Method and apparatus for emissivity measurement based on multi-source correction

Abstract

The present disclosure provides a multi-source correction-based emissivity measurement method and device, the method comprising: establishing an emissivity measurement model; the emissivity measurement model at least comprising one of radiation source correction, atmospheric environment correction, device radiation energy correction, and detection element segmented nonlinear fitting correction; the radiation source correction is used to remove the influence of non-target radiation sources and target non-normal radiation energy through a microcavity collimation structure installed at the front end of the detection element; the atmospheric environment correction is used to remove the influence of atmospheric environment attenuation error; the device radiation energy correction is used to remove the influence of the radiation energy of the microcavity collimation structure; the detection element segmented nonlinear fitting is used to reduce the influence of the temperature-voltage fitting error of the detection element; and the emissivity of the target sample is determined by using the emissivity measurement model. The present disclosure corrects the errors of the radiation source, the radiation propagation path, the device radiation, and the radiation receiving end, and constructs a high-precision emissivity measurement model.

Description

Technical Field

[0001] This disclosure relates to the field of radiation measurement technology, and more specifically to a method and apparatus for emissivity measurement based on multi-source correction. Background Technology

[0002] Any object with a temperature above absolute zero constantly radiates energy outwards, and emissivity is a parameter characterizing the amount of energy an object can radiate. Measuring emissivity is crucial in fields such as radiation thermometry, infrared guidance, and satellite remote sensing.

[0003] Existing emissivity measurement methods mainly include the reflectivity method and the energy method. The reflectivity method involves radiating a known amount of energy to the target and using devices such as hot cavity reflectometers and integrating sphere reflectometers to measure the energy reflected from the target surface, thus calculating the target's surface emissivity. The energy method, based on the definition of emissivity, directly calculates the target's surface emissivity by measuring the target's radiated energy and comparing it to the blackbody radiation energy at the same temperature.

[0004] The reflectivity method requires complex equipment and operation, making measurements difficult and costly, and its accuracy is affected by the surface condition of the target. The energy method is affected by factors such as ambient temperature and background radiation, and its measurement accuracy depends on the accuracy of the radiation measurement model, requiring full consideration of radiation influence factors other than the target. Summary of the Invention

[0005] In view of the above problems, this disclosure provides a method and device for emissivity measurement based on multi-source correction by constructing a high-precision emissivity measurement model through error correction of the target radiation source, radiation propagation path, device radiation, and radiation receiving end.

[0006] This disclosure provides an emissivity measurement method based on multi-source correction, comprising: establishing an emissivity measurement model; the emissivity measurement model includes at least one of radiation source correction, atmospheric environment correction, device radiation energy correction, and detector element piecewise nonlinear fitting correction; radiation source correction is used to remove the influence of radiation energy from non-target radiation sources and non-target radiant sources by using a microcavity collimation structure installed at the front end of the detector element; atmospheric environment correction is used to remove the influence of atmospheric environment attenuation error; device radiation energy correction is used to remove the influence of radiation energy from the microcavity collimation structure; detector element piecewise nonlinear fitting correction is used to reduce the influence of detector element temperature-voltage fitting error; and using the emissivity measurement model, determining the emissivity of the target sample.

[0007] According to embodiments of this disclosure, an emissivity measurement model is established, including: using a microcavity collimation structure to transmit the normal radiation energy emitted by the target sample to a detector element for radiation source correction; obtaining a radiation energy expression formula based on atmospheric environmental parameters and the radiation energy of the device for atmospheric environment correction and device radiation energy correction; and determining the emissivity measurement formula of the target sample through the radiation energy expression formula; wherein the atmospheric environmental parameters include at least the current ambient temperature.

[0008] According to embodiments of this disclosure, a microcavity collimation structure is used to transmit the normal radiation energy emitted by a target sample to a detector element for radiation source calibration. This includes: adjusting the diameter and radius of the microcavity collimation structure according to preset parameters; the preset parameters include at least one of the target sample temperature, the effective width of the detector element, and the detection distance of the microcavity collimation structure; and installing the microcavity collimation structure at the front end of the detector element to process the radiation energy emitted by the target sample and transmit it to the detector element.

[0009] According to embodiments of this disclosure, adjusting the diameter and radius of the microcavity collimation structure based on preset parameters includes: determining the diameter of the microcavity collimation tube based on the preset diameter of the target sample's probe area and the target sample's measurement temperature range; calculating the length of the microcavity collimation structure using the probe area diameter, the effective width of the probe element, the probe distance of the microcavity collimation structure, and the diameter of the microcavity collimation structure; wherein, the formula for calculating the length of the microcavity collimation structure is as follows:

[0010]

[0011] In the formula, L2 is the length of the microcavity collimation structure; L1 is the detection distance of the microcavity collimation structure; D is the diameter of the microcavity collimation structure; S is the effective width of the detector element; and L is the diameter of the target sample's detection area.

[0012] According to embodiments of this disclosure, the microcavity collimation structure is also equipped with a cooling device.

[0013] According to embodiments of this disclosure, a formula for expressing radiation energy is obtained based on atmospheric environmental parameters and the radiation energy of the device to complete atmospheric environmental correction and device radiation energy correction. Prior to this, the method further includes: measuring the current ambient temperature and calculating the atmospheric transmittance based on the current ambient temperature; obtaining the temperature of the microcavity collimation structure using the thermistor embedded in the microcavity collimation structure; and measuring the true temperature of the target sample.

[0014] According to embodiments of this disclosure, a radiation energy expression formula is obtained based on atmospheric environmental parameters and the radiation energy of the device to complete atmospheric environmental correction and device radiation energy correction; the emissivity measurement formula for the target sample is determined using the radiation energy expression formula, including: expressing the radiation energy received by the detector as the sum of atmospheric radiation energy, device radiation energy, and target radiation energy to obtain the radiation energy expression formula; converting the radiation energy expression formula into a radiation temperature expression formula according to the Stefan Boltzmann law; and obtaining the emissivity measurement formula using the radiation temperature expression formula.

[0015] The formula for expressing radiation temperature is as follows:

[0016] T0' n =αεT0 n +α(1-ε)T u n +ε w T w n

[0017] In the formula, T0' is the target radiation temperature; α is the atmospheric transmittance; ε is the emissivity of the target sample; ε w T0 is the emissivity of the internal coating material of the microcavity collimating material; T0 is the true temperature of the target sample; .... u T represents the current ambient temperature. w The temperature of the microcavity collimation structure is given; n is a constant.

[0018] The emissivity measurement formula is as follows:

[0019]

[0020] Where T0' is the target radiation temperature; α is the atmospheric transmittance; T0 is the true temperature of the target sample; ε w T represents the emissivity of the internal coating material of the microcavity collimating material. u T represents the current ambient temperature. w The temperature of the microcavity collimation structure is denoted as ν; n is a constant.

[0021] According to embodiments of this disclosure, the emissivity of a target sample is determined using an emissivity measurement model, including: determining the target radiation temperature by querying the temperature-voltage curve of the detector element based on its response voltage; and substituting the actual temperature, target radiation temperature, atmospheric transmittance, current ambient temperature, and temperature of the microcavity collimation structure into the emissivity measurement formula to determine the emissivity of the target sample.

[0022] According to embodiments of this disclosure, the target radiation temperature is determined by querying the temperature-voltage curve of the detector element based on its response voltage, including: collecting the change value of the response voltage at preset temperature intervals within the temperature measurement range of the detector element; dividing the temperature measurement range into multiple temperature intervals; and fitting the temperature-voltage curve of the detector element using a piecewise linear fitting method for each temperature interval.

[0023] The second aspect of this disclosure provides an emissivity measurement device based on multi-source correction, which can be used to implement the above-described method. The device includes: an emissivity measurement model module for establishing an emissivity measurement model; the emissivity measurement model includes at least one of radiation source correction, atmospheric environment correction, device radiation energy correction, and detector element piecewise nonlinear fitting correction; radiation source correction is used to remove the influence of radiation energy from non-target radiation sources and non-target directional radiation sources through a microcavity collimation structure installed at the front end of the detector element; atmospheric environment correction is used to remove the influence of atmospheric environment attenuation error; device radiation energy correction is used to remove the influence of radiation energy from the microcavity collimation structure; detector element piecewise nonlinear fitting correction is used to reduce the influence of detector element temperature-voltage fitting error; and an emissivity calculation module for determining the emissivity of the target sample using the emissivity measurement model.

[0024] According to the emissivity measurement method based on multi-source correction provided in this disclosure, the direction and effective area of ​​the sensor receiving radiation are controlled by a microcavity collimation structure to eliminate the influence of non-target radiation sources and illegal orientation of the target; environmental influences are removed by atmospheric environment correction; the influence of the device's own radiation is removed by device radiation energy correction; and the influence of detector element measurement error is removed by piecewise nonlinear fitting correction of the detector element. Since a high-precision emissivity measurement model is constructed by correcting errors in the radiation source, radiation propagation path, device radiation, and radiation receiver, the technical problem of reduced measurement accuracy due to factors such as ambient temperature and radiation background is at least partially solved, achieving the technical effect of accurate emissivity measurement. Attached Figure Description

[0025] Figure 1 A flowchart illustrating a multi-source correction-based emissivity measurement method according to an embodiment of the present disclosure is shown schematically.

[0026] Figure 2 A schematic diagram of a microcavity collimation structure according to an embodiment of the present disclosure is shown.

[0027] Figure 3 A schematic diagram of a multi-source calibrated temperature measurement model according to an embodiment of the present disclosure is shown.

[0028] Figure 4 A schematic block diagram of a multi-source correction-based emissivity measurement device according to an embodiment of the present disclosure is shown. Detailed Implementation

[0029] The embodiments of the present disclosure will now be described with reference to the accompanying drawings. However, it should be understood that these descriptions are exemplary only and are not intended to limit the scope of the disclosure. In the following detailed description, numerous specific details are set forth to provide a thorough understanding of the embodiments of the present disclosure for ease of explanation. However, it will be apparent that one or more embodiments may be practiced without these specific details. Furthermore, descriptions of well-known structures and techniques are omitted in the following description to avoid unnecessarily obscuring the concepts of the present disclosure.

[0030] The terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the scope of this disclosure. The terms “comprising,” “including,” etc., as used herein indicate the presence of features, steps, operations, and / or components, but do not exclude the presence or addition of one or more other features, steps, operations, or components.

[0031] All terms used herein (including technical and scientific terms) have the meanings commonly understood by those skilled in the art, unless otherwise defined. It should be noted that the terms used herein are to be interpreted in a manner consistent with the context of this specification, and not in an idealized or overly rigid way.

[0032] When using expressions such as "at least one of A, B, and C", they should generally be interpreted in accordance with the meaning that is commonly understood by a person skilled in the art (e.g., "a system having at least one of A, B, and C" should include, but is not limited to, a system having A alone, a system having B alone, a system having C alone, a system having A and B, a system having A and C, a system having B and C, and / or a system having A, B, and C, etc.).

[0033] First, the technical terms used in this disclosure are explained as follows:

[0034] Stefan-Boltzmann Law: The Stefan-Boltzmann Law states that the total energy radiated per unit area per unit time by a blackbody (i.e., an ideal radiating surface capable of absorbing all incident thermal radiation) is proportional to the fourth power of the blackbody's thermodynamic temperature. For non-blackbody surfaces, their actual radiative power can be estimated by measuring their emissivity and multiplying it by the radiative power of a blackbody according to the Stefan-Boltzmann Law.

[0035] Figure 1 A flowchart illustrating a multi-source correction-based emissivity measurement method according to an embodiment of the present disclosure is shown, such as... Figure 1As shown, embodiments of this disclosure provide an emissivity measurement method, comprising: establishing an emissivity measurement model; the emissivity measurement model includes at least one of radiation source correction, atmospheric environment correction, device radiation energy correction, and detector element piecewise nonlinear fitting correction; radiation source correction is used to remove the influence of radiation energy from non-target radiation sources and non-target radiant sources by using a microcavity collimation structure installed at the front end of the detector element; atmospheric environment correction is used to remove the influence of atmospheric environment attenuation error; device radiation energy correction is used to remove the influence of radiation energy from the microcavity collimation structure; detector element piecewise nonlinear fitting correction is used to reduce the influence of detector element temperature-voltage fitting error; and using the emissivity measurement model to determine the emissivity of the target sample.

[0036] In this embodiment, the detector element may be a thermal sensor.

[0037] Through the embodiments of this disclosure, a comprehensive emissivity measurement method is proposed. From the perspective of the radiation source, the influence of energy from non-target radiation sources and non-target radiant sources, as well as the radiation energy radiated by the device, is eliminated. From the perspective of the transmission path, the influence of atmospheric radiation energy and atmospheric attenuation errors is eliminated. From the perspective of the radiation receiver, the influence of detector measurement error is eliminated. Finally, through a high-precision emissivity measurement model, a more accurate measurement of the emissivity of the target sample is achieved.

[0038] Based on the above embodiments, an emissivity measurement model is established, including: using a microcavity collimation structure to transmit the normal radiation energy emitted by the target sample to the detector element for radiation source correction; obtaining a radiation energy expression formula based on atmospheric environmental parameters and the radiation energy of the device for atmospheric environment correction and device radiation energy correction; determining the emissivity measurement formula of the target sample through the radiation energy expression formula; wherein, the atmospheric environmental parameters include at least the current ambient temperature.

[0039] Through the embodiments of this disclosure, a microcavity collimation structure is used to remove non-target radiation and target illegal radiation energy. Since the attenuation degree varies in different atmospheric environments, an atmospheric compensation mode is designed to correct the attenuation error under different atmospheric conditions to avoid the influence of different testing environments. Simultaneously, because the microcavity collimation structure will experience a temperature rise due to the external environment during measurement, a radiation energy compensation for the microcavity collimation structure is proposed. This yields a more accurate expression for radiation energy, further leading to a radiation temperature expression formula, which is then used to calculate emissivity, thereby improving the accuracy of emissivity.

[0040] Based on the above embodiments, a microcavity collimation structure is used to transmit the normal radiation energy emitted by the target sample to the detector element for radiation source correction. This includes: adjusting the diameter and radius of the microcavity collimation structure according to preset parameters; the preset parameters include at least one of the target sample temperature, the effective width of the detector element, and the detection distance of the microcavity collimation structure; and installing the microcavity collimation structure at the front end of the detector element to process the radiation energy emitted by the target sample and transmit it to the detector element.

[0041] In this embodiment, Figure 2 A schematic diagram of a microcavity collimation structure according to an embodiment of the present disclosure is shown. The microcavity collimation structure is mounted at the front end of a thermistor. The microcavity collimation structure is cylindrical, with its inner wall composed of closely arranged spherical cavities coated with a high-absorption material. Coolant is filled between the inner and outer walls for water-cooled circulation and cooling, and a thermistor is embedded for temperature monitoring. The water-cooled circulation is used to reduce radiant energy interference caused by the heating of the microcavity collimation structure and eliminate the influence of ambient temperature; temperature monitoring is used for accurate radiant energy compensation.

[0042] Through the embodiments of this disclosure, based on parameters such as the temperature of the target sample, the effective width of the detector element, and the detection distance, the diameter and radius of the microcavity collimation structure are precisely designed and adjusted to optimize the size of the microcavity collimation structure, adapt to measurement requirements, and ensure that it can effectively receive and preprocess radiation energy under different conditions.

[0043] Based on the above embodiments, the diameter and radius of the microcavity collimation structure are adjusted according to preset parameters, including: determining the diameter of the microcavity collimation tube based on the preset diameter of the target sample's probe area and the target sample's measurement temperature range; calculating the length of the microcavity collimation structure using the probe area diameter, the effective width of the probe element, the probe distance of the microcavity collimation structure, and the diameter of the microcavity collimation structure; wherein, the formula for calculating the length of the microcavity collimation structure is as follows:

[0044]

[0045] In the formula, L2 is the length of the microcavity collimation structure; L1 is the detection distance of the microcavity collimation structure; D is the diameter of the microcavity collimation structure; S is the effective width of the detector element; and L is the diameter of the target sample's detection area.

[0046] In this embodiment, the preset diameter of the area to be detected is set by the operator. By modifying parameters such as the detection distance, collimator length, and diameter, the effective diameter of the target sample can be calculated, making the effective diameter equal to the diameter of the area to be detected. The effective diameter refers to the area of ​​the target sample that can actually receive radiation energy. Therefore, the preset diameter of the area to be detected can be equated to the effective diameter for various calculations.

[0047] In this embodiment, the non-target radiation and the target's non-directional radiated heat W, which are incident at an angle, are nearly completely absorbed after multiple reflections by the high-absorption inner wall material and the spherical cavity structure. The radiation energy emitted by the target is approximately calibrated to the horizontal direction, while the non-target radiation in the surrounding environment is approximately eliminated.

[0048] W'=(1-ε w ) n W

[0049] Where, ε w The emissivity of the internal coating material of the microcavity collimating material is approximately 1. The radiation energy W' of the non-target radiation source and the non-target radiation direction obtained after multiple reflections is approximately 0, where W is the incident radiation energy of the non-target radiation source and the non-target radiation direction.

[0050] Meanwhile, the microcavity collimation structure limits the effective area of ​​the target, reducing the measurement region to a circular area of ​​diameter L. The effective area L is calculated using the following formula:

[0051]

[0052] Where S is the effective width of the sensor detection element, D and L2 are the diameter and length of the microcavity collimation structure, and L1 is the detection distance.

[0053] Furthermore, during the design phase of the microcavity collimator, the diameter of the microcavity collimator is given priority. Therefore, in practice, the diameter of the microcavity collimator, the area L to be restricted, and the measurement distance L1 are known variables. Thus, based on determining the length of the microcavity collimator, a formula for calculating its length can be derived using the formula for the effective area L.

[0054] Through the embodiments of this disclosure, the high-absorbency inner wall material and spherical cavity structure of the microcavity collimation structure enable the obliquely incident radiant heat W to be nearly completely absorbed after multiple reflections, thereby approximately eliminating non-target radiation in the surrounding environment and approximately calibrating the radiation emitted by the target to the horizontal direction. Simultaneously, the microcavity collimation structure limits the effective area of ​​the target sample, restricting the amount of radiation outside the effective detection area of ​​the target to be incident on the sensor, thus reducing the impact of target surface non-uniformity.

[0055] Furthermore, the diameter of the microcavity collimation structure is closely related to the energy of the target incident on the sensor. A larger diameter results in a larger effective radiation area and stronger energy, but also a greater impact from target non-uniformity. Low-temperature targets have low self-radiated energy; if the diameter is too small, the incident energy is difficult for the sensor to detect. Therefore, microcavity collimation structures of different diameters are selected based on the temperature of the target. The diameter of the microcavity collimation tube is determined based on the preset diameter of the target sample's detection area and the target sample's measurement temperature range. Specifically, this includes determining the microcavity collimation tube diameter based on the preset diameter of the target sample's detection area and the target sample's measurement temperature range. That is, the range of the microcavity collimation tube diameter is determined based on the size of the detector element, setting the collimation tube diameter between 1 and 2 times the effective width of the detector element, i.e., S≤D≤2S. The collimation tube diameter is then fine-tuned according to the target sample size and radiation amount. It should be noted that the purpose of setting the collimation diameter is to ensure that the effective diameter of the target sample is the same as the diameter of the detection area; therefore, fine-tuning is sufficient. The diameter can remain unchanged, or different effective diameters can be obtained through different detection distances. For example, if the target temperature is very low and the energy it radiates is relatively small, then the diameter of the collimator needs to be set relatively large within the range. With the same effective area, the detection distance can be closer, thus receiving more energy. Conversely, if the diameter of the area to be detected is very large, and the collimator diameter is set relatively small, then the detection distance needs to be very far to ensure that the sample size and the effective detection area are consistent. In this case, the diameter of the collimator needs to be increased as much as possible within the range.

[0056] Based on the above embodiments, the microcavity collimation structure is also equipped with a cooling device.

[0057] In this embodiment, the cooling device may be an air-cooled device or a water-cooled device.

[0058] Through the embodiments of this disclosure, the influence of device radiation energy is reduced in advance by physical means using a cooling device, and then the device radiation energy is further removed by device radiation source correction, so as to make the emissivity measurement more accurate.

[0059] Based on the above embodiments, according to atmospheric environmental parameters and the radiation energy of the device, a radiation energy expression formula is obtained to complete atmospheric environmental correction and device radiation energy correction. Prior to this, the following steps are also included: measuring the current ambient temperature and converting the atmospheric transmittance based on the current ambient temperature; obtaining the temperature of the microcavity collimation structure using the thermistor embedded in the microcavity collimation structure; and measuring the true temperature of the target sample.

[0060] In this embodiment, before measuring the target, the atmospheric environment is predicted, the sensor response is recorded, and the compensation is the atmospheric radiation energy under the current test environment. The atmospheric transmittance is calculated using the current ambient temperature value, thereby achieving atmospheric compensation.

[0061] In this embodiment, absorbing a large amount of ambient radiation will cause the temperature of the microcavity collimation structure to rise, affecting the measurement accuracy. The temperature value obtained by using the embedded thermistor is used to correct the energy of the microcavity collimation structure.

[0062] Through embodiments of this disclosure, necessary data support is provided for the correction of radiation energy by pre-measurement data acquisition and embedding thermistors in the microcavity collimation structure.

[0063] Based on the above embodiments, according to atmospheric environmental parameters and the radiation energy of the device, a radiation energy expression formula is obtained to complete atmospheric environmental correction and device radiation energy correction; through the radiation energy expression formula, the emissivity measurement formula of the target sample is determined, including: expressing the radiation energy received by the detector as the sum of atmospheric radiation energy, device radiation energy, and target radiation energy to obtain the radiation energy expression formula; according to Stefan Boltzmann's law, the radiation energy expression formula is converted into a radiation temperature expression formula; and the emissivity measurement formula is obtained using the radiation temperature expression formula.

[0064] The formula for expressing radiation temperature is as follows:

[0065] T0' n =αεT0 n +α(1-ε)T u n +ε w T w n

[0066] In the formula, T0' is the target radiation temperature; α is the atmospheric transmittance; ε is the emissivity of the target sample; T0 is the true temperature of the target sample; T u T represents the current ambient temperature. w The temperature of the microcavity collimation structure is given; n is a constant.

[0067] The emissivity measurement formula is as follows:

[0068]

[0069] Where T0' is the target radiation temperature; α is the atmospheric transmittance; T0 is the true temperature of the target sample; T u T represents the current ambient temperature. w The temperature of the microcavity collimation structure is denoted as ν; n is a constant.

[0070] In this embodiment, Figure 3 A schematic diagram of a multi-source calibrated temperature measurement model according to an embodiment of the present disclosure is shown. Figure 3 As shown, the principle of multi-source correction in this disclosure is analyzed, and the final emissivity measurement formula is obtained as follows:

[0071] (1) Before adding the microcavity collimation structure, the total radiation received by the sensor detector element can be approximated as:

[0072] W tot =α·ε·W obj +α·(1-ε)·W amb +(1-α)W atm

[0073] Where ε is the emissivity of the target; α is the transmittance; ε·W obj The radiation energy of the target, after atmospheric attenuation, is α·ε·W. obj W amb The energy radiated from a non-target radiation source in the environment to the target surface, after reflection by the target surface, is (1-ε)·W. amb After atmospheric attenuation, it becomes α·(1-ε)·W amb ;(1-α)W atm It is the radiant energy of the atmosphere.

[0074] (2) After correction by the microcavity collimation structure, the energy radiated from the non-target radiation source to the target surface is approximately eliminated. Therefore, the radiation energy W' after correction by the microcavity collimator is... tow for:

[0075] W′ tot =α·ε·W′ obj +(1-α)W atm

[0076] Wherein, ε·W' obj The radiation energy within the effective area of ​​the target is defined by a specific angle; illegal radiation from the target is eliminated in the same way as radiation from non-target areas; (1-α)W atm It is the radiant energy of the atmosphere.

[0077] (3) Absorption of a large amount of environmental radiation will cause the temperature of the microcavity collimation structure to rise, affecting the measurement accuracy. This disclosure fills the space between the inner and outer walls with coolant to alleviate the temperature rise problem of the microcavity collimation structure. Simultaneously, it uses the temperature value measured by the embedded thermistor for further correction. The corrected total radiation energy W″ tot (i.e., the formula for expressing radiant energy) is:

[0078] W″ tot =α·ε·W′ obj +(1-α)W atm +ε w ·W w

[0079] Wherein, ε·W' obj The radiation energy within a defined angle within the effective area of ​​the target; (1-α)W atm ε is the radiant energy of the atmosphere;w ·W w The radiation energy of the microcavity collimation structure is related to the temperature of the microcavity collimation structure and the emissivity ε of the surface coating. w Closely related.

[0080] (4) According to Stefan Boltzmann's law, it can be converted to:

[0081] T0' n =αεT0 n +α(1-ε)T u n +ε w T w n

[0082] In the formula, T0' is the target radiation temperature; α is the atmospheric transmittance; ε is the emissivity of the target sample; T0 is the true temperature of the target sample; T u T represents the current ambient temperature. w The temperature of the microcavity collimation structure is denoted as ν; n is a constant.

[0083] (5) The final emissivity measurement formula is obtained by conversion:

[0084]

[0085] Where T0' is the target radiation temperature; α is the atmospheric transmittance; T0 is the true temperature of the target sample; T u T represents the current ambient temperature. w The temperature of the microcavity collimation structure is denoted as ν; n is a constant.

[0086] Through the embodiments of this disclosure, radiative energy is expressed as the sum of atmospheric radiative energy, structural radiative energy, and target radiative energy, and converted into a radiative temperature expression formula according to the Stefan Boltzmann law. The target, atmospheric, ambient temperature, and sensor are calibrated respectively, and a radiation measurement model is constructed based on the calibration results, ultimately achieving accurate measurement of the target emissivity.

[0087] Based on the above embodiments, the emissivity of the target sample is determined using an emissivity measurement model, including: determining the target radiation temperature by querying the temperature-voltage curve of the detector element based on its response voltage; and substituting the actual temperature, target radiation temperature, atmospheric transmittance, current ambient temperature, and temperature of the microcavity collimation structure into the emissivity measurement formula to determine the emissivity of the target sample.

[0088] In this embodiment, the target radiation temperature is calculated based on the temperature-voltage curve of the detector element; the target's true temperature is obtained by thermocouple measurement; the atmospheric transmittance is calculated by the environmental compensation process described above; and the temperature of the microcavity collimation structure is obtained by a sensor.

[0089] Through the embodiments of the present disclosure, the target radiation temperature-response voltage curve is queried according to the response voltage of the detection element, and relevant parameters are substituted into the radiation temperature expression formula to calculate the emissivity of the target sample, so as to achieve rapid and accurate measurement of the emissivity.

[0090] Based on the above embodiments, according to the response voltage of the detection element, the detection element temperature-voltage curve is queried to determine the target radiation temperature, including: within the temperature measurement range of the detection element, the change values of the response voltage are collected at a preset temperature interval; the temperature measurement range is divided into multiple temperature intervals, and for each temperature interval, the detection element temperature-voltage curve is fitted by means of piecewise linear fitting.

[0091] In this embodiment, during the measurement process, according to the current response U of the thermal sensor, the T-U curve database is queried to obtain the target radiation temperature T0'.

[0092] Among them, the nonlinear thermal sensor T-U curve is calibrated by using the piecewise linearization method. The specific method is as follows:

[0093] First, within the temperature measurement range, the change values of the output response U of the thermal sensor are collected at an interval of ΔT, and the temperature measurement range is divided into multiple temperature intervals t. Within the interval t, the T-U curve is fitted by means of piecewise linear fitting. Before fitting, the linear expression is:

[0094] U t =β 0t +β 1t T t

[0095] It is assumed that a turning point of the T-U curve appears at the moment t0 within the temperature interval t. An auxiliary variable A is constructed, where A = 0 when t < t0, and vice versa A = 1. The T-U curve within this temperature segment can be approximately expressed as:

[0096] U t =β 0t +β 1t ]T t +β 2t (T t -T t0 )A

[0097] The T-U curve after piecewise fitting can be approximately:

[0098] When t < t0, U t =β 0t +β 1t T t ;

[0099] When t > t0, U t =β 0t -β2t T t +β 1t T t +β 2t T t ;

[0100] When t = t0, U t =β 0t +β 1t T t =β 0t -β 2t T t +β 1t T t +β 2t T t ;

[0101] Where, β 0t β 1t β 2t All values ​​represent the parameter values ​​of the fitted curve; different subscripts represent the fitting coefficients for different segments; A is an auxiliary variable; U t Let T be the voltage at time t; t Let t be the temperature at time t.

[0102] Through the embodiments of this disclosure, within the temperature measurement range of the sensor, the change value of the response voltage is collected at preset temperature intervals, and the target radiation temperature-response voltage curve is fitted by a piecewise linear fitting method. The sensor is nonlinearly corrected to improve the accuracy of the target radiation temperature-response voltage curve. Finally, a radiation measurement model after multi-source correction is constructed to achieve accurate measurement of emissivity.

[0103] Therefore, this disclosure achieves emissivity measurement based on the energy method, proposing a microcavity collimation structure, an atmospheric compensation mode, and a piecewise nonlinear correction method for the sensor. A multi-source calibrated emissivity measurement model is constructed from three aspects: the target under test, the transmission path, and the sensor, improving the accuracy of emissivity measurement. The device has a simple structure, high measurement accuracy, and wide applicability.

[0104] Based on the above-described emissivity measurement method, this disclosure also provides an emissivity measurement device based on multi-source correction, which can be used to implement any of the above-described emissivity measurement methods based on multi-source correction. The following will be combined with... Figure 4 The device is described in detail.

[0105] Figure 4 A schematic block diagram of a multi-source correction-based emissivity measurement device according to an embodiment of the present disclosure is shown.

[0106] like Figure 4 As shown, the emissivity measurement device 400 of this embodiment includes an emissivity measurement model module 401 and an emissivity calculation module 402.

[0107] The emissivity measurement model module is used to establish an emissivity measurement model. The emissivity measurement model includes at least one of the following: radiation source correction, atmospheric environment correction, device radiation energy correction, and detector element piecewise nonlinear fitting correction. Radiation source correction is used to remove the influence of radiation energy from non-target radiation sources and non-target radiant sources through a microcavity collimation structure installed at the front end of the detector element. Atmospheric environment correction is used to remove the influence of atmospheric environment attenuation errors. Device radiation energy correction is used to remove the influence of radiation energy from the microcavity collimation structure. Detector element piecewise nonlinear fitting correction is used to reduce the influence of detector element temperature-voltage fitting errors. In one embodiment, the emissivity measurement model module 401 can be used to perform the operation S1 described above, which will not be repeated here.

[0108] The emissivity calculation module is used to determine the emissivity of the target sample using an emissivity measurement model. In one embodiment, the emissivity calculation module 402 can be used to perform the operation S2 described above, which will not be repeated here.

[0109] This disclosure also provides an electronic device suitable for implementing a multi-source correction-based emissivity measurement method.

[0110] An electronic device according to embodiments of the present disclosure includes a processor that can perform various appropriate actions and processes based on a program stored in read-only memory (ROM) or a program loaded from a storage portion into random access memory (RAM). The processor may include, for example, a general-purpose microprocessor (e.g., a CPU), an instruction set processor and / or an associated chipset and / or a special-purpose microprocessor (e.g., an application-specific integrated circuit (ASIC)), etc. The processor may also include onboard memory for caching purposes. The processor may include a single processing unit or multiple processing units for performing different actions of the method flow according to embodiments of the present disclosure.

[0111] The RAM stores various programs and data required for the operation of the electronic device. The processor, ROM, and RAM are interconnected via a bus. The processor executes various operations of the method flow according to embodiments of this disclosure by executing programs in the ROM and / or RAM. It should be noted that programs may also be stored in one or more memories other than ROM and RAM. The processor may also execute various operations of the method flow according to embodiments of this disclosure by executing programs stored in one or more memories.

[0112] According to embodiments of this disclosure, the electronic device may further include an input / output (I / O) interface, which is also connected to a bus. The electronic device may also include one or more of the following components connected to the I / O interface: an input section including a keyboard, mouse, etc.; an output section including a cathode ray tube (CRT), liquid crystal display (LCD), etc., and a speaker, etc.; a storage section including a hard disk, etc.; and a communication section including a network interface card such as a LAN card, modem, etc. The communication section performs communication processing via a network such as the Internet. A drive is also connected to the I / O interface as needed. Removable media, such as a magnetic disk, optical disk, magneto-optical disk, semiconductor memory, etc., are installed on the drive as needed so that computer programs read from them can be installed into the storage section as needed.

[0113] This disclosure also provides a computer-readable storage medium, which may be included in the device / apparatus / system described in the above embodiments; or it may exist independently and not assembled into the device / apparatus / system. The computer-readable storage medium carries one or more programs that, when executed, implement the method according to the embodiments of this disclosure.

[0114] Embodiments of this disclosure also include a computer program product comprising a computer program containing program code for performing the methods shown in the flowchart. When the computer program product is run on a computer system, the program code is used to cause the computer system to implement the methods provided in the embodiments of this disclosure.

[0115] According to embodiments of this disclosure, program code for executing the computer programs provided in embodiments of this disclosure can be written in any combination of one or more programming languages. Specifically, these computational programs can be implemented using high-level procedural and / or object-oriented programming languages, and / or assembly / machine languages. Programming languages ​​include, but are not limited to, languages ​​such as Java, C++, Python, "C", or similar programming languages. The program code can execute entirely on the user's computing device, partially on the user's device, partially on a remote computing device, or entirely on a remote computing device or server. In cases involving remote computing devices, the remote computing device can be connected to the user's computing device via any type of network, including a local area network (LAN) or a wide area network (WAN), or it can be connected to an external computing device (e.g., via the Internet using an Internet service provider).

[0116] The flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of possible implementations of systems, methods, and computer program products according to various embodiments of this disclosure. In this regard, each block in a flowchart or block diagram may represent a module, segment, or portion of code containing one or more executable instructions for implementing a specified logical function. It should also be noted that in some alternative implementations, the functions indicated in the blocks may occur in a different order than those indicated in the drawings. For example, two consecutively indicated blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. It should also be noted that each block in a block diagram or flowchart, and combinations of blocks in a block diagram or flowchart, may be implemented using a dedicated hardware-based system that performs the specified function or operation, or using a combination of dedicated hardware and computer instructions.

[0117] Those skilled in the art will understand that the features described in the various embodiments and / or claims of this disclosure can be combined or combined in various ways, even if such combinations or combinations are not explicitly described in this disclosure. In particular, the features described in the various embodiments and / or claims of this disclosure can be combined or combined in various ways without departing from the spirit and teachings of this disclosure. All such combinations and / or combinations fall within the scope of this disclosure.

[0118] The embodiments of this disclosure have been described above. However, these embodiments are for illustrative purposes only and are not intended to limit the scope of this disclosure. Although various embodiments have been described above, this does not mean that the measures in the various embodiments cannot be used advantageously in combination. The scope of this disclosure is defined by the appended claims and their equivalents. Various substitutions and modifications can be made by those skilled in the art without departing from the scope of this disclosure, and all such substitutions and modifications should fall within the scope of this disclosure.

Claims

1. A method for measuring emissivity based on multi-source correction, characterized in that, The method comprises the following steps: establishing an emissivity measurement model; the emissivity measurement model comprises at least one of radiation source correction, atmospheric environment correction, device radiation energy correction, and detection element segmented nonlinear fitting correction; the radiation source correction is used to remove the influence of non-target radiation sources and target non-normal radiation energy by means of a micro-cavity collimation structure installed at the front end of the detection element; the atmospheric environment correction is used to remove the influence of atmospheric environment attenuation error; the device radiation energy correction is used to remove the influence of the radiation energy of the micro-cavity collimation structure; and the detection element segmented nonlinear fitting correction is used to reduce the influence of detection element temperature-voltage fitting error; determining the emissivity of the target sample by using the emissivity measurement model; wherein the emissivity measurement model is established by using the micro-cavity collimation structure to transmit the normal radiation energy emitted by the target sample to the detection element for completing the radiation source correction; obtaining a radiation energy expression formula according to atmospheric environment parameters and device radiation energy for completing the atmospheric environment correction and the device radiation energy correction; and determining an emissivity measurement formula of the target sample by means of the radiation energy expression formula; wherein the atmospheric environment parameters at least include the current environment temperature; wherein the radiation energy expression formula is obtained according to atmospheric environment parameters and device radiation energy for completing the atmospheric environment correction and the device radiation energy correction; and the emissivity measurement formula of the target sample is determined by means of the radiation energy expression formula, which comprises: expressing the radiation energy received by the detection element as the sum of atmospheric radiation energy, device radiation energy and target radiation energy to obtain a radiation energy expression formula; converting the radiation energy expression formula into a radiation temperature expression formula according to the Stefan-Boltzmann law; and obtaining the emissivity measurement formula by means of the radiation temperature expression formula; wherein the radiation temperature expression formula is as follows: ； wherein is the target radiance temperature; is the atmospheric transmittance; is the emissivity of the target sample; is the emissivity of the internal coating material of the microcavity collimating material; is the true temperature of the target sample; is the current ambient temperature; is the temperature of the microcavity collimating structure; n is a constant; wherein the emissivity measurement formula is as follows: ； wherein, is a target radiation temperature; is an atmospheric transmittance; is a true temperature of the target sample; is an emissivity of the internal coating material of the microcavity collimating material; is a current ambient temperature; is a temperature of the microcavity collimating structure; n is a constant.

2. The method of claim 1, wherein, transmitting the normal radiation energy emitted by the target sample to the detection element by means of the micro-cavity collimation structure for completing the radiation source correction, which comprises: adjusting the diameter and radius of the micro-cavity collimation structure according to preset parameters; the preset parameters at least include one of the temperature of the target sample, the effective width of the detection element, and the detection distance of the micro-cavity collimation structure; installing the micro-cavity collimation structure at the front end of the detection element for processing the radiation energy emitted by the target sample and transmitting it to the detection element.

3. The method of claim 2, wherein, adjusting the diameter and radius of the micro-cavity collimation structure according to preset parameters, which comprises: determining the diameter of the micro-cavity collimation tube according to the preset to-be-detected region diameter of the target sample and the measurement temperature interval of the target sample; calculating the length of the micro-cavity collimation structure by means of the to-be-detected region diameter, the effective width of the detection element, the detection distance of the micro-cavity collimation structure, and the diameter of the micro-cavity collimation structure; wherein the formula for calculating the length of the micro-cavity collimation structure is as follows: ； in the formula, L2 is the length of the micro-cavity collimation structure; L1 is the detection distance of the micro-cavity collimation structure; D is the diameter of the micro-cavity collimation structure; S is the effective width of the detection element; and L is the to-be-detected region diameter.

4. The method of claim 2, wherein, The micro-cavity collimation structure is also provided with a cooling device.

5. The method of claim 1, wherein, According to the atmospheric environment parameters and the radiation energy of the device, a radiation energy expression formula is obtained to complete the atmospheric environment correction and the device radiation energy correction, and the method further comprises the following steps: Measuring the current environment temperature, and converting the atmospheric transmittance through the current environment temperature; Using the thermal resistor embedded in the micro-cavity collimation structure to obtain the temperature of the micro-cavity collimation structure; Measuring the real temperature of the target sample.

6. The method of claim 1, wherein, Using the emissivity measurement model, the emissivity of the target sample is determined, comprising: According to the response voltage of the detection element, the detection element temperature-voltage curve is queried to determine the target radiation temperature; The real temperature, the target radiation temperature, the atmospheric transmittance, the current environment temperature and the temperature of the micro-cavity collimation structure are substituted into the emissivity measurement formula to determine the emissivity of the target sample.

7. The method of claim 6, wherein, According to the response voltage of the detection element, the detection element temperature-voltage curve is queried to determine the target radiation temperature, comprising: Within the temperature measurement range of the detection element, the change value of the response voltage is collected at a preset temperature interval; The temperature measurement range is divided into multiple temperature intervals, and for each temperature interval, the detection element temperature-voltage curve is fitted in a piecewise linear fitting manner.

8. A multi-source correction based emissivity measurement apparatus, characterized by, The device can be used to implement any one of the methods of claims 1 to 6, and the device comprises: An emissivity measurement model module is configured to establish an emissivity measurement model; the emissivity measurement model comprises at least one of a radiation source correction, an atmospheric environment correction, a device radiation energy correction, and a detection element piecewise nonlinear fitting correction; the radiation source correction is configured to remove the influence of non-target radiation sources and target non-normal radiation energy through a micro-cavity collimation structure installed at the front end of the detection element; the atmospheric environment correction is configured to remove the influence of atmospheric environment attenuation error; the device radiation energy correction is configured to remove the influence of the radiation energy of the micro-cavity collimation structure; and the detection element piecewise nonlinear fitting correction is configured to reduce the influence of detection element temperature-voltage fitting error; An emissivity calculation module is configured to determine the emissivity of the target sample using the emissivity measurement model; Wherein, the emissivity measurement model is established by: using the micro-cavity collimation structure to transmit the normal radiation energy emitted by the target sample to the detection element to complete the radiation source correction; according to the atmospheric environment parameters and the radiation energy of the device, a radiation energy expression formula is obtained to complete the atmospheric environment correction and the device radiation energy correction; through the radiation energy expression formula, the emissivity measurement formula of the target sample is determined; wherein the atmospheric environment parameters at least include the current environment temperature; Wherein, according to the atmospheric environment parameters and the radiation energy of the device, a radiation energy expression formula is obtained to complete the atmospheric environment correction and the device radiation energy correction; through the radiation energy expression formula, the emissivity measurement formula of the target sample is determined, comprising: expressing the radiation energy received by the detection element as the sum of the atmospheric radiation energy, the device radiation energy and the target radiation energy to obtain the radiation energy expression formula; according to the Stefan-Boltzmann law, the radiation energy expression formula is converted into a radiation temperature expression formula; and the emissivity measurement formula is obtained using the radiation temperature expression formula; Wherein, the radiation temperature expression formula is as follows: ； wherein is the target radiance temperature; is the atmospheric transmittance; is the emissivity of the target sample; is the emissivity of the internal coating material of the microcavity collimating material; is the true temperature of the target sample; is the current ambient temperature; is the temperature of the microcavity collimating structure; n is a constant; The emissivity measurement formula is as follows: ； wherein, is a target radiance temperature; is an atmospheric transmittance; is a true temperature of the target sample; is an emissivity of the internal coating material of the microcavity collimating material; is a current ambient temperature; is a temperature of the microcavity collimating structure; n is a constant.

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