Transformer winding deformation diagnosis method and device, electronic equipment and storage medium

Abstract

The embodiment of the invention discloses a transformer winding deformation diagnosis method and device, electronic equipment and a storage medium. The method comprises the following steps: constructing a short-circuit impedance test device and a capacitance test device; carrying out a transformer short-circuit impedance test based on the short-circuit impedance test device to obtain a transformer short-circuit impedance change trend; winding capacitance testing is carried out based on the capacitance testing device, and a winding capacitance data change trend is obtained; according to the transformer short-circuit impedance change trend and the winding capacitance data change trend, jointly diagnosing whether the transformer winding is deformed or not; the internal relevance between the short-circuit impedance and the winding capacitance and the winding space size is summarized and analyzed according to the relation between the short-circuit impedance and the winding capacitance, so that the diagnosis accuracy of winding deformation can be improved, and support is provided for making a transformer maintenance strategy.

Description

Technical Field

[0001] The present invention relates to the technical field of transformer fault monitoring, and in particular to a transformer winding deformation diagnosis method, device, electronic equipment and storage medium. Background Art

[0002] Transformers are the most core power transmission and transformation equipment in the power system, especially large power transformers, which play an important role in the process of electric energy transmission.

[0003] It is inevitable that the transformer will be impacted by short-circuit current during operation. When the impacted short-circuit current exceeds the short-circuit current tolerance of the transformer itself, the transformer winding will be deformed. Since the transformer winding is inside the oil tank and has a "black box" characteristic, the diagnosis of transformer winding deformation has always been a difficult problem in the industry. Domestic and foreign scholars have carried out a lot of research on the diagnosis of transformer winding deformation. The more commonly used methods are frequency response method and short-circuit impedance method. The frequency response method of winding deformation diagnosis is to assume that the three-phase winding should have the same frequency response characteristics. However, due to differences in lead or coil layout, the actual situation will lead to large differences in the frequency response test results of the three-phase winding. At the same time, the test is greatly affected by factors such as grounding, which is easy to cause misjudgment; the short-circuit impedance method is a test method used in recent years, but in field tests, it will be affected by three-phase voltage imbalance, differences in test conditions and factory tests, and bushing CT open circuits, which may lead to misjudgment.

[0004] Therefore, in general, the existing winding deformation diagnosis method is prone to misjudgment. Summary of the invention

[0005] The main purpose of the present invention is to provide a method, device, electronic device and storage medium for diagnosing transformer winding deformation, which can improve the diagnosis accuracy of transformer winding deformation.

[0006] To achieve the above objectives, the present application provides a method for diagnosing transformer winding deformation, the method comprising:

[0007] Construct a short-circuit impedance test device and a capacitance test device;

[0008] Based on the short-circuit impedance testing device, a transformer short-circuit impedance test is carried out to obtain a change trend of the transformer short-circuit impedance;

[0009] Conducting a winding capacitance test based on the capacitance testing device to obtain a winding capacitance data change trend;

[0010] Whether the transformer winding is deformed is diagnosed jointly based on the change trend of the transformer short-circuit impedance and the change trend of the winding capacitance data.

[0011] Optionally, the short-circuit impedance test device includes a voltage regulator, a current test device and a voltage test device; the voltage regulator is connected to the primary side of the transformer under test, the secondary side of the transformer under test is short-circuited, and the current test device and the voltage test device are used to measure the current and voltage on the primary side of the transformer under test, respectively;

[0012] The winding capacitance test applies the principle of charging and discharging a capacitor and calculates the capacitance through changes in voltage and current.

[0013] Optionally, the method further includes:

[0014] When the transformer short-circuit impedance test is abnormal, the cause of the transformer short-circuit impedance abnormality is analyzed according to a preset transformer short-circuit impedance calculation formula, and the preset transformer short-circuit impedance calculation formula is as follows:

[0015]

[0016] Among them, f is the frequency, I is the rated current, W is the total number of turns when the main tap is connected, I and W are the data of the winding on the same side, e t is the potential per turn, H K is the average reactance height of the two windings, K is the additional reactance coefficient, ρ is the Rockwell coefficient, and ∑D is the winding space size.

[0017] Optionally, the winding capacitance test includes: an inter-winding capacitance test or a winding-to-ground capacitance test.

[0018] Optionally, the method further includes:

[0019] According to the capacitance calculation formula, the principle of diagnosing winding deformation according to winding capacitance is determined. The capacitance calculation formula is:

[0020]

[0021] Among them, ε is the relative dielectric constant, S is the area facing the two plates, k is the electrostatic force constant, and d is the vertical distance between the two plates.

[0022] Optionally, the jointly diagnosing whether the transformer winding is deformed according to the change trend of the transformer short-circuit impedance and the change trend of the winding capacitance data includes:

[0023] Obtain transformer winding deformation diagnosis table;

[0024] Determine whether the change trend of the transformer short-circuit impedance and the change trend of the winding capacitance data are consistent with the change rules in the transformer winding deformation diagnosis table;

[0025] If they are consistent, it is determined whether the transformer winding is deformed, and the deformation type corresponding to the change rule is determined.

[0026] Optionally, the transformer winding deformation diagnosis table includes the following corresponding relationships:

[0027] Deformation type, short-circuit impedance change trend, each side winding capacitance data change trend and comprehensive judgment, the deformation type includes winding type and deformation direction.

[0028] On the other hand, the present application also provides a transformer winding deformation diagnosis device, comprising:

[0029] A construction module for constructing a short-circuit impedance test device and a capacitance test device;

[0030] A testing module, used to carry out a transformer short-circuit impedance test based on the short-circuit impedance testing device to obtain a change trend of the transformer short-circuit impedance;

[0031] The test module is further used to carry out a winding capacitance test based on the capacitance test device to obtain a change trend of winding capacitance data;

[0032] The diagnosis module is used to jointly diagnose whether the transformer winding is deformed according to the change trend of the transformer short-circuit impedance and the change trend of the winding capacitance data.

[0033] On the other hand, the present application provides an electronic device, including a memory and a processor, wherein the memory stores a computer program, and when the computer program is executed by the processor, the processor executes the steps of the first aspect and any possible implementation method thereof.

[0034] On the other hand, the present application provides a computer-readable storage medium storing a computer program. When the computer program is executed by a processor, the processor executes each step of the method described in the first aspect.

[0035] The present application provides a method, device, electronic device and storage medium for diagnosing transformer winding deformation, by constructing a short-circuit impedance testing device and a capacitance testing device; based on the short-circuit impedance testing device, a transformer short-circuit impedance test is carried out to obtain a transformer short-circuit impedance change trend; based on the capacitance testing device, a winding capacitance test is carried out to obtain a winding capacitance data change trend; based on the transformer short-circuit impedance change trend and the winding capacitance data change trend, a joint diagnosis is made as to whether the transformer winding is deformed; the intrinsic correlation between the short-circuit impedance and the winding capacitance and the winding space size is applied, and the intrinsic correlation between the two methods is summarized and analyzed based on the relationship between the two, thereby improving the diagnostic accuracy of winding deformation and providing support for the formulation of transformer maintenance strategies. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0037] in:

[0038] Figure 1 A schematic flow chart of a method for diagnosing transformer winding deformation provided in an embodiment of the present application;

[0039] Figure 2 A schematic diagram of a test circuit structure provided in an embodiment of the present application;

[0040] Figure 3 A schematic diagram of a winding capacitance test circuit provided in an embodiment of the present application;

[0041] Figure 4 A schematic diagram of the structure of a transformer winding deformation diagnosis device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0042] In order to enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without creative work are within the scope of protection of the present application.

[0043] The terms "first", "second", etc. in the specification and claims of this application and the above-mentioned drawings are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but optionally includes steps or units that are not listed, or optionally includes other steps or units inherent to these processes, methods, products or devices.

[0044] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0045] The embodiments of the present application are described below in conjunction with the drawings in the embodiments of the present application.

[0046] See also Figure 1 , is a flow chart of a transformer winding deformation diagnosis method provided in an embodiment of the present application. Figure 1 As shown, the method includes:

[0047] 101. Construct a short-circuit impedance test device and a capacitance test device.

[0048] In the embodiment of the present application, the transformer winding deformation diagnosis method is mainly established based on the internal connection of experimental data, so it is necessary to conduct experiments on a test device to obtain the required data for analysis. Here, a short-circuit impedance test device and a capacitance test device are constructed.

[0049] In the embodiment of the present application, a typical transformer short-circuit impedance test circuit can be described as follows: the test power supply is connected to the primary side of the transformer through a control device, and the secondary side of the transformer is short-circuited through a short-circuit wire. During the test, the voltage of the test power supply is gradually increased, and the current and voltage on the primary side are measured at the same time until the current on the secondary side reaches the rated value. At this time, the voltage value on the primary side is recorded, which is the short-circuit voltage, and is used to calculate the short-circuit impedance or impedance voltage.

[0050] In an optional embodiment, the short-circuit impedance testing device includes a voltage regulator, a current testing device and a voltage testing device;

[0051] The voltage regulator is connected to the primary side of the transformer under test, the secondary side of the transformer under test is short-circuited, and the current test device and the voltage test device are used to measure the current and voltage of the primary side of the transformer under test, respectively;

[0052] The above winding capacitance test applies the principle of charging and discharging a capacitor and calculates the capacitance through the change of voltage and current. Optionally, the current test device includes an ammeter and a current transformer, and the voltage test device includes a voltmeter and a voltage transformer.

[0053] Figure 2 A schematic diagram of a test circuit structure provided in an embodiment of the present application. Figure 2As shown, the short-circuit impedance test circuit includes a voltage regulator, a current test device, and a voltage test device. The test product is the transformer under test. During the test, voltage is generally applied on the high-voltage side and the lower-voltage side is short-circuited. The capacitance test applies the principle of charging and discharging the capacitor, and the capacitance is calculated by the changes in voltage and current. During the test, the capacitance between a winding pair can be tested, or the capacitance of a single winding as a whole to the ground can be tested. Figure 2 A switch for the molded case circuit breaker control circuit is also provided, wherein CT is a current transformer and PT is a voltage transformer.

[0054] In the transformer short-circuit impedance test circuit, CT and PT play an important role. The following are their main functions and applications:

[0055] Current transformer (CT) function: used to proportionally reduce the large current on the primary side to a small current (usually 1A or 5A) suitable for measuring and protecting equipment. Its working principle is similar to that of a transformer and can accurately reflect the primary side current.

[0056] Application: The secondary side of CT is connected in series with measuring instruments and relay protection devices to provide necessary current signals. CT is widely used for current measurement and monitoring in power systems.

[0057] Safety requirements: The secondary side of the CT must not be open when in use, otherwise it will generate dangerous high voltage, endangering the safety of personnel and equipment. One end of the secondary side must be grounded to prevent the potential safety hazard caused by high voltage entering the secondary side.

[0058] Voltage transformer (PT) function: used to reduce high voltage to a low voltage suitable for use in measurement and control equipment. The secondary voltage of the PT is usually 100V or other standard values.

[0059] Application: PT is mainly used for voltage measurement and monitoring, and can provide necessary voltage signals for relay protection, metering instruments, etc.

[0060] Safety requirements: The secondary side of the PT is not allowed to be short-circuited and must be kept open to avoid damage to equipment and personnel caused by high voltage.

[0061] 102. Based on the above short-circuit impedance testing device, a transformer short-circuit impedance test is carried out to obtain the changing trend of the transformer short-circuit impedance.

[0062] According to DL / T 1093-2018 "Guidelines for Detection and Judgment of Transformer Winding Deformation by Reactance Method":

[0063] 1) The relative change of winding parameters of power transformers with a capacity of 100MVA or less and a voltage of 220kV or less should not be greater than ±2.0%; other transformers should not be greater than ±1.6%;

[0064] 2) The maximum relative difference of the three single-phase parameters of the winding of power transformers with a capacity of 100MVA or less and a voltage of 220kV or less should not be greater than 2.5%; for other transformers, it should not be greater than 2%.

[0065] If the transformer short-circuit impedance test is abnormal, the cause of the transformer short-circuit impedance abnormality can be analyzed according to the transformer short-circuit impedance calculation formula. The preset transformer short-circuit impedance calculation formula can be shown as follows:

[0066]

[0067] Among them, f is the frequency, I is the rated current, W is the total number of turns when the main tap is connected, I and W are the data of the winding on the same side, e t is the potential per turn, H K is the average reactance height of the two windings, K is the additional reactance coefficient, ρ is the Rockwell coefficient, and ∑D is the winding space size. kx % indicates the percentage of transformer winding impedance drop.

[0068] Further optionally, the possibility of transformer winding deformation is derived according to the calculation formula in the above step 103. The transformer short-circuit impedance is proportional to the spatial size of the winding and inversely proportional to the average reactance height of the two windings; when the transformer winding is deformed, the height change is generally not obvious, so the change is mainly related to the spatial size of the winding.

[0069] 103. Carry out winding capacitance test based on the above-mentioned capacitance testing device to obtain the changing trend of winding capacitance data.

[0070] Measuring the capacitance of transformer windings can indirectly reflect the degree of deformation of the windings. When the windings are deformed, the gap distance between the windings and the core becomes smaller, resulting in a larger capacitance between the windings and the ground.

[0071] Capacitance testing can be used as one of the auxiliary means to judge winding deformation. Together with the dielectric loss factor (tanδ), it can be used to check whether the transformer as a whole is damp, whether the insulating oil and paper are deteriorated, etc.

[0072] Optionally, the above winding capacitance test may adopt an inter-winding capacitance test or a winding-to-ground capacitance test.

[0073] Specifically, the winding capacitance test can be carried out on site. The capacitance calculation formula involved here is:

[0074]

[0075] Among them, ε is the relative dielectric constant, S is the area facing the two plates, k is the electrostatic force constant, and d is the vertical distance between the two plates.

[0076] When the transformer is deformed, especially radially deformed, the vertical distance between the two windings will change. This is the principle by which the winding-to-ground capacitance can diagnose winding deformation.

[0077] See also Figure 3 A schematic diagram of a winding capacitance test circuit is shown. H, M, L represent high, middle, and low side windings respectively, C1, C1, C1, C1 are the capacitances between windings, and C5 is the capacitance between windings and ground.

[0078] 104. Based on the change trend of the transformer short-circuit impedance and the change trend of the winding capacitance data, diagnose whether the transformer winding is deformed.

[0079] Specifically, winding deformation can be diagnosed jointly based on short-circuit impedance and winding capacitance. According to the calculation formula of short-circuit impedance and winding-to-ground capacitance, it can be seen that the short-circuit impedance is proportional to the winding space size ∑D, and the winding-to-ground capacitance is proportional to the vertical distance d between the two plates. When the change trend of the short-circuit impedance and winding-to-ground capacitance test data is consistent with the preset rules, it can be basically determined that the transformer winding has the risk of winding deformation;

[0080] Optionally, when there is a discrepancy between the two rules, further retesting and elimination of related interference are required on site to further diagnose whether the transformer winding is deformed, and to diagnose the specific type of deformation, etc., which is not limited in this embodiment of the present application.

[0081] The preset rule for joint diagnosis in the embodiment of the present application may be a pre-set correspondence relationship, specifically in the form of a correspondence table, which is not limited here.

[0082] In an optional implementation, the above step 104 includes:

[0083] Obtain transformer winding deformation diagnosis table;

[0084] Determine whether the change trend of the transformer short-circuit impedance and the change trend of the winding capacitance data are consistent with the change rules in the transformer winding deformation diagnosis table;

[0085] If they are consistent, determine whether the transformer winding is deformed, and determine the deformation type corresponding to the above change law.

[0086] Further optionally, the transformer winding deformation diagnosis table includes the following corresponding relationships:

[0087] Deformation type, short-circuit impedance change trend, capacitance data change trend of each side winding and comprehensive judgment, the above deformation type includes winding type and deformation direction.

[0088] For example, Table 1 is a transformer winding deformation diagnosis table provided in an embodiment of the present application.

[0089]

[0090] Table 1

[0091] As shown in Table 1, the corresponding relationships among different deformation types, short-circuit impedance change trends, capacitance data change trends of each side winding, and comprehensive judgment are set. The conditions that the current change trend meets can be found according to the table to determine whether each winding of the transformer is deformed, and the comprehensive judgment results can accurately locate the specific deformation direction of different windings. Table 1 is only a schematic, and the rules can be modified or adjusted as needed, which is not limited in the embodiments of the present application.

[0092] When the changing trends of short-circuit impedance and winding capacitance data are inconsistent, further retesting and elimination of related interference are required on site to further diagnose whether the transformer winding is deformed.

[0093] Optionally, based on the transformer short-circuit impedance calculation formula and the search results of the abnormality analysis, the causes of the transformer short-circuit impedance abnormality can also be analyzed from the following aspects:

[0094] Iron core remanence: The short-circuit impedance test is based on the premise that the excitation impedance is much greater than the leakage impedance. The remanence of the transformer core will cause the excitation inductance measurement value to decrease, directly causing the transformer impedance value to be too small, thereby increasing the error of the low-voltage short-circuit impedance test. The larger the remanence, the greater the error, which is easy to cause misjudgment.

[0095] Winding temperature: Since the short-circuit impedance includes a resistance component and a reactance component, the former is related to temperature and increases with increasing temperature. Therefore, the winding temperature during the test should be accurately recorded so that the short-circuit impedance measurement value can be converted to the same temperature reference.

[0096] Internal structural failure: Abnormal measurement of transformer low voltage short-circuit impedance is also an important cause of transformer failure. Accident analysis shows that internal structural failure of the transformer, such as abnormal insulation structure and dust accumulation on the insulation surface, may lead to abnormal short-circuit impedance measurement.

[0097] Incorrect winding connection or poor contact: If the transformer winding is connected incorrectly or has poor contact, the short-circuit impedance measurement result may be abnormal.

[0098] Measurement method and equipment errors: In the actual measurement process, if the measurement method is inappropriate or there are errors in the equipment used, the measurement results of the short-circuit impedance may be inaccurate.

[0099] Transformer design and manufacturing defects: Improper transformer design or defects in the manufacturing process, such as uneven winding and poor quality of insulation materials, may also lead to abnormal short-circuit impedance.

[0100] Transformer load and operating conditions: The short-circuit impedance of the transformer may change under different load and operating conditions. If the load conditions during the test do not match the design conditions, abnormal measurement results may also occur.

[0101] By analyzing the above factors, the causes of abnormal transformer short-circuit impedance can be investigated and diagnosed, so that corresponding maintenance and repair measures can be taken.

[0102] Transformer winding deformation is a major hidden danger in the operation of the transformer. After the winding is deformed, the insulation distance of the coil will change, and the insulation of some coils will be damaged, causing the insulation performance of the transformer to deteriorate, further causing transformer failure. Therefore, accurately detecting the hidden dangers of transformer winding deformation is of great significance for preventing and controlling sudden transformer failures. Existing winding deformation detection methods include frequency response method and impedance method, which are easily affected by test methods, test power supply and other aspects, and are prone to misjudgment.

[0103] The transformer winding deformation diagnosis method in the embodiment of the present application actually proposes a transformer winding deformation diagnosis method based on the intrinsic connection of test data, applies the intrinsic correlation between short-circuit impedance and winding capacitance and the winding space size, summarizes and analyzes the intrinsic correlation between the two methods according to the relationship between the two, thereby improving the diagnostic accuracy of winding deformation and providing support for the formulation of transformer maintenance strategies.

[0104] Based on the description of the aforementioned method embodiment, the embodiment of the present application further discloses a device for diagnosing transformer winding deformation.

[0105] Figure 4 A schematic diagram of a transformer winding deformation diagnosis device provided in an embodiment of the present application is shown in FIG. Figure 4 As shown, the transformer winding deformation diagnosis device 400 may include:

[0106] A construction module 410 is used to construct a short-circuit impedance test device and a capacitance test device;

[0107] A testing module 420 is used to carry out a transformer short-circuit impedance test based on the short-circuit impedance testing device to obtain a transformer short-circuit impedance change trend;

[0108] The testing module 420 is further used to carry out a winding capacitance test based on the capacitance testing device to obtain a change trend of winding capacitance data;

[0109] The diagnosis module 430 is used to jointly diagnose whether the transformer winding is deformed according to the change trend of the transformer short-circuit impedance and the change trend of the winding capacitance data.

[0110] It can be understood that the relevant contents of each module in the above device have been described in detail in the aforementioned method embodiment, and the details can be referred to the contents in the method embodiment; that is, the transformer winding deformation diagnosis device provided in the present application can be executed as follows: Figure 1 Any steps in the illustrated embodiment will not be described in detail here.

[0111] In one embodiment of the present application, an electronic device is also provided. The electronic device may include a processor and a memory, wherein the memory stores a computer program, and when the computer program is executed by the processor, the execution Figure 1 Any step in the method embodiment shown can execute the relevant construction of the model and can also execute the application calculation of the model. The electronic device can also include an input / output device, etc. In a specific implementation, the electronic device can be a server, a terminal device, etc.

[0112] In one embodiment, a computer-readable storage medium is further provided. The computer-readable storage medium stores a computer program. When the computer program is executed by a processor, the processor executes any step in the above method embodiment.

[0113] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the program can be stored in a non-volatile computer-readable storage medium. When the program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided in this application can include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. As an illustration and not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).

[0114] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0115] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A method for diagnosing transformer winding deformation, characterized in that: The method comprises: Construct a short-circuit impedance test device and a capacitance test device; Based on the short-circuit impedance testing device, a transformer short-circuit impedance test is carried out to obtain a change trend of the transformer short-circuit impedance; Conducting a winding capacitance test based on the capacitance testing device to obtain a winding capacitance data change trend; Whether the transformer winding is deformed is diagnosed jointly based on the change trend of the transformer short-circuit impedance and the change trend of the winding capacitance data.

2. The transformer winding deformation diagnosis method according to claim 1, characterized in that: The short-circuit impedance test device comprises a voltage regulator, a current test device and a voltage test device; the voltage regulator is connected to the primary side of the transformer under test, the secondary side of the transformer under test is short-circuited, and the current test device and the voltage test device are used to measure the current and voltage of the primary side of the transformer under test respectively; The winding capacitance test applies the principle of charging and discharging a capacitor and calculates the capacitance through changes in voltage and current.

3. The transformer winding deformation diagnosis method according to claim 1, characterized in that: The method further comprises: When the transformer short-circuit impedance test is abnormal, the cause of the transformer short-circuit impedance abnormality is analyzed according to a preset transformer short-circuit impedance calculation formula, and the preset transformer short-circuit impedance calculation formula is as follows: Among them, f is the frequency, I is the rated current, W is the total number of turns when the main tap is connected, I and W are the data of the winding on the same side, e t is the potential per turn, H K is the average reactance height of the two windings, K is the additional reactance coefficient, ρ is the Rockwell coefficient, and ∑D is the winding space size.

4. The transformer winding deformation diagnosis method according to claim 1, characterized in that: The winding capacitance test includes: inter-winding capacitance test or winding-to-ground capacitance test.

5. The transformer winding deformation diagnosis method according to claim 4, characterized in that: The method further comprises: According to the capacitance calculation formula, the principle of diagnosing winding deformation according to winding capacitance is determined. The capacitance calculation formula is: Among them, ε is the relative dielectric constant, S is the area facing the two plates, k is the electrostatic force constant, and d is the vertical distance between the two plates.

6. The transformer winding deformation diagnosis method according to claim 1, characterized in that: The jointly diagnosing whether the transformer winding is deformed according to the change trend of the transformer short-circuit impedance and the change trend of the winding capacitance data includes: Obtain transformer winding deformation diagnosis table; Determine whether the change trend of the transformer short-circuit impedance and the change trend of the winding capacitance data are consistent with the change rules in the transformer winding deformation diagnosis table; If they are consistent, it is determined whether the transformer winding is deformed, and the deformation type corresponding to the change rule is determined.

7. The transformer winding deformation diagnosis method according to claim 6, characterized in that: The transformer winding deformation diagnosis table includes the following corresponding relationships: Deformation type, short-circuit impedance change trend, each side winding capacitance data change trend and comprehensive judgment, the deformation type includes winding type and deformation direction.

8. A transformer winding deformation diagnosis device, characterized in that: include: A construction module for constructing a short-circuit impedance test device and a capacitance test device; A testing module, used to carry out a transformer short-circuit impedance test based on the short-circuit impedance testing device to obtain a change trend of the transformer short-circuit impedance; The test module is further used to carry out a winding capacitance test based on the capacitance test device to obtain a change trend of winding capacitance data; The diagnosis module is used to jointly diagnose whether the transformer winding is deformed according to the change trend of the transformer short-circuit impedance and the change trend of the winding capacitance data.

9. An electronic device, characterized in that: The method comprises a memory and a processor, wherein the memory stores a computer program, and when the computer program is executed by the processor, the processor executes the steps of the method according to any one of claims 1 to 7.

10. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the processor is caused to perform the steps of the method according to any one of claims 1 to 7.

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