Testing device and testing system

Abstract

The invention relates to a testing device and a testing system.The testing device comprises a shell, a testing jig and a connecting assembly, and the shell is provided with a testing bin; the test fixture is provided with a movable first test fixture and a movable second test fixture, the first test fixture can extend out of or be accommodated in the test bin, the first test fixture is provided with a floatable test station, and the second test fixture is accommodated in the test bin; the connecting assembly is assembled on the test fixture, and the second test fixture drives the test station to approach or leave at least part of the connecting assembly, so that the connecting assembly is in electric contact with or separated from the test piece on the test station. According to the invention, by arranging the first test fixture, the second test fixture and the connecting assembly which can float the test station, the product is relatively stable during testing, and the accuracy of product testing and the use experience of consumers are greatly improved.

Description

Technical Field

[0001] The present disclosure relates to the technical field of electronic equipment testing, and in particular to a testing device and a testing system. Background Art

[0002] ECG monitoring is an effective means of early detection of cardiovascular diseases. With the increasing functions of smart electronic devices and consumers' growing health awareness, electronic devices without health detection functions are gradually unable to meet consumers' needs for rapid health monitoring. Electronic devices with medical certification of electrocardiogram (ECG) data, such as wearable devices, are undoubtedly becoming hot in the electronic device market.

[0003] The accuracy of factory calibration and testing of ECG functions is of great concern to consumers. At present, when testing the ECG function of products, the test equipment has problems such as unstable testing and poor test accuracy, which directly affects the consumer's experience. Summary of the invention

[0004] In order to overcome the problems existing in the related art, the present disclosure provides a testing device and a testing system.

[0005] According to a first aspect of an embodiment of the present disclosure, there is provided a testing device, comprising: a housing having a testing chamber; a testing fixture, wherein the testing fixture is provided with a movable first testing fixture and a movable second testing fixture, wherein the first testing fixture can be extended out or accommodated in the testing chamber, wherein the first testing fixture is provided with a floating testing station, and the second testing fixture is accommodated in the testing chamber; and a connecting assembly assembled on the testing fixture, wherein the second testing fixture drives the testing station to approach or move away from at least a portion of the connecting assembly, so that the connecting assembly is in electrical contact with or out of contact with a test piece on the testing station.

[0006] In some possible embodiments, the first test fixture includes: a base, the connecting component is installed on the base; a supporting component, a reset component is arranged between the supporting component and the base so that the supporting component can float on the base, at least a part of the connecting component is located between the supporting component and the base, and the test station is arranged on the supporting component.

[0007] In some possible implementations, the support assembly includes:

[0008] A support member having a first hardness, wherein the support member is provided with a first opening;

[0009] A positioning member having a second hardness, wherein the second hardness is smaller than the first hardness, the positioning member is connected to the supporting member, the test station is arranged on the positioning member, the positioning member is provided with a second opening, the second opening is arranged corresponding to the first opening, and at least a part of the connecting component is electrically contacted or disconnected with the test piece on the test station through the first opening and the second opening.

[0010] In some possible implementations, the connection component includes:

[0011] The first connecting component is installed on the base and is located between the supporting component and the base. When the second test fixture drives the test station close to the first connecting component, the first connecting component is electrically contacted with the test piece on the test station through the first opening and the second opening.

[0012] In some possible implementations, the first connection component includes:

[0013] A first connecting seat, mounted on the base, a mounting portion is provided on the first connecting seat, and the first connecting seat is an insulating seat;

[0014] A first conductive component is assembled on the mounting portion and protrudes from the first connecting seat. When the second test fixture drives the test station close to the first connecting component, the first conductive component is electrically contacted with the test piece on the test station through the first opening and the second opening.

[0015] In some possible implementations, the first conductive component includes a plurality of first conductive components, and the plurality of first conductive components are assembled on the mounting portion.

[0016] Each of the first conductive components includes a conductive seat and a first conductive contact piece. The conductive seat is mounted on the first connecting seat, and the first conductive contact piece is protrudingly mounted on the conductive seat.

[0017] In some possible implementations, the connection component further includes:

[0018] The second connecting component is installed on the base and is located outside the first connecting component. When the first connecting component is in electrical contact with the first part of the test piece on the test station, the second connecting component is in electrical contact with the second part of the test piece on the test station.

[0019] In some possible implementations, the second connection component includes:

[0020] A second connecting seat, mounted on the base;

[0021] A first driving member, mounted on the second connecting seat;

[0022] The second conductive contact piece is installed on the driving end of the first driving piece. When the first connecting component is in electrical contact with the first part of the test piece on the test station, the first driving piece drives the second conductive contact piece to be in electrical contact with the second part of the test piece on the test station.

[0023] In some possible implementations, the second test fixture includes:

[0024] A connecting member, installed in the housing and located above the first test fixture;

[0025] A second driving member, mounted on the connecting member;

[0026] A pressing assembly is installed at the driving end of the second driving member, and the second driving member drives the pressing assembly to approach or move away from the first test fixture to make the connecting assembly electrically contact or lose contact with the test piece on the test station.

[0027] In some possible implementations, the pressing assembly includes:

[0028] a substrate mounted on the driving end of the second driving member,

[0029] A limit block, mounted on a side of the substrate facing the first test fixture;

[0030] A buffer component is arranged corresponding to the test station, and the buffer component is on the same side as the limit block and is elastically connected to the base plate.

[0031] In some possible implementations, the testing device further includes:

[0032] A test circuit board is installed on the second test fixture, and the test circuit board is connected to the first conductive contact piece and the second conductive contact piece through wires.

[0033] In some possible implementations, the testing device further includes:

[0034] A guide drive assembly is installed on the first test fixture, and the guide drive assembly drives the first test fixture to extend out or be accommodated in the test chamber.

[0035] In some possible implementations, the guide drive assembly includes:

[0036] A bottom plate is installed in the test chamber of the shell,

[0037] A support plate, arranged parallel to the bottom plate and slidable on the bottom plate;

[0038] A vertical plate, mounted on the support plate near the door of the test chamber; and

[0039] The third driving member is installed on the bottom plate, and the driving end of the third driving member is connected to the vertical plate.

[0040] According to a second aspect of an embodiment of the present disclosure, a testing system is provided, comprising a testing device as described in any embodiment of the first aspect above; a tester installed in the testing device, the tester being electrically connected to the testing device; and a host computer, the host computer being electrically connected to the tester via a communication line.

[0041] The technical solution provided by the embodiments of the present disclosure may include the following beneficial effects: the present disclosure provides a testing device, having a shell of a testing chamber, the testing fixture is provided with a movable first testing fixture and a movable second testing fixture, the first testing fixture can be extended or accommodated in the testing chamber, the first testing fixture is provided with a floating testing station, the second testing fixture is accommodated in the testing chamber; a connecting component is assembled on the testing fixture, and the second testing fixture drives the testing station to approach or move away from at least part of the connecting component, so that the connecting component is in electrical contact with or out of contact with the test piece on the testing station. The present disclosure makes the product relatively stable during testing by providing the first testing fixture, the second testing fixture and the connecting component of the floating testing station, which greatly improves the accuracy of product testing and the user experience of consumers.

[0042] It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present disclosure. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and, together with the description, serve to explain the principles of the present disclosure.

[0044] Figure 1 is an assembly diagram of a testing device according to an exemplary embodiment.

[0045] Figure 2 It is a schematic structural diagram of a shell according to an exemplary embodiment.

[0046] Figure 3 is an assembly diagram of a test fixture according to an exemplary embodiment.

[0047] Figure 4 is an exploded view of a test fixture according to an exemplary embodiment.

[0048] Figure 5 is an exploded view of a first test fixture according to an exemplary embodiment.

[0049] Figure 6 is an exploded view of a support assembly according to an exemplary embodiment.

[0050] Figure 7 is an exploded view of a first connection component according to an exemplary embodiment.

[0051] Figure 8 is a cross-sectional view of a first connection assembly according to an exemplary embodiment.

[0052] Fig. 9 is a schematic structural diagram of a second connection component according to an exemplary embodiment.

[0053] Fig.10 is a schematic structural diagram of a second test fixture according to an exemplary embodiment.

[0054] Fig.11 is a cross-sectional view of a second test fixture according to an exemplary embodiment.

[0055] Fig.12 It is a schematic structural diagram of a guide drive assembly according to an exemplary embodiment.

[0056] Fig.13 It is a schematic structural diagram of a guide drive assembly from a viewing angle according to an exemplary embodiment.

[0057] Fig.14 It is a schematic diagram of the structure of a testing system according to an exemplary embodiment.

[0058] Reference numerals:

[0059] 1. Matching pin; 2. Fixing screw; 3. Linear bushing; 4. Circlip; 5. Equal height screw; 6. Tester; 7. Upper computer; 8. Circuit control board; 9. Transmitter element;

[0060] 10. Shell; 101. Human-machine operation button; 102. Barcode scanner; 103. Upper cover; 11. Test chamber;

[0061] 20. Test fixture; 201. Test station;

[0062] 21. first test fixture; 211. base; 212. support assembly; 2121. support member; 2122. positioning member; 2123. first opening; 2124. second opening; 213. reset assembly;

[0063] 22. Second test fixture; 221. Connecting member; 2211. First connecting plate; 2212. Second connecting plate; 222. Second driving member; 223. Pressing assembly; 2231. Base plate; 2232. Stop block; 2233. Buffer assembly; 2234. Guide sleeve; 2235. Connecting block; 2236. Pressing stop block; 2237. Guide shaft;

[0064] 30. Connect components;

[0065] 31. first connecting component; 311. first connecting seat; 312. mounting portion; 313. first conductive component; 314. conductive seat; 315. first conductive contact piece; 316. conductive sleeve; 317. conductive contact cloth; 318. conductive elastic rubber; 319. conductive copper core; 320. conductive copper rod;

[0066] 32. second connecting assembly; 321. second connecting seat; 322. first driving member; 323. second conductive contact member; 324. probe fixing block; 325. screw;

[0067] 40. Test circuit board; 50. Guide drive assembly; 51. Base plate; 52. Support plate; 53. Vertical plate; 54. Third drive member; 55. Slide rail; 56. Guide rail slider; 57. Support part; 58. Connecting strip; 59. Cylinder connector; 60. Floating joint. DETAILED DESCRIPTION

[0068] Exemplary embodiments will be described in detail herein, examples of which are shown in the accompanying drawings. When the following description refers to the drawings, the same numbers in different drawings represent the same or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present disclosure. Instead, they are merely examples of devices and methods consistent with some aspects of the present disclosure as detailed in the appended claims.

[0069] With the increasing functions of smart electronic devices and consumers' growing health awareness, electronic devices with rapid health monitoring are becoming more and more popular among consumers. Electronic devices with medical certification of electrocardiogram data, such as wearable devices, are becoming more and more popular among consumers.

[0070] In the related art, the accuracy of the test device used in the ECG function test of the product is not ideal, and there is a risk of damaging the appearance of the product.

[0071] In order to solve the above technical problem, according to a first aspect of the present disclosure, a testing device is provided. Figure 1 is an assembly diagram of a testing device according to an exemplary embodiment. Figure 2It is a schematic structural diagram of a shell according to an exemplary embodiment. Figure 3 is an assembly diagram of a test fixture according to an exemplary embodiment. Figure 4 is an exploded view of a test fixture according to an exemplary embodiment.

[0072] like Figure 1-4 As shown, the testing device includes: a housing 10 , a testing fixture 20 and a connecting assembly 30 .

[0073] The shell 10 has a test chamber 11; the test fixture 20 is provided with a movable first test fixture 21 and a movable second test fixture 22, the first test fixture 21 can be extended or accommodated in the test chamber 11, the first test fixture 21 is provided with a floating test station 201, and the second test fixture 22 is accommodated in the test chamber 11; the connection component 30 is assembled on the test fixture 20, and the second test fixture 22 drives the test station 201 to approach or move away from at least a part of the connection component 30, so that the connection component 30 is electrically contacted or disconnected with the test piece on the test station 201.

[0074] The housing 10 may be a shielding box, and the shielding box may be a sheet metal box, such as Figure 1-2 As shown, the shielding box is provided with human-machine operation buttons 101, such as a start button, an emergency stop button, etc. The shielding box is also provided with a barcode scanner 102 and an upper cover 103. The barcode scanner 102 is used to read the product serial number of the test piece, i.e., the Serial Number, SN number. The upper cover 103 is buckled with the sheet metal box through a spring to achieve electromagnetic shielding.

[0075] The test fixture 20 is a core component of the test device. The test fixture 20 is provided with a first test fixture 21 and a movable second test fixture 22. The first test fixture 21 can be extended or accommodated in the test chamber 11. The first test fixture 21 is provided with a floating test station 201, and the second test fixture 22 is accommodated in the test chamber 11.

[0076] The connection assembly 30 is assembled on the test fixture 20 , and the second test fixture 22 drives the test station 201 to approach or move away from at least a portion of the connection assembly 30 , so that the connection assembly 30 is in electrical contact with or out of contact with the test piece on the test station 201 .

[0077] When the test device is needed to perform an ECG function test on the test piece, the first test fixture 21 extends out of the test chamber 11, and the operator places the test piece on the test station 201 in the first test fixture 21. Then the first test fixture 21 drives the test piece into the test chamber 11, and the second test fixture 22 is pressed down to abut against the test piece on the test station 201, so that the connection component 30 is electrically contacted with the test piece on the test station 201 for testing.

[0078] In the present disclosure, a housing 10 having a test chamber 11 is provided, and a test fixture 20 is provided with a movable first test fixture 21 and a movable second test fixture 22. The first test fixture 21 can be extended or accommodated in the test chamber 11, and the first test fixture 21 is provided with a floating test station 201, and the second test fixture 22 is accommodated in the test chamber 11; a connection component 30 is assembled on the test fixture 20, and the second test fixture 22 drives the test station 201 to approach or move away from at least a part of the connection component 30, so that the connection component 30 is in electrical contact with or out of contact with the test piece on the test station 201. By providing the first test fixture 21, the second test fixture 22 and the connection component 30 with a floating test station, the product is relatively stable during testing, which greatly improves the accuracy of product testing and the user experience of consumers.

[0079] In some possible implementations, such as Figure 5 As shown, the first test fixture 21 includes a base 211 and a support assembly 212 .

[0080] The connecting component 30 is installed on the base 211; a reset component 213 is arranged between the supporting component 212 and the base 211 so that the supporting component 212 can float on the base 211, at least part of the connecting component 30 is located between the supporting component 212 and the base 211, and the test station 201 is arranged on the supporting component 212.

[0081] The base 211 may be a rectangular plate, a diamond plate, or a plate-like structure of other shapes, which is not specifically limited in the present disclosure.

[0082] The support component 212 is used to limit the test piece. At the same time, the support component 212 can float on the base 211 along the thickness direction of the base 211. For example, the support component 212 can move up and down 3 mm along the thickness direction of the base 211. The floating direction of the support component 212 is guided and limited by the equal height screws 5. There are multiple test stations 201 on the support component 212, and the multiple test stations 201 are arranged at intervals.

[0083] The initial position of the support assembly 212 is reset by the tension of the reset assembly 213. Specifically, the reset assembly 213 includes a spring.

[0084] In the disclosed embodiment, the support assembly 212 can float on the base 211, at least part of the connecting assembly 30 is located between the support assembly 212 and the base 211, and the test station 201 is arranged on the support assembly 212 to contact the ECG electrode sheet at the bottom of the test piece.

[0085] In some possible implementations, such as Figure 6As shown, the support assembly 212 includes: a support member 2121 and a positioning member 2122 .

[0086] The support member 2121 has a first hardness and is provided with a first opening 2123;

[0087] The positioning member 2122 has a second hardness, which is less than the first hardness. The positioning member 2122 is connected to the support member 2121. The test station 201 is set on the positioning member 2122. The positioning member 2122 is provided with a second opening 2124. The second opening 2124 is arranged corresponding to the first opening 2123. At least part of the connecting component 30 is electrically contacted or disconnected with the test piece on the test station 201 through the first opening 2123 and the second opening 2124.

[0088] The support member 2121 may be a hard aluminum plate, the first opening 2123 may be a square opening, and the second opening 2124 may be a square opening or a circular opening.

[0089] Exemplarily, the positioning member 2122 and the support member 2121 are positioned by the matching pin 1 and connected into a whole by the fixing screw 2. The linear bushing 3 and the support member 2121 are interference fit in the shaft hole. The linear bushing retaining spring 4 is clamped at the relatively small diameter of the linear bushing 3 to prevent it from falling off.

[0090] In the embodiment of the present disclosure, the support assembly 212 is used to limit the test piece, and the support assembly 212 can float on the base 211 along the thickness direction of the base 211.

[0091] In some possible implementations, such as Figure 5 As shown, the connection assembly 30 includes:

[0092] The first connecting component 31 is installed on the base 211 and is located between the supporting component 212 and the base 211. When the second test fixture 22 drives the test station 201 close to the first connecting component 31, the first connecting component 31 is electrically contacted with the test piece on the test station 201 through the first opening 2123 and the second opening 2124.

[0093] There may be a plurality of first connection components 31 , and the plurality of first connection components 31 are installed on the base 211 at intervals.

[0094] In the disclosed embodiment, when the second test fixture 22 drives the test station 201 to approach or move away from at least a portion of the first connection component 31 of the connection component 30 , the first connection component 31 is used to electrically contact or break contact with the test piece on the test station 201 .

[0095] In some possible implementations, such as Figure 7 As shown, the first connection component 31 includes: a first connection seat 311 and a first conductive component 313 .

[0096] The first connection seat 311 is installed on the base 211, and a mounting portion 312 is provided on the first connection seat 311, and the first connection seat 311 is an insulating seat; the first conductive component 313 is assembled on the mounting portion 312 and protrudes from the first connection seat 311. When the second test fixture 22 drives the test station 201 close to the first connection component 31, the first conductive component 313 is electrically contacted with the test piece on the test station 201 through the first opening 2123 and the second opening 2124.

[0097] The first connection seat 311 is an insulating seat, which may be a non-conductive insulator to prevent a short circuit between two electrode sheets at the bottom of the test piece when the test piece is tested.

[0098] There may be one or more first conductive components 313 , which is not specifically limited in the embodiment of the present disclosure. The first conductive components 313 may be connected to and conducted with two electrode sheets at the bottom of the test piece, respectively.

[0099] In the embodiment of the present disclosure, the first conductive component 313 and the mounting portion 312 of the first connection seat 311 are connected together by screws to achieve a detachable connection between the first conductive component 313 and the first connection seat 311 for easy disassembly and assembly.

[0100] In some possible implementations, such as Figure 8 As shown, the first conductive component 313 includes multiple first conductive components 313, which are assembled on the mounting portion 312, each first conductive component 313 includes a conductive seat 314 and a first conductive contact 315, the conductive seat 314 is mounted on the first connecting seat 311, and the first conductive contact 315 is protruded and mounted on the conductive seat 314.

[0101] The first conductive component 313 is conductive throughout, and the system resistance is within 5 ohms. The conductive seat 314 can be a conductive copper block.

[0102] Exemplarily, the first conductive contact member 315 includes a plurality of conductive contact parts, each of which includes a conductive sleeve 316, a contact conductive cloth head 317, a conductive elastic rubber 318 and a conductive copper core 319. The conductive contact part is threadedly connected to the conductive seat 314 through the conductive copper core 319. The contact conductive cloth head 317 is wrapped around the conductive elastic rubber 318, and the conductive elastic rubber 318 is elastically sleeved on the conductive copper core 319, and then fixed by the conductive sleeve 316 to prevent it from falling off; the conductive copper rod 320 is connected to the conductive seat 314 through threads.

[0103] In some possible implementations, such as Fig. 9 As shown, the connection component 30 further includes: a second connection component 32 .

[0104] The second connection component 32 is installed on the base 211 and is located outside the first connection component 31 . When the first connection component 31 is in electrical contact with the first part of the test piece on the test station 201 , the second connection component 32 is in electrical contact with the second part of the test piece on the test station 201 .

[0105] There may be a plurality of second connection components 32 , and the second connection components 32 are arranged corresponding to the first connection components 31 , and the plurality of second connection components 32 are installed on the base 211 at intervals.

[0106] In the embodiment of the present disclosure, when the second test fixture 22 drives the test station 201 close to at least a portion of the connecting component 30, the first connecting component 31 is used to electrically contact the first portion of the test piece on the test station 201, and at the same time, the second connecting component 32 is electrically contacted with the second portion of the test piece on the test station 201.

[0107] In some possible implementations, such as Fig. 9 As shown, the second connection component 32 includes: a second connection seat 321 , a first driving member 322 and a second conductive contact member 323 .

[0108] The second connecting seat 321 is installed on the base 211; the first driving member 322 is installed on the second connecting seat 321; the second conductive contact member 323 is installed on the driving end of the first driving member 322. When the first connecting component 31 is in electrical contact with the first part of the test piece on the test station 201, the first driving member 322 drives the second conductive contact member 323 to be in electrical contact with the second part of the test piece on the test station 201.

[0109] The second connection base 321 and the base 211 may be an integral structure or two independent components. The second connection base 321 and the base 211 are connected via screws 325 , which is not specifically limited in the embodiment of the present disclosure.

[0110] The first driving member 322 may be a cylinder, and the second conductive contact member 323 may be a probe.

[0111] Exemplarily, the first driving member 322 is connected to the probe fixing block 324 and the second connecting seat 321 by a screw 325, and the second conductive contact member 323 is interference fit with the probe fixing block 324; the first driving member 322 provides a driving force to move the second conductive contact member 323 and the probe fixing block 324 forward, and the second conductive contact member 323 contacts the side key of the test piece to realize the electrical connection of the test piece.

[0112] In some possible implementations, such as Figure 10-11 As shown, the second test fixture 22 includes: a connecting member 221 , a second driving member 222 and a pressing assembly 223 .

[0113] The connecting member 221 is installed in the shell 10 and is located above the first test fixture 21; the second driving member 222 is installed on the connecting member 221; the pressing assembly 223 is installed on the driving end of the second driving member 222, and the second driving member 222 drives the pressing assembly 223 to move closer to or away from the first test fixture 21, so that the connecting assembly 30 is electrically contacted or out of contact with the test piece on the test station 201.

[0114] The second test fixture 22 is used to press the upper surface of the test piece and move it downward, so that the ECG electrode sheet at the bottom of the test piece is connected to the first conductive component 313.

[0115] The connecting member 221 includes a first connecting plate 2211 and a second connecting plate 2212 , and the first connecting plate 2211 and the second connecting plate 2212 may be provided as an integral structure. The second connecting plate 2212 is connected to the inner wall of the testing chamber 11 .

[0116] In the embodiment of the present disclosure, the second driving member 222 may be a cylinder. The cylinder provides driving force to complete the pressing of the test piece. The pressing assembly 223 has a buffer protection function to prevent the cylinder pressure from being too high and crushing the test piece.

[0117] In some possible implementations, such as Figure 10-11 As shown, the pressing assembly 223 includes: a base plate 2231 , a limiting block 2232 and a buffer assembly 2233 .

[0118] The substrate 2231 is installed on the driving end of the second driving member 222, and the limit block 2232 is installed on the side of the substrate 2231 facing the first test fixture 21; the buffer component 2233 is arranged corresponding to the test station 201, and the buffer component 2233 is on the same side as the limit block 2232 and is elastically connected to the substrate 2231.

[0119] The limit block 2232 and the base plate 2231 can be connected by screws, and the buffer assembly 2233 can float in the limit block 2232 and the base plate 2231. The buffer assembly 2233 includes a rubber-coated pressing block and a spring. The rubber-coated pressing block is mainly used to reduce the damage to the test piece when it is squeezed and abutted, and is safer to use. The buffer assembly 2233 can provide downward pressure (10N).

[0120] Exemplarily, the outer diameter of the guide sleeve 2234 is interference fit (pressed into) with the hole of the base plate 2231, and the second drive member 222 is threadedly connected to the connecting block 2235 to serve as a fixed end; the downward pressure limit block 2236, the guide shaft 2237, the base plate 2231, and the limit block 2232 are connected together by screws (not shown) to serve as a downward pressure movable end; the downward pressure movable end and the fixed end are guided in the vertical direction by the hole-shaft fit.

[0121] In some possible implementations, such as Fig.10 As shown, the testing device further includes: a testing circuit board 40 .

[0122] The test circuit board 40 is installed on the second test fixture 22 , and the test circuit board 40 is connected to the first conductive contact 315 and the second conductive contact 323 through wires.

[0123] In the embodiment of the present disclosure, the first conductive contact 315 is connected to the test circuit board 40 through the conductive copper rod 320, and the second conductive contact 323 is connected to the test circuit board 40 through the conductive wire to realize the test path.

[0124] In some possible implementations, such as Figure 12-13 As shown, the testing device further includes: a guide drive assembly 50 .

[0125] The guide driving assembly 50 is installed on the first test fixture 21 , and the guide driving assembly 50 drives the first test fixture 21 to extend out or be accommodated in the test chamber 11 .

[0126] In the disclosed embodiment, the guide drive assembly 50 is used to switch the position of the test fixture 20 between the inbound test position and the outbound manual placement position.

[0127] In some possible implementations, such as Figure 12-13 As shown, the guide drive assembly 50 includes: a base plate 51 , a support plate 52 , a vertical plate 53 and a third drive member 54 .

[0128] The bottom plate 51 is installed in the test chamber 11 of the shell 10, and the support plate 52 is arranged parallel to the bottom plate 51 and can slide on the bottom plate 51; the vertical plate 53 is installed on the support plate 52 near the chamber door of the test chamber 11; the third driving member 54 is installed on the bottom plate 51, and the driving end of the third driving member 54 is connected to the vertical plate 53.

[0129] Exemplarily, a slide rail 55 is provided on the side of the support plate 52 facing the bottom plate 51, and a guide rail slider 56 is provided on the bottom plate 51, and a precise guide is provided between the slide rail 55 and the guide rail slider 56. A support portion 57 and a connecting strip 58 are rigidly connected to the support plate 52. A cylinder connector 59 is rigidly connected to the bottom plate 51. The third driving member 54 is installed on the bottom plate 51 through the cylinder connector 59, and the driving end of the third driving member 54 is connected to the vertical plate 53 through a floating joint 60.

[0130] Based on the same inventive concept, the present disclosure also provides a testing system, such as Fig.14 As shown, it includes a testing device as in any embodiment of the first aspect above, a tester 6 and a host computer 7.

[0131] The tester 6 is installed in the test device, the tester 6 is electrically connected to the test device, and the host computer 7 is electrically connected to the tester 6 via a communication line.

[0132] The tester 6 can be a one-to-four ECG tester. The tester 6 is connected to the host computer 7 via a universal serial bus (USB) communication line, transmits the final signal to the host computer 7, and interacts with the host computer 7 for command data. The ECG waveform content can be intuitively viewed on the screen of the host computer 7.

[0133] When the test system is required to perform an ECG function test on the test piece, the first test fixture 21 in the test device extends out of the test chamber 11, and the operator places the test piece on the test station 201 in the first test fixture 21. The first test fixture 21 then drives the test piece into the test chamber 11, and the second test fixture 22 is pressed down to abut against the test piece on the test station 201, so that the connection component 30 is in electrical contact with the test piece on the test station 201 for testing.

[0134] In the present disclosure, a housing 10 having a test chamber 11 is provided, and a test fixture 20 is provided with a movable first test fixture 21 and a movable second test fixture 22. The first test fixture 21 can be extended or accommodated in the test chamber 11, and the first test fixture 21 is provided with a floating test station 201, and the second test fixture 22 is accommodated in the test chamber 11; a connection component 30 is assembled on the test fixture 20, and the second test fixture 22 drives the test station 201 to approach or move away from at least a part of the connection component 30, so that the connection component 30 is in electrical contact with or out of contact with the test piece on the test station 201. By providing the first test fixture 21, the second test fixture 22 and the connection component 30 with a floating test station, the product is relatively stable during testing, which greatly improves the accuracy of product testing and the user experience of consumers.

[0135] In some possible implementations, such as Fig.14 As shown, the tester 6 is installed in the housing 10, and the tester 6 is electrically connected to the connection assembly 30; the host computer 7 is electrically connected to the tester 6 through a communication line.

[0136] In the disclosed embodiment, the tester 6 can be a one-to-four ECG tester. The tester 6 is connected to the host computer 7 via a Universal Serial BUS (USB) communication line, transmits the final signal to the host computer 7, and interacts with the host computer 7 for command data. The ECG waveform content can be intuitively viewed on the screen of the host computer 7.

[0137] In some possible implementations, such as Fig.14 As shown, the testing device includes a guide drive assembly 50 , and the testing system also includes: a circuit control board 8 .

[0138] The circuit control board 8 is installed in the housing 10 . The host computer 7 is electrically connected to the circuit control board 8 via a communication line. The circuit control board 8 is electrically connected to the guide drive assembly 50 and the second test fixture 22 .

[0139] In the disclosed embodiment, the circuit control board 8 may be a fixture motion control board for controlling the guide drive assembly 50 of the test device to perform related actions of entering and exiting the test chamber 11, the second test fixture 22, and related actions of the second connection assembly 32.

[0140] In some possible implementations, such as Fig.14 As shown, the test system further includes: a transmitting element 9.

[0141] The transmitting element 9 is installed in the housing 10 , the host computer 7 is electrically connected to the transmitting element 9 via a communication line, and the host computer 7 is connected to the testing device via the transmitting element 9 .

[0142] In the disclosed embodiment, the transmitting element 9 may be a Bluetooth transmitter, and the host computer 7 reads the waveform received by the test piece through the Bluetooth transmitter and makes a judgment.

[0143] The operating process of the test system is as follows:

[0144] The operator places the test piece on the test station 201 of the first test fixture 21 and presses the start button in the human-machine operation button 101; the guide drive component 50 brings the test piece into the test chamber 11. After it is in place, the second drive member 222 in the second test fixture 22 drives the pressing component 223 to press down and maintain it; so that the first conductive contact member 315 contacts the two electrode sheets of the ECG of the test piece; the second conductive contact member 323 is driven by the first drive member 322 to contact the ECG function button of the test piece; the test fixture 20 sends "to be tested" to the host computer 7; When the test starts, the host computer 7 controls the instrument to output a standard waveform through the instrument communication line, and the waveform is transmitted to the test piece through two electrode sheet wires and a side key wire; the host computer 7 reads the waveform received by the test piece through the transmitting element 9 and makes a judgment; after the test is completed, the host computer 7 sends "test completed" to the circuit control board 8, the first driving member 322 drives the second conductive contact member 323 to detach from the test piece, the second test fixture 22 moves away from the test piece, and the guide drive assembly 50 moves the test piece out of the test chamber 11; the operator removes the test piece to complete the entire test process.

[0145] It is to be understood that in the present disclosure, "plurality" refers to two or more than two, and other quantifiers are similar. "And / or" describes the association relationship of associated objects, indicating that three relationships may exist. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. The character " / " generally indicates that the associated objects before and after are in an "or" relationship. The singular forms "a", "the" and "the" are also intended to include plural forms, unless the context clearly indicates other meanings.

[0146] It is further understood that the terms "first", "second", etc. are used to describe various information, but such information should not be limited to these terms. These terms are only used to distinguish the same type of information from each other, and do not indicate a specific order or degree of importance. In fact, the expressions "first", "second", etc. can be used interchangeably. For example, without departing from the scope of the present disclosure, the first information can also be referred to as the second information, and similarly, the second information can also be referred to as the first information.

[0147] It will be further understood that the terms “center”, “longitudinal”, “lateral”, “front”, “back”, “up”, “down”, “left”, “right”, “vertical”, “horizontal”, “top”, “bottom”, “inside”, “outside”, etc., indicating orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, are only for the convenience of describing the present embodiment and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation.

[0148] It can be further understood that, unless otherwise specified, “connection” includes a direct connection without other components between the two, and also includes an indirect connection with other components between the two.

[0149] It is further understood that, although the operations are described in a specific order in the drawings in the embodiments of the present disclosure, it should not be understood as requiring the operations to be performed in the specific order shown or in a serial order, or requiring the execution of all the operations shown to obtain the desired results. In certain environments, multitasking and parallel processing may be advantageous.

[0150] Those skilled in the art will readily appreciate other embodiments of the present disclosure after considering the specification and practicing the invention disclosed herein. The present disclosure is intended to cover any variations, uses or adaptations of the present disclosure, which follow the general principles of the present disclosure and include common knowledge or customary techniques in the art that are not disclosed in the present disclosure. The specification and examples are intended to be exemplary only, and the true scope and spirit of the present disclosure are indicated by the following scope of rights.

[0151] It should be understood that the present disclosure is not limited to the precise structures that have been described above and shown in the drawings, and that various modifications and changes may be made without departing from the scope thereof. The scope of the present disclosure is limited only by the scope of the appended claims.

Claims

1. A testing device, characterized in that: include: A housing having a test chamber; A test fixture, wherein the test fixture is provided with a movable first test fixture and a movable second test fixture, the first test fixture can be extended or accommodated in the test chamber, the first test fixture is provided with a floating test station, and the second test fixture is accommodated in the test chamber; as well as A connection assembly, mounted on the test fixture, The second test fixture drives the test station to approach or move away from at least a portion of the connection component, so that the connection component is electrically contacted with or out of contact with the test piece on the test station.

2. The testing device according to claim 1, characterized in that: The first test fixture comprises: A base, wherein the connecting assembly is mounted on the base; A support component is provided between the support component and the base so that the support component can float on the base, at least part of the connecting component is located between the support component and the base, and the testing station is provided on the support component.

3. The testing device according to claim 2, characterized in that: The support assembly comprises: A support member having a first hardness, wherein the support member is provided with a first opening; A positioning member having a second hardness, wherein the second hardness is smaller than the first hardness, the positioning member is connected to the supporting member, the test station is arranged on the positioning member, the positioning member is provided with a second opening, the second opening is arranged corresponding to the first opening, and at least a part of the connecting component is electrically contacted or disconnected with the test piece on the test station through the first opening and the second opening.

4. The testing device according to claim 3, characterized in that: The connection component comprises: The first connecting component is installed on the base and is located between the supporting component and the base. When the second test fixture drives the test station close to the first connecting component, the first connecting component is electrically contacted with the test piece on the test station through the first opening and the second opening.

5. The testing device according to claim 4, characterized in that: The first connection component comprises: A first connecting seat, mounted on the base, a mounting portion is provided on the first connecting seat, and the first connecting seat is an insulating seat; A first conductive component is assembled on the mounting portion and protrudes from the first connecting seat. When the second test fixture drives the test station close to the first connecting component, the first conductive component is electrically contacted with the test piece on the test station through the first opening and the second opening.

6. The testing device according to claim 5, characterized in that: The first conductive component includes a plurality of first conductive components, and the plurality of first conductive components are assembled on the mounting portion. Each of the first conductive components includes a conductive seat and a first conductive contact piece. The conductive seat is mounted on the first connecting seat, and the first conductive contact piece is protrudingly mounted on the conductive seat.

7. The testing device according to claim 6, characterized in that: The connection component also includes: The second connecting component is installed on the base and is located outside the first connecting component. When the first connecting component is in electrical contact with the first part of the test piece on the test station, the second connecting component is in electrical contact with the second part of the test piece on the test station.

8. The testing device according to claim 7, characterized in that: The second connection component comprises: A second connecting seat, mounted on the base; A first driving member, mounted on the second connecting seat; The second conductive contact piece is installed on the driving end of the first driving piece. When the first connecting component is in electrical contact with the first part of the test piece on the test station, the first driving piece drives the second conductive contact piece to be in electrical contact with the second part of the test piece on the test station.

9. The testing device according to claim 1, characterized in that: The second test fixture comprises: A connecting member, installed in the housing and located above the first test fixture; A second driving member, mounted on the connecting member; A pressing assembly is installed at the driving end of the second driving member, and the second driving member drives the pressing assembly to approach or move away from the first test fixture to make the connecting assembly electrically contact or lose contact with the test piece on the test station.

10. The testing device according to claim 9, characterized in that: The pressing assembly comprises: a substrate mounted on the driving end of the second driving member, A limit block, mounted on a side of the substrate facing the first test fixture; A buffer component is arranged corresponding to the test station, and the buffer component is on the same side as the limit block and is elastically connected to the base plate.

11. The testing device according to claim 8, characterized in that: Also includes: A test circuit board is installed on the second test fixture, and the test circuit board is connected to the first conductive contact piece and the second conductive contact piece through wires.

12. The testing device according to claim 1, characterized in that: Also includes: A guide drive assembly is installed on the first test fixture, and the guide drive assembly drives the first test fixture to extend out or be accommodated in the test chamber.

13. The testing device according to claim 12, characterized in that: The guide drive assembly comprises: A bottom plate is installed in the test chamber of the shell, A support plate, arranged parallel to the bottom plate and slidable on the bottom plate; A vertical plate, mounted on the support plate near the door of the test chamber; and The third driving member is installed on the bottom plate, and the driving end of the third driving member is connected to the vertical plate.

14. A testing system, characterized in that: include: The testing device as claimed in any one of claims 1 to 13; A tester is installed in the test device, and the tester is electrically connected to the test device; as well as A host computer is electrically connected to the tester via a communication line.

Images