Electrical characteristic test method and system of digital sound production chip

Abstract

The invention discloses a method and a system for testing electrical characteristics of a digital sound production chip, relates to the technical field of digital sound production chips, and aims to solve the problem that the electrical characteristics of the digital sound production chip cannot be tested in the prior art. The method comprises the following steps: acquiring first contact test detection data, wherein the first contact test detection data represents detection data generated after an electrical property test unit is connected with a digital sounding chip; the electrical characteristic test unit is used for carrying out electrical characteristic test on the digital sounding chip; if the electrical characteristic test unit is successfully connected with the digital sounding chip, testing the plurality of target test channels according to a preset electrical characteristic test strategy to obtain a plurality of target test data; the multiple pieces of target test data are data obtained by performing real-time detection on an electrical characteristic test process by using a voltage and current detection unit; and finally, based on the multiple pieces of target test data, determining the electrical characteristics of the digital sound production chip. Therefore, the electrical characteristic test of the digital sound production chip is realized.

Description

Technical Field

[0001] The present invention relates to the field of digital sound chip testing, and in particular to a method and system for testing the electrical characteristics of a digital sound chip. Background Art

[0002] The digital sound chip is an array sound device composed of pixel units. This complete digital sound chip consists of a 1024-pixel array, specifically 32 pixels in the TOP layer, plus two groups of 31*32-bit control signals in BUTTON-ROW to achieve logical control of any unit in the array, thereby achieving overall sound control of the chip. For example: if you need to control the sound of 70 pixels, select 31 pixels in the first column, 31 pixels in the second column, and 8 pixels in the TOP layer, where the pixels in the TOP layer are used as padding.

[0003] With the rapid application of digital sound chips in the field of digital sound chip technology, higher requirements are placed on the product quality of digital sound chips. Among them, the electrical characteristics of digital sound chips are of great significance to the design optimization of digital sound chips. For example: how much voltage can the pixel channel of a digital sound chip withstand, and at what voltage will it break down; for example, a short circuit occurs in the pixel channel of a digital sound chip, and specifically, what voltage causes the pixel channel to short-circuit; such electrical characteristics have great reference value for the design optimization and performance improvement of digital sound chips. Due to the particularity of the structure of digital sound chips, existing testing tools and methods cannot be adapted to digital sound chips, resulting in the inability to test the electrical characteristics of digital sound chips; thus affecting the rapid development of digital sound chips.

[0004] In view of this, there is an urgent need to design an electrical characteristics test scheme that can be adapted to the digital sound chip to verify and evaluate the electrical characteristics of the digital sound chip, so as to solve the problem that the electrical characteristics of the digital sound chip cannot be tested in the existing technology, and support the design optimization and performance improvement of the digital sound chip. Summary of the invention

[0005] The purpose of the present invention is to disclose a method and system for testing the electrical characteristics of a digital sound chip, so as to solve the problem that the electrical characteristics of a digital sound chip cannot be tested in the prior art.

[0006] In order to achieve the above object, the present invention provides the following technical solutions:

[0007] In a first aspect, the present invention provides a method for testing electrical characteristics of a digital sound chip, which may include:

[0008] Acquire first contact test detection data; the first contact test detection data represents detection data generated after the electrical characteristic test unit is connected to the digital sound chip; the electrical characteristic test unit is used to perform electrical characteristic test on the digital sound chip;

[0009] According to the first contact test detection data, determining whether the electrical characteristic test unit is successfully connected to the digital sound chip;

[0010] If the electrical characteristic test unit is successfully connected to the digital sound chip, the electrical characteristic test unit is used to test multiple target test channels according to a preset electrical characteristic test strategy to obtain multiple target test data; the multiple target test data are data obtained by real-time detection of the test process of the multiple target test channels using a voltage and current detection unit;

[0011] Based on the plurality of target test data, the electrical characteristics of the digital sound chip are determined.

[0012] Preferably, the step of testing a plurality of target test channels using the electrical characteristic test unit according to a preset electrical characteristic test strategy to obtain a plurality of target test data may include:

[0013] Each target test channel in the plurality of target test channels is tested using a preset electrical characteristic test strategy to obtain a plurality of target test data.

[0014] Preferably, the adopting a preset electrical characteristic test strategy to test each target test channel of the plurality of target test channels to obtain the plurality of target test data may include:

[0015] Applying a first target test voltage to each of the plurality of target test channels until each target test channel breaks down and the test is stopped; the first target test voltage is a test voltage that increases step by step with a first gradient according to a preset voltage;

[0016] Acquire characteristic data of each target test channel during the process of loading the first target test voltage; the characteristic data at least includes current variation data, temperature variation data, test environment data and loading time;

[0017] The characteristic data is preprocessed to obtain the target test data; the data preprocessing includes one or more of removing duplicate values, processing missing values ​​and processing abnormal values.

[0018] Preferably, the adopting a preset electrical characteristic test strategy to test each target test channel of the plurality of target test channels to obtain the plurality of target test data may include:

[0019] For the digital sound chip in a static state, a second target test voltage is applied to each of the multiple target test channels, and the test is stopped until the detection voltage of each target test channel no longer rises, so as to obtain multiple capacitance characteristic data corresponding to the multiple target test channels; the second target test voltage is a voltage corresponding to the capacitance value of the digital sound chip; the digital sound chip in the static state represents a digital sound chip that has not been loaded with data and has not been driven to produce sound;

[0020] The plurality of capacitance characteristic data are used as the plurality of target test data.

[0021] Preferably, the adopting a preset electrical characteristic test strategy to test each target test channel of the plurality of target test channels to obtain the plurality of target test data may include:

[0022] For the digital sound chip in a non-stationary state, a third target test voltage is loaded on each of the multiple target test channels, and a vibrometer and / or an optical microscope is used to collect the corresponding amplitude data of each target test channel adsorbing or releasing under the third target test voltage, so as to obtain a plurality of amplitude data corresponding to the multiple target test channels; the third target test voltage is the working voltage of the digital sound chip; the digital sound chip in the non-stationary state represents a digital sound chip that is loaded with data and driven to make sounds;

[0023] The plurality of amplitude data are used as the plurality of target test data.

[0024] Preferably, determining the electrical characteristics of the digital sound chip based on the plurality of target test data may at least include:

[0025] Based on the plurality of target test data, a plurality of electrical characteristic curves corresponding to the plurality of target test channels are drawn; the electrical characteristic curves at least include current and voltage curves, capacitance test curves, and amplitude test curves of the plurality of target test channels;

[0026] The electrical characteristics of the digital sound chip are obtained according to the plurality of electrical characteristic curves.

[0027] Preferably, before obtaining the first contact test detection data, the step may include: determining a short-circuit state of the digital sound chip.

[0028] Preferably, the determining the short-circuit state of the digital sound chip may include:

[0029] Acquire second contact test detection data; the second contact test detection data represents detection data generated after the short-circuit logic unit is connected to the digital sound chip; the short-circuit logic unit is used to perform a short-circuit test on the digital sound chip;

[0030] Based on the second contact test detection data, determining whether the short-circuit logic unit is successfully connected to the digital sound chip;

[0031] If the short-circuit logic unit is successfully connected to the digital sound chip, the short-circuit logic unit is used to perform a low-voltage short-circuit test on the digital sound chip according to a preset low-voltage short-circuit test strategy to obtain first short-circuit test data;

[0032] Based on the first short-circuit test data, a preset high-voltage short-circuit test strategy is used to perform a high-voltage short-circuit test on the digital sound chip to obtain second short-circuit test data;

[0033] Based on the first short-circuit test data and the second short-circuit test data, a short-circuit state of the digital sound chip is determined.

[0034] Preferably, the using the short-circuit logic unit to perform a low-voltage short-circuit test on the digital sound chip according to a preset low-voltage short-circuit test strategy to obtain first short-circuit test data may include:

[0035] Based on a preset low-voltage short-circuit test strategy, a low-voltage short-circuit test is performed on a first channel among the multiple target test channels; the preset low-voltage short-circuit test strategy is to set the first channel among the multiple target test channels to be turned on, and the remaining test channels to be grounded, and to use low voltage polling on the multiple target test channels;

[0036] After the low-voltage short-circuit test of the first channel is completed, based on the preset low-voltage short-circuit test strategy, a low-voltage short-circuit test is performed on a second channel among the plurality of target test channels; the second channel and the first channel are different test channels;

[0037] The first short-circuit test data is obtained until all channels connecting the short-circuit logic unit and the digital sound chip are tested.

[0038] Preferably, based on the first short-circuit test data, the digital sound chip is subjected to a high-voltage short-circuit test using a preset high-voltage short-circuit test strategy to obtain the second short-circuit test data, which may include:

[0039] Based on a preset high-voltage short-circuit test strategy, a high-voltage short-circuit test is performed on a third channel among the multiple target test channels; the preset high-voltage short-circuit test strategy is to set the third channel among the multiple target test channels to be turned on, and the remaining test channels to be grounded, and to use high voltage to poll the multiple target test channels;

[0040] After the high-voltage short-circuit test of the third channel is completed, based on the preset high-voltage short-circuit test strategy, a high-voltage short-circuit test is performed on a fourth channel among the plurality of target test channels; the fourth channel and the third channel are different test channels;

[0041] The second short-circuit test data is obtained until all channels connecting the short-circuit logic unit and the digital sound chip are tested.

[0042] In a second aspect, the present invention provides an electrical characteristic test system for a digital sound chip, wherein the system adopts the electrical characteristic test method described in the first aspect to perform an electrical characteristic test on the digital sound chip, and may at least include: a voltage and current detection unit, an electrical characteristic test unit, a core logic control unit, and a read-write memory unit; the voltage and current detection unit is connected to the electrical characteristic test unit, the core logic control unit is connected to the electrical characteristic test unit, the core logic control unit is connected to the read-write memory unit, and the electrical characteristic test unit is connected to the digital sound chip;

[0043] The electrical characteristic testing unit is used to perform an electrical characteristic test on the digital sound chip according to a preset electrical characteristic testing strategy;

[0044] The voltage and current detection unit is used to detect multiple target test data of multiple target test channels in the digital sound chip;

[0045] The core logic control unit is used to control the electrical characteristic test logic jump of the electrical characteristic test unit according to a preset electrical characteristic test strategy; and determine the electrical characteristics of the digital sound chip according to a plurality of the target test data;

[0046] The read-write memory unit is used for exchanging data with an external device.

[0047] Preferably, the system further comprises: a short-circuit logic unit;

[0048] The voltage and current detection unit is connected to the short-circuit logic unit, the core logic control unit is connected to the short-circuit logic unit, and the short-circuit logic unit is connected to the digital sound chip;

[0049] The short-circuit logic unit is used to perform a short-circuit test on the digital sound chip according to a preset low-voltage short-circuit test strategy;

[0050] The voltage and current detection unit is also used to detect the voltage and current test data in the short circuit test of the digital sound chip;

[0051] The core logic control unit is also used to obtain short-circuit test operation instructions, control the short-circuit test logic jump of the short-circuit logic unit; and judge the short-circuit state of the digital sound chip according to the voltage and current test data in the short-circuit test.

[0052] Compared with the prior art, the present invention provides an electrical characteristic testing method for a digital sound chip, which obtains first contact test detection data; the first contact test detection data represents the detection data generated after the electrical characteristic testing unit is connected to the digital sound chip; the electrical characteristic testing unit is used to perform an electrical characteristic test on the digital sound chip; further, according to the first contact test detection data, it is determined whether the electrical characteristic testing unit is successfully connected to the digital sound chip; if the electrical characteristic testing unit is successfully connected to the digital sound chip, the electrical characteristic testing unit is used to test multiple target test channels according to a preset electrical characteristic testing strategy to obtain multiple target test data; the multiple target test data are data obtained by real-time detection of the test process of the multiple target test channels using a voltage and current detection unit; finally, based on the multiple target test data, the electrical characteristics of the digital sound chip are determined; thereby, at least based on the multiple target test data, the IV curve, capacitance test curve and amplitude test curve of each target test channel can be drawn to evaluate the electrical characteristics of the digital sound chip; the electrical characteristic test of the digital sound chip is realized. BRIEF DESCRIPTION OF THE DRAWINGS

[0053] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0054] Figure 1 It is a schematic diagram of the structure of a complete digital sound chip in the prior art;

[0055] Figure 2 A schematic diagram of the main flow of a method for testing the electrical characteristics of a digital sound chip provided by the present invention;

[0056] Figure 3 A schematic diagram of an IV test flow of a target test channel of an electrical characteristic test method of a digital sound chip provided by the present invention;

[0057] Figure 4 A schematic diagram of a capacitance test flow of a target test channel of an electrical characteristic test method of a digital sound chip provided by the present invention;

[0058] Figure 5 A schematic diagram of an amplitude test flow of a target test channel of an electrical characteristic test method of a digital sound chip provided by the present invention;

[0059] Figure 6 A schematic diagram of a short-circuit test process in an electrical characteristic test method of a digital sound chip provided by the present invention;

[0060] Figure 7 A schematic diagram of the main structure of an electrical characteristic testing device for a digital sound chip provided by the present invention.

[0061] Figure markings: 7100-FPGA logic control module, 7200-digital sound chip, 7300-audio data storage module, 7400-microcontroller module, 7500-reset module, 7110-voltage and current detection unit, 7120-short circuit logic unit, 7130-clock division module, 7160-electrical characteristics test unit, 7140-core logic control unit, 7150-read and write memory unit, 7161-power supply module, 7121-low voltage short circuit detection subunit, 7122-high voltage short circuit detection subunit, 7123-one to one short circuit detection subunit. DETAILED DESCRIPTION

[0062] In order to facilitate the clear description of the technical solutions of the embodiments of the present invention, in the embodiments of the present invention, the words "first", "second" and the like are used to distinguish the same items or similar items with substantially the same functions and effects. For example, the first threshold and the second threshold are only used to distinguish different thresholds, and do not limit their order of precedence. Those skilled in the art can understand that the words "first", "second" and the like do not limit the quantity and execution order, and the words "first", "second" and the like do not necessarily limit them to be different.

[0063] It should be noted that, in the present invention, words such as "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the present invention should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.

[0064] In the present invention, "at least one" means one or more, and "plurality" means two or more. "And / or" describes the association relationship of associated objects, indicating that three relationships may exist. For example, A and / or B can mean: A exists alone, A and B exist at the same time, and B exists alone, where A and B can be singular or plural. The character " / " generally indicates that the associated objects in the previous time are in an "or" relationship. "At least one of the following items" or similar expressions refers to any combination of these items, including any combination of single items or plural items. For example, at least one of a, b or c can mean: a, b, c, the combination of a and b, the combination of a and c, the combination of b and c, or the combination of a, b and c, where a, b, c can be single or multiple.

[0065] In the prior art, a complete digital sound chip is composed of a 1024-pixel array, specifically 32 pixels in the TOP layer, plus two groups of 31*32-bit control signals of BUTTON-ROW to realize logical control of any unit in the array, thereby realizing the overall sound control of the chip.

[0066] See also Figure 1 , Figure 1 It is a schematic diagram of the structure of a complete digital sound chip in the prior art.

[0067] exist Figure 1 In the figure, BUTTON-ROW-TOP are the three sides of the digital sound chip. The digital sound chip is composed of the three sides to form a pixel unit array. When receiving the control signal, the control signal is used to realize the logical control of any unit in the array to realize the overall generation control of the chip. Due to the special structure of the digital sound chip, there is no such design on the market. The existing test tools and methods cannot be adapted to this digital sound chip, so it is necessary to design an adaptable test scheme to verify and evaluate the electrical characteristics of the chip.

[0068] In view of this, the present invention provides a method and system for testing the electrical characteristics of a digital sound chip, which can implement the electrical characteristics test of the digital sound chip through the configured electrical characteristics test unit, solving the problem that the electrical characteristics of the digital sound chip cannot be tested in the prior art.

[0069] Next, the technical solution of the present invention is described in detail with reference to the accompanying drawings:

[0070] See also Figure 2 , Figure 2The main flow chart of the electrical characteristics test method of a digital sound chip provided by the present invention is shown in FIG. The execution subject is a server or terminal device equipped with the technical solution disclosed in the embodiment of the present invention, such as a test platform or a portable detection device, etc. The method can be applied to an electrical characteristics test system with an FPGA logic control module.

[0071] exist Figure 2 In, the method may include:

[0072] Step 210: Acquire first contact test detection data; the first contact test detection data represents the detection data generated after the electrical characteristic test unit is connected to the digital sound chip; the electrical characteristic test unit is used to perform an electrical characteristic test on the digital sound chip.

[0073] Step 220: judging whether the electrical characteristic test unit is successfully connected to the digital sound chip according to the first contact test detection data;

[0074] In steps 210 to 220, when the system is set to perform an electrical characteristics test on the digital sound chip to be tested, the test interface of the electrical characteristics test unit is connected to the digital sound chip to be tested; the electrical characteristics test unit will perform a self-test after being connected to the digital sound chip to be tested, and generate contact test detection data; after obtaining the first contact test detection data, the test system will determine based on the contact test detection data whether any channel of the digital sound chip is connected to the electrical characteristics test unit, and if the connection is completed, the electrical characteristics test will be performed according to the method described in the embodiments of this specification.

[0075] Step 230: If the electrical characteristics test unit is successfully connected to the digital sound chip, the electrical characteristics test unit is used to test multiple target test channels according to a preset electrical characteristics test strategy to obtain multiple target test data; the multiple target test data are data obtained by real-time detection of the test process of the multiple target test channels using a voltage and current detection unit.

[0076] Step 240: Determine the electrical characteristics of the digital sound chip based on the multiple target test data.

[0077] In step 230 to step 240, if the electrical characteristics test unit is successfully connected to the digital sound chip, it means that the electrical characteristics test unit is successfully connected to any channel of the digital sound chip, so that the electrical characteristics test unit can be used to test multiple target test channels according to a preset electrical characteristics test strategy, and the voltage and current detection unit can be used to perform real-time detection of the test process of the multiple target test channels to obtain multiple target test data; further, based on the multiple target test data, at least the IV curve (current-voltage curve), capacitance test curve and amplitude test curve of the multiple target test channels can be obtained, and then the electrical characteristics of each target test channel can be analyzed based on the IV curve, capacitance test curve and amplitude test curve, thereby realizing the electrical characteristics test of the digital sound chip.

[0078] In practical applications, the electrical characteristic test unit can be used to test multiple target test channels simultaneously according to a preset electrical characteristic test strategy to improve the test efficiency of the electrical characteristic test of the digital sound chip; of course, in order to improve the accuracy of the test, the electrical characteristic test unit can also be used to test multiple target test channels one by one according to the preset electrical characteristic test strategy; it can be seen that whether it is multi-channel simultaneous testing or single-channel testing one by one, IV curves, capacitance test curves and amplitude test curves for multiple target test channels can be obtained in the end, thereby supporting the electrical characteristic analysis of each target test channel; wherein, the target test channel can be any channel in the digital sound chip; the IV curve represents the current-voltage curve obtained by loading different voltages on the target test channel of the digital sound chip, the capacitance test curve represents the curve corresponding to the charging and discharging process of the pixel unit of the target test channel after the voltage is loaded, and the amplitude curve represents the change curve of the diaphragm of the pixel unit of the target test channel after the voltage is loaded, based on which the curve can be used to evaluate the electrical characteristics of the digital sound chip.

[0079] It should be noted that when the user needs to perform an electrical characteristics test on a digital sound chip, the channel number, voltage range and test time to be tested should be determined and loaded into the system, for example, a 10-second test is required; then the voltage range should be set, for example, from 0 volts to 60 volts; in this way, the electrical characteristics test unit will control the power supply system to increase the voltage uniformly within 10 seconds; the test target channel should be set on the host computer, and the parameter is the xth channel. Since the chip can control 96 output pins, the channel range is 1-96; then the electrical characteristics test method described in the first aspect is used to test each target test channel. If all tests are completed, it means that the electrical performance test of the digital sound chip is completed; and then the electrical test program is initialized.

[0080] Based on this, the present invention provides an electrical characteristics testing method for a digital sound chip, which obtains first contact test detection data; based on the first contact test detection data, determines whether the electrical characteristics testing unit is successfully connected to the digital sound chip; if the electrical characteristics testing unit is successfully connected to the digital sound chip, the electrical characteristics testing unit is used to test multiple target test channels according to a preset electrical characteristics testing strategy to obtain multiple target test data; finally, based on the multiple target test data, at least the IV curve, capacitance test curve and amplitude test curve of each target test channel can be obtained to evaluate the electrical characteristics of the digital sound chip; and the electrical characteristics test of the digital sound chip is realized.

[0081] In step 230, preferably, using the electrical characteristic test unit to test multiple target test channels according to a preset electrical characteristic test strategy to obtain multiple target test data may include:

[0082] Each target test channel in the plurality of target test channels is tested using a preset electrical characteristic test strategy to obtain a plurality of target test data.

[0083] Further, each of the target test channels is tested using a preset electrical characteristic test strategy to obtain a plurality of target test data. The electrical characteristic test of the digital sound chip can be performed in the following manner:

[0084] Method 1: Please refer to Figure 3 , Figure 3 A schematic diagram of an IV test flow of a target test channel of an electrical characteristic test method for a digital sound chip provided by the present invention.

[0085] exist Figure 3 In the test method, the following can be included:

[0086] Step 310: Start current and voltage testing.

[0087] Step 320: Load the set channel number, voltage range and test time; wherein the channel number indicates the channel number of the target test channel.

[0088] Step 330: Measure and record the current value that changes with time.

[0089] Step 340: End the current and voltage test; if the test is not ended, it means that the channels required to be tested have not all completed the test, and then execute step 320; if the test is ended, it means that the channels required to be tested have all completed the test, and then initialize the test system.

[0090] In step 310 to step 340, a first target test voltage can be loaded on each of the multiple target test channels until the test is stopped when each target test channel breaks down; the first target test voltage is a test voltage that increases step by step with a first gradient according to a preset voltage. The first gradient is determined according to actual test requirements and the size of the pixel unit, preferably 3V, 5V or 6V; the test time is preferably: 10s or 20s. When the target test channel is broken down, the basis for judging whether the channel is broken down may be: the current drops to 0 instantly during the continuous increase in voltage or the current does not change at all during the increase in voltage.

[0091] Obtain characteristic data of each target test channel during the process of loading the first target test voltage; the characteristic data at least includes current change data, temperature change data, test environment data and loading time. It should be noted that the characteristic data corresponds one-to-one to the voltage increase process, so that each target test channel can be analyzed in multiple dimensions; for example, under different influences, such as in a humid environment, what is the breakdown voltage of the target test channel and what is the loading time; in a scene with a higher temperature, what is the breakdown voltage of the target test channel and what is the loading time; in this way, the electrical characteristics of the digital sound chip can be evaluated in multiple dimensions.

[0092] Furthermore, the characteristic data may be preprocessed to obtain target test data; the data preprocessing includes one or more of removing duplicate values, processing missing values, and processing abnormal values, thereby improving the efficiency of the next step of data analysis and ensuring the authenticity of the generated electrical characteristic curve.

[0093] Method 2: Please refer to Figure 4 , Figure 4 A schematic diagram of a capacitance test flow of a target test channel of an electrical characteristic test method of a digital sound chip provided by the present invention.

[0094] exist Figure 4 In the test method, the following can be included:

[0095] Step 410: Start capacitance test.

[0096] Step 420: Load the set channel number, voltage range and test time; wherein the channel number indicates the channel number of the target test channel.

[0097] Step 430: Detect the charge and discharge time of the capacitor and send back the data.

[0098] Step 440: End the capacitance test; if the test is not ended, it means that the channels required to be tested have not all completed the test, and then execute step 420; if the test is ended, it means that the channels required to be tested have all completed the test, and then initialize the test system.

[0099] In steps 410 to 440, the target object is the digital sound chip in a static state. A second target test voltage can be loaded on each of the multiple target test channels until the detection voltage of each target test channel no longer rises, and the power supply is disconnected. The test is stopped when the voltage value of the channel is completely released, and a plurality of capacitance characteristic data corresponding to the multiple target test channels are obtained; the second target test voltage is a voltage corresponding to the capacitance value of the digital sound chip for testing, which can be an operating voltage; the digital sound chip in the static state represents a digital sound chip that has not been loaded with data and has not been driven to produce sound; the plurality of capacitance characteristic data are used as the plurality of target test data.

[0100] Specifically, the diaphragm and electrode of the digital sound chip form the two poles of the capacitor. When the diaphragm is in different positions, the capacitance value of the capacitor is also different, that is, the capacitance test can be performed on each pixel of the digital sound chip in a static state. By testing the capacitance value of each pixel, the consistency of their diaphragm positions can be determined, which plays an important role in assisting the detection of pixel quality and chip electrical characteristics. For example, when it is necessary to perform a capacitance test on any channel of the digital sound chip: first, connect the electrical characteristic test unit to the digital sound chip, set the pixel channel to be tested, start the power supply, test the pixel channel to be tested with the second target test voltage, and record the time when the channel capacitance is fully charged; disconnect the power supply, test and record the time when the channel capacitance is completely released; that is, obtain the capacitance characteristic data of the pixel channel. Report the capacitance characteristic data of the channel to the host computer. Among them, the channel capacitance is full, indicating that the voltage of the pixel unit does not increase with the increase of the loaded voltage during the continuous rise of the voltage; the capacitance characteristic data at least includes the voltage value of the loaded second target voltage, and the charging and discharging time of the pixel channel.

[0101] It should be noted that when performing a capacitance test on a pixel channel, the test voltage of the pixel channel can be measured using a voltage and current detection unit, or an external measurement tool; the timer can also be measured using an external measurement method; this is not specifically limited in the present invention.

[0102] Method 3: Please refer to Figure 5 , Figure 5 A schematic diagram of the amplitude test flow of a target test channel of an electrical characteristic test method of a digital sound chip provided by the present invention.

[0103] exist Figure 5 In the test method, the following can be included:

[0104] Step 510: Start amplitude test.

[0105] Step 520: Load the set channel number, voltage range and test time; connect the vibrometer and the optical microscope; wherein the channel number indicates the channel number of the target test channel.

[0106] Step 530: Test sequentially and transmit the amplitude data back; wherein, testing sequentially means testing each pixel in the test channel and recording the amplitude data of the pixel.

[0107] Step 540: End the amplitude test; if the test is not ended, it means that the channels required to be tested have not all completed the test, and then execute step 520; if the test is ended, it means that the channels required to be tested have all completed the test, and then initialize the test system.

[0108] In step 510 to step 540, the target object is the digital sound chip in a non-stationary state, and a third target test voltage is loaded on each of the multiple target test channels, and each pixel is tested. A vibrometer and / or an optical microscope is used to collect the corresponding amplitude data of each target test channel adsorbing or releasing under the third target test voltage, so as to obtain a plurality of amplitude data corresponding to the plurality of target test channels; the third target test voltage is the working voltage of the digital sound chip; the digital sound chip in the non-stationary state represents a digital sound chip that is loaded with data and driven to make sound; and the plurality of amplitude data are used as the plurality of target test data.

[0109] In actual use, due to process problems, the physical form of each pixel may not be exactly the same during the chip production process. Circuit problems may also cause pixel electrode short circuit or leakage, resulting in different actual sound levels for each pixel in the digital sound chip. The physical manifestation of the sound of the digital sound chip is the inconsistent amplitude of the diaphragm. Therefore, as long as you drive each pixel in turn and observe with a vibrometer and an optical microscope, you can get the amplitude of adsorption / release of each pixel at the same voltage, and then judge the volume level relationship between pixels.

[0110] For example: for the digital sound chip in a non-static state, the electrical characteristic test unit is connected to the digital sound chip, the pixel channel to be tested is set, the power supply is turned on, and the pixel channel to be tested is tested with a third target test voltage; that is, the amplitude can be measured from the 1st pixel to the 1024th pixel in sequence. When the test starts, the vibration amplitude from the 1st pixel to the 1024th pixel is detected using a tester and / or an optical microscope; thereby obtaining multiple amplitude data corresponding to the 1st pixel to the 1024th pixel, and reporting to the host computer.

[0111] It should be noted that in the second and third methods, the collected data may also be preprocessed to ensure the authenticity of the target test data.

[0112] In step 240, preferably, determining the electrical characteristics of the digital sound chip based on the multiple target test data may at least include: drawing a plurality of electrical characteristic curves corresponding to the multiple target test channels based on the multiple target test data; the electrical characteristic curves may at least include current and voltage curves, capacitance test curves and amplitude test curves of the multiple target test channels; and obtaining the electrical characteristics of the digital sound chip based on the multiple electrical characteristic curves.

[0113] Based on this, at least the current and voltage curves, capacitance test curves and amplitude test curves of each target test channel under different loading voltages can be obtained, and the electrical characteristics of the digital sound chip can be obtained for subsequent research on the electrical characteristics of the digital sound chip.

[0114] For example, for any target test channel, the voltage can be increased step by step from 0V through the electrical characteristic test unit, and the voltage and current detection unit can be used to obtain the voltage and current change data during the voltage increase process until the target test channel breaks down; thus, it can be obtained at what volt the pixel unit breaks down. Alternatively, multiple target channels can be tested and the IV curve differences between the target test channels can be analyzed for subsequent electrical characteristic research.

[0115] As another embodiment, the short-circuit state of the digital sound chip may be determined before the electrical characteristic test, so that the electrical characteristics of the short-circuited pixel channel may be specifically determined; such as the IV curve of the short-circuited channel.

[0116] Preferably, before obtaining the first contact test detection data, the following steps may be included:

[0117] Determine the short circuit state of the digital sound chip.

[0118] Specifically, determining the short-circuit state of the digital sound chip may include:

[0119] Acquire second contact test detection data; the second contact test detection data represents detection data generated after the short-circuit logic unit is connected to the digital sound chip; the short-circuit logic unit is used to perform a short-circuit test on the digital sound chip; based on the second contact test detection data, determine whether the short-circuit logic unit is successfully connected to the digital sound chip.

[0120] In the above steps, when it is necessary to perform a short-circuit test on the digital sound chip to be tested, the test interface of the short-circuit test device can be connected to the digital sound chip to be tested; the short-circuit test device will perform a self-test after being connected to the digital sound chip to be tested, and generate contact test detection data; after obtaining the contact test detection data, the FPGA logic control module will determine based on the contact test detection data whether all channels of the digital sound chip are connected to the short-circuit test device. If all channels are connected, a short-circuit test will be performed according to the method described in the embodiments of this specification. If it is partially connected, a prompt message will be generated to remind the tester to perform a contact check between the short-circuit test device and the digital sound chip.

[0121] Further, if the short-circuit logic unit is successfully connected to the digital sound chip, the short-circuit logic unit is used to perform a low-voltage short-circuit test on the digital sound chip according to a preset low-voltage short-circuit test strategy to obtain first short-circuit test data. Based on the first short-circuit test data, a preset high-voltage short-circuit test strategy is used to perform a high-voltage short-circuit test on the digital sound chip to obtain second short-circuit test data.

[0122] Based on the first short-circuit test data and the second short-circuit test data, a short-circuit state of the digital sound chip is determined.

[0123] In the above steps, if the short-circuit test device is successfully connected to the digital sound chip, it means that the short-circuit test device is successfully connected to all channels of the digital sound chip. First, a low-voltage short-circuit test is performed on all channels of the digital sound chip to obtain low-voltage short-circuit test data, i.e., the first short-circuit test data; after the low-voltage short-circuit test is completed on all channels, a high-voltage short-circuit test is performed on all channels of the digital sound chip to obtain high-voltage short-circuit test data, i.e., the second short-circuit test data; finally, according to the first short-circuit test data and the second short-circuit test data, the short-circuit test result of the digital sound chip is determined; thereby determining whether the digital sound chip is short-circuited.

[0124] Preferably, the using the short-circuit logic unit to perform a low-voltage short-circuit test on the digital sound chip according to a preset low-voltage short-circuit test strategy to obtain first short-circuit test data may include:

[0125] Based on a preset low-voltage short-circuit test strategy, a low-voltage short-circuit test is performed on the first channel among the multiple target test channels; the preset low-voltage short-circuit test strategy is to set the first channel among the multiple target test channels to be turned on, and the remaining test channels to be grounded, and to use low voltage polling to poll the multiple target test channels.

[0126] After the low-voltage short-circuit test of the first channel is completed, based on the preset low-voltage short-circuit test strategy, a low-voltage short-circuit test is performed on a second channel among the plurality of target test channels; the second channel and the first channel are different test channels.

[0127] The first short-circuit test data is obtained until all channels connecting the short-circuit logic unit and the digital sound chip are tested.

[0128] Preferably, based on the first short-circuit test data, the digital sound chip is subjected to a high-voltage short-circuit test using a preset high-voltage short-circuit test strategy to obtain the second short-circuit test data, which may include:

[0129] Based on a preset high-voltage short-circuit test strategy, a high-voltage short-circuit test is performed on the third channel among the multiple target test channels; the preset high-voltage short-circuit test strategy is to set the third channel among the multiple target test channels to be turned on, and the remaining test channels to be grounded, and use high voltage to poll the multiple target test channels.

[0130] After the high-voltage short-circuit test of the third channel is completed, based on the preset high-voltage short-circuit test strategy, a high-voltage short-circuit test is performed on a fourth channel among the multiple target test channels; the fourth channel and the third channel are different test channels.

[0131] The second short-circuit test data is obtained until all channels connecting the short-circuit logic unit and the digital sound chip are tested.

[0132] As a specific example, the entire digital sound chip needs to test circuit channels of 32+32+32, a total of 96 channels, and the 96 channels of the digital sound chip are subjected to low-voltage short-circuit test and high-voltage short-circuit test in turn.

[0133] In the low-voltage short-circuit test, a 20V voltage can be used to perform a short-circuit test on the digital sound chip. Channel 1 is set to the on state and all other channels are grounded. If the voltage and current of the channel are abnormal, the channel is judged to be short-circuited. At this time, the relay will be disconnected immediately for protection. After each channel detection is completed, the next channel will be automatically short-circuited until all 96 channels are tested.

[0134] Set the relay mode to low voltage state, i.e. 20V, the FPGA control logic corresponding to the test channel is 00, i.e. turned on, and the other channels are 10, i.e. grounded; the automatic polling method is to shift 1 to the high position 2n+1 times each time, so that the logic state of the channel is 00 when the nth test is achieved, and the others are 10.

[0135] For example: to detect the 5th channel, the entire chip is divided into 32+32+32, a total of 96 channels, so this channel belongs to the first group of 32 channels. Because each channel needs to be expressed by a 2-bit signal, the 64-bit hexadecimal parameter of this group of signals is: AAAA_AAAA_AAAA_A8AA.

[0136] Detect the 10th channel, the 64-bit hexadecimal parameter bits of this group of signals:

[0137] AAAA_AAAA_AAA2_AAAA.

[0138] In the high-voltage short-circuit test, the chip can be short-circuited using a voltage of 60V, 20KHZ. The specific implementation method is to set channel 1 to the on state and ground all other channels. If the voltage and current of the channel are abnormal, the channel is judged to be short-circuited, and the relay will be disconnected immediately for protection; after each channel detection is completed, the next channel will be automatically short-circuited until all 96 channels are tested.

[0139] Among them, the relay mode is the high voltage state 60V, and the FPGA control logic corresponding to the test channel is 00, that is, it is turned on; other channels are 10, that is, grounded. The 20KHz voltage conversion logic in 60V 20KHz is specifically implemented when the FPGA controls the channel IO. The implementation method is to restore the logic of the nth channel at a frequency of 20K, that is, turn on and off at a frequency of 20K. The automatic polling method is to shift 1 to the high position 2n+1 times each time, so that the channel logic state is 00 when the nth test is achieved, and the rest are 10.

[0140] It should be noted that in the process of polling multiple target test channels, if a voltage abnormality or a current abnormality is detected in any test channel, the channel is determined to be a short-circuit channel; the voltage abnormality indicates that the detected voltage is greater than the rated voltage of the digital sound chip; the current abnormality indicates that the detected current is greater than the rated current of the digital sound chip.

[0141] Specifically, because different chips under test have different rated voltages / currents, or different resistors in the voltage detection circuit will cause different judgment parameters, but the abnormal phenomenon is that the detected voltage / current exceeds the rated voltage / current of the chip under test. As long as it exceeds the rated voltage / current of the chip under test, it can be judged as a short circuit. For each test item, this value needs to be determined based on actual conditions.

[0142] For a more specific example, see Figure 6 , Figure 6 A schematic diagram of a short-circuit test flow in an electrical characteristic test method of a digital sound chip provided by the present invention.

[0143] Step 610: Read the short-circuit test result data, that is, read the first short-circuit test result and the second short-circuit test result, so as to determine multiple short-circuit channels of the digital sound chip.

[0144] Step 620: Load data status, set counter n to count self-increment; execute steps 660 and 630 respectively.

[0145] Step 630: Determine whether the nth path is short-circuited. If the nth path is a short-circuited channel, execute step 640 to perform a one-to-one detection on the nth path; if the nth path is not a short-circuited channel, execute step 320 to load the n+1 channel.

[0146] Step 640: Perform a one-to-one detection on the nth path.

[0147] Step 650: Determine whether the one-to-one short circuit test between the nth channel and all other ports is completed; that is, the one-to-one short circuit test between the nth channel and all other ports needs to be completed. If the one-to-one short circuit test is completed, execute step 620 to load the n+1 channel; if the one-to-one short circuit test is not completed, continue to perform the one-to-one short circuit test.

[0148] Step 660: Determine whether the counter n is full. If the counter n is full, it means that all short-circuit channels of the digital sound chip have completed the one-to-one short-circuit test channel.

[0149] Step 670: The one-to-one detection is completed, that is, the one-to-one short-circuit test of all short-circuited channels is completed, and the short-circuit conditions between channels are determined.

[0150] Specifically, in step 610 to step 670, performing a one-to-one short-circuit test on the short-circuited channel of the digital sound chip may include: using a voltage of 60V, 20KHZ to perform a short-circuit test on the chip, polling to check the previous test results, performing a one-to-one test each time a short-circuited channel is encountered, setting the short-circuited channel x to an on state, and grounding the nth channel from channel 1 to channel 96 in sequence, and when channel n is grounded, all other channels are left floating; at this time, if abnormal voltage and current are detected, it can be determined that channel x and channel n are short-circuited to each other; until all channels are polled.

[0151] Among them, the relay mode is in high voltage state, that is, 60V; the FPGA control logic corresponding to the test channel is 00, that is, turned on; the one-to-one channel is 10, that is, grounded; the other channels are 01, that is, floating. The 20KHz voltage conversion logic of 60V, 20KHz is specifically implemented when the FPGA controls the channel IO, and the implementation method is to restore the logic of the nth channel at a frequency of 20K, that is, turn on and off at a frequency of 20K. The automatic polling method is to shift 1 to the high position 2n+1 times each time, and the logical state of the channel is 00 when the nth test is achieved; the implementation method of the one-to-one channel is to shift the channel data and 11 2n times and then take the XOR, and when the mth one-to-one detection is achieved, the one-to-one channel is 10, and all other channels are 01.

[0152] It should be noted that, in addition to the above functional introduction, the following points should be noted during the implementation of the method according to the embodiment of this specification:

[0153] (1) Power charging buffer: When testing short circuits, pay attention to the power charging buffer time. When just starting up or switching modes, there will be a problem of insufficient voltage. This is a sign that the power charging is not complete. At this time, the system needs to wait for an additional period of time.

[0154] (2) Data reporting: When reporting data, the high and low bits are reversed. This makes it easier for the host computer to read and perform subsequent operations. Therefore, when writing data, it is necessary to write from high to low. For example, if channels 1 and 2 are short-circuited, it needs to be written as 1100·0000.

[0155] (3) Short circuit judgment: Different sampling chips need to pay attention to the possible deviation of the short circuit judgment criteria, such as voltage or overvoltage duration.

[0156] (4) Short circuit information reporting: Short circuit information will be written to DDR first. Before the test is completed, the voltage and current currently read will be updated in real time. After the short circuit test is completed, the data will be written in the order of low voltage test results, high voltage test results, and one-to-one test results. It should be noted that each time the DDR writes data, a buffer period is required.

[0157] (5) Clock: The hardware provides a 50M active crystal oscillator, and the FPGA system main clock is 100M.

[0158] Based on this, it is possible to determine whether the digital sound chip has a short circuit according to the results of the low-voltage short-circuit test and the high-voltage short-circuit test; if a short circuit exists, a one-to-one short-circuit test can also be performed according to the results of the low-voltage short-circuit test and the high-voltage short-circuit test. After all are completed, the short-circuit result will be returned, which is manifested as a short circuit between the Xth and Yth paths; further, the target channel (i.e., the xth row and xth column) that needs to be tested for electrical characteristics can be sent through the host computer, and then the control power supply that needs to be boosted from x volts to x volts within x seconds can be sent through the host computer, so as to obtain the data of the current and voltage of the pixel channel changing with time within x seconds, and at least the IV curve of the target channel can be obtained to evaluate the electrical characteristics of the target channel.

[0159] In a second aspect, the present invention provides an electrical characteristic test system for a digital sound chip, wherein the system uses the electrical characteristic test method described in the first aspect to test the electrical characteristics of the digital sound chip. Figure 7 , Figure 7 A schematic diagram of the main structure of an electrical characteristic testing device for a digital sound chip provided by the present invention.

[0160] exist Figure 7 In the embodiment, the system may at least include an FPGA logic control module 7100 , an audio data storage module 7300 , a microcontroller module 7400 and a reset module 7500 .

[0161] The FPGA logic control module 7100 may at least include: a voltage and current detection unit 7110, an electrical characteristics test unit 7160, a core logic control unit 7140 and a read-write memory unit 7150; the voltage and current detection unit 7110 is connected to the electrical characteristics test unit 7160, the core logic control unit 7140 is connected to the electrical characteristics test unit 7160, the core logic control unit 7140 is connected to the read-write memory unit 7150, and the electrical characteristics test unit 7160 is connected to the digital sound chip 7200.

[0162] The read-write memory unit 7150 is connected to the audio data storage module 7300 , the audio data storage module 7300 is connected to the microcontroller module 7400 , and the microcontroller module 7400 is respectively connected to the FPGA logic control module 7100 and the reset module 7500 .

[0163] The electrical characteristic test unit 7160 is used to test the electrical characteristics of the digital sound chip 7200 according to the preset electrical characteristic test strategy; the voltage and current detection unit 7110 is used to detect multiple target test data of multiple target test channels in the digital sound chip 7200; the core logic control unit 7140 is used to control the electrical characteristic test logic jump of the electrical characteristic test unit 7160 according to the preset electrical characteristic test strategy; and determine the electrical characteristics of the digital sound chip 7200 according to the multiple target test data; the read-write memory unit 7150 is used to exchange data with external devices. The external devices include: audio data storage module 7300, microcontroller module 7400 and reset module 7500, etc.

[0164] Preferably, the electrical characteristic testing unit 7160 includes at least a power supply module 7161, and the power supply module 7161 is used to provide a digital power supply to provide a precise voltage during the electrical characteristic testing process.

[0165] Furthermore, the FPGA logic control module 7100 may also include a clock frequency division module 7130, which is connected to the FPGA logic control module 7100. The clock frequency division module 7130 is used to divide the main frequency signal to provide clock signals of different frequencies to various components in the FPGA logic control module 7100, so as to realize synchronous operation of various components.

[0166] It should be noted that when the electrical characteristics test unit 7160 is used to test the electrical characteristics of the digital sound chip 7200, it is first necessary to set the test time on the host computer, for example, the test needs to be 10 seconds; then set the voltage range, for example, from 0 volts to 60 volts; this will control the power supply system to increase the voltage uniformly within 10 seconds. In terms of setting the IV curve test channel, it is necessary to set the test target channel on the host computer, and the parameter is the xth channel. Because the chip can control 96 output pins, the channel range is 1-96. Based on this, the electrical characteristics test can be performed on any channel of the digital sound chip 7200 according to the method described in the first aspect to obtain the IV curve, capacitance test curve and amplitude test curve of any channel of the digital sound chip 7200 to evaluate the electrical characteristics of the digital sound chip 7200.

[0167] Furthermore, the FPGA logic control module 7100 may also include: a short-circuit logic unit 7120 .

[0168] The voltage and current detection unit 7110 is connected to the short-circuit logic unit 7120 , the core logic control unit 7140 is connected to the short-circuit logic unit 7120 , and the short-circuit logic unit 7120 is connected to the digital sound chip 7200 .

[0169] The short-circuit logic unit 7120 is used to perform a short-circuit test on the digital sound chip 7200 according to a preset low-voltage short-circuit test strategy; the voltage and current detection unit 7110 is also used to detect the voltage and current test data in the short-circuit test of the digital sound chip 7200; the core logic control unit 7140 is also used to obtain the short-circuit test operation instructions, control the short-circuit test logic jump of the short-circuit logic unit 7120; and judge the short-circuit state of the digital sound chip according to the voltage and current test data in the short-circuit test.

[0170] Preferably, the short-circuit logic unit 7120 includes a low-voltage short-circuit detection subunit 7121 , a high-voltage short-circuit detection subunit 7122 and a one-to-one short-circuit detection subunit 7123 .

[0171] The low-voltage short-circuit detection subunit 7121 is used to perform a low-voltage short-circuit test on the digital sound chip 7200; the high-voltage short-circuit detection subunit 7122 is used to perform a high-voltage short-circuit test on the digital sound chip 7200; the one-to-one short-circuit detection subunit 7123 is used to perform a one-to-one short-circuit test on the digital sound chip 7200 based on the low-voltage short-circuit test results and the high-voltage short-circuit test results.

[0172] It should be noted that the test method of the low-voltage short-circuit detection subunit and the high-voltage short-circuit detection subunit is to use 20V and 60V voltages to test the chip for short circuits. The specific implementation method is to set channel 1 to the on state and ground all other channels. If the voltage and current of the channel are abnormal, the channel is judged to be short-circuited, and the relay will be disconnected immediately for protection; after each channel detection is completed, the next channel will be automatically tested for short circuits until all 96 channels are tested.

[0173] The test method of the one-to-one short circuit detection subunit 7123 is: use a voltage of 60V 20KHZ to perform a short circuit test on the chip, poll to check the previous test results, and perform a one-to-one test each time a short circuit channel is encountered until all previous polling is completed.

[0174] Specifically: the short-circuited channel x is set to the on state, and the nth channel is grounded in sequence from channel 1 to channel 96. When channel n is grounded, all other channels are left floating. At this time, if abnormal voltage and current are detected, it can be determined that channel x and channel n are short-circuited with each other.

[0175] Based on this, the control source can continuously output different voltages for the abnormal channel in the digital sound chip, thereby obtaining the current under the corresponding voltage. For the current value of a single abnormal channel under different voltages, the current-voltage curve (IV curve) of the channel can be plotted to evaluate the electrical characteristics of the channel pixel.

[0176] In summary, the electrical characteristics test system of a digital sound chip provided by the present invention is provided by at least setting a voltage and current detection unit, an electrical characteristics test unit, a core logic control unit and a read-write memory unit; connecting the voltage and current detection unit with the electrical characteristics test unit, connecting the core logic control unit with the electrical characteristics test unit, connecting the core logic control unit with the read-write memory unit, and connecting the electrical characteristics test unit with the digital sound chip; according to the method described in the first aspect, the electrical characteristics test of the digital sound chip is realized, which effectively promotes the rapid development of the digital sound chip.

[0177] In addition, in combination with the short-circuit logic unit, targeted electrical characteristic tests can be performed on abnormal channels in the digital sound chip, thereby improving the efficiency of determining the electrical characteristics of the digital sound chip.

[0178] Although the present invention is described herein in conjunction with various embodiments, in the process of implementing the claimed invention, those skilled in the art may understand and implement other variations of the disclosed embodiments by viewing the drawings, the disclosure, and the appended claims. In the claims, the word "comprising" does not exclude other components or steps, and "one" or "an" does not exclude multiple situations. A single processor or other unit may implement several functions listed in the claims. Certain measures are recorded in different dependent claims, but this does not mean that these measures cannot be combined to produce good results.

[0179] Although the present invention has been described in conjunction with specific features and embodiments thereof, it is apparent that various modifications and combinations may be made thereto without departing from the spirit and scope of the present invention. Accordingly, this specification and the accompanying drawings are merely exemplary illustrations of the present invention as defined by the appended claims and are deemed to cover any and all modifications, variations, combinations or equivalents within the scope of the present invention. Obviously, those skilled in the art may make various modifications and variations to the present invention without departing from the spirit and scope of the present invention. Thus, the present invention is intended to include such modifications and variations if they fall within the scope of the claims of the present invention and their equivalents.

Claims

1. A method for testing the electrical characteristics of a digital sound chip, characterized in that: include: Acquire first contact test detection data; the first contact test detection data represents detection data generated after the electrical characteristic test unit is connected to the digital sound chip; The electrical characteristic testing unit is used to perform electrical characteristic testing on the digital sound chip; According to the first contact test detection data, determining whether the electrical characteristic test unit is successfully connected to the digital sound chip; If the electrical characteristic test unit is successfully connected to the digital sound chip, the electrical characteristic test unit is used to test multiple target test channels according to a preset electrical characteristic test strategy to obtain multiple target test data; The plurality of target test data are data obtained by real-time detection of the test process of the plurality of target test channels using a voltage and current detection unit; Based on the plurality of target test data, the electrical characteristics of the digital sound chip are determined.

2. The method according to claim 1, characterized in that The electrical characteristic test unit is used to test a plurality of target test channels according to a preset electrical characteristic test strategy to obtain a plurality of target test data, including: Each target test channel in the plurality of target test channels is tested using a preset electrical characteristic test strategy to obtain a plurality of target test data.

3. The method according to claim 2, characterized in that The adopting a preset electrical characteristic test strategy to test each target test channel of the plurality of target test channels to obtain a plurality of target test data includes: Applying a first target test voltage to each of the plurality of target test channels until each target test channel breaks down and the test is stopped; the first target test voltage is a test voltage that increases step by step with a first gradient according to a preset voltage; Acquire characteristic data of each target test channel during the process of loading the first target test voltage; the characteristic data at least includes current variation data, temperature variation data, test environment data and loading time; The characteristic data is preprocessed to obtain the target test data; the data preprocessing includes one or more of removing duplicate values, processing missing values ​​and processing abnormal values.

4. The method according to claim 2, characterized in that The adopting a preset electrical characteristic test strategy to test each target test channel of the plurality of target test channels to obtain a plurality of target test data includes: For the digital sound chip in a static state, a second target test voltage is applied to each of the multiple target test channels, and the test is stopped until the detection voltage of each target test channel no longer rises, so as to obtain multiple capacitance characteristic data corresponding to the multiple target test channels; the second target test voltage is a voltage corresponding to the capacitance value of the digital sound chip; the digital sound chip in the static state represents a digital sound chip that has not been loaded with data and has not been driven to produce sound; The plurality of capacitance characteristic data are used as the plurality of target test data.

5. The method according to claim 2, characterized in that The adopting a preset electrical characteristic test strategy to test each target test channel of the plurality of target test channels to obtain a plurality of target test data includes: For the digital sound chip in a non-stationary state, a third target test voltage is loaded on each of the multiple target test channels, and a vibrometer and / or an optical microscope is used to collect the corresponding amplitude data of each target test channel adsorbing or releasing under the third target test voltage, so as to obtain a plurality of amplitude data corresponding to the multiple target test channels; the third target test voltage is the working voltage of the digital sound chip; the digital sound chip in the non-stationary state represents a digital sound chip that is loaded with data and driven to make sounds; The plurality of amplitude data are used as the plurality of target test data.

6. The method according to claim 1, characterized in that Determining the electrical characteristics of the digital sound chip based on the plurality of target test data at least includes: Based on the plurality of target test data, a plurality of electrical characteristic curves corresponding to the plurality of target test channels are drawn; the electrical characteristic curves at least include current and voltage curves, capacitance test curves, and amplitude test curves of the plurality of target test channels; The electrical characteristics of the digital sound chip are obtained according to the plurality of electrical characteristic curves.

7. The method according to claim 1, characterized in that Before obtaining the first contact test detection data, the method includes: Determining the short-circuit state of the digital sound chip; The determining the short-circuit state of the digital sound chip comprises: Acquire second contact test detection data; the second contact test detection data represents detection data generated after the short-circuit logic unit is connected to the digital sound chip; the short-circuit logic unit is used to perform a short-circuit test on the digital sound chip; Based on the second contact test detection data, determining whether the short-circuit logic unit is successfully connected to the digital sound chip; If the short-circuit logic unit is successfully connected to the digital sound chip, the short-circuit logic unit is used to perform a low-voltage short-circuit test on the digital sound chip according to a preset low-voltage short-circuit test strategy to obtain first short-circuit test data; Based on the first short-circuit test data, a preset high-voltage short-circuit test strategy is used to perform a high-voltage short-circuit test on the digital sound chip to obtain second short-circuit test data; Based on the first short-circuit test data and the second short-circuit test data, a short-circuit state of the digital sound chip is determined.

8. The method according to claim 7, characterized in that The method of using the short-circuit logic unit to perform a low-voltage short-circuit test on the digital sound chip according to a preset low-voltage short-circuit test strategy to obtain first short-circuit test data includes: Based on a preset low-voltage short-circuit test strategy, a low-voltage short-circuit test is performed on a first channel among the multiple target test channels; the preset low-voltage short-circuit test strategy is to set the first channel among the multiple target test channels to be turned on, and the remaining test channels to be grounded, and to use low voltage polling on the multiple target test channels; After the low-voltage short-circuit test of the first channel is completed, based on the preset low-voltage short-circuit test strategy, a low-voltage short-circuit test is performed on a second channel among the plurality of target test channels; the second channel and the first channel are different test channels; until all channels connecting the short-circuit logic unit and the digital sound chip are tested to obtain the first short-circuit test data; The step of performing a high-voltage short-circuit test on the digital sound chip based on the first short-circuit test data using a preset high-voltage short-circuit test strategy to obtain second short-circuit test data includes: Based on a preset high-voltage short-circuit test strategy, a high-voltage short-circuit test is performed on a third channel among the multiple target test channels; the preset high-voltage short-circuit test strategy is to set the third channel among the multiple target test channels to be turned on, and the remaining test channels to be grounded, and to use high voltage to poll the multiple target test channels; After the high-voltage short-circuit test of the third channel is completed, based on the preset high-voltage short-circuit test strategy, a high-voltage short-circuit test is performed on a fourth channel among the plurality of target test channels; the fourth channel and the third channel are different test channels; The second short-circuit test data is obtained until all channels connecting the short-circuit logic unit and the digital sound chip are tested.

9. A system for testing electrical characteristics of a digital sound chip, wherein the system adopts the method for testing electrical characteristics of a digital sound chip according to any one of claims 1 to 8 to test the electrical characteristics of the digital sound chip, wherein: At least include : Voltage and current detection unit, electrical characteristics test unit, core logic control unit and read-write memory unit; The voltage and current detection unit is connected to the electrical characteristic test unit, the core logic control unit is connected to the electrical characteristic test unit, the core logic control unit is connected to the read-write memory unit, and the electrical characteristic test unit is connected to the digital sound chip; The electrical characteristic testing unit is used to perform an electrical characteristic test on the digital sound chip according to a preset electrical characteristic testing strategy; The voltage and current detection unit is used to detect multiple target test data of multiple target test channels in the digital sound chip; The core logic control unit is used to control the electrical characteristic test logic jump of the electrical characteristic test unit according to a preset electrical characteristic test strategy; and determining the electrical characteristics of the digital sound chip according to a plurality of the target test data; The read-write memory unit is used for exchanging data with an external device.

10. The system according to claim 9, characterized in that The system also includes: a short-circuit logic unit; The voltage and current detection unit is connected to the short-circuit logic unit, the core logic control unit is connected to the short-circuit logic unit, and the short-circuit logic unit is connected to the digital sound chip; The short-circuit logic unit is used to perform a short-circuit test on the digital sound chip according to a preset low-voltage short-circuit test strategy; The voltage and current detection unit is also used to detect the voltage and current test data in the short circuit test of the digital sound chip; The core logic control unit is also used to obtain short-circuit test operation instructions, control the short-circuit test logic jump of the short-circuit logic unit; and judge the short-circuit state of the digital sound chip according to the voltage and current test data in the short-circuit test.

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