Matrix switch path internal resistance measuring system and method

Abstract

The invention provides a matrix switch path internal resistance measuring system and method, and relates to the technical field of electronics. Comprising one or more H-bridge circuits; the first branch circuit and the second branch circuit of the H-bridge circuit are connected with the positive electrode end and the negative electrode end of the H-bridge circuit; the first branch is provided with a first high-side switch and a first low-side switch, and the second branch is provided with a second high-side switch and a second low-side switch; the first node between the first high-side switch and the first low-side switch is used for connecting a first to-be-tested terminal in the matrix switch; the second node between the second high-side switch and the second low-side switch is used for connecting a second terminal to be tested in the matrix switch; two ends of the measuring element are respectively connected with the positive electrode end and the negative electrode end, and the measuring element is used for determining the path internal resistance between the first to-be-measured terminal and the second to-be-measured terminal. Therefore, the internal resistance of the path between any two terminals in the matrix switch can be accurately determined by connecting the H-bridge circuit and the measuring element.

Description

Technical Field

[0001] The present application relates to the field of electronic technology, and in particular to a system and method for measuring the internal resistance of a matrix switch path. Background Art

[0002] Matrix switches switch between multiple input signals and multiple output signals in any combination and are often used in automated testing. Figure 1 The circuit structure diagram of a matrix switch shown in FIG. 1 is composed of rows and columns, and the rows and columns can be connected to the outside through terminals, for example, Figure 1 The mth column is connected to the outside through the terminal Xm, and the nth row is connected to the outside through the terminal Yn. The intersection of the row and the column in the matrix switch can be used as a node to set the switch, for example, Figure 1 The intersection of the first row and the first column can be used as a node to set a switch K11, which controls the connectivity of the node. Closing K11 can connect the first column terminal X1 and the first row terminal Y1.

[0003] When different terminals of a matrix switch are connected to each other, there will be different internal resistances. For example, different wiring lengths will produce different internal resistances, and different initial internal resistances and usage times of the switch will also produce different internal resistances. If the loss of the internal resistance of the matrix switch path is not considered during testing, the test results will be affected and even incorrect conclusions will be drawn. Summary of the invention

[0004] In view of this, the present application provides a system and method for measuring the internal resistance of a matrix switch path, aiming to accurately obtain the internal resistance of the path between terminals in the matrix switch.

[0005] In a first aspect, the present application provides a system for measuring the internal resistance of a matrix switch path, comprising one or more H-bridge circuits; the H-bridge circuit comprises a first branch and a second branch, the first branch and the second branch are both connected to the positive terminal and the negative terminal of the H-bridge circuit; the first branch is provided with a first high-side switch and a first low-side switch, and the second branch is provided with a second high-side switch and a second low-side switch; A first node between the first high-side switch and the first low-side switch is used to connect a first terminal to be tested in the matrix switch; A second node between the second high-side switch and the second low-side switch is used to connect a second terminal to be tested in the matrix switch; Two ends of the measuring element are connected to the positive terminal and the negative terminal respectively, and are used to determine the internal resistance of the path between the first terminal to be measured and the second terminal to be measured.

[0006] Optionally, each column in the matrix switch has a column terminal, and each row has a row terminal; The first node is connected to a column terminal as the first terminal to be tested, and the second node is connected to a row terminal as the second terminal to be tested; Or, the first node is connected to a column terminal as the first terminal to be tested, and the second node is connected to a column terminal as the second terminal to be tested; Alternatively, the first node is connected to a row terminal as the first terminal to be tested, and the second node is connected to a row terminal as the second terminal to be tested.

[0007] Optionally, it also includes a first controller; The control end of the first controller is connected to the first high-side switch, the second high-side switch, the first low-side switch and the second low-side switch; The first controller is used to control the connection state of each of the first high-side switch, the second high-side switch, the first low-side switch, and the second low-side switch.

[0008] Optionally, a second controller is also included; The control end of the second controller is connected to the switch to be tested in the matrix switch; the switch to be tested is located between the first node and the second node; The second controller is used to control the connection state of the switch to be tested.

[0009] Optionally, it further includes an operation processor; the measuring element is a voltmeter, the positive terminal and the negative terminal are also connected to an excitation source, and the excitation source is a constant current source; the operation processor is connected to the measuring element; The computing processor is used for: When the switch on the first branch is closed and the first switch is open, the internal resistance of the first branch is calculated according to the voltage value measured by the measuring element and the current value output by the excitation source, and the first switch is a switch other than the switch on the first branch; When the switch on the second branch is closed and the second switch is open, the internal resistance of the second branch is calculated according to the voltage value measured by the measuring element and the current value output by the excitation source, and the second switch is a switch other than the switch on the second branch; When the first high-side switch, the second low-side switch and the switch to be tested are closed and the third switch is open, a first internal resistance is calculated according to the voltage value measured by the measuring element and the current value output by the excitation source; the switch to be tested is a switch located between the first node and the second node in the matrix switch, and the third switch is a switch other than the first high-side switch, the second low-side switch and the switch to be tested; When the second high-side switch, the first low-side switch and the switch to be tested are closed and the fourth switch is open, a second internal resistance is calculated according to the voltage value measured by the measuring element and the current value output by the excitation source, and the fourth switch is a switch other than the second high-side switch, the first low-side switch and the switch to be tested; Calculate a first sum of the first branch internal resistance and the second branch internal resistance, and a second sum of the first internal resistance and the second internal resistance, calculate half of the difference between the second sum and the first sum, and obtain the path internal resistance between the first terminal to be measured and the second terminal to be measured.

[0010] Optionally, it further includes a calculation processor; the measuring element is an ohmmeter; the calculation processor is connected to the measuring element; The computing processor is used for: When the switch on the first branch is closed and the first switch is open, obtaining the first branch internal resistance measured by the measuring element, wherein the first switch is a switch other than the switch on the first branch; When the switch on the second branch is closed and the second switch is open, obtaining the internal resistance of the second branch measured by the measuring element, wherein the second switch is a switch other than the switch on the second branch; When the first high-side switch, the second low-side switch, and the switch to be measured are closed and the third switch is open, obtaining a first internal resistance measured by the measuring element, wherein the switch to be measured is a switch located between the first node and the second node in the matrix switch, and the third switch is a switch other than the first high-side switch, the second low-side switch, and the switch to be measured; When the second high-side switch, the first low-side switch, and the switch to be tested are closed and the fourth switch is open, obtaining a second internal resistance measured by the measuring element, wherein the fourth switch is a switch other than the second high-side switch, the first low-side switch, and the switch to be tested; Calculate a first sum of the first branch internal resistance and the second branch internal resistance, and a second sum of the first internal resistance and the second internal resistance, calculate half of the difference between the second sum and the first sum, and obtain the path internal resistance between the first terminal to be measured and the second terminal to be measured.

[0011] Optionally, the matrix switch is a matrix switch of N rows×M columns, and the system includes M+N branches; Each of the M columns has a column terminal, and nodes disposed between the high-side switch and the low-side switch in M ​​of the M+N branches are connected one-to-one with the M column terminals included in the M columns; Each of the N rows has a row terminal, and nodes disposed between the high-side switch and the low-side switch in N of the M+N branches are connected one-to-one with the N row terminals included in the N rows; One end of the M+N branches is commonly connected to the positive terminal, and the other end is commonly connected to the negative terminal; Among the M+N branches, any two branches serve as the first branch and the second branch in an H-bridge circuit.

[0012] Optionally, the first high-side switch, the second high-side switch, the first low-side switch and the second low-side switch are all relay switches.

[0013] In a second aspect, the present application further provides a method for measuring the internal resistance of a matrix switch path, which is applied to a system for measuring the internal resistance of a matrix switch path as described in any one of the first aspects above, and the method comprises: Controlling the switch on the first branch to close, controlling the first switch to open, and determining the first branch internal resistance between the positive terminal and the negative terminal, wherein the first switch is a switch other than the switch on the first branch; Controlling the switch on the second branch to close, controlling the second switch to open, and determining the internal resistance of the second branch between the positive terminal and the negative terminal, wherein the second switch is a switch other than the switch on the second branch; Controlling the first high-side switch, the second low-side switch and the switch to be tested to be closed, controlling the third switch to be opened, and determining a first internal resistance between the positive terminal and the negative terminal, wherein the switch to be tested is a switch located between a first node and a second node in a matrix switch, and the third switch is a switch other than the first high-side switch, the second low-side switch and the switch to be tested; Control the second high-side switch, the first low-side switch and the switch to be tested to close, control the fourth switch to open, and determine the second internal resistance between the positive terminal and the negative terminal, wherein the fourth switch is a switch other than the second high-side switch, the first low-side switch and the switch to be tested; Calculate a first sum of the first branch internal resistance and the second branch internal resistance, and a second sum of the first internal resistance and the second internal resistance, calculate half of the difference between the second sum and the first sum, and obtain the path internal resistance between the first terminal to be measured and the second terminal to be measured.

[0014] Optionally, the step of determining the internal resistance between the positive terminal and the negative terminal includes: Connecting the positive electrode of the excitation source to the positive terminal, and connecting the negative electrode of the excitation source to the negative terminal; Connect the positive pole of the voltmeter to the positive terminal, and the negative pole of the voltmeter to the negative terminal; Collecting the voltage value between the positive terminal and the negative terminal by the voltmeter; The resistance between the positive terminal and the negative terminal is calculated according to the voltage value and the current value output by the excitation source.

[0015] In a third aspect, the present application provides a device, comprising a memory and a processor, wherein the memory is used to store instructions or codes, and the processor is used to execute the instructions or codes so that the device executes a method for measuring the internal resistance of a matrix switch path as described in any one of the first aspects above.

[0016] In a fourth aspect, the present application provides a computer storage medium, in which a code is stored. When the code is executed, the device executing the code implements a method for measuring the internal resistance of a matrix switch path as described in any one of the first aspects above.

[0017] The present application provides a system and method for measuring the internal resistance of a matrix switch path. The method comprises one or more H-bridge circuits. When the path internal resistance between a pair of terminals of the matrix switch needs to be measured, an H-bridge circuit can be configured for the pair of terminals. Specifically, the H-bridge circuit comprises a first branch and a second branch. The first end of the first branch is connected to the positive terminal of the H-bridge circuit, the second end of the first branch is connected to the negative terminal of the H-bridge circuit, the first end of the second branch is connected to the positive terminal of the H-bridge circuit, the second end of the second branch is connected to the negative terminal of the H-bridge circuit, the first branch is provided with a first high-side switch and a first low-side switch, the second branch is provided with a second high-side switch and a second low-side switch, the first end of the first high-side switch is connected to the positive terminal, the second end of the first high-side switch is connected to the first end of the first low-side switch, the second end of the first low-side switch is connected to the negative terminal, the first end of the second high-side switch is connected to the positive terminal, the second end of the second high-side switch is connected to the first end of the second low-side switch, and the second end of the second low-side switch is connected to the negative terminal; the above two terminals comprise a first terminal to be measured and a second terminal to be measured. The first terminal to be measured is connected to a first node between the first high-side switch and the first low-side switch, and the second terminal to be measured is connected to a second node between the second high-side switch and the second low-side switch. The two ends of the measuring element are respectively connected to the positive terminal and the negative terminal of the H-bridge circuit, thereby determining the path internal resistance between the first terminal to be measured and the second terminal to be measured. In this way, by connecting the H-bridge circuit and the measuring element, the path internal resistance between any two terminals in the matrix switch can be accurately determined, thereby facilitating compensation based on the determined path internal resistance when performing automated testing through the matrix switch, thereby obtaining accurate measurement results. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in this embodiment or the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0019] Figure 1 A schematic diagram of a circuit structure of a matrix switch provided in an embodiment of the present application; Figure 2 A schematic diagram of a circuit structure in which an H-bridge circuit is connected to two terminals to be tested of a matrix switch according to an embodiment of the present application; Figure 3 A schematic diagram of a circuit structure in which an H-bridge circuit provided in an embodiment of the present application connects a column terminal and a row terminal in a matrix switch; Figure 4 A schematic diagram of a structure in which a measuring element is connected to a positive terminal and a negative terminal provided in an embodiment of the present application; Figure 5 A schematic diagram of a structure of a matrix switch configuration H-bridge circuit provided in an embodiment of the present application; Figure 6 A schematic flow chart of a method for measuring the internal resistance of a matrix switch path provided in an embodiment of the present application. DETAILED DESCRIPTION

[0020] Based on the above statements, when different terminals of the matrix switch are interconnected, the internal wiring lengths are different, the wiring internal resistances are different, and the internal resistances of different switches in the matrix switch are also different. For example, the initial internal resistances of different relay switches are different. After a period of use, due to factors such as arc contact oxidation, the internal resistance of the relay switch will increase to varying degrees, or even fail. Furthermore, when performing automated testing through the matrix switch, the matrix switch can realize arbitrary combination switching between multiple input signals and multiple output signals, but when connecting different terminals, the difference in path internal resistance will affect the test results, and even produce erroneous results. Therefore, it is of great significance to accurately determine the path internal resistance between two terminals of the matrix switch.

[0021] Based on the above problems, the present application proposes a system and method for measuring the path internal resistance of a matrix switch to accurately determine the path internal resistance between any two terminals in the matrix switch, the system comprising one or more H-bridge circuits; the H-bridge circuit comprises a first branch and a second branch, the first branch and the second branch are both connected to the positive terminal and the negative terminal of the H-bridge circuit; the first branch is provided with a first high-side switch and a first low-side switch, the second branch is provided with a second high-side switch and a second low-side switch; the first node between the first high-side switch and the first low-side switch is used to connect the first terminal to be measured in the matrix switch; the second node between the second high-side switch and the second low-side switch is used to connect the second terminal to be measured in the matrix switch; the two ends of the measuring element are respectively connected to the positive terminal and the negative terminal, for determining the path internal resistance between the first terminal to be measured and the second terminal to be measured. In this way, an H-bridge circuit is configured for any two terminals in the matrix switch, and the path internal resistance between the two terminals in the matrix switch is accurately determined based on the electrical parameters measured by the measuring element by controlling the switch on the H-bridge circuit and the switch between the two terminals connected to the H-bridge circuit. Furthermore, based on the accurate path internal resistance, certain compensation can be made for the data of the automated test using the matrix switch.

[0022] In order to be able to understand the features and technical contents of the embodiments of the present disclosure in more detail, the implementation of the embodiments of the present disclosure is described in detail below in conjunction with the accompanying drawings. The attached drawings are for reference only and are not used to limit the embodiments of the present disclosure. In the following technical description, for the convenience of explanation, a full understanding of the disclosed embodiments is provided through multiple details. However, one or more embodiments can still be implemented without these details. In other cases, to simplify the drawings, well-known structures and devices can be simplified for display.

[0023] The terms "first", "second", etc. in the specification and claims of the embodiments of the present disclosure and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the terms used in this way can be interchanged where appropriate, so that the embodiments of the embodiments of the present disclosure described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions.

[0024] Unless otherwise stated, the term "plurality" means two or more.

[0025] In the embodiment of the present disclosure, the character " / " indicates that the preceding and following objects are in an "or" relationship. For example, A / B indicates: A or B.

[0026] The term "and / or" is a description of the association relationship between objects, indicating that three relationships can exist. For example, A and / or B means: A or B, or, A and B.

[0027] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0028] See also Figure 2 A schematic diagram of a circuit structure in which an H-bridge circuit is connected to two terminals to be measured of a matrix switch. A system for measuring the internal resistance of a matrix switch path includes one or more H-bridge circuits; The H-bridge circuit includes a first branch and a second branch, both of which are connected to the positive terminal V+ and the negative terminal V- of the H-bridge circuit; the first branch is provided with a first high-side switch S1 and a first low-side switch S2, and the second branch is provided with a second high-side switch S3 and a second low-side switch S4.

[0029] For details, see Figure 2 The first end of the first branch is connected to the positive terminal V+ of the H-bridge circuit, the second end of the first branch is connected to the negative terminal V- of the H-bridge circuit, the first end of the second branch is connected to the positive terminal V+ of the H-bridge circuit, and the second end of the second branch is connected to the negative terminal V- of the H-bridge circuit.

[0030] The first end of the first high-side switch S1 is connected to the positive terminal V+, the second end of the first high-side switch S1 is connected to the first end of the first low-side switch S2, the second end of the first low-side switch S2 is connected to the negative terminal V-, the first end of the second high-side switch S3 is connected to the positive terminal V+, the second end of the second high-side switch S3 is connected to the first end of the second low-side switch S4, and the second end of the second low-side switch S4 is connected to the negative terminal V-.

[0031] The first node between the first high-side switch S1 and the first low-side switch S2 is used to connect the first terminal to be tested in the matrix switch; the second node between the second high-side switch S3 and the second low-side switch S4 is used to connect the second terminal to be tested in the matrix switch.

[0032] Two ends of the measuring element are respectively connected to the positive terminal V+ and the negative terminal V−, and are used to determine the path internal resistance between the first terminal to be measured and the second terminal to be measured.

[0033] According to the above Figure 2The circuit shown configures an H-bridge circuit for any two terminals in the matrix switch, and determines the path internal resistance between the two terminals in the matrix switch based on controlling the switch on the H-bridge circuit and the connection state of the switch between the two terminals in the matrix switch, combined with the electrical parameters measured by the measuring element, so that the path internal resistance between any two terminals in the matrix switch can be accurately determined.

[0034] Based on the above embodiments, Figure 2 The circuit shown can connect any two terminals in the matrix switch. Specifically, each column in the matrix switch has a column terminal, and each row has a row terminal.

[0035] In a possible implementation manner, the first node is connected to a column terminal as the first terminal to be tested, and the second node is connected to a row terminal as the second terminal to be tested.

[0036] It can be understood that the first node and the second node of the H-bridge circuit can be connected to a column terminal and a row terminal of the matrix switch respectively, thereby determining the path internal resistance between the column terminal and the row terminal.

[0037] In another possible implementation manner, the first node is connected to a column terminal as the first terminal to be tested, and the second node is connected to a column terminal as the second terminal to be tested.

[0038] It can be understood that the first node and the second node of the above H-bridge circuit can be connected to two column terminals in the matrix switch respectively, so as to determine the path internal resistance between the two column terminals.

[0039] In yet another possible implementation, the first node is connected to a row terminal as the first terminal to be tested, and the second node is connected to a row terminal as the second terminal to be tested.

[0040] It can be understood that the first node and the second node of the above H-bridge circuit can be connected to two row terminals in the matrix switch respectively, thereby determining the path internal resistance between the two row terminals.

[0041] For example, see Figure 3 The circuit structure diagram of the H-bridge circuit shown in FIG. 1 is a circuit diagram of a column terminal and a row terminal of a matrix switch. Figure 1 The first terminal to be tested (Xm terminal) and the second terminal to be tested (Yn terminal) in the matrix switch of the H-bridge circuit are set to an H-bridge circuit, that is, the first node of the first branch of the H-bridge circuit is the Xm terminal, and the second node of the second branch is connected to the Yn terminal. Among them, the Xm terminal is connected to the Yn terminal through the high-side switch S xmH Connect the positive terminal V+ through the low-side switch S xmL Connect the negative terminal V-, Yn terminal through the high side switch S ynHConnect the positive terminal V+ through the low-side switch S ynL Connect the negative terminal to V-.

[0042] Based on the circuit structure of the above embodiment, an H-bridge circuit is configured to calculate the path internal resistance between the first terminal to be measured and the second terminal to be measured, and the switch on the H-bridge circuit and the connection state of the switch between the two terminals connected by the H-bridge circuit can be controlled. Based on the electrical parameters measured by the measuring element, the internal resistance generated by the H-bridge circuit and the path internal resistance between the H-bridge circuit and the two terminals are determined, and the path internal resistance between the two terminals is calculated. The implementation method is as follows: Optionally, a first controller is configured; the control end of the first controller is connected to the first high-side switch, the second high-side switch, the first low-side switch and the second low-side switch; the first controller is used to control the respective connectivity states of the first high-side switch, the second high-side switch, the first low-side switch and the second low-side switch.

[0043] Of course, the connection states of the first high-side switch, the second high-side switch, the first low-side switch, and the second low-side switch may also be controlled by using a manual button.

[0044] Specifically, the control end of the first controller can be an output end of the first controller, which can send an electrical control signal to the first high-side switch, the second high-side switch, the first low-side switch, and the second low-side switch. The output end of the first controller can include multiple output ends, and one output end can be configured for each switch. The above-mentioned connected state includes two states: switch closed and switch open.

[0045] Optionally, a second controller is configured; a control end of the second controller is connected to the switch to be tested in the matrix switch; the switch to be tested is located between the first node and the second node; the second controller is used to control the connectivity state of the switch to be tested.

[0046] Of course, the connectivity status of the switch to be tested can also be controlled by a manual button.

[0047] Specifically, the control end of the second controller can be an output end of the second controller, and can send a control signal to the switch to be tested in the matrix switch. The connection state of the switch to be tested includes two states: the switch to be tested is closed and the switch to be tested is disconnected. The output end of the second controller can be configured in multiple states, respectively connected to multiple switches to be tested in the matrix switch.

[0048] Optionally, a calculation processor is configured to calculate the path internal resistance between the first switch to be tested and the second switch to be tested by the calculation processor. Of course, the path internal resistance between the first switch to be tested and the second switch to be tested can also be manually calculated based on the electrical parameters obtained by the H-bridge circuit and the measuring element.

[0049] Optionally, the arithmetic processor may connect the first controller and the second controller to determine the switch state, and may also connect a measuring element to determine the internal resistance between the positive terminal and the negative terminal based on different switch states.

[0050] It is understandable that different types of measuring elements can be used to determine the internal resistance between the positive terminal and the negative terminal. For example, the measuring element can be an ohmmeter, the positive pole of the ohmmeter is connected to the positive terminal, and the negative pole of the ohmmeter is connected to the negative terminal, so as to directly determine the internal resistance between the positive terminal and the negative terminal. For another example, see Figure 4 A structural schematic diagram of a measuring element connected to a positive terminal and a negative terminal is shown. The measuring element can be a voltmeter. At the same time, the positive terminal and the negative terminal also need to be connected to an excitation source that provides current. The resistance between the positive terminal and the negative terminal is calculated by the current output by the excitation source and the voltage value obtained by the voltmeter.

[0051] Therefore, there are many possible implementations of the arithmetic processor, which are described in detail below.

[0052] In one possible implementation, see Figure 4 , the measuring element is a voltmeter, the positive terminal and the negative terminal are also connected to an excitation source, and the excitation source is a constant current source; the operation processor is connected to the measuring element; the operation processor is used to: When the switch on the first branch is closed and the first switch is open, the internal resistance of the first branch is calculated according to the voltage value measured by the measuring element and the current value output by the excitation source, and the first switch is a switch other than the switch on the first branch.

[0053] When the switch on the second branch is closed and the second switch is open, the internal resistance of the second branch is calculated based on the voltage value measured by the measuring element and the current value output by the excitation source, and the second switch is a switch other than the switch on the second branch.

[0054] When the first high-side switch, the second low-side switch and the switch to be tested are closed and the third switch is open, the first internal resistance is calculated according to the voltage value measured by the measuring element and the current value output by the excitation source; the switch to be tested is a switch located between the first node and the second node in the matrix switch, and the third switch is a switch other than the first high-side switch, the second low-side switch and the switch to be tested.

[0055] When the second high-side switch, the first low-side switch and the switch to be tested are closed and the fourth switch is open, the second internal resistance is calculated based on the voltage value measured by the measuring element and the current value output by the excitation source, and the fourth switch is a switch other than the second high-side switch, the first low-side switch and the switch to be tested.

[0056] Calculate a first sum of the first branch internal resistance and the second branch internal resistance, and a second sum of the first internal resistance and the second internal resistance, calculate half of the difference between the second sum and the first sum, and obtain the path internal resistance between the first terminal to be measured and the second terminal to be measured.

[0057] It can be understood that the internal resistance between the positive terminal and the negative terminal can be determined by calculating the ratio of the voltage value measured by the voltmeter to the current value output by the constant current source.

[0058] The internal resistance of the first branch is determined by turning on only the first branch in the H-bridge circuit.

[0059] The above-mentioned internal resistance of the second branch is determined by turning on only the second branch in the H-bridge circuit.

[0060] The first internal resistance is the internal resistance determined by turning on only the first high-side switch, the switch to be tested and the second low-side switch.

[0061] The second internal resistance is the internal resistance determined by turning on only the second high-side switch, the switch to be tested and the first low-side switch.

[0062] The first sum value is the sum of the internal resistance of the first branch and the internal resistance of the second branch, that is, the internal resistance of the H-bridge circuit.

[0063] The second sum is the sum of the internal resistance of the H-bridge circuit and twice the internal resistance of the path between the first terminal to be measured and the second terminal to be measured.

[0064] Therefore, the difference between the second sum and the first sum is twice the path internal resistance between the first terminal to be tested and the second terminal to be tested. Further, half of the difference between the second sum and the first sum determines the path internal resistance between the first terminal to be tested and the second terminal to be tested.

[0065] In another possible implementation, the measuring element is an ohmmeter; the operation processor is connected to the measuring element; the operation processor is used to: When the switch on the first branch is closed and the first switch is opened, the internal resistance of the first branch measured by the measuring element is obtained, and the first switch is a switch other than the switch on the first branch.

[0066] When the switch on the second branch is closed and the second switch is open, the internal resistance of the second branch measured by the measuring element is obtained, and the second switch is a switch other than the switch on the second branch.

[0067] When the first high-side switch, the second low-side switch, and the switch to be measured are closed and the third switch is open, the first internal resistance measured by the measuring element is obtained, the switch to be measured is a switch located between the first node and the second node in the matrix switch, and the third switch is a switch other than the first high-side switch, the second low-side switch, and the switch to be measured.

[0068] When the second high-side switch, the first low-side switch and the switch to be tested are closed and the fourth switch is open, the second internal resistance measured by the measuring element is obtained, and the fourth switch is a switch other than the second high-side switch, the first low-side switch and the switch to be tested.

[0069] Calculate a first sum of the first branch internal resistance and the second branch internal resistance, and a second sum of the first internal resistance and the second internal resistance, calculate half of the difference between the second sum and the first sum, and obtain the path internal resistance between the first terminal to be measured and the second terminal to be measured.

[0070] The above implementation method can directly determine the internal resistance between the positive terminal and the negative terminal by using an ohmmeter. The operation processor directly measures the first branch internal resistance, the second branch internal resistance, the first internal resistance and the second internal resistance through the measuring element, and then calculates the path internal resistance between the first terminal to be measured and the second terminal to be measured.

[0071] For example, based on Figure 3 Set up an H-bridge circuit to connect the Xm terminal and Yn terminal in the matrix switch. xmH The internal resistance and the wiring on both sides (including the high-side switch S xmH to V+ and the high-side switch S xmH The sum of the internal resistances from the Xm terminal to the Xm terminal is denoted as R xmH . The low-side switch S xmL The internal resistance and the wiring on both sides (including the low-side switch S xmL to V- and the low-side switch S xmL The sum of the internal resistances from the Xm terminal to the Xm terminal is denoted as R xmL . The high-side switch S ynH The internal resistance and the wiring on both sides (including the high-side switch S ynH to V+ and the high-side switch S ynH The sum of the internal resistances from the terminal (to the Yn terminal) is recorded as R ynH . The low-side switch S ynL The internal resistance and the wiring on both sides (including the low-side switch S ynL to V- and the low-side switch SynL The sum of the internal resistances from the terminal (to the Yn terminal) is recorded as R ynL .

[0072] calculate Figure 3 The internal resistance Rmn of the path between the Xm terminal and the Yn terminal can be calculated by: Step A1: Close the high-side switch S xmH and the low-side switch S xmL , other switches are disconnected, wherein other switches include except the high-side switch S xmH and the low-side switch S xmL Other than the switch.

[0073] Determine the resistance between the positive terminal V+ and the negative terminal V- based on the measuring element: R xm =R xmH +R xmL .

[0074] Step A2: Close the high-side switch S ynH and the low-side switch S ynL , other switches are disconnected, wherein other switches include except the high-side switch S ynH and the low-side switch S ynL Other than the switch.

[0075] Determine the resistance between the positive terminal V+ and the negative terminal V- based on the measuring element: R yn =R ynH +R ynL .

[0076] Step A3: Close the high-side switch S xmH , low side switch S ynL and the switch K to be tested located between the first node and the second node in the matrix switch mn , other switches are disconnected, wherein other switches include except the high-side switch S xmH , low side switch S ynL And the switch under test K mn Other than the switch.

[0077] Determine the resistance between the positive terminal V+ and the negative terminal V- based on the measurement element: R xmyn =R xmH +R mn +R ynL .

[0078] Step A4: Close the low-side switch S xmL , high side switch S ynH and the switch K to be tested located between the first node and the second node in the matrix switch mn , other switches are disconnected, wherein other switches include except the low-side switch SxmL , high side switch S ynH And the switch under test K mn Other than the switch.

[0079] Determine the resistance between the positive terminal V+ and the negative terminal V- based on the measurement element: R ynxm =R xmL +R mn +R ynH .

[0080] Step A5: Based on the above steps A1-A4, the internal resistance of the path between the Xm terminal and the Yn terminal is: R mn =(R xmyn +R ynxm -R xm -R yn ) / 2.

[0081] Based on the above embodiments, Figure 3 In the figure, an H-bridge circuit connects a column terminal (Xm terminal) and a row terminal (Yn terminal) in the matrix switch to determine the path internal resistance between a row terminal and a column terminal. Similarly, when the H-bridge circuit connects two column terminals or two row terminals in the matrix switch, the calculation method for determining the path internal resistance between the two column terminals or two row terminals is the same.

[0082] Exemplary, determine Figure 1 In the figure, the internal resistance of the path between the Xe terminal and the Xf terminal connected by a row of Yi, where the value ranges of e and f are both [1, m], and the value range of i is [1, n]. The specific steps are: The high-side switch S xeH The internal resistance and the wiring on both sides (including the high-side switch S xeH to V+ and the high-side switch S xeH The sum of the internal resistances from the Xe terminal to the Xe terminal is denoted as R xeH . The low-side switch S xeL The internal resistance and the wiring on both sides (including the low-side switch S xeL to V- and the low-side switch S xeL The sum of the internal resistances from the Xe terminal to the Xe terminal is denoted as R xeL . The high-side switch S xfH The internal resistance and the wiring on both sides (including the high-side switch S xfH to V+ and the high-side switch S xfH The sum of the internal resistances from the Xf terminal to the xfH . The low-side switch S xfL The internal resistance and the wiring on both sides (including the low-side switch S xfL to V- and the low-side switch S xfL The sum of the internal resistances from the Xf terminal to thexfL The internal resistance of the path between the Xe terminal and the Xf terminal connected by a line is recorded as R i ef .

[0083] Step B1: Close the high-side switch S xeH and the low-side switch S xeL , other switches are disconnected, wherein other switches include except the high-side switch S xeH and the low-side switch S xeL Other than the switch.

[0084] Determine the resistance between the positive terminal V+ and the negative terminal V- based on the measuring element: R xe =R xeH +R xeL .

[0085] Step B2: Close the high-side switch S xfH and the low-side switch S xfL , other switches are disconnected, wherein other switches include except the high-side switch S xfH and the low-side switch S xfL Other than the switch.

[0086] Determine the resistance between the positive terminal V+ and the negative terminal V- based on the measuring element: R xf =R xfH +R xfL .

[0087] Step B3: Close the high-side switch S xeH , low side switch S xfL The switch K to be tested is located between the first node (Xe terminal) and the second node (Xf terminal) in the matrix switch. ei And the switch under test K fi , other switches are disconnected, wherein other switches include except the high-side switch S xeH , low side switch S xfL And the switch under test K ei And the switch under test K fi Other than the switch.

[0088] Determine the resistance between the positive terminal V+ and the negative terminal V- based on the measurement element: R i xexf =R xeH +R i ef +R xfL .

[0089] Step B4: Close the low-side switch S xeL , high side switch S xfHand the switch K to be tested located between the first node and the second node in the matrix switch ei And the switch under test K fi , other switches are disconnected, wherein other switches include except the low-side switch S xeL , high side switch S xfH And the switch under test K ei and K fi Other than the switch.

[0090] Determine the resistance between the positive terminal V+ and the negative terminal V- based on the measurement element: R i xfxe =R xeL +R i ef +R xfH .

[0091] Step B5: Based on the above steps B1-B4, the internal resistance of the path between the Xe terminal and the Xf terminal connected through a row Yi is: R i ef = (R i xexf +R i xfxe -R xe -R xf ) / 2.

[0092] The switch K under test ei is the switch in the row i of the e-th column in the matrix switch, and the switch to be tested K fi is the switch in the fth column and the i-th row in the matrix switch.

[0093] Based on the above embodiment, when determining the path internal resistance between different terminals of the matrix switch, the H-bridge circuit can be configured separately for determination. For example, when applied to an automated test scenario, the matrix switch can realize arbitrary combination switching between multiple input signals and multiple output signals, but when connecting different terminals, the path internal resistance will also be different due to the difference in routing length and switch internal resistance. Therefore, when connecting different terminals during testing, even if the input signals are the same, the corresponding output signals may also be different. Therefore, accurately determining the path internal resistance between the terminals to compensate for the automated test can improve the accuracy of the automated test.

[0094] Based on the above problems, multiple H-bridge circuits can be configured for multiple terminals on the matrix switch involved in the automated test, and the positive terminals of the multiple H-bridge circuits are the same positive terminal, and the negative terminals of the multiple H-bridge circuits are the same negative terminal. Specifically, each terminal is connected to the positive terminal through a high-side switch and to the negative terminal through a low-side switch. From the positive terminal to the negative terminal, the high-side switch and the low-side switch are connected in sequence in the middle to form a branch in the H-bridge circuit connected to the terminal. The branch can be combined with a branch connected to any other terminal to form an H-bridge circuit. To connect the measuring element to the positive terminal and the negative terminal, it is only necessary to coordinate the connection state of the switch on the H-bridge circuit and the switch on the matrix switch, based on the electrical parameters obtained by the measuring element, to calculate and determine the path internal resistance between any two terminals of the above-mentioned multiple terminals.

[0095] For example, see Figure 5 The structure diagram of a matrix switch configuration H-bridge circuit is shown. A branch can be set for each row terminal in the matrix switch, and a branch can also be set for each column terminal. The specific structure is as follows: The matrix switch is a matrix switch of N rows×M columns. Figure 5 In the embodiment, the N rows may include a plurality of row terminals from Y1, Y2, Y3, ..., Yn-1, Yn, and the M columns may include a plurality of column terminals from X1, X2, X3, ..., Xm-1, Xm.

[0096] A system for measuring the internal resistance of a matrix switch path may include M+N branches; Each of the M columns has a column terminal, and nodes arranged between the high-side switch and the low-side switch in M ​​of the M+N branches are connected to the M column terminals included in the M columns in a one-to-one correspondence.

[0097] For example, see Figure 5 In the multiple column terminals X1, X2, X3...Xm-1, Xm, each column terminal is connected through a high-side switch (such as Figure 5 In the example, each column terminal corresponding to X1, X2, X3, ..., Xm is provided with a high-side switch S x1H , S x2H , S x3H ……S xmH ) is connected to the positive terminal, and each column terminal is connected through a low-side switch (such as Figure 5 Each column terminal corresponding to X1, X2, X3...Xm is provided with a low-side switch S x1L , S x2L , S x3L ……S xmL ) to the negative terminal.

[0098] Each of the N rows has a row terminal, and nodes arranged between the high-side switch and the low-side switch in N branches of the M+N branches are connected to the N row terminals included in the N rows in a one-to-one correspondence.

[0099] For example, see Figure 5 In the multiple row terminals Y1, Y2, Y3...Yn-1, Yn, each row terminal is connected through a high-side switch (such as Figure 5 Each row terminal in Y1, Y2, Y3...Yn is provided with a high-side switch S y1H , S y2H , S y3H ……S ynH ) is connected to the positive terminal, and each row terminal is connected through a low-side switch (such as Figure 5 Each row terminal in Y1, Y2, Y3, ..., Yn is provided with a low-side switch S y1L , S y2L , S y3L ……S ynL ) to the negative terminal.

[0100] One end of the M+N branches is commonly connected to the positive terminal V+, and the other end is commonly connected to the negative terminal V-. Any two of the M+N branches serve as the first branch and the second branch of an H-bridge circuit.

[0101] One end of the M+N branches is commonly connected to the positive terminal V+, and the other end is commonly connected to the negative terminal V-. In this way, a measurement element can be configured at the positive terminal and the negative terminal to determine the path internal resistance between multiple pairs of terminals. Of course, the positive terminal and the negative terminal can also be set separately for each H-bridge circuit.

[0102] Both the high-side switch and the low-side switch mentioned above can be selected to use relay switches, which can have better isolation.

[0103] The above are some specific implementation methods of a system for measuring the internal resistance of a matrix switch path provided in an embodiment of the present application. Based on this, the present application also provides a corresponding method.

[0104] See also Figure 6 A flow chart of a method for measuring the internal resistance of a matrix switch path is shown, and a method for measuring the internal resistance of a matrix switch path is applied to a system for measuring the internal resistance of a matrix switch path according to any one of claims 1 to 8, and the method comprises: S601, controlling a switch on a first branch to close, controlling a first switch to open, and determining a first branch internal resistance between a positive terminal and a negative terminal, wherein the first switch is a switch other than the switch on the first branch.

[0105] The first switch is disconnected to ensure that the current between the positive terminal and the negative terminal flows entirely through the first branch, so that the resistance on the first branch can be determined from the positive terminal and the negative terminal by measuring the element. The first switch can be a matrix switch and all other switches in the H-bridge circuit except the switch on the first branch.

[0106] S602, controlling the switch on the second branch to close, controlling the second switch to open, and determining the second branch internal resistance between the positive terminal and the negative terminal, wherein the second switch is a switch other than the switch on the second branch.

[0107] The second switch is disconnected to ensure that the current between the positive terminal and the negative terminal flows entirely through the second branch, so that the resistance on the second branch can be determined from the positive terminal and the negative terminal by measuring the element. The second switch can be a matrix switch and all other switches in the H-bridge circuit except the switch on the second branch.

[0108] Step S603, controlling the first high-side switch, the second low-side switch and the switch to be tested to be closed, controlling the third switch to be opened, and determining a first internal resistance between the positive terminal and the negative terminal, wherein the switch to be tested is a switch located between the first node and the second node in the matrix switch, and the third switch is a switch other than the first high-side switch, the second low-side switch and the switch to be tested.

[0109] The third switch is disconnected to ensure that the current between the positive terminal and the negative terminal all flows through the first high-side switch, the second low-side switch and the switch to be tested. The third switch can be all switches in the matrix switch and the H-bridge circuit except the first high-side switch, the second low-side switch and the switch to be tested. The switch to be tested in step S603 is all switches in the matrix switch through which the current at the positive terminal and the negative terminal flows after the third switch is disconnected.

[0110] S604, controlling the second high-side switch, the first low-side switch and the switch to be tested to close, controlling the fourth switch to open, and determining a second internal resistance between the positive terminal and the negative terminal, wherein the fourth switch is a switch other than the second high-side switch, the first low-side switch and the switch to be tested.

[0111] The fourth switch is disconnected to ensure that all currents between the positive terminal and the negative terminal flow through the second high-side switch, the first low-side switch and the switch to be tested. The third switch can be a matrix switch and all other switches in the H-bridge circuit except the second high-side switch, the first low-side switch and the switch to be tested. The switches to be tested in step S604 are all switches in the matrix switch through which the currents at the positive terminal and the negative terminal flow after the fourth switch is disconnected.

[0112] S605. Calculate a first sum of the first branch internal resistance and the second branch internal resistance, and a second sum of the first internal resistance and the second internal resistance, and calculate half of the difference between the second sum and the first sum to obtain the path internal resistance between the first terminal to be measured and the second terminal to be measured.

[0113] Based on the above steps S601-S605, it can be known that by connecting the H-bridge circuit and the measuring element, the path internal resistance between any two terminals in the matrix switch can be accurately determined, thereby facilitating compensation based on the determined path internal resistance when performing automated testing through the matrix switch to obtain accurate measurement results.

[0114] Optionally, the step of determining the internal resistance between the positive terminal and the negative terminal includes: Connecting the positive electrode of the excitation source to the positive terminal, and connecting the negative electrode of the excitation source to the negative terminal; Connect the positive pole of the voltmeter to the positive terminal, and the negative pole of the voltmeter to the negative terminal; Collecting the voltage value between the positive terminal and the negative terminal by the voltmeter; The resistance between the positive terminal and the negative terminal is calculated according to the voltage value and the current value output by the excitation source.

[0115] In one specific example, see Figure 5 , determine the path resistance R between the X1 endpoint and the Y2 endpoint 12 , the specific steps can be: First, use an adjustable constant current source as the excitation source, connect the positive pole of the excitation source to the positive terminal, and the negative pole of the excitation source to the negative terminal. Use a high-precision voltmeter as the measuring element, connect the positive pole of the voltmeter to the positive terminal, and the negative pole of the voltmeter to the negative terminal. Set the current of the constant current source .

[0116] Then, close Figure 5 Medium S x1H and S x1L , Figure 5 The other switches are open, and the voltage read by the voltmeter is 0.5 millivolts. Calculate R x1 0.5 divided by 5 equals 0.1 ohms.

[0117] closure Figure 5 Medium S y2H and S y2L , Figure 5 The other switches are open, and the voltage read by the voltmeter is 0.6 mV. Calculate R y2 0.6 divided by 5 equals 0.12 ohms.

[0118] closure Figure 5 Medium Sx1H , K 12 and S y2L , Figure 5 The other switches are open, and the voltage read by the voltmeter is 1 millivolt. Calculate R x1y2 1 divided by 5 equals 0.2 ohms.

[0119] closure Figure 5 Medium S x1L , K 12 and S y2H , Figure 5 The other switches are open, and the voltage read by the voltmeter is 1.1 mV. Calculate R y2x1 1.1 divided by 5 equals 0.22 ohms.

[0120] Finally, calculate the path resistance R between the X1 terminal and the Y2 terminal 12 =(R x1y2 +R y2x1 -R y2 -R x1 ) / 2=0.1 ohm.

[0121] In another specific example, see Figure 5 , determine the internal resistance R of the path between the X1 terminal and the X2 terminal connected through the Y3 line 3 12 , the specific steps can be: First, use an adjustable constant current source as the excitation source, connect the positive pole of the excitation source to the positive terminal, and the negative pole of the excitation source to the negative terminal. Use a high-precision voltmeter as the measuring element, connect the positive pole of the voltmeter to the positive terminal, and the negative pole of the voltmeter to the negative terminal. Set the current of the constant current source .

[0122] Then, close Figure 5 Medium S x1H and S x1L , Figure 5 The other switches are open, and the voltage read by the voltmeter is 0.5 millivolts. Calculate R x1 0.5 divided by 5 equals 0.1 ohms.

[0123] closure Figure 5 Medium S x2H and S x2L , Figure 5 The other switches are open, and the voltage read by the voltmeter is 0.6 mV. Calculate R x2 0.6 divided by 5 equals 0.12 ohms.

[0124] closure Figure 5 Medium S x1H , K 13 , K 23 and Sx2L , Figure 5 The other switches are open, and the voltage read by the voltmeter is 1.2 mV. Calculate R 3 x1x2 1.2 divided by 5 equals 0.24 ohms.

[0125] closure Figure 5 Medium S x1L , K 13 , K 23 and S x2H , Figure 5 The other switches are open, and the voltage read by the voltmeter is 1.3 mV. Calculate R 3 x2x1 1.3 divided by 5 equals 0.26 ohms.

[0126] Finally, calculate the path resistance R between the X1 terminal and the Y2 terminal 3 12 =(R 3 x2x1 +R 3 x1x2 -R x2 -R x1 ) / 2=0.14 ohms.

[0127] Optionally, the step of determining the internal resistance between the positive terminal and the negative terminal includes: Connect the positive pole of the ohmmeter to the positive terminal, connect the negative pole of the ohmmeter to the negative terminal, and obtain the internal resistance between the positive terminal and the negative terminal through the ohmmeter.

[0128] Based on the above-mentioned matrix switch path internal resistance measurement system and method, combined with Figure 5 By setting the topology of the H-bridge circuit for the matrix switch, the path internal resistance between any two endpoints in the matrix switch can be accurately determined. Especially when applied to automated testing, certain compensation can be made for the paths involved in the test to obtain more accurate test results. In addition, during automated testing, by controlling the connection status of the matrix switch and the switches in the H-bridge circuit, real-time measurement of the path internal resistance between any two terminals in the entire matrix switch can be achieved, which is no longer affected by the change in the internal resistance of the relay switch. The path internal resistance data can also be recorded, and the change trend of the path internal resistance can be specifically analyzed to predict the service life of the switch.

[0129] The embodiments of the present application also provide corresponding devices and computer storage media for implementing the solutions provided by the embodiments of the present application.

[0130] The device includes a memory and a processor, the memory is used to store instructions or codes, and the processor is used to execute the instructions or codes so that the device executes a method for measuring the internal resistance of a matrix switch path described in any embodiment of the present application.

[0131] The computer storage medium stores codes, and when the codes are executed, a device executing the codes implements a method for measuring the internal resistance of a matrix switch path as described in any embodiment of the present application.

[0132] The "first" and "second" in the names such as "first" and "second" (if any) mentioned in the embodiments of the present application are only used as name identifiers and do not represent the first or second in order.

[0133] Through the description of the above implementation methods, it can be known that those skilled in the art can clearly understand that all or part of the steps in the above-mentioned embodiment method can be implemented by means of software plus a general hardware platform. Based on such an understanding, the technical solution of the present application can be embodied in the form of a software product, and the computer software product can be stored in a storage medium, such as a read-only memory (ROM) / RAM, a disk, an optical disk, etc., including a number of instructions for a computer device (which can be a personal computer, a server, or a network communication device such as a router) to execute the methods described in each embodiment of the present application or some parts of the embodiments.

[0134] Each embodiment in this specification is described in a progressive manner, and the same or similar parts between the embodiments can be referred to each other, and each embodiment focuses on the differences from other embodiments. In particular, for the method embodiment, since it is basically similar to the system embodiment, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiment. Some or all of the modules can be selected according to actual needs to achieve the purpose of the scheme of this embodiment. Ordinary technicians in this field can understand and implement it without paying creative work.

[0135] The above description is merely an exemplary embodiment of the present application and is not intended to limit the protection scope of the present application.

Claims

1. A system for measuring the internal resistance of a matrix switch path, characterized in that: One or more H-bridge circuits are included; the H-bridge circuit includes a first branch and a second branch, the first branch and the second branch are both connected to the positive terminal and the negative terminal of the H-bridge circuit; the first branch is provided with a first high-side switch and a first low-side switch, and the second branch is provided with a second high-side switch and a second low-side switch; A first node between the first high-side switch and the first low-side switch is used to connect a first terminal to be tested in the matrix switch; A second node between the second high-side switch and the second low-side switch is used to connect a second terminal to be tested in the matrix switch; Two ends of the measuring element are connected to the positive terminal and the negative terminal respectively, and are used to determine the internal resistance of the path between the first terminal to be measured and the second terminal to be measured.

2. The system according to claim 1, characterized in that Each column of the matrix switch has a column terminal, and each row has a row terminal; The first node is connected to a column terminal as the first terminal to be tested, and the second node is connected to a row terminal as the second terminal to be tested; Or, the first node is connected to a column terminal as the first terminal to be tested, and the second node is connected to a column terminal as the second terminal to be tested; Alternatively, the first node is connected to a row terminal as the first terminal to be tested, and the second node is connected to a row terminal as the second terminal to be tested.

3. The system according to claim 2, characterized in that Also included is a first controller; The control end of the first controller is connected to the first high-side switch, the second high-side switch, the first low-side switch and the second low-side switch; The first controller is used to control the connection state of each of the first high-side switch, the second high-side switch, the first low-side switch, and the second low-side switch.

4. The system according to claim 2 or 3, characterized in that: Also included is a second controller; The control end of the second controller is connected to the switch to be tested in the matrix switch; the switch to be tested is located between the first node and the second node; The second controller is used to control the connection state of the switch to be tested.

5. The system according to claim 4, characterized in that It also includes an operation processor; the measuring element is a voltmeter, the positive terminal and the negative terminal are also connected to an excitation source, and the excitation source is a constant current source; the operation processor is connected to the measuring element; The computing processor is used for: When the switch on the first branch is closed and the first switch is open, the internal resistance of the first branch is calculated according to the voltage value measured by the measuring element and the current value output by the excitation source, and the first switch is a switch other than the switch on the first branch; When the switch on the second branch is closed and the second switch is open, the internal resistance of the second branch is calculated according to the voltage value measured by the measuring element and the current value output by the excitation source, and the second switch is a switch other than the switch on the second branch; When the first high-side switch, the second low-side switch and the switch to be tested are closed and the third switch is open, a first internal resistance is calculated according to the voltage value measured by the measuring element and the current value output by the excitation source; the switch to be tested is a switch located between the first node and the second node in the matrix switch, and the third switch is a switch other than the first high-side switch, the second low-side switch and the switch to be tested; When the second high-side switch, the first low-side switch and the switch to be tested are closed and the fourth switch is open, a second internal resistance is calculated according to the voltage value measured by the measuring element and the current value output by the excitation source, and the fourth switch is a switch other than the second high-side switch, the first low-side switch and the switch to be tested; Calculate a first sum of the first branch internal resistance and the second branch internal resistance, and a second sum of the first internal resistance and the second internal resistance, calculate half of the difference between the second sum and the first sum, and obtain the path internal resistance between the first terminal to be measured and the second terminal to be measured.

6. The system according to claim 4, characterized in that It also includes an operation processor; the measuring element is an ohmmeter; the operation processor is connected to the measuring element; The computing processor is used for: When the switch on the first branch is closed and the first switch is open, obtaining the first branch internal resistance measured by the measuring element, wherein the first switch is a switch other than the switch on the first branch; When the switch on the second branch is closed and the second switch is open, obtaining the internal resistance of the second branch measured by the measuring element, wherein the second switch is a switch other than the switch on the second branch; When the first high-side switch, the second low-side switch, and the switch to be measured are closed and the third switch is open, obtaining a first internal resistance measured by the measuring element, wherein the switch to be measured is a switch located between the first node and the second node in the matrix switch, and the third switch is a switch other than the first high-side switch, the second low-side switch, and the switch to be measured; When the second high-side switch, the first low-side switch, and the switch to be tested are closed and the fourth switch is open, obtaining a second internal resistance measured by the measuring element, wherein the fourth switch is a switch other than the second high-side switch, the first low-side switch, and the switch to be tested; Calculate a first sum of the first branch internal resistance and the second branch internal resistance, and a second sum of the first internal resistance and the second internal resistance, calculate half of the difference between the second sum and the first sum, and obtain the path internal resistance between the first terminal to be measured and the second terminal to be measured.

7. The system according to claim 4, characterized in that The matrix switch is a matrix switch of N rows×M columns, and the system includes M+N branches; Each of the M columns has a column terminal, and nodes disposed between the high-side switch and the low-side switch in M ​​of the M+N branches are connected one-to-one with the M column terminals included in the M columns; Each of the N rows has a row terminal, and nodes disposed between the high-side switch and the low-side switch in N of the M+N branches are connected one-to-one with the N row terminals included in the N rows; One end of the M+N branches is commonly connected to the positive terminal, and the other end is commonly connected to the negative terminal; Among the M+N branches, any two branches serve as the first branch and the second branch in an H-bridge circuit.

8. The system according to claim 7, characterized in that The first high-side switch, the second high-side switch, the first low-side switch, and the second low-side switch are all relay switches.

9. A method for measuring the internal resistance of a matrix switch path, characterized in that: A system for measuring internal resistance of a matrix switch path according to any one of claims 1 to 8, the method comprising: Controlling the switch on the first branch to close, controlling the first switch to open, and determining the first branch internal resistance between the positive terminal and the negative terminal, wherein the first switch is a switch other than the switch on the first branch; Controlling the switch on the second branch to close, controlling the second switch to open, and determining the internal resistance of the second branch between the positive terminal and the negative terminal, wherein the second switch is a switch other than the switch on the second branch; Controlling the first high-side switch, the second low-side switch and the switch to be tested to be closed, controlling the third switch to be opened, and determining a first internal resistance between the positive terminal and the negative terminal, wherein the switch to be tested is a switch located between the first node and the second node in the matrix switch, and the third switch is a switch other than the first high-side switch, the second low-side switch and the switch to be tested; Control the second high-side switch, the first low-side switch and the switch to be tested to close, control the fourth switch to open, and determine the second internal resistance between the positive terminal and the negative terminal, wherein the fourth switch is a switch other than the second high-side switch, the first low-side switch and the switch to be tested; Calculate a first sum of the first branch internal resistance and the second branch internal resistance, and a second sum of the first internal resistance and the second internal resistance, calculate half of the difference between the second sum and the first sum, and obtain the path internal resistance between the first terminal to be measured and the second terminal to be measured.

10. The method according to claim 9, characterized in that The step of determining the internal resistance between the positive terminal and the negative terminal comprises: Connecting the positive electrode of the excitation source to the positive terminal, and connecting the negative electrode of the excitation source to the negative terminal; Connect the positive pole of the voltmeter to the positive terminal, and the negative pole of the voltmeter to the negative terminal; Collecting the voltage value between the positive terminal and the negative terminal by the voltmeter; The resistance between the positive terminal and the negative terminal is calculated according to the voltage value and the current value output by the excitation source.

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