Method and device for generating system performance defect solution and electronic equipment
By labeling and reverse indexes of the performance test data of the business system, the defect solution set is generated, and the time -consuming and effectiveness of the dependence of professional capabilities in existing technology has been solved, and the efficiency and efficiency of defect solutions are improved.
CN119377071APending Publication Date: 2025-01-28中国邮政储蓄银行股份有限公司
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Patent Information
- Application Number
- CN202411531848.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-30
- Publication Date
- 2025-01-28
AI Technical Summary
Technical Problem
The prior art relies on the professional capabilities of developers and performance testers and proficiency in the system in the process of solving business system defects, resulting in time-consuming and labor-consuming.
Method used
By obtaining the performance testing data of the test system, the labelization processing generates defect labels, determines the level and frequency of the label, and indexed the historical experience library based on these labels to generate defect solutions.
Benefits of technology
Reduced dependence on professional ability, improved the efficiency and efficiency of defect solution, and reduced time and effort.
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure CN119377071A_ABST
Abstract
The invention provides a method and device for generating a system performance defect solution and electronic equipment. The method comprises the following steps: acquiring performance test data of a tested system, labeling the performance test data, generating various defect tags of the tested system, determining defect levels and occurrence frequencies of the defect tags, and determining defect weights of the defect tags according to the defect levels and the occurrence frequencies of the defect tags; and according to the various defect labels and the defect weights corresponding to the various defect labels, inversely indexing to a historical experience library, and generating a defect solution set of the tested system. The performance test data of the tested system is subjected to tagging processing, and the generated tag is reversely indexed to the historical experience library to determine the defect solution of the tested system. The problem that time and labor are consumed due to the fact that a business system defect solving process in the prior art depends on the professional ability of developers and performance testers and the proficiency of the system is solved.
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