Method and device for measuring angle of planar light reflection object
By recording the initial parameters and multiple deflection angle parameters in the angle measurement device, and calculating the deflection angle of the plane light reflective object, the problem of inaccurate measurement results in the prior art is solved, and higher measurement accuracy and reliability are achieved.
Patent Information
- Application Number
- CN202411673403.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-21
- Publication Date
- 2025-02-28
- Estimated Expiration
- 2044-11-21
AI Technical Summary
In the prior art, the distance between the reflection point and the light source after the plane light reflecting object is deflected, resulting in poor accuracy of the measurement results.
An angle measurement device is adopted, which includes a curved light reflective object, a platform, a light source, a mirror and a light receiver. By recording the initial parameters and a plurality of deflection angle parameters, the deflection angle of the plane light reflecting object is calculated, and the accuracy of the measurement results is improved by interpolation.
The accuracy and reliability of the angle measurement of plane light reflective objects is achieved, and the applicability of the device and the authenticity of the measurement results are improved.
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Figure CN119533342A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of angle measurement, and in particular to a method and device for measuring the angle of a planar light reflecting object. Background Art
[0002] Angle measurement is an important part of metrology. With the continuous development of production and science, angle measurement is increasingly widely used in various fields such as machinery, optics, aviation, aerospace, and navigation, and the technical level and measurement accuracy are also constantly improving. Various angle measuring instruments have been developed to meet various needs. When a plane light reflecting object is deflected by a certain angle, the reflected light path will change accordingly. Therefore, the measurement of the deflection angle of a plane light reflecting object is very important in practical applications.
[0003] The angle measurement method of a plane light reflecting object in the prior art generally directly irradiates a light beam onto the plane light reflecting object for reflection, and obtains the angle of the plane light reflecting object by the change of the reflection angle. However, after the plane light reflecting object is deflected, the distance from the reflection point to the light source will change, resulting in poor accuracy of the measurement result. Summary of the invention
[0004] In view of this, the present invention proposes a method and device for measuring the angle of a planar light reflecting object to solve the technical problem in the above background technology that the distance from the reflection point to the light source will change after the planar light reflecting object is deflected, resulting in poor accuracy of the measurement result.
[0005] The technical solution of the present invention is achieved in this way:
[0006] In a first aspect, the present invention provides a method for measuring the angle of a planar light reflecting object, comprising:
[0007] An angle measuring device is used, the angle measuring device includes a curved light reflecting object, a platform, a light source, at least one reflector and a light receiver, the curved light reflecting object is mounted on the platform, a directional light beam emitted by the light source is reflected by at least one reflector onto the curved light reflecting object, the directional light beam is reflected by the curved light reflecting object and then transmitted to the light receiver so as to record an initial parameter and a plurality of deflection angle parameters, and a method for measuring the initial parameter and the deflection angle parameter includes:
[0008] Assembling the angle measuring device according to a predetermined test parameter, which is in an initial state, recording a deflection angle parameter of a first point of the light receiver where the light beam path of the light source falls in the initial state, and using the deflection angle parameter of the first point as an initial parameter; and
[0009] Move the platform in the horizontal direction (x, y) so that the light beam path of the light source passes through the curved light reflective object, and record a plurality of deflection angle parameters of a plurality of points falling on the light receiver, each of the deflection angle parameters at least including an x-axis incident angle in the horizontal direction, a y-axis incident angle in the horizontal direction, an X coordinate of a pixel of the light receiver, and a Y coordinate of a pixel of the light receiver; and
[0010] A plane light reflecting object of the angle to be measured is installed on the platform instead of the curved light reflecting object in the initial state, and the pixel coordinates (X', Y') of a measuring point where the directional light beam of the light source falls on the light receiver after being reflected by the plane light reflecting object are recorded. By comparing the pixel coordinates of the measuring point with the initial parameters and the plurality of deflection angle parameters, a deflection angle of the plane light reflecting object is calculated.
[0011] On the basis of the above technical solution, preferably, the relative position relationship among the light source, at least one of the reflectors and the light receiver is fixed.
[0012] On the basis of the above technical solution, preferably, the plurality of points falling on the optical receiver are evenly distributed with the first point as the center.
[0013] On the basis of the above technical solution, preferably, the deflection angle of the planar light reflecting object is calculated by comparing the relationship between the pixel coordinates of the measuring point and the initial parameters and the multiple deflection angle parameters, including: if the measuring point does not coincide with the first point or the multiple points, the deflection angle is calculated by interpolation.
[0014] On the basis of the above technical solution, preferably, it further includes: moving the platform in the vertical direction z, and each of the deflection angle parameters also includes: a change value Z of the distance transmitted between the light receiver and the curved light reflecting object by the directional light beam of the light source, and the z-axis incident angle in the vertical direction;
[0015] By comparing the relationship between the measurement point, the initial parameter, and the plurality of deflection angle parameters, a vertical distance of the planar light reflecting object offset is obtained.
[0016] Based on the above technical solution, preferably, the predetermined test parameters include: a predetermined distance W that the directional light beam of the light source transmits between the light receiver and the curved light reflecting object, an incident angle θ1 of the light beam path of the light source transmitted through the reflector to a reflection point of the curved light reflecting object, and a reflection angle θ2 of the light receiver relative to the normal of the curved light reflecting object at the reflection point.
[0017] On the basis of the above technical solution, preferably, the value of the incident angle θ1 is equal to the negative value of the reflection angle θ2.
[0018] In a second aspect, the present invention provides an angle measuring device for a plane light reflecting object, comprising a curved light reflecting object, a plane light reflecting object and a platform, as well as a light source, at least one reflector and a light receiver whose relative positions are fixed, wherein:
[0019] The platform is used to mount the curved light reflecting object or the flat light reflecting object, and the platform can move in the horizontal direction;
[0020] A directional light beam emitted by the light source is directed toward at least one of the reflectors;
[0021] At least one of the reflectors is used to reflect the directional light beam and project it onto the curved light reflecting object or the flat light reflecting object as incident light;
[0022] The light receiver is used to receive the reflected light beam after being reflected by the curved light reflecting object or the flat light reflecting object.
[0023] On the basis of the above technical solution, preferably, the platform can also move in the vertical direction.
[0024] On the basis of the above technical solution, preferably, two reflectors are provided, and the distances from the two reflectors to the origin in the horizontal y direction are the same or different.
[0025] The angle measurement method of a planar light reflecting object of the present invention has the following advantages compared with the prior art:
[0026] (1) By establishing initial parameters and a plurality of deflection angle parameters, a plane light reflecting object is installed on the platform instead of a curved light reflecting object, and the pixel coordinates (X', Y') of the measuring point where the light beam of the light source falls on the light receiver after being reflected by the plane light reflecting object are recorded. By comparing the relationship between the pixel coordinates of the measuring point and the initial parameters and the plurality of deflection angle parameters, the deflection angle of the plane light reflecting object is calculated. The light source of this measurement method is unique, and the deflection angle of the plane light reflecting object is obtained by comparison, and the result is accurate and reliable;
[0027] (2) The plurality of points falling on the optical receiver are evenly distributed with the first point as the center, so that the parameters of the plurality of points are more uniform and the distribution range is larger, the range of the deflection angle that can be measured is larger, and the applicability of the device is improved;
[0028] (3) if the measuring point does not coincide with the first point or the plurality of points, the deflection angle is calculated by interpolation, so that the measurement result is closer to the true value, thereby improving the accuracy and reliability of the measurement result;
[0029] (4) By moving the platform in the vertical direction z and comparing the relationship between the measurement point and the initial parameters and a plurality of deflection angle parameters, the vertical distance of the offset of the plane light reflecting object can be obtained. Not only the posture of the plane light reflecting object in the three-dimensional space can be known, but also the position of the plane light reflecting object in the three-dimensional space can be obtained, thereby improving the scope of use of the device. BRIEF DESCRIPTION OF THE DRAWINGS
[0030] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.
[0031] Figure 1 is a schematic structural diagram of a device for measuring the angle of a planar light reflecting object in an embodiment of the present invention;
[0032] Figure 2 Schematic diagram of the structure of two reflectors in an embodiment of the present invention (first solution);
[0033] Figure 3 Schematic diagram of the structure of two reflectors (second solution) in an embodiment of the present invention;
[0034] Figure 4 FIG. 4 is a schematic flow chart of a method for measuring the angle of a planar light reflecting object according to an embodiment of the present invention.
[0035] Explanation of the reference numerals: 1 - curved light reflecting object, 2 - platform, 3 - light source, 4 - reflector, 5 - light receiver; 100 - flat light reflecting object. DETAILED DESCRIPTION
[0036] The following will be combined with the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.
[0037] Reference Figure 1-3As shown, the first embodiment of the present invention provides an angle measuring device for a planar light reflecting object, comprising a curved light reflecting object 1 and a platform 2, and a light source 3, at least one reflector 4 and a light receiver 5 whose relative positions are fixed, wherein:
[0038] The platform 2 is used to mount the curved light reflecting object 1 or the flat light reflecting object 100, and the platform 2 can move in the horizontal direction; the x, y, z axis coordinate system is constructed, and the platform 2 is arranged parallel to the horizontal plane where the x axis and the y axis are located;
[0039] The directional light beam emitted by the light source 3 is directed toward at least one of the reflectors 4; the directional light beam may be a laser or other parallel light;
[0040] At least one of the reflectors 4 is used to reflect the directional light beam and project it onto the curved light reflecting object 1 or the flat light reflecting object 100 as incident light;
[0041] The light receiver 5 is used to receive the reflected light beam reflected by the curved light reflecting object 1 or the flat light reflecting object 100 .
[0042] It should be noted that the relative position relationship in this embodiment is fixed, which means that the relative positions and angles of the light source 3, at least one reflector 4 and the light receiver 5 are fixed, and in the initial state, the at least one reflector 4 can reflect the directional light beam emitted by the light source 3 and then be incident on the curved light reflecting object 1 on the platform 2, the beam angle of the directional light beam incident on the curved light reflecting object 1 is uniform, and the distance from the reflection point of the curved light reflecting object 1 to the light receiver 5 is fixed. The path of the light beam emitted by the light source 3 is: light source 3-reflector 4-curved light reflecting object 1 or plane light reflecting object 100-light receiver 5.
[0043] In some embodiments, the platform 2 can also move in the vertical direction. By moving the platform 2 in the vertical direction, the vertical distance of the offset of the planar light reflecting object 100 can also be measured, thereby increasing the scope of use of the device. The specific method of measuring the vertical distance of the offset of the planar light reflecting object 100 is described in detail in the following method embodiment.
[0044] In some embodiments, Figure 2 As shown, there are two reflectors 4, and the distances from the two reflectors 4 to the origin in the horizontal y direction are the same. The line connecting the center points of the two reflectors 4 is parallel to the horizontal x-axis direction. The light beam emitted by the light source 3 is reflected by one of the reflectors 4, and then reflected by the other reflector 4, and then incident on the curved light reflecting object 1 or the flat light reflecting object 100. Through two or more reflectors 4, the light beam path can be changed, which is convenient for the arrangement of the light source 3 and improves the convenience of arrangement.
[0045] In some embodiments, Figure 3 As shown, there are two reflectors 4, and the distances from the two reflectors 4 to the origin in the horizontal y direction are different. The line connecting the center points of the two reflectors 4 has a certain angle with the horizontal x-axis direction. The light beam emitted by the light source 3 is reflected by one of the reflectors 4, and then reflected by the other reflector 4, and then incident on the curved light reflecting object 1 or the flat light reflecting object 100. Through two or more reflectors 4, the light beam path can be changed, which is convenient for the arrangement of the light source 3 and improves the convenience of arrangement.
[0046] Combination Figure 4 As shown, the second embodiment of the present invention provides a method for measuring the angle of a planar light reflecting object, using the angle measuring device for the planar light reflecting object described in the first embodiment, and the angle measuring method includes:
[0047] Step S1: Assemble the angle measuring device according to the predetermined test parameters, which are in the initial state at this time, and record the deflection angle parameters of the light beam path of the light source 3 falling on the first point of the light receiver 5 in the initial state, and use the deflection angle parameters of the first point as the initial parameters. The predetermined test parameters include: a predetermined distance W transmitted between the light source 3 and the curved light reflecting object 1, an incident angle θ1 of the light source 3 path transmitted through the reflector 4 to a reflection point of the curved light reflecting object 1, and a reflection angle θ2 of the light receiver 5 relative to the normal of the curved light reflecting object 1 at the reflection point.
[0048] Step S2: Move the platform 2 in the horizontal direction (x, y) so that the light beam path of the light source 3 passes through the curved light reflecting object 1, and record a plurality of deflection angle parameters of a plurality of points falling on the light receiver 5, wherein the deflection angle parameters at least include the x-axis incident angle in the horizontal direction, the y-axis incident angle in the horizontal direction, the pixel X coordinate of the light receiver 5, and the pixel Y coordinate of the light receiver 5.
[0049] In order to facilitate the understanding of the initial parameters and the repeated deflection angle parameters, the present embodiment will use numerical values to illustrate the relationship between the initial parameters and the repeated deflection angle parameters. It should be understood that the numerical values of the implementation are not intended to limit the present invention. When using predetermined test parameters under different conditions or using different curved light reflecting objects 1, the numerical values of the initial parameters and the repeated deflection angle parameters will be different.
[0050] Assume that the initial parameters are: the x-axis incident angle of the initial reflection point transmitted by the light source 3 to the curved light reflective object 1 is 10°, the y-axis incident angle is 0°, the pixel x-coordinate of the light receiver 5 is 0, and the pixel y-coordinate of the light receiver 5 is 0. The following Table 1 can be drawn:
[0051] Table 1
[0052] x-axis incident angle Y-axis incident angle Pixel X coordinate Pixel Y coordinate Initial Parameters 10° 0° 0 0
[0053] After obtaining the initial parameters, the next step is to collect and repeat the deflection angle parameters. In this process, the platform 2 will move along the horizontal direction (x, y), and at the same time drive the movement of the curved light reflective object 1 in the horizontal direction (x, y). Since the curved light reflective object 1 is curved, the movement of the curved light reflective object 1 in the horizontal direction (x, y) is equivalent to the incident angle also changing accordingly.
[0054] For example, the curved light reflective object 1 is moved by 1 point vector in the horizontal x-axis direction and 0 point vector in the horizontal y-axis direction. At this time, the incident angle of the light beam of the light source 3 on the curved light reflective object 1 is equal to 11.233° on the x-axis and 7.725° on the y-axis, and the light receiver 5 receives the light beam reflected by the curved light reflective object 1 at the pixel x coordinate of 3.012 and the pixel y coordinate of 1.818. The following Table 2 can be drawn:
[0055] Table 2
[0056] x-axis incident angle Y-axis incident angle Pixel X coordinate Pixel Y coordinate Initial Parameters 10° 0° 0 0 Angle parameter 1 11.233° 7.725° 3.012 1.818
[0057] Next, the curved light reflective object 1 is repeatedly moved in different horizontal directions, and the pixel coordinates of the corresponding light source 3 on the light receiver 5 are obtained, which can be roughly plotted into the following Table 3:
[0058] Table 3
[0059] x-axis incident angle Y-axis incident angle Pixel X coordinate Pixel Y coordinate Initial Parameters 10° 0° 0 0 Angle parameter 1 11.233° 7.725° 3.012 1.818 Angle parameter 2 13.875° 8.588° 17.288 -5.181 Angle parameter 3 6.545° -12.657° -7.213 13.665 ... ... ... ... ...
[0060] Accordingly, the initial parameters and the repeated deflection angle parameters are constructed. It should be noted that the more deflection angle parameters are obtained, the more accurate the subsequent measurement of the deflection angle of the planar light reflecting object 100 will be.
[0061] Step S3: The plane light reflecting object 100 of the angle to be measured replaces the curved light reflecting object 1 in the initial state and is installed on the platform 2, and the pixel coordinates (X', Y') of the measuring point where the light beam of the light source 3 falls on the light receiver 5 after being reflected by the plane light reflecting object 100 are recorded, and the deflection angle of the plane light reflecting object 100 is calculated by comparing the relationship between the pixel coordinates of the measuring point and the initial parameters and a plurality of deflection angle parameters.
[0062] For example, if the pixel coordinates (X', Y') of the measuring point reflected by the planar light reflecting object 100 received by the light receiver 5 fall at (pixel X coordinate 17.288, pixel Y coordinate -5.181), it means that the deflection angle of the planar light reflecting object 100 is 13.875° along the x-axis direction and 8.588° along the y-axis direction.
[0063] In some embodiments, the plurality of points falling on the light receiver 5 are evenly distributed with the first point as the center. By evenly distributing the plurality of points falling on the light receiver 5 with the first point as the center, the parameters of the plurality of points are more uniform, the distribution range is larger, the range of the deflection angle that can be measured is larger, and the applicability of the device is improved.
[0064] In some embodiments, the deflection angle of the planar light reflecting object 100 is calculated by comparing the relationship between the pixel coordinates of the measuring point and the initial parameters and the plurality of deflection angle parameters, including: if the measuring point does not coincide with the first point or the plurality of points, the deflection angle is calculated by interpolation.
[0065] For example, if the light receiver 5 receives the pixel coordinates (X', Y') of the measuring point reflected by the plane light reflecting object 100, X' is 1.506, which is half of the sum of the pixel X coordinates of the initial parameter and the angle parameter 1, and Y' is 0.606, which is 1 / 3 of the sum of the pixel Y coordinates of the initial parameter and the angle parameter 1, then a difference operation is performed between the initial parameter and the angle parameter 1 to obtain the x-axis incident angle of the corresponding light beam on the plane light reflecting object 100 = (10 + 11.233) / 2 = 10.617°, and the y-axis incident angle = (0 + 7.725) / 3 = 2.575°, that is, the deflection angle of the plane light reflecting object 100 is 10.617° along the x-axis direction and 2.575° along the y-axis direction.
[0066] In some embodiments, it also includes: moving the platform 2 in the vertical direction z, and the deflection angle parameters also include: the change value Z of the distance transmitted by the light beam of the light source 3 between the light receiver 5 and the curved light reflecting object 1, and the z-axis incident angle in the vertical direction; by comparing the relationship between the measuring point and the initial parameters and a plurality of deflection angle parameters, the vertical distance of the offset of the planar light reflecting object 100 is obtained.
[0067] The method for generating multiple deflection angle parameters when the curved light reflecting object 1 moves in three-dimensional space (x, y, z) is similar to that of the above-mentioned embodiment, so it is not repeated here. The difference from the above-mentioned embodiment is that the vertical direction z movement of the curved light reflecting object 1 will cause the distance W of the light beam of the light source 3 transmitted between the light receiver 5 and the curved light reflecting object 1 to change, and the change value of these changes is the change value Z. In this way, the following Table 4 can be obtained:
[0068] Table 4
[0069]
[0070] Thus, when the plane light reflecting object 100 replaces the curved light reflecting object 1 and is installed on the platform 2, as mentioned above, if the measurement point reflected by the plane light reflecting object 100 received by the light receiver 5 falls on the pixel point with the pixel X coordinate of 17.288 and the pixel Y coordinate of -5.181, in addition to obtaining the deflection angle of the plane light reflecting object 100, the vertical distance of the offset of the plane light reflecting object 100 can be obtained as -0.454, thereby determining the position and posture of the plane light reflecting object 100 in the three-dimensional space.
[0071] In some embodiments, the value of the incident angle θ1 is equal to the negative value of the reflection angle θ2.
[0072] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.
Claims
1. A method for measuring the angle of a planar light reflecting object, characterized in that: include: An angle measuring device is used, the angle measuring device includes a curved light reflecting object, a platform, a light source, at least one reflector and a light receiver, the curved light reflecting object is mounted on the platform, a directional light beam emitted by the light source is reflected by at least one reflector onto the curved light reflecting object, the directional light beam is reflected by the curved light reflecting object and then transmitted to the light receiver so as to record an initial parameter and a plurality of deflection angle parameters, and a method for measuring the initial parameter and the deflection angle parameter includes: Assembling the angle measuring device according to a predetermined test parameter, which is in an initial state, recording a deflection angle parameter of a first point of the light receiver where the light beam path of the light source falls in the initial state, and using the deflection angle parameter of the first point as an initial parameter; and Move the platform in the horizontal direction (x, y) so that the light beam path of the light source passes through the curved light reflective object, and record a plurality of deflection angle parameters of a plurality of points falling on the light receiver, each of the deflection angle parameters at least including an x-axis incident angle in the horizontal direction, a y-axis incident angle in the horizontal direction, an X coordinate of a pixel of the light receiver, and a Y coordinate of a pixel of the light receiver; and A plane light reflecting object of the angle to be measured is installed on the platform instead of the curved light reflecting object in the initial state, and the pixel coordinates (X', Y') of a measuring point where the directional light beam of the light source falls on the light receiver after being reflected by the plane light reflecting object are recorded. By comparing the pixel coordinates of the measuring point with the initial parameters and the plurality of deflection angle parameters, a deflection angle of the plane light reflecting object is calculated.
2. The method for measuring the angle of a planar light reflecting object as claimed in claim 1, wherein: The relative positional relationship among the light source, at least one of the reflectors and the light receiver is fixed.
3. The method for measuring the angle of a planar light reflecting object as claimed in claim 1, wherein: The plurality of points falling on the light receiver are evenly distributed with the first point as the center.
4. The method for measuring the angle of a planar light reflecting object as claimed in claim 1, wherein: The deflection angle of the planar light reflecting object is calculated by comparing the relationship between the pixel coordinates of the measuring point and the initial parameters and the plurality of deflection angle parameters, including: if the measuring point does not coincide with the first point or the plurality of points, the deflection angle is calculated by interpolation.
5. The method for measuring the angle of a planar light reflecting object as claimed in claim 1, wherein: Also includes: The platform is moved in the vertical direction z, and each of the deflection angle parameters further includes: a change value Z of the distance transmitted between the light receiver and the curved light reflecting object by the directional light beam of the light source, and an incident angle of the z-axis in the vertical direction; By comparing the relationship between the measurement point, the initial parameter, and the plurality of deflection angle parameters, a vertical distance of the planar light reflecting object offset is obtained.
6. The method for measuring the angle of a planar light reflecting object as claimed in claim 1, wherein: The predetermined test parameters include: a predetermined distance W that the directional light beam of the light source transmits between the light receiver and the curved light reflecting object, an incident angle θ1 of the light beam path of the light source transmitted through the reflector to a reflection point of the curved light reflecting object, and a reflection angle θ2 of the light receiver relative to the normal of the curved light reflecting object at the reflection point.
7. The method for measuring the angle of a planar light reflecting object as claimed in claim 6, wherein: The value of the incident angle θ1 is equal to the negative value of the reflection angle θ2.
8. An angle measuring device for a planar light reflecting object, characterized in that: The invention comprises a curved light reflecting object, a flat light reflecting object and a platform, as well as a light source, at least one reflector and a light receiver with fixed relative positions, wherein: The platform is used to mount the curved light reflecting object or the flat light reflecting object, and the platform can move in the horizontal direction; A directional light beam emitted by the light source is directed toward at least one of the reflectors; At least one of the reflectors is used to reflect the directional light beam and project it onto the curved light reflecting object or the flat light reflecting object as incident light; The light receiver is used to receive the reflected light beam after being reflected by the curved light reflecting object or the flat light reflecting object.
9. The angle measuring device of a planar light reflecting object as claimed in claim 8, characterized in that: The platform is also movable in a vertical direction.
10. The angle measuring device for a planar light reflecting object as claimed in claim 8, wherein: There are two reflectors, and the distances from the two reflectors to the origin in the horizontal y direction are the same or different.
Citation Information
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