to be tested on the driver board that needs to be polarized can be determined according to the power-on information of each test point. The polarization test path is planned according to the power-on information, and the polarization test process is performed on the VCSEL module to be tested on the polarization test path according to the polarization test path. The test path with a short distance can be flexibly configured to perform polarization test on the VCSEL module to be tested, thereby improving the test efficiency. The driver board supplies power to the VCSEL module to be tested under the control of the test control signal, and the polarization drive module drives a polarizer to rotate at a preset angle interval under the enablement of the polarization drive signal corresponding to the test control signal, so that the laser power of the laser radiated by the VCSEL module to be tested and corresponding to the rotation angle of the polarizer can be obtained, thereby realizing a more accurate and comprehensive detection of the VCSEL module to be tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the drawings required for use in the embodiments of the present application or related technical descriptions will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0039] Figure 1 Schematic diagram of a process of a VCSEL module polarization test method in one embodiment;

[0040] Figure 2is a schematic diagram of a polarization test process in one embodiment;

[0041] Figure 3 A structural block diagram of a VCSEL module polarization test device in one embodiment;

[0042] Figure 4 A structural block diagram of a VCSEL module polarization test device in one embodiment;

[0043] Figure 5 FIG. 4 is a diagram showing the internal structure of a computer device in one embodiment.

[0044] Description of reference numerals:

[0045] 200: VCSEL module to be tested; 300: VCSEL module polarization test equipment; 310: driving board; 320: main control module; 330: polarization driving module; 340: polarizer; 350: power test module; 400: VCSEL module polarization test device; 410: first receiving module; 420: planning module; 430: execution module; 440: second receiving module. DETAILED DESCRIPTION

[0046] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0047] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0048] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of this application, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0049] In this application, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0050] Polarization testing of VCSEL modules mainly uses polarizing beam splitters (PBS) or polarizers. PBS is used to split the light beam into two parts: parallel polarization (transmitted light) and vertical polarization (reflected light). The light intensity in these two directions is measured by photodetectors. The extinction ratio can be calculated by substituting relevant parameters into the formula, and the aging of the VCSEL module can be characterized based on the extinction ratio. Based on the high flatness of VCSEL wafers, PBS can be used to test quickly and in large quantities, and the repeatability and accuracy of the test can be guaranteed.

[0051] Currently, there is no suitable testing solution for the polarization characteristics of VCSEL modules. Taking the VCSEL module soldered on a multi-channel driver board using the SMT (Surface Mounted Technology) process as an example, when testing the polarization extinction ratio of multiple modules, it is difficult to ensure repeatability and accuracy using a polarization beam splitter solution.

[0052] The accuracy of the polarization extinction ratio test of the VCSEL module is poor. When testing polarization parameters, the plane of the VCSEL chip and the plane of the polarizer need to be kept as parallel as possible, and the VCSEL module is usually fixed on the multi-channel driver board using the SMT process welding method. The flatness of the pad, the flatness of the module welding, and the consistency of the channel cannot be guaranteed. If the polarization beam splitter solution is used for testing, the polarization characteristics of each channel cannot be accurately evaluated due to flatness. In addition, the polarization beam splitter (PBS) solution cannot quickly and accurately evaluate the polarization characteristics of the VCSEL module in each direction. The polarization beam splitter can only decompose the light beam into parallel polarization (transmitted light) and vertical polarization (reflected light). The polarization characteristics of only two directions can be tested at one time, and the full-angle data cannot be evaluated.

[0053] In one embodiment, the present application provides a VCSEL module polarization test method. The VCSEL module in the present application may be a module obtained by packaging a VCSEL bare chip, and the packaging may be, for example, a TO package, a CAN package, or a C-Mount package. Figure 1 and attached Figure 2 , attached Figure 1 The schematic diagram of the process of VCSEL module polarization test method is shown; Figure 2 The schematic diagram of the polarization test process is shown. The VCSEL module polarization test method in this embodiment includes the following steps S101 to S103.

[0054] Step S101, obtaining power-on information of each test point on the driver board.

[0055] Each test point can be welded to a VCSEL module to be tested.

[0056] The driver board is provided with a plurality of test points. For example, the driver board includes 10, 16, 20, etc. test points. Taking 16 test points as an example, the 16 test points can be arranged in 2 rows and 8 columns, or in 4 rows and 4 columns, which is not limited in this embodiment. Each test point is used to connect the corresponding VCSEL module to be tested to provide an electrical signal to the connected VCSEL module to be tested.

[0057] The power-on information is used to indicate whether the corresponding test point is connected to the VCSEL module to be tested.

[0058] For example, each test point can be controlled to provide a power-on signal, and when a power-on signal is provided, if a change in optical parameters such as optical power is detected, it is determined that the corresponding test point has been connected to the VCSEL module to be tested. That is, the power-on information can be an optical parameter such as optical power.

[0059] In another exemplary embodiment, a plurality of pins for connecting to the test point can be respectively provided for each VCSEL module to be tested, an in-situ detection signal is provided through a pin of the test point, and an in-situ feedback signal is obtained according to another pin of the test point, and whether the VCSEL module to be tested is connected to the multiple test points is determined according to the in-situ feedback signal. The in-situ feedback signal is generated by the VCSEL module to be tested according to the in-situ detection signal. Among them, the in-situ detection signal can be any one of a voltage signal or a current signal, and the in-situ feedback signal can be any one of a voltage signal or a current signal. For example, when the VCSEL module to be tested is not connected to the test point, the corresponding in-situ feedback signal is 0V. When the VCSEL module to be tested is connected to the test point, the corresponding in-situ feedback signal is 3V. That is, the power-on information can be the electrical parameters of the electrical signal output by the VCSEL module to be tested when it is connected to the test point, but is not limited to this.

[0060] Step S102: planning a polarization test path according to the power-on information.

[0061] The position of the VCSEL module to be tested connected to the driver board can be determined according to the power-on information, so as to plan the polarization test path according to the position of the VCSEL module to be tested on the driver board, and realize polarization testing of all VCSEL modules to be tested according to the shortest test path.

[0062] Exemplarily, there are 9 test points on the driver board, and the explanation is given by taking the 9 test points arranged in a 3×3 array as an example. A coordinate system is established with the middle test point as the origin, and the position of each test point is taken as an example by the coordinate point standard. Assuming that the VCSEL module to be tested is connected to the positions of coordinates (0, -1), (0, 1) and (-1, 1) according to the power-on information, the polarization test path can be (0, -1) → (0, 1) → (-1, 1). It is not limited to this, and it is only necessary to ensure that the test order is reasonable and the test path is short.

[0063] Step S103 , performing a polarization test process on the VCSEL module to be tested on the polarization test path according to the polarization test path; the polarization test process includes the following steps S1031 to S1033 .

[0064] Step S1031 , outputting a test control signal to the driving board, so that the driving board supplies power to the VCSEL module to be tested.

[0065] Exemplarily, a driver board may be provided with a plurality of power supply modulation circuits, each of which is connected to a test point. The plurality of power supply modulation circuits operate under the action of a test control signal and supply power to the corresponding test point according to the test control signal, thereby enabling the driver board to supply power to the VCSEL module to be tested.

[0066] Step S1032: outputting a polarization driving signal based on the test control signal to enable a polarization driving module to drive a polarizer to rotate according to a preset angle interval.

[0067] When the polarizing plate rotates, the central axis perpendicular to the extending direction of the polarizing plate is used as the rotation axis.

[0068] Exemplarily, the polarization drive signal output based on the test control signal can enable the polarization drive module to drive the polarizer to rotate 0-360° on a plane parallel to the light-emitting surface of the VCSEL module to be tested. The preset angle interval can be 1°, 5°, 10°, 15°, 20°, 25°, 30°, etc., but is not limited thereto.

[0069] When the polarizer is at different rotation angles, it can select different polarization states of the laser radiated by the VCSEL module to be tested. Exemplarily, when the polarizer is at a first rotation angle, the laser of the first polarization state radiated by the VCSEL module to be tested is selected. When the polarizer is at a second rotation angle, the laser of the second polarization state radiated by the VCSEL module to be tested is selected, but the present invention is not limited thereto.

[0070] Step S1033 , controlling the power test module to obtain the laser power of the laser in the polarization state selected by the polarizer at different rotation angles.

[0071] Among them, the laser power of the polarization state of the laser selected by the polarizer at different rotation angles can characterize the polarization characteristics of the VCSEL module to be tested, thereby characterizing the aging of the VCSEL module to be tested. Exemplarily, each laser corresponding to the polarization state of the laser at each rotation angle corresponds to a standard laser power, and the aging test result of the VCSEL module to be tested is obtained by comparing the laser power of the polarization state of the laser selected by the polarizer at a rotation angle obtained by the power test module with the preset standard laser power. In the case where the difference between the laser power of the polarization state corresponding to the rotation angle obtained by the power test module and the standard laser power corresponding to the same polarization state is greater than or equal to the preset value, the aging degree of the VCSEL module to be tested is more serious. In the case where the difference between the laser power of the polarization state of the laser selected by the polarizer at a rotation angle obtained by the power test module and the standard laser power corresponding to the same polarization state is less than the preset value, the aging degree of the VCSEL module to be tested is relatively small.

[0072] In this embodiment, the power-on information of each test point on the driver board is obtained; since each test point can correspond to the welding of a VCSEL module to be tested, the position of the VCSEL module to be tested on the driver board that needs to be polarized can be determined according to the power-on information of each test point. The polarization test path is planned according to the power-on information, and the polarization test process is performed on the VCSEL module to be tested on the polarization test path according to the polarization test path. The test path with a short distance can be flexibly configured to perform polarization test on the VCSEL module to be tested, thereby improving the test efficiency. The driver board supplies power to the VCSEL module to be tested under the control of the test control signal, and the polarization drive module drives a polarizer to rotate at a preset angle interval under the enablement of the polarization drive signal corresponding to the test control signal, so that the laser power of the laser radiated by the VCSEL module to be tested and corresponding to the rotation angle of the polarizer can be obtained, thereby achieving more accurate and comprehensive detection of the VCSEL module to be tested.

[0073] In one embodiment, the VCSEL module polarization test method further includes: generating a test chart based on the laser power at different rotation angles corresponding to the test control signal.

[0074] In this embodiment, the test chart can represent the correspondence between laser power and rotation angle, polarization state of laser radiated by the VCSEL module to be tested, and test control signal. The process and results of polarization test on the VCSEL module to be tested can be intuitively reflected according to the test chart.

[0075] In one of the embodiments, the VCSEL module polarization testing method further includes: adjusting a test control signal and / or a polarization driving signal according to a test chart.

[0076] Exemplarily, the test control signal may be adjusted according to the test chart, thereby adjusting the power supply parameters of the VCSEL module to be tested.

[0077] As another example, the polarization driving signal may be adjusted according to the test chart, thereby adjusting the rotation angle, rotation direction, etc. of the polarizer.

[0078] As another example, the test control signal and the polarization drive signal may be adjusted simultaneously according to the test chart, thereby simultaneously adjusting the power supply parameters of the VCSEL module to be tested and the rotation angle, rotation direction, etc. of the polarizer.

[0079] In this embodiment, the process and result of the polarization test of the VCSEL module to be tested can be determined according to the test chart, and the test control signal and / or the polarization drive signal can be adjusted according to the test chart, so as to ensure that timely adjustments can be made when errors occur during the polarization test of the VCSEL module to be tested, thereby improving the accuracy of the polarization test of the VCSEL module to be tested.

[0080] In one embodiment, the test control signal is used to control at least one of the peak current, driving pulse width and modulation frequency output by the driver board to the VCSEL module to be tested. That is, the test control signal can adjust the power supply parameters output by the driver board to the VCSEL module to be tested, and the power supply parameters include at least one of the peak current, driving pulse width and modulation frequency.

[0081] Adjusting the test control signal according to the test chart includes: adjusting at least one of a peak current, a driving pulse width, and a modulation frequency output to the VCSEL module to be tested according to the test chart.

[0082] The test control signal is adjusted according to the test chart, so that the driver board adjusts at least one of the peak current, the drive pulse width and the modulation frequency output to the VCSEL module to be tested according to the adjusted test control signal.

[0083] For example, when the laser frequency of the laser radiated by the VCSEL module to be tested when the polarizer is at a rotation angle is too low, resulting in the inability to determine the laser characteristics of the laser in this polarization state, at least one of the peak current, drive pulse width and modulation frequency can be appropriately increased for retesting to ensure accurate test results.

[0084] In this embodiment, at least one of the peak current, the driving pulse width and the modulation frequency output to the VCSEL module to be tested is adjusted according to the test chart, so as to improve the test flexibility and ensure the accuracy of the polarization characteristic test of the VCSEL module to be tested.

[0085] In one embodiment, adjusting the polarization driving signal according to the test chart includes: adjusting the level state of the polarization driving signal according to the test chart to adjust the rotation angle interval or rotation direction of the polarizer.

[0086] For example, the rotation of the polarizer between 0° and 180° is determined and completed according to the test chart, and the laser power of the laser corresponding to the polarization state under the rotation of 180° to 360° needs to be continued to be tested. The polarization drive signal of 0V when the polarizer stops rotating can be adjusted to a polarization drive signal of 1V, so that the polarizer continues to rotate at a preset angle interval on the basis of 180°.

[0087] As another example, taking the preset angle interval of 30° as an example, assuming that it is determined according to the test chart that the laser power is incorrect when the polarizer is rotated 90° compared to the initial angle, and at this time the polarizer has been rotated 120° compared to the initial angle, the output of a polarization drive signal of -1V can be controlled to rotate the polarizer counterclockwise by 30°, thereby detecting the laser power of the polarizer when it is rotated 90° compared to the initial angle again.

[0088] In this embodiment, the level state of the polarization driving signal is adjusted according to the test chart to adjust the rotation angle interval or rotation direction of the polarizer. The rotation angle and rotation direction of the polarizer can be adjusted in time according to the test results reflected in the test chart, thereby improving the test flexibility and accuracy.

[0089] In one of the embodiments, the polarization test process also includes: outputting a corresponding movement control signal to a movement module according to the polarization test path; the movement module controls the polarizer to move to the light output side of each VCSEL module to be tested on the polarization test path according to the polarization test path based on the movement control signal; wherein the light incident surface of the polarizer is parallel to the light output surface of the VCSEL module to be tested.

[0090] The mobile module includes an XYZ motion track and a stepper motor. The XYZ motion track can also be called a three-axis motion track, and each axis is independently controlled by a corresponding stepper motor. Specifically, the main control module can control the stepper motor to rotate so that the corresponding axis moves, thereby driving the target module connected to the axis to move to the target position to perform the test. It is understandable that different target modules can be configured with different target positions to support different test functions. Among them, the target module can be at least one of a polarization drive module, a polarizer, and a drive plate.

[0091] Exemplarily, the mobile module can be connected to the polarization drive module and the polarizer respectively, and is used to drive the polarization drive module to move at the same time, thereby adjusting the positions of the polarization drive module and the polarizer to select the polarization state of the laser radiated by the VCSEL module to be tested at different test points to complete the polarization test.

[0092] In another exemplary embodiment, the moving module can be connected to the driving board to drive the driving board to move, thereby adjusting the position between the VCSEL module to be tested and the polarizer at different points on the driving board, so that the polarization driving module and the polarizer can select the polarization state of the laser radiated by the VCSEL module to be tested at different test points to complete the polarization test.

[0093] In addition, in other embodiments, the mobile module can also be connected to the polarization drive module, the polarizer and the drive board at the same time, and is used to drive the polarizer, the polarization drive module and the drive board to move respectively, so as to adjust the relative position between the polarization drive module, the polarizer and the VCSEL module to be tested at different test points in the drive board, but is not limited to this.

[0094] In this embodiment, the polarizer is controlled by the moving module to move along the polarization test path to the light-emitting side of each VCSEL module to be tested on the polarization test path, thereby testing different VCSEL modules to be tested in the driver board and improving the test flexibility of the test system.

[0095] It should be understood that, although the various steps in the flowcharts involved in the above-mentioned embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-mentioned embodiments can include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0096] In one embodiment, the present application also provides a VCSEL module polarization test device. Figure 3 , attached Figure 3 The schematic block diagram of the structure of the VCSEL module polarization test device 300 in the present embodiment is shown. The VCSEL module polarization test device 300 in the present embodiment includes a driving board 310, a main control module 320, a connected polarization driving module 330 and a polarizer 340, and a power test module 350. The driving board 310 includes a plurality of test sites, and the test sites are used to access the VCSEL module to be tested; the driving board 310 is used to supply power to the corresponding VCSEL module to be tested through the test sites; the main control module 320 is connected to the driving board 310, and is used to obtain the power-on information of each test point on the driving board 310; wherein each test point can correspond to a VCSEL module to be tested for welding; a polarization test path is planned according to the power-on information; a polarization test process is performed on the VCSEL module to be tested on the polarization test path according to the polarization test path; the polarization test process includes: outputting a test control signal to enable the driving board 310 supplies power to the corresponding VCSEL module to be tested according to the test control signal; outputs a polarization drive signal based on the test control signal; the polarization drive module 330 is connected to the main control module 320, and the polarization drive module 330 is used to drive the polarizer 340 to rotate according to a preset angle interval when the polarization drive signal is enabled; wherein, when the polarizer 340 rotates, the central axis perpendicular to the extension direction of the polarizer 340 is used as the rotation axis; the power test module 350 is arranged on the light output side of the polarizer 340, and is used to obtain the laser power of the laser in the polarization state selected by the polarizer 340 at different rotation angles.

[0097] The polarization driving module 330 may be any module or instrument such as a stepping motor that can drive the polarizer 340 to rotate.

[0098] The power test module 350 includes but is not limited to an integrating sphere, a spectrometer, and a high-speed detector.

[0099] In this embodiment, the power-on information of each test point on the driving board 310 is obtained; since each test point can correspond to the welding of a VCSEL module to be tested, the position of the VCSEL module to be tested on the driving board 310 that needs to be polarized can be determined according to the power-on information of each test point. The polarization test path is planned according to the power-on information, and the polarization test process is performed on the VCSEL module to be tested on the polarization test path according to the polarization test path. The test path with a short distance can be flexibly configured to perform polarization test on the VCSEL module to be tested, thereby improving the test efficiency. The driving board 310 supplies power to the VCSEL module to be tested under the control of the test control signal, and the polarization drive module 330 drives a polarizer 340 to rotate at a preset angle interval under the enablement of the polarization drive signal corresponding to the test control signal, so that the laser power of the laser radiated by the VCSEL module to be tested and corresponding to the rotation angle of the polarizer 340 can be obtained, thereby realizing a more accurate and comprehensive detection of the VCSEL module to be tested.

[0100] In one of the embodiments, the main control module is also used to output a corresponding movement control signal according to the polarization test path; the VCSEL module polarization test equipment also includes a movement module, which is used to control the polarizer to move to the light-emitting side of each VCSEL module to be tested on the polarization test path according to the polarization test path based on the movement control signal; wherein the light incident surface of the polarizer is parallel to the light-emitting surface of the VCSEL module to be tested.

[0101] Based on the same inventive concept, the embodiment of the present application also provides a VCSEL module polarization test device for implementing the VCSEL module polarization test method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations of one or more VCSEL module polarization test device embodiments provided below can refer to the limitations of the VCSEL module polarization test method above, and will not be repeated here.

[0102] In an exemplary embodiment, Figure 4As shown, a VCSEL module polarization test device 400 is provided, including: a first receiving module 410, a planning module 420, an execution module 430 and a second receiving module 440, wherein the first receiving module 410 is used to obtain power-on information of each test point on the driving board; wherein each test point can correspond to a VCSEL module to be tested and welded; the planning module 420 is used to plan a polarization test path according to the power-on information; the execution module 430 is used to perform a polarization test process on the VCSEL module to be tested on the polarization test path according to the polarization test path; the polarization test process includes: outputting a test control signal to the driving board so that the driving board supplies power to the VCSEL module to be tested; outputting a polarization drive signal based on the test control signal so that a polarization drive module drives a polarizer to rotate according to a preset angle interval; wherein when the polarizer rotates, the central axis perpendicular to the extension direction of the polarizer is used as the rotation axis; the second receiving module 440 is used to obtain the laser power of a laser in a polarization state selected by a power test module after being selected by the polarizer at different rotation angles.

[0103] In one embodiment, the execution module is further used to generate a test chart of the laser power at different rotation angles corresponding to the test control signal.

[0104] In one embodiment, the execution module is further configured to adjust the test control signal and / or the polarization driving signal according to the test diagram.

[0105] In one of the embodiments, the test control signal is used to control at least one of the peak current, drive pulse width and modulation frequency output by the driver board to the VCSEL module to be tested; the execution module is also used to adjust at least one of the peak current, drive pulse width and modulation frequency output to the VCSEL module to be tested according to the test chart.

[0106] The above-mentioned VCSEL module polarization test device can be implemented in whole or in part by software, hardware and their combination. The above-mentioned modules can be embedded in or independent of the processor in the computer device in the form of hardware, or can be stored in the memory of the computer device in the form of software, so that the processor can call and execute the corresponding operations of the above-mentioned modules.

[0107] In an exemplary embodiment, a computer device is provided. The computer device may be a terminal, and its internal structure diagram may be as shown in FIG. Figure 5As shown. The computer device includes a processor, a memory, an input / output interface, a communication interface, a display unit and an input device. Among them, the processor, the memory and the input / output interface are connected through a system bus, and the communication interface, the display unit and the input device are connected to the system bus through the input / output interface. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The input / output interface of the computer device is used to exchange information between the processor and the external device. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be implemented through WIFI, a mobile cellular network, near field communication (Near Field Communication, NFC) or other technologies. When the computer program is executed by the processor, a VCSEL module polarization test method is implemented. The display unit of the computer device is used to form a visually visible picture, which can be a display screen, a projection device or a virtual reality imaging device. The display screen can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer device can be a touch layer covering the display screen, or a button, trackball or touchpad set on the computer device shell, or an external keyboard, touchpad or mouse.

[0108] Those skilled in the art will understand that Figure 5 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0109] In an exemplary embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the steps in the above-mentioned method embodiments when executing the computer program.

[0110] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps in the above-mentioned method embodiments are implemented.

[0111] In one embodiment, a computer program product is provided, including a computer program, which implements the steps in the above method embodiments when executed by a processor.

[0112] A person of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment method can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, an artificial intelligence (AI) processor, etc., but are not limited to this.

[0113] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0114] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A VCSEL module polarization test method, characterized in that: The method comprises: Obtaining power-on information of each test point on the driver board; wherein each of the test points may correspond to a VCSEL module to be tested; Planning a polarization test path according to the power-on information; Performing a polarization test process on the VCSEL module to be tested on the polarization test path according to the polarization test path; the polarization test process includes: outputting a test control signal to the driving board so that the driving board supplies power to the VCSEL module to be tested; Based on the test control signal, a polarization driving signal is output to enable a polarization driving module to drive a polarizer to rotate at a preset angle interval; wherein when the polarizer rotates, a central axis perpendicular to the extension direction of the polarizer is used as the rotation axis; Controlling the power test module to obtain the laser power of the laser in the polarization state selected by the polarizer at different rotation angles; Generating a test chart of the laser power at different rotation angles corresponding to the test control signal; Adjust the test control signal and / or the polarization drive signal according to the test chart; the test control signal is used to control at least one of the peak current, drive pulse width and modulation frequency output by the driver board to the VCSEL module to be tested; Wherein, adjusting the test control signal according to the test chart includes: adjusting at least one of a peak current, a driving pulse width and a modulation frequency output to the VCSEL module to be tested according to the test chart; Adjusting the polarization drive signal according to the test chart includes: adjusting the level state of the polarization drive signal according to the test chart to adjust the rotation angle interval or rotation direction of the polarizer.

2. The VCSEL module polarization testing method according to claim 1, characterized in that: The polarization test process also includes: Outputting a corresponding movement control signal to a movement module according to the polarization test path; The moving module controls the polarizer to move to the light-emitting side of each VCSEL module to be tested on the polarization test path according to the polarization test path based on the movement control signal; Wherein, the light incident surface of the polarizer is parallel to the light emitting surface of the VCSEL module to be tested.

3. A VCSEL module polarization test device, characterized in that: include: A driving board, comprising a plurality of test sites, wherein the test sites are used to access a VCSEL module to be tested; The driving board is used to supply power to the corresponding VCSEL module to be tested through the test site; A main control module is connected to the driving board and is used to obtain power-on information of each test point on the driving board; wherein each of the test points can correspond to a VCSEL module to be tested for welding; a polarization test path is planned according to the power-on information; a polarization test process is performed on the VCSEL module to be tested on the polarization test path according to the polarization test path; the polarization test process includes: outputting a test control signal so that the driving board supplies power to the corresponding VCSEL module to be tested according to the test control signal; and outputting a polarization drive signal based on the test control signal; A polarization drive module and a polarizer connected to each other, wherein the polarization drive module is connected to the main control module, and the polarization drive module is used to drive the polarizer to rotate at a preset angle interval when enabled by the polarization drive signal; wherein when the polarizer rotates, the central axis perpendicular to the extension direction of the polarizer is used as the rotation axis; A power test module, disposed on the light-emitting side of the polarizer, for obtaining the laser power of the laser in the polarization state selected by the polarizer at different rotation angles; Wherein, outputting a polarization drive signal based on the test control signal also includes: generating a test chart of the laser power at different rotation angles corresponding to the test control signal; adjusting the test control signal and / or the polarization drive signal according to the test chart; the test control signal is used to control at least one of the peak current, drive pulse width and modulation frequency output by the driver board to the VCSEL module to be tested; Adjusting the test control signal according to the test chart includes: adjusting at least one of a peak current, a driving pulse width, and a modulation frequency output to the VCSEL module to be tested according to the test chart; Adjusting the polarization drive signal according to the test chart includes: adjusting the level state of the polarization drive signal according to the test chart to adjust the rotation angle interval or rotation direction of the polarizer.

4. The VCSEL module polarization test equipment according to claim 3, characterized in that: The main control module is also used to output a corresponding movement control signal according to the polarization test path; and further includes: A moving module, used for controlling the polarizer to move to the light-emitting side of each VCSEL module to be tested on the polarization test path according to the polarization test path based on the movement control signal; Wherein, the light incident surface of the polarizer is parallel to the light emitting surface of the VCSEL module to be tested.

5. A VCSEL module polarization test device, characterized in that: The VCSEL module polarization testing device comprises: The first receiving module is used to obtain the power-on information of each test point on the driver board; wherein each of the test points can correspond to a VCSEL module to be tested; A planning module, used for planning a polarization test path according to the power-on information; An execution module is used to execute a polarization test process on the VCSEL module to be tested on the polarization test path according to the polarization test path; the polarization test process includes: outputting a test control signal to the driving board so that the driving board supplies power to the VCSEL module to be tested; outputting a polarization drive signal based on the test control signal so that a polarization drive module can drive a polarizer to rotate according to a preset angle interval; wherein, when the polarizer rotates, the central axis perpendicular to the extension direction of the polarizer is used as the rotation axis; The second receiving module is used to obtain the laser power of the laser of the polarization state selected by the polarizer of a power test module at different rotation angles; The execution module is further used to generate a test chart of the laser power at different rotation angles corresponding to the test control signal; adjust the test control signal and / or the polarization drive signal according to the test chart; the test control signal is used to control at least one of the peak current, drive pulse width and modulation frequency output by the drive board to the VCSEL module to be tested; Adjusting the test control signal according to the test chart includes: adjusting at least one of a peak current, a driving pulse width, and a modulation frequency output to the VCSEL module to be tested according to the test chart; Adjusting the polarization drive signal according to the test chart includes: adjusting the level state of the polarization drive signal according to the test chart to adjust the rotation angle interval or rotation direction of the polarizer.

6. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 2 are implemented.

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