Local temperature control laser scanning galvanometer service life test device and test method

By designing a local temperature-controlled laser scanning galvanometer life test device, the problem of difficulty in testing large-scale laser galvanometers at different temperatures in the prior art is solved, and effective temperature regulation and environmental adaptability of laser galvanometer components are achieved. test.

CN119469677AActive Publication Date: 2025-02-18CHINA ELECTRONICS RELIABILITY AND ENVIRONMENTAL TESTING INSTITUTE ((THE FIFTH INSTITUTE OF ELECTRONICS MINISTRY OF INDUSTRY AND INFORMATION TECHNOLOGY) (CHINA SAIBAO LABORATORY)
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Patent Information

Application Number
CN202411384876.0
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-09-30
Publication Date
2025-02-18
Estimated Expiration
2044-09-30

AI Technical Summary

Technical Problem

Due to the limited size of the heating device, the existing laser galvanometer testing device is difficult to test large-sized laser galvanometers at different temperatures, resulting in the inability to effectively evaluate its environmental adaptability.

Method used

A local temperature-controlled laser scanning galvanometer life test device is designed, including a test bench, a temperature adjustment mechanism, a laser and a position detector. The temperature adjustment mechanism realizes centralized heating of the laser galvanometer assembly through heating fans and hot air ducts, and adjusts its temperature through heating pipes of different specifications.

Benefits of technology

It realizes effective temperature adjustment of large-size laser galvanometers, and can test their environmental adaptability at different temperatures, improving the accuracy and efficiency of the test.

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Abstract

The invention relates to a local temperature control laser scanning galvanometer service life test device and a test method, the local temperature control laser scanning galvanometer service life test device comprises a test bench, a laser galvanometer assembly, a temperature adjusting mechanism, a laser and a position detector, the temperature adjusting mechanism comprises a heating fan and a hot air pipe; one end of the hot air pipe is fixedly communicated with the output end of the heating fan, the other end of the hot air pipe is arranged outside the laser galvanometer assembly in a sleeving mode, concentrated heating of the laser galvanometer assembly is achieved, heating pipes of different specifications are matched with the laser galvanometer assemblies of different specifications, and therefore the temperature of the laser galvanometer assembly is adjusted, and the laser galvanometer assembly can be heated conveniently. And the laser and the position detector are matched to detect the environment adaptability of the laser galvanometer assembly.
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Description

Technical Field

[0001] The present application relates to the technical field of laser manufacturing and additive manufacturing, and in particular to a local temperature-controlled laser scanning galvanometer life test device and test method. Background Art

[0002] Galvanometers are high-precision scanning devices that play an increasingly important role in today's laser precision micromachining applications. Therefore, the requirements for the product quality of galvanometers are becoming increasingly stringent, so that galvanometers undergo multiple inspection processes before leaving the factory to ensure that the galvanometers leaving the factory have product quality that meets the standards.

[0003] However, the existing laser galvanometer testing device and testing method are limited by the size of the heating device, which makes it impossible or difficult to test the environmental adaptability of the galvanometer at different temperatures for a laser galvanometer that is too large. Summary of the invention

[0004] Based on this, it is necessary to provide a local temperature-controlled laser scanning galvanometer life test device and test method to solve the problem that the laser galvanometer with too large specifications cannot or is difficult to test the environmental adaptability of the galvanometer at different temperatures due to the size of the heating device.

[0005] In a first aspect, an embodiment of the present application provides a local temperature-controlled laser scanning galvanometer life test device, the local temperature-controlled laser scanning galvanometer life test device comprising:

[0006] A test bench, the test bench is used to place a laser galvanometer assembly, the laser galvanometer assembly includes a galvanometer motor and a lens, the galvanometer motor is fixed to the test bench, the lens is fixed to the output end of the galvanometer motor, and the galvanometer motor can drive the lens to rotate along the axial direction of the output end of the galvanometer motor;

[0007] A temperature regulating mechanism, wherein the temperature regulating mechanism comprises a heating fan and a hot air pipe, wherein one end of the hot air pipe is connected to the heating fan to receive the air blown by the heating fan; the other end of the hot air pipe is sleeved outside the laser galvanometer assembly, and the lens at least partially extends outside the hot air pipe, so that the air blown by the heating fan can flow to the laser galvanometer assembly through the hot air pipe;

[0008] A laser, the laser is located outside the hot air pipe, and the laser can emit laser light to the lens;

[0009] A position detector is located outside the hot air duct, and the position detector can receive the laser reflected by the lens.

[0010] In one embodiment, the hot air duct is U-shaped, and includes an air inlet duct, a connecting pipe and an air outlet duct connected in sequence. One end of the air inlet duct is fixed on the heating fan, and the air outlet duct is sleeved on the outside of the laser galvanometer assembly, and the lens is at least partially located outside the air outlet duct. The connecting pipe is used to connect the air inlet duct and the air outlet duct.

[0011] In one embodiment, the air inlet pipe and the air outlet pipe are extended along a first direction, and the connecting pipe is extended along a second direction;

[0012] The first direction and the second direction are perpendicular to each other.

[0013] In one embodiment, the heating fan includes a motor, a rotating shaft, a plurality of fan blades, and a cover; the rotating shaft is connected to the output end of the motor, the plurality of fan blades are connected to the rotating shaft and are arranged in sequence along the circumference of the rotating shaft, the cover is disposed outside the plurality of fan blades, the cover is provided with an air outlet, and one end of the hot air pipe is connected to the air outlet.

[0014] In one of the embodiments, the locally temperature-controlled laser scanning galvanometer life test device also includes a mounting fixture, the mounting fixture includes a mounting frame and a fixing plate, the mounting frame includes a base and a connecting plate, the base is fixed to the test bench, the connecting plate is extended along a first direction, the bottom of the connecting plate is fixed to the base, the fixing plate is fixedly connected to the connecting plate, and the fixing plate is used to fix the laser galvanometer assembly.

[0015] In one of the embodiments, a slide rail is disposed on the connecting plate, the fixing plate can move along the slide rail in a first direction, and a fastener is disposed on the fixing plate, and the fastener is used to fix the fixing plate on the slide rail.

[0016] In one embodiment, the temperature adjustment mechanism further includes a temperature sensor, which is fixed on the galvanometer motor and is used to detect the temperature of the galvanometer motor.

[0017] In one of the embodiments, the local temperature-controlled laser scanning galvanometer life test device further includes a mounting bracket, which is fixed to the test bench and is used to place the laser and the position detector.

[0018] In one of the embodiments, the local temperature-controlled laser scanning galvanometer life test device further includes a fixing mechanism, which is fixed to the mounting bracket, and is used to fix the laser and the position detector to the mounting bracket.

[0019] In the second aspect, a local temperature controlled laser scanning galvanometer life test method is also provided in the embodiment of the present application, and the test is performed using the above-mentioned local temperature controlled laser scanning galvanometer life test device. The local temperature controlled laser scanning galvanometer life test method comprises the following steps:

[0020] Adjust the laser galvanometer assembly to zero position, and adjust the lens installation angle so that the laser reflected by the lens can fall into the position detector;

[0021] Start the heating fan and set the heating temperature to the test temperature T;

[0022] The temperature of the galvanometer motor is measured by the temperature sensor, and a life index test is performed after the temperature is stabilized.

[0023] Beneficial effects:

[0024] The embodiments of the present application provide a local temperature-controlled laser scanning galvanometer life test device and a test method. The local temperature-controlled laser scanning galvanometer life test device includes a test bench, a laser galvanometer assembly, a temperature adjustment mechanism, a laser and a position detector. The temperature adjustment mechanism includes a heating fan and a hot air pipe. By fixedly connecting one end of the hot air pipe with the output end of the heating fan and sleeved the other end of the hot air pipe on the outside of the laser galvanometer assembly, centralized heating of the laser galvanometer assembly is achieved. By using heating pipes of different specifications in combination with laser galvanometer assemblies of different specifications, the temperature of the laser galvanometer assembly can be adjusted, and then the environmental adaptability of the laser galvanometer assembly can be detected in combination with the laser and the position detector. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 A schematic structural diagram of a laser scanning galvanometer life test device with local temperature control provided in some embodiments of the present application.

[0026] Figure 2 A schematic structural diagram of a mounting fixture and a moving mechanism of a laser scanning galvanometer life test device with local temperature control provided in some embodiments of the present application.

[0027] Figure 3 A schematic diagram of the structure of a heating fan of a laser scanning galvanometer life test device with local temperature control provided in some embodiments of the present application.

[0028] Figure 4 A schematic diagram of the structure of a moving mechanism of a laser scanning galvanometer life test device with local temperature control provided in some embodiments of the present application.

[0029] Figure 5A diagram showing the relationship between the deflection angle of a scanning galvanometer assembly and the displacement detected by a position detector of a laser scanning galvanometer life test device with local temperature control provided in some embodiments of the present application.

[0030] Figure 6 A relationship diagram between the deflection angle of a scanning galvanometer component and the displacement of a reflected light spot of a laser scanning galvanometer life test device with local temperature control provided in some embodiments of the present application.

[0031] Reference numerals:

[0032] 1. Test bench;

[0033] 2. Temperature regulating mechanism; 21. Heating fan; 211. Heating motor; 212. Rotating shaft; 213. Fan blades; 214. Cover body; 215. Heating element; 22. Hot air pipe; 221. Air inlet pipe; 222. Connecting pipe; 223. Air outlet pipe;

[0034] 3. Laser;

[0035] 4. Position detector;

[0036] 5. Mounting fixture; 51. Mounting frame; 511. Base; 512. Connecting plate; 52. Fixing plate;

[0037] 6. Install the bracket;

[0038] 7. Adjustment mechanism; 71. First adjustment assembly; 711. First drive rod; 712. First adjustment platform; 72. Second adjustment assembly; 721. Second drive rod; 722. Second adjustment platform; 73. Angle adjustment assembly; 731. Arc platform; 732. Arc seat;

[0039] 100, laser galvanometer assembly; 101, galvanometer motor; 102, lens;

[0040] X, first direction; Y, second direction; Z, third direction. DETAILED DESCRIPTION

[0041] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are described in detail below in conjunction with the accompanying drawings. In the following description, many specific details are set forth to facilitate a full understanding of the present application. However, the present application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without violating the connotation of the present application, so the present application is not limited by the specific embodiments disclosed below.

[0042] In the description of the present application, it should be understood that if the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. appear, the orientation or position relationship indicated by these terms is based on the orientation or position relationship shown in the accompanying drawings, which is only for the convenience of describing the present application and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present application.

[0043] In addition, if the terms "first" or "second" appear, these terms are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the features. In the description of this application, if the term "plurality" appears, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0044] In this application, unless otherwise clearly specified and limited, if the terms "installed", "connected", "connected", "fixed" and the like appear, these terms should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integrated connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to the specific circumstances.

[0045] In the present application, unless otherwise clearly specified and limited, if there is a description that a first feature is "above" or "below" a second feature, etc., or similar descriptions appear, it may mean that the first and second features are in direct contact, or that the first and second features are in indirect contact through an intermediate medium. Moreover, the first feature being "above", "above" and "above" the second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. The first feature being "below", "below" and "below" the second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0046] It should be noted that if an element is referred to as being "fixed to" or "disposed on" another element, it may be directly on the other element or there may be a central element. If an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. If any, the terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used in this application are for illustrative purposes only and do not represent the only implementation method.

[0047] First, see Figure 1-Figure 2 An embodiment of the present application provides a local temperature-controlled laser scanning galvanometer life test device, which includes a test bench 1, a temperature adjustment mechanism 2, a laser 3 and a position detector 4.

[0048] In the embodiment of the present application, the test bench 1 is used to place the laser galvanometer assembly 100, and the laser galvanometer assembly 100 includes a galvanometer motor 101 and a lens 102. The galvanometer motor 101 is fixed to the test bench 1, and the lens 102 is fixed to the output end of the galvanometer motor 101. The galvanometer motor 101 can drive the lens 102 to rotate along the axial direction of the output end of the galvanometer motor 101.

[0049] The temperature adjustment mechanism 2 includes a heating fan 21 and a hot air pipe 22, one end of the hot air pipe 22 is connected to the heating fan 21 to receive the air blown by the heating fan 21;

[0050] The other end of the hot air pipe 22 is sleeved outside the laser galvanometer assembly 100, and the lens 102 at least partially extends out of the hot air pipe 22, so that the wind blown by the heating fan 21 can flow to the laser galvanometer assembly 100 through the hot air pipe 22;

[0051] The laser 3 is located outside the hot air pipe 22, and the laser 3 can emit laser light to the lens 102;

[0052] The position detector 4 is located outside the hot air pipe 22 , and the position detector 4 can receive the laser reflected by the lens 102 .

[0053] The embodiment of the present application provides a local temperature-controlled laser scanning galvanometer life test device and test method. By fixedly connecting one end of the hot air pipe 22 with the output end of the heating fan 21, and the other end of the hot air pipe 22 is sleeved on the outside of the laser galvanometer assembly 100, centralized heating of the laser galvanometer assembly 100 is achieved, and different specifications of heating pipes are used in conjunction with different specifications of laser galvanometer assemblies 100, so as to adjust the temperature of the laser galvanometer assembly 100, and then cooperate with the laser 3 and the position detector 4 to detect the environmental adaptability of the laser galvanometer assembly 100.

[0054] It should be noted that the first direction X is the X direction, the second direction Y is the Y direction, the third direction Z is the Z direction, and the first direction X, the second direction Y and the third direction Z are perpendicular to each other.

[0055] like Figure 1-Figure 3 As shown, in some embodiments, specifically, the hot air duct 22 is U-shaped, and the hot air duct 22 includes an air inlet duct 221, a connecting pipe 222 and an air outlet duct 223 connected in sequence, one end of the air inlet duct 221 is fixed on the heating fan 21, the air outlet duct 223 is sleeved on the outside of the laser galvanometer assembly 100, and the lens 102 is at least partially located outside the air outlet duct 223, and the connecting pipe 222 is used to connect the air inlet duct 221 and the air outlet duct 223.

[0056] By configuring the hot air pipe 22 to be composed of three sections, namely an air inlet pipe 221, a connecting pipe 222 and an air outlet pipe 223, which are connected in sequence, it is possible to use laser galvanometer assemblies 100 of different specifications only by replacing the air outlet pipe 223, without replacing the entire hot air pipe 22 structure, thereby greatly improving the test efficiency. In addition, if one of the air inlet pipe 221, the connecting pipe 222 and the air outlet pipe 223 is damaged, only the damaged part needs to be replaced, thereby saving the test cost.

[0057] like Figure 1-Figure 3 As shown, in some embodiments, the air inlet pipe 221 and the air outlet pipe 223 are extended along a first direction X, and the connecting pipe 222 is extended along a second direction Y; the first direction X and the second direction Y are perpendicular to each other.

[0058] In the embodiment of the present application, the lens 102 is located at the bottom of the galvanometer motor 101, and the air outlet pipe 223 is correspondingly set to extend along the first direction X, so that the laser galvanometer assembly 100 can be directly installed in the air outlet pipe 223 from top to bottom, and part of the lens 102 can be exposed outside the air outlet pipe 223, so that the lens 102 can reflect the laser emitted by the laser 3 into the position detector 4.

[0059] like Figure 1 and Figure 3 As shown, in some embodiments, the heating fan 21 includes a motor, a rotating shaft 212, a plurality of fan blades 213, and a cover body 214; the rotating shaft 212 is connected to the output end of the motor, the plurality of fan blades 213 are connected to the rotating shaft 212, and are arranged in sequence along the circumference of the rotating shaft 212, the cover body 214 is arranged outside the plurality of fan blades 213, the cover body 214 is provided with an air outlet, and one end of the hot air pipe 22 is connected to the air outlet.

[0060] In addition, in the embodiment of the present application, the heating fan 21 further includes a heating element 215, and the heating element 215 is located between the fan blades 213 and the air outlet. In the embodiment of the present application, the heating element 215 is a heating wire.

[0061] The motor drives the rotating shaft 212 to drive the fan blades 213 to rotate, so that the hot air is blown out, and the hot air enters the hot air pipe 22 to heat the laser galvanometer assembly 100.

[0062] like Figure 2 As shown, in some embodiments, the locally temperature-controlled laser scanning galvanometer life test device also includes a mounting fixture 5, the mounting fixture 5 includes a mounting frame 51 and a fixing plate 52, the mounting frame 51 includes a base 511 and a connecting plate 512, the base 511 is fixed to the test bench 1, the connecting plate 512 is extended along the first direction X, the bottom of the connecting plate 512 is fixed on the base 511, the fixing plate 52 is fixedly connected to the connecting plate 512, and the fixing plate 52 is used to fix the laser galvanometer assembly 100.

[0063] By providing the mounting fixture 5 to fix the laser galvanometer assembly 100 , the laser galvanometer assembly 100 can be made more stable, thereby improving the test quality.

[0064] like Figure 2 As shown, in some embodiments, a slide rail is provided on the connecting plate 512, and the fixing plate 52 can move along the slide rail in the first direction X. A fastener is provided on the fixing plate 52, and the fastener is used to fix the fixing plate 52 on the slide rail.

[0065] By providing a slide rail on the connecting plate 512, the fixed plate 52 is slidably connected to the slide rail, so that the fixed plate 52 can slide along the first direction X, thereby driving the laser galvanometer assembly 100 to move along the first direction X, thereby adjusting the position of the lens 102 in the first direction X, thereby further improving the testing degree of the lens 102, and further improving the product quality of the laser galvanometer assembly 100. In addition, the position of the fixed plate 52 on the slide rail is fixed by fasteners, thereby greatly improving the stability of the laser galvanometer assembly 100 and improving the quality of the experiment.

[0066] like Figure 1-Figure 3 As shown, in some embodiments, the temperature adjustment mechanism 2 further includes a temperature sensor, and the temperature sensor is fixed on the galvanometer motor 101 , and the temperature sensor is used to detect the temperature of the galvanometer motor 101 .

[0067] In an embodiment of the present application, the local temperature-controlled laser scanning galvanometer life test device also includes a temperature control unit, which includes a control screen and a control board. The control screen is electrically connected to the temperature sensor, and the control screen can display the temperature of the laser galvanometer assembly 100. The control board is electrically connected to the heating motor 211, and the control board can control the switch of the heating motor 211, thereby adjusting the temperature of the laser galvanometer assembly 100.

[0068] like Figure 1-Figure 3 As shown, in some embodiments, the local temperature-controlled laser scanning galvanometer life test device further includes a fixing mechanism, which is fixed to the test bench 1 and is used to fix the galvanometer motor 101 .

[0069] like Figure 1-Figure 3 As shown, in some embodiments, the local temperature controlled laser scanning galvanometer life test device also includes a fixing mechanism, which is fixed to the mounting bracket 6, and the fixing mechanism is used to fix the laser 3 and the position detector 4 to the mounting bracket 6.

[0070] By providing a mounting bracket 6 to place the laser 3 and the position detector 4, and fixing the laser 3 and the position detector 4 on the mounting bracket 6 through a fixing mechanism, the placement positions of the laser 3 and the position detector 4 can be fixed, thereby making the laser 3 and the position detector 4 more stable, making the test results more accurate, and by fixing the positions of the laser 3 and the position detector 4, the experimental efficiency can be improved.

[0071] like Figure 2 and Figure 4 As shown, in some embodiments, the locally temperature-controlled laser scanning galvanometer life test device also includes an adjusting mechanism 7, the adjusting mechanism 7 is fixed to the test bench 1, the fixing mechanism is fixed to the adjusting assembly, the adjusting mechanism 7 is used to adjust the position of the fixing mechanism along the second direction Y and along the third direction Z, and the adjusting mechanism 7 can also adjust the inclination angle of the lens 102 relative to the second direction Y.

[0072] By setting up a moving mechanism and fixing the mounting fixture 5 to the moving mechanism, the mounting fixture 5 and the laser galvanometer assembly 100 fixed on the mounting fixture 5 can be driven by the moving mechanism to move along the second direction Y and the third direction Z, and adjust the angle of the lens 102 relative to the second direction Y, thereby greatly improving the moving range of the lens 102, and then improving the testing degree of the lens 102, so that the product quality of the laser galvanometer assembly 100 is further improved.

[0073] like Figure 2 and Figure 4As shown, in some embodiments, the adjustment mechanism 7 includes a first adjustment component 71, the first adjustment component 71 includes a first driving member, a first driving rod 711 and a first adjustment platform 712, the first adjustment platform 712 and the first driving member are arranged on the test bench 1, the first driving member output end is fixedly provided with the first driving rod 711, the first driving member is used to drive the first driving rod 711 to drive the first adjustment platform 712 to move along the second direction Y.

[0074] By driving the first driving rod 711 through the first driving member to drive the first adjustment platform 712 to move along the second direction Y, the movement range of the lens 102 along the second direction Y can be expanded, thereby improving the testing degree of the lens 102, so that the product quality of the laser galvanometer assembly 100 is further improved, and the degree of automation of the laser scanning galvanometer life test device with local temperature control can be improved, so that the experimental efficiency is improved, thereby accelerating the production efficiency of the laser galvanometer assembly 100.

[0075] like Figure 2 and Figure 4 As shown, in some embodiments, the moving mechanism includes a second adjusting component 72, the second adjusting component 72 includes a second driving member, a second driving rod 721 and a second adjusting platform 722, the second moving platform and the second driving member are arranged on the first adjusting platform 712, and the second driving member output end is fixedly provided with the second driving rod 721, and the second driving member can drive the second driving rod 721 to drive the second moving platform to move along the third direction Z.

[0076] By driving the second driving rod 721 through the second driving member to drive the second movable platform to move along the third direction Z, the moving range of the lens 102 along the third direction Z can be expanded, thereby further improving the testing degree of the lens 102, so that the product quality of the laser galvanometer assembly 100 is further improved, and the degree of automation of the laser scanning galvanometer life test device with local temperature control can be improved, so that the experimental efficiency is further improved, thereby accelerating the production efficiency of the laser galvanometer assembly 100100.

[0077] like Figure 2 and Figure 4 As shown, in some embodiments, the adjustment mechanism 7 includes an angle adjustment component 73, the angle adjustment component 73 includes an arc table 731, an arc seat 732 and a third driving member, the arc table 731 and the third driving member are arranged on the second movable platform, the arc table 731 is provided with an arc groove, the arc seat 732 is provided with an arc protrusion, the arc groove and the arc surface of the arc protrusion cooperate, and the third driving member can drive the arc seat 732 to rotate along the arc groove around the axis of the third direction Z.

[0078] By setting an arc-shaped groove on the arc-shaped table 731 and an arc-shaped protrusion on the arc-shaped seat 732, and by using a third driving member to drive the arc-shaped seat 732 to rotate along the arc-shaped groove around the axis of the third direction Z, the angle of the lens 102 relative to the second direction Y can be adjusted, thereby further improving the testing degree of the lens 102, and further improving the product quality of the laser galvanometer assembly 100.

[0079] Second, as Figure 5-Figure 6 As shown, the embodiment of the present application also provides a local temperature controlled laser scanning galvanometer life test method, which uses the above-mentioned local temperature controlled laser scanning galvanometer life test device to perform the test, and the local temperature controlled laser scanning galvanometer life test method includes the following steps:

[0080] Adjust the laser galvanometer assembly 100 to zero position, and adjust the installation angle of the lens 102 so that the laser reflected by the lens 102 can fall into the position detector 4;

[0081] Start the heating fan 21 and set the heating temperature to the test temperature T;

[0082] The temperature sensor is used to measure the temperature of the galvanometer motor 101 , and after the temperature is stabilized, a life index test is performed.

[0083] like Figure 5-Figure 6 As shown, in some embodiments, specifically, a local temperature-controlled laser scanning galvanometer life test device and a laser galvanometer assembly 100 to be tested are started, the monochromatic laser 3 is turned on, and the lens 102 is placed at zero position, and the installation angle of the lens 102 is adjusted to ensure that the light spot appears on the position detector 4 when the lens 102 is at the maximum deflection angle in both the positive and negative directions and when the lens 102 is at zero position.

[0084] In some embodiments, the life index test includes a test before the life test, and the test before the life test is an index test. The index test includes a maximum scanning angle test of the scanning galvanometer, a deflection accuracy test, a linearity test, and a zero deviation test.

[0085] In an embodiment of the present application, the life index test also includes a test during the life test. After the laser galvanometer assembly 100 passes the pre-life test test, the life test test begins. The test time during the life test is 1500 hours, and the test cycle is 24 hours. An index test is carried out in each test cycle to test the maximum scanning angle, deflection accuracy, linearity, and zero position deviation of the laser galvanometer assembly 100.

[0086] In the embodiment of the present application, the life index test also includes a post-life test test. After the laser galvanometer assembly 100 completes the 1500-hour life test, the life test is stopped and a final index test is carried out.

[0087] In some embodiments, after completing the above life index test, if the laser galvanometer assembly 100 has not failed and all index tests meet the requirements, it is considered that the laser galvanometer assembly 100 has passed the life test at temperature T.

[0088] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0089] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be construed as limiting the scope of the patent application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent application shall be subject to the attached claims.

Claims

1. A local temperature controlled laser scanning galvanometer life test device, characterized in that: The local temperature controlled laser scanning galvanometer life test device comprises: A test bench, the test bench is used to place a laser galvanometer assembly, the laser galvanometer assembly includes a galvanometer motor and a lens, the galvanometer motor is fixed to the test bench, the lens is fixed to the output end of the galvanometer motor, and the galvanometer motor can drive the lens to rotate along the axial direction of the output end of the galvanometer motor; A temperature regulating mechanism, wherein the temperature regulating mechanism comprises a heating fan and a hot air pipe, wherein one end of the hot air pipe is connected to the heating fan to receive the air blown by the heating fan; the other end of the hot air pipe is sleeved outside the laser galvanometer assembly, and the lens at least partially extends outside the hot air pipe, so that the air blown by the heating fan can flow to the laser galvanometer assembly through the hot air pipe; A laser, the laser is located outside the hot air pipe, and the laser can emit laser light to the lens; A position detector is located outside the hot air duct, and the position detector can receive the laser reflected by the lens.

2. The local temperature controlled laser scanning galvanometer life test device according to claim 1, characterized in that: The hot air duct is U-shaped, and includes an air inlet duct, a connecting pipe and an air outlet duct connected in sequence. One end of the air inlet duct is fixed on the heating fan, and the air outlet duct is sleeved outside the laser galvanometer assembly, and the lens is at least partially located outside the air outlet duct. The connecting pipe is used to connect the air inlet duct and the air outlet duct.

3. The local temperature controlled laser scanning galvanometer life test device according to claim 2, characterized in that: The air inlet pipe and the air outlet pipe are extended along a first direction, and the connecting pipe is extended along a second direction; The first direction and the second direction are perpendicular to each other.

4. The local temperature controlled laser scanning galvanometer life test device according to claim 1, characterized in that: The heating fan includes a motor, a rotating shaft, a plurality of fan blades, and a cover body; the rotating shaft is connected to the output end of the motor, the plurality of fan blades are connected to the rotating shaft and are arranged in sequence along the circumference of the rotating shaft, the cover body is arranged outside the plurality of fan blades, the cover body is provided with an air outlet, and one end of the hot air pipe is connected to the air outlet.

5. The local temperature controlled laser scanning galvanometer life test device according to claim 1, characterized in that: The locally temperature-controlled laser scanning galvanometer life test device also includes a mounting fixture, which includes a mounting frame and a fixing plate, the mounting frame includes a base and a connecting plate, the base is fixed to the test bench, the connecting plate is extended along a first direction, the bottom of the connecting plate is fixed to the base, the fixing plate is fixedly connected to the connecting plate, and the fixing plate is used to fix the laser galvanometer assembly.

6. The local temperature controlled laser scanning galvanometer life test device according to claim 5, characterized in that: The connecting plate is provided with a slide rail, the fixing plate can move along the slide rail in a first direction, and the fixing plate is provided with a fastener, which is used to fix the fixing plate on the slide rail.

7. The local temperature controlled laser scanning galvanometer life test device according to claim 1, characterized in that: The temperature adjustment mechanism further includes a temperature sensor, which is fixed on the galvanometer motor and is used to detect the temperature of the galvanometer motor.

8. The local temperature controlled laser scanning galvanometer life test device according to claim 1, characterized in that: The local temperature-controlled laser scanning galvanometer life test device further comprises a mounting bracket, which is fixed to the test bench and is used to place the laser and the position detector.

9. The local temperature controlled laser scanning galvanometer life test device according to claim 8, characterized in that: The local temperature-controlled laser scanning galvanometer life test device further includes a fixing mechanism, which is fixed to the mounting bracket and is used to fix the laser and the position detector to the mounting bracket.

10. A local temperature controlled laser scanning galvanometer life test method, characterized in that: The test is performed using the local temperature controlled laser scanning galvanometer life test device as described in any one of claims 1 to 9, and the local temperature controlled laser scanning galvanometer life test method comprises the following steps: Adjust the laser galvanometer assembly to zero position, and adjust the lens installation angle so that the laser reflected by the lens can fall into the position detector; Start the heating fan and set the heating temperature to the test temperature T; The temperature of the galvanometer motor is measured by the temperature sensor, and a life index test is performed after the temperature is stabilized.

Citation Information

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