Method and system for generating stability rate of industrial device

Abstract

The invention discloses a stationary rate generation method and system for an industrial device, and the method comprises the steps: obtaining a preset configuration of a process index, and subscribing a real-time value of a bit number according to the configuration; screening process indexes which need to be subjected to data sampling; on the basis of the over-limit rate, calculating the over-limit stability rate R1 of the process indexes in the fixed calculation period; calculating the deviation stability rate R2 of the process indexes in the fixed calculation period based on the standard deviation coefficient; averaging the over-limit stability rate and the deviation stability rate to obtain the stability rate of the process index; and performing weighted calculation on the stability rate of the process index to obtain the stability rate of the industrial device. According to the method, the stability rate data is calculated comprehensively in combination with the stability rate calculation mode of the overrun rate and the stability rate calculation mode of the standard deviation coefficient, the fluctuation frequency of the process index and the corresponding industrial device can be reflected, the amplitude of the fluctuation frequency can be reflected, and a more accurate and effective stability rate data result can be obtained.

Description

Technical Field

[0001] The present invention relates to the field of information automation technology, and in particular to a method and system for generating a stability rate of an industrial device. Background Art

[0002] The smooth operation of each process indicator and device in the factory is crucial. The smooth operation of indicators can not only effectively reduce process fluctuations, reduce safety risks, ensure the safety and stability of the production process, but also improve production efficiency and reduce unnecessary manpower and physical consumption. The traditional method of manually calculating the stability rate of indicators is inefficient, complex, error-prone, and difficult to retrieve. Therefore, many systems that use computer technology to count the stability rate of process indicators have emerged. However, the existing calculation methods are relatively simple and cannot effectively evaluate the true stability rate data of process indicators. In addition, there are tens of thousands of process indicators in the factory. How to efficiently and automatically filter process indicators under abnormal conditions or that do not need to be counted; how to calculate stability rate data with more guiding value, more accurately locate the parameter defects of process indicators, and provide preventive and guiding data for the safe and stable operation of the factory are problems that need to be solved urgently.

[0003] The "A Method and System for Calculating the Stability Rate of a Refining and Chemical Plant" disclosed in Chinese patent documents has a publication number of CN112488578A and a publication date of 20210312, which includes the following steps: 1) Configure the monitoring points according to the process card information, that is, configure the process parameters to be monitored according to the process requirements of each device in the factory's production management system, create corresponding monitoring points, and determine the process constraints and monitoring frequency information; 2) Track the dynamic changes of the parameter values ​​of each monitoring point in real time, and obtain the monitoring deviation value of each monitoring point according to the set threshold and the real-time value of the collected monitoring point number, and save the deviation record; 3) Obtain the duration of each deviation and the total deviation time according to the deviation record, and then calculate the stability rate of each device to reflect the stability of the device operation. This technology only calculates the stability rate of the device by the time exceeding the preset upper and lower limit thresholds of the parameters. The calculation method is single and cannot effectively evaluate the true stability rate data of the process indicators. Summary of the invention

[0004] The present invention aims to overcome the problems in the prior art that the calculation method of the stability rate data of industrial devices is single, the real stability rate data cannot be effectively evaluated, and the accuracy of the stability rate calculation results is not high, and provides a method and system for generating the stability rate of industrial devices.

[0005] In order to achieve the above object, the present invention adopts the following technical solutions: A method for generating a steady rate of an industrial device, comprising: Obtain the preset configuration of the process indicator, and subscribe to the real-time value of the bit number according to the configuration; filter the process indicators that need data sampling; calculate the over-limit stability rate R1 of the process indicator within a fixed calculation period based on the over-limit rate; Calculate the deviation stability rate R2 of the process indicators within a fixed calculation period based on the standard deviation coefficient; The stability rate of the process index is obtained by averaging the over-limit stability rate and the deviation stability rate; The stability rate of the industrial device is calculated by weighting the stability rate of the process indicators.

[0006] The present invention combines the stability rate calculation method of the over-limit rate and the stability rate calculation method of the standard deviation coefficient to comprehensively calculate the stability rate data. Compared with the single stability rate calculation method in the prior art, it can reflect both the fluctuation frequency of the process indicator and the amplitude of its fluctuation, and can obtain more accurate and effective stability rate data results of the process indicator. In addition, there are a large number of different process indicators in an industrial device at the same time. After calculating the stability rate results of different process indicators, the stability rate result of the industrial device is obtained by weighting the weights of different process indicators in the industrial device and the corresponding stability rates, so that the final stability rate is more real and effective. For a large number of process indicators, the operating condition expression can be used to judge and determine the process indicators that need to be sampled and the stability rate calculation, thereby automatically filtering out process indicators under abnormal conditions or that do not need to be counted, thereby improving calculation efficiency.

[0007] Preferably, the configuration of obtaining the preset process index includes: Sampling period: the interval time for sampling the data corresponding to the bit number in the process indicator configuration; Fixed calculation cycle, the interval time for calculating the stability rate of process indicators, including several sampling cycles; Real-time value bit number, based on which the real-time value of the corresponding process indicator is collected; Working condition expression, filter the process indicators that require data sampling.

[0008] Preferably, the process indicators for which data sampling is required for screening include: Obtain the working condition expression corresponding to the process index, and parse the bit number and operation logic in the working condition expression; Collect the real-time value corresponding to the bit number in the working condition expression to determine whether the working condition expression is established; If it is true, data sampling is performed, if it is not true, no sampling is performed.

[0009] Preferably, the calculation of the over-limit stability rate R1 of the process indicator within the fixed calculation period includes: Obtain the indicator limit range corresponding to the process indicator; obtain the real-time value of the process indicator; Calculate the duration of each time that the real-time value of the process indicator exceeds the indicator limit range, and accumulate and calculate the total exceeding time of the indicator limit range within a fixed calculation cycle; The over-limit stability rate R1 of the process indicator is calculated based on the total over-limit time.

[0010] Preferably, the calculation of the deviation stability rate R2 of the process indicator within the fixed calculation period includes: Obtain the lower limit and control mode corresponding to the process indicator; obtain the real-time value of the process indicator; Determine the first array variable based on the difference between the real-time value and the lower limit of the indicator; determining a second array variable based on the control mode and the real-time value; The standard deviation coefficient is calculated using the first array variable and the second array variable within a fixed calculation period, and the deviation stability rate R2 is obtained.

[0011] Preferably, the calculation of the overrun stability rate R1 of the process indicator based on the total overrun time comprises: The overrun rate is calculated by dividing the total overrun time by the total running time in a fixed calculation cycle; Subtract the excess rate from one to get the excess stability rate, expressed as a percentage.

[0012] Preferably, determining the second array variable based on the control mode and the real-time value comprises: In the automatic control mode, the second array variable is determined by the difference between the real-time value and the set value corresponding to the process index; In manual control mode, the real-time value is used as the second array variable.

[0013] Preferably, obtaining the deviation stability rate R2 comprises: The standard deviation coefficient is obtained by dividing the standard deviation of the second array variable by the mean of the first array variable; Subtracting the standard deviation coefficient from one gives the deviation stationarity rate, which is expressed as a percentage.

[0014] A steady rate generation system for an industrial device, comprising: The receiving and collecting module subscribes to and collects the real-time value of the bit number according to the preset configuration of the process indicator; The stability rate calculation module calculates the stability rate of process indicators and industrial devices; The interactive module is used to set the parameters in the stability rate calculation process and query and display the stability rate calculation results.

[0015] Preferably, the stability rate calculation module includes: An over-limit stability rate calculation unit calculates the over-limit stability rate R1 of the process index within a fixed calculation period based on the over-limit rate; The deviation stability rate calculation unit calculates the deviation stability rate R2 of the process indicator within a fixed calculation period based on the standard deviation coefficient; the device stability rate calculation unit obtains the stability rate of the industrial device by weighted calculation of the stability rate of the process indicator.

[0016] The present invention has the following beneficial effects: the calculation method of the smooth rate of the over-limit rate and the calculation method of the smooth rate of the standard deviation coefficient are combined to comprehensively calculate the smooth rate data, which can not only reflect the fluctuation frequency of the process indicators and the corresponding industrial equipment, but also reflect the amplitude of its fluctuation, and can obtain more accurate and effective smooth rate data results; the process indicators that need to be sampled and the smooth rate calculation are judged and determined through the working condition expression, so as to automatically filter out the process indicators under abnormal working conditions or that do not need statistics, and improve the calculation efficiency; the smooth rate calculation method of the standard deviation coefficient can be automatically switched according to the current control mode, so as to improve the accuracy of the smooth rate calculation. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a flow chart of the method for generating the stability rate of an industrial device in the present invention.

[0018] Figure 2 It is a flow chart for judging whether data sampling is required for process indicators according to the working condition expression in the present invention.

[0019] Figure 3 It is a flow chart of calculating the over-limit stability rate in the present invention.

[0020] Figure 4 It is a flow chart of calculating the deviation stability rate in the present invention. DETAILED DESCRIPTION

[0021] The present invention is further described below in conjunction with the accompanying drawings and specific embodiments.

[0022] Existing methods for calculating the stability rate include: manual sampling, recording the number of times exceeding the limit, calculating the exceeding rate, and thus obtaining the stability rate; the software system is connected to the factory real-time database for sampling, presetting the upper and lower limits of the indicators, recording the number of times exceeding the limit, and calculating the exceeding rate, and thus obtaining the stability rate; the software system is connected to the factory real-time database for sampling, presetting the upper and lower limits of the indicators, recording the exceeding time, and calculating the exceeding rate, and thus obtaining the stability rate; the software system is connected to the factory real-time database for sampling, manually eliminating the sampling data under abnormal conditions or that does not need to be counted, obtaining the valid sampling data, and dividing the number of valid samplings by the total number of samplings to obtain the stability rate.

[0023] However, the calculation methods of these stability rates are relatively simple and cannot effectively evaluate the actual stability rate data of process indicators and industrial equipment. In addition, manual sampling is inefficient, complex, and prone to errors, and it is difficult to quickly retrieve historical data; sampling through a real-time database is easily affected by the performance of the real-time database, resulting in sampling deviations; the upper and lower limits of the preset indicators are too dependent on human experience. In order to make the stability rate results look high, factories often set a large range for the upper and lower limits, and cannot effectively calculate stability rate data with reference guidance value; manually eliminating sampling data under abnormal conditions or that does not need to be counted requires manual intervention, which has the defects of large workload and untimely elimination affecting the accuracy of the indicator stability rate data.

[0024] Based on the shortcomings of the above-mentioned existing technologies, how to efficiently and automatically filter process indicators under abnormal conditions or that do not require statistics; how to calculate more valuable stability rate data, more accurately locate the parameter defects of process indicators, and provide preventive and guiding data for the safe and stable operation of the factory are urgent problems to be solved. It is necessary to provide a stability rate calculation method, which is firstly universal and suitable for the stability rate calculation of various devices in different industries; secondly, the algorithm is easy to understand, easy to customize, and simple to maintain; thirdly, different sampling cycles and calculation cycles can be configured; then, no manual intervention is required, and the sampling data is fully automatically processed according to the working conditions; finally, it is suitable for the stability rate calculation of both automatic and manual control modes.

[0025] The present invention provides Figure 1 A method for generating a steady rate of an industrial device is shown, comprising: Obtain the preset configuration of the process indicator, and subscribe to the real-time value of the bit number according to the configuration; filter the process indicators that need data sampling; calculate the over-limit stability rate R1 of the process indicator within a fixed calculation period based on the over-limit rate; Calculate the deviation stability rate R2 of the process indicators within a fixed calculation period based on the standard deviation coefficient; The stability rate of the process index is obtained by averaging the over-limit stability rate and the deviation stability rate; The stability rate of the industrial device is calculated by weighting the stability rate of the process indicators.

[0026] It should be noted that the present invention combines the stability rate calculation method of the overlimit rate and the stability rate calculation method of the standard deviation coefficient to comprehensively calculate the stability rate data. Compared with the single stability rate calculation method in the prior art, it can reflect both the fluctuation frequency of the process indicator and the amplitude of its fluctuation, and can obtain more accurate and effective stability rate data results of the process indicator. In addition, there are a large number of different process indicators in an industrial device at the same time. After calculating the stability rate results of different process indicators, the stability rate result of the industrial device is obtained by weighting the weights of different process indicators in the industrial device and the corresponding stability rates, so that the final stability rate is more real and effective. For a large number of process indicators, the operating condition expression can be used to judge and determine the process indicators that need to be sampled and the stability rate calculation, thereby automatically filtering out process indicators under abnormal conditions or that do not need to be counted, thereby improving calculation efficiency.

[0027] Specifically, first connect to the OPCDA service, and after the data is obtained from the industrial device to be collected through a specific collection device, the data collected from the data source is provided to the external application in the form of an OPC standard interface through the OPCDA service. In the present invention, the data is provided to the stability calculation system for stability calculation.

[0028] After completing the connection of the OPCDA service, when calculating the stability rate of the industrial device, since the summary of the operation process of the industrial device contains a large number of process indicators, the stability rate of the process indicators is calculated first, and then the stability rate of the industrial device is calculated comprehensively. For each process indicator, it is necessary to obtain the preset configuration of the process indicator, including the sampling period, fixed calculation period, measurement value bit number, set value bit number, control mode bit number, automatic mode value, working condition expression, and indicator limit range (indicator lower limit and indicator upper limit).

[0029] For each process indicator, according to the sampling period in its preset configuration, the real-time value data of the bit number in the process indicator configuration is subscribed to the OPCDA service at regular intervals. The real-time value corresponding to the bit number in the working condition expression in the process indicator configuration is substituted into the working condition expression to determine whether the expression is valid. If it is valid, the process indicator is sampled according to the sampling period. If not, the process indicator is not sampled.

[0030] For process indicators that are judged to require sampling, sampling is performed once every sampling cycle to obtain real-time value data of the process indicators. After a fixed calculation cycle, the exceedance rate of the process indicators is calculated, and then the exceedance rate is subtracted from one to obtain the exceedance stability rate R1 within this fixed calculation cycle; similarly, the standard deviation coefficient of the real-time value of the process indicator within a fixed calculation cycle is calculated, and then the standard deviation coefficient is subtracted from one to obtain the deviation stability rate R2 within this fixed calculation cycle.

[0031] The stability rate of a process indicator within a fixed calculation period is the average of the over-limit stability rate R1 and the deviation stability rate R2: For a certain industrial device, the corresponding stability rate calculation is performed for all process indicators that are determined to require sampling.

[0032] The device stability rate within this fixed calculation period is the weighted average of the process index stability rates: Where Wi represents the weight of the i-th process indicator among all process indicators that meet the working conditions under the industrial device (the weight is set according to actual needs), Ri represents the stability rate of the i-th process indicator, and n is the number of all process indicators that meet the working conditions under the industrial device.

[0033] It is worth noting that the sampling period is usually several minutes, and the fixed calculation period is usually several hours. The configuration can be modified freely and applied quickly and flexibly to different sampling strategies of various factories. After the sampling period is reached, the system actively obtains the real-time value data of the bit number in the process indicator configuration, and subscribes to the broadcast event of the real-time value change. When the real-time value changes, it determines whether the working condition expression is established. If the working condition expression is established, the subsequent stability rate calculation is performed. The method of the present application can calculate the stability rate of a single bit number and the stability rate of a control loop. When calculating the stability rate of a control loop, it only needs to fill in the set value bit number and the control mode bit number in the configuration. The configuration is simple and applicable to a wider range, and there is no need to manually judge the indicator type, which improves the efficiency of the user.

[0034] Furthermore, the configuration for obtaining the preset process indicators includes: Sampling period: the interval time for sampling the data corresponding to the bit number in the process indicator configuration; Fixed calculation cycle, the interval time for calculating the stability rate of process indicators, including several sampling cycles; Real-time value bit number, based on which the real-time value of the corresponding process indicator is collected; Set value bit number, based on which the set value bit number is used to obtain the set value of the data corresponding to the process indicator; Control mode bit number, based on which the control mode corresponding to the process indicator is obtained; Working condition expression, to determine whether there are abnormal conditions in the working condition and to select the process indicators that need data sampling; The indicator limit range, including the indicator lower limit and the indicator upper limit, corresponds to the upper and lower boundaries of the process indicator when it is in a normal state.

[0035] It should be noted that the sampling period and the fixed calculation period can be set by the technical personnel according to the actual needs by inputting parameters. At the same time, the preset configuration of the process indicator includes various different bit numbers, each bit number corresponds to a process indicator value, so according to the specific bit number, the real-time data corresponding to the bit number can be obtained for subsequent specific operations; such as obtaining the real-time value data of the process indicator according to the real-time value bit number, and obtaining the control module of the process indicator at the current sampling according to the control mode bit number. The limit range of the indicator can also be input and set according to the different process indicators, and the over-limit rate of the process indicator is determined by the limit range of the indicator, and then the over-limit stability rate is calculated; at the same time, in order to overcome the problem of inaccurate stability rate caused by a single calculation method and the subjective setting of the limit range, the present invention also obtains the deviation stability rate by calculating the standard deviation coefficient, reduces the influence of the size difference of the limit range setting on the stability rate calculation, and comprehensively considers the over-limit stability rate and the deviation stability rate to obtain the final stability rate.

[0036] As a specific embodiment, the process indicators for which data sampling is required include: Obtain the working condition expression corresponding to the process index, and parse the bit number and operation logic in the working condition expression; Collect the real-time value corresponding to the bit number in the working condition expression to determine whether the working condition expression is established; If it is true, data sampling is performed, if it is not true, no sampling is performed.

[0037] It should be noted that there are tens of thousands of process indicators in factories, and different industrial devices also have a large number of process indicators. Automatically filtering process indicators under abnormal conditions or without statistics can reduce manual intervention and avoid the defects of large workload and untimely elimination that affect the accuracy of indicator stability rate data. Therefore, the present invention sets a corresponding method for screening process indicators, and judges whether data sampling is required for process indicators based on whether the working condition expression is established.

[0038] It is worth noting that, through the working condition expression of the process indicator, based on the real-time value corresponding to the bit number in the working condition expression, the normal or abnormal working condition (device start-up and shutdown, maintenance, load lifting, etc.) can be automatically judged, and the sampling data of abnormal working conditions can be automatically filtered without manual elimination. The working condition expression can contain multiple bit numbers, and different bit numbers are connected by logical or mathematical operators such as AND, OR, =, ! =, >, <, +, -, *, / , etc. Finally, the working condition expression is judged whether it is established based on the result of the logical operation. If the result of the logical operation is 0, it means that it belongs to an abnormal working condition, and if the result of the logical operation is 1, it means that it belongs to a normal working condition.

[0039] Specifically, Figure 2The flowchart of an embodiment of judging whether a process indicator needs data sampling according to a working condition expression is shown; taking the working condition expression AI1001.PV>10OR AI1002.PV<100 as an example; firstly, the bit numbers existing in the working condition expression are parsed out, which are AI1001.PV and AI1002.PV respectively, and then the logical operator OR (or operation) in the working condition expression is parsed; when judging the working condition expression, the real-time value data corresponding to the bit numbers AI1001.PV and AI1002.PV are obtained, and the real-time value data corresponding to the bit numbers AI1001.PV and AI1002.PV are brought into the working condition expression for logical or operation to obtain the final operation result. If the operation result is 0, it means that the working condition expression is not established, which is an abnormal working condition, and the corresponding process indicator does not perform data sampling; if the operation result is 1, it means that the working condition expression is established, which is a normal working condition, and the corresponding process indicator performs data sampling and subsequent stability rate calculation.

[0040] As a specific embodiment, calculating the over-limit stability rate R1 of the process indicator within the fixed calculation period includes: Obtain the indicator limit range corresponding to the process indicator; obtain the real-time value of the process indicator; Calculate the duration of each time that the real-time value of the process indicator exceeds the indicator limit range, and accumulate and calculate the total exceeding time of the indicator limit range within a fixed calculation cycle; The over-limit stability rate R1 of the process indicator is calculated based on the total over-limit time.

[0041] It should be noted that the fixed calculation cycle includes several sampling cycles, which means that the real-time values ​​of the process indicators are sampled multiple times within the fixed calculation cycle. The real-time value obtained by each sampling is used to determine whether it exceeds the indicator limit range. When it exceeds the limit range, the start time of the limit can be determined based on the sampling cycle and the number of times the real-time value of the sampling exceeds the limit range. Then, the time when the subsequent most recent real-time value returns to the limit range is used as the end time to obtain the duration of each time the real-time value of the process indicator exceeds the indicator limit range; the total time of exceeding the limit range within the fixed calculation cycle is added together to obtain the total time of exceeding the limit within the fixed calculation cycle. Then, the limit-exceeding rate is calculated based on the total time of exceeding the limit and the limit-exceeding stability rate is further obtained.

[0042] Specifically, Figure 3 The figure shows a flow chart for calculating the over-limit stability rate based on the over-limit rate; first, the preset configuration of the process indicator is obtained, and the real-time value of the bit number is subscribed according to the configuration; at the same time, the notification of the change of the real-time value of the bit number of the process indicator is subscribed; when the real-time value changes, it is re-judged whether the operating condition expression is established. If the operating condition expression is not established, it means that the current operating condition is in an abnormal state (device start-up and shutdown, maintenance, load lifting, etc.), and it ends directly; if the operating condition expression is established, the subsequent over-limit judgment and stability rate calculation are carried out.

[0043] The indicator limit range of the process indicator includes the indicator upper limit and the indicator lower limit. When the real-time value of the process indicator is greater than the indicator upper limit or less than the indicator lower limit, it indicates that the real-time value exceeds the indicator limit range. The real-time value is compared with the upper and lower limits of the indicator. If the real-time value exceeds the upper limit of the indicator, the start time T1 of exceeding the upper limit is recorded; if the real-time value is lower than the lower limit of the indicator, the start time T2 of exceeding the lower limit is recorded; if the real-time value is between the lower limit of the indicator and the upper limit of the indicator, the time interval D1 between the current time and the start time of the most recent exceeding the upper limit (duration of exceeding the upper limit) or the time interval D2 between the current time and the start time of the most recent exceeding the lower limit (duration of exceeding the lower limit) is recorded. If there are both exceeding the upper limit and exceeding the lower limit before the current time, the exceeding time closest to the current time is used for calculation. In a fixed calculation cycle, D1 and D2 are accumulated to obtain the total exceeding time D in seconds. The exceeding rate is calculated based on the total exceeding time and the exceeding stability rate R1 is further obtained.

[0044] Furthermore, the overrun stability rate R1 of the process index calculated by the total overrun time includes: The overrun rate is calculated by dividing the total overrun time by the total running time in a fixed calculation cycle; Subtract the excess rate from one to get the excess stability rate, expressed as a percentage.

[0045] Over-limit stability rate R1: R1=(1-(D / T))×100% Where D is the total overrun time, and T is the total running time within a fixed calculation cycle.

[0046] As a specific embodiment, calculating the deviation stability rate R2 of the process indicator within the fixed calculation period includes: Obtain the lower limit and control mode corresponding to the process indicator; obtain the real-time value of the process indicator; Determine the first array variable based on the difference between the real-time value and the lower limit of the indicator; determining a second array variable based on the control mode and the real-time value; In the automatic control mode, the second array variable is determined by the difference between the real-time value and the set value corresponding to the process index; or in the manual control mode, the real-time value is used as the second array variable; The standard deviation coefficient is calculated using the first array variable and the second array variable within a fixed calculation period, and the deviation stability rate R2 is obtained.

[0047] It should be noted that in addition to calculating the stability rate with the over-limit rate, in order to overcome the problem that the stability rate result is inaccurate due to the single calculation method, the standard deviation coefficient of the real-time value of the process indicator is also considered to calculate the deviation stability rate, and the final stability rate result is obtained by combining it with the over-limit stability rate. It can reflect both the frequency of fluctuation of the process indicator and the amplitude of its fluctuation, making the stability rate calculation result more valuable for reference.

[0048] Specifically, Figure 4 The figure shows a flow chart for calculating the deviation stability rate based on the standard deviation coefficient; first, the preset configuration of the process indicator is obtained, and the real-time value of the bit number is subscribed according to the configuration; at the same time, the notification of the change of the real-time value of the bit number of the process indicator is subscribed; when the real-time value changes, it is re-determined whether the operating condition expression is established. If the operating condition expression is not established, it means that the current operating condition is in an abnormal state (device start-up and shutdown, maintenance, load lifting, etc.), and it ends directly; if the operating condition expression is established, subsequent deviation judgment and stability rate calculation are carried out.

[0049] In this embodiment, the difference d1 between the real-time value PV of the process indicator and the lower limit of the process indicator is used as the element of the first array variable, and the number of elements in the first array variable corresponds to the number of sampling periods in the fixed calculation period; if d1 is greater than or equal to 0, d1 is appended to the first array variable L1, and if d1 is less than 0, 0 is appended to the first array variable L1. Optionally, the difference d1 between the upper limit of the process indicator and the real-time value PV of the process indicator can also be used as the element of the first array variable, and the specific processing method is the same. Calculate the average value of the first array variable L1.

[0050] After completing the acquisition of the first array variable, select different acquisition methods for the second array variable according to different control modes. When the control mode is automatic control, the difference d2 between the real-time value PV of the process indicator and the set value SP of the process indicator is calculated as the element in the second array variable, and the number of elements in the second array variable corresponds to the number of sampling cycles in the fixed calculation cycle; when the control mode is manual control, the real-time value PV of the process indicator is directly used as the element in the second array variable. Calculate the standard deviation of the second array variable L2, and the standard deviation calculation method can be automatically switched according to the current control mode to improve the accuracy of the stability calculation. In automatic mode, the standard deviation is σ(PV-SP); in manual mode, the standard deviation is σ(PV).

[0051] The standard deviation coefficient is calculated using the mean value of the first array variable and the standard deviation of the second array variable, and the deviation stability rate is further obtained.

[0052] Furthermore, the deviation stability rate R2 includes: The standard deviation coefficient is obtained by dividing the standard deviation of the second array variable by the mean of the first array variable; Subtracting the standard deviation coefficient from one gives the deviation stationarity rate, which is expressed as a percentage.

[0053] Deviation stability rate R2: Where σ(L2) represents the standard deviation of the second array variable, Represents the mean of the first array variable.

[0054] Compared with the prior art, the method of the present invention can flexibly switch between sampling cycles and fixed calculation cycles, and can be quickly and flexibly applied to different sampling strategies of various factories. It can automatically determine whether the process indicator is in an abnormal condition according to the working condition expression, without the need to manually eliminate the abnormal condition, and has the advantages of being more efficient, less prone to errors, and low in latency. It can calculate the stability rate of a single bit number and the stability rate of a control loop. It has a simple configuration and is more applicable, and there is no need to manually judge the indicator type, thereby improving the efficiency of the user. The calculation method of the standard deviation coefficient can be automatically switched according to the current control mode to improve the accuracy of the stability rate calculation. The stability rate is calculated by combining the two sets of data, the over-limit rate and the standard deviation coefficient, which can reflect both the frequency of fluctuations in the process indicator and the amplitude of its fluctuations, making the stability rate calculation result more valuable for reference.

[0055] Based on the method, a method for generating a steady rate of an industrial device is provided, and a system for generating a steady rate of an industrial device is provided, comprising: The receiving and collecting module subscribes to and collects the real-time value of the bit number according to the preset configuration of the process indicator; The stability rate calculation module calculates the stability rate of process indicators and industrial devices; The interactive module is used to set the parameters in the stability rate calculation process and query and display the stability rate calculation results.

[0056] The stability rate calculation module includes: An over-limit stability rate calculation unit calculates the over-limit stability rate R1 of the process index within a fixed calculation period based on the over-limit rate; The deviation stability rate calculation unit calculates the deviation stability rate R2 of the process indicator within a fixed calculation period based on the standard deviation coefficient; the device stability rate calculation unit obtains the stability rate of the industrial device by weighted calculation of the stability rate of the process indicator.

[0057] In this embodiment, an example of applying the method of the present invention to generate a steady rate in a certain device is given.

[0058] According to the IP address of the OPCDA service, enumerate all OPCDA service lists under the IP address, select one of the available services and connect.

[0059] During configuration, a factory model is constructed, in which the hierarchy from top to bottom is a company-a factory area-a device-process A, and process indicators are added under process A (in fact, there are thousands of process indicators in the factory, and only one process indicator is taken as an example here): the process indicator name is PIC1001, the upper limit of the indicator max is 100, the lower limit of the indicator min is 0, the weight is 0.2, the real-time value bit number is PIC1001.PV, the set value bit number is PIC1001.SV, the control mode bit number is PIC1001.MODE, and the working condition expression is AI1.PV=1AND AI2.PV>50. The sampling period is set to 1 minute, and the fixed calculation period is set to 1 hour.

[0060] Parse all the bit numbers in the working condition expression: AI1.PV, AI2.PV, subscribe to these bit numbers to the OPCDA service, and receive notifications of changes in the real-time values ​​of these bit numbers. Substitute the real-time values ​​of AI1.PV and AI2.PV into the working condition expression AI1.PV=1AND AI2.PV>50, and calculate the result of the expression. If the result is 0, it means that the working condition is not established and it is an abnormal working condition (device start-up and shutdown, maintenance, load lifting, etc.), and no sampling is required; if the result is 1, it means that the working condition is established and it is a normal working condition.

[0061] Under normal working conditions, according to the sampling period, the real-time values ​​of the real-time value bit number PIC1001.PV, the set value bit number PIC1001.SV, and the control mode bit number PIC1001.MODE are obtained every 1 minute, and notifications of changes in the real-time values ​​of these bits are received at the same time.

[0062] Compare the real-time value obtained by the real-time value bit number PIC1001.PV with the index limit range. If it exceeds the index upper limit 100, record the start time T1 of exceeding the upper limit; if it is lower than the lower limit 0, record the start time T2 of exceeding the lower limit; if the real-time value is between the lower limit and the upper limit, record the time interval D1 between the current time and T1, and the time interval D2 between the current time and T2. In a fixed calculation cycle, accumulate D1 and D2 to obtain the total limit exceeding time D in seconds.

[0063] Record the difference between the real-time value bit number PIC1001.PV and the lower limit of the index 0 (if the difference is less than 0, take 0), and append the difference to the first array variable L1 in the memory. Determine the control mode according to the control mode bit number PIC1001.MODE. If it is automatic mode, record the difference between the real-time value bit number PIC1001.PV and the real-time value corresponding to the set value bit number PIC1001.SV, and append the difference to the second array variable L2; if it is manual mode, directly append the real-time value corresponding to the real-time value bit number PIC1001.PV to the second numerical variable L2. Repeat the above steps until the fixed calculation cycle reaches 1 hour, and then calculate the stability rate.

[0064] The over-limit stability rate R1 is calculated by the over-limit time; the deviation stability rate R2 is calculated according to the standard deviation coefficient. The stability rate of the indicator PIC1001 in this fixed calculation cycle is The stability rate of the device in this fixed calculation cycle is: Where Wi represents the weight of the i-th process indicator among all process indicators that meet the working conditions under the industrial device, Ri represents the stability rate of the i-th process indicator, and n is the number of all process indicators that meet the working conditions under the industrial device.

[0065] The above embodiments are further elaborations and illustrations of the present invention for ease of understanding, and are not limitations of the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A method for generating a steady rate of an industrial device, characterized in that: include: Get the preset configuration of process indicators and subscribe to the real-time value of the bit number according to the configuration; Screen the process indicators that require data sampling; Calculate the over-limit stability rate R1 of the process indicator within a fixed calculation period based on the over-limit rate; Calculate the deviation stability rate R2 of the process indicators within a fixed calculation period based on the standard deviation coefficient; The stability rate of the process index is obtained by averaging the over-limit stability rate and the deviation stability rate; The stability rate of the industrial device is calculated by weighting the stability rate of the process indicators.

2. The method for generating a steady rate of an industrial device according to claim 1, characterized in that: The configuration of obtaining the preset process index includes: Sampling period: the interval time for sampling the data corresponding to the bit number in the process indicator configuration; Fixed calculation cycle, the interval time for calculating the stability rate of process indicators, including several sampling cycles; Real-time value bit number, based on which the real-time value of the corresponding process indicator is collected; Working condition expression, filter the process indicators that require data sampling.

3. A method for generating a steady rate of an industrial device according to claim 1 or 2, characterized in that: The process indicators for data sampling required for the screening include: Obtain the working condition expression corresponding to the process index, and parse the bit number and operation logic in the working condition expression; Collect the real-time value corresponding to the bit number in the working condition expression to determine whether the working condition expression is established; If it is true, data sampling is performed, if it is not true, no sampling is performed.

4. A method for generating a steady rate of an industrial device according to claim 1 or 2, characterized in that: The calculation of the over-limit stability rate R1 of the process indicator within the fixed calculation period includes: Obtain the indicator limit range corresponding to the process indicator; obtain the real-time value of the process indicator; Calculate the duration of each time that the real-time value of the process indicator exceeds the indicator limit range, and accumulate and calculate the total exceeding time of the indicator limit range within a fixed calculation cycle; The over-limit stability rate R1 of the process indicator is calculated based on the total over-limit time.

5. A method for generating a steady rate of an industrial device according to claim 1 or 2, characterized in that: The calculation of the deviation stability rate R2 of the process indicator within the fixed calculation period includes: Obtain the lower limit and control mode corresponding to the process indicator; obtain the real-time value of the process indicator; Determine the first array variable based on the difference between the real-time value and the lower limit of the indicator; determining a second array variable based on the control mode and the real-time value; The standard deviation coefficient is calculated using the first array variable and the second array variable within a fixed calculation period, and the deviation stability rate R2 is obtained.

6. The method for generating a steady rate of an industrial device according to claim 4, characterized in that: The overrun stability rate R1 of the process indicator calculated by the total overrun time includes: The overrun rate is calculated by dividing the total overrun time by the total running time in a fixed calculation cycle; Subtract the exceedance rate from one to get the exceedance stability rate, which is expressed as a percentage.

7. The method for generating a steady rate of an industrial device according to claim 5, characterized in that: Determining the second array variable based on the control mode and the real-time value includes: In the automatic control mode, the second array variable is determined by the difference between the real-time value and the set value corresponding to the process index; In manual control mode, the real-time value is used as the second array variable.

8. The method for generating a steady rate of an industrial device according to claim 5, characterized in that: The deviation stability rate R2 is obtained by: The standard deviation coefficient is obtained by dividing the standard deviation of the second array variable by the mean of the first array variable; Subtracting the standard deviation coefficient from one gives the deviation stationarity rate, which is expressed as a percentage.

9. A system for generating a stability rate of an industrial device, applicable to the method for generating a stability rate according to any one of claims 1 to 8, characterized in that: include: The receiving and collecting module subscribes to and collects the real-time value of the bit number according to the preset configuration of the process indicator; The stability rate calculation module calculates the stability rate of process indicators and industrial devices; The interactive module is used to set the parameters in the stability rate calculation process and query and display the stability rate calculation results.

10. The system for generating a steady rate of an industrial device according to claim 9, characterized in that: The stability rate calculation module includes: An over-limit stability rate calculation unit calculates the over-limit stability rate R1 of the process index within a fixed calculation period based on the over-limit rate; The deviation stability rate calculation unit calculates the deviation stability rate R2 of the process index within a fixed calculation period based on the standard deviation coefficient; The device stability rate calculation unit obtains the stability rate of the industrial device by weighted calculation of the stability rate of the process index.

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