IGBT small time scale data sparse reconstruction method and system

Abstract

The invention provides an IGBT (Insulated Gate Bipolar Translator) small time scale data sparse reconstruction method and system. The method comprises the following steps: acquiring small time scale electrical signal data in an IGBT operation process; according to a preset determination mode of key data points in the electrical signal data, identifying a plurality of key data points representing the steady state and change of the electrical signal in the electrical signal data; function fitting is carried out on the electrical signal data between every two adjacent key data points; connecting the plurality of fitting functions obtained by fitting based on a time sequence to obtain reconstruction data of the electrical signal data; complete electrical characteristic information in an IGBT switching period can be obtained through small-scale data; according to the method, the feature information of the IGBT switching period can be represented, the comprehensive real-time monitoring of the IGBT switching process is realized, the scale of the transmitted data is compressed, and the engineering application is facilitated.

Description

Technical Field

[0001] The present invention relates to the field of power electronics technology, and in particular to an IGBT small time scale data sparse reconstruction method and system. Background Art

[0002] IGBT (Insulated Gate Bipolar Transistor) is widely used in power systems, smart cars and other fields, but problems such as aging and failure may occur during use, and the status of IGBT needs to be monitored. Among them, monitoring the electrical signals of IGBT is the most direct method, such as the on-state voltage drop and collector current of IGBT. These electrical signals can directly reflect the operation of IGBT on the one hand, and on the other hand, they can also extract typical characteristics to calculate indirect parameters such as junction temperature to evaluate the status of IGBT. Therefore, monitoring the electrical signals of IGBT has important engineering significance and application value.

[0003] However, the on-off process of IGBT is completed instantaneously and lasts for a very short time, while the signal change process is quite diverse. When collecting the electrical signal of IGBT, a sampling period that is too long will lose a lot of characteristic information. Therefore, a very small sampling period is required to ensure that the data is not distorted, that is, small time scale data. This results in a very large amount of IGBT electrical signal data collected, and the switching frequency of IGBT is relatively high, so that the final IGBT small time scale data exceeds the transmission capacity of the optical fiber, and ultimately cannot monitor the switching process of IGBT in real time.

[0004] Currently, there are almost no engineering cases that monitor the entire switching process data of IGBT, and the acquisition of IGBT electrical signals mainly exists in laboratory research projects. Oscilloscopes, sampling boards, etc. are used to obtain some characteristic values ​​of individual signals without comprehensive monitoring of the IGBT switching process. This may cause the loss of some characteristic information in the switching process, resulting in inaccurate IGBT switching status evaluation results. Summary of the invention

[0005] In order to overcome the above-mentioned deficiencies of the prior art, the present invention proposes a method for reconstructing IGBT small time scale data sparseness, comprising:

[0006] Acquire small time scale electrical signal data during IGBT operation;

[0007] According to a preset method for determining key data points in the electrical signal data, a plurality of key data points representing steady state and changes of the electrical signal are identified in the electrical signal data;

[0008] Based on the time of each key data point, function fitting is performed on the electrical signal data between every two adjacent key data points to obtain multiple fitting functions;

[0009] Based on the time sequence of the multiple key data points, the multiple fitting functions are connected to obtain reconstructed data of the electrical signal data in each switching cycle of the IGBT.

[0010] Optionally, the identifying, in the electrical signal data, a plurality of key data points representing a steady state and a change of the electrical signal according to a preset method for determining key data points in the electrical signal data includes:

[0011] Dividing the electrical signal data in each switching cycle of the IGBT into turn-on phase data and turn-off phase data;

[0012] Determine the identification order and location interval of the key data points according to the preset method of determining the key data points in the electrical signal data;

[0013] According to the identification sequence and the position interval of the key data points, a plurality of key data points representing the steady state and the change of the electrical signal are identified in the turn-on phase data and the turn-off phase data.

[0014] Optionally, the multiple key data points representing the steady state and changes of the electrical signal include multiple of the following: turn-on point, turn-on steady-state point, turn-off point, turn-off steady-state point, local maximum point, local minimum point and local steady-state point and change rate turning point.

[0015] Optionally, the identifying of a plurality of key data points representing steady state and changes of electrical signals in the turn-on phase data and the turn-off phase data according to the identification order and the position interval of the key data points includes:

[0016] Record the electrical signal data with the same value as one data value, and respectively obtain the two data values ​​with the largest number in the opening phase data and the closing phase data;

[0017] Determine the turn-on point and the turn-on steady-state point based on the magnitudes of the two largest data values ​​in the turn-on phase data and the time sequence of the electrical signal data; determine the turn-off point and the turn-off steady-state point based on the magnitudes of the two largest data values ​​in the turn-off phase data and the time sequence of the electrical signal data;

[0018] Eliminating the multiple data values ​​corresponding to the on-point, the on-steady-state point, the off-point, and the off-steady-state point, to obtain the on-stage data and the off-stage data after the data are eliminated;

[0019] Respectively obtaining the largest data value in the on-stage data and the off-stage data after data removal, and determining the local steady-state point based on the time sequence of the electrical signal data corresponding to the largest data value;

[0020] Acquire a local fluctuation data interval and a turning data interval in the electrical signal data based on the position interval where the key data point is located;

[0021] The local maximum point and the local minimum point are determined based on the maximum data value and the minimum data value in the local fluctuation number interval, and the change rate turning point is determined based on the data value with the least number in the turning data interval.

[0022] Optionally, the determining the local steady-state point based on the time sequence of the electrical signal data corresponding to the largest number of data values ​​includes:

[0023] According to the time sequence of the electrical signal data, the starting electrical signal data corresponding to the largest number of data values ​​in the electrical signal data is determined as the local steady-state starting point;

[0024] According to the time sequence of the electrical signal data, the final electrical signal data in the electrical signal data corresponding to a data value with the largest number in the electrical signal data is determined as the local steady-state end point.

[0025] Optionally, the acquiring the local fluctuation data interval in the electrical signal data based on the position interval where the key data point is located includes:

[0026] According to the position interval of the key data point, the data segment between the shutoff point and the local steady-state point in the shutoff data stage is determined as the local fluctuation data interval in the electrical signal data.

[0027] Optionally, the obtaining of the turning data interval in the electrical signal data based on the position interval where the key data point is located includes:

[0028] According to the position interval where the key data point is located, the data segment between the local steady-state point and the shut-off steady-state point in the shut-off data stage is determined as the turning data interval in the electrical signal data.

[0029] Optionally, after obtaining the reconstructed data of the electrical signal data in each switching cycle of the IGBT, the method further includes: performing operating status monitoring and evaluation on the IGBT based on the reconstructed data of the electrical signal data.

[0030] Based on the above invention concept, the present invention proposes an IGBT small time scale data sparse reconstruction system, comprising:

[0031] A data acquisition module is used to acquire electrical signal data of small time scale during the operation of IGBT;

[0032] A key point identification module, used to identify a plurality of key data points representing a steady state and a change of an electrical signal in the electrical signal data according to a preset method for determining key data points in the electrical signal data;

[0033] A data analysis module, used for performing function fitting on the electrical signal data between every two adjacent key data points based on the time of each key data point, to obtain multiple fitting functions;

[0034] The data reconstruction module is used to connect the multiple fitting functions based on the time sequence of the multiple key data points to obtain reconstructed data of the electrical signal data in each switching cycle of the IGBT.

[0035] Optionally, the key point identification module includes:

[0036] A data division unit, used for dividing the electrical signal data in each switching cycle of the IGBT into turn-on phase data and turn-off phase data;

[0037] The identification method determination unit is used to determine the identification order and the position interval of the key data points according to the preset determination method of the key data points in the electrical signal data;

[0038] The key data point identification unit is used to identify a plurality of key data points representing the steady state and changes of the electrical signal in the opening phase data and the closing phase data according to the identification order and the position interval of the key data points.

[0039] Optionally, the key data point identification unit includes:

[0040] A first identification subunit is used to record the electrical signal data with the same value as one data value, and respectively obtain the two data values ​​with the largest number in the opening stage data and the closing stage data;

[0041] Determine the turn-on point and the turn-on steady-state point based on the magnitudes of the two largest data values ​​in the turn-on phase data and the time sequence of the electrical signal data; determine the turn-off point and the turn-off steady-state point based on the magnitudes of the two largest data values ​​in the turn-off phase data and the time sequence of the electrical signal data;

[0042] A data elimination subunit, used to eliminate the multiple data values ​​corresponding to the switch-on point, the switch-on steady-state point, the switch-off point and the switch-off steady-state point, and obtain the switch-on phase data and the switch-off phase data after the data are eliminated;

[0043] A second identification subunit is used to respectively obtain the largest number of data values ​​in the opening phase data and the closing phase data after the data is eliminated, and determine the local steady-state point based on the time sequence of the electrical signal data corresponding to the largest number of data values;

[0044] An interval identification subunit, used for acquiring a local fluctuation data interval and a turning data interval in the electrical signal data based on a position interval where the key data point is located;

[0045] The third identification subunit is used to determine the local maximum point and the local minimum point based on the maximum data value and the minimum data value in the local fluctuation number interval, and determine the change rate turning point based on the smallest number of data values ​​in the turning data interval.

[0046] Optionally, the second identification subunit is specifically used to:

[0047] Respectively obtaining the data value with the largest number in the opening phase data and the closing phase data after the data is eliminated;

[0048] According to the time sequence of the electrical signal data, the starting electrical signal data corresponding to the largest number of data values ​​in the electrical signal data is determined as the local steady-state starting point;

[0049] According to the time sequence of the electrical signal data, the final electrical signal data in the electrical signal data corresponding to a data value with the largest number in the electrical signal data is determined as the local steady-state end point.

[0050] Optionally, the interval identification subunit is specifically used to:

[0051] According to the position interval of the key data point, the data segment between the shutoff point and the local steady-state point in the shutoff data stage is determined as the local fluctuation data interval in the electrical signal data.

[0052] Optionally, the interval identification subunit is further used to:

[0053] According to the position interval where the key data point is located, the data segment between the local steady-state point and the shut-off steady-state point in the shut-off data stage is determined as the turning data interval in the electrical signal data.

[0054] Optionally, the system further includes a monitoring and evaluation module for, after obtaining reconstructed data of the electrical signal data in each switching cycle of the IGBT, performing operating status monitoring and evaluation on the IGBT based on the reconstructed data of the electrical signal data.

[0055] In another aspect, the present application further provides an electronic device, comprising: at least one processor and a memory; the memory and the processor are connected via a bus;

[0056] The memory is used to store one or more programs;

[0057] When the one or more programs are executed by the at least one processor, the IGBT small time scale data sparse reconstruction method as described above is implemented.

[0058] On the other hand, the present application also provides a computer-readable storage medium having an execution program stored thereon, and when the execution program is executed, the IGBT small time scale data sparse reconstruction method as described above is implemented.

[0059] Compared with the closest prior art, the present invention has the following beneficial effects:

[0060] The present invention provides an IGBT small time scale data sparse reconstruction method and system, comprising: obtaining electrical signal data of a small time scale during the operation of the IGBT; identifying multiple key data points representing the steady state and changes of the electrical signal in the electrical signal data according to a preset method for determining key data points in the electrical signal data; performing function fitting on the electrical signal data between every two adjacent key data points based on the time of each key data point to obtain multiple fitting functions; connecting the multiple fitting functions based on the time sequence of the multiple key data points to obtain reconstructed data of the electrical signal data in each switching cycle of the IGBT; by obtaining small-scale data, complete electrical characteristic information in the IGBT switching cycle can be obtained; reconstructed data can be obtained according to the fitting function of the electrical signal data between the key data points, and the reconstructed data can represent the characteristic information of the IGBT switching cycle, realize comprehensive real-time monitoring of the IGBT switching process, and can be used for accurate evaluation of the IGBT switching state; at the same time, compared with using complete data to analyze the IGBT switching state, the transmission data scale is greatly compressed, which is convenient for engineering application. BRIEF DESCRIPTION OF THE DRAWINGS

[0061] Figure 1 A schematic diagram of a process flow of an IGBT small time scale data sparse reconstruction method provided by the present invention;

[0062] Figure 2 It is the small time scale data (threshold voltage data) of the collected IGBT switch electrical signal;

[0063] Figure 3 is a schematic diagram of threshold voltage data after data segmentation;

[0064] Figure 4It is a schematic diagram of key data points in electrical signal data;

[0065] Figure 5 Schematic diagram of the results of original data and reconstructed data;

[0066] Figure 6 A structural schematic diagram of an IGBT small time scale data sparse reconstruction system provided by the present invention;

[0067] Figure 7 The present invention provides a schematic structural diagram of an electronic device. DETAILED DESCRIPTION

[0068] The specific implementation modes of the present invention are further described in detail below with reference to the accompanying drawings.

[0069] Example 1

[0070] The present invention provides a method for reconstructing IGBT small time scale data sparseness, such as Figure 1 As shown, including:

[0071] S1. Obtain electrical signal data of small time scale during IGBT operation;

[0072] S2. according to a preset method for determining key data points in the electrical signal, identifying a plurality of key data points in the electrical signal data that represent a steady state and changes in the electrical signal;

[0073] S3, based on the time of each key data point, performing function fitting on the electrical signal data between every two adjacent key data points to obtain multiple fitting functions;

[0074] S4. Based on the time sequence of the multiple key data points, the multiple fitting functions are connected to obtain reconstructed data of the electrical signal data in each switching cycle of the IGBT.

[0075] In step S1, small time scale data of electrical signals in the switching cycle during the operation of the complete IGBT are collected, such as Figure 2 As shown, the horizontal axis represents time, and the vertical axis represents electrical signal data (here refers to the threshold voltage V ge ). Small time scale data refers to data collected over a shorter time interval and is usually used in situations where high time resolution analysis is required.

[0076] The electrical signals during IGBT operation include the conduction voltage drop V ce , threshold voltage V ge and collector current I c In this embodiment, the electrical signal data is expressed as a threshold voltage V ge Take this as an example to explain this solution in detail.

[0077] In step S2, a plurality of key data points representing a steady state and a change of the electrical signal are identified in the electrical signal data according to a preset method for determining key data points in the electrical signal.

[0078] S21, dividing the data set: dividing the electrical signal data in each switching cycle of the IGBT into turn-on phase data and turn-off phase data.

[0079] The collected complete IGBT switch electrical signal data set of small time scale is segmented according to different levels. Specifically, in one switching cycle of IGBT, the data in the switching cycle is divided into two segments according to the preset segmentation point, such as Figure 3 As shown, one section is the IGBT turn-on stage data ( Figure 3 (a)), one section is the IGBT turn-off stage data ( Figure 3 (b)). The data of each switching cycle is segmented in this way, and the segmentation points are set according to expert experience.

[0080] Among them, the IGBT turn-on stage data includes the steady-state data of the electrical signal in the IGBT turn-off state, the change data of the electrical signal during the IGBT turn-on process, and the steady-state data of the electrical signal after the IGBT is turned on; the IGBT turn-off stage data includes the steady-state data of the electrical signal in the IGBT turn-on state, the change data of the electrical signal during the IGBT turn-off process, and the steady-state data of the electrical signal after the IGBT is turned off.

[0081] S22. Determine the identification order and location interval of the key data points according to a preset method for determining the key data points in the electrical signal data.

[0082] The multiple key data points representing the steady state and changes of the electrical signal include multiple of the following: turn-on point, turn-on steady state point, turn-off point, turn-off steady state point, local maximum point, local minimum point and local steady state point and change rate turning point.

[0083] like Figure 4 As shown, the turn-on point refers to the data point when the IGBT is turned on;

[0084] The turn-on steady-state point refers to the data point at which the IGBT completes turn-on and reaches steady state;

[0085] The turn-off point refers to the data point when the IGBT turns off;

[0086] The turn-off steady-state point refers to the data point at which the IGBT completes turn-off and reaches steady state;

[0087] The rate of change turning point refers to the change in the law of electrical signal change during the IGBT turn-on or turn-off process, such as the change in the slope of a straight line, the change from a straight line to a curve, the change in the form of the curve, etc.

[0088] The local maximum point and local minimum point refer to the situation where the electrical signal fluctuates or turns locally during the IGBT's on or off process, thereby generating a local maximum point or a local minimum point.

[0089] The local steady-state point refers to the situation that the electrical signal does not change much locally during the on-off or off-off process of the IGBT, and is basically in a stable state, and lasts for a period of time. The starting point and ending point of the data during this period are the local steady-state points.

[0090] Local outliers refer to data points that appear in the entire cycle that do not conform to the expert's expected modeling.

[0091] Among them, the occurrence stages of the turning point of the rate of change, the local maximum point, the local minimum point and the local steady-state point are judged based on expert experience.

[0092] Specifically, the method for determining the key data points in the electrical signal data is pre-set based on expert experience. The method for determining the key data points includes the various key points that exist in each type of electrical signal (IGBT has a variety of electrical signals, including on-state voltage drop, gate voltage, and collector current. The types of key data points of these electrical signals are different. Some have no key data points, and some have fewer key data points. Expert experience is required to pre-set the key points of various electrical signals), the identification order of each key data point, and the location interval of the key data points. Different key data points have different determination methods, and different electrical signals have different key data point identification orders, which are judged by expert experience and formed into a unified standard.

[0093] S23. According to the identification sequence and the location interval of the key data points, a plurality of key data points representing the steady state and the change of the electrical signal are identified in the turn-on phase data and the turn-off phase data.

[0094] Specifically, electrical signal data with the same value is recorded as one data value, and the two data values ​​with the largest number in the opening phase data and the closing phase data are respectively obtained;

[0095] 1. Determine the turn-on point, turn-on steady-state point, turn-off point, and turn-off steady-state point:

[0096] Determine the turn-on point and the turn-on steady-state point based on the magnitudes of the two largest data values ​​in the turn-on phase data and the time sequence of the electrical signal data; determine the turn-off point and the turn-off steady-state point based on the magnitudes of the two largest data values ​​in the turn-off phase data and the time sequence of the electrical signal data;

[0097] The two largest data values ​​in the turn-on phase data correspond to the data segments where the turn-on point and the turn-on steady-state point (corresponding to the turn-on data of the IGBT) are located. The data segment corresponding to the turn-on point and the data segment corresponding to the turn-on steady-state point are determined according to the size of the data value; according to the time sequence of the electrical signal data, the end point in the data segment corresponding to the turn-on point is determined as the turn-on point, and the starting point in the data segment corresponding to the turn-on steady-state point is determined as the turn-on steady-state point.

[0098] The two largest data values ​​in the shutdown phase data correspond to the data segments where the shutdown point and the shutdown steady-state point (corresponding to the shutdown data of the IGBT) are located. The data segment corresponding to the shutdown point and the data segment corresponding to the shutdown steady-state point are determined according to the size of the data value; according to the time sequence of the electrical signal data, the end point in the data segment corresponding to the shutdown point is determined as the shutdown point, and the starting point in the data segment corresponding to the shutdown steady-state point is determined as the shutdown steady-state point.

[0099] 2. Determine the local steady-state point:

[0100] Eliminating the multiple data values ​​corresponding to the on-point, the on-steady-state point, the off-point, and the off-steady-state point, to obtain the on-stage data and the off-stage data after the data are eliminated;

[0101] The largest data value in the on-stage data and the off-stage data after data removal is respectively obtained, and the local steady-state point is determined based on the time sequence of the electrical signal data corresponding to the largest data value.

[0102] The above-mentioned data after the data is removed is counted, and the point with the largest number is the local steady-state point. Then, the position of the point in the data segment is searched to determine the local steady-state starting point and the local steady-state ending point. Specifically, according to the time sequence of the electrical signal data, the starting electrical signal data corresponding to the largest number of data values ​​in the electrical signal data is determined as the local steady-state starting point;

[0103] According to the time sequence of the electrical signal data, the final electrical signal data in the electrical signal data corresponding to a data value with the largest number in the electrical signal data is determined as the local steady-state end point.

[0104] 3. Determine the local maximum point, local minimum point and the turning point of the rate of change:

[0105] Based on the position interval of the key data point, a local fluctuation data interval and a turning data interval in the electrical signal data are obtained.

[0106] The local fluctuation data interval and the turning data interval are pre-set in the method of determining key data points based on expert experience; the local fluctuation data interval is the location where local fluctuations or turning points of the electrical signal are judged by expert experience, and the turning data interval is the stage where the turning point occurs as judged by expert experience.

[0107] The electrical signal in this embodiment is the threshold voltage V ge According to expert experience, the data segment between the shutdown point and the local steady-state point in the shutdown data stage is determined as the local fluctuation data interval in the electrical signal data; the data segment between the local steady-state point and the shutdown steady-state point in the shutdown data stage is determined as the turning point data interval in the electrical signal data.

[0108] The local maximum point and the local minimum point are determined based on the maximum data value and the minimum data value in the local fluctuation number interval, and the change rate turning point is determined based on the data value with the least number in the turning data interval.

[0109] In step S3, based on the time of each key data point, function fitting is performed on the electrical signal data between every two adjacent key data points to obtain a plurality of fitting functions.

[0110] The data between key points has a functional relationship with time. Different functional relationships are formulated based on expert experience, including linear functions, exponential functions, trigonometric functions, etc. After obtaining the key point data, the electrical signal data between every two adjacent key data points can be fitted according to time to obtain multiple fitting functions.

[0111] In step S4, based on the time sequence of the multiple key data points, the multiple fitting functions are connected to obtain the reconstructed data of the electrical signal data in each switching cycle of the IGBT, such as Figure 5 FIG. 1 is a schematic diagram of original data and reconstructed data of the electrical signal collected in step S1 .

[0112] After obtaining the reconstructed data of the electrical signal data in each switching cycle of the IGBT, the operating state of the IGBT is monitored and evaluated based on the reconstructed data of the electrical signal data.

[0113] Small-time-scale data collection of IGBT electrical signals results in a large amount of data, which exceeds the capacity of optical fiber transmission, and an excessively large sampling period will result in a lot of feature information loss. Therefore, a method is needed to sparse the small-time-scale data, extract key features, and then reconstruct the signal based on these features to achieve online operating status monitoring of the IGBT; therefore, the present invention provides a sparse reconstruction method for IGBT small-time-scale data, which can obtain complete electrical feature information in the IGBT switching cycle by acquiring small-scale data; reconstructed data is obtained according to the fitting function of the electrical signal data between key data points, and the reconstructed data can represent the feature information of the IGBT switching cycle, thereby achieving comprehensive real-time monitoring of the IGBT switching process, and can be used for accurate evaluation of the IGBT switching state; at the same time, compared with the use of complete data to analyze the IGBT switching state, the transmission data scale is greatly compressed, which is convenient for engineering applications.

[0114] At the same time, the present invention determines the key data points according to the number of data values, the time sequence and the value change position of the preset electrical signal data, and can obtain accurate characteristic information in the IGBT switching cycle, which is representative and the reconstructed data obtained is relatively accurate.

[0115] Example 2

[0116] Based on the same inventive concept, the present invention also provides an IGBT small time scale data sparse reconstruction system, such as Figure 6 As shown, including:

[0117] A data acquisition module is used to acquire electrical signal data of small time scale during the operation of IGBT;

[0118] A key point identification module, used to identify a plurality of key data points representing a steady state and a change of an electrical signal in the electrical signal data according to a preset method for determining key data points in the electrical signal data;

[0119] A data analysis module, used for performing function fitting on the electrical signal data between every two adjacent key data points based on the time of each key data point, to obtain multiple fitting functions;

[0120] The data reconstruction module is used to connect the multiple fitting functions based on the time sequence of the multiple key data points to obtain reconstructed data of the electrical signal data in each switching cycle of the IGBT.

[0121] In a possible implementation, the key point identification module includes:

[0122] A data division unit, used for dividing the electrical signal data in each switching cycle of the IGBT into turn-on phase data and turn-off phase data;

[0123] The identification method determination unit is used to determine the identification order and the position interval of the key data points according to the preset determination method of the key data points in the electrical signal data;

[0124] The key data point identification unit is used to identify a plurality of key data points representing the steady state and changes of the electrical signal in the opening phase data and the closing phase data according to the identification order and the position interval of the key data points.

[0125] In a possible implementation, the key data point identification unit includes:

[0126] A first identification subunit is used to record the electrical signal data with the same value as one data value, and respectively obtain the two data values ​​with the largest number in the opening stage data and the closing stage data;

[0127] Determine the turn-on point and the turn-on steady-state point based on the magnitudes of the two largest data values ​​in the turn-on phase data and the time sequence of the electrical signal data; determine the turn-off point and the turn-off steady-state point based on the magnitudes of the two largest data values ​​in the turn-off phase data and the time sequence of the electrical signal data;

[0128] A data elimination subunit, used to eliminate the multiple data values ​​corresponding to the switch-on point, the switch-on steady-state point, the switch-off point and the switch-off steady-state point, and obtain the switch-on phase data and the switch-off phase data after the data are eliminated;

[0129] A second identification subunit is used to respectively obtain the largest number of data values ​​in the opening phase data and the closing phase data after the data is eliminated, and determine the local steady-state point based on the time sequence of the electrical signal data corresponding to the largest number of data values;

[0130] An interval identification subunit, used for acquiring a local fluctuation data interval and a turning data interval in the electrical signal data based on a position interval where the key data point is located;

[0131] The third identification subunit is used to determine the local maximum point and the local minimum point based on the maximum data value and the minimum data value in the local fluctuation number interval, and determine the change rate turning point based on the smallest number of data values ​​in the turning data interval.

[0132] In a possible implementation, the second identification subunit is specifically used to:

[0133] Respectively obtaining the data value with the largest number in the opening phase data and the closing phase data after the data is eliminated;

[0134] According to the time sequence of the electrical signal data, the starting electrical signal data corresponding to the largest number of data values ​​in the electrical signal data is determined as the local steady-state starting point;

[0135] According to the time sequence of the electrical signal data, the final electrical signal data in the electrical signal data corresponding to a data value with the largest number in the electrical signal data is determined as the local steady-state end point.

[0136] In a possible implementation, the interval identification subunit is specifically used to:

[0137] According to the position interval of the key data point, the data segment between the shutoff point and the local steady-state point in the shutoff data stage is determined as the local fluctuation data interval in the electrical signal data.

[0138] In a possible implementation, the interval identification subunit is further used to:

[0139] According to the position interval where the key data point is located, the data segment between the local steady-state point and the shut-off steady-state point in the shut-off data stage is determined as the turning data interval in the electrical signal data.

[0140] In a possible implementation, the system further includes a monitoring and evaluation module for performing operating status monitoring and evaluation on the IGBT based on the reconstructed data of the electrical signal data in each switching cycle of the IGBT after obtaining the reconstructed data of the electrical signal data.

[0141] Example 3

[0142] like Figure 7 As shown, the present invention also provides an electronic device, which may be a computer device, a single-chip device, an intelligent mobile device, etc. The electronic device in this embodiment may include a processor, a memory, a transceiver component, etc. The memory, the processor, and the transceiver component are connected via a bus; the memory may be used to store an execution program, and an exemplary execution program may include instructions; the processor is used to execute the instructions stored in the memory. The memory may also be used to store data, which may be called and / or modified when the instructions are executed.

[0143] The processor may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components, etc. It is the computing core and control core of the terminal, which is suitable for implementing one or more instructions, specifically suitable for loading and executing one or more instructions in a storage medium to implement the corresponding method flow or corresponding functions, so as to realize the steps of an IGBT small time scale data sparse reconstruction method in the above-mentioned embodiment.

[0144] Example 4

[0145] Based on the same inventive concept, the present invention also provides a readable storage medium, specifically an electronic device readable storage medium (Memory), which is a memory device in an electronic device for storing programs and data. It can be understood that the storage medium here can include both built-in storage media in electronic devices and, of course, extended storage media supported by electronic devices. The storage medium provides a storage space, which stores the operating system of the terminal. In addition, one or more instructions suitable for being loaded and executed by a processor are also stored in the storage space, and these instructions can be one or more execution programs (including program codes). It should be noted that the storage medium here can be a high-speed RAM memory or a non-volatile memory, such as at least one disk memory. The processor loads and executes one or more instructions stored in the storage medium, which can implement the steps of a method for sparse reconstruction of IGBT small time scale data in the above embodiment.

[0146] Those skilled in the art will appreciate that embodiments of the present invention may be provided as methods, systems, or computer program products. Therefore, the present invention may take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Moreover, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0147] The present invention is described with reference to flowcharts and / or block diagrams of methods, devices (systems), and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0148] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0149] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0150] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention rather than to limit its protection scope. Although the present invention has been described in detail with reference to the above embodiments, ordinary technicians in the relevant field should understand that after reading the present invention, those skilled in the art can still make various changes, modifications or equivalent substitutions to the specific implementation methods of the application, but these changes, modifications or equivalent substitutions are all within the protection scope of the claims to be approved.

Claims

1. A method for reconstructing IGBT small time scale data sparseness, characterized in that: include: Acquire small time scale electrical signal data during IGBT operation; According to a preset method for determining key data points in the electrical signal data, a plurality of key data points representing steady state and changes of the electrical signal are identified in the electrical signal data; Based on the time of each key data point, function fitting is performed on the electrical signal data between every two adjacent key data points to obtain multiple fitting functions; Based on the time sequence of the multiple key data points, the multiple fitting functions are connected to obtain reconstructed data of the electrical signal data in each switching cycle of the IGBT.

2. The method according to claim 1, characterized in that The method of determining the key data points in the electrical signal data according to a preset method, identifying a plurality of key data points in the electrical signal data indicating the steady state and the changes of the electrical signal, comprises: Dividing the electrical signal data in each switching cycle of the IGBT into turn-on phase data and turn-off phase data; Determine the identification order and location interval of the key data points according to the preset method of determining the key data points in the electrical signal data; According to the identification sequence and the position interval of the key data points, a plurality of key data points representing the steady state and the change of the electrical signal are identified in the turn-on phase data and the turn-off phase data.

3. The method according to claim 2, characterized in that The multiple key data points representing the steady state and changes of the electrical signal include multiple of the following: turn-on point, turn-on steady state point, turn-off point, turn-off steady state point, local maximum point, local minimum point and local steady state point and change rate turning point.

4. The method according to claim 3, characterized in that The identifying of a plurality of key data points representing steady state and changes of electrical signals in the on-stage data and the off-stage data according to the identification sequence and the position interval of the key data points comprises: Record the electrical signal data with the same value as one data value, and respectively obtain the two data values ​​with the largest number in the opening phase data and the closing phase data; Determine the turn-on point and the turn-on steady-state point based on the magnitudes of the two largest data values ​​in the turn-on phase data and the time sequence of the electrical signal data; determine the turn-off point and the turn-off steady-state point based on the magnitudes of the two largest data values ​​in the turn-off phase data and the time sequence of the electrical signal data; Eliminating the multiple data values ​​corresponding to the on-point, the on-steady-state point, the off-point, and the off-steady-state point, to obtain the on-stage data and the off-stage data after the data are eliminated; Respectively obtaining the largest data value in the on-stage data and the off-stage data after data removal, and determining the local steady-state point based on the time sequence of the electrical signal data corresponding to the largest data value; Acquire a local fluctuation data interval and a turning data interval in the electrical signal data based on the position interval where the key data point is located; The local maximum point and the local minimum point are determined based on the maximum data value and the minimum data value in the local fluctuation number interval, and the change rate turning point is determined based on the data value with the least number in the turning data interval.

5. The method according to claim 4, characterized in that The determining the local steady-state point based on the time sequence of the electrical signal data corresponding to the largest number of data values ​​includes: According to the time sequence of the electrical signal data, the starting electrical signal data corresponding to the largest number of data values ​​in the electrical signal data is determined as the local steady-state starting point; According to the time sequence of the electrical signal data, the final electrical signal data in the electrical signal data corresponding to a data value with the largest number in the electrical signal data is determined as the local steady-state end point.

6. The method according to claim 4, characterized in that The obtaining of the local fluctuation data interval in the electrical signal data based on the position interval where the key data point is located includes: According to the position interval of the key data point, the data segment between the shutoff point and the local steady-state point in the shutoff data stage is determined as the local fluctuation data interval in the electrical signal data.

7. The method according to claim 4, characterized in that The obtaining of the turning data interval in the electrical signal data based on the position interval where the key data point is located comprises: According to the position interval where the key data point is located, the data segment between the local steady-state point and the shut-off steady-state point in the shut-off data stage is determined as the turning data interval in the electrical signal data.

8. The method according to claim 1, characterized in that After obtaining the reconstructed data of the electrical signal data in each switching cycle of the IGBT, the method further includes: performing operating status monitoring and evaluation on the IGBT based on the reconstructed data of the electrical signal data.

9. An IGBT small time scale data sparse reconstruction system, characterized in that: include: A data acquisition module is used to acquire electrical signal data of small time scale during the operation of IGBT; A key point identification module, used to identify a plurality of key data points representing a steady state and a change of an electrical signal in the electrical signal data according to a preset method for determining key data points in the electrical signal data; A data analysis module, used for performing function fitting on the electrical signal data between every two adjacent key data points based on the time of each key data point, to obtain multiple fitting functions; The data reconstruction module is used to connect the multiple fitting functions based on the time sequence of the multiple key data points to obtain reconstructed data of the electrical signal data in each switching cycle of the IGBT.

10. The system according to claim 9, characterized in that The key point recognition module comprises: A data division unit, used for dividing the electrical signal data in each switching cycle of the IGBT into turn-on phase data and turn-off phase data; The identification method determination unit is used to determine the identification order and the position interval of the key data points according to the preset determination method of the key data points in the electrical signal data; The key data point identification unit is used to identify a plurality of key data points representing the steady state and changes of the electrical signal in the opening phase data and the closing phase data according to the identification order and the position interval of the key data points.

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