Imaging performance evaluation device and method after irradiation of photoelectric imaging system

Abstract

The invention relates to a device and a method for evaluating the performance of a photoelectronic imaging system, in particular to a device and a method for evaluating the imaging performance of a photoelectronic imaging system after irradiation, and solves the technical problem that the existing device for evaluating the performance of the photoelectronic imaging system is difficult to directly reflect the imaging performance of the photoelectronic imaging system after irradiation. According to the device for evaluating the imaging performance of the irradiated photoelectric imaging system, provided by the invention, the imaging performance of the irradiated photoelectric imaging system to be tested is evaluated by taking an image in a test graphic card, an imaging graphic library, a scene video library or a star simulator as a background; the evaluation of the imaging performance of the photoelectric imaging system in various complex scenes, static or dynamic scenes can be realized, and the system is simple and high in accuracy. The invention further provides a method for evaluating the imaging performance of the photoelectronic imaging system after irradiation, the star simulator, the test graphic card or the display is selected according to the evaluation requirement of the photoelectronic imaging system to be tested to provide a test image, and the applicability is high.

Description

Technical Field

[0001] The present invention relates to a device and method for evaluating the performance of a photoelectric imaging system, and in particular to a device and method for evaluating the imaging performance of a photoelectric imaging system after irradiation. Background Art

[0002] Optoelectronic imaging systems based on CCD or CMOS image sensors (mainly including star sensors, surveillance imaging systems, detection systems, etc.) are widely used in radiation environment fields such as satellite attitude measurement, remote sensing imaging, reactor operation status monitoring, and spent fuel pool monitoring. However, when applied to the above fields, they will be affected by the cumulative irradiation effect of radiation particles or rays (mainly including total dose effect and displacement effect), resulting in serious degradation of device performance or functional failure. Therefore, it is of great significance to accurately evaluate the impact of radiation damage on the performance of optoelectronic imaging systems.

[0003] At present, research work on radiation damage of optoelectronic imaging systems has been carried out both at home and abroad, and measurement devices and methods for radiation-sensitive parameters of optoelectronic imaging systems after irradiation have been gradually established. For example, patent CN106872142A, whose applicant is the Northwest Institute of Nuclear Technology, discloses a method for measuring image retention after proton irradiation of CMOS image sensors, and patent CN106998466A, whose applicant is the Xinjiang Institute of Physics and Technology of the Chinese Academy of Sciences, discloses a method for testing the full well of complementary metal oxide semiconductor active pixel sensors after irradiation. However, the above methods are mainly used to measure the sensitive parameters of the core imaging devices of optoelectronic imaging systems after irradiation, and cannot directly reflect the imaging performance of optoelectronic imaging systems. Summary of the invention

[0004] The purpose of the present invention is to solve the technical problem that the existing photoelectric imaging system performance evaluation device is difficult to directly reflect the imaging performance of the photoelectric imaging system after irradiation, and to provide a device and method for evaluating the imaging performance of the photoelectric imaging system after irradiation.

[0005] To achieve the above object, the technical solution adopted by the present invention is:

[0006] A device for evaluating the imaging performance of an optoelectronic imaging system after irradiation, which is special in that it comprises a control unit, a dark box, and a first mobile platform arranged in the dark box for mounting the optoelectronic imaging system to be tested, wherein the first mobile platform and the optoelectronic imaging system to be tested are both electrically connected to the control unit;

[0007] The dark box is provided with a test unit for providing a test image, the test unit being a first test unit, a second test unit or a third test unit, and the first test unit, the second test unit or the third test unit being located within the field of view of the photoelectric imaging system to be tested during evaluation;

[0008] The first test unit is used to quantitatively evaluate the imaging performance, and includes a standard light source color matching light box and a test chart. The standard light source color matching light box is fixed to the bottom of the dark box through a light box support, and the angle between the standard light source color matching light box and the light box support is 45°; the test chart is vertically fixed to the light box support through a test chart support plate, and is located in the standard light source color matching light box; the standard light source color matching light box is used to illuminate the test chart, and the test chart is used to provide a test image;

[0009] The second test unit is used to evaluate the imaging performance in a specific scene, including a display fixed to the bottom of the dark box, the display is electrically connected to the control unit, the control unit has a built-in imaging gallery and a scene video gallery, and the display displays images in the imaging gallery and the scene video gallery under the control of the control unit;

[0010] The third test unit is used to evaluate the positioning accuracy and limit star of the star sensor, and includes a second mobile platform fixed to the bottom of the dark box, and a star simulator installed on the second mobile platform. The second mobile platform and the star simulator are both electrically connected to the control unit, and the star simulator is used to simulate a star map under the control of the control unit.

[0011] Furthermore, it also includes an optical power meter arranged in the dark box, and the optical power meter is used to measure the light intensity in the dark box.

[0012] Furthermore, it also includes an optical platform for reducing external vibration, and the dark box is arranged on the optical platform.

[0013] Furthermore, the test chart has a magnetic attraction component, and the test chart support plate is made of an iron-based composite material with a warping degree of less than 1% and a flatness of less than 0.2 mm;

[0014] The star simulator is a dynamic star simulator, with a resolution greater than or equal to 2K×2K and a refresh frequency greater than or equal to 10 Hz.

[0015] Furthermore, the test chart includes a standard 24-color test chart, a lens resolution test chart, and a grayscale test chart;

[0016] The imaging library includes typical satellite images, space station images, lunar images, Mars images, remote sensing images, reactor interior images and fuel rod images, and the scene video library includes simulated scene videos and real scene videos;

[0017] The photoelectric imaging system to be tested is powered by a direct current power supply 13 .

[0018] The present invention also provides a method for evaluating the imaging performance of a photoelectric imaging system after irradiation, which is based on the above-mentioned device for evaluating the imaging performance of a photoelectric imaging system after irradiation, and is special in that it includes the following steps:

[0019] Step 1, placing the photoelectric imaging system to be tested or its core imaging device in an irradiation environment, stopping the irradiation when it reaches a set cumulative irradiation injection or dose, and then installing the photoelectric imaging system to be tested on a first mobile platform and electrically connecting it to a control unit;

[0020] Step 2: According to the evaluation requirements of the optoelectronic imaging system to be tested, select a test unit that provides a test image and install it in the dark box; specifically:

[0021] If it is required to quantitatively evaluate the imaging performance of the optoelectronic imaging system to be tested, the first test unit is installed in the dark box and step 3 is performed;

[0022] If it is required to evaluate the imaging performance of the optoelectronic imaging system to be tested in a specific scenario, the second test unit is installed in the dark box, and the display is electrically connected to the control unit, and then step 4 is performed;

[0023] If it is required to evaluate the positioning accuracy and limit star of the star sensor in the photoelectric imaging system to be tested, the third test unit is installed in the dark box, and the star simulator and the second mobile platform are electrically connected to the control unit respectively, and then step 5 is performed;

[0024] Step 3, turn on the standard light source color matching light box so that the light beam emitted by it illuminates the test chart, and then the control unit adjusts the first mobile platform and turns on the photoelectric imaging system to be tested for real-time imaging, so that the imaging image of the test chart is located at the center of the field of view of the photoelectric imaging system to be tested, and executes step 6;

[0025] Step 4, the control unit controls the display to display the images in the imaging gallery or the scene video gallery, then adjusts the first mobile platform and turns on the optoelectronic imaging system to be tested for real-time imaging, so that the image image in the imaging gallery or the scene video gallery displayed on the display is located at the center of the field of view of the optoelectronic imaging system to be tested, and executes step 6;

[0026] Step 5, the control unit controls the star simulator to simulate a star map, and then adjusts the first mobile platform and the second mobile platform respectively and turns on the photoelectric imaging system to be tested for real-time imaging, until the star map imaging image in the star simulator is located at the center of the field of view of the photoelectric imaging system to be tested, and then executes step 6;

[0027] Step 6, performing light shielding treatment on the photoelectric imaging system to be tested, and then allowing the photoelectric imaging system to be tested to continuously collect images for system warm-up, until the grayscale value of the image output by the photoelectric imaging system to be tested is stable, and then removing the light shielding of the photoelectric imaging system to be tested, and entering the imaging performance evaluation stage;

[0028] Step 7: The photoelectric imaging system to be tested continues to collect images, and stops collecting images when the number of images to be collected meets the test requirements. The control unit analyzes the output images of the photoelectric imaging system to be tested, and then evaluates the imaging performance of the photoelectric imaging system to be tested based on the parameters obtained from the analysis.

[0029] Furthermore, in step 6, the gray value stability of the output image of the photoelectric imaging system to be tested refers to:

[0030] The average grayscale change value of the output image of the photoelectric imaging system to be tested is less than 1% within two consecutive minutes;

[0031] The average gray value of each frame Calculated by the following formula:

[0032]

[0033] Among them, m and n are the horizontal and vertical coordinates of the pixel points of the output image of the photoelectric imaging system to be tested, M and N are the maximum number of rows and columns of the pixel points of the photoelectric imaging system to be tested, and μ y,dark [m][n] is the grayscale value of the pixel with coordinates (m, n) in the photoelectric imaging system to be tested.

[0034] Furthermore, in step 7, the parameters obtained by the analysis are specifically:

[0035] If it is required to quantitatively evaluate the imaging performance of the optoelectronic imaging system to be tested or to evaluate the imaging performance of the optoelectronic imaging system to be tested in a specific scenario, the parameters obtained by analysis include the resolution, transfer function, dynamic range, uniformity and noise of the output image;

[0036] If it is required to evaluate the positioning accuracy and limiting star of the star sensor in the photoelectric imaging system to be tested, the parameters obtained by analysis include the coordinates of the centroid of the star point and the dynamic range; the coordinates of the centroid of the star point (x0, y0) are calculated by the following formula:

[0037]

[0038] Wherein, (M0, N0) and (M1, N1) are the image vertices of the local area containing the star point in the output image of the photoelectric imaging system to be tested, μ(x, y) is the gray value of the pixel point with coordinates (x, y) in the photoelectric imaging system to be tested; μ th is the background noise threshold of the photoelectric imaging system to be tested after irradiation.

[0039] Furthermore, in step 1, the irradiation environment is proton irradiation, neutron irradiation, heavy ion irradiation, electron irradiation or gamma ray irradiation.

[0040] Furthermore, in step 6, the shading method is: using shading paper or a lens cover to shading.

[0041] Compared with the prior art, the present invention has the following beneficial technical effects:

[0042] The imaging performance evaluation device for the photoelectric imaging system after irradiation provided by the present invention uses the test chart, imaging library, scene video library and images in the star simulator as the background, and can evaluate the imaging performance of the photoelectric imaging system to be tested after irradiation in a variety of complex scenes, static or dynamic scenes. The system is simple and has high accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] Figure 1 Schematic diagrams of the structure of the imaging performance evaluation device after irradiation of the photoelectric imaging system according to an embodiment of the present invention, wherein (a) is a schematic diagram of the structure using the first test unit, (b) is a schematic diagram of the structure using the second test unit, and (c) is a schematic diagram of the structure using the third test unit;

[0044] Figure 2 It is a flow chart of a method for evaluating imaging performance of a photoelectric imaging system after irradiation according to an embodiment of the present invention;

[0045] The following are the descriptions of the reference numerals:

[0046] 1-photoelectric imaging system to be tested, 2-first mobile platform, 3-darkroom, 4-control unit, 5-standard light source color matching light box, 6-light box support table, 7-test chart, 8-test chart support plate, 9-display, 10-star simulator, 11-second mobile platform, 12-optical power meter, 13-DC power supply, 14-optical platform. DETAILED DESCRIPTION

[0047] In order to make the purpose, advantages and features of the present invention more clear, the imaging performance evaluation device and method of a photoelectric imaging system after irradiation proposed by the present invention are further described in detail below in conjunction with the drawings and specific embodiments.

[0048] A device for evaluating the imaging performance of an optoelectronic imaging system after irradiation, such as Figure 1As shown, it includes a control unit 4, an optical platform 14 and a dark box 3. The dark box 3 needs to be completely shielded from light, the interior is black, and it is installed on the optical platform 14. The optical platform 14 is used to reduce external vibration. The photoelectric imaging system 1 to be tested is powered by a DC power supply 13. During the test, it is installed on the first mobile platform 2. The first mobile platform 2 is fixed in the dark box 3 and can realize the movement of the X, Y, and Z axes. The first mobile platform 2 and the photoelectric imaging system 1 to be tested are both electrically connected to the control unit 4. Among them, the photoelectric imaging system 1 to be tested is a star sensor, a surveillance camera or a detection camera, and the core electronic components are CMOS image sensors or CCDs. A test unit for providing a test image and an optical power meter 12 for measuring the light intensity in the dark box 3 are arranged in the dark box 3. The test unit is a first test unit, a second test unit or a third test unit. The first test unit, the second test unit or the third test unit is located in the field of view of the photoelectric imaging system 1 to be tested during evaluation.

[0049] like Figure 1 As shown in (a), the first test unit is used to quantitatively evaluate the imaging performance, including a standard light source color matching light box 5 and a test chart 7. The standard light source color matching light box 5 is fixed to the bottom of the dark box 3 through a light box support 6, and the angle between the standard light source color matching light box 5 and the light box support 6 is 45°. The test chart 7 is vertically fixed to the light box support 6 through a test chart support plate 8 and is located in the standard light source color matching light box 5. The angle between the standard light source color matching light box 5 and the light box support 6, and the angle between the test chart 7 and the light box support 6 meet the requirements of national testing standards. The standard light source color matching light box 5 is used to provide uniform light source, color tone and intensity to illuminate the test chart 7. The test chart 7 has a magnetic suction component, including a standard 24-color test chart, a lens resolution test chart and a grayscale test chart. The test chart support plate 8 is made of an iron-based composite material with a warpage of less than 1% and a flatness of less than 0.2 mm. The test chart 7 can be directly adsorbed on the test chart support plate 8.

[0050] like Figure 1 As shown in (b), the second test unit is used to evaluate the imaging performance in a specific scene, including a display 9 fixed at the bottom of the dark box 3, the display 9 is electrically connected to the control unit 4, the control unit 4 has a built-in imaging gallery and a scene video gallery, and the display 9 displays the images in the imaging gallery and the scene video gallery under the control of the control unit 4. The imaging gallery includes typical satellite images, space station images, lunar images, Mars images, remote sensing images, reactor internal images, and fuel rod images, and the scene video gallery includes simulated scene videos and real scene videos.

[0051] like Figure 1As shown in (c), the third test unit is used to evaluate the positioning accuracy and limit star of the star sensor, including a second mobile platform 11 fixed to the bottom of the dark box 3, and a star simulator 10 installed on the second mobile platform 11, and the second mobile platform 11 and the star simulator 10 are both electrically connected to the control unit 4. The second mobile platform 11 can realize the movement of the X, Y, and Z axes. The star simulator 10 is a dynamic star simulator, and its resolution is greater than or equal to 2K×2K, and the refresh frequency is greater than or equal to 10Hz. The star simulator 10 is controlled by the control unit 4, and can simulate a static star map or a dynamic star map as needed.

[0052] This embodiment also provides a method for evaluating the imaging performance of a photoelectric imaging system after irradiation, based on the above-mentioned device for evaluating the imaging performance of a photoelectric imaging system after irradiation, such as Figure 2 As shown, the following steps are included:

[0053] Step 1: Place the photoelectric imaging system 1 or its core imaging device to be tested in an irradiation environment, stop irradiation when the set cumulative irradiation injection or dose is reached, then install the photoelectric imaging system 1 to be tested on the first mobile platform 2, and electrically connect it to the control unit 4. The irradiation environment is proton irradiation, neutron irradiation, heavy ion irradiation, electron irradiation or gamma ray irradiation.

[0054] Step 2: According to the evaluation requirements of the optoelectronic imaging system 1 to be tested, a test unit providing a test image is selected and installed in the dark box 3. Specifically:

[0055] If it is required to quantitatively evaluate the imaging performance of the optoelectronic imaging system 1 to be tested, the first test unit is installed in the dark box 3 and step 3 is performed;

[0056] If it is required to evaluate the imaging performance of the optoelectronic imaging system 1 under a specific scenario, the second test unit is installed in the dark box 3, and the display 9 is electrically connected to the control unit 4, and then step 4 is performed;

[0057] If it is required to evaluate the positioning accuracy and limit star of the star sensor in the optoelectronic imaging system 1 to be tested, the third test unit is installed in the dark box 3, and the star simulator 10 and the second mobile platform 11 are electrically connected to the control unit 4 respectively, and then step 5 is executed.

[0058] Step 3, turn on the standard light source color matching light box 5 so that the light beam it emits illuminates the test chart 7, then the control unit 4 adjusts the first mobile platform 2 and turns on the optoelectronic imaging system 1 to be tested for real-time imaging, so that the imaging image of the test chart 7 is located at the center of the field of view of the optoelectronic imaging system 1 to be tested, and execute step 6.

[0059] Step 4, the control unit 4 controls the display 9 to display the images in the imaging gallery or the scene video gallery, then adjusts the first mobile platform 2 and turns on the optoelectronic imaging system 1 to be tested for real-time imaging, so that the image image in the imaging gallery or the scene video gallery displayed by the display 9 is located at the center of the field of view of the optoelectronic imaging system 1 to be tested, and executes step 6.

[0060] Step 5, the control unit 4 controls the star simulator 10 to simulate the star map, and then adjusts the first mobile platform 2 and the second mobile platform 11 respectively and turns on the optoelectronic imaging system 1 to be tested for real-time imaging, until the star map imaging image in the star simulator 10 is located at the center of the field of view of the optoelectronic imaging system 1 to be tested, and executes step 6.

[0061] Step 6: Use shading paper or lens cover to shade the optoelectronic imaging system 1 to be tested, and then make the optoelectronic imaging system 1 to be tested continuously collect images to preheat the system until the grayscale value of the output image of the optoelectronic imaging system 1 to be tested is stable, and then remove the shading paper or lens cover to enter the imaging performance evaluation stage.

[0062] The gray value stability of the output image of the photoelectric imaging system 1 to be tested means that the average gray value change of the output image of the photoelectric imaging system 1 to be tested is less than 1% within two consecutive minutes. Calculated by the following formula:

[0063]

[0064] Wherein, m and n are respectively the horizontal and vertical coordinates of the pixel points of the output image of the photoelectric imaging system 1 to be tested, M and N are respectively the maximum number of rows and columns of the pixel points of the photoelectric imaging system 1 to be tested, and μ y,dark [m][n] is the grayscale value of the pixel with coordinates (m, n) in the photoelectric imaging system 1 to be tested.

[0065] Step 7: The photoelectric imaging system 1 to be tested continues to collect images. The number of images to be collected is not less than 3 frames. In this embodiment, 10 frames are collected. The control unit 4 uses existing analysis software to analyze the output images of the photoelectric imaging system 1 to be tested, and then evaluates the imaging performance of the photoelectric imaging system 1 to be tested based on the parameters obtained by the analysis. The parameters obtained by the analysis are specifically:

[0066] If it is required to quantitatively evaluate the imaging performance of the optoelectronic imaging system 1 to be tested or to evaluate the imaging performance of the optoelectronic imaging system 1 to be tested in a specific scenario, the parameters obtained by the analysis include the resolution, transfer function, dynamic range, uniformity and noise of the output image;

[0067] If it is required to evaluate the positioning accuracy and limiting star of the star sensor in the photoelectric imaging system 1 to be tested, the parameters obtained by analysis include the coordinates of the centroid of the star point and the dynamic range; wherein the coordinates of the centroid of the star point (x0, y0) are calculated by the following formula:

[0068]

[0069] Wherein, (M0, N0) and (M1, N1) are the image vertices of the local area containing the star point in the output image of the photoelectric imaging system 1 to be tested, μ(x, y) is the gray value of the pixel with coordinates (x, y) in the photoelectric imaging system 1 to be tested; μ th is the background noise threshold of the photoelectric imaging system 1 to be tested after being irradiated.

[0070] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the present invention.

Claims

1. A device for evaluating imaging performance of a photoelectric imaging system after irradiation, characterized in that: It comprises a control unit (4), a dark box (3), and a first movable platform (2) arranged in the dark box (3) for mounting the optoelectronic imaging system (1) to be tested; the first movable platform (2) and the optoelectronic imaging system (1) to be tested are both electrically connected to the control unit (4); The dark box (3) is provided with a test unit for providing a test image, the test unit being a first test unit, a second test unit or a third test unit, and the first test unit, the second test unit or the third test unit being located within the field of view of the photoelectric imaging system (1) to be tested during evaluation; The first test unit is used to quantitatively evaluate imaging performance, and comprises a standard light source color matching light box (5) and a test chart (7); the standard light source color matching light box (5) is fixed to the bottom of the dark box (3) via a light box support platform (6), and the angle between the standard light source color matching light box (5) and the light box support platform (6) is 45°; the test chart (7) is vertically fixed to the light box support platform (6) via a test chart support plate (8), and is located in the standard light source color matching light box (5); the standard light source color matching light box (5) is used to illuminate the test chart (7), and the test chart (7) is used to provide a test image; The second test unit is used to evaluate the imaging performance in a specific scene; it comprises a display (9) fixed to the bottom of the dark box (3); the display (9) is electrically connected to the control unit (4); the control unit (4) has an imaging gallery and a scene video gallery built in; the display (9) displays images in the imaging gallery and the scene video gallery under the control of the control unit (4); The third test unit is used to evaluate the positioning accuracy and limit star of the star sensor, and comprises a second mobile platform (11) fixed to the bottom of the dark box (3), and a star simulator (10) installed on the second mobile platform (11), the second mobile platform (11) and the star simulator (10) are both electrically connected to the control unit (4), and the star simulator (10) is used to simulate a star map under the control of the control unit (4).

2. The imaging performance evaluation device of a photoelectric imaging system after irradiation according to claim 1, characterized in that: It also includes an optical power meter (12) arranged in the dark box (3), and the optical power meter (12) is used to measure the light intensity in the dark box (3).

3. The imaging performance evaluation device of a photoelectric imaging system after irradiation according to claim 2, characterized in that: It also comprises an optical platform (14) for reducing external vibration, and the dark box (3) is arranged on the optical platform (14).

4. A device for evaluating imaging performance of a photoelectric imaging system after irradiation according to any one of claims 1 to 3, characterized in that: The test chart (7) has a magnetic attraction component, and the test chart support plate (8) is made of an iron-based composite material with a warpage of less than 1% and a flatness of less than 0.2 mm; The star simulator (10) is a dynamic star simulator, with a resolution greater than or equal to 2K×2K and a refresh frequency greater than or equal to 10 Hz.

5. The imaging performance evaluation device of a photoelectric imaging system after irradiation according to claim 4, characterized in that: The test chart (7) comprises a standard 24-color test chart, a lens resolution test chart and a grayscale test chart; The imaging library includes typical satellite images, space station images, lunar images, Mars images, remote sensing images, reactor interior images and fuel rod images, and the scene video library includes simulated scene videos and real scene videos; The photoelectric imaging system to be tested (1) is powered by a direct current power supply (13).

6. A method for evaluating the imaging performance of an optoelectronic imaging system after irradiation, based on the imaging performance evaluation device of an optoelectronic imaging system after irradiation according to any one of claims 1 to 5, characterized in that: The following steps are involved: Step 1: placing the optoelectronic imaging system (1) or its core imaging device to be tested in an irradiation environment, stopping the irradiation when the set cumulative irradiation injection or dose is reached, and then installing the optoelectronic imaging system (1) to be tested on a first mobile platform (2), and electrically connecting it to a control unit (4); Step 2: According to the evaluation requirements of the optoelectronic imaging system (1) to be tested, a test unit providing a test image is selected and installed in a dark box (3); specifically: If it is required to quantitatively evaluate the imaging performance of the optoelectronic imaging system (1) to be tested, the first test unit is installed in the dark box (3) and step 3 is performed; If it is required to evaluate the imaging performance of the optoelectronic imaging system (1) under test in a specific scene, the second test unit is installed in the dark box (3), and the display (9) is electrically connected to the control unit (4), and then step 4 is performed; If it is required to evaluate the positioning accuracy and limit star of the star sensor in the photoelectric imaging system (1) to be tested, the third test unit is installed in the dark box (3), and the star simulator (10) and the second mobile platform (11) are electrically connected to the control unit (4) respectively, and then step 5 is performed; Step 3, turning on the standard light source color matching light box (5) so that the light beam emitted by it illuminates the test chart (7), then the control unit (4) adjusts the first moving platform (2) and turns on the photoelectric imaging system to be tested (1) for real-time imaging, so that the imaging image of the test chart (7) is located at the center of the field of view of the photoelectric imaging system to be tested (1), and then executing step 6; Step 4, the control unit (4) controls the display (9) to display the images in the imaging gallery or the scene video gallery, then adjusts the first mobile platform (2) and turns on the optoelectronic imaging system (1) to be tested for real-time imaging, so that the image image in the imaging gallery or the scene video gallery displayed by the display (9) is located at the center of the field of view of the optoelectronic imaging system (1) to be tested, and executes step 6; Step 5, the control unit (4) controls the star simulator (10) to simulate a star map, and then respectively adjusts the first mobile platform (2) and the second mobile platform (11) and turns on the photoelectric imaging system (1) to be tested to perform real-time imaging, until the star map image in the star simulator (10) is located at the center of the field of view of the photoelectric imaging system (1) to be tested, and then executes step 6; Step 6: performing light shielding on the photoelectric imaging system (1) to be tested, and then allowing the photoelectric imaging system (1) to be tested to continuously collect images to preheat the system until the grayscale value of the image output by the photoelectric imaging system (1) to be tested is stable, and then removing the light shielding of the photoelectric imaging system (1) to be tested, and entering the imaging performance evaluation stage; Step 7: The photoelectric imaging system to be tested (1) continues to collect images, and the number of collected images is not less than 3 frames. The control unit (4) analyzes the output image of the photoelectric imaging system to be tested (1), and then evaluates the imaging performance of the photoelectric imaging system to be tested (1) based on the parameters obtained by the analysis.

7. The method for evaluating imaging performance of an optoelectronic imaging system after irradiation according to claim 6, characterized in that: In step 6, the gray value stability of the output image of the photoelectric imaging system (1) to be tested refers to: The average grayscale change value of the output image of the photoelectric imaging system (1) to be tested is less than 1% within two consecutive minutes; The average gray value of each frame Calculated by the following formula: Wherein, m and n are respectively the horizontal coordinate and the vertical coordinate of the pixel point of the output image of the photoelectric imaging system (1) to be tested, M and N are respectively the maximum number of rows and the maximum number of columns of the pixel points of the photoelectric imaging system (1) to be tested, and μ y,dark [m][n] is the gray value of the pixel with coordinates (m, n) in the photoelectric imaging system (1) to be tested.

8. The method for evaluating imaging performance of an optoelectronic imaging system after irradiation according to claim 7, characterized in that: In step 7, the parameters obtained by the analysis are specifically: If it is required to quantitatively evaluate the imaging performance of the optoelectronic imaging system (1) to be tested or to evaluate the imaging performance of the optoelectronic imaging system (1) to be tested in a specific scene, the parameters obtained by analysis include the resolution, transfer function, dynamic range, uniformity and noise of the output image; If it is required to evaluate the positioning accuracy and limiting star of the star sensor in the photoelectric imaging system (1) to be tested, the parameters obtained by analysis include the coordinates of the centroid of the star point and the dynamic range; wherein the coordinates of the centroid of the star point (x0, y0) are calculated by the following formula: Wherein, (M0, N0) and (M1, N1) are the image vertices of the local area containing the star point in the output image of the photoelectric imaging system (1) to be tested, μ(x, y) is the gray value of the pixel point with coordinates (x, y) in the photoelectric imaging system (1) to be tested; μ th is the background noise threshold of the photoelectric imaging system (1) to be tested after being irradiated.

9. The method for evaluating imaging performance of an optoelectronic imaging system after irradiation according to claim 8, characterized in that: In step 1, the irradiation environment is proton irradiation, neutron irradiation, heavy ion irradiation, electron irradiation or gamma ray irradiation.

10. The method for evaluating imaging performance of an optoelectronic imaging system after irradiation according to claim 9, characterized in that: In step 6, the shading method is: using shading paper or a lens cover to shading.

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