Light-operated calibration tool and light-operated dynamic calibration method

Abstract

The invention relates to a light-operated calibrator and a light-operated dynamic calibration method. The light-operated calibration tool particularly comprises a controllable photoresistor branch, the controllable resistance value of the controllable photoresistor branch can be accurately calculated by means of a known resistor branch and a voltage measurement branch, and then the light-operated calibration tool can be accurately calibrated by means of the characteristics that the resistance value of a photoresistor in the controllable photoresistor branch is controllable when the photoresistor is illuminated and the resistance value of the photoresistor is stable. Any required accurate resistance value is provided for calibration, a standard resistor disc does not need to be replaced frequently, damage to a calibration instrument is avoided, safety is improved, meanwhile, testing of resistance values in different ranges of the to-be-tested equipment can be completed with high flexibility, and finally high-safety, flexible and accurate dynamic calibration of the to-be-tested equipment is achieved.

Description

Technical Field

[0001] The present invention is applicable to the field of calibration and detection technology, and in particular relates to a light-controlled calibration tool and a light-controlled dynamic calibration method. Background Art

[0002] At present, the electrical properties of superconducting devices are often tested in IV mode of semi-automatic probe stations. In the process of testing the electrical properties of superconducting devices, resistance testing is particularly important in superconducting technology, and the stability and accuracy of the test results directly affect the yield of the tested products. Therefore, in order to ensure the credibility of the equipment test results, it is necessary to calibrate the probe station with different resistance values ​​before officially testing the equipment to be tested.

[0003] Currently, the calibration of the probe station mainly relies on standard resistors. However, on the one hand, the existing standard resistors on the market have few resistance specifications and discrete resistance values, resulting in insufficient calibration flexibility. On the other hand, there are also large errors in the accuracy and specifications of existing standard resistors, resulting in poor current calibration accuracy. On the other hand, the specifications of existing standard resistors on the market, especially the height, are not uniform. In the process of calibrating the probe station using standard resistors with different resistance values, it is easy to damage the equipment during the replacement of the standard resistors due to differences in the specifications of the standard resistors.

[0004] Therefore, the current calibration scheme for the probe station has problems such as insufficient security, insufficient flexibility and insufficient accuracy of calibration. Summary of the invention

[0005] In view of this, the embodiments of the present invention provide a light-controlled calibration tool and a light-controlled dynamic calibration method to solve the technical problems of the current calibration method being insufficient in safety, flexibility and accuracy.

[0006] In a first aspect, a light-controlled calibration tool is provided, comprising a power supply branch, a device selection branch to be tested, a known resistance branch, a controllable photoresistor branch, a first voltage measurement branch, and a second voltage measurement branch;

[0007] The positive terminal of the power supply branch is connected to the input terminal of the device selection branch under test, the negative terminal of the power supply branch is grounded, the output terminal of the device selection branch under test is connected to the input terminal of the controllable photoresistor branch, the output terminal of the controllable photoresistor branch is connected to the input terminal of the known resistance branch, and the output terminal of the known resistance branch is grounded;

[0008] The second voltage measurement branch is connected in parallel with the controllable photoresistor branch, and the first voltage measurement branch is connected in parallel with the device-to-be-tested selection branch.

[0009] In a second aspect, a light-controlled dynamic calibration method applied to the above-mentioned light-controlled calibration tool is provided, the method comprising:

[0010] Controlling the device under test to select a branch to connect to the device under test, and determining a loop current flowing through the known resistance branch according to the power supply voltage of the power supply branch, the first voltage measured by the first voltage measurement branch, the second voltage measured by the second voltage measurement branch, and the resistance value of the known resistance branch;

[0011] Determine the controllable resistance value of the controllable photoresistor branch according to the loop current and the second voltage, and determine the resistance of the device under test according to the loop current and the first voltage;

[0012] The controllable resistance of the controllable photoresistor branch is changed, and the resistance of the device under test is correspondingly determined after each change of the controllable resistance of the controllable photoresistor branch, so as to complete the test of the resistance values ​​of the device under test in different ranges.

[0013] Compared with the prior art, the present invention has the following beneficial effects:

[0014] The light-controlled calibration device of the present invention comprises a power supply branch, a device selection branch to be tested, a known resistance branch, a controllable photoresistor branch, a first voltage measurement branch and a second voltage measurement branch. With the help of the known resistance branch and the voltage measurement branch, the controllable resistance value of the controllable photoresistor branch can be accurately calculated. Then, by utilizing the characteristics that the resistance of the photoresistor in the controllable photoresistor branch is controllable under light and its own resistance is stable, any required accurate resistance value can be provided for calibration by adjusting the light intensity received by the photoresistor in the controllable photoresistor branch. There is no need to frequently replace the standard resistor sheet as in the prior art, which avoids damage to the calibration instrument and improves safety. At the same time, accurate testing of different ranges of resistance values ​​of the device to be tested can be completed with high flexibility, and finally a highly safe, flexible and accurate dynamic calibration of the device to be tested is achieved. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0016] Figure 1 It is a schematic diagram of the circuit structure of a light-controlled calibration tool provided by one embodiment of the present invention;

[0017] Figure 2 It is a flow chart of a light-controlled dynamic calibration method provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0018] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0019] It should be understood that the present invention can be implemented in different forms and should not be construed as being limited to the embodiments set forth herein. On the contrary, providing these embodiments will make the disclosure thorough and complete and fully convey the scope of the present invention to those skilled in the art. In the accompanying drawings, the sizes and relative sizes of layers and regions may be exaggerated for clarity. The same reference numerals throughout represent the same elements.

[0020] It should be understood that when an element or layer is referred to as being "on, adjacent to, connected to or coupled to other elements or layers, it may be directly on, adjacent to, connected to or coupled to other elements or layers, or there may be intervening elements or layers. In contrast, when an element is referred to as being "directly on, directly adjacent to, directly connected to or directly coupled to other elements or layers, there may be no intervening elements or layers. It should be understood that, although the terms first, second, third, etc. may be used to describe various elements, components, regions, layers and / or parts, these elements, components, regions, layers and / or parts should not be limited by these terms. These terms are only used to distinguish one element, component, region, layer or part from another element, component, region, layer or part. Therefore, without departing from the teachings of the present invention, the first element, component, region, layer or part discussed below may be represented as a second element, component, region, layer or part.

[0021] Spatially relative terms such as "under," "beneath," "below," "under," "above," "above," and the like may be used herein for ease of description to describe the relationship of an element or feature shown in the figures to other elements or features. It should be understood that the spatially relative terms are intended to include different orientations of the device in use and operation in addition to the orientations shown in the figures. For example, if the device in the accompanying drawings is flipped, then the elements or features described as "under other elements" or "under" or "under" will be oriented as "above" the other elements or features. Thus, the exemplary terms "under" and "under" may include both upper and lower orientations. The device may be otherwise oriented (rotated 90 degrees or other orientations) and the spatial descriptors used herein are interpreted accordingly.

[0022] The purpose of the terms used herein is only to describe specific embodiments and is not intended to be limiting of the present invention. When used herein, the singular forms "one", "an" and "said / the" are also intended to include plural forms, unless the context clearly indicates otherwise. It should also be understood that the terms "consisting of" and / or "comprising", when used in this specification, determine the presence of the features, integers, steps, operations, elements and / or parts, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, parts and / or groups. When used herein, the term "and / or" includes any and all combinations of the relevant listed items.

[0023] In order to fully understand the present invention, detailed structures and steps will be presented in the following description to illustrate the technical solutions proposed by the present invention. The preferred embodiments of the present invention are described in detail below, but in addition to these detailed descriptions, the present invention may also have other implementations.

[0024] like Figure 1 , which is a schematic diagram of a circuit structure of a light-controlled calibration device provided by an embodiment of the present invention, comprising a power supply branch 101, a switch branch 102, a device-to-be-tested selection branch 103, a known resistance branch 104, a controllable photoresistor branch 105, a first voltage measurement branch 106, and a second voltage measurement branch 107;

[0025] Among them, the negative end of the power supply branch 101 is grounded, the positive end of the power supply branch 101 is connected to one end of the switch branch 102, the other end of the switch branch 102 is connected to the input end of the device selection branch 103 under test, the output end of the device selection branch 103 under test is connected to the input end of the controllable photoresistor branch 105, the output end of the controllable photoresistor branch 105 is connected to the input end of the known resistance branch 104, and the output end of the known resistance branch 104 is grounded.

[0026] Furthermore, the second voltage measurement branch 107 is connected in parallel with the controllable photoresistor branch 105 , and the first voltage measurement branch 106 is connected in parallel with the device selection branch 103 .

[0027] The light-controlled calibration device shown in this embodiment particularly includes a controllable photoresistor branch 105, wherein the photoresistor is controllable because its resistance is directly affected by the magnitude of light illumination. Therefore, the resistance of the photoresistor can be purposefully changed by changing the magnitude of the light illumination intensity to which the photoresistor is subjected. The loop current of the light-controlled calibration device as a whole is calculated by the known resistance of the known resistance branch 104 and the voltage on the known resistance branch calculated by the power supply branch and the two voltage measurement branches. The resistance of the controllable photoresistor branch is then calculated by the loop current and the voltage measured by the second voltage measurement branch. The sensitivity and stability of the photoresistor are utilized to debug and change the resistance, thereby obtaining an ideal calibration resistor with a precisely known resistance value. Furthermore, when the resistance value of the resistor required for calibration changes, there is no need to replace a standard resistor sheet with a different resistance value as in the prior art. Instead, only the light intensity needs to be changed, thereby avoiding damage to the calibration instrument that may be caused by frequent replacement of the standard resistor sheet. While improving safety, the calibration flexibility can also be improved, thereby improving calibration efficiency.

[0028] Since the function of the above-mentioned switch branch 102 is only to control the power on and off of the overall circuit of the calibration device, in other embodiments, the light-controlled calibration device may not include the above-mentioned switch branch 102. At this time, the positive end of the power branch 101 is directly connected to the input end of the device selection branch 103 under test.

[0029] In this way, the overall structure of the light control calibration device can be simplified, reducing costs while improving reliability.

[0030] In one embodiment, the controllable photoresistor branch 105 includes an adjustable current source, a light-emitting diode and a photoresistor. The output end of the adjustable current source is connected to the positive electrode of the light-emitting diode, and the negative electrode of the light-emitting diode is connected to the input end of the adjustable current source. The resistance value of the photoresistor is controlled by the light intensity of the light-emitting diode, that is, the photoresistor is arranged adjacent to the light-emitting diode, and the photoresistor receives the light emitted by the light-emitting diode.

[0031] In this embodiment, by changing the magnitude of the current output by the adjustable current source, the magnitude of the light intensity emitted by the light emitting diode can be changed, thereby controlling the resistance of the photoresistor by means of the change in the magnitude of the light intensity, thereby achieving flexible regulation of the overall resistance of the controllable photoresistor branch. The adjustable current source of this embodiment includes Figure 1 The two current outputs shown are current level I source1 and current level I source2 In other embodiments, other adjustable current source forms may be selected according to needs, and this embodiment will not be specifically limited.

[0032] Of course, in other embodiments, the controllable photoresistor branch 105 can also be Figure 1As shown, a photocoupler 1 is used to generate light excitation, and then the light receiving part in the photocoupler 1 is used to control the current flowing through the light-emitting diode, thereby controlling the light intensity received by the photoresistor. With the help of this light-electric-light conversion process, the stability of the light intensity is improved, thereby improving the stability and accuracy of the resistance value of the controllable photoresistor branch 105 used for calibration, thereby improving the calibration effect.

[0033] Preferably, the photoelectric coupler 1 , the light emitting diode, and the photoresistor are all arranged in a light-proof housing 2 .

[0034] In one embodiment, the device selection branch 103 under test includes a first single-pole double-throw switch K2 and a second single-pole double-throw switch K3, the movable end of the first single-pole double-throw switch K2 is connected to the input end of the device selection branch 103 under test, the movable end of the second single-pole double-throw switch K3 is connected to the output end of the device selection branch 103 under test, and the first fixed end of the first single-pole double-throw switch K2 is connected to the first fixed end of the second single-pole double-throw switch K3, that is, Figure 1 The two ends of the switch K2 and the switch K3 are directly connected, and the second fixed end of the first single-pole double-throw switch K2 is also as shown in FIG. Figure 1 The c end shown in FIG. 1 and the second fixed end of the second single-pole double-throw switch K3 are also as shown in FIG. Figure 1 The d terminal shown is used to connect the device under test. Figure 1 Both ends of the DUT are shown.

[0035] By using two single-pole double-throw switches to form the device selection branch 103 in the above manner, the two switches can be connected to the first fixed end or the second fixed end at the same time. In both cases, when the device under test DUT is connected and when the device under test DUT is not connected, the resistance of the controllable photoresistor branch 105 can be adjusted, thereby further improving the calibration flexibility of the light-controlled calibration device.

[0036] In one embodiment, the power branch 101 is as follows: Figure 1 The power supply U1 is shown as a probe station power supply, wherein the positive pole of the probe station power supply is connected to the positive terminal of the power supply branch, and the negative pole of the probe station power supply is connected to the negative terminal of the power supply branch.

[0037] By utilizing the excellent voltage supply stability of the probe station power supply, the accuracy of the resistance value of the controllable photoresistor branch 105 calculated using Ohm's law can be further guaranteed, thereby improving the calibration accuracy.

[0038] In one embodiment, setting the known resistance branch 104 includes: Figure 1 The first resistor R1 is shown, and the resistance value of R1 is artificially selected;

[0039] Furthermore, the first voltage measurement branch 106 includes a first voltmeter V1 , and the second voltage measurement branch 107 includes a second voltmeter V2 .

[0040] Furthermore, in a preferred embodiment, the second voltage measurement branch further includes a first on-off switch K4, and the first on-off switch K4 is connected in series with the second voltmeter V2 in the second voltage measurement branch.

[0041] Considering that the resistance of the photoresistor is inversely proportional to the light intensity, when the current source is not working, the photoresistor has a large resistance because it is not exposed to light. At this time, the voltage across it is very large. If the second voltmeter V2 is always connected in parallel with the photoresistor, the voltage across the photoresistor is very large and may exceed the range of the second voltmeter V2 and damage the second voltmeter V2. Therefore, the first on-off switch K4 is additionally provided to control whether the second voltmeter V2 is connected in parallel with the controllable photoresistor branch 105, thereby avoiding damage to the second voltmeter V2.

[0042] It should be noted that, in the above embodiment, the first voltage measurement branch 106 is directly connected in parallel with the device selection branch 103 under test. In other embodiments, it is easy to understand that the first voltage measurement branch 106 can also be connected in parallel. Figure 1 As shown in the figure, when connected in parallel with the device under test (DUT), the two parallel connection methods will not bring any change to the results.

[0043] like Figure 2 FIG. 1 is a flow chart of a light-controlled dynamic calibration method applied to the light-controlled calibration tool provided by an embodiment of the present invention. The method includes the following steps.

[0044] Step S201, control the device under test to select a branch to connect to the device under test, and determine the loop current flowing through the known resistance branch according to the power supply voltage of the power supply branch, the first voltage measured by the first voltage measurement branch, the second voltage measured by the second voltage measurement branch, and the resistance value of the known resistance branch.

[0045] like Figure 1As shown, since the calibration tool is to test and calibrate the device under test, the device under test is first controlled to select branch 103 to connect to the device under test DUT, and when the switch branch 102 is included in the overall circuit structure of the light-controlled calibration tool, the switch branch 102 is closed, and when the second voltage measurement branch includes the first on-off switch K4, the first on-off switch K4 is closed, and then the voltage on the known resistance branch is determined based on the power supply voltage of the power supply branch, the first voltage measured by the first voltage measurement branch, and the second voltage measured by the second voltage measurement branch. Since the resistance of the known resistance branch is known, the current flowing through the known resistance branch can be calculated based on Ohm's law. Since the other branches are connected in series with the known resistance branch, the current flowing through the known resistance branch is the overall loop current of the light-controlled calibration tool.

[0046] Among them, the current flowing through the known resistance branch is:

[0047]

[0048] Among them, I is the current flowing through the known resistance branch, that is, the loop current, R1 is the resistance value of the known resistance branch, U1 is the power supply voltage of the power supply branch, V1 is the first voltage measured by the first voltage measurement branch, and V2 is the second voltage measured by the second voltage measurement branch.

[0049] Step S202, determining the controllable resistance of the controllable photoresistor branch according to the loop current and the second voltage, and determining the resistance of the device under test according to the loop current and the first voltage.

[0050] After determining the current of the overall loop of the light-controlled calibration device, the controllable resistance value of the controllable photoresistor branch can be calculated according to the second voltage measured by the second voltage measurement branch:

[0051]

[0052] Among them, R L is the controllable resistance value of the controllable photoresistor branch;

[0053] And, according to the loop current and the first voltage measured by the first voltage measurement branch, the resistance value of the device under test can be calculated:

[0054]

[0055] Among them, R DUT is the resistance of the device under test.

[0056] Step S203, changing the controllable resistance of the controllable photoresistor branch, and determining the resistance of the device under test correspondingly after each change of the controllable resistance of the controllable photoresistor branch, thereby completing the test of different resistance ranges of the device under test.

[0057] Since the measurement requirement for the device to be tested is to complete calibration tests of resistance values ​​in different ranges, and the initial controllable resistance value of the controllable photoresistor branch is most likely not what is expected, after obtaining the initial controllable resistance value of the controllable photoresistor branch, the controllable resistance value of the controllable photoresistor branch needs to be changed. The purpose is to adjust the controllable resistance value of the controllable photoresistor branch to the resistance value required for calibration, and each time the controllable resistance value of the controllable photoresistor branch is changed, the resistance of the device to be tested is determined again to complete the test of resistance values ​​in different ranges of the device to be tested.

[0058] The beneficial effects that can be achieved by this embodiment have been described in the above-mentioned light control calibration tool embodiment, so they will not be repeated here.

[0059] The embodiments described above are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention, and should all be included in the protection scope of the present invention.

Claims

1. A light control calibration tool, characterized in that: It includes a power supply branch, a device selection branch to be tested, a known resistance branch, a controllable photoresistor branch, a first voltage measurement branch and a second voltage measurement branch; The positive terminal of the power supply branch is connected to the input terminal of the device selection branch under test, the negative terminal of the power supply branch is grounded, the output terminal of the device selection branch under test is connected to the input terminal of the controllable photoresistor branch, the output terminal of the controllable photoresistor branch is connected to the input terminal of the known resistance branch, and the output terminal of the known resistance branch is grounded; The second voltage measurement branch is connected in parallel with the controllable photoresistor branch, and the first voltage measurement branch is connected in parallel with the device-to-be-tested selection branch.

2. The light control calibration tool according to claim 1, characterized in that: The controllable photoresistor branch includes an adjustable current source, a light emitting diode and a photoresistor; The output end of the adjustable current source is connected to the positive electrode of the light emitting diode, the negative electrode of the light emitting diode is connected to the input end of the adjustable current source, and the resistance value of the photoresistor is controlled by the light intensity of the light emitting diode.

3. The light control calibration tool according to claim 1, characterized in that: The device under test selection branch includes a first single-pole double-throw switch and a second single-pole double-throw switch, the moving end of the first single-pole double-throw switch is connected to the input end of the device under test selection branch, the moving end of the second single-pole double-throw switch is connected to the output end of the device under test selection branch, the first fixed end of the first single-pole double-throw switch is connected to the first fixed end of the second single-pole double-throw switch, and the second fixed end of the first single-pole double-throw switch and the second fixed end of the second single-pole double-throw switch are used to connect two ends of the device under test.

4. The light control calibration tool according to claim 1, characterized in that: The power branch includes a probe station power supply, the positive electrode of the probe station power supply is connected to the positive terminal of the power branch, and the negative electrode of the probe station power supply is connected to the negative terminal of the power branch.

5. The light control calibration tool according to claim 1, characterized in that: The known resistance branch includes a first resistor, and the resistance value of the first resistor is artificially selected.

6. The light control calibration tool according to claim 1, characterized in that: The first voltage measurement branch includes a first voltmeter, and the second voltage measurement branch includes a second voltmeter.

7. The light control calibration tool according to claim 6, characterized in that: The second voltage measurement branch further includes a first on-off switch, which is connected in series with the second voltmeter in the second voltage measurement branch.

8. A light-controlled dynamic calibration method, characterized in that: Applicable to the light control calibration tool of claim 1, the method comprising: Controlling the device under test to select a branch to connect to the device under test, and determining a loop current flowing through the known resistance branch according to the power supply voltage of the power supply branch, the first voltage measured by the first voltage measurement branch, the second voltage measured by the second voltage measurement branch, and the resistance value of the known resistance branch; Determine the controllable resistance value of the controllable photoresistor branch according to the loop current and the second voltage, and determine the resistance of the device under test according to the loop current and the first voltage; The controllable resistance of the controllable photoresistor branch is changed, and the resistance of the device under test is correspondingly determined after each change of the controllable resistance of the controllable photoresistor branch, so as to complete the test of the resistance values ​​of the device under test in different ranges.

9. The light-controlled dynamic calibration method according to claim 8, characterized in that: Determining the loop current flowing through the known resistance branch according to the power supply voltage of the power supply branch, the first voltage measured by the first voltage measurement branch, the second voltage measured by the second voltage measurement branch, and the resistance value of the known resistance branch includes: Calculate the current flowing through the known resistance branch: Among them, I is the current flowing through the known resistance branch, that is, the loop current, R1 is the resistance value of the known resistance branch, U1 is the power supply voltage of the power supply branch, V1 is the first voltage measured by the first voltage measurement branch, and V2 is the second voltage measured by the second voltage measurement branch.

10. The light-controlled dynamic calibration method according to claim 9, characterized in that: The controllable resistance of the controllable photoresistor branch is: Among them, R L is the controllable resistance value of the controllable photoresistor branch; The resistance of the device under test is: Among them, R DUT is the resistance of the device under test.

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