Testing device and testing method for transmissivity response time

Abstract

The invention relates to a device and a method for testing transmissivity response time. The transmissivity response time testing device comprises a temperature control box; the sample table is arranged in the temperature control box and is used for placing a sample; the light source is arranged outside the temperature control box; the first light guide component penetrates through the temperature control box and is in butt joint with the light source, and the first light guide component is used for conducting at least part of light rays emitted by the light source into the temperature control box and projecting the light rays onto the sample; the photoelectric sensor is arranged outside the temperature control box; the second light guide assembly penetrates through the temperature control box, one end of the second light guide assembly is in butt joint with the photoelectric sensor, the other end of the second light guide assembly is arranged on the side, back to the first light guide assembly, of the sample, and the second light guide assembly is used for receiving at least part of light emitted from the first light guide assembly and penetrating through the sample and conducting the light to the photoelectric sensor. The testing device can realize accurate and reliable measurement.

Description

Technical Field

[0001] The present application relates to the field of optical testing technology, and in particular to a transmittance response time testing device and a testing method. Background Art

[0002] With the rapid development of glass technology, dimming glass has emerged. By changing the size and waveform of the voltage applied to the dimming glass, the transmittance of the dimming glass to light can be changed to achieve different visual effects, thus adapting to different application scenarios and user needs. In vehicles, dimming glass can usually be used as skylights, window glass, rear windshield, etc. according to different needs.

[0003] In low temperature (e.g., below 0°C) or high temperature (e.g., above 80°C) environments, the activity of the dimming glass is affected, which will change the transmittance change curve and transmittance response time of the dimming glass, affecting the user experience. Therefore, it is very important to measure the transmittance response time of the dimming glass in low temperature (e.g., below 0°C) or high temperature (e.g., above 80°C) environments. However, the industry currently lacks devices that can accurately and reliably measure the transmittance response time in low temperature (e.g., below 0°C) or high temperature (e.g., above 80°C) environments. Summary of the invention

[0004] Based on this, it is necessary to provide a transmittance response time testing device and method to accurately and reliably measure the transmittance response time of dimming glass in a low temperature (e.g., below 0°C) environment or a high temperature (e.g., above 80°C) environment.

[0005] A transmittance response time testing device, comprising:

[0006] Temperature control box;

[0007] A sample table, arranged in the temperature control box and used for placing samples;

[0008] A light source is arranged outside the temperature control box;

[0009] A first light guide component, passing through the temperature control box and docking with the light source, the first light guide component is used to conduct at least part of the light emitted by the light source into the temperature control box and project it onto the sample;

[0010] A photoelectric sensor is arranged outside the temperature control box; and

[0011] A second light guide component passes through the temperature control box and is connected to the photoelectric sensor at one end, and the other end is arranged on the side of the sample facing away from the first light guide component, so as to receive at least part of the light emitted from the first light guide component and passing through the sample, and to transmit the light to the photoelectric sensor.

[0012] In the above-mentioned test device, the temperature control box can provide a low temperature (e.g., below 0°C) environment or a high temperature (e.g., above 80°C) environment, and at least part of the light emitted by the light source can be transmitted to the sample through the first light guide component, and then transmitted to the photoelectric sensor through the second light guide component after passing through the sample. The photoelectric sensor can receive the light to obtain information such as the luminous flux of the light, thereby obtaining the transmittance or transmittance response time of the sample in a low temperature environment or a high temperature environment. At the same time, the light source and the photoelectric sensor are arranged outside the temperature control box, and the performance of the light source and the photoelectric sensor will not be affected by the high and low temperature environment in the temperature control box and produce temperature drift, which affects the measurement accuracy of the transmittance or transmittance response time, thereby facilitating accurate and reliable measurement of the transmittance or transmittance response time of the sample in a high and low temperature environment.

[0013] In one embodiment, the first light guide assembly includes a first light guide element and a first projection lens group, the first projection lens group is arranged in the temperature control box and located on one side of the sample, the first light guide element passes through the temperature control box and two ends thereof are respectively connected to the light source and the first projection lens group, at least part of the light emitted by the light source can be conducted by the first light guide element to the first projection lens group, and then collimated by the first projection lens group and projected onto the sample;

[0014] The second light guide assembly includes a second light guide element and a first receiving lens group. The first receiving lens group is arranged in the temperature control box and is located on the side of the sample facing away from the first projection lens group. The second light guide element passes through the temperature control box and its two ends are respectively connected to the first receiving lens group and the photoelectric sensor. The first receiving lens group is used to receive at least part of the light emitted by the first projection lens group and passing through the sample, and guide the light into the second light guide element.

[0015] In one embodiment, the testing device further includes a third light guide component and a fourth light guide component, the third light guide component passes through the temperature control box and one end is connected to the light source, the fourth light guide component passes through the temperature control box and one end is connected to the photoelectric sensor, and the third light guide component and the fourth light guide component are connected to each other at one end inside the temperature control box.

[0016] In one embodiment, the third light guide assembly includes a third light guide element and a second projection lens group, the fourth light guide assembly includes a fourth light guide element and a second receiving lens group, the second projection lens group and the second receiving lens group are located in the temperature control box and are arranged opposite to each other, the two ends of the third light guide element are respectively connected to the light source and the second projection lens group, the two ends of the fourth light guide element are respectively connected to the photoelectric sensor and the second receiving lens group, the second projection lens group has the same structure as the first projection lens group, and the second receiving lens group has the same structure as the first receiving lens group.

[0017] In one embodiment, the testing device further includes a first motion mechanism and a second motion mechanism disposed in the temperature control box, the first projection lens group is disposed on the first motion mechanism, the first motion mechanism can drive the first projection lens group to move in a first direction and a second direction, the first receiving lens group is disposed on the second motion mechanism, the second motion mechanism can drive the first receiving lens group to move in the first direction and the second direction, the first direction and the second direction are two mutually perpendicular directions on a plane perpendicular to the first projection lens group pointing to the first receiving lens group.

[0018] In one embodiment, the first motion mechanism can also drive the first projection lens group to move in a third direction, and the second motion mechanism can also drive the first receiving lens group to move in the third direction, and the third direction is perpendicular to the first direction and the second direction.

[0019] In one embodiment, the first projection lens group and the first receiving lens group are capable of moving synchronously at the same speed and in the same direction in the first direction and the second direction, and the first projection lens group and the first receiving lens group are capable of moving synchronously at the same speed and in opposite directions in the third direction.

[0020] In one embodiment, the first projection lens assembly includes a first lens barrel and at least one lens sealed in the first lens barrel, and the first receiving lens assembly includes a second lens barrel and at least one lens sealed in the second lens barrel;

[0021] Wherein, the testing device further comprises a vacuum pump disposed outside the temperature control box, the vacuum pump being connected to the first lens barrel and the second lens barrel through an air pipe so as to evacuate the first lens barrel and the second lens barrel; or,

[0022] The first lens barrel and the second lens barrel are filled with inert gas.

[0023] In one embodiment, the testing device further includes a power supply element, which is disposed outside the temperature control box and is capable of applying a voltage to a sample located in the temperature control box through a conductive element. The magnitude and waveform of the voltage applied by the power supply element to the sample are adjustable.

[0024] In one embodiment, the temperature in the temperature control box can be adjusted within a range of -40°C to 105°C.

[0025] In one embodiment, the testing device further comprises a filter disposed on the light emitting side of the light source, wherein the filter is capable of transmitting at least a portion of the visible light and filtering out at least a portion of the non-visible light.

[0026] A method for testing transmittance response time, comprising:

[0027] Providing a preset temperature environment and placing the sample in the preset temperature environment, wherein the temperature of the preset temperature environment is -40°C to 105°C;

[0028] receiving light transmitted through the sample to obtain the transmittance of the sample;

[0029] Changing the voltage applied to the sample so that the sample switches from a first performance state to a second performance state, and obtaining a change in transmittance of the sample during the change between the first performance state and the second performance state;

[0030] The response time of the sample switching from the first performance state to the second performance state is obtained according to the transmittance change.

[0031] In one of the embodiments, in one of the first performance state and the second performance state, the voltage applied to the sample is zero.

[0032] In one embodiment, the testing method further comprises:

[0033] Receiving reference light that has not passed through the sample in the preset temperature environment, and acquiring the luminous flux of the reference light;

[0034] The step of receiving light transmitted through the sample to obtain the transmittance of the sample comprises:

[0035] Acquiring the luminous flux of the light passing through the sample;

[0036] The ratio of the luminous flux of the light passing through the sample to the luminous flux of the reference light is obtained to obtain the transmittance of the sample. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] Figure 1 Schematic diagram of the structure of the testing device in some embodiments.

[0038] Figure 2 for Figure 1 A schematic diagram of the structure of the components located in the temperature control box in the test device shown.

[0039] Figure 3 It is a partial enlarged schematic diagram of the testing device at another angle in some embodiments.

[0040] Figure 4 Schematic diagram of the structure of the testing device in some other embodiments.

[0041] 10. Test device; 11. Temperature control box; 12. Industrial control component; 13. Frame; 14. Sample stage; 15. Light source; 16. Photoelectric sensor; 17. First light guide assembly; 171. First light guide element; 172. First projection lens group; 18. Second light guide assembly; 181. Second light guide element; 182. First receiving lens group; 19. Third light guide assembly; 191. Third light guide element; 192. Second projection lens group; 21. Fourth light guide assembly; 211. Fourth light guide element; 212. Second receiving lens group; 22. First motion mechanism; 23. Second motion mechanism; 24. Vacuum pump; 25. Air pipe; 26. Power supply element; 27. Conductive element; 281. First direction; 282. Second direction; 283. Third direction; 30. Sample. DETAILED DESCRIPTION

[0042] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are described in detail below in conjunction with the accompanying drawings. In the following description, many specific details are set forth to facilitate a full understanding of the present application. However, the present application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without violating the connotation of the present application, so the present application is not limited by the specific embodiments disclosed below.

[0043] In the description of the present application, it should be understood that if the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. appear, the orientation or position relationship indicated by these terms is based on the orientation or position relationship shown in the accompanying drawings, which is only for the convenience of describing the present application and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present application.

[0044] In addition, if the terms "first" or "second" appear, these terms are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the features. In the description of this application, if the term "plurality" appears, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0045] In this application, unless otherwise clearly specified and limited, if the terms "installed", "connected", "connected", "fixed" and the like appear, these terms should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integrated connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to the specific circumstances.

[0046] In the present application, unless otherwise clearly specified and limited, if there is a description that a first feature is "above" or "below" a second feature, etc., or similar descriptions appear, it may mean that the first and second features are in direct contact, or that the first and second features are in indirect contact through an intermediate medium. Moreover, the first feature being "above", "above" and "above" the second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. The first feature being "below", "below" and "below" the second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0047] It should be noted that if an element is referred to as being "fixed to" or "disposed on" another element, it may be directly on the other element or there may be a central element. If an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. If any, the terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used in this application are for illustrative purposes only and do not represent the only implementation method.

[0048] See also Figure 1 , Figure 2 and Figure 3 As shown, Figure 1 The structure diagram of the transmittance response time testing device 10 in some embodiments of the present application is shown. Figure 2 for Figure 1 The schematic diagram of the structure of the components located inside the temperature control box 11 in the test device 10 shown in FIG. Figure 3A partial enlarged schematic diagram of the test device 10 at another angle in some embodiments of the present application is shown. The test device 10 provided in the present application can be used to measure the transmittance response time of the sample 30 when switching between two performance states in a low temperature environment (e.g., below 0°C) or a high temperature environment (e.g., above 80°C), or to measure the transmittance of the sample 30 in a low temperature environment or a high temperature environment and in a certain performance state. Among them, the sample 30 involved in the present application can be any applicable dimming element whose transmittance can change with the magnitude or waveform of the voltage applied to the sample 30, and the sample 30 includes but is not limited to dimming films such as polymer dispersed liquid crystal (PDLC) films or electrochromic (EC) films, and can also be a dimming element such as laminated glass with dimming films such as PDLC films or EC films. When the sample 30 is a laminated glass with a dimming film, the sample 30 is not limited to being used in products such as vehicles, for example, it can be used as a skylight, window glass, rear windshield, etc. of a vehicle.

[0049] In this application, the description of different performance states of the sample 30 can be understood as different states of voltage applied to the sample 30, including the state where the voltage applied to the sample 30 is 0, that is, the state where the sample 30 is powered off. In different performance states, the magnitude and / or waveform of the voltage applied to the sample 30 are different, and the transmittance of the sample 30 will also change. The description of the transmittance response time when the sample 30 switches between two performance states can be understood as the time required for the transmittance of the sample 30 to change from a transmittance that can be stably present under one voltage to a transmittance that can be stably present under another voltage when the voltage on the sample 30 changes.

[0050] In some embodiments, the test device 10 includes a temperature control box 11, an industrial control component 12, a frame 13, and a sample stage 14. The temperature control box 11 includes but is not limited to any applicable air-cooled or direct-cooled temperature control component. By adjusting the temperature of the temperature control box 11, a low-temperature environment or a high-temperature environment of a specific temperature can be formed in the temperature control box 11. For example, the industrial control component 12 is electrically connected to the temperature control box 11, and a temperature control panel is provided on the industrial control component 12. By operating the temperature control panel, the internal temperature of the temperature control box 11 can be adjusted. The frame 13 is fixedly arranged in the temperature control box 11, and the sample stage 14 is arranged on the frame 13 and is used to place the sample 30. The sample stage 14 may include a clamp with a flexible protective material, which improves the stability of the sample 30 when it is placed on the sample stage 14 by clamping and fixing the sample 30, and is not easy to scratch or damage the sample 30.

[0051] In some embodiments, the testing device 10 further includes a light source 15, a first light guide component 17, a photoelectric sensor 16, and a second light guide component 18. The light source 15 and the photoelectric sensor 16 are both arranged outside the temperature control box 11, that is, outside the specific temperature environment formed by the temperature control box 11. The light source 15 is used to emit light, and the photoelectric sensor 16 is used to receive light and can convert the optical signal into an electrical signal and transmit it to the industrial control component 12 or other equipment. The first light guide component 17 and the second light guide component 18 both pass through the temperature control box 11, that is, the first light guide component 17 and the second light guide component 18 are partially located outside the temperature control box 11 and partially located inside the temperature control box 11. The portion of the first light guide component 17 located outside the temperature control box 11 is connected to the light source 15 so as to be able to receive and conduct at least part of the light emitted by the light source 15. The ends of the first light guide component 17 and the second light guide component 18 located in the temperature control box 11 are located on opposite sides of the sample 30 and are arranged opposite to each other, so that the light transmitted by the first light guide component 17 can be projected onto the sample 30 and enter the second light guide component 18 after passing through the sample 30. The part of the second light guide component 18 located outside the temperature control box 11 is connected to the photoelectric sensor 16, and the second light guide component 18 can transmit at least part of the received light to the photoelectric sensor 16.

[0052] It is understandable that the above-mentioned test device 10 provides a specific temperature environment through the temperature control box 11, and receives the light emitted by the light source 15 and transmitted through the sample 30 through the photoelectric sensor 16. The transmittance and transmittance response time of the sample 30 under a specific temperature environment can be obtained by manual calculation, industrial computer or other equipment software calculation. For example, the luminous flux of the light after passing through the sample 30 can be obtained by the electrical signal converted by the photoelectric sensor 16, and the ratio of the luminous flux of the light emitted by the light source 15 can be regarded as the transmittance of the sample 30 under a specific temperature environment and a specific voltage state. When the voltage applied to the sample 30 changes under a specific temperature environment, so that the sample 30 switches from the first performance state to the second performance state, the transmittance change curve of the sample 30 switching from the first performance state to the second performance state is obtained by obtaining the transmittance of the sample 30 multiple times. According to the corresponding relationship between the transmittance and time in the transmittance change curve, the switching time required for the sample 30 to switch from one stable transmittance to another stable transmittance is obtained, and the transmittance response time of the sample 30 between the first performance state and the second performance state under a specific temperature environment can be obtained. Of course, this is only one of the calculation methods for the transmittance and transmittance response time of the sample 30. The method for obtaining the transmittance and transmittance response time is not limited to this, as long as the transmittance and transmittance response time of the sample 30 can be obtained according to the light received by the photoelectric sensor 16.

[0053] In addition, the above-mentioned test device 10 sets the light source 15 and the photoelectric sensor 16 outside the temperature control box 11, and the performance of the light source 15 and the photoelectric sensor 16 will not be affected by the high and low temperature environment in the temperature control box 11 and produce temperature drift. For example, the light wavelength and light intensity of the light source 15, the photoelectric conversion efficiency of the photoelectric sensor 16 and other performance are not easily affected by the temperature in the temperature control box 11 that is different from the external environment, thereby avoiding the high and low temperature environment in the temperature control box 11 to affect the measurement accuracy of the transmittance or transmittance response time, which is conducive to accurately and reliably measuring the transmittance or transmittance response time of the sample 30 in the high and low temperature environment. When the sample 30 is a laminated glass used in a vehicle, the accurate and reliable measurement results of the transmittance and transmittance response time in the high and low temperature environment can provide a more accurate reference for the application scenarios and performance design of the vehicle.

[0054] It should be noted that, since the activity of the sample 30 such as the dimming element is more easily affected in a low temperature environment or a high temperature environment, resulting in a long transmittance response time or a sudden change in transmittance, which affects the user experience, the above record uses the transmittance and transmittance response time of the sample 30 measured in a low temperature environment or a high temperature environment as an example. In fact, in the test device 10 provided in the present application, the temperature control box 11 can provide a low temperature environment of -40°C to 0°C and a high temperature environment of 80°C to 105°C, and can also provide a temperature environment corresponding to any temperature value in the range of -40°C to 105°C to meet different test requirements.

[0055] In some embodiments, the light source 15 includes but is not limited to any type of standard light source such as CIE A light source 15, D65 light source 15, etc. The testing device 10 may also include a filter (not shown) disposed on the light emitting side of the light source 15. The filter may be disposed between the light source 15 and the first light guide component 17, or disposed in the first light guide component 17, and is used to filter the light emitted by the light source 15. The filter can transmit visible light and filter non-visible light to adapt to the use scenario of the sample 30 on the vehicle. Depending on different scenarios and samples 30, the light source 15 may also have other different options. The photoelectric sensor 16 involved in the present application includes but is not limited to any applicable sensor element that can convert an optical signal into an electrical signal using the photoelectric effect to obtain the transmittance of the sample 30.

[0056] Combination Figure 2 and Figure 3As shown, in some embodiments, the first light guide assembly 17 includes a first light guide element 171 and a first projection lens group 172, and the second light guide assembly 18 includes a second light guide element 181 and a first receiving lens group 182. The first projection lens group 172 and the first receiving lens group 182 are both located in the temperature control box 11 and are respectively located on opposite sides of the sample 30. The first light guide element 171 passes through the temperature control box 11 and its two ends are respectively connected to the light source 15 and the first projection lens group 172, and the second light guide element 181 passes through the temperature control box 11 and its two ends are respectively connected to the first receiving lens group 182 and the photoelectric sensor 16. It can be understood that at least part of the light emitted by the light source 15 can be transmitted by the first light guiding element 171 to the first projection lens group 172, and then projected onto the sample 30 after being collimated by the first projection lens group 172, and at least part of the light can pass through the sample 30 and be emitted onto the first receiving lens group 182, and then be received by the first receiving lens group 182 and introduced into the second light guiding element 181, and then be emitted onto the photoelectric sensor 16 after being transmitted by the second light guiding element 181.

[0057] The first projection lens group 172 and the first receiving lens group 182 can both include one or more lenses with optical power, which can shape the light. The first projection lens group 172 can at least collimate the light transmitted by the first light guide element 171, so that the light can be more accurately projected onto the sample 30, for example, vertically onto the sample 30, and then projected onto the first receiving lens group 182 through the sample 30. The first receiving lens group 182 can at least converge the light and guide it onto the second light guide element 181. The first receiving lens group 182 and the first projection lens group 172 can improve the accuracy of the measurement optical path and the light collection efficiency, thereby improving the measurement accuracy of the transmittance of the sample 30. The number and type of lenses in the projection lens group and the receiving lens group involved in the present application are not limited, and can be specifically designed according to the light shaping requirements. The light-guiding elements involved in the present application include but are not limited to optical fibers, etc. For example, they can be optical fibers with a metal flexible protective layer. The diameter of the light-guiding element can be less than 6 mm, and both ends are connected to the light source 15, the projection lens group, the receiving lens group or the photoelectric sensor 16 and other elements through metal threaded interfaces.

[0058] Further, refer to Figure 2 and Figure 4As shown, in some embodiments, the testing device 10 further includes a third light guide component 19 and a fourth light guide component 21. The third light guide component 19 passes through the temperature control box 11 and one end is connected to the light source 15. The fourth light guide component 21 passes through the temperature control box 11 and one end is connected to the photoelectric sensor 16. The third light guide component 19 and the fourth light guide component 21 are connected to each other at one end located in the temperature control box 11. It can be understood that, in addition to entering the first light guide element 171, part of the light emitted by the light source 15 enters the third light guide component 19, is conducted to the inside of the temperature control box 11 by the third light guide component 19, and then is emitted from the third light guide component 19 into the fourth light guide component 21, and is conducted to the photoelectric sensor 16 by the fourth light guide component 21. The light emitted from the third light guide component 19 to the fourth light guide component 21 does not pass through the sample 30. By setting the third light guide component 19 and the fourth light guide component 21, a specific temperature environment is formed by passing through the temperature control box 11, and reference light is formed without passing through the sample 30. The reference light is used for reference with the light passing through the sample 30, which can reduce variables in the measurement process. For example, it can reduce the impact of temperature drift caused by the internal temperature environment of the temperature control box 11 on the test results, thereby facilitating the accuracy of the transmittance and transmittance response time measurement of the sample 30.

[0059] It can be understood that when the photoelectric sensor 16 is able to obtain the luminous flux of the light passing through the sample 30 and the luminous flux of the reference light, if the luminous flux of the light emitted from the light source 15 to the first light guide component 17 and the third light guide component 19 is equal, the ratio of the luminous flux of the light passing through the sample 30 to the luminous flux of the reference light can be regarded as the transmittance of the sample 30. In some embodiments, the testing device 10 may also include a beam splitter (not shown) disposed between the light source 15, the first light guide component 17 and the third light guide component 19, the beam splitter is used to equally divide the light emitted by the light source 15 and emit it to the first light guide component 17 and the third light guide component 19 respectively, so that the luminous flux entering the first light guide component 17 and the third light guide component 19 is equal, thereby improving the accuracy of the measurement. Of course, when a reference light path is provided, the transmittance of the sample 30 may also be calculated by any other applicable method.

[0060] Further, in some embodiments, the third light guide assembly 19 includes a third light guide element 191 and a second projection lens group 192, the fourth light guide assembly 21 includes a fourth light guide element 211 and a second receiving lens group 212, the second projection lens group 192 and the second receiving lens group 212 are both located in the temperature control box 11 and are arranged opposite to each other, the two ends of the third light guide element 191 are respectively connected to the light source 15 and the second projection lens group, and the two ends of the fourth light guide element 211 are respectively connected to the second receiving lens group 212 and the photoelectric sensor 16. Part of the light emitted by the light source 15 can be transmitted to the second projection lens group 192 through the third light guide element 191, and then emitted from the second projection lens group 192 to the second receiving lens group 212, and then transmitted to the photoelectric sensor 16 through the fourth light guide element 211.

[0061] In some embodiments, the second projection lens group 192 has the same structure as the first projection lens group 172, for example, the second projection lens group 192 has the same number of lenses and lens types as the first projection lens group 172, and the second projection lens group 192 and the first projection lens group 172 have the same light shaping effect. The second receiving lens group 212 has the same structure as the first receiving lens group 182, for example, the second receiving lens group 212 has the same number of lenses and lens types as the first receiving lens group 182, and has the same light shaping effect. Such a configuration is conducive to reducing the variable factors between the test light passing through the sample 30 and the reference light not passing through the sample 30, preventing the influence of the variable factors on the measurement results, thereby improving the measurement accuracy of the transmittance of the sample 30. In some embodiments, the third light guide element 191 and the first light guide element 171 may also have the same structure, and the fourth light guide element 211 and the second light guide element 181 may also have the same structure, so as to further reduce the variable factors between the two light paths.

[0062] Please see again Figure 2 In some embodiments, the testing device 10 further includes a first motion mechanism 22 and a second motion mechanism 23 disposed in the temperature control box 11. The first motion mechanism 22 and the second motion mechanism 23 may be both disposed on the frame 13 and respectively located on opposite sides of the sample 30. The first projection lens group 172 is disposed on the first motion mechanism 22. The first motion mechanism 22 can drive the first projection lens group 172 to move in a first direction 281 and a second direction 282. The first receiving lens group 182 is disposed on the second motion mechanism 23. The second motion mechanism 23 can drive the first receiving lens group 182 to move in a first direction 281 and a second direction 282. The first direction 281 and the second direction 282 are two mutually perpendicular directions on a plane perpendicular to the first projection lens group 172 and pointing to the first receiving lens group 182. The plane where the first direction 281 and the second direction 282 are located may be perpendicular to the optical axes of the first projection lens group 172 and the first receiving lens group 182.

[0063] By setting the first motion mechanism 22 and the second motion mechanism 23 to drive the first projection lens group 172 and the first receiving lens group 182 to move relative to the sample 30 on a plane perpendicular to the optical axis, the alignment accuracy between the first projection lens group 172 and the first receiving lens group 182 can be adjusted to improve the accuracy of measurement, and the light can also be transmitted through different positions of the sample 30 to meet different types of samples 30 and different testing requirements. In some embodiments, when the first projection lens group 172 and the first receiving lens group 182 are opposite to each other, driven by the first motion mechanism 22 and the second motion mechanism 23, the first projection lens group 172 and the first receiving lens group 182 move synchronously at the same speed and in the same direction in the first direction 281 and the second direction 282, and the first projection lens group 172 and the first receiving lens group 182 can be accurately aligned while adjusting the positions of the first projection lens group 172 and the first receiving lens group 182 relative to the sample 30, thereby improving the measurement accuracy.

[0064] Furthermore, in some embodiments, the first motion mechanism 22 can also drive the first projection lens group 172 to move in the third direction 283, and the second motion mechanism 23 can also drive the first receiving lens group 182 to move in the third direction 283, the third direction 283 is perpendicular to the first direction 281 and the first direction 281, and the third direction 283 is parallel to the optical axes of the first projection lens group 172 and the first receiving lens group 182. The movement of the first projection lens group 172 and the first receiving lens group 182 in the third direction 283 can adjust the distance between the first projection lens group 172 and the first receiving lens group 182, and between the first projection lens group 172 and the first receiving lens group 182 and the sample 30 to adapt to different types of samples 30 and measurement requirements, and also can prevent the first projection lens group 172 and the first receiving lens group 182 from interfering with the sample 30 during the process of taking and placing the sample 30, thereby causing scratches or damage to the sample 30. When the light source 15 emits light, the first projection lens group 172 and the first receiving lens group 182 can be respectively contacted with the opposite sides of the sample 30 through the first motion mechanism 22 and the second motion mechanism 23, or can be spaced apart from the sample 30 to reduce damage to the sample 30 during the measurement process.

[0065] In some embodiments, driven by the first motion mechanism 22 and the second motion mechanism 23, the first projection lens group 172 and the first receiving lens group 182 move at the same speed and in opposite directions in the third direction 283, and precise alignment between the first projection lens group 172 and the first receiving lens group 182 can be maintained during the movement, thereby improving measurement accuracy.

[0066] In some embodiments, the first motion mechanism 22 and the second motion mechanism 23 may both use three electric screws with different extension directions to realize the movement of the first projection lens group 172 and the first receiving lens group 182 in three directions. In some embodiments, the first motion mechanism 22 and the second motion mechanism 23 may also establish a linkage relationship through any applicable transmission elements such as gears and synchronous belts to realize the synchronous movement of the first projection lens group 172 and the first receiving lens group 182 in the first direction 281 and the second direction 282, or realize the synchronous movement in the third direction 283, which is conducive to reducing the preparation cost and power consumption of the test device 10. Of course, the first projection lens group 172 and the first receiving lens group 182 may also use any other applicable methods such as handwheel drive to realize the movement relative to the sample 30, which will not be repeated here.

[0067] refer to Figure 1 and Figure 2 As shown, in some embodiments, the first projection lens group 172 includes a first lens barrel (not shown) and at least one lens sealed in the first lens barrel, and the first receiving lens group 182 includes a second lens barrel (not shown) and at least one lens sealed in the second lens barrel. The test device 10 also includes a vacuum pump 24 disposed outside the temperature control box 11, and the vacuum pump 24 is connected to the first lens barrel and the second lens barrel through an air pipe 25, so as to evacuate the first lens barrel and the second lens barrel. The vacuum pump 24 is arranged to evacuate the first lens barrel and the second lens barrel, which can reduce the condensation and frost of the lens or other optical elements in the optical path due to too low temperature, resulting in changes in the shaping effect of the light, thereby facilitating the improvement of the measurement accuracy of the sample 30. In other embodiments, the first lens barrel and the second lens barrel can also be filled with an inert gas such as nitrogen instead of the vacuum design, which can also avoid the phenomenon of condensation and frost of the lens, while reducing the preparation cost and energy consumption of the test device 10.

[0068] It can be understood that the second projection lens group 192 and the second receiving lens group 212 may also include a lens barrel and a lens sealed in the lens barrel, and the lens barrels of the second projection lens group 192 and the second receiving lens group 212 may also be connected to the vacuum pump 24, or filled with inert gas to further reduce the variables between the first projection lens group 172 and the first receiving lens group 182, and between the second projection lens group 192 and the second receiving lens group 212.

[0069] refer to Figure 2As shown, in some embodiments, the sample 30 is provided with two electrodes, and the test device 10 further includes a power supply element 26, which includes but is not limited to any applicable oscilloscope power transmitter, and the power supply element 26 is arranged outside the temperature control box 11, and can apply voltage to the sample 30 located in the temperature control box 11 through any applicable conductive element 27 such as a wire, for example, two conductive elements 27 are used to apply positive and negative voltages to the two electrodes of the sample 30 respectively. The magnitude and waveform of the voltage applied by the power supply element 26 to the sample 30 are adjustable, which is conducive to adapting to different types of samples 30 and different detection requirements. For example, according to different requirements, the power supply element 26 can apply 0-220V AC or 110V DC to the sample 30, and can generate any applicable waveform such as a sine wave, a square wave, a triangle wave, etc. Arranging the power supply element 26 outside the temperature control box 11 is conducive to controlling the power supply element 26, and is also conducive to avoiding the influence of the temperature in the temperature control box 11 on the performance of the power supply element 26, thereby facilitating the improvement of the measurement accuracy.

[0070] Based on the test device 10 described in any of the above embodiments, the present application also provides a test method for transmittance response time. The test method can use the test device 10 described in any of the above embodiments to measure the transmittance and transmittance response time of the sample 30, or can use any other applicable device for measurement, as long as the test steps of any of the following embodiments can be implemented. In some embodiments, the test method includes:

[0071] A preset temperature environment is provided, and the sample 30 is placed in the preset temperature environment, wherein the temperature of the preset temperature environment is any one within the range of -40°C to 105°C.

[0072] The light transmitted through the sample 30 is received to obtain the transmittance of the sample 30 .

[0073] The voltage applied to the sample 30 is changed so that the sample 30 switches from the first performance state to the second performance state, and the transmittance change of the sample 30 during the change between the first performance state and the second performance state is obtained.

[0074] The corresponding time when the sample 30 switches from the first performance state to the second performance state is obtained according to the transmittance change.

[0075] It is understood that in some embodiments, a preset temperature environment can be provided by the temperature control box 11, and the preset temperature environment includes but is not limited to the low temperature environment or high temperature environment described above, and the light passing through the sample 30 can be received by the second light guide component 18 and the light can be transmitted to the photoelectric sensor 16. In the process of obtaining the transmittance change of the sample 30 during the change between the first performance state and the second performance state, the transmittance of the sample 30 at multiple time points can be obtained, and a transmittance change curve of the sample 30 can be drawn. The method of obtaining the transmittance of the sample 30 according to the received light and obtaining the transmittance response time according to the transmittance change can be obtained from the above description, and will not be repeated here.

[0076] The voltage applied to the sample 30 in the first performance state and the second performance state is not limited, and can be specifically designed according to the test requirements and the type of sample 30. In some embodiments, the sample 30 is powered off in the first performance state, that is, the voltage applied to the sample 30 is 0, and the sample 30 is powered on in the second performance state, and the power-on type includes but is not limited to 0-220V AC voltage, or 110V DC voltage. At this time, the measured response time can be regarded as the opening response time of the sample 30, that is, the response time ON. In other embodiments, the sample 30 is powered on in the first performance state and powered off in the second performance state. At this time, the measured response time can be regarded as the closing response time of the sample 30, that is, the response time OFF.

[0077] In some embodiments, the testing method further comprises:

[0078] The reference light that has not passed through the sample 30 is received in a preset temperature environment, and the luminous flux of the reference light is acquired.

[0079] The step of receiving the light transmitted through the sample 30 to obtain the transmittance of the sample 30 includes:

[0080] Acquiring the luminous flux of the light passing through the sample 30;

[0081] The ratio of the luminous flux of the light passing through the sample 30 to the luminous flux of the reference light is obtained to obtain the transmittance of the sample 30 .

[0082] It is understood that in some embodiments, the reference light can be transmitted to the photoelectric sensor 16 through the third light guide component 19 and the fourth light guide component 21 of the test device 10. The reference light comparison can effectively reduce the variable factors in the measurement process and improve the accuracy and precision of the measurement.

[0083] Table 1 below shows the transmittance and response time of sample 30 at different temperatures measured by the test method and the test device 10 in one embodiment, wherein sample 30 is a dimming product with a built-in dimming film layer, the power-on transmittance represents the transmittance of sample 30 in the power-on state, the power-off transmittance represents the transmittance of sample 30 in the power-off state, normal temperature represents 25°C, and the meanings of response time ON and response time OFF can be obtained from the above records. It should be noted that the sample 30 used in Table 1 has a higher transmittance in the power-on state and a lower transmittance in the power-off state, so it can be in a bright state in the power-on state and in a dark state in the power-off state. In other embodiments, the sample 30 may also have a lower transmittance in the power-on state and a higher transmittance in the power-off state, so it is in a dark state in the power-on state and in a bright state in the power-off state. At this time, the response time ON should be understood as the response time of sample 30 switching from the dark state to the bright state, that is, the response time from the power-on state to the power-off state, and the response time OFF should be understood as the response time of sample 30 switching from the bright state to the dark state, that is, the response time from the power-off state to the power-on state.

[0084] Table 1

[0085]

[0086] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0087] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be construed as limiting the scope of the patent application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent application shall be subject to the attached claims.

Claims

1. A transmittance response time testing device, characterized in that: include: Temperature control box; A sample table, arranged in the temperature control box and used for placing samples; A light source is arranged outside the temperature control box; A first light guide component, passing through the temperature control box and docking with the light source, the first light guide component is used to conduct at least part of the light emitted by the light source into the temperature control box and project it onto the sample; A photoelectric sensor is arranged outside the temperature control box; and, A second light guide component passes through the temperature control box and is connected to the photoelectric sensor at one end, and the other end is arranged on the side of the sample facing away from the first light guide component, so as to receive at least part of the light emitted from the first light guide component and passing through the sample, and to transmit the light to the photoelectric sensor.

2. The testing device according to claim 1, characterized in that: The first light guide assembly includes a first light guide element and a first projection lens group. The first projection lens group is arranged in the temperature control box and located on one side of the sample. The first light guide element passes through the temperature control box and two ends thereof are respectively connected to the light source and the first projection lens group. At least part of the light emitted by the light source can be conducted to the first projection lens group by the first light guide element, and then collimated by the first projection lens group and projected onto the sample. The second light guide assembly includes a second light guide element and a first receiving lens group. The first receiving lens group is arranged in the temperature control box and is located on the side of the sample facing away from the first projection lens group. The second light guide element passes through the temperature control box and its two ends are respectively connected to the first receiving lens group and the photoelectric sensor. The first receiving lens group is used to receive at least part of the light emitted by the first projection lens group and passing through the sample, and guide the light into the second light guide element.

3. The testing device according to claim 2, characterized in that: The testing device also includes a third light guide component and a fourth light guide component. The third light guide component passes through the temperature control box and one end is connected to the light source. The fourth light guide component passes through the temperature control box and one end is connected to the photoelectric sensor. The third light guide component and the fourth light guide component are connected to each other at one end inside the temperature control box.

4. The testing device according to claim 3, characterized in that: The third light guide component includes a third light guide element and a second projection lens group, the fourth light guide component includes a fourth light guide element and a second receiving lens group, the second projection lens group and the second receiving lens group are located in the temperature control box and are arranged opposite to each other, the two ends of the third light guide element are respectively connected to the light source and the second projection lens group, the two ends of the fourth light guide element are respectively connected to the photoelectric sensor and the second receiving lens group, the second projection lens group has the same structure as the first projection lens group, and the second receiving lens group has the same structure as the first receiving lens group.

5. The testing device according to claim 2, characterized in that: The testing device also includes a first motion mechanism and a second motion mechanism disposed in the temperature control box, the first projection lens group is disposed on the first motion mechanism, the first motion mechanism can drive the first projection lens group to move in a first direction and a second direction, the first receiving lens group is disposed on the second motion mechanism, the second motion mechanism can drive the first receiving lens group to move in the first direction and the second direction, the first direction and the second direction are two mutually perpendicular directions on a plane perpendicular to the first projection lens group pointing to the first receiving lens group.

6. The testing device according to claim 5, characterized in that: The first motion mechanism can also drive the first projection lens group to move in a third direction, and the second motion mechanism can also drive the first receiving lens group to move in the third direction, and the third direction is perpendicular to the first direction and the second direction.

7. The testing device according to claim 6, characterized in that: The first projection lens group and the first receiving lens group can move synchronously at the same speed and in the same direction in the first direction and the second direction, and the first projection lens group and the first receiving lens group can move synchronously at the same speed and in opposite directions in the third direction.

8. The testing device according to claim 2, characterized in that: The first projection lens assembly includes a first lens barrel and at least one lens sealed in the first lens barrel, and the first receiving lens assembly includes a second lens barrel and at least one lens sealed in the second lens barrel; Wherein, the testing device further comprises a vacuum pump disposed outside the temperature control box, the vacuum pump being connected to the first lens barrel and the second lens barrel through an air pipe so as to evacuate the first lens barrel and the second lens barrel; or, The first lens barrel and the second lens barrel are filled with inert gas.

9. The testing device according to any one of claims 1 to 8, characterized in that: The testing device also includes a power supply element, which is arranged outside the temperature control box and can apply voltage to the sample in the temperature control box through a conductive element. The magnitude and waveform of the voltage applied by the power supply element to the sample are adjustable.

10. The testing device according to any one of claims 1 to 8, characterized in that: The temperature in the temperature control box can be adjusted in the range of -40°C to 105°C.

11. The testing device according to any one of claims 1 to 8, characterized in that: The testing device further comprises a filter arranged on the light-emitting side of the light source, wherein the filter can transmit at least a part of the visible light and filter out at least a part of the non-visible light.

12. A method for testing transmittance response time, characterized in that: include: Providing a preset temperature environment and placing the sample in the preset temperature environment, wherein the temperature of the preset temperature environment is -40°C to 105°C; receiving light transmitted through the sample to obtain the transmittance of the sample; Changing the voltage applied to the sample so that the sample switches from a first performance state to a second performance state, and obtaining a change in transmittance of the sample during the change between the first performance state and the second performance state; The response time of the sample switching from the first performance state to the second performance state is obtained according to the transmittance change.

13. The testing method according to claim 12, characterized in that: In one of the first performance state and the second performance state, the voltage applied to the sample is zero.

14. The testing method according to claim 12, characterized in that: The test method also includes: Receiving reference light that has not passed through the sample in the preset temperature environment, and acquiring the luminous flux of the reference light; The step of receiving light transmitted through the sample to obtain the transmittance of the sample comprises: Acquiring the luminous flux of the light passing through the sample; The ratio of the luminous flux of the light passing through the sample to the luminous flux of the reference light is obtained to obtain the transmittance of the sample.

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