Test method and device based on multi-module load box
Through the multi-module load box testing method, using multiple load modules to simulate different load situations, the problem that load box can only simulate limited load situations in the existing technology is solved, and a comprehensive performance test of the vehicle controller is achieved.
Patent Information
- Application Number
- CN202411442140.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-16
- Publication Date
- 2025-02-14
AI Technical Summary
The internal circuit structure of the existing load box is fixed, which can only simulate limited load conditions, making it difficult to cover all load conditions that the vehicle controller may encounter during actual operation, resulting in insufficient comprehensive testing.
Using a multi-module load box test method, the test interfaces of multiple load modules are electrically connected to the test interfaces of the equipment to be tested through multiple load modules, the target test operating conditions are determined according to the target test instructions, the status of the load module is adjusted to simulate different load conditions, and the equipment to be tested is obtained. The response signal of the test condition analysis is carried out.
Through a multi-module load box, simulates the load conditions corresponding to various target test instructions, meets various different load test needs, and achieves efficient and comprehensive performance testing of the equipment to be tested.
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Figure CN119439950A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of controller testing technology, and in particular to a testing method and device based on a multi-module load box. Background Art
[0002] The vehicle controller is the core control system of the vehicle, responsible for coordinating and controlling various subsystems to achieve the normal operation of the vehicle. During the design and development of the vehicle controller, the vehicle controller needs to be fully and strictly tested to verify its performance and reliability. At present, the test of the vehicle controller is usually achieved through a dedicated load box, which simulates a specific test environment and test load for the vehicle controller and receives the response of the vehicle controller, which can reflect the actual working condition of the current vehicle controller.
[0003] However, the current load box has limitations. Because the internal circuit structure of a dedicated load box is fixed, it can only simulate limited load conditions. It is difficult to cover all load conditions that the vehicle controller may encounter during actual operation. The test of the vehicle controller is not comprehensive enough, which may make it impossible for testers to accurately evaluate the performance of the vehicle controller.
[0004] Therefore, how to provide a solution to the above technical problems is a problem that those skilled in the art need to solve. Summary of the invention
[0005] In view of this, an embodiment of the present application provides a testing method and device based on a multi-module load box to solve the problem in the prior art that the load box can only simulate limited load conditions.
[0006] In a first aspect of an embodiment of the present application, a test method based on a multi-module load box is provided. The multi-module load box includes a plurality of load modules, each load module is electrically connected to each test interface of a device under test, and the test method includes:
[0007] receiving a target test instruction, and determining a target test condition based on the target test instruction;
[0008] Based on the target test condition, determine the corresponding target load module among all load modules, and determine the test load state and target test state corresponding to each target load module; the target test state includes at least one of an input excitation state and an output response state;
[0009] Based on the target test condition, determining the input excitation signal of each target load module corresponding to the input excitation state;
[0010] Setting the real-time load state of each target load module to the corresponding test load state;
[0011] Sending a corresponding input excitation signal to each target load module of the corresponding input excitation state to act on the device under test and enable the device under test to generate an excitation response result;
[0012] Obtaining a real-time response signal returned by each target load module corresponding to the output response state based on the stimulus response result;
[0013] The test condition analysis is performed based on all input excitation signals and all real-time response signals to obtain the test results of the device under test corresponding to the target test condition.
[0014] In a second aspect of an embodiment of the present application, a test device based on a multi-module load box is provided, wherein the multi-module load box includes a plurality of load modules, each load module is electrically connected to each test interface of a device under test, and the test device includes:
[0015] An instruction receiving module, used for receiving a target test instruction and determining a target test condition based on the target test instruction;
[0016] A test determination module, for determining a corresponding target load module among all load modules based on a target test condition, and determining a test load state and a target test state corresponding to each target load module; the target test state includes at least one of an input excitation state and an output response state;
[0017] The test determination module is further used to determine the input excitation signal of each target load module corresponding to the input excitation state based on the target test condition;
[0018] A test action module, used to set the real-time load state of each target load module to the corresponding test load state;
[0019] The test action module is further used to send a corresponding input excitation signal to each target load module of the corresponding input excitation state, so as to act on the device under test and enable the device under test to generate an excitation response result;
[0020] The test action module is also used to obtain the real-time response signal returned by each target load module corresponding to the output response state based on the stimulus response result;
[0021] The analysis module is used to perform test condition analysis based on all input excitation signals and all real-time response signals to obtain test results corresponding to the target test conditions of the device under test.
[0022] According to a third aspect of an embodiment of the present application, an electronic device is provided, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the above method when executing the computer program.
[0023] According to a fourth aspect of an embodiment of the present application, a readable storage medium is provided, which stores a computer program, and when the computer program is executed by a processor, the steps of the above method are implemented.
[0024] Compared with the prior art, the beneficial effects of the embodiments of the present application include at least: the embodiments of the present application are based on a multi-module load box including a plurality of load modules, the target load module and its test load state and the target test state are determined in the multi-module load box based on the target test condition, the target load module is adjusted to the test load state, and an input excitation signal is sent to the target load module whose target test state is the input excitation state, and the real-time response result of the target load module whose target test state is the output response state is received, because the target load module is connected to the device under test during the entire test process, the input excitation signal is transmitted to the device under test through the target load module, the device under test generates an excitation response result and returns the corresponding real-time response signal through the target load module, and the test result of the device under test on the target test condition can be obtained by analyzing the input excitation signal and the real-time response signal. In the present application, the target load modules used for testing are various and optional, and the test load state and input excitation signal of the load module are adjustable, so the load conditions corresponding to various target test instructions are simulated by the multi-module load box, so as to meet various different load test requirements, and the performance test of the device under test is realized efficiently and comprehensively. BRIEF DESCRIPTION OF THE DRAWINGS
[0025] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.
[0026] Figure 1 It is a schematic diagram of an application scenario of an embodiment of the present application;
[0027] Figure 2 It is a flow chart of a test method based on a multi-module load box provided in an embodiment of the present application;
[0028] Figure 3 This is an interface display diagram of a human-computer interaction interface provided in an embodiment of the present application:
[0029] Figure 4 This is another interface display diagram of a human-computer interaction interface provided in an embodiment of the present application:
[0030] Figure 5 It is a schematic diagram of data reception under a network setting of an Ethernet communication protocol provided in an embodiment of the present application;
[0031] Figure 6 It is a structural schematic diagram of a test device based on a multi-module load box provided in an embodiment of the present application;
[0032] Figure 7 It is a structural schematic diagram of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION
[0033] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present application.
[0034] Since the internal circuit structure of the dedicated load box is fixed, it can only simulate limited load conditions, and it is difficult to cover all load conditions that the vehicle controller may encounter during actual operation, and the test of the vehicle controller is not comprehensive enough. To this end, this embodiment proposes a test method based on a multi-module load box with flexibly controllable internal state to achieve multiple test conditions and improve test efficiency.
[0035] A testing method and device based on a multi-module load box according to an embodiment of the present application will be described in detail below with reference to the accompanying drawings.
[0036] Figure 1 1 is a schematic diagram of an application scenario of an embodiment of the present application. The application scenario may include a terminal device 101, a multi-module load box 102, and a device to be tested 103. The multi-module load box 102 includes a plurality of load modules, one end of each load module is connected to the terminal device 101, and the other end is connected to the test interface of the device to be tested 103. The terminal device 101 can control the real-time load status of each load module through the connection of the dotted line, and can communicate with the load module through the connection of the solid line. The terminal device 101 can also be integrated with the multi-module load box 102 into a whole.
[0037] Figure 2 It is a flow chart of a testing method based on a multi-module load box provided in an embodiment of the present application. Figure 2 The test method can be Figure 1 The terminal device executes. Figure 2 As shown, the test method includes:
[0038] S201: receiving a target test instruction, and determining a target test condition based on the target test instruction;
[0039] S202: Based on the target test condition, determine a corresponding target load module among all load modules, and determine a test load state and a target test state corresponding to each target load module; the target test state includes at least one of an input excitation state and an output response state;
[0040] S203: Determine the input excitation signal of each target load module corresponding to the input excitation state based on the target test condition;
[0041] S204: setting the real-time load state of each target load module to the corresponding test load state;
[0042] S205: Sending a corresponding input excitation signal to each target load module in a corresponding input excitation state to act on the device under test and enable the device under test to generate an excitation response result;
[0043] S206: Acquire a real-time response signal returned by each target load module corresponding to the output response state based on the stimulus response result;
[0044] S207: Perform test condition analysis according to all input excitation signals and all real-time response signals to obtain test results of the device under test corresponding to the target test condition.
[0045] Among them, in this embodiment, the multi-module load box includes multiple load modules, and each load module is electrically connected to each test interface of the device under test. The multi-module load box is connected to the device under test, and the execution subject of this method sends an input excitation signal to control the multi-module load box to simulate the test environment for the device under test. The device under test takes action based on the test environment. The multi-module load box monitors the relevant action signal and returns a real-time response signal to the execution subject of this method. The test condition analysis can be performed according to the input excitation signal and the real-time response signal.
[0046] Specifically, the method of this embodiment determines the target test condition according to the target test instruction, determines the load module to be used in this test as the target load module based on the target test condition, determines the test load state and the target test state of the target load module, sets the target load module to the test load state, sends a corresponding input excitation signal to the target load module whose target test state is the input excitation state, and receives a real-time response signal returned by the target load module whose target test state is the output response state; the target load module that receives the input excitation signal provides a simulated test environment for the device under test as an excitation; the device under test performs corresponding actions after sensing the test environment through the test interface as a response to the excitation, that is, an excitation response result, and the corresponding load module can receive the excitation response result through the test interface and return a real-time response signal to the execution subject of this method; the test condition analysis is performed according to the input excitation signal and the real-time response signal to determine the performance of the current device under test.
[0047] It can be understood that the multi-module load box in this embodiment includes multiple load modules, the target load module is optional, the test load state and the target test state of the target load module are optional, the input excitation signal can be set, and the control of the multi-module load box is extremely flexible, so that the multi-module load box can be controlled to simulate a rich test environment, meet a variety of different target test instructions, and realize the performance test of the equipment to be tested efficiently and comprehensively at a lower cost.
[0048] It is understandable that in this embodiment, the device under test can be a vehicle controller, the device under test can also be a controller unit of a vehicle subsystem, or a controller in other fields other than the vehicle control field, or other electrical equipment other than the controller, without specific limitation. The device under test is provided with one or more test interfaces for connecting to the corresponding load module and sending and receiving information.
[0049] Specifically, feasible target test conditions usually correspond to the device under test, that is, the test environment corresponding to the target test conditions should be able to be sensed and acted upon by the device under test. For example, when the device under test is a vehicle controller, common target test conditions include but are not limited to vehicle starting, acceleration, deceleration, steering and braking.
[0050] Specifically, the target test condition can usually be described by a DBC (Database for CAN, a data format applied to CAN) file, and the DBC file can define the load modules required for a test condition and the related information of each load module. After receiving the target test instruction sent by the human-computer interaction module, the target test condition corresponding to the target test instruction can be analyzed, and the DBC file of the target test condition can be used to determine the target load module and related information.
[0051] Furthermore, the various load modules in the multi-module load box can be functionally divided into circuit loads and communication channels.
[0052] The load module corresponding to the circuit load includes a high-side impedance load module, a low-side impedance load module, and an H-bridge load module. The H-bridge load module includes an H-bridge structure and a motor. The motor is connected to the test interface through the H-bridge structure. The power range of the motor can be 1 to 100W. The high-side impedance load module is an impedance load module connected to the power supply. The low-side impedance load module is an impedance load module connected to the ground. The impedance load module includes one or more impedance loads. The impedance load is a resistor, a capacitor, or an inductor. The impedance range of the resistor can be 0-100kΩ. When the impedance load module includes multiple impedance loads, the connection relationship of the impedance load can be flexibly set, and there is no restriction here. The impedance load can be a load with a fixed impedance value, and the impedance load can also be set to a load with a variable impedance value. When there are two test load states with different impedance values in two consecutive tests, the previous target load module with a fixed impedance value can be replaced with another target load module with a fixed impedance value, or the same target load module with a variable impedance value can be continuously used to reduce replacement costs.
[0053] The load modules corresponding to the communication channels include digital communication load modules and analog communication load modules. The digital communication load modules are used to communicate with the device under test using digital signals, and the analog communication load modules are used to communicate with the device under test using analog signals. Electrical components may also be provided on the signal paths of the digital communication load modules and the analog communication load modules as required.
[0054] Therefore, the multiple load modules included in the multi-module load box specifically include:
[0055] Various types of high side impedance load modules, low side impedance load modules, H-bridge load modules, digital communication load modules, and analog communication load modules;
[0056] The test load status of each load module includes the load on / off status;
[0057] The test load states of the high-side impedance load module and the low-side impedance load module also include a target impedance value.
[0058] It can be understood that the load on-off state is specifically on or off, specifically refers to the on-off state of the load module and the test interface, which can be controlled by the on-off of the path switch in the load module. Usually, the load on-off state of the target load module is on, and the load on-off state of other load modules other than the target load module is off. The specific load on-off state can be selected and set according to the actual situation of the target test condition.
[0059] It is understandable that the test load state of the high-side impedance load module and the low-side impedance load module includes the specific impedance value of the impedance load. In the case where the impedance load module and the specific impedance value are proposed in the target test condition, the target impedance value can be first determined based on the specific impedance value, and then a target load module that meets the target impedance value can be determined in the load module with a fixed impedance value. Alternatively, a load module with a variable impedance value can be selected as the target load module, and the actual load state of the target load module can be adjusted according to the target impedance value corresponding to the target test condition.
[0060] It is understandable that if the target test condition includes multiple continuous tests, and the target impedance value changes according to the load curve during the test, a load module with a variable impedance value can be selected considering the test efficiency, and the impedance value can be adjusted accordingly according to the load curve. Specifically, when the target load module includes a high-side impedance load module or a low-side impedance load module, the process of determining the test load state corresponding to each target load module includes:
[0061] Determine a load curve variation array of a high-side impedance load module or a low-side impedance load module;
[0062] The load curve variation array includes multiple target impedance values that vary with the test conditions.
[0063] Further, in the case where the target load module includes a high-side impedance load module or a low-side impedance load module, the process of setting the real-time load state of each target load module to the corresponding test load state includes:
[0064] Based on the load curve change array, the real-time load state of the high-side impedance load module or the low-side impedance load module is set to a target impedance value corresponding to the current test condition.
[0065] It is understandable that in a target load circuit with a variable impedance value, the change of the real-time load state should follow the current test conditions and conform to the load curve change array.
[0066] It is understandable that the test conditions include the number of tests or other test instructions. As the test conditions change, the target impedance value changes. The adjustment accuracy of the target impedance value is related to the adjustable accuracy of the impedance load, which can be set or selected according to actual conditions.
[0067] It is understandable that the digital communication load module includes at least one of a controller area network CAN (Controller Area Network) communication load module, a local interconnect network LIN (Local Interconnect Network) communication load module, and an Ethernet communication load module, and may also include communication load modules of other communication protocols, which are not limited here. Therefore, the method of this embodiment can support multiple communication protocols, has high versatility, and can be applied to various types of vehicles.
[0068] It can be understood that in addition to the above load modules, the multi-module load box also includes a power module for powering the load module, and the voltage range can be 0-12V. The specific electrical parameters of the power module for powering the load module can be selected or set according to actual conditions.
[0069] It can be understood that during the test, the input excitation signal and the real-time response signal can be divided into two categories: digital signal and analog signal. The corresponding type of load module needs to be selected according to the different types. Accordingly, the input excitation signal corresponding to each target load module corresponding to the input excitation state is an analog input signal or a digital input signal;
[0070] The analog input signal includes at least one of a direct current signal, a sine wave signal, a square wave signal, a pulse width modulation signal, and a random noise signal.
[0071] It can be understood that the purpose of the analog input signal is to simulate various electrical signals, such as voltage, current, etc. The specific numerical expressions of these electrical signals are set according to the target test conditions. Common expressions include DC, sine wave, square wave, PWM (Pulse Width Modulation), random noise, etc.
[0072] Accordingly, the purpose of the digital input signal is to simulate various communication information, such as various control signals, status information, etc. input to the device under test, such as motor control signals, brake pressure control signals, etc.
[0073] It can be understood that the method of this embodiment records all load modules involved in a test process as target load modules, and determines the target test state of each target load module according to the use requirements of the target load module in the target test condition, wherein the target load module used to simulate the test environment is the input excitation state, and the target load module used to receive the excitation response result of the device under test is the output response state. The target load module corresponding to the input excitation state receives the corresponding input excitation signal and simulates the test environment for the device under test, and the target load module in the output response state returns the corresponding real-time response signal, reflecting the response of the device under test based on the test environment. One end of each load module is connected to the device under test through the test interface, and the other end is connected to the execution subject of this method, thereby achieving the effect of receiving the input excitation signal sent by the execution subject or returning the real-time response signal to the execution subject.
[0074] It can be understood that, in a specific embodiment, before performing the actual actions S204-S206 on the multi-module load box, it is also possible to check whether the target load module is normally connected to the test interface of the device under test. If so, continue S204-S206, if not, output connection alarm information to indicate the information of the load module that is not normally connected. This check can ensure the effective execution of subsequent test actions. At this time, before sending the corresponding input excitation signal to each target load module of the corresponding input excitation state to act on the device under test and make the device under test generate an excitation response result, it also includes:
[0075] Check whether all target load modules are electrically connected to the corresponding test interfaces;
[0076] If yes, executing the step of sending a corresponding input excitation signal to each target load module in the corresponding input excitation state to act on the device under test and enable the device under test to generate an excitation response result;
[0077] If not, a connection warning message is output to the display device, where the connection warning message is used to indicate the target load module that is not normally electrically connected to the corresponding test interface.
[0078] It is understandable that after receiving the connection warning information, the display device can directly display the connection warning information, or based on the connection warning information, display the position and connection status of each load module in a more intuitive position diagram, and distinguish between target load modules that are normally electrically connected and those that are not normally electrically connected. The position diagram can be represented by an LED array, where each LED light represents a corresponding load module, and the color or brightness of the LED light represents the connection status of the load module and whether it is a target load module; the position diagram can also be represented by a dot diagram array on the display screen, which is similar to the LED array.
[0079] It can be understood that based on the description of the method of the embodiment of the present application, taking the vehicle controller as the device to be tested as an example, using a multi-module load box for testing, the complete test scheme can be as follows:
[0080] (1) Connect the vehicle controller and the multi-module load box.
[0081] Verify that all connections are correct.
[0082] Identify the target test conditions that need to be simulated, which refers to actual vehicle conditions, such as starting, acceleration, deceleration, steering, braking, etc.
[0083] Start the power supply of the vehicle controller and multi-module load box.
[0084] (2) Test starts.
[0085] Receive the target test instruction, determine the target test condition corresponding to the target test instruction, load the corresponding DBC file, and determine the target load module and corresponding status information through the DBC file. The status information includes the test load status and the input excitation signal.
[0086] According to the preset target test conditions, the state information of the target load module is controlled, and the corresponding control signal is sent through the control module of the load box. In some embodiments, the high and low side loads are turned on (assuming that the corresponding real vehicle function is to turn on the low beam and fog light signals), and the H-bridge load (corresponding to the high beam signal) is disconnected to simulate the test conditions of turning on the low beam and fog lights and turning off the high beam. The underlying logic of the above-mentioned real vehicle conditions, such as starting and accelerating, is to control the corresponding real vehicle functions by controlling the current size of different load types, so the real-time load state of the target load module can be adjusted in real time according to the target test conditions.
[0087] (2)Data monitoring.
[0088] Get the real-time response signal. The real-time response signal is the signal after the stimulus response result of the vehicle controller passes through the target load module. The stimulus response result includes the input / output data of the vehicle controller, including sensor data, control commands and status signals, etc. It also includes the working status information of the vehicle controller, which is used to indicate whether the vehicle controller is running stably under the current test conditions.
[0089] Save real-time response signals in time.
[0090] Perform test condition analysis based on input excitation signals and real-time response signals. The analysis includes:
[0091] Check whether there is any abnormal data or error and analyze the cause.
[0092] Generate data reports under different test conditions.
[0093] It can be understood that in this embodiment, multiple channels are used for signal transmission and signal acquisition, and corresponding signal data are collected, processed and stored in real time, and data of multiple channels are recorded synchronously to ensure the consistency of timestamps.
[0094] It can be understood that the present embodiment can receive the target test instruction issued by the user through the human-computer interaction interface and display the test results to the user. During the entire test process, the user can also further issue the target test instruction through the human-computer interaction interface, set the specific target load module and the related information of the target load module, and can also retrieve the related signal through the human-computer interaction interface, so that the user can monitor the load module based on the test results and issue new target test instructions through the human-computer interaction interface to update the target test condition, such as Figure 3 and Figure 4 As shown. Among them, Figure 3 The interface displays the changes of each signal. Figure 4 An interface is displayed for monitoring and management of more specific test processes.
[0095] It can be understood that the multi-module load box in this embodiment is compatible with multiple communication protocols. To ensure smooth transmission of signals, the execution subject of this embodiment can also set up its own network according to needs, such as Figure 5 As shown, Figure 5 A schematic diagram of data reception in a network setting of an Ethernet communication protocol.
[0096] The method of the embodiment of the present application is carried out based on a multi-module load box including a plurality of load modules. Based on the target test condition, the target load module and its test load state and the target test state are determined in the multi-module load box, the target load module is adjusted to the test load state, and an input excitation signal is sent to the target load module whose target test state is the input excitation state, and the real-time response result of the target load module whose target test state is the output response state is received. Since the target load module is connected to the device under test during the entire test process, the input excitation signal is transmitted to the device under test through the target load module, the device under test generates an excitation response result and returns the corresponding real-time response signal through the target load module, and the test result of the device under test on the target test condition can be obtained by analyzing the input excitation signal and the real-time response signal. In the present application, the target load modules used for testing are variously optional, and the test load state and input excitation signal of the load module are adjustable. Therefore, the load conditions corresponding to various target test instructions are simulated by the multi-module load box, thereby meeting various different load test requirements, and realizing the performance test of the device under test efficiently and comprehensively.
[0097] All the above optional technical solutions can be combined in any way to form optional embodiments of the present application, and will not be described in detail here. It should be understood that the size of the sequence number of each step in the above embodiment does not mean the order of execution, and the execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiment of the present application.
[0098] The following is an embodiment of the device of the present application, which can be used to execute the embodiment of the method of the present application. For details not disclosed in the embodiment of the device of the present application, please refer to the embodiment of the method of the present application.
[0099] Figure 6 Schematic diagram of a test device based on a multi-module load box provided in an embodiment of the present application. The multi-module load box includes multiple load modules, each of which is electrically connected to each test interface of the device under test. Figure 6 As shown, the test device based on the multi-module load box includes:
[0100] An instruction receiving module 601 is used to receive a target test instruction and determine a target test condition based on the target test instruction;
[0101] The test determination module 602 is used to determine the corresponding target load module among all load modules based on the target test condition, and determine the test load state and target test state corresponding to each target load module; the target test state includes at least one of an input excitation state and an output response state;
[0102] The test determination module 602 is further used to determine the input excitation signal of each target load module corresponding to the input excitation state based on the target test condition;
[0103] A test action module 603, used to set the real-time load state of each target load module to the corresponding test load state;
[0104] The test action module 603 is further used to send a corresponding input excitation signal to each target load module in a corresponding input excitation state, so as to act on the device under test and enable the device under test to generate an excitation response result;
[0105] The test action module 603 is also used to obtain the real-time response signal returned by each target load module corresponding to the output response state based on the stimulus response result;
[0106] The analysis module 604 is used to perform test condition analysis based on all input excitation signals and all real-time response signals to obtain test results corresponding to the target test conditions of the device under test.
[0107] The device of the embodiment of the present application is based on a multi-module load box including a plurality of load modules. Based on the target test condition, the target load module and its test load state and the target test state are determined in the multi-module load box, the target load module is adjusted to the test load state, and an input excitation signal is sent to the target load module whose target test state is the input excitation state, and the real-time response result of the target load module whose target test state is the output response state is received. Since the target load module is connected to the device under test during the entire test process, the input excitation signal is transmitted to the device under test through the target load module, the device under test generates an excitation response result and returns the corresponding real-time response signal through the target load module, and the test result of the device under test on the target test condition can be obtained by analyzing the input excitation signal and the real-time response signal. In the present application, the target load modules used for testing are various and optional, and the test load state and input excitation signal of the load module are adjustable. Therefore, the load conditions corresponding to various target test instructions are simulated by the multi-module load box, thereby meeting various different load test requirements, and realizing the performance test of the device under test efficiently and comprehensively.
[0108] In an exemplary embodiment, the multiple load modules included in the multi-module load box specifically include:
[0109] Various types of high side impedance load modules, low side impedance load modules, H-bridge load modules, digital communication load modules, and analog communication load modules;
[0110] The test load status of each load module includes the load on / off status;
[0111] The test load states of the high-side impedance load module and the low-side impedance load module also include a target impedance value.
[0112] In an exemplary embodiment, when the target load module includes a high-side impedance load module or a low-side impedance load module, the test determination module is specifically used to:
[0113] Determine a load curve variation array of a high-side impedance load module or a low-side impedance load module;
[0114] The load curve variation array includes multiple target impedance values that vary with the test conditions.
[0115] In an exemplary embodiment, when the target load module includes a high-side impedance load module or a low-side impedance load module, the test action module is specifically used to:
[0116] Based on the load curve change array, the real-time load state of the high-side impedance load module or the low-side impedance load module is set to a target impedance value corresponding to the current test condition.
[0117] In an exemplary embodiment, the digital communication load module includes at least one of a controller area network (CAN) communication load module, a local interconnect network (LIN) communication load module, and an Ethernet communication load module.
[0118] In an exemplary embodiment, the input excitation signal corresponding to each target load module corresponding to the input excitation state is an analog input signal or a digital input signal;
[0119] The analog input signal includes at least one of a direct current signal, a sine wave signal, a square wave signal, a pulse width modulation signal, and a random noise signal.
[0120] In an exemplary embodiment, the test action module is further configured to:
[0121] Check whether all target load modules are electrically connected to the corresponding test interfaces;
[0122] If yes, executing the step of sending a corresponding input excitation signal to each target load module in the corresponding input excitation state to act on the device under test and enable the device under test to generate an excitation response result;
[0123] If not, a connection warning message is output to the display device, where the connection warning message is used to indicate the target load module that is not normally electrically connected to the corresponding test interface.
[0124] Figure 7 Schematic diagram of an electronic device 7 provided in an embodiment of the present application. Figure 7 As shown, the electronic device 7 of this embodiment includes: a processor 701, a memory 702, and a computer program 703 stored in the memory 702 and executable on the processor 701. When the processor 701 executes the computer program 703, the steps in the above-mentioned method embodiments are implemented. Alternatively, when the processor 701 executes the computer program 703, the functions of the modules / units in the above-mentioned device embodiments are implemented.
[0125] The electronic device 7 may be a desktop computer, a notebook, a PDA, a cloud server, or other electronic device. The electronic device 7 may include, but is not limited to, a processor 701 and a memory 702. Those skilled in the art will appreciate that Figure 7 The electronic device 7 is merely an example and does not limit the electronic device 7 , and may include more or less components than those shown in the figure, or different components.
[0126] The processor 701 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc.
[0127] The memory 702 may be an internal storage unit of the electronic device 7, for example, a hard disk or memory of the electronic device 7. The memory 702 may also be an external storage device of the electronic device 7, for example, a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. equipped on the electronic device 7. The memory 702 may also include both an internal storage unit of the electronic device 7 and an external storage device. The memory 702 is used to store computer programs and other programs and data required by the electronic device.
[0128] Those skilled in the art can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example. In actual applications, the above-mentioned functions can be assigned to different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiments can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units.
[0129] If the integrated module / unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a readable storage medium, such as a computer-readable storage medium. Based on this understanding, the present application implements all or part of the processes in the above-mentioned embodiment method, and can also be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a readable storage medium, and the computer program can implement the steps of the above-mentioned various method embodiments when executed by the processor. The computer program may include computer program code, which may be in source code form, object code form, executable file or some intermediate form. The readable storage medium may include: any entity or device capable of carrying computer program code, recording medium, U disk, mobile hard disk, disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal and software distribution medium, etc.
[0130] The above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.
Claims
1. A test method based on a multi-module load box, characterized in that: The multi-module load box includes multiple load modules, each of which is electrically connected to each test interface of the device to be tested. The test method includes: receiving a target test instruction, and determining a target test condition based on the target test instruction; Based on the target test condition, a corresponding target load module is determined in all the load modules, and a test load state and a target test state corresponding to each target load module are determined; the target test state includes at least one of an input excitation state and an output response state; Based on the target test condition, determining an input excitation signal of each of the target load modules corresponding to the input excitation state; Setting the real-time load state of each target load module to the corresponding test load state; Sending the corresponding input excitation signal to each target load module corresponding to the input excitation state, so as to act on the device under test and enable the device under test to generate an excitation response result; Acquire a real-time response signal returned by each of the target load modules corresponding to the output response state based on the stimulus response result; A test condition analysis is performed based on all the input excitation signals and all the real-time response signals to obtain a test result of the device under test corresponding to the target test condition.
2. The method according to claim 1, characterized in that The multiple load modules included in the multi-module load box specifically include: Multiple types of high side impedance load modules, low side impedance load modules, H-bridge load modules, digital communication load modules, and analog communication load modules; The test load state of each load module includes a load on-off state; The test load states of the high-side impedance load module and the low-side impedance load module also include target impedance values.
3. The method according to claim 2, characterized in that In the case where the target load module includes the high-side impedance load module or the low-side impedance load module, the process of determining the test load state corresponding to each of the target load modules includes: Determining a load curve change array of the high-side impedance load module or the low-side impedance load module; The load curve variation array includes a plurality of target impedance values that vary with test conditions.
4. The method according to claim 3, characterized in that In the case where the target load module includes the high-side impedance load module or the low-side impedance load module, the process of setting the real-time load state of each target load module to the corresponding test load state includes: Based on the load curve change array, the real-time load state of the high-side impedance load module or the low-side impedance load module is set to the target impedance value corresponding to the current test condition.
5. The method according to claim 2, characterized in that: The digital communication load module includes at least one of a controller area network (CAN) communication load module, a local interconnect network (LIN) communication load module and an Ethernet communication load module.
6. The method according to claim 1, characterized in that The input excitation signal corresponding to each of the target load modules corresponding to the input excitation state is an analog input signal or a digital input signal; The analog input signal includes at least one of a direct current signal, a sine wave signal, a square wave signal, a pulse width modulation signal, and a random noise signal.
7. The method according to any one of claims 1 to 6, characterized in that Before sending the corresponding input excitation signal to each target load module corresponding to the input excitation state to act on the device under test and enable the device under test to generate an excitation response result, the method further includes: Detecting whether all the target load modules are electrically connected to the corresponding test interfaces normally; If yes, executing the step of sending the corresponding input excitation signal to each target load module corresponding to the input excitation state to act on the device under test and enable the device under test to generate an excitation response result; If not, a connection warning message is output to the display device, where the connection warning message is used to indicate that the target load module is not normally electrically connected to the corresponding test interface.
8. A test device based on a multi-module load box, characterized in that: The multi-module load box includes a plurality of load modules, each of which is electrically connected to each test interface of the device to be tested. The test device includes: An instruction receiving module, used for receiving a target test instruction and determining a target test condition based on the target test instruction; A test determination module, used to determine a corresponding target load module among all the load modules based on the target test condition, and determine a test load state and a target test state corresponding to each of the target load modules; the target test state includes at least one of an input excitation state and an output response state; The test determination module is further used to determine the input excitation signal of each target load module corresponding to the input excitation state based on the target test condition; A test action module, used to set the real-time load state of each target load module to the corresponding test load state; The test action module is further used to send the corresponding input excitation signal to each target load module corresponding to the input excitation state, so as to act on the device under test and enable the device under test to generate an excitation response result; The test action module is further used to obtain a real-time response signal returned by each target load module corresponding to the output response state based on the stimulus response result; The analysis module is used to perform test condition analysis based on all the input excitation signals and all the real-time response signals to obtain the test result of the device under test corresponding to the target test condition.
9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 7 are implemented.
10. A readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 7 are implemented.
Citation Information
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