Probe module

By setting the spring and positioning shaft between the guide head and the flange in the probe module, the problems of plug position accuracy and disassembly time are solved, and a high-precision and consistent board-to-board connector test is achieved.

CN119438651BActive Publication Date: 2025-07-22KUNSHAN DLOORPLF ELECTRONIC TECH CO LTD
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Patent Information

Application Number
CN202411546144.7
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2024-10-31
Publication Date
2025-07-22
Estimated Expiration
2044-10-31

AI Technical Summary

Technical Problem

In the board-to-board connector test, the existing probe modules have problems such as low position accuracy between the plug and flange, insufficient overlap of the plug end surface plane, long disassembly time, and insufficient testing accuracy and consistency.

Method used

A spring is used to set up a spring between the guide head and the flange, and connect the guide sleeve and the flange through a positioning shaft, increase the flange hole and slot the flange side. The spring's elastic force is used to correct the plug to accurately contact the plate-to-board connector. Only the two ends of the spring are limited to allow large angle twisting to ensure that the plug is completely entered into the plug.

Benefits of technology

Improve the position accuracy and plane coincidence of the plug and flange, reduce disassembly and assembly time, ensure the accuracy and consistency of the test, and avoid part damage.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present invention discloses a probe module, comprising: a plug; a guiding head fixedly connected to the plug, having a first through hole and a first counterbore groove; a guiding sleeve having a sleeve hole, at least a part of the plug and the guiding head being located in the sleeve hole; a flange having a second through hole and a notch, the notch communicating with the second through hole and the radial side surface of the flange in the radial direction, the second through hole including a first hole portion and a second hole portion, the second hole portion being closer to the guiding sleeve than the first hole portion, and the aperture of the second hole portion being larger than that of the first hole portion; two positioning shafts arranged in parallel, fixedly connecting the guiding sleeve and the flange; a spring, one end of which is located in the first counterbore groove and the other end of which is located in the second hole portion, the two positioning shafts being symmetrically arranged on the radial sides of the spring and having a gap with the spring; a cable connector physically and electrically connected to the plug and sequentially passing through the first through hole, the spring and the second through hole. This probe module solves the testing problem caused by the reference deviation of the chip contacts and saves the disassembly and assembly time.
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Description

Technical Field

[0001] The present invention relates to the technical field of electronic component testing, and particularly to a probe module. Background Art

[0002] With the progress of electronic technology, the frequency of electronic products is getting higher and higher, the volume is getting smaller and smaller, and the number of channels is getting more and more, which promotes the strict and efficient technical requirements in the high-frequency testing of antennas and transmission lines with board-to-board (BTB) connectors as ports. Specifically, the board-to-board connector test probe module needs to have characteristics such as high test accuracy and convenient disassembly and assembly.

[0003] In the prior art, the probe module usually adopts the method of connecting the plug and the flange with a single rod and sleeving a spring outside the rod. There are defects such as low positional accuracy between the plug and the flange and low flatness coincidence degree between the end face of the plug and the bottom of the flange. Moreover, the board-to-board connector has a certain tolerance on the product it is assembled on, but the probe is generally in an absolute fixed position. Sleeving a spring outside the rod can correct the contact point between the plug and the board-to-board connector to a certain extent, but the angle that the plug can tilt and rotate is limited, resulting in the board-to-board connector unable to fully enter the plug, and the test accuracy and consistency are low. In addition, the parts replacement frequency of the board-to-board connector test probe module is very high. When replacing parts of the existing probe module, the cable needs to pass through the hole in the middle of the flange, and the disassembly and assembly time is long.

[0004] Therefore, it is necessary to provide a new probe module to solve the above problems. Summary of the Invention

[0005] The purpose of the present invention is to provide a probe module, which solves the test problems caused by the reference deviation of the chip contact point and saves the disassembly and assembly time.

[0006] To achieve the above purpose, the present invention adopts the following technical solutions:

[0007] A probe module for testing a board-to-board connector, the probe module comprising:

[0008] A plug;

[0009] A guiding head fixedly connected to the plug, the guiding head having a first through hole axially penetrating therethrough and a first counterbore groove axially recessed from a side away from the plug;

[0010] A guiding sleeve having a sleeve hole, at least a part of the plug and the guiding head being located in the sleeve hole;

[0011] A flange, having a second through hole axially penetrating therethrough and a notch, the notch being radially communicated with the second through hole and a radial side surface of the flange, the second through hole including a first hole portion and a second hole portion, the second hole portion being closer to the guide sleeve relative to the first hole portion, and the aperture of the second hole portion being larger than the aperture of the first hole portion;

[0012] Two positioning shafts are provided in parallel, and the positioning shafts are fixedly connected to the guide sleeve and the flange;

[0013] A spring, the two positioning shafts are symmetrically arranged on the radial sides of the spring and there is a gap between the spring and the positioning shafts, the axial ends of the spring respectively abut against the guide head and the flange, at least a part of one end of the spring is located in the first sunk groove, and at least a part of the other end of the spring is located in the second hole portion;

[0014] A cable connector is physically and electrically connected to the plug, and the cable connector sequentially passes through the first through hole, the spring and the second through hole.

[0015] As a further improved technical solution of the present invention, the guide sleeve is provided with a first fixing hole, and one end of the positioning shaft close to the guide sleeve is provided with a threaded hole axially recessed, and is screwed and fixed in the first fixing hole and the threaded hole to connect the guide sleeve and the positioning shaft;

[0016] The flange is provided with a second fixing hole, and one end of the positioning shaft close to the flange is provided with a screw hole axially recessed, and is screwed and fixed in the second fixing hole and the screw hole to connect the flange and the positioning shaft.

[0017] As a further improved technical solution of the present invention, the positioning shaft includes a shaft body and a first convex shaft and a second convex shaft protruding from both ends of the shaft body, the first fixing hole includes a third hole portion and a fourth hole portion, the aperture of the fourth hole portion is larger than the aperture of the third hole portion, the first convex shaft is adapted to the fourth hole portion, the second fixing hole includes a fifth hole portion and a sixth hole portion, the aperture of the sixth hole portion is larger than the aperture of the fifth hole portion, and the second convex shaft is adapted to the sixth hole portion.

[0018] As a further improved technical solution of the present invention, the second hole portion includes a first sub-hole portion and a second sub-hole portion, the first sub-hole portion is closer to the first hole portion relative to the second sub-hole portion, the aperture of the second sub-hole portion is larger than the aperture of the first sub-hole portion, and the aperture of the first sub-hole portion is equivalent to the diameter of the spring.

[0019] As a further improved technical solution of the present invention, the cable connector includes a low-frequency cable and a high-frequency cable, and the width of the notch is greater than the diameters of the low-frequency cable and the high-frequency cable.

[0020] As a further improved technical solution of the present invention, the guiding head further includes a second sunk groove axially recessed from the side close to the plug, and at least part of the plug is located in the second sunk groove.

[0021] As a further improved technical solution of the present invention, the sleeve hole includes a seventh hole part and an eighth hole part. The seventh hole part is closer to the flange than the eighth hole part. The aperture of the seventh hole part is larger than that of the eighth hole part, and the guiding head is adapted to the seventh hole part.

[0022] As a further improved technical solution of the present invention, the seventh hole part includes a third sub-hole part. The aperture of the third sub-hole part gradually decreases from the side close to the flange to the side away from the flange. The guiding head includes an oblique cutting part, and the oblique cutting part is adapted to the third sub-hole part.

[0023] As a further improved technical solution of the present invention, the plug includes a housing, a circuit board and a probe group. The housing includes a base body and a boss. The circuit board is arranged in the second sunk groove. The base body is fixedly connected to the circuit board. The cable connector is physically and electrically connected to the circuit board or the probe group. At least part of the probe group is exposed on the side of the boss away from the base body.

[0024] As a further improved technical solution of the present invention, the plug further includes a carrier and a grounding block. The housing has a receiving cavity communicating the base body and the boss. The carrier and the grounding block are located in the receiving cavity. At least part of the probe group is arranged in the carrier and at least part of it is arranged in the grounding block. The carrier is located between the grounding block and the circuit board.

[0025] Compared with the prior art, the beneficial effects of the probe module of the present invention are as follows: By setting two positioning shafts with the same height to connect the guiding sleeve and the flange, both the accuracy of the position from the flange to the plug and the flatness coincidence degree of the plug end face to the bottom of the flange are ensured. The flange hole is enlarged and a groove is opened on the side of the flange, so that more cables can pass through the flange, and when disassembling and assembling, the cables do not need to pass through the flange hole and can be taken out or inserted from the notch on the side of the flange, thus saving the disassembly and assembly time and not causing secondary damage to the parts during the disassembly and assembly process. A spring is arranged between the guiding head and the flange to correct the plug to accurately contact the board-to-board connector. Only the two ends of the spring are limited, so the spring has more twisting deformation angles and correspondingly pushes the guiding head and the plug, so that the board-to-board connector completely enters the plug to ensure accurate and consistent testing. Description of the Drawings

[0026] Figure 1 Schematic three - dimensional structure diagram of the probe module according to a specific embodiment of the present invention;

[0027] Figure 2 Schematic three - dimensional structure diagram of the probe module from another perspective according to a specific embodiment of the present invention;

[0028] Figure 3 Exploded structure diagram of the probe module according to a specific embodiment of the present invention;

[0029] Figure 4 Partial three - dimensional sectional structure diagram of the probe module according to a specific embodiment of the present invention;

[0030] Figure 5 is Figure 4 Enlarged structure diagram of area A in

[0031] Figure 6 is Figure 4 Enlarged structure diagram of area B in

[0032] Figure 7 Partial exploded structure diagram of the probe module according to a specific embodiment of the present invention;

[0033] Figure 8 is Figure 7 Sectional structure diagram of

[0034] Figure 9 Assembly diagram of the plug and the guiding head according to a specific embodiment of the present invention;

[0035] Figure 10 Partial exploded structure diagram of the plug and the guiding head according to a specific embodiment of the present invention;

[0036] Figure 11 Exploded structure diagram of the plug according to a specific embodiment of the present invention;

[0037] Figure 12 Another perspective exploded structure diagram of the plug according to a specific embodiment of the present invention;

[0038] Figure 13 Partial three - dimensional sectional structure diagram of the plug according to a specific embodiment of the present invention;

[0039] Figure 14 Partial exploded structure diagram of the plug according to a specific embodiment of the present invention;

[0040] Figure 15 Another perspective partial exploded structure diagram of the plug according to a specific embodiment of the present invention. Detailed implementation manners

[0041] The exemplary specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. If there are several specific embodiments, the features in these embodiments can be combined with each other without conflict. When the description involves the accompanying drawings, unless otherwise specified, the same numbers in different drawings represent the same or similar elements. The content described in the following exemplary specific embodiments does not represent all embodiments consistent with the present invention; on the contrary, they are only examples of devices, products, and / or methods consistent with some aspects of the present invention recorded in the claims of the present invention.

[0042] The terms used in the present invention are only for the purpose of describing specific embodiments, and are not intended to limit the protection scope of the present invention. The singular forms "a", "the", or "said" used in the specification and claims of the present invention are also intended to include the plural forms, unless the context clearly indicates otherwise.

[0043] It should be understood that the terms such as "first", "second", and similar words used in the specification and claims of the present invention do not represent any order, quantity, or importance, but are only used to distinguish the named features. Similarly, words such as "a" or "one" do not represent a quantity limitation, but mean that there is at least one. Unless otherwise specified, the words such as "front", "rear", "upper", "lower", etc. appearing in the present invention are only for the convenience of description, and are not limited to a specific position or a spatial orientation. The open-ended expression "comprising" or "including" means that the elements appearing before "comprising" or "including" cover the elements appearing after "comprising" or "including" and their equivalents, and this does not exclude that the elements appearing before "comprising" or "including" may also include other elements. If "several" appears in the present invention, its meaning refers to two or more.

[0044] Please refer to Figures 1 to 15 As shown, an embodiment of the present invention discloses a probe module for testing the electrical performance of a board-to-board connector.

[0045] Please refer to Figures 1 to 3 As shown, the probe module includes a plug 1, a guide head 2, a guide sleeve 3, a flange 4, a positioning shaft 5, a spring 6, and a cable connector 7. The plug 1 is fixedly connected to the guide head 2, the guide sleeve 3 is sleeved on the outer periphery of the plug 1 and the guide head 2, the positioning shaft 5 fixedly connects the guide sleeve 3 and the flange 4, the spring 6 is arranged between the guide head 2 and the flange 4, and the cable connector 7 is physically and electrically connected to the plug 1.

[0046] Please refer to Figure 3 and Figure 4As shown, the guiding head 2 has a first through hole 21 axially penetrating therethrough, the flange 4 has a second through hole 41 axially penetrating therethrough, and the cable connecting member 7 sequentially passes through the first through hole 21, the spring 6, and the second through hole 41 from the plug 1.

[0047] Please refer to Figure 1 、 Figure 3 and Figure 4 As shown, the guiding sleeve 3 has a sleeve hole 31, and at least part of the plug 1 and the guiding head 2 are located in the sleeve hole 31. Since the spring 6 is arranged between the guiding head 2 and the flange 4, under the elastic force of the spring 6, the guiding head 2 and the plug 1 will not fall off from the guiding sleeve 3.

[0048] Please refer to Figures 4 to 8 As shown, the sleeve hole 31 includes a seventh hole portion 311 and an eighth hole portion 312. The seventh hole portion 311 is closer to the flange 4 than the eighth hole portion 312, and the aperture of the seventh hole portion 311 is larger than that of the eighth hole portion 312. The guiding head 2 is adapted to the seventh hole portion 311, and there is a third connecting wall 313 between the seventh hole portion 311 and the eighth hole portion 312. At least part of the surface of the guiding head 2 close to the plug 1 abuts against the third connecting wall 313. Such a setting facilitates the assembly between the guiding head 2 and the guiding sleeve 3, with relatively high assembly precision and can reduce the assembly time to a certain extent. Further, there is no fixed connection between the guiding head 2 and the guiding sleeve 3. Under the elastic force of the spring 6, a force is generated on the guiding head 2 to axially move away from the flange 4 and abut against the guiding sleeve 3; and the guiding head 2 and the plug 1 can withstand the force pressing from one end of the plug 1 towards the flange 4 side. Under the elastic force of the spring 6, the guiding head 2 and the plug 1 will not fall off from the guiding sleeve 3.

[0049] Further, please refer to Figures 4 to 8 As shown, the seventh hole portion 311 includes a third sub-hole portion 3111, and the aperture of the third sub-hole portion 3111 gradually decreases from the side close to the flange 4 towards the side away from the flange 4. The guiding head 2 includes an inclined cutting portion 24, and the inclined cutting portion 24 is adapted to the third sub-hole portion 3111. Such a setting provides a mutual guiding effect between the guiding sleeve 3 and the guiding head 2. When the guiding head 2 and the plug 1 are under pressure, the elastic force of the spring 6 is released, and the inclined cutting portion 24 of the guiding head 2 can smoothly slide into the third sub-hole portion 3111, thereby improving the assembly precision and stability.

[0050] Please refer to Figure 9 and Figure 10 As shown, the guiding head 2 further includes a second counterbore groove 23 axially recessed from the side close to the plug 1, and at least part of the plug 1 is located in the second counterbore groove 23. Such a setting facilitates the assembly between the plug 1 and the guiding head 2, with relatively high assembly precision and can reduce the assembly time to a certain extent. Further, the part of the plug 1 located in the second counterbore groove 23 matches the second counterbore groove 23, and the plug 1 and the guiding head 2 are also fixedly connected by a third fastener 83.

[0051] The groove side wall of the second sinking table groove 23 is relatively located on the inner side, and the inclined wall of the inclined cutting portion 24 is relatively located on the outer side. The guiding head 2 further has a top wall 25 connecting the second sinking table groove 23 and the inclined cutting portion 24. The top wall 25 is higher than the bottom wall of the second sinking table groove 23. The top wall 25 abuts against the third connecting wall 313, and the bottom wall of the second sinking table groove 23 abuts against the plug 1.

[0052] Please refer to Figure 3 and Figure 4 As shown, the two ends of the spring 6 respectively abut against the guiding head 2 and the flange 4 to generate an elastic force on the guiding head 2 and the plug 1 fixedly connected to the guiding head 2. The guiding head 2 further has a first sinking table groove 22 axially recessed from the side away from the plug 1. Axially, the first through hole 21 is located in the first sinking table groove 22, and one end of the spring 6 is at least partially located in the first sinking table groove 22. The second through hole 41 of the flange 4 includes a first hole portion 411 and a second hole portion 412. The second hole portion 412 is closer to the guiding sleeve 3 relative to the first hole portion 411, and the aperture of the second hole portion 412 is larger than that of the first hole portion 411. The other end of the spring 6 is at least partially located in the second hole portion 412.

[0053] Since there are certain tolerances for the board-to-board connector on the product it is assembled on, but the probe generally has an absolute fixed position, there are certain tolerances for the board-to-board connector mounted on the product relative to the plug 1. The elastic force of the spring can be used to correct the guiding head 2 and the plug 1. At this time, the guiding head 2 and the plug 1 will have a certain inclination to improve the accuracy of docking the board-to-board connector. In this embodiment, the rotation point of this inclination is closer to the board-to-board connector compared to other conventional probe modules. Under the same conditions, the plug 1 can rotate at a larger angle, with stronger compatibility, and only the two ends of the spring 6 are limited, that is to say, more parts of the spring 6 can be deformed and twisted. When the relative position between the board-to-board connector and the plug 1 is large, there may be a large angle when the plug 1 just contacts the board-to-board connector. However, if the angle is always large during the contact between the board-to-board connector and the plug 1, it will cause the board-to-board connector to not be able to fully enter the plug 1. In this embodiment, since the spring 6 can be twisted at a large angle, the spring 6 will deform and twist to release the elastic force, and accordingly push the guiding head 2 and the plug 1 to move a certain distance, so that the board-to-board connector can fully enter the plug 1 for docking, thereby ensuring the accuracy and consistency of the test.

[0054] Further, please refer to Figures 4 to 8As shown, the second hole portion 412 includes a first sub-hole portion 4121 and a second sub-hole portion 4122. The first sub-hole portion 4121 is closer to the first hole portion 411 than the second sub-hole portion 4122, and the aperture of the second sub-hole portion 4122 is larger than that of the first sub-hole portion 4121. That is to say, the first hole portion 411, the first sub-hole portion 4121, and the second sub-hole portion 4122 are arranged in sequence and the apertures increase in sequence. The aperture of the first sub-hole portion 4121 is equivalent to the diameter of the spring 6. The first sink groove 22 is a circular groove, and its inner diameter is also equivalent to the diameter of the spring 6. In this way, both ends of the spring 6 are radially limited in the first sub-hole portion 4121 and the first sink groove 22 in small parts, which can strengthen the limiting effect on both ends of the spring 6 and does not affect the torsional deformation of other parts of the spring 6. The aperture of the second sub-hole portion 4122 is slightly larger than that of the first sub-hole portion 4121, which can perform a certain radial limit on a small part of the end of the spring 6 close to the middle to prevent the inclination angle of the torsional deformation of the spring 6 from being too large to return to the correct position.

[0055] Please refer to Figures 3 to 8 As shown, two positioning shafts 5 are arranged in parallel. The two positioning shafts 5 are axially fixedly connected to the guide sleeve 3 and the flange 4 respectively, and the two positioning shafts 5 are at the same height, which can not only ensure the position accuracy of the flange 4 to the plug 1, but also ensure the flatness coincidence degree of the end face of the plug 1 to the bottom of the flange 4, and achieve a higher connection accuracy of the probe module at a lower cost.

[0056] The two positioning shafts 5 are symmetrically arranged on the radial two sides of the spring 6 to improve the stability of the whole probe module. There is a gap between the spring 6 and the positioning shafts 5 to prevent the positioning shafts 5 from restricting the torsional rotation angle of the spring 6.

[0057] Please refer to Figures 4 to 8 As shown, the guide sleeve 3 is provided with a first fixing hole 32. One end of the positioning shaft 5 close to the guide sleeve 3 is provided with a threaded hole 501 axially recessed, and the aperture of the threaded hole 501 is smaller than the diameter of the positioning shaft 5. It is helically fixed in the first fixing hole 32 and the threaded hole 501 through the first fastener 81 to connect the guide sleeve 3 and the positioning shaft 5. The flange 4 is provided with a second fixing hole 43. One end of the positioning shaft 5 close to the flange 4 is provided with a screw hole 502 axially recessed, and the aperture of the screw hole 502 is smaller than the diameter of the positioning shaft 5. It is helically fixed in the second fixing hole 43 and the screw hole 502 through the second fastener 82 to connect the flange 4 and the positioning shaft 5. Further, the length of the first fastener 81 is greater than the thickness of the guide sleeve 3 to be able to pass through the first fixing hole 32 and the threaded hole 501 at the same time; the length of the second fastener 82 is greater than the thickness of the flange 4 to be able to pass through the second fixing hole 43 and the screw hole 502 at the same time. With such a setting, both ends of the positioning shaft 5 abut against the guide sleeve 3 and the flange 4 respectively, and are fixedly connected through the openings at both ends, so that the two positioning shafts 5 can always be kept at the same height and the stability of the connection is ensured at the same time.

[0058] Further, please refer to Figures 4 to 8 As shown, the positioning shaft 5 includes a shaft body 51, a first convex shaft 52 and a second convex shaft 53 protruding from both ends of the shaft body 51 respectively. The first convex shaft 52 is closer to the guide sleeve 3 than the second convex shaft 53. The first fixing hole 32 includes a third hole portion 321 and a fourth hole portion 322. The fourth hole portion 322 is closer to the flange 4 than the third hole portion 321, and the aperture of the fourth hole portion 322 is larger than that of the third hole portion 321. The first convex shaft 52 is adapted to the fourth hole portion 322, and the aperture of the first slot hole 501 is smaller than the diameter of the first convex shaft 52. The second fixing hole 43 includes a fifth hole portion 431 and a sixth hole portion 432. The sixth hole portion 432 is closer to the guide sleeve 3 than the fifth hole portion 431, and the aperture of the sixth hole portion 432 is larger than that of the fifth hole portion 431. The second convex shaft 53 is adapted to the sixth hole portion 432, and the aperture of the second slot hole 502 is smaller than the diameter of the second convex shaft 53. With such a setting, not only the connection strength between the two ends of the positioning shaft 5 and the guide sleeve 3 and the flange 4 is enhanced, but also the disassembly and assembly among the three are made more rapid and convenient.

[0059] In this embodiment, the diameters of the first convex shaft 52 and the second convex shaft 53 are both smaller than that of the shaft body 51. Therefore, the positioning shaft 5 has a first end face 541 and a second end face 542 facing the guide sleeve 3, and a third end face 543 and a fourth end face 544 facing the flange 4. The first end face 541 is the face where the first convex shaft 52 is away from the shaft body 51, and the second end face 542 is the face where the shaft body 51 is close to the first convex shaft 52. There is a first connecting wall 323 between the third hole portion 321 and the fourth hole portion 322 of the guide sleeve 3. The first end face 541 at least partially abuts against the first connecting wall 323, and the second end face 542 at least partially abuts against one face of the guide sleeve 3 close to the flange 4; the third end face 543 is the face where the second convex shaft 53 is away from the shaft body 51, and the fourth end face 544 is the face where the shaft body 51 is close to the second convex shaft 53. There is a second connecting wall 433 between the fifth hole portion 431 and the sixth hole portion 432 of the flange 4. The third end face 543 at least partially abuts against the second connecting wall 433, and the fourth end face 544 at least partially abuts against one face of the flange 4 close to the guide sleeve 3. With such a setting, the positioning shaft 5 has two abutting faces with different axial positions respectively with the guide sleeve 3 and the flange 4, improving the installation accuracy of the positioning shaft 5 and simplifying the installation steps.

[0060] Please refer to Figure 1 、 Figure 2 and Figure 7 As shown, the flange 4 further has a notch 42 axially penetrating therethrough. The notch 42 is radially communicated with the second through hole 41 and a radial side face of the flange 4, so that the cable can be directly taken out or inserted from the notch 42 during disassembly and assembly without passing through the second through hole 41. At the same time, in this embodiment, the aperture of the second through hole 41 is increased so that more cables can pass through the second through hole 41.

[0061] Please refer to Figures 1 to 3 As shown, the cable connector 7 includes a low-frequency cable 71, a high-frequency cable 72, a terminal 73, and a plug 74. The low-frequency cable 71 is connected to the terminal 73, and the high-frequency cable 72 is connected to the plug 74. The terminal 73 and the plug 74 are respectively used for plugging into corresponding low-frequency and high-frequency external test devices. Further, the diameters of both the low-frequency cable 71 and the high-frequency cable 72 are smaller than the width of the notch 42, so that the low-frequency cable 71 and the high-frequency cable 72 can be smoothly taken out or inserted from the notch 42 during disassembly and assembly.

[0062] Please refer to Figure 3 、 Figure 11 and Figure 12 As shown, the plug 1 includes a housing 11, a circuit board 12, a probe group 13, a carrier 14, and a grounding block 15. The housing 11 includes a base 111 and a boss 112. The circuit board 12 is fixedly connected to the base 111. The cable connector 7 is physically and electrically connected to the circuit board 12 or the probe group 13. At least part of the probe group 13 is exposed on the side of the boss 112 away from the base 111. Further, the radial outer contour of the base 111 is flush with the radial outer contour of the circuit board 12, and the thickness of the circuit board 12 is equal to the groove depth of the second counterbore 24. The circuit board 12 is disposed in the second counterbore 24. With such a setting, the circuit board 12 is protected from being damaged and does not affect the connection of the circuit board 12 to other components. The housing 11 has a receiving cavity 113 communicating the base 111 and the boss 112. The carrier 14 and the grounding block 15 are located in the receiving cavity 113. At least part of the probe group 13 is disposed in the carrier 14 and at least part of it is disposed in the grounding block 15. The carrier 14 is clamped between the grounding block 15 and the circuit board 12.

[0063] Please refer to Figure 12 and Figure 13 As shown, both the carrier 14 and the grounding block 15 are in the shape of a cuboid, and their radial outer contours are flush and equal. At least part of the four radial side surfaces of the carrier 14 and the grounding block 15 abut against the inner side wall of the receiving cavity 113 to limit the carrier 14 and the grounding block 15. On the side of the base 111 away from the boss 112, there is also a first groove 114. The two first grooves 114 are located radially outside the receiving cavity 113 and are oppositely arranged. The first groove 114 communicates with the receiving cavity 113. With such a setting, it is convenient for the disassembly and assembly of the carrier 14 and the grounding block 15 in the receiving cavity 113.

[0064] Please refer to Figures 9 to 13As shown, the base body 111 is provided with a plurality of first mounting holes 1111, and the circuit board 12 is correspondingly provided with a plurality of second mounting holes 121. The two are fixedly connected by a third fastener 83. Further, the guiding head 2 is provided with a plurality of third mounting holes 26 corresponding to the first mounting holes 1111 and the second mounting holes 121. The third fastener 83 sequentially passes through the first mounting hole 1111, the second mounting hole 121, and the third mounting hole 26 to fixedly connect the base body 111, the circuit board 12, and the guiding head 2.

[0065] Please refer to Figures 11 to 15 As shown, the probe group 13 includes a low-frequency probe 131 and a high-frequency probe 132. The circuit board 12 is provided with a third through hole 122. The low-frequency cable 71 is welded to the circuit board 12. The high-frequency cable 72 passes through the third through hole 122 and is physically and electrically connected to the high-frequency probe 132. At least a part of the low-frequency probe 131 and the high-frequency probe 132 is exposed on the side of the boss 112 away from the base body 111. Further, a third counterbore 1121 is provided on the side of the boss 112 away from the base body 111. The side of the boss 112 away from the base body 111 has a first top wall 1122 and a second top wall 1123. The first top wall 1122 is the wall of the boss 112 farthest from the base body 111 as a whole, and the second top wall 1123 is the bottom wall of the third counterbore 1121. In the radial direction, the second top wall 1123 is located inside the first top wall 1122. The low-frequency probe 131 and the high-frequency probe 132 are exposed in the third counterbore 1121, and the exposed parts of the low-frequency probe 131 and the high-frequency probe 132 are axially located between the first top wall 1122 and the second top wall 1123, that is, the exposed height of the low-frequency probe 131 and the high-frequency probe 132 does not exceed the first top wall 1122.

[0066] Please refer to Figures 13 to 15 As shown, the low-frequency probe 131 and the high-frequency probe 132 have the same length. The low-frequency probe 131 includes a first needle body part 1311 and first needle heads 1312 and second needle heads 1313 at both ends. The high-frequency probe 132 includes a second needle body part 1321 and third needle heads 1322 and fourth needle heads 1323 at both ends. The grounding block 15 is provided with an axially penetrating first needle hole 151 and a second needle hole 152 for setting the low-frequency probe 131 and the high-frequency probe 132. The first needle body part 1311 and the second needle body part 1321 are respectively at least partially arranged in the first needle hole 151 and the second needle hole 152. The first needle head 1312 and the third needle head 132 are respectively at least partially exposed in the third counterbore 1121. The carrier 14 is provided with an axially penetrating cable hole 141. The high-frequency cable 72 passes through the third through hole 122 into the cable hole 141 of the carrier 14. The fourth needle head 1323 is physically and electrically connected to the high-frequency cable 72. The second needle head 1313 is connected to the carrier 14 and is physically and electrically connected to the circuit board 12 through the carrier 14.

[0067] Please refer to Figures 11 to 15 As shown, the plug 1 further includes a limiting block 16. The limiting block 16 is clamped between the circuit board 12 and the carrier 14. The limiting block 16 is provided with axially penetrating second notches 161, and a plurality of second notches 161 communicate with the radial sides of the limiting block 16 respectively. The width of the second notch 161 is equivalent to the diameter of the high-frequency cable 72 to limit the high-frequency cable 72 and improve the accuracy of the probe module. The projection of the second notch 161 in the axial direction is located within the third through hole 122 of the circuit board 12, so that the high-frequency cable 72 can smoothly pass through the circuit board 12 and the limiting block 16 to the carrier 14 to be connected to the high-frequency probe 132, and further improve the disassembly and assembly convenience of the high-frequency cable 72.

[0068] Please refer to Figure 14 and Figure 15 As shown, the probe group 13 further includes a ground probe 133. The limiting block 16 is provided with an axially penetrating third pin hole 162. The ground probe 133 passes through the third pin hole 162 to connect the circuit board 12 and the carrier 14. The ground probe 133 includes a third pin body portion 1331 and fifth pin heads 1332 and sixth pin heads 1333 at both ends. At least part of the third pin body portion 1331 is disposed in the third pin hole 162. The fifth pin head 1332 is connected to the carrier 14, and the sixth pin head 1333 is welded to the circuit board 12. Further, the carrier 14 is provided with a fourth pin hole 142. The fourth pin hole 142 corresponds to the third pin hole 162 axially and communicates with the third pin hole 162. In this embodiment, at least part of the third pin body portion 1331 is disposed in the third pin hole 162 and at least part of it is disposed in the fourth pin hole 142, and the fifth pin head 1332 is disposed in the fourth pin hole 142 to strengthen the connection between the circuit board 12 and the carrier 14, and further strengthen the grounding performance.

[0069] Please refer to Figures 13 to 15 As shown, the probe group 13 further includes a wave-cutting probe 134. Its length is greater than that of the low-frequency probe 131 and the high-frequency probe 132. The wave-cutting probe 134 connects the ground block 15 and the circuit board 12 and is used to transmit wave-cutting signals. The wave-cutting probe 134 includes a fourth pin body portion 1341 and seventh pin heads 1342 and eighth pin heads 1343 at both ends. The ground block 15 is provided with an axially penetrating fifth pin hole 153. The carrier 14 and the limiting block 16 are respectively provided with a sixth pin hole 143 and a seventh pin hole 163 that axially correspond to the fifth pin hole 153. At least part of the fourth pin body portion 1341 is disposed in the fifth pin hole 153, at least part of it is disposed in the sixth pin hole 143, and at least part of it is disposed in the seventh pin hole 163. At least part of the seventh pin head 1342 is exposed from the third counterbore groove 1121, and the eighth pin head 1343 is welded to the circuit board 12.

[0070] In summary, compared with the prior art, the probe module of the present invention has the following advantages: By providing two positioning shafts 5 with the same height to connect the guide sleeve 3 and the flange 4, both the position accuracy from the flange 4 to the plug 1 and the flatness coincidence degree from the end face of the plug 1 to the bottom of the flange 4 are ensured. The flange hole is enlarged and a slot is opened on the side of the flange 4, so that more cables can pass through the flange 4, and when disassembling and assembling, the cables do not need to pass through the flange hole and can be taken out or inserted from the notch 42 on the side of the flange, thus saving the disassembly and assembly time and not causing secondary damage to the parts during the disassembly and assembly process. A spring 6 is provided between the guide head 2 and the flange 4 to correct the plug 1 to accurately contact the board-to-board connector. Only the two ends of the spring 6 are limited, so the spring 6 has more twisting deformation angles and correspondingly pushes the guide head 2 and the plug 1, so that the board-to-board connector completely enters the plug 1 to ensure accurate and consistent testing.

[0071] The above embodiments are only used to illustrate the present invention and do not limit the technical solutions described in the present invention. The understanding of this specification should be based on those skilled in the art of the relevant technical field. Although this specification has described the present invention in detail with reference to the above embodiments, those of ordinary skill in the art should understand that those skilled in the relevant technical field can still modify the present invention or make equivalent substitutions. All technical solutions and their improvements that do not depart from the spirit and scope of the present invention shall be covered within the scope of the claims of the present invention.

Claims

1. A probe module for testing a board-to-board connector, characterized in that The probe module includes: A plug (1); A guide head (2) fixedly connected to the plug (1), the guide head (2) having an axially penetrating first through hole (21) and a first counterbore groove (22) recessed axially from a side away from the plug (1); A guide sleeve (3) having a sleeve hole (31), at least a part of the plug (1) and the guide head (2) being located in the sleeve hole (31), and the guide head (2) axially abutting against the guide sleeve (3); A flange (4) having an axially penetrating second through hole (41) and a notch (42), the notch (42) radially communicating the second through hole (41) with a radial side surface of the flange (4), the second through hole (41) including a first hole portion (411) and a second hole portion (412), the second hole portion (412) being closer to the guide sleeve (3) than the first hole portion (411), and the aperture of the second hole portion (412) being larger than the aperture of the first hole portion (411); Two positioning shafts (5) provided in parallel, the positioning shafts (5) fixedly connecting the guide sleeve (3) and the flange (4); A spring (6), the two positioning shafts (5) being symmetrically arranged on two radial sides of the spring (6) and there being a gap between the spring (6) and the positioning shafts (5), axial ends of the spring (6) respectively abutting against the guide head (2) and the flange (4), one end of the spring (6) being at least partially located in the first counterbore groove (22), and the other end of the spring (6) being at least partially located in the second hole portion (412); A cable connector (7) physically and electrically connected to the plug (1), and the cable connector (7) sequentially passing through the first through hole (21), the spring (6), and the second through hole (41).

2. The probe module according to claim 1, wherein: The guide sleeve (3) is provided with a first fixing hole (32), and one end of the positioning shaft (5) close to the guide sleeve (3) is provided with a threaded hole (501) recessed axially, and is screwed and fixed in the first fixing hole (32) and the threaded hole (501) by a first fastener (81) to connect the guide sleeve (3) and the positioning shaft (5); The flange (4) is provided with a second fixing hole (43), and one end of the positioning shaft (5) close to the flange (4) is provided with a screw hole (502) recessed axially, and is screwed and fixed in the second fixing hole (43) and the screw hole (502) by a second fastener (82) to connect the flange (4) and the positioning shaft (5).

3. The probe module according to claim 2, wherein: The positioning shaft (5) includes a shaft body (51), a first convex shaft (52) and a second convex shaft (53) protruding from both ends of the shaft body (51). The first fixing hole (32) includes a third hole portion (321) and a fourth hole portion (322). The aperture of the fourth hole portion (322) is larger than that of the third hole portion (321). The first convex shaft (52) is adapted to the fourth hole portion (322). The second fixing hole (43) includes a fifth hole portion (431) and a sixth hole portion (432). The aperture of the sixth hole portion (432) is larger than that of the fifth hole portion (431). The second convex shaft (53) is adapted to the sixth hole portion (432).

4. The probe module according to claim 1, wherein: The second hole portion (412) includes a first sub-hole portion (4121) and a second sub-hole portion (4122). The first sub-hole portion (4121) is closer to the first hole portion (411) than the second sub-hole portion (4122). The aperture of the second sub-hole portion (4122) is larger than that of the first sub-hole portion (4121). The aperture of the first sub-hole portion (4121) is equivalent to the diameter of the spring (6).

5. The probe module according to claim 1, wherein: The cable connector (7) includes a low-frequency cable (71) and a high-frequency cable (72). The width of the notch (42) is larger than the diameters of the low-frequency cable (71) and the high-frequency cable (72).

6. The probe module according to claim 1, wherein: The guiding head (2) further includes a second counterbore groove (23) axially recessed from the side close to the plug (1). At least a part of the plug (1) is located in the second counterbore groove (23).

7. The probe module according to claim 1, wherein: The sleeve hole (31) includes a seventh hole portion (311) and an eighth hole portion (312). The seventh hole portion (311) is closer to the flange (4) than the eighth hole portion (312). The aperture of the seventh hole portion (311) is larger than that of the eighth hole portion (312). The guiding head (2) is adapted to the seventh hole portion (311).

8. The probe module according to claim 7, wherein: The seventh hole portion (311) includes a third sub-hole portion (3111). The aperture of the third sub-hole portion (3111) gradually decreases from the side close to the flange (4) towards the side away from the flange (4). The guiding head (2) includes an oblique cutting portion (24). The oblique cutting portion (24) is adapted to the third sub-hole portion (3111).

9. The probe module according to claim 6, wherein: The plug (1) includes a housing (11), a circuit board (12) and a probe group (13). The housing (11) includes a base body (111) and a convex platform (112). The circuit board (12) is arranged in the second counterbore groove (24). The base body (111) is fixedly connected to the circuit board (12). The cable connector (7) is physically and electrically connected to the circuit board (12) or the probe group (13). At least a part of the probe group (13) is exposed on the side of the convex platform (112) away from the base body (111).

10. The probe module according to claim 9, wherein: The plug (1) further includes a carrier (14) and a grounding block (15). The housing (11) has a receiving cavity (113) that communicates the base body (111) with the boss (112). The carrier (14) and the grounding block (15) are located in the receiving cavity (113). At least a part of the probe group (13) is disposed in the carrier (14) and at least a part of the probe group (13) is disposed in the grounding block (15). The carrier (14) is located between the grounding block (15) and the circuit board (12).

Citation Information

Patent Citations

  • Probe

    CN110133328A

  • Probe assembly

    CN116068235A