Integrated circuit chip test equipment

Abstract

The invention belongs to the technical field of chip testing, and particularly relates to integrated circuit chip testing equipment which comprises a machine body, a testing part and a transferring part, the testing part is installed on the machine body and comprises an appearance testing assembly and an electrical performance testing assembly, and the transferring part is used for transporting a chip to sequentially pass through the appearance testing assembly and the electrical performance testing assembly. The transfer part comprises a first circular ring, a second circular ring, a third circular ring, a fourth circular ring and a fourth circular ring, the placing assemblies are mounted on the first circular ring in an annular array manner; each placing assembly comprises a connecting plate mounted on the first circular ring; the fixing plate is movably arranged on the connecting plate and is used for fixing a chip; through the arrangement of the placement assembly, the problems that the appearance test system cannot detect that the pins are separated from the chip and the pins are left on the electrical performance test assembly under the action of friction force between the pins and the electrical performance test assembly when the pins are transferred to the electrical performance test after the appearance test is qualified are solved.

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