Capacitor high and low temperature fast switching aging test device and method thereof

Abstract

The invention relates to the technical field of capacitor aging test, in particular to a capacitor high-low temperature fast switching aging test device and method. Comprising a high-temperature box and a low-temperature box, a transmission mechanism is arranged on one side wall of the high-temperature box, and a first linkage block is clamped to one side wall of the high-temperature box; one side of the first linkage block is rotatably connected with a loading block, and the upper and lower ends of the loading block are movably clamped with a plurality of groups of capacitors; the two groups of connecting blocks are fixedly connected with the side wall of the low-temperature box; the transmission mechanism drives the loading block to move into the high-temperature box, so that the capacitor inserted into the bottom end of the loading block enters the high-temperature box for high-temperature aging test, the transmission mechanism drives the loading block to move out of the high-temperature box, and meanwhile, the loading block drives the capacitor to turn over, so that rapid position switching of the capacitor is realized. And the low-temperature box and the loading block are rapidly clamped, so that rapid cooling of the capacitor is realized.

Description

Technical Field

[0001] The invention belongs to the technical field of capacitor aging testing, and in particular relates to a capacitor high-low temperature fast switching aging testing device and a method thereof. Background Art

[0002] In the circuit system, capacitors are commonly used electrical components and play an important role in tuning, bypassing, coupling, filtering and other circuits. In the production process of capacitors, aging tests are required to eliminate defective products. When traditional capacitors are subjected to aging tests, high and low temperatures are often switched in a box, which easily causes energy waste and long waiting time, affecting test efficiency.

[0003] After searching, in the prior art, announcement number: CN218412741U, announcement date: 2023-01-31, discloses an aging test device, and in particular, relates to an aging test device for capacitor production. The technical problem of the utility model is: to provide an aging test device for capacitor production that can speed up the cooling rate of the capacitor and improve the test efficiency. An aging test device for capacitor production includes a base, a first shell, a first box door, a second box door and a heating box, etc. The top of the base is connected to the first shell, the front side of the first shell is rotatably connected to the first box door, the top of the first shell is connected to the heating box, and the front side of the heating box is rotatably connected to the second box door. With the cooperation of the first motor and the heater, the present application can blow hot air onto the capacitor for aging test, and multiple capacitors can be aging tested at one time, with high efficiency. The second motor drives the second fan blade to rotate, generating wind to cool the capacitor, speed up the cooling rate of the capacitor, and improve the test efficiency.

[0004] However, the device still has the following defects: although it can speed up the cooling speed of the capacitor, when the device performs aging test on the capacitor, the heating and cooling are both carried out in the same heating box, and it is impossible to achieve rapid switching between high temperature and low temperature. The waiting time is long, which affects the test efficiency of the capacitor, and the conversion between high temperature and low temperature in the same box is likely to cause a lot of energy waste. Summary of the invention

[0005] In view of the above problems, the present invention provides a capacitor high and low temperature fast switching aging test device and method thereof, comprising a high temperature box and a low temperature box, a transmission mechanism is provided on one side wall of the high temperature box, and a first linkage block is clamped on one side wall of the high temperature box; One side of the first linkage block is rotatably connected to a loading block, and upper and lower ends of the loading block are movably connected to a plurality of groups of capacitors; A fixed shaft is installed on the first linkage block, and two groups of connecting blocks are sleeved on the fixed shaft, and the two groups of connecting blocks are fixedly connected to the side wall of the low temperature box; The transmission mechanism drives the loading block to move into the high temperature box, so that the capacitor plugged into the bottom of the loading block enters the high temperature box for high temperature aging test. The transmission mechanism drives the loading block to move out of the high temperature box, and at the same time, the loading block drives the capacitor to flip, so as to realize the rapid switching of the position of the capacitor. By quickly connecting the low temperature box and the loading block, the capacitor can be quickly cooled down.

[0006] Furthermore, a cover plate is provided on the low-temperature box, a refrigeration mechanism is provided on the cover plate, the refrigeration mechanism is interconnected with the interior of the low-temperature box, two groups of first hinged seats are symmetrically provided at the box opening of the high-temperature box, both groups of the first hinged seats are rotatably connected to electric push rods, and two groups of second hinged seats are symmetrically provided at the bottom end of the cover plate, and the two groups of the second hinged seats are respectively rotatably connected to the output ends of the two groups of electric push rods.

[0007] Furthermore, a through groove is provided on one side wall of the high temperature box, and the through groove is movably fitted with a first linkage block. A storage groove is provided on the other side wall of the high temperature box, and a folding plate is arranged in the storage groove. Several groups of first limit bolts are arranged on both sides of the folding plate. Both side walls of the high temperature box are provided with sliding grooves, and the two groups of sliding grooves are movably fitted with several groups of first limit bolts respectively. A second linkage block is slidably connected in the high temperature box, one end of the second linkage block is rotatably connected to the loading block, and the other end of the second linkage block is rotatably connected to one end of the folding plate. Several groups of heating tubes are arranged in the high temperature box, and a temperature sensor is arranged on the inner wall of the high temperature box.

[0008] Furthermore, the transmission mechanism includes a transmission box, in which a transmission gear is rotatably connected, a first motor is mounted on the transmission box, and an output end of the first motor is transmission-connected to the transmission gear.

[0009] Furthermore, loading slots are provided at both upper and lower ends of the loading block, and loading parts are installed in two groups of the loading slots. The loading part includes a test seat, which is electrically connected to an external power supply. Several groups of test sockets are provided on the test seat, and pads are provided on the test seat. Pins of several groups of the capacitors are inserted into the test sockets after passing through the pads for power-on testing. Second grooves are provided on both side walls of the loading block, and second racks are installed in the two groups of the second grooves.

[0010] Furthermore, a second motor is installed on one side wall of the first linkage block, a reducer is provided at the output end of the second motor, the output end of the reducer is transmission-connected to one end of the loading block, a first groove is provided on one side wall of the first linkage block, a first rack is installed in the first groove, a third groove is provided on one side wall of the second linkage block, a third rack is installed in the third groove, and the third rack is movably meshed with the transmission gear.

[0011] Furthermore, the refrigeration mechanism includes a heat dissipation pipe and a semiconductor refrigeration sheet, one end of the heat dissipation pipe is installed on the cover plate, the other end of the heat dissipation pipe is provided with a dustproof mesh plate, a heat dissipation fan is provided in the heat dissipation pipe, a heat dissipation groove is provided on the cover plate, the heat dissipation groove and the heat dissipation pipe are communicated with each other, a cold conduction groove is provided on the side wall of the low temperature box, the cold conduction groove is communicated with the interior of the low temperature box, the semiconductor refrigeration sheet is arranged between the cover plate and the low temperature box, the heat dissipation end of the semiconductor refrigeration sheet is in contact with the heat dissipation groove, and the cooling end of the semiconductor refrigeration sheet is in contact with the cold conduction groove.

[0012] Furthermore, a blower is installed on one side wall of the low temperature box, the air outlet end of the blower is connected to an air outlet pipe, the other end of the air outlet pipe extends into the low temperature box, and a plurality of through grooves are opened on the other side wall of the low temperature box. A cold insulation mechanism is provided in the low temperature box.

[0013] Furthermore, the cold insulation mechanism includes a cold insulation plate and a transmission box, and linkage shafts are provided at the upper and lower ends of the cold insulation plate, and two groups of linkage shafts are rotatably connected to the upper and lower inner walls of the low-temperature box respectively, and the transmission box is arranged at the top of the outer wall of the low-temperature box, and a third motor is installed on one side wall of the transmission box, and the output end of the third motor is transmission-connected to a worm, and a plurality of groups of worm wheels are meshingly connected to the worm, and the centers of the plurality of groups of worm wheels are respectively fixedly connected to the plurality of linkage shafts.

[0014] A method for a capacitor high and low temperature fast switching aging test device, the method comprising: A batch of capacitors are plugged into the loading block; The loading block is turned over so that the capacitor to be tested is turned over to the bottom end of the loading block; The transmission mechanism drives the loading block to move into the high temperature chamber, so that the capacitor enters the high temperature chamber for aging test; After the capacitor completes the high temperature aging test, the transmission mechanism drives the loading block to move out of the high temperature box, so that the capacitor is moved out of the high temperature box; The loading block is flipped so that the capacitor that has completed the aging test is flipped to the top of the loading block, and the low-temperature box is rotated to engage with the loading block, so that the capacitor that has completed the high-temperature aging test enters the low-temperature box for rapid cooling.

[0015] The beneficial effects of the present invention are: 1. The transmission mechanism drives the loading block to move into the high-temperature box, so that the capacitor plugged into the bottom of the loading block enters the high-temperature box for high-temperature aging test. The transmission mechanism cooperates with the flipping of the loading block to achieve rapid position switching of the capacitor. Through two sets of electric push rods, the low-temperature box and the loading block are quickly connected to achieve rapid cooling of the capacitor. By setting up a high-temperature box and a low-temperature box, the high and low temperature rapid switching of the capacitor test space can be achieved, which effectively improves the efficiency of the aging test while avoiding energy waste caused by high-temperature and low-temperature conversion in the same space.

[0016] 2. The position of the capacitor is switched by flipping the loading block, so that one batch of capacitors can be quickly cooled down while another batch of capacitors that have completed the aging test can be quickly cooled down. After the cooling is completed, the capacitors can be unloaded and replaced with a new batch, so that the high-temperature aging test and the cooling operation can be carried out at the same time, which effectively shortens the waiting time of the capacitor aging test, thereby improving the efficiency of the capacitor aging test.

[0017] 3. Refrigeration is performed through semiconductor refrigeration sheets to cool down the inside of the low-temperature box. The heat dissipation speed of the heat dissipation end of the semiconductor refrigeration sheet is accelerated by setting a heat dissipation pipe and a heat dissipation fan, thereby improving the refrigeration effect of the semiconductor refrigeration sheet. The worm is driven by the third motor to rotate, so that the linkage shaft drives the cold insulation plate to rotate to a flat state, so that a refrigeration cavity is formed between the cold insulation plate and the inner wall of one side of the low-temperature box. When the capacitor needs to be cooled quickly, the worm is driven by the third motor to rotate in the opposite direction, so that several groups of cold insulation plates are rotated to a state parallel to each other, so that the cold air in the refrigeration cavity quickly flows to the surface of the capacitor, and the capacitor is quickly cooled. At the same time, the cold air in the low-temperature box is quickly circulated through the blower and the through slot, so that the heat on the capacitor flows out quickly, and the capacitor is quickly cooled.

[0018] 4. The temperature in the high temperature box is monitored by a temperature sensor. When the temperature in the high temperature box is lower than a preset value, the temperature in the high temperature box is raised to a preset value by a heating tube. When the loading block is moved out of the high temperature box, the second linkage block drives one end of the folding plate to move, so that the folding plate is attached to the inner wall of the high temperature box and unfolded to keep the high temperature box warm. When the loading block is moved into the high temperature box, the second linkage block pushes the folding plate to fold, so that the folding plate enters the storage slot for storage, so that when the next group of capacitors is subjected to a high temperature aging test, the high temperature box does not need to be reheated, and the high temperature aging test of the capacitor can be quickly performed. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0020] Figure 1 A schematic diagram of the main structure of the running state according to an embodiment of the present invention is shown; Figure 2 A schematic diagram of the main structure in standby state according to an embodiment of the present invention is shown; Figure 3 A schematic diagram of the internal structure of a high temperature box according to an embodiment of the present invention is shown; Figure 4 A schematic diagram of a loading block and its connection structure according to an embodiment of the present invention is shown; Figure 5 It shows a schematic structural diagram of a material loading part according to an embodiment of the present invention; Figure 6 A schematic diagram of an explosion of the external structure of a cryogenic box according to an embodiment of the present invention is shown; Figure 7 A schematic diagram of the internal structure of a cryogenic box according to an embodiment of the present invention is shown; Figure 8 A schematic exploded view of the cold insulation structure according to an embodiment of the present invention is shown.

[0021] In the figure: 1. high temperature box; 101. through slot; 102. heating tube; 103. temperature sensor; 104. storage slot; 105. slide slot; 2. low temperature box; 201. cold conduction slot; 202. through slot; 3. transmission mechanism; 301. transmission box; 302. first motor; 303. transmission gear; 4. first linkage block; 401. first groove; 402. first rack; 5. fixed shaft; 6. cover plate; 601. heat dissipation slot; 7. first articulated seat; 8. electric push rod; 9. second articulated seat; 10. loading block; 1001. loading slot; 1002. protective net cover; 1003. second groove; 1004. second rack; 1005. rotating shaft; 11. supporting shaft; 12. second electric machine; 13. reducer; 14. auxiliary wheel; 15. folding plate; 1501. first limit bolt; 16. refrigeration mechanism; 1601. heat pipe; 1602. dustproof screen; 1603. cooling fan; 1604. semiconductor refrigeration sheet; 17. blower; 18. air outlet duct; 19. cold insulation mechanism; 1901. cold insulation plate; 1902. transmission box; 1903. linkage shaft; 1904. third motor; 1905. worm; 1906. worm wheel; 20. connecting block; 21. loading part; 2101. test seat; 2102. test socket; 2103. pad; 22. second linkage block; 2201. third groove; 2202. third rack; 2203. second limit bolt. DETAILED DESCRIPTION

[0022] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0023] The embodiment of the present invention provides a capacitor high and low temperature fast switching aging test device, including a high temperature box 1 and a low temperature box 2; illustratively, as Figure 1 and Figure 2 shown.

[0024] A transmission mechanism 3 is provided on one side wall of the high temperature box 1, a first linkage block 4 is clamped on one side wall of the high temperature box 1, a fixed shaft 5 is installed at the box opening of the high temperature box 1, two groups of connecting blocks 20 are sleeved on the fixed shaft 5, and the two groups of connecting blocks 20 are fixedly connected to the side wall of the low temperature box 2, a cover plate 6 is provided on the low temperature box 2, and a refrigeration mechanism 16 is provided on the cover plate 6, and the refrigeration mechanism 16 is communicated with the interior of the low temperature box 2; Two groups of first hinged seats 7 are symmetrically arranged on the box opening of the high-temperature box 1, and the two groups of the first hinged seats 7 are rotatably connected to the electric push rods 8. Two groups of second hinged seats 9 are symmetrically arranged at the bottom end of the cover plate 6, and the two groups of the second hinged seats 9 are respectively rotatably connected to the output ends of the two groups of electric push rods 8. One side of the first linkage block 4 is rotatably connected to the loading block 10, and the upper and lower ends of the loading block 10 are movably connected to the loading part 21, and the loading part 21 is movably connected to a plurality of groups of capacitors. A second linkage block 22 is slidably connected in the high-temperature box 1, and the second linkage block 22 is rotatably connected to one end of the loading block 10; Specifically, by connecting several groups of capacitors to be tested to the loading part 21, the loading block 10 drives the capacitors into the high-temperature box 1, and the capacitors located at the bottom of the loading block 10 are subjected to a high-temperature aging test. The cover plate 6 is driven to rotate by the extension and retraction of the two groups of electric push rods 8, so that the low-temperature box 2 rotates synchronously. When the bottom end of the low-temperature box 2 rotates to fit with the loading block 10, the refrigeration mechanism 16 is used to quickly cool down the several groups of capacitors connected to the top of the loading block 10, and the test data of the capacitors under the low-temperature state is recorded. After completing the low-temperature test, the low-temperature box 2 can be driven to rotate by the two groups of electric push rods 8 to disengage the low-temperature box 2 from the loading block 10, so that the capacitors after the test can be taken out conveniently and the capacitors to be tested can be put in at the same time.

[0025] For example, Figure 3 shown.

[0026] A through slot 101 is provided on one side wall of the high temperature box 1, and the through slot 101 is movably fitted with the first linkage block 4. A storage slot 104 is provided on the other side wall of the high temperature box 1, and a folding plate 15 is provided in the storage slot 104. Both sides of the folding plate 15 are provided with a plurality of groups of first limit bolts 1501. Both side walls of the high temperature box 1 are provided with sliding slots 105, and two groups of the sliding slots 105 are movably fitted with a plurality of groups of first limit bolts 1501, respectively. A plurality of groups of heating tubes 102 are provided in the high temperature box 1, and a temperature sensor 103 is provided on the inner wall of the high temperature box 1. Specifically, the temperature in the high temperature box 1 is monitored by the temperature sensor 103 . When the temperature in the high temperature box 1 is lower than a preset value, the temperature in the high temperature box 1 is increased to the preset value by the heating tube 102 .

[0027] The transmission mechanism 3 includes a transmission box 301 , in which a transmission gear 303 is rotatably connected. A first motor 302 is installed on the transmission box 301 , and an output end of the first motor 302 is transmission-connected to the transmission gear 303 .

[0028] For example, Figure 4 shown.

[0029] Both upper and lower ends of the loading block 10 are provided with loading slots 1001, and the two groups of the loading parts 21 are respectively installed in the two groups of loading slots 1001. Both upper and lower ends of the loading block 10 are rotatably connected with protective net covers 1002, and the two groups of protective net covers 1002 are movably engaged with one end of the two groups of loading slots 1001 respectively. Both side walls of the loading block 10 are provided with second grooves 1003, and the two groups of second grooves 1003 are respectively installed with second racks 1004, and the two groups of second racks 1004 are movably engaged with the transmission gear 303. Both ends of the loading block 10 are fixedly connected with rotating shafts 1005, one group of the rotating shafts 1005 is rotatably connected to the first linkage block 4, and the other group of the rotating shafts 1005 is rotatably connected to the second linkage block 22; One side wall of the first linkage block 4 is provided with two groups of support shafts 11, and the bottom ends of the two groups of support shafts 11 are provided with auxiliary wheels 14. One side wall of the first linkage block 4 is installed with a second motor 12, and the output end of the second motor 12 is provided with a reducer 13, and the output end of the reducer 13 is transmission-connected with a group of rotating shafts 1005. One side wall of the first linkage block 4 is provided with a first groove 401, and a first rack 402 is installed in the first groove 401, and the first rack 402 is movably meshed with the transmission gear 303; Both ends of the second linkage block 22 are provided with second limit bolts 2203, and the two groups of the second limit bolts 2203 are movably fitted with the two groups of slide grooves 105 respectively. A third groove 2201 is opened on one side wall of the second linkage block 22, and a third rack 2202 is installed in the third groove 2201, and the third rack 2202 is movably meshed with the transmission gear 303; Specifically, after the capacitor at the bottom of the loading block 10 completes the high-temperature aging test, the first motor 302 drives the transmission gear 303 to rotate, so that the first rack 402 drives the first linkage block 4 to move, thereby driving the loading block 10 to move. While the loading block 10 moves, the second rack 1004 is meshed and connected with the transmission gear 303, so that the loading block 10 drives the capacitor to continue to move until the loading block 10 is completely moved out of the high-temperature box 1, and the loading block 10 is turned over by the second motor 12, so that the capacitor that has completed the aging test is turned over to the top of the loading block 10, and the capacitor to be tested is turned over to the bottom of the loading block 10, so as to realize the material replacement operation of the capacitor; After the material replacement operation is completed, the first motor 302 drives the transmission gear 303 to rotate in the opposite direction, so that the loading block 10 drives the capacitor to move into the high-temperature box 1. While the capacitor located at the bottom of the loading block 10 is subjected to high-temperature testing, the two sets of electric push rods 8 drive the low-temperature box 2 to rotate, so that the low-temperature box 2 is engaged with the top of the high-temperature box 1, so that the capacitor located at the top of the loading block 10 enters the low-temperature box 2 for rapid cooling, and at the same time, data of the capacitor after cooling is recorded. After the test is completed, the electric push rod 8 drives the low-temperature box 2 to rotate and disengage from the high-temperature box 1, unloads the capacitor that has completed the test, and then loads the next set of capacitors to be tested.

[0030] Furthermore, when the loading block 10 is moved out of the high temperature box 1, the second linkage block 22 drives one end of the folding plate 15 to move, so that the folding plate 15 is attached to the inner wall of the high temperature box 1 and unfolded to keep the high temperature box 1 warm. When the loading block 10 is moved into the high temperature box 1, the second linkage block 22 pushes the folding plate 15 to fold, so that the folding plate 15 enters the storage groove 104 for storage, so that when the next group of capacitors is subjected to the high temperature aging test, the high temperature box 1 does not need to be reheated and the high temperature aging test of the capacitors can be quickly performed.

[0031] The loading part 21 includes a test seat 2101; illustratively, as Figure 5 shown.

[0032] The test socket 2101 is electrically connected to an external power supply, and is provided with several groups of test sockets 2102. The test socket 2101 is provided with pads 2103, and the pins of several groups of capacitors are inserted into the test sockets 2102 after passing through the pads 2103 for power-on testing.

[0033] For example, Figure 7 shown.

[0034] The refrigeration mechanism 16 includes a heat dissipation pipe 1601 and a semiconductor refrigeration sheet 1604. One end of the heat dissipation pipe 1601 is installed on the cover plate 6. The other end of the heat dissipation pipe 1601 is provided with a dustproof mesh plate 1602. A heat dissipation fan 1603 is provided in the heat dissipation pipe 1601. A heat dissipation groove 601 is provided on the cover plate 6. The heat dissipation groove 601 and the heat dissipation pipe 1601 are communicated with each other. A cold conduction groove 201 is provided on the side wall of the cryogenic box 2. The cold conduction groove 201 is communicated with the inside of the cryogenic box 2. The semiconductor refrigeration sheet 1604 is arranged between the cover plate 6 and the cryogenic box 2. The heat dissipation end of the semiconductor refrigeration sheet 1604 is in contact with the heat dissipation groove 601. The cooling end of the semiconductor refrigeration sheet 1604 is in contact with the cold conduction groove 201. Specifically, the semiconductor refrigeration sheet 1604 is used for cooling to lower the temperature inside the low temperature box 2 , and the heat dissipation speed of the heat dissipation end of the semiconductor refrigeration sheet 1604 is accelerated by providing the heat dissipation pipe 1601 and the heat dissipation fan 1603 , thereby improving the cooling effect of the semiconductor refrigeration sheet 1604 .

[0035] For example, Figure 7 and Figure 8 shown.

[0036] A blower 17 is installed on one side wall of the cryogenic box 2, and the air outlet end of the blower 17 is connected to an air outlet pipe 18, and the other end of the air outlet pipe 18 extends into the cryogenic box 2. A plurality of through grooves 202 are opened on the other side wall of the cryogenic box 2, and a cold insulation mechanism 19 is provided in the cryogenic box 2; The cold-insulating mechanism 19 comprises a cold-insulating plate 1901 and a transmission box 1902. The upper and lower ends of the cold-insulating plate 1901 are provided with linkage shafts 1903. Two groups of linkage shafts 1903 are rotatably connected to the inner walls of the upper and lower ends of the low-temperature box 2, respectively. The transmission box 1902 is arranged at the top of the outer wall of the low-temperature box 2. A third motor 1904 is installed on one side wall of the transmission box 1902. The output end of the third motor 1904 is transmission-connected with a worm 1905. The worm 1905 is meshingly connected with a plurality of groups of worm wheels 1906. The centers of the plurality of groups of worm wheels 1906 are respectively fixedly connected with the plurality of linkage shafts 1903. Specifically, the third motor 1904 drives the worm 1905 to rotate, so that the linkage shaft 1903 drives the cold insulation plate 1901 to rotate to a flat state, so that a refrigeration chamber is formed between the cold insulation plate 1901 and the inner wall of one side of the low-temperature box 2. When the capacitor needs to be cooled quickly, the third motor 1904 drives the worm 1905 to rotate in the opposite direction, so that several groups of cold insulation plates 1901 rotate to a state parallel to each other, so that the cold air in the refrigeration chamber quickly flows to the surface of the capacitor, and the capacitor is quickly cooled. At the same time, the cold air in the low-temperature box 2 is quickly circulated through the blower 17 and the through groove 202, so that the heat on the capacitor flows out quickly, and the capacitor is quickly cooled.

[0037] The working principle of the capacitor high and low temperature fast switching aging test device proposed by the present invention is as follows: A batch of capacitor pins are inserted into the test socket 2102 through the pad 2103 to complete the plug-in of the capacitors to be tested. The second motor 12 drives the loading block 10 to flip, so that the capacitors to be tested are flipped to the bottom of the loading block 10. The loading block 10 is driven to move into the high temperature box 1 through the transmission mechanism 3, so that the capacitors enter the high temperature box 1. The loading block 10 fits with the inner wall of the high temperature box 1, and the loading block 10 and the bottom of the inner wall of the high temperature box 1 form a closed high temperature test space, and the capacitors are powered on for testing. At the same time, another batch of capacitors to be tested are plugged into the test socket 2101 at the upper end of the loading block 10.

[0038] After a batch of capacitors complete the high-temperature aging test, the loading block 10 is driven by the transmission mechanism 3 to move outside the high-temperature box 1, so that the capacitors are moved out of the high-temperature box 1, and the loading block 10 is driven to flip by the second motor 12, so that the capacitors that have completed the aging test are flipped to the top of the loading block 10, and the capacitors to be tested are flipped to the bottom of the loading block 10, and the loading block 10 is driven by the transmission mechanism 3 to move outside and inside the high-temperature box 1 to perform an aging test on the capacitors to be tested, and the low-temperature box 2 is driven to rotate by two sets of electric push rods 8 to make the low-temperature box 2 engage with the top of the high-temperature box 1, so that the capacitors that have completed the high-temperature aging test enter the low-temperature box 2 for rapid cooling, and at the same time, the data of the capacitors after cooling is recorded. After the test is completed, the low-temperature box 2 is driven by the electric push rod 8 to rotate and disengage from the high-temperature box 1, the capacitors that have completed the test are unloaded, and then the next group of capacitors to be tested are loaded.

[0039] The temperature in the high temperature box 1 is monitored by the temperature sensor 103. When the temperature in the high temperature box 1 is lower than the preset value, the temperature in the high temperature box 1 is increased to the preset value through the heating tube 102. When the loading block 10 is moved out of the high temperature box 1, the second linkage block 22 drives one end of the folding plate 15 to move, so that the folding plate 15 is attached to the inner wall of the high temperature box 1 and unfolded to keep the high temperature box 1 warm. When the loading block 10 is moved into the high temperature box 1, the second linkage block 22 pushes the folding plate 15 to fold, so that the folding plate 15 enters the storage groove 104 for storage, so that when the next group of capacitors are subjected to the high temperature aging test, the high temperature box 1 does not need to be reheated and the high temperature aging test of the capacitors can be quickly performed.

[0040] The semiconductor refrigeration sheet 1604 is used for cooling to lower the temperature inside the low temperature box 2. The heat dissipation speed of the heat dissipation end of the semiconductor refrigeration sheet 1604 is accelerated by providing a heat dissipation pipe 1601 and a heat dissipation fan 1603 to enhance the cooling effect of the semiconductor refrigeration sheet 1604.

[0041] The third motor 1904 drives the worm 1905 to rotate, so that the linkage shaft 1903 drives the cold insulation plate 1901 to rotate to a flat state, so that a refrigeration chamber is formed between the cold insulation plate 1901 and the inner wall of one side of the low-temperature box 2. When the capacitor needs to be cooled quickly, the third motor 1904 drives the worm 1905 to rotate in the opposite direction, so that several groups of cold insulation plates 1901 rotate to a state parallel to each other, so that the cold air in the refrigeration chamber quickly flows to the surface of the capacitor, and the capacitor is quickly cooled. At the same time, the cold air in the low-temperature box 2 is quickly circulated through the blower 17 and the through groove 202, so that the heat on the capacitor flows out quickly, and the capacitor is quickly cooled.

[0042] Based on the above capacitor high and low temperature fast switching aging test device, the embodiment of the present invention further proposes a method for the test device. Exemplarily, the method includes: Insert the pins of a batch of capacitors through the pad into the test jack to complete the plugging of the capacitors to be tested; Turning on the second motor to drive the loading block to flip so that the capacitor to be tested flips to the bottom of the loading block; Turn on the first motor, so that the transmission gear drives the loading block to move into the high temperature box, so that the capacitor enters the high temperature box; The loading block fits with the inner wall of the high temperature box, so that a high temperature test space is formed in the high temperature box, and a high temperature aging test is performed on the capacitor in the high temperature box; At the same time, another batch of capacitors to be tested are plugged into the test socket on the upper end of the loading block; After a batch of capacitors complete the high temperature aging test, the transmission mechanism drives the loading block to move outside the high temperature box, so that the capacitors are moved out of the high temperature box; Turning on the second motor to drive the loading block to flip, so that the capacitor that has completed the aging test flips to the top of the loading block, and the capacitor to be tested flips to the bottom of the loading block; The transmission mechanism drives the loading block to move into the high temperature box, and the loading block fits against the inner wall of the high temperature box to perform an aging test on the capacitor to be tested; Open two sets of electric push rods to drive the low temperature box to rotate, so that the low temperature box and the top of the high temperature box are connected, so that the capacitors that have completed the high temperature aging test enter the low temperature box for rapid cooling; After the test is completed, the electric push rod drives the low-temperature box to rotate and separate from the high-temperature box, unloads the tested capacitors, and then loads the next group of capacitors to be tested.

[0043] Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent substitutions for some of the technical features therein; and these modifications or substitutions do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A capacitor high and low temperature fast switching aging test device, comprising a high temperature box (1) and a low temperature box (2), characterized in that: A transmission mechanism (3) is provided on one side wall of the high temperature box (1), and a first linkage block (4) is clamped on one side wall of the high temperature box 1; One side of the first linkage block (4) is rotatably connected to a loading block (10), and upper and lower ends of the loading block (10) are movably clamped with a plurality of groups of capacitors; A fixed shaft (5) is mounted on the first linkage block (4), two groups of connection blocks (20) are sleeved on the fixed shaft (5), and the two groups of connection blocks (20) are fixedly connected to the side wall of the low temperature box (2); The transmission mechanism (3) drives the loading block (10) to move into the high temperature box (1), so that the capacitor plugged into the bottom end of the loading block (10) enters the high temperature box (1) for a high temperature aging test. The transmission mechanism (3) drives the loading block (10) to move out of the high temperature box (1), and at the same time, the loading block (10) drives the capacitor to flip, thereby realizing rapid position switching of the capacitor. The low temperature box (2) and the loading block (10) are quickly connected, thereby realizing rapid cooling of the capacitor.

2. The capacitor high and low temperature fast switching aging test device according to claim 1 is characterized in that: The low-temperature box (2) is provided with a cover plate (6), and a refrigeration mechanism (16) is provided on the cover plate (6). The refrigeration mechanism (16) is communicated with the interior of the low-temperature box (2). Two groups of first hinged seats (7) are symmetrically provided at the box opening of the high-temperature box (1), and both groups of the first hinged seats (7) are rotatably connected to electric push rods (8). Two groups of second hinged seats (9) are symmetrically provided at the bottom end of the cover plate (6), and the two groups of the second hinged seats (9) are rotatably connected to the output ends of the two groups of electric push rods (8), respectively.

3. The capacitor high and low temperature fast switching aging test device according to claim 1 is characterized in that: A through groove (101) is provided on one side wall of the high temperature box (1), and the through groove (101) is movably fitted with a first linkage block (4). A storage groove (104) is provided on the other side wall of the high temperature box (1), and a folding plate (15) is arranged in the storage groove (104). Both sides of the folding plate (15) are provided with a plurality of groups of first limit pins (1501). Both side walls of the high temperature box (1) are provided with sliding grooves (105), and two groups of the sliding grooves (105) are movably fitted with a plurality of groups of first limit pins (1501) respectively. A second linkage block (22) is slidably connected in the high temperature box (1), one end of the second linkage block (22) is rotatably connected to the loading block (10), and the other end of the second linkage block (22) is rotatably connected to one end of the folding plate (15). A plurality of groups of heating tubes (102) are arranged in the high temperature box (1), and a temperature sensor (103) is arranged on the inner wall of the high temperature box (1).

4. The capacitor high and low temperature fast switching aging test device according to claim 1 is characterized in that The transmission mechanism (3) comprises a transmission box (301), a transmission gear (303) being rotatably connected inside the transmission box (301), a first motor (302) being mounted on the transmission box (301), and an output end of the first motor (302) being transmission-connected to the transmission gear (303).

5. The capacitor high and low temperature fast switching aging test device according to claim 3 is characterized in that: The loading block (10) is provided with loading slots (1001) at both upper and lower ends, and a loading portion (21) is installed in two groups of the loading slots (1001). The loading portion (21) includes a test seat (2101), and the test seat (2101) is electrically connected to an external power supply. The test seat (2101) is provided with a plurality of groups of test sockets (2102). The test seat (2101) is provided with a pad (2103). Pins of the plurality of groups of capacitors are inserted into the test sockets (2102) after passing through the pad (2103) for power-on testing. Second grooves (1003) are provided on both side walls of the loading block (10), and second racks (1004) are installed in the two groups of the second grooves (1003).

6. The capacitor high and low temperature fast switching aging test device according to claim 3 is characterized in that: A second motor (12) is installed on one side wall of the first linkage block (4); a reducer (13) is provided at the output end of the second motor (12); the output end of the reducer (13) is transmission-connected to one end of the loading block (10); a first groove (401) is provided on one side wall of the first linkage block (4); a first rack (402) is installed in the first groove (401); a third groove (2201) is provided on one side wall of the second linkage block (22); a third rack (2202) is installed in the third groove (2201); the third rack (2202) is movably meshed with a transmission gear (303).

7. The capacitor high and low temperature fast switching aging test device according to claim 2 is characterized in that: The refrigeration mechanism (16) comprises a heat dissipation pipe (1601) and a semiconductor refrigeration sheet (1604); one end of the heat dissipation pipe (1601) is mounted on the cover plate (6); the other end of the heat dissipation pipe (1601) is provided with a dustproof screen (1602); a heat dissipation fan (1603) is provided inside the heat dissipation pipe (1601); a heat dissipation groove (601) is provided on the cover plate (6); the heat dissipation groove (601) and the heat dissipation pipe (1601) are interconnected; a cold conduction groove (201) is provided on the side wall of the low temperature box (2); the cold conduction groove (201) and the interior of the low temperature box (2) are interconnected; the semiconductor refrigeration sheet (1604) is arranged between the cover plate (6) and the low temperature box (2); the heat dissipation end of the semiconductor refrigeration sheet (1604) and the heat dissipation groove (601) are mutually abutted; and the cooling end of the semiconductor refrigeration sheet (1604) and the cold conduction groove (201) are mutually abutted.

8. The capacitor high and low temperature fast switching aging test device according to claim 7, characterized in that: A blower (17) is installed on one side wall of the low temperature box (2); an air outlet end of the blower (17) is connected to an air outlet pipe (18); the other end of the air outlet pipe (18) extends into the low temperature box (2); a plurality of through grooves (202) are provided on the other side wall of the low temperature box (2); and a cold insulation mechanism (19) is provided in the low temperature box (2).

9. The capacitor high and low temperature fast switching aging test device according to claim 8, characterized in that: The cold-insulating mechanism (19) comprises a cold-insulating plate (1901) and a transmission box (1902); the upper and lower ends of the cold-insulating plate (1901) are both provided with linkage shafts (1903); two groups of linkage shafts (1903) are respectively rotatably connected to the upper and lower inner walls of the low-temperature box (2); the transmission box (1902) is arranged at the top of the outer wall of the low-temperature box (2); a third motor (1904) is installed on one side wall of the transmission box (1902); the output end of the third motor (1904) is transmission-connected to a worm (1905); a plurality of groups of worm wheels (1906) are meshingly connected to the worm (1905); the centers of the plurality of groups of worm wheels (1906) are respectively fixedly connected to the plurality of linkage shafts (1903).

10. A method for applying the capacitor high and low temperature fast switching aging test device according to any one of claims 1 to 9, characterized in that: The method comprises: A batch of capacitors are plugged into the loading block; The loading block is turned over so that the capacitor to be tested is turned over to the bottom end of the loading block; The transmission mechanism drives the loading block to move into the high temperature chamber, so that the capacitor enters the high temperature chamber for aging test; After the capacitor completes the high temperature aging test, the transmission mechanism drives the loading block to move out of the high temperature box, so that the capacitor is moved out of the high temperature box; The loading block is flipped so that the capacitor that has completed the aging test is flipped to the top of the loading block, and the low-temperature box is rotated to engage with the loading block, so that the capacitor that has completed the high-temperature aging test enters the low-temperature box for rapid cooling.

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