Intelligent factory testing method and system based on infrared emission mode, medium and equipment

Abstract

The invention provides an intelligent factory testing method and system based on an infrared emission mode, a medium and equipment, computer equipment responds to account login and operation of determining a production line, accesses an MQTT network, sends production line information and equipment information of equipment to be detected to infrared equipment, and sends the infrared equipment to the MQTT network; the infrared equipment forwards the MAC address of the corresponding to-be-detected equipment to the computer equipment, and the computer equipment receives and displays the MAC address of the to-be-detected equipment, resets factory test items of the to-be-detected equipment, and receives and displays one or more factory test results of the to-be-detected equipment forwarded by the infrared equipment, and the computer equipment judges and stores the received one or more factory test results, so that factory test automation is realized, factory test data loss is avoided, the accuracy of the factory test data is improved, the factory test history of specific equipment can be checked at any time on the management platform, the factory test process of each piece of equipment can be managed efficiently, and the factory test efficiency is improved. And the troubleshooting efficiency is improved.

Description

Technical Field

[0001] The present application relates to the field of factory testing technology, and in particular to an intelligent factory testing method, system, medium and equipment based on infrared emission mode. Background Art

[0002] After a component is produced on the production line, the various hardware of the equipment needs to be factory tested to verify whether the various performance of the equipment meets the requirements. Only when they meet the requirements can they be shipped out of the factory. Under the existing factory testing mode, factory testing is purely manual on the production line, and the factory test results are manually observed and recorded manually. Due to the large number of factory testing items, the following defects are prone to occur: manual recording of factory test results, there is a risk of recording errors or loss; the factory testing process is cumbersome, and can only be limited to the factory test box on the running machine to observe the results, which is not convenient for engineers to troubleshoot problems; it is impossible to view the factory test process records in real time, and the troubleshooting efficiency is low. Summary of the invention

[0003] In view of the shortcomings of the prior art mentioned above, the purpose of the present application is to provide an intelligent factory testing method, system, medium and equipment based on infrared emission mode, which is used to solve the technical problems in the prior art that manual recording of factory testing results may result in loss or error, the factory testing process records cannot be viewed in real time, and the troubleshooting efficiency is low.

[0004] To achieve the above-mentioned purpose and other related purposes, the first aspect of the present application provides an intelligent factory testing method based on infrared emission mode, which is applied to computer equipment, including:

[0005] In response to the account login and production line confirmation operations, access to the MQTT network;

[0006] Send the production line information and the device information of the device to be detected to the infrared device, so that the infrared device can parse and splice the MAC addresses sent by the device to be detected at preset time intervals according to the device information and then forward the MAC addresses of the corresponding devices to be detected;

[0007] Receive and display the MAC address of the device to be detected, reset the factory test items of the device to be detected, so that the device to be detected can be factory tested and send one or more factory test results to the infrared device according to a preset infrared data protocol;

[0008] Receive and display one or more factory test results forwarded by the infrared device, and determine whether the login name of the factory test result is consistent with the MAC address of the device to be tested according to each factory test result;

[0009] If they are consistent, the factory test result of the device to be tested is stored and displayed; otherwise, the factory test result is discarded.

[0010] In some embodiments of the first aspect of the present application, the method of sending the production line information and the device information of the device to be detected to the infrared device so that the infrared device can perform data parsing and splicing on the MAC address sent by the device to be detected at a preset time interval according to the device information includes:

[0011] If the MAC address sent by the device to be detected to the infrared device exceeds the transmission capacity of the serial port, the MAC address is sent to the infrared device in segments;

[0012] When sending MAC address segments to infrared devices, a header data associated with the device to be detected is set for each segment address, so that the infrared device can identify the device to be detected according to its header data after receiving each segment address, and then piece together the segment addresses into a complete MAC address for forwarding.

[0013] In some embodiments of the first aspect of the present application, the infrared data protocol includes one or more combinations of a fixed-length status sending protocol, a fixed-length status and error code sending protocol, and a variable-length status and error code sending protocol.

[0014] In some embodiments of the first aspect of the present application, when the infrared data protocol includes a fixed-length status sending protocol, the format of the fixed-length status sending protocol includes: a frame header, a frame length, a fixed length and a check code; wherein the fixed length includes one or more instruction codes used to characterize the type of factory test item.

[0015] In some embodiments of the first aspect of the present application, when the infrared data protocol includes a fixed-length status and error code sending protocol, the format of the fixed-length status and error code sending protocol includes: a frame header, a frame length, a fixed length and a check code; wherein the fixed length includes one or more instruction codes for characterizing the type of factory test item and an error code for characterizing the corresponding error type in the instruction code.

[0016] To achieve the above-mentioned purpose and other related purposes, the second aspect of the present application provides an intelligent factory testing method based on infrared emission mode, which is applied to the equipment to be tested, including:

[0017] Sending the MAC address of the device to be detected to the infrared device at a preset time interval, so that the computer device receives and displays the MAC address of the device to be detected forwarded by the infrared device;

[0018] In response to a factory test item start signal, broadcast a factory test start voice and perform the factory test;

[0019] One or more factory test results of the device to be tested are sent to the infrared device according to a preset infrared data protocol, so that the computer device receives and displays the one or more factory test results forwarded by the infrared device, and determines whether the login name of the factory test result is consistent with the MAC address of the device to be tested based on each factory test result to decide whether to retain or discard the factory test result.

[0020] To achieve the above-mentioned purpose and other related purposes, the third aspect of the present application provides an intelligent factory testing system based on infrared emission mode, including:

[0021] Computer equipment;

[0022] The device to be detected has a communication connection established with the computer device;

[0023] An infrared device, which establishes communication connections with the computer device and the device to be detected respectively;

[0024] The computer device accesses the MQTT network in response to the operation of account login and production line determination; the computer device sends the production line information and the device information of the device to be detected to the infrared device, the device to be detected sends its MAC address to the infrared device at a preset time interval, the infrared device performs data parsing and splicing on the MAC address according to the device information and then forwards the MAC address of the device to be detected to the computer device; the computer device receives and displays the MAC address of the device to be detected and resets the factory test items of the device to be detected; the device to be detected responds to the factory test item start signal to broadcast the factory test start voice and perform factory test, and sends one or more factory test results of the device to be detected to the infrared device according to the preset infrared data protocol; the infrared device forwards the one or more factory test results to the computer device, the computer device receives and displays the one or more factory test results forwarded by the infrared device, and determines whether the login name of the factory test result is consistent with the MAC address of the device to be detected according to each factory test result; if they are consistent, the factory test result of the device to be detected is stored and displayed; otherwise, the factory test result is discarded.

[0025] To achieve the above-mentioned purpose and other related purposes, the fourth aspect of the present application provides a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the intelligent factory testing method based on the infrared emission mode as described above is implemented.

[0026] To achieve the above-mentioned purpose and other related purposes, the fifth aspect of the present application provides an electronic terminal, including: a processor and a memory; the memory is used to store computer programs; the processor is used to execute the computer programs stored in the memory, so that the electronic terminal executes the intelligent factory testing method based on the infrared emission mode as described above.

[0027] To achieve the above-mentioned purpose and other related purposes, the sixth aspect of the present application provides an intelligent robot device, characterized in that it includes: a processor and a memory; the memory is used to store computer programs; the processor is used to execute the computer programs stored in the memory, so that the intelligent robot device performs the intelligent factory testing method based on the infrared emission mode as described above.

[0028] As described above, the present application's intelligent factory testing method, system, medium and device based on infrared emission mode have the following beneficial effects: the computer device responds to the account login and production line determination operations, accesses the MQTT network, and sends the production line information and the device information of the device to be tested to the infrared device, so that the infrared device can perform data parsing and splicing on the MAC address sent by the device to be tested at a preset time interval according to the device information, and then forwards the MAC address of the corresponding device to be tested; the computer device receives and displays the MAC address of the device to be tested, resets the factory testing items of the device to be tested, so that the device to be tested can be factory tested and sent One or more factory test results are sent to the infrared device according to a preset infrared data protocol; the computer device judges and stores the one or more factory test results forwarded by the received infrared device, thereby realizing factory test automation, reporting each test result to the cloud in real time, and displaying the real-time equipment factory test process on the production line computer device. When all test items are completed, the factory test results are saved to the cloud database, avoiding the loss of factory test data and improving the accuracy of equipment factory test data. On the management platform, the factory test history of specific equipment can be viewed at any time, truly achieving efficient management of the factory test process of each device and improving the efficiency of troubleshooting. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] Figure 1 Shown is an applicable scenario diagram of an intelligent factory testing method based on infrared emission mode in one embodiment of the present application.

[0030] Figure 2A Shown is a flow chart of an intelligent factory testing method based on infrared emission mode in one embodiment of the present application.

[0031] Figure 2B It shows a format diagram of an infrared data protocol in an embodiment of the present application as a fixed-length transmission protocol.

[0032] Figure 2C It shows a format diagram of the infrared data protocol in a fixed-length state and error code sending protocol in one embodiment of the present application.

[0033] Figure 2D It shows a format diagram of an infrared data protocol of a variable length state and error code sending protocol in one embodiment of the present application.

[0034] Figure 3 Shown is another flow chart of an intelligent factory testing method based on infrared emission mode in one embodiment of the present application.

[0035] Figure 4A Shown is a structural diagram of an intelligent factory testing system based on infrared emission mode in one embodiment of the present application.

[0036] Figure 4B Shown is a schematic diagram of the operation flow of the intelligent factory testing system based on the infrared emission mode in an embodiment of the present application.

[0037] Figure 5 Shown is a schematic diagram of the structure of an electronic terminal in one embodiment of the present application. DETAILED DESCRIPTION

[0038] The following describes the embodiments of the present application through specific examples, and those skilled in the art can easily understand other advantages and effects of the present application from the contents disclosed in this specification. The present application can also be implemented or applied through other different specific embodiments, and the details in this specification can also be modified or changed in various ways based on different viewpoints and applications without departing from the spirit of the present application. It should be noted that the following embodiments and features in the embodiments can be combined with each other without conflict.

[0039] It should be noted that in the following description, with reference to the accompanying drawings, several embodiments of the present application are described in the accompanying drawings. It should be understood that other embodiments may also be used, and mechanical composition, structure, electrical and operational changes may be made without departing from the spirit and scope of the present application. The following detailed description should not be considered restrictive, and the scope of the embodiments of the present application is limited only by the claims of the published patents. The terms used here are only for describing specific embodiments and are not intended to limit the present application. Spatially related terms, such as "upper", "lower", "left", "right", "below", "below", "lower", "above", "upper", etc., may be used in the text to facilitate the description of the relationship between an element or feature shown in the figure and another element or feature.

[0040] In this application, unless otherwise clearly specified and limited, the terms "install", "connect", "connect", "fix", "hold" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be an indirect connection through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0041] Furthermore, as used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless there is an indication to the contrary in the context. It should be further understood that the terms "comprise", "include" indicate the presence of the described features, operations, elements, components, items, kinds, and / or groups, but do not exclude the presence, occurrence or addition of one or more other features, operations, elements, components, items, kinds, and / or groups. The terms "or" and "and / or" used herein are interpreted as inclusive, or mean any one or any combination. Therefore, "A, B or C" or "A, B and / or C" means "any of the following: A; B; C; A and B; A and C; B and C; A, B and C". Exceptions to this definition will only occur when the combination of elements, functions or operations is inherently mutually exclusive in some way.

[0042] In the prior art, after a component is produced on the production line, various hardware of the equipment needs to be factory tested to verify whether the various performances of the equipment meet the requirements. Only when they meet the requirements can they be shipped out of the factory. In the existing factory testing mode, the factory test is purely manual on the production line, and the factory test results are manually observed and recorded manually. Due to the large number of factory test items, the following defects are prone to occur: manual recording of factory test results, there is a risk of recording errors or loss; the factory test process is cumbersome, and can only be limited to the factory test box on the running machine to observe the results, which is not convenient for engineers to troubleshoot problems; it is impossible to view the factory test process records in real time, and the troubleshooting efficiency is low. Therefore, an intelligent factory test mode is provided, which can report the test results of each item to the cloud in real time, and display the real-time process on the computer equipment on the production line. When all the test items are completed, the factory test results will be saved to the cloud database. On the management platform, the factory test history of the specific machine can be viewed, which is of great significance.

[0043] In order to solve the technical problems in the prior art that manual recording of factory test results may result in loss or error, the factory test process records cannot be viewed in real time, and the troubleshooting efficiency is low, the present invention provides an intelligent factory test method, system, medium and equipment based on infrared emission mode, aiming to improve the accuracy of equipment factory test data and the efficiency of troubleshooting.

[0044] At the same time, in order to make the purpose, technical solution and advantages of the present invention more clear, the technical solution in the embodiment of the present invention is further described in detail through the following embodiments and in combination with the accompanying drawings. It should be understood that the specific embodiments described here are only used to explain the present invention and are not used to limit the invention.

[0045] Before further describing the present invention in detail, the nouns and terms involved in the embodiments of the present invention are explained. The nouns and terms involved in the embodiments of the present invention are applicable to the following interpretations:

[0046] <1> MQTT (Message Queuing Telemetry Transport): Message Queuing Telemetry Transport Protocol is a "lightweight" communication protocol based on the publish / subscribe model. The protocol is built on the TCP / IP protocol and can provide real-time and reliable message services for remote connected devices with very little code and limited bandwidth.

[0047] <2> Infrared device: Send and receive data according to the preset infrared data protocol.

[0048] The embodiment of the present invention provides an intelligent factory testing method, system, medium and device based on infrared emission mode. As for the implementation of an intelligent factory testing method based on infrared emission mode, the embodiment of the present invention will illustrate an exemplary implementation scenario of an intelligent factory testing method based on infrared emission mode.

[0049] like Figure 1 As shown, it is a diagram showing an applicable scenario of an intelligent factory testing method based on infrared emission mode in one embodiment of the present application. The scenarios applicable to the intelligent factory testing method based on infrared emission mode described in the present application include: a computer device 11, an infrared device 12, and a device to be tested 13, wherein the device to be tested 13 has a communication connection with the computer device 11; and the infrared device 12 has a communication connection with the computer device 11 and the device to be tested 13 respectively.

[0050] The computer device 11 includes, but is not limited to, desktop computer devices, tablet devices, digital processing devices, factory background processing devices, embedded computer devices, etc.

[0051] The infrared device 12 is mainly composed of an infrared light transmitter, a receiver, a filter, an amplifier, a signal processing circuit and an output interface, and can receive and transmit infrared signals.

[0052] The equipment to be detected 13 can only transmit infrared signals but cannot receive infrared signals, including but not limited to: intelligent robots, intelligent sweepers, intelligent lawn mowers, etc. The intelligent robots include but are not limited to industrial robots, primary intelligent robots, intelligent agricultural robots, and household intelligent accompanying robots; the intelligent sweepers include but are not limited to medium-brush clamp-type intelligent sweepers, ultrasonic bionic technology intelligent sweepers, single-suction intelligent sweepers, V-brush cleaning system sweepers, etc.; the intelligent lawn mowers include but are not limited to small remote-controlled crawler lawn mowers, obstacle-avoiding intelligent lawn mowers, and self-propelled intelligent lawn shredders.

[0053] In this embodiment, during the intelligent factory test, the device to be tested 13 sends its MAC address to the infrared device 12 at a preset time interval. The infrared device 12 performs data parsing and splicing on the MAC address according to the device information sent by the computer device 11, and then forwards the MAC address of the corresponding device to be tested to the computer device 11; the computer device 11 receives and displays the MAC address of the device to be tested 13, resets the factory test items of the device to be tested 13, so that the device to be tested 13 can perform factory testing and send one or more factory test results to the infrared device 12 according to the preset infrared data protocol; the computer device 11 judges and stores the one or more factory test results forwarded by the infrared device 12, thereby realizing the intelligence of factory testing, process automation, data cloudification and full-process standardization, greatly improving the efficiency of troubleshooting and production efficiency, reducing labor costs, and avoiding the risk of recording errors or losses.

[0054] In the above, the equipment structure of the intelligent factory test in the embodiment of the present invention is explained to a certain extent. The following will further illustrate the implementation process and principle of the intelligent factory test method based on the infrared emission mode in the embodiment of the present invention.

[0055] like Figure 2A As shown, a flow chart of an intelligent factory testing method based on infrared emission mode in one embodiment of the present application is shown, and the intelligent factory testing method is applied to a computer device 11, including:

[0056] S201: In response to the account login and production line confirmation operations, access to the MQTT network.

[0057] In this embodiment, each production line corresponds to a plurality of devices to be detected 13, and each device to be detected 13 corresponds to a different login name. For example, there are 10 intelligent robots on the production line, which are defined as intelligent robot A, intelligent robot B, intelligent robot C, etc.

[0058] In this embodiment, when performing factory testing on the device to be tested 13, first, the operator opens the production line, logs in the account information to enter the factory testing project management platform, and the computer device 11 connects to the MQTT network to obtain the production line information and the device information of the device to be tested 13.

[0059] In this embodiment, the production line information includes but is not limited to the number of production lines, the type of equipment to be tested on the production line, and one or more combinations of the ID numbers of the production lines. On the factory test project management platform, each production line has a unique ID number for use when the equipment to be tested reports.

[0060] In this embodiment, the device information includes but is not limited to a combination of one or more of the login name of the device to be tested, the model of the device to be tested, and the factory test project type of the device to be tested, wherein on the factory test project management platform, each device to be tested has a unique login name, which corresponds one-to-one to its MAC address.

[0061] S202: Send the production line information and the device information of the device to be detected to the infrared device, so that the infrared device can parse and splice the MAC addresses sent by the device to be detected at preset time intervals according to the device information and forward the corresponding MAC addresses of the device to be detected.

[0062] In this embodiment, the operator turns on the production line, logs in the account information to enter the factory test project management platform, and the computer device 11 connects to the MQTT network to obtain the production line information and the device information of the device to be detected 13, and sends the production line information and the device information to the infrared device 12. Since the device to be detected 13 can only transmit infrared signals but cannot receive infrared signals, the device to be detected 13 continues to send its MAC address at a preset time interval until the infrared device 12 receives the MAC address of the device to be detected. Each device to be detected 13 has a unique MAC address, which is equivalent to the identity card of the device to be detected 13, and corresponds one-to-one with its login name. After the infrared device 12 parses and splices the received MAC address with the received device information, the infrared device 12 forwards the MAC address of the device to be detected 13 to the computer device 11.

[0063] In some examples, if the MAC address sent by the device to be detected 13 to the infrared device 12 exceeds the transmission capacity of the serial port, the MAC address is sent in segments to the infrared device 12. Specifically, the transmission capacity of the serial port is limited to a certain extent, for example, only 32 bits can be transmitted each time, but some MAC addresses exceed 32 bits, which results in that the MAC address cannot be sent at once and needs to be sent in segments, so the MAC address of the device to be detected 13 received by the infrared device 12 is fragmented.

[0064] Furthermore, in the process of sending the MAC address segments to the infrared device 12, a header data associated with the device to be detected 13 is set for each segment address, so that the infrared device 12 can identify the device to be detected 13 to which it belongs according to its header data after receiving each segment address, and then piece the segment addresses together into a complete MAC address and forward it to the computer device 11.

[0065] For example: the infrared device 12 receives the MAC addresses sent by intelligent robot A, intelligent robot B, and intelligent robot C respectively, and the computer device 11 sends the device information of intelligent robot A to the infrared device 12. After the login name of intelligent robot A and its MAC address are resolved to correspond with each other, if the MAC address of intelligent robot A received by the infrared device 12 is broken, the MAC address of intelligent robot A is spliced ​​to obtain a complete MAC address, and its complete MAC address is forwarded to the computer device 11.

[0066] S203: receiving and displaying the MAC address of the device to be detected, resetting the factory test items of the device to be detected so that the device to be detected can be factory tested and sending one or more factory test results to the infrared device according to a preset infrared data protocol.

[0067] In this embodiment, the computer device 11 receives and displays the MAC address of the device to be tested 13 forwarded by the infrared device 12, resets the factory test item of the device to be tested 13, and the operator starts the factory test of the project of the device to be tested 13 of the corresponding production line, so that the device to be tested 13 broadcasts the factory test start voice and performs the factory test. Each time the device to be tested 13 performs a factory test on a content, its factory test result is sent to the infrared device 12 according to the preset infrared data protocol. The factory test result includes but is not limited to one or more combinations of factory test item type, corresponding factory test item code, error type, and error code.

[0068] Specifically, in this embodiment, the infrared data protocol includes one or a combination of a fixed-length status sending protocol, a fixed-length status and error code sending protocol, and a variable-length status and error code sending protocol.

[0069] Specifically, in this embodiment, when the infrared data protocol includes a fixed-length status sending protocol, the format of the fixed-length status sending protocol includes: frame header (Header), frame length (Length), fixed length (Data) and check code (CheckSum); wherein, the fixed length (Data) includes one or more instruction codes used to characterize the type of factory test item.

[0070] like Figure 2BAs shown, it is a format diagram of the fixed-length transmission protocol of the infrared data protocol in one embodiment of the present application. The header consists of header and length, and the middle data part is fixed length, and the length is based on the number of factory test items of the specific model. The type of factory test item represented by the instruction code is defined in advance, such as instruction code 1 for fan detection, instruction code 2 for bottom sensor detection, etc. Every 2 bits can represent 4 states of the factory test item type, 00 for failure, 01 for preparation, 10 for idle state, and 11 for pass. This embodiment can represent the specific state of the factory test item, but it cannot represent the specific error when the factory test item fails. CRC check is used at the end to verify the correctness and integrity of the data. The above example is only one embodiment of the present invention, which is mainly used for explanation and description, not for limiting the scope of protection of the present invention.

[0071] Specifically, in this embodiment, when the infrared data protocol includes a fixed-length status and error code sending protocol, the format of the fixed-length status and error code sending protocol includes: a frame header (Header), a frame length (Length), a fixed length (Data) and a check code (CheckSum); wherein, the fixed length (Data) includes one or more instruction codes for characterizing the type of factory test item and an error code for characterizing the corresponding error type in the instruction code.

[0072] like Figure 2C As shown, it is a format diagram of the infrared data protocol in an embodiment of the present application as a fixed-length state and error code sending protocol. The header consists of header and length, and the middle data part is fixed length, and the length is based on the number of factory test items of the specific model. The factory test item type represented by the instruction code is defined in advance, and the error code corresponds to the different error types in the instruction code. For example, instruction code 1 represents fan detection, and instruction code 2 represents bottom sensor detection. For example, in error code 1, 0001 indicates insufficient fan voltage, 0010 indicates insufficient fan suction, and so on. Every 2 bits can represent 4 states of the factory test item type. 00 means failed, 01 means in preparation, 10 means idle state, and 11 means passed. When the factory test item 11 has passed, the corresponding error code is 0000. When the factory test item 00 fails, the corresponding error type is displayed in the error code. This embodiment can indicate the specific status of the current factory test, and when a factory test item fails, it can also indicate the specific reason for failure, which is convenient for obtaining and analyzing the factory test results. When the factory test item fails, the specific reason for failure can be obtained to take corresponding measures. CRC check is used at the end to verify the correctness and integrity of the data. The above example is only one embodiment of the present invention, which is mainly used for explanation and description, rather than for limiting the scope of protection of the present invention.

[0073] Specifically, in this embodiment, when the infrared data protocol includes a variable-length status and error code sending protocol, the format of the variable-length status and error code sending protocol includes: a frame header (Header), a frame length (Length), a variable length (Data) and a check code (CheckSum); wherein, the variable length (Data) includes one or more instruction codes for characterizing the type of factory test item and an error code for characterizing the corresponding error type in the instruction code.

[0074] like Figure 2D As shown, it is a format diagram of the infrared data protocol in an embodiment of the present application as a variable-length state and error code sending protocol. The header is composed of header and length, and the middle data part is variable length, and the length is based on the number of factory test items of the specific model. The factory test item type represented by the instruction code is defined in advance, and the error code corresponds to the different error types in the instruction code. For example, instruction code 1 represents fan detection, and instruction code 2 represents bottom sensor detection. For example, in error code 1, 0x0001 fan voltage is insufficient, 0010 fan suction is insufficient, and so on. Each 2 bits can represent 4 states of the factory test item type, 00 for failure, 01 for preparation, 10 for idle state, and 11 for passing. When the factory test instruction code is not 00 and fails, no error code will be generated. The state of each factory test item type is read by 2 bits. When the factory test instruction code is 00 and fails, the 4-bit error code is immediately read and saved, and the cause is analyzed so that corresponding measures can be taken. Since the data is obtained in variable length, the total length is determined to be 2nbit+4nbit by the number of error codes read, which can greatly reduce a large number of invalid error code bits, thereby ensuring the simplification of the entire data. The above example is only one embodiment of the present invention, which is mainly used for explanation and not for limiting the protection scope of the present invention.

[0075] It is worth noting that the present invention adopts a different reporting mode when reporting the factory test results, and selects the combination of instruction code and error code, so as to realize the reflection of all factory test conditions with a smaller amount of data. When the factory test result fails, the error type can be displayed, which is convenient for engineers to analyze the cause and take corresponding measures, thus truly achieving full traceability and greatly improving the efficiency of troubleshooting.

[0076] S204: receiving and displaying one or more factory test results forwarded by the infrared device, and judging whether the login name of the factory test result is consistent with the MAC address of the device to be tested according to each factory test result.

[0077] S205: If they are consistent, the factory test result of the device to be tested is stored and displayed.

[0078] S206: Otherwise, discard the factory test result.

[0079] In this embodiment, each time the device to be detected 13 performs a factory test on a content, its factory test result is sent to the infrared device 12 according to the preset infrared data protocol. The infrared device 12 parses and splices the received factory test result data, and then forwards it to the computer device 11. The computer device 11 compares the login name corresponding to the received factory test result with the MAC address of the device to be detected 13. If the two are consistent, the received factory test result is stored in the cloud database and displayed. Otherwise, the factory test result is discarded.

[0080] In some examples, if the factory test result data sent by the device to be detected 13 to the infrared device 12 exceeds the transmission capacity of the serial port, the factory test result data is sent in segments to the infrared device 12. Specifically, the transmission capacity of the serial port is limited to a certain extent, for example, only 32 bits can be transmitted each time, but some factory test result data exceeds 32 bits, which results in that the factory test result data cannot be sent at once and needs to be sent in segments, so the factory test result data of the device to be detected 13 received by the infrared device 12 is fragmented.

[0081] Furthermore, in the process of sending the factory test result data in segments to the infrared device 12, a header data associated with the device to be tested 13 is set for each segmented factory test result data, so that the infrared device 12 can identify the device to be tested 13 to which each segmented factory test result data belongs according to its header data after receiving the segmented factory test result data, and then piece together the segmented factory test result data into complete factory test result data and forward it to the computer device 11.

[0082] In this embodiment, after the device to be tested 13 is automatically tested, the operator operates the production line to perform manual project testing. After clicking Submit, the factory test results of the manual test of the device to be tested 13 are sent to the computer device 11 for storage and display, completing all factory tests of the device to be tested 13, clearing the MAC address of the device to be tested 13, resetting the factory test results, and performing factory testing of the next device to be tested 13.

[0083] It is worth noting that, in this embodiment, since each production line has a unique ID number, the device 13 to be tested on each production line has a unique login name and a corresponding MAC address. Based on this, the equipment currently being tested on the production line can be accurately distinguished, and the present invention parses the infrared code or sends the infrared code for factory testing through the MQTT method, and saves the records and results of the entire factory testing process to the cloud database through MQTT, which improves the efficiency of data upload, facilitates engineers to view in real time, and can also view their factory testing history, truly achieving full traceability, greatly improving the efficiency of troubleshooting and production efficiency, reducing labor costs, avoiding the risk of recording errors or losses, and by designing different infrared code sending schemes to adapt different machines for factory testing, truly achieving intelligent factory testing, process automation, data cloudification and full-process standardization.

[0084] like Figure 3 As shown, a flow chart of an intelligent factory testing method based on an infrared emission mode in an embodiment of the present application is shown, and the intelligent factory testing method is applied to the device to be tested 13, including:

[0085] S301: Sending the MAC address of the device to be detected to the infrared device at a preset time interval, so that the computer device receives and displays the MAC address of the device to be detected forwarded by the infrared device.

[0086] In this embodiment, the operator turns on the production line, logs in the account information to enter the factory test project management platform, and the computer device 11 connects to the MQTT network to obtain the production line information and the device information of the device to be detected 13, and sends the production line information and the device information to the infrared device 12. Since the device to be detected 13 can only transmit infrared signals but cannot receive infrared signals, the device to be detected 13 continues to send its MAC address at a preset time interval until the infrared device 12 receives the MAC address of the device to be detected. Each device to be detected 13 has a unique MAC address, which is equivalent to the identity card of the device to be detected 13, and corresponds one-to-one with its login name. The infrared device 12 makes the received MAC address correspond to the received device information and parses and splices them. Then, the infrared device 12 forwards the MAC address of the device to be detected 13 to the computer device 11.

[0087] In some examples, if the MAC address sent by the device to be detected 13 to the infrared device 12 exceeds the transmission capacity of the serial port, the MAC address is sent in segments to the infrared device 12. Specifically, the transmission capacity of the serial port is limited to a certain extent, for example, only 32 bits can be transmitted each time, but some MAC addresses exceed 32 bits, which results in that the MAC address cannot be sent at once and needs to be sent in segments, so the MAC address of the device to be detected 13 received by the infrared device 12 is fragmented.

[0088] Furthermore, in the process of sending the MAC address segments to the infrared device 12, a header data associated with the device to be detected 13 is set for each segment address, so that the infrared device 12 can identify the device to be detected 13 to which it belongs according to its header data after receiving each segment address, and then piece the segment addresses together into a complete MAC address and forward it to the computer device 11.

[0089] For example: the infrared device 12 receives the MAC addresses sent by intelligent robot A, intelligent robot B, and intelligent robot C respectively, and the computer device 11 sends the device information of intelligent robot A to the infrared device 12. After the login name of intelligent robot A and its MAC address are resolved to correspond with each other, if the MAC address of intelligent robot A received by the infrared device 12 is broken, the MAC address of intelligent robot A is spliced ​​to obtain a complete MAC address, and its complete MAC address is forwarded to the computer device 11.

[0090] S302: In response to a factory test item start signal, broadcast a factory test start voice and perform the factory test.

[0091] In this embodiment, the computer device 11 receives and displays the MAC address of the device to be tested 13 forwarded by the infrared device 12, resets the factory test items of the device to be tested 13, and the operator starts the factory test items of the device to be tested 13 of the corresponding production line, so that the device to be tested 13 broadcasts the factory test start voice and performs the factory test.

[0092] S303: Send one or more factory test results of the device to be tested to the infrared device according to a preset infrared data protocol, so that the computer device receives and displays the one or more factory test results forwarded by the infrared device, and determines whether the login name of the factory test result is consistent with the MAC address of the device to be tested based on each factory test result to decide whether to retain or discard the factory test result.

[0093] In this embodiment, each time the device 13 to be detected performs a factory test on a content, the factory test result is sent to the infrared device 12 according to the preset infrared data protocol. The factory test result includes but is not limited to the factory test item type, the corresponding factory test item code, the error type, and one or more combinations of error codes. After the infrared device 12 parses and splices the received factory test result data, it is forwarded to the computer device 11. The computer device 11 compares the login name corresponding to the received factory test result with the MAC address of the device 13 to be detected. If the two are consistent, the received factory test result is stored in the cloud database and displayed. Otherwise, the factory test result is discarded.

[0094] In this embodiment, after the device to be tested 13 is automatically tested, the operator operates the production line to test the manual items. After clicking Submit, the factory test results of the manual test of the device to be tested 13 are sent to the computer device 11 for storage and display, completing the factory test of the device to be tested 13, clearing the MAC address of the device to be tested 13, resetting the factory test results, and performing the factory test of the next device to be tested 13.

[0095] like Figure 4AAs shown, a structural diagram of an intelligent factory test system based on infrared emission mode in an embodiment of the present application is shown, including: a computer device 11, an infrared device 12, and a device to be tested 13. Among them, the device to be tested 13 has a communication connection established with the computer device 11; the infrared device 12 has a communication connection established with the computer device 11 and the device to be tested 13 respectively.

[0096] The computer device 11 includes, but is not limited to, desktop computer devices, tablet devices, digital processing devices, factory background processing devices, embedded computer devices, etc.

[0097] The infrared device 12 is mainly composed of an infrared light transmitter, a receiver, a filter, an amplifier, a signal processing circuit and an output interface, and can receive and transmit infrared signals.

[0098] The equipment to be detected 13 can only transmit infrared signals but cannot receive infrared signals, including but not limited to: intelligent robots, intelligent sweepers, intelligent lawn mowers, etc. The intelligent robots include but are not limited to industrial robots, primary intelligent robots, intelligent agricultural robots, and household intelligent accompanying robots; the intelligent sweepers include but are not limited to medium-brush clamp-type intelligent sweepers, ultrasonic bionic technology intelligent sweepers, single-suction intelligent sweepers, V-brush cleaning system sweepers, etc.; the intelligent lawn mowers include but are not limited to small remote-controlled crawler lawn mowers, obstacle-avoiding intelligent lawn mowers, and self-propelled intelligent lawn shredders.

[0099] like Figure 4B As shown, a schematic diagram of the operation flow of an intelligent factory testing system based on an infrared emission mode in an embodiment of the present application is shown, including:

[0100] S401: The computer device 11 accesses the MQTT network in response to the account login and production line determination operations.

[0101] S402 : The computer device 11 sends the production line information and the device information of the device to be detected 13 to the infrared device 12 .

[0102] S403: The device to be detected 13 sends its MAC address to the infrared device 12 at a preset time interval.

[0103] S404: the infrared device 12 performs data parsing and splicing on the MAC address according to the device information and then forwards the MAC address of the device to be detected 13 to the computer device 11 .

[0104] S405: the computer device 11 receives and displays the MAC address of the device to be detected 13, and resets the factory test items of the device to be detected 13.

[0105] S406: The device to be tested 13 responds to the factory test item start signal by broadcasting a factory test start voice and performing the factory test.

[0106] S407: The device to be detected 13 sends one or more factory test results to the infrared device 12 according to a preset infrared data protocol.

[0107] S408 : The infrared device 12 forwards the one or more factory test results to the computer device 11 .

[0108] S409: The computer device 11 receives and displays one or more factory test results forwarded by the infrared device 12, and determines whether the login name of the factory test result is consistent with the MAC address of the device to be detected 13 according to each factory test result.

[0109] S410: If they are consistent, the factory test result of the device to be tested is stored and displayed.

[0110] S411: Otherwise, discard the factory test result.

[0111] The information interaction, execution process, etc. between the modules / units of the above-mentioned system are based on the same concept as the method embodiment described in the present application, and the technical effects they bring are the same as those of the method embodiment of the present application. For specific contents, please refer to the description in the method embodiment shown in the previous description of the present application, and will not be repeated here.

[0112] It should also be noted that it should be understood that the division of the various modules of the above system is only a division of logical functions. In actual implementation, they can be fully or partially integrated into one physical entity, or physically separated. Moreover, these units can be implemented in the form of software calling through processing elements; they can also be implemented in the form of hardware; some modules can also be implemented in the form of software calling through processing elements, and some modules can be implemented in the form of hardware.

[0113] In one embodiment of the present application, the present invention provides a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the intelligent factory testing method based on the infrared emission mode as described above is implemented.

[0114] Those skilled in the art can understand that all or part of the steps of implementing the above-mentioned method embodiments can be completed by hardware related to the computer program. The aforementioned computer program can be stored in a computer-readable storage medium. When the program is executed, the steps of the above-mentioned method embodiments are executed; and the aforementioned storage medium includes: ROM, RAM, magnetic disk or optical disk and other media that can store program codes.

[0115] In the embodiments provided in the present application, the computer readable and writable storage medium may include a read-only memory, a random access memory, an EEPROM, a CD-ROM or other optical disk storage device, a disk storage device or other magnetic storage device, a flash memory, a USB flash drive, a mobile hard disk, or any other medium that can be used to store a desired program code in the form of an instruction or data structure and can be accessed by a computer. In addition, any connection can be appropriately referred to as a computer-readable medium. For example, if the instruction is sent from a website, a server or other remote source using a coaxial cable, an optical fiber cable, a twisted pair, a digital subscriber line (DSL), or wireless technologies such as infrared, radio, and microwaves, the coaxial cable, optical fiber cable, twisted pair, DSL, or wireless technologies such as infrared, radio, and microwaves are included in the definition of the medium. However, it should be understood that computer readable and writable storage media and data storage media do not include connections, carriers, signals, or other temporary media, but are intended to be non-temporary, tangible storage media. Disk and disc, as used in this application, includes compact disc (CD), laser disc, optical disc, digital versatile disc (DVD), floppy disk and Blu-ray disc where disks usually reproduce data magnetically, while discs reproduce data optically with lasers.

[0116] like Figure 5 As shown, it is a schematic diagram of the structure of an electronic terminal in one embodiment of the present application. The electronic terminal 500 provided in this example includes: a processor 501 and a memory 502; the memory 502 is connected to the processor 501 through a system bus and completes communication with each other, the memory 502 is used to store computer programs, and the processor 501 is used to run the computer programs stored in the memory 502, so that the electronic terminal 500 executes the intelligent factory testing method based on the infrared emission mode as described above.

[0117] The intelligent factory testing method based on infrared emission mode provided in the embodiment of the present invention can be implemented on the terminal side or the server side. As for the hardware structure of the electronic terminal 500, please refer to Figure 5 , is an optional hardware structure diagram of an electronic terminal 500 provided in an embodiment of the present invention. The terminal 500 may be a mobile phone, a computer device, a tablet device, a personal digital processing device, a factory background processing device, etc. The electronic terminal 500 includes: at least one processor 501, a memory 502, at least one network interface 504 and a user interface 506. The various components in the device are coupled together through a bus system 505. It can be understood that the bus system 505 is used to achieve connection and communication between these components. In addition to the data bus, the bus system 505 also includes a power bus, a control bus and a status signal bus. However, for the sake of clarity, in Figure 5 In the specification, various buses are labeled as bus systems.

[0118] The user interface 506 may include a display, a keyboard, a mouse, a trackball, a click gun, keys, buttons, a touch pad or a touch screen.

[0119] It is understood that the memory 502 can be a volatile memory or a non-volatile memory, and can also include both volatile and non-volatile memories. Among them, the non-volatile memory can be a read-only memory (ROM), a programmable read-only memory (PROM), which is used as an external cache. By way of example but not limitation, many forms of RAM are available, such as static random access memory (SRAM), synchronous static random access memory (SSRAM). The memory described in the embodiments of the present invention is intended to include but is not limited to these and any other suitable categories of memory.

[0120] The memory 502 in the embodiment of the present invention is used to store various categories of data to support the operation of the electronic terminal 500. Examples of these data include: any executable program used to operate on the electronic terminal 500, such as an operating system 5021 and an application 5022; the operating system 5021 includes various system programs, such as a framework layer, a core library layer, a driver layer, etc., for implementing various basic services and processing hardware-based tasks. The application 5022 can include various applications, such as a media player (MediaPlayer), a browser (Browser), etc., for implementing various application services. The intelligent factory testing method based on the infrared emission mode provided in the embodiment of the present invention can be included in the application 5022.

[0121] The method disclosed in the above embodiment of the present invention can be applied to the processor 501, or implemented by the processor 501. The processor 501 may be an integrated circuit chip with signal processing capabilities. In the implementation process, each step of the above method can be completed by the hardware integrated logic circuit in the processor 501 or the instruction in the form of software. The above processor 501 may be a general processor, a digital signal processor (DSP, Digital Signal Processor), or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components, etc. The processor 501 can implement or execute the various methods, steps and logic block diagrams disclosed in the embodiment of the present invention. The general processor 501 may be a microprocessor or any conventional processor, etc. In combination with the steps of the accessory optimization method provided in the embodiment of the present invention, it can be directly embodied as a hardware decoding processor to execute, or it can be executed by a combination of hardware and software modules in the decoding processor. The software module can be located in a storage medium, which is located in a memory, and the processor reads the information in the memory and completes the steps of the above method in combination with its hardware.

[0122] In an exemplary embodiment, the electronic terminal 500 may be implemented by one or more application specific integrated circuits (ASIC), DSP, programmable logic device (PLD), complex programmable logic device (CPLD) to execute the aforementioned method.

[0123] In one embodiment of the present application, the present invention provides an intelligent robot device, including: a processor and a memory;

[0124] The memory is used to store computer programs;

[0125] The processor is used to execute the computer program stored in the memory so that the intelligent robot device performs the intelligent factory testing method based on the infrared emission mode as described above.

[0126] In summary, the present application provides an intelligent factory testing method, system, medium and device based on infrared emission mode, which have the following beneficial effects: the computer device responds to the operation of account login and production line determination, accesses the MQTT network, and sends the production line information and the device information of the device to be tested to the infrared device, so that the infrared device can perform data parsing and splicing on the MAC address sent by the device to be tested at a preset time interval according to the device information, and then forward the MAC address of the corresponding device to be tested; the computer device receives and displays the MAC address of the device to be tested, resets the factory testing items of the device to be tested, so that the device to be tested can perform factory testing and send one or more factory testing results to the preset infrared data protocol according to the preset infrared data protocol. The infrared device; the computer device judges and stores one or more factory test results forwarded by the infrared device, realizing factory test automation, reporting each test result to the cloud in real time, and being able to display the process of equipment factory test in real time on the production line computer device. When all the test items are completed, the factory test results are saved to the cloud database, avoiding the loss of factory test data, facilitating engineers to view in real time, and also to view their factory test history, greatly improving the efficiency of troubleshooting and production efficiency, reducing labor costs, and truly achieving full traceability. By designing different infrared code sending schemes to adapt different machines for factory testing, factory testing intelligence, process automation, data cloudification and full-process standardization are realized. Therefore, the present application effectively overcomes the various shortcomings in the prior art and has a high industrial utilization value.

[0127] The above embodiments are merely illustrative of the principles and effects of the present application and are not intended to limit the present application. Anyone familiar with the technology may modify or change the above embodiments without violating the spirit and scope of the present application. Therefore, all equivalent modifications or changes made by a person of ordinary skill in the art without departing from the spirit and technical ideas disclosed in the present application shall still be covered by the claims of the present application.

Claims

1. An intelligent factory testing method based on infrared emission mode, applied to computer equipment, characterized in that: include: In response to the account login and production line confirmation operations, access to the MQTT network; Send the production line information and the device information of the device to be detected to the infrared device, so that the infrared device can parse and splice the MAC addresses sent by the device to be detected at preset time intervals according to the device information and then forward the MAC addresses of the corresponding devices to be detected; Receive and display the MAC address of the device to be detected, reset the factory test items of the device to be detected, so that the device to be detected can be factory tested and send one or more factory test results to the infrared device according to a preset infrared data protocol; Receive and display one or more factory test results forwarded by the infrared device, and determine whether the login name of the factory test result is consistent with the MAC address of the device to be tested according to each factory test result; If they are consistent, the factory test result of the device to be tested is stored and displayed; otherwise, the factory test result is discarded.

2. The intelligent factory testing method based on infrared emission mode according to claim 1 is characterized in that: The method of sending the production line information and the device information of the device to be detected to the infrared device so that the infrared device can parse and splice the MAC address sent by the device to be detected at a preset time interval according to the device information includes: If the MAC address sent by the device to be detected to the infrared device exceeds the transmission capacity of the serial port, the MAC address is sent to the infrared device in segments; When sending MAC address segments to infrared devices, a header data associated with the device to be detected is set for each segment address, so that the infrared device can identify the device to be detected according to its header data after receiving each segment address, and then piece together the segment addresses into a complete MAC address for forwarding.

3. The intelligent factory testing method based on infrared emission mode according to claim 1 is characterized in that: The infrared data protocol includes one or a combination of fixed-length status sending protocol, fixed-length status and error code sending protocol, and variable-length status and error code sending protocol.

4. The intelligent factory testing method based on infrared emission mode according to claim 2 is characterized in that: In the case where the infrared data protocol includes a fixed-length status sending protocol, the format of the fixed-length status sending protocol includes: a frame header, a frame length, a fixed length and a check code; wherein the fixed length includes one or more instruction codes for characterizing the type of factory test item.

5. The intelligent factory testing method based on infrared emission mode according to claim 2 is characterized in that: In the case where the infrared data protocol includes a fixed-length status and error code sending protocol, the format of the fixed-length status and error code sending protocol includes: a frame header, a frame length, a fixed length and a check code; wherein the fixed length includes one or more instruction codes for characterizing the type of factory test item and an error code for characterizing the corresponding error type in the instruction code.

6. An intelligent factory testing method based on infrared emission mode, applied to the equipment to be tested, characterized in that: include: Sending the MAC address of the device to be detected to the infrared device at a preset time interval, so that the computer device receives and displays the MAC address of the device to be detected forwarded by the infrared device; In response to a factory test item start signal, broadcast a factory test start voice and perform the factory test; One or more factory test results of the device to be tested are sent to the infrared device according to a preset infrared data protocol, so that the computer device receives and displays the one or more factory test results forwarded by the infrared device, and determines whether the login name of the factory test result is consistent with the MAC address of the device to be tested based on each factory test result to decide whether to retain or discard the factory test result.

7. An intelligent factory testing system based on infrared emission mode, characterized in that: include: Computer equipment; The device to be detected has a communication connection established with the computer device; An infrared device, which establishes communication connections with the computer device and the device to be detected respectively; The computer device accesses the MQTT network in response to the operation of account login and production line determination; the computer device sends the production line information and the device information of the device to be detected to the infrared device, the device to be detected sends its MAC address to the infrared device at a preset time interval, the infrared device performs data parsing and splicing on the MAC address according to the device information and then forwards the MAC address of the device to be detected to the computer device; the computer device receives and displays the MAC address of the device to be detected and resets the factory test items of the device to be detected; the device to be detected responds to the factory test item start signal to broadcast the factory test start voice and perform factory test, and sends one or more factory test results of the device to be detected to the infrared device according to the preset infrared data protocol; the infrared device forwards the one or more factory test results to the computer device, the computer device receives and displays the one or more factory test results forwarded by the infrared device, and determines whether the login name of the factory test result is consistent with the MAC address of the device to be detected according to each factory test result; if they are consistent, the factory test result of the device to be detected is stored and displayed; otherwise, the factory test result is discarded.

8. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by the processor, it implements the intelligent factory testing method based on the infrared emission mode described in any one of claims 1 to 5; or, when the computer program is executed by the processor, it implements the intelligent factory testing method based on the infrared emission mode described in claim 6.

9. An electronic terminal, characterized in that: include: Processor and memory; The memory is used to store computer programs; The processor is used to execute the computer program stored in the memory, so that the electronic terminal executes the intelligent factory testing method based on the infrared emission mode as described in any one of claims 1 to 5.

10. An intelligent robot device, characterized in that: include: Processor and memory; The memory is used to store computer programs; The processor is used to execute the computer program stored in the memory so that the intelligent robot device performs the intelligent factory testing method based on the infrared emission mode as described in claim 6.

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