A method and device for controlling temperature sensor failure and low-temperature storage equipment

Abstract

The present invention discloses a control method, device and low-temperature storage equipment for temperature sensor failure. The method includes: determining the start time and the shutdown time after the temperature sensor fails; determining a first correction value according to the cumulative number of door openings in the previous time period; determining a second correction value according to the cumulative door opening time in the previous time period; adjusting the shutdown time according to the first correction value and the second correction value; and controlling the start and stop operation of the equipment in the next time period according to the start time and the adjusted shutdown time. When the temperature sensor failure of the equipment is detected, the present invention timely and accurately calculates and adjusts the start and stop time according to the operating data before the failure and the whole machine door opening and closing data to cope with the temperature fluctuation caused by the temperature sensor failure. It can not only achieve precise temperature control, but also avoid unnecessary loss of electric energy, effectively ensure the uniformity of the temperature inside the equipment, and ensure the good storage state of the items stored inside the equipment.

Description

Technical Field

[0001] The present invention relates to the technical field of low-temperature storage equipment, and in particular to a method and device for controlling temperature sensor failure and low-temperature storage equipment. Background Art

[0002] When the temperature sensor in the box of the low-temperature storage device fails, the current control scheme is to run it periodically according to the preset start and stop time (start time and stop time). However, this control strategy does not provide enough precision in temperature regulation. In addition, when storing items, temperature fluctuations may have an adverse effect on the preservation status of sensitive items. If the current preset start and stop times are continued, the internal temperature of the low-temperature storage device may not reach or maintain the expected level, thereby affecting its performance and efficiency.

[0003] With regard to the problem in the prior art that the temperature control of the equipment is not accurate enough when the temperature sensor fails, no effective solution has been proposed yet. Summary of the invention

[0004] The embodiments of the present invention provide a method and device for controlling a temperature sensor failure and a low-temperature storage device to solve the problem in the prior art that the temperature control of the device is not accurate enough when the temperature sensor fails.

[0005] In order to solve the above technical problems, the present invention provides a control method for temperature sensor failure, wherein the method comprises: after the temperature sensor fails, determining the start time and the stop time; determining a first correction value according to the cumulative number of door openings in the previous time period; determining a second correction value according to the cumulative door opening time in the previous time period; adjusting the stop time according to the first correction value and the second correction value; and controlling the start and stop operations of the equipment in the next time period according to the start time and the adjusted stop time.

[0006] Furthermore, after a temperature sensor fails, the startup time and the shutdown time are determined, including: after the temperature sensor fails, judging whether the device is in a startup and shutdown stage; if it is in the startup and shutdown stage, and the startup time data and the shutdown time data of the startup and shutdown stage exceed a preset data amount, then calculating the startup time and the shutdown time according to the startup time data and the shutdown time data of the startup and shutdown stage; otherwise, determining the corresponding startup time and the shutdown time according to the preset target temperature of the device.

[0007] Furthermore, the startup time and the shutdown time are calculated based on the startup time data and the shutdown time data of the startup and shutdown stage, including: calculating the average value of all the startup time data of the startup and shutdown stage to obtain the startup time; calculating the average value of all the shutdown time data of the startup and shutdown stage to obtain the shutdown time.

[0008] Further, the corresponding startup time and shutdown time are determined according to the preset target temperature of the device, including: determining a temperature range in which the preset target temperature of the device is located; wherein startup time and shutdown time corresponding to different temperature ranges are preset; and determining the corresponding startup time and shutdown time according to the temperature range.

[0009] Furthermore, the first correction value is determined based on the cumulative number of door openings in the previous time period, including: judging whether the cumulative number of door openings exceeds a preset number; if so, determining the first correction value to be M0; if not, determining the first correction value to be M1; wherein M0 and M1 are preset values, and M0>M1.

[0010] Further, the second correction value is determined based on the cumulative door opening time in the previous time period, including: judging whether the cumulative door opening time exceeds the preset time; if so, determining the first correction value to be P0; wherein P0 is the preset value; if not, determining the first correction value to be 0.

[0011] Furthermore, the downtime is adjusted according to the first correction value and the second correction value, which is achieved by the following formula: The adjusted downtime T off = downtime - first correction value - second correction value.

[0012] The present invention also provides a control device for a temperature sensor failure, wherein the device includes: a calculation module, used to determine the start-up time and the shutdown time after the temperature sensor fails; a correction module, used to determine a first correction value based on the cumulative number of door opening times in the previous time period; used to determine a second correction value based on the cumulative door opening time in the previous time period; an adjustment module, used to adjust the downtime based on the first correction value and the second correction value; and a control module, used to control the start and shutdown operations of the equipment in the next time period according to the start-up time and the adjusted downtime.

[0013] The present invention also provides a low-temperature storage device, wherein the low-temperature storage device includes the above-mentioned control device for temperature sensor failure.

[0014] The present invention also provides a computer-readable storage medium having a computer program stored thereon, wherein the program implements the above method when executed by a processor.

[0015] The present invention also provides an electronic device, which includes: one or more processors; a storage device for storing one or more programs, when the one or more programs are executed by the one or more processors, the one or more processors implement the method as described above.

[0016] By applying the technical solution of the present invention, when a temperature sensor failure of the equipment is detected, the start-up and shutdown time can be timely and accurately calculated and adjusted according to the operation data before the failure and the door opening and closing data of the whole machine to cope with the temperature fluctuation caused by the temperature sensor failure. It can not only achieve precise temperature control, but also avoid unnecessary loss of electric energy, effectively ensure the uniformity of the temperature inside the equipment, and ensure the good storage state of the items stored inside the equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 is a flow chart of a method for controlling a temperature sensor failure according to an embodiment of the present invention;

[0018] Figure 2 is a temperature control flow chart of a temperature sensor failure in a low temperature storage box according to an embodiment of the present invention;

[0019] Figure 3 4 is a structural block diagram of a control device for temperature sensor failure according to an embodiment of the present invention. DETAILED DESCRIPTION

[0020] In order to make the purpose, technical scheme and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0021] The terms used in the embodiments of the present invention are only for the purpose of describing specific embodiments, and are not intended to limit the present invention. The singular forms "a", "said" and "the" used in the embodiments of the present invention and the appended claims are also intended to include plural forms, unless the context clearly indicates other meanings, and "multiple" generally includes at least two.

[0022] It should be understood that the term "and / or" used in this article is only a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship.

[0023] It should be understood that, although the terms first, second, third, etc. may be used to describe the correction values ​​in the embodiments of the present invention, these correction values ​​should not be limited to these terms. These terms are only used to distinguish the correction values. For example, without departing from the scope of the embodiments of the present invention, the first correction value may also be referred to as the second correction value, and similarly, the second correction value may also be referred to as the first correction value.

[0024] As used herein, the words "if" and "if" may be interpreted as "at the time of" or "when" or "in response to determining" or "in response to detecting", depending on the context. Similarly, the phrases "if it is determined" or "if (stated condition or event) is detected" may be interpreted as "when it is determined" or "in response to determining" or "when detecting (stated condition or event)" or "in response to detecting (stated condition or event)", depending on the context.

[0025] It should also be noted that the term "includes", "comprising" or any other variation thereof is intended to cover non-exclusive inclusion, so that a commodity or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such commodity or device. In the absence of more restrictions, the elements defined by the sentence "comprising a ..." do not exclude the existence of other identical elements in the commodity or device including the elements.

[0026] The optional embodiments of the present invention are described in detail below with reference to the accompanying drawings.

[0027] Example 1

[0028] When a temperature sensor of a device fails, the currently used control scheme is to run the device periodically according to a preset start and stop time (start time and stop time). However, the temperature regulation precision of this control strategy is insufficient, and temperature fluctuations may have an adverse effect on the storage state of sensitive items. In order to avoid temperature fluctuations when a temperature sensor fails, based on this, according to an embodiment of the present invention, a control method embodiment of a temperature sensor failure is provided.

[0029] It should be noted that the steps shown in the flowcharts of the accompanying drawings can be executed in a computer system such as a set of computer executable instructions, and that, although a logical order is shown in the flowcharts, in some cases, the steps shown or described can be executed in an order different from that shown here.

[0030] Figure 1 is a flow chart of a method for controlling a temperature sensor failure according to an embodiment of the present invention. Figure 1 As shown, the method comprises the following steps:

[0031] Step S101, after the temperature sensor fails, determine the startup time and shutdown time;

[0032] Step S102, determining a first correction value according to the cumulative number of door openings in the previous time period; determining a second correction value according to the cumulative door opening duration in the previous time period;

[0033] Step S103, adjusting the downtime according to the first correction value and the second correction value;

[0034] Step S104, controlling the start and stop operations of the device in the next time period according to the start time and the adjusted stop time.

[0035] It should be noted that there is no particular order in which the first correction value and the second correction value are executed in the above step S102 , and they can also be executed simultaneously.

[0036] When the temperature sensor failure of the device is detected, this embodiment timely and accurately calculates and adjusts the start and stop time according to the operation data before the failure (i.e. the previous time period) and the whole machine door opening and closing data to cope with the temperature fluctuation caused by the temperature sensor failure. It can not only achieve precise temperature control, but also avoid unnecessary loss of electric energy, effectively ensure the uniformity of the temperature inside the device, and ensure the good storage state of the items stored inside the device.

[0037] When the temperature sensor of the equipment is not faulty, the internal temperature of the equipment reaches the shutdown temperature, and the difference between the set temperature and the internal temperature of the equipment is less than T (for example, T = 3°C), then the compressor will enter the startup and shutdown stage according to the preset startup and shutdown time, and the refrigeration state of the whole machine is relatively stable at this time. Therefore, when determining the startup time and shutdown time after the temperature sensor fails, it is necessary to first determine whether the equipment is already in the startup and shutdown stage. Specifically, after the temperature sensor fails, determine whether the equipment is in the startup and shutdown stage; if it is in the startup and shutdown stage, and the startup time data and shutdown time data of the startup and shutdown stage exceed the preset data amount, then the startup time and shutdown time are calculated based on the startup time data and shutdown time data of the startup and shutdown stage. Otherwise, the corresponding startup time and shutdown time are determined according to the preset target temperature of the equipment. Based on this, a more reasonable startup and shutdown time can be calculated in a timely and accurate manner in combination with the current operating status and operating data of the equipment.

[0038] That is, if the device is already in the start-up and shutdown stage, it means that the internal temperature of the device has reached the shutdown temperature, the whole machine is in a stable operation stage, and the start-up time and shutdown time are close each time. Then the start-up and shutdown time data of the start-up and shutdown stage can be used as a reference. Of course, the amount of parameterizable data also needs to be considered. If the amount of data is too small, it cannot represent a reasonable start-up and shutdown time. Therefore, there is a certain requirement for the amount of data, that is, setting a threshold of preset data amount. If it is in the start-up and shutdown stage, and the start-up time data and shutdown time data of the start-up and shutdown stage exceed the preset data amount, the required start-up time and shutdown time are generated based on the start-up time data and shutdown time data of the start-up and shutdown stage.

[0039] The specific calculation method of the above preferred implementation is as follows: according to the startup time data and the shutdown time data of the startup and shutdown phase, the startup time and the shutdown time are calculated, including: calculating the average value of all the startup time data of the startup and shutdown phase to obtain the startup time; calculating the average value of all the shutdown time data of the startup and shutdown phase to obtain the shutdown time. Based on this, the startup time data and the shutdown time data of the startup and shutdown phase can be used as effective reference data to obtain a more reasonable startup and shutdown time that is conducive to achieving precise temperature control.

[0040] If the device is not in the shutdown stage, or the device is in the startup and shutdown stage but the startup time data and shutdown time data in the startup and shutdown stage do not exceed the preset data volume, it is necessary to determine a more reasonable startup time and shutdown time based on the preset target temperature. The higher the preset target temperature of the device, the longer the downtime can be set, and the lower the preset target temperature of the device, the shorter the downtime needs to be set to achieve cooling inside the device and ensure a lower temperature inside the device.

[0041] The specific calculation method of the above preferred implementation is as follows: determine the corresponding startup time and shutdown time according to the preset target temperature of the device, including: determine the temperature range where the preset target temperature of the device is located; wherein, startup time and shutdown time corresponding to different temperature ranges are preset; determine the corresponding startup time and shutdown time according to the temperature range.

[0042] The above can obtain a more reasonable startup time and downtime that helps to achieve accurate temperature control inside the equipment. In addition, the temperature fluctuation caused by the opening and closing of the door during normal use of the equipment needs to be considered. In other words, in addition to generating a reasonable startup time and downtime based on the equipment's own operating data, the downtime is further adjusted and corrected based on the user's daily use of the equipment.

[0043] Specifically, the first correction value is determined according to the cumulative number of door openings in the previous time period, including: judging whether the cumulative number of door openings exceeds the preset number; if yes, determining the first correction value to be M0; if not, determining the first correction value to be M1; wherein M0 and M1 are preset values, and M0>M1. That is, the more the cumulative number of door openings, the greater the impact on the internal temperature of the device, the easier the temperature is to fluctuate, and the greater the amount of time required for correction. Based on this, the impact of the device's door opening and closing operations on temperature fluctuations can be avoided, which helps to achieve temperature stability inside the device.

[0044] Determining the second correction value based on the cumulative door opening time in the previous time period includes: judging whether the cumulative door opening time exceeds the preset time; if so, determining the first correction value to be P0; wherein P0 is a preset value; if not, determining the first correction value to be 0. That is, if the cumulative door opening time is long, it will affect the internal temperature of the device, and the temperature is prone to fluctuate, so a certain amount of time needs to be corrected. If the cumulative door opening time is short, the impact on the internal temperature of the device is small, and the downtime does not need to be corrected. Based on this, the impact of the device's door opening and closing operations on temperature fluctuations can be avoided, which helps to achieve temperature stability inside the device.

[0045] After determining the first correction value and the second correction value, the downtime is adjusted according to the first correction value and the second correction value, which is achieved by the following formula: The adjusted downtime T off = downtime - first correction value - second correction value. Considering that the door opening and closing operation will cause the temperature inside the equipment to rise, the downtime is subtracted from the first correction value and the second correction value, that is, the downtime is shortened, which helps to reduce the temperature of the equipment and ensure a low-temperature storage environment inside the equipment.

[0046] Example 2

[0047] This embodiment combines the start and stop time of the equipment before the fault occurs, the preset temperature setting value and the door opening and closing data, and accurately calculates the start and stop time of the whole machine to deal with the situation of temperature sensor failure. This method can not only achieve the effect of temperature control, but also effectively reduce the unnecessary loss of electric energy.

[0048] Figure 2 FIG. 1 is a flow chart of temperature control for a temperature sensor failure in a low temperature storage box according to an embodiment of the present invention. Figure 2 As shown, the process is as follows:

[0049] Step 1: After the low-temperature storage box is powered on, the startup time and shutdown time of the whole machine are recorded and updated in real time, and this time is used as the basis for the operation of the whole machine when a fault occurs. Then, step 2 is performed to determine the status of the temperature sensor in the box;

[0050] Step 2: Determine whether the temperature sensor in the box is faulty. If so, run the machine according to the fault status and execute step 3. Otherwise, continue to record the startup time and shutdown time of the whole machine and then execute step 1.

[0051] Step 3, judging the running state of the low-temperature preservation box. If the whole machine is in the start-up and shutdown stage, it means that the temperature inside the box has reached the shutdown temperature, the whole machine is in a stable running stage, and each start-up time and shutdown time are relatively close. Then, judging the data of the start-up time and shutdown time, and executing step 4. Otherwise, it means that the whole machine is in the temperature-drawing stage, and the start-up time and shutdown time need to be controlled according to different set temperatures, and executing step 6;

[0052] Step 4: determine whether the amount of startup time and shutdown time data collected during the startup and shutdown phase reaches N groups (typical value is 5). If so, it means that the temperature uniformity in the whole box is relatively good, and the purpose of temperature control can be achieved by simply maintaining the previous startup time and shutdown time, and execute step 5. Otherwise, it means that not enough valid data has been collected, and the startup time and shutdown time are controlled according to different set temperatures, and execute step 6;

[0053] Step 5: Calculate the average value of N groups of data to obtain the startup time Ton and shutdown time Toff. Then, since the door opening and closing has a great impact on the operation of the whole machine, it is necessary to determine whether there is a door opening and closing action, and execute step 11;

[0054] Step 6: Control the start-up time and shutdown time of the low-temperature preservation box according to the set temperature. The set temperature is divided into three intervals. First, determine whether the set temperature is greater than or equal to Temp1 (typical value is -60 degrees Celsius). If so, a smaller start-up rate can meet the temperature control requirements and execute step 10. Otherwise, continue to determine the next temperature interval and execute step 7.

[0055] Step 7, determine whether the set temperature is greater than or equal to Temp2 (typical value is -80 degrees Celsius). If so, increase the power-on rate of the whole machine and execute step 9. Otherwise, operate at a higher power-on rate and execute step 8.

[0056] Step 8: The whole machine runs periodically according to the startup time Time1 (typical value is 30 minutes) and the shutdown time Time2 (typical value is 5 minutes). Then, it is determined whether there is a door opening and closing action, and step 11 is executed;

[0057] Step 9: The whole machine runs periodically according to the startup time Time1 (typical value is 30 minutes) and the shutdown time Time3 (typical value is 10 minutes). Then, it is determined whether there is a door opening and closing action, and step 11 is executed;

[0058] Step 10: The whole machine runs periodically according to the startup time Time1 (typical value is 30 minutes) and the shutdown time Time4 (typical value is 15 minutes). Then, it is determined whether there is a door opening and closing action, and step 11 is executed;

[0059] Step 11, determine whether the whole machine has a door opening action. If the door is opened or closed, it is necessary to adjust the downtime to compensate for the cooling capacity lost due to the door opening, and execute step 12. Otherwise, execute step 19 to clear the door opening and closing data.

[0060] Step 12: The number of door openings and the cumulative door opening time have an impact on the cooling loss in the box. Therefore, the number of door openings and closings and the cumulative door opening time are counted once every T (typical value is 12 hours). Then, at the starting point of each cycle, the door opening data of the previous cycle is counted, and step 13 is executed.

[0061] Step 13: determine whether the number of door openings is greater than or equal to Open_cnt1 (typical value is 3 times). If so, it means that the number of door openings is large and the power-on rate of the whole machine needs to be increased. Go to step 14. Otherwise, the power-on rate can be appropriately increased to meet the temperature control requirements. Go to step 15.

[0062] Step 14: the correction value To of the whole machine running time is M0 (typical value is 3 minutes), then the accumulated door opening time of the whole machine is determined, and step 16 is executed;

[0063] Step 15: the correction value To of the whole machine running time is M1 (typical value is 1 minute), then the accumulated door opening time of the whole machine is determined, and step 16 is executed;

[0064] Step 16: Determine whether the accumulated door opening time of the interval T is greater than or equal to Time_con (typical value is 300 seconds). If so, it means that the door opening time is too long, and the temperature control demand cannot be met by controlling the number of door openings. It is necessary to increase the correction value appropriately and execute step 17. Otherwise, execute step 18.

[0065] Step 17: the correction value Tc of the whole machine running time is P0 (typical value is 1 minute), then the downtime is comprehensively calculated and step 20 is executed;

[0066] Step 18: At this time, the temperature control requirement can be met by the correction value of the number of door openings, and the correction value Tc of the whole machine operation time is 0. Then, the downtime is comprehensively calculated and step 20 is executed;

[0067] Step 19: The whole machine has no door opening action, the number of door opening times, the cumulative door opening time, the values ​​of Tc and To are reset to zero, then the downtime is comprehensively calculated, and step 20 is executed;

[0068] Step 20, calculate the downtime according to Toff-Tc-To, and the whole machine will run periodically according to the startup time and downtime. Then, continue to record the startup time and downtime of the whole machine and execute step 1.

[0069] When the temperature sensor inside the low-temperature storage box of this embodiment fails, the start and stop time of the whole machine is accurately adjusted according to the operating conditions before the failure, the set temperature and the door opening and closing data, which can achieve the purpose of temperature control and avoid unnecessary loss of electric energy.

[0070] Example 3

[0071] Corresponds to Figure 1 The control method for temperature sensor failure described above is provided in this embodiment. Figure 3 The structure block diagram of the control device for temperature sensor failure shown in FIG. 1 includes:

[0072] A calculation module 10, for determining a startup time and a shutdown time after a temperature sensor fails;

[0073] The correction module 20 is connected to the calculation module 10 and is used to determine the first correction value according to the cumulative number of door openings in the previous time period; and is used to determine the second correction value according to the cumulative door opening duration in the previous time period;

[0074] An adjustment module 30, connected to the correction module 20, for adjusting the downtime according to the first correction value and the second correction value;

[0075] The control module 40 is connected to the adjustment module 30 and is used to control the start and stop operations of the equipment in the next time period according to the start time and the adjusted stop time.

[0076] This embodiment can timely and accurately calculate and adjust the start and stop time according to the operating data before the failure and the whole machine door opening and closing data when the temperature sensor failure of the equipment is detected, so as to cope with the temperature fluctuation caused by the temperature sensor failure. It can not only achieve precise temperature control, but also avoid unnecessary loss of electric energy, effectively ensure the uniformity of the temperature inside the equipment, and ensure the good storage state of the items stored inside the equipment.

[0077] This embodiment further provides a low-temperature storage device, which includes the above-mentioned control device for temperature sensor failure.

[0078] Low-temperature storage equipment is used to store items with high temperature requirements, such as low-temperature preservation boxes in hospitals, which are used to store vaccines, biological tissues, etc. The temperature inside the box generally needs to be stabilized at around -80°C. The stable temperature helps to maintain the stability of the stored items and keep them in good storage condition.

[0079] Example 4

[0080] This embodiment provides an electronic device, which is used in a method for controlling a temperature sensor failure. The electronic device includes: at least one processor; and a memory connected to the at least one processor in communication; wherein:

[0081] The memory stores instructions that can be executed by a processor, and the instructions are executed by at least one processor so that the at least one processor can: determine the start time and the shutdown time after a temperature sensor fails; determine a first correction value based on the cumulative number of door openings in a previous time period; determine a second correction value based on the cumulative door opening time in the previous time period; adjust the shutdown time based on the first correction value and the second correction value; and control the start and shutdown operations of the equipment in the next time period according to the start time and the adjusted shutdown time.

[0082] Example 5

[0083] The embodiment of the present invention provides a software, which is used to execute the technical solutions described in the above embodiment and preferred implementation manner.

[0084] An embodiment of the present invention provides a non-volatile computer storage medium, wherein the computer storage medium stores computer executable instructions, and the computer executable instructions can execute the temperature sensor failure control method in any of the above method embodiments.

[0085] The above-mentioned software is stored in the above-mentioned storage medium, which includes but is not limited to: a CD, a floppy disk, a hard disk, an erasable memory, etc.

[0086] The serial numbers of the above embodiments of the present invention are only for description and do not represent the advantages or disadvantages of the embodiments.

[0087] In the above embodiments of the present invention, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0088] In the several embodiments provided in this application, it should be understood that the disclosed technical content can be implemented in other ways. Among them, the device embodiments described above are only schematic. For example, the division of the units can be a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of units or modules, which can be electrical or other forms.

[0089] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple units. Some or all of the units may be selected according to actual needs to achieve the purpose of the present embodiment.

[0090] In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0091] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or all or part of the technical solution can be embodied in the form of a software product. The computer software product is stored in a storage medium, including several instructions for a computer device (which can be a personal computer, server or network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: U disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), mobile hard disk, disk or optical disk, etc. Various media that can store program codes.

[0092] The electronic devices of the embodiments of the present invention exist in various forms, including but not limited to:

[0093] (1) Mobile communication devices: These devices are characterized by their mobile communication functions and their main purpose is to provide voice and data communications. These terminals include: smart phones (such as iPhone), multimedia phones, functional phones, and low-end phones.

[0094] (2) Ultra-mobile personal computer devices: These devices fall into the category of personal computers, have computing and processing capabilities, and generally also have mobile Internet access features. These terminals include: PDA, MID and UMPC devices, such as iPad.

[0095] (3) Portable entertainment devices: These devices can display and play multimedia content. They include audio and video players (such as iPods), handheld game consoles, e-books, as well as smart toys and portable car navigation devices.

[0096] (4) Server: A device that provides computing services. The server consists of a processor, hard disk, memory, device bus, etc. The server is similar to the general computer architecture, but because it needs to provide highly reliable services, it has higher requirements in terms of processing power, stability, reliability, security, scalability, manageability, etc.

[0097] (5) Other electronic devices with data interaction functions, such as televisions, large-screen cars, etc.

[0098] The device embodiments described above are merely illustrative, wherein the units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0099] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for controlling a temperature sensor failure, characterized in that: The method comprises: Determine the start-up and downtime after a temperature sensor failure; The first correction value is determined according to the cumulative number of door openings in the previous time period; the second correction value is determined according to the cumulative door opening duration in the previous time period; The downtime is adjusted according to the first correction value and the second correction value; this is achieved by the following formula: The adjusted downtime T off = downtime - first correction value - second correction value; The start and stop operations of the equipment in the next time period are controlled according to the start time and the adjusted stop time.

2. The method according to claim 1, characterized in that: Determine uptime and downtime after a temperature sensor failure, including: After the temperature sensor fails, determine whether the equipment is in the start-up and shutdown stage; If it is in the start-up and shutdown stage, and the start-up time data and the shutdown time data in the start-up and shutdown stage exceed the preset data amount, the start-up time and the shutdown time are calculated according to the start-up time data and the shutdown time data in the start-up and shutdown stage; Otherwise, the corresponding startup time and shutdown time are determined according to the preset target temperature of the device.

3. The method according to claim 2, characterized in that The startup time and the shutdown time are calculated according to the startup time data and the shutdown time data of the startup and shutdown phases, including: Calculate the average value of all the startup time data in the startup and shutdown stages to obtain the startup time; All downtime data in the start-stop phase are calculated and averaged to obtain the downtime.

4. The method according to claim 2, characterized in that: Determining the corresponding startup time and shutdown time according to the preset target temperature of the device includes: Determine a temperature range in which a preset target temperature of the device is located; wherein startup time and shutdown time corresponding to different temperature ranges are preset; The corresponding startup time and shutdown time are determined according to the temperature range.

5. The method according to claim 1, characterized in that Determining a first correction value according to the accumulated number of door openings in a previous time period includes: Determining whether the cumulative number of door openings exceeds a preset number; If yes, then determine the first correction value as M0; If not, the first correction value is determined to be M1; wherein M0 and M1 are preset values, and M0>M1.

6. The method according to claim 1, characterized in that The second correction value is determined according to the accumulated door opening time in the previous time period, including: Determine whether the accumulated door opening time exceeds a preset time; If yes, then determine the first correction value to be P0; wherein P0 is a preset value; If not, the first correction value is determined to be zero.

7. A control device for temperature sensor failure, characterized in that: The device comprises: A calculation module, used for determining the startup time and shutdown time after the temperature sensor fails; A correction module, used to determine a first correction value according to the cumulative number of door openings in a previous time period; used to determine a second correction value according to the cumulative door opening duration in the previous time period; The adjustment module is used to adjust the downtime according to the first correction value and the second correction value; the adjustment is implemented by the following formula: The adjusted downtime T off = downtime - first correction value - second correction value; The control module is used to control the start and stop operations of the equipment in the next time period according to the start time and the adjusted stop time.

8. A low temperature storage device, characterized in that: The low-temperature storage equipment comprises the temperature sensor failure control device according to claim 7.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the program is executed by a processor, the method according to any one of claims 1 to 6 is implemented.

10. An electronic device, characterized in that: include: one or more processors; A storage device for storing one or more programs, which, when executed by the one or more processors, enables the one or more processors to implement the method according to any one of claims 1 to 6.

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